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USER`S MANUAL

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1. XG2130 E1 Datacom Tester Navigating the Displays codeer ecaro esre gt Table 30 Effects of framings on Basic Analysis Note The instrument will disable the counting of errors in the presence of various alarms which are in context for the current settings of the instrument These alarms will affect the error count EC and the error free seconds EFS results EC EFS O BIT Table 31 Effects of alarms on error counts in the unframed E1 EC Signal Frame Pattern EFS Loss Loss Frar me Fram mE Loss 7 a a E Table 32 Effects of alarms on error counts in the framed E1 72 0027 03A 79 XG2130 E1 Datacom Tester Navigating the Displays b G 821 Analysis G 821 Analysis performs result statistics of errored seconds ES and ES severely errored seconds SES and SES degraded minutes DM and DM unavailable time UAS and UAS for BIT errors The displays of unframed and framed E1 testing in G 821 Analysis are same as shown in Fig 34 Results OODOOH15M25S ce CR ve PARE ES 0 SES 0 DM 0 nas 0 0 Running Please wait BASIC G 821 LCR PA ANALYSI ANALYSI ANALYSI Fig 34 G 821 Analysis result menu The relevant result analysis items are described in Table 33 item Description Asynchronous errored seconds ES are counted over the available time Asynchronous errored seconds counted over the available
2. The LCD backlight can be turned on by pressing the Backlight key and be automatically turned off in 30 seconds This function can be set to or 0J in Others menu When set as OFFI press the Backlight key to turn on the backlight and press the Backlight key again to turn off the backlight 2 3 Switch On 2 3 1 Switch on Inspection Steps e Plug in AC adapter with power cord the Charge indicator of this instrument will turn on e This instrument can be switched on after Power key has been pressed for about 1 second LCD displays company s LOGO and the software version information embedded in the instrument About 1 second later the switch on process is completed and LCD display the setting s menu 72 0027 03A 24 XG2130 E1 Datacom Tester Getting Started after one beep e This instrument can be switched off by pressing the Power key again for 1 second When the battery has been fully recharged remove the AC power adapter After powering of battery this instrument can be switched on or off by pressing the Power key e Loopback the 2Mb s input and output interface of the instrument with E1 752 unbalanced test cable e Switch on the instrument and check if LCD displays and LED indicators are abnormal e Select error insertion type as BIT Single and press the Single Err Add key to check if the instrument detects and operates properly e When the user rec
3. 185 7 RS 449 Adapter Cable PIN Assignments DTE 186 8 RS 449 Adapter Cable PIN Assignments DCE 187 9 X 21 Adapter Cable PIN Assignments DTE 188 10 X 21 Adapter Cable PIN Assignment DCE 189 11 RS 485 Adapter Cable PIN Assignments DTE 190 12 RS 485 Adapter Cable PIN Assignments DCE 191 13 EIA 530 Adapter Cable PIN Assignments DTE 192 14 ElIA 530 Adapter Cable PIN Assignments DCE 193 15 ElIA 530A Adapter Cable PIN Assignments DTE 194 72 0027 03A 2 XG2130 E1 Datacom Tester Contents 16 EIA 530A Adapter Cable PIN Assignments DCE 195 Appendix C G 703 CO Adapter Cable cccscesseseeeees 196 Appendix D Special Adapter Cables ccccsesssesseneas 197 Appendix E Abbreviation ssssssssunnuusunuuunnnunnnnnnnnn 198 72 0027 03A XG2130 E1 Datacom Tester Overview 1 Overview This chapter briefly describes the relevant icons E1 Datacom tester overview product compositions functional keyboard LED alarm and status indications and LCD icon indications in this operation manual 1 1 Relevant icon information 1 2 Product overview 1 3 Product compositions 1 4 Functional keyboard 1 5 LED indicators 1 6 LCD icon indications 1 1 Icon Description Some important information and items requiring special attention in this manual are described with following icons Note symbol indicates some details that should be d
4. Alarm happens on receiving less than 3 Os in 512 bits and cleans on detecting more than 2 Os in 512 bits and the LED will be turned off Comply with ITU T 0 162 Alarm happens on receiving 3 or more FRAME _ consecutive FAS words in error and LED turns on LOSS red Otherwise the alarm is cleaned and LED turns off Comply with ITU T G 706 Alarm happens on synchronization loss of CAS or CRC4 Multiframe and the LED turns on red Alarm cleans on both of these two alarms recovering and the LED turns off MERANIE CAS Multiframe Loss Alarm on receiving 2 consecutive MFAS words in error and the LED as turns on Otherwise the alarm is cleaned CRC4 Multiframe Loss Alarm on receiving 915 or more CRC4 code words out of 1000 received in error and LED turns on Alarm cleans on receiving 2 valid MF alignment words in 8ms Alarm happens on receiving 6 or more bits in PATTERN error in consecutive 64 bits and the LED turns on LOSS red Otherwise the alarm is cleaned and the LED turns off Alarm happens on detecting at least 1 error and ERRORS the LED turns on red The error sources BIT FAS CODE CRC4 and E BIT 72 0027 03A 14 XG2130 XG2130 El Datacom Tester Overview_ Tester Overview Alarm happens on detecting Remote Alarm or Remote Multiframe Alarm and the LED turns on red Alarm cleans on both of two disappear and the LED turns off Remote Alarm Alarm happens on receiving 1 at Bit3
5. TS Analysis provides timeslot analysis of framed E1 signal The full frame data can be monitored in this analysis including frame alignment FAS and NFAS timeslot 16 data speech timeslot data and timeslot activities as shown in Fig 41 Since the timeslot 16 is used to transmit multiframe alignment 72 0027 03A 93 XG2130 E1 Datacom Tester Navigating the Displays signal and CAS signaling data in PCM30 CRC framing and common 64 kb s data or CCS messages in PCM31 CRC framing the results of it will be displayed different on framing configured in the settings menu The effects of framings on analysis items are shown in Table 44 FAS and NFAS displays also are affected by CRC4 framing or non CRC4 framing chosen Results OODOOH15M25S LEER ESA ATAR FAS NFAS Running Please wait SIGNAL TS EVENT ANALYSI ANALYSI RECORDS Fig 41 TS Analysis result menu TS Analysis Framing oo A a a O Mtrame ysis anaysis gt tsmonitor actvity fe pf Table 44 Effects of framings on TS Analysis e FAS NFAS 72 0027 03A 94 XG2130 E1 Datacom Tester Navigating the Displays FAS NFAS analysis result menu displays different contents according to the CRC4 and non CRC4 framing The frame structure of PCM30 PCM30CRC PCM31 and PCM31CRC are described in Appendix A Before the measurement the user should know the framing used by the equipment under test FAS NFA
6. This instrument can make full simulation of PCM equipment and perform comprehensive measurements to 2M b s interface of the equipment In PCM Simulator mode the instrument provides transmit clock deviation error insertion alarm generation framing bits and signaling programming It can also support inserting idle codes and VF tone whose frequency and level are adjustable in one or more timeslots Go back to page 1 of Settings menu select in Function item to set relevant parameters There are 2 pages of settings menu in this mode as shown in Fig 14 and Fig 15 a Page 1 of PCM Simulator Settings As shown in Fig 14 press the Cursor Right and Down key to move the cursor to the positions to set Interface 72 0027 03A 49 XG2130 E1 Datacom Tester Navigating the Displays Framing Tx clk Alarm injection parameters and select relevant parameters by pressing F1 F2 F3 and F4 softkeys Settings P1 10 30 00 Function El PCM SIMULATOR Interface UNBAL 75Q HDB3 Framing PCM30 Tx clk INTERN 2048K 10ppm Alarm injection FRAME LOSS Tester is ready for use Sete APS PCM DELA DELAY SI MULAT Fig 14 Page 1 of PCM Simulator settings menu The settings of Interface Framing and Tx Clk parameters are described in Table 6 5 8 respectively Since the framing data or framing synchronization may be destroyed after some
7. Tx Clock Source RX CLK Rx Clock Source RX CLK c Synchronous clock edge adjustment The E1 Datacom tester provides clock valid edge adjustment function Regardless DTE or DCE equipment the data signals have strict phase relation with the clock signals The data Signals are always coincident with the clock signals to ensure that the valid edge of the clock rising edge or falling edge is 72 0027 03A 141 XG2130 E1 Datacom Tester Performing Measurements aligned to the middle of the data This coincidence helps the equipment clock in or out the data properly It is very important for user to configure the valid edge of sampling or transmitting the data But various equipments from different vendors don t treat the clock edge in the same way The valid edge of the clock signals is always uncertain to the user Therefore when making the synchronous measurements with the equipment under test the user need to know the valid edge of clocks of the equipment under test firstly or try to adjust the valid edge of the clock when not sure about it If the instrument has no clock edge adjustment function the test may be failed to the equipments from different vendors The valid edge of transmit and receive clock signals is normally configured as the rising edge The rising edge configuration may be effective for most digital equipments d Handshaking Signal Testing A typical datacom interface always has some control circuits for han
8. and the other is to upgrade the embedded software via PC to protect your investment 2 4 1 Communication Steps Switch off the instrument firstly Open the end cover of the instrument Connect RS232 interface of the instrument to PC serial port with RS232 communication cable supplied Switch on the instrument Set RS232 port state to 0 in Others menu Run the TestManager software on PC click Select to choose the type and click Connect icon After the 72 0027 03A 26 XG2130 E1 Datacom Tester Getting Started successful connection the user can upload view analyze delete print test results in the form of report and do other operations Be sure not to plug and unplug the communication cable alive when connecting PC serial interface to the instrument using the serial communication cable and be sure to ground or use ESD wrist strip During serial data communication period the instrument can be powered either by built in batteries or by AC power adapter 2 4 2 Upgrading the Embedded Software We will launch the latest version embedded software and host software TestManager in the website of our company for the users to download Make sure to visit our website frequently to ensure you will always get the software of the latest version For the software upgrading method please refer to the relevant part of Communication with PC and follow instruction of the TestManager When performing the embed
9. CC B CB A CB B BA A BA B DA A DA B CA A CA B D A D B D A D B ee e e Po fe Pas a a 72 0027 03A 193 XG2130 E1 Datacom Tester Appendix B 15 EI A 530A Adapter Cable PI N Assignments DTE PIN ae ITU T Signal Equipment Tester Signal Under Test A B DTE Transmit Clock Data Terminal A B A B A B DCE A B A B D D C C B B D D C C D D DCE Detect Detect 72 0027 03A 194 BB A B B B A B B AB CC B A B B A A A B A A A B A A A B CD D A D B CF A CF B 1 XG2130 E1 Datacom Tester Appendix B 16 El A 530A Adapter Cable PIN Assignments DCE PIN ITU T Signal Equipment Circuit Name Tester Signal Direction Under Test ae DCE Transmit ce DCE Se ef a Poss sete ce or 20 esto a a ea ha Data es a rg Data Transmit a DTE Transmit Sek DTE Data Terminal Ready Receive Clock D A Data are Detect Data cre Detect 72 0027 03A 195 XG2130 E1 Datacom Tester Appendix C Appendix C G 703 CO Adapter Cable PIN Signal Equipment Tester Under Test Direction Red Red Cable Green Green Cable Green Red Red Cable Green Cable 72 0027 03A 196 XG2130 E1 Datacom Tester Appendix D Appendix D Special Adapter Cables cote XGA1008 XGA1009 XGA1010 XGA1011 XGA1012 72 0027 03A Item De
10. Circuit Name Tester Signal Direction Under Test Byte Timin 4 3 B A DCE A Byte Timin 5 y a B B DCE B Indication A I A Indication B I B Transmit A T A Transmit B T B Control A C A Control B C B Signal Element 20 a S A Timing A Signal Element 21 S B Timing B Pe ff Pe f gt J os 72 0027 03A 189 XG2130 E1 Datacom Tester Appendix B 11 RS 485 Adapter Cable PIN Assignments DTE PIN be oa ITU T Signal Equipment Circuit Name Tester Signal Direction Under Test Transmitted Data 103 A Transmitted Data B Transmit Clock DTE XTC A Transmit Clock DTE Signal Ground S Gi a A B B 2 A TD TD 1 11 00 113 0 0 gt x lt Sj O iss Ww N O Z w 1 1 10 Data Terminal iar Send RTS A aaa to Send RTS B 105 105 10 gg R Received Data R 104 Receive Clock A R 115 Receive Clock B RC 115 Clear to Send A CTS A 106 Clear to Send B CTS B 06 Data Set Ready 7 a 10 B Transmit Clock DCE A TC Transmit Clock DCE B TOLIB Data Carrier DcD A Detect B 72 0027 03A 190 lt D D C gt ae B J n JJ gt w O 07 PS 1 1 B 107 A 1 B 1 10 109 Received Data w O 0 XG2130 E1 Datacom Tester Appendix B 12 RS 485 Adapter Cable PIN Assignme
11. Current result Then delete the unvalued results to release the capacity and save the Current 72 0027 03A 112 XG2130 E1 Datacom Tester Navigating the Displays Result HJA _P 1 3 Function Interface UNBAL 75Q Framing BERT pattern Polarity INVERTED 08 vacant results storages SETTING RESULT TIME Fig 61 Setting information of stored results item Description View full information of the stored result Lock the selected result in order to prevent it Lock from being accidentally renamed and Unlock overwritten Unlock the selected result in order to rename and delete it Rename Modify the name of selected result Delete the selected result Table 49 Activities to the stored results 3 5 Others Menu Others menu mainly performs the settings of other relevant parameters of the instrument User can make configurations according to the real needs LA Press the Other key to switch to Others menu Others menu provides the accessorial functions of UKA 5 h ae ts POWER MANAGERSRS232 PORTHTI ME amp DATERKEYBOARD Uso aA LGS Goatees Milne These 72 0027 03A 113 XG2130 E1 Datacom Tester Navigating the Displays functions will be described respectively below 3 5 1 Miscellaneous Miscellaneous menu is as shown in Fig 62 provides Beep on alarm Keyboard lock Display EFS or EFS Language and Load default sett
12. In the stored results the 72 0027 03A 29 XG2130 E1 Datacom Tester Navigating the Displays instrument setting and result information of any test result are available Others menu Press the Other key to switch to the auxiliary information menus Following auxiliary information menus can be accessed by pressing the FI F2 F3 and F4 softkeys including miscellaneous power manager time amp date RS232 port keyboard test self test tester information producer information and so on Status prompt information line provides operating status of the instrument The upper right corner of LCD indicates that the parameters can be modified ce indicates that the instrument is doing one test softkeys are under the lock status and configuration data can not be modified in the storage menu indicates that there still has storage uu nr Space to save more records in the instrument ce indicates that no saving space is available some records nr must be deleted first to save the new records and following each saved record respectively indicate that the record is under locked or unlocked status 3 2 Settings Menu Settings menu mainly performs the selection of the test function and the settings of relevant parameters which are associated with the situation of the system under test Only after 72 0027 03A 30 XG2130 E1 Datacom Tester
13. Settings Menu 3 2 2 1 Page 1 of Datacom Setting Menu Return to the page 1 of Settings menu Press the F1 key in the Function item to select ANEX There have 4 pages in settings menu Press the Cursor Right and Down key in 72 0027 03A 57 XG2130 E1 Datacom Tester Navigating the Displays page 1 to the positions of Interface Test mode BERT pattern and Polarity and then select relevant parameters by pressing Fl F2 F3 F4 softkeys as shown in Fig 24 Settings P1 10 30 00 Function PIAN E Interface V 35 Test mode DTE ASYNC BERT pattern 27a Polarity INVERTED ITU T Tester is ready for use PROTOC G 703 DATACOM CONVER co Fig 24 Page 1 of Datacom settings menu The settings of datacom I nterface parameters are as shown in Table 16 e we mo ee Interface Table 16 Datacom Interface parameter settings The settings of Test mode parameters are as shown in Table 17 mode Table 17 Datacom Test mode parameter settings 72 0027 03A 58 XG2130 E1 Datacom Tester Navigating the Displays Note When DTE emulation mode is chosen the datacom adapter cables provided with a DTE male connector should be used When in DCE emulation mode the cables provided with DCE female connectors should be used The settings of Test pattern parameters are as shown in Table 18 Item Option D
14. e Page 2 of settings menu in RX HI Z mode framed Press the PgDn key to enter into page 2 of the settings menu in RX HI Z mode framed testing move the cursor to the positions to set Duration parameter and select relevant parameters by pressing F1 F2 F3 F4 keys as shown in Fig 10 And relevant parameters are described in Table 10 72 0027 03A 44 XG2130 E1 Datacom Tester Navigating the Displays Settings P2 10 30 00 Duration Beye The tester is ready MANUAL AUTO TIMER Fig 10 Page 2 of settings menu in RX HI Z framed mode 3 2 1 3 Through Mode Through mode testing supports the instrument is bridged as a resistor into an El path In another word E1 signal transmits through the instrument receiver transparently and to be relayed through the transmitter of the instruments In this mode the transmitter and the receiver of the instrument must be connected into the El path and the transmit clock of the instrument is always extracted from the received E1 signal to guarantee the synchronization of the signal Because of the transparent transmission through the instrument the instrument will not change the data of received El and make the measurements of error counting frame data signal and timeslot analysis Go back to page 1 of Settings menu select OMA in Function item to set relevant parameters All these parameter configurations are same a
15. 0027 03A 139 XG2130 E1 Datacom Tester Performing Measurements Rx Clock Source RX CLK y Tester Transmitter Supplies Clock to Tester receiver As shown in Fig 80 the E1 Datacom tester clocks in data on TD using the same clock that it supplies to the DTE under test on TC It follows that the DTE must use TC to clock out the data on TD The tester does not use the clock on XTC if provided by the DTE under test The E1 Datacom tester uses its internal synthesizer to clock out data on RD and also derive clock signals on RC and TC TC Receiver XTC Not Used gt TD RC Internal RD Synthesizer DTE Under Test E1 Datacom Tester DCE Fig 80 Tester transmitter supplies clock to tester receiver Instrument settings Datacom DCE SYNC Tx Clock Source INTERN Rx Clock Source INTERN DTE Under Test Supplies Clock to Tester Receiver and Transmitter 72 0027 03A 140 XG2130 E1 Datacom Tester Performing Measurements As shown in Fig 81 the E1 Datacom tester uses the clock supplied on XTC to clock in data on TD The DTE under test should have generated this clock internally The E1 Datacom tester uses the clock supplied on XTC to clock out data on RD and also to derive clock signals on RC ans TC TC Not Used Receiver XTC TD Transmitter RC RD DTE Under Test E1 Datacom Tester DCE Fig 81 DTE under test supplies clock to tester transmitter and receiver Instrument settings Datacom DCE SYNC
16. 63 Power Manager menu 72 0027 03A 115 XG2130 E1 Datacom Tester Navigating the Displays When a test is controlled by timer which set in Settings menu please set Auto power off as OFF in order to prevent the instrument auto shut off before the test can be automatically started by the timer tem Option ___ Description When the instrument is not under the test started status and there is ON no keystroke for 5 minutes running Auto power l ff the instrument will be automatically Oo shut off OFF The automatic shutdown function is disabled Press the Backlight key to open the backlight the backlight will be automatically turned off in 30 Auto backlight seconds off The automatic backlight shutdown function is disabled Table 51 Power Manager configurations 3 5 3 RS232 Port As shown in Fig 64 before uploading the stored results in the instruments or upgrading the embedded software by TestManager user should configure the RS232 port firstly as 72 0027 03A 116 XG2130 E1 Datacom Tester Navigating the Displays described in Table 52 Rs232 Port Option Description ON The instrument can communicate with PC via RS232 interface Port State OFF The communication with PC via RS232 interface will be prohibited Table 52 RS232 Port configurations Others DEEPA el aT Port state Accessorial system functions MI SCEL POWER R
17. AA NiMH rechargeable battery GP180AAHC 1800 mAH AC Power Adapter Input AC 100V 240V 10 50 60 Hz 0 45A Output DC12V 1 5A Dimension 249mm x90 128mmMmx60mmMm LxWxH Weight 760g Operating Temperature 0 40 C Storage Temperature 30 70 C Humidity 5 90 no condensation 72 0027 03A 168 XG2130 E1 Datacom Tester Working with TestManager 6 Working with TestManager This chapter briefly describes the software functions system configurations and running environment install and uninstall the software on the PC and how to use TestManager software 6 1 Software Functions 6 2 System Configuration and Running Environment 6 3 Install and Uninstall the Software on the PC 6 4 How to Use TestManager Software 6 1 Software Functions TestManager communicates with the XG series tester via the serial port in PC It can support uploading the stored data from the tester viewing and printing the stored results You can easily check manage and analyze every test result on your PC It also can describe all the error and alarm events happened in the test period time in detail by square drawing and help you in Classification filing and report outputting of the test results Another very important function of TestManager is that you can on line upgrade the embedded software in the tester with this PC software Basic functions of TestManager e Select the type of the instrument e Connect the instrument e Upload the test results which stor
18. Error add are described in Table 9a and Table 9b The setting parameters of Resolution Storage and Duration are described in Table 10 Settings P2 10 30 00 Tx clk MaA 2048K 10ppm Error add BIT RATE 1E 2 Resolution 1MIN Storage NO Duration TIMER 01 MIN Start 2004 04 26 10 25 36 Tester is ready for use Fig 6 Page 2 of Settings menu in TX RX Unframed a ae Default transmit clock Tx clk INTERN sourced from the internal crystal The transmit clock is derived RX CLK from the received signals at the receiver 72 0027 03A 36 XG2130 E1 Datacom Tester Frequency deviation EXTERN 2Mby s cloc Option Navigating the Displays Optional The transmit clock is derived from the external 2 048M Hz clock signal which complied with TTL standard electrically i e the 2MHz square wave signal input as the transmit clock source the yellow cable is connected to the clock signal and the black cable is connected to signal ground Optional The transmit clock is derived from the external standard 2Mb s HDB3 signal which is accessed with 75Q coaxial L9 connector through the special access cable The internal clock can be deviated in the range of 999ppm with the step length of 1 ppm One application of this function is to test the clock recovering capability in receive circuit of the multiplexer under test Table 8 Transmit clock
19. JO Tester is ready for use Fig 17 Page 1 of PCM30CRC 31CRC FAS NFAS edition e When NEFI or AESA framing is chosen no CAS multiframe will be formed In CCS Common Channel Signaling frame TS16 timeslot is used as normal data timeslot which can be used to transmit speech or data like other timeslots in E1 frame Therefore all the bits of TS16 timeslot can be programmed by the user in the form of FO F16 as shown in Fig 21 and Fig 22 72 0027 03A 54 XG2130 E1 Datacom Tester Navigating the Displays FAS NFAS P 2 3 10 30 00 FO1l 03 05 07 09 11 13 15 Sa4 NFAS 1 1 1 1 1 1 1 Sa5 NFAS ff 1 1 1 1 1 Sa6 NFAS 1 1 1 1 1 1 1 1 Sa7 NFAS 1 1 1 1 Tester is ready for use Fig 18 Page 2 of PCM30CRC 31CRC FAS NFAS edition Transmit the TS16 timeslot according to the default settings of the instrument Bits of TS16 timeslot can be programmed by the user An alarm may be generated if relevant bit is aki changed if MFAS or MNFAS bit is changed the equipment under test may be lose multiframe synchronization Table 14 TS16 parameter settings TS16 FORMAT P 1 4 10 30 00 MFAS 000 NMFAS 1011 ABCD ABCD TSO1 1010 TSO2 1010 TS03 1 0 1 0 TS04 1010 TS05 1 0 1 0 TSO6 1010 I Tester is ready for use Fig 19 Page 1 of PCM30 CRC TS16 timeslot settings 72 0027 03A 55 XG2130 E1 Datacom Tester Navigating the Displays TS16 FORMAT P 2 4 10 30 00 2 ABCD ABCD TSO7
20. Navigating the Displays setting relevant parameters and performing the correct test connections can be the test process accomplished properly Every time the instrument is switched on again the instrument automatically uses the settings menu of the last valid test as the default setting menu Only the start stop processing test can become one valid test Press the Setting key to switch to the Settings menu the user can select Gil AUA EOT to set test functions The parameters of settings may vary from function to function And below will explain the settings respectively E1 Datacom tester in case the instrument does not carry the G 703 CO module its option will not show up in the Function option And the user can not make the relevant measurements 3 2 1 E1 Settings Menu 3 2 1 1 TX RX Mode TX RX mode mainly performs out of service framed or unframed bit error test to El transmission networks The display is shown as Fig 4 The settings may be changed by framing format selection The settings of relevant framing are described in Table 5 The settings of relevant PCM30 PCM30CRC PCM31 and PCM31CRC are shown in Appendix A El Frame Structure a TX RX Mode Unframed Settings An unframed test pattern which internally generated is 72 0027 03A 31 XG2130 E1 Datacom Tester Navigating the Displays transmitted by the transmitter of the instrument and is sent into the network unde
21. RDI source 1 Framing Remote alarm A second containing 1 or more CRC4 errors from 1 or more sources Framing 1 Remote alarm 2 1 E BIT errors Tx Direction Non CRC4 Framing A second containing 1 or more errors from 1 or more sources gt 1 Remote alarm A second containing 1 or more CRC4 errors from 1 or more sources Framing 2 1 Remote alarm 805 E BIT errors UAS Same with UAS descriptions in Table 33 Table 38 M 2100 Analysis in E1 TX RX mode e Alarm Seconds Alarm Seconds give the error counts in seconds of loss of signal AIS loss of frame loss of pattern clock slip remote alarm loss of CRC4 multiframe loss of CAS multiframe and so on Alarm Seconds result menu is as shown in Fig 37 and the relevant result analysis items are described in Table 39 72 0027 03A 86 XG2130 E1 Datacom Tester Navigating the Displays Results OODOOH15M25S NONE EM P 1 2 Signal loss AIS Pattern loss Remote alarm Running Please wait ALARM SIGNAL EVENT SECONDS ANALYSI RECORDS Fig 37 Alarm Seconds result menu The effects of framings on alarm seconds counts in Alarm Seconds are as shown in Table 39 tem Description The number of seconds during which signal loss was detected counted over the elapsed test period The number of seconds during which AIS was detected counted over the elapsed test period The number of seconds during which
22. RS 232 V 28 DB25 connector DB44 DB25 adapter cable Maximum data rate 128Kb s Drivers Output voltage into 3kQ to 73k 15V 5V Binary 1 Mark OFF 5V 15V Binary 0 Space ON Slew rate 30V us maximum Short circuit current less than 100mA Receiver Input voltage 3V min Binary 0 Space ON 0 8V max Binary 1 Mark OFF Input impedance 3kQ to 7kQ Pin Assignments See Appendix B 72 0027 03A 161 XG2130 E1 Datacom Tester Technical Specifications b V 35 General V 35 Drivers V 35 Receivers V 28 Drivers 72 0027 03A M34 connector DB44 M34 adapter cable Data and clock circuits are balanced according to V 35 Balanced signal polarity A lt B Binary 1 OFF A gt B Binary 0 ON Control circuits are unbalanced according to V 28 Terminal to terminal voltage 0 44V 0 66V Source impedance 50Q 1509 Resistance between shorted terminals and ground 15092 10 Rise time less than 40ns DC signal offset less than 0 6V Input impedance 1009 10 Resistance between shorted terminals and ground 15092 10 Output voltage into 3kQ to 7kQ 15V 5V Binary 1 OFF 5V 15V Binary 0 ON Slew rate 30V us maximum Short circuit current less than 100mA 162 XG2130 E1 Datacom Tester Technical Specifications V 28 Receiver Input voltage 3V min Binary 1 OFF 0 8V max Binary 0 ON Pin Assignments See Annex B c V 36 General V 11 Driver V 11 Receiver V 10 Drive
23. Records and so on Press F1 F2 F3 and F4 softkeys to select the analysis displays accordingly in the menu 72 0027 03A 75 XG2130 E1 Datacom Tester Navigating the Displays As the different framing has been chosen the results displays in El TX RX mode are different refer to the effects of framings on results as shown in Table 28 a Basic Analysis Basic Analysis performs result statistics of error count error free seconds current error ratio average error ratio for BIT FAS CODE CRC4 and E BIT errors and errored block count and background errored blocks only appears when unframed testing is chosen for BIT errors Basic Analysis result menu is as shown in Fig 33 The relevant result analysis items are described in Table 29 And the effects of framings on Basic Analysis are as shown in Table 30 Results OODOOH15M25S T ce EASTON BIT P 1 2 Errors 2 EFS 1713 Current err ratio 0 Average err ratio 5 694E 10 Running Please wait BASIC G 821 G 826 ANALYSI ANALYSI ANALYSI Fig 33 Basic Analysis result menu The effects of alarms on error counts in Basic Analysis are as shown in Table 31 Table 32 72 0027 03A 76 XG2130 E1 Datacom Tester Navigating the Displays Result ae Description Analysis Errors are counted for all sources over total elapsed time Counting may be inhibited under certain alarm conditions see Effects of Alarms o
24. X 21 interface when 72 0027 03A 166 XG2130 E1 Datacom Tester Technical Specifications configured as DTE Asynchronous Mode General Rates Not provided for X 21 operation 50 b s 75 b s 150 b s 300 b s 600 b s 1 2K b s 2 4 Kb s 4 8 Kb s 7 2 Kb s 9 6 Kb s 19 2 Kb s Character Format e Character length 5 6 7 or 8 bits e Parity odd even O 1 or none e Stop bits 1 or 2 character length 6 7 or 8 bits 1 5 character length 5 bits Data Polarity Normal or inverse polarity may be selected Error Add 5 3 3 Receiver Same as E1 Bit error only y Synchronous Mode Rates Clock Sources Maximum rate 2 048 Mbit s Datacom interface Internal DCE mode only Data is clocked coincident with the transmitter output clock Both sources may be inverted allowing selectable clock data phase relationship X 21 operation limited as follows DTE datacom interface DCE internal Asynchronous Mode General 72 0027 03A Not provided for X 21 operation 167 XG2130 E1 Datacom Tester Technical Specifications Rates As selected for transmitter Character Format As selected for transmitter Data Polarity Normal or inverse polarity may be selected 5 4 Protocol Converter Specifications Refer to the parameters in E1 and Datacom 5 5 Other Specifications Serial Port RS 232 Baud Rate 19 2 Kb s Character Length 8 bit Parity None Stop Bits 1 bit Battery 5x1 2V
25. XG2130 E1 Datacom Tester Navigating the Displays rem omon osc Pseudorandom Binary Sequence PRBS is suitable for bit error rate BE measurement BERT pattern Fixed code or static binary code oem simulate AIS 1111 and etc m BIT is a user programmable word The instrument transmits and receives PRBS code according to the normal 1 or 0 polarity Code 1 is transmitted as 1 and code Polarity o is transmitted as 0 The instrument transmits and receives PRBS code according to the reverse polarity Code 1 is transmitted as O and code 0 is transmitted as 1 Table 7 Test Pattern and Polarity parameter settings Note when performing measurements between two testers and the test pattern polarity transmitted is not confirmed the user could switch to the reverse pattern e Page 2 of Setting menu in TX RX mode unframed Press the PgDn key to enter into the page 2 as shown in Fig 72 0027 03A 35 XG2130 E1 Datacom Tester Navigating the Displays 6 Press the Cursor Right and Down key to move the cursor to the positions to set Transmit clock Error add Resolution Storage and Duration parameters and select relevant parameters by pressing F1 F2 F3 F4 softkeys The setting parameters of Transmit clock are described in Table 8 The setting parameters of
26. a Current Setting As shown in Fig 55 the current setting appears only in the first page When Eqfe its is chosen displays as shown in Fig 56 will appear After named the current setting the instrument will save the setting as the name with ce lock followed Storages SETTINGS GGTAMG 1 lt 01 gt Setting1 lt 02 gt Setting2 lt 03 gt Setting3 01 vacant setting storage STORE OODOOH15M25S P 1 3 Mode THROUGH Mode THROUGH Mode APS DELAY Mode APS DELAY Fig 55 Current setting 72 0027 03A 108 XG2130 E1 Datacom Tester Navigating the Displays Edit record s name Name 81549747 Input 1 SELECT DELETE A EXIT Fig 56 Edit the record s name b Stored Settings The stored settings are numbered as shown in Fig 57 User can view recall rename and delete the stored settings as described in Table 48 Storages SETTINGS P 1 3 CURRENT Mode THROUGH lt 01 gt AE Mode THROUGH lt 02 gt Setting2 Mode APS DELAY lt 03 gt Setting3 Mode APS DELAY 01 vacant setting storage VIEW RECALL UNLOCK Fig 57 Stored settings If the stored setting is marked with user can only make the activities of view recall and unlock If the stored setting is marked with user can make the activities of view recall lock rename and 72 0027 03A 109 XG2130 E1 Datacom Tester Navigating the Displays delete The capacity of sett
27. alarms are injected therefore some error insertion functions will be disabled accordingly Error insertion type is also related with the frame format as shown in Table 12 The settings of alarms insert ion parameters and insertion permitted error types are described in Table 12 b Page 2 of PCM Simulator Settings Press the PgDn key to enter into page 2 of PCM Simulator settings menu as shown in Fig 15 Move the cursor to the positions to set Error add TX FAS NFAS TS16 Signal Injection and Tx timeslots parameters by pressing F1 F2 F3 and F4 softkeys The settings of 72 0027 03A 50 XG2130 E1 Datacom Tester Navigating the Displays relevant these parameters are describled in Table 9a and 9b Settings P2 10 30 00 Error add M20 RATE 1E 2 Tx FAS NFAS NORM TS16 NORM Signal injection IDLE WORD 10101010 TX Tester is ready for use Fig 15 Page 2 of PCM Simulator settings menu oaa assa eA inserted The instrument transmits the wrong FRAME frame alignment signals to check if the fe equipment under test is able to give the ae corresponding alarm If the equipment under test can give AB AIS alarm when the instrument None transmits AIS all 1 alarm ALARM MF LOSS If the equipment under test can give the alarm when the instrument sets Bit3 of NFAS data in transmitted E1 data stream If the equipment under test can giv
28. as the one in E1 TX RX mode Results OODOOH15M25S VPA NeoN P 2 2 Octet loss Running Please wait BASIC G 821 LARM ANALYSI ANALYSI SECONDE Fig 53 Page 2 of Alarm Seconds menu in G 703 CO 3 3 4 Protocol Converter Result Menu When making measurements with a protocol converter the result menu provides Basic Analysis G 821 Analysis G 826 Analysis M 2100 Analysis Alarm Seconds Signal Analysis and Event Records User can select different analysis by pressing F1 F2 F3 F4 softkeys The result displays in Protocol Converter is relative to the settings of Rx interface as described below When RX interface is selected as 1l the result menus are the same as the ones in ET When RX interface is selected as BEA 11 the result menus are the same as the ones in Datacom When RX interface is selected as cyy kiee the result menus are the same as the ones in G 703 CO 72 0027 03A 106 XG2130 E1 Datacom Tester Navigating the Displays 3 4 Storages Menu Storages menus provide following functions e Recall the stored settings to make the settings of a test automatically Modify some parameters and the user settings can be saved or recalled e After making the settings choose Storage item as YES to save the results of this test and start the test When th
29. assessment of transmission performance in the selected one or more timeslots Select with the framed structure such as AYET ZETTE ZUEN AEA There are 3 setting pages in TX RX mode among which the setting contents of page 1 and page 3 are aS same as ones in the unframed testing setting menus e Page 1 of settings menu in TX RX mode framed Refer to the relevant parts in page 1 of the settings menu in 72 0027 03A 40 XG2130 E1 Datacom Tester Navigating the Displays TX RX mode unframed testing e Page 2 of settings menu in TX RX mode framed Press the PgDn key to enter into page 2 of settings menu in TX RX mode framed testing move the cursor to the positions to set Tx Rx timeslots Idle pattern parameters as shown in Fig 7 The relevant parameters to select are described in Table 11 Settings P2 10 30 00 Tx Rx timeslots TX Rx Bandwidth Tx 00 64K Rx O0O 64K Idle pattern 10101010 Tester is ready for use TX DIVERSE AS RX Fig 7 Page 2 in TX RX mode framed testing e Page 3 of settings menu in TX RX mode framed testing Refer to the descriptions of relevant parts in page 2 of settings menu in TX RX mode unframed testing item Option Description The selected timeslots in the transmit PAYS 3 direction are different to the ones in the receive direction Tx Rx timeslots 72 0027 03A 41 XG2130 E1 Data
30. default settings When T or eVER framing is chosen the user can set Si bits A bit Sa4 Sa8 bits in FAS and NFAS frame as shown in Fig 16 FAS NFAS 10 30 00 Si FAS A Sa4 Sa8 wes CEPO Tester is ready for use Fig 16 PCM30 31 FAS NFAS edition e When REA or ZAVESA framing is chosen a CRC 4 Multiframe is formed CRC MFAS provides synchronization of CRC4 Multiframe The user can set Si bit in FAS frame A bit Sa4 Sa8 bits and C1 C4 bits in NFAS frame of FO F15 sub frames as shown in Fig 17 and Fig 18 The settings of TS16 parameters are described in Table 14 TS16 settings will be switched to different menus according 72 0027 03A 53 XG2130 E1 Datacom Tester Navigating the Displays to frame structure When eet or EETA framing is chosen CAS multiframe is formed The Multiframe Alignment Signal MFAS provides synchronization of the signaling multiframe The user can set MFAS MNFAS bits and CAS Channel Associated Signaling signaling ABCD bits of TS1 TS31 There have 4 pages in all as shown in Fig 19 and 20 among which the settings from page 2 to page 4 are same only the timeslot numbers are different Note do not set all ABCD bits of all 30 or 31 timeslots as 0000 otherwise the CAS Multiframe alignment will be lost FAS NFAS P 1 3 10 30 00 2 FOO 02 04 06 08 10 12 14 Si FAS W 0 00 00 0 FOl 03 05 07 09 11 13 15 Si NFAS 0 O 1 O 1 1 1 1 Aras O O0 O0 O O 0 O
31. f o 1 0 TS08 1010 TS09 1010 TS10 1010 TS11 1010 TS12 1010 TS13 1010 TS14 1010 Tester is ready for use Fig 20 Page 2 of PCM30 CRC TS16 timeslot settings TS16 FORMAT P 1 2 10 30 00 MSB LSB FO1 f1010 FO3 1010 FO5 1010 Forth O10 Tester is ready for use Fig 21 Page 1 of PCM31 CRC TS16 timeslot settings TS16 FORMAT P 2 2 10 30 00 MSB LSB MSB Foof 01 1 0 F11 1 0 1 1 0 F13 1 0 1 1 0 010 010 010 01010 F16 10 F15 1 0 1 Tester is ready for use Fig 22 Page 2 of PCM31 CRC TS16 timeslot settings 72 0027 03A 56 XG2130 E1 Datacom Tester Navigating the Displays In El framed structure idle word or audio signal can be inserted into some timeslots based on needs with the menu as shown in Fig 23 The settings of Signal injection parameters are described in Table 15 Option Description Insert 8 bit user defined idle codes to one or more timeslots as shown in Fig 14 Insert VF tone signals with programmable frequency and level to one or more timeslots frequency range 200HZ 3400Hz with the step of 10Hz level range 60dBm 3dBm Table 15 Signal Injection parameter settings Settings P2 10 30 00 Error add FAS RATE 1E 2 TX FAS NFAS NORM TS16 NORM Signal injection AUDIO EREN Hz 10 dBm TX TS Tester is ay use ro E Leonel PA Fig 23 Audio signal injection parameter settings menu 3 2 2 Datacom
32. of the equipment under test Test Description e The transmit clock deviation testing can be performed in the TX RX mode and PCM Simulator mode e The settings are described in Section 3 2 1 and Section 3 2 6 e All the test results will be displayed in Signal Analysis menu 4 2 2 Datacom Service Testing The transmission quality of datacom path is mainly evaluated by bit error rate testing which commonly uses Errors EFS Current error ratio Average error ratio statistics indexes The E1 Datacom tester can perform BER testing and other analysis conveniently to V 24 RS 232 V 28 V 35 V 36 X 21 RS 485 RS 449 EIA 530 EIA 530A_ with synchronous and asynchronous test mode It supports the data rate measurement range from 50b s 2 048 Mb s In digital transmission system datacom interfaces V 24 RS 232 V 28 V 35 V 36 X 21 RS 485 RS 449 EIA 530 and ElA 530A are commonly used to interconnect between the narrow band data terminals or networks These interfaces 72 0027 03A 132 XG2130 E1 Datacom Tester Performing Measurements have various control circuits including GND data signals clock signals and handshaking signals And all these signals can be classified with single end and differential signals The different datacom interfaces have different signals which may be single end or differential conformed to various voltage level standards such as V 11 V 28 and V 35 For example the X 21 interf
33. parameter settings 72 0027 03A 37 XG2130 E1 Datacom Tester Navigating the Displays O Description O Insert bit errors Effective under various of Insert Frame Alignment Signal FAS errors type Insert CRC4 errors Effective only under the framed testing with CRC4 frame structure Insert E BIT errors Effective only under the framed testing with CRC4 frame structure Option EZ Ez Error CODE Insert CODE errors Effective only under add the AMI line code type cea Table 9a Error add type parameter settings Item Option Description _ _ SINGLE Press the Single Err Add key on the keyboard to inject one error per time Every time this key is pressed one error such as BIT FAS CODE E BIT CRC4 is inserted by the transmitter ERRORS indicator turns on for one time with a second update Error add Errors are injected at the constant fixed rate such as MA WEE WS SE Ae M3 In the mean time the ERRORS RATE indicator turns on OFF Errors insertion is forbidden and pressing the Single Err Add key is invalid Table 9b Error add parameter settings 72 0027 03A 38 XG2130 E1 Datacom Tester ee Resolution MELE Storage 72 0027 03A Navigating the Displays AIM The time resolution to record the BEIT The time time of errors and alarm in the stored event records for the histogram analysis Save the test resu
34. pattern Pattern loss loss was detected counted over the elapsed test period The number of seconds during which clock slips were detected counted over the elapsed Clock slip l test period Only provided in PRBS test patterns 72 0027 03A 87 XG2130 E1 Datacom Tester Navigating the Displays The number of seconds during which remote Remote alarm was detected counted over the elapsed alarm l test period The number of seconds during which remote Remote MF alarm multiframe alarm was detected counted over the elapsed test period The number of seconds during which frame loss was detected counted over the elapsed test period The number of seconds during which CAS CAS MF loss multiframe loss was detected counted over the elapsed test period The number of seconds during which CRC CRC MF loss multiframe loss was detected counted over the elapsed test period Table 39 Alarm Seconds in E1 TX RX mode Seconds Counted Signal Loss Clock Slip Remote Remote MF 72 0027 03A 88 XG2130 E1 Datacom Tester Navigating the Displays Frame oss gt casmrioss ecm iss Table 40 Effects of framings on alarm seconds counts f Signal Analysis Signal Analysis provides the real time signal measurement of received signals including Rx line rate frequency offset and signal level as shown in Fig 38 The displays of Signal Analysis in E1 unframed and fram
35. test or Aaa if you want the system under test to supply the clock For both DCE and DTE configurations when or Safe is selected you can choose which clock edge you want to clock the data in on Select to clock on the rising edge or jg to clock on the falling edge The settings parameters of the synchrnous clock are as shown in Table 21 When making measurements in synchronization mode the clock configurations are pretty complex When the instrument 72 0027 03A 64 XG2130 E1 Datacom Tester Navigating the Displays emulates a DTE or a DCE the clock configurations should be properly set otherwise some alarms such as Pattern Loss Errors and Clock Loss will be generated RX CLK eee aa source g clock sense hae e Table 21 Synchronous Clock Configurations The settings of Tx data rate parameters are as shown in Table 22 64kb s or 1 2kb s 2 4kb s 4 8kb s Tx data below 9 6kb s 19 2kb sS H38 4kb s mo eee Table 22 Tx data rate configurations 3 2 2 5 Page 3 of Datacom Settings Menu in SYNC Press the PgDn key to enter into page 3 of Datacom nr settings menu The instrument also detects the clock data and handshaking signals in SYNC mode as shown in Fig 27 An 72 0027 03A 65 XG2130 E1 Datacom Tester Navigating the Displays effective clock is needed under synchronization mode It is very easy for the user to observe the statuses of these signal
36. 0 00 SD 103 OK RS 105 RD 104 NONE CS 106 SCTE 113 DTR 108 SCT 114 E DSR 107 SCR 115 RLSD 109 I Tester is ready for use Fig 25 Control circuits of a typical V 35 interface 3 2 2 4 Page 2 of Datacom Settings Menu in SYNC When the test mode is chosen as BATS press the PgDn key to enter into page 2 of Datacom settings menu and press the Cursor Right and Down key to move the cursor to positions to set Tx clock source Rx clock source Tx output clock sense and Tx data rate parameters and then select relevant parameters by pressing F1 F2 F3 F4 softkeys as shown in Fig 26 Before making sttings of synchronous clock the user must consider what transmit and receive clock configurations is to be used details are given in the relavant parts of chapter 4 Performing the Measurements 72 0027 03A 62 XG2130 E1 Datacom Tester Navigating the Displays Settings P2 10 30 00 Tx clock source LUNA Rx clock source lt RX CLK gt Tx output clock sense Tx data rate 1 2Kb s Tester is ready for use INTERN RX CLK Fig 26 Page 2 of Datacom setting menu in SYNC Note When the X 21 interface is selected The Tx and Rx clocks are fixed at when the instrument emulates a DCE or Aaa when the instrument emulates a DTE To Select the Transmit Clock Source Move the cursor to Tx clock source to selec
37. 04 26 10 25 36 Tester is ready for use SI NGLE RATE Ea Fig 32 Page 5 of Protocol Converter settings menu Fixed at ANE No frequency deviation EN EE EG EN Fixed at MT eee SEG ae Clock sense j or J LER Fixed at MAAT Table 27a Tx Clock configurations in Protocol Converter RX clock source parameter Rx interface PA on ae at Lis RS 449 EEE EE EET EERE or Clock sense j or J G 703 CO Fixed at AAA Table 27b Rx Clock configurations in Protocol Converter Clock sense j or 72 0027 03A 74 XG2130 E1 Datacom Tester Navigating the Displays 3 3 Results Menu After setting up the measurement parameters user can start a test with the instrument by pressing the Start Stop key When performing the measurements the Start Stop LED indicator turns on then press the Result key to display all the results The Results menu has different displays under various test modes And we will describe them respectively according to different test settings 3 3 1 E1 Results Menu 3 3 1 1 Results Menus in E1 TX RX Mode 3 p u ie ct Table 28 Effects of framings on results in E1 TX RX mode The Results menus in the E1 TX RX mode provide full measurement analysis including Basic Analysis G 821 Analysis G 826 Analysis M 2100 Analysis Alarm Seconds Signal Analysis Event
38. 1 Si is reserved for international use Bit 2 is always set to 1 Bit 3 of the NFAS contains the A bit which indicates a remote or distant alarm for example far end multiplexer out of synchronization Bit 3 0 indicates normal operation no alarm Bit 3 1 indicates that one of the following fault conditions has occurred 72 0027 03A 176 XG2130 E1 Datacom Tester Appendix A Power supply failure Codec failure Failure of incoming 2Mb s signal Frame alignment error Frame alignment signal error ratio gt 10 Bit 4 Bit 8 ITU T recommendations allow the S bits Sa4 to Sa8 to be used in specific point to point applications Bit Sa4 may be used as a message based data link for operations maintenance and performance monitoring The signal Originates at the point where the frame is generated and ends where the frame is split up Bits Sa5 to Sa8 are all intended for national use and when unused are Set to logic 1 Channel associated signaling CAS Once the multiplexer has gained frame alignment it searches in timeslot 16 for the multiframe alignment signal MFAS 0000 in bits 1 to 4 A multiframe consists of 16 frames and 0000 in bits 1 to 4 signifies the first of these frames The multiframe is only necessary when CAS is used that is PCM30 Timeslot 16 contains the information necessary for switching and routing all 30 telephone channels The signaling between the near end and far end multiplexer takes place usi
39. 1010 F04 10101010 F06 Running Please wait FAS TS NFAS TS16 MONITOR ACTIVIT Fig 45 TS16 in PCM31 CRC framing 72 0027 03A 96 XG2130 E1 Datacom Tester Navigating the Displays e TS Monitor TS Monitor is valid for all framings and provides 64 kb s data channel monitoring updated every one second The 8 bit binary word and hex word of the timeslot selected will be displayed in real time as shown in Fig 46 Results 00D00H15M25S TS ANALYSIS TS select 01 Data 10101010 AAH Listen E J VOL Running Please wait FAS TS NFAS MONITOR ACTIVIT Fig 46 TS Monitor in TS Analysis e ACTIVITY Activity is valid for all framings and provides the activity monitoring for all 64 kb s data channel In PCM30 or PCM30 CRC framing timeslot 16 contains the frame alignment of multiframe information necessary for switching and routing all 30 telephone channels So it is not valid for timeslot activity monitoring All the timeslot activities are displayed with B busy and I idle The busy or idle status of timeslot is achieved by monitoring the 8 bit data of every timeslot in real time If the 8 bit data of certain timeslot is consistent with the idle code which can be set in Settings menu of the instrument then that timeslot status is idle otherwise it is busy as shown in Fig 47 72 0027 03A 97 XG2130 E1 Datacom Tester Navigating
40. 7 03A 70 XG2130 E1 Datacom Tester Navigating the Displays Tx Rx interface Table 24 Tx Rx interface parameter settings EIA 530A REET GEEZER EEN EEN ma O a Table 25 Matching relation of Tx and Rx interface The test data bandwidth is determined by the Tx interface settings as shown in Table 26 NOAK N 1 30 N 6AK N 1 20 N 64K N 1 31 N GAK N 1 31 72 0027 03A 71 XG2130 E1 Datacom Tester Navigating the Displays E EEN N 64k N 1 32 EIA 5304 G 703 CO Table 26 Tx data bandwidth descriptions The bandwidth of the Tx data set must equal to that of the Rx data otherwise no test will be allowed to start For the settings of other parameters in page 1 please refer to the descriptions of the relevant interfaces 3 2 4 2 Page 2 of Protocol Converter Settings When the Tx interface is chosen as M refer to the settings menu of B When the Tx interface is chosen as V 245 WEL WETS KEF GED EEG ESET or EEL refer to the settings menu of PyAWe Neely When the TX interface is chosen as efy veye e refer to the settings menu of FAE A So 3 2 4 3 Page 3 of Protocol Converter Settings When the Rx interface is chosen as refer to the settings menu of 3i When the Rx interface is chosen as W921 VEE WETS EEFI ERT GEES SPEED or EETA refer to 72 0027 03A 72 XG2130 E1 Datacom Tester N
41. C4 and E BIT as shown in Fig 40 The relevant descriptions are shown in Table 43 The effects of framing on errors count are shown in Table 43 Results OODOOH15M25S temo eL FAS errors CODE errors CRC4 errors E BIT errors Running Please wait ERRORS M 2100 LARM COUNT ANALYSI FEON DS Fig 40 Errors Count result menu in El RX HI Z mode Errors p Counter is Disabled by Counted JUAJOENWIDd JYITEWId e Loss of signal The framer is searching for FAS alignment and or synchroniza tion at either the CAS or CRC4 multiframe level ei of frame synchronization CRC4 ae either the FAS or CRC4 level 72 0027 03A 92 XG2130 E1 Datacom Tester Navigating the Displays Sei Loss of frame synchronization at either the FAS or CRC4 level Table 43 Effects of framings on Errors Count b M 2100 Analysis M 2100 Analysis menu is as shown in Fig 36 And the relevant analysis results are described in Table 38 M 2100 Analysis is not provided in unframed testing c Alarm Seconds Alarm Seconds menu is as shown in Fig 37 And the relevant analysis results are described in Table 39 The effects of framings on Alarm Seconds are as shown in Table 40 d Signal Analysis Signal Analysis menu is as shown in Fig 38 And the relevant analysis results are described in Table 41 e Event Records Event Records result menu is as shown in Fig 39 f TS Analysis
42. D Transmitted Data sourced from DTE TC Transmit Clock sourced from DCE XTC Transmit clock Sourced from DTE a E1 Datacom Tester as DTE When the E1 Datacom tester is configured as a DTE it can be connected to a DCE normally a modem or some other data set making it possible to test the whole datacom circuit from end to end The DCE under test always supplies data on RD and clock on RC to the E1 Datacom tester Tester Transmitter Supplies Clock to DCE under test As shown in Fig 77 the El Datacom tester uses its internal synthesizer to clock out data on TD to DCE under test It supplies a clock on XTC which should be used to clock this data into the DCE The E1 Datacom tester does not use the clock on TC if provided by the DCE under test Internal Synthesizer XTC gt Receiver El Datacom Tester DCE Under Test DTE Fig 77 Tester supplies clock to DCE under test 72 0027 03A 137 XG2130 E1 Datacom Tester Performing Measurements Instrument settings Datacom DTE SYNC Tx Clock Source INTERN DCE Under Test Supplies Clock to Tester Transmitter As shown in Fig 78 the E1 Datacom tester uses the clock supplied on TC to clock out data on TD to the DCE under test A delayed version of this clock is sent back to the DCE on XTC With this configuration there are two ways that the DCE can clock in data from the E1 Datacom tester The data is clocked into the DCE coincident with the clock it is supply
43. G2130 E1 Datacom Tester Performing Measurements with the protocol converter under test e Throughout the test process bit error can be directly inserted into the path via the Single Err Add key of the instrument to verify the operating status of the instrument and signals transmitted and received in the path 72 0027 03A 156 XG2130 E1 Datacom Tester Technical Specifications 5 Technical Specifications This chapter introduces the technical specifications of all the interfaces in the E1 Datacom tester 5 1 E1 Specifications 5 2 G 703 CO Specifications 5 3 Datacom Specifications 5 4 Protocol Converter Specifications 5 5 Other Specifications 5 1 E1 Specifications 5 1 1 General Measuring interface 2048Kb s Alarm LEDs Signal Loss AIS Frame Loss MFrame Loss CAS and CRC Remote Alarm RDI and Remote MF Pattern Loss Errors Clock Slip Alarm Hierarch The more important alarm will Suppress a lesser alarm see below Hierarch Alarm and Error Signal Loss o CAS MF Loss CRC MF Loss Pattern Loss Remote Alarm Remote MF Alarm 72 0027 03A 157 a XG2130 E1 Datacom Tester Technical Specifications E1 standards Comply with G 703 G 706 G 732 PCM30 G 704 with CAS multiframe PCM31 G 704 with no multiframe PCM30CRC G 704 with CAS and CRC4 multiframe PCM31CRC G 704 with CRC4 multiframe Test Pattern PRBS 277 1 0 151 2 1 0 151 211 1 0 153 29 1 Fi
44. GAO XG2130 E1 Datacom Tester USER S MANUAL XG2130 E1 Datacom Tester Contents Contents COMPCIIES Seowecssiew asd va uadua wan ue cewedduvacmeucnseeusasaueaateaumadweeass cies 1 1 QVGR WIG W sicccecieiica sie ccaee reas dese Seite cedekeena saan eeded ee 4 1 1 Icon Description ssssssrrsssrererrrrrrererrrerrrrerrrsn 4 1 2 Product Overview sssssssrserrrrerrrerrrrerrrerrrrerrrene 5 1 3 Product CompositionS ssssesssesrererrrrerrrerrrrerrrene 8 1 4 Functional Keyboard sssssssrsssrrrerrrrrrrrerrrrerrrene 9 doo URED URNGIGALONS eana elias eat also aE EE 12 1 6 LED icon IAGICALIONS ooctiatcneteratexvardnender ial e a ates 16 2 Getting Started ssssssss25 555 5 s5 5 19 2 1 Unpacking Check ssssssssrrsssrresrrrerrrrsrrrerrresrns 19 2 2 POWer Supply aeeoeia e E ENEE 21 2 3 SWitCh O fuera diaa e ea A a a Ea 24 2 4 Communication with PC scr setss forts ase 26 3 Navigating the DisplayS ccceeesseeeeeseeeeesseeeeneas 28 3 1 Menu OvervieW s ss ssssssrresrrrerrresrrrerrrrsrrrerrresrn 28 3 2 Settings Men s sssssssrssrrrsrrresrrrerrrrsrrrerrresrne 30 3 3 Results MenU sean citstnccvcdenincne eatin teas eens 75 3 4 Storages Menu sssssssssrrsrrresrrrerrresrererrrrsreree 107 3 5 Others Men esr terete tert a E 113 4 Performing Measurements cccecsceeeseneeeeseeeeeees 122 Meal MOMEIVICW o a y a a iia eaten weet 122 4 2 P
45. PS Delay Mode The result menu displays the delay time of E1 signal when the system under test making APS with maximum measurement delay of 2s Second in the accuracy of 1us microsecond as shown in Fig 49 In the menu user should make the measurements by pressing FL If the delay time exceeds the limitation or the APS condition is not reachable the information will appears on the prompt line Results APS delay Test is completed START TEST Fig 49 APS Delay result menu 72 0027 03A 99 XG2130 E1 Datacom Tester Navigating the Displays 3 3 1 6 Results Menu in E1 PCM Simulator Mode PCM Simulator only provides errors alarms VF tone insertion and other analysis for framed E1 signals Therefore the results menu includes Errors Count Alarm Seconds Signal Analysis TS Monitor please refer to Section 3 3 1 1 for details In TS Monitor menu VF tone frequency and level measurement results of the timeslot selected is added 3 3 2 Datacom Result Menu When making measurements with the datacom interfaces the result menu provides Basic Analysis G 821 Analysis Alarm Seconds Signal Analysis and Event Records User can select different analysis by pressing F1 F2 F3 F4 softkeys as shown in Fig 50 Results OODOOH15M25S T ESTRAE P 1 2 Errors 2 EFS 1713 Current err ratio 0 Average err ra
46. S analysis displays of PCM30 or PCM31 framing is as shown in Fig 42 Results OODOOH15M25S TS ANALYSIS EOIN Si FAS FAS O O O 1 1 O 1 1 Si A Sa4 Sa8 NFAS 0 1 1 1 1 L 1I 1 Running Please wait FAS TS NFAS MONI TOR ACTIVIT Fig 42 FAS NFAS in PCM30 31 framing FAS NFAS analysis displays of PCM30 CRC or PCM31 CRC framing is as shown in Fig 43 Results OODOOH15M25S ce TS ANALYSIS ZOMIN P 1 3 SMF1 SMF2 FAS X0011011 X0011011 NFAS O1XXXXXX O1XXXXXX NFAS OLXXXXXX OLXXXXXX Running Please wait FAS TS NFAS MONITOR ACTIVIT Fig 43 FAS NFAS in PCM30 31 framing 72 0027 03A 95 XG2130 E1 Datacom Tester Navigating the Displays e MFRAME MFRAME is only valid for PCM30 or PCM30CRC framing In this menu user can monitor MFAS and NMFAS word and 4 bit ABCD signaling words TSO1 TS15 TS17 TS31 as shown in Fig 44 4 pages in all Results OODOOH15M25S oe TS ANALYSIS UAIN P 1 4 MFAS 0000 NMFAS 1011 ABCD ABCD ABCD TSO1 1010 S02 1010 TS03 1010 TSO4 1010 TSO5 1010 TSO6 1010 Running Please wait FAS TS NFAS MONITOR ACTIVIT Fig 44 MFRAME in PCM30 CRC framing e TS16 TS16 is only valid for PCM31 or PCM31CRC framing In this menu user can monitor the data of timeslot 16 in FOl F16 multiframes as shown in Fig 45 3 pages in all Results OODOOH15M25S TS ANALYSIS UFG MSB LSB FOl 10101010 F02 FO3 1010
47. S232 LANEOUS MANAGER PORT Fig 64 RS232 Port menu When the RS232 port state is configured as N other operations of the instrument will be disabled The displays will be locked temporarily before the port state becomes OFF Please disable the port state as OFF when the communication with PC is completed to perform other operations 3 5 4 Time amp Date When recording results it is useful to have certain events time stamped for example Alarms and Error Seconds As 72 0027 03A 117 XG2130 E1 Datacom Tester Navigating the Displays shown in Fig 65 user can set up the new time and date as described in Table 53 Others DOSY Clock mode RUN Date 2004 03 21 Time 12 40 55 Accessorial system functions TIME KEYBOA SELF amp DATE RD TEST TEST Fig 65 Time amp Date menu RUN To run the new real time clock after the modification of the date and time Clock Mode Modify the date and time of the SETUP instrument aca Select between 2000 2099 Time Table 53 Time amp Date configurations 3 5 5 Keyboard Test Keyboard Test function can detect whether the keyboard of 72 0027 03A 118 XG2130 E1 Datacom Tester Navigating the Displays the instrument functions properly or not Except for the Power key all other functional keys can be tested As shown in Fig 66 the keyboard test can be performed one by One according to the prompt information in displ
48. SES and unavailable time UAS in both transmit Tx and receive Rx directions for in service and out of service testing Since it counts errors based on frame data M 2100 Analysis is only provided in the El framed testing as shown in Fig 36 The relevant result analysis items are described in Table 38 72 0027 03A 84 XG2130 E1 Datacom Tester Navigating the Displays Results OODOOH15M25S ere eR TX ES 0 SES 0 UAS 0 Running Please wait BASI C G 821 G 826 ANALYSI ANALYSI ANALYSI Fig 36 M 2100 Analysis result menu Item Description A second containing 1 or more errors from 1 or more sources Rx Non CRC4 1 Signal loss 1 Frame loss 2 1 AIS 1 errored FAS 28 frame bit errors Direction Framing A second containing 1 or more errors from 1 or more sources CRC4 1 Signal loss 1 Frame loss 1 Framing AIS 2 1 CRC4 errors 805 CRC4 errors A second containing 1 or more Non CRC4 errors from 1 or more sources Framing 1 Signal loss 1 Frame loss 1 AIS 28 frame bit errors CRC4 A second containing 1 or more Framing errors from 1 or more sources 72 0027 03A 85 XG2130 E1 Datacom Tester XG2130 E1 Datacom Tester _________________ Navigating the Displays the Displays a Signal loss 1 Frame loss 1 a S 2 805 CRC4 errors uas same with UAS descriptions in Table 33 A second containing 1 or more Non CRC4 errors from
49. TestManager Accessories Waterproof package Special test cables AC power adapter rechargeable batteries automobile cigarette lighter adapter cable and so on 1 3 1 Appearance of the tester Front panel LCD display LED alarm and status indicators keyboard Back panel four disassembly proof label serial number label Front end E1 unbalanced signal input output interface L9 coaxial DB 44 Datacom signal input output interface El balanced signal input output interface E1 external clock signal access interface G 703 CO signal input 72 0027 03A 8 XG2130 E1 Datacom Tester Overview output interface 12VDC input jack Back end end cover slightly press the spring fins at the two sides of end cover to remove end cover And the user can see battery compartment and RS232 port jack The appearance of the instrument is as shown in Fig 1 1 3 2 Accessories of the tester 1 4 Waterproof package E1 75 unbalanced test cable E1 1209 balanced test cable G 703 CO test cable Datacom interfaces adapter cables Datacom interfaces loop back adapter E1 external clock signal access cable option AC power adapter RS232 communication cable Automobile cigarette lighter battery adapter cable AA NiMH rechargeable batteries TestManager setup CD User s manual Functional Keyboard The E1 Datacom tester has 16 functional keys at the front panel including main functional keys softkeys cursor keys page keys
50. The effects of alarms on error counts in G 821 Analysis are as shown in Table 34 Table 35 5ignal Loss AlS Pattern Loss ES SES Table 34 Effects of alarms on ES SES in the unframed E1 CAS CRC Signal Frame Pattern Loss Loss Frame Frame Loss Loss Loss eee eee eee EA Table 35 Effects of alarms on ES SES in the framed E1 c G 826 Analysis G 826 Analysis performs result statistics of errored block seconds EBS and EBS severely errored block seconds SEBS and SEBS background blocks errors BBE and BBE unavailable time UAS and UAS for BIT errors Since G 826 Analysis counts the errors based on continuous serial data blocks so G 826 Analysis is not provided in El framed testing as shown in Fig 35 Results OODOOH15M25S ce EBS 0 SEBS 0 BBE 0 UAS 0 I Running Please wait BASIC G 821 G 826 ANALYSI ANALYSI ANALYSI gt gt Fig 35 G 826 Analysis result menu 72 0027 03A 82 XG2130 E1 Datacom Tester Navigating the Displays The relevant result analysis items are described in Table 36 Errored Block Seconds EBS are counted for all The number of errored block seconds counted over the available time expressed as a percentage of total elapsed time of a test period in seconds The number of severely errored block seconds SEBS is counted over the available time A severely errored block second is a second which has an errored block rati
51. a backlight key a power switch key a start stop key a single error insert key etc The arrangement of functional keys and names of keys from left to right are as shown in Fig 2 These functional keys are described as in Table 1 72 0027 03A 9 XG2130 E1 Datacom Tester Overview DB44 Datacom E1 balanced G 703 CO E1 external clock signal interface E1 75Q Tx Interface E1 75Q Rx Interface LCD Display LED Alarm Indicators Functional Keyboard End Cover Knock down Fig 1 Appearance of E1 Datacom tester F1 Softkeys FI F2 F3 FQ SETTING RESULT Setting Result PgUp Cursor moveable left and up key Storage Other PgDn Cursor STORAGE OTHER a moveable right and down key SINGLE START Single Error Add Start Stop ERRADD STOP vife Backlight Power key Fig 2 Functional keyboard 72 0027 03A 10 XG2130 E1 Datacom Tester Overview The right key stroke leads to one beep while wrong or invalid key stroke leads to two beeps As prompt there will be relevant hint information in LCD display at the same time Identified as F1 to F4 used to select the parameter or activity in corresponding Softkeys highlight place at the bottom of LCD Each LCD display defines one or more functions of these softkeys Matched with the Settings menu When this key is pressed LCD display swit
52. ace is one datacom interface whose signals are differential transmitted and received conformed electrically to V 11 All the specifications of datacom interfaces are described in the Technical Specification chapter Before making measurements of datacom interfaces the key parameters such as Interface Test mode Tx data rate and BERT pattern should be configured completely When making measurements on a synchronous data clock configurations should be made either Select the right datacom adapter cables according to the type of the interface and emulation of the instrument The connection of datacom service testing is similar to El Local loop Far end loopback and far end mutual test can be used to perform measurements as shown in Fig 74 Fig 75 and Fig 76 The datacom interfaces are usually provided by the digital equipment such as DTU MODEM Loop carrier system And the equipment under test in the following figure apply to all above equipment but for simplicity only the PCM equipment with standard datacom interfaces are used 72 0027 03A 133 Performing Measurements XG2130 E1 Datacom Tester Datacom Loopback Adapter El Cable Datacom Tester Fig 75 Datacom BER testing Local or Far end network loopback Adapter E1 Datacom Tester Adapter El Cable Datacom Tester Fig 76 Datacom BER testing Far end mutual test In the process of measurement error can be
53. acy 1Hz e Level Measurement 60 dB 3 14 dB e Level Accuracy 72 0027 03A 159 XG2130 E1 Datacom Tester Delay Measurement Technical Specifications 60 dB 21 dB 2 87 dB 20 dB 3 14 dB 0 21 dB Accuracy 1 us 5 2 G 703 CO Specifications 5 2 1 General Measuring I nterface Standard Line Code Test Pattern Test Period Result Analysis Physical I nterface Pin Assignments 5 2 2 Transmitter I mpedance Pulse Shape Tx Clock Source I nternal Tx Clock G 703 co directional G 703 AMI Same as E1 Manual Auto Timer G 821 Analysis DB44 G 703 CO test cable See Appendix C 120Q balanced Nominal Conform to with ITU T G 703 Table 1 Internal Interface Loop timing e Frequency 64 kHz e Stability 30 ppm temperature 0 40 C e Ageing 2 ppm per year typical Octet Timing Error Add 5 2 3 Receiver Rate 72 0027 03A Comply with ITU T G 703 can be disabled Same as E1 64 kbit s 150 ppm 160 XG2130 E1 Datacom Tester Input I mpedance Pulse Shape Interference Jitter Tolerance Alarm Detection Technical Specifications G 703 specs 100 ppm 120Q balanced Nominal Conforms to ITU T G 703 Table 1 Typically meets G 703 Meets ITU T G 823 Section 3 Signal Loss Octet Loss 5 3 Datacom Specifications 5 3 1 General Measuring interface a V 24 V 24 V 35 V 36 X 21 RS 449 RS 485 EIA 530 EIA 530A General Equivalent to
54. ansmitted data Transmit Clock DTE Signal Ground SGND Data Terminal Ready Request to Send Receive Clock Clear to Send Data Set Ready Transmit Clock DCE Data Carrier Detect Received Data 72 0027 03A 180 XG2130 E1 Datacom Tester Appendix B 2 V 24 Adapter Cable PIN Assignments DCE PIN xe ITU T Signal Equipment Tester Score Name Signal Direction Under Test Received Data Ro Transmit Clock TC DCE Signal Ground SGND Data Set Ready Clear to Send Transmit Clock XTC DTE Request to Send Data Terminal DTR Ready Receive Clock Transmitted Data Data Carrier 22 Detect w Perf pep f 72 0027 03A 181 XG2130 E1 Datacom Tester Appendix B 3 V 35 Adapter Cable PIN Assignments DTE PIN ee ITU T Signal Equipment Circuit Name Tester Signal Direction Under Test Send Data Send Data Serial Clock Transmit oe DTE A sal ae SCTE Transmit Phe B DTE ora Signal Ground SGND Data Terminal Ready Ea Request to Send coo W 29 Serial a SCR A Receive Serial cock SCR B Receive Clear to Send Data Set Ready Serial Clock ena SCT A DCE A Serial Ta E SCT B DCE Receive Te Signal Detector aoe 72 0027 03A 182 XG2130 E1 Datacom Tester 4 V 35 Adapter Cable PIN Assignments DCE DB44 male PIN Tester Serial Clock ee DCE Serial ae ene DCE aa Em E Signal Ground SGND o Data Set Ready E Clear to Send e sof ere te S
55. are described in Table 6 The settings parameters of Framing are described in Table 5 The setting parameters of BERT pattern and Polarity are described in Table 7 item option Descriptions UNBAL The line impedance is unbalanced 75Q I nterface connected with coaxial cable The physical connector is L9 72 0027 03A 33 XG2130 E1 Datacom Tester Navigating the Displays The line impedance is balanced 1202 connected with twisted pair wires the red cable transmits and the yellow cable receives the signals The physical connector is crocodile clamp The line code is a High Density Bipolar 3 which is one of the commonly used line code to perform the base band signal transmission in the digital networks HDB3 coding was adopted to eliminate the synchronization problems occurring with AMI In HDB3 format a string of four consecutive zeros is replaced with a substitute string containing an intentional BPV Bi Polar Violation The line code is an Alternate Mask Inversion AMI coding is used to represent successive 1s in a bit stream with alternating positive and negative pulses A zero bit will not generate any pulse AMI coding is not used in most E1 transmissions because of synchroni zation loss during long strings of data zeros Note Signal loss alarm will be generated when transmitting unframed all 0 in AMI code Table 6 Line Interface parameter settings 72 0027 03A 34
56. avigating the Displays the settings menu of PyAWe Neely e When the RX interface is chosen as ery vey ee refer to the settings menu of caylee 3 2 4 4 Page 4 of Protocol Converter Settings e When the Tx interface or the Rx interface is chosen as WZ WES WEG Cae GEEZ GEES GEEET or BAJA the displays of the data clock and handshaking signals appear on this page And the user can set up the control circuits e When the Tx interface or the Rx interface is chosen as JPA eee see the page 5 3 2 4 5 Page 5 of Protocol Converter Settings In the page 5 press the Cursor Right and Down key to move the cursor to positions to set Error add Resolution Storage and Duration parameters and then select relevant parameters by pressing F1 F2 F3 F4 keys as shown in Fig 32 nr Error add Resolution Storage and Duration setting parameters are same with those in E1 testing All the descriptions of these parameters are described in Table 9b Table 10 respectively The parameter settings of clock configurations in Protocol Converter mode are as shown in Table 27a Table 27b 72 0027 03A 73 XG2130 E1 Datacom Tester Navigating the Displays Settings P5 10 30 00 El block length lt 2048 gt Error Add lt BIT gt M 1E 2 Resolution 11MIN Storage YES Duration TIMER 01 MINS Start 2004
57. ays In the process of keyboard test all the functional keys including the Power key are locked and only valid for use after the test Others KEYBOARD TEST Perform the test Accessorial system functions Fig 66 Keyboard Test menu During the keyboard test if no key stroked by user then the instrument will keep waiting When the correct key is stroked the keys prompted under test will display V and the wrong keys will display x until all the process is completed Please follow the prompt information to stroke the corresponding key until the test is completed Until the keyboard test is completed user can not exit 3 5 6 Self Test Before making measurements user can run self test to 72 0027 03A 119 XG2130 E1 Datacom Tester Navigating the Displays ascertain the integrity and functions of the instrument As shown in Fig 67 the instrument self test is performed one by one according to the functional circuit modules on displays User can exit the test when the test has completed During the self test the instrument will self detect the LED indicators with the steps of turning on all CPU controlled LEDs then turning all of them off and finally turning on SIGNAL LOSS FRAME LOSS AIS MFRAME LOSS PATTERN LOSS REMOTE ALARM ERRORS LOW BATTERY and START STOP indicators in sequence User can check if the LED indicator is functioning
58. b s signal under test select the corresponding frame structure such as Unframed PCM30 PCM30CRC PCM31 and PCM31CRC Please refer to relevant parts of Section 3 2 2 for details e When completing all the settings press the Start Stop key and the Result key to enter into relevant result menu All the test results in this mode are described in Section 3 3 2 e When E1 Through mode is chosen the 2 Mb s signal under test will be transmitted transparently through the instrument Select Unframed PCM30 PCM30CRC PCM31 72 0027 03A 126 XG2130 E1 Datacom Tester Performing Measurements PCM31CRC frame structure according to the 2 Mb s signal under test Please refer to the relevant parts of Section 3 2 3 for details When completing all the settings press the Start Stop key and the Result key to enter into relevant result menu All the test results in this mode are described in Section 3 3 3 4 2 1 3 Nx64Kb s Bit Error Rate Testing Nx64kb s BER testing is used to check timeslot integrity through the digital cross connect equipment A test pattern is transmitted over a group of timeslots from the near end At the far end the expected receive timeslots are selected and bit error rate is calculated The E1 digital cross connection equipment can switch one received timeslot to any timeslot of the other El In El TX RX mode framed testing select a group of timeslots in the transmit direction and expec
59. cal V 24 interface shown above are 72 0027 03A 104 XG2130 E1 Datacom Tester Navigating the Displays XTC Transmit clock sourced from DTE TC Transmit clock sourced from DCE RC Receive clock sourced from DCE The settings of synchronous clock configuration referring to Tx clock source Rx clock source and the valid edge need to be determined according to the clock configurations of the system under test therefore the judgment of clock loss should be determined according to the specific conditions For the clock configurations please refer to the relevant parts of Performing Measurements in the next chapter 3 3 3 G 703 CO Result Menu When making measurements with G 703 _ co directional interfaces the result menu provides Basic Analysis G 821 Analysis Alarm Seconds Signal Analysis and Event Records User can select different analysis by pressing F1 F2 F3 F4 softkeys e Basic Analysis result menu is the same as the one in datacom TX RX mode e G 821 Analysis result menu is the same as the one in E1 TX RX mode e Alarm Seconds result menu is as shown in Fig 53 and Octet loss is added to make counts of octet timing loss e Signal Analysis result menu is the same as the one in El TX RX mode 72 0027 03A 105 XG2130 E1 Datacom Tester Navigating the Displays Event Records result menu is the same
60. ches to the Settings menu ss Matched with the Results menu When this key is pressed LCD display switches to the Results menu Matched with the Storages menu When Storage this key is pressed LCD display switches to the Storages menu Matched with the Others menu When this key is pressed LCD display switches to the Others menu When the tester is set as single error Single Error insertion mode every time this key is Add pressed one error of the set type will be inserted in the transmit direction 72 0027 03A 11 XG2130 E1 Datacom Tester Overview Start Stop Page Up Cursor Moveable Left and Up Cursor Moveable Right and Down Backlight Manually control the start or stop activity of the test Press it to start the test and press it again to stop the test When page number appears in the display menu Like P1 indicates that display menu has more pages in all and is on page 1 currently press this key to go page up When page number appears in the display menu Like P1 indicates that display menu has more pages in all and is on page 1 currently press this key to go page down Move the cursor upward and leftward and the cursor can reach the position with Move the cursor downward and rightward and the cursor can reach the position with g Turn on or off the LCD backlight accor
61. cked and has to be unlocked firstly before it can be overwritten Icon flashes on that the configuration items can be modified the storage Capacity is not full stored records have been unlocked to prompt the user that no test iS running yet and all the configuration items can be modified or storage capacity is not full and new 17 XG2130 E1 Datacom Tester Overview Clock Loss Table 3 Descriptions of LCD icon indications 72 0027 03A records can be saved or that stored record is under the unlocked status and can be deleted Icon flashes on that no valid 2 MHz clock or 2 Mb s signal is presented at El external clock receiver when selecting E1 transmit clock source as External or no valid clock signal is detected at the datacom receiver by the instrument when performing measurements with the datacom interfaces 18 XG2130 E1 Datacom Tester Getting Started 2 Getting Started This chapter briefly introduces the unpacking check power Supply switching on communication with PC and other attention points of the instrument 2 1 Unpacking check 2 2 Power supply 2 3 Switch on 2 4 Communication with PC 2 1 Unpacking Check In order to safely transport the E1 Datacom tester is packed with carton and with all accessories in a waterproof package Be sure not to connect this instrument to any signal cable carrying hazardous voltage Please check when receiving the product e fthe packing carton
62. col converters include E1 V 35 E1 V 24 and E1 G 703 CO are mainly used to meet the needs of interconnections and network optimization between network routers and traditional communication network Since El path supports both framed and unframed transmission so a converter is frequently used to adapt the low speed synchronous Nx64k data to timeslots of the framed E1 for transmission Through the DXC equipment the adapted data timeslots were combined with together into one E1 path to be transmitted and the transmission bandwidth is efficiently used and resources are saved In the past the transmission performance of the protocol converters could only be evaluated by the loopback one protocol interface and measured at the other interface This test mode will be supported by selecting Function item of 72 0027 03A 146 XG2130 E1 Datacom Tester Performing Measurements the instrument as E1 Datacom and G 703 CO But if there is something wrong with the measurements user can not identify which direction the problem happens in the receive direction or the transmit direction The E1 Datacom tester provides a one direction test mode to transmit and receive data with various data interfaces thus can accurately determine the problem happens to the transmit direction or the receive direction providing effective help for the maintenance and troubleshooting The E1 Datacom tester supports synchronous error bit rate test f
63. com Tester Timeslot status Band width Idle pattern 72 0027 03A SELECT Navigating the Displays The selected timeslots in the transmit direction are same as the ones in the receive direction To select or de select a timeslot The selected timeslot is marked with and unselected one is marked with Move leftward or rightward to the timeslot that needs to be selected or de select Displays the bandwidth of the transmit direction and the receive direction in real time according to amount of the timeslots selected respectively Except the timeslot 0 and timeslot 16 in PCM30 30CRC frame other not selected timeslots data will be replaced by idle codes on a per channel basis on the transmit direction This can be effectively used to detect the busy or idle activity of the timeslots Note Be sure not to set all idle codes as all 0 under AMI line code function a E Move leftward or rightward to the bit ios ia that needs to be edited Table 11 Tx Rx timeslots and Idle pattern settings 42 XG2130 E1 Datacom Tester Navigating the Displays 3 2 1 2 RX HI Z Mode a RX HI Z Unframed Settings Firstly choose the Function of the instrument as RX HI Z as shown in Fig 8 Press the Cursor Right and Down key to select E1 framing as MAINE When user set the timer to start the test there will have 2 pages of settings menu in RX HI Z mode unframed te
64. com Tester Protocol Converter Under Test Fig 89 Transmitter is E1 and Receiver is G 703 CO b Transmitter is G 703 CO Receiver is E1 The E1 Datacom tester uses its internal synthesizer to transmit G 703 co directional signal The protocol converter uses the clock derived from the G 703 CO interface to generate 72 0027 03A 154 XG2130 E1 Datacom Tester Performing Measurements the clock to transmit E1 signal as shown in Fig 90 Transmitter Receiver G 703 CO G 703 CO Data Clock Internal Received Synthesizer Clock Receiver Transmitter Data Clock x El E1 Datacom Tester Protocol Converter Under Test Fig 90 Transmitter is G 703 CO and Receiver is E1 Instrument settings Tx interface G 703 CO G 703 CO Tx clock lt I nternal gt Rx interface E1 Rx clock source lt I nterface gt Protocol converter settings Rx interface G 703 CO Tx interface E1 Tx clock source EXT line clock on G 703 CO Test Description e Choose Protocol Converter in the Settings menu make the configurations to all the parameters Refer to Section 3 2 4 for details e Press the Start Stop key when settings have been configured and press the Result key to enter into relevant result menu See relevant descriptions in Section 3 3 4 for details e Be sure that the transmit interface the receive interface emulation and clock mode should be configured properly 72 0027 03A 155 X
65. de are as shown in Table 19 aa Fixed as 1 bit a ere ti 72 0027 03A 60 XG2130 E1 Datacom Tester Navigating the Displays oe oe a ae al onc ee Pay ELLE EYAL ES Table 19 Character length Stop bits Parity and Tx data rate parameters The setting of Stop bits is associated with Character length with their matching relations as shown in Table 20 Character length Stop bits settings 8 G amp O B C Bo d Gb B O Table 20 Relationship between Stop bits and Character length 3 2 2 3 Page 3 of Datacom Settings Menu Press the PgDn key to enter into page 3 of the Datacom setting menu as shown in Fig 25 Before BER testing can proceed it may nessary to establish a data path by using the instrument control circuit In Fig 25 the statuses of data clock and handshaking signals is displayed in real time with V 35 datacom interface as an example Among which the RS and DTR signal can be controlled as 0Y or 02 There is no clock signal necessary for mode so all 72 0027 03A 61 XG2130 E1 Datacom Tester Navigating the Displays clock signal statuses in figure are marked with Circuit names will changed with different datacom interface chosen please refer to the datacom interface pin assignments in appendix B for the detailed circuit names of the data clock and handshaking signals Settings P3 10 3
66. ded software upgrading in order to prevent the instrument powered off caused by the battery exhausted it is strongly recommended to use external AC power supply to power the instrument 72 0027 03A 27 XG2130 E1 Datacom Tester Navigating the Displays 3 Navigating the Displays This chapter first briefly gives an overview of the four main operation menus and then explains the relevant operations of these four main operation menus in details 3 1 Menu overview 3 2 Settings menu 3 3 Results menu 3 4 Storages menu 3 5 Others menu 3 1 Menu Overview The operation menus of the E1 Datacom tester includes Settings Results Storages and Others menu matched with the Setting Result Storage and Other keys respectively These four menus can be switched from one another at any time by pressing these four keys PgUp and PgDn keys provide page up and down functions Cursor Right and Down and Cursor left and Up keys provide cursor movement functions F1 F2 F3 F4 softkeys are used to select the parameter or actions at the bottom of LCD which matched with the place highlighted by the cursor In each of display areas the field currently able to be changed is marked by a Highlighted cursor The menu of selection available for the active field is displayed on softkeys on the bottom of the display The choice from the menu is
67. descriptions in Section 3 3 4 for details e Be sure that the transmit interface the receive interface emulation and clock mode should be configured properly with the protocol converter under test e Throughout the test process bit error can be directly inserted into the path via the Single Err Add key of the instrument to verify the operating status of the instrument and signals transmitted and received in the path 4 2 4 2 E1 G 703 CO Synchronous BER Testing Since both G 703 co directional and E1 interface are extracted the clock from the received signal so the clock configuration is simple with specific description as follows a Transmitter is E1 Receiver is G 703 CO 72 0027 03A 153 XG2130 E1 Datacom Tester Performing Measurements The E1 Datacom tester uses its internal synthesizer to transmit El signals And the protocol converter uses the clock derived from the received E1 signal to transmit G 703 co directional signal The instrument uses the clock derived from received signal to clock in data at the G 703 CO interface as shown in Fig 89 Instrument settings Tx interface EL E1 Tx clock lt Internal gt Rx interface G 703 CO Rx clock source lt I nterface gt Protocol converter settings Rx interface El Tx interface G 703 CO Tx clock source E1 Line clock Receiver Data Clock nternal Received Synthesizer Clock Receiver Transmitter Data Clock p G 703 CO G 703 CO E1 Data
68. ding BERT pattern Polarity Tx clock Source Octet timing Error add Resolution Storage and Duration Please refer to Section 3 2 3 for details Tester Fig 82 Far end interface loopback 72 0027 03A 144 XG2130 E1 Datacom Tester Performing Measurements El Tester Tester Fig 84 Far end mutual test Throughout the test process bit error can be directly inserted into the path via the Single Err Add key of the instrument to verify the operating status of the instrument and signals transmitted and received in the path Note Throughout the test process the OCTET timing needs to be enabled to ensure the right transmission of data through the 64 kb s co directional interface 72 0027 03A 145 XG2130 E1 Datacom Tester Performing Measurements Test Description Results throughout the test period can be acquired from the test result menu including Basic Analysis Error EFS Current error ratio Average error ratio block errors errored block ratio Alarm Seconds Signal loss Clock loss Pattern loss Clock slip Octet loss G 821 Analysis Signal Analysis Line rate Frequency offset Event Records etc 4 2 4 Protocol Converter testing Protocol Converter is also named as Mux DeMux in other instrument The protocol converters are widely used in applications to interconnect various protocol data interfaces nowadays Most commonly used proto
69. ding to the light condition Power Switch on or off the tester Table 1 Functional keys descriptions 1 5 LED Indicators The E1 Datacom tester has 12 status and alarm LED indicators in all including 2 status indicators and 10 alarm indicators mainly indicating the current operating status of instrument and 72 0027 03A 12 XG2130 E1 Datacom Tester Overview if any alarm is detected during the test process The arrange ment of the status and alarm LED indicators is as shown in Fig 3 SIGNAL LOSS FRAME LOSS AIS MFRAME LOSS PATTERN LOSS REMOTE ALARM ERRORS LOW BATTERY CLOCK SLIP CHARGE OCTET LOSS START STOP Fig 3 LED Indicators Status and alarm LED indicators are described as in Table 2 LED Name START As Start Stop key keeps changing status this STOP indicator turns on green when the test is started and turns off when the test is stopped The tester has built in rechargeable batteries and a rapid charging circuit This indicator turns on CHARGE orange when the tester is under charging and turns off when it is fully charged Effectively indicates a loss of signal When the receiver detects 255 consecutive Os an alarm is SIGNAL generated and this indicator turns on red Alarm LOSS cleans on detecting at least 32 1s in consecutive 255 bits and LED turns off Comply with ITU T G 775 G 962 72 0027 03A 13 XG2130 XG2130 El Datacom Tester iSCSI Tester Overview
70. directly inserted into the path via the Single Error Add key of the instrument 72 0027 03A 134 XG2130 E1 Datacom Tester Performing Measurements to verify the operating status of the instrument and the signals transmitted and received in the path Test Description Results throughout the test period can be acquired from the test result menu including Basic Analysis Error EFS Current error ratio Average error ratio block errors errored block ratio Alarm Seconds Signal loss Clock loss Pattern loss Clock slip G 821 Analysis Signal Analysis Line rate Event Records etc Some issues to which special attention should be paid in setting test parameters for asynchronous data and synchronous data transmission are described as follows a Making a Measurement on Asynchronous Data In asynchronous data testing following parameters of the instrument need to be set including Tx data rate Character length Stop bits Parity and BERT patter and Polarity Since the clock signal is unnecessary for asynchronous data transmission the clock configurations and frequency measurement is not provided in this mode b Making a Measurement on Synchronous Data In synchronous data testing the instrument can be emulated as a DTE or a DCE according to the emulation of the equipment under test The emulation of the instrument is the key parameter which can determine other configurations In one dig
71. dshaking before the connection is established for example RTS CTS and DTR DSR The E1 Datacom tester can monitor the status of these handshaking signals in real time In Settings menu of a synchronous test all the status of input handshaking signals can be displayed with ON or OFF and all the output handshaking signals of the control circuits can be set with N or eliza fey status is defined as a High in logic and e ax is defined as a Low in logic Since the logic High and Low stand for 72 0027 03A 142 XG2130 E1 Datacom Tester Performing Measurements the different level in voltage in deferent interfaces please refer to Technical Specification chapter for details The handshaking signal test function simplifies the troubleshooting of the establishment of data communication 4 2 3 G 703 CO Service Testing In either of transmit direction or receive direction of the G 703 co directional interface there have three kinds of signals 64 kb s data signal 64 kHz timing signal and 8 kHz octet timing signal passing through interfaces via a balanced cable These three signals are integrated into one signal by coding According to AMI coding rule the receiver can recover the 64 kHz timing signal from the signal By injecting one violation every 8 bit block polarity conversion in the transmission data the receiver can recognize 8 kHz octet timing signal For
72. e the alarm when the instrument transmits the wrong MFAS word This 72 0027 03A 51 XG2130 E1 Datacom Tester Navigating the Displays function is only effective in the frame E BIT ee ae If the equipment under test can give CRC make the alarm when the instrument CODE MF LOSS transmits wrong CRC4 word in NFAS Bie This function is only effective in the MF ALARM frame structure with CRC If the equipment under test can give the alarm when the instrument transmits wrong NMFAS word This function is only effective in the frame structure with CAS Table 12 Alarm Injection parameter settings The settings of Tx FAS NFAS parameters are described in Table 13 Transmit FAS and NFAS word according to the default settings of the instrument the equipment under test will generate remote The FAS and NFAS word can be programmed by user An alarm may be generated if some relevant aki bits are changed For instance if A bit is set as 1 alarm Table 13 Tx FAS NFAS parameter settings The Tx FAS NFAS parameter settings will switch to various 72 0027 03A 52 XG2130 E1 Datacom Tester Navigating the Displays menus according to the frame structure has benn set Note you d better not edit FAS or NFAS word when the alarm has already been inserted otherwise the new alarms may be generated or existing alarm may disappear In case of messy situation please select MAJAY to restore
73. e been historical errors or Historical alarms happened during the elapsed time Errors or f of one test the icon flashes once every Alarms other second to prompt the user Icon flashes on detecting open status of El transmit circuit Real time indicates to prompt the user the transmitter is not connected with the cable or the cable is open circuit or broken This icon can be used to judge if the cable is properly Transmit neue connected or damaged Circuit Icon flashes on detecting short status of El transmit circuit Real time indicates to prompt the user the cable is in short status This icon can be used to judge if the cable is properly connected or damaged 72 0027 03A 16 XG2130 E1 Datacom Tester Overview Timer Testing Mode Status Lock 72 0027 03A Icon flashes on that the automatic test timer has been set and indicates the tester will start the automatic test function at the specified time This icon displays in real time to prompt the user that the pre determined timer has been set Icon flashes on that the configuration items in the Settings menu have been locked or the storage capacity is full or stored settings and results have been locked to prompt the user that one test has been started and configuration items can not be modified any more or the storage capacity is full existing records have to be deleted firstly to save the new records or that stored record has been lo
74. e instrument is switched off firstly And open the end cover of the instrument and slightly press the battery compartment lock card downward the battery case will pop out Extract the battery compartment and unscrew the screws on the top of the case to open and replace new batteries Be careful of not mistaking the polarity of the battery When the battery compartment has been loaded again slip it back into the battery case frame and push the battery compartment inside Put your fingers upon the case rather than the battery case lock card the battery case is installed well while a click sound is heard The battery replacement is completed when the end cover of the instrument is mounted again When the batteries supplied for this instrument have been expired the charging life or are impaired they 72 0027 03A 22 XG2130 E1 Datacom Tester Getting Started should be dealt with control If dealt with general waste processing system or detained in the instrument they will harm the environment The waste batteries should be recycled or disposed of properly at special recycling station or hazardous waste collection center 2 2 3 Charging the Battery To recharge the battery plug in the charger using an appropriate adapter supplied Normally the battery will be fully charged after 2 5 hours In exceptional circumstances where the battery may have become deeply discharged a charge time of 24 hours may be required Note that the instru
75. e test is completed the LCD displays will auto switch to the storage menu user can define the record s name of this result and choose whether to save this test record or not If user choose not to save this result press F4 to select EXIT to exit the storage menu If user choose Storage item as INO in Settings menu this test result will not be saved automatically the storage displays will no appear when the test is completed In the case of that user can also save the current result in the Storages menu later e View lock unlock and delete the stored settings or results Press the Storage key to switch to Storages menu and choose Jami tes LALAU to enter into the menus We will describe them respectively below 3 4 1 Settings in Storage Menu The instrument can save the settings of the test User can directly recall those stored settings to set up the test The instrument provides sets of default settings when manufactured in factory Thus the user can simplify the setting 72 0027 03A 107 XG2130 E1 Datacom Tester Navigating the Displays process The settings storage menu is as shown in Fig 54 Results HA 1 CURRENT OODOOH15M25S P 1 3 Mode THROUGH Mode THROUGH Mode APS DELAY lt 03 gt Setting3 Mode APS DELAY 01 vacant setting storage SETTING RESULTS Fig 54 Settings storage menu lt 01 gt Setting1 lt 02 gt Setting2
76. ealt with special caution when operating the instrument and reminds user s attention Info symbol indicates some relevant information that user still need be told to know about after finishing some operating descriptions Warning symbol indicates that user should refer to the manual instruction in order to protect the apparatus against damage The information after these icons in the operation manual must be noted to ensure the right and safe operation of this 72 0027 03A 4 XG2130 E1 Datacom Tester Overview instrument 1 2 Product Overview This E1 datacom tester is one multi functional and full featured digital transmission system test device designed for the installation engineering check and acceptance daily maintenance of the digital networks mainly performing bit error test alarm analysis fault finding and signaling analysis In addition the E1 Datacom tester further provides various commonly used protocol converters with one directional and bi directional bit error test function This instrument mainly has following functions u E1 Testing e 75Q Unbalanced and 120Q Balanced line interfaces e HDB3 and AMI line codes e Out of Service framed and unframed testing 2Mb s Nx64Kb s BER testing Frame data and alarm monitoring Frame data FAS NFAS TS16 and timeslot data Alarm Signal Loss AlS Frame Loss Remote Alarm Mframe alarm Pattern Loss and BIT CODE FAS E BIT errors and so on Cloc
77. easurement e Transmit clock Internal or Interface u Protocol Converter Testing e E1 Datacom synchronous 64kb s Nx64kb s BER testing Datacom interface V 24 V 35 V 36 X 21 RS 449 RS 485 EIA 530 EIA 530A e E1 G 703 CO synchronous 64kb s BER testing e One directional data conversion BER testing e Frequency and offset measurement of receive interface e Handshaking signals monitoring of Datacom interface e El frame data monitoring u Other Functions e Real time clock e Extensive LED LCD alarm and status indications e Test pattern PRBS Fixed Code and 16 BIT user word e Error Injection Single and Fixed Rate e Manual and auto timer measurement e Histograms analysis of error and alarm events e ITU T G 821 G 826 and M 2100 performance analysis e Self test and keyboard testing 72 0027 03A 7 XG2130 E1 Datacom Tester Overview Upgradeable software via an RS232C interface Up to 99 days continuance test performance More than 6 hours measurement operation from a single battery charge Save Recall of up to 10 user defined setups and results Test results could be uploaded conserved and printed by TestManager software Built in NiMH rechargeable can be charged with automobile cigarette lighter battery adapter 1 3 Product Compositions The E1 Datacom Tester is consists of following modules Hardware Main board Power board and Display board Software Embedded software and surveillance and management PC software
78. ecords sum Running Please wait ALARM SIGNAL EVENT SECONDS ANALYSI RECORDS Fig 39 Event Records result menu h TS Analysis TS Analysis provides the timeslot analysis under E1 framed 72 0027 03A 90 XG2130 E1 Datacom Tester Navigating the Displays testing The specific contents of TS Analysis are shown in the displays under E1 RX HI Z mode below refer to 3 3 1 2 for details 3 3 1 2 Results Menu in E1 RX HI Z Mode RX HI Z mode is normally used in out of service measurement of E1 line The Results menus under E1 RX HI Z mode provide full measurement analysis including Errors Count M 2100 Analysis Alarm Seconds Signal Analysis Event Records TS Analysis and so on Press FL F2 F3 F4 softkeys to select the analysis displays accordingly in the menu As the different framing has been chosen the results displays in El RX HI Z mode are different refer to the effects of framings on results as shown in Table 42 PCM30C PCM31C framea POMBO PORE pemsa P Re S Comme e ee S Count moe of e ee Analysis De ee Seconds ee Analysis Records Analysis Table 42 Effects of framings on results in E1 RX HI Z mode 72 0027 03A 91 XG2130 E1 Datacom Tester Navigating the Displays a Errors Count Errors count provides the full errors statistics for CODE FAS CR
79. ed in the instrument e View the stored results e Analyze the stored results e Clean up the records uploaded 72 0027 03A 169 XG2130 E1 Datacom Tester Working with TestManager Plot out the test results with the graphics table or text mode Upgrade the embedded software Help 6 2 System Configuration and Running Environment 6 2 1 Firmware Basic configurations required PC 586 133MHz or better Memory above 16MB Hard disk above 50MB CD ROM drive for installation Standard mouse and keyboard Serial port Windows compatible printer or plotter 6 2 2 Operating System Windows ME 2000 NT XP 6 2 3 System Configuration Recommendation 6 3 6 3 1 Installation Process System display mode 800x600 Pixels Install the printer or plotter before setup Install and Uninstall the Software on the PC Close all programs and turn off virus protection software to prevent installation confliction Open the package and carry out the data CD with the mark of TestManager 72 0027 03A 170 XG2130 E1 Datacom Tester Working with TestManager Insert the CD into the CD ROM drive View the contents of the CD from My Computer Double click Setup exe Complete the installation according the setup wizard After completing installation of the software one short cut icon TestManager will be placed on the desktop automatically Double click the icon TestManager to run the program Note We
80. ed testing is same The relevant result analysis items are described in Table 41 Results OODOOH15M25S ce SIGNAL ANALYSI S Rx line rate 2048001HZ Rx frequency offset Oppm Rx signal level gt 2 5B Running Please wait ALARM SIGNAL EVENT SECONDS ANALYSI RECORDS Fig 38 Signal Analysis result menu item Description i The frequency of received 2 Mb s signal relative to Line Rate l the internal reference clock Frequency Frequency offset calculation relative to the Offset internal reference clock The offset need to 72 0027 03A 89 XG2130 E1 Datacom Tester Navigating the Displays comply with the limits specified in ITU T G 703 lt 50ppm Signal The level is measured of received 2 Mb s signal in Level the range 2 5dB 43dB with the step of 2 5dB Table 41 Signal Analysis in E1 TX RX mode g Event Records During the test if an error or an alarm occurs in the setting resolution time then one event will be generated by the instrument accordingly And the event records number is added by 1 every the resolution time The event records sum will be updated in accumulation with the storage interval for example 1 minute 15 minutes 1 hour as shown in Fig 39 Event records can be further uploaded via one test result by TestManager software And in TestManager user can see when the alarms and errors happened in histogram analysis Results OODOOH15M25S EVENT RECORDS Event r
81. eives the instrument at the first time please use the instrument until the battery is completely exhausted before giving it its first charge 2 3 2 Setting the Time and Date At the top line of the screen LCD displays the current time in the format of Hour Minute Second with 24 hour system Because the test result is time stamped therefore it is necessary to set right time and date before using this instrument Time and date can be set in the real time clock settings in the Others menu by following operational steps e Press the Other key to switch to the Others menu select WAY 37 by the softkeys 72 0027 03A 25 XG2130 E1 Datacom Tester Getting Started Select to Clock Mode item and then the date and time of the instrument can be modified Choose the RUN status after date or time has been set and then the instrument can work according to the newly setting time 2 3 3 Self test Before making measurements run a self test to check that the instrument is operating correctly The user may find self test function in the Others menu Please refer to the Others LA menu descriptions for details 2 4 Communication with PC This instrument supports communication with PC via RS232C interface by TestManager software And TestManager can do two jobs one is to upload the test results stored in the instrument to PC for further processing including filing printing and analyzing
82. er of blocks errors counted Errored over the elapsed test period Block block error is defined as a block in which one or more BIT errors occur Erori The ratio of block errors counted to _ blocks received over the elapsed test block ratio period Table 45 Basic Analysis descriptions in Datacom G 821 Analysis result menu is the same as the one in El TX RX mode e Alarm Seconds result menu is as shown in Fig 52 and the result analysis items are described in Table 46 e Signal Analysis result menu is the same as the one in El TX RX mode without frequency offset calculation feature e Event Records result menu is the same as the one in E1 TX RX mode 72 0027 03A 102 XG2130 E1 Datacom Tester Navigating the Displays Results OODOOH15M25S Signal loss Clock loss Pattern loss Clock slip Running Please wait BASI C G 821 LARM ANALYSI ANALYSI PON DS Fig 52 Alarm Seconds in Datacom Item Description The number of seconds during which signal loss Signal was detected counted over the elapsed test Loss period The number of seconds during which clock loss Clock Loss was detected counted over the elapsed test period The number of seconds during which pattern loss Pattern was detected counted over the elapsed test Loss i period The number of seconds during which clock slips Clock Slip were detected counted ove
83. erform the Measurements cccceeeeeseeeeeeeees 123 5 Technical Specifications sssssnssssn0uuunnuunnnnnnnnn 157 Salo VEL Specification urene eai aar 157 5 2 G 703 CO Specifications sssssssrsesrrrerrrrsrrrn 160 5 3 Datacom Specifications ssssssssesrrrerrrrsrrree 161 72 0027 03A 1 XG2130 E1 Datacom Tester Contents 5 4 Protocol Converter Specifications ccceee eee 168 5 5 Other Specifications siete lites cee ee es a aes 168 6 Working with TestManager sssssssss22221 169 6 1 Software FunctionS s sssssesrsesrrrerrrrrrrrerrrerrn 169 6 2 System Configuration and Running Environment 170 6 3 Install and Uninstall the Software on the PC 170 6 4 How to Use TestManager Software ccceeeeeeeeees 171 7 Troubleshooting ssssssssssssussnnsununnnnnnnnnnnnnnnnnnn 174 Appendix A El Frame Structure ssssssnnnnnnnnnnnnnnnnn 176 1 PCM30 PCM31 Frame Format ccccceeee cece eens 176 2 PCM30CRC PCM31CRC Frame Format 178 Appendix B Datacom Adapter Cables cscccsssseseees 180 L V 24 Adapter Cable PIN Assignments DTE 180 2 V 24 Adapter Cable PIN Assignments DCE 181 3 V 35 Adapter Cable PIN Assignments DTE 182 4 V 35 Adapter Cable PIN Assignments DCE 183 5 V 36 Adapter Cable PIN Assignments DTE 184 6 V 36 Adapter Cable PIN Assignments DCE
84. erial Clock Transmit vue DTE A A aT Transmit oe DTE Request to Send Data Terminal Ready Serial a SCRIA Receive Serial cock SCR B Receive Receive Signal Detector 72 0027 03A ITU T Signal Signal Direction Appendix B M34 female Equipment Under Test 183 XG2130 E1 Datacom Tester Appendix B 5 V 36 Adapter Cable PIN Assignments DTE DB44 male DB37 male oe Circuit Name ITU T Signal Equipment Tester Signal Direction Under Test a aaa Data ea Tanaris Data Tans we Tanem Gia Le Signal Ground SGND Data Terminal Ready Request to Send es Data eave Data E Receive Clock a Receive Clock aoe Clear to Send Data Terminal Ready Transmit oe DCE Transmit Goa DCE Data e Detect 72 0027 03A 184 XG2130 E1 Datacom Tester Appendix B 6 V 36 Adapter Cable PIN Assignments DCE Sep Circuit Name ITU T Signal Equipment Tester Signal Direction Under Test Received Data RD A Received Data RD B Transmit Clock DCE A TEVA Transmit Clock DCE B TEARI Signal Ground SGND Data Set Ready Clear to Send Transmitted Data TD A A TD B Transmit Clock DTE A KICIA Transmit Clock DTE B XTC B Request to Send Data Terminal Receive Clock A C A C B CD Receive Clock B Data Carrier D Detect R R mp pe bef ef 2 psf fe EN B 72 0027 03A 185 XG2130 E1 Datacom Tester Appendix B 7 RS 449 Adapter Cable PIN Assignme
85. ern to be transmitted over the go and return legs of a duplex network path A test pattern is transmitted in an Nx64 kb s path or 2 Mb s unframed path and a timer is set running A loopback is manually applied to the network 72 0027 03A 128 XG2130 E1 Datacom Tester Performing Measurements equipment to return the test signal The received pattern stops the timer and the round trip delay is calculated Fig 68 shows a loop delay testing connection Test Description e Loop delay is only possible at 2 Mb s line rate e Connect a loopback to the network equipment e Set up the settings as described in Section 3 2 4 e When completing all the settings press the Result key to enter into relevant result menu and then press the F1 key to start the test e All the test results are described in Section 3 3 4 4 2 1 5 APS Delay Measurement SDH four fiber and two fiber optical loop network is usually provided with automatic protection switching APS function When the operating fiber cable line is broken the SDH equipment can automatically switch the interrupted 2 Mb s signals to the optical channels of another direction for transmission to ensure that the communication will not be interrupted When the equipment performs automatic protection switching there is a clear limitation to the delay time And the APS delay measurement is to measure the total time taken for the switching Before performing APS acti
86. es clock to protocol converter under test y Tester Supplies Clock to Converter Under Test The E1 Datacom tester uses its internal synthesizer to clock out data on E1 to the converter The converter uses the clock which is derived from received El signal and then divided to clock out data on RD and supplies clock on SCR to the instrument In this way the clock source of protocol converter should be configured as E1 Line clock Thus the clock of the converter under test is sourced from the instrument actually as shown in Fig 85 Instrument settings Tx interface E1 E1 Tx clock source lt l nternal gt 72 0027 03A 148 XG2130 E1 Datacom Tester Performing Measurements Rx interface V 35 DTE V 35 Rx clock lt RX CLK gt Protocol converter settings Rx interface E1 Tx interface V 35 DCE Tx clock source El Line clock Note If the protocol converter is unable to provide clock valid edge choice the valid clock edge of the instrument may be set as t Because under such circumstance the protocol converter usually clocks out data in coincidence with the rising edge of clock and the falling edge is aligned to the middle of the data Converter Uses Internal Clock The protocol converter uses its internal synthesizer to clock data on RD and supplies a clock on SCR to the instrument In this mode both the instrument and the converter under test work with its internal clock themselves There is no common c
87. escription PRBS Pseudorandom Binary Sequence 16 BIT is a user defined word Test Fixed code or static binary pattern yee A code can simulate AIS 1111 and etc Table 18 Datacom Test pattern parameter settings According to ITU T recommendation the test pattern of the datacom transmission system is somewhat different from the test pattern of El system Please refer to Table 7 for comparison The settings of pattern Polarity parameters are as shown in Table 7 3 2 2 2 Page 2 of Datacom Settings Menu in ASYNC 72 0027 03A 59 XG2130 E1 Datacom Tester Navigating the Displays Displays shown in subsequent pages vary from the datacom test mode to the test mode If the test mode in page 1 of the settings is chosen as PSNT press the PgDn key to enter into page 2 of datacom settings menu then press the Cursor Right and Down key to move the cursor to positions to set Character length Stop bits Parity and Tx data rate parameters and then select relevant parameters by pressing F1 F2 F3 F4 softkeys as shown in Fig 25 Settings P2 10 30 00 Character length isi Start bit lt 1 gt Stop bits 1 Parity NONE Tx data rate 1 2kb s Tester is ready for use Fig 25 Page 2 of Datacom settings menu in ASYNC The settings of Character length Stop bits Parity and Tx data rate parameters in y4 l mo
88. ey to select settings menu as shown in Fig 29 The G 703 CO testing is provided as an optional function of the E1 Datacom tester When the G 703 CO firmware module is mounted inside the instrument the instrument will automatically recognize it and display its option in the Function item Settings Pl 10 30 00 Function Ic 703 co BERT Pattern 2 Polarity INVERTED ITU T Tx clock source INTERN Octet timing ON Tester is ready for use PROTOC G 703 DATACO CONVER co Fig 29 Page 1 of G 703 CO settings menu 72 0027 03A 67 XG2130 E1 Datacom Tester Navigating the Displays 3 2 3 1 Page 1 of G 703 CO Settings Menu The G 703 CO settings menu consists of 2 pages with the page 1 as shown in Fig 29 Relevant parameters can be chosen by pressing the Cursor Right and Down key to move the cursor to positions to set BERT pattern Polarity Tx clock source and OCTET Timing parameters by pressing F1 F2 F3 F4 softkeys BERT pattern Polarity and Tx clock source setting parameters are same with those in E1 testing All the descriptions of these parameters are described in Table 7 Table 8 respectively The settings of OCTET Timing parameter are as shown in Fig 23 I tem Option Description When making measurements with the G 703 CO interface be sure to set the OCTET Timing in status so as to recover c
89. full duplex communication the interface needs only two pairs of balanced circuits Digital equipments with 64 kb s co directional interfaces such as data terminals packet switch and router can be directly connected with digital transmission equipment PCM equipment For example two routers are connected with 64 kb s co directional interface through the transmission system The 64 kb s co directional interface can be tested in following ways e Far end interface loopback Connect a loopback to the far end equipment interface At the far end equipment the transmit signals is looped back into the receiver Fig 72 0027 03A 143 XG2130 E1 Datacom Tester Performing Measurements 82 shows the typical connection e Local loop or far end network equipment loopback Connect a loopback to the near end or far end network equipment These equipments are used to transmit Signals in the path such as PCM SDH equipment Fig 83 shows the typical connection e Far end mutual test Two E1 Datacom testers are respectively placed at the near end and the far end to make BER testing to 64 kb s co directional path directly Fig 84 shows the typical connection Note Since some equipments have the software remote control function in a loopback test the loopback can be formed between equipment interfaces via the loopback cable or formed by software loopback configuration Following parameters of the instrument need to be set before testing inclu
90. in 3 consecutive NFAS words and the LED REMOTE turns on red Alarm cleans on receiving 0 at Bit3 ALARM in 3 consecutive NFAS words Comply with ITU T 0 162 Remote Multiframe Alarm Alarm happens on receiving 1 at Bit6 of timeslot 16 in frame zero in consecutive multiframes and the LED turn on Otherwise the alarm is cleaned Alarm happens on when one or bits have been added to or deleted from a received PRBS CLOCK erie pattern and the LED turns on red In out of service testing when the test pattern is PRBS a clock slip will be counted in seconds Alarm happens on not receiving octet timing violations for 8 consecutive octets in G 703 CO OCTET Loss testing and the LED turns on red Alarm cleans on the receipt of the first octet violation and the LED turns off Only valid for G 703 CO testing ain Alarms happens on the built in NiMH battery s voltage has dropped to a low level without BATTERY external power supply And the LED turns on red 72 0027 03A 15 XG2130 E1 Datacom Tester Overview to prompt the user that an external power is needed In case the instrument is powered by external power the LED turns off soon Table 2 Descriptions of status and alarm indicators 1 6 LCD icon indications The E1 Datacom tester has 5 LCD icons which are displayed at the upper right corner of the LCD and with different indications respectively Various LCD icons are described in Table 3 When there hav
91. ing on TC XTC is not used by the DCE This approach is appropriate at lower data rates The delayed clock on XTC is used to clock data into the DCE This approach is more appropriate at higher data rate Instrument settings Datacom DTE SYNC Tx Clock Source RX CLK Transmitter TC 4 XTC Use or Ignore TD Receiver RC RD E1 Datacom Tester DCE Under Test DTE Fig 78 DCE under test supplies clock to tester transmitter 72 0027 03A 138 XG2130 E1 Datacom Tester Performing Measurements b E1 Datacom Tester as DCE When the E1 Datacom tester is configured as a DCE it can be connected to DTE equipments Like a real data test set the transmitter of tester supplies data on RD and clocks on RC and TC to the DTE under test Both clock signals are derived from the same source DTE Under Test Supplies Clock to Tester Receiver As shown in Fig 79 the E1 Datacom tester uses the clock supplied on XTC to clock in data on TD The DTE under test may have generated this clock internally or may have derived from the clock supplied by the E1 Datacom tester on TC The E1 Datacom tester uses its internal synthesizer to clock out data on RD and also to derive clock signals on RC and TC TC Use or Receiver Ignore XTC TD RC Internal RD Synthesizer DTE Under Test E1 Datacom Tester DCE Fig 79 DTE under test supplies clock to tester Instrument settings Datacom DCE SYNC Tx Clock Source INTERN 72
92. ings parameters and relevant parameters are described in Table 50 Others URNATA P 1 2 Beep on alarm OFF Keyboard lock OFF Display EFS or EFS EFS Accessorial system functions MI SCEL POWER RS232 LANEOUS MANAGER PORT Fig 62 Miscellaneous menu Beep on alarm and error Beep on alarm No beep on alarm and error anyway To lock the START STOP key can not be used when the test has not been started yet the START eile oN STOP indicator turns off Only valid after the test is started the START STOP indicator turns on 72 0027 03A 114 XG2130 E1 Datacom Tester Navigating the Displays Error free second displays as the Display EFS number of count or EFS Error free second displays as a EFS ae percentage of the elapsed seconds Language DAS Simplified Chinese displays English displays Load default Restore the instrument with the settings default factory settings Table 50 Miscellaneous configurations 3 5 2 Power Manager As shown in Fig 63 the instrument provides the functions to Save the power Power Manager menu allows the user to set Auto power off Auto backlight off parameters by pressing F1 and F2 softkeys The relevant parameters are described in Table 51 Others MmPOWER MANAGER Auto power off Auto backlight off Accessorial system functions MI SCEL POWER RS232 LANEOUS MANAGER PORT Table
93. ings storage is limited The maximum number of stored settings is 10 among which 8 sets are available as system default settings and 2 sets left to the user to define If the user wants to save more settings it is necessary to delete existing stored ones firstly then directly save the results or save the Current setting The default name of the stored setting given by the instrument is identified as the current time in the string format of Date Hour Minute Second such as 18154947 Item Description View the settings information of the stored setting Recall the stored setting as the current to set up a new test it from being accidentally renamed and delete Unlock the selected stored setting in order to oct ee Modify the name of selected stored setting Delete the selected stored setting Table 48 Activities to the stored settings 3 4 2 Results in Storage Menu The result storage menu allows the test results to be saved or the relevant information of the test result to be viewed 72 0027 03A 110 XG2130 E1 Datacom Tester Navigating the Displays according to the name of the result The result storage menu is as shown in Fig 58 in that menu user can save current test result view rename and delete stored results saved The instrument can save up to 10 sets of results a Current Result As shown in Fig 59 the current result appears only in the first page When is selected the d
94. ircuit clock accurately OFF In self loop test the OCTET Timing can be set in JJ status Fig 23 OCTET Timing parameter settings 3 2 3 2 Page 2 of G 703 CO Settings Menu Press the PgDn key to enter into page 2 of the G 703 CO settings menu press the Cursor Right and Down key to move the cursor to positions to set Error add Resolution 72 0027 03A 68 XG2130 E1 Datacom Tester Storage and Duration parameters Navigating the Displays and then select relevant parameters by pressing F1 F2 F3 F4 keys as shown in Fig 30 Settings P2 10 30 0 Block length Error Add Resolution Duration lt BIT gt 1MIN TIMER 01 2004 04 26 ready for use Start Tester SINGLE RATE ees Fig 30 Page 2 of G 703 CO settings menu is Error add Resolution GS Storage Storage O lt 1000 gt 1E 2 YES MINS 10 25 36 and Duration setting parameters are same with those in E1 testing All the descriptions of these parameters are described in Table 9b Table 10 respectively 3 2 4 PROTOCOL CONVERTER Settings Menu Protocol Converter testing function always named with Mux Demux in other instruments is used to make BER testing for multiplexing or de multiplexing This function can give the evaluation of Mux and Demux performance
95. is impaired and if the appearance of the product is impaired e lf the product and all its accessories are available e The product with the standard configurations is consists of following items as shown in Table 4 Optional Configuration If the E1 External Clock Signal optional function is ordered the hardware software and its accessory E1 External 72 0027 03A 19 XG2130 E1 Datacom Tester Getting Started Clock Signal Access Cable will be provided item Qua item O 75Q Unbalanced Test i G 703 CO Test Cable Maintenance Card 1 Datacom Interfaces i Quality Certificate i Loop back Adapter Card RS232 Communication EAT 1 Packing list 1 Cable Automobile Cigarette AA NiMH Rechargeable Lighter Battery Adapter 1 Batteries Built in Cable Table 4 Standard configurations of the E1 Datacom tester Please check the product item by item according to the packing list Please contact the supplier if anything is missing If necessary keep the packaging materials in case they will be needed some time 72 0027 03A 20 XG2130 E1 Datacom Tester Getting Started 2 2 Power Supply This instrument can be powered by external power supply or rechargeable batteries 2 2 1 External Power Supply The external power supply requires a power source of 110V to 240V AC at a frequency between 50Hz to 60Hz nominal And the tester requires a nominal DC supply of 12V Plug the AC power cord into an appropriate AC wall out
96. isplays shown in Fig 56 will appear After named the current result the instrument will save the result as the name with ce lock followed Storages P 1 1 CURRENT Mode TX RX lt 01 gt Results1 Mode THROUGH lt 02 gt Results2 Mode APS DELAY lt 03 gt Results3 Mode APS DELAY 08 vacant results storages SETTI NG RESULTS Fig 58 Results storage menu Storages RESULTS P 1 1 UGG Mode TX RX lt 01 gt Results1 Mode RX HI Z lt 02 gt Results2 Mode THROUGH lt 03 gt Results3 Mode APS DELAY I 08 vacant results storages STORE Fig 59 Current result 72 0027 03A 111 XG2130 E1 Datacom Tester Navigating the Displays b Stored Results The stored results are as shown in Fig 60 User can view rename and delete the stored results as described in Table 49 Every stored result consists of full information about the settings results and time All the information can help the user in analysis of one valued test Storages RESULTS P 1 1 CURRENT Mode TX RX lt 01 gt Geist Mode RX HI Z lt 02 gt Results2 Mode THROUGH lt 03 gt Results3 Mode APS DELAY 08 vacant results storages VIEW UNLOCK Fig 60 Stored results When the result is chosen to be saved after the test is completed and there is no more saving capacity user can exit the Edit record s name menu first At the same time the result information will be saved in the
97. ital network DCE equipment usually provides the clock to 72 0027 03A 135 XG2130 E1 Datacom Tester Performing Measurements DTE equipment in order to make all digital equipments working synchronously Henceforward special attention should be paid that the synchronous clock source for the transmitter and receiver of the instrument internal or interface and valid clock sense rising edge or falling edge may be different based on the emulation mode of equipment under test The relevant configurations are described below DTE Mode When the E1 Datacom tester is configured as a DTE it can be connected to a DCE normally a modem or some other data set making it possible to test the whole datacom circuit from end to end DCE Mode When the E1 Datacom tester is configured as a DCE it can be connected to terminal equipment for confidence checking It can also be connected to transmission equipment which has been configured DTE y Synchronous Clock Configurations The E1 Datacom tester can use various clock configurations when emulating a DTE or DCE The examples shown in the illustrations apply to the V 24 X 21 V 35 and other interfaces but for simplicity only the V 24 circuit names are used Abbreviation Explanation DTE Digital Terminal Equipment DCE Digital Connect Equipment RD Received Data sourced from DCE 72 0027 03A 136 XG2130 E1 Datacom Tester Performing Measurements RC Receive Clock Sourced from DCE T
98. k slip measurement e In service framed and unframed testing Hi Z and Through mode testing CODE FAS CRC4 and E BIT BER testing Frame data and timeslot activity monitoring 72 0027 03A 5 XG2130 E1 Datacom Tester Overview Built in 64kb s tone channel listen capability CAS and CCS signaling monitoring e Round trip delay measurement e APS delay measurement e PCM simulator Extensive alarm generation Frame data Si Sa A FAS CRC 4 MFAS NMFAS and E BIT control and monitoring Idle word timeslot insertion VF tone generation and measurement CAS and CCS signaling generation and monitoring e Frequency offset and level measurement e Up to 999ppm transmit clock deviation e Transmit clock Internal Interface and External 2M clock signal option e Real time transmit circuit open short indication u Datacom Testing e Datacom V 24 V 35 V 36 X 21 RS 449 RS 485 EIA 530 EIA 530A BER testing e Asynchronous BER testing with baud rate 50b s 57 6Kb s e Synchronous BER testing with data rate 1 2Kb s 38 4Kb s and Nx64Kb s N 1 32 e DTE or DCE emulation mode e Synchronous clock source and sense selection Clock source Internal or Interface Clock sense Rising edge or falling edge 72 0027 03A 6 XG2130 E1 Datacom Tester Overview e Frequency and offset measurement e Handshaking signals control and monitoring u G 703 64kb s CO Testing e G 703 CO 64kb s BER testing e Octet timing control and monitoring e Frequency and offset m
99. ks of data and the 4 bit remainder is transmitted to the far end using the first bit in the FAS of each even numbered frame C1 C4 At the receiving end the receiver makes the same calculation and compares its results with those in the received signal f the two 4 bit words differ the receiving equipment knows that one or more errors are present in the payload Every bit of the block is checked so an accurate estimate of block error rate or errored seconds is made while the link is in service To enable the receiver to locate the four bits C1 C2 C3 C4 forming the remainder an additional frame called the CRC multiframe is formed The CRC 4 multiframe comprises sub multiframes I and II both of which comprise eight normal frames A CRC multiframe alignment signal is used to synchronize the receiver to this frame The signal is inserted bit by bit into the first bit position of the NFAS in frames 1 3 5 7 9 and 11 The CRC 4 multiframe alignment signal is 001011 and is transmitted in the first bit of the NFAS word The first bits of frame 13 and 15 called E bits are used to indicate a negative comparison that is data blocks with bits errors back from the far end to the transmitter If the E bit in frame 13 is O then there is an error in sub multiframe SMF I The E bit in frame 15 indicates error status from sub multiframe II in the same way Each sub multiframe in the CRC multiframe consists of eight standard PCM frames and is 1
100. let and connect the instrument with adapter cable And the instrument can be powered by external power supply via the AC adapter 2 2 2 Rechargeable Batteries The rechargeable batteries will typically power the instrument for more than 6 hours with the backlight off and Bit Error measurement selected The instrument uses 5 high performance 1800mAH Nickel Metal Hydride NiMH rechargeable batteries placed in the battery compartment that may not be fully charged when the user receive the instrument Whatever the state of charge use the instrument the battery is completely exhausted before giving it its first charge This will ensure better accuracy from the battery charge indicator Do not change battery model Do not use old and new rechargeable batteries together gt Do not use non rechargeable battery in case that may be cause the battery explosion or other danger 72 0027 03A 21 XG2130 E1 Datacom Tester Getting Started Replacement of Rechargeable battery A new rechargeable battery can be charged and discharged for about 800 1000 times before it can not be used any more Normally the fully charged batteries could support the instrument continuous 6 hours working depending upon the test settings So when the operating duration of the battery is apparently reduced the batteries should be replaced We suggest that the rechargeable batteries should be replaced every one or two years Method of Battery Replacement Ensure th
101. lock source as shown in Fig 86 Transmitter 1 Receiver Internal Data Clock Synthesizer Received Clock Receiver SCR Transmitter v 35 RD v 35 DTE Control DCE E1 Datacom Tester Protocol Converter Under Test Fig 86 Protocol converter under test uses the internal clock 72 0027 03A 149 XG2130 E1 Datacom Tester Performing Measurements Instrument settings Tx interface E1 E1 Tx clock source lt l nternal gt Rx interface V 35 DTE V 35 Rx clock lt RX CLK gt Protocol converter settings Rx interface E1 Tx interface V 35 DCE Tx clock source Internal b Transmitter is E1 Receiver is Datacom DCE Tester Supplies Clock to Converter Under Test Same with the receiver is Datacom DTE as shown in Fig 85 At this time the protocol converter is emulated as a DTE Instrument settings Tx interface E1 E1 Tx clock source lt l nternal gt Rx interface V 35 DCE V 35 Rx clock RX CLK Protocol converter settings Rx interface El Tx interface V 35 DTE Tx clock source E1 Line clock When the clock source of the V 35 receiver is chosen as Internal the instrument uses the clock on SCT which is supplied to the transmitter of converter under test to clock in the data on SD At this time the protocol converter must use SCT to clock out data on SD The instrument does not use the clock on SCR if provided by the protocol converter under test The instrument uses it
102. lt The menu to save the result will pop out when the test is completed The test result is not saved directly and the user can save it later in the CURRENT item of Storages menu The test period is controlled by the Start Stop key User defined duration Test period is initiated by pressing the Start Stop key and normally terminates at the end of the period but this can be overridden by the Start Stop key According to actual needs the time range can be set from 1 second 99 days Run a timed test by programming both the start and stop time of this test The test will automatically start and stop at the pre determined time And 39 XG2130 E1 Datacom Tester Navigating the Displays the test time range can also be set from 1 second 99 days and the start time can be set in the format of Y M D and H M S In case that the pre determined time is earlier than the real time clock of the instrument the test of pre determined time does not work this can be overridden by the Start Stop key If later than the current time the pre determined time works user is not able to manually start the test but can stop the test in advance manually Table 10 Resolution Storage and Duration settings b TX RX Mode Framed Settings The framed testing is intended to perform the bit error test of Nx64kb s N 1 31 in E1 timeslots This testing can make the accurate
103. ly asked questions and the resolutions 1 The tester cannot be powered on or has no displays When Low Battery alarms the tester will be shut down soon automatically When the voltage of battery drops to a low level the power circuit of the tester will be locked and cannot be opened until Plug the AC power adapter into an appropriate AC wall outlet and power the tester with external power supply When the battery is fully charged unplug the AC power adapter and press the Power key to switch on the tester And the tester will work normally 2 When the battery charged fully Charge LED will be turned off And LED will be lit as soon as plugging AC adapter again This is normal The battery will be charged automatically when connected with AC power adapter because the power consumption in working process The battery will be fully charged in a very short time And Charge indicator will turned off 3 The tester shuts off Check if the voltage of battery is low Check if Auto power off in Power Manager of Other menu is set to I or not 72 0027 03A 174 XG2130 E1 Datacom Tester Troubleshooting 4 The tester cannot work with battery Switch off the tester Open the end cover of tester check if the battery case is locked tightly or not If not re clip the case and slide it back on emphatically When hearing Click the battery case has been installed into the provided slot successfull
104. made using the keys situated immediately below the display The highlighted 72 0027 03A 28 XG2130 E1 Datacom Tester Navigating the Displays cursor is moved around the display using page and cursor keys When a highlighted field has more than 5 choices a softkey labeled is provided When is chosen the remainder of the menu is revealed Settings menu Press the Setting key to enter into the settings menu Press the Cursor Right and Down and Cursor left and Up keys to move the cursor press the F1 F2 F3 and F4 softkeys to select the corresponding parameters In case page number appears in the menu turn page by pressing the PgUp or PgDn key Press the Start Stop key to start the test after all the settings have already been configured completely Results menu Press the Result key to switch to the result menu F1 F2 F3 F4 softkeys are used to select various types of result analysis and statistics In case page number appears in the menu then page can be turned by pressing the PgUp or PgDn key Storages menu Press the Storage key to switch to the storage menu Press the Cursor Right and Down and Cursor left and Up keys to select storage name press the F1 F2 F3 F4 softkeys to view delete lock unlock rename and other actions to the settings and results of the record
105. ment can be used while the battery is charging During rapid charging the Charge indicator turns on When the rapid charging is completed charging automatically turns into a trickle charge the Charge indicator turns off The instrument certainly can be recharged when it is powered off the charging indicator can give the right display In addition the battery can be recharged with automobile charger at this time an automobile cigarette lighter adapter cable is needed 2 2 4 Low Battery I ndication When being powered by the battery this instrument can give the early alarm to low battery voltage and the Low Battery indicator turns on After being used for a couple of hours the battery voltage continues to drop to a low level and the instrument will automatically perform protective shutdown 72 0027 03A 23 XG2130 E1 Datacom Tester Getting Started When the Low Battery indicator turns on the external power supply is needed to support the instrument working while the battery is charging 2 2 5 Power Management This instrument provides automatic power off function When the instrument is not under test started status and there is no keystroke in 5 minutes this instrument will be turned off automatically This function can effectively prevent the instrument from being accidentally turned on and the battery from being exhausted during transport This function can be set to e or JF in Others menu
106. ms 8 x 125 us long That means there are one thousand CRC 4 error checks made every second CRC 4 error checking is very reliable because at least 94 of errored blocks are detected Another powerful feature CRC 4 framing provides is the local indication of alarms and errors detected at the remote end When an errored SMF is detected E bits are changed from 1 to 0 in the return path multiframe The local end therefore has exactly the same block error information as the far end CRC 4 checker Counting E bit changes is equivalent to counting CRC block errors Consequently the local end can monitor the performance of both go and return path This can be carried out by the network equipment itself or by suitable test equipment monitoring the received 2 Mb s stream In the same way the A bits return error alarm signals for loss of frame loss of synchronization or loss of signal from the remote end The CRC 4 frame structure is preferred format because of its error detection capability and immunity to false frame alignment refer to ITU T G 706 For systems without CRC framing in service testing is limited to checking for errors in the frame alignment word which provides a poor indication of errors in the payload 72 0027 03A 179 XG2130 E1 Datacom Tester Appendix B Appendix B Datacom Adapter Cables 1 V 24 Adapter Cable PIN Assignments DTE PIN bie haa ITU T Signal Equipment Tester ircu ae Signal Direction Under Test Tr
107. n Basic Errors below Error Free Seconds are counted for all sources over total elapsed time Counting may be inhibited under certain alarm conditions see Effects EFS EFS of Alarms on Basic Errors below Error Free Seconds is the number Basic of error free seconds during a test Analysis period expressed as a percentage of the elapsed seconds Current Current Error Ratio is the error ratio err ratio measured over the last second Average Average Error Ratio is the error ratio err ratio measured over total elapsed time Errored Blocks are counted for the BIT source over total elapsed time Background Errored Blocks are counted for BIT source over total elapsed time 72 0027 03A 77 XG2130 E1 Datacom Tester Navigating the Displays BiT Received bit violations BERT pattern set in the instrument FAS O Word errors in the FAS in timeslot 0 Bipolar violations in AMI code or code violations in HDB3 code Bipolar violations are defined as consecutive marks of the same polarity Code violations are defined as consecutive bipolar violations of the same polarity Received CRC4 errors in CRC4 Multi CRC4 frames Far end Block Errors FEBE reported in the first bit of frames 13 and 15 on El lines running with CRC4 multiframe Table 29 Basic Analysis in E1 TX RX mode Effected PCM30 PCM31 BIT are E error rate Average error rate oom e o ee ee ee 72 0027 03A 78
108. ng pulse signals comprising 4 bits ABCD These are generated by the signaling multiplex equipment The 64 kb s signaling capacity of timeslot 16 is divided between the 30 telephone channels and two auxiliary channels synchronization and alarm message using pairs of 4 bit ABCD signaling words Over a complete multiframe all 30 channels are serviced Timeslot 16 can accommodate a pair of 4 bit ABCD signaling words This ensures that all 30 channels are serviced over a complete multiframe Common channel signaling CCS If CCS is used multiframe alignment is unnecessary Timeslot 16 is simply used as a 64 kb s data channel for CCS message or it can be turned over to revenue earning traffic giving a total of 31 channels for the payload PCM31 Limitations of the standard framing format When the 2 Mb s frame is used exclusively for PCM voice transmission the frame alignment criteria is very reliable However it has some limitations particularly for data transmission and on line performance monitoring With data transmission the traffic can inadvertently simulate the frame alignment and non frame alignment words and false framing is possible This can have a serious effect on the data Performance monitoring of received signal is limited to checking for errors in the frame alignment signals This gives a poor indication of errors in the payload as only seven bits in 256 are being checked There is no way for the remote end to send back thi
109. nts DCE PIN ae ITU T Signal Equipment N Tester Circuit Name ab Signa Direction Under Test Transmit ie wh DCE oo reef ae e DCE Sonal Gound_ seo 7 ea ree ee ee Ie D Ka a C Co eearve sens asa aos e E ers 306 Transmit Clock Be ema Anpi a Transmit Clock Data Terminal a Data Terminal Z Data Carrier _ Data Carrier 72 0027 03A 191 XG2130 E1 Datacom Tester Appendix B 13 EI A 530 Adapter Cable PI N Assignments DTE PIN ITU T Signal Equipment Tester Circuit Name Signal Direction Under Test ae a Data Tansmite Data ans a DTE Transmit Clock DTE a Signal Ground Data Terminal Ready Eg ce ki Send Request 7 Send recived Data recived Data DCE DCE Detect Detect W ies 5s w oj gt OJU vy O pd w 72 0027 03A 192 XG2130 E1 Datacom Tester Appendix B 14 El A 530 Adapter Cable PIN Assignments DCE PIN Equipment ircui ignal Tester Circuit Name Ab Signal pivection Under Test Rees ate Bea A K sec5 B Transmit Clock DBA DCE A Transmit Clock DB B DCE Signal Ground AB Data Set Ready ERA A Data Set Ready B Clear to Send A Clear to Send B B Transmitted Data A B Transmit Clock DTE A Transmit Clock DTE B B B Ready A Ready B A B C C Request to Send A BB A BB B DB A DB B AB CC A
110. nts DTE PIN ITU T Signal Equipment Tester Signal Under Test Terminal Timing DTE Terminal Timing DTE Signal Ground Terminal Ready Terminal Ready B B B A g Request to Send G A A A Clear to Send Clear to Send Data Mode Data Mode D DCE DCE A B 72 0027 03A 186 B S S T T R R C C D pg D A D B TT A TT B S R A R B RS A RS B D A D B RT A RT B S A S B M A M B ST A ST B RR A RR B 1 A B is poe e ae aa a B A B a a 103 103 mg e 24 oe Wee e 107 107 XG2130 E1 Datacom Tester Appendix B 8 RS 449 Adapter Cable PIN Assignments DCE PIN Equipment Circuit Name ITU T Signal quip Tester sona Direction Under Test 2 Send Tinira DCE Send Timina DCE Signal ci A Clear to Send B CS B DTE B A k E B rE A Penge rof B Receive Timing Rea aw n Receive Timing Re o n ree ea f A esi ro B 72 0027 03A 187 Terminal fon DTE A XG2130 E1 Datacom Tester Appendix B 9 X 21 Adapter Cable PIN Assignments DTE PIN ae ITU T Signal Equipment Tester Signal Under Test Signal Element Timing A Signal TF Timing DCE DCE 72 0027 03A 188 XG2130 E1 Datacom Tester Appendix B 10 X 21 Adapter Cable PIN Assignment DCE DB44 male DB15 male PIN ITU T Signal Equipment
111. o worse than 30 The number of severely errored block seconds SEBS SEBS expressed as a percentage of the available time in seconds during the total elapsed time blocks not occurring as a part of an SES The ratio of errored blocks to total blocks during a fixed measurement interval excluding all blocks during SES and unavailable time The number of unavailable seconds during a test period A system becomes available when the errored block ratio measured in 1 second intervals is better than the severely errored block second threshold for 10 or more consecutive seconds A system becomes unavailable when the errored block ratio measured in 1 second intervals is greater 72 0027 03A 83 XG2130 E1 Datacom Tester Navigating the Displays than the severely errored block second threshold for 10 or more consecutive seconds The number of unavailable seconds during a test UAS period expressed as a percentage of the total number of elapsed seconds Table 36 G 826 Analysis in E1 TX RX mode The effects of alarms on the block counts in G 826 Analysis are as shown in Table 37 SignalLoss AIS Pattern Loss Table 37 Effects of alarms on EBS SEBS in the unframed E1 d M 2100 Analysis ITU T M 2100 recommendation is used to evaluate the connection quality of El line in a long term test M 2100 Analysis provides statistics counts of errored seconds ES severely errored seconds
112. of the system under test Since the protocol converters such as V 35 E1 V 24 E1 converters are commonly and largely used in China E1 Datacom tester provides this function for the synchronous BER testing of different datacom interfaces with the El interface 72 0027 03A 69 XG2130 E1 Datacom Tester Navigating the Displays 3 2 4 1 Page 1 of Protocol Converter Settings Return to the Settings main menu move the cursor to the Function item and press the F4 key to select settings menu as shown in Fig 31 The Protocol Converter settings menu consists of 5 pages in page 1 press the Cursor Right and Down key to move the cursor to positions to set Tx interface Rx interface Framing BERT pattern and Polarity parameters and select relevant parameters by pressing F1 F2 F3 F4 softkeys as shown in Fig 31 Settings P1 10 30 00 Function PROTOCOL CONVERTER Tx interface V 35 DTE Rx interface lt E1 gt UNBAL 752 Tx framing lt SYNC gt BERT pattern 215 1 INVERTED Tester is ready for use PROTOC G 703 DATACOM CONVER co Fig 31 Page 1 of Protocol Converter settings menu The settings of relevant Tx interface and Rx interface parameters are as shown in Table 24 Under the test mode of relevant protocol converters the matching relation of Tx and Rx interface types is as shown in Table 25 72 002
113. on the equipment usually generates AIS on 2 Mb s signal firstly When the instrument receives this AIS alarm the timer internal is set running and a test pattern will be transmitted into the path under test The 72 0027 03A 129 XG2130 E1 Datacom Tester Performing Measurements received pattern stops the timer and APS delay time will be calculated Fig 68 shows the typical connection Test Description e Loop delay is only possible at 2 Mb s line rate e Set up the settings as described in Section 3 2 5 e When completing all the settings press the Result key to enter into relevant result menu and then press the F1 key to start the test e Wait for the AIS signal and the delay time is calculated e All the test results are described in Section 3 3 5 4 2 1 6 Timeslot Analysis When performing in service testing RX HI Z mode or Through mode not only the error measurement can be tested but also the data and activities of all 64kb s timeslot and signaling words in E1 signal can be monitored Since the timeslot data always carry the speech information the instrument also provides the listen capability to all the voice channels Fig 70 and Fig 71 show the examples Test Description e The settings are described in relevant parts of RX HI Z mode framed testing in Section 3 2 2 e Inthe result menu user can select the timeslot that needs to be monitored From the display both binary and hex forma
114. properly according to the above procedures If user finds one LED indicator can not be turned on or off the LED indicator may be damaged or out of control In that case please contact the instrument supplier as soon as possible Since the CHARGE LED indicator is not controlled by CPU therefore this LED can not be checked by self test Others SELF TEST Perform the test I Accessorial system functions Fig 67 Self Test configurations 72 0027 03A 120 XG2130 E1 Datacom Tester Navigating the Displays It will display V if the test is ok and display x if the test is failed User can not exit the self test until the test has completed 3 5 7 Tester Info Tester I nfo menu displays the serial number code software version hardware version and manufacturer and optional function module and other information of the instrument 3 5 8 Producer I nfo Producer Info menu displays company name website service phone email and other information of the manufacturer 72 0027 03A 121 XG2130 E1 Datacom Tester Performing Measurements 4 Performing Measurements This chapter is intended to help the user in performing measurements with El Datacom tester Full details of the measurements and how to perform them will be described below 4 1 Overview 4 2 Perform the measurements 4 1 Overview The E1 Datacom tester combines E1 circuit testing function and datacom communication ci
115. r test And this test pattern will be looped back to the receiver The instrument makes bit error test and analysis based on the comparison of the transmitted and received data Settings P1 10 30 00 Function L Rd TX RX Interface UNBAL 75Q HDB3 Framing PCM30 BERT pattern 22 41 Polarity INVERTED ITU T Tester is ready for use PROTOC DATACOM CONVER Fig 4 Page 1 of Settings menu Framing Description UNFRAMED The unframed data is a 2 048Mb s serial binary data stream without framing Framed E1 with Channel Associated Signaling PCM30 CAS multiframe Framed E1 with Channel Associated Signaling Table 5 Framing parameter settings e Page 1 of Settings menu in TX RX mode unframed 72 0027 03A 32 XG2130 E1 Datacom Tester Navigating the Displays unframed testing mode has 2 pages with the page 1 as shown in Fig 5 Settings P1 10 30 00 Function El L TRE Interface UNBAL 759 HDB3 Framing UNFRAMED BERT pattern 24T Polarity INVERTED ITU T Tester is ready for use Fig 5 Page 1 of Settings menu in TX RX Unframed Under MAINA mode in page 1 of the settings menu move the cursor to the parameter s positions corresponding to Interface Framing BERT pattern Polarity and select relevant parameters by pressing F1 F2 F3 F4 softkeys The setting parameters of I nterface
116. r the elapsed test period Only provided in PRBS test patterns Table 46 Alarm Seconds descriptions in Datacom In the synchronous transmission system the data signals are always clocked in or out with the clock signals And these two types of signals are synchronous transmitted and received on 72 0027 03A 103 XG2130 E1 Datacom Tester Navigating the Displays separate pairs of circuits Therefore Signal Loss alarm of the instrument in SYNC mode can not be judged only by the received data signals especially when received data is all 0 or all 1 The judgment rules of Signal Loss and Clock Loss in synchronous datacom interface are described in Table 47 The example clock signals in Table 47 apply to all the datacom interfaces but for simplicity only the V 24 circuit names are used Please refer to Appendix B for the pin assignments of the datacom interfaces item Emulation Judgment basis No effective data is detected and at the Same time there is no receive clock signal If the received data is all 1 or all 0 but the receive clock signal still exists then it should not be judged as a Signal loss TX clock Clock signals source detected RX CLK No TC or no RC RX clock Clock signals source detected RX CLK No XTC No receive clock signal Internal is needed to detect Table 47 Judgment rule of Signal Clock loss in SYNC mode The clock signals of typi
117. rcuit testing function together With this unique combination the instrument can be used to make measurements for transmission networks which cover 50b s 2 048Mb s bandwidth It supports more than 10 types of various telecom and datacom interfaces which are widely used in digital networks E1 Datacom tester is suitable for R amp D manufacturing installation certification and maintenance testing of PCM digital communication equipment and multi protocol interface converters The basic procedure of making measurement is a Select the test interface b Set up the measurement parameters c Perform the measurement d Display or store the results e Upload and analyze the stored results 72 0027 03A 122 XG2130 E1 Datacom Tester Performing Measurements 4 2 Perform the Measurements 4 2 1 E1 Service Testing 4 2 1 1 Out of service Bit Error Rate Testing The out of service error testing is mainly used in the development spot installation spot acceptance and daily maintenance of equipment can accurately perform measurements of the transmission quality of the system under test In addition the instrument will give full analysis on the error signal alarm seconds and event records The out of service testing can be made by local loop or far end loopback and far end mutual test as shown in Fig 68 and Fig 69 El Loopback Fig 69 Out of service BER Testing Far end Mutual Test LTE Line Terminal Equipment of
118. rs 72 0027 03A DB37 connector DB44 DB37 adapter cable Data and clock circuits are balanced according to V 11 control circuit conforms to V 10 Input clock and data signal terminated by 1209 Balanced signal polarity A lt B Binary 1 OFF A gt B Binary 0 ON Differential output voltage 2V minimum into 100Q 5V maximum Open circuit Rise time less than 20ns Short circuit current less than 150mA Differential input threshold voltage 0 3V Input impedance 4kQ minimum Open circuit voltage 4V 6V 3 6V minimum into 450Q Short circuit current less than 150mA 163 XG2130 E1 Datacom Tester Technical Specifications V 10 Receiver Input current 3 25mMA 3 25mA Input impedance 4KQ minimum Differential input threshold voltage 0 3V Pin Assignments See Appendix B d X 21 General DB15 connector DB44 DB15 adapter cable Data and clock circuits are balanced according to V 11 Input clock and data signal terminated by 1209 Pin Assignments See Appendix B e RS 449 General DB37 connector DB44 DB37 adapter cable Data and clock circuits are balanced according to V 11 and V 10 Input clock and data signal terminated by 1202 Pin Assignments See Appendix B f RS 485 General 72 0027 03A DB25 connector DB44 DB25 adapter cable Data and clock circuits are balanced 164 XG2130 E1 Datacom Tester Technical Specifications according to V 11 and V 10 Input clock and data signal terminated b
119. s to troubleshoot the problems when making the synchrounous measurements ettings P3 10 30 00 103 OK RS 105 0N 104 NONE CS 106 OFF 113 OK DTR 108 ON 114 OK DSR 107 OFF 115 OK RLSD 109 ON Tester is ready for use Fig 27 Control circuits of V 35 in SYNC The control circuits of RS and DTR can be set ON or OFF in the displays 3 2 2 6 Page 4 of Datacom Settings Menu Press the PgDn key to enter into page 4 of the Datacom settings menu press the Cursor Right and Down key to move the cursor to positions to set Error add Resolution Storage and Duration parameters and then select relevant parameters by pressing F1 F2 F3 F4 keys as shown in Fig 28 Error add Resolution Storage and Duration setting parameters are same with those in E1 testing All the descriptions of these parameters are described in Table 9b Table 10 respectively 72 0027 03A 66 XG2130 E1 Datacom Tester Navigating the Displays Settings P4 10 30 00 Block length lt 1000 gt Error Add lt BIT gt GWGwa 1E 2 Resolution 1MIN Storage YES Duration TIMER 01 MINS Start 2004 04 26 10 25 36 Tester is ready for use SINGLE RATE EA Fig 28 Page 4 of Datacom settings menu 3 2 3 G 703 CO Settings Menu Return to the Settings main menu move the cursor to the Function item and press the F4 k
120. s internal synthesizer to derive the clock on SCT shown in Fig 87 Instrument settings 72 0027 03A 150 XG2130 E1 Datacom Tester Performing Measurements Tx interface E1 E1 Tx clock source lt I nternal gt Rx interface V 35 DCE V 35 Rx clock Internal Protocol converter settings Rx interface E1 Tx interface V 35 DTE Tx clock source E1 Line clock El Receiver c Data Clock Internal Received Synthesizer SCT Clock t SCR Not Used Receiver Transmitter V 35 A RD V 35 DCE Control DTE E1 Datacom Tester Protocol Converter Under Test Fig 87 Tester supplies clock to the transmitter of converter Converter Uses Internal Clock Same with the receiver is Datacom DTE as shown in Fig 86 At this time the protocol converter uses its internal synthesizer to receive E1 data and clock out V 35 data on RD And the Rx clock source of the instrument should be fixed on Interface Instrument settings Tx interface E1 E1 Tx clock source lt I nternal gt Rx interface V 35 DCE V 35 Rx clock RX CLK Protocol converter settings Rx interface E1 Tx interface V 35 DTE 72 0027 03A 151 XG2130 E1 Datacom Tester Performing Measurements Tx clock source Internal c Transmitter is Datacom DTE Receiver is E1 The instrument uses its internal synthesizer to clock data on SD And the protocol converter must use the clock on SCR to generate 2M clock to tran
121. s rudimentary error performance data so only one direction of transmission can be monitored at each location In an age of increasingly competitive digital leased line service this is inadequate 72 0027 03A 177 XG2130 E1 Datacom Tester Appendix A 2 PCM30CRC PCM31CRC Frame Format ITU T G 704 Sub TS1 TS17 Number TS15 TS31 FAS ta Pen O01 ft oii Date Data Pp CNFASCCC B 8 bit o 1 A Sal Sa Sa Sa Sa Data Data 8 bit 8 bit ae Pe Tota Data Data 8 bit 8 bit o 1 A Sal Sa Sa Sa a Data Data 8 bit Simin aaa Data NFAS 1 a A Sa Sa SalSa Sa Data 8 bit aana ier Data NFAS 8 bit eee ee ge ae 8 bit e aaa Data NFAS 8 bit 1 1 a SalSa Sa Sa Sa Data TS10 TS26 Data fez ojolijajolilal 1 1 A Sa Sal sa Sa Sa Data 8 bit esto ojifilofa il Data E1 1 A Sa Sa Sa Sa Sal Data capo ota r Loria Data E2 1 A Sa Sa Sa Sa Sa Data Da CRC 4 framing To overcome the limitations of the standard framing format issued above ITU T recommendation G 704 specifies that the use of a CRC 4 cyclic redundancy check for 2 Mb s systems CRC 4 framing provides reliable protection against incorrect synchronization and a means of monitoring bit error ratio BER during normal operation In other words CRC 4 framing 72 0027 03A 178 XG2130 E1 Datacom Tester Appendix A algorithm is extremely unlikely to be fooled by payload data patterns The CRC 4 remainder is calculated on complete bloc
122. s those in RX HI Z mode 72 0027 03A 45 XG2130 E1 Datacom Tester Navigating the Displays 3 2 1 4 Loop Delay Mode The time taken for voice or data traffic to pass through network is very important as excessive delay adds distortion Speech is particularly affected by delays longer than 150ms Loop delay Round Trip Delay is a measurement of the total delay on the go and return legs of a duplex path and is typically in the order of milliseconds The instrument measure the time taken for a test pattern to be transmitted over the go and return legs of a duplex path A test pattern is transmitted in an Nx64k b s path or a 2Mb s unframed path and a timer is set running A loopback is manually applied to the network equipment to return the test signal The received pattern stops the timer and the round trip delay is calculated in resolution of 1lus Go back to page 1 of Settings menu select in Function item to set relevant parameters as shown in Fig 11 Different formats of frame set will have different settings We will describe them below respectively a Loop Delay Unframed Settings As shown in Fig 11 press the Cursor Right and Down key select Framing as MAANA mode There has one page of settings in this mode And move the cursor to the positions to set Interface parameter and select relevant parameters by pressing F1 F2 F3 and F4
123. scription Datacom Special Adapter Cable I DTE DCE Datacom Special Adapter Cable II DTE DCE Datacom Special Adapter Cable III DTE DCE Datacom Special Adapter Cable IV DTE DCE G 703 CO Special Adapter Cable Applying Connector Interfaces V 24 RS 485 DB25 EIA 530 EIA 530A RS 449 V 36 DB37 197 XG2130 E1 Datacom Tester Appendix E Appendix E Abbreviation AIS AMI BBE CAS CCS CODE CRC DM EB EFS ER ES FAS HDB3 MF MFAS MFOTS16 multi frame N FAS NMFAS PCM REBE SES SMF UNAVA 72 0027 03A Alarm Indication Signal Alternate Mark Inversion Background Block Error Channel Associated Signaling Common Channel Signaling Code Cyclical Redundancy Check Degraded Minutes Error Block ERR Free Seconds Error Errored Second Frame Alignment Signal High Density Bipolar3 Multi frame Timeslot 16 for the multiframe alignment signal MFAS 0000 in bits 5 to 8 Timeslot 16 for the FO sub frame of Unframed Signal Timeslot 16 for the multiframe alignment signal NMFAS XYXX in bits 1 to 4 Pulse code Modulation Remote End Block Errors Severe Errored Second CRC Sub Multiframe Unavailability 198
124. smit E1 signal At this time the protocol converter should be configured in EXT line clock mode which means clock is sourced from the datacom interface as shown in Fig 88 Instrument settings Tx interface V 35 DCE V 35 Tx clock lt I nternal gt Rx interface E1 E1 Rx clock source lt I nterface gt Protocol converter settings Rx interface V 35 DTE TX interface E1 Tx clock source EXT line clock on V 35 Receiver El Data Clock Received Internal Clock Synthesizer Transmitter SCR z Receiver V 35 SD V 35 DTE Control DCE E1 Datacom Tester Protocol Converter Under Test Fig 88 Tester supplies clock to converter under test d Transmitter is Datacom DCE Receiver is E1 72 0027 03A 152 XG2130 E1 Datacom Tester Performing Measurements It is fully same with the case when the transmitter of instrument is V 35 DTE and the receiver is E1 If the protocol converter supports receiving clock signal SCT from DCE equipment then the protocol converter can use the clock on SCT as EXT line clock to transmit data on RD otherwise the clock on SCR should be used Test Description e Choose Protocol Converter in the Settings menu make the configurations to all the parameters Refer to Section 3 2 4 for details e Press the Start Stop key when settings have been configured and press the Result key to enter into relevant result menu See relevant
125. softkeys The settings of I nterface and Framing parameters are 72 0027 03A 46 XG2130 E1 Datacom Tester Navigating the Displays described in Table 6 and Table 5 Settings 10 30 00 Function El Loop DELAY Interface UNBAL 75Q HDB3 Framing UNFRAMED BERT pattern lt 21 1 gt Polarity lt INVERTED gt ITU T Tester is ready for use LOOP oe PCM DELAY DELA SI MULAT Fig 11 Loop Delay settings menu Unframed b Loop Delay Framed Settings As shown in Fig 12 press the Cursor Right and Down key select the framing formats of CIVET PCM30CRC ieee eee ve There have two pages of settings in this mode as shown in Fig 12 and Fig 13 e Page 1 of settings menu in Loop delay Framed mode As shown in Fig 12 in page 1 move the cursor to the positions to set Interface and Framing and select relevant parameters by pressing F1 F2 F3 and F4 softkeys The settings of I nterface and Framing parameters are described in Table 6 and Table 5 e Page 2 of settings menu in Loop delay Framed mode Press the PgDn key to enter into page 2 of the settings menu in Loop delay framed mode as shown in Fig 13 Move the cursor to the positions to set Tx Rx timeslots and other 72 0027 03A 47 XG2130 E1 Datacom Tester Navigating the Displays parameters by pressing F1 F2 F3 and F4 softkeys Set
126. sting otherwise there has only 1 page Move the cursor to the positions to set Interface Framing Resolution Storage and Duration parameters and select relevant parameters by pressing F1 F2 F3 F4 softkeys Above relevant parameters are described in Table 5 6 10 Settings 10 30 00 Function El RX HI Zi Interface UNBAL 75Q HDB3 Framing UNFRAMED Resolution IMIN Storage NO Duration MANUAL Tester is ready for use Fig 8 Settings menu in RX HI Z mode Unframed b RX HI Z Framed Settings e Page 1 of settings menu in RX HI Z mode framed As shown in Fig 9 press the Cursor Right and Down key to select El frame as the framed structure There have 2 setting pages in RX HI Z mode framed testing as shown 72 0027 03A 43 XG2130 E1 Datacom Tester Navigating the Displays in Fig 9 and Fig 10 In page 1 move the cursor to the positions to set Interface Framing Idle pattern Resolution and Storage parameters and select relevant parameters by pressing F1 F2 F3 F4 softkeys Above relevant parameters are described in Table 5 6 10 11 Settings Pl 10 30 00 Function E1 I RX HI Z Interface UNBAL 759 HDB3 Framing GXAET Idle pattern 10101010 LMIN Storage NO Tester is ready for use Fig 9 Page 1 of settings menu in RX HI Z framed mode
127. strongly recommend that user installs the software following the default mode 6 3 2 Uninstall TestManager 6 4 From the Start menu choose Settings Open Control Panel Click Add Remove Programs Select TestManager in the list Click Change Remove button to remove the software automatically How to Use TestManager Software 6 4 1 Connect the I nstrument See Section 2 4 and confirm connection successful and setting correct 6 4 2 TestManager Software Operation Graphic windows help the user operate TestManager software 72 0027 03A 171 XG2130 E1 Datacom Tester Working with TestManager simply and easily User can work with TestManager as follows Double click the icon of TestManager to run the software Switch off the instrument Connect RS232 communication cable between the integrated RS232 port with the serial port of your PC Switch on the instrument and set RS232 Port State as ON Click Select icon in the short cut bar or in the Manipulation menu to choose the type of instrument which you are working with Click Connect icon in the short cut bar or in the System menu to make the connection with the instrument After connecting successfully user can do the operations as below Upload the stored results Click Upload icon in the short cut bar or in the Manipulation menu to upload the stored results from the ins
128. t of the data are provided Please refer to Section 3 3 2 for details e The frame structure of PCM30 PCM30CRC PCM31 and 72 0027 03A 130 XG2130 E1 Datacom Tester Performing Measurements PCM31CRC are described in Appendix A 4 2 1 7 PCM Simulator Testing When PCM Simulator function is chosen the El1 Datacom tester can be simulated as PCM equipment In this mode the instrument provides various alarm insertion transmit clock deviation error insertion frame data generation VF tone generation and measurement and so on In the mean time the instrument also performs framing bits signaling bits spare bits monitoring and signal analysis to the received E1 signal It is mainly used to check the performance of PCM equipment For example the VF tone generation and measurement function can be used to verify the PCM coding and decoding of the equipment Fig 73 shows a typical connection of PCM Simulator testing E1 Datacom Tester Fig 73 PCM Simulator testing Test Description e The settings are described in Section 3 2 6 e All the test results in this mode are described in Section 3 3 6 72 0027 03A 131 XG2130 E1 Datacom Tester Performing Measurements 4 2 1 8 Tx Clock Deviation Testing The transmit clock which sourced from internal synthesizer can be deviated up to 999 ppm by user with the step of 1ppm step This function can evaluate the synchronous clock recovery capability of the receiver
129. t the clock source that clocks data out of the instrument Choose if you want the instrument to supply the clock or Yaa if you want the system under test to supply the clock If is selected then the Tx data rate setting will appear on the display And the user can select a rate between 1200 b s and 2 048M b s or up to 128 kb s if the V 24 interface is selected If the AAAA is selected then you can choose which edge of the incoming clock you want to clock data out on Select l to clock on the rising edge or jy to clock on the falling edge 72 0027 03A 63 XG2130 E1 Datacom Tester Navigating the Displays To Supply a Clock to the System Under Test The instrument supplies a clock which can be used to clock data into the system under test This clock is derived from the selected Tx clock source No clock is available from the instrument if the X 21 interface is selected when the instrument is emulating a DTE Move the cursor to Tx output clock sense setting to select and which makes the data clocked out coincident with the rising edge or falling edge To Select the Receive Clock Source Move the cursor to Rx clock source to select the clock source that clocks data into the instrument If the instrument is configured DTE the Rx clock source is supplied from the INTERFACE only If the instrument is configured as DCE select if you want to use the clock supplied by the instrument to the system under
130. tacom Tester Performing Measurements into the path to verify the operating status of the instrument including the transmitter and receiver 4 2 1 2 In service Testing In applications when the service can not be interrupted such as the transmission of the real time accounting information the user should make the measurements in the in service testing mode In service testing provides monitoring error performance on FAS CODE CRC4 and E BIT In the measurements user can also make a listen to any speech channel and monitor timeslot data CCS or CAS signaling word frame data such as FAS NFAS There are two in service testing mode including RX HI Z mode and Through mode RX HI Z mode testing connection is as shown in Fig 70 Through mode testing connection is as shown in Fig 71 Telecom High Impedance Datacom Tester Fig 70 RX HI Z mode in service testing MUX Multiplexer Demultiplexer 72 0027 03A 125 XG2130 E1 Datacom Tester Performing Measurements Telecom Network E1 Datacom Tester Fig 71 Through mode in service testing Test Description e When El RX HI Z mode is chosen the input impedance of the receiver of the instrument is set under high impedance gt 2K2 User can directly connect the receiver of the instrument to 2 Mb s transmission channel with the transmitter or receiver on DDF Digital Distribution Fame According to framings of the 2 M
131. ted timeslots in the receive direction to make the BER testing Fig 72 shows one Nx64Kb s BER testing connection De SS ge re Ge eg ore a Ce ee I TAPE 7 EERE E1 Tx DAG Datacom Tester Fig 72 Nx64Kb s BER testing 72 0027 03A 127 XG2130 E1 Datacom Tester Performing Measurements Test Description e As shown in Fig 72 the E1 DXC equipment cross connects the 2 and the 3 timeslots of one E1 signal to the 29 and the 30 timeslots of another E1 signal Therefore user should select the 2 and the 3 timeslots in Tx timeslots and the 29 and the 30 timeslots in Rx timeslots Then the BER testing can be performed in these two timeslots path e When making BER measurements in Nx64kb s mode TX RX framed testing mode should be configured Please refer to the relevant parts of the Section 3 2 1 e When completing all the settings press the Start Stop key and the Result key to enter into relevant result menu All the test results in this mode are described in Section 3 3 1 4 2 1 4 Loop Delay Measurement The time taken for voice or data traffic to pass through the network is very important as excessive delay adds distortion Speech is particularly affected by delays longer than 150 ms Loop delay means the total round trip delay on the go and return legs of a duplex path and is typically in the order of microseconds The instrument measures the time taken for a test patt
132. the Displays 64 kb s data channels are more frequently used than the traditional speech channels in El signals So the method to make the estimation of channel activities is transited from traditional 4 bit signaling ABCD word monitoring to timeslot data monitoring In the instrument the status of timeslot idle can be defined by programming the idle pattern in Settings menu Results OODOOH15M25S TS ANALYSIS ESB P 1 3 TSOl B TS02 TS03 B TS04 B TS05 TS06 B TS06 B TS08 B TS09 B B TS10 B TS11 B TS12 Running Please wait FAS TS NFAS TS16 MONITOR ACTIVIT Fig 47 Activity in TS Analysis 3 3 1 3 Results Menu in E1 Through Mode The result menus in E1 Through mode are same with the result menus in E1 RX HI Z mode Please refer to Section 3 2 1 2 for details 3 3 1 4 Results Menu in E1 Loop Delay Mode The result menu displays the delay time of E1 signal in one round trip with maximum measurement delay of 2s Second in the accuracy of tlus microsecond as shown in Fig 48 In the menu user should make the measurements by pressing F1 If the delay time exceeds the maximum or the line is out of service the information will appears on the prompt line 72 0027 03A 98 XG2130 E1 Datacom Tester Navigating the Displays Results Loop delay Test is completed START TEST Fig 48 Loop Delay result menu 3 3 1 5 Results Menu in E1 A
133. time expressed as a percentage of the available time in seconds The number of severely errors seconds SES is counted over the available time A severely errored 72 0027 03 a 80 XG2130 E1 Datacom Tester Navigating the Displays second is a second which has an error ratio worse than the threshold 10 The number of severely errored seconds SES expressed as a percentage of the available time in seconds The number of degraded minutes DM during the test period A degraded minute is a 60 second 1 minute composite interval during the available time excluding severely errored seconds over which the error ratio is worse than 10 The number of degraded minutes expressed as a percentage of the total number of elapsed minutes of available time Unavailable Seconds UAS is the number of unavailable seconds during a test period Asystem becomes available when the error ratio measured in 1 second intervals is better than the severely errored second threshold for 10 or more consecutive seconds A system becomes unavailable when the error ratio measured in 1 second intervals is greater than the severely errored second threshold for 10 or more consecutive seconds The number of unavailable seconds during a test period expressed as a percentage of the total number of elapsed seconds Table 33 G 821 Analysis in E1 TX RX mode 72 0027 03A 81 XG2130 E1 Datacom Tester Navigating the Displays
134. tings P1 10 30 00 Function El LOOP DELAY Interface UNBAL 75Q HDB3 Framing CXANER BERT pattern lt 21 1 gt Polarity lt INVERTED gt ITU T Tester is ready for use Fig 12 Page 1 of settings menu in Loop Delay Framed The settings of Tx Rx timeslots parameters are described in Table 11 Settings 2 10 30 00 Tx Rx timeslots Tx Rx Bandwidth Tx 00 64K Rx O00 64K Tester is ready for use TX DIVERSE AS RX Fig 13 Page 2 of settings menu in Loop Delay Framed 3 2 1 5 APS Delay Mode The time taken for El signal transferring one to another transmission path is also very important to networks with E1 protection systems such as SDH In these systems once any of E1 links goes faulty while generating AIS alarm the system 72 0027 03A 48 XG2130 E1 Datacom Tester Navigating the Displays will automatically switch that El link to the other standby one When the instrument received AIS alarm a timer is started After the detection of recovery from AIS the timer will be stopped and the APS delay will be calculated in resolution of lus APS Delay is ideal for the assessment of the switching performance in SDH optical transmission or other networks Go back to page 1 of Settings menu select MANEN in Function item to set relevant parameters All these parameter configurations are same as those in Loop Delay mode 3 2 1 6 PCM Simulator Mode
135. tio 5 694E 10 Running Please wait BASIC G 821 LARM ANALYSI ANALYSI eae Fig 50 Page 1 of Basic Analysis in Datacom Basic Analysis performs result statistics of error count error free seconds current error ratio average error ratio 72 0027 03A 100 XG2130 E1 Datacom Tester Navigating the Displays errored block count and errored block ratio for BIT Basic Analysis result menus are as shown in Fig 50 51 The relevant result analysis items are described in Table 45 Results OODOOH15M25S T EAEL F UASA P 2 2 Block Errored block Errored block ratio Running Please wait BASIC G 821 LARM ANALYSI ANALYSI SECONDS Fig 50 Page 2 of Basic Analysis in Datacom Result Bee Test result description Analysis Basic The number of BIT errors counted Analysis over the elapsed time Error Free Seconds are counted for the BIT source over total elapsed time in seconds Error Free Seconds is the number of error free seconds during a test period expressed as a percentage of the elapsed seconds Current Current Error Ratio is the error ratio err ratio measured over the last second 72 0027 03A XG2130 E1 Datacom Tester Navigating the Displays Average Average Error Ratio is the error ratio err ratio measured over total elapsed time The number of blocks counted over the elapsed test period The default block length is supplied by the instrument The numb
136. transmission system PDH SDH 72 0027 03A 123 XG2130 E1 Datacom Tester Performing Measurements Test Description When E1 TX RX mode is chosen configure the settings according to the specific configurations of the equipment under test Please refer to relevant part of Section 3 2 1 After completing the settings press the Start Stop key and the Result key to enter into relevant result menu The test result is described in Section 3 3 1 The results may be different according to the different settings When making loopback test the loop can be made by loopback interface to network directly at the local equipment under test or the far end loopback which can be configured via the maintenance software of the system under test In out of service framed BER testing if there is no 64K timeslot DXC equipment in the loopback path the transmit and the receive timeslots need to be set as TX AS RX If the DXC equipment is used in the loopback path and the transmit timeslots have been cross connected then the receive timeslots need to be determined according to the cross connected timeslots At this time the transmit and the receive timeslots should be set as DIVERSE Pay attention to ensure that the test pattern and pattern polarity of the local and far end instrument should be set identically in the far end mutual test When making the measurements error can be inserted 72 0027 03A 124 XG2130 E1 Da
137. trument View the uploaded results Click View icon in the short cut bar or in the Manipulation menu to check the detailed information of every uploaded results in the software If there has a graph result user can also view the histogram analysis of the error and alarm events In addition user can delete and print any result 72 0027 03A 172 XG2130 E1 Datacom Tester Working with TestManager Clean up all uploaded results in software Click Clean Up the Records the System menu to delete all the uploaded results of one instrument in the list Upgrade the embedded software Click Upgrade embedded software the System menu to update the embedded software of the selected instrument First step Click Read button to read out the type and software version of the selected instrument Second step Click Load File button to load the target hex file into the program Third step Click Next button to enter into the upgrading window and then click Upgrade button to start upgrading Fourth step The program will automatically complete the upgrading process After being upgraded the instrument will reset itself Fifth step Switch off the instrument and uninstall the RS232 communication cable Close TestManager program 72 0027 03A 173 XG2130 E1 Datacom Tester Troubleshooting 7 Troubleshooting This chapter is intended to provide prompt help to operator on some frequent
138. unction between E1 and V 24 V 35 V 36 X 21 RS 449 RS 485 ElA 530 EIA 530A G 703 CO interfaces It applies to the transmission performance test for multiple protocol converters and the development manufacturing installation certification and maintenance test of protocol converters Most commercially available data protocol converters today are provided as a DCE so special attention should be paid to the synchronous clock configurations The examples shown below apply to all the test modes only the E1 V 35 and E1 G 703 protocol converters are used 4 2 4 1 E1 Datacom Synchronous BER Testing a Transmitter is E1 Receiver is Datacom DTE Tester Supplies Clock to Converter Under Test The E1 Datacom tester uses its internal synthesizer to clock out data on E1 to the converter The converter uses the clock which is derived from received E1 signal and then 72 0027 03A 147 XG2130 E1 Datacom Tester Performing Measurements divided to clock out data on RD and supplies clock on SCR to the instrument In this way the clock source of protocol converter should be configured as E1 Line clock Thus the clock of the converter under test is sourced from the instrument actually as shown in Fig 85 Transmitter E El Receiver Internal Data Clock Synthesizer Received Clock Receiver SCR Transmitter v 35 RD v 35 DTE Control DCE E1 Datacom Tester Protocol Converter Under Test Fig 85 Tester suppli
139. xed Code 1111 0000 1010 16BIT Fully programmable 16 bit word PRBS Polarity Normal or Inverted Test Period Manual Auto Timer Result Analysis G 821 G 826 M 2100 Analysis 5 1 2 Transmitter Line Code HDB3 AMI Impedance 75Q unbalanced 120Q balanced Pulse Shape Conforms to ITU T G 703 Table 6 J itter Meets ITU T G 823 Section 2 Tx Clock Source Internal Interface External source Internal Tx Clock Frequency 2 048 MHz Stability 10 ppm temperature 0 40 C Ageing 2 ppm per year typical Deviation 999 ppm External Tx Clock 2 048 MHz 200 ppm binary clock 72 0027 03A or 2 Mbit s HDB3 signal XG2130 E1 Datacom Tester Technical Specifications Error Add BIT CODE FAS CRC4 E BIT Error Add Rate Single 1E N N 2 7 5 1 3 Receiver Rate 2 048 Mbit s 999 ppm G 703 specs 50 ppm Line Code HDB3 AMI Pulse Shape Conforms to ITU T G 703 Table 6 Jitter Tolerance Meets ITU T G 823 Section 3 Impedance e TX RX 75Q unbalanced 1209 balanced e RX HI Z gt 2KQ unbalanced balanced e Through 75Q unbalanced 1209 balanced Receive Sensitivity gt 43dB External Clock I nput e Binary Clock Input 2 048 MHz Square ware TTL e 2M bit s Signal Input HDB3 75Q unbalanced Timeslot Analysis e FAS NFAS e MFOTS16 e Timeslot data e Timeslot activity e VF tone frequency and level measurement VF Tone Measurement e Frequency Measurement 200HzZ 3400Hz e Frequency Accur
140. y 120 Pin Assignments See Appendix B g EIA 530 General DB25 connector DB44 DB25 adapter cable Data and clock circuits are balanced according to V 11 and V 10 Input clock and data signal terminated by 1209 Pin Assignments See Appendix B h ElA 530A General DB25 connector DB44 DB25 adapter cable Data and clock circuits are balanced according to V 11 and V 10 Input clock and data signal terminated by 1209 Pin Assignments See Appendix B i Terminal Emulation DTE or DCE j Test Pattern e PRBS 279 1 0 153 215 1 0 151 72 0027 03A 211 1 0 153 2 1 0 153 2 1 165 XG2130 E1 Datacom Tester Technical Specifications e Fixed Code 1111 0000 1010 e 16BIT Fully programmable 16 bit word e PRBS Polarity Normal or Inverted k Result Analysis G 821 Analysis 5 3 2 Transmitter Synchronous Mode General Provided for all datacom interfaces Clock Source Internal synthesizer Datacom interface May be inverted Allowing selectable clock data phase relationship X 21 operation limited as follows DTE datacom interface DCE internal Synthesizer Rates 1 2 Kb s 2 4 Kb s 4 8 Kb s 7 2 Kb s 9 6 Kb s 19 2 Kb s 38 4 Kb s Nx64 Kb s N 1 32 Synthesizer Accuracy 30 ppm Ageing 2 ppm per year typical Interface Clock Source Minimum rate 50 bit s Maximum rate 2 048 Mb s Clock Output Datacom interface May be inverted allowing selectable clock data phase relationship No clock output on
141. y Then install the end cover back 5 Duration of battery is getting shorter The usage life time of new rechargeable battery is about 800 1000 cycles of charge and discharge When you find the working duration is reduced in evidence you should replace the rechargeable batteries Do not put the old and new batteries in use together or use some bad or unconfirmed rechargeable batteries 6 Get more help If you have any other questions please contact with the manufacturer by phone or by emails as soon as possible If you find that theinstrument can not work please contact your provider as soon as possible Do not open the instrument by yourself If the frangible pastes around the tester are damaged or have been removed user would lose the 1 year free maintenance service 72 0027 03A 175 XG2130 E1 Datacom Tester Appendix A Appendix A E1 Frame Structure 1 PCM30 PCM31 Frame Format ITU T G 704 G 706 1 frame 32 timeslots 125us ws TS TS TS PS TS TS TS TS om 1 2 15 ay 17 29 30 31 Channels Channels 1 to 15 16 to 30 Network Signaling 8 bit word sifofo s sfols s rololo o olx yfxfx Lllslalslslls MFAS NMFAS a FAS Word PEA lt nras word ra alo cfa alo cfa lel leloloPoleo UTIR CH17 Sa4 Sa8 Bit 1 Si is reserved for international use The remaining bits are used for frame sync and are always set to 0011011 NFAS word structure FAS word structure Bit

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