Auto Importance Sampling Tutorial
Contents
1. ad Rings li Peak flux 1 Total rays i Grid Position and Orientation Grid onentation method Direction vectors se rigin Normal vector Up vector xo vho z0 Apply amp Trace Raps Apply Set Defaults t 5 TracePro Release 3 2 Auto Importance Sampling Tutorial Chief Ray Empirically determine the origin and direction of the chief ray i c j Grid Rayt x In this example we have assumed that the stop is in the center of the lens lee lel Es Grid Setup Beam Setup Polarization The chief ray will intersect the center of the stop at the optical axis and Annular intersect the edge of the image Outer radius jo Inner radius E Grid Pattern Circular ad Rings li Grid Boundary Peak flux 1 Total rays i Grid Position and Orientation Grid onentation method Direction vectors se rigin Normal vector Up vector xo vho z0 Apply amp Trace Rays Apply Set Defaults t TracePro Release 3 2 Auto Importance Sampling Tutorial Auto Importance Sampling dialog Enter the marginal chief and gut ray data into the Define Auto Importance Sampling dialog The Gut Ray defines the optical axis The Inner and Outer rays are chief rays to define the inside and outside of the annual target Setting the Inner ray to zeros defines a circular region Enter the values as shown and press OK TracePro traces rays and calculates locations sizes a2. Auto Importance Sampling Tutorial This is a general tutorial for users of TracePro and TracePro Expert Auto Importance Sampling Tutorial Introduction Importance sampling is defined for surfaces to improve the performance of the raytrace Each surface may have zero or more importance sampling targets causing one or more rays to be traced into the solid angle defined by each importance sampling target For stray light analyses of complex optical imaging systems defining importance sampling targets manually can be a chore TracePro provides a feature for you to do this automatically using the Define Auto Importance Sampling selection When you use this feature TracePro will define an annular or rectangular importance sampling target for each surface in the prescription Before you automatically set up targets you must first define the model s Prescription Use the Prescription tab of the Define Apply Properties dialog box to do this TracePro needs three or four rays to determine the location and size of importance sampling targets A gut ray marginal ray and one or two chief rays are needed Within TracePro they are defined as follows e Gut Ray a ray passing through the center of the aperture stop and the center of the field of view e Marginal Ray a ray passing through the edge of the aperture stop and the center of the field of view e Chief Ray a ray passing through the center of the aperture stop and the edge of the fie
3. ength 0 48613 um Set Data 3 TracePro Release 3 2 Auto Importance Sampling Tutorial Verify Prescription Examine the System Tree to verify prescription numbers Cemented groups have two coincident surfaces at each cemented interface You can also use the Reports Property Data to view the Prescription information System Tree information for selected surface fi Model DBLGAUSS oml lof E Object 1 o B Surface 0 es Prescription Mumbef 2 a Surface Property lt None gt Sphere 474 2 millimeters Ep ourface 1 es Prescription Number 1 Ki a Surface Property lt None gt Sphere 34 6 millimeters Surface 2 z Surface Property lt None gt w Cone 21 millimeters bis Lens Data From OSLO l Object 2 Surface 0 z Prescription Number 4 z Surface Property lt None gt Sphere 137 22 millimeters l Surface 1 and Surface Property lt None gt Cone 15 millimeters E Surface 2 TracePro Release 3 2 Auto Importance Sampling Tutorial Marginal Ray Empirically locate the origin of a marginal ray by tracing rays using Analysis Grid Raytrace i Grid Raytrace Sli The Y position of the origin may be set to the Entrance Beam Size of the Grid Setup Beam Setup Polarization lens Grid Boundary Note ray parameters you must later enter them in the Auto Importance Sampling dialog box Annular Outer radius li 0 Inner radius E Grid Pattern Circular
4. ld of view You may find it helpful to use a lens design program to determine the starting positions and directions of these rays Two chief rays are needed to define rectangular or annular targets This tutorial illustrates the steps required to use Auto Importance Sampling For a detailed explanation please see the technical reference section of the TracePro User s Manual TracePro Release 3 2 2 Auto Importance Sampling Tutorial Double Gauss Define Prescription 1 Open the DBLGAUSS OML model file in the Examples Demos Lens Demo folder using File Open il Apply Properties lel 2 Define the Prescription using the Set Data feature Importance Sampling ExitSurface Diffraction e Select Define Apply Properties dialog box R aytrace Flag Mueller Matrix Gradient Index O Bulk Scattering Temperature Class and User Data e then the Prescription tab TE bl aterial Surbace Surface Source Prescription Color 3 Enter the data as shown and click the Set Data button The origin is changed so the ray starts to the left of the first lens anna alae eer i Surface Number f 4 TracePro will trace a ray through the lens and assign a prescription number to each surface it intersects in sequence Automatic data selection 5 The image surface must absorb the ray completely Trace a single ray to order the surfaces and apply prescription numbers Origin Direction Vector f1 Model DBLGAUSS oml fe vo 2 Aaytrace Wavel
5. mension r Rings Slices Prescription Number 1 Surface Property lt None gt z 1 Importance Target Defin z Sphere 34 6 millimeters E Surface 2 Entity 1 T Material from SCHOTT Several targets displayed Material name BASFS1 origin Lens Data From OSLO diameter Object 2 fal a E E ae orientation 4 TracePro Release 3 2
6. nd senses of targets Automatic Setup of Importance Sampling Target Shape Annular Rectangular Marginal Ray r Outer Ray i position oO Y position 12 5 Z position jooo 3 direction jo Y direction fo 2 direction no Raptrace Wavelength 0 48613 um Cancel i J TracePro Release 3 2 Auto Importance Sampling Tutorial Verify Target Definitions The new importance targets will be visible in the System Tree and the Property Report el Apply Properties fo Select Define Apply Properties and then the Importance Mueller Matrix Gradient Index Bulk Scattering l Temperature Sampling tab for details of each target Class and User Data l Repl ile Temperature Distribution The targets may also be viewed in the Model Window using the Material Surface Surface Source Prescription Color View Display Importance menu Importance Sampling Exit Surface Diffraction Raptrace Flag The target origin is indicated by the IT label Target of 2 Rayecell fi Data for the single target defined on Surface 1 Direction Toward shape Annular Target Center Normal Vector a 10 i jo okl 2 pemr Target Size Outer radius li 6 37625775 Inner radius E Single Surface is selected Add Delete f1 Model DELGAUSS oml Object 1 Surface 0 i Prescription Number 2 i Surface Propere lt Nane gt z 1 Importance Target Detirn Sphere W4 2 millimeters Cells in each di
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