User Manuel - ProT Ar-Ge
Contents
1. 39 OSCILLOSCOPE PROGRAM FEATURES csccccccccccnccncuseuseuseuceuceuceucccccccccccccscascass 38 RECOMMENDATIONYOS isis kai n GER RR REOR RR RERO RS EC RH RR HU RR HER RO REB ERR RA 42 WARRANTY AND CONDEUIONS 552555 isagkEvEXURSVENERA ERES RYXR RRFENRREERREKESFRENERR ENRENEEAS 43 FADOS9F1 FAULT DETECTOR amp OSCILLOSCOPE s proT Ar Ge FADOS9F1 N Picture 2 FADOS9F1 FADOS9F1 includes 9 important functions 1 Double Channel Fault Detection Analog Signature Analysis VI Graph Comparing good and faulty or suspect circuit boards without giving power to boards 2 Programmable Integrated DC Power Supply For giving energy to circuit boards and creating Power DC Voltage Current Graph 3 Non Touched IR Temperature Sensor For detecting more heated components and draw out heat map of circuit board 4 Equivalent Circuit Diagram Composing R C or Diode Circuit Diagram according to the point touched 5 Measuring Value of Resistors Capacitors and Diodes Feature of measuring the value of touched point 6 Fault Detection by Comparison from Memory By recording data of good circuit boards to memory comparing faulty or suspects boards from memory 7 Double Channel Digital Oscilloscope As occasion may require device can be used as oscilloscope 8 Square Wave Signal Output Ch 1 is used as oscilloscope and Ch 2 is used as si2. Picture 6 Power IR Test Screen 15 B bee eee Recording Test Point Time Auto Test VOLTAGE V necare PETET One L id Power On he 59 1 DC provides an Output through the power cables If the electronic board draws more current than the set value the program limits the current and does not allow excessive current draw Power Off Cuts off the voltage Power Test Used to produce the Current Voltage Graph of the electronic board s power supply Power his option is for DC Power Test and measurement Temperature This option is for IR Temperature Test and measurement Micro Volt This option is for Microvolt measurement Low Current Selected when measurement is made between 0 300 milliamp Recording Opens the file format and starts recording or opens a saved file Temperature Shows the Components Temperature values Temp Set Shows the temperature of the component stored in the memory Temp Tol Shows Temperature Tolerance User can change tolerance Test Point Shows the serial number of the point under test Time Shows Counting down from 90 seconds Auto Test If tolerance of test point is equal to tolerance mentioned below the next data will be opened automatically Next Point Opens the next test point Temp Zero Used for compensating the IR sensor for the room temperature
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4. Add inc f 1 Add Number Adds a number to the test points INOOT PDT dat To aaa automatically ace pra Inc Increments the numbers automatically Save Saves the value of the test point to the file specified with a given name Change In order to change the data of a saved test point select the saved test point and click the Change button to change the saved data Open Opens the data for the marked test point as reference o Channel 1 Delete Deletes the data for the marked test point from the computer Recording The Test Points With Image Open a new folder for the board to be recorded Click on Load Figure to select the photograph of the circuit from the window opened The software changes the name of the photograph to image automatically For example if the name of the photograph is Figure jpg the software changes the name of the photograph to image jpg automatically and adds to the file If you want to add a photograph to the folder you need to change the name of the photograph as image jpg since the software checks the files named image jpg 32 only If the name is not written as image jpg this feature will not work After loading the figure a photograph of the circuit is shown at the lower right corner of the VI test screen The green buttons on the photograph for zooming Select the point to be recorded on th
5. mptied by using a resisto iac zm EN Picture 15 Picture 15 Capacitor VI citor VI Graph The Equivalent Circuit diagram and Value Measurement 1 o Test Channel 1 2 te z 4 Very Low Frq Low2Frg LOW Fra 14 e o Lr Comparison Capacitor Test gt Me ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using resistor Ch1 12 Tolerance 3 Picture 16 Capacitor VI Graph 25 Capacitor Quality Test and RC Circuit When Capacitor Test is selected an additional curve displaying the quality of capacitor appears If this curve is at horizontal axis or close to it quality is high and quality is low as much as the angle degree is high High quality capacitor generates a horizontal line hanne VI TESTER VI TESTER Picture 17 High Quality Capacitor Picture 18 Low Quality Capacitor pa FADOS9F1 FAULT DETECTOR AND OSCILLOSCOPE Channel 1 2 Q v Automatic Fe L1v Ea 5Y 10 V pe Very Low Fra Comparison Capacitor Test pom TTT FET IGBT Memory Save Test ATTENTION Probe must be at 1X position High voltage capacitors must be
6. Comparison 14 o F gt Capacitor Test FET IGBT Recording 7 5 OSCILLOSCOPE Diff 125 Disharmony ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor Picture 34 Comparison Test From Memory 3G 3 DIFFERENT GRAPHS DISPLAY By pushing the 1G button you can display 2G e g 2 graphs or 3G e g 3 graphs on the monitor simultaneously selecting different voltage frequency current levels Test Channel 1 2 v BH IR TEST BV as 1 Very Low Fra Low 2 Fra Frq POWER Capacitor Test VI TESTER Memory Save Test Recording OSCILLOSCOPE Tolerance 3 ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor D1 0 6 V R1 2 29 K Open Circuit Picture 35 3G Graph Display 39 Test Es Channel 1 2 f Automatic b Es 2V BY Cr 081 CL Low 2 Fra Low 1 cc e F Comparison Capacitor Test Memory Save Test ATTENTION Probe must be 1X position High voltage capacitors must be emptied by using a resistor CL 5 Ch1 Ch2 O D a O O Tolerance 9 3 Picture 36 3G Graph Display In Picture
7. Voltage Shows the Maximum Voltage CURRENT Shows the resistance of the circuit Current mA Shows the current drawn by the circuit Bold Green Line Shows the Component s temperature value Thin Green Lines Shows Temp Set Tolerance for example If Temp Set is 8 C and Tolerance 2 green line sets between 6 C and 10 Power Supply Test DC Voltage Current Graph 1 First the maximum Voltage and Current required by the board is adjusted 2 The Power cables are connected to the board s supply Red Cable Black cable 3 The Voltage and Current are adjusted and power is supplied to the board 4 The Power Test button is clicked The DC Voltage Current Graph is produced in 100 mV increments from 0 Volt to the maximum voltage 5 The Recording button is clicked to record the DC Voltage Current Graph tFADOS9F1 FAULT DETECTOR AND OSCILLOSCOPE H 8 xi ra Power IR Temparature Test j 200mA POWER IR TEST Recording Temparature 1 5 c Lu 0 Lu p gt OSCILLOSCOPE 5 Record s 299 New Folder Opens a new folder in the computer s hard New Folder disk under the name given to a new circuit 9 Program Files Step 1 xls New Folder New Point If New Points is empty software saves data stm 432 Step Open Image with automatic n
8. Diodes General purpose Zener High Voltage etc Transistors NPN PNP JFET MOSFET etc SCRs TRIACS Optocouplers Integrated Circuits Digital Analog etc Unique Features Integrated DC Power Source IR infrared Sensor Temperature Test Equivalent Circuit Diagram and Measuring Values of all Components features are unique in the World Integrated DC Power Source It can be adjusted between 0 16V and 20 1500mA with power output It gives energy to circuit boards and creating Power DC Voltage Current Graph IR infrared Sensor Temperature Test This feature is used for detecting more heated components and draw out heat map of electronic card Equivalent circuit diagram and measuring values of all components features as an example if resistor connected parallel to capacitor it shows circuit diagram and value of them at the same time SECURITY 1 I 5 o 1 FADOS9F1 is produced by using lead free solder and designed in accordance CE regulations users must use the following usage rules Chassis must be isolated and grounded Connect the chassis ground connection point of the probe is the same as your computer careful to avoid the potential difference Feature of oscilloscope if probe key is set to 1X it measures 12 Voltage probe key is set to 10X it measures 100 Voltage Do not use above these limits of voltage It tests electronic circuit boards without giving to energy Before te
9. Point Frequen 1 0 KHz 2 Channel ATTENTION Chassis to connect to the point must be isolated or grounded ADVICE Use Probe is 10X position Analog Output Channel 2 1 rDesign Probe X1 Top Value 0 00 V _ Active 2 Low Value 0 00 V 0 aj 100 Signal 2 INDUSTRIAL PROJECT DESIGN Frequen o DAC 4000 www protarge com Picture 5 Oscilloscope Analog Output Screen INSTALLATION 1 Connect the FADOSO9F1 to the computer using the USB port and load the driver supplied on CD 2 Click FADOS9F1 SETUP exe and install program 3 Run FADOSOF1 exe DRIVER INSTALLATION 1 Connect the FADOS9F1 to the computer You can load the driver directly for Windows XP when the New Hardware Found message appears Insert the CD in to the CD ROM drive and load the driver 2 Windows Vista and Windows 7 open Device Manager e On the desktop right click on my computer and click Properties of open the Control Panel and double click the System icon e Inthe System Properties window click the Hardware tab e Inthe Hardware tab click the Device Manager Button 11 e Click Start e Click Settings e Click Control Panel e Inthe Control Panel double click the Systems icon e Inthe System Properties window click the Hardware tab e Inthe Hardware tab click the Device Manager Button 3 Find Prot Ar Ge FADOS9F1 Fault Detector inside Universal Serial Bus Co
10. emptied by using a resistor Ch2 R 465K 106 nF ALLOSCOPE gt Pam Ss Tolerance 3 Picture 19 Capacitor and RC Circuit The axis of the graphs for the RC circuits comprising Resistors and Capacitors makes an angle 26 SEMI CONDUCTORS VI GRAPH Diode Zener Diode VI Graph Diodes start to transmit current after high transmission voltage For this reason diodes are seen horizontally at one part of the graph and are seen vertically at the other part If cathode of diode is connected to chassis a curve appears at horizontal axis at negative voltage and before transmits voltage and the curve appears at vertical axis at transmit voltage If anode of diode is at chassis a curve appears to down at negative voltage A Zener diode exhibits the same signature as a conventional diode for voltages below the Zener voltage When the reverse bias exceeds the Zener voltage a low resistance signature is displayed If diode and resistor are serial on circuit after transmission graph makes an angle to horizon pa FADOS9F1 FAULT DETECTOR AND OSCILLOSCOPE IR TEST POWER OSCILLOSCOPE Channel 1 Automatic Very Low Low 2 Fra Low 1 Test Frq High Comparison Capacitor Test Memory Save Test Referance Ch1 Tolerance 3 Open Circuit ne a Picture 20 Diode and Serial
11. mathematical functions and formulas but rarely has the possibility of making mistake This probability is more increased with applied externally electromagnetic fields of generated interference The EMC Testing 3V M and the range of 80MHz 1GHz is approximately capacitor 901 resistor 903 diodes 9o1 Some fast diodes make oscillation in some frequencies so that can be perceived as active point by the device VI Graph the rate of change lt 1 3 Components Value Measurement Tolerance e Resistor 2 e Capacitor 3 e Diode Transmit Voltage 0 1V e If Resistor and Capacitor are connected Parallel Resistor 4 Capacitor 5 e If Resistor and Diodes are connected Serial 4 e If Diode and Resistor are connected Parallel 3 e If 2 Diodes and a Resistor are connected Parallel 10 Note 1 These tolerances valid if resistor curve makes angle between 10 and 80 degree to horizontal axis If resistor curve close to horizontal line select Low Current Step and if resistor curve close to vertical line select Middle or High Current Step for reducing mistake rate Note 2 These tolerance valid if capacitor ellipse of width length ratio is greater than 1 4 This ratio is less than 1 4 and ellipse s width length is thin and long In such a case change current step or and frequency step for selecting step appropriate to components 4 Oscilloscope voltage measurement tolerance 0 5 PRODUCT OVERVIEW and CONTE
12. 36 the 3G feature has been used to set Voltage Level 12V Frequency Level Test Frequency Current levels Low Current Medium 1 Current and Medium 2 Current As can be seen from the example a component that does not show any defect with Low Current proves to be defective when Medium Current 1 is used 40 OSCILLOSCOPE PROGRAM FEATURES tFADOS9F1 FAULT DETECTOR AND OSCILLOSCOPE r Osciloscope IR TEST POWER Osc Active Channel 1 r Synchronous 1 Channel 14 0D Probe X1 Top Value 4 03 V Low Value 0 02 V Point Frequen 1 0 KHz ATTENTION Chassis to connect to the point must be isolated or grounded ADVICE Use Probe is10X position Channel Probe X1 Top Value 0 00 V Low Value 0 00 V Point Frequen Osc Active Channel 1 Automatic Save Channel 1 Up Probe X1 Top Value 1 31 Low Value 1 30 V Point Frequen 1 8 KHz Active Signal Analog Output Channel 2 rDesign Prot fe Signal R D LTD CO 1000 Frequence 2 INDUSTRIAL PROJECT DESIGN DAG 4000 S www protarge com Picture 37 Oscilloscope Screen Osc Active Passive The Oscilloscope button makes the Oscilloscope active or freezes the current image and saves the image to the memory by pushing the recording button Channel Selects channel Channeli Channel2 and both channels are selected in
13. 45 Fax 00 90 224 221 74 53 export protarge com www protarge com 43
14. Diode Resistor VI Graph The Equivalent Circuit Diagram 27 WM FADOS9F1 FAULT DETECTOR AND OSCILLOSCOPE c jm Test Automatic Est 2571 EN 5v 2 lt li POWER _ Very Low Low 2 Low 1 Frq Test Frq High Frq L p i D e mu Comparison Capacitor Test TER Memory Save ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using resistor Referance Ch1 OSCILLOSCOPE Tolerance 3 Picture 21 Diode VI Graph Channel1 Zener Diode VI Graph Channel2 Transmission Voltage Transistor Triac Thyristor FET IGBT VI Graph Active components such as transistor triac and FET can be tested by transmitting them while both of two channels are used A transistor contains two semiconductor junctions connected Transistors also must have emitter chassis First touch collector with a probe Channel 1 probe or Channel 2 probe Collector must be at non transmission position Then touch other probe Channel 1 probe or Channel 2 probe base in order to provide transistor to start transmitting Transistor characteristics should be seen as at the screen Lack of any leak at the junction point fully horizontal supports the soundness of the material The FET is comprised of a channel containing semi conductor materials and another zone g
15. Ge Endustriyel Proje Tasarim Teknolojik Ar Ge Ltd Sti Prot R amp D Industrial Project Design R amp D Ltd Co FADOS9F1 Trouble Shooting amp Oscilloscope Device is designed for trouble shooting all types of electronic boards The FADOS9F1 is a PC based VI Test Voltage Current Analysis device 2 unique capabilities are added to the FADOS9F1 over the FADOS7F1 The first feature is the Programmable DC Power Supply thanks to the 0 16V and 20 1500mA adjustable power supply the DC Voltage Current graphs of the electronic board power supply can be produced The second feature is the IR Remote Temperature Measurement Sensor this sensor is used to find the components that heat up by drawing too much current Using these two features together may reduce the time for trouble shooting some malfunctions by 5 to 10 times These features can be used as a new technique for trouble shooting Signature Analysis is a power off test method that is used to troubleshoot circuit boards FADOS9F1 works by applying a current limited sine wave through a serial resistor point of touched on circuit and Voltage Current Signature graph is displayed on the computer screen In addition to these features the computer software analyzes the Voltage Current graph and shows the equivalent circuit diagram and the electronic components of the contact point Those futures are intended to provide guidance to the user in order to facilitate trouble shooting Usi
16. Integrated circuits can be tested all the pins with the help of probes Circuits made up of many components encapsulated within a single package The component count within an IC may vary from as few as half a dozen devices on a chip to many thousands of components in for instance a modern microprocessor Because of the need to package so many components into an extremely small space components within an IC are often microscopically small As a result modern ICs contain components and connections which are susceptible to damage from electrical stress and static discharge at levels far lower than those which would damage normal components For this reason many ICs incorporate protection diodes on their signal input and output pins When testing integrates signals display similar to the double inverse diode zener diode and diodes It can be capacitors or resistors are connected to these If pin of integrated has double reverse diode it means this pin can be good We can use the same technique to locate faults in ICs which are large and very complex such as memory chips and microprocessors The pin arrangement of such complex ICs means that it is especially appropriate to use comparison techniques to test these devices As we look at these devices we will find that despite the large number of pins there are only a few distinct graph patterns on a digital IC Note You will frequently notice differences in the signatures between simil
17. NT 1 59 1 Product 1 Software CD and User Manual Pdf e 1 IR Temperature Probe e 2 Oscilloscope Probes e 1 Com Probe Crocodile e 1 USB Cable e 1 DC Cable e 1 Power Adapter e 1 Handbag Picture 1 FADOS9F1 Sets FADOS9F1 TECHNICAL SPECIFICATIONS A FAULT DETECTION SPECIFICATIONS Test Voltages Test Resistance Test Frequencies Number of Channels Scan Mode Other Feature 1V 2V 6V 12 24V Current Level Low 47KQ Med1 3 5KQ Med2 7000 High 2500 Very Low Frequency 2 2 Low2 Frequency 4 2 Low1 Frequency 12 Hz Test Frequency 32 5 Hz High Frequency 355 4 Hz 2 Channel 1 and Channel 2 Manual or Automatic Automatic selection steps of voltage current frequency 1 Equivalent circuit diagram 2 Resistor capacitors diodes etc measurement 3 Data recording and comparing from memory 4 Displaying 3 graphs of different settings at the same time B POWER IR TEMPERATURE FEATURES DC Power Supply IR Infrared Sensor 0 16V 20 1500mA adjustable power output Measures the 0 120 degree differences according to the ambient temperature C PC OSCILLOSCOPE FEATURES Sampling Rate Input Voltage Channel ADC Accuracy Display speed Momentary Memory 400 K S Probe 1X 12 V Probe10X 100 V 2 Channel 12 Bit 2 5 mV 0 02 mS div 100 mS div 64 Kbyte D DIGITAL AND ANALOG OUTPUT Output Output Voltage Freq
18. T DETECTION PART While testing with V I graph do not apply power to board Generally probe chassis is connected to board chassis and a signal is applied to touch point by the device The V I graphic Signal appears on the screen Signals scans from negative voltage to positive voltage and when open circuit it appears horizontally in the middle of the screen All the control buttons to be used for trouble shooting are placed on the left hand side of the screen FRE FADOS9F1 FAULT DETECTOR AND OSCILLOSCOPE Sy Test Channel 1 2 TEST POWER Low 1 Test Frq High Fra Comparison Capacitor Test Memory Save Test Referance Ch1 OSCILLOSCOPE Tolerance 5 Open Circuit Picture 11 Fault Detector VI Tester Screen 22 Channel 1 2 Med High Comparison Capacitor Test FET IGBT C 02 Memory Save Test Test Point Point N001 Tolerance 3 Channel Used to select channel Auto When this setting is selected the most suitable value of the Voltage Frequency and Current levels are shown on the screen depending on the characteristics of the contact point Voltage Step The voltage to be applied to the board is selected by manually selecting out of the 1 V 2 V 6 V 12 V 24 V voltage levels One voltage level on
19. The figures show the voltage value If the figures are double clicked 0 V reference of the channel is starts the point clicked Starting Point Sets the starting point of the displayed section of the image in the Memory mode Time Adjustment Time Division Adjusts the time allocated to each division on the horizontal axis time axis RECOMMENDATIONS EA The probes should be set to 1X while trouble shooting fault detection Test good solid circuit board channel 1 faulty or suspect circuit board channel 2 First touch the channel 1 probe and then touch channel 2 probes The important aspect in trouble shooting is the matching of the graphs The lower circuit diagram and values are for assistance purposes The values in the circuit diagram are not for measurement but for comparison Wrong indications may be given with the effects of the other components on the board While using the device testing at the medium current level is recommended When necessary use the low current level i e high value resistors or low value capacitors When recording in the memory click save button after touching good solid circuit board s pins with channel 1 When the data open from memory using Channel 2 comparison data with faulty suspect or good solid circuit board In the Oscilloscope mode the 1X setting of the probe measures up to 5V and the 10X setting up to 50 volts Measuring high volta
20. Try to find the defects by comparing when starting You should be able to distinguish the graphs of the good and defective materials in a short time The Equivalent circuit diagram and values will aid you in the process If you concentrate on the values in the equivalent circuit diagnosing may take longer Use the values of the components as necessary but do not well on the values alone like the measurement logic of the test equipment The evaluation logic of this product is based on the interpretation of the graphs i e interpreting the graphs produced by the computer and generating the equivalent circuit diagram and showing the associated values POWER IR TEMPERATURE TEST When you run the software Power IR Temperature Test screen pop up DC Voltage Current Graph is seen at the screen All control buttons are placed to the left of the panel used in Power IR Test FADOS9F1 FAULT DETECTOR AND OSCILLOSCOPE Lo 20 Power IR Temparature Test 490mA 7 Power On 0 3 4 Power Off tc Low Current ad I Recording i m H Temparature 0 Max 9V 1 16 VOLTAGE V CURRENT mA Q QO A O i O Power For giving power to circuit board 2 Power Test For creating to circuit board supply s voltage current graph Record For opening circuit board s power graph or Temp Map from memory
21. UPPLY DC VI GRAPH WITH THE FAULTY BOARD S DC VI GRAPH 17 TEMPERATURE TEST ER RR RO RR c EE Re ER RR RR 20 RECORDING THE COMPONENTS TEMPERATURES nennen nennen nnn nnn nnne nnn nnn ann nnns 20 TEMPERATURE CHECKS OF THE FAULTY ELECTRONIC CIRCUIT BOARD eee nnn 21 MICROS VOLT oiron TIU UNTEN 21 VI TEST PROGRAM FEATURES OF FAULT DETECTION 22 PASSIVE COMPONENTS R L C V I GRAPH erneuern nun nun nnn 23 RESISTOR VI GRAPH c dcr erra ic ic E DER RE ERE eV eH er V Ora CN RR RR 23 CAPACTTORSVT GRAPH 25 CAPACITOR QUALITY TEST AND RC CIRCUIT EX ui eda Eae e Eva 26 SEMI CUNDOCTORS V I GRAPH 2 ER EX RR RR ER cR E RE RED RE RR 27 DIODE ZENER DIODE VI GRAPH gon ise sin an ODE iR Uc inae Mohn Medel ee OUR M ne 27 TRANSISTOR TRIAC THYRISTOR FET IGBT VI GRAPH eee nnns 28 INTEGRATED CIRCUITS ICs SMD INTEGRATES V I 30 SAVING AN ELECTRONIC CIRCUIT BOARD TO THE MEMORY AND COMPARISING FROM MEMOR Y ax S VER vi EUR UE EROR RAE ER DUM EE CERE WE ERR a EROR SM NA RN ENS 31 RECORDING THE TEST POINTS WITH IMAGE nnno reu read haa a na aa naa anao 31 COMPARITIVE TEST OF THE COMPONENTS OF IN THE CIRCUIT BOARDS 33 3G 3 DIFFERENT GRAPHS DISPLAY
22. an order Manual Auto When the Manual setting is selected the signals within the Lower Limit mV and Upper Limit mV values are captured On Automatic the last signal is captured when the signal is cut off Save Saves oscilloscope data or opens recorded data Channel Channel is selected for synchronous Up Down Starts synchronization at the rising or falling edge Probe X1 Adjusts the voltage value of the probe by the X1 or X10 level Top or Low Highest or lowest value on screen Point Shows the voltage value at a vertical line to the cursor in the memory Frequency Shows the frequency if the frequency of the incoming signal can be detected Active Passive When this button is clicked a square wave or analog output is generated at Channel 2 Signal DAC Selects Square wave or analog voltage 41 Frequence 1800 Frequency Determines the frequency of the Square wave signal output Voltage mv 2600 Voltage Determines the voltage of the Square wave or analog output Voltage Display Sensitivity Voltage Division Adjusts the voltage display sensitivity The accuracy of the data received from the product does not change The figures show the voltage value If the figures are double clicked the 0 V reference of the channel is taken as the point clicked Data received from device is 12 Bit 2 5mV sensitive Zero Adjustment Shifts the 0 V point of the image upwards or downwards
23. ar ICs from different vendors or which have been manufactured using different technologies Compare the graph on a suspect pin with graphs from other pins on the same device before regarding the device as faulty 30 FADOS9F1 FAULT DETECTOR AND OSCILLOSCOPE Test Channel 1 2 TEST POWER Very Low Frq Low 2 Fra Low 1 Fra Ease High ic BE Comparison Capacitor Test 14 LL o gt Memory Save Test Diff 0 Harmonious ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor Referance Ch1 OSCILLOSCOPE Tolerance 3 Picture 26 Good Solid Integrated Pins Compare 2 Integrated Pins SAVING AN ELECTRONIC CIRCUIT BOARD TO THE MEMORY AND COMPARING FROM MEMORY Another feature of the FADOS9F1 Trouble Shooting Device and PC Oscilloscope is the ability to record save the points of the electronic circuits in the computer Click on the Recording Test from the FADOS9F1 test features to open the Recording Menu Create a new folder by writing the name or code of the circuit The name of the point data to be recorded is written in the New Recording Touch the Channel 1 probe to the point to be recorded and make sequential recordings by pushing the record button If no data name is assigned to the New Recording the software records the data under the names 001 02 et
24. ate made of a semi conductor material opposite to the foregoing The Gate shapes the diode with the connections at both ends of the channel source and drain and those diodes can be tested Both probes are used for testing the 3 pin active components One probe shows the trigger signal and the other shows the conduction state If conduction occurs click FET 28 IGTB from test types menu and software checks if FET MOSFET is of the or P type MOSFET are field effect transistors Gate drain and gate source tests generally yield an open circuit mark However some MOSFETs have a protective diode between the gate and source In such cases the gate source marking is similar to a zener diode Those are checked like the FET using the source drain conduction and gate source voltage The MOSFETs on the other hand are checked by means of the normal and reverse polarization of the gate source junction Triac Thyristor IGBT can be tested in the same way If Thyristor Triac Transistor FET IGBT selection T T T FET IGBT button is applied type of component can be determined VI TESTER VI TESTER Companson Capacitor Test Comparison Capacitor Test VI TESTER TESTER ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor Picture 24 N FET Picture 25 P FET INTEGRATED CIRCUITS ICs SMD INTEGRATES
25. ating up Use the IR sensor for trouble shooting the heating components If the faulty defective board draws less current than the good intact board it means an open circuit in the board In this case the Oscilloscope Screen can be opened to diagnose the line that does not receive power If the graphic of the faulty defective board is the same as the good board the faulty component can be diagnosed by opening the VI Tester Screen Open circuit s graph is in the middle and horizontal position at Test Fault Detect screen Current Voltage Graph VI makes angle according to the value of resistance capacitor is like circle and ellipse short circuit is vertical position In the Medium current mode in the areas with high resistor values if the VI graph is closer to the horizontal axis you can see the resistors with high values more clearly by switching to low current If the VI graph is too close to the vertical axis this means that the resistor value is low and you can read the values more clearly by switching to the high current mode Please test the capacitors in the high frequency mode generally Use low current when the capacitor value is low and high current if the value is large If the capacitor value resembles a thin line in high current at the vertical axis you can see the value more clearly by reducing the frequency from the frequency mode The pins of a good integrated circuit are generally in
26. button Picture 9 Temperature Test 20 Temperature Checks of Faulty Electronic Circuit Board e Connect the Power cables to the board s supply Red Cable Black cable e Click the Record Recording button select the IR Temperature Data and click the Open button e Click the Power Test button and wait 90 seconds for the components to warm up Measure the temperature of the first component If the measured temperature is the same as the recorded data click on the Next Point to opened the second recorded data If Auto Test is selected and the measured temperature is the same as the recorded data the other recorded data is opened a few seconds later FADOSSF1 FAULT DETECTOR AND OSCILLOSCOPE Power IR Temparature Test 200mA IR TEST Meer MMM SSE Er gt 2220122221021 2 POWER H Temparature 7 m Temp Set 8 10 11 12 13 14 15 16 Temp Tol Test Point id E 1 4 gt OSCILLOSCOPE Temperature Normal Picture 10 Temperature Comparison Micro Volt The FADOS9F1 can be used for micro volt measurements Select Micro Volt to open the Micro Voltage screen Connect one probe to IR plug and measure micro volt It is used for measure voltage below 2 5 uV max Micro VOLTAGE 21 VI TEST PROGRAM FEATURES OF FAUL
27. c in numerical order Maximum 999 data can be recorded for each recording folder If you select Add Number the software adds numbers to the data automatically and if Increase is selected the software increases the numbers automatically 31 In order to test from saved file press record memorized test button select data to be tested and open first saved point Saved data is seen as a red graph at first channel Touch the point to be tested with second channel If it is same as the saved data or in tolerance values it is written Harmonious at screen If it is out of tolerance values it is written Disharmony percentage value is seen and wrong voice is heard When automatic test is activated if a test point is harmonious then it goes to next point automatically This feature allows rapid testing without having to look at the monitor Note The test points of the Electronic may be recorded only with Channel 1 The test points saved with the Recording Menu can be opened as reference and the points on the defective circuit can be compared with those using Channel 2 New Folder Opens a folder on the computer s hard disk for a new circuit with a given name Bow Files Open Image Open and upload circuit of CXFADOSSF1 ase image New Point The name of the point to be recorded is New Point written if left blank the software adds the numbers 812 001 NOO2 etc to the file automatically
28. e photograph then touch the Channel 1 probe to that point and push the Record Save button When you use this feature for comparing from the memory you can see the location of the saved point on the board Bl FADOS9F1 FAULT DETECTOR AND OSCILLOSCOPE o5 Test 1 Channel 1 2 4 Record SIC Program Files CNFADOSSFI New Point PB12 Add Inc 1 NOO1 PD1 dat Tol 002 PDZ dat N003 004 PD4 dat 005 PD5 dat 06 007 PD NOOS PDS 009 R30 dat NO10_PE6 dat Open Cancel 10 tode 4 4 2124 8 hace E 04 ATTENTION Probe must be 1X position High voltage capacitors must be emptied by using a resistor Referance Ch1 OSCILLOSCOPE Tolerance 3 Open Circuit Picture 27 Recording Data with Image COMPARATIVE TEST OF THE COMPONENTS IN THE CIRCUITS BOARDS When a component is tested in the circuit the other parallel or serial components in the circuit cause a mixed signal to be generated The FADOS9F1 displays the mixed signals of the components on the electronic board and produces an equivalent circuit diagram to measure and compare the values of the components You can perform the test by connecting the card assumed to be good to Channel 1 and the suspect circuit to Channel 2 from the common points Comparisons can be made starting
29. en the Square Wave Signal Output is used a signal is applied to the electronic board and the other channels display the output signals on the oscilloscope screen Technicians engineers and hobbyists have found VI graph to be an effective and efficient method for troubleshooting printed circuit boards The signature comparison method is easy to use and allows for immediate feedback that will assist you in locating faulty component As you gain some experience with VI graph you will realize that FADOS9F1 is an indispensable troubleshooting tool Usage is very easy and users will find the faults just by looking at graphs without comparison When test Printed Circuit Assembly PCA with FADOS9F1 do not apply power to PCA PCA and the devices must be made high voltage capacitor discharges There is no risk of further damage to the PCA while testing and troubleshooting FADOSOF1 is easy to carry since it s small It can be carried in a laptop briefcase Including many more features it is like a Swiss knife of users dealing with electronics Usage Areas ECU Automotive electronic circuit boards servo step motor drivers circuit boards of medical devices military electronic circuit boards computer and monitor circuit boards television audio radio circuit boards circuit boards of textile machines mobile phone electronic circuit boards etc all type electronic circuit boards Electronic Components Test Resistors Capacitors Inductors
30. form of a dual reverse diode other than the supply and ground Although the attached resistors and or capacitors might affect the graph the two reverse diodes should be observed In the output of some integrated circuit only one diode may also be seen But an image in form of a resistor would most probably mean a defective integrated chip The capacity test shows the quality of the electrolytic capacitor in particular The more horizontal this curve is the higher the quality of the capacitor is The angle of the deteriorating capacitor makes an angle with the horizontal If the angle is large it means a defective capacitor Because the circuit draws a current while in the board this test can be deceptive hence consider this while testing In case of doubt remove the capacitor from the circuit and then measure in this measurement the test devices may show all of them as intact The best capacitor quality measurements can be done by iw looking at the Capacity Resistor Curve with this product While making this measurement adjust the frequency and current to become longer on the vertical axis of the graph but without forming a multiple and thin graph In case of a misshapen capacitor graph due to the effects of the diodes in the circuit value of the capacitor can be measured again after eliminating the effects of the diodes The important issue in trouble shooting is the shape of the graphs and their interpretation
31. from the power supply to the board and progressing inputs and other suspected points If it is same JS as it is written Harmonious at screen If it is out of tolerance values it is written Disharmony percentage value is seen and wrong voice is heard lll FADOS9F1 FAULT DETECTOR AND OSCILLOSCOPE SSIRSTEST POWER Comparison Capacitor Test Vi TESTER Memory Save Test OSCILLOSCOPE Tolerance 5 Picture 28 Comparison Test Comparing this system is very sensitive and is considered compatible with the values within the given tolerance 34 GH FADOS9F1 FAULT DETECTOR AND OSCILLOSCOPE Test Channel 1 2 POWER Comparison Capacitor Test VI TESTER Memory Save Test OSCILLOSCOPE Tolerance 5 Picture 29 Comparison Test In this system multiple accurate comparisons are made and the values falling within the tolerances specified are considered as compatible But in case of small differences determining is defective or not is left to the experience of the user An important difference to be observed in Picture 29 is the difference of the resistor s value in the test circuit This is caused by the integrated circuits with reverse diodes The integrated circuits usually contain reverse diodes There may be capacitors and resistors connected as well If there is a dual rever
32. ge circuits is not recommended Each product has different calibration settings The calibration file can be found on the CD in the program installation folder Please do not lose the program CD 42 WARRANTY AND CONDITIONS 1 The warranty period is 1 year from the date of product delivery 2 The repair period is seven 7 business days 3 Any defects arising out of not using the product in conformity with the instruction manual are not covered by the warranty If a higher voltage than the voltage values specified for the probes is used the series resistors connected to the probes burn out The burning of the resistors shows a user error because of not discharging the high voltage capacitors before use hence such conditions are excluded from the warranty 4 The device is in a solid box Normally use the card is not physically damaged The device is in an aluminum case therefore the electronic board cannot be damaged physically Breaking wetting etc are not covered by warranty 5 The probes may be damaged depending on use Therefore the probe malfunctions are not covered by the warranty 6 In case of device failure send the device to an authorized repair service or Prot Ar Ge Company Endiistriyel Proje Tasarim Ar Ge Ltd Sti _ Industrial Project Design R amp D Co Ltd Prot n Address Alaaddinbey Mh 628 Sok Elektromekanik Is Merkezi No 1 C Niliifer 16000 BURSA TURKEY Phone 00 90 224 223 17
33. gnal generator 9 Analogue Voltage Output Ch 1 is used as oscilloscope and Ch 2 gives analog voltage output tFADOS9F1 FAULT DETECTOR AND OSCILLOSCOPE Power IR Temparature Test 300 Max 200mA POWER IR TEST IV Low Current Recording Temparature 11 Max 12V 9 10 11 12 13 14 15 16 id LI 0 V CURRENT mA OSCILLOSCOPE Temp Zero Record For opening circuit board s power graph or Temp Map from memory Picture 3 Power IR Test Screen lll FADOSOF FAULT DETECTOR AND OSCILLOSCOPE D o X Test Channel 1 2 v Automatic 1 23 5 45v EMEN Very Low Low 2 POWER IR TEST Low Medi Med2 DADA TESTER Comparison Capacitor Test Mem ory Save Test Recording Diff 229 Disharmony ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor R 50K D1 06V R1 1 70K Tolerance 5 02 0 52 V 2 450 OSCILLOSCOPE Picture 4 Fault Detector Trouble Shooting VI Tester Screen 10 LtFADOS9F1 FAULT DETECTOR AND OSCILLOSCOPE Osciloscope Osc Active Channel 1 Save r Synchronous Channel 1 Up r1 Channel Probe X1 Top Value 4 03 V Low Value 0 02 V POWER IR TEST id Lu o
34. indicates faulty circuit or circuit to be tested When saved at memory Reference Channel1 is saved Values of circuits composed of resistance capacitor and diode are displayed 23 PASSIVE COMPONENTS RESISTOR INDUCTOR CAPACITOR V I GRAPH Resistor VI Graph Resistor signatures appear with a specific angle to horizon and resistor symbol and value are seen at the bottom of the graph While resistors at high values appear with angle close to horizontal axis resistors at low values are seen at screen with an angle close to vertical axis Picture 12 13 display resistors typical signals and values for the equivalent circuit Picture 14 short and open circuit The resistors of high values produce graphs closer to the horizontal axis Therefore while testing the resistors of high value select the Low Current Level The resistors of low values produce graphs closer to the vertical axis Therefore while testing the resistors of low value select the High Current Level lf FADOS9F1 FAULT DETECTOR AND OSCILLOSCOPE c 9 amt Test Channel 1 2 iv EN 65 __Very Low Frg Low 2 Fr VER Comparison Capacitor Test VI TESTER Memory Save Test ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using Ch1 Ch2 resistor OPE OSCILLOSC Tolerance Picture 12 Resistors VI Graphs The Equivalent Circuit Diagra
35. ly can be selected for a test Frequency Step The frequency to be applied to the board is selected by manually selecting out of the Multi Low Frequency Low 2 Frequency Low 1 Frequency Test Frequency High Frequency levels One frequency level only can be selected for a test Current Step The current to be applied to the board is selected by manually selecting out of the Low Current Mediumi Current Medium2 Current High Current levels One current level only can be selected for a test Comparison If this option is selected good solid and faulty or suspect circuit boards are compared by touching probes to the same points of both circuit board Capacitor Test Capacitor test determines quality of electrolytic capacitor TTT FET IGBT If this option is selected determines TTT FET IGBT etc Type of semi conductors Recording Opens the file format and starts recording or opens a saved file Grf Allows selecting graphs in 3 different settings voltage frequency current and switching rapidly 1G 2G 3G Graphs in 1 2 or 3 different settings can be displayed on the screen at the same time Recording Opens the file format and starts recording or opens a saved file Test Point Shows the serial number of the Test point Point Shows the name or code of the Test point lt Opens the previous test point gt Opens the next test point Reference Channel1 indicates good solid circuit Channel2
36. m and Value Measurement Channel 1 Red Channel 2 Blue Wl FADOS9F1 FAULT DETECTOR AND OSCILLOSCOPE cce FADOSOFI FAULT DETECTOR AND OSCILLOSCOPE 14 Low T Low Medi Med o e f Comparison Companson gt Capacitor Test Capacitor Test emory Save Te Memory Save Test Picture 13 Resistors VI Graphs Picture 14 Short Circuit Channel 1 and Open Circuit Channel 2 24 Capacitor VI Graph The energy storing devices leak voltage and current in the phase shift area This situation creates a circular or elliptical shape on the screen The capacitor current voltage VI graph equivalent circuit diagram and values are shown in Picture 15 16 Picture 15 16 displays capacitor typical signals and values for the equivalent circuit The VI graphs of the high value capacitors are displayed on the vertical axis For testing high capacitor select high current and low frequency The VI graphs of the medium value capacitors are elliptical close to a circle Low capacitor generates horizontal ellipse For testing low capacitor lower than 10 nF select low current and high frequency BB Favosori FAULT DETECTOR AND OSCILLOSCOPE AUG oS peo gil 1 2 o Automatic H iv mM aa 14 0 ul Comparison Capacitor Test ATTENTION Probe must be at 1X position High voltage
37. ng the Dual Channel VI test feature the intact and defective or suspect electronic boards can be compared by touching the same points on each board at the same time thus the out of tolerance malfunctions can easily be diagnosed with this method All the VI graphs are produced by the software making analyses at 720 separate points with an accuracy of 2 5 mV Therefore the FADOS9F1 is very accurate Memory Recording feature by means of this feature the characteristics of the intact electronic board VI graph equivalent circuit diagram and electronic components values are written on the computer s hard disk and taking these points as reference you can compare the defective or assumed to be defective electronic boards accurately easily and rapidly At the same time the data can be written on the photograph of the board Thus the recorded point can be seen on the photograph while making a comparison from the memory The software produces different sounds while comparing the matching and non matching points during the test thus allowing to concentrate only on the sound for a rapid comparison without 2 having to look at a board or display continuously The user can compare the electronic boards from 3 different settings at the same time Selected Current Voltage Frequency steps In addition to the above features the VI FADOS9F1 Test Device can be used as a Dual channel Oscilloscope Square Wave Generator and Analog Voltage output Wh
38. ntrollers and click right then select update software driver 4 Select Search for the best driver location and click browse find FADOS9F1 Driver s folder 5 Click OK and install driver Note Each product has different calibration settings so that please do not lost the FADOS9F1 program CD CONNECT PROBES Connect the DC Power Cable Red Black Cable to the Power connector Connect IR Sensor to IR Temp connector The Oscilloscope Probes and Com Probe Crocodile can be connected each VI Tester sockets The probe with the yellow circle is always Channel 1 the probe with the blue circle is always Channel 2 The crocodile probe is always Com USB cable is used for communication between the computer and FADOS9F1 Connect the Power Adaptor to the mains plug 18 20 VDC GENERAL USAGE INFORMATION 1 When run software Power The IR Temperature Test screen opens and an input is entered to the VI Tester screen or Oscilloscope Analog Output screen with the VI Tester button While testing the Electronic boards we recommend the user to use the Power IR Temperature Test feature for testing e Firstly create good circuit board s Power Voltage Current Graph Than save this graph to memory Compare faulty or suspect circuit boards with good circuit board s Power 12 Voltage Current Graph If the faulty or suspect board draws too much current it means that one or more components on the board are he
39. rent Graph e The DC VI graph of the good electronic board is opened from the memory e The Power cables are connected to board s supply Red Cable Black cable e The Power Test button is pushed to generate a DC VI graph of the faulty board Max 200mA POWER IR TEST 01 xj New Folder Se Documents and Settings 41 CX Belgelerim CXVBASIC CXFADOSSF1 New Point m C Power Temp 12V e _ Save 10 11 12 13 14 15 16 Y 0D CURRENT mA emperature Test Please wait 75 Seconds for heating components OSCILLOSCOPE Open _ Select a folder and click Open button Picture 9 Comparison of DC Voltage Current Graphs For testing faulty circuit boards Good circuit board graph opens Maximum current is determined and after click Power Test button created faulty circuit board s supply graph Two graphs are seen on the screen If the faulty board draws too much current it means that one or more components on the board are heating up Use the IR sensor for trouble shooting the heating components If the defective board draws less current than the intact board it means an open circuit in the board In this case the Oscilloscope Screen can be opened to diagnose the line that does not receive power If the graphic of the defective board is the same as the good board the fa
40. se diode connected to the pin of the integrated circuit it can be said that this pin is intact In particular if there is complete matching in the comparison this point should be good 35 Bl FADOSOF1 FAULT DETECTOR AND OSCILLOSCOPE ST RITES lt B lt 15 24 CL Y LLI o bur Lu Comparison Capacitor Test gt IGET Memory Save Test EIFE Diff 0 Harmonious ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using resistor aE O A z O 2 O Tolerance 5 Picture 30 Comparison Test Integrated circuit is usually double reverse diode It can be capacitors or resistors are connected to these If pin of integrated has double reverse diode it means this pin can be good solid 36 lll 4005961 FAULT DETECTOR AND OSCILLOSCOPE Si TE IR VI LU OP e OSCILL Test Channel 1 2 Comparison Capacitor Test IGBI Memory Save Test Recording ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor Tolerance 5 Picture 31 Comparison Test Integrated Pin Faults When a pin of the integrated circuit is destroyed
41. st electronic circuit board and the devices must be made high voltage capacitor discharges The users of this equipment must have knowledge and experience to repair of electronic circuit boards Thus during using FADOS9F1 do not make this mistakes such as touch chassis to high voltage non isolated ground test high voltage capacitor discharges Without enough knowledge and experience in this subject keep away high voltages such as mains voltage which can damage the system and themselves Giving high voltage from probes series resistors which contained in the device damaged and makes the circuit an open circuit In this case the computer port which is connected device via USB port damaged but observed in other parts of the computer is not damaged FADOS9F1 PERFORMANS AND MEASURUMENT TOLERANCE 1 NJ FADOSOF1 is designed multi function as Voltage Current VI Signature Analysis Tester and Oscilloscope The main of the feature device is VI Tester in addition to this feature computer software by analyzing voltage current graph to displays equivalent circuit diagram and values of electronic components in specific tolerances The equivalent circuit diagram and values are for informational purposes As the device is not suitable for direct measurement And Computer software creates Power Voltage Current Graph and measures temperature of components in specific tolerances Equivalent circuit diagram is drawing by software using
42. the reverse diodes are broken so that a resistor open circuit or short circuit may appear Gl FADOS9F1 FAULT DETECTOR AND OSCILLOSCOPE EEG x P A VI COP OSCILLO Channel 1 2 Very Low Fra Low 2 Low 1 Comparison Capacitor Test BEDIEEDIGBT Memory Save Test Recording ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor Tolerance 5 Picture 32 Comparison Test Integrated Pin Faults 37 FADOS9F1 FAULT DETECTOR AND OSCILLOSCOPE amp imm Test Channel 1 2 Gr1 ESS ES Qc 14 o Comparison Capacitor Test FET IGBT Memory Save Test ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor Ch2 Q taj O O Tolerance 9 5 Picture 33 Comparison Test Parallel Resistor Faults An important difference to be observed in Picture 33 is the missing resistor in the reference circuit This may result from a broken trace leading to the resistor or a cold solder at the resistor lead The reverse diodes are caused by the integrated circuit 38 LFADOS9F1 FAULT DETECTOR AND OSCILLOSCOPE L Test Channel 1 2 IR TEST POWER
43. uency Digital Dimensions Weight Channel 2 12V 12V Adjustable From 0 2KHz to 25KHz 122mm L x 113mm W x 29mm H 1100 gram with all accessories Table 1 FADOS9F1 Technical Features CONTENTS Page PRODUCT DESCRIPTION 55iiiesixuads SNR UE ERU ER a 2 USAGE ARPAS 3 ELECTRONIC COMPONENTS TEST scsscssscnsenscnvenssensencenscnnranscnsnssanrenccepanenanrencanssansanrenesansansenrs 3 UNIOUE FEATURES cid E dE sini v ke d dE vas Pu PE ROT inde ee eee 4 SECUREUN E CDAVVINK MEL EDU MM IE 4 FADOS9F1 PERFORMANS AND MEASURUMENT TOLERANCE 5 PRODUCT OVERVIEW AND CONTENT 6 FADOS9F1 TECHNICAL SPECIFICATIONS eere eren nnne nnn nnn nnn 7 FADOS9F1 FAULT DETECTOR amp OSCILLOSCOPE eee ern nnn 9 INSTALLATION DRIVER INSTALLATION sex oco axe axe av be e e P e ad 11 CONNECT Merz TP TT TTE 12 GENERAL USAGE 12 POWER IR TEMPERATURE TEST 14 POWER SUPPLY TEST DC VOLTAGE CURRENT GRAPH 16 COMPARISON OF THE POWER S
44. ulty component can be diagnosed by opening the VI Tester Screen 19 IR TEMPERATURE TEST Recording the Component Temperatures Connect DC cable to circuit board s supply And Click Power On button for giving energy to boards The Timer will count down from 90 seconds to 0 Click Record button to open the picture of the circuit loaded before The IR sensor is held to a point on the table and the Temp Zero button is clicked Then the temperature of the component is measured with the IR Sensor The IR sensor is brought over the component to be measured The measured component is marked on the photograph When the Timer counts down to zero the data is recorded by clicking the Save button Then the other components can save After waiting 90 seconds it will be easy to detect more heated components and draw out heat map of electronic card tFADOS9F1 FAULT DETECTOR AND OSCILLOSCOPE Power IR Temparature Test POWER IR TEST i EED E i111 ma HHHH 7 TT p p LEX SH gt E a TII Temparature 10 Temp Set 8 Temp To 2 4 Time id E 0 pe gt Auto Test or Temnerature Teat Please wait 47 Seconde for heating comnonenta For IR Temperature lest Please vait 47 Seconas or heating components P x OSCILLOSCOPE Open _ Select a folder and click Open
45. umber like and add to file New Point Power Temp Open Image Open and upload the circuit of the image Power If the DC Voltage Current Graph is to be recorded Power is selected Temp If the components temperature value is to be E o Save recorded Temp Temperature is selected Change Save Saves the value of test point with mentioned name to the determined folder If name is not given saves with serial number Change To change the data of a recorded test point the recorded test point is selected and the change button is pushed for changing the test point data Open The point selected is opened on the screen 17 Comparison of the Power Supply DC VI Graph with the Faulty Board s VI Graph Opening Recorded Data Click Recording Button and select Power Data then click on Open Button and to epee the selected file Power IR Temparature Test j Max 200mA IR TEST POWER New Folder Documents and Settings X Belgelerim CXVBASIC CXFADOSSF1 New Point Power Temp Max 12V Y ibe 0D gt 10 11 12 13 14 15 16 CURRENT mA New Folder For new test folder Folder cea Geant s name or code Save Lu in Pe poe nperature Open folder and click Open button OSCILLOSCOPE Picture 8 Recorded DC Voltage Cur
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