IMPEDANCE ANALYZER IM7580
Contents
1. Mew IMPEDANCE ANALYZER 7580 Component measuring instruments ANAL IZER HI lt 1 18 tory B rma DH TUS TEN fastest JN Speed up cycle times and accelerate productivity with high speed measurement and superior repeatability Among impedance analyzers with a frequency bandwidth of 1 MHz to 300 MHz ANALYZER EREN Moni E T RODIN un TT 10 tU DAGHA EA butir 00H47 LOU NU Sp id de ae 1 IM7T5BD TEST HEAD T T i ith a measurement time of 0 5 1115 the 1M7580 is history s fastest impedance analyzer More than just fast Improved repeatability ensures stable measurement The IM7580 delivers the speed and precision that manufacturing applications demand 1 0 1 Repeatability Z 3 CV Precision 0 046 0 01 0 1 As fast Repeatability and analog measurement times Comparison of the IM7580 and the Hioki 3535 x Measurement frequency 100 MHz ii wA ec Sample 600 Q Beads as 0 5 ms 1 IM75 IM7580 basic specifications o 8 10 100 1000 Analog measurement time index time ms Basic accuracy 0 72 rdg Measurement speeds FAST 0 5 ms MED 0 9 ms SLOW 2 1 ms SLOW2 3 7 ms Measurable range 100 mQ to 5 Measurement frequency 12. 0 35 0 2 0 0 15 P Power dBm Yor 0 1 F Yo ES EE S F Measurement frequency MHz a gc 0 000 0000 0 OU MM Yor For power of 7 dBm to 7 dBm FAST MED SLOW SLOW2 7 5 57 3 3 24 Yor For power of 40 dBm to 7 1 dBm Zoff Yorr FAST MED SLOW SLOW2 i 3 x 10 0046P 0 1 0 00 0 4 P Power dBm Free software for calculating accuracy Free software for automatically calculating measurement accuracy based on user entered measurement 0 8 conditions and measurement results 5 can be downloaded 10 from Hioki s website 100 Measurement frequency MHz For 7 dBm to 7 dBm SLOW2 External control List of EXT I O handler interface signals 15 Pin I O Signal 1 IN TRIG 2 IN Unused 3 IN Unused 4 IN LDI Signal Function 5 IN LD3 TRIG External trigger 6 IN LD5 LDO to LD6 Panel number selection 7 IN Pause EOM Measurement complete signal 8 5 ISO_5V Analog measurement complete signal 9 ISO COM INDEX g measu plete sig 10 OUT ERR ERR Detection level error 11 OUT PARAI HLBINI PARAI NG LD VALID Panel load 12 IT PARAI LO BIN3 PARA2 NG i zi ISO 5V Isolated power supply 5 V input 13
3. P Oulput Maximum load voltage 30 V maximum output current 50 mA channel 35 OUT PARAA IN specifications signals Residual voltage 1 V or less 10 mA or 1 5 V or less 50 mA 36 OUT Unused Built in isolated Voltage 4 5 V to 5 V maximum output current 100 mA 37 OUT Unused power supply Floating relative to protective ground potential and measurement circuit Timing chart Example of LCR Mode measurement timing Connection state Chuck Open Chuck TRIG Measurement ON OFF ON OFF start signal EOM Measurement ON complete signal l k gt gt ON OFF ON Analog measurement complete signal Judgment result output i d Previous n ERR judgment result udgment resu Error signal LD_VALID i LDO to LD6 x Example of Analyzer Mode measurement timing Connection state Chuck Open Chuck TRIG Measurement ON OFF ON OFF start signal Measurement complete signal INDEX ON OFF ON Analog measurement complete signal Judgment result output EE ji San iudgment result Judgment result Error signal i LD_VALID LDO to LD6 X n this example the TRIG signal s active edge is the falling edge ON EOM Off from trigger input to end of measurement processing INDEX Off during probe chuck probe cannot be removed from target Instrument IMPEDANCE ANALYZER IM7580 IMPEDANCE ANALYZER IM7580 0
4. MHz to 300 MHz Measurement signal level 40 0 dBm to 7 0 dBm 4 mV to 1 001 mV 0 09 mA to 20 02 mA Analog measurement time 215 mm 8 46 in 268 mm 10 55 in HIOK ANAL Pare mm IM7580 external view tld ME iT ac wide o mud d n 200 mm i _ 7 87 in ug An ev 9 55 mm pim 61 mm 2 40 in Superior productivity 1n a small package Compact half rack test head that fits in footprint The ability to fit two instruments into a single rack and use them simultaneously lets you carry out a variety of measurements faster This the palm of your hand The IM7580 s test head is small enough to fit in the palm of your hand enabling it to be placed closer to the measurement target The size is essential for boosting volume gt ability to position the test head next on production lines T the measured object makes testing less susceptible to noise and other Fixture amp Large display The display s brightness color and as 50 1409 0 LS CES adverse effects increasing accuracy TH text size can be changed according to the needs of your application while _ the touch screen provides a LL convenient and intuitive user Number of display Customizable Customizable E experience dig
5. USB LAN GP IB optional RS 232C optional Display and sound Key lock function Lock operation of the instrument using the panel Unlock by entering a passcode Beep tone Enable or disable for judgment results and key operation Warm up function The instrument will display a message 60 minutes after it is powered on Selection of number of display digits 3 4 5 or 6 digits Display settings LCD display on off Backlight brightness adjustment Measurement screen background color white or black Switchable parameter colors Display 8 4 inch color TFT with touch panel Other Operating temperature and humidity range 0 C to 40 C 20 RH to 80 RH non condensing Storage temperature 10 C to 50 C 20 RH to 80 RH non condensing and humidity range Operating Use indoors at an elevation of 2 000 m or less in an environment environment with a maximum pollution level of 2 Power supply and maximum rated 100 V to 240 V AC 50 60 Hz 70 VA power Dielectric strength 1 62 kV AC for 1 min between power line and ground line Standards compliance EMC EN 61326 EN 61000 Safety EN 61010 Dimensions and weight Approx 215 W x 200 H x 268 Dmm 8 46 W x 7 87 Hx 10 55 D in approx 6 5 kg 229 3 oz Accessories Test head x1 Connection cable x1 Power cord x1 Instruction manual x1 LCR application disc Communications user manual x
6. 1 14 Measurement accuracy Conditions Guaranteed accuracy temperature and humidity range 7 Ea Eb 0 0 58 x Ea Eb 0 C to 40 C 20 RH to 80 RH non condensing However must be within 5 C of the temperature at the time of calibration Guaranteed accuracy period 1 year Open short and load calibration should be performed daily before measurement Warm up time At least 60 min Measurement conditions Frequency power and speed points at which open short and load calibration have been performed Ea 0 5 Er Er For power of 7 dBm to 7 dBm Frequency FAST MED SLOW SLOW2 1 MHz to 100 Mhz 0 09 0 06 0 036 0 03 100 01 MHz to 300 MHz 0 108 0 078 0 039 0 036 Er For power of 40 dBm to 7 1 dBm Eoff Frequency FAST MED SLOW SLOW2 1 MHz to 100 MHz 3x fe Borg 1 8 2 2 15 2 3 100 01 MHz to 300 MHz 3 X J0 POVRETE 1 75 1 9 2 1 2 25 P Power setting dBm ZS Eb Yo Zx 100 22 Z measured value in Q x 20 Zsr 0 5 x F pros i E 0 Measurement frequency MHz dicc M COSS I c CIE MCCC MIC CIC C MMC Zsr For power of 7 dBm to 7 dBm FAST MED SLOW SLOW2 13 5 9 5 1 3 9 Zsr For power of 40 dBm to 7 1 dBm Zoff Zsr FAST MED SLOW SLOW2 3 x 10 0048
7. 2 Standard accessories Test head e Connection cable IM7580 1 IM7580 02 2m Instruction manual LCR application disc Communications user manual Power cord Free software for calculating accuracy LCR application disc Free software for automatically calculating measurement accuracy based on user entered measurement conditions and measurement results can be downloaded from Hioki s website The instrument does not ship with a test fixture or probe test fixture designed specifically for use with the Impedance Analyzer IM7580 is required For more information please contact your Hioki distributor Options Interfaces GP IB INTERFACE Z3000 GP IB CONNECTION CABLE 9151 02 RS 232C INTERFACE Z3001 RS 232C CABLE 9637 Cable length 2 m 6 56 ft Cable length 1 8 m 5 91ft Any interlink compatible cross cable can be used as the RS 232C CABLE Test fixtures and associated options Available in December 2014 tentative TEST FIXTURE STAND IM9200 ADAPTER IM9906 3 5 mm to 7 mm SMD TEST FIXTURE IM9201 Note Company names and Product names appearing in this catalog are trademarks or registered trademarks of various companies HIOKI Shanghai SALES amp TRADING CO LTD O K TEL 86 21 63910090 FAX 86 21 63910360 DISTRIBUTED BY http www hioki cn E mail info hioki com cn HIOKI E E CORPORATION HIOKI INDIA PRIVATE LIMITED
8. OUT PARA2 IN BINS PARA3 NG Isolated 1 14 OUT AND BIN7 ISO COM solated power supply common 15 OUT PARA3 IN BIN9 PARA4 IN PARAI HI to PARA4 HI Comparator judgment result HI judgment 16 OUT PARA4 HI PARAI IN to PARA4 IN Comparator judgment result IN judgment 17 OUT PARAI LO to 4 Comparator judgment result LO judgment 18 OUT Unused Se Bi t It 19 OUT OUT OF BINSCIRCUIT NG eee pene ee 20 IN Unused BINI BINIO Bin judgment allocation Bin 1 to Bin 10 21 IN Unused CIRCUIT NG Equivalent circuit analysis Comparator judgment result 22 IN PARAI NG to PARA4 NG Peak judgment result 23 IN LD2 ee 24 IN m PARAI IN to PARA3 IN Peak judgment result 25 IN LD6 Result of applying a logical AND operation to judgment 3 AND results for measured values for four parameters output 2 A when all judgment results are IN 27 ISO COM 28 OUT EOM DC 37P ULR solder J D sub 37 pin 29 OUT INDEX we DCSP JB37PR crimp 30 OUT PARAI IN BIN2 PARAI IN Female 4 40 inch thread Japan Aviation Electronics Industry Ltd 31 OUT PARA2 HI BIN4 PARA2 IN 32 OUT PARA2 LO BIN6 PARA3 IN DE Photocoupler isolated no voltage contact input S1 na S 66 29 A ec 29 33 OUT PARA3 HLBINS PAR A4 NG 5 Input on voltage 0 V to 0 9 input off voltage open or 5 V to 24 V 34 OUT l Isolated NPN open collector output
9. TEL 91 124 6590210 FAX 91 124 6460113 HEADQUARTERS E mail hioki hioki in 81 Koizumi Ueda Nagano 386 1192 Japan TEL 81 268 28 0562 FAX 81 268 28 0568 SINGAPORE PTE LTD http www hioki com E mail os com hioki co jo TEL 65 6634 7677 FAX 65 6634 7477 E mail info sg hioki com sg HIOKI USA CORPORATION HIOKI KOREA CO LTD TEL 1 609 409 9109 FAX 1 609 409 9108 TEL 82 42 936 1281 FAX 82 42 936 1284 http www hiokiusa com E mail hioki hiokiusa com E mail info kr hioki co jp All information correct as of Sept 10 2014 All specifications are subject to change without notice IM7580E2 49B Printed in Japan
10. als FAST 0 5 ms SLOW 2 1 ms 5 MED 0 9 ms SLOW2 3 7 ms measurement Averaging Valid setting range 1 to 256 in steps of 1 Basic accuracy Z 0 72 rdg 0 0 41 Guaranteed accuracy range 100 to 5 impedance Guaranteed accuracy period 1 year Terminal design 2 terminal design Supplementary functionality Trigger function User selectable internal or external trigger EXT I O interface manual Trigger delay 0 sec to 9 sec Trigger synchronized output Stabilization wait time of 0 sec to 9 sec INDEX signal delay time of 0 sec to 0 1 sec Trigger types Sequential repeat step 1 Open short load calibration From IM7580 to test head Open load compensation Compensation of fixture Compensation component function Electrical length compensation 0 mm to 100 mm Correlation compensation Compensation of display values based on user input compensation coefficient DCR measurement Hi Z reject function waveform Contact check judgment function Analyzer mode only Recording and interface Number of measured values that can be stored in memory LCR Mode 32000 Analyzer Mode 100 sweeps Measured values are stored in the instrument and then saved all together Panel save and load functions Measurement conditions 30 sets for LCR mode 16 sets for Analyzer mode Compensation values only 30 sets for LCR mode Interfaces HANDLER
11. alue A96 Bin measurement Ranks components using multiple judgment criteria BINI BIN2 BIN3 BINA BINS BINIO IN Measurement standard range Set upper and lower limits for each bin The instrument will rank components using up to 10 categories Upper and lower limit settings are the same as for comparator measurement Zoom function Monitor function Displays measured values using larger Displays the measurement signal text for better visibility on production level being applied to components in lines and in other field applications real time Monitor voltage 0 0 mV to 1000 0 mV Monitor current 0 000 mA to 20 000 mA Measurement parameters Measure up to four parameters simultaneously Impedance Conductance Rp Equivalent parallel resistance Cp Equivalent parallel capacitance Y Admittance B Susceptance Ls Equivalent series inductance D Loss factor tan 6 Phase angle Q Q factor Lp Equivalent parallel inductance V Monitor voltage X Reactance Rs Equivalent series resistance ESR Cs Equivalent series capacitance I Monitor current Analyzer mode only Analyzer Mode Use Analyzer Mode to perform measurement while sweeping through a range of measurement frequencies and measurement signal levels This mode is ideal for checking frequency characteristics and level characteristics Normal segment sweep operation Discover component characteristics by sweeping through a range of frequencies a
12. alyzer mode Sweep measurement and equivalent circuit analysis Continuous measurement mode Continuous measurement using previously saved conditions LCR mode Bin measurement 10 categories for 4 measurement parameters Measurements Comparator measurement Hi IN and Lo judgments for 4 parameters Monitor function Functionality Monitor voltage range 0 0 mV to 1000 0 mV Monitor current range 0 000 mA to 20 000 mA Display Zoom display function Enlarged display of measured values Analyzer mode Measurements Sweep measurement Up to 801 sweep points with user configurable point delay Normal sweep Measurement of up to 801 points Segment sweep Up to 20 segments with a total of 801 points Time interval measurement Interval of 0 00000 sec to max 1 000 00 sec 801 points Functionality Equivalent circuit analysis 5 circuit models Cursor function Automatically search for maximum and minimum values target local maximum and minimum values Comparator function Area and peak judgment Display List display graph display XY graph display judgment results display Scaling Linear or logarithmic Continuous measurement mode Measurements Continuous measurement using up to 46 combinations of the following measurement conditions 30 LCR mode measurement conditions and 16 analyzer mode measurement conditions 13 Speed and accuracy Measurement speed ann
13. and continuous measurement When one component must be measured two different ways or when compensation values and measurement conditions differ for each measurement point the IM7580 streamlines the measurement process by automatically switching among compensation values and measurement conditions When one component must be measured two different ways AM o ___ Automatic Common mode switching Differential mode Halve cycle times by using two instruments Thanks to a compact design two IM7580s can be stored in one rack Using two impedance analyzers simultaneously can dramatically reduce cycle times When compensation values and measurement conditions differ for each measurement point Progressive switching of compensation values and measurement conditions T LU 132334 4 3 2 PASS FAIL judgments for power inductors Comparator function By using the comparator function s area and peak judgment functions you can easily differentiate between defective and non defective components Set the judgment area and then check whether component measurement results fall inside that area This approach is well suited to differentiating between defective and non defective components Non defective Defective As illustrated to the left you can set a range around the peak value and use it to make judgments Area judgment Measurement parameters and measurement c
14. asurement complete signal Pulse You can set the duration for which the measurement complete signal is placed in the on state Hold The measurement complete signal switches from on to off at trigger input You can set the duration of the delay from output of judgment results to output of the measurement complete signal 4 Analog measurement signal Output delay When using trigger synchronized output you can ensure that the analog measurement signal is only output once the measurement signal has turned off Trigger synchronized output The measurement signal is only applied to the sample during measurement Key lock function You can lock the instrument s keys to prevent erroneous or unauthorized screen operation Full key lock Disables all setting changes Set key lock Enables only comparator and bin judgment settings Before activating the key lock function check the passcode setting Audio Signal You can turn the beep tone on or off based on the comparator judgment results The key tone can also be turned on or off Beep types 14 Volume 3 settings Warm up function The instrument will display a message indicating that warm up operation is complete about 60 minutes after it is powered on A warm up period of 60 minutes is required in order for the instrument to perform at its defined accuracy 11 12 Applications Common mode filter measurement Panel save
15. ement results R1 C1 C1 L1 L1 R1 R1 L1 C1 Simulation function residual error display Perform a simulation based on equivalent circuit analysis results and compare the results to measured values to verify their accuracy The residual error display allows you to check the quantitative difference between measured values and simulation results Difference Measured values Simulated values Frequency Absolute accuracy The IM7580 features the functionality you need to make accurate reliable measurements Contact check The instrument checks the state of contact between the measurement terminals and circuit elements to verify the state of contact and detect contact errors DCR measurement Checking contact before and after measurement This capability is ideal for carrying out contact checks of inductive components with low DC resistance values such as inductors ferrite cores and common mode filters Judgments based on user configured upper and lower contact resistance limits Guaranteed accuracy range 0 1 Q to 100 Q Measurement timing Before measurement after measurement or before and after measurement Measured value gt Upper limit Displays H1 Upper limit gt Measured value gt Lower limit Displays IN Measured value lt Lower limit Displays LO Hi Z reject function Judging the contact state based on measurement
16. et Moves the cursor to the local minimum L Min value value a filter can be set Select a measurement parameter to search for Select the search type If target enter the value Qu Select whether to search for a rising waveform or falling waveform Qu Select whether to use a filter Local maximum and local minimum values only Auto search function Move the cursor automatically according to user configured settings once sweep measurement is complete Peak judgment screen Area and peak comparison functions Check whether measured values fall inside a previously configured judgment area These functions are ideal for use in verifying non defective products Area judgment Obtaining an overall judgment for each sweep Define a range by setting upper and lower limits and display the judgment results as IN or NG Judgment area IN judgment Inside area NG judgment Outside area Peak judgment Identifying resonance points Define a range by setting upper lower left and right limits and display the judgment results as IN or NG Judgment area IN judgment Inside area NG judgment Outside area FERL i LL ti if 208 z ie m Equivalent circuit analysis function Analyze individual component values L C R for elements in the following five circuits based on measur
17. f the electrical connection between the reference surface and the measurement sample connection surface to allow compensation of error caused by phase shift If mounting a fixture on the test head it is necessary to enter the fixture s electrical length Open and short compensation Open and short compensation eliminates sources of error from the calibration reference surface to the sample connection surface including the fixture measurement cables etc 2 Reset on Previous 7 N Current ERR i i Reset off Previous X Current ma 5 2000 300 5 Hold 3 Pulse Delay ERR Previous Current 4 INDEX Signal External control I O When using external control you can regulate the input and output signal timing as desired 1 Trigger input Timing and enable disable settings A Choose to enable or disable trigger input during measurement By B disabling input you can prevent erroneous input caused by chatter Select whether to base input timing on the trigger s rising edge or falling edge 2 Reset judgment result You can set the timing at which judgment results are reset On Reset the previous judgment results at the measurement complete signal s rising edge Off Reset the previous judgment results when the next judgment results are output 3 Measurement complete signal Output method and output delay Select whether to use pulse or hold output for the me
18. its 3 4 5 6 display color text size Absolute value display Background color and display color 1 GP IB 2 RS 232C 3 EXT I O Handler interface 4 LAN 5 USB for PC connectivity te Hu ij e Pee ee L LRRR RE LELE ELE LE LS SSCS ECE CEES SSCP TERR RRR REE RR EE EE SS RE R RRR RRR ERR ER RES FY GP IB INTERFACE Z3000 LhE RRR LEER ERE EEE REE EE EY REE EEE EE eT YT paid i ii i Foe i ta p wn pes se ce La gt e a t y WERDE cm nt T e TR g RS 232C INTERFACE 23001 The GP IB and RS 232C INTERFACE are optional Extensive range of interfaces for PC based management Save measurement conditions and results on a USB flash drive Use the USB slot on the front of the IM7580 to store measurement results screens and measurement conditions saved on the instrument s internal memory on a USB flash drive Extensive range of interfaces for external control Use the IM7580 s LAN USB GP IB RS 232C and EXT I O interfaces to control the instrument from an external device The GP IB and RS 232C interfaces are optional LAN GP IB optional EXT I O Connector RJ 45 connector Connector 24 pin D sub 37 pin Saat Connector Transmission 10Base T 100Ba
19. nd levels Normal Performs measurement after you set the sweep parameter frequency or level sweep range number of sweep points and measurement conditions gt Segment Allows you to set sweep parameter sweep range number of sweep points and measurement conditions on a segment by segment basis Sweep parameters Frequency signal level power voltage current Sweep range 1 MHz to 300 MHz 40 0 dBm to 7 0 dBm Number of sweep points segments Up to 801 points Up to 20 segments with a total of 801 points Measurement condition settings Frequency level speed average TER Interval SWCCD operation Discover element characteristics over time under set conditions Measurement condition settings Frequency level speed average Time interval 0 sec to 1 000 sec Number of sweep points segments Up to 801 points Up to 20 segments with a total of 801 points Eu Display T The graph display can be switched based on the type of measurement being performed with a total of 7 layouts available Sweep graph display 1 graph 4 graph display XY graph display 1 graph 2 graph display Multi display simultaneous display of sweep and List display Peak display 189 Edo 300 OOH Intelligent measurement and analysis Convenient functionality for performing measurement reviewing measurement re
20. onditions Z Impedance Rs Equivalent series resistance ESR Y Admittance Rp Equivalent parallel resistance Phase angle Ls Equivalent series inductance Measurement val llel ind am X Reactance Lp Equiva ent parallel in uctance pa Conductance Cs Equivalent series capacitance B Susceptance Cp Equivalent parallel capacitance Q factor D Loss factor tan 7 0001099999960 Rs 0 00m to 9 999996 Q Rp z 0 00m to 9 99999G Q Y 0 0001 9 999990 S 5 Ls 0 00000 to 9 99999G H 9 0 000 to 999 999 Lp 0 000000 to 9 99999G H Display range X 0 00 to 9 99999G 0 Cs 90 00000p to 9 99999G F G 0 000 to 9 99999G S TAA i Cp 0 00000 to 9 99999G F B 0 000 to 9 99999G S D 2 000000 to 9 99999 0 00 to 9 999 99 Bs ih 2 A 0 000 to 999 999 Measurable range 100 to 5 Output impedance 50 at 10 MHz Range 1 MHz to 300 MHz E 1 0000 MHz to 9 9999 MHz 100 Hz steps A ent Resolution 10 000 MHz to 99 999 MHz 1 kHz steps ur 100 00 MHz to 300 00 MHz 10 kHz steps Accuracy 0 01 of setting or less Power 40 0 dBm to 7 0 dBm Voltage 4 mV to 1 001 mV 8 Current 0 09 mA to 20 02 mA Measurement User configured power voltage and current signal level Resolution 0 1 dB steps Accuracy 2 dB 23 C 5 4 dB 0 C to 40 C Measurement modes Measurement modes LCR mode Measurement using a single set of conditions An
21. results Activate this function in order to output a measurement terminal contact error if the impedance measured value is greater than a user configured reference value 1 Q to 10000 Q Valid setting range Waveform judgment function Detecting chatter during measurement Verify that components and terminals are in contact during measurement The instrument will output an error if fluctuations in the RMS value exceed a user configured range that has been set using the initially acquired RMS value waveform as the reference value Valid setting range 0 01 to 100 0 of the reference value Output format Screen error display or EXT I O error output Compensation function To truly measure accurately all analyzers should first be set up to their optimal state Test head terminals Sample connection Calibration reference terminals surface Calibration reference DICES surface M Test ead Measurement BHUR sample mmm m cable optional 2 m IM7580 mme Connector cable test fixture Open short and load calibration The compensation process involves calibrating the measurement setup from the IM7580 to the reference surface either the test head terminals or the sample connection terminals Each of three standards open short and load 15 connected and its calibration data measured to eliminate potential sources of error Electrical length compensation Enter the length o
22. se Tx Standard IEEE 488 1 1987 Female 4 40 inch thread method 1000Base T Reference standard IEEE 488 2 1987 DC 37P ULR solder Protocol TCP IP Terminator CR LF LF Compatible DCSP JB37PR crimp connectors Japan Aviation Electronics USB for PC connectivity RS 232C optional Industry Ltd Connector USB Type B Connector D sub 9 pin For more information see page 15 a gee USB 2 0 High Speed Flow control Software UNE 9600 19200 38400 57600 bps Dual measurement modes Featuring LCR Mode and Analyzer Mode LCR Mode Use LCR Mode to make measurements by applying the desired frequency and level signal to the component being measured This mode is ideal for evaluating passive devices such as capacitors and coils Comparator measurement Yields a PASS FAIL judgment for the target component based on a single judgment criterion Greater than or equal to upper limit HI DINE 0 displayed Reference Within range defined by upper and pF lower limits m aco IN is displayed LO Lower Less than or equal to lower limit limit LO is displayed Upper and lower limit judgment Set the upper and lower limits Percentage judgment Set the upper and lower limits as percentages of the reference value Deviation percentage judgment Set the upper and lower limits as percentages of the reference value The instrument will display deviation of the measured value from the reference v
23. sults and judging measured values Analyzer Mode LCR Mode A Panel numbers set for continuous measurement B Measured values C Parameter judgment results Continuous measurement function Conduct continuous measurement by progressively loading multiple sets of previously saved measurement conditions using the panel save function Measurements can combine LCR and Analyzer Mode measurement conditions Continuous measurement can be performed using up to 46 measurement condition combinations and can be implemented from EXT I O Selecting an Analyzer Mode panel displays the waveform Panel save and load function Save previously configured measurement conditions compensation values and compensation conditions in LCR or Analyzer Mode and load saved measurement conditions Number of panels that can be saved LCR Mode measurement conditions 30 Analyzer Mode measurement conditions 16 A Cursor B Search result point C Measured values at result point m Measured value search function The cursor can be moved automatically to a user selected measured value point for one set of sweep measurement results Search options Maximum value Moves the cursor to the maximum value Minimum value Moves the cursor to the minimum value Moves the cursor to a user set measured value Target Moves the cursor to the local maximum L Max value value a filter can be s
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