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Oriel FTIR User Manual

1. 22 Remove the CD from the computer s CD ROM drive place it back into its case and store in a safe location 23 WINDOWS 7 USERS ONLY Paste the dll files listed below from the computer s desktop to the directory listed here Failure to perform this step will result in a MATLab Runtime Error message appearing when opening the MIRMat software C Windows System32 mfc70 dll mfc7Ou dll msvcr70 dll 24 Continue to Section 6 to install the FT IR instrument driver COMPUTER PRIVILEGES MIR8035SPO01 Series Modular FT IR Spectrometers Page 30 6 FT IR INSTRUMENT DRIVER INSTALLATION The individual performing the installation must have administrator privileges for the computer 6 2 FT IR DRIVERS INSTALLATION PROCEDURE WINDOWS XP This section will guide the user through the driver installation process Please note that unless otherwise stated the figures shown are based upon an installation performed using a Windows XP Service Pack 3 operating system For Windows 7 users please refer to Section 6 3 1 With the FT IR scanner off connect the USB cable from the scanner to the computer 2 Apply power to the scanner 3 The Found New Hardware Wizard should automatically open in Windows XP If installing onto a Windows 7 32 bit operating system go to the device manager and locate VSE SPECTRA under Other devices Software from the menu Right click and select Update Driver File Actio
2. FFT requires knowledge of over sampling parameter If over sampling selection will not match native sampling of interferogram the resulted X scale will have no physical meaning in terms of Wavenumber assignment MIR8035 SP01 Series Modular FT IR Spectrometers Page 49 7 14 SPECTRAL CALCULATOR If at least one location is filled in the Memory Stack the Spectral Calculator may be used to perform mathematical calculation Open the Spectral Calculator by going to Math gt Function A B in the SPV window Functions provided are LOG10 CALCULATE SQRT INVERT NEGATE ABSOLUTE Choices for the first and second variables are A through F of the memory stack 0 or 1 Mathematical operators are addition subtraction multiplication and division Clicking on the equal sign performs the calculation The data is stored in the stack specified to the right of the equal sign Note that the Spectral Calculator result will override anything already stored in that location Figure 50 Spectral Calculator 7 15 PLOTTING FROM SVG WINDOW Each time the Plot button is clicked a plot is added to the plot window This can result in numerous plots being displayed at once for comparison MIR8035 SP01 Series Modular FT IR Spectrometers Page 50 7 16 LOADING A FILE FROM SVG WINDOW Clicking the Load button in the SVG window brings up the following e From Disk MAT File Name Browse F Default Directory Cancel File C
3. 7 8 SPECTRAL DATA VIEWERS In the main data display window the time domain Spectral Viewer is accessed by clicking on the SPV icon located to the right of the time domain plot Note that in this window data is no longer being acquired The spectral viewer is used to zoom pan and perform calculations on the scan The frequency domain Spectral Viewer displays the last acquired spectrum It is accessed by clicking on the SPV icon located to the right of the frequency domain plot It has the same functions as the time domain Spectral Viewer as well as a pull down menu used to select units Available units for the x axis are um nm cm MHz eV kcal mol kJ mol and K 5 Spectral Data Viewer NEWPORT SP ORIEL ES x File Tools Math 9 Load 4 305e 009 Plot Save Data Mem Stack A 2 1 7694e 009 12000 13000 4000 5000 CURSOR 13112 3428 Close Figure 46 Time Domain Spectral Data Viewer MIR8035 SP01 Series Modular FT IR Spectrometers Page 45 BJ Spectral Data Viewer NEWPORT SP ORIEL 2004 cmima x 107 Load 0 000946 y lod Flot 8 Export 7 6 hem Stack E D B h uw 4 3 2 1 4 4 Ye 2000 4000 6000 8000 10000 12000 14000 1 Auto Y 1265 765 o 14537 01 Ez o 2000 ai 000 anol Te ae Ta a Al BI A Fe Name insb4b mat Figure 47 Frequency Domain Spectral Data Viewer 7 9 ZOOM PAN AND SCALE In the Spectral Viewer one is able to adjust the sca
4. of lens 3 is 2 5 At the interferometer settings for the resolutions 4 8 16 32 64 cm the detector will represent the limiting factor and these resolutions should be achieved When the interferometer is set for higher resolution 2 1 or 0 5 cm we will still get no better spectral resolution than 4 cm the best achievable with the divergence or convergence we have But we can make use of the Jacquinot stop Closing the aperture reduces the divergence and unfortunately also the signal level The attainable resolution is improved and if we have enough signal we can attain the resolution limit set by the fundamental rule of scan length We have talked about the tendue of the MIR8035 and said that it differs from the throughput because of the performance of the optics The tendue takes into account just the geometrical factor Poor reflectance say from the corner cubes will reduce the throughput but not affect the etendue Measurements on the MIR8035 show the throughput is around 0 15 to 0 2 times the tendue Sometimes the multiplier is called efficiency and designated o since it depends on the wavenumber The real throughput of a spectral instrument including an FT IR relates to the etendue through Q G 0 Equation 13 where c is dimensionless For an FT IR a typical number for the maximum value of o is 0 2 The spectral dependence of 0 is determined mainly by the efficiency and transmittance
5. 80019 Si and 80020 InGaAs Detectors 10 3 HgCdZnTe Detectors The 80015 and 80016 Mercury Cadmium Zinc Telluride detector exhibits fast response time a wide dynamic range and features an integrated preamplifier using a low noise power supply plus the convenience of thermoelectric cooling Thermoelectric TE cooling reduces noise increases responsivity and eliminates the inconvenience associated with refilling a liquid nitrogen reservoir The cooler controller features a temperature lock indicator and provides power to the preamplifier Monolithic optical immersion of this detector is achieved using a hyperspherical lens shape The monolithic construction of this detector the epitaxial layer is grown directly on the lens substrate is a highly effective technique for making a small detector behave like a larger detector The active area surface appears to be n2 larger where n is the index of refraction for the lens The immersion reduces the image size and increases the detectivity by the same factor These detectors also includes a CaF focusing lens with X Y adjustment and an iris that can be manually adjusted from 1 to 25 mm diameter The iris can act as a Jacquinot Stop By decreasing the effective source size and reducing the spot size on the detector it increases the resolution The iris uses standard Oriel 1 5 Inch Series male and female flanges allowing it to be easily integrated into the FT IR system All necessary cables and a power ad
6. MIR8035 SP01 Series Modular FT IR Spectrometers Page 86 Detectors Room Temperature 1 7 to 28 um 0 7 to 1 um 1 to 1 7 um ptics l parabolic reflector Focusing Lens Focusing Lens Operating Bandwidth 100 Hz to 40 kHz 100 Hz to 40 kHz with amplifier TOO PAAA RA gain dependent gain dependent Gain Adjustable Potentiometer 10 to 10 V A 10 to 10 V A Detectors Thermoelectrically Cooled HgCdZnTe TE Cooled a 3 550 to 1 540 cm 1 Responsivity Range 2 8 to 6 5 um Detector Element Size Window Material Preferred Beam Splitter Typical D 1 2x 10 cm Hz w Operating Bandwidth with amplifier Inout Voltage 100 to 130 VAC 200 to 240 VAC j 9 50 to 60 Hz 50 to 60 Hz 10 Hz to 140 kHz MIR8035 SP01 Series Modular FT IR Spectrometers Page 87 Liquid Nitrogen Liquid Nitrogen o 10 000 to 2 000 cm 5 000 to 600 cm Responsivity Range 1 to 5 um 2 to 17 um Detector Element Size Window Material Sapphire Preferred Beam Splitter Typical D 1x 10 cm Hz w 5 x 10 cm Hz w Operating Bandwidth with amplifier 100 Hz to 40 kHz 100 Hz to 40 kHz CaF Focusing Lens CaF Focusing Lens X Y Adjust Optics Iris Manual Adjust 2 to 36 mm diameter 1 to 25 mm diameter Infrared Light Sources Silicon Carbide Quartz Tungsten Halogen 6 000 to 350 cm 14 000 to 2 800 cm operira ange 1 7 to 28 um 0 7 to 3 5 um Collimated Beam Diameter 1 36 inch 34 5 mm 1 36 inch 34 5 mm Light Rippl
7. Simply select the appropriate fiber adapter screw it into place connect the fiber and adjust its position along the X Y axis for maximum throughput Interchangeable fiber adapters are available for SMA ST and 11 mm ferrule terminations ordered separately This type of reflector provides very efficient radiation control because collection or focus occurs over very large solid angles This makes the 80033 particularly useful with lower power incoherent sources such as the 80007 Silicon Carbide or 80009 QTH infrared sources Figure 73 80033 Fiber Coupler with 80041 SMA Adapter gt Figure 74 80040 Fiber Coupler MIR8035SPO01 Series Modular FT IR Spectrometers Page 66 11 2 Accessory Compartment An exciting variety of FT IR sample measurement products may be used with the 80070 Accessory Compartment The 80070 uses Oriel 1 5 inch Series flanges so it is compatible with Oriel s entire series of FT Spectrometer products Sampling accessories are positioned at the proper optical height between the Scanner and Detector Off axis parabolic reflectors are integrated into the design rather than lenses IR refractive optics are expensive and have transmittance limitations Using this type of reflector provides several advantages The gold coating enhances IR reflectance The focal point is displaced from the mechanical axis giving full access to the reflector focus area Contact Oriel s technical sales engineers for a list of compat
8. This wizard helps you install software for Newporkt Onel FTIR USB Device If your hardware came with an installation CD lt or floppy disk insert it now What do you want the wizard to do Install the software automatically Recommended Install from a list or specific location Advanced Click Hest to continue Figure 29 Install Software Automatically MIR8035 SP01 Series Modular FT IR Spectrometers Page 32 6 The window shown in Figure 30 may appear Click Continue Anyway Hardware Installation The software you are installing for this hardware Newpor Orel FTIR USB Device has not passed Windows Logo testing to very its compatibility with Windows P Tellme why this testing is important Continuing your installation of this software may impair or destabilize the correct operation of your system either immediately or in the future Microsoft strongly recommends that you stop this installation now and contact the hardware vendor for software that has passed Windows Logo testing Leon STOP Installation Figure 30 Windows XP Signed Driver Prompt 7 Installation of the FT IR instrument driver will now begin Refer to Figure 31 Found New Hardware Wizard Please wait while the wizard installs the software NewporkOnel FTIR USB Device oriel_usb sy To CAWINDOMW S Systemse Drivers CO Figure 31 Installing Instrument Driver MIR8035 SP01 Series Modular FT
9. What is observed is a sinusoidal signal The average value is the same as you would see if the beam was not divided and interference produced The sinusoid goes positive and negative about this value so the average signal level is called the zero level A high precision electronic circuit produces a voltage pulse when the signal reference sinusoid crosses the zero level By use of only positive zero crossings the circuitry can develop one pulse per cycle of the reference interferogram or use all zero crossings for two pulses per cycle of this interferogram The latter case is called oversampling These pulses trigger the A D converter which immediately samples the main interferogram MIR8035 SP01 Series Modular FT IR Spectrometers Ara INTERFEROGRAM PAANANNANAAAAD E VVVVVVV UV UU PAA AA AN VUVVVVVVVVVU REFERENCE INTERFEROGRAM Figure 96 With oversampling positive and negative zero crossings are used There is a fundamental rule of information theory called the Nyquist theorem which can be paraphrased to state that a sinusoid can be restored exactly from its discrete representation if it has been sampled at a frequency at least twice as high as its own frequency If we apply this rule to the formula Equation 3 we find immediately that since the minimum value of f f is 2 so the minimum value of A is twice the wavelength of the reference laser Amiin 633 nm 2 1 266 UM With oversampling the reference laser wavelen
10. and it is considered expensive You can coat it at further expense and reduction of the spectral range You can find transmittance curves of different IR materials in Newport s catalog and website A second issue is dispersion of the lens material Lenses are definitely good for short wavelength range applications For example the sensitivity range of an InGaAs detector is very short from 800 to 1700 nm Using a lens should not pose a major problem though we do see some dispersion in our labs with fused silica lenses over this range i e you can axially move the lens to optimize the long wavelength or short wavelength signal For a wider wavelength range you should position the detector at the shortest focal length position in other words in the position of minimum spot size for the shortest wavelength Then you can be safe for longer wavelengths MIR8035 SP01 Series Modular FT IR Spectrometers Page 110 21 Appendix B Glossary of Terms 100 Line Calculated by ratioing two background spectra taken under identical conditions Ideally the result is a flat line at 100 transmittance Absorbance Units used to measure the amount of IR radiation absorbed by a sample Absorbance is commonly used as the Y axis units in IR spectra Absorbance is defined by Beer s Law and is linearly proportional to concentration Aliasing If frequencies above the Nyquist Frequency are not filtered out energy in these will appear as spectral artifact
11. and then plug them to the electrical mains af Figure 4 Unlocking Moving Mechanism MIR8035 SP01 Series Modular FT IR Spectrometers Page 16 Detector Figure 5 Scanner with Source and Detector 80070 Optional Accessory Compartment Figure 6 Complete System with Accessory Compartment MIR8035 SP01 Series Modular FT IR Spectrometers Page 17 USB Cable to Computer To Detector Figure 7 Scanner Connectors MIR8035 SP01 Series Modular FT IR Spectrometers Page 18 Figure 8 Beamsplitter Alignment Access Points 3 6 MIR8035 SP01 Series Modular FT IR Spectrometers Page 19 FIRST TIME STARTUP Ensure that the scanning mechanism was unlocked prior to powering up the instrument If unsure remove the cover and check before proceeding Then apply power to all instruments in the system A liquid crystal display LCD is located on the top of the scanner as shown in Figure 9 A and B indicate the two signal levels after the beam splitter The phase is between the two signals is also displayed The system must warm up for at least 30 minutes to stabilize the scanner s internal temperature in order to obtain accurate readings If both signal readings are greater than 25 and the phase is from 88 to 92 refer to Section 4 for the MIRMat software installation procedure Ideally the percentages will be at 50 with a maximum of 5 difference between the two readings If the
12. Auto Scale X Auto Scale Y Frequency Domain Auto Scale X Auto Scale Y Zoom in or out by clicking in the graph windows Use the mouse to window around an area of interest on the graph when zooming in To return to the original views select the auto scaling commands for the time or frequency domain graphs Web opens the default web browser and goes to the Newport website Apodization Boxcar Hanning Triangular Blackman Hamming selecting one of the choices applies the window function to the graph The interferogram data is still preserved in its natural acquisition format while the spectrum is Fourier transformed with the selected windowing function Display Setup Freq Domain Y Scale Linear Log By default the y axis scale of the frequency domain is linear Quit exits the MIRMat application MIR8035 SP01 Series Modular FT IR Spectrometers Page 44 7 7 ACQUISITION MODES When the software first opens Stop is the default acquisition mode and the number of scans shown is zero highlighted in green Other acquisition choices are Continuous Coadd Single and Quit Enter a number in the Coadd field to set up how many scans to coadd then select Coadd acquisition mode The actual number of scans will increase until the limit is reached Once completed the actual number of scans is highlighted in red If the Continuous mode is selected the number of scans continues until Stop is selected The Quit selection exits the application
13. IR Spectrometers Page 33 8 Upon completion the screen shown in Figure 32 will appear Click Finish If successful the instrument will now appear in the Windows Device Manager under USB Devices Found New Hardware Wizard Completing the Found New Hardware Wizard The wizard has finished installing the software for NewportOnel FTIR USB Device Click Finish to close the wizard Cancel Figure 32 Instrument Driver Installation Complete 6 3 FT IR DRIVERS INSTALLATION PROCEDURE WINDOWS 7 This section will guide the user through the driver installation process Please note that unless otherwise stated the figures shown are based upon an installation performed using a Windows 7 operating system For Windows XP users please refer to Section 6 2 le 2 With the FT IR scanner off connect the USB cable from the scanner to the computer Apply power to the scanner Go to the device manager and select the listing for the FTIR Right click on the FTIR and select Update Driver Software Update Driver Software Uninstall Scan for hardware changes Properties Figure 33 Update Driver Software MIR8035 SP01 Series Modular FT IR Spectrometers Page 34 5 Choose Browse my computer for driver software How do you want to search for driver software gt Search automatically for updated driver software Windows will search your computer and the Internet for the latest driver software for your d
14. Modular FT IR Spectrometers Page 96 INTENSITY Y Figure 99 Interference pattern The farther the scanning mirror moves the tighter this ring pattern becomes So the detector will see some average level of the intensity and the distinct interference picture recorded for the collimated input will be smeared To get it back we need to have just one fringe across the detector as in Figure 100 when the ring pattern is the tightest in other words when the OPD has is at its maximum value INTENSITY FRINGE PATTERN DETECTOR SENSITIVE AREA Figure 100 Intensity distribution at the detector As we see from this simple consideration an optimal functioning of the FT IR requires certain restrictions on sizes of the detector and source maximum angle of the fan of rays maximum length of scan spectral resolution and range of wavelengths Since most of these parameters are related to each other it would be practical to write one simple formula and then derive all other restrictions from it The following formula ties together the highest wave number QA max that is to be observed spectral resolution Aa and maximum divergence angle half angle aa in radians that can be tolerated inside the interferometer Omax Ac O max Equation 4 For example if we wish to measure with 1 wavenumber resolution at 6667 wavenumbers 1 5 um then the half angle divergence of the beam inside the interferometer must be less than 12 2 milliradia
15. Show Legend Unlock Axes Position 52 Properties l Figure 57 Show Legend E Pot File Tools Cut Copy Paste Clear Hide Legend Unlock Axes Position Properties Figure 58 Hide Legend MIR8035 SP01 Series Modular FT IR Spectrometers Page 55 Right click on the legend text to bring up the following menu selections Cut Copy Paste Clear String Font Size d ee Font Style Color 5 Properties AB 46 Figure 59 Legend Text Menu Right click in the legend away from the text to bring up the following menu selections H h nel pa l _ h inez hin i L Paste 5 Clear Show Legend Unlock Axes Position 5 Properties 43 46 1500 Figure 60 Legend Menu Select Unlock Axes Position Move the cursor onto the border of the legend When it turns into a 4 arrow icon then you can drag the legend onto the plot Right click again and choose Lock Axes Position when done to prevent accidental movement MIR8035 SP01 Series Modular FT IR Spectrometers Page 56 Clicking on Properties either from the legend text or the other part of the legend brings up the following screens mam Edit Properties for legend egend ne el i Text Sie Font Fontname Helvetica Fontweight Norma l Font angle Norma a Font size f40 0 v Pro
16. System Man d program tn compactas mode tr ni a ip tae de conii Bh Addie archeve ima de tstcond2 aran 7 de uiii Add to tuprar de urbriew de Wired de Windows Settings Compress ed email HH a y J 00400 ini OS h Compres lo selupver ad eal Run in 756 colors O Aber E Sup nieras 1 E J Astoruninf P O as Wied k Run in 64 x screen resolution El Hago j I El fisrgents vbs a sable v the es E insta 3 EMS cie ds onde Tel mico Doabir drop compartan gt mica mida dll Dnabie dia stating ot hgh OPI settings 8 basa Be Mia0250 Drives A ora Level ot mari ob Fun fe grog an as an arar ator EN supat eat sas Lei ex Sigui J Setup Change settings for al users T Pps gt dealers 154 Ee en Selupuexe Detemodiied LITO 10 43 a Date crested LSU EDOE MANAM eN setup exe Oste modifies 12 14 Application Soi EM KB Ae se 224 ll gt Figure 11 Run Active X Installer MIR8035 SP01 Series Modular FT IR Spectrometers Page 21 4 Click Next to begin the installation process as shown in Figure 12 13 Mir80250 Drive Welcome to the InstallShield Wizard for Mir80250 Drivers_ActiveX The InstallShield R Wizard will allow you to modify repair or remove Mir80250 Drivers_ActiveX To continue dick Next Figure 12 Begin Active X Installation 5 Select Modify and click Next per Figure 13 e program features are installed This option displays the Custom Selection dialog in which y
17. as a protective housing for the laser A safety interlock prevents the laser from operating with the cover off Eye protection is required if operating this laser in such a manner as to be exposed to the beam or its reflection It is strongly suggested that personnel who operate this instrument understand and utilize laser safety practices appropriate for a Class IIIA laser The scanner should never be set up in such a manner that unprotected bystanders may be exposed to the laser s output beam MIR8035 SP01 Series Modular FT IR Spectrometers Page 11 2 INTRODUCTION The MIR8035 M has been designed to be useful for routine analytical applications for an FT IR as well as non traditional applications where modular design is required for flexibility in the optical path The MIR8035 was designed specifically for Researchers and OEMs who want an instrument easily adaptable to their special needs at an economical price and without compromise in performance The MIR8035 has selectable resolution starting with 0 5 cm and a very broad spectral range depending on choices of sources optics detectors and beam splitters The MIR8035 is commanded by MIRMat a software package that provides sophistication for routine analysis that allows you to write custom routines to control the system This package is also compatible with Active X Oriel utilized a modular approach when designing the MIR8035 We made the components that restrict the use of FT IR inst
18. delicate gold coated optical parts Therefore the instrument must operate or be stored in a controlled laboratory environment where relative humidity does not exceed 30 The shipping container and scanner contain desiccant allowing the system to be transported without any negative effects due to humidity It is the user s responsibility to ensure that the system is operated or stored in a low humidity environment Note that damage caused by mishandling or placement in an inappropriate environment is not covered under warranty UNPACKING The system is carefully packaged to minimize the possibility of damage during shipment Follow these steps to unpack the FT IR system safely 1 Inspect the shipping crate for external signs of damage or mishandling 2 Place the unopened box in the lab work area where you will be using the MIR MIR8035 and wait 24 hours before unpacking the instrument to let it achieve equilibrium with ambient conditions 3 After 24 hours take the instrument out of the box 4 Wait 1 hour before opening the sealed plastic bag containing the Scanner 5 Puton latex gloves Remove the Scanner from its bag 6 Remove the desiccant place it in the plastic bag and seal it with a twist tie 7 Remove all other items from the shipping container 8 Inspect the contents to ensure that nothing is missing or damaged before proceeding with setting up the system Ensure that power cords are provided for all are instruments
19. horizontal screw 1 4 turn clockwise which moves the centerburst in the positive direction or counterclockwise which moves it in the negative direction Turn Scanner on set the resolution to 4 cm and begin acquiring data The centerburst should now be visible The amount and direction of movement will determine what further adjustments must be made Repeat step 4 as many times as necessary to bring the centerburst to zero E Figure 90 Opto Flag for ZPD Adjustment MIR8035 SP01 Series Modular FT IR Spectrometers Page 80 14 4 Gain Control Adjustment Problem You hear a high pitch sound when scanning Solution Remove the cover from the Scanner Adjust the Gain Control see Figure 91 until the high pitch sound disappears Replace the cover turn the Scanner off and then back on again the instrument should now be running smoothly Gain Control a MM eek rrrvrerrre wiitiiiirryriri A illi N IN l I ih Figure 91 Adjust the Gain Control with a screwdriver a 14 5 MIR8035 SP01 Series Modular FT IR Spectrometers Page 81 ZPD Adjustment To perform a ZPD Adjust ll 2 3 Click stop on the main MIRMAT screen drop down Bring up the Properties menu Select a Resolution value of 16 or less Leave ZPD Adjust unchecked then click OK Click single on MIRMAT main screen to acquire a scan and observe that interferogram is valid See Calibration and Tro
20. laser mode the scanner utilizes the laser to control motion Therefore the laser must be operating and the beam splitter must be correctly aligned The scanner must be in laser mode to acquire data MIR8035 SP01 Series Modular FT IR Spectrometers Page 42 7 5 MAIN DATA DISPLAY Prior to taking any data the Resolution Velocity and Oversampling must be set refer to Section 7 3 for more information When data is taken the screen displays both the interferogram and spectrum Resolution Ed cm Civersampling de Spectra Viewer E Interferogram time domain A ee gn po ig PA A e em E Set number of scans to co aded 0 Er 00 i Actual number Signal Processing Mode Boxcar of scans Acquisition mode sdection Spectra View er fequency domain Figure 45 Interferogram and Spectrum Display The top plot in this window is the interferogram and the bottom is the spectrum The screen displays the number of scans and loops The status and counter fields display real time information This window is used to display a quick view of the data in both time domain and frequency domains To perform calculations on the scan display data in the Spectral Viewer This is discussed in Sections 7 8 and 7 14 MIR8035 SP01 Series Modular FT IR Spectrometers Page 43 7 6 MAIN DISPLAY MENU BAR FUNCTIONS The menu bar pull down menus are found at the top of the main display window Tools Zoom In Zoom Out Time Domain
21. of the beam splitter It stays relatively flat through most of the spectral design range and quickly rolls to zero at the extremes of the spectral range where either the beam splitter s coating or substrate become absorptive It will be useful for comparison to estimate an tendue and throughput of a dispersive instrument with the same resolving power R o Ao 5000 4 1250 as in the example above For a grating instrument the calculation is complicated by the slit geometry resolution dimension issue e we don t have the friendly circular geometry that applies to the FT IR Here we just give a result we will expand on the comparison later Operating at 2000 nm with a 1250 resolving power gives a resolution of 1 6 nm With a 300 l mm grating in the Newport 77250 Monochromator for example the slit widths are set to 62 5 um The slit height is somewhat arbitrary but as our detectors are typically 3 mm in that dimension and as the best we can do is refocus the output with an F 1 optic on the detector from the F 4 instrument we choose 12 mm for the slit height The tendue for the monochromator is given approximately by the product of the slit area and the acceptance angle As the grating turns from normal incidence this will decrease but here we are approximating The acceptance angle is 0 057 sr and the area is 12 0 05 mm Therefore Gmo 0 034 mm sr This compares with 2 mm sr for the FT IR so geometrically the FT IR has 60 ti
22. scale Fluctuations in Vm have a different effect they manifest themselves as deviations of the interferogram from a pure sine wave that in turn will be considered as a mix of sinusoids In other words we will think that there is more than one wavelength in the incoming radiation This behavior produces what are called spectral artifacts Since the manufacture of an interferometrically accurate drive is extremely expensive FT IR designers added an internal reference source into the interferometer to solve the drive performance problem A HeNe laser emits light with a wavelength which is known with a very high degree of accuracy and which does not significantly change under any circumstance The laser beam takes the same path through the interferometer and produces its own interferogram at a separate detector This is essentially used as an extremely accurate measure of the interferometer optical path difference For this interferogram we can write an equation similar to Equation 1 A Vo t Vo f Equation 2 And combining Equation 1 and Equation 2 together Ni Ar fp f Equation 3 Thus Vm has dropped out of the picture and we can calculate the spectrum without knowledge of the velocity or without extremely tight tolerances on the velocity This was just a theoretical example Now let us see how the reference interferogram is actually used in the MIR8035 The signal from the interfering beams of the HeNe are monitored by a detector
23. shadowing with the detector s active area positioned at the focal point A manually adjustable iris is included with the 80026 Its diameter range is from 0 8 to 1 4 2 to 36 mm The iris can act as a Jacquinot Stop By decreasing the effective source size and reducing the spot size on the detector the resolution increases The iris uses standard Oriel 1 5 Inch Series male and female flanges allowing it to be easily integrated into the FT IR system Figure 72 80026 MCT Detector MIR8035SPO01 Series Modular FT IR Spectrometers Page 65 11 FT IR ACCESSORIES 11 1 Fiber Couplers When transitioning from a collimated beam of light into a fiber or visa versa the 80033 is an ideal choice when working in the infrared An advantage of the 80040 is that it does not require optical alignment Simply connect the fiber optic cable and it is ready to use Its 1 5 Inch Series female flange is compatible with the Oriel FT Spectrometer family An off axis parabolic reflector is integrated into the design rather than a condenser lens IR refractive optics are expensive and have transmittance limitations Using this type of reflector provides several advantages Its gold coating enhances IR reflectance The focal point is displaced from the mechanical axis giving full access to the reflector focus area There is no shadowing with the fiber positioned at the focal point An advantage of the 80033 is that it can accept a variety of fiber terminations
24. wiring which terminates with lugs Install the new emitter ensuring that the radiating area is centered with respect to the opening in the holder Replace the brass piece and secure the emitter Connect the lugs to the terminal blocks and tighten the terminal block screws Ensure the wiring is not in the path of the light emitted from the holder Push the wiring to the side if necessary Replace the cover using all screws provided prior to reconnecting the light source to its power supply MIR8035 SP01 Series Modular FT IR Spectrometers Page 74 Figure 86 80030 SiC Emitter Figure 87 80030 SiC Emitter Radiating Area MIR8035 SP01 Series Modular FT IR Spectrometers Page 75 13 PROGRAMMING 13 1 13 1 1 Programming with the MIR MIR8035 ActiveX FTS_AX OCX When the MIR8035 ActiveX and Drivers CD setup is run the FTS_AX Control is installed and is registered along with the MIR8035 instrument USB2 0 drivers MIR8035 ActiveX Methods The Properties menu can be brought up by right clicking on the ActiveX container for the FTS_AX BOOL Acquire void Acquires an interferogram from the MIR8035 see also GetDataDblArray Returns FALSE if triggering an acquisition on the MIR8035 has failed Note If the ZPD Adjust is checked on the property page a ZPD adjust will be performed with the Acquire The adjusted interferogram will be read on the next Acquire VARIANT GetDataDblArray void returns a variant pointing to a
25. 0 1500 0 Labels V Auto 1500 1000 500 Linear Normal C Log Reverse Set axes auto shape Settight limits OK Cancel Apply V Immediate apply Dua Sto into Line Peopertas Lin siyar IDobed ne 3 awm fy aii ra Custom coles Marker Properti Biya Dayun m Sor fag Baye color horror Custom colo Face color Enck Cutom bolo Figure 63 Plot Line Property Editor MIR8035 SP01 Series Modular FT IR Spectrometers Page 58 9 PURGING THE SCANNER The MIR8035 Scanner can be purged with dried air or nitrogen to reduce H2O and CO absorption lines The Scanner has a 1 8 inch hose barb fitting CAUTION BEFORE PURGING WITH NITROGEN ENSURE THAT THERE IS ADEQUATE VENTILATION IN THE ROOM Connect the proper tubing to these fittings We suggest that you use any commercially available two stage regulator to regulate the flow of air or nitrogen Initialize the instrument and begin collecting data Begin with a steady flow of 1 I min of dried air or nitrogen and observe the spectrum Note that the nitrogen will escape through the power supply enclosure After a few minutes the H20 and CO absorption bands should disappear Reduce the air or nitrogen flow to the level required to maintain the spectrum free of H20 and COs lines Figure 64 Purge Hose Connector MIR8035SPO01 Series Modular FT IR Spectrometers Page 59 10 DETECTION SYSTEMS Make all electr
26. 1 Scanner and 80008 DTGS Detector 70 Figure 83 80007 Light Source DIMenNSIONS cooocccnncccnnnccnncncnnnccnnonononcnnnnnonnnnnnnnnnnnnnnnnnnnnnrnnnnnnnnnnnnnnnnnanenns 71 Figure g4 OTE Lamp Replacement e ed 72 Figure 85 SIC Emitter Replacement anida it 73 FIGUIE 667 GO030 SIG Emite an A ida 74 Figure 87 80030 SiC Emitter Radiating rea cccccoconccnccccnonnnnncnononnnnncnonancnnnonnnnncnnnnnonanrnnnnnonanennnnnnnanenss 74 Figure 88 Phase Adjustment wheel c ooooccnccccconccnncccnonconncnononcnnnnnonnnnnnnonononnnnnnnnnnnnnnnnnnnnnrnnnnnnnannrnnnnnnanens 77 Figure 89 Centerburst cannot be Centered at Zero ooooccnnccccnnccnncncnnnnonnnnnnnncnnnononancnnnnnnnnnrnnnnnonancnnnnnnnancos 78 Figure 90 Opto Flag Tor ZPD AdUSIMENC aaa 79 Figure 91 Adjust the Gain Control with a screwdriver cccccccccseseeceeeceeeeeeeeeeeeeseeeeeseaaeeeeeesaaaeeeeesaaaseeees 80 Figure 92 Interl0ck FUNCION srta media dae ictaiincustaateiaiuld sowaviearmdtady ous tasted vaindaamunleieasiaineyambisienaaaiae 82 PIQUE OSs Interl0cK LOCATON iaa di 82 Figure 94 Marking the top of the window FiNg ccccccssececceeseeccseneeeceauececceuueeecsageeesseeeesseaseeessageeessageees 83 Figure 95 Detector signal vs time mirror position and OPD VS time ccccccccsseeeeeeeeeeeeeeaeeeeeeeeeeeeenaas 91 Figure 96 With oversampling positive and negative zero crossings are USEC ceececeeeeeeeeeeeeeeeeeeeee
27. 5 MIRMA T SOFTWARE INSTALLATION siria ii didas 25 Sol COMPUTER PRIN NEB GES sida aleros adi 25 5 2 MIRMAT SOFTWARE INSTALLATION PROCEDURE cccceceecceeececceeeceeeeeeeeeeeeneees 25 6 FT IR INSTRUMENT DRIVER INSTALLATION oooccoccnoconcnnncnncnnnconcnnnconcnnnnnnnnnnnonnnnnnnnnnnnnnnnrnnronnrnncnnns 30 6 1 COMPUTER PRIVMIEEGES 0 santa Ee E E 30 6 2 FT IR DRIVERS INSTALLATION PROCEDURE WINDOWS XP oooccccccoccccccoccccccccccncno 30 6 3 FT IR DRIVERS INSTALLATION PROCEDURE WINDOWS 7 ooccccoccccccccncncccoccnccccccnncnno 33 7 GETTING STARTED WITH MIRMAT sonia ta 36 Tal ANIMALIA AR DWARE CHECO Resina it do 36 Te SOFTWARE WINDOW S conizrssiosmitadaiianiiiia iii aia 37 Lo SETTING INSTRUMENT PARAMETERS anisi hie a A i 38 7 3 1 Fy Ss A e heels enclose sate stan basa Sects eee ean ate eee aa 38 7 3 2 Velar dada daa a 39 TESE OVers ampli ais a a ios 40 TA SOANNER MODE S aiii dai 41 7 4 1 ia A sabinedaceiunesdcuuuaehade 41 7 4 2 Alo Lol APEE EE EA ATT A A E 41 7 5 MAIN DATA DISPLAY oooconcconcnncnnncnncnnncnncnonnn ccoo errar rr nar narran 42 7 6 MAIN DISPLAY MENU BAR FUNCTIONS 0occcoccnccnncnncnnnnnncnnnnonccnnnoncnoncnnnronnnnnnonnnnncnnncnnnnnns 43 LI AAGQUISITION MO DE S otitis taa iia lanas diia 44 7 8 SPECTRAL DATA VIEWERS cc ccc cceccecceecceecceeceeceeeceeceeeceeeaeecesaeeceesaeeseecaeeneesaeeneeseeneees 44 79 ZOOM PANAN D SOA E a ita taa 45 FAO MEMORYS VAGA el AE N 46 Al CUA SO retos lacra ata Delta erra
28. 9 QTH Spectrum taken using 80351 Scanner and 80008 DTGS Detector MIR8035 SP01 Series Modular FT IR Spectrometers Page 71 OS wi Wee 1 75 DIVERGENCE 19 ANGLE 1 5 INCH SiC SERIES EMITTER FEMALE 3 8mm WIDE FLANGE 5 0mm HIGH Figure 83 80007 Light Source Dimensions MIR8035 SP01 Series Modular FT IR Spectrometers Page 72 12 1 QTH Lamp Replacement Disconnect the power supply from the light source prior to beginning this procedure Open the cover of the 80009 QTH IR Light Source using a philips head screwdriver to remove the top cover screws Grasp the QTH lamp and pull upwards to remove Replace the lamp by gently pushing it into the socket Avoid twisting to prevent wearing of the socket Always wear gloves when handling a lamp Replace the cover using all screws provided prior to reconnecting the light source to its power supply Figure 84 QTH Lamp Replacement MIR8035 SP01 Series Modular FT IR Spectrometers Page 73 12 2 SiC Emitter Replacement Disconnect the power supply from the light source prior to beginning this procedure Open the cover of the 80007 SiC IR Light Source using a philips head screwdriver to remove the top cover screws Use a wrench to unscrew the brass piece holding the emitter in place Loosen the screws on the terminal block just enough to remove the wiring leading to the emitter Figure 85 SiC Emitter Replacement The 80030 replacement SiC Emitter comes with its own
29. MIR8035 SP01 Series Oriel Modular FT IR Spectrometers and Related Products User s Manual x 4 Ey HIEL INSTRUMENTS A Newport Corporation Brand QAD Newport Family of Brands ILX Lightwave New Focus Ophir Corion Richardson Gratings Spectra P hysics M8035xSP01 Rev A 08 13 14 MIR8035 SP01 Series Modular FT IR Spectrometers Page 2 TABLE OF CONTENTS 1 GENERAL INFORMATION con rr 8 1 1 SYMBOLS AND DEFINITIONS 0000 cece cece ecceeceeeceeeeeeceeeneeceeeueeceeeaeeseesaeeseeeaneseesaeeseees 8 1 2 GENERAL WARNINGS 2 0 00 cece ccc ceeccecceeceeceeeceeeeeeceeeeeeceeeaeececaeeceecaeeceesauecsesaueseesaeeseeeaeenaes 9 t3 iELEGTRIGCAL HAZARD Susini titi 9 l4 O a e 10 LS MAMP AAND N G dai 10 1 LASER INAZARDS odres 10 2 INTRODUCTION oa 11 3 SST EMS diia ici dd cias 13 3 1 WHAT S INCLUDED WITH THE SHIPMENT P merento a a a 13 3 2 ADDITIONAL ITEMS REQUIRED cccecccecceeeceeeneeeeeeneeceesaeeceeeaeeseesaeeeaeeeeeeaeeneees 13 3 3 INSTRUMENT LOCATION 0 00 cc ccc ccc cecceecceeceeececeneeceecaeeceeeaeeceeeaeeceeeaeeceesneeeaeesesaeeseesaeeneees 14 BA AS o IA A 14 35 SETTING UP THESS EM oocituas ti preciada sicsbesaraduebenhides 15 36 FIRST TIME STAR TUR pea aa iii iia aaa erica did 19 4 ACTIVE INS DALLA TION caida adn iia 20 4 1 COMPUTER PRIVILEGES 0000 a n a S e aA 20 4 2 ACTIVE X INSTALLATION PROCEDURE 00ccooconccnoconcnnncnnccnnnnncnnnnnnnnnnnnnnnnnnnnnnnnnnncnnnnnneniness 20
30. NGTH OF INPUT LENS f FOCAL LENGTH OF OUTPUT LENS Figure 97 Typical optical layout of external optics relative to a dispersive monochromator Figure 97 a shows a typical optical layout of external optics relative to a dispersive monochromator Figure 97 b shows the same for an FT IR spectrometer The main optical feature of the FT IR is that there are no focusing elements inside the instrument it works with parallel beams Dispersive instruments from the input slit to an output slit are self contained in the sense that major spectral characteristics do not depend very much on how you illuminate the input slit and how you collect the light after the output slit Manipulating the light with external optics just gains or loses you sensitivity and adds or reduces stray light and aberrations MIR8035 SP01 Series Modular FT IR Spectrometers Page 95 This is not the case with FT IRs External optics are as important for proper functioning of the instrument as its internal parts Figure 98 shows in a bigger scale a simplified scanning Michelson interferometer together with a source and a detector Suppose first that the source is a monochromatic point source and therefore the beam entering the interferometer rays 1 1 is perfectly parallel Exiting the interferometer it will be focused into a point on the detector surface With motion of the scanning mirror the detector will register an interferogram A sequence of constructive and destructive interact
31. Where A equals to area of the focal spot From Equation 10 and Equation 12 we get A 2 0 79 2 56 mm2 If we want to intercept all the light we have to use a detector with the same area A A4 or in other words having diameter Da V 4 2 56 7 1 8 mm The highest resolution for the MIR8035 0 5 cm corresponds to about a 0 6 mm detector diameter and G 0 22 mm rad still considering O max 5 000cm At the same time working at the lowest resolution that is 64 cm we could get away with as much tendue as 32 mm rad This means that at lower resolutions we could potentially pump into the system a lot more radiation without impacting the resolution performance But if we ve chosen a 0 6 mm diameter detector we cannot actually use this radiation What can we do in this situation We do not have the luxury of using a different detector for each resolution For general use we can choose one detector which corresponds to a reasonably high but not necessarily the highest resolution 4 cm is a popular choice for this because 4 cm resolution is plenty for condensed phase work What if subsequently we need a higher resolution There are a couple of ways to handle this eventuality One way is to increase the focal length of the detector s fore optics Longer focus means higher F lower throughput and a higher allowed resolution lt means of course a radiation loss also Another way is to use an aperture to increase th
32. a jeans ee and email Settings 0x0409 ini WinZip Autorun inf Oriel MIRMAT 8025 msi Send to Run in 640 x 480 screen resolution Copy A Disable visual themes a Sp d Create shortcut Disable desktop composition 4 Setup ini gt Foii Disable display scaling on high DPI settings Privilege Level v Run this program as an administrator Change settings for all users Cu Network setup exe Date modified 6 22 2004 10 57 AM Date created 6 22 2004 10 57 AM Application Size 224 KB Figure 20 Run MIRMat Installer 16 A window will appear to indicate configuring of the installer as shown in Figure 21 This may take a few minutes Preparing to Install Oriel MIRMAT 8025 Setup is preparing the InstallShield Wizard which will guide pon through the program setup process Please wait Checking Operating System Version y Cancel Figure 21 Configuring MIRMat Installer 17 Click Next to begin the installation process as shown in Figure 22 MIR8035 SP01 Series Modular FT IR Spectrometers Page 27 Welcome to the InstallShield Wizard for Oriel MIRMAT 8025 The InstallShield R Wizard will allow you to modify repair or remove Oriel MIRMAT 8025 To continue click Next Figure 22 Begin Active X Installation 18 Select Modify and click Next per Figure 23 Change which program featur
33. able 3 32 hex wrench Alignment kit includes reticle hex wrench laser safety glasses instructional video Optional items IR Source typically ordered and shipped with scanner IR Detector typically ordered and shipped with scanner Accessory Compartment Fiber Coupler Assembly Fiber Coupler Adapter s IR Fiber Optic Cables Off Axis Parabolic Reflectors ADDITIONAL ITEMS REQUIRED The operator shall have the following items on hand in order to proceed with setting up the scanner and configuring the system Note that the MIR8035 system requires the use of MIRMat software in order to complete the system setup The individual installing the software and drivers is required to log onto the computer using Administrator privileges The following items are required Flat blade and philips screwdrivers Computer with the following Y Microsoft Windows XP service pack 2 or greater or Windows 7 82 bit operating system 500 MB minimum free hard drive space 2 GHz processor 512 MB RAM USB 2 0 port CD ROM Drive Re NE ON OR ON 3 3 3 4 MIR8035SPO01 Series Modular FT IR Spectrometers Page 14 INSTRUMENT LOCATION Choose an installation location where the electrical requirements can be met for the system and the environment is suitable for the materials contained in the system The scanner contains extremely hygroscopic materials such as potassium bromide KBr The scanner source and detector also contain
34. ai Figure 40 MIRMat Windows MIR8035 SP01 Series Modular FT IR Spectrometers Page 38 7 3 SETTING INSTRUMENT PARAMETERS Using the mouse right click on the FTS_AX Container window to bring up the FTS_AX Control Properties Select Stop on the MIRMat main screen before altering any of the parameters It is suggested to adjust the parameters in the following order 1 Resolution 2 Velocity 3 Oversampling These settings must be adjusted prior to taking any data 7 3 1 Resolution The resolution is expressed in wave number cm and is uniform throughout the entire spectral range Choices are 40 25 15 and 5 cm The higher the resolution the longer the acquisition speed A sufficient resolution for most measurements is 5 cm To convert from wavenumber to nanometers or visa versa use the following formula x nm 10 000 000 x cm y cm 10 000 000 y nm General Velocity kHz Over Sampling Mumber Points a CA 2048 25 2x Us ad Resolution cm 1 33 Tle 1B Enable Slider Lazer Waw nm Encoder 632 Enable PD ad Figure 41 Setting Resolution MIR8035 SP01 Series Modular FT IR Spectrometers Page 39 7 3 2 Velocity Velocity is defined as the speed at which the scanning mirror moves Choices are 40 25 15 and 5 KHz Velocity kHz Over Sampling MHumber Points a Tk 2048 25 EN Us 3 Resolution cm 1 E 32 i E Enable Slider L
35. amp Proprietary Rights Reservation of Title The Newport programs and all materials furnished or produced in connection with them Related Materials contain trade secrets of Newport and are for use only in the manner expressly permitted Newport claims and reserves all rights and benefits afforded under law in the Programs provided by Newport Corporation Newport shall retain full ownership of Intellectual Property Rights in and to all development process align or assembly technologies developed and other derivative work that may be developed by Newport Customer shall not challenge or cause any third party to challenge the rights of Newport Preservation of Secrecy and Confidentiality and Restrictions to Access Customer shall protect the Newport Programs and Related Materials as trade secrets of Newport and shall devote its best efforts to ensure that all its personnel protect the Newport Programs as trade secrets of Newport Corporation Customer shall not at any time disclose Newport s trade secrets to any other person firm organization or employee that does not need consistent with Customer s right of use hereunder to obtain access to the Newport Programs and Related Materials These restrictions shall not apply to information 1 generally known to the public or obtainable from public sources 2 readily apparent from the keyboard operations visual display or output reports of the Programs 3 previously in the possession of Customer
36. and they are the appropriate type for the locale MIR8035 SP01 Series Modular FT IR Spectrometers Page 15 3 5 SETTING UP THE SYSTEM Place the scanner in its final location for operation Connect the source and detector to the scanner Remove the screws along the perimeter of the cover of the FT IR scanner using a philips head screwdriver in order to remove the cover The locking screw for the scanning mechanism is shown in Figure 4 Unscrew and remove the locking screw using a philips head screwdriver Manually check to ensure mechanism can move freely Never slide tilt or move the scanner after the mechanism has been unlocked Keep the locking screw is a safe location for moving the instrument in the future Place the cover back onto the scanner and secure with the screws provided It is important to note that the cover must be on the instrument and held in place using all cover screws during operation This satisfies the safety interlock mechanism ensures stable data and minimizes the number of random particulates able to enter the instrument cavity Plug the Oriel detector cable into the connector on the side of the scanner lf the detector is not from Oriel refer to Section 0 for connector pinouts Add liquid nitrogen to the detector if required Connect the USB cable to the scanner but do not connector the cable to the computer until instructed to do so by this user s manual Connect all power cords to the instruments
37. apter are included Figure 69 80015 80016 HgCdZnTe Detectors MIR8035SPO01 Series Modular FT IR Spectrometers Page 63 10 4 DTGS Detector With its broad spectral response covering the entire range of the 80350 Scanner the model 80008 Deuterated L alanine doped Triglycine Sulphate DTGS detector is a good choice for many mid IR applications There is no need to worry about using liquid nitrogen this pyroelectric detector operates at room temperature while still achieving good sensitivity An off axis parabolic reflector is integrated into the design rather than a focusing lens IR refractive optics are expensive and have transmittance limitations Using this type of reflector provides several advantages Its gold coating enhances IR reflectance The focal point is displaced from the mechanical axis giving full access to the reflector focus area There is no shadowing with the detector s active area positioned at the focal point This DTGS detector is optimized for use with the model 80007 silicon carbide IR source Fine gain adjustments can be made via an internal potentiometer if desired Figure 70 80008 DTGS Detector 10 5 InSb Detector The 80021 InSb detector exhibits superior performance over its operating range and approaches the maximum theoretical limit of sensitivity for background limited applications This detector requires liquid nitrogen cooling Liquid nitrogen holding time is eight hours A preamplifier is integra
38. area for closer examination Default scale X or Y commands allow the view to be auto scaled provided the view is not a 3D rotated plot 3D PLOTTING Select Plot View gt 3D View To display a 3D plot at a custom viewing angle select Tools gt Rotate 3D Plot Click and drag the mouse in the plot window to adjust the view as a 3D graph In order to return to the default 2D plot continue to drag the plot LA e ML MM File Get Data from SPV Plot View PlotMode Web Close Edit Plot Zoom In Zoom Out Y Rotate 3D Default Scale Figure 53 3D Rotated Plot MIR8035 SP01 Series Modular FT IR Spectrometers Page 53 8 6 GRID AND AXIS SETTINGS The Grid can be displayed only when the Axis display is turned on MIR8035 SP01 Series Modular FT IR Spectrometers Page 54 8 7 CLEARING PLOTS If the Plot button was clicked multiple times in the SVG window multiple plots will appear together In the plot window go to Plot Mode gt Remove Last Plot to erase the last plot Clear All will remove all plots and leave a blank plotting window 8 8 PLOT LEGEND Right click in the plot area and select Show Legend Right click in the plot area once more to select Hide Legend if desired Piot File Tools Get Data from SPV Plot View Plot Mode Web Close E ee DD _ ee 6 5 8 Cut Copy Paste 56 l Clear x1 54 o
39. aser Waw nm Encoder 632 g Enable ZPO adi Figure 42 Setting Velocity MIR8035 SP01 Series Modular FT IR Spectrometers Page 40 7 3 3 Oversampling Oversampling choices are 1x 2x and 4x Please refer to Section 20 Appendix A for more information on oversampling Velocity kHz Over Sampling MHumber Points E TN a 2048 25 M 15 Bs NS Resolution cm 1 E 32 Us i Enable Slider Laser Waw nm Encoder 632 g Enable ZPO adi Figure 43 Setting Oversampling MIR8035 SP01 Series Modular FT IR Spectrometers Page 41 7 4 SCANNER MODES The MIR8035 scanner has two modes of operation Upon powering up the scanner it operates in encoder mode The scanner will remain in encoder mode until it receives a command to switch to laser mode When the MIRMat software is in use or the Active X control is loaded the scanner is placed in laser mode by default when applying power 7 4 1 Encoder Mode In this mode the scanner utilizes an encoder to control motion Motion continues regardless of laser alignment or status This mode is for beam splitter alignment and troubleshooting only It cannot be used for data acquisition Tanar General Velocity kHz Over Sampling Number Points a Iu a 2048 25 E E x Resolution cm 1 e E Su 1b i Enable sida wf Laser Waw nm Encoder 632 8 Enable PD adi Figure 44 Enabling Encoder Mode 7 4 2 Laser Mode In
40. ation They are however limited to this purpose They cannot be used for imaging Spherical mirrors on the other hand can be used for imaging by imaging we mean transferring some source placed at a finite distance from the mirror into an image positioned also at a finite distance from the mirror Light from a point source placed in a focus of a full parabolic reflector Figure 105 will be transformed after reflection into an ideally parallel beam Accordingly a parallel beam will be focused into a tiny focal spot This is true for any section of the parabola So an off axis section of the parabolic reflector can be cut out for convenience as illustrated in Figure 106 Figure 105 Light from a point source placed at the focus of a parabolic reflector MIR8035SPO01 Series Modular FT IR Spectrometers Page 105 Figure 106 Section of an off axis parabolic reflector The arrangement shown in Figure 106 is described as a 90 off axis reflector since the ray striking the center of the aperture and parallel to the main axis turns exactly at 90 degrees and comes into the focal point The distance from the point on the surface of the parabola at the center of the aperture to the focal point is called effective focal length EFL and it is exactly two times the focal length of the parabola EFL 2f F numbers of off axis parabolic mirrors can reach very low values F 1 or even less is practical If not a point but a finite
41. averaging The A D used must have sufficient precision to measure the entire range as any clipping or distortion of the largest signal affects the whole spectrum Dynamic Range For an interferogram it is the ratio of the large centerburst signal at ZOPD to the smallest recorded signal which must be greater than the noise for any benefit from signal averaging The A D used must have sufficient precision to measure the entire range as any clipping or distortion of the largest signal affects the whole spectrum Felgett multiplex Advantage An advantage of FT IR instrument compared to scanning single channel dispersive instruments It is based on the fact that in an FT IR all the wavenumbers of light are detected at once Fourier Transform Calculation performed on an interferogram to turn it into an infrared spectrum Interferogram A plot of infrared detector response versus optical path difference The fundamental measurement obtained by an FT IR is an interferogram Interferograms are Fourier transformed to give infrared spectra Jacquinot or J Stop An aperture placed in the beam to restrict the divergence to the maximum compatible with the selected resolution When choosing lower resolution you can improve the S N by opening the stop Note that in many instances there is no physically separate stop but there will be some aperture be it the source size or the detector active area that acts as the system J stop MIR8035 SP01 Series Mo
42. be contacted and notified of the final cost to repair or replace the item If the decision is made to not proceed with the repair only the evaluation fee will be billed If authorization to perform the repair or provide a replacement is obtained the evaluation fee will be applied to the final cost A revised purchase order must be submitted for the final cost lf paying by credit card written authorization must be provided that will allow the full repair cost to be charged to the card 22 5 WARRANTY REPAIR If there are any defects in material or workmanship or a failure to meet specifications notify Oriel Instruments promptly prior to the expiration of the warranty Except as otherwise expressly stated in Oriel s quote or in the current operating manual or other written guarantee for any of the Products Oriel warrants that for the period of time set forth below with respect to each Product or component type the Warranty Period the Products sold hereunder will be free from defects in material and workmanship and will conform to the applicable specifications under normal use and service when correctly installed and maintained Oriel shall repair or replace at Oriel s sole option any defective or nonconforming Product or part thereof which is returned at Buyer s expense to Oriel facility provided that Buyer notifies Oriel in writing prompily after discovery of the defect or nonconformity and within the Warranty Period Products may only b
43. bolic Re lector sidad ii E 67 11 4 Intrared Fiber OPICO ales caida da NS 68 INFRARED LIGHT SQURCE SS td Ad a 69 124 OTA Lamp Replacement cnc doi cd 72 122 SIG Emite Replacement da 73 PROGRAMMING ao 75 13 1 Programming with the MIR MIR8035 ActiveX FTS_AX OCX oooocccccccnooccccncccnnnnnannccnnnnnnnns 75 13 1 1 MIRSOS5ACUVEX MEDIAS esla iod 75 13 MIRSO3SS AGUVCA Properties ui ala 76 TROUBLESHOOTING ut A ane eae eee eee 77 141 Beamsplitter Alimenta incitar lsi raidind 77 TAZ Phase ACIS HVS A ieee Ratatat ela lel A Setmedaesaniedntegidanliestast 77 14 3 ZPD Optical Sensor Real Me bursatil 78 144 GaN COMM OlAGIUSIM CMs ci aa a E a 80 TAS 22D AJUSTEN rita lo laredo 81 LASER GAFE FY INTEREOCK SWITCH 82 WINDOW REPLACEMENT xa ll 83 SPECIFIC ATIO NS o ee ado 84 REPLACEMENT PART Siiran s ete SO 89 DECLARATION OF CONFORMITY oia 90 Appendix A FT IR Technical DISCUSSION cccccccseeeeeeeeeeeeeceeeeeeeseeeeeseeueeessaeeeeesaeeesseaueeessneeeeeas 91 20 1 Why is There a Shorter Wavelength Limit for FT IR Spectral Analyzers o o o 91 20 2 Relationship between Resolution and Divergence ccccooccncccnnccncononcncccnncnnonnanoncnnoncnnnnoncnnnonas 94 20 3 External FT IR Optics General ConsideratiONS cccccccconcconccononcnnncnnnancnnncnnnancnnnonnnanennnnss 97 20 4 External FT IR Optics Detector OPtiCS cccccccccooccnnccnnncccconononcnnnnnonononanncnnnnnononnonanennnons 100 20 5 External FT IR O
44. ccccoonccnccccconccnnccnnnnconnnnnnoncnnnnnnnnncnnnnnnnnncnnnnnonannnnnononanenns 32 PIQUFE 31S Installing Is tU Mentira dci rca dia 32 Figure 32 Instrument Driver Installation Complete ooncccccccncncoconcnnoconcnnconanoncononcnnnnoncnnconannnnonanennnnaneos 33 Figure 33 Update Driver SOmWal 6 sssrin aaae a TE ts 33 Figure 34 Browse for Driver Software sita ia dmeneedieouendadeneidavins 34 FIQUIe 39 Piek rom a LIS tOr DAVOS acacia a a a a caida 34 Fig re 36 Have DISK kesene a E a 35 Figure 37 Selecting Ni ENC sacra rr anea Ea E ER 35 Fig re OO MIRMat 1G Ol emana a a a eE aA AE 36 Fiqure 39 MIR Mat SOMWAare usina ts 36 Fig re 40 IVIFIVIAT VV INGOWS sonrisa A das 37 FIQUIC 41 Setting Resol ION cra atar 38 FIGUuie 42 gt oeng Velo Marin oa 39 Figure 43 Setting Ov rsampling tii iia is 40 Figure 44 Enabling Encoder Mode ccccsssscccccccssseeeccceeseeeccceausececceseueeeccsseuseeeesseaugeeeesssaseseessaagaeeees 41 Figure 45 Interferogram and Spectrum Display ooooccncccccocccnncncnnoconncnonancnnnonnnnnnnnnnnnnnnrnnnnnnnannrnnnnnnnnnons 42 Figure 46 Time Domain Spectral Data Viewer occooonncccconnnnccnoncncononenncnnncnnonnannnnnnnncnnnnonconcnnnrnnonanennnnanens 44 Figure 47 Frequency Domain Spectral Data Viewer oonccccccnncncoccncnnoconcnnonnanononnnnennononcnnonnnnnnnonanennnnaneos 45 Figure 48 Data Stored in Memory OtaCk ccccccconnccnncccconccnncnononncnnononnnnnnnnonnnnnnnnnnnnnnnnn
45. da a celadeda 46 12 SPV MENU BAR FUNCTION Sodi arios 47 aio MATA MENU DERIN TON Sesa o atea 48 714 SPECTRAL CALCULATOR Sta cates deptskerounacids tests tuawananes a Aara A Sanur 49 7 15 PEOTTING FROM SVG WINDOW uta e id wen 49 7 16 LOADING A FILE FROM SVG WINDOW 0 occ cceccecccecceceeeeceeceeeceeeaeeceeeaeeceeeaeeeeeeaeeneees 50 8 OPENING SAVING AND PLOTTING DATA vA oe cccceeceecceeccecceeececceeececceeeneeceeeneecaeeneeeaeeaeesesaeeseeaeeens 51 8 1 PLOT WINDOW MENU BAR FUNG TIONS ousirscatn aia ais 51 11 12 13 14 15 16 17 18 19 20 21 MIR8035 SP01 Series Modular FT IR Spectrometers Page 3 8 2 OPENING A RIE ra lo 52 83 SAVING AND EXPOR TIN Eisspsaisa cele ent ae esr a ee ee eed 52 8 4 ZOOMING IN OUT AUTO SGALING PLO Tsunade 52 85 SD cot GE 1 reer ee ec iia 52 85 GRIDAND AXIS SETTINGS cuise cee te ne ee 53 67 HCE AR ING PO WS eigesseiec eas eerste tar atc cadablnd as octane a N 54 Ss ame ey ll al Dns eee e e eae 54 8 9 ADVANCED PELOT EDITING id 57 PURGING THE OG AININE R traido 58 DETECTIONS YSTEMS e364 cise teehee ken ata hee acne 59 190 SUICON Detecta e ad ron emer eee 61 102 INGAAS DOECO a it 61 103 RAGAZA Te Detecta dl iets 62 104 DITOS De crac tai olas 63 CA WINS alo AAA e oo mane a a a asmeelutnm i usecaenoieee 63 10 METIDA olor o epee ee ean 64 FTRAGGES SO Plies uu o ds li NR 65 a FIDE OU SS E E leds 65 tise ACCESSOFY GoOMpParmMeRta ai ads 66 dito OIRAXS Para
46. dular FT IR Spectrometers Page 112 Jacquinot Advantage This is the throughput advantage of FT IRs over traditional spectrometers that require a slit aperture The advantage varies as wavenumber and depends on resolution because of slit width changes In practice any advantage will also depend on source dimensions Mirror Displacement The distance that the mirror in an interferometer has moved from zero path difference Normalized The process of dividing all the absorbance values in a spectrum by the largest absorbance value This resets the Y axis scale from 0 to 1 Nyquist Frequency A term widely used in information theory but here applies to the highest frequency shortest wavelength that can be identified in an interferogram It is the one for which there are exactly two points per cycle The contribution of any higher frequency signal or noise can be represented by some lower frequency and so will appear aliased or folded into the spectrum Optical Distance Physical distance multiplied by the index of refraction of the medium Optical Path Difference The difference in optical distance that two light beams travel in an interferometer Phase Correction A software procedure to compensate for not taking a data point exactly at ZOPD and for frequency dependent variations caused by the beam splitter and signal amplification The Mertz and Forman corrections are both used with the Mertz applied to double sided interferograms this i
47. e Peak to Peak 0 10 0 10 parabolic reflector parabolic reflector 47 to 63 Hz 47 to 63 Hz Fiber Couplers Optional Connection Type s SMA ST 11mm ferrule i Gold coated off axis Gold coated off axis Optics i parabolic reflector parabolic reflector X Y Adjust 80033 requires fiber connection adapter ordered separately 80033 Fiber Coupler Adapters Optional Model Type 80043 11 mm ferrule MIR8035 SP01 Series Modular FT IR Spectrometers Page 88 Accessory Compartment Optional 1 5 inch series flange Gold coated reflectors Off Axis Parabolic Reflectors Optional 80120 l 5 5 inch 7 28 inch 0 8 inch nec Ie FOCALEGNOMI 139 7 mm 185 0 mm 120 3 mm Infrared Fiber Optic Cables Optional Chalcogenide Glass 5 000 to 1 666 cm 80060 pat ae e 034 inch 860 um 5 ft 1 5 m 76905 a Glas a ie a 010 inch 250 um 3 ft 1 0 m r a 76906 ae ARSS a co 016 inch 400 um 3 ft 1 0 m Note All fibers listed above are terminated with SMA connections MIR8035 SP01 Series Modular FT IR Spectrometers Page 89 18 REPLACEMENT PARTS If there is a need to purchase a replacement shipping container beam splitter alignment tool s laser alignment kit or other items not listed below please contact Oriel Instruments or local sales representative Please note that if it is desired to refit the scanner from KBr to CaF2 or visa versa both the beam splitter and windows must be replaced Replace
48. e F by decreasing the effective source size this reduces the spot size on the detector in FT IR jargon use a Jacquinot stop This method will be further discussed in Section 20 5 One needs to be careful in extending the model above A question which is sometimes asked what if we use a 0 5 mm diameter detector which corresponds to 0 25 cm resolution at 5000 cm Will we get this kind of resolution The answer is no The length of the scan of the moving mirror allows you to get 0 5 cm at best With proper optical arrangements you can approach this limit but you can never surpass it The same is true for all other resolution settings of the interferometer MIR8035 SP01 Series Modular FT IR Spectrometers Page 101 20 5 External FT IR Optics Source Optics Ideally the source with its optics should present a beam with etendue equal to the required etendue of the interferometer We have seen that the etendue of the instrument is limited by the desired resolution or detector size and optics The source tendue is determined by the source size and the source optics the product of the source area and the solid angle subtended by the input at the source center Gs AsQ input Usually as the source has a larger diameter than the detector using short focal length optics it delivers a more divergent beam to the interferometer than is necessary for the given resolution In this case the detector is the one which really sets the system te
49. e of an off axis reflector cccooocccoconncoconnnconnncnononos 107 Energy distribution in the focal plane of CaF o IONS ooocccccccnocccnncnononcconononanccnnononanccnncnnnancnnnnns 108 MIR8035 SP01 Series Modular FT IR Spectrometers Page 8 1 GENERAL INFORMATION Thank you for your purchase of this FT IR system from Oriel Instruments Please carefully read the following important safety precautions prior to unpacking and operating this equipment In addition please refer to the complete User s Manual for additional important notes and cautionary statements regarding the use and operation of the system Do not attempt to operate the system without reading all the information provided with each of the components 1 1 SYMBOLS AND DEFINITIONS WARNING Situation has the potential to cause bodily harm or death CAUTION Situation has the potential to cause damage to property or equipment ELECTRICAL SHOCK Hazard arising from dangerous voltage Any mishandling could result in irreparable damage to the equipment and personal injury or death EUROPEAN UNION CE MARK The presence of the CE Mark on Newport Corporation equipment means that it has been designed tested and certified as complying i with all applicable European Union CE regulations and recommendations Please read all instructions that were provided prior to operation of the system If there are any questions please contact Oriel Instruments or the r
50. e returned by Buyer when accompanied by a return material authorization number RMA number issued by Oriel with freight prepaid by Buyer Oriel shall not be responsible for any damage occurring in transit or obligated to accept Products returned for warranty repair without an RMA number Buyer bears all risk of loss or damage to the Products until delivery at Oriel s facility Oriel shall pay for shipment back to Buyer for Products repaired under warranty WARRANTY PERIOD All Products except consumables such as lamps filters etc described here are warranted for a period of twelve 12 months from the date of shipment or 3000 hours of operation whichever comes first Lamps gratings optical filters and other consumables spare parts whether sold as separate Products or constituting components of other Products are warranted for a period of ninety 90 days from the date of shipment WARRANTY EXCLUSIONS The above warranty does not apply to Products which are a repaired modified or altered by any party other than Oriel b used in conjunction with equipment not provided or authorized by Oriel c subjected to unusual physical thermal or electrical stress improper installation misuse abuse accident or negligence in use storage transportation or handling alteration or tampering or d considered a consumable item or an item requiring repair or replacement due to normal wear and tear MIR8035 SP01 Series Modular FT IR Sp
51. ectrometers Page 117 DISCLAIMER OF WARRANTIES EXCLUSIVE REMEDY THE FOREGOING WARRANTY IS EXCLUSIVE AND IN LIEU OF ALL OTHER WARRANTIES EXCEPT AS EXPRESSLY PROVIDED HEREIN ORIEL MAKES NO WARRANTIES EITHER EXPRESS OR IMPLIED EITHER IN FACT OR BY OPERATION OF LAW STATUTORY OR OTHERWISE REGARDING THE PRODUCTS SOFTWARE OR SERVICES NEWPORT EXPRESSLY DISCLAIMS ANY IMPLIED WARRANTIES OF MERCHANTABILITY OR FITNESS FOR A PARTICULAR PURPOSE FOR THE PRODUCTS SOFTWARE OR SERVICES THE OBLIGATIONS OF ORIEL SET FORTH IN THIS SECTION SHALL BE ORIEL S SOLE LIABILITY AND BUYER S SOLE REMEDY FOR BREACH OF THE FOREGOING WARRANTY Representations and warranties made by any person including distributors dealers and representatives of Oriel Newport Corporation which are inconsistent or in conflict with the terms of this warranty shall not be binding on Oriel unless reduced to writing and approved by an expressly an authorized officer of Newport 22 6 LOANER DEMO MATERIAL Persons receiving goods for demonstrations or temporary use or in any manner in which title is not transferred from Newport shall assume full responsibility for any and all damage while in their care custody and control If damage occurs unrelated to the proper and warranted use and performance of the goods recipient of the goods accepts full responsibility for restoring the goods to their original condition upon delivery and for assuming all costs and charges Confidentiality
52. ed TE cooled detectors in light blue and liquid nitrogen cooled detectors in dark blue MIR8035 SPO01 Series Modular FT IR Spectrometers 80019 Si 80020 InGaAs 6 6 5 0 168 127 2 8 41 MOUNTING HOLE 1 5 INCH SERIES FEMALE FLANGE 80021 InSb g 1 5 INCH SERIES FEMALE FLANGE 80026 MCT 5 7 o N e i 9 3 236 1 5 INCH NS SERIES 19 FEMALE FLANGE TYP Figure 66 Detector Dimensions Page 60 MIR8035 SP01 Series Modular FT IR Spectrometers Page 61 hb CHASSIS GND ANALOG GND ANALOG GND SIGNAL INPUT 15V SIGNAL REF INP UT ANALOG GND ANALOG GND 15V ao O A O O N N O Figure 67 Detector Connector Pinouts The FT IR scanner provides power the detectors amplifiers in most cases so that only one connection cable is required The TE cooled detectors are powered from their cooler controllers For the TE cooled models connect the cooler controller to the detector and the signal cable from the FT IR scanner to the detector Connect the power cord to the TE cooler controller and turn it on If it is desired to use a detector not covered in this user s manual Figure 67 provides the pin assignments for the scanner s D sub connector 10 1 Silicon Detector The 80019 Silicon Detector exhibits excellent stability and sensitivity from 14 000 to 10 000 cm 0 7 to 1 um This model is a high speed low noise detector which o
53. ence using DTGS detector 2 88 inch 73 1 mm Optical Axis Height from bottom of base plate to center of aperture Oversampling must be set to 4x Without oversampling the spectral range lower limit is 1 4 um Throughput MIR8035 SP01 Series Modular FT IR Spectrometers Page 85 General p 419 x 300 x 203 mm Weight Scanner Relative Humidity Operation or Storage Cannot exceed 30 Coupling 1 5 inch series Oriel male flanges Data Acquisition Computer Interface USB 2 0 Hardware Internal 16 bit A D converter i with 250 kHz throughput 160 kHz to 20 kHz with 4x oversampling ds TEY 40 kHz to 5 kHz with no oversampling Filters 93 Hz low pass filter 5 kHz 80 kHz high pass filter 40 kHz MIRMat Selectable Units um nm cm MHz eV kcal mol kJ mol K Data Presentation Type Interferogram single beam transmittance Software Velocity resolution oversampling on off AE eile bidirectional data acquisition on off pati Fine adjustment of ZPD and peau aan delay of A D converter triggering signals Type of apodization zero fill parameters for phase FFT Parameter Settings yP p e T end io p alcuisione Addition subtraction multiplication division Log io Square Root Invert Negate Absolute Microsoft Active X control allows applications to be built using Visual Basic Visual C MATLAB LabVIEW or other Microsoft applications compatible with Active X technology Software Development
54. end Apodization Boxcar Hanning Triangular Blackman Hamming When selecting any of the FFT choices the bottom of the screen will show Magnitude Spectrum and AutoScale can be enabled DIFF indicates a first order difference is applied At least one location of the Memory Stack need to be filled prior to selecting Function A B The memory stack locations chosen do not necessarily have to be A and B If at least one location is filled the Spectral Calculator will appear Refer to 7 14 on using the Spectral Calculator MIR8035 SP01 Series Modular FT IR Spectrometers Page 48 7 13 MATH MENU DEFINITIONS DECIMATE Resample data at a lower rate after low pass filtering Y DECIMATE X R re samples the sequence in vector X at 1 R times the original sample rate The resulting re sampled vector Y is R times shorter LENGTH Y LENGTH X R DECIMATE filters the data with an eighth order Chebyshev Type low pass filter with cutoff frequency 8 Fs 2 R before re sampling DETREND Remove a linear trend from a vector usually for FFT processing Y DETREND X removes the best straight line fit linear trend from the data in vector X and returns it in vector Y If X is a matrix DETREND removes the trend from each column of the matrix DIFF Difference and approximate derivative DIFF X for a vector X is X 2 X 1 X 3 X 2 X n X n 1 FFT Discrete Fourier transform FF I X is the discrete Fourier transform DFT of vector X
55. ene 5 NUS AHA 4 m tad and using 4 Omax A0 6 max Equation 9 1000 gt y 10 000 MAXIMUM WAVENUMBER IN THE SPECTRUM Figure 102 MIR8035 Etendue vs Maximum Wavenumber at different resolutions Example The shortest wavelength we want to observe in the spectrum is 2 microns which is equivalent to 5000 cm The desired spectral resolution is 4 cm From Equation 9 we get Gintrt 2 mm rad 2 mm sr Equation 10 The following sections illustrate the need to carefully choose and arrange auxiliary optics for an interferometer If the desired resolution cannot be achieved it is most likely due to poor alignment wrongly chosen focal length of optics etc MIR8035 SP01 Series Modular FT IR Spectrometers Page 100 20 4 External FT IR Optics Detector Optics Now let us consider auxiliary optics first on the detector side Suppose that the allowed acceptance angle is filled fully with light Continuing the conditions cited in the example above we want to collect this light and squeeze it onto the smallest possible detector since typically smaller detectors have better noise characteristics To do this we will take a very fast lens with F 1 Then according to Equation 6 the solid angle at the focal spot will be Q4 0 79 sr Equation 11 At the same time the light we are dealing with is propagating through the interferometer and therefore Equation 8 is applicable to it Gintrt Ga Q4 A Equation 12
56. epresentative through whom the system was purchased MIR8035 SP01 Series Modular FT IR Spectrometers Page 9 1 2 GENERAL WARNINGS e Read all warnings and operating instructions for this system prior to setup and use e Do not use this equipment in or near water e To prevent damage to the equipment read the instructions in the equipment manual for proper input voltage e This equipment is grounded through the grounding conductor of the power cords e Route power cords and other cables so they are not likely to be damaged e Disconnect power before cleaning the equipment e Do not use liquid or aerosol cleaners use only a damp lint free cloth e Lock out all electrical power sources before servicing the equipment e To avoid explosion do not operate this equipment in an explosive atmosphere e Qualified service personnel should perform safety checks after any service e If this equipment is used in a manner not specified in this manual the protection provided by this equipment may be impaired e To prevent damage to equipment when replacing fuses locate and correct the problem that caused the fuse to blow before re applying power e Do not block ventilation openings e Do not position this product in such a manner that would make it difficult to disconnect the power cords e Use only the specified replacement parts e Follow precautions for static sensitive devices when handling this equipment e This product should only be
57. er technology and equipment Founded in 1969 Newport is a pioneering single source solutions provider of laser and photonics components to the leaders in scientific research life and health sciences photovoltaics microelectronics industrial manufacturing and homeland security markets Newport Corporation proudly serves customers across Canada Europe Asia and the United States through 9 international subsidiaries and 24 sales offices worldwide Every year the Newport Resource catalog is hailed as the premier sourcebook for those in need of advanced technology products and services It is available by mail request or through Newport s website The website is where one will find product updates interactive demonstrations specification charts and more To obtain information regarding sales technical support or factory service United States and Canadian customers should contact Oriel Instruments directly Oriel Instruments 150 Long Beach Boulevard Stratford CT 06615 USA Telephone 800 714 5393 toll free in United States 203 377 8282 Fax 203 378 2457 Sales oriel sales newport com Technical assistance oriel tech newport com Repair Service rma service newport com Customers outside of the United States must contact their regional representative for all sales technical support and service inquiries A list of worldwide representatives can be found on Oriel s website http www newport com oriel MIR8035 SP01 Series Modu
58. ere a Shorter Wavelength Limit for FT IR Spectral Analyzers To figure this out let us assume that we are using a collimated monochromatic light source with the FT IR spectrometer This light will produce an interferogram in the form of a sinusoid at the detector Our goal is to find the spectrum in this case to determine the wavelength of the incoming radiation We know that when the light intensity goes from one maximum of the interferogram to the next maximum the optical path difference between the two legs of the interferometer changes by exactly 1 wavelength of the incoming radiation DETECTOR SIGNAL OPTICAL PATH i DIFFERENCE i MIRROR POSITION Figure 95 Detector signal vs time mirror position and OPD vs time With this in mind we can measure the frequency f or period t 1 f of the interferogram with say an oscilloscope Then we can find the wavelength through the formula Ai Vo ti Vo fi Equation 1 Where Vo the speed of change of the optical path difference Vo is directly related to the speed of the scanning mirror For MIR8035 V is exactly four times the speed of the scanning mirror Vo 4V m MIR8035 SP01 Series Modular FT IR Spectrometers Page 92 There is however an important practical difficulty We need to maintain the velocity V constant at all time and we need to know what this velocity is with a high degree of accuracy An error in the velocity value will shift the wavelength
59. eries female output flange which allows the source to be coupled to a variety of items including Oriel FT Spectrometer products An off axis parabolic reflector is integrated into the design rather than a condenser lens IR refractive optics are expensive and have transmittance limitations Using this type of reflector provides several advantages Its gold coating enhances IR reflectance The focal point is displaced from the mechanical axis giving full access to the reflector focus area Each model produces a 34 5 mm 1 36 inch diameter collimated output beam with 1 divergence full angle A hose fitting is provided to purge the source with nitrogen if desired The 80007 includes a 24 watt SiC emitter and the 80009 includes a 20 watt QTH lamp Each model includes a stand alone power supply designed to minimize light ripple A 1 m 3 3 ft long cable connects the source to its power supply Figure 79 Infrared Light Source and Power Supply e Figure 80 Light Source Hose Barb for N Purge MIR8035 SP01 Series Modular FT IR Spectrometers Page 70 7 0 6 0 5 0 4 0 3 0 ARBITRARY UNITS 2 0 0 0 8000 0 7000 0 6000 0 5000 0 4000 0 3000 0 2000 0 1000 0350 0 Figure 81 80007 SiC Spectrum taken using 80350 Scanner and 80008 DTGS Detector N o o o o o 6 0 4 0 ARBITRARY UNITS 2 0 ise 0 14000 0 12000 0 10000 0 8000 0 6000 0 4000 0 2000 0 0 0 WAVENUMBERS cm Figure 82 8000
60. ers 11 4 Infrared Fiber Optic Cables Page 68 Infrared fibers are offered with two types of material Chalcogenide Glass CIR Fibers are used from 2 to 6 um Polycrystalline PIR Fibers function from 4 to 18 um All fibers are terminated with SMA connectors for ST or other fiber terminations contact a Sales Engineer The Chalcogenide Fibers are drawn in a core clad structure and use a double polymer coating They are characterized by low optical loss and high flexibility The jacket material is PVC Polycrystalline Fibers are extruded from pure AgCL AgBr solid solution crystals The core and cladding are the same material with a different ratio of AgCL and AgBr to create the different index of refraction required to keep the light from leaking through the fiber TRANSMITTANCE 100 p 90 80 FO 60 50 H 40 M 30 H 20 10 1 500 20 POLYCRYSTALLINE PIR FIBER 1000 1500 2000 2500 3000 3500 4000 WAVE NUMBER 5 4 10 6 7 3 3 2 8 2 5 MICRON Figure 78 Transmittance of PIR and CIR Fiber Optic Cables MIR8035 SP01 Series Modular FT IR Spectrometers Page 69 12 INFRARED LIGHT SOURCES The 80007 is a complete silicon carbide SiC infrared light source that provides a smooth continuum from 6 000 to 350 cm 1 1 7 to 28 um The 80009 i quartz tungsten halogen QTH infrared light source provides a smooth continuum from 14 000 to 2 800 cm 1 0 7 to 3 5 um Each model uses a 1 5 Inch S
61. es 93 Figure 97 Typical optical layout of external optics relative to a dispersive monochromatot 00 94 Figure 98 A finite source produces a fan of parallel beams inside an interferomete cccseeeeeeeeeees 95 Figure 99 Inte nerenco Pale Mina tensive E No Waders 96 Figure 100 Intensity distribution at the detector ccoooncccccconnncoconnnnoconcnnnnnanonconannncononcnnononnnnnnnannnnnnanos 96 Figure 101 Solid angles and conventional angles ccccccocnccnncccnnoncnncnononcnnncnonancnnnnnnnnnrnnnononanennnnnnnanenns 97 Figure 102 Figure 103 Figure 104 Figure 105 Figure 106 Figure 107 Figure 108 Figure 109 MIR8035 SP01 Series Modular FT IR Spectrometers Page 7 MIR8035 tendue vs Maximum Wavenumber at different resolutions oooccicninnc 99 Interferometer with Jacquinot StOP ccccccccccnnnnnccnnnccnncononocononcnnnonnnnncnnnnnonoonnnannnnnnnnnnonnnanrennss 101 Single and double sided interferograMS cccccccccoonnnnconnccnononononconononononanoncnnononnnnnnanncnnnncnnnnnnnos 103 Light from a point source placed at the focus of a parabolic reflector oo cconnnnnncccnnc 104 Section of an off axis Parabolic reflector oooonccnccccconcnoncnononcnnnononancnnnononnncnnnnnnnancnnonnnnns 105 Diameter of Focal Spot vs Angular DiVergenCe cooooocccncccnoncconccononcconcnonanccnnononanconcnonanncinnnos 106 Energy distribution in the focal plan
62. es are installed This option displays the Custom Selection dialog in which you can change the way features are installed Repair installation errors in the program This option fixes missing or corrupt files shortcuts and registry entries Remove Oriel MIRMAT 8025 from your computer lt Back G NEKE S Figure 23 Select Type of MIRMat Installation 19 Highlight Mir80350_Drivers_Active and click Next per Figure 24 MIR8035 SP01 Series Modular FT IR Spectrometers Page 28 Custom Setup Select the program features you want installed Click on an icon in the list below to change how a feature is installed Feature Description This feature requires OKB on your hard drive Figure 24 Select MIRMat Setup 20 Click Next to begin the installation process as shown in Figure 25 Ready to Modify the Program The wizard is ready to begin installation Click Install to begin the installation If you want to review or change any of your installation settings dick Back Click Cancel to exit the wizard InstallShield Figure 25 Run MIRMat Installer MIR8035 SP01 Series Modular FT IR Spectrometers Page 29 21 When the installation is complete the screen shown in Figure 16 will appear Click Finish InstallShield Wizard Completed The InstallShield Wizard has successfully installed Oriel MIRMAT 8025 Click Finish to exit the wizard Figure 26 MIRMat Installation Complete
63. evice unless you ve disabled this feature in your device installation settings gt Browse my computer for driver software Locate and install driver software manually Figure 34 Browse for Driver Software 6 Choose Let me pick from a list of device drivers on my computer Browse for driver software on your computer Search for driver software in this location gt Let me pick from a list of device drivers on my computer This list will show installed driver software compatible with the device and all driver software in the same category as the device Figure 35 Pick from a List of Drivers MIR8035 SP01 Series Modular FT IR Spectrometers Page 35 7 Choose Have disk Select the device driver you want to install for this hardware Select the manufacturer and model of your hardware device and then click Next If you have a T disk that contains the driver you want to install click Have Disk Show compatible hardware Model E Generic USB Hub El This driver is digitally signed Tell me why driver signing is important Figure 36 Have Disk 8 Browse to and select C windows vsespectra inf make sure that the correct drive is selected below Figure 37 Selecting inf File MIR8035 SP01 Series Modular FT IR Spectrometers Page 36 7 GETTING STARTED WITH MIRMAT 7 1 INITIAL HARDWARE CHECK The MIR8035 is designed to be a flexible modular system consisting of the scanner and various attach
64. gth is effectively halved So in this case Amin 633nm 2 2 633 nm In practice the FFT math runs into difficulties close to the theoretical limit That is why we say 1 4 um is the limiting wavelength without oversampling and 700 nm is the limiting wavelength with 4x oversampling It is possible to sample more or less frequently Higher frequency sampling allows you to measure to lower wavelengths Problems arise because alignment and motion fidelity become more critical and the number of interferogram points require higher computational speed and more storage Lower frequency sampling i e sampling at every kth cycle of the reference interferogram instead of every cycle was more popular when memory and computational speed were a problem since if appropriate anti aliasing steps are taken undersampling can be regarded as data compression MIR8035SPO01 Series Modular FT IR Spectrometers Page 94 20 2 Relationship between Resolution and Divergence The FT IR principle of operation is very different from typical dispersive instruments Many aspects of this relatively new approach are counter intuitive to those of us accustomed to dispersive techniques starting of course with the wavenumber units that go the wrong way a DISPERSIVE SPECTRAL INSTRUMENT 2f E SOURC y DETECTOR INPUT OUTPUT OPTICS OPTICS SLIT SLIT FTIR b SPECTRAL INSTRUMENT i a SOURCE OPTICS AOUTPUT OPTICS DETECTOR I FOCAL LE
65. h other Since the amplitudes of waves are additive the two waves will add together to give a resultant wave which is more intense than either of the individual waves Destructive Interference A phenomenon that occurs when two waves occupy the same space Since the amplitudes of waves are additive if the two waves are out of phase with each other the resultant wave will be less intense than either of the individual waves Diffuse Reflectance The phenomenon that takes place when infrared radiation reflects off a rough surface The light is transmitted absorbed scattered and reflected by the surface The light approaches the surface from one direction but the diffusely reflected light leaves the surface in all directions A reflectance sampling technique known as DRIFTS is based on this phenomenon Dispersive Instruments Infrared spectrometers that use a grating or prism to disperse infrared radiation into its component wavenumbers before detecting the radiation This type of instrument was dominant before the development of FT IR DTGS Deuterated tri glycine sulfate pyroelectric detectors are the most common detectors used in FT IR instruments They are chosen for their ease of use good sensitivity wide spectral responsivity and excellent linearity Duplicate Range For an interferogram it is the ratio of the large centerburst signal at ZOPD to the smallest recorded signal which must be greater than the noise for any benefit from signal
66. he computer s CD ROM drive Open the contents of the CD File Edit View Tools Help Organize v Eject Burn to disc Properties System properties Li Favorites 4 Hard Disk Drives 1 Local Disk C A Libraries 124 GB free of 232 GB E Computer 4 Devices with Removable Storage 1 4 DVD RW Drive D 040628_1655 Cu Network a SSH 659 MB free of 702 MB DVD RW Drive D 040628_1655 Space used ll CD Drive Space free 659 MB gs Figure 10 Active X CD 2 Right click the setup exe application and choose Properties per Figure 11 Check the box to install the software in compatibility mode and ensure Windows XP Service Pack 3 is selected Check the box to run as administrator and then click OK 3 Run the setup exe application es Computer DVD RW Drive 0 040674 1655 Ple Edi Wee Toss Hp Fle Edt View Took Help m x setup exe Properties rganne Bum de doe Le i 7 Organize Burn te dise y Genera Competbity Detsis E Favoitie Narre Enable Daab Depla Sgnatuec loom Tps WW Feromes If you hawe problems seth tus program and it worked comrecdy a Files Curro D Re miro s Piles Currently on Y en an carter version of Windows select the compatib ty mode A Libremes Ji pant Iroubledst compitihiiity A Libtares A tl quo q carter version Ji popim Raa wih grephecs processor k m program fies Comenthaty oun jE Comput E Computer gt K E I de hemi Ol Sean be three de
67. hroughput which stays constant through all optical transformations G A Q const Equation 8 Note that in Figure 99 the area A is that of the source or detector The relevance of this is that every optical system has something that sets or limits the value of G Knowing what part that is and improving it as best as possible is fruitful Working to increase the G value for another part of the system is a waste of time but a very common waste of time In what follows we consider the tendue of the MIR8035 It s important to not confuse the resolution restrictions on tendue the output or detector etendue and the source side tendue In general we like to start by knowing what the largest tendue we can tolerate to get the resolution we need If the tendue of the instrument including source and detector is larger than this then we have to lower the system value to ensure we get the resolution Let s determine the resolution limit on tendue for the MIR8035 We know that it has an aperture of 1 25 inches 31 75 mm We can also find a maximum allowed divergence angle of a beam propagating through it according to a maximum wave number in a spectrum and required resolution formula from Equation 4 From this we can find the maximum solid angle of the fan of rays making use of Equation 7 Q max na max Thus we will find the tendue of the interferometer MIR8035 SP01 Series Modular FT IR Spectrometers Page 99 Gr
68. ible sampling products A 4 inch long spacer tube is provided for connection to the Scanner This allows for easy access to the hose barb used for nitrogen purging if desired Additionally an extension cable is provided to connect the detector to the Scanner 15__y 1 5 INCH SERIES 1 5 INCH SERIES 38 QUICK CONNECT MALE FLANGE FEMALE FLANGE 2 0 S 7 38 187 404 102 A 0 38 9 6 11 0 446 279 Figure 76 80070 Accessory Compartment Dimensions MIR8035 SP01 Series Modular FT IR Spectrometers Page 67 11 3 Off Axis Parabolic Reflectors Oriel Instruments offers parabolic reflectors with a gold coating that enhances IR reflectance Off axis parabolic reflectors collect radiation from a source at its focal point and reflect it as a collimated beam parallel to the axis Alternatively they can tightly focus a collimated beam at its focus The focal point is off the mechanical axis giving full access to the reflector focus area There are no shadowing problems if a detector fiber or source is placed at the focus Off axis parabolic reflectors provide very efficient radiation control since focus or collection is over very large solid angles This makes them particularly useful for lower power incoherent light sources Refer to the Specifications contained in this user s manual for more information Figure 77 Various Off Axis Parabolic Reflectors MIR8035 SPO01 Series Modular FT IR Spectromet
69. ical connections prior to powering up the Scanner If using a detector which requires liquid nitrogen ensure the Dewar is filled before operating Thermoelectric coolers come with a controller which indicates when the detector has reached its temperature set point Oriel FT IR Detectors Spectral Range vs Specific Detectivity Wavelength cm 6 000 3 000 1 500 1 000 800 600 500 A s0019 si 80020 InGaAs DIA 80021 insb liquid nitrogen cooled AAA 80026 Mt liquid nitrogen cooled Typical Detectivity D 80015 80016 HgCdZnTe TE cooled 80009 OTH Source Spectral Range 80351 CaF Scanner Spectral Range 80007 SiCSource Spectral Range E_ _ __ _ gt __ _ _ _ _ _ _ _ _ _ _ _ _ _ _ ______ _ 80350 KBr Scanner Spectral Range ee 0 1 2 3 4 5 6 7 g 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 Wavelength um Figure 65 Typical D Values for FT IR Detectors The graph above notes the typical values obtained of the specific detectivity D for various Oriel detectors designed to work with the FT IR scanner Typical D values were obtained with true RMS meter Blackbody radiation was modulated with a mechanical chopper and the bare detector element was irradiated by a known radiation flux originating from a blackbody at 1273K no optics were used Room temperature detectors are shown in r
70. ile an F 1 lens collects 0 79 sr This collection concept leads to many problems when we talk about our F 1 vs F 1 5 etc condensers If a point source such as a small arc emits isotropically then the simple geometrical comparison would give us the ability to compare by calculation Our sources are not isotropic emitters even the arcs are not point sources and one can immediately see that the flat tungsten filaments are Lambertian rather than isotropic emitters We have made measurements for arcs and base our conversion factors on these We also oversimplify in not providing measured factors for each arc and for QTH lamps and we also neglect to give the exact F for our condensers In the more familiar two dimensional picture we use the divergence angle related to the solid angle by o Q n radians Equation 7 The product of solid angle and area of an image at a plane where the solid angle originates is called by various names optical extent geometrical extent or etendue Often the term throughput is used instead of etendue and am sure we do so somewhere in this material The latter refers only to the spatial properties of the instrument beam Throughput includes this and the reflectance and transmittance of the optics of the system Etendue determines the radiation capacity of an optical system The fundamental law of optics mentioned above states that any optical system can be characterized by an optical extent etendue t
71. ions between two portions of the beam in the interferometer The further the scanning mirror is traveling the longer the interferogram and the higher the spectral resolution that can be achieved In real life point sources as well as purely parallel beams do not exist A finite size source produces a fan of parallel beams inside the interferometer A marginal beam 2 2 of this fan is shown in Figure 98 INTERFEROMETER INPUT p f SOURCE OUTPUT LENS AN DETECTOR LL Da Figure 98 A finite source produces a fan of parallel beams inside an interferometer This beam will be focused at some distance from the center of the detector To be exact it will be focused into a ring if the source has a round shape Now the simple picture we had before becomes much more complex since interference conditions will be different for the beams 1 1 and 2 2 At the zero optical path difference ZOPD both beams 1 1 and 2 2 are at constructive interference conditions and the whole detector will sense a high level of intensity But while the scanning mirror moves away from the ZOPD position the next condition of constructive interference will happen sooner for beam 2 2 than for beam 1 1 As a result of that different parts of the detector will see different phases of the interference pattern a maximum in the center will be surrounded by a ring of minimum intensity then a ring at maximum intensity again etc MIR8035SPO01 Series
72. lar FT IR Spectrometers Page 115 22 2 REQUEST FOR ASSISTANCE SERVICE Please have the following information available when requesting assistance or service Contact information for the owner of the product Instrument model number located on the product label Product serial number and date of manufacture located on the product label Description of the problem To help Oriel s Technical Support Representatives diagnose the problem please note the following Is the system used for manufacturing or research and development What was the state of the system right before the problem Had this problem occurred before If so when and how frequently Can the system continue to operate with this problem or is it non operational Were there any differences in the application or environment before the problem occurred 22 3 REPAIR SERVICE This section contains information regarding factory service for this product The user should not attempt any maintenance or service of the system beyond the procedures outlined in this manual This product contains no user serviceable parts other than what is noted in this manual Any problem that cannot be resolved should be referred to Oriel Instruments If the instrument needs to be returned for service a Return Material Authorization RMA number must be obtained prior to shipment to Oriel Instruments This RMA number must appear on both the shipping container and the package documents Ret
73. le of the data being displayed The Auto Y icon can be used to restore the view of the data if it is off the chart area Limit fields are present for both the x and y axes The upper limit must be greater than the lower limit or else an error message will appear in a separate window Click the Continue button in the error window to correct the limits Clicking Quit exits the application Below the main display screen is a preview display with two vertical bars These bars define the x axis of the main display Click and drag the bars to see the change in the x axis This area is used to zoom in on a specific area or pan over a large area MIR8035SPO01 Series Modular FT IR Spectrometers Page 46 7 10 MEMORY STACK The Memory Stack pulldown menu in the Spectral Viewer is used to store up to six 6 interferograms and spectra in temporary memory Data that is stored in the memory stack can be recalled and mathematically manipulated in the MIRMat software The memory stack locations are referred to as A through F To store the data click the down arrow and then click on any letter from the Mem Stack field Using a location containing previously saved data will overwrite that data When the data is stored successfully the popup window in Figure 48 appears briefly The status of the memory stack is displayed in the lower left corner of the Spectral Viewer window refer to Figure 49 Letters appearing in black text indicate data is stored in that
74. location Clicking the Reset button clears the entire memory stack The memory stack is not the same as permanently saving the data on the computer s hard drive or other media it temporarily stores data When exiting the MIRMat software or closing the SPV window the data stored in the memory stack is erased Refer to 8 for information on saving data Data from the current window pushed to the stack Figure 48 Data Stored in Memory Stack gt E a A Figure 49 Data Stored in Locations A B C and F 7 11 CURSOR A cursor feature is present in the time domain SPV Click the checkbox to enable it By placing the cursor in the scan window the values of the x and y axes are displayed Uncheck the box to remove the cursor from the screen MIR8035 SP01 Series Modular FT IR Spectrometers Page 47 7 12 SPV MENU BAR FUNCTIONS The menu bar pull down menus are found at the top of the main display window File Close Print Printing saves a screen capture of the SPV window Close exits the SPV but not the entire application Tools Zoom In Zoom in by clicking in the graph windows Use the mouse to window around an area of interest on the graph when zooming in Math Function A B FFT 1x oversampled interf 2x oversampled interf 4x oversampled interf Default from Instrument Decimate Decimation by 2 Decimation by 4 Decimation by 8 Semilog Y changes to Linear Y when selected DIFF Normalize Detr
75. m splitter material distortion in the detector and signal circuitry etc that gives rise to phase shifts between the ideally equi phased sinusoids To get the real spectrum from the interferogram requires some phase correction for the interferogram This is done by using a phase correction algorithm and the one used in the MIR8035 is the popular Mertz phase correction algorithm The MIR8035 uses double sided interferograms relying on the retro reflectors and robust scan construction MIR8035SPO01 Series Modular FT IR Spectrometers Page 104 20 6 External FT IR Optics Off Axis Parabolic Reflectors Practically all FT IR instruments use off axis parabolic reflectors for collimating and focusing light external to the interferometer An off axis parabolic reflector is a segment of a full parabolic reflector These gold coated mirrors are very broadband from 0 7 to 10 microns they reflect more than 98 and it stays in this range up to 25 microns Bear in mind that for wavelengths shorter than 0 6 micron gold is a bad reflector its reflectivity drops abruptly to less than 40 An important feature of reflectors in general is that they do not have any dispersion there is no chromatic aberration so the focal spot stays at the same place for any wavelength They do have monochromatic aberrations Parabolic reflectors are devices ideally suited for collimating light from small sources and conversely for tightly focusing collimated beams of radi
76. ment Parts 8000 Beamsplitter KBr 80005 Beamsplitter CaF gt 80010 Windows KBr set of 2 with gaskets 80011 Windows Car set of 2 with gaskets 80030 SiC Emitter 24 W 6319 QTH Lamp 20 W MIR8035SPO01 Series Modular FT IR Spectrometers Page 90 19 DECLARATION OF CONFORMITY EC DECLARATION OF CONFORMITY Manufacturer s name Manufacturer s address Declares that the product Product Name Model Numbers Type of equipment Newport Corporation 150 Long Beach Boulevard Stratford CT 06615 USA ORIEL FT IR Spectrometers 80350SP01 80351SP01 Electrical equipment for measurement control and laboratory use in industrial locations conforms to the following Product Specifications Safety EMC complies with the following Directives and accordingly carries the marg mark affixed a a ms ae AA a Domenic Assalone Site Manager Oriel Products Division 150 Long Beach Boulevard Stratford CT 06615 USA EN 61010 1 2010 EN 61326 1 2006 cor 2008 cor 2010 2004 108 EC EMC Directive 2006 95 EC Low Voltage Directive Beaune May 19 2011 Bruno Rety Authorized to compile technical documentation Group Director PPT Instrument and Motion Europe Micro Controle Division of Newport Corporation Zone Industrielle 45340 Beaune la Rolande France MIR8035SPO01 Series Modular FT IR Spectrometers Page 91 20 Appendix A FT IR Technical Discussion 20 1 Why is Th
77. ments such as IR sources detectors etc The user s manual describes the basic operation of the system and its software Turn on the power switch of the scanner and other accessories Click on the MIRMat icon in the Start Menu to open the software Once the software recognizes the instrument the scanner shall operate in Laser Mode If the scanner has completely stopped refer to Section 14 1 for the beamsplitter alignment procedure Check the signal values and phase on the scanner s LCD Both A and B signal readings must be above 25 with a difference of less than 5 The phase must be 88 to 92 If the values displayed on the LCD after a 30 minute scanner warm up do not meet the above criteria refer to Section 14 1 for the beamsplitter alignment procedure and or Section 14 2 for phase adjustment Click on the MIRMat icon in the Start Menu to open the software par 4 Spectra Physics Figure 39 MIRMat Software MIR8035 SP01 Series Modular FT IR Spectrometers Page 37 7 2 SOFTWARE WINDOWS Two windows will open in the MIRMat software as shown in Figure 40 The FITS AX Container Active X window is shown on the right FTS AX container Vpp 0 0901 79 V Active X Window Su Main Data Display Window Ja r x al AA a A al AAA A a T e TE K a5 200 re 0 3 a 200 600 AL LEIA i F w IE i d AN es 4 hy j n l Aonga ga a nan ngn iiiar 000 a ii 100i T
78. mes the throughput of the monochromator The efficiency of the monochromator may be two to three times that of the FT IR near blaze leaving the FT IR advantage at 20 30 MIR8035SPO01 Series Modular FT IR Spectrometers Page 103 Consider a small source area A with spectral radiance of l at o and let s assume the source is an isotropic emitter The total power is then 4T1A at o watts per wavenumber The spectral power collected at the input is Lo lsAsQinput lo Ginput W Hz For a matched system with detector tendue equal to that of the input the detected power will be given by Ba 0 1 G W Hz where G Ginput Goutput FT IR instruments use basically two methods of scanning In one of these the path length for the two beams is equal when the scanning mirror is in the middle of its mechanical scan range The ZOPD occurs in the center of the scan The interferograms are termed double sided or single sided accordingly laj AMAN da a RAMAAR AMA sali Y Y MAMANI Po PAU URI rent per ANNA ATA AL PU L at SINGLE SIDED DOUBLE SIDED INTERFEROGRAM INTERFEROGRAM Figure 104 Single and double sided interferograms The ideal double sided interferogram is perfectly symmetrical so the full information is available from either side and one side appears redundant Actual interferograms have some degree of asymmetry This is due to such factors as beam divergence over the scan path dispersion of the bea
79. n View Help s gt 3 Batteries JE Computer EY Credential Vault Device gt a Disk drives gt AE Display adapters gt DVD CD ROM drives 35 Human Interface Device gt P Imaging devices r gt EX Jungo gt En Keyboards A Mice and other pointin gt 4 Modems A Monitors E Network adapters a F Other devices al Ji VSE SPECTRA gt 40 Portable Devices gt TF Ports COM amp LPT a Processors EslolBalB le ler Update Driver Software Disable Uninstall Scan for hardware changes Properties Figure 27 Updating Driver in Windows 7 MIR8035 SP01 Series Modular FT IR Spectrometers Page 31 4 Ifthe screen appears as shown in Figure 28 select the option labeled Yes this time only Click Next to proceed Found New Hardware Wizard Welcome to the Found New Hardware Wizard Windows will search for current and updated software by looking on pour computer on the hardware installation CD or on the Windows Update Web site with your permission Read our privacy policy Can Windows connect to Windows Update to search for sofware Yes this time only i Yes now and every time connect a device O No not this time Click Next to continue Figure 28 Found New Hardware Wizard 5 Check the option labeled Install the software automatically Recommended as shown in Figure 29 Click Next to proceed Found New Hardware Wizard
80. n operating systems Windows Script Host x ERROR No USB 2 0 Hub required for FTS 80250 has been found Figure 17 Active X Communication MIR8035 SP01 Series Modular FT IR Spectrometers Page 24 10 WINDOWS 7 USERS ONLY Copy the following files shown in Figure 18 from the CD to the computer s desktop mfc70 dll mfc7Ou dll msvcr70 dll x CN MEN i gt Computer gt DVD RW Drive D 0406281655 z Ye 3 tems selected Dair er 1 5 2002 3 37 AM Me created 1 5 2002 3237 AM e 217 MB Figure 18 Copy dll Files 11 Remove the CD from the computer s CD ROM drive place it back into its case and store in a safe location 12 Continue to Section 5 to install the MIRMat software MIR8035 SP01 Series Modular FT IR Spectrometers Page 25 5 MIRMAT SOFTWARE INSTALLATION 9 1 9 2 COMPUTER PRIVILEGES The individual performing the installation must have administrator privileges for the computer When installing onto a Windows 7 computer the installation must be run in compatibility mode for Windows XP Service Pack 3 MIRMAT SOFTWARE INSTALLATION PROCEDURE This section will guide the user through the software installation process Please note that the Figures shown are based upon an installation performed using a Windows XP operating system Do not connect the USB cable to the computer until directed to do so in a later section of this manual 13 Insert the MIRMat software CD into the compu
81. ncnnnnnanoncnnannnnononcnnonnnnnnnnnannnnonanens 18 PIQUE 9 IEG ID DIS DIAY sandro oia 19 Figure VO ACUVEA GD scanners 20 Figure 111 RUNACIVE Instale eii siria oia 20 PIQUE 12 Begin Active X INSTA AU OM asias iria A A ced ia 21 Figure 13 Select Type of Active X Installation ccccccocnnncnncccnonnonncnonancnnncnonanconnononancnnnnnonannnnnnnnnanenns 21 Figure 14 Select Active X SEU ia 22 FIQUFE 15 RUN Active X Installer aaa 22 Figure 16 Active X Installation Complete ooocccccccconccnnccononnonncnononcnnncnononcnnnnnnnnncnnnnnnnnnrnnnonnnannnnnnnnnanenss 23 Figure 17 AGIIVE X Communicator eree a lee ee at ail eles eine rhs ste 23 Foure Fro om 7 0 0 al geen nt ee eee eee 24 Figure 19 MIRAME GO arabe 25 Figure 20 RUA MIRMat still aaa 26 Figure 21 Gontiguring MIR Mat lAstalleF oros ee woe ae ele std noe eeeee 26 Figure 22 Bedin Active X Installation adria ad 27 Figure 23 Select Type of MIRMat Installation ccccooonnccnnccccocnonncocnoncnnncnnnnncnnnnnnnnncnnnononancnnnnnnnanenss 27 Figure 24 elect MIR Mat Sel ita A AE O DA eK Doe ea eae 28 Figure 295 RUM INIAMATIISTANGR iia O E E A aiii 28 FIQure 26 MIR Matilastallation COMH ui jaca la A A A A A eee 29 Figure 27 Ubdating DAVEFINWINCOWS 7 acidosis dla ea ANS 30 Figure 28 Found New Hara Ware WIZaTO uuu o O AO AAA EA a 31 Figure 297 IAstall SOMWate Automatically A A AA A A 31 Figure 30 Windows XP Signed Driver ProMpt ccc
82. nd spectrum is to measure the contribution of the instrument and environment to the spectrum These effects are removed from a sample spectrum by ratioing the sample single beam spectrum to the background spectrum Baseline Correction A spectral manipulation technique used to correct spectra with sloped or varying baselines The user must draw a function parallel to the baseline then this function is subtracted from the spectrum Boxcar Truncation With no apodization all points in an interferogram are given equal weight up to the edges of the interferogram If the resolution is less than the smallest line width in the spectrum oscillations appear on the baseline on both sides of the peaks Centerburst The sharp intense part of an interferogram The size of the centerburst is directly proportional to the amount of infrared radiation striking the detector Coadding The process of adding interferograms together to achieve an improvement in signal to noise ratio MIR8035 SP01 Series Modular FT IR Spectrometers Page 111 Collimation The ideal input beam is a cylinder of light No beam of finite dimensions can be perfectly collimated at best there is a diffraction limit In practice the input beam is a cone that is determined by the source size or aperture used The degree of collimation can affect the S N and the resolution Constructive Interference A phenomenon that occurs when two waves occupy the same space and are in phase with eac
83. ndue spectral resolution limit Nothing is gained by the overfilling of the input and there is always the possibility that some of the wasted light will find its way to the detector and cause trouble just as happens in a monochromator Of course in an open bench approach source optics can be slower than detector optics when the source sizes are large A 5 mm size IR emitter with F 2 5 optics will have according to Equation 6 and Equation 8 an tendue Ginput 3 25 mm rad which is higher than we need for 4 cm resolution in the example we are considering There exists an arrangement see Figure 103 which allows you to have a variable throughput and therefore variable resolution in the system without changing focal lengths of lenses or size of a detector Lens 1 projects the source in plane 2 where a variable aperture usually called a Jacquinot stop is placed This apertured radiation is collected and collimated by lens 3 This arrangement is also particularly important for radiometry applications where different size sources are measured and compared with a calibrated source that may be significantly different in size INTERFEROMETER ADJUSTABLE JACQUINOT 1 STOP SOURCE DETECTOR Figure 103 Interferometer with Jacquinot Stop MIR8035 SP01 Series Modular FT IR Spectrometers Page 102 To be specific let s assume that the tendue of the detector unit is 2 mm rad which determines the required resolution 4 cm F
84. nnnnnnnnnnnnrnnnnnnnannrnnnnnnanenns 62 Figure 70280008 DIGS Detecta lili 63 Figure 1280021 ISD Dec o ida 64 Figure 72 80026 MCT Detector ccccccssccccceeseecceseeeceeuscecceuseeccseececeeseeessaseeessegececseseeessageeessageeessseags 64 Figure 73 80033 Fiber Coupler with 80041 SMA Adapter cccoooncnccconcnccccnconcccoccnconononnononcononnanonconanennnnaneos 65 Figure 74 80040 Fiber Coupler ccccccccccsseseccccceeeeceeecaeeeceeesseeeceeessaeseeeeesseaseeeeesseaseceesssaageseessaaseeess 65 Figure 75 80070 Accessory Compartment ccccocncccnnccnnnnccnncnonnnnnnnonononnnnnnnnnnnrnnnnnnnnnnnnnnnnnnnrrnnnnnnannrnnrnnnanens 66 Figure 76 80070 Accessory Compartment DIMENSIONS ccooocccnncccnnncnnncnononcnnnnnonnnnnnnnnnnnnnnnnononanennnonnnanenns 66 Figure 77 Various Off Axis Parabolic Reflectors ooocccccconcncoconnnccconcononnnnonnonanonnononnonononnnnnnnannnnonanns 67 Figure 78 Transmittance of PIR and CIR Fiber Optic Cables occcccoonccnccccccncononcnnnnoncononnannnnonanennnnonons 68 Figure 79 Infrared Light Source and Power Supply oocccncccccocncnncccnnoccnncnononcnononononnnnnononnncnnnononannnnnonnnanenns 69 Figure 80 Light Source Hose Barb for No Purge c cccoocccnnccccocccnncccnonconncnononcnnncnnnncnnnononancnnnononannnnnnnnnancons 69 Figure 81 80007 SiC Spectrum taken using 80350 Scanner and 80008 DTGS Detector 70 Figure 82 80009 QTH Spectrum taken using 8035
85. nnnnnnrnnnnnonanrrnnrnnnanens 46 Figure 49 Data Stored in Locations A B and F oocccccccccnnccconcnncconcnnnnonnnnnnnnnnnnononennononnnnnnnnnnnnonanennnnoness 46 MIR8035 SP01 Series Modular FT IR Spectrometers Page 6 FIQUIS S0 SPECI al Gac saa e A a e a ete es ee 49 Figure i Loading 4 Mal FING ia da aa 50 Figure 52 Parameters for Loading a mat File ainia ea ia da a ietlads 50 FIGURE o3 SD Rotated Pla a daa 52 Figure 54 AIS ON OO ida 53 US OA O o O A eee 53 Figure 565 AXIS ONM ana Oi dida 53 FOUS SS noO WISE tallo coa 54 FIQUre Ses IOS EEG italiano blas 54 FIGUIE 59 gt Eegena Text Mena diia 55 Figure 607 Legend Men lr A 55 Figure 61 Legend Property Ed Orea etane aenta a e a ae 56 Figure 62 PIOC PrOpeny Ed ere a a a 57 Figure 63 Plot Line Property Editor via 57 Figure 64 Purge Hose Connector rss cceussbencsdewed ceed Leveveendad duauachenedianss donde seeecoundesenerssiee ext 58 Figure 65 Typical D Values for FT IR DetectorS occcccconnnnccoconcnnononcnnncnncononnnnoncnnoncnnnnonnnnonnannnnonanennonaneos 59 FIQUre 667 Detector DIMENSIONS iia cia iia 60 Figure 67 Detector Connector PiNQU S occcccccccocccnnccononccnnonononnnnnononannnnnnnononnrnnnnnnnnnnnnnnnnnnrnnnnnnnanrrnnnnnnnnens 61 Figure 68 80019 Si and 80020 InGaAs Detectors ooocccnnccccnocccnncnononccnncnononcnnnononnnnnnnnnnnnnrnnnnnnnannrnncnnnanenns 62 Figure 69 80015 80016 HgCdZnTe DetectorS cccccccoocccnccccconccnncncnonccnnononancnnnonnn
86. ns Input and output optics as we see from Figure 99 are the components that provide an FT IR with the required divergence angle MIR8035SPO01 Series Modular FT IR Spectrometers Page 97 20 3 External FT IR Optics General Considerations The task of external FT IR optics as we saw in the previous section is not only to collect and collimate light but also to provide a certain acceptance angle in the system according to the resolution formula To be able to perform calculations for FT IR auxiliary optics we will need first to revisit some basic optical ideas This touches on one of the most fundamental but neglected laws of radiation that affects the design of optical systems that Oriel Instruments offers AREA A SOURCE Q TA Si a j j a NaN A A n s a DETECTOR Figure 101 Solid angles and conventional angles Consider light collected by a lens onto a focal spot or emitted by a source placed in the focal plane of a lens The solid angle of the cone of rays collected from the source or alternately directed onto the focal spot is given by Q A f sr Equation 5 where both f and A are expressed in the same units e g m m or mm mm and A the area of the collecting focusing lens f lens focal length Q n 4F sr MIR8035 SP01 Series Modular FT IR Spectrometers Page 98 Equation 6 We can use F instead of focal length in Equation 6 So an F 4 lens collects a solid 0 05 sr wh
87. o not touch the window with your gloved fingers Insert the new window again handling it by its sides only Place the ring back into position pencil mark up Line up the screw holes and screw back into place The ring should be seated tightly against the wall of the housing ee Figure 94 Marking the top of the window ring MIR8035SPO01 Series Modular FT IR Spectrometers Page 84 17 SPECIFICATIONS Scanner Parameter 80350SP01 80351SP01 Function containing an interferometric modulator retroprism Input Maximum y Divergence Angle CAE Beam Splitter Input Output Windows Spectral Range 6 000 to 350 cm 14 000 to 1 200 cm 1 7 to 28 um 0 7 to 8 3 um Aperture 7x 10 cm Sr for acceptance angle corresponding to 1 cm resolution ecen Selectable from 0 5 to 64 cm in 8 steps corresponds to 02 nm at 700 nm at 04 um at 28 um at 40 kHz at laser modulation frequency at 25 kHz at laser modulation frequency at 15 kHz at laser modulation frequency at 5 kHz at laser modulation frequency HeNe Laser Phase Tolerance scanner control and data acquisition Scanning mirror can be finely adjusted by the software to get ZPD Point ZPD point exactly in the middle of a scan this position will be maintained with zero error as long as the unit is powered up Interferogram Oversampling Wave Number Accuracy Wave Number Resolution Sianal to Noise Ratio 1000 1 at 2500 cm 4cm resolution g 1 scan sample 1 scan refer
88. off when the cover is removed The illustration on the right with the plunger lifted up would allow the power to be applied to the laser When the Laser is on with the interlock defeated the LED mounted next to the switch will light Hormal Position with Interlock defeated LED the Cover Removed LASER DISABLE Switch Position with the Interlock defeated LASER ENABLED Figure 93 Interlock Location MIR8035 SP01 Series Modular FT IR Spectrometers Page 83 16 WINDOW REPLACEMENT When the scanner is used in the low humidity environment specified there is no need to replace the input and output windows unless it is desired to change from a KBr to CAFI2 model or visa versa If that is the case the beamsplitter must also be changed to the desired material Windows can be replaced in the field However beam splitter replacement is best performed by qualified service personnel Always wear latex gloves to avoid damaging the optics 1 Mark the top of the window ring with a pencil so you can later distinguish the top from the bottom as shown in Figure 94 2 Remove the two lower screws first then the top while holding the ring 3 Located behind the ring is a gasket this gasket may stick to either the ring or the window upon removal If it sticks to the window you need to remove it and put it back into the groove of the ring 4 Pick the window out of the instruments housing carefully and by its sides only D
89. ontents Display Data as x X ys Multiple Y Pairs X Y x YZ Import as Xx mo Import as Y co Figure 51 Loading a mat File Browse and select a mat file Display data as X Y Under File Contents highlight X Click the right arrow to select it as the Import as X field Repeat for the Y axis Once this is done the OK button appears so that the file can now be imported e From Disk MAT File Name C Users katy zadrovicz Browse l Default Directory C Users katy zadrovicz Cancel OK File Contents info parameters units x Import as X T IC Tell Me More Import as Y gt ES y To view Y plot press or make another selection Figure 52 Parameters for Loading a mat File MIR8035 SP01 Series Modular FT IR Spectrometers Page 51 8 OPENING SAVING AND PLOTTING DATA 8 1 PLOT WINDOW MENU BAR FUNCTIONS The plot window is opened by clicking the Plot button in the SPV The menu bar pull down menus are found at the top of the main display window File Open Close Save Save As Export Page Setup Print Setup Print Preview Print Tools Edit Plot Zoom In Zoom Out Rotate 3D Default Scale X Y When selecting a command under the Tools menu in the plot window that option will remain checked For example if the Zoom In command is chosen any time the mouse is clicked inside the plot window the view will be magnified To uncheck go back to the Tools men
90. or subsequently developed or acquired without reliance on the Newport Programs or 4 approved by Newport for release without restriction First printing 2014 2014 by Newport Corporation Irvine CA All rights reserved No part of this manual may be reproduced or copied without the prior written approval of Newport Corporation This manual has been provided for information only and product specifications are subject to change without notice Any change will be reflected in future printings Newport Corporation 1791 Deere Avenue Irvine CA 92606 USA
91. ou can change the way features are corrupt files shortcuts and registry entries E Remove Mir80250 Drivers_ActiveX from your computer a InstallShield Figure 13 Select Type of Active X Installation MIR8035 SPO01 Series Modular FT IR Spectrometers Page 22 6 Highlight Mir80350 Drivers_ Active and click Next per Figure 14 Custom Setup Select the program features you want installed Click on an icon in the list below to change how a feature is installed Feature Description This feature requires OKB on your hard drive Figure 14 Select Active X Setup 7 Click Next as shown in Figure 15 to being running the installer The wizard is ready to begin installation Click Install to begin the installation If you want to review or change any of your installation settings dick Back Click Cancel to exit the wizard InstallShield Figure 15 Run Active X Installer MIR8035 SP01 Series Modular FT IR Spectrometers Page 23 8 When the installation is complete the screen shown in Figure 16 will appear Click Finish Drivers_ ActiveX Click Finish to exit the wizard Figure 16 Active X Installation Complete 9 The Active X installation is now complete However communication to the instrument cannot be established until the MIRMat software installation has also been completed If the error message shown Figure 17 appears click OK This message only appears on certai
92. perates at room temperature no TE cooling or liquid nitrogen is needed The detector has a built in transimpedance amplifier that is powered from the model 80351 Scanner The amplifier allows gain selections to be made from 10 V A to 10 V A It also offers three selectable time constant settings allowing the detector to operate at the lowest possible bandwidth setting for the experiment in order to minimize noise levels The 80019 includes an aspheric focusing lens with X Y adjustment and a standard Oriel 1 5 Inch Series female flange The default factory setting is 10 gain and minimum time constant 10 2 InGaAs Detector The 80020 InGaAs Detector exhibits excellent stability and sensitivity over its spectral responsivity range This model is a low noise detector that operates at room temperature no TE cooling or liquid nitrogen is needed The detector has a built in transimpedance amplifier that is powered from the model 80351 Scanner The amplifier allows gain selections to be made from 10 V A to 10 V A It also offers three selectable time constant settings allowing the detector to operate at the lowest possible bandwidth setting for the experiment in order to minimize noise levels The 80020 includes an aspheric focusing lens with X Y adjustment and a standard Oriel 1 5 Inch Series female flange The default factory setting is 10 gain and minimum time constant MIR8035 SP01 Series Modular FT IR Spectrometers Page 62 Figure 68
93. perty Editor ES Edit Properties for legend legend M el Text Style Legend V Visible Background White y Custom color Position To the right of the plot 61 led Fontname Helvetica Font weight Norma wf Font angle Norma wf Font size 100 ast Font units Pons Color White Custom color OK Cancel Apply Help MV Immediate apply x Ca o MV Immediate apply Figure 61 Legend Property Editor The back and forward buttons in the upper right of the property editor take the user to all the menu choices previously selected for editing legend plot exes etc It does not undo or redo the selections that were made MIR8035 SP01 Series Modular FT IR Spectrometers Page 57 8 9 ADVANCED PLOT EDITING Properties can be edited for the figure legend and axes To edit the properties of the figure right click in the plot area This allows one to choose a background color outside of the plot area or change the title block text and many other features Right click on the plot line to edit properties such as color line weight etc la al er lt Edit Properties for faxes PlotAxes y el x y z siie Aspect Lights viewpoint Info Label koo Properties Color Black y Custom color Location Bottom 0 Grid T Show Limits V Auto 1500 00 1500 00 Ticks V Auto 1500 0 1000 0 500 0 0 0 500 0 1000
94. powered as described in the manual e Do not remove the cover for normal usage 1 3 ELECTRICAL HAZARDS Make all connections to or from the power supply with the power off Do not use the power supply without its cover in place Lethal voltages are present inside 1 4 1 5 1 6 MIR8035 SP01 Series Modular FT IR Spectrometers Page 10 FIRE HAZARDS Light sources are extremely hot during operation and remain hot for several minutes after being shut off Keep flammable objects away from the IR source and its emitter or lamp To avoid fire hazard use only the specified fuses with the correct type number voltage and current ratings as referenced in the appropriate locations in the service instructions or on the equipment Only qualified service personnel should replace fuses LAMP HANDLING Never touch any lamp or the reflector s inner surface with bare fingers or other contaminates Skin oil or other substances can burn into the lamp envelope during operation and negatively affect the lamp s performance and lifetime Always wear appropriate gloves when handling any lamp Avoid any mechanical strain during handling Do not operate the lamp without all housing panels in place Lamps become very hot after only a few minutes of operation up to 150 C and remain quite hot for at least 10 to 15 minutes after being turned off LASER HAZARDS The FT IR scanner contains a Class IIIA laser The fully assembled FT IR system functions
95. ptics Source OPtICS ooooccccnncccccccnonccnnnnnonononanncnnnnnnnnnonannnnnnnnnnnnnananennns 101 20 6 External FT IR Optics Off Axis Parabolic Reflectors coccooonnccnnccccocncnncnonanononcnonancnns 104 20 7 External FTHAR Optics Lens eS id 108 Append B Glossary Ol TOS 110 MIR8035 SP01 Series Modular FT IR Spectrometers Page 4 22 WARRANTY AND SER VIO Esso 114 221 GONTACTING ORIEL INSTRUMENTS iva id eae atin 114 222 IREQUEST FOR ASslsT ANCE SERVICE senie ains 115 223 MERA SERVIO Es eine So ede odio 115 224 NONSWARRANTY REPARA cuna tas 115 22 5 WARRANTY REPAIR ct io Ste a sii 116 220 LOANERY DEMO MATERIA oustiaiaaaiirsliiadias 117 MIR8035SP01 Series Modular FT IR Spectrometers Page 5 LIST OF FIGURES Figure T Basic System A aio 11 Figure 2 Building a Complete SySteM ooocccccccconccnnccononcconcnononcnnnonononnnnnnnonnnnnnnnnnnnnnnnnnnnnnnrrnnnnnnnnrrnnennnanens 12 PERO e on o A 12 Figure 4 Unlocking Moving MechaniSM ooncnncccccnnccconcnncconcnncnnonnnnononcnnononcnnnnnnnnnnonnncnnnnonrnnnnnnnrnronanennnnaneos 15 Figure 5 Scanner with Source and Detector ooocccccccccnncnnccccnnnnnncnononnonncnononcnnnnonnnnnnnnnnonnnrrnnnnnnannnnnnnnnanenns 16 Figure 6 Complete System with Accessory Compartment cccoooonncccnnncnnnonnnnncnnnnnnnnonnnnncnnnnnnononnnancrnnnnnnnos 16 Figure 7 Scaner Connect iia 17 Figure 8 Beamsplitter Alignment Access Points ccccccccccccconnncoconnnnoco
96. rocess until the signal is maximized The instrument should now be scanning Slowly remove the tool taking care not to accidentally disturb the beam splitter position Allow the instrument to scan for at least one hour to allow all opto mechanical parts to warm up 14 2 Phase Adjustment Problem Phase value on LCD is not within an acceptable value Solution Open the scanner unit and slowly turn the phase wheel until the value is correct Figure 88 Phase Adjustment wheel MIR8035 SP01 Series Modular FT IR Spectrometers Page 78 14 3 ZPD Optical Sensor Realignment Problem You cannot get an interferogram even though the Scanner is scanning and the LCD display shows plenty of signals Or the interferogram cannot be centered at Zero See Figure 89 ILE PCRS MPSS CHAJE o Pe Figure 89 Centerburst cannot be centered at zero Solution During transportation or beam splitter interchange the optical sensor which senses ZPD has been misaligned MIR8035 SP01 Series Modular FT IR Spectrometers Page 79 With the instrument on and scanning set the resolution to 4 cm if the centerburst is still not visible in the Display Screen change the resolution to 1 cm Once the centerburst is visible although off center turn off power to the Scanner and remove the cover With the provided 3 32 wrench loosen the vertical screw on the optical flag by turning it 1 8 of a turn counterclockwise as shown in Figure 90 Turn
97. rray of the last Acquired data volts Cast the returned variant to an array of doubles See RawDataBuffer and NumberPoints properties section for environments that do not support passing of VARIANT type void SetEncoderMode ULONG state state 1 the encoder is enabled for slider control laser not used for use when laser has failed or the instrument has been jostled out of alignment state 0 the encoder is disabled The laser is used for slider control normal operation mode for acquiring interferogram data Note The MIR8035 powers up with the encoder enabled this is so incase the laser is not functioning or misaligned the slider motion is still functioning which allows the lack of laser signal to be troubleshot without computer connection The first thing any application should do is disable encoder mode void DoAutoAdjustZPD void Performs an acquisition and automatically adjusts the zero position to for the centerburst NOTE a subsequent Acquire will obtain the zero adjusted interferogram 13 2 MIR8035 SP01 Series Modular FT IR Spectrometers Page 76 void SendZPD long zpdoffset Moves the centerburst by the number of points specified by zpdoffset long zpdoftset value moves the centerburst to the right value moves the centerburst to the left ULONG GetLaserSignalA void Returns the level of laser signal A corresponds to the first left number on the MIR8035 LCD panel ULONG GetLaserSignalB void Ret
98. ruments sources detectors and sample compartments interchangeable so you do not have to break it apart when your needs change simply switch out the component s Figure 1 illustrates how the MIR8035 works Very simply the scanner modulates the radiation from the source or sample the electronics board in the scanner digitizes the analog signals from the detection system and sends them to a computer through a USB 2 0 interface MIRMat software is used for instrument control and data handling Infrared Light Source Or Sample FT IR i Detector Scanner USB cable ee acquisition software Figure 1 Basic System Diagram A complete MIR8035 FT IR Spectrometer system is composed of e MIR8035 scanner with beam splitter and windows installed e IR Source or sample e IR Detector e MIRMat software The flexibility of the modular MIR8035 FT IR Spectrometer allows you to choose either an Oriel or your own Source and Detector to complete your FT IR system The flowchart in Figure 2 provides a quick reference to which detectors and sources are offered by Oriel Instruments For questions please contact an Oriel Technical Sales Engineer MIR8035 SP01 Series Modular FT IR Spectrometers Page 12 mmm SCANNER rr 80351 3 praa 80350 Near IR Scanner Mid IR Scanner 14 000 1 200 cm 0 7 8 3 pm 6 000 350 cm 1 7 28 ym Includes CaF Beam Splitter and Window Includes KBr Beam Splitter and Window Near IR So
99. s considered in the most accurate approach Resolution A measure of how well an IR spectrometer can distinguish spectral features that are close together For instance if two features are 4 cm apart and can be discerned easily the spectrum is said to be at least 4 cm resolution Resolution in an FT IR is mainly determined by the optical path difference Sidelobes Spectral features that appear to the sides of an absorbance band as undulations in the baseline Sidelobes are caused by having to truncate an interferogram as a result of finite scan distance and can be removed from a spectrum by multiplying the spectrum s interferogram by an apodization function Single Beam Spectrum The spectrum that is obtained after Fourier transforming an interferogram Single beam spectra contain features due to the instrument the environment and the sample Smoothing A spectral manipulation technique used to reduce the amount of noise in a spectrum It works by calculating the average absorbance or transmittance of a group of data points called the smoothing window and plotting the average absorbance or transmittance versus wavenumber The size of the smoothing window determines the number of data points to use in the average and hence the amount of smoothing Spectral Subtraction A spectral manipulation technique where the absorbances of a reference spectrum are subtracted from the absorbances of a sample spectrum The idea is to remo
100. s below the Nyquist Frequency Optical and electronic anti aliasing can be used to prevent this Sometimes the higher frequencies are said to be folded back so the term folding is used Angular Divergence The spreading out of an infrared beam as it travels through the FT IR Angular divergence contributes to noise in high resolution spectra and can be a limit to achievable resolution Apodization Functions Functions used to multiply an interferogram to reduce the amount of side lobes in a spectrum Different types of apodization functions include boxcar triangle Beer Norton Hanning and Bessel The use of apodization functions unavoidably reduces the resolution of a spectrum ATR Abbreviation which stands for Attenuated Total Reflectance a reflectance sampling technique In ATR infrared radiation impinges on a prism of infrared transparent material of high refractive index The total internal reflectance based design assures that the light reflects off the surface of the crystal at least once before leaving it The infrared radiation sets up an evanescent wave which penetrates a small distance above and below the crystal surface Samples brought into contact with the surface will absorb the evanescent wave giving rise to an infrared spectrum This sampling technique is useful for liquids polymer films and semisolids Background Spectrum A single beam spectrum acquired with no sample in the infrared beam The purpose of a backgrou
101. same value made with formulas Equation 6 Equation 7 and Equation 13 gives a value of 0 4 mm With increasing divergence of the beam the diameter of the focal spot also increases as we see but it has some limit between 1 5 and 2 mm The reason for this is that the interferometer itself is blocking high angle rays and they simply do not reach the parabolic reflector The maximum value of angle of rays that can get through the interferometer is 0 06 to 0 07 rad This is exactly the region where the curve in Figure 107 starts to flatten out Figure 108 shows the energy distribution in the focal plane of the off axis reflector for beams of different divergence This shows the increasing impact of aberrations as the field of view of the parabola is increased MIR8035 SP01 Series Modular FT IR Spectrometers Page 107 PARABOLA PARABOLA DIVERGENCE DIVERGENCE 0 01 RADIANS 0 05 RADIANS Figure 108 Energy distribution in the focal plane of an off axis reflector Despite universality and wide usage of off axis parabolic reflectors in FT IR spectroscopy they have certain disadvantages Alignment is fairly difficult Each reflectance turns the beam through 90 degrees and this may make the system bulky At low F F i e large fields of view high tendue they suffer from significant aberrations MIR8035 SP01 Series Modular FT IR Spectrometers Page 108 20 7 External FT IR Optics Lenses In many applications especially in the Near IR len
102. ses could be a good choice Figure 109 shows the energy distribution in the focal spot of a CaFs lens having about the same focal length and F as the parabolic mirror considered in Figure 108 LENS DIVERGENCE e IIA 9006 RADIANS Ti LENS DIVERGENCE LENS i y DIVERGENCE DIVERGENCE 0 01 RADIANS 0 05 RADIANS Figure 109 Energy distribution in the focal plane of CaF lens What is there to worry about when working with lenses First material we recommend the use of CaF lenses in the whole range where the CaF beam splitter is applicable In the very Near IR up to 3 microns fused silica lenses are fine though the water absorption bands may cause some loss They are somewhat cheaper than Car gt lenses A wide variety of materials are available for the Mid IR You ve usually got a choice among performance expense durability birefringence etc The hygroscopic nature of some materials can be a big problem NaCl and KBr windows are two such popular materials Some materials are transparent in the visible and others not this can be a plus if you are trying to align in the visible or a negative when you would prefer the material to act as a filter Basically the only rugged and transparent material which is used for manufacturing lenses is ZnSe lt has however a very high index of refraction that pushes reflectance losses to relatively high levels up to MIR8035 SP01 Series Modular FT IR Spectrometers Page 109 30
103. signals being displayed are less than 30 the beam splitter requires realignment Refer to Section 7 1 for more information Once the beam splitter alignment is complete re check the LCD readings If they are acceptable continue to Section 4 to install the MIRMat software If the phase being displayed is not within the acceptable range as noted above the phase requires adjustment Refer to Section 14 2 for more information Once the phase reading is correct re check the signal readings on the LCD If all readings are acceptable continue to Section 4 to install the MIRMat software Turn off the FT IR scanner until prompted to turn it on during the driver installation process as noted in Section 6 2 Figure 9 LCD Display MIR8035 SP01 Series Modular FT IR Spectrometers Page 20 4 ACTIVE X INSTALLATION 4 1 COMPUTER PRIVILEGES The individual performing the installation must have administrator privileges for the computer Refer to Section 3 2 for the minimum system requirements When installing onto a Windows 7 computer the installation must be run in compatibility mode for Windows XP Service Pack 3 4 2 ACTIVE X INSTALLATION PROCEDURE This section will guide the user through the installation process Please note that the Figures shown are based upon an installation performed on a computer with a Windows 7 32 bit operating system Do not connect the USB cable to the computer until directed to do so 1 Insert the Active X CD into t
104. size source is placed in the focal point of the parabola the reflected beam will not be ideally parallel any more lt will have some angular divergence according to the angular size of the source Additionally it will suffer from all kinds of aberrations Accordingly a non parallel incoming beam will be focused into not a spot but into a certain size blur It is important to analyze how the angular divergence of a beam turns into a blur spot in a parabola focus We created the optical schematic of the MIR8035 with an F 1 parabolic mirror at the output The effective focal length of the mirror was 20 mm We traced rays with different divergence through the system and watched for the focal spot size Figure 107 shows a graph of the diameter of the focal spot vs angular divergence of the beam propagating through the interferometer MIR8035 SP01 Series Modular FT IR Spectrometers Page 106 DIAMETER OF FOCAL SPOT mm N 0 0 00 0 01 0 02 003 004 005 0 06 007 0 08 0 09 0 10 0 11 DIVERGENCE ANGLE INSIDE INTERFEROMETER RADIANS Figure 107 Diameter of Focal Spot vs Angular Divergence The limit on divergence angle in the interferometer we found from formula Equation 4 at the smallest possible Ac which is 0 5 cm and the highest possible o which is 14 000 cm is 0 006 rad The graph shows that the diameter of the focal spot which corresponds to this value is about 0 5 mm It is interesting to mention that the rough estimate of the
105. ted into the design which reduces the effects of background radiation It is matched with the detector allowing the detector to function at its ideal operating point A manually adjustable iris is included with the 80021 lts diameter range is from 0 8 to 1 4 2 to 36 mm The iris can act as a Jacquinot Stop By decreasing the effective source size and reducing the spot size on the detector resolution is increased The iris uses standard Oriel 1 5 Inch Series male and female flanges allowing it to be easily integrated into the FT IR system MIR8035 SP01 Series Modular FT IR Spectrometers Page 64 as Figure 71 80021 InSb Detector 10 6 MCT Detector The 80026 Mercury Cadmium Telluride MCT detector s broad spectral response extends into the mid IR region This liquid nitrogen cooled detector measures signals approximately 100 times weaker and acquires data about 8 times faster than Oriel s 80008 room temperature DTGS detector Liquid nitrogen holding time is eight hours A two stage low noise amplifier is built into the housing and requires no user adjustments An off axis parabolic reflector is integrated into the design rather than a focusing lens IR refractive optics are expensive and have transmittance limitations Using this type of reflector provides several advantages lts gold coating enhances IR reflectance The focal point is displaced from the mechanical axis giving full access to the reflector focus area There is no
106. ter s CD ROM drive Open the contents of the CD A es 7 File Edit View Tools Help Organize v Eject Burn to disc Properties System properties Y Favorites 4 Hard Disk Drives 1 Local Disk C Libraries 124 GB free of 232 GB e Computer 4 Devices with Removable Storage 1 DVD RW Drive D 040628 _1603 Cu Network 94 516 MB free of 702 MB d DVD RW Drive D 040628_1603 Space used o _ Y CD Drive Space free 516 MB Figure 19 MIRMat CD MIR8035 SP01 Series Modular FT IR Spectrometers Page 26 14 Right click the setup exe application and choose Properties per Figure 20 Check the box to install the software in compatibility mode and ensure Windows XP Service Pack 3 is selected Check the box to run as administrator and then click OK 15 Run the setup exe application Enable Disable Digital Signature Icons File Edit View Tools Help Run as administrator If you have problems with this program and it worked correctly p Troubleshoot compatibility on an earlier version of Windows select the compatibility mode Organize v Burn to disc E oe ds that matches that earlier version vid PERA Help me choose the settings A Name Scan for threats Compatibility mode Favorites Add to archive Y Run this program in compatibility mode for i 4 Files Currently on the Disc 6 Add to setup rar Windows xP Service Pack 3 as d
107. u and uncheck the command or select another command Get Data from SPV refreshes the plot from a continuously running scan Plot Mode Grid off Grid on Box off Box on Axis on Axis off Remove Last Plot Clear All Web opens the default web browser and goes to the Newport website Close closes the plot window MIR8035SPO01 Series Modular FT IR Spectrometers Page 52 8 2 OPENING A FILE In the plot window File gt Open allows one to select a fig file which opens in a separate window 8 3 SAVING AND EXPORTING The Save and Save As commands under the File pulldown menu allow the plot to be stored as a fig file The MATLab fig file is a binary format to which one may save figures so that they can be opened in subsequent MATLab sessions The whole figure including graphs graph data annotations data tips menus and other user interface controls is saved The only exception is highlighting created by data brushing As a MATLab based software application MIRMat supports this type of file Exporting a file allows the plot to be saved in various graphic file formats such as emf omp jpg etc The exported file is not an entire screen capture of the plot window This function exports and saves the plot window and values for the x and y axes 8 4 ZOOMING IN OUT AUTO SCALING PLOT 8 5 Zoom In and Zoom out allow the user to click on the plot to change the view Zoom In also allows the user to create a window around an
108. ubleshooting section if there is no centerburst Click stop on the main MIRMAT screen Bring up the Properties dialog Check the ZPD Adjust Box and click OK The resolution must be set to 16 or less when the ZPD Adjustment is enabled On the main MIRMAT screen click single to Acquire a scan the instrument will adjust the interferogram after this scan On the main MIRMAT screen click single to Acquire a scan you should observe that the interferogram centerburst is now centered The first subsequent acquire performs a ZPD adjustment the next acquire will show the adjusted interferogram MIR8035 SP01 Series Modular FT IR Spectrometers Page 82 15 LASER SAFETY INTERLOCK SWITCH The Laser Interlock Switch turns off the Laser when the Instruments cover is removed The switch is designed to be defeated allowing a qualified service person to apply power to the Laser In order to disable the interlock the switch needs to be up CAUTION Direct eye exposure to the laser beam must be avoided Laser safety glasses are strongly recommended any time the power is applied to the Laser and the instrument is open Protective eyewear worn must be appropriate for use with HeNe lasers Newport includes one set of safety glasses with the alignment packaged that is shipped with every instrument Figure 93 shows the interlock switch with the cover removed The illustration on the left shows the normal switch position with the Laser shut
109. urces pate Mid IR Sources _ 80009 QTH Source o a 80007 SiC Source l Your Near IA Source 14 000 2 800 env 6 000 350 em Your Mid IR Source 0 7 3 5 um 1 7 28 pm or Sample sa DETECTOR ns 80019 Si 80020 InGaAs a 1 80021 InSb 80008 DTGS 14 000 10 000 cm 10 000 6 000 em he 10 000 2 000 em 6 000 350 em 0 7 1 um 1 1 7 pm 1 5 um 1 7 28 pm 80015 80016 HgCdZnTe 80026 MCT Your Near IR Detector 3 550 1 540 cm 5 000 600 cm 2 8 6 5 pm 2 17 pm Your Mid IR Detector pectrometer Figure 2 Building a Complete System The MIR8035 uses a scanning Michelson Interferometer Our optical layout as shown in Figure 3 includes corner cubes and a retro reflector The unique layout is immune to tilt and shift The retro reflector and beam splitter are mounted together providing accurate alignment while desensitizing the system to vibrations and temperature variations This unibody approach to the beam splitter makes for easy interchangeability with a minimum of realignment required RETRO REFLECTOR INPUT OUTPUT SPLITTER INPUT OUTPUT Figure 3 Optical Layout MIR8035 SP01 Series Modular FT IR Spectrometers Page 13 3 SYSTEM SETUP 3 1 3 2 WHAT S INCLUDED WITH THE SHIPMENT ltems provided with all FT IR system orders Model 80350 or 80351 Scanner with beam splitter and windows MIRMat software installation CD MIR MIR8035 ActiveX Drivers CD USB 2 0 c
110. urn the product to Oriel Instruments freight prepaid clearly marked with the RMA number and it either will be repaired or replaced it at Oriel s discretion Oriel is not responsible for damage occurring in transit The Owner of the product bears all risk of loss or damage to the returned Products until delivery at Oriel s facility Oriel is not responsible for product damage once it has left the facility after repair or replacement has been completed Oriel is not obligated to accept products returned without an RMA number Any return shipment received by Oriel without an RMA number may be reshipped by Newport freight collect to the Owner of the product 22 4 NON WARRANTY REPAIR For Products returned for repair that are not covered under warranty Newport s standard repair charges shall be applicable in addition to all shipping expenses Unless otherwise stated in Newport s repair quote any such out of warranty repairs are warranted for ninety 90 days from date of shipment of the repaired Product Oriel will charge an evaluation fee to examine the product and determine the most appropriate course of action Payment information must be obtained prior to having an RMA number assigned Customers may use a valid credit card and those who have an existing account with Newport Corporation may use a purchase order MIR8035 SP01 Series Modular FT IR Spectrometers Page 116 When the evaluation had been completed the owner of the product will
111. urns the percentage level of laser signal B corresponds to the second percentage value on the MIR8035 LCD panel ULONG GetPhase void Returns the phase degrees corresponds to the rightmost number on the MIR8035 LCD panel MIR8035 ActiveX Properties The RawDataBuffer and NumberPoints public properties are made available for applications like MATLab that do not support VARIANTs Programming environments like LabView which support VARIANTS should use the VARIANT GetDataDblArray void method shown above long RawDataBuffer pointer to the address in memory of an array of doubles containing the interferogram data array volts long NumberPoints the number of data points in the interferogram array MIR8035 SP01 Series Modular FT IR Spectrometers Page 77 14 TROUBLESHOOTING Set the scanner to encoder mode when troubleshooting Refer to Section 7 4 1 14 1 Beamsplitter Alignment Problem Scanner does not scan Solution The MIR8035 is a very sensitive instrument if the instrument is inadvertently misaligned it will not scan Turn off power to the Scanner Insert a flat blade screwdriver into the beamsplitter adjustment access ports Once the screwdriver s slot is engaged very slowly turn the screwdriver while observing the percentage values on the LCD Turn the tool first in one then the other direction to determine which way increases the percentage values Repeat with the second access port Continue this p
112. ve the bands due to the reference material from the sample spectrum This is done by simply calculating the difference in absorbance between the two spectra then plotting this difference versus wavenumber The reference spectrum is often multiplied by a subtraction factor so that the reference material bands subtract out properly MIR8035 SP01 Series Modular FT IR Spectrometers Page 113 Transmission Sampling A sampling method where the infrared beam passes through the sample before it is detected Samples are typically diluted or flattened to adjust the absorbance values to a measurable range Wavelength Distance between adjacent crests or troughs of a light wave Wavenumber 1 wavelength the units of wavenumbers are cm and are most commonly used as the X axis unit in infrared spectra 1 um 1 000 nm 10 000 cm 1 5 um 5 000 nm 2 000 cm 1 Zero Path Difference or Zero Optical Path Difference The mirror displacement at which the optical path difference for the two beams in an interferometer is zero At ZPD ZOPD the detector signal is often very large the centerburst MIR8035 SP01 Series Modular FT IR Spectrometers Page 114 22 WARRANTY AND SERVICE 22 1 CONTACTING ORIEL INSTRUMENTS Oriel Instruments belongs to Newport Corporation s family of brands Thanks to a steadfast commitment to quality innovation hard work and customer care Newport is trusted the world over as the complete source for all photonics and las

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