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USER`S MANUAL

1. TSO TS16 7 Number TS15 FAS 8 bit MFAS NMFAS g bit C1 ao a a Pata 0000 xYxx Data NFAS 8 bit TS01 TS17 g bit 0 Sa Sa Sa Sa Sa Data abcd abcd Data FAS 8 bit TS02 TS18 g bit C2 A A Pata abcd abcd Pata NFAS 8 bit 1503 TS19 g pit 3 0 Sa Sa Sa Sa Sa Data abcd abcd Pata FAS 8 bit TS04 TS20 shit C3 1 1 o 1 1 Pata abcd abcd Data NFAS 8 bit TS05 TS21 g bit 1 Sa Sa Sa Sa Sa Data abcd abcd Data FAS 8 bit TS06 TS22 shit c4 1 1 o 1 1 Pata abcd abcd Data NFAS 8 bit 507 TS23 g bit 0 Sa Sa Sa Sa Sa Data abcd abcd Data FAS 8 bit TS08 TS24 g bit c iae o rr Bata abcd abcd Data NFAS 8 bit TS09 TS25 g bit 1 Sa Sal Sa Sal sal Pata abcd abcd Pata 10 FAS 8 bit TS10 TS26 8 bit C2 te St Pata abcd abcd Pata a NFAS 8 bit TS11 TS27 g bit 1 sa sa sa sa sa Pata abcd abcd Data i E FAS 8 bit TS12 TS28 g bit C3 T lin ii PASS abcd abca 098 M NFAS 8 bit TS13 TS29 8 bit E1 sa sa sa sa sa Data abcd abcd Data R FAS 8 bit TS14 TS30 g bit C4 Te Sea Geil a a Pata abcd abca Pata R NFAS 8 bit TS15 TS31 g bit E2 Sa Sa Sa Sa sal Data abcd abcd Data 72 0049 00A 71 E1 BER Tester Appendix A El Frame Structure CRC 4
2. Second step Click Load File button to load the target hex file into the program Third step Click Next button to enter into the upgrading window and then click Upgrade button to start upgrading Fourth step The program will automatically complete the upgrading process After being upgraded the instrument will reset itself Fifth step Switch off the instrument and uninstall the RS232 communication cable Close TestManagerPro program 72 0049 00A 66 El BER Tester 6 Working with TestManagerPro Double click the icon of TestManagerPro to run the software Enter into the main window of the program Select the type of instrument Connect instrument Check if the connection is No well done or if the serial port of PC is damaged Yes Select functions Clean up records Upload records Upgrade embedded software CI th d Vievv Select records Read oe ean up the records uploaded instrumen of specific selected records instrument View the settings and Load in hex file results of record Start upgrading Save the form as other format file Exit from TestManagerPro Fig 51 TestManagerPro operation flow chart 72 0049 00A 67 E1 BER Tester 7 Troubleshooting 7 Troubleshooting This chapter is intended to provide prompt help to operator on some freguently asked guestions and the resolutions 1 The instrument can not be powered on or has no displays When Low Battery
3. Results 00400h15m25s A TS ANALYSIS NAAA P 1 3 TS01 BUSY TS04 BUSY TS07 BUSY TS10 BUSY TS02 IDLE TSO5 IDLE TS08 IDLE TS11 IDLE TS03 BUSY TS06 BUSY TS09 BUSY TS13 BUSY Running Please wait il TS16 MONITOR ACTIVITY Fig 26 Activity in TS Analysis 3 3 3 Results Menu in E1 Through Mode The result menus in E1 Through mode are same with the result menus in El RX HI Z mode Please refer to Section 3 3 2 for details 3 4 Storages Menu Storages menus provide following functions Recall the stored settings to make the settings of a test automatically 72 0049 00A 43 El BER Tester 3 Navigating the Displays e Modify settings parameters and the user settings can be saved or recalled After making the settings choose Storage item in Settings menu as 125 to save the results of this test and start the test VVhen the test is completed the LCD displays vvill auto svvitch to the storage menu the user can define the record s name of this result and choose vvhether to save this test record or not If the user choose not to save this result press F4 to select to exit the storage menu If the user choose Storage item as 179 in Settings menu this test result will not be saved automatically the storage displays will no appear when the test is completed In case of that the user can also save the current result in the Storages
4. alarms the tester will be shut down soon automatically When the voltage of battery drops to a low level the power circuit of the tester will be locked and cannot be opened until Plug the AC power adapter into an appropriate AC wall outlet and power the tester with external power supply lt When the battery is fully charged unplug the AC power adapter and press the Power key to switch on the tester And the tester will work normally 2 When the battery charged fully Charge LED will be turned off And LED will be lit as soon as plugging AC adapter again This is normal The battery will be charged automatically when connected with AC power adapter because the power consumption in working process The battery will be fully charged in a very short time And Charge indicator will turned off 3 The instrument shuts off lA Check if the voltage of battery is low lA Check if Auto power off in Other menu is set to Tl or not 4 The instrument can not work with battery Switch off the instrument Open the end cover of instrument check if the battery case is locked tightly or not If not re clip the case and slide it back on emphatically When hearing Click the battery case has been installed into the provided slot successfully Then install the end cover back 5 Duration of battery is getting shorter The usage life time of new rechargeable battery is about 800 1000 cycles of charge and dis
5. Tester Info menu displays the serial number code software version hardware version and manufacturer and optional function module and other information of the instrument as shown in Fig 44 Others el TESTER INFON Serial num 123456789012 Software version VER 1 0 001 Hardware version VER 1 0 Produced by XGXC Accessorial system functions SELF TESTER WPRODUC TEST INFO ER INFO gt gt Fig 44 Tester Info menu 3 5 9 Producer Info Producer I nfo menu displays t company name website service phone email and other information of the manufacturer as shown in Fig 45 Others el HACIA NAO Manufacturer XGXC Website WWW Xgxc com Email support xgxc com Tel Shenzhen 0086 755 26711014 Accessorial system functions SELF TESTER PRODUC TEST INFO ER INFO gt gt Fig 45 Producer Info menu 72 0049 00A 55 E1 BER Tester 4 Performing Measurements 4 Performing Measurements This chapter is intended to help the operator in performing measurements with E1 BER Tester Full details of the measurements and how to perform them will be described below 4 1 Overview 4 2 Perform the measurements 4 1 Overview The E1 BER Tester is a handheld communication instrument suitable for the field deployment operation and maintenance of communication equipment It can perform error testing alarm generation and detection frame data analysis signaling analys
6. 1 5 Functional keyboard 1 6 LED indicators 1 7 LCD icon indications 1 1 Symbol Descriptions The following symbols in the manual indicate precautions or information which must be taken to maintain safe and right operation of the instrument Caution symbol denotes attention to the operation of the instrument which if not correctly performed or adhered to could result in failure to the test or damage to the instrument Do not proceed beyond a caution until the indicated conditions are fully understood and met Note symbol denotes some help information to the operation of the instrument which if fully understood and met could help the operator in performing the test VVarning symbol denotes a hazard It calls attention to a procedure which if not correctly performed or adhered to could result in injury or loss of life or serious damage or destruction to the instrument Do not proceed beyond a warning until the indicated conditions are fully understood and met Before operation the instructions following above symbols in the manual must be fully understood and met to ensure the right and safe operation of this instrument 1 2 Product Overview The E1 BER Tester is a compact and practical handheld 2M instrument providing a scalable future proof solution for the testing needs of technicians involved in the installation and maintenance of E1 digital networks It offers all the error and alarm measurements you
7. capacity is not full stored records have been unlocked to prompt the user that no test is running yet and all the configuration items can be modified mi or storage capacity is not full and new records can be saved or that stored record is under the unlocked status and can be deleted This icon will be replaced by in the text part of the manual Table 4 Descriptions of LCD icon indications 72 0049 00A 10 E1 BER Tester 2 Getting Started 2 Getting Started This chapter briefly introduces the unpacking check power supply switch on communication with PC for the instrument and safety precautions for the operators 2 1 Unpacking check 2 2 Power supply 2 3 Switch on 2 4 Communication with PC 2 5 Safety precautions 2 1 Unpacking Check In order to safely transport the E1 BER Tester is packaged with a paper carton and with all accessories placed in a waterproof package Please check when receiving the product If the packing carton is impaired and if the appearance of the product is impaired If the instrument and all its accessories are available The standard configuration list of E1 BER Tester is shown in Table 1 Caution Please check the configurations of instrument item by item according to the packing list Please contact your vendor if anything is unavailable Please fill in the product maintenance card carefully and take good care of it If necessary keep the packing materials in case
8. Duration parameters and select the parameters by pressing FT F2 F3 FA softkeys Settings P 2 2 19 38 20 Duration Tu Tester is ready for use Fig 11 Page2 of settings menu in RX HI Z mode framed 3 2 3 Through Mode Through mode testing supports the instrument is bridged as a resistor into an E1 path 72 0049 00A 27 E1 BER Tester 3 Navigating the Displays In another word E1 signal transmits through the instrument receiver transparently and to be relayed through the transmitter of the instruments In this mode the transmitter and the receiver of the instrument must be connected into the E1 path and the transmit clock of the instrument is always extracted from the received El signal to guarantee the synchronization of the signal Because of the transparent transmission through the instrument and make the measurements of error counting frame data signal and timeslot analysis Go back to page 1 of Settings menu select tela in Function item to set relevant parameters All these parameter configurations are same as those in RX HI Z mode In Through mode the instrument will not make any change or damage to E1 framing data signalling and etc but transmit them transparently and directly This will not affect the normal transmission of E1 signal as well In this mode the instrument can on line perform measurements of El signal frequency and level m
9. Error Ratio is the error ratio measured over the last second err ratio Average Average Error Ratio is the error ratio measured over total elapsed time err ratio EB Errored Blocks are counted for the BIT source over total elapsed time Background Errored Blocks are counted for BIT source over total BBE elapsed time BIT Received bit violations in BERT pattern set in the instrument FAS Word errors in the FAS in timeslot O Bipolar violations in AMI code or code violations in HDB3 code Bipolar Error CODE violations are defined as consecutive marks of the same polarity Code Sources violations are defined as consecutive bipolar violations of the same polarity jee Received CRC4 errors in CRC4 Multi frames Far end Block Errors FEBE reported in the first bit of frames 13 and 15 on El lines running with CRC4 multiframe Table 16 Basic Analysis in El TX RX mode 72 0049 00A 29 El BER Tester 3 Navigating the Displays Results 00d00h15m25s dl ZAKEN BIT Errors 2 EFS 923 Current error ratio 0 Average error ratio 1 056E 09 Running Please wait BASIC G 821 G 826 ANALYSISBANALYSISBANALYSIS Fig 12 Basic Analysis result menu in E1 TX RX mode The effects of framings on Basic Analysis are as shovvn in Table 17 5 Unframed PCM30 PCM30CRC PCM31 PCM31CRC BIT Error o e o e o EFS o o o o Cur
10. Far end Loopback 72 0049 00A 56 El BER Tester 4 Performing Measurements Go v W El Tx El Rx Telecom El Rx Netvvork El Tx El BER Tester 3 El LTE Return LTE BER Tester Fig 47 Out of service BER Testing Far end Mutual Test LTE Line Terminal Eguipment of transmission system PDH SDH Test Description 4 2 2 When El TX RX mode is chosen configure the settings according to the specific configurations of the system under test Please refer to relevant part of Section 3 2 1 After completing the settings press the Start Stop key and the Result key to enter into relevant result menu The test result is described in Section 3 3 1 The results may be different according to the different settings When making loopback test the loop can be made by loopback interface to network directly at the local eguipment under test or the far end loopback which can be configured via the maintenance software of the system under test In out of service framed BER testing if there is no 64K timeslot DXC eguipment in the loopback path the transmit and the receive timeslots need to be set as TX AS RX If the DXC eguipment is used in the loopback path and the transmit timeslots have been cross connected then the receive timeslots need to be determined according to the cross connected timeslots At this time the Tx and Rx timeslots should be set as DIVERSE Pay attention to ensure that
11. NT XP 6 2 3 System Configuration Recommendation 6 3 System display mode 800x600 Pixels Install the printer or plotter before setup Install and Uninstall the Software on the PC 6 3 1 Installation Process Close all programs and turn off virus protection software to prevent installation confliction Open the package and carry out the data CD with the mark of TestManagerPro Insert the CD into the CD ROM drive View the contents of the CD from My Computer Double click Setup exe Complete the installation according the setup vvizard After completing installation of the softvvare one short cut icon TestManagerPro will be placed on the desktop automatically Double click the icon TestManagerPro to run the program 6 3 2 Uninstall TestManagerPro 6 4 From the Start menu choose Settings Open Control Panel Click Add Remove Programs Select TestManagerPro in the list Click Change Remove button to remove the softvvare automatically Hovv to Use TestManagerPro 6 4 1 Connect the Instrument See Section 2 4 and confirm connection successfully and settings correctly 6 4 2 TestManagerPro Software Operation Graphic windows help the user operate TestManagerPro software simply and easily User can work with TestManagerPro as follows Double click the icon of TestManagerPro to run the software Switch off the instrument 72 0049 00A 65
12. RS232 port jack 12VDC input jack Fig 1 Appearance of the E1 BER Tester 72 0049 00A 6 El BER Tester 1 Overview 1 5 Functional Keyboard The E1 BER Tester has 16 functional keys at the front panel including main functional keys softkeys cursor keys page keys a backlight key a povver svvitch key a start stop key a single error insert key etc The arrangement of functional keys and names of keys from left to right are as shovvn in Fig 2 These functional keys are described as in Table 2 Softkeys F1 F2 F3 FA Setting Result PgUp Cursor moveable left and up key Storage Other PgDn Cursor moveable right and down key Single Error Add Start Stop Backlight Power key Fig 2 Functional keyboard Caution The key stroke beep can be set as 911 or in Others menu VVhen the key stroke beep is set as JN the right key stroke leads to one beep while wrong or invalid key stroke leads to two beeps As prompt there will be relevant hint information in LCD display at the same time Key Name Description Identified as F1 to F4 used to select the parameter or activity in Softkeys corresponding highlight place at the bottom of LCD Each LCD display defines one or more functions of these softkeys ss Matched with the Settings menu When th
13. been configured completely Results menu Press the Result key to svvitch to the results menu All the information that related to the result statistics performance analysis and signal monitoring and measurement are provided in the Results menu F1 F2 F3 F4 softkeys are used to select various types of result analysis and statistics In case page number appears in the menu such as P 1 2 then the page can be turned by pressing the PgUp or PgDn key 72 0049 00A 18 E1 BER Tester 3 Navigating the Displays Storages menu Press the Storage key to switch to the storages menu Press the Cursor Moveable Right and Down and Cursor Moveable left and Up keys to select storage s name press the F1 F2 F3 F4 softkeys to view delete lock unlock rename and do other actions to the settings and results of the stored record In the stored results the settings and results information of a test are available Others menu Press the Other key to switch to the auxiliary information menus In Others menu it provides the settings and examination to the auxiliary functions and instrument Following auxiliary information menus can be accessed by pressing the F1 F2 F3 and F4 softkeys including Autoconfigure Miscellaneous Power Manager Time amp Date RS232 Port Keyboard Test Self test Tester I nformation Due to
14. framing To overcome the limitations of the standard framing format issued above ITU T recommendation G 704 specifies that the use of a CRC 4 cyclic redundancy check for 2 Mb s systems CRC 4 framing provides reliable protection against incorrect synchronization and a means of monitoring bit error ratio BER during normal operation In other words CRC 4 framing algorithm is extremely unlikely to be fooled by payload data patterns The CRC 4 remainder is calculated on complete blocks of data and the 4 bit remainder is transmitted to the far end using the first bit in the FAS of each even numbered frame C1 C4 At the receiving end the receiver makes the same calculation and compares its results with those in the received signal If the two 4 bit words differ the receiving eguipment knows that one or more errors are present in the payload Every bit of the block is checked so an accurate estimate of block error rate or errored seconds is made while the link is in service To enable the receiver to locate the four bits C1 C2 C3 C4 forming the remainder an additional frame called the CRC multiframe is formed The CRC 4 multiframe comprises sub multiframes land II both of which comprise eight normal frames A CRC multiframe alignment signal is used to synchronize the receiver to this frame The signal is inserted bit by bit into the first bit position of the NFAS in frames 1 3 5 7 9 and 11 The CRC 4 multiframe alignment signal is 0010
15. function can be set to SIN or JE in Others menu When set as 2142 press the Backlight key to turn on the backlight and press the Backlight key again to turn off the backlight 2 3 Switch On 2 3 1 Switch on Inspection Steps Plugin AC adapter with the power cord the Charge indicator of this instrument will turn on e This instrument can be switched on after Power key has been pressed for about 1 second After switch on the LCD will display manufacturer s LOGO and the embedded software version information of the instrument About 1 second later the switch on process is completed and the LCD displays the settings menu after one beep e This instrument can be switched off by pressing the Power key again for 1 second When the battery has been fully recharged remove the AC power adapter After powering of battery this instrument can be switched on or off by pressing the Power key e Loopback the E1 input and output interface of the instrument with E1 752 unbalanced test cable e Switch on the instrument and check if LCD displays and LED indicators are abnormal e Select error insertion type as BIT Single and press the Single Err Add key to check if the instrument detects and operates properly e When the user receives the instrument at the first time please use the instrument until the battery is completely exhausted before giving it its first charge 2 3 2 Setting the Ti
16. menu later e Vievv lock unlock and delete the stored settings or results Press the Storage key to switch to Storages menu and choose Hamid MES to enter into the menus We will describe them respectively below 3 4 1 Settings in Storage Menu The instrument can save the settings of the test The user can directly recall those stored settings to set up the test The instrument provides sets of default settings when manufactured in factory Thus the user can simplify the setting process The instrument contains 7 sets of saved records in all The settings storage menu is as shown in Fig 27 In this menu the user can store the current settings of the instrument as well as check recall rename and delete stored setting information Storages a 5447151 P 1 2 CURRENT Mode TX RX lt O1 gt SETTING1 Mode TX RX a lt 02 gt SETTING2 Mode RX HI Z a lt 03 gt SETTING3 Mode THROUGH M 02 vacant setting storages SETTING NW RESULTS Fig 27 Settings storage menu Every stored settings record can be recalled The user could recall the stored settings and modify the settings then save it for the future use a Current Setting As shown in Fig 28 the current setting appears only in the first page When 91 45 is chosen displays as shown in Fig 29 will appear After named the current setting the instrument will save the setting as the name with CE lock followed 72 00
17. of the instrument to PC serial port with RS232 communication cable supplied e Switch on the instrument Set RS232 port state to 211 in Others menu e Run the TestManagerPro software on PC click Select button to choose the tester s type and click Connect button After the successful connection the user can upload view analyze delete print test results in the form of report and do other operations e Switch off the instrument after communication with PC e Pull out the RS232 communication cable Warning Be sure not to plug and unplug the communication cable alive when connecting PC serial interface to the instrument using the serial communication cable and be sure to ground or use ESD wrist strip Plug and unplug the communication cable alive may result in damage to PC or the serial interface of the instrument 2 4 2 Upgrading the Embedded Software Manufacturer will launch the latest version embedded software and host software 72 0049 00A 14 E1 BER Tester 2 Getting Started TestManagerPro in the website of our company for the users to download Make sure to visit our website freguently to ensure you will always get the software of latest version For the software upgrading method please refer to the relevant part of Communication with PC and follow instructions of the TestManagerPro Caution When performing the embedded software upgrading in order to prevent the instrument powered off caus
18. the results displays in El RX HI Z mode are different refer to the effects of framings on results as shown in Table 29 Result Unframed PCM30 PCM30CRC PCM31 PCM31CRC Errors Count e e e e e M 2100 Analysis e e e e Alarm Seconds e Signal Analysis e e N Event Records e e TS Analysis e e e e Table 29 Effects of framings on results in El RX HI Z mode a Errors Count Errors Count provides the full errors statistics for CODE FAS CRC4 and E BIT as shown in Fig 19 The relevant descriptions are shown in Table 30 72 0049 00A 38 El BER Tester 3 Navigating the Displays Results 00d00h15m25s WERRORS COUNT FAS errors CODE errors CRC4 errors E BIT errors Running Please wait ERRORS M 2100 ALARM COUNT ANALYSISBSECONDS Fig 19 Errors Count result menu The effects of framing on errors count are shown in Table 31 5 v vi v v Errors 2 BS S 33 Counter is Disabled b Counted E 5 AS 5 ae ounter is Disabled by 0 o o me m CODE e e e e e Loss of signal The framer is searching for FAS alignment and or FAS e e e e synchroniza tion at either the CAS or CRC4 multiframe level Loss of frame synchronization at either the FAS or CRC4 CRC4 level Loss of frame synchronization at either the FAS or E BIT e CRC4 level Table 30 Effects of framings on Errors Cou
19. the test pattern and pattern polarity of the local and far end instrument should be set identically in the far end mutual test VVhen making the measurements error can be inserted into the path to verify the operating status of the instrument including the transmitter and receiver VVhen making out of service BER testing vvith far end mutual mode if the test pattern or polarity of the far end instrument is undetermined the operator can use the autoconfigure function in the Others menu to help settings I n service Testing In applications when the service can not be interrupted such as the transmission of the real time accounting information mobile speech user should make the measurements in the in service testing mode In service testing provides monitoring error performance on FAS CODE CRC4 and E BIT In the measurements user can also make a listen to any speech channel and monitor timeslot data CCS or CAS signaling word frame data such as 72 0049 00A 57 El BER Tester 4 Performing Measurements FAS NFAS There are two in service testing mode including RX HI Z mode and Through mode RX HI Z mode testing connection is as shown in Fig 48 Through mode testing connection is as shown in Fig 49 MUX Multiplexer Demultiplexer High impedance gt El BER Tester Fig 48 RX HI Z mode in service testing El BER Tester Fig 49 Through mode in service testing Test De
20. they will be needed some time 2 2 Power Supply This instrument can be powered by external power supply or built in rechargeable batteries 2 2 1 External Power Supply The external power supply reguires a power source of 110V to 240V AC at a freguency between 50Hz to 60Hz nominal And the instrument reguires a nominal DC supply of 12V Plug the AC power cord into an appropriate AC wall outlet and connect the instrument with the supplied adapter cable And the instrument can be powered by the external power supply via the AC adapter 2 2 2 Rechargeable Batteries The rechargeable batteries will typically power the instrument for more than 6 hours with the backlight and testing mode selected The instrument uses 1 high performance Lithium Li ion rechargeable batteries placed in the battery case that may not be fully charged when the user receives the instrument Whatever the state of charge use the instrument until the battery is completed exhausted before giving it its first charge This will ensure 72 0049 00A 11 El BER Tester 2 Getting Started better accuracy from the battery charge indicator Warning Do not change the battery model Do not use non recharge battery in case that may cause the battery explosion or other danger Caution When the battery supplied for this instrument has been used expiring the charging life or are impaired they should be dealt with control If dealt with general waste processing system detain
21. used line code to perform the base band signal transmission in the digital networks HDB3 coding was adopted to eliminate the synchronization problems occurring with AMI In HDB3 format a string of four consecutive zeros is replaced vvith a substitute string containing an intentional BPV Bi Polar Violation AMI The line code is an Alternate Mask Inversion AMI coding is used to represent successive 1s in a bit stream with alternating positive and negative pulses A zero bit will not generate any pulse AMI coding is not used in most E1 transmissions because of synchronization loss during long strings of data zeros Table 6 Line Interface and Line Code parameter settings Caution Signal Loss alarm will be generated when transmitting unframed all 0 in AMI code The setting parameters of E1 framing are described in Table 5 The setting parameters of BERT pattern and Polarity are described in Table 7 72 0049 00A 21 E1 BER Tester 3 Navigating the Displays Item Option Descriptions 223 1 275 1 Pseudorandom Binary Sequence PRBS is suitable for bit error rate measurement PRBS simulates the random data 273 1 2251 running in the transmission network under test BERT pattern Fixed code or static binary code can simulate AIS 1111 and E TYY FD etc 16BIT 16 BIT is a user programmable word The instrument transmits and rec
22. will 72 0049 00A 3 E1 BER Tester 1 Overview need to verify quality of service in your netvvorks Plus signal quality measurements including frequency level and other functions to ensure your costly time consuming work performed guickly and efficiently The E1 BER Tester mainly provides the following functions e HDB3 and AMI line codes 750 Unbalanced 1200 Balanced and high impedance gt 2kQ option e Out of service framed unframed testing TX RX mode 2Mb s Nx64kb s BER testing Monitoring Signal Loss AIS Frame Loss Remote Alarm Remote MF Alarm CRC MF Loss CAS MF Loss Pattern Loss Alarms and BIT Code FAS CRC 4 E BIT errors Clock slips measurement e In service framed unframed testing RX HI Z and Through mode option Rx Hi Z and through mode testing Code FAS CRC 4 and E BIT BER testing FAS NFAS MFAS NMFAS timeslot activity monitoring CAS and CCS signalling monitoring e Freguency and offset measurement e Real time transmit circuit open short indication e Autoconfigure function E1 frame format BERT pattern the timeslots carried BERT pattern automatically detection and setting for El testing e Real time clock e BERT pattern PRBS Fixed Code and 16 BIT User Word e Errorinjection Single and Fixed Rate e Resetthe results to zero function e Manual and auto timer testing e Self check keyboard and LED testing e Historical alarm indication e Extensive beep and LED alarm indications e I
23. 00A 59 E1 BER Tester 4 Performing Measurements When making Nx64kb s BER testing if the timeslots carrying the BERT pattern in the received E1 signal which may be cross connected by DXC eguipment are undetermined the operator can use the autoconfigure function in the Others menu to help settings 4 2 4 Timeslot Analysis When performing in service testing RX HI Z or Through mode not only the error measurement can be tested but also the data and activities of all 64kb s timeslot and signaling words in E1 signal can be monitored Since the timeslot data always carry the speech information the instrument also provides the listen capability to all the voice channels Fig 46 and Fig 47 show the examples Test Description The settings are described in relevant parts of RX HI Z mode framed testing in Section 3 2 2 e Inthe result menu user can select the timeslot that needs to be monitored From the display both binary and hex format of the data are provided Please refer to Section 3 3 2 for details e The frame structure of PCM30 PCM30CRC PCM31 and PCM31CRC are described in Appendix A 72 0049 00A 60 E1 BER Tester 5 Technical Specifications 5 Technical Specifications This chapter introduces the technical specifications of all the interfaces in the E1 BER Tester 5 1 E1 Specifications 5 2 Other Specifications 5 1 E1 Specifications 5 1 1 General Measuring i
24. 00A 69 E1 BER Tester Appendix A El Frame Structure e Power supply failure e Codec failure e Failure of incoming 2Mb s signal e Frame alignment error Frame alignment signal error ratio gt 10 Bit 4 Bit 8 ITU T recommendations allow the S bits Sa4 to Sa8 to be used in specific point to point applications Bit Sa4 may be used as a message based data link for operations maintenance and performance monitoring The signal originates at the point where the frame is generated and ends where the frame is split up Bits Sa5 to Sa8 are all intended for national use and when unused are set to logic 1 Channel associated signalling CAS Once the multiplexer has gained frame alignment it searches in timeslot 16 for the multiframe alignment signal MFAS 0000 in bits 1 to 4 A multiframe consists of 16 frames and 0000 in bits 1 to 4 signifies the first of these frames The multiframe is only necessary when CAS is used that is PCM30 Timeslot 16 contains the information necessary for switching and routing all 30 telephone channels The signaling between the near end and far end multiplexer takes place using pulse signals comprising 4 bits ABCD These are generated by the signaling multiplex eguipment The 64 kb s signaling capacity of timeslot 16 is divided between the 30 telephone channels and two auxiliary channels synchronization and alarm message using pairs of 4 bit ABCD signaling words Over a complete multiframe all
25. 11 and is transmitted in the first bit of the NFAS word The first bits of frame 13 and 15 are called as E bits which are used to indicate a negative comparison that is data blocks with bits errors back from the far end to the transmitter If the E bit in frame 13 is O then there is an error in sub multiframe SMF I The E bit in frame 15 indicates error status from sub multiframe II in the same way Each sub multiframe in the CRC multiframe consists of eight standard PCM frames and is 1 ms 8 x 125 us long That means there are one thousand CRC 4 error checks made every second CRC 4 error checking is very reliable because at least 94 of errored blocks are detected Another powerful feature CRC 4 framing provides is the local indication of alarms and errors detected at the remote end When an errored SMF is detected E bits are changed from 1 to 0 in the return path multiframe The local end therefore has exactly the same block error information as the far end CRC 4 checker Counting E bit changes is equivalent to counting CRC block errors Consequently the local end can monitor the performance of both go and return path This can be carried out by the network equipment itself or by suitable test equipment monitoring the received 2 Mb s stream In the same way the A bits return error alarm signals for loss of frame loss of synchronization or loss of signal from the remote end The CRC 4 frame structure is preferred format because of
26. 30 channels are serviced Timeslot 16 can accommodate a pair of 4 bit ABCD signaling words This ensures that all 30 channels are serviced over a complete multiframe Common channel signalling CCS If CCS is used multiframe alignment is unnecessary Timeslot 16 is simply used as a 64 kb s data channel for CCS message or it can be turned over to revenue earning traffic giving a total of 31 channels for the payload PCM31 Limitations of the standard framing format When the 2 Mb s frame is used exclusively for PCM voice transmission the frame alignment criteria is very reliable However it has some limitations particularly for data transmission and on line performance monitoring With data transmission the traffic can inadvertently simulate the frame alignment and non frame alignment words and false framing is possible This can have a serious effect on the data Performance monitoring of received signal is limited to checking for errors in the frame alignment signals This gives a poor indication of errors in the payload as only seven bits in 256 are being checked There is no way for the remote end to send back this rudimentary error performance data so only one direction of transmission can be monitored at each location In an age of increasingly competitive digital leased line service this is inadeguate 72 0049 00A 70 E1 BER Tester Appendix A El Frame Structure 11 PCM3OCRC PCM31CRC Frame Format ITU T G 704
27. 32 Port menu RS232 Port Option Description en The instrument can communicate with PC via the RS232 interface Port State em The communication with PC via RS232 interface will be prohibited Table 37 RS232 Port configurations Caution Before communicating with PC make sure to set the RS232 port as IN When the RS232 port state is configured as GIN other operations of the instrument will be disabled The displays will be locked temporarily before the port state becomes eJaa Please disable the port state as SIJ when the communication with PC is completed to perform other operations 72 0049 00A 52 El BER Tester 3 Navigating the Displays 3 5 5 Time Date When recording the results it is necessary to time stamp the certain events The operator can set the time and date in the menu as shown in Fig 41 And the time and date setting parameters are described in Table 38 Others m TIME s DATE Clock mode RUN Date 2005 12 20 Time 11 40 40 Accessorial system functions RS232 TIME KEY BOA PORT amp DATE RD TEST gt gt Fig 41 Time amp Date menu Time amp E Date Option Description RUN To run the new real time clock after the modification of the date and Clock time Mode Sj To modify the date and time of the instrument Year To select between 2000 2099 Date Month To select elect between 01 12 Day To select elect
28. 40 o Ageing 2 ppm per year typical Deviation 999 ppm 2 048 MHz 200 ppm binary clock or 2Mbit s HDB3 signal BIT CODE FAS CRC4 E BIT Single 1E N N 2 7 2 048Mbit s 999 ppm G 703 specs 450 ppm HDB3 AMI Conforms to ITU T G 703 Table 6 TX RX 750 unbalanced 1200 balanced o RX HI Z gt 2KQ unbalanced balanced o Through 750 unbalanced 1200 balanced gt 43dB Binary Clock Input 2 048 MHz Sguare ware TTL o 2M bit s Signal Input HDB3 750 unbalanced FAS NFAS MFOTS16 Timeslot data Timeslot activity VF tone freguency and level measurement 62 E1 BER Tester 5 Technical Specifications 5 2 Other Specifications Serial Port Battery AC Power Adapter Dimension Weight Operating Temperature Storage Temperature Humidity 72 0049 00A RS 232 Baud Rate 19 2 Kb s Character Length 8 bit Parity None Stop Bits 1 bit 3 7x2V Lithium rechargeable battery 1000 mAh Input AC 100V 240V 10 50 60 Hz 0 45A Output DC12V 1 5A 230mmx72 116mmx46mm LxWxH 760g 0 40 C 30 70 596 90 non condensing 63 El BER Tester 6 Working with TestManagerPro 6 Working with TestManagerPro This chapter briefly describes the software functions system configurations and running environment install and uninstall the software on the PC and how to use TestManagerPro software 6 1 Software Functions 6 2 System Configuration and Runni
29. 49 00A 44 El BER Tester 3 Navigating the Displays Storages m SETTINGS 1 P l 2 ALO 1 Mode TX RX lt 01 gt SETTING1 Mode TX RX a lt 02 gt SETTING2 Mode RX HI Z a lt 03 gt SETTING3 Mode THROUGH H 02 vacant setting storages STORE Fig 28 Current setting Edit record s name Name 19094303 01234567 8 9ABCDEFGH I J KLMNOPO RS TUVWXYZ Use default name DDHHMMSS SELECT DELETE EY EXIT Fig 29 Edit the record s name Caution If the stored setting is marked with 02 user can only make the activities of view recall and unlock If the stored setting is marked with user can make the activities of view recall lock rename and delete The capacity of settings storage is limited The maximum number of stored settings is 7 among which 6 sets are available as system default settings and 1 sets left to the user to define If the user wants to save more settings it is necessary to delete existing stored ones firstly then directly save the results or save the Current setting The default name of the stored setting given by the instrument is identified as the current time in the string format of Date Hour Minute Second such as 18154947 b Stored Settings The stored settings are as shown in Fig 30 The user can view recall lock or unlock stored setting records When in unlock status the instrument can rename and delete the 72 0049 00A 45 El BER Tester 3 Na
30. AO Timeslot select TS 01 Data 10101010 AAH Running Please wait Hats TS16 MOT ACTIVITY Fig 25 TS Monitor in TS Analysis 72 0049 00A 42 E1 BER Tester 3 Navigating the Displays S When performing TS Analysis all data that displayed in the result menu will a be upgraded in every one second so is to timeslot data ACTIVITY Activity is valid for all framings and provides the activity monitoring for all 64kb s data channel In PCM30 or PCM30CRC timeslot 16 contains the frame alignment of multiframe information necessary for switching and routing all 30 telephone channels So it is not valid for timeslot activity monitoring All timeslot activities are displayed with Busy and dle Caution The busy or idle status of timeslot is achieved by monitoring the 8 bit data of every timeslot in real time If the 8 bit data of certain timeslot is consistent with the idle code which can be set in Settings menu of the instrument then that timeslot status is idle otherwise it is busy as shown in Fig 26 64kb s data channel are more frequently used than the traditional speech channels in El signals So the method to make estimation of channel activities is transmitted from traditional 4 bit signaling ABCD word monitoring to timeslot data monitoring In the instrument the status of timeslot idle can be defined by programming the idle pattern in Settings menu
31. CRC in Fig 34 C1 C2 C3 C4 eS bits in FAS will vary with CRC data and Si bits in NFAS will be fixed as 001011 MFRAME is only valid for PCM30 or PCM30CRC framing In this menu the user monitor the result of MFAS and NMFAS word and 4 bit ABCD signalling words TSO1 TS15 TS17 TS31 as shown in Fig 23 4 pages in all 72 0049 00A 41 El BER Tester 3 Navigating the Displays Results 00d00h15m25s a TS ANALYSIS INA TTO P 1 4 MFAS 0000 NMFAS 1011 ABCD ABCD ABCD TS01 0000 502 0000 TS03 0000 TS04 0000 TS050000 506 0000 Running Please wait 333 BR R ACTIVITY Fig 23 MFRAMEFE in PCM30 CRC framing e TS16 TS16 is only valid for PCM31 or PCM31CRC framing In this menu the user can monitor the data of timeslot 16 in FO1 F16 multiframes as shovvn in Fig 24 3 pages in all Results 00400h15m25s A TS ANALYSIS 0252 P 1 3 MSB LSB MSB LSB FO1 11111111 FO2 11111111 FO3 11111111 FO4 11111111 FO5 11111111 FO6 11111111 Running Please wait TS16 Pete ACTIVITY Fig 24 TS16 in PCM31 CRC framing e TS Monitor TS Monitor is valid for all framings It provides 64kb s data channel monitoring updated every one second and speech timeslot listen capability The 8 bit binary word and hex word of the timeslot selected will be displayed in real time as shown in Fig 25 Results 00400h15m25s H TS ANALYSIS TLu Ue
32. CRC MF loss e e Table 27 Effects of framings on alarm seconds counts 72 0049 00A 36 E1 BER Tester 3 Navigating the Displays f Signal Analysis Signal Analysis provides the real time signal measurement of received E1 signal including Rx line rate freguency offset and signals level There is only 1 page in Signal Analysis menu as shown in Fig 17 The displays of Signal Analysis in E1 unframed and framed testing is same The relevant results are described in Table 28 Results 00400h15m25s A SI GNAL ANALYSI S Rx line rate 2048000Hz Rx frequency offset OPPM Rx signals level 3 7dB Running Please wait ALARM SIGNAL EVENT SECONDS ANALYSI S RECORDS Fig 17 Signal Analysis result menu Result Item Description The freguency of received 2048kb s signal relative to the internal Rx Line Rate reference clock The frequency needs to comply with the limits specified in 2048000Hz 50ppm Signal Freguency offset of received 2 Mb s signal relative to the internal Rx Freguency rs NETAS 5 reference clock The offset needs to comply vvith the limits specified in ITU T G 703 lt 50ppm Rx Signal The level is measured of received 2 Mb s signal in the range Level 2 5dB 43dB with the step of 2 5dB Table 28 Signal Analysis result menu description g EventRecords During the test if an error or an alarm occurs in the resolution time which i
33. El BER Tester 6 Working with TestManagerPro e Connect RS232 communication cable between the integrated RS232 port with the serial port of your PC e Switch on the instrument and set RS232 Port State as ON Click Select icon in the short cut bar or in the Manipulation menu to choose the type of instrument which you are working with e Click Connect icon in the short cut bar or in the System menu to make the connection with the instrument e After connecting successfully user can do the operations as below Upload the stored results Click Upload icon in the short cut bar or in the Manipulation menu to upload the stored results from the instrument View the uploaded results Click View icon in the short cut bar or in the Manipulation menu to check the detailed information of every uploaded results in the software If there has a graph result user can also view the histogram analysis of the error and alarm events In addition user can delete and print any result Clean up all uploaded results in software Click Clean Up the Records the System menu to delete all the uploaded results of one instrument in the list Upgrade the embedded softvvare Click Upgrade embedded software the System menu to update the embedded software of the selected instrument First step Click Read button to read out the type and software version of the selected instrument
34. GAO 2128 El BER Tester USER S MANUAL El BER Tester Contents Contents 1 Overvlevv cccccocococoncnronnncnrncnnrnrnnnn carac nara annan annan aran rara nan rara nnnrarnnnnrarananrananianos 3 TT Symbol Descriptor Em 3 1 27 PUE A ao 3 1 3 Ordering IOMA aaa 5 1 4 Product Compositions eee Ad 6 1 5 Functional Keyboard san A PHS TS N IN a ei 7 1 6 LED IMdicatorS c a aa a ante a s a a bi 8 1 7 ECD j1CONMINGICATIONS ses 10 2 Getting Started l a ll lll 11 2 1 Unpacking CHECK sss csecc esgeas ara EPT xas do Rap NI AERE RIESA 11 2 2 eki 11 AS 13 2 4 Communication With 14 PS A Ema ka R kata a kasvan VAN 15 3 Navigating the Displays y y y y nananana KaKa Kaanaan Kana KA Ka aaann 18 3 1 Menu OVC EW sua tasaa maa Eeva v van PAHA TAKA PE r EEE AK asta yay 18 3 2 Settings Menu science vrei eine hae AA AAA AAA 19 3 3 Results Menu ieis A a a a a 28 3 4 Storages MenUmmssss t it k tt ttitteiytsiytitytsittyiyseiytsiy etytsiyteiyt yts 43 3 91 Others Menu A noh ee ad in mn i n AR As 48 4 Performing 5 ana Kan A Ka ayyy KA Kaanaan 56 OVA Wi AA oat asin 56 4 2 Perform the 65 Hee eet tena n
35. NT ANALYSIS RECORDS Fig 20 TS Analysis result menu TS Analysis Framing result item PCM30 PCM30CRC PCM31 PCM31CRC FAS NFAS e e e e Mframe e e TS16 Analysis e TS Monitor e e N N Activity e e e N Table 31 Effects of framings on TS Analysis e FAS NFAS FAS NFAS analysis result menu displays specific contents according to the CRC4 and non CRC4 framing Before the measurement the user should know the framing used by the equipment under test so as to understand the FAS NFAS analysis result menu in specific framing The frame structure of PCM30 PCM30CRC PCM31 and PCM31CRC are described in Appendix A E1 Frame Structure FAS NFAS analysis displays of PCM30 or PCM31 framing is as shown in Fig 21 72 0049 00A 40 E1 BER Tester 3 Navigating the Displays Results 00d00h15m25s DENS FAS NFAS Si FAS FAS 00011011 Si A Sa4 Sa8 NFAS 00011011 Running Please vvait ja mun Sate ACTIVITY Fig 21 FAS NFAS in PCM30 31 framing FAS NFAS analysis displays of PCM30CRC or PCM31CRC framing is as shown in Fig 22 3 pages in all Results 00d00h15m25s a UMAN FAS NFASI P 1 3 SMF1 SMF2 0 FAS 00110111 00110111 1 NFAS 00110111 00110111 3 FAS 00110111 00110111 Running Please wait ere r Ti ACTIVITY Fig 22 FAS NFAS in PCM30CRC 31CRC framing AN When making a test with PCM30CRC or PCM31
36. ONFI GU MANAGER gt gt Fig 36 Autoconfigure function is not provided Caution In the test mode that supports autoconfigure function the parameters such as Interface Code Resolution Storage Duration can not be auto configured with autoconfigure function These parameters can only be set in manual by the operator Before the autoconfigure function is performed please set these parameters manually if needed 72 0049 00A 49 E1 BER Tester 3 Navigating the Displays Caution When performing the autoconfigure function the instrument needs to detect and analyze the received data and clock signals So before using the autoconfigure function be sure the right signals are present on the receiver of the instrument 3 5 2 Miscellaneous Miscellaneous menu is as shown in Fig 37 and Fig 38 Move the cursor to the position of Beep on alarm Keyboard lock Display EFS or EFS Adjust LCD contrast Language and Load default settings parameters to perform the selection the relevant parameters description are described in Table 35 Others SSRIS P 1 2 Beep on alarm Keyboard lock Display EFS or 96EFS Adjust LCD contrast Accessorial system functions AUTO POVVER CONFI GU MANAGER gt gt Fig 37 Page 1 of Miscellaneous menu Item Option Description en Beep on alarm and error Beep on alarm OFF No beep on alarm and error anyw
37. TU T G 821 G 826 and M 2100 performance analysis e Histograms analysis of error and alarm events e Upgradeable software via an RS232 interface 72 0049 00A 4 El BER Tester 1 Overview e Up to 99 days continuance test performance e More than 6 hours measurement operation from a single battery charge e Save Recall of up to 7 user defined setups and 10 results e Test results could be uploaded conserved and printed by TestManagerPro e Built in NiMH rechargeable batteries can be charged with automobile cigarette lighter battery adapter 1 3 Ordering Information When user receivs the instrument please check the tester and its accessories carefully to make sure whether the received one meetingthe purchasing reguirements or not If user finds any optional test function lacked or wants to add some options after a period of the operation please contact with the vendor in time We will service the instrument as soon as possible lt Standard configuration list of the E1 BER Tester E1 BER Tester Embedded Softvvare Built in AC Povver Adapter TestManagerPro Setup CD Automobile Cigarette Lighter Battery Adapter Cable Li ion Rechargeable Batteries Built in E1 750 Unbalanced Test Cable Waterproof Package El 1200 Balanced Test Cable Ouality Certificate Card RS232 Communication Cable Maintenance Card User s Manual Packing List Table 1 Standard co
38. age of the available time in seconds DM The number of degraded minutes DM during the test period A degraded minute is a 60 second 1 minute composite interval during the available time excluding severely errored seconds over vvhich the error ratio is worse than 10 DM The number of degraded minutes expressed as a percentage of the total number of elapsed minutes of available time UAS Unavailable Seconds UAS is the number of unavailable seconds during a test period A system becomes available when the error ratio measured in 1 second intervals is better than the severely errored second threshold for 10 or more consecutive seconds A system becomes unavailable when the error ratio measured in 1 second intervals is greater than the severely errored second threshold for 10 or more consecutive seconds UAS The number of unavailable seconds during a test period expressed as a percentage of the total number of elapsed seconds c Table 22 G 826 Analysis G 821 Analysis in E1 TX RX mode G 826 Analysis performs result statistics of errored block seconds EBS and EBS severely errored block seconds SEBS and SEBS background blocks errors BBE and BBE unavailable time UAS and UAS for BIT errors Since G 826 Analysis counts the errors based on the continuous serial data blocks over the rate of 2048kb s G 826 Analysis is not provided in E1 fr
39. ake analysis of El synchronization framing data and signalling and detect E1 on line alarm and monitor any timeslot data Therefore Through mode is normally recognized as an effective tool for a long term on line monitoring 3 3 Results Menu After setting up the measurement parameters the user can start a test with the instrument by pressing the Start Stop key When performing the measurements the Start Stop LED indicator turns on then press the Result key to display all the results The Results menu has different displays under various test modes And we will describe them respectively according to different test settings 3 3 1 Results Menus in E1 TX RX Mode The Results menus in E1 TX RX mode provide full measurement analysis including Basic Analysis G 821 Analysis G 826 Analysis M 2100 Analysis Alarm Seconds Signal Analysis Event Records and so on Press F1 F2 F3 and F4 softkeys to select the analysis displays accordingly in the menu As the specific framing has been chosen the results displays in E1 TX RX mode are different Please refer to the effects of framings on results as shovn in Table 15 n a o o gt o gt Dm 5 20 Lo Lo aN S y mu o vp s SP GS Go a3 z as 22 Framing 9 W a wo n a m o Unframed e e e e e PCM30 o o o o o o o PCM30CRC e e e
40. amed testing There is only one page in this analysis as shown in Fig 14 The effects of alarms on errored block counts in G 826 Analysis are as shown in Table 23 Signal Loss AIS Pattern Loss EBS SEBS Table 23 Effects of alarms on ES SES in the unframed E1 72 0049 00A 32 El BER Tester 3 Navigating the Displays Results 00d00h15m25s EAFA EBS SEBS BBE UAS Running Please wait BASIC G 821 G 826 ANALYSISBANALYSISBANALYSIS Fig 14 G 826 Analysis result menu in E1 TX RX mode The relevant result analysis items of G 826 Analysis are described in Table 24 Result Item Description ES Errored Block Seconds EBS are counted for all sources over total elapsed time EE The number of errored block seconds counted over the available time expressed as a percentage of total elapsed time of a test period in seconds The number of severely errored block seconds SEBS is counted over the SES available time A severely errored block second is a second vvhich has an errored block ratio vvorse than 3096 ASES The number of severely errored block seconds SEBS expressed as a percentage of the available time in seconds during the total elapsed time G 826 ABE Background Block Errors are counted for the errored blocks not occurring as a part of an SES BBE The ratio of errored blocks to total blocks during a fixed mea
41. an reach the position with Backlight Turn on or off the LCD backlight according to the light condition Povver Svvitch on or off the instrument Table 2 Functional keys descriptions 1 6 LED Indicators The E1 BER Tester has 10 status and alarm LED indicators in all including 2 status indicators and 8 alarm indicators mainly indicating the current operating status of instrument and if any alarm is detected during the test process The arrangement of the status and alarm LED indicators is as shovvn in Fig 3 SIGNAL LOSS 69 FRAME LOSS AIS O MFRAME LOSS PATTERN LOSS O REMOTE ALARM ERRORS O CHARGE START STOP LOW BATTERY Fig 3 Status and Alarm LED Indicators Status and alarm LED indicators will reflect the current testing status in real time By the indication of LED we can make a judgement of the testing status intuitively And this will help the operator in understanding and resolving the problems during a test 72 0049 00A 8 E1 BER Tester 1 Overview Status and alarm LED indicators are described as in Table 3 LED Name Description Status I ndicator START STOP As Start Stop key keeps changing status this indicator turns on green vvhen the test is started and turns off vvhen the test is stopped CHARGE The instrument embeds rechargeable batteries and a rapid charging circuit This indicator turns on orange when the inst
42. ay To lock the START STOP key can not be used when the test has not been started yet the START STOP indicator turns off Only valid after the test is started the START STOP indicator turns on Keyboard lock OFF Release the keyboard lock ES Error free second displays as the number of count Display EFS or EFS EFS Error free second displays as a percentage of the elapsed seconds EB To select simplified Chinese displays Language EMS To select English displays 72 0049 00A 50 El BER Tester 3 Navigating the Displays Oth ers Load default A Restore the instrument with the default factory settings settings YES y 9 To adjust the contrast of LCD with a step value of 1 or 10 The Adjust LCD HE El default value is 200 If the value is set exceeding to the contrast Mm SN limitation the instrument will reset the contrast value to 200 after the restart of the instrument Table 35 Miscellaneous configurations m MESTIS P 2 2 Language Load default settings ON ENGLISH Accessorial system functions AUTO POWER CONFI GU MANAGER gt gt Fig 38 Page 2 of Miscellaneous menu 3 5 3 Power Manager As shovn in Fig 39 the instrument provides the functions to save the povver Povver Manager menu allows the user to set Auto power off Auto backlight off para
43. between 01 31 Hour To select elect between 00 23 Time Minute To select elect between 00 59 Second 1 To select elect between 00 59 Table 38 Time amp Date configurations 3 5 6 Keyboard Test Keyboard Test function can detect whether the keyboard of the instrument functions properly or not Except for the Povver key all other functional keys can be tested As shown in Fig 42 the keyboard test can be performed one by one according to the prompt information in displays In the process of keyboard test all the functional keys including the Povver key are locked and only valid for use after the test 72 0049 00A 53 El BER Tester 3 Navigating the Displays Others MAGIA Perform the test Accessorial system functions RS232 TIME KEY BOA PORT amp DATE RD TEST gt gt Fig 42 Keyboard Test menu Caution In the keyboard test if no key stroked by user then the instrument will keep waiting When the correct key is stroked the keys prompted under test will display V and the wrong keys will display x until all the process is completed Please follow the prompt information to stroke the corresponding key until the test is completed Until the keyboard test is completed user can not exit 3 5 7 Self Test Before making measurements user can run self test to ascertain the integrity and functions of the instrument As shown in Fig 43 th
44. ceive direction of the equipment under test is also called as Remote The relevant result analysis items of M 2100 Analysis are described in Table 25 Result Item Description Non CRC4 A second containing 1 or more errors from 1 or more sources gt 1 Signal loss 1 Frame loss gt 1 AIS gt 1 Framing errored FAS gt 28 frame bit errors ES A second containing 1 or more errors from 1 or more CRC4 Framing sources gt 1 Signal loss gt 1 Frame loss 1 AIS gt 1 CRC4 2100 errors 2 805 CRC4 errors NENAS Non CRC4 A second containing 1 or more errors from 1 or more Rx sources gt 1 Signal loss gt 1 Frame loss gt 1 AIS gt 28 Direction Framing frame bit errors SES A second containing 1 or more errors from 1 or more CRC4 Framing sources 1 Signal loss 1 Frame loss gt 1 AIS gt 805 CRC4 errors UAS Same with UAS description in Table 24 Non CRC4 A second containing 1 or more errors from RDI source gt 1 Framing Remote alarm ES JA second containing 1 or more errors from 1 or more CRC4 Framing MET sources gt 1 Remote alarm gt 1 E BIT errors METAS Non CRC4 A second containing 1 or more errors from 1 or more Tx sources gt 1 Remote alarm Direction SES Framing 1 A second containing 1 or more errors from 1 or more CRC4 Framing sources gt 1 Remote alarm 805 E BIT errors UAS Same with UAS de
45. charge When you find the working duration is reduced in evidence you should replace the rechargeable batteries Do not put the old and new batteries in use together or use some bad or unconfirmed rechargeable batteries 6 Get more help If you have any other guestions please contact with your local vendor by phone or by emails as soon as possible Warning If you find that the instrument works abnormally please contact your vendor as soon as possible Do not open the instrument by yourself If the frangible pastes around the instrument are damaged or have been removed user would lose the 1 year free maintenance service 72 0049 00A 68 E1 BER Tester Appendix A El Frame Structure Appendix A El Frame Structure I PCM30 PCM31 Frame Format ITU T G 704 G 706 1 frame 32 timeslots 125us LES TS TS TS MIEN TS TS TS TS Oy 1 2 15 444 17 29 30 31 Channels Channels 1 to 15 16 to 30 8 bit word FAS word structure Bit 1 Si is reserved for international use The remaining bits are used for frame sync and are always set to 0011011 NFAS word structure Bit 1 Si is reserved for international use Bit 2 is always set to 1 Bit 3 of the NFAS contains the A bit which indicates a remote or distant alarm for example far end multiplexer out of synchronization Bit 3 O indicates normal operation no alarm Bit 3 1 indicates that one of the following fault conditions has occurred 72 0049
46. cy after the result is uploaded into the TestManagerPro The error and alarm events will be recorded with the resolution of 15 Resolution MEQ minutes The histogram of event records can be zoomed in as 15 minutes accuracy after the result is uploaded into the TestManagerPro The error and alarm events will be recorded with the resolution of 1 POT hour The histogram of event records can be zoomed in as 1 hour accuracy after the result is uploaded into the TestManagerPro Table 11 Resolution parameter settings Page 2 of Setting menu in TX RX mode Unframed Press the PgDn key to enter into the page 2 as shown in Fig 7 Move the cursor to the positions to set Storage and Resolution parameters and select the parameters by pressing F1 F2 F3 F4 softkeys Settings P 2 2 19 38 20 m Tx clock I NTERNALII Error add BIT RATE 1E 2 Resolution 1MIN Storage ON Duration TIMER 01 MIN Start 2006 10 28 10 25 36 Tester is ready for use Fig 7 Page 2 of Settings menu in TX RX Unframed 72 0049 00A 23 E1 BER Tester 3 Navigating the Displays The setting parameters of Storage are described in Table 12 The setting parameters of Resolution are described in Table 13 Item Option Descriptions Storage YES Save the test result The menu to save the result vvill pop out vv
47. displays of unframed and framed El testing in G 821 Analysis are same as shown in Fig 13 Results 00d00h15m25s 821 515 5 SES DM UAS Running Please wait BASI C G 821 G 826 ANALYSI SANALYSI S ANALYSIS RX mode Fig 13 G 821 Analysis result menu in E1 TX The effects of alarms on error counts in G 821 Analysis results of the framed and unframed El testing are as shown in Table 20 and 21 Signal Loss AIS Pattern Loss ES SES t Table 20 Effects of alarms on ES SES in the unframed E1 72 0049 00A 31 E1 BER Tester 3 Navigating the Displays Signal Loss Frame CAS CRC Pattern AIS Frame Loss Loss Frame Loss Loss ES SES Table 21 Effects of alarms on ES SES in the framed E1 The relevant result analysis items of G 821 Analysis are described in Table 22 Result Item Description ES Asynchronous errored seconds ES are counted over the available time ES Asynchronous errored seconds counted over the available time expressed as a percentage of the available time in seconds SES The number of severely errors seconds SES is counted over the available time A severely errored second is a second which has an error ratio worse than the threshold 107 SES The number of severely errored seconds SES expressed as a percent
48. e PCM31 e e e e e e PCM31CRC e e e e Table 15 Effects of framings on results in El TX RX mode 72 0049 00A 28 E1 BER Tester 3 Navigating the Displays The results menu of Basic Analysis G 821 Analysis G 826 Analysis M 2100 Analysis Alarm Seconds Signal Analysis Event Records in E1 TX RX mode will be described respectively below in detail a Basic Analysis Basic Analysis performs result statistics of error count error free seconds current error ratio average error ratio for BIT FAS CODE CRC4 and E BIT errors and errored block count and background errored blocks only appears when unframed testing is chosen for BIT errors Basic Analysis results menu is as shown in Fig 12 The relevant result analysis items are described in Table 16 Result Analysis Item Description Errors are counted for all sources over total elapsed time Counting Errors may be inhibited under certain alarm conditions see Effects of Alarms on Basic Errors below Error Free Seconds are counted for all sources over total elapsed time ERS Counting may be inhibited under certain alarm conditions see Effects EFS of Alarms on Basic Errors below Error Free Seconds is the number of error free seconds during a test period expressed as a percentage of Basic the elapsed seconds Current Current
49. e instrument self test is performed one by one according to the CPU control external 1 control Memorizer control FPGA logic control DSP arithmetic control LED light control XPLD program version and etc User can exit the test when the test has completed Others SELF TESTI Perform the test Accessorial system functions SELF TESTER WPRODUC TEST INFO ER INFO gt gt Fig 43 Self Test configurations During the self test the instrument will self detect the LED indicators with the steps of turning on all CPU controlled LEDs then turning all of them off and finally turning on SIGNAL LOSS FRAME LOSS AI S MFRAME LOSS PATTERN LOSS REMOTE ALARM ERRORS START STOP and LOW BATTERY indicators in sequence User 72 0049 00A 54 El BER Tester 3 Navigating the Displays can check if the LED indicator is functioning properly according to the above procedures If user finds one LED indicator can not be turned on or off the LED indicator may be damaged or out of control In that case please contact the instrument supplier as soon as possible Since the CHARGE LED indicator is not controlled by CPU therefore this LED can not be checked by self test Caution It will display V followed with the test item if the function is ok and display x if the function is failed User can not exit the self test until the test has completed 3 5 8 Tester Info
50. e tenet 56 5 Technical 5 61 sli El Speciheat cnsa aa a o 61 O a a 63 6 Working with TestManagerPro y aa Kaan aan a KA aaa daaa 64 6 1 lt SOIWareikUNctiONisSsmmimakossesukamakksuma takaa TOMIA aaa 64 6 2 System Configuration and Running 64 6 3 Install and Uninstall the Software on the PC sss eee enna es 65 72 0049 00A 1 El BER Tester Contents 6 4 How to Use TestManagerPro 65 7 naa naa naan naan KAKA aa naan nan KA KAKA iaia 68 Appendix A El Frame Structure ana naan ana Kanaan KaKa KA Kanaan 69 PCM30 PCM31 Frame Format ITU T G 704 G 706 69 11 PCM30CRC PCM31CRC Frame Format ITU T G 704 7 Appendix B Glossary AKA UKA Kana aa daa a 73 72 0049 00A El BER Tester 1 Overview 1 Overvievv This chapter briefly describes the symbols in the manual product overvievv ordering information product compositions functional keyboard LED alarm and status indications LCD icon indications for the instrument 1 1 Symbol descriptions 1 2 Product overview 1 3 Ordering information 1 4 Product compositions
51. ed by the battery exhausted it is strongly recommended to use external AC power supply to power the instrument 2 5 Safety Precautions The following general safety precautions must be observed during all phases of operation service and repair of this instrument Failure to comply with these precautions or with specific warnings elsewhere in this manual violates safety standards of design manufacture and intended use of the instrument The manufacturing company assumes no liability for the customers failure to comply with these reguirements Warning Do not operate damaged eguipment Whatever it is possible that the safety protection features built into this product have been impaired either through physical damage excessive moisture or any other reason remove power and do not use the product until safe operation can be verified by service trained personnel If necessary return the product to your vendor and service office for service and repair to ensure the safety features are maintained 2 5 1 External Power Requirements Please use the supplied AC adapter when operating with the instrument or charging the battery The supplied AC power adapter requires a power source of 100V to 240V at a freguency between 50Hz and 60Hz nominal AC Input 100V 240V 50 60 Hz Max 0 45A The AC adapter will output a DC power of 12V to the instrument DC Output 12V Max 1500mA VVarning Do not use other AC power adapter to pro
52. ed in the instrument they will harm the instrument The waste batteries contain Lithium and must be recycled or disposed of properly at special recycling station or hazardous waste collection center Replacement of Rechargeable Battery A new rechargeable battery can be charged and discharged for about 500 800 times before it can not be used any more Normally the fully charged batteries could support the instrument continuous 6 hours working depending upon the test settings So when the operating duration of the battery is apparently reduced the batteries should be replaced It is strong recommended that the rechargeable batteries should be replaced every one or two years The Lithium recharge battery may become invalid after no used for a long time It can only be reused after reactivation Warning When installing the battery compartment back to the battery case frame please ensure not to push overexerted which if not will result in impairing the battery case frame or making the battery shrapnel damaged 2 2 3 Charging the Battery To recharge the battery plug in the charger using an appropriate adapter supplied Normally the battery will be fully charged after 2 5 hours In exceptional circumstances where the battery may have become deeply discharged a charge time of 24 hours may be reguired Note that the instrument can be used while the battery is charging During rapid charging the Charge LED indicator turns on Whe
53. ed testing FAS Insert Frame Alignment Signal errors Valid only under the framed testing Error CODE Insert CODE errors Valid only under the AMI line code type add type a Insert CRC4 errors Valid only under framed testing with CRC4 frame structure E BIT Insert E BIT errors Valid only under the framed testing with CRC4 frame structure Table 9 Error add type parameter settings 72 0049 00A 22 El BER Tester 3 Navigating the Displays Item Option Description Press the Single Err Add key on the keyboard to inject one error per time Every time this key is pressed one error such as BIT FAS CODE SMS E BIT CRC4 will be inserted to the transmit data stream by the transmitter ERRORS indicator turns on for one time if the error inserted by the Error transmitter is looped back to the receiver add Errors are injected at the constant fixed rate such as HH 132 MET RATE ES 13 12 In the mean time the ERRORS indicator turns on with if the error inserted by the transmitter is looped back to the receiver OFF Error insertion is forbidden and pressing the Single Err Add key is invalid Table 10 Error add parameter settings Item Option Description The error and alarm events will be recorded with the resolution of 1 MYM minute The histogram of event records can be zoomed in as 1 minute accura
54. eives PRBS code according NORMAL to the normal 1 or 0 polarity Code 1 is transmitted as 1 and code O is transmitted as 0 Polarity The instrument transmits and receives PRBS code according I NVERTED to the reverse polarity Code 1 is transmitted as 0 and code 0 is transmitted as 1 Table 7 BERT Pattern and Polarity parameter settings When performing a BERT test with the other instrument at far end the BERT pattern or polarity received may be undetermined the operator could choose autoconfigure function in Others menu Please refer to the introduction of autoconfigure hereinafter When the BERT pattern polarity transmitted is undetermined the operator could switch to the reverse pattern polarity for matchment The setting parameters of Frequency deviation are described in Table 8 The setting parameters of Error add type and Error add mode are described in Table 9 and Table 10 The setting parameters of Resolution are described in Table 11 Item Option Description Tx AW The EI transmit clock is sourced from the internal crystal cik 323243 The El transmit clock is derived from the received signals at the receiver Table 8 Transmit clock parameter settings Item Option Description BIT Insert bit errors Valid under various of unframed and fram
55. g container A double wall carton made of 250 pound test material is adeguate e Usea layer of shock absorbing material 70 to 100 mm 3 to 4 inch thick around all sides of the instrument to provide firm cushioning and prevent movement inside the container Protect the Front Panel controls and Front End connectors with cardboard e Seal shipping container securely 2 5 6 Maintenance Requirements Maintenance appropriate for the operator is Cabinet Cleaning Clean the cover using a damp cloth only Battery Replacement See Section 2 2 2 Warning No adjustable components and operator serviceable parts inside Refer service to qualified personnel to prevent electrical shock Do not remove covers 72 0049 00A 17 E1 BER Tester 3 Navigating the Displays 3 Navigating the Displays This chapter first briefly gives an overview of the four main operating menus and then explains the relative operations of these four main operating menus in details 3 1 Menu overview 3 2 Settings menu 3 3 Results menu 3 4 Storages menu 3 5 Others menu 3 1 Menu Overvievv The operating menus of the E1 BER Tester includes Settings Results Storages and Others menu matched with the Setting Result Storage and Other functional keys respectively These four menus can be switched from one to another at any time by pressing these four functional keys PgUp and PgDn key
56. he LED turns on red The error may be sourced from BIT FAS CODE CRC4 and E BIT REMOTE ALARM Alarm happens on detecting Remote Alarm or Remote Multiframe Alarm and the LED turns on red Alarm cleans on both of two disappear and the LED turns off Remote Alarm Alarm happens on receiving 1 at Bit3 in 3 consecutive NFAS words and the LED turns on red Alarm cleans on receiving 0 at Bit3 in 3 consecutive NFAS words Comply with ITU T 0 162 Remote Multiframe Alarm Alarm happens on receiving 1 at Bit6 of timeslot 16 in frame zero in consecutive multiframes and the LED turn on Otherwise the alarm is cleaned 72 0049 00A E1 BER Tester 1 Overview 1 7 Alarms happens on the built in NiMH battery s voltage has dropped LOW to a low level without external power supply And the LED turns on BATTERY red to prompt the user that an external power is needed In case the instrument is powered by external power the LED turns off soon Table 3 Descriptions of status and alarm indicators LCD icon indications The E1 BER Tester has 5 LCD icons which are displayed at the upper right corner of the LCD and with different indications respectively Various LCD icons are described in Table 4 I con type Descriptions Historical When there have been historical errors or alarms happened during the Errors or T elapsed time of one test the icon flashe
57. hen the test is completed RE The test result is not saved directly and the user can save it later in the CURRENT item of Storages menu Table 12 Storage parameter settings Item Option Descriptions Duration MANUAL The test period is controlled by the Start Stop key manually User defined duration Test period is initiated by pressing the Start Stop key and normally terminates at the end of the period but this can be overridden by the Start Stop key According to actual needs the time range can be set from 1 second 99 days Run a timed test by programming both the start and stop time of this test The test will automatically start and stop at the pre determined time And the test time range can also be set from 1 second 99 days and the start time can be set in the format of Y M D and H M S In case that the pre determined time is earlier than the real time clock of the instrument the test of pre determined time does not work this can be overridden by the Start Stop key If later than the current time the pre determined time works user is not able to manually start the test but can stop the test in advance manually Table 13 Duration parameter settings b TX RX Mode Framed Settings The framed testing is intended to perform the bit error rate test of Nx64kb s N 1 31 in El timeslots This testing can ma
58. in Fig 5 The parameters of settings may vary from function to function And below will explain the settings respectively 3 2 1 TX RX Mode TX RX mode mainly performs out of service framed or unframed Bit Error Ratio Test to El transmission networks The settings may be changed by El framing selection The settings of E1 framing parameters are described in Table 5 El framing PCM30 PCM30CRC PCM31 and PCM31CRC information can be observed in Appendix A E1 Frame Structure 72 0049 00A 19 El BER Tester 3 Navigating the Displays Press Setting key to enter into Settings menu as shown in Fig 5 Settings P 1 2 19 38 20 m Function B C 8 4 Interface 752UNBAL HDB3 El framing PCM30 BERT pattern 215 1 Polarity INVERTED ITU T Tester is ready for use TX RX E THROUGH Fig 5 Page 1 of Settings menu Framing Description UNFRAMED The unframed data is a 2 048Mb s serial binary data stream without framing PCM30 Framed E1 with Channel Associated Signalling CAS multiframe ZTEI Framed E1 with Channel Associated Signalling CAS and CRC4 multiframe IPCM31CRC Framed E1 with CRC4 multiframe AVEN Framed E1 with no CRC4 multiframe Table 5 Framing parameter settings a TX RX Mode Unframed Settings An unframed test pattern vvhich is generated internally is transmitted by the transmitter of the instrument and
59. is signal analysis delay measurement and other measurements to 2Mb s channels In addition the E1 BER Tester can conveniently help user completing in service and out of service framed and unframed NX 64Kb s bit error testing timeslot analysis VF tone generation and measurement PCM simulation and other measurements is a very effective communication test tool for the m aintenance repair deployment and development of communication equipment The basic procedure of making measurements with the instrument is a b c d e f Select the test interface Set up the measurement parameters Perform the measurement Display or store the results Upload and analyze the stored results Print the record form of the results 4 2 Perform the Measurements 4 2 1 Out of service Bit Error Rate Testing The out of service error testing is mainly used in the development spot installation spot acceptance and daily maintenance of equipment can accurately perform measurements of the transmission quality of the system under test In addition the instrument will give full analysis on the error signal alarm seconds and event records The out of service testing can be made by local loop or far end loopback and far end mutual test as shown in Fig 46 and Fig 47 Go Telecom nn El Network Loopback a El QA BER Tester LTE Return LTE Fig 46 Out of service BER Testing
60. is key is pressed LCD display svvitches to the Settings menu Matched with the Results menu When this key is pressed LCD display Result s i switches to the Results menu J Matched with the Storages menu When this key is pressed LCD orage display switches to the Storages menu 72 0049 00A El BER Tester 1 Overview Matched with the Others menu When this key is pressed LCD display th r x li svvitches to the Others menu VVhen the instrument is set as single error insertion mode every time this key is pressed one error of the set type vvill be inserted in the transmit direction Start Stop Manually control the start or stop activity of the test Press it to start the test and press it again to stop the test Page Up When page number appears in the display menu Like P 2 4 indicates that display menu has 4 pages in all and is on page 2 currently press this key to go page up Page Down When page number appears in the display menu Like P 2 4 indicates that display menu has 4 pages in all and is on page 2 currently press this key to go page down Cursor Move the cursor upvvard and leftvvard and the cursor can reach the position Moveable Left ih Wy and Up with 117 Cursor Moveable Right and Dovvn Move the cursor dovvnvvard and rightvvard and the cursor c
61. is sent into the network under test And this test pattern will be looped back to the receiver The instrument makes bit error ratio test and analysis based on the comparison of the transmitted and received data e Page 1 of Settings menu in TX RX mode Unframed AMES unframed testing mode has 2 pages with the page 1 as shown in Fig 6 Settings P 1 2 19 38 20 m Function IEA Interface 750UNBAL HDB3 El framing UNFRAMED BERT pattern 215 1 Polarity INVERTED ITU T Tester is ready for use TX RX KA THROUGH Fig 6 Page 1 of Settings menu in TX RX Unframed 72 0049 00A 20 E1 BER Tester 3 Navigating the Displays Under LTL mode in page 1 of the settings menu move the cursor to the parameter s positions corresponding to Interface E1 framing BERT pattern Polarity and select the parameters by pressing F1 F2 F3 F4 softkeys accordingly The setting parameters of Interface and Code are described in Table 6 Item Option Descriptions MEN The line impedance is unbalanced 75 connected with coaxial cable The physical connector is L9 Interface BATI The line impedance is balanced 1200 connected with twisted pair wires the red cable transmits and the yellovv cable receives the signals The physical connector is crocodile clamp Code The line code is a High Density Bipolar 3 which is one of the commonly
62. its error detection capability and immunity to false frame alignment refer to ITU T G 706 For systems without CRC framing in service testing is limited to checking for errors in the frame alignment word which provides a poor indication of errors in the payload 72 0049 00A 72 E1 BER Tester Appendix B Glossary Appendix B Glossary Glossary of terms and mnemonics used in this manual AIS AMI BBE BBER CAS ccs CODE CRC DM EB EFS ES ESR FAS G 821 HDB3 MF MFAS MFAS NFAS NMFAS PCM REBE RS232 Rx RX SES SESR SMF Tx TX UNAVA UAS 72 0049 00A Alarm Indication Signal Alternate Mark Inversion Background Block Error Background Block Error Ratio Channel Associated Signalling Common Channel Signalling Line Code Cyclical Redundancy Check used in 2Mbit s data frames Degraded Minutes Errored Block Error Free Seconds Errored Seconds Errored Seconds Ratio Frame Alignment Signal timeslot 0 of alternate 2Mbit s frames ITU T Rec that specifies performance criteria for ISDN circuits High Density Bipolar 3 Multiframe Timeslot 16 for the multiframe alignment signal MFAS 0000 in bits 5 to 8 Multiframe Alignment Signal timeslot 16 of frame O in 2Mbit s frames Not Frame Alignment Signal timeslot 0 of intervening 2Mbit s frames Not Multiframe Alignment Signal associated with MFAS Pulse Code Modulation Remote End Block Errors EIA interface specification equivalent to a combinatio
63. ke the accurate assessment of transmission performance in the selected one or more timeslots Select with the framed structure such as 9114 Ka KE EE There are 3 setting pages in TX RX framed mode There are 3 setting pages in TX RX mode among which the setting contents of page 1 and page 3 are as same as ones in the unframed testing setting menus Page 1 of settings menu in TX RX mode Framed Refer to the relative setting descriptions in TX RX mode Unframed testing for the same basic setting parameters e Page 2 of settings menu in TX RX mode framed Press the PgDn key to enter into page 2 move the cursor to the positions to set Tx Rx 72 0049 00A 24 El BER Tester 3 Navigating the Displays timeslots I dle pattern parameters The setting parameters of Tx Rx timeslot are described in Table 14 as shown in Fig 8 Settings P 2 3 19 38 20 m Tx Rx timeslots DI VERSE Tx 01 64k Rx 01 64k ES Bandwidth Tx 00 64K Rx O 7 21 0 64 Idle pattern 10101010 O O O Tester is ready for use TX AS RX Fig 8 Page 1 in TX RX mode Framed testing Item Option Description The selected timeslots in the transmit direction are different to Tx Rx DIVERSE the ones in the receive direction timeslots The selected timeslots in the transmit direction are same as the TX AS RX ones in the receive directi
64. lution 1MIN Storage OFF Duration MANUAL Tester is ready for use TX RX ES THROUGH Fig 9 Page 1 of Settings menu in RX HI Z mode Unframed The parameters of Line interface and Code are described in Table 7 The parameters of E1 framing are described in Table 6 The parameters of Resolution Storage Duration are described in Table 12 72 0049 00A 26 El BER Tester 3 Navigating the Displays 13 14 b RX HI Z Framed Settings e Page 1 of settings menu in RX HI Z mode Framed As shown in Fig 10 press the Cursor Moveable Right and Down key to select El frame as the framed structure There are 2 setting pages in RX HI Z mode framed testing In page 1 move the cursor to the positions to set Interface Framing Idle pattern Resolution and Storage parameters and select relevant parameters by pressing F1 F2 F3 F4 softkeys Above relevant parameters of are described in Table 7 6 12 Settings P 1 2 19 38 20 m Function RX HI Z Interface 752UNBAL HDB3 E1 framing Idle pattern 10101010 Resolution 1MIN Storage OFF Tester is ready for use Fig 10 Page 1 of settings menu in RX HI Z mode framed e Page 2 of settings menu in RX HI Z mode Framed Press the PgDn key to enter into the page 2 as shown in Fig 11 Move the cursor to the positions to set
65. mage e Before handling the instrument select a work area where potential static sources are minimized Avoid working in carpeted areas and non conductive chairs Keep body movement to a minimum We recommend that you use a controlled static workstation e Handling the instrument by its cover Avoid touching any components or edge connectors Warning When connecting or disconnecting ensure that you are grounded to bring you and the instrument to the same static potential Do not connect this instrument to any signal cable carrying a hazardous voltage 72 0049 00A 16 El BER Tester 2 Getting Started 2 5 4 Storage and Shipment Reguirements The instrument may be stored or shipped in environments within the following limits Temperature 20 70 Altitude Up to 15 200 meters 50 000 feet The instrument should also be protected from temperature extremes which could cause condensation within the instrument 2 5 5 Repackaging Reguirements If the instrument is being returned to the factory for service please complete a repair tag and attach it to the instrument e Wrap instrument in heavy paper or plastic If the instrument is being shipped to the factory attach a tag indicating the type of service reguired return address model number and full serial number Mark the container FRAGI LE to ensure careful handling In any correspondence refer to the instrument by model number and full serial number e Useastrong shippin
66. me and Date At the top line of the screen LCD displays the current time in the format of Hour Minute Second with 24 hour system Since the test result is time stamped it is necessary to set 72 0049 00A 13 E1 BER Tester 2 Getting Started right time and date before using the instrument Time and date can be set in the real time clock settings in the Others menu by following operational steps e Press the Other key to switch to the Others menu select 1115125197 5 by the softkeys e Select 311 to Clock Mode item and then the date and time of the instrument can be modified Choose the T status after date or time has been set and then the instrument can work according to the newly setting time 2 3 3 Self test Before making measurements run a self test to check that the instrument is operating correctly The user may find self test function in the Others menu Please refer to the Others menu descriptions for details 2 4 Communication with PC This instrument supports communication with PC via RS232C interface by TestManagerPro software And TestManagerPro can do two jobs one is to upload the test results stored in the instrument to PC for further processing including filing printing and analyzing and the other s to upgrade the embedded software via PC to protect your investment 2 4 1 Communication Steps e Switch off the instrument firstly e Connect RS232 interface
67. meters by pressing F1 and F2 softkeys The relevant parameters are described in Table 36 Item Option Description When the instrument is not under the test started status and 21 there is keystroke for 5 minutes running the instrument will Auto power off be automatically shut off OFF The automatic shutdown function is disabled em Press the Backlight key to open the backlight the backlight Auto backlight vvill be automatically turned off in 30 seconds off OFF The automatic backlight shutdovvn function is disabled Table 36 Power Manager configurations Caution VVhen a test is controlled by timer vvhich set in Settings menu please set Auto power off as lili in order to prevent the instrument auto shut off before the test can be automatically started by the timer 72 0049 00A 51 El BER Tester 3 Navigating the Displays Others INPOWER MANAGER Auto power off Auto backlight off Accessorial system functions AUTO POVVER CONFI GU MANAGER Fig 39 Page 2 of Power Manager menu 3 5 4 RS232 Port As shown in Fig 40 before uploading the stored results in the instrument or upgrading the embedded software by TestManagerPro user should configure the RS232 port firstly as described in Table37 Others LEEY Port state Accessorial system functions RS232 TIME KEY BOA PORT amp DATE RD TEST Fig 40 RS2
68. n of V 24 and V 28 Receiver or Received Severely Errored Seconds Severely Errored Seconds Ratio CRC Sub Multiframe Transmitter or Transmitted Unavailability Unavailable Seconds 73
69. n the rapid charging is completed charging automatically turns into a trickle charge the Charge indicator turns off The instrument certainly can be charged when it is powered off The charging indicator can give the right display 72 0049 00A 12 El BER Tester 2 Getting Started n addition the battery can be recharged vvith the automobile charger at this time an automobile cigarette lighter adapter cable is needed 2 2 4 Low Battery Indication When being powered by the battery this instrument can give the early alarm to low battery voltage and the Low Battery indicator turns on After being used for a couple of hours the battery voltage continues to drop to a low level and the instrument will automatically perform protective shutdown When the Low Battery indicator turns on the external power supply is needed to support the instrument working while the battery is charging 2 2 5 Power Management This instrument provides automatic power off function When the instrument is not under test started status and there is no keystroke in 5 minutes this instrument will be turned off automatically This function can effectively prevent the instrument from being accidentally turned on and the battery from being exhausted during the transport This function can be set to en or OFF in Others menu The LCD backlight can be turned on by pressing the Backlight key and be automatically turned off in 30 seconds This
70. nfiguration list Caution If user wants to add some optional test functions after having received the instrument The test provides not only the RX TX test mode but also RX HI Z and THROUGH Users can purchase these options according to their reguirements 72 0049 00A E1 BER Tester 1 Overview Caution Please check the product item by item according to the packing list and contact the supplier if anything is missed Please fill in the product maintenance card carefully and take good care of it If necessary keep the packaging materials in case they will be needed some time 1 4 Product Compositions The El BER Tester is consists of following modules e Hardware Main board and Display board e Software the Embedded software surveillance and management PC software TestManagerPro e Accessories VVaterproof Package Special Test Cables AC Povver Adapter Rechargeable Batteries Automobile Cigarette Lighter Adapter Cable and so on 1 4 1 Compositions of Instrument e Front panel LCD display LED alarm and status indicators keyboard back cover e Back panel four disassembly proof label serial number label e Front end input output interface L9 coaxial RJ45 e Right end 12VDC input jack and RS232 port jack 1 4 2 Appearance of Instrument The appearance of the instrument is as shown in Fig 1 El 759 Tx 2 Interface LED Alarm 1 750 LCD Display Functional Keyboard
71. ng Environment 6 3 Install and Uninstall the Software on the PC 6 4 How to Use TestManagerPro 6 1 Software Functions TestManagerPro communicates with series instruments via the serial port in PC It can support uploading the stored data from the instrument viewing and printing the stored results You can easily check manage and analyze every test result on your PC It also can describe all the error and alarm events happened in the test period time in detail by sguare drawing and help you in classification filing and report outputting of the test results Another very important function of TestManagerPro is that you can on line upgrade the embedded software in the instrument with this PC software Basic functions of TestManagerPro e Select the type of the instrument e Connect the instrument e Upload the test results which stored in the instrument e View the stored results e Analyze the stored results e Clean up the records uploaded Plot out the test results with the graphics table or text mode Upgrade the embedded software e Help 6 2 System Configuration and Running Environment 6 2 1 Firmware Basic configurations reguired e PC 586 133MHz or better e Memory above 16MB e Hard disk above 50MB e CD ROM drive for installation 72 0049 00A 64 El BER Tester 6 Working with TestManagerPro Standard mouse and keyboard Serial port Windows compatible printer or plotter 6 2 2 Operating System Windows ME 2000
72. ng the Displays ABCDEFGI ESB 1 3 a Function TX RX Interface 75QUNBAL HDB3 El framing UNFRAMED BERT pattern 215 1 Polarity INVERTED ITU T 01 vacant setting storages SETTING RESULTS TIME Fig 34 Setting information of stored results Item Description View relevant information of Test setting Test result and Test time as shown in Fig 34 Lock Lock the selected result in order to prevent it from being accidentally renamed Unlock and overwritten Unlock the selected result in order to rename and delete it Modify the name of selected result Delete the selected result Table 33 Activities to the stored settings 3 5 Others Menu Others menu mainly performs the settings of other relevant parameters of the instrument User can make configurations according to the real needs Press the Other key to switch to Others menu Others menu provides the accessorial functions of INU METETE SUENA ERP L PI PAKSU LAIA ARAS Wage These functions will be described respectively below 3 5 1 Autoconfigure When user starts performing the measurements the operator may not familiar with the setting parameters of the instrument or may have no idea of how to set the testing parameters The autoconfigure function is an intelligent setting tool that provided by the instrument It can help the operator in the circumstances when the o
73. nt b M 2100 Analysis M 2100 Analysis menu is as shown in Fig 15 And the relevant analysis results are described in Table 25 M 2100 Analysis is not provided in unframed testing c Alarm Seconds Alarm Seconds menu is as shown in Fig 16 And the relevant analysis results are described in Table 26 The effects of framings on Alarm Seconds are as shown in Table 27 d Signal Analysis Signal Analysis menu is as shown in Fig 17 And the relevant analysis results are described in Table 28 e Event Records Event Records result menu is as shown in Fig 18 72 0049 00A 39 El BER Tester 3 Navigating the Displays f TS Analysis TS Analysis provides timeslot analysis of framed El signal The full frame data can be monitored in this analysis including frame alignment FAS and NFAS timeslot 16 data speech timeslot data and timeslot activities as shown in Fig 20 Since the timeslot 16 is used to transmit multiframe alignment signal and CAS signalling data in PCM30 CRC framing and common 64kb s data or CCS messages in PCM31 CRC framing the results of it will be displayed different on framing configured in the settings menu The effects of framings on analysis items are shown in Table 31 FAS and NFAS displays also are affected by CRC4 framing or non CRC4 framing chosen Results 00d00h15m25s ENAR FAS NFAS Si FAS FAS 00011011 Si A Sa4 Sa8 NFAS 00011011 Running Please vvait SIGNAL EVE
74. nterface Alarm LEDs Alarm Hierarch 2048Kb s Signal Loss AIS Frame Loss MFrame Loss CAS and CRC Remote Alarm RDI and Remote MF Pattern Loss Errors The more important alarm will suppress a lesser alarm see below Hierarch Alarm and Error 1 Signal Loss 2 AIS Errors 3 Frame Loss CAS MF Loss CRC MF Loss 4 Pattern Loss Remote Alarm Remote MF Alarm E1 standards Test Pattern 72 0049 00A Table 39 El Alarm Hierarch Comply with G 703 G 706 G 732 PCM30 G 704 vvith CAS multiframe PCM31 G 704 vvith no multiframe PCM30CRC G 704 vvith CAS and CRC4 multiframe PCM31CRC G 704 with CRC4 multiframe PRBS 273 1 0 151 215 1 0 151 211 1 0 153 29 1 Fixed Code 1111 0000 1010 16BIT Fully programmable 16 bit word PRBS Polarity Normal or Inverted 61 E1 BER Tester Test Period Result Analysis 5 1 2 Transmitter Line Code I mpedance Pulse Shape Tx Clock Source I nternal Tx Clock External Tx Clock Error Add Error Add Rate 5 1 3 Receiver Rate Line Code Pulse Shape I mpedance Receive Sensitivity External Clock I nput Timeslot Analysis 72 0049 00A 5 Technical Specifications Manual Auto Timer G 821 G 826 M 2100 Analysis HDB3 AMI 752 unbalanced 1202 balanced Conforms to ITU T G 703 Table 6 Internal Interface External source 2 048 2 o Stability 10 ppm temperature 0
75. on HH To select or de select a timeslot The selected timeslot is marked SA ASI EIA with and unselected one is marked with Tx 5 Move leftward or rightward to the timeslot that needs to be lt gt selected or de selected H To select or de select a timeslot The selected timeslot is marked SRLECT gals with and unselected one is marked with Rx pz izi Move leftvvard or rightvvard to the timeslot that needs to be gt selected or de selected Band Displays the BERT data bandwidth of the transmit direction and and width No option the receive direction according to amount of the timeslots selected respectively Except the timeslot O in all frame structure and timeslot 16 in PCM30 30CRC framing timeslot data will be replaced by idle Idle codes on a per channel basis on the transmit direction in those pattern unselected timeslots This can be effectively used to detect the busy or idle activity of the timeslots Move leftvvard or rightvvard to the bit that needs to be edited Table 14 Tx Rx timeslots parameter settings 72 0049 00A 25 El BER Tester 3 Navigating the Displays Caution Be sure not to set all idle codes as all zeros when setting AMI as the line code t may result in generations of signal loss frame loss and other alarms at El receiver when too many unselected timeslots carry the all zeros idle code in the transmit direction of the instr
76. oss counted over the elapsed test period AIE The number of seconds during which AIS was detected counted over the elapsed test period The number of seconds during which pattern loss was Pattern loss detected counted over the elapsed test period The number of seconds during which clock slips were Clock slip detected counted over the elapsed test period Only provided in PRBS test patterns Alarm The number of seconds during which remote alarm was Seconds Remote alarm detected counted over the elapsed test period Remote MF alarm The number of seconds during which remote multiframe alarm was detected counted over the elapsed test period Frame loss The number of seconds during which frame loss was detected counted over the elapsed test period The number of seconds during which CAS multiframe loss was CAS MF loss detected counted over the elapsed test period The number of seconds during which CRC multiframe loss was CRC MF loss detected counted over the elapsed test period Table 26 Alarm Seconds in E1 TX RX mode The effects of framings on alarm seconds counts in Alarm Seconds are as shown in Table 27 Seconds Counted Unframed PCM30 PCM30CRC PCM31 PCM31CRC Signal Loss o o o o o AIS o o o o o Pattern Loss o e e e e Clock Slip o Remote Alarm o o o e Remote MF Alarm o e Frame loss e e e e CAS MF loss e e
77. perator is not familiar with the application of the instrument or the relevant parameters of the system under test are undetermined The autoconfigure function will simplify the settings of the instrument The autoconfigure function is only provided in some of test modes in the instrument Furthermore it also can t fully replace the user to set all the setting parameters In Table 34 it definitely indicates the test mode condition and configuration range of the autoconfigure application When in the test mode that supports autoconfigure switch to the Aautoconfigure menu press F1 directly to perform the autoconfigure application as 72 0049 00A 48 E1 BER Tester 3 Navigating the Displays shown in Fig 35 When in the test mode that not supports autoconfigure application switch to the autoconfigure menu the autoconfigure function can t be chosen as shown in Fig 36 I nterface Test Mode Autoconfigure Range Framed All PRBS P Framing BERT pattern Tx Rx timeslots E1 Unframed All PRBS P Framing BERT pattern RX HI Z P Framing THROUGH P Framing Table 34 Autoconfigure function descriptions Others AUTOCONFIGURE Perform autoconfigure Accessorial system functions AUTO POVVER CONFI GU MANAGER gt gt Fig 36 Autoconfigure function is provided Others AUTOCONFIGURE Perform autoconfigure Accessorial system functions AUTO POVVER C
78. rent error rate o e o o Average error rate o o o o o EB o BBE o FAS error o e e o Code error e e CRC4 error e o E BIT error o o Table 17 Effects of framings on Basic Analysis Caution The instrument will disable the counting of errors in the presence of various alarms which are in context for the current settings of the instrument These alarms will affect the count of the error EC the error seconds ES and the error free seconds EFS results This is the reason why the error and its relevant counting value such as EB BBE are so low when such kind of alarm appears in the testing result of the instrument The effects of alarms on error counts in Basic Analysis results of the framed and unframed El testing are as shown in Table 18 and 19 72 0049 00A 30 El BER Tester 3 Navigating the Displays EC EFS E EB BBE Signal Loss AIS Pattern Loss Table 18 Effects of alarms on error counts in the unframed E1 2 CAS EC EFS Signal AIS Frame Frame CRC Pattern Loss Loss L Frame Loss Loss oss CODE CRC4 E BIT x x x Table 19 Effects of alarms on error counts in the framed El b G 821 Analysis G 821 Analysis performs result statistics of errored seconds ES and 96 ES severely errored seconds SES and SES degraded minutes DM and DM unavallable time UAS and UAS for BIT errors The
79. rument is under charging and turns off when it is fully charged Alarm I ndicator SI GNAL LOSS Effectively indicates a loss of signal When the receiver detects 255 consecutive Os an alarm is generated and this indicator turns on red Alarm cleans on detecting at least 32 1s in consecutive 255 bits and LED turns off Comply with ITU T G 775 G 962 AIS Alarm happens on receiving less than 3 Os in 512 bits and cleans on detecting more than 2 Os in 512 bits and the LED will be turned off Comply with ITU T 0 162 FRAME LOSS Alarm happens on receiving 3 or more consecutive FAS words in error and LED turns on red Otherwise the alarm is cleaned and LED turns off Comply with ITU T G 706 MFRAME LOSS Alarm happens on synchronization loss of CAS or CRC 4 Multiframe and the LED turns on red Alarm cleans on both of these two alarms recovering and the LED turns off CAS Multiframe Loss Alarm on receiving 2 consecutive MFAS words in error and the LED turns on Otherwise the alarm is cleaned CRC 4 Multiframe Loss Alarm on receiving 915 or more CRC4 code words out of 1000 received in error and LED turns on Alarm cleans on receiving 2 valid MF alignment words in 8ms PATTERN LOSS Alarm happens on receiving 6 or more bits in error in consecutive 64 bits and the LED turns on red Otherwise the alarm is cleaned and the LED turns off ERRORS Alarm happens on detecting at least 1 error and t
80. s menu to help settings 4 2 3 Nx64Kb 5 Bit Error Rate Testing Nx64kb s BER testing is used to check timeslot integrity through the digital cross connect equipment A test pattern is transmitted over a group of timeslots from the near end Atthe far end the expected receive timeslots are selected and bit error rate is calculated The E1 digital cross connection equipment can svvitch one received timeslot to any timeslot of the other El In El TX RX mode framed testing select a group of timeslots in the transmit direction and expected timeslots in the receive direction to make the BER testing Fig 50 shows one Nx64Kb s BER testing connection Test Description As shown in Fig 50 the El DXC equipment cross connects the 2 and the 3 timeslots of one El signal to the 294 and the 30 timeslots of another El signal Therefore user should select the 2 and the 3 timeslots in Tx timeslots and the 29 and the 30 timeslots in Rx timeslots Then the BER testing can be performed in these two timeslots path e When making BER measurements in Nx64kb s mode TX RX framed testing mode should be configured Please refer to the relevant parts of the Section 3 2 1 e When completing all the settings press the Start Stop key and the Result key to enter into relevant result menu All the test results in this mode are described in Section 3 3 1 El BER Tester Fig 50 Nx64Kb s BER testing 72 0049
81. s once every other second to Alarms prompt the user Icon flashes on detecting open status of El transmit circuit Real time B indicates to prompt the user the transmitter is not connected with the cable E1 or the cable is open circuit or broken This icon can be used to judge if the Transmit cable is properly connected or damaged Circuit Status Icon flashes on detecting short status of El transmit circuit Real time n indicates to prompt the user the cable is in short status This icon can be used to judge if the cable is properly connected or damaged Icon flashes on that the automatic test timer has been set and indicates the 7 tester vvill start the automatic test function at the specified future time This estin l E 57 icon displays in real time to prompt the user that the pre determined timer has been set Icon flashes on that the configuration items in the Settings menu have been locked or the storage capacity is full or stored settings and results have been locked to prompt the user that one test has been started and configuration items can not be modified any more or the storage capacity is full existing records have to be deleted firstly to save the new records or that stored record has been locked and has to be unlocked firstly before it can be overwritten Status s Lock This icon vvill be replaced by oe in the text part of the manual Icon flashes on that the configuration items can be modified the storage
82. s provide page up and down functions Cursor Moveable Right and Down and Cursor Moveable left and Up keys provide cursor movement functions F1 F2 F3 F4 softkeys are used to select the parameter or actions at the bottom of LCD which matched with the place highlighted by the cursor In each of display areas the field currently able to be changed is marked by a Highlight Cursor The menu of selection available for the active field is displayed on softkeys on the bottom of the display The choice from the menu is made using the keys situated immediately below the display The highlighted cursor is moved around the display using page and cursor keys When a highlighted field has more than 5 choices a softkey labeled EH is provided When is chosen the remainder of the menu is revealed Settings Menu Press the Setting key to enter into the settings menu All the information that related to the choice of the testing function and the setting of the parameters are provided in the Settings menu Press the Cursor Moveable Right and Dovvn and Cursor Moveable left and Up keys to move the cursor press the F1 F2 F3 and F4 softkeys to select the corresponding parameters In case page number appears in the LCD menu such as P 1 2 turn page by pressing the PgUp or PgDn key Press the Start Stop key to start the test after all the settings have already
83. s set in the settings menu then one event will be generated by the instrument accordingly And the event records number is added by 1 every the resolution time The event records sum will be updated in accumulation with the storage interval for example 1 minute 15 minutes 1 hour Event records can be further uploaded via one test result by TestManagerPro software The event records menu is as shown in Fig 18 The displays of Event Records in E1 unframed and framed testing are the same 72 0049 00A 37 El BER Tester 3 Navigating the Displays Results 00d00h15m25s EVENT RECORDSI Eventrecords sum Running Please wait ALARM SIGNAL EVENT SECONDS ANALYSI S RECORDS Fig 18 Event Records result menu h TS Analysis TS Analysis provides the timeslot analysis under El framed testing The specific contents of TS Analysis are shown in the displays under E1 RX HI Z mode below refer to Section 3 3 2 for details 3 3 2 Results Menu in E1 RX HI Z Mode RX HI Z mode is normally used in out of service measurement of El path The Results menus under E1 RX HI Z mode provide full measurement analysis including Errors Count M 2100 Analysis Alarm Seconds Signal Analysis Event Records TS Analysis and so on Press F1 F2 F3 F4 softkeys to select the analysis displays accordingly in the menu As the specific framing has been chosen
84. scription e When El RX HI Z mode is chosen the input impedance of the receiver of the instrument is set under high impedance gt 2KQ User can directly connect the receiver of the instrument to 2 Mb s transmission channel with the transmitter or receiver on DDF Digital Distribution Fame According to framings of the 2 Mb s signal under test select the corresponding frame structure such as Unframed PCM30 PCM30CRC PCM31 and PCM31CRC Please refer to relevant parts of Section 3 2 2 for details e When completing all the settings press the Start Stop key and the Result key to enter into relevant result menu All the test results in this mode are described in Section 3 3 2 72 0049 00A 58 El BER Tester 4 Performing Measurements e When E1 Through mode is chosen the 2 Mb s signal under test will be transmitted transparently through the instrument Select Unframed PCM30 PCM30CRC PCM31 PCM31CRC frame structure according to the 2 Mb s signal under test Please refer to the relevant parts of Section 3 2 3 for details When completing all the settings press the Start Stop key and the Result key to enter into relevant result menu All the test results in this mode are described in Section 3 3 3 When making in service testing in RX HI Z and Through mode if the N N frame structure of the E1 signal under test is undetermined the operator can use the autoconfigure function in the Other
85. scription in Table 24 Table 25 M 2100 Analysis in E1 TX RX mode 72 0049 00A 34 E1 BER Tester 3 Navigating the Displays Results 00d00h15m25s 2100 ANALYSISM TX ES SES UAS Running Please wait BASI C G 821 M 2100 ANALYSI SANALYSI S ANALYSIS Fig 15 M 2100 Analysis result menu in E1 TX RX mode Caution M 2100 Analysis on the basis of monitoring frame data of framed El performs the evaluation of the transmission quality on the E1 path between the remote and local eguipment Therefore M 2100 Analysis will only be used in unframed E1 path When performing unframed E1 testing this result analysis will not be provided e Alarm Seconds Alarm Seconds give the error counts in seconds of loss of signal AIS loss of pattern clock slip remote alarm remote multiframe alarm loss of frame loss of CAS multiframe loss of CRC4 multiframe and so on Alarm Seconds result menu is as shown in Fig 16 and the relevant result analysis items are described in Table 26 Results 00d00h15m25s 5 5 Signal loss AIS Patter loss Clock slip Running Please wait ALARM SIGNAL EVENT SECONDS LYN AKS RECORDS Fig 16 Alarm Seconds result menu in E1 TX RX mode 72 0049 00A 35 E1 BER Tester 3 Navigating the Displays Result Item Description The number of seconds during which signal loss was detected Signal l
86. surement interval excluding all blocks during SES and unavailable time UAS The number of unavailable seconds during a test period A system becomes available when the errored block ratio measured in 1 second intervals is better than the severely errored block second threshold for 10 or more consecutive seconds A system becomes unavailable when the errored block ratio measured in 1 second intervals is greater than the severely errored block second threshold for 10 or more consecutive seconds UAS The number of unavailable seconds during a test period expressed as a percentage of the total number of elapsed seconds Table 24 G 826 Analysis in E1 TX RX mode d M 2100 Analysis ITU T M 2100 recommendation is used to evaluate the connection quality of E1 path in a long term test It can be available under option mode M 2100 Analysis provides 72 0049 00A 33 E1 BER Tester 3 Navigating the Displays statistics counts of errored seconds ES severely errored seconds SES and unavailable time UAS in both transmit Tx and receive Rx directions for in service and out of service testing Since it counts errors based on frame data M 2100 Analysis is only provided in E1 framed testing as shown in Fig 15 Receive direction stands for the E1 transmit direction of the equipment under test is also called as Local Transmit direction stands for the E1 re
87. the vvorking circumstances the status prompt information line vvhich is above the highlighted field provides operating status of the instrument The upper right corner of LCD indicates that the parameters can be modified indicates that the instrument is currently doing one test softkeys are under the lock status and the highlighted settings can not be modified n in the Storages menu indicates that there still has storage space to save more records in the instrument 02 indicates that no saving space is available some records must be deleted firstly to save the new records 7 and following each saved record respectively indicate that the record is under locked or unlocked status 3 2 Settings Menu Settings menu mainly performs the selection of the test function and the settings of relative parameters vvhich are associated vvith the situation of the system under test Only after setting relative parameters and performing the correct test connections can be the test process accomplished properly Every time the instrument is svvitched on again the instrument automatically loads the settings menu of the last valid test as the default setting menu Only the start stop processing test can become one valid test Press the Setting key to switch to the Settings menu the operator can select 13 22 32 IRX HI Zh THROUGH to set the test functions as shown
88. ults storage menu 72 0049 00A 46 El BER Tester a Current Result 3 Navigating the Displays As shown in Fig 32 the current result appears only in the first page When 9143 is selected the displays shown in Fig 44 will appear After named the current result the instrument will save the result as the name with CE lock followed Storages RESULTS 1 P 1 1 SIRREM lt 01 gt SETTING1 lt 02 gt SETTING2 lt 03 gt SETTING3 Mode Mode Mode Mode 1 TX RX Tx RX H RX HI z il THROUGH H 08 vacant setting storages SETTING Fig 32 Current result Caution VVhen the result is chosen to be saved after the test is completed and there is no more saving capacity user can exit the Edit record s name menu first At the same time the result information vvill be saved in the Current result Then delete the unvalued results to release the capacity and save the Current b Stored Results The stored results are as shown in Fig 33 User can view as shown in Fig 34 lock or unlock rename and delete the stored results The relevant functions description is as described in m TX RX H TX RX E RX HI z H THROUGH M Table 33 Storages P 1 3 CURRENT Mode lt 01 gt ABCDEFGI Mode lt 02 gt BCDEFGKI Mode lt 03 gt CDEFGHIK Mode 01 vacant setting storages Fig 33 Stored results 72 0049 00A 47 El BER Tester 3 Navigati
89. ument Too many consecutive zeros in AMI line code could result in loss of frame synchronization 3 2 2 RX HI Z Mode option RX 1 2 mode is one in service testing mode commonly used in the case that the network under test can not be out of serviced In this mode the El BER Tester will be connected into the E1 signals with very high impedance through which would not affect the normal transmission of user s data RX HI Z mode is always used in the long term on line measurements to those E1 signals which is still transmitting the user s data and can not be stopped In RX HI Z mode the E1 BER Tester can perform statistic analysis of various E1 alarms and errors in framed and unframed circuit and surveillance and monitoring of E1 frame data In RX HI Z mode the E1 BER Tester only uses its receiver and the transmitter will be shut off for saving the power a RX HI Z Unframed Settings e Page 1 of Settings menu in RX HI Z mode Unframed In El RX HI Z mode move the cursor to the positions to set Interface Framing Resolution Storage and Duration parameters and select relevant parameters by pressing F1 F2 F3 F4 softkeys Press the Cursor Moveable Right and Down key to select El framing as LIL The settings menu is as shown in Fig 9 Settings 19 38 20 m Function RX HI Z Interface 75QUNBAL HDB3 E1 framing UNFRAMED Reso
90. vide power supply This instrument has an external power supply which has an autoranging line voltage input Ensure the line supply is vvithin the specified range The supplied standard AC power adapter should be only used indoor DC Connector Polarity 72 0049 00A 15 El BER Tester 2 Getting Started VE Fig 4 DC connector polarity 2 5 2 Operating Environment This instrument is designed for Indoor use only This instrument may be operated in environments within the following limits Temperature 407 Altitude Up to 3050m 10 000 feet Humidity 596 90 non condensation Warning This instrument is designed for Indoor use only Do not operate the product in an explosive atmosphere or in the presence of flammable gasses or fumes 2 5 3 Operation Reguirements The network connectors are located at the top of the instrument Before connecting note the Warning and Caution information given The instrument contains components sensitive to electrostatic discharge To prevent component damage carefully follow the handling precautions presented below The smallest static voltage most people can feel is about 3500 volts It takes less than one tenth of that about 300 volts to destroy or severely damage static sensitive circuits Often static damage does not immediately cause a malfunction but significantly reduce the component s life Adhering to the following precautions will reduce the risk of static discharge da
91. vigating the Displays stored settings the relevant description are as described in Table 32 Storages SAMMA P 1 2 CURRENT Mode TX RX lt O01 gt SETTINGI1 Mode TX RX m lt 02 gt SETTING2 Mode RX HI Z a lt 03 gt SETTING3 Mode THROUGH M 01 vacant setting storages VIEW A Fig 30 Stored settings Item Description View View the settings information of the stored setting record KSO Recall the stored setting as the current to set up a new test Lock the selected stored setting in order to prevent it from being accidentally renamed and delete 7978 Unlock the selected stored setting in order to rename and overwrite it Modify the name of selected stored setting Delete the selected stored setting Table 32 Activities to the stored settings 3 4 2 Results in Storage Menu The result storage menu allows the test results to be saved or the relevant information of the test result to be viewed according to the name of the result The result storage menu is as shown in Fig 31 in that menu user can save current test result view rename and delete stored results saved The instrument can save up to 10 sets of results Storages m SSS P 1 1 CURRENT Mode TX RX lt O1 gt SETTING1 Mode TX RX a lt 02 gt SETTING2 Mode RX HI Z B lt 03 gt SETTING3 Mode THROUGH H 08 vacant setting storages SETTI NG H RESULTS Fig 31 Res

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