X-Cite® Optical Power Measurement System
Contents
1. Designed with fluorescence microscopy in mind Compatible with arc lamps lasers and LEDs Encompasses a wide dynamic range in a single detector Easily captures settings and data via PC interface LUMEN DYNAMICS xX Cite PUTTING Fluorescence Illumination In Control The ability to measure optical power is the first step to keeping it consistent The X Cite XR2100 Power Meter and the Prism Award winning X Cite XP750 Objective Plane Power Sensor are designed especially for measuring power at the specimen level for fluorescence microscopy applications By fitting a wide dynamic range into a compact sensor we have made it easier than ever to obtain this critical information DESIGNED WITH MICROSCOPY IN MIND Engineered to fit in standard microscope slide clips the low profile of the X Cite XP750 Objective Plane Power Sensor makes itideal for use in the limited space between the objectives and stage on upright microscopes On inverted microscopes simply center the transmission light from above on the printed target to center the detection area over the objective lens Working with dim ambient lighting The backlit display on the X Cite XR2100 Power Meter ensures that readings are always legible BROAD DYNAMIC RANGE Calibrated for use at any wavelength between 320nm and 750nm the X Cite XP750 is compatible with a full range of filters With sensitivity to power levels from SuW to SO0mW itis appropriate for applications us2. ing both low and high intensity illumination This makes it suitable for use on standard confocal DSU and other microscope configurations VERSATILE amp CONVENIENT Since the X Cite XP750 measures light right on the stage it can be used with any epi fluorescence light source including HBO mercury metal halide or xenon lamps lasers and LEDs With hundreds of wavelength choices the X Cite XR2100 allows you to define favorite wavelengths to correspond to your most frequently used sources and filters CERTIFIED amp TRACEABLE X Cite XR2100 and X Cite XP750 are calibrated according to a strict protocol using transfer standards traceable to NIST and NRC For your records certificates of calibration accompany each unit REPEATABLE TAKE CONTROL Consistency is essential for data integrity By measuring and recording power output in absolute units watts with X Cite you ensure that illumination levels used in an experiment can always be repeated no matter how light sources light guides filters and other optical components change over time This unique capability is critical for reducing post experiment image processing time making accurate quantitative image comparisons and compiling complete experiment documentation Much of our research depends on quantitative fluorescence microscopy analysis over lon design makes it easy to routinely measure the exact amount of excitation light delivered Enjo
3. nsions with alow profile Compatible with lamps laser and LED light sources Large detection surface area 10mm Fits in a standard microscope dip for convenient measuring fight directly from the objective without removing or reconfiguring equipment Economically use one system to service multiple microscopes regardless of ilumination technology Appropriate for use with both low and high magnification objectives No focusing required Obtain accurate measurements quickly Wide range of wavelengths and power Suitable for use with full ange of applications and microscope configurations X Cite XP750 amp XR2100 LCD display with backlight View data dearly even in the dim lighting conditions ofa microscopy imaging suite Two input ports for measuring power via objective plane sensor or light guide Calibration traceable to NIST NRC standards One button dick for data colection storage and exporting PCinterface Compatibility with X Cite exact calibration feature SPECIFICATIONS Indudes Power Range Measurement Resolution Uncertainty Response Time Calibration Wavelength Range lamp Type Light Source Compatibility Objective Compatibility Display Wavelength Selection Data Capacity PC Controls Command Protocol Power Supply Weight Dimensions without cover Worldwide Certifications Warranty Patents sep rt oi seit ming rp te pies aceite nahin seta pobre n Paan nme best possible supplie
4. r in all aur business nd Selectively monitor light source performance of entire microscope system or individual components Achieve quality assurance and confidence in accuracy of results Keep data organized with accurate paperless record keeping Manage settings and data conveniently via PC automatable for convenience and OEM use Easily calibrate X Cite exacte via light guide or objective plane sensor to display and set power in watts X Cite XR2100 X Cite XP750 Handheld power meter adapter for mm light guide Objective plane power sensor with software CD cables user manual able connector for X Cte XR2100 somw 10w SyW St0mW amio 20M as am 1s 00ns ntl 3s to ensure stable reading Traceable to NST Traceable to NRC onm 675nm 320nm 750nm XGte 200C X Cite exacte X Cite 120 Series using 3mm ght guide input port Cite 200C X Cite exacte X Cite 120 Series Mercury HBO Metal Halide Xenon LED Laser Not applicable 4X 63K alr coupled with FOV diameters less than 10mm 3 digit LCD backlight Va X Cite XR2100 MotApplabie nm increments using up down buttons on X Cite XR2100 or PC interface Store 100 readings on handheld unit or record directly into PC interface export in spreadsheet compatible format Va X Cite XR2100 View change settings define favorite wavelengths View change settings download export stored data record data for multiple objectives filters intensity se
5. ttings dovnload export stored data 5232 via USB virtual COM port o viaxe xr100 2x30 Lithium Battery Va Ge X10 b 59 29029 154542 I9em x11 Sam xSem 307x035 5mm x25nm omn marked Va Cie Xo no Tyr Ter Gte Optical Power Measurement System incorporates technology protected by the following patents U6 437 861 USE 335 801 MST National insu d Sanda and Technology YR Matona Reseach und Glen oe 210 nde SS menmen ever rh mors Gt Lumen Dni Group cr frbroman 2260 Argentia Road Mississauga Ontario LSN6H7 CANADA Www LDGEXCite com Telephone 1 905 821 2600 Tall Free USA and Canada 1 800 668 8752 Facsimile 1 905 821 2055 XCiteLDGLcom
6. y the option of paperless record keeping With the X Cite XR2100 you VE w can store power measurements for immense tS p downloading or logging them directly puniri intheXCite PCinterface Created H s m te me especially for X Cite XP750 the power snapshot tool allows you to collect and save data by wavelength objective and intensity This ensures LL that you have a complete record of illuminating power for whichever combination of settings used when optimizing and acquiring images e The X Cite Optical Power Meter System can service multiple microscopes and their light sources In addition to standardizing illumination levels for experiments the X Cite XR2100 is a vital diagnostic tool for imaging facilities technical sales representatives and service centers providing helpful optical output data for Setting up imaging systems determining baseline performance Troubleshooting imaging systems by quantifying the effect of adjusting settings and servicing individual components Preventative maintenance monitoring optical output over time to determine when components such as lamps and light guides require replacement NIST Natal nue of standards adeno NPC Natonal Research Counc me time periods The X Cite XP750 s o the specimen at any time point Damir Sudar Lawrence Berkeley National Laboratory FEATURES BENEFITS X Cite XP750 Microscope slide dime
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