WAYNE KERR 4265 Datasheet
Contents
1. be added either from the built in source or from an external source up to 40 V DC Testing electronic components with Wayne Kerr LCR meters is easy and in less than a second you ll see all you need to know on the large easy to read LCD display The dominant component value can be measured with a basic accuracy of 0 1 and displayed with its equivalent circuit diagram Measurement integrity is further enhanced with the use of Kelvin leads or test posts which connect directly onto the instrument s front panel The 4200 series LCR meters offer a comprehensive range of measurement functions series and parallel resistance Rac DC resistance Rdc capacitance C inductance L impedance Z phase angle dissipation factor D and quality factor Q can all be selected An internal DC bias source is provided for testing components such as electrolytic capacitors and semiconductor junctions For the un skilled user just connect the component yowwant to test into the test posts and the LCR meter will automatically sense the type of component being tested and display the characteristic parameters and equivalent circuit on the large LCD display To get a more stable reading you can use the averaging function For fast comparison of components the 4270 also offers a deviation mode Select the current voltage monitoring function to see the actual test current and voltage values measured at the component under test This ensures maxim2. lower risk and off balance sheet accounting Both second user and rental improve the key business measure of Return On Capital Employed We are based near Heathrow Airport in the UK from where we supply test equipment worldwide Our facility incorporates Sales Support Admin Logistics and our own in house Lab All products supplied by Test Equipment Solutions include No quibble parts amp labour warranty we provide transport for UK mainland addresses Free loan equipment during warranty repair if available Full electrical mechanical and safety refurbishment in our in house Lab Certificate of Conformance calibration available on request Manuals and accessories required for normal operation Free insured delivery to your UK mainland address sales Support from our team of seasoned Test amp Measurement engineers 1509001 quality assurance Test equipment Solutions Ltd Unit 8 Elder Way Waterside Drive Langley Berkshire SL3 6EP T 44 0 1753 596000 F 44 0 1753 596001 Email info TestEquipmentHQ com Web www TestEquipmentHQ com LCR Meters Wayne Kerr Electronics Ltd Providing low and accurate components production or environment Three low cost versatile models the 4270 4265 and 4260 offer a combination of powerful capabilities to meet the most demanding requirements quickly and effectively Features Comprehensive measurement functi
3. Test Equipment Solutions Datasheet Test Equipment Solutions Ltd specialise in the second user sale rental and distribution of quality test 4 measurement T amp M equipment We stock all major equipment types such as spectrum analyzers signal generators oscilloscopes power meters logic analysers etc from all the major suppliers such as Agilent Tektronix Anritsu and Rohde amp Schwarz We are focused at the professional end of the marketplace primarily working with customers for whom high performance quality and service are key whilst realising the cost savings that second user equipment offers As such we fully test amp refurbish equipment in our in house traceable Lab Items are supplied with manuals accessories and typically a full no quibble 2 year warranty Our staff have extensive backgrounds in T amp M totalling over 150 years of combined experience which enables us to deliver industry leading service and support We endeavour to be customer focused in every way right down to the detail such as offering free delivery on sales covering the cost of warranty returns BOTH ways plus supplying a loan unit if available and supplying a free business tool with every order As well as the headline benefit of cost saving second user offers shorter lead times higher reliability and multivendor solutions Rental of course is ideal for shorterterm needs and offers fast delivery flexibility try before you buy zero capital expenditure
4. agram 7 different equivalent circuit diagrams Auto mode Read out Equivalent circuit diagram Manual mode Read out Equivalent circuit diagram Measurement update rate 2 measurements s Trim function Open circuit Short circuit Stored settings non volatile memory Front panel settings Calibration Calibration interval Environmental conditions Operating temperature Storage temperature Power requirements Line frequency Power consumption EMC Safety Warm up time Dimensions and weight WxHxD Weight 0 000 Q to 200 MQ 0 0 pF to 100 mF 0 0 uH to 32 kH 0 002 to 500 0 002 to 500 90 0 to 90 0 deg Dominant parameter Parallel for R C Serial for R L Dominant or secondary parameter Parallel or serial selectable Open circuit compensation Z gt 100 kQ Short circuit compensation ZE 10 0 1 trim figures included 0 C to 50 C 40 C to 70 C 100 120 220 240 V 10 50 to 100 Hz 16 VA VDE 0871 Class B CISPR 11 According to CE regulation 73 23 EN61010 CAT II CSA C22 2 No 231 5 minutes 315 x 105 x 405 mm 12 4 x 4 13 x 15 9 3 8 kg 8 4 lb AC Test mode Test frequency Test frequency accuracy Test signal levels Basic measurement accuracy at normal measurement mode DC bias Internal External DC Test mode Optional Test signal levels Basic measurement accuracy at normal measurement mode Contact Check 4270 only Pass Fail Maximum measuring ran
5. cording to EN 50082 1 inclusive IEC 801 2 3 4 conjunction with the 9542A According to CE regulation 73 23 EN61010 CAT Il Pollution Degree 2 CSA C22 2 No 231 a Dimensions and weight Rack mount kit WxHxD 315 x 105 x 405mm 12 4 x 4 13 x 15 9 Weight 5 3 kg 11 7 lb 4 7 kg 10 4 lb USA Wayne Kerr Inc 165L New Boston Street Woburn MA 01801 1744 Tel 781 938 8390 Fax 781 933 9523 Sales 800 933 9319 email sales waynekerr com www waynekerrtest com Wayne Kerr Electronics Ltd UK Durban Road Bognor Regis West Sussex PO22 9RL Tel 44 1243 825811 Fax 44 1243 824698 email sales wayne kerr co uk www waynekerrtest com Distributors worldwide contact UK office ASIA 14F 6 No 79 Hsin Tai Wu Rd Sec1 Hsi Chih Taipei 221 Taiwan R O C Tel 886 2 2698 4104 Fax 886 2 2698 0716 email wksales microtest com tw www waynekerrtest com
6. ges Impedance Resistance AC Z or Rac Resistance DC Roc Capacitance Inductance Quality factor Dissipation factor Phase angle Voltage Monitor Current monitor Maximum resolution Impedance Resistance AC Resistance DC Capacitance Inductance Quality factor Dissipation factor Phase angle Voltage monitor Current monitor Circuit diagram Display Auto mode Read out Equivalent circuit diagram Manual mode Read out Equivalent circuit diagram 50 60 100 120 Hz 200 Hz to 100 kHz 100 Hz steps 100 kHz to 1 MHz 1 kHz steps 0 01 50 mV to 2 V 10 mV steps via 100 Q 0 1 1 digit for gt 0 25 V lt 50 kHz 0 1 x f 50 kHz 1 digit for 2 0 25 Y gt 50 kHz Ore 10 25 VAT 1 digit for lt 0 25 V lt 50 kHz O to 10 V 0 1 V steps O to 40 V 50 mV to 2 V 10 mV steps via 100 Q 0 1 1 digit for gt 0 25 V lt 3Q gt 3 Q with indication of failed connection lead 50 60 100 120 Hz 200 Hz to 20 kHz 100 Hz steps 100 kHz 0 01 50 mV via 100 Q 1 V via 100 Q 2 V via 400 Q 0 1 1 digit for lt 20 kHz 0 4 1 digit 100 kHz 0 5 1 digit for 50 mV lt 20 kHz 2 0 1 digit for 50 mV 100 kHz 2V O to 40 V 300 mV via 100 Q 1V via 100 Q 2 V via 400 Q 0 1 1 digit for 1 V 0 0000 Q to 200 MQ 0 0000 Q to 50 MQ 0 00 pF to 31 8 F 0 00 uH to 637 kH 0 000 to 1000 0 000 to 1000 179 to 180 deg 0 1 uV to 2 00 V 0 005 uA to 10 0
7. l indication along with an external measurement trigger input further speeding up the sorting process become the heart of a fully automated compo testing environment for operation at up to N measurements per second Or with the RS 232 interface the tester can be controlled simply and economically from a PC in a standalone system for incoming inspection of components and devices With the IEEE 488 interface the 4270 and 4265 c TX as Y gt o Using the RS 232 interface measurement results can be output directly to a printer With so many built in capabilities the compact and versatile Wayne Kerr 4200 series LCR meters can be used in service laboratory or production environments And with the best measurement versatility and value in their class they are sure to e FS prove a valuable addition where low cost straightforward testing is required and component accuracy and reliability are essential The Wayne Kerr 4200 series comprises three models to meet a wide range of performance and budget requirements The 4270 is the most versatile LCR meter in the family It allows testing at any frequency up to 1 MHz variable AC and DC test voltages deviation mode and is capable of handling a wide variety of components under realistic test conditions N For testingdo 00 kHz consider the 4265 It has a basic a curacy of 0 1 3 test voltage levels and 204 test frequencies providing a powerful yet low cost s
8. mA 1 of 7 different equivalent circuit diagrams Dominant and secondary parameter Parallel for R C Serial for R L Dominant and secondary parameter or Z 6 D O Vx lx Parallel or serial selectable Average function l Ras l Function Exponential averaging in continuous mode O gt a a 4270 ORDERING CODES OPTIONS Deviation mode 4270 only Relative range in respect to 100 to 100 Description reference value 114260 Measuring modes Automatic LCR Meter 1 kHz Normal Supplied with User Manual and AC Continuous 2 measurements s Power cable Single Triggered via TRIG key Triggered via handler interface 1J4265 Triggered via IEEE 488 or RS 232 Automatic LCR Meter DC 100 kHz Supplied with User Manual and AC Test frequency Br cable 50 60 100 120 Hz 50 60 100 120 Hz 200 Hz to 100 kHz 100 Hz steps 200 Hz to 20 kHz 100 Hz steps 100 kHz to 1 MHz 1 kHz steps 100 kHz Options for 1J4265 DC optional DC optional A RS 232 Interface cannot be fitted B EEE 488 Interface cannot be fitted Max speed 10 measurements s IC DC Test Test frequency 200 Hz to 100 kHz 200 Hz steps 200 Hz to 20 kHz 200 Hz steps D Handler Interface 100 kHz to 1 MHz 1 kHz steps 100 kHz DC optional DC optional 1J4270 Automatic LCR Meter DC 1 MHz with Single Triggered via handler interface RS 232 Interface Triggered via IEEE 488 or RS 232 Read out Via IEEE or RS 232 interface display blanked Za eee nual and AC a amp Bin
9. ning r j Special bins Bin O and bin fail Bin programming via IEEE 488 interface B EEE 488 Interface supplied in place RS 232 interface of RS 232 interface Bin limit programming Bin programmer 4265 only GDC Test Absolute or relative D Handler Interface Trim function Open circuit Open Circuit compensation Z gt 10 kQ Accessories Short circuit Short circuit compensation Z lt 40 Q i 7 9536 041 T against charged RS 232 Cable 3m 9 pin female 9 pin f C lt 2pF Vr lt ZOM Vera lt 500V ou Er 2 ur lt C lt 2 mF Vm 47 x C mF Ny ake lt 11 x C mF Vmax in V C in mF Vex in V C in mF 9540 BAN E gt 2 mF Vmax lt 40 V Vmax lt 100 V 4 wire test cable set with Banana Plugs Stored settings 9540 TWE non volatile memory ETiptveezers Front panel settings 9 1 trim figures included Bin settings 9 1 9541A Print measurement results Via RS 232 interface for serial printers 4 wire test cable set with Kelvin clips Pe an Ag coating alibration Calibration interval 1 year 9541B 4 wire test cable set with Kelvin clips Environmental conditions Heavy Au gold 2 4um Operating temperature Storage temperature 0 C to 50 C 40 C to 70 C 9542A Power requirements 100 120 220 240 V 10 Universal test adapter Line frequency 50 60 Hz EMC According to CE regulation 89 336 Emmission according to EN 55011 Group 1 Class B Test fixture for SMD s Used in Safety respectively CISPR 11 Immunity ac
10. olution to component testing The simplest and most cost effective solution to component testing The 4260 has a 0 25 basic accuracy and is ideal for use in manufacturing as a quality assurance tool or in the service lab for quick tests on a wide variety of components It s equally at home in the classroom for education or in training environments Select the Wayne Kerr LCR meter that s right for your application 2270 T e T EE Frequency range 50 Hz 1 MHz 50 Hz 100 kHz Measurement functions Z Rac L C O D 6 Vx Z Rac L C O D 6 Vx MRS COD O Ix A Series amp Parallel Ix Series amp Parallel e 2 Parallel j Rdc opt Rdc opt l 0 25 AC test signal level 0mV 2V 50 mV 1V 2V D lt 40 V ext lt 40 V ext Contact check Yes Averaging Yes Blevels Yes Deviation mode Yes Test signal monitoring Current or voltage Current or voltage IEEE 488 or RS 232_ IEEE 488 or RS 232 TECHNICAL SPECIFICATIONS AC test mode Test frequency Test frequency accuracy Test signal level Basic measurement accuracy DC bias Internal 1 kHz 0 025 2V via 400 Q source 025 1 digit Maximum measuring ranges Impedance Resistance Z or Rac Capacitance Inductance Quality factor Dissipation factor Phase angle Maximum resolution Impedance Resistance Capacitance Inductance Quality factor Dissipation factor Phase angle Circuit di
11. ons including DC Resistance Test components to 1MHz Large LCD display with easy to read characters 0 1 basic accuracy IEEE 488 or RS 232 interface DC Voltage bias 9 instrument setups stored Display of actual Voltage and Current measurement Automatic zero trim The 4200 series combines superior performance measurement functions and a Contact check low price providing unbeatable value for money Operation is simple and straightforward with measurements undertaken at a wide range of test frequencies and voltage levels Features include a choice of interfaces IEEE 488 or RS 232 comprehensive measurement functions including DC Resistance a bin handling capability and component characterisation to 1 MHz Deviation measurement mode Directly print measured data The 4270 and 4265 have the widest choice of test frequencies For testing primary power components such as transformers and filter capacitors these instruments have 50 and 60 Hz test frequencies together with the 100 and 120 Hz ripple frequencies In the 100 Hz to 20 kHz range both LCR meters provide 100 Hz resolution for precision frequency characterisation For testing small value capacitors 100 kHz is also provided in the 4265 while the test frequency of the 4270 is continuously adjustable up to 1 MHz Component test voltage levels are variable from 2V right down to only 50 mV to keep sensitive semi conductor junctions below their voltage thresholds DC bias can
12. um protection for current sensitive components and allows the test current to be specified together with the measured component parameters Connection of test components is quick and simple either directly to the detachable test posts which are conveniently located on the front panel or using the 9542A universal test adapter The optional 9541B test cable with Kelvin clips provides a unique solution for flexible attachment to mounted components while retaining the extra accuracy of the 4 wire measurement principle Surface mount devices SMDs are also handled quickly and efficiently using the optional SMD accessories All measurements are made using a 4 wire technique which ensures accurate and repeatable measurements even for low impedance components Testing surface mount devices has always been a challenge because of their size no wire leads and tiny or no markings These factors make it more important to be able to test SMD components to control their quality and prevent misloads in a manufacturing environment The Wayne Kerr accessories for SMD testing are uniquely designed and allow fast convenient and accurate characterization of these components The binning function allows components to be sorted into ten bins By inserting the component in the test fixture the indicated bin number can be read from the display The optional handler interface provides lamp drivers for a visual indication of the proper bin or a pass fai
Download Pdf Manuals
Related Search