EMC TEST REPORT
Contents
1. KININININIK I INININIRISINIRIRINISININIRINIRR 33 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory 4 5 Electrostatic discharge Contact discharges to the conductive surfaces and coupling planes The EUT shall be exposed to at least 200 discharges 100 each at negative and positive polarity ata minimum of four test points One of the test points are subjected to at least 50 indirect discharges to the center of the front edge of the horizontal coupling plane The remaining three test points are each receive at least 50 direct contact discharges If no direct contact test points are available then at least 200 indirect discharges be applied in the indirect mode Test is performed at a maximum repetition rate of one discharge per second Air discharges at slots and apertures and insulating surfaces On those parts of the EUT where it is not possible to perform contact discharge testing the equipment should be investigated to identify user accessible points where breakdown may occur Such points are tested using the air discharge method This investigation should be restricted to those area normally handled by the user A minimum of 10 single air discharges shall be applied to the selected test point for each such area The EUT was tested with all I O ports ex2. Serial or Calibration Test instrumentation Model name Manufacturer Firmware Interval No Ver Date Month Test Software EMC 32 R amp S Ver 4 40 0 N A N A Measuring receiver ESCI R amp S 100368 2008 06 11 12 Artificial mains network ENV216 R amp S 100116 2007 09 13 12 9 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory y mene A OS A Oy e NO 214 Project No LBE081646 4 1 2 Photograph of the test Configuration Front 10 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory LCD Monitor MG40PS at EMC La oratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory 4 1 3 Test results Operating condition PC Video In Analog Test date 2008 05 29 Test engineer Hyun Jeong Jang Ambient temperature 25 2 Relative humidity 46 Climate condition Atmospheric pressure 100 7 kPa Test place Shielded Room 1 QP Quasi peak AV Average Note Result Level QP or AV Corr LISN Insertion loss Cable loss Amplifier Gain Margin Limit Level Hardware Setup Voltage with ENV 2 Line LISN EMI conducted Subrange 1 Frequency Range Receiver Transducer 150kHz 30MHz ESCI 3 ENV216 Receiver 2 Line LISN ENV216 Scan Setup EN55022_B_ENV 2 Line LISN fin EMI conducted Ha
3. Table of contents 1 Summary of test results 1 1 Emission 1 2 Immunity 2 General Information 2 1 Test facility 2 2 Accreditation and listing 2 3 EUT Description 3 Test configuration 3 1 Test Peripherals 3 2 EUT operating mode 3 3 Details of Sampling 3 4 Used cable description 3 5 EUT Description 3 6 Description of the EUT exercising method 3 7 Performance Criteria 3 8 Measurement uncertainty 3 9 Measurement uncertainty 4 Result of individual tests 4 1 Conducted disturbance 4 2 Radiated disturbance 4 3 Harmonics current 4 4 Voltage fluctuation amp Flicker 4 5 Electrostatic discharge 4 6 Radiated radio frequency electromagnetic field 4 7 Electrical fast transient burst 4 8 Surge 4 9 Conducted disturbances induced by radio frequency fields 4 10 Voltage dips short interruptions and voltage variations Appendix EUT photography 2 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory 1 Summary of test results 1 1 Emission The EUT has been tested according to the following specifications Applied Test type Applied standard Result Remarks Meets Class B Limit Xx ee Complied Minimum margin is EN55022 1998 A1 200 6 2dB at 0 391 MHz 0 A2 2003 Meets Class B Limit xX Radiated Disturbance Complied Minimum margin is 3 3 dB at 512 396 MHz EN61000 3 2 2000 X Harmonic
4. Vertical Polarization QP No Frequency Reading c f Result Limit Margin Remark MHz dB uV dB 1 m dB uV m dB uv m B 1 85 918 30 5 21 1 9 4 30 0 20 6 2 50 818 33 9 22 4 11 5 30 0 18 5 3 581 396 40 6 7 1 33 5 37 0 3 5 4 769 484 35 3 4 4 30 9 37 0 6 1 21 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 4 3 Harmonics current LCD Monitor MG40PS SEC EMC Laboratory The EUT operated to produce the maximum harmonic components under normal operating conditions for each successive harmonic component in turn The power consumption steady state harmonic currents were measured in the tested operating mode s The EUT measured in accordance with the test conditions described in Annex C C 10 Limits for Class D equipment Harmonic order Maximum permissible Maximum permissible harmonic current harmonic current per watt n mA W A 3 3 4 2 30 5 1 9 1 14 7 1 0 0 77 9 0 5 0 40 11 0 35 0 33 13 n s39 3 85 n See Table 1 odd harmonics only 4 3 1 Test instrumentation Test instrumentation used in the Harmonics current test was as follows Serial or Calibration Test instrumentation Model name Manufacturer Firmware Interval No Ver Date Month Power Analyzer PM6000 Voltech 100006700167 2007 10 12 12 IEC Network 555 ZIMMER IB10 9466 N A N A Test Software IEC1000 3 Voltech Ver 3 13 08 N A N A
5. 4 7 4 Test results Test date 2008 06 05 Hyun Jeong Jang Ambient temperature 25 0 C Relative humidity 48 Climate condition Atmospheric pressure 100 7 kPa vee Observation Performance Test Point Polarity Level Tr Th ns Note No Result kV Live 1 5 50ns 5kHz Note1xXx 2L AX BL Neutral 1 5 50ns 5kHz Note 1 2L AXM BLU PE Ground 1 5 50ns 5kHz Note 1 20 AX BO a c power Live PE l 1 5 50ns 5kHz Note 1 x 2 AM BU ports Neutral PE 1 5 50ns 5kHz Note 1X 2L AM BLE Live Neutral 1 5 50ns 5kHz Note1xx 2 AM BLU a eb 4 5 50ns 5kHz NoteiX 20 AR BO LAN Ports 0 5 5 50ns 5kHz Note1 2L AL BL NOTE 1 There was no change compared with initial operation during the test 2 The transmission of data was stopped during the test but self recoverable after the test 45 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory 4 8 Surge The basic test procedure was in accordance with IEC 61000 4 5 Performance criteria Applied conditions Test specification pela Combination wave ec power pelts Line to Line 1kV Peak Line to earth 2 kV Peak signal and telecommunication ports Line to ground 1 kV Peak B d c power ports 0 5 kV Peak Waveform parameter Open circuit voltage 1 2 5
6. LCD Monitor MG40PS SEC EMC Laboratory 4 6 3 Test results Test date 2008 06 08 Hyun Jeong Jang Ambient temperature 21 0 C Relative humidity 42 Climate condition Atmospheric pressure 100 5 kPa Table Ereduency Azimuth Polarity Observation Penormante MHz Result degree 5 Horizontal AN BL Vertical AM BU a0 Horizontal AX BL Vertical AX BL 80 1 000 See Note igi Horizontal AXM BL Vertical AX BL Horizontal AX BL 270 Vertical AM BU NOTE There was no change compared with initial operation during the test 41 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory 4 7 Electrical fast transient burst E Test on power supply ports and on protective earth terminals Stationary floor mounted equipment The test voltage applied between a reference ground plane and each of the power supply terminals a c or d c and on the terminal for the protective or function earth on the cabinet of the EUT The EFT B generator shall be located on the reference plane The length of the hot wire from the coaxial output of the EFT B generator to the terminals on the EUT is not exceeding 1 m This connection was unshielded but well insulated All other connections of the EUT are in accordance with its functional requirements Non stationary mounted EUT co
7. 20 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory ORY ACCRED y gt ED Project No LBE081646 S O Z A LCD Monitor MG40PS SEC EMC Laboratory Operating condition DVI to HDMI connected Test date 2008 06 19 Test engineer Hyun Jeong Jang Ambient temperature 23 4 T Relative humidity 42 Climate condition Atmospheric pressure 101 0 kPa Test place 10m Semi Anechoic Chamber 2 Receiving antenna mode Horizontal Vertical Test distance 10 m RF Semi Anechoic Chamber Note Result Reading c f Antenna factor Cable loss Amp Gain Margin Limit Result SAMSUNG lt lt Radiated Emission gt gt R4 10m Chamber 2 hdmi_0619 dat Model Standard CISPR Pub 22 Class B 10m Serial Remark1 B Operator Remark2 AC Power Remark3 Temp Humidity Remark4 dB uV m 6o lt 10m_CISPRB gt F Limit L lt hdmi_0619 gt 50 E Spectrum H PK Spectrum V PK Suspected Item H Suspected Item V Final Item H QP Final Item V QP L E a 949 Level Final Result Horizontal Polarization QP No Frequency Reading c f Result Limit Margin Remark MHz dB uV dB 1 m dB uV m dB uV m dB 1 512 995 42 7 9 0 33 7 37 0 3 3 2 581 396 39 0 8 0 31 0 37 0 6 0 3 598 524 35 4 7 8 27 6 37 0 9 4 4 769 498 32 2 5 4 26 8 37 0 10 2
8. Note 1x 20 AX BU Live Neutral 1 1 2 50 8 20 Note 1k 2L AX BLE I O Ports l 1 1 2 150 8 20 Note10 20 AQ BO LAN Ports Line to 1 1 2 50 8 20 Note 1 200 AL BLU Modem Ports Earth l 1 1 2 50 8 20 Note10 20 AL BO d c power ports 0 5 1 2 50 8 20 Note iL 200 AL BUO NOTE 1 There was no change compared with initial operation during the test 2 The transmission of data was stopped during the test but self recoverable after the test 49 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory 4 9 Conducted disturbances induced by radio frequency fields The test was performed with the test generator connected to each of the coupling and decoupling devices in turn while the other non excited RF input ports of the coupling devices are terminated by a 50 ohm load resistor Attempts should be made to fully exercise the EUT during testing and to fully interrogate all exercise modes selected for susceptibility Test results are listed below The basic test procedure was in accordance with IEC 61000 4 6 Performance criteria Test range ere Performance MHz Test specification abe a 3 V unmodulated r m s 80 AM 1 kHz 1 The frequency range is scanned as specified However when specified in Annex A an additional comprehensive functional test shall be carried out at a limited number of fr
9. without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory Operating condition DVI Input Digital Test date 2008 05 29 Test engineer Hyun Jeong Jang Climate condition Ambani pa o Sele 40 Atmospheric 109 7 Kpa temperature humidity pressure Test place Shielded Room 1 QP Quasi peak AV Average Note Result Level QP or AV Corr LISN Insertion loss Cable loss Amplifier Gain Margin Limit Level Hardware Setup Voltage with ENV 2 Line LISN EMI conducted Subrange 1 Frequency Range 150kHz 30MHz Receiver ESCI 3 Transducer ENV216 Receiver 2 Line LISN ENV216 Scan Setup EN55022_B_ENV 2 Line LISN fin EMI conducted Hardware Setup Voltage with ENV 2 Line LISN Level Unit dBuV Subrange Detectors IF Bandwidth Meas Time Receiver 150kHz 30MHz QuasiPeak Average 9kHz 15s ESCI 3 EN55022 B_ with ENV 2 Line LISN 80 70 60 EN 55022 _B Voltage on Mains QP 50 EN 55022 _B Voltage on Mains AV D a n i uh j S 40 ND d 7 TINY 3 eT es a ra L i Diala l 30 20 10 0 150k 300 400 500 800 1M 2M 3M 4M 5M 6 8 10M 20M 30M Frequency in Hz 13 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Labo
10. 19 83mA 29 75mA 1 373mMA 1 419mA 0 145mA NIA 3 18 70mA 28 04mA 1 259mMA 1 314mA 5 None None 0 142mA 0 159mA NIA 37 17 68mA 26 53mA 0 794mA 4 4 0 975mA 38 None None 0 149mA 0 163mA NIA 39 16 78mA 25 17mA 0 559mMA 0 616mA lt L1 Reading is below limit 1 lt L2 Reading is below limit 2 N A Harmonic current below 0 6 of rated current or 5mA whichever is greater are disregarded 27 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Operating condition Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory DVI to HDMI connected Test date Climate condition 2008 05 31 Test engineer Hyun Jeong Jang Ambient temperature 24 2 Relative humidity 40 Atmospheric pressure 100 5 kPa Test place Product Serial no Description Test Date Result Name Shielded Room 3 MONITOR 2008 May 30 4 57pm None Page 1 of 1 2008 May 30 4 40pm HAR_HDMI Type of Test Limits EN61000 2006 Harmonics inc interharmonics to EN61000 4 7 Class D Power Analyzer AC Source Voltech PM6000 v1 18 05RC3 s n 100006700167 Mains Manual Source Harmonic Results Against Chosen Limits PASS Test Parameter Details Operating Frequency Operating Voltage Specified Power Fundamental Current Power Factor Average Input Current Maximum POHC POHC Limit Maximum
11. 22 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory 23 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory 4 3 3 Test results Operating condition PC Video In Analog Test date 2008 05 31 Test engineer Hyun Jeong Jang Ambient temperature 24 2 Relative humidity 40 Climate condition Atmospheric pressure 100 5 kPa Test place Shielded Room 3 Product MONITOR 2008 May 30 4 58pm Serial no None Page 1 of 1 Description Test Date 2008 May 30 4 33pm Result Name HAR_PC Type of Test EN61000 2006 Harmonics inc interharmonics to EN61000 4 7 Limits Class D Power Analyzer Voltech PM6000 v1 18 05RC3 s n 100006700167 AC Source Mains Manual Source Harmonic Results Notes Against Chosen Limits Voltage Crest Factor outside permitted limits PASS Test Parameter Details User Entered Measured Operating Frequency 50 49 9840 Operating Voltage 230 230 5914 Specified Power 170 0000 158 5691 Fundamental Current 0 0000 0 6955 Power Factor 0 0000 0 9751 Average Input Current 0 7048 Maximum POHC 0 0041 POHC Limit 0 0731 Maximum THC 0 1179 Minimum Power 75 Class Multiplier 1 0000 Test Duration 00 02 30 24 57 This report must not
12. EMC Laboratory 4 7 1 Test conditions Test condition in the Electrical fast transient burst immunity test was as follows _ Representative operating conditions PC Video In Analo of the EUT x 9 Ll Stationary floor mounted equipment 2 the Type of the EUT gt Non stationary mounted EUT 3 the type of test facility Shielded Room 2 4 Test level LJ05kvV X 1kvV 5 Polarity of the test voltage XX Positive Xx Negative 6 Duration of the test 18 min IX Live Xx Neutral Xx Live Neutral a c power ports xX Live PE gt Neutral PE Live Neutral PE 7 EUT s ports to be tested i Give Ha LI VO ports Others ports L Communication ports L d c power ports 4 7 2 Test instrumentation Test instrumentation used in the Electrical fast transient burst test was as follows Serial or Calibration Test instrumentation Model name Manufacturer Firmware Interval No Ver Date Month EFT Burst Generator NSG 2025 SCHAFFNER 19873 2007 09 06 12 CDN CDN 8015 SCHAFFNER 19073 N A N A 43 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory 44 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory
13. In Analog DVI Input Digital DVI to HDMI connected Test date 2008 05 31 Test engineer Hyun Jeong Jang Ambient temperature 24 2 Relative humidity 40 Climate condition Atmospheric pressure 100 5 kPa Test place Shielded Room 3 Product MONITOR 2008 May 31 10 28am Serial no None Page 1 of 1 Description Result Name FLI_PC Voltech IEC61000 3 Windows Software 1 08 03RC1 Test Date 2008 May 31 9 06am Type of Test Flickermeter Test Table Power Analyzer Voltech PM6000 v1 18 05RC3 s n 100006700167 AC Source Mains Manual Source Overall Result Notes Measurement method Voltage PASS ee ee O de dmax d t gt 3 3 ms 1 000 3 300 4 000 Reading 1 0 101 0 003 0 058 a a Product MONITOR 2008 May 31 10 28am Serial no None Page 1 of 1 Description Result Name FLI_DVI Voltech IEC61000 3 Windows Software 1 08 03RC1 Test Date 2008 May 31 9 36am Type of Test Flickermeter Test Table Power Analyzer Voltech PM6000 v1 18 05RC3 s n 100006700167 AC Source Mains Manual Source Overall Result Notes Measurement method Voltage PASS d t gt 3 3 ms Limit Reading 1 0 31 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory Product MONITOR 2008 May 31 10 28am Serial no None Page 1 of 1 Description Result Name FLI_HDMI Voltech IEC61000 3 W
14. LI 0 4m L 0 8m 3 Type of test facility 3m Fully anechoic chamber 4 Position of the radiating antennas a distance of 3 meters from the EUT 5 Type of antennas Log periodic 6 Frequency sweep rate 1 5 x 10 3 decades s 7 Dwell time and frequency steps Dwell time 3 s Step size 1 8 Applied test level 3 V m 39 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory 4 6 2 Test instrumentation Test instrumentation used in the Radiated radio frequency and electromagnetic field test was as follows Serial or Calibration Test instrumentation Model name Manufacturer Firmware No Ver date Interval Mast Controller CO2000 INNCO N A Sinal Generator SMLO3 R amp S 102191 2007 09 07 12 Milivolt Meter URV5 R amp S 100243 2008 04 07 12 10V Insertion Unit URV5 Z2 R amp S 100240 2008 04 07 12 10V Insertion Unit URV5 Z2 R amp S 100241 2008 04 07 12 Amplifier 250W1000A AR 312241 N A N A Amplifier 60SIG3 AR 311853 N A N A Antenna AT1080 AR 310700 N A N A Antenna Mast TP1000A AR 311200 N A N A Relay Switching Unit TS RSP AR N A N A 4 6 2 Photograph of the test Configuration 40 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646
15. Laboratory Project No LBE081646 LCD Monitor MG40PS 4 10 Voltage dips short interruptions and voltage variations SEC EMC Laboratory The EUT is tested for each selected combination of test levels and duration with a sequence of tree dips interruptions with intervals of 10 s minimum between each test event Each representative mode of operation shall be tested Abrupt changes in supply voltage shall occur at zero crossings of the voltage waveform The basic test procedure was in accordance with IEC 61000 4 11 Performance criteria Environmental Test Performance phenomenon specification criteria oe 5 Voltage dips gt 95 Voltage interruptions NOTE Changes to occur at 0 degree crossover point of the voltage waveform 4 10 1 Test instrumentation a k reduction periods c See NOTE Test instrumentation used in the Voltage dips short interruptions and voltage variations test was as follows Tost Serial or Calibration inetrumentation Model name Manufacturer Firmware Interval No Ver date Month PFS503 63A Voltage Dip PFS 803 EM TEST 10513100036 2007 06 16 12 Int ti baai X PLINE 1610 HAEFELY 083690 21 2008 05 13 12 54 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory ED Project No LBE081646 S O C u A LCD Monitor MG40PS 4 10 2 Photograph of the test Configuration SEC EMC Laboratory 5
16. MG40PS Samsung EUT PC DM V4 Y95998AX800011Z Samsung Printer ML 1610 BC27BKBL500801F Samsung USB Keyboard SEM DT35US 5B004314 Samsung PS 2 Mouse SMOP5000WX UAG 06060003357 CHIC CORP 3 2 EUT operating mode To achieve compliance applied standard specification the following mode s were made during compliance testing Operating Mode 1 PC Video In Analog Operating Mode 2 DVI Input Digital Operating Mode 3 DVI to HDMI connected 3 3 Details of Sampling Customer selected single unit 5 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory 3 4 Used cable description The EUT is configured installed arranged and operated in a manner consistent with typical applications Interface cables loads devices are connected to at least one of each type of interface port of the EUT and where practical each cable shall be terminated in a device typical of actual usage The type s of interconnecting cables to be used and the interface port of the EUT to which these were connected No Connect Cable Length m Shielded Y N Remark 1 Power 1 8 N EUT 2 Power 1 8 N PC 3 Power 1 8 N Printer 4 DVI Video Input 1 5 N 5 PC Video Input 1 5 N 6 BNC Audio Input 1 2 N 7 BNC Video output 1 2 N 8 USB Keyboard 1 5 N 9 PS 2 Mouse 1 5 N 10 PC Aud
17. be reproduced except in full without written permission from SEC EMC Laboratory gt Project No LBE081646 5 LCD Monitor MG40PS SEC EMC Laboratory MONITOR 2008 May 30 4 58pm Serial no None Page 1 of 1 Description Result Name HAR_PC Voltech IEC61000 3 Windows Software 1 08 03RC1 Test Date 2008 May 30 4 33pm Type of Test Fluctuating Harmonics Test Worst Case Table 2006 Power Analyzer Voltech PM6000 v1 18 05RC3 s n 100006700167 AC Source Mains Manual Source Overall Result Notes Voltage Crest Factor outside permitted limits Class Multiplier Limit 1 Limit2 Average lt Li lt L2 lt L2 Pass Harm Limit 1 Limit2 Average lt L1 lt 12 Max lt L2 Pass Reading Reading FAIL Reading Reading FAIL Class vn SSeS None None 0 498mA 0 538mA N A 323 0mA 484 5mA 48 28mA L L 48 51mA Pass 0 433mA N A rA OmA E A 86mA EFIA EA al ome o aa aa a Ap EAE A A ae Ciun o ioana rss arta y y ranma y ma zns we F i roe asana asaf 9 y Fezan T ma orama wa 7 oesona rrema asama yy faea y wa S O ae ee ee a ee 22 vm vere orsinal ovetmal wa 22 anatnn scttna carro yy satina 7 wa z a Ce a festa wa ar 2am seaem osrana yy eA Pee ee ese Tose T na Ca sma asa iea yy orea 7 wa TES mal mn Pa fae ae 2 ml e m tnd n ae ieem 2nrena ain yy rina y wa gt e parma aae aa YY sl S sn zama foeon y fof we farina assina yy Josam wa lt L1 Reading is b
18. full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory 3 8 Measurement uncertainty Where relevant the following measurement uncertainty levels have been estimated for tests performed on the apparatus According to CISPR 16 4 and UKAS Lab 34 3 8 1 Emission Test type Measurement uncertainty yp C L 95 k 2 Conducted disturbance 2 8 dB Horizontal 4 82 dB Radiated Disturbance Vertical 5 42 dB 8 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory 4 Results of individual test 4 1 Conducted disturbance Both conducted lines are measured in Quasi Peak and Average mode including the worst case data points for each tested configuration The EUT measured in accordance with the methods described in Clause 9 Limits for conducted disturbance at the mains ports of class A ITE Frequency range Limits Limits dB uV NOTE The lower limit shall apply at the transition frequency Limits for conducted disturbance at the mains ports of class B ITE The lower limit shall apply at the transition frequency NOTE 2 The limit decreases linearly with the logarithm of the frequency in the range 0 15 MHz to 0 50 MHz 4 1 1 Test instrumentation Test instrumentation used in the Conducted disturbance test was as follows
19. gt 21 May 2008 11 18 R4 10m Chamber 2 rgb dat Model Standard CISPR Pub 22 Class B 10m Serial i Remark1 i Operator z Remark2 AC Power A Remark3 Temp Humidity Remark4 dB uv m soi i i lt 10m_CISPRB gt F oa Limit F l lt rgb gt 50 F i i Spectrum H PK c T T Spectrum V PK F i h gt Suspected Item H F f x Suspected Item V 40 C i i Final Item H QP L lt Final Item V QP 5 L a 30 p i h 10 iit Ey lg 1 0 30 50 100 500 1000 Frequency MHz Final Result Horizontal Polarization P No Frequency Readin c f Result Limit Margin Remark MHz aB uV I dB 1 m dB uV m dB uV m dB 1 87 287 38 6 21 5 17 1 30 0 12 9 2 985 109 22 6 1 8 20 8 37 0 16 2 Vertical Polarization QP No Frequency Readin c f Result Limit Margin Remark MHz aB uV T dB 1 m dB uV m dB uV m dB 1 78 213 34 9 22 6 12 3 30 0 17 7 2 95 625 32 4 18 9 13 5 30 0 16 5 3 132 895 36 3 16 5 19 8 30 0 10 2 4 154 468 33 0 18 7 14 3 30 0 15 7 5 397 572 30 4 10 8 19 6 37 0 17 4 6 973 396 22 5 1 0 21 5 37 0 15 5 19 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory ORY ACCRED y gt Z ED Project No LBE081646 S O Z A LCD Monitor MG40PS SEC EMC Laboratory Operating condition DVI Input Digital Test date 2008 06 19 Test engineer Hyun Jeong Jang Ambient temperature 23
20. minimum performance level or the permissible performance loss is not specified by the manufacturer then either of these may be derived from the product description and documentation and by what the user may reasonably expect from the equipment if used as intended Performance criterion B After the test the equipment shall continue to operate as intended without operator intervention No degradation of performance or loss of function is allowed after the application of the phenomena below a performance level specified by the manufacturer when the equipment is used as intended The performance level may be replaced by a permissible loss of performance During the test degradation of performance is allowed However no change of operating state or stored data is allowed to persist after the test If the minimum performance level or the permissible performance loss is not specified by the manufacturer then either of these may be derived from the product description and documentation and by what the user may reasonably expect from the equipment if used as intended Performance criterion C Loss of function is allowed provided the function is self recoverable or can be restored by the operation of the controls by the user in accordance with the manufacturer s instructions Functions and or information stored in non volatile memory or protected by a battery backup shall not be lost 7 57 This report must not be reproduced except in
21. 0 Tr Th us Short circuit current 8 20 Tr Th ys Applicable only to ports which according to the manufacturer s specification may connect directly to outdoor cables Where normal functioning cannot be achieved because of the impact of the CDN on the EUT no test shall be required When the manufacturer specifies protection measures and it is impractical to simulate these measures during the tests then the applied test levels shall be reduced to 0 5 kV and 1 kV Applicable only to ports which according to the manufacturer s specification may connect directly to outdoor cables 4 8 1 Test instrumentation Test instrumentation used in the Surge test was as follows Serial or Calibration Test instrumentation Model name Manufacturer Firmware Interval No Ver Date Month Surge Tester o HAEFELY 152602 2008 01 30 12 Surge Impulse Module PIM 100 HAEFELY 152288 2008 01 23 12 Coupling Decoupling PCD 120 HAEFELY 148918 2008 01 23 12 Network Coupling Decoupling E AR HAEFELY 152636 2008 01 23 12 Network 100M Impulse Module PIM 120 HAEFELY 150663 2008 01 30 12 46 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory 4 8 2 Test conditions Test condition in the Surge immunity test was as follows 1 Representative operating condition
22. 1 0 1197 75 1 0000 00 02 30 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory Product MONITOR 2008 May 30 5 05pm Serial no None Page 1 of 1 Description Result Name HAR_DVI Voltech IEC61000 3 Windows Software 1 08 03RC1 Test Date 2008 May 30 5 00pm Type of Test Fluctuating Harmonics Test Worst Case Table 2006 Power Analyzer Voltech PM6000 v1 18 05RC3 s n 100006700167 AC Source Mains Manual Source Overall Result PASS Class Class Multiplier Limit 1 Average Max c Limit 2 Average Max Reading Reading Reading Reading 0 667mA 578 0mA 867 0mA 104 7mA 106 2mA 0 644mA 323 0mA 484 5mA 48 67mA 49 20mA 0 442mA 170 0mA 255 0mA 23 63mA 24 56mA 0 276mA 85 00mA 127 5mA 6 928mA 8 037mA 0 210mA 59 50mA 89 25mA 3 222mA 3 730mA 0 203mA 50 34mA 75 51mA 1 093mA 1 791mA 0 168mA 43 63mA 65 44mA 2 285mA 2 510mA 0 200mA 38 50mA 57 75mA 3 456mA 0 171mA 34 44mA 51 67mA 2 684mA 3 035mA 0 156mA 31 16mA 46 75mA 2 000mA 2 202mMA 0 154mA 2 28 45mA 42 68mA 1 728mA 1 896mA 3 None None 0 224mA 0 253mA N A 25 26 17mA 39 27mA 0 818mA if Wg 1 210mMA if 26 None None 0 157mA 0 177mA NIA 27 24 24mA 36 36mA 0 660mA 0 699mA ft 0 WA 1 2 N 3 0 144mA N 3 21 11mMA 31 66mA 1 251mA 1 277MA 32 0 160mA NIA 33
23. 2692 002 2008 03 18 12 EMI Test Receiver ESIB 26 R amp S 100290 2008 03 27 12 Ant Mast MA4000 inn co N A N A Ant Mast MA4000 inn co N A N A Mast Controller C02000 inn co N A N A Amplifier 310N SONOMA 251674 2008 03 13 12 Amplifier 310N SONOMA 186465 2008 04 09 12 RF selector NS4900 inn co N A N A RF selector NS4900 inn co N A N A Bi log Antenna CBL6112D SCHAFFNER 22248 2007 10 18 24 Bi log Antenna CBL6112D SCHAFFNER 22603 2007 04 02 24 17 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LCD Monitor MG40PS SEC EMC Laboratory 4 2 2 Photograph of the test Configuration Front 18 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory ED Project No LBE081646 S 0O C u A LCD Monitor MG40PS 4 2 3 Test results SEC EMC Laboratory Operating condition PC Video In Analog Test date 2008 06 19 Test engineer Hyun Jeong Jang Ambient temperature 23 4 Relative humidity 42 Climate condition Atmospheric pressure 101 0 kPa Test place 10m Semi Anechoic Chamber 2 Receiving antenna mode Horizontal Vertical Test distance 10 m RF Semi Anechoic Chamber Note A Result Reading c f Antenna factor Cable loss Amp Gain Margin Limit Result SAMSUNG lt lt Radiated Emission gt
24. 4 T Relative humidity 42 Climate condition Atmospheric pressure 101 0 kPa Test place 10m Semi Anechoic Chamber 2 Receiving antenna mode Horizontal Vertical Test distance 10 m RF Semi Anechoic Chamber Result Reading c f Antenna factor Cable loss Amp Gain Margin Limit Result Note SAMSUNG lt lt Radiated Emission gt gt 21 May 2008 10 14 R4 10m Chamber 2 DVI dat Model 4 Standard CISPR Pub 22 Class B 10m Serial Remark1 Operator Remark2 AC Power Remark3 Temp Humidity Remark4 dB uv m 60 lt 10m_CISPRB gt Limit lt DVI gt Spectrum H PK ___ Spectrum V PK gt Suspected Item H gt lt Suspected Item V o Final Item H QP __ Final Item V QP Level 30 50 100 500 1000 Frequency MHz Final Result Horizontal Polarization QP No Frequency Readin c f Result Limit Margin Remark MHz aB Cuv dB 1 m dB uV m dB uV m dB 1 81 714 38 4 22 6 15 8 30 0 4 2 2 96 810 32 4 19 8 12 6 30 0 17 4 3 427 536 34 4 10 3 24 1 37 0 12 9 4 598 524 33 5 7 8 25 7 37 0 1 3 Vertical Polarization QP No Frequency Readin c f Result Limit Margin Remark MHz dB uV dB 1 m dB uV m dB uV m dB 1 123 437 34 1 16 5 17 6 30 0 2 4 2 427 508 35 2 9 9 25 3 37 0 11 7 3 598 468 35 3 6 9 28 4 37 0 8 6 4 940 584 26 2 A 24 5 37 0 2 5
25. 5 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory 4 10 3 Test results Operating condition PC Video In Analog Test date 2008 05 29 Test engineer Hyun Jeong Jang Ambient temperature 25 0 C Relative humidity 48 Climate condition Atmospheric pressure 100 7kPa Test Voltage Period di Angle Observation Performance g an Degrees Note No Result Applications gt 95 UT 0 5 10 0 180 Note 1x 2L AM BO cO 30 UT 25 10 0 Note 1x 2 AK BOU cU gt 95 UT 250 10 0 Note 10 2X AL BX cI NOTE 1 There was no change compared with initial operation during the test 2 While The Voltage Dip amp Interruption tests malfunction appeared in normal operate but self recoverable after the test 56 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory RY _ACCRE Ge iP gt O Project No LCD Monitor MG40PS SEC EMC Laboratory Appendix EUT photography Front View Rear View 57 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory
26. 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory 4 2 Radiated disturbance Of those disturbances above L 20dB where L is the limit level in logarithmic units record at least the disturbance levels and the frequencies of the six highest disturbances The following data lists the significant emission frequencies measured levels correction factors for antenna and cables orientation of table polarization and height of antenna the corrected reading the limit and the amount of margin All measurements were taken utilizing quasi peak detection unless stated otherwise Measurements were performed at an antenna to EUT distance of 10 meters and elevated between 1 and 4 meters Both vertical and horizontal antenna polarizations were measured Limits for radiated disturbance of ITE at a measuring distance of 10 m Frequency range Limits Quasi peak Limits dB dB uV m NOTE 1 The lower limit shall apply at the transition frequency NOTE 2 Additional provisions may be required for cases where interference occurs 4 2 1 Test instrumentation Test instrumentation used in the Radiated disturbance was as follows Serial or Calibration Test instrumentation Model name Manufacturer Firmware SSS eet No Ver Date No Month EMI Test Receiver ESIB 26 R amp S 83
27. 6 1 and 16 2 and Shielded rooms The SEC EMC Laboratory is operated as testing laboratory in accordance with the requirements of ISO IEC 17025 2005 2 2 Accreditation and listing Laboratory Qualifications Remarks goes Accredited KOLAS Korea Laboratory Accreditation Scheme 124 Radio Research Laboratory A i FCC Federal Communications Commission pele National Voluntary Laboratory Accreditation Program Lab Code 200623 0 Norges Elektriske Materiellkontroll Accredited ELA 195 i OM OY VCCI Voluntary Control Council for Interference by Information Technology Equipment C 2421 R 2224 China Quality Certification Center 5 053 5 054 Ver A TUV Rhineland H9354285 TUV PG GOST GOSTSTANDART ROSTEST Deme Elektrotechnicky Zkusebni Ustav Reg No 001 iwi Industry T Canada IC Industry Canada 4 57 Assigned Code 5871 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory 3 Test Setup configuration 3 1 Test Peripherals The cables used for these peripherals are either permanently attached by the peripheral manufacturer or coupled with an assigned cable as defined below The following is a listing of the EUT and peripherals utilized during the performance of EMC test Description Model No Serial No Manufacturer Note LCD Monitor
28. A 3 197mMA 3 360mA Sf Pass Pass tA N A 0 219mA 0 242mA N A 50 34mA 75 51mA 0 998mA 1 208mA 0 159mA 0 176mA N A 43 63mA 65 44mA 2 391MA 2 481mA 0 230mA 0 250mA N A 38 50mA 57 75mA 3 456mA 3 492mMA None 0 173mA 0 190mA 34 44mA 51 67mA 2 628mA 2 754mA 0 146mA 0 160mA 21 31 16mA 46 75mA 1 987mMA 2 070mA vv WA None None fot d a a o n jaojo j 0 164mA 0 184mA 23 28 45mA 42 68mA 1 717mMA 1 802mA MA L 0 233mA 0 251mA 25 26 17mA 39 27mA 0 760mMA 0 870mA Ls s None None 0 156mA 0 172mA 27 24 24mA 36 36mA 0 672mA 0 691mA s A 0 171mA 0 191mA 29 22 56mA 33 85mA 1 083mMA 1 116mA vv None None A 0 142MA 0 166mA 31 21 11mA 31 66mA 1 255mA 1 276mA 0 158mA 0 179mA A 33 19 83mA 29 75mA 1 401mA 1 428mA vv WA None None 0 160mA 0 179mMA 28 04mA 1 248mA 1 277mA vv fv ov MA A A A A A A A A A A A A 0 138mA 0 154mA 17 68mA 26 53mA 0 765mA 0 809mA 38 None 40 lt L1 Reading is below limit 1 lt L2 Reading is below limit 2 A None 0 142MA 0 159MA N N N N N N N N N N N 0 152mA 0 175mA 16 78mA 25 17mA 0 573mA 0 606mA 37 39 I I I I 35 18 70mA I N A Harmonic current below 0 6 of rated current or 5mA whichever is greater are disregarded 29 57 This report must not be reproduced except in f
29. EMC TEST REPORT Project No LBE081646 Revision No NONE Name of organization Samsung Electronics Co Ltd 416 Maetan 3 Dong Yeongtong Gu Suwon Si Applteani Address Gyeonggi Do 443 742 Korea Date of application 2008 05 16 Kind of product LCD Monitor MG40PS Model No EUT Variant Model No NONE Equipment New Alternative Under Test Permissive change New information Samsung Electronics Co Ltd Manufacturer 416 Maetan 3 Dong Yeongtong Gu Suwon Si Gyeonggi Do 443 742 Korea EN55022 1998 A1 2000 A2 2003 EN55024 1998 A1 2001 A2 2003 EN61000 3 2 2000 A2 2005 EN61000 3 3 1995 A1 2001 A2 2005 Issue date 2008 06 30 Test result Complied Applied Standards The equipment under test has found to be compliant with the applied standards Refer to the attached test result for more detail Tested by Hyun Jeong Jang Reviewed by No Cheon Park ZZ Mee Fev This report is the test result about the sphere accredited by KOLAS which signed the Mutual Recognition Arrangement of International Laboratory Accreditation Cooperation The test results in this report only apply to the tested sample This report must not be reproduced except in full without written permission from SEC EMC Laboratory EERU SEC EMC Laboratory 416 Maetan 3 Dong Yeongtong Gu Suwon Si Gyeonggi Do 443 742 Korea Tel 82 31 277 7752 Fax 82 31277 7753 1 57 KON ACCRED Fo Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory
30. Hz 30MHz ESCI 3 ENV216 Receiver 2 Line LISN ENV216 Scan Setup EN55022_B_ENV 2 Line LISN fin EMI conducted Hardware Setup Level Unit Subrange 150kHz 30MHz Detectors QuasiPeak Average Voltage with ENV 2 Line LISN dBuV IF Bandwidth Meas Time 9kHz 15s Receiver ESCI 3 EN55022 B_ with ENV 2 Line LISN Level in dBuV 20 150k 300 400 500 EN 55022 _B Voltage on Mains AV 800 1M 2M 3M 4M 5M 6 8 10M 20M 30M Frequency in Hz 15 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory Final Measurement Detector 1 Frequency Quasi Peak Line Corr Margin Limit MHz dB u V dB dB dB xu V 0 150 000 51 2 L1 9 6 14 8 66 0 0 245 500 45 4 L1 9 6 16 5 61 9 0 390 500 43 7 N 9 6 14 3 58 1 0 491 500 39 2 L1 9 6 16 9 56 1 0 835 500 37 8 N 9 7 18 2 56 0 0 926 500 38 0 L1 9 7 18 0 56 0 1 226 500 40 3 N 9 7 15 7 56 0 1 374 500 40 0 L1 9 7 16 0 56 0 Final Measurement Detector 2 Frequency Average Line Corr Margin Limit MHz dB uv V dB dB dB xu V 0 244 500 41 7 L1 9 6 10 3 51 9 0 391 500 41 9 N 9 6 6 2 48 0 0 588 500 36 1 N 9 6 9 9 46 0 0 685 500 37 6 N 9 6 8 4 46 0 0 930 500 37 1 N 9 7 8 9 46 0 1 028 500 36 4 N 9 7 9 6 46 0 1 225 500 38 2 N 9 7 7 8 46 0 1 371 500 37 7 L1 9 7 8 3 46 0 16
31. THC Minimum Power Class Multiplier Test Duration Notes Voltage Crest Factor outside permitted limits User Entered 50 230 170 0000 0 0000 0 0000 75 1 0000 00 02 30 28 57 Measured 49 9840 230 5843 158 3083 0 6943 0 9749 0 7035 0 0040 0 0731 0 1195 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS MONITOR None Product Serial no SEC EMC Laboratory 2008 May 30 4 58pm Page 1 of 1 Description Result Name HAR_HDMI Voltech IEC61000 3 Windows Software 1 08 03RC1 Type of Test Power Analyzer AC Source Test Date Fluctuating Harmonics Test Worst Case Table 2006 Voltech PM6000 v1 18 05RC3 s n 100006700167 Mains Manual Source 2008 May 30 4 40pm Overall Result PASS Class Notes Voltage Crest Factor outside permitted limits Class D Class Multiplier Limit 1 Limit 2 None 1 Max Reading Limit 1 Limit 2 Max Reading Average Average Reading Reading lt L2 Pass Harm lt L2 Pass FAIL FAIL 0 714mA 0 764mA 578 0mA 867 0mA 105 3mA 105 9mA VAA None None 0 594mA 0 644mA 323 0mA 484 5mA 48 87mMA 49 10mA 3 Sf Pass 5 Pass 0 577mA 0 608mA 170 0mA 255 0mA 23 47mA 23 79MA L ov None Ni Ni NI 7 0 218mA 0 331mA Ni 9 85 00mA 127 5mA 6 795mA 7 147mA 0 201mA 0 227mA NIA 59 50mA 89 25m
32. X BO cH ndirec ff ef VCP Contact 2 4 8L Note1xX 21 AX BL CL 1 LCD Panel Air 2 4x 8X Note 1x 2L AX BL CL Air 2X 4 8 Note 1X 2L AX BL CL 2 RS232C Outln Contact 25 45 80 Note 1X 20 aM BO co 3 Audio Air 2X 40 8 Note 1k 2L AK BL CL Contact 2 4 8 Note1xX 2L AX BO CLI 4 HDMI Air 20 40 8 Note 1X 2L AX BL CLI Contact 20 4 8 Note 1 2L AX BO CLI Direct l Air 2 4 8X Note 1 2 AM BO cO 2 ideo Contact 26 4 8 Note 1X 20 AX BO cO 6 DVI Inout Air 2 4 8K Note 1 20 AX BO CL p Contact 2 4X 8 Note 1X 20 AM BO cL 7 Audio In Out Contact 20 4 8 Note1xX 2L AX BO cH 8 Switch Air 21 4 8 Note 1x 2L AX BL CL 9 AC Power Air 2X 4 8 Note 1x 2L AX BL CL NOTE 1 There was no change compared with initial operation during the test 2 While the electrostatic discharge tests malfunction appeared in normal operate but self recoverable after the test 36 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LCD Monitor MG40PS SEC EMC Laboratory 4 5 4 Tested points E Air discharge points Contact discharge points Air Contact discharge points m Front m Side 37 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory CA gt P
33. elow limit 1 None None 0 405mA 12 EE 4 6 3 w N o w w w lt L2 Reading is below limit 2 N A Harmonic current below 0 6 of rated current or S5mA whichever is greater are disregarded 25 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory Operating condition DVI Input Digital Test date 2008 05 31 Test engineer Hyun Jeong Jang Ambient temperature 24 2 Relative humidity 40 Climate condition Atmospheric pressure 100 5 kPa Test place Product Serial no Description Test Date Result Name MONITOR None 2008 May 30 5 00pm HAR_DVI Shielded Room 3 2008 May 30 5 05pm Page 1 of 1 Type of Test Limits Power Analyzer AC Source EN61000 2006 Harmonics inc interharmonics to EN61000 4 7 Class D Voltech PM6000 v1 18 05RC3 s n 100006700167 Mains Manual Source Harmonic Results Against Chosen Limits PASS Notes Test Parameter Details Operating Frequency Operating Voltage Specified Power Fundamental Current Power Factor Average Input Current Maximum POHC POHC Limit Maximum THC Minimum Power Class Multiplier Test Duration 26 57 User Entered Measured 50 49 9840 230 230 6072 170 0000 159 0499 0 0000 0 6974 0 0000 0 9762 0 7038 0 0042 0 073
34. equencies The selected frequencies for conducted tests are 0 2 1 7 1 13 56 21 27 12 and 40 68 MHz 1 2 Applicable only to cables which according to the manufacturer s specification supports communication on cable lengths greater than 3m 4 9 1 Test conditions Test condition in the Radiated radio frequency and electromagnetic field test was as follows 1 Representative operating conditions of EUT gt PC Video In Analog 2 Type of EUT unit X Single L Multiple 3 Type of test facility used Shielded Room 2 4 Frequency range of application the test 0 15 80 MHz 5 Frequency sweep rate 1 5x 10 3 decades s 6 Dwell time and frequency steps Dwell time 3 s Step size 1 7 Applied test level 3V 50 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory 4 9 3 Test instrumentation Test instrumentation used in the Conducted disturbances induced by radio frequency fields test was as follows Serial or Calibration Test instrumentation Model name Manufacturer Firmware Interval No Ver date Month RF Generator NSG2070 Schaffner 1118 2008 06 16 12 Attenuator INA2070 1 Schaffner 2118 2008 03 06 12 Test Software Win 2070 Schaffner V01 05 N A N A Coupling Decoupling GDN M016 Schaffner 21246 2008 04 21 12 Network 51 57 T
35. ercised Test results are listed below The basic test procedure was in accordance with IEC 61000 4 2 Performance criteria Application of discharge Nee ee Performance criteria Contact discharge 4 B Air Discharge 8 B 4 5 1 Test instrumentation Test instrumentation used in the Electrostatic discharge test was as follows Serial or Calibration Test instrumentation Model name Manufacturer Firmware Interval No Ver Date Month ESD Gun NSG435 SCHAFFNER 001506 2008 03 27 12 Vertical Plane VCP 1 Thermo Keytek 34 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory ECD Project No LBE081646 S 0O C u A LCD Monitor MG40PS 4 5 2 Photograph of the test Configuration SEC EMC Laboratory 35 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory 4 5 3 Test results Operating condition PC Video In Analog Test date 2008 06 08 Test engineer Hyun Jeong Jang Ambient temperature 24 0 Relative humidity 56 Climate condition Atmospheric pressure 100 5 kPa Test place Shielded Room 3 Test z Discharge Observation Performance Method No Applied Pontii emoa Testbevel KV Note No Result dired HCP Contact 21 4 8 Note 1 2L A
36. his report must not be reproduced except in full without written permission from SEC EMC Laboratory ED Project No LBE081646 en LCD Monitor MG40PS SEC EMC Laboratory 4 9 4 Photograph of the test Configuration 52 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory 4 9 5 Test results Test date 2008 06 05 Hyun Jeong Jang Ambient temperature 23 7 C Relative humidity 51 Climate condition Atmospheric pressure 100 3 kPa F Field Pere requency Strength Injection Inject Points Observation Performance MHz Method Cable length Note No Result Vr m s 3 CDN M3 AC power line 1 8m Note 1 201 AXK BLE 3 CDN T4 LAN 10m Note 1 20 AL BL 3 CDN T2 Telephone 10m Note 1L 20 AO BUO 0 15 80 3 CLAMP DC 1 8m Note 1 20 AL BL 3 CLAMP Printer 2m Note 1 20 AO BLU 3 CLAMP VGA 1 8m Note 1 20 AO BO NOTE 1 There was no change compared with initial operation during the test 2 The transmission of data from modem port stopped during the test but self recoverable after the test This permissive loss of performance is specified by the manufacturer and this phenomenon will be put as a clear statement in the User s Manual to avoid misunderstanding 53 57 This report must not be reproduced except in full without written permission from SEC EMC
37. indows Software 1 08 03RC1 Test Date 2008 May 31 10 03am Type of Test Flickermeter Test Table Power Analyzer Voltech PM6000 v1 18 05RC3 s n 100006700167 AC Source Mains Manual Source Overall Result Notes Measurement method Voltage PASS a es de dmax d t gt 3 3 ms Limit 1 000 3 300 4 000 500 Reading 1 0 086 0 002 0 085 0 32 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory Operating condition Manual Switching Test date 2008 05 31 Test engineer Hyun Jeong Jang Ambient temperature 24 2 Relative humidity 40 Climate condition Atmospheric pressure 100 5 kPa Test place Shielded Room 3 Product MONITOR 2008 May 31 11 32am Serial no None Page 1 of 1 Description Result Name MANUAL SWITCHING Voltech IEC61000 3 Windows Software 1 08 03RC1 Test Date 2008 May 31 10 58am Type of Test Manual Switching Table Power Analyzer Voltech PM6000 v1 18 05RC3 s n 100006700167 AC Source Mains Manual Source Overall Result Notes Measurement method Voltage PASS Average dmax 1 429 dmax limit 4 Result dmax pass fail included Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass Pass CO CO N MD GH A oj N
38. io In 1 5 N 11 RS 232C In 1 2 N 12 RS 232C Out 1 2 N 13 audio In 1 5 N 14 AV out 1 5 N 3 5 EUT Description The following features describe EUT represented by this report Items Description Optimum Resoultion 1 360 x 768 60Hz Maximum Resolution 1 360 x 768 60Hz Horizontal Frequency kHz 30 81KHz Vertical Frequency Hz 50 85Hz 6 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory 3 6 Description of the EUT exercising method The EUT exercise program used during EMI and Immunity EMS testing was the SEC EMC Laboratory standardized test program for MS Windows The program repetitively sends a screen of H Character to the display Connect video output of computer on EUT s PC IN D sub port and scrolled H character continuously on EUT s screen Also when EUT has loudspeaker it was regenerative through EUT s audio input reproducing digital white noise by MS Windows Media player in computer 3 7 Performance Criteria Performance criterion A The equipment shall continue to operate as intended without operator intervention No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer when the equipment is used as intended The performance level may be replaced by a permissible loss of performance If the
39. nnected to the mains supply by flexible cord and plugs The test voltage is applied between each of the power supply conductors and the protective earth at the power supply outlet to which the EUT is to be connected E Test on I O and communication ports As far as possible the capacitive coupling clamp is used for coupling the test voltage into the lines However if the clamp cannot be used due to mechanical problems size cable routing in the cabling it may be replaced by a tape or a conductive foil enveloping the lines under test The capacitance of this coupling arrangement with foil or tape is equivalent to that of the standard coupling clamp In other cases it is useful to couple the EFT B generator to the terminals of the lines via discrete 100 pF capacitors instead of the distributed capacitance of the clamp or of the foil or tape arrangement All tests carried out in shielded room The EUT was tested with all I O ports exercised Test results are listed below Performance criteria Applied conditions Test specification Performance criteria Open circuit output test voltage a c power ports 1 kV Peak signal and telecommunication ports 0 5 kV Peak d c power ports 0 5 kV Peak B Wave shape of the pulse 5 50 Tr Th ns Repetition Frequency 5 kHz 42 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC
40. ratory Final Measurement Detector 1 Frequency Quasi Peak Line Corr Margin Limit MHz dB xu V dB dB dB xu V 0 151 000 50 6 L1 9 6 15 4 65 9 0 245 500 45 5 L1 9 6 16 4 61 9 0 393 500 43 4 N 9 6 14 6 58 0 0 493 500 37 8 L1 9 6 18 3 56 1 0 830 500 37 3 L1 9 7 18 7 56 0 0 931 500 39 9 N 9 7 16 1 56 0 1 373 500 40 3 L1 9 7 15 7 56 0 1 468 500 38 8 L1 9 7 17 2 56 0 Final Measurement Detector 2 Frequency Average Line Corr Margin Limit MHz dB xu V dB dB dB xu V 0 245 500 41 6 L1 9 6 10 3 51 9 0 392 500 41 8 N 9 6 6 2 48 0 0 686 500 36 8 N 9 6 9 2 46 0 0 930 500 37 5 N 9 7 8 5 46 0 1 029 500 36 6 L1 9 7 9 4 46 0 1 225 500 37 3 N 9 7 8 7 46 0 1 372 500 38 2 N 9 7 7 8 46 0 1 469 500 36 0 N 9 7 10 0 46 0 14 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Operating condition Project No LBE081646 LCD Monitor MG40PS DVI to HDMI connected SEC EMC Laboratory Test date 2008 05 29 Test engineer Hyun Jeong Jang Climate condition panbient pa o Relative 40 Atmospheric 499 7 kPa temperature humidity pressure Test place Shielded Room 1 QP Quasi peak AV Average Note Result Level QP or AV Corr LISN Insertion loss Cable loss Amplifier Gain Margin Limit Level Hardware Setup Voltage with ENV 2 Line LISN EMI conducted Subrange 1 Frequency Range Receiver Transducer 150k
41. rdware Setup Voltage with ENV 2 Line LISN Level Unit dBuV Subrange Detectors IF Bandwidth Meas Time Receiver 150kHz 30MHz QuasiPeak Average 9kHz 15s ESCI 3 EN55022_B with ENV 2 Line LISN 80 70 60 hel A Level in dBuV w 20 EN 55022_B Voltage on Mains AV 150k 300 400 500 EN 55022 _B Voltage on Mains QP 800 1M 2M 3M 4M 5M 6 8 10M 20M 30M Frequency in Hz 11 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory Final Measurement Detector 1 Frequency Quasi Peak Line Corr Margin Limit MHz dB u V dB dB dB xu V 0 150 000 51 7 L1 9 6 14 3 66 0 0 245 500 45 8 L1 9 6 16 1 61 9 0 293 500 41 9 L1 9 6 18 5 60 4 0 393 500 43 4 N 9 6 14 6 58 0 0 488 500 38 4 N 9 6 17 8 56 2 0 736 500 36 5 L1 9 7 19 5 56 0 0 834 500 39 1 L1 9 7 16 9 56 0 0 932 500 40 2 N 9 7 15 8 56 0 Final Measurement Detector 2 Frequency Average Line Corr Margin Limit MHz dB xu V dB dB dB xu V 0 245 500 41 4 L1 9 6 10 5 51 9 0 392 500 41 8 N 9 6 6 2 48 0 0 832 500 36 0 N 9 7 10 0 46 0 0 931 500 38 2 N 9 7 7 8 46 0 1 028 500 37 0 N 9 7 9 0 46 0 1 372 500 37 6 N 9 7 8 4 46 0 1 470 500 36 0 N 9 7 10 0 46 0 2 009 500 35 4 N 9 7 10 6 46 0 12 57 This report must not be reproduced except in full
42. roject No LBE081646 lt 4 LCD Monitor MG40PS Buttom SEC EMC Laboratory 38 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory LCD Monitor Project No LBE081646 MG40PS SEC EMC Laboratory 4 6 Radiated radio frequency electromagnetic field The test was performed with the EUT exposed to both vertically and horizontally polarized fields of the four sides on each The dwell time at each frequency shall be not less than the time necessary for the EUT to be able to respond The basic test procedure was in accordance with IEC 61000 4 3 Performance criteria Test range MHz Test specification rete 80 AM 1 kHz 3 V m unmodulated r m s Performance praca Remarks criteria The test level specified is prior to modulation See The frequency range is scanned as specified However when specified in Annex A EN55024 an additional comprehensive functional test Shall be carried out at a limited number of frequencies The selected frequencies are 80 120 160 230 434 460 600 863 and 900 MHz 1 4 6 1 Test conditions Test condition in the Radiated radio frequency and electromagnetic field test was as follows 1 Representative operating conditions of EUT x PC Video In Analog XX Table top L a combination of the two 2 Type of the EUT LI Floor standing a height above the ground plane
43. s current A2 2005 Complied X Voltage fluctuation amp EN61000 3 3 1995 A1 Flicker 2001 A2 2005 Complicd 1 2 Immunity Immunity test applied the normative documents of EN55024 1998 A1 2001 A2 2003 The EUT has been tested according to the following specifications Performance Criterion Applied Test type Applied standard Result Specification X Electrostatic discharge EN61000 4 2 1995 AX BL CL B Radiated radio frequency re x electromagnetic field ENG1000 4 3 1995 Abd BLI cL A x Electrical fast transient burst EN61000 4 4 1995 Ax BL CL B xX Surge EN61000 4 5 1995 AX BL CL B xX Radio frequency conducted EN61000 4 6 1996 AX BL CL A AX BLE CL Voltage dips short B gt 95 0 5 Reduction xX interruptions and voltage EN61000 4 11 1994 A BL CL C 30 25 Reduction variations C gt 95 250 Reduction AL BX cL oO COREEA ae magnetic EN61000 4 8 1993 AC BO cL A 3 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS 2 General Information 2 1 Test facility SEC EMC Laboratory The SEC EMC Laboratory is located on Samsung Electronics Co Ltd at 416 Maetan 3 Dong Yeongtong Gu Suwon Si Gyeonggi Do South Korea All testing are performed in Semi anechoic chambers conforming to the site attenuation Characteristics defined by ANSI C63 4 CISPR 22 1
44. s f Re LOT x PC Video In Analog X EUT power supply L unshielded asymmetrically operated interconnection lines 2 aes of L unshielded symmetrically operated interconnection telecommunication lines L shielded lines L potential differences 3 the type of test facility Shielded Room 3 4 Test level L 0 5 kV X1kv X 2kvV 5 Polarity of the surge XX Positive xX Negative 6 Number of test at selected points 40 7 Repetition rate 60 sec DX Live Neutral a c power ports P E I Live PE X Neutral PE 8 EUT s ports to be tested C 1O ports others ports L Communication ports L d c power ports 47 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory 4 8 3 Photograph of the test Configuration 48 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory 4 8 4 Test results Test date 2008 06 05 Hyun Jeong Jang Ambient temperature 24 0 Relative humidity 56 Climate condition Atmospheric pressure 100 1 kPa eet NEE WEN Observation Performance Test Point Polarity Level Shape Note No Result kV us Live PE 2 1 2 50 8 20 Note 1X 2L AM BL a c oor Neutral PE 2 1 2 50 8 20
45. ull without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory 4 4 Voltage fluctuation amp Flicker The EUT operated to produce the most unfavorable sequence of voltage changes under normal operating conditions During the flicker measurement the measure time shall include that part of whole operation cycle in which the EUT produce the most unfavorable sequence of voltage changes Limits of voltage fluctuations and flicker at the supply terminals short termflleker the relative the value of d t during a the maximum indicator Pst steady state voltage voltage change d t relative voltage change dc gt 3 3 change dmax 3 3 4 4 4 1 Test instrumentation Test instrumentation used in the Voltage fluctuation amp Flicker test was as follows Serial or Calibration Test instrumentation Model name Manufacturer Firmware Interval No Ver Date Month Power Analyzer PM6000 Voltech 100006700167 2007 10 12 12 IEC Network 555 ZIMMER 1IB10 9466 N A N A Test Software IEC1000 3 Voltech Ver 3 13 08 N A N A 4 4 2 Photograph of the test Configuration Is Same the Harmonic current test photograph 30 57 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081646 LCD Monitor MG40PS SEC EMC Laboratory 4 4 3 Test results Operating condition PC Video
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