9100 Series - Test Equipment Datasheets
Contents
1. l FLOPPY CARD EDGE PLUG JACK FIXTURE The 1 O module lets you use a v iriety of test techniques You can use it to drive anode high or low or to stimulate it with a st ing of data patterns It can also gather a wie range of response data including taking an de s signa ture sensing its logic ievel and me asuring ac tivity on a node through frequenc measure ments or event counting Built in clock con nectors let you synchronize the m dule to an external clock when troubleshoot 1g asynch ronous circuitry The measurement may consist Oo Signatures gathered concurrently at several todes or it may be the circuit response meas ired by the pod Functional testing may be at tomated by fixturing the nodes Critical for functi nal testing O Modules are adaotabie interfac ng with test fixtures for functional testing Tne 9100 Series testers provid flexibility several ways and alternatives to exe cise circui try on the UUT to perform reliable functional tests with a high degree of fault cc verage and confidence a e e e e e e e e a e a e e e e a e 9100 Series Node oriented Troubleshooting If any of the built in tests or functional tests indicate that faults exist your next step is to perform node oriented troubleshooting to iso late the fault to a particular component One of the test techniques used in this process is sig nature analysis in which the electrical signa ture of2. 8 bit and 16 bit microprocesors Special circuitry protects pods from damage even if p ugged in backwards Troubleshooting Probe Plugs into SC J0 Series mainframe in response mode takes si ynatures counts events shows logic states ir stimulus mode injects either clock synchron zed or 1 kHz pulses Measurement thresholds are 0 8V low 2 4V high Stimulus pulses are lt 0 2V a 100 mA low gt 4V at 100 mA high Probe S protected to 30V es Aulomatic Functions Summary Learn Mode 9010A and 9020A only Uses a known good system of same type as unit under test to locate and determine size of RAM ROM and read writeable I O registers and to com ute signatures Stores results in memory for immediate comparison to circuits being tested data can also be saved on minicassette or with RS 232 C option downloaded to another system or device Built In Kernel Tests Using data entered either automatically through Learn mode or manually through the keyboard the 9000 Series Trouble shooters can perform the following tests of ker nel circuitry each initiated by a single key stroke BUS Checks electrical integrity of address data and contro lines isolates stuck nodes and adjacent trace shorts RAM SHORT Checks each RAM location for ability to read and write verifies address decoding detects data line shorts beyond bus buffers ROM Computes ROM signatures and co
3. 80286 Pod Use only on 40 pin microprocessor adaptations Option 9010A G01 is required E Disk Option 1720A 001 is required for 1720A Option 9OTOA 001 is required Requires IBM PC with RS 232 Interface 9010A and 90T0A GF Requires IBM PC with AS 232 interface Package of Ten Minicassette Tapes yYAD At oF g 9100 Series option Compatibility Description OC Za S100A SYS St00A 9105A Interface Pods all Parallel O Module four can be used Programmers Station w Monochrome Monitor Programmers Station w o Monitor for Color 312K Memory Expansion Q000A 9100A 003 9100A 004 9100A 005 91054 007 9105A 008 9100A 009 9O00A 010 9100A 011 Real Time Clock Monochrome Monitor Demonstration and Training Package Golor Video Card 9100A 012 91004 013 Other hems y8091 Package of Ten 3 5 inch Floppy Disks Y9100A DCS DIP CLIP Set 14D through 40D Notes All options are customer installable excepi where noted Compatible option Option suffix identifies Interface Pod type One included installed at Factory or at extra charge later order through Service Center included as part of 9100A 004 2 M Byte Memory Expansion Keyboard Mi
4. 9000 Series Micra System Tro ibleshoot ars 9005A 90104 and 9020A ire among the most comprehensive troublest ooting in struments ever developed for locatir g faults on microprocessor based systems Th ay include built in preprogrammed test routines for check ing the entire microprocessor kernel bus RAM ROM and O Included is a trout eshooting probe that you can use either to mc nitor logic action on a node by node basis cr to inject stimulus pulses The three troubleshooters differ rimarily in their programming and system cap bilities The 9010A is a self contained pi gramma ble model that lets you develop you own cus tomized test programs Using the 010A you can perform specialized guided fat t isolation routines on any portion of a boa d s digital circuitry The nonprogrammable 90054A ir cludes the Same built in tests as the 9010A out cannot generate new test routines It can hi wever run test sequences developed on the 3010A and downloaded from a minicassette ta e With the optional RS 232C interface you can also down load test sequences directly fromthe 9010A ora host computer Typically you wot d develop guided fault isolation programs at central lo cation using a 9010A and then ren the pro grams at remote sites on 9005As The 9020A designed for system 3 3 use runs fest programs written and stored ii a system controller or other computer Yo can also combine the 9020A with other test i istr
5. 9020A and records the responses It also provides a graphic display of the node that the operator is probing along with the other points that drive that node As each nodal measurement is taken the dis play will show whether the response was GOOD or BAD The software wil continue to ask for probe points until it can make a decision on the cause of the problem Once made this decision is displayed on the CRT For cases where ihe operator is experienced in troubleshooting a particular board TestWri ter also allows unguided fault isolation in which the operator decides the order in which nodes are to be tested a a a a L Test Station Configuration a a 1 Technic a i Prompts bet in Poe J ee l a HA T w j rrira e 4 a y 7 l j Frote Loen as 232 9010A GF Upgrade Kit This kit in conjunction with the 9010A 001 AS 232C interface port transforms a 9010A into a dual purpose unit it will continue to func tion as a standard 9010A and in addition can function as a 9O20A 001 As a 9020A this unit can operate with the above described Test Writer software which executes on an MS DOS compatible personal computer This upgrade kit allows you to execute all existing test procedures on the 9010A and ex pands its utility by offering you the ability to interface it with a pe and utilizing the power of the TestWriter software system The upgrade m
6. a node on the unit under test is compared with that of the same node on a known good board Other response factors may also be compared including logic levels event count and frequencies Single point probe for high frequency sig nals You can use the single point probe in stead of the I O module for higher frequency signals up to 40 MHz You can also use it for parts of the board that cannot be accessed with an Omodule Like the I O module the single point probe can be used to drive a node high or low to stimulate a node and to gather various types of response data it can take signatures sense logic levels and count events or fre quencies An external clock module provides leads for testing asynchronous circuitry Get as much or as litile automation as you want With the 9100 Series you choose the degree of automation you want immediate Mode for manual operation Guided Fault Isolation for automation of the troubleshooting process or Unguided Fauit tsolation for semi automated troubleshooting If you do decide to automate you ll find that many of the 9100 Series special features including the programming work Station high level programming lanquage and built in Guided Fault Isolation decision tree make the process easier and faster than you ever thought possible Manual operation lets you start testing immediately Immediate Mode lets you begin using your 9100 Series tester the first da
7. d period Software uparades include any har ware re quired for implementation Upgrades will include productimp svements which increase the tunctionality of tF a product software and increase the throughpu oftesting and troubleshooting Upgrades im rove the operation af the operator control pro jramming station editor programming language anc func tions Guided Fault Isolation progran ming and the i O devices such as the disks and commun ication ports Some upgrades impro e the op eration of existing capabilities and some up grades add new capabilities Future najor en hancements wil be sold separately 9100 Features Mainframe 20 Mbyte Hard Disk fo program development and storage 9100 Single 9100A or Dual 9105A 3 5 inch 1 40K byte formatted MicroFloppy Drives for soft are load ing storage and copying 16 bit wr with 2 0 Mbytes 9100A or 1 5 Mbytes 9105 of inter nal RAM for program and data storac 2 Plug in slots for 1 pod and 4 Parallell O Mod ules Dual RS 232 Interfaces one system refere iced one earth referenced Display 3 line 42 characters vacuu 1 fluores cent dot matrix with graphics capabi ty Keypad User keyboard allows acc 2ss to ail functions Seldom used functions re called with soft keys Built in Tests RAM Allows selection of one of thre possible tests for finding faults associated with RAM circuitry ROM Reads ROM and computes RACs and compares with stored CRC Bus
8. into the eens program to make the programmer s j 1b easier ie METT m Key among these are Provision for default entries on n ost com mands simplifying the process o creating Mealea test routines oe Mevtusg se uc 8 Fbee Built in fault handlers that you car incorpo isos dtn dalam Bes sey rate in your routines You can als 9 choose Seater dene dvaae iar sete to override these built in fault han ders with scaricare sas eee custom created ones crete You can write functional tests ince rporating ee G a nan the microprocessor interface pod IO module a pk and probe A debugger is provided w th break ms a p n ae a co ma pam point and single step capabilities to help you quickly locate any problems You can also write administrative programs for examp te track board failures and the associated fa ulty com ponents for future analysis Programming for the 9100A is erformed through an 80 column 24 line Cf T and a standard computer style keyboard The key board also includes nine soft keys wi f built in functions to speed program develop ient ee eee ee a Inam gii a iz Special test language Tne 9100A uses a programming language designed specifically for developing test and troubleshooting rou tines Its command list incorporates all of the 9100 functions program control constructs and allowed variables making ita well rounded language for writing test programs a ie Two RS 232 C seria
9. parts or other parts nc t included in the standard library roe PRERS RE Interconnectivity data indicating which de vices and pins make up each node The back tracing algorithm uses this informa tion to isolate the fault to a single compo nent f this information already exists in a CAD CAE file you may be able to download it diractly saving data entry time Single point probe pulser can measure sig nals up to 40 MHz The probe is particularly useful for portions of the board that cannot be accessed with the 1 0 module A clack module fnot shown provides connections To external clock signals for trouble shooting asynchronous circuitry Microprocessor pod gives you direct control are avaiable for more than SC micropraces sor chips Powerful Motorola 68000 microprocessor allows fast execution of all tests Clear easy to read three line vacuum fuor escent display nas a line length of 42 characters Fiva soft keys are user programmable in Guided Fault Isolation and Unguided Fault isolation Modes In Immediate Mode the default values of these Keys are used Soft key labels are displayed on the bottom tine of the three line display I O MOD key displays a group of solt key options allowing the operator to configure and contro the 1 0 module i of the microprocessor bus circuitry Pods ee Digital Test Systems 9100 Series Numerous features are designec
10. products more Joroughly and with a higher degree of confic ance than ever before at the design stage c uring pro duction and in the field And you can automate your troub eshooting procedures with minimal programmil g the tes ter s built in Guided Fault solatio cecision tree does most of the work Emulative Board Testing for the Kernel Ai the heart of Fluke s approach s a tech nique known as emulative board tes ting so called because it involves emulation of the board s microprocessor This technic ue is pre ferred by board manufacturers the world over for finding faults in kernel circuitry be sause itis the only technique that tests a boar from the inside out Consequently it lets 3u locate more faults more quickly than iny other approach Microprocessor interface pods T emulate the board s microprocessor you sele ct the mi croprocessor interface pod that corre spondsto the microprocessor on the board Pods are avail able for over 50 microprocessor chig 3 includ ing the new 80286 All existing Fluke 1icropro cessor interface pods can be usec with the 9100 Series The 80286 Pod with the 9100A 91C 5A main frame allows a single instruction b eakpoint and provides 8 K bytes of overlay RAI 4 includ ing the advanced pod features see pa je 214 for pod information Total control of the bus In addition tc contain ing its own microprocessor each pe d has its own RAM ROM and 1 0 making ita s
11. stimulus mode it can inject high or low pulses to stimulate readouts print heads interfaces or other devices Driven by a sync pulse from the interface pod the probe can be synchronized to various microprocessor events such as valid address or data periods on the microprocessor bus You can also choose to use itin free run mode injecting 1 kHz pulses at the contacted nodes To further extend the capabilities of the trou bleshooting probe add the asynchronous sig nature option This option lets you lest asynchron ous circuits located outside the microprocessor bus structure such as DMA controllers video controllers and video generation circuits with out using a logic analyzer or oscilloscope Tests performed include signature gathering wave form capture and event counting For more in formation see the description of the Asynchron ous Signature Probe Option Custom Test Programming on the Fluke 9010A The 9010A lets you write your own compre hensive test routines tailored i the unique characteristics of the equipment you service These programs can inciude prompting mes sages to help guide your technicians through the test procedures Once written your test programs can be stored on minicassettes for later use or for loading in a 9005A You can generate your own test software in two ways First you can develop short pro grams right on the 9010A s keyboard in much the same way as with a scien
12. to 63 Hz Power Consumption Mainframe 1 OW max monitor 50W max Size Mainframe 14 0cmhH x343cemWw x 30 8cmD 5 5in x 13 5 in x 20 0 in Monitor 30 33cm H x 33 53 em W x 33 00 cm D 12 02 in 213 2 in x Win ASCII Keyboard 5 02cmHx2 15cmW x 47 2 cm D 2 0 in x 8 33 in x 18 51 in Weight Mainframe 8 26 kg 18 2 b Monitor 8 44 kg 18 6 lb ASCII Keyboard 1 59 kg 3 5 Ib Safely Designed to meet the follow ng safety standards ANSI UL 478 IEC 348 IE 3435 and CSA 5568 Options 9100A 003 Parallel I O Modiile Features CRC signatures with Start Stop En ble clock ed to pod or external clock CRC signatures with stop derived Homa pro grammabie number of clock pulses ter Start Enabie can be derived from the ext arnal ena ble lins or from Pod Sync or can be f irced true Programmable slopes on clock tari stop and enable CRC signatures can be taken du ing over drive Transition counter gated by exte nal Start stop and Enable Frequency measurements to 10 NV 4z Clocked level history using extei na clock qualified with Star Stop and Enable Asynchronous level history Drive ofany arbitrary pattern of 0 1 or 3 state Comparison of any arbitrary 40 oit pattern with a programmabie 40 bit pattern o Os and 1s True comparison available as a fi ult within TL 1 programs or as a message dui ng imme diate mode operation The hardw ire signa DCE is also available on the outsidt ofthel O module
13. Checks the integrity of address data and control bus Built in Troubleshooting Functions Read Reads data from a specified Ic sation Write Writes data to a specified loca ion Toggle Toggles a specified data a jdress or control bit Ramp Ramps the data or address bi s over all possible values with a specified star ing value and a mask of bits to be ramped Rotate Rotates right a specified sta ting data word through all possible bit positior 3 Probe Features CRC signatures with exter val clock start stop and enable CRC signatures with external clock start and stop genera ed froma programmable number of clock pt ses after start CRC signatures with the clock from the pod sync 24 bit transition counting us ng exter nal start stop and enabie Freque icy mea surement to 40 MHz Clocked 3 state ogic level history using external clock qualified with start stop and enable Clocked 3 state Igic leve history using microprocessor pod s ne clock ae asynchronous 3 state level history in all modes Selectable thresholds for TTL CMOS anc AS 232 levels Three logic level indicators on the handheld probe body Probe output drive for nigh low or toggle synchronized to pod sync external clock or free run Probe response but ton to signal the mainframe to gather response data Common lead fused for both the probe and clock module to provide ground fauit pro tection with blown fuse indication Software Programmin
14. Digital Test Systems 9100 Series EEE F GILA Se m era lest ALS DETIAN BUS AT ACDE 9100 Series Digital Test System Emutative Board Test Test microprocessor based digital circuitry from the microprocessor outward Automated Functional GO NO GO Tests and Guided Fault Isolation GFI Test Integrated program development environment Automatic functional tests of uP kernel Automatic generation of GFI decision tree Support for over 50 microprocessors The 9100 Series is the newest member of Fluke s family of digital testers and trouble shooters It is designed for fast cost effective automation of your test and troubleshooting procedures for microprocessor Dased digital circuit boards Included in the 9100 Series are two testers the 9100A Digital Test System which can be used both for developing test software and asa stand alone test station and the 9105A Digital Test Station an execute only tester that can be used to execute programs developed on the 9100A The 9100A offers fast and easy development oi functional test and troubleshooting programs which stay ahead of the increasing complexity of digital boards Test program design is highly automated guiding the test or service engineer through the development process Combined with new state of the art test hardware com plete digital board test and repair solutions can be created in record time The 9105A Digital Test Station
15. Logic thresholds switchable betw en CMOS and TTE l Family of DIP and SMT logic cli modules with response butten to start respon ie gather Ing Common lead fuse protection for ground fault protection with blown fuse indict ation 9100 Series Electrical Specifications Data Output Specifications Current time gt 10 mS 200 mA Current lt 10 mS 2A Pattern Rate 1 module driven 35 kHz Pattern Depth 1 module driven during 10 mS high current pattern drive mode 256 patterns Max current per pin driving high 250 mA Max current per pin driving low 150 mA Data Inputs Input impedance 50 kM min Input Thresholds Te GMOs 50V GUARANTEED HIGH high or invalid GUARANTEED INVALID tow or invalid GUARANTEED LOW 1 2V Clock Start Stop and Enable Inputs Thresholds Logic low 0 8V max Logic high 2 0V min Input Current 1 pA Input Output Overvoltage Protection 15 V for one minute maximum any pin one at a time Transition Counter Max Frequency 10 MHz minimum Max Count Transition Mode 8388607 counts toverllow Freg Accuracy Freq Mode 250 ppm 2 Hz Stop Counter Max Frequency 10 MHz Max Count 65535 clocks Clock Max Frequency 10 MHz Min Pulse Width 50 nsec Timing for Synchronous Measurements Max Frequency of Clock 10 MHz Data Setup Time 30 nsec Data Hold Time 30 nsec Minimum Putse Width Start Stop Enable Clock 50 nsec Start Edge Setup T
16. Video controllers Video generation circuits Communication circuits Peripheral controllers The Asynchronous Signature Probe provides three distinct troubleshooting measurements Signature gathering using the c clic redun dancy check technique Waveform capture in which tr 3 probe tip data stream is sampled every 20 nanose conds fora total of upto 32 datas amples The results of this sampling are boti displayed and stored Event counting a powerful tool for node characterization Using this feat re you can count events from the probe tip either con tinuously or through a measurer ant window A 24 bit register allows you to rer ord over 16 Million events The Asynchronous Signature Pre be consists of a circuit board installed in the J000 Series mainframe a clock module which p icks up tim ing and control signals from the un tunder test and a special set of operating pre Jrams con tained on a minicassette tape Micro System Troubleshooters 9000 Series 9020A 925 TestWriter Fluke s TestWriter software combined with the 9020A Micro System Troubleshooter an in terface pod and an IBM or IBM compatible personal compuler makes it easy to develop guided fault isolation or automated diagnostic programs for digital circuit testing In this con figuration the persona computer communicat ng with the 9020A 001 through its AS 232 C interface acts as both a system controller anda stor
17. age medium TestWriter offers the best of both worlds in regards to program generation and execution Programmers will welcome TestWriter s time savings and simplified data entry procedures Operators will appreciate the use of menus in directing the testing process as well as the easy to read graphic feedback of the testing process TesiWriter s ability to automatically generate a fault tree eliminates the tedious time consum ing process of entering individual decision statements when structuring a program The programmer simpiy enters UUT descriptive in formation the component types and their inter connectivity This time saving feature together withthe increased memory capacity inthe PCis what makes TestWriter extremely effective when generating large GFI programs The test engineer proceeds by developing a set of stimulus routines one and sometimes several lor each node on the UUT The last step in completing the GFI program is to gather responses on each node of a known qood UUT while stimulated by the correspond ing stimulus routine s These responses are stored in a separate file which will be used for comparison with responses from a defective board during the fault isolation process TestWriter also simplifies the process of trou bleshooting defective units The operator makes selections from menus aided by prompts and grapnic displays The personal computer auto matically sends the appropriate commands to the
18. al area Fluke Sales Office o Representa tive for a copy of Technical Data B i156 User Designed Interface Pod Adapters r Micro System Troubleshooters 9000 Series Interface Pods More intelligence Many of the newer pods feature additional built in software enhancing he troubleshooting and test capabilities of the mainframe With this software the user need only send the test parameters to the pod from the troubleshooter mainframe The pod will in dependently execute the specified function providing much faster test results than is possi ble with mainframe execution interrupt Features Some of the newer pods also have interrupt testing capabilities allowing them to read information from received inter ruots The user can control the configuration of the pod s interrupt lines enabling and disabling interrupts and forcing interrupt acknowledge cycles Quick Memory Tests Fluke has increased the speed of memory testing in many of its new er pods including tne 8051 8086 8088 Z8000 68000 80186 80188 and 80286 building Quick AAM and Quick ROM tests into the pod soft ware In addition to greatly reducing the test time these tests provide A choice of byte or word test for the 16 bit microprocessors A choice of address increment size More flexibility under program control The Quick RAM test consists of two parts The first rapidly tests the read write capabilities of either small segm
19. apability is that al operators can be nefit from the knowledge of your most expe rienced test engineers Once your test engineers write the Guided Fault Isolation procedures lower level operators can execute them saving you considerable labor costs Semi automatic operation lets you choose the troubleshooting sequence For emi auto matic troubleshooting you can ust the 9100 Series to perform Unguided Fault lso ation This mode is like Guided Fault Isolation xcept that the operator decides which node to probe However much of the manual act vity is re moved from the process so you c n trouble shoot more rapidly Once a node is selected the appr gt priate sti mulus routine is executed and the re sults of the stimulus are displayed In tnis way tt operator guides the fauit tracing procedure For experienced troubleshooters vho prefer to follow their instincts rather thin moving through a set troubleshooting seq ence Un Qquided Fault isolation is tne Dest tec amigue The 9100A Programming Environment With Option 004 From its built in back tracing aigc itnm to its easy to use programming language the 9100 Series lets you develop fully automat d test and troubleshooting routines in a matter of days or weeks aS opposed to the months c develop ment time required by many other s stems Built in GF decision tree The 91 j0A s Spe cially designed back tracing algorit im makes all the decisions about the troubl
20. ay be ordered as akitfor Fluke field service center installation in your unit or can be ordered factory installed for new units The instalation adds an internal module and a switch labeled GF Guided Faut Isolation on the rear panel In the GFI ON mode the 9010A with 9010A GF option behaves as a 9020A a Transit Cases Lockable hard case holds 9000 eries pod probe accessories four mini Cass tte tapes and user s manual Foam tined sturdy con struction Wa Technical Specifications Display Vacuum fivorescent displi ys up to thirty two 14 seqment alphanumeri charac ters al once Self Test Ail 9000 Series units per orm self tests at each power up verifying prop er opera tion of internal RAM ROM clock pow 2r supply display and communications with interface pod Pod has own self test socket to verify proper operation al microprocessor lug Test Speed Tests run at full syste n speed based on clock in unit under test Keyboard Data Entry Hexadecimal dthrouan 9 and A through F Mag Tape 9005A and 9010A only Mi icassette tapes store all learned data plus test pro grams generated on line for off the b s testing One tape holds up to 12K bytes tht same as internal memory on the 9005A and 90 OA Both units come with a built in tape drive Interface Pod Plugs into 9000 Ser as main frame must match type of microproce isor used in circuits being tested Pods availabl for
21. ccess te built in stimulus routines Data Toggle Control ri tiii Toggles Address Toggle an i hs ni ey fl mig ar E ie ih a a rete Test Systems 9100 Series The 9105A Test Program Execution The 9105A is an execute only version of the 9100A It performs the same immediate mode operations as the 9100A and it will execute all programs written on the 9100A but you can not write programs with the 9105A It has 1 5 Mbyte cof RAM memory space and two floppy disk drives rather than a hard disk drive Applications and Programming Support Fluke s application and programming sup port programs are designed to meet the needs of a wide variety of users Applications course The 9100 Series offers you a choice of test techniques as well as a variety of circuit interface devices The best choice for a particular situation depends both on the type of circuitry involved and on your objective functiona test fault isolation etc Fluke s applications course shows you how to apply the 9100 Series to a wide range of circuits commonly found in microprocessor based sys tems SO you can select the most appropriate test technique and interface device for each application Programming course Programming the 9100 Series is easy but you may stil benefit from guidance in how to develop effective Guided Fault Isolation routines for different types of test and troubleshooting procedures Fluke s pro gramming course wi
22. dingly the newer pods indicated by an in Table offer ad vanced features not available in some of the earlier models These include more itelligence interrupt features quick memory tests and quick looping read and write tests Table 1 Microprocessors Su iported by Fluke Interface Pods Syslem Pod System Fod uP Model uP Model Z80A 90094 280 BO41A J00A B0OA4AB 2808 SOO0A 280 AA 8042 E JOOA BOd8 28001 99004 28000 BOd4 J00A 6051 Z8002 S000A Z8000 8048 JOOA 8045 28003 SO000A 28000 8049 E 004 8045 28004 99004 28000 8050 JOOA 6048 1892 9000A 1802 8051 JO0A 8051 1804 S000A 1802 8052 JOOA 8051 1805 9000A 1802 8080 OOA 8950 1806 9000A 1802 8085A O0A 5085 6502 000A4 6502 BOBSA 2 JODA B085 6890 30004 6800 acae E O0A 6086 68900 3000A 68000 8088 c 3004 6088 68910 S3000A 68000 6344 004 8051 6502 3000A 6802 8741 O0A 8048 6502NS 99004 6802 8741A 004 8048 6808 90004 6802 8742 E jOOA 8048 6809 90004 6809 874a4 O0A 8081 B809E 90004 6809 8748 O0A 6048 8031 90004 8051 8749 00A 8048 8032 9900A 8051 8751 04 8051 8035 S000A 8048 80186 0O0A 80186 8039 99004 80438 80188 9004 80188 5040 9SD00A 804a 80286 00A 80286 8041 9000A 8048 9900 O0A 2900 incorporates one or more advanced eatures s discussion under Advanced Pod Fei tures in this section Note For microprocessors not found int is table con faci your loc
23. e Width Invalid x TTL or CMOS 100 nsec 20 nsec RS 232 2000 nsec 400 nsec Transition Counting Maximum Frequency 40 MHz minimum Maximum Count 16777215 toverflow Maximum Stop Count 65535 clocks Frequency Measurement Maximum Frequency 40 MHz minimum Resolution 20 Hz Accuracy 250 pom 20 Hz Output Pulser High gt 3 5V 200 mA for less than 10 ys 1 duty cycle gt 4 5 5 mA continuously Low lt 8V 200 mA for less than 10 ys 1 duty cycle lt 4V 5 mA continuously Clock Module Specifications Input Threshold 1 6V 0 2V Inout mpedance 50K shunted by less than 10 pF Clock Start Stop and Enable Input Speed Maximum Repetition Rate 40 MHz Minimum Pulse Width 12 5 nsec RS 232 Interfaces One isolated system referenced One non isolated earth referenced Baud Rates 110 134 300 600 1200 1800 2406 4800 9600 19200 Parity Odd even or none Data Bits 5 6 7 or stop Bits 1 1 5 2 XON XOFF Ctrl S Ctri Q Disable enabdle Clear to Send Disable enable New Line Carriage Return Line Feed or Car riage Return 9100 Series General Specifications Operating Temperature 5 C to 27 95 RH maximum non condensing 27 C ta 10 C RH decreasing linearly from 95 to 51 non condensing Storage Shipping Temperature 20 gt to60 C 8 to 80 RH non condensing mic ro lloppy media limited to 5 C to 60 C 8 to 80 RH non condensing Line Voltage 90 to 132V ac 47 to 440 4z 180 to 264V ac 47
24. ecial functions are available RAMP WALK with preprogrammed stimu lus Sequences c Optional RS 232 easy downloading of pro grams ard test results to storage mediums printers and other testers at remote loca tions Optional IEEE 488 for com _ puter controller operation 020 id TAPE deck controls for storing and reading programs and UUT memory maps on the mini cassette e LEARN function which is used on a known good system finds and maps RAM ROM and reac writable O addresses Hexadecimal entry of address descriptors g MODE control of tests and programs h TEST SEQUENCING and ARITHMETIC keys for creating unique user generated testrou tines i PROBE controls used for synchronizing the troubleshooting probe to uP cycles and to drive nodes high and or low p Pod design provides for easy servicing Ex tensive input protection prevents damage to the pod from common accidental abuses such as plugging the pod into the socket backwards Plug Is inserted into socket on pod for self test Pins can be protected there when not in use 900C Series VOEEE 488 AS 232 Partial List of Processors Supported Z80A 68010 8042 B2 id Z808 6802 8044 B7 H 28001 6802N5 8048 8711A 28002 6808 8049 87 42 28003 6809 8050 8744 28004 6B09E 8051 87 48 1802 8031 8052 B7 49 1804 8032 8080 8731 1805 8035 8085A 9E JQ 1806 8039 8085 2 BC 186 6502 8040 8086 SC 188 6800 8041 8085 8C 286 68000 80414 The
25. ed to valid address or data periods on the mi croprocessor bus Micro System Troubleshooters 9000 Series HIGH Pulse Activates high going pulses The frequency and width of the pulses de pend on the sync mode selected e LOW Pulse Activates low going pulses The frequency and width of the pulses de pend on the sync mode selected HIGH and LOW toggie Pulses alternate between high going and low qgoing Also a scope trigger signal of about 100 mV amplitude can be synchronized with ad dress or data sync puises from the mainframe Test programming Functions Summary 9010A Not applicable to 9020A available in execu te only mode on 9005A Users wishing to troubleshoot beyond the system Kernel into periphera devices can write and edit test programs tailored to the unique architecture of the systems they work with The following keys are available for on line pro gramming e PROGM Opens and closes test programs both for development and for editing EXEC Runs selected test program DISPL Allows programs to include opera tor prompts e g PROBE U6 PIN 7 Sequencing keys IF gt GOTO LABEL Available for comparison branching loop ing and labeling steps in the test program e Arithmetic keys Eight logical operations available for arithmetic control of mainframe registers that store user specified address and data information during program writing e Ed
26. ents of memory or the entire block of RAM The second a pattern verification test verifies that memory addresses are being properly decoded and checks dynamic RAM memory for refresh problems verifying its ability to retain accurate information The Quick ROM test uses a checksum proce dure to test the ROM for faults It also finds any inactive data bits bits that always read high or low regardless of the ROM address selected Quick Looping Read or Write The Quick Looping Read or Write function rapidly per forms continuous Reads or Writes at a specified address This feature jets you easily view bus Signals on an oscilloscope synchronized to the TRIGGER OUTPUT pulse located on the rear pane of the Troubleshooter By increasing the repetition rate of the oscilloscope trace this function makes the trace signal brighter and therefore easier to see Special Circuitry Because the pod is intended to be used with defective micro systems Fiuke designed it with special input protection circuitry This circuitry provides overvoltage protection on each line ta the unit under test even if the pod is plugged in backwards Other pod circuitry monitors and checks each read write operation as itis per formed A self test socket is included for verify ing proper pod function Pod Adapter Packaging Kit Allows testing of many microprocessor sys tems not directly supported by a Fluke interface pod Consists of al the parts ne
27. essary to house the adapter circuitry to connect the pad to the adapter and to connect the adi pter to the UUT _Micro System Troubleshooters 9000 Series Interface Pods 9005A 9010A 9020A Option Compatibility Option Description 9005A 9010A 90204 001 9020A 002 s 9000A interface Pods all 00 0 ce eee eee 9010A 001 RS 232 Interface oo ccc eae e eee 9000A 006 Asynchronous Signature Probe 9000A 010 Demonstration and Training Package 9000A 200 Kit for customizing interface Pods 90004 201 Chip on Adapter for 8051 Pod 9000A 900 Transit Case oo 0 tee een neces 900CA 901 AC PCB for Troubleshooting Classes 9000A 910 Utility Tape eee arira rera ruren DANDA Eua EUU e 90104 920 Language Compiler for 1722A or 1720A 90104 922 Language Compiler for Kay Pro 9010A 923 Language Compiler for IBM PC 9020A 925 Testwriter PC Software 00 00 0 90COA 9711 Tape for Troubleshooting 8520AS 9010A GF For Guided Fault Testing w Option 925 Other ltems 8007 Notes All options are customer installable except where noted Compatible option Option suffix identifies interface Pod type RS 232 capability included installed at Factory or at extra charge laler order through Service Center Requires 90004
28. est soting se quence allowing the programmer ti enter the necessary information in simple date base for mat information is stored in five kincs of files Stimulus programs io test each 1ode The programs are designed to reveal Il possible faults that could cause a particular node to fail They don tneed to be elabora e howev er in many cases a series of reac s or writes at the appropriate address is suff cient Known good responses to con pare with UUT responses Ater developing a stimulus program for a node the progra nmer can use iton a known good board to Jetermine what a good response looks like For each node the programmer can selec t the most appropriate type of response sigr ature log ic level frequency or event coun An inter aciive program provides guidance 1 develop ing these files A reference list relating the devit e number to the type of device This is a sin ple matter af linking each device reference umber on the UUT to the type of device usec e g U2 2114 so the system will know wt ich partto look up in the parts library Aparts library that explains the relationship of input pins to output pins GFI equires 4 parts library with a description ot each pat on the UUT A part description s ecifies al input pins which are related to eich output pin A library of the most commi n parts i provided with the 9100 program ning soft ware A field oriented editor allc ws you tO add custom
29. esting It also means that you can test for multi ple faults by simply disabling each faulty line as itis identified and continuing to run the tests Each pod includes a RUN UUT function to let you test the unit s operation as though it were operating under its own microprocessor When this function is activated it electrically discon nects the unit being tested from the pod Jetting it perform as if its microprocessor were still in the socket Microprocessors Supported Fluke interface pods currently support an ex tensive range of microprocessors as shown in Table 1 New pods are added regularly to sup port additional microprocessors as they are in troduced IBM is a regisiered trademark of International Busi ness Machines Corporation Kay Pro lI is a registered trademark of Non Linear Sysiems ine CLL nn cc 5 dhe esioer The interface pod obtains its lock signa from the unit under test and runs at the same speed as the unit Since manufac turers often build a particular microprocessor in different versions each running at a dif 2rent clock speed Fluke selects the fastest lock speed available when designingits pods his ensures the pod s ability to test any proce ssor in that family regardiess of clock speed Peeipheres oe ee ee ee ee e Unit Under Tast Advanced Pod Features As microprocessor technology advances Fluke has made its pods correspon ingly larger and more powerlul Accor
30. g The user creates and debugs test or troubleshooting procedures with the programmer s station option This gives the user full access to a screen oriented editor and integrated procedure debugger Test proce dures generated on the 9100A can be trans ported and executed on other 9100A 9105A systems via the 3 5 inch micro floppy media Language The test language called TL 1 is used by atest engineer to specify automatic test and troubleshooting procedures TL 1 is an easily read high level language designed for complete control of the functional test and GFI test environment The language includes the 9010A language testing concepts Enhance ments are provided in the area of fault handling UUT initialization and interface to GFI pro cedures Edit Debug Procedure editing and debugging are integrated to present a unified means of testing and modifying procedures The editor is screen oriented and always provides the user with a current picture of the procedure being cited The debugger provides many features such as break point tracing and access to var lables by name Guided Probe Clip Troubleshooting A menu driven software package makes it easy for a technician to specify node list information and accumulate signatures from a good UUT Dur Ing troubleshooting this information is used to guide the operator The operator is told where to place the probe or IC clip to track down the fault Executing The procedure executio
31. he troubleshooting process In this mode the operator enters no data and makes no decisions Ali necessary data stimulus routines reference lists parts lists known good responses and interconnec tivity information are contained in the pro gram The system tells the operator whatto do at each step of the process and interprets all re sponse data Once a Guided Fault Isolation program has been written the only action required to initiate it is to tell the system which nodes are suspect ed of being faulty so it will Know where to start the node oriented troubleshooting This infor mation can either be entered by the operator or passed to the GFI program from a prior func tional test At each step of the process the system teils the operator which nade to probe using a gra phic display to assistin locating the pin in ques tion As soon as the operator indicates that the interface device is atiached the sysiem runs ihe appropriate stimulus program reads the re sponse and compares it with tne kncwn good response for that node If the response is good the system directs the operator to the next sus pect node If itis bad the system uses its Built in back tracing algorithm together with the refer ence data in its files to locate the chip ariving the input to the bad node This process con tinues until the system has traced the fault back to its Source A key advantage of the system s Guided Fault Isolation c
32. ime betore clock edge for clack edge to be recognized 0 nsec Stop Edge Hold Time after clock edge for ciock edge to be recognized 10 nsec Enable Setup Time before clock edge for clock edge to be recognized 0 nsec Enable Hold Time after clock edge for clock edge to be recognized 10 nsec Data Timing for Asynchronous Measurements Max Frequency 10 MHz Minimum Puise Width high or fow 50 nsec Min pulse width tri state 150 nsec Data Compare Equal DCE Min pulse width of Data and Enable 75 nsec Fue 2000 PERG og Repet Bath rarer hE aac inl as bem be bens ee titer wae rera ee wee A Ue na ne me aera ret 9019A Micra System Troubleshooters 9000 Series Micro System Troubleshooters Preprogrammed kernel test routines Simple peripheral troubleshooting Keyboard data entry 32 digit display Power up self test Keystroke programming 9010A only Language compiler optional 9005A and 9010A Communications interface RS 232C is optional for 9005A and 9010A either RS 232 or IEEE 488 is standard for 9020A Special Functions a Preprogrammed furctional tests offer struc tured testing and troubleshooting of the up s BUS RAM ROM and O Registers b TROUBLESHOOTING functions simple READ and WRITE commands allow you to stimulate and observe responses from peri pheral interphase adapters PIAs CTCs and UARTs and circuitry beyond the P bus Several sp
33. ith the UUT may be used to stimulate circuitry beyond the microprocessor kernel Typically the majority of stimulus will be generated from the micropro cessor socket via the interface pod Since the pod can emulate any activity which the microprocessor on the UUT can perform functional testing may be performed in the fol lowing steps Partition the UUT into functional areas excite or stimulate a functional partition from the pod the single point probe or the VO Module measure the output response from the functional partition and compare the response to the expected response from a known good WUT I O modules for rapid fault isolation One of the innovations offered with the 9100 Series is the new type of circuit interface device for node oriented troubleshooting the 1 O module This module which lets you test all pins on a chip atonce provides a quick means of detect ing and isolating faults for signals up to 10 MHZ it works with both synchronous and asynchro nous circuitry on or off the bus And because you can use up to four O modules at a time you can testas many as 160 pins simultaneously Modules may be clipped directly over the chip via a DIP clip available in configurations ranging from 14 to 40 pins Or you can use the 9100 Series 20 line flying lead module to devel op your own custom connections connecting the tester to the board edge a bed of nails fix ture or a customized test fixture JO MODULES
34. iting keys Allow the operator to scroll backwards or forwards through the program ming steps Mode Control Summary Mode control keys give operator contro over all functions automatic tests programmed tests and troubleshooting operations The following mode control keys are available STOP Halts current test or operation RPEAT Causes test or operation to repeat once e CONT Advances to next test step or coan tinues last operation e LOOP Continucusly repeats a functional test programmed test step or troubleshoot ing command or loops on any fault RUN UUT Aliows full exercise o both the self diaqnostics and normal run op ration of the unit under test with the pod r icropro cessor acting as the processor o the unit being tested General Specifications Temperature 0 C to 50 C operating empe ra ture 10 C to 40 C for minicassette 40 C to 70 C non operating temperature 4 C to 50 C for minicassette Power 100 120 220 240V ac 10 30 Hz 60 Hz 5 40W maximum Size 11 5 cm H x 35 5 cm W x 30 5 cm l 4 5in H x 14in Wx 12 in D Weight 6 kg 13 1b mainframe 0 7 kg 5 lb per interface pod Included Probe probe accessories wo mini cassettes none with 9020A manua s power cord Micro System Troubleshooters 9000 Series Interface Pods Micro System Troubleshooters interlace Pods interface Pods 50 microprocessors suppo
35. ll help you get the most irom the system s Guided Fault solation capa bilities Contract consulting and programming Fluke s contract consuiting and programming services offer still other options for applications and programming support You can contract with us for consulting help as you work on your own applications and programs or you can have us simply develop programmed routines for you Customizing them to your particular products and procedures Contact your local Fiuke representative for availability Maintenance Support Worldwide network of technical centers Fluke s worldwide network of technica centers makes it easy for you to maintain and service your system no matter where your operation iS located Standard Warranty Your 9100 Series tester comes with a 90 day warranty including both time and materials Warranty service is avail able at any Fluke technical center worldwide Extended Warranty Agreement All 9100A product line components come with a 90 day warranty A one year renewable Extended Warranty covering all repairs with performance testing including parts labor and return surface freight costs This warranty will be discounted 15 if pur chased with the instrument or 7 if purchased prior to expiration of product warranty See page 453 Software Maintenance Agree nent A software maintenance agreeme tis aone year renewable agreement that pr vides for product upgrades during the cover
36. mpares them with those in the known good unit 1 0 Checks each I O register identified in the kKnown good system to make Sure it Is read writeable AUTO Runs all the above tests initiated by a single keystroke Typically requires sever al minutes depending on size of memory be ing checked RAM LONG A more complex RAM test used to isolate soft or pattern sensitive RAM faults In addition 9000 Series Troubleshooters con tinually monitor the power supply of the unit under test for out of tolerance conditions as wail as the UUT clock signal An error message is displayed if they detect a defect Troubleshooting Functions Summary The following function keys are available on the 9000 Series Micro System Troubleshooters READ Displays data contents of specified address WRITE Writes specified data to any ad dress location WALK Writes automatic walking pattern to Specified address RAMP Writes automatic binary increment ing ramp to specified location FOGGL DATA Pulses specified data bit between high and low state TOGGL ADOR Pulses specified address bit between high and low state TOGGL DATA then STS CTL Pulses specified control bit between high and low State READ PROBE Displays probe measure ments including signatures logic states and i event counts SYNC Allows probe measurements or sti mulus to be either asynchronous or synch
37. n environ ment on the 9100A and the 9105A are identical Procedures generated on the 9100A will aiso runon the 9105A Procedures are transported from the 9100A to the 9105A on a 3 5 inch mi cro floppy disk Manuals Getting Started A description of the parts of the 91004 9105A what they do how to connect them and how to power up Automated Operations Manual How to run Pre programmed test or troubleshooting pro Cedures Technical User s Manual How to run built in ests and manual or pre programmed trouble shooting procedures Applications Manual How to write test or trou bleshooting programs using the 9100A s TL 1 Programming language TL 1 Reference Manual Programmers Manual Pod Supplemental Manual Digital Test Systems Specifications 9100A 9105A Electrical Specifications Single Point Probe Input Thresholds cmos ps 232 S GUARANTEED HIGH high of invalid GUARANTEED INVALID low or invalid GUARANTEED LOW 30v Input Impedance 70 kM shunted by less than 33 pF Data Timing for Synchronous Measurements Maximum Frequency 40 MHz Minimum Pulse Width H or L 12 5 nsec Minimum Pulse Width tri state 20 nsec Setup Times Data to CIk 5 nsec Start Stop or Enabie to Clk 10 nsec Hold Time Clk to Enable 10 nsec Clk to Start or Stop 0 nsec Data Timing for Asynchronous Measurements Maximum Frequency 40 MHz Minimum Pulse Width H or L 12 5 nsec Minimum Puls
38. niques Options and Accessories 9000A 910 Utility Tape The 9000A 910 Utility Tape cor tains many programs designed to enhance the iperation of ihe 9010A These include e Merge Tape Lets you read s ecific pro grams froma minicassette tape r numbering them as desired and merging the n with pro grams already in the 9010A Wit this utility you can combine programs from wo or more tapes onto a single tape Frequency Counter Lets you u se the trou bleshocting probe to measure fre quencies of up to 6 MHz Setup Lets the 9010A ope ator make changes in the setup menu while the system is under program control Probe Pulser Lets the 901 4 operator change pulser status while the system is under program control Register Addition and Subtractic 1 Aliows forthe addition or Subtraction oft 1e contents of two registers while the syste n is uncer program control The Utility Tape comes witha man sal and one minicassette that describes how to ise each of these programs nS Micro System Troubleshooters _ 900C Series 9010A Language Compiler lf your test routines are short you can devel op them right at the keyboard of the 9010A For more extensive test routines you ll find it easier to work off line on a personal computer using the 9010A Language Compiler and download ing the results to the 9010A The Language Compiier lets you write exten sive test and troublesh
39. ompiete kernel The pod replaces the board sr iicropro cessor allowing the pod to control a bus re lated devices on the board Plugging i 1 the pod also causes the clock circuit of the bo rdunder test to be channeled to the pod s e icropra cessor so that tests can be performe with the board running atits normal speed Ak UN UUT function allows you to execute progra ns resid ing inthe UUT s memory This allows xecution of initialization programs and diagnostic 3 speed ing troubleshooting Automatic bus line monitoring Bus nemon iioring takes place automatically whei the pod accesses the unit under test This meai sthatno probing is necessary to find bus faul s It also means that the pod can detect dynamic faults Digital Test Systems 9101 Series peers 1 F POD a COMPLETE DIGITAL FAULT COVERAGE those that come and go depending on the activi ty being performed as weil as static fau ts Built in BUS RAM and ROM tests Using the pods you can quickly execute the 9100 Series built in BUS RAM and ROM test routines Be cause these circuits operate the same way on all microprocessor base d boards you can run tnese tests as soon as you plug in the pod without writing any code at all At the conclu sion of each test the system reports its findings to the operator via specific fault messages Functional Testing Beyond the Kernel All of the devices interfacing w
40. ooting routines more quickly and conveniently The Compiler is avail able in several versions offering compatibility with the following computer systems IBM Personal Computer Kay Pro Il s Fluke 1720A and 1722A Instrument Con troliers sophisticated development tools come with the Compiler to speed the program development Process Using these features you can Share common test routines among multiple programs through a File Inclusion features linking them together automatically at com pile time Save time when entering cade by using key word abbreviations aptional command key words and shorthand notations Assign symbolic names to your programs labels and registers making it easier to un derstand and remember the purpose of the different program sections Document programs with comments imbed ded within the program listing making them easier to follow shouid you later wish to re vise them 9000A 006 Asynchronous Signature Probe Option The 8000A 006 Asynchronous Signature Probe Option gives you high powered faultiso lation capabilities for asynchronous circuits io cated outside the microprocessor Dus structure With this option you no longer need to augment your 9000 Series Troubleshooter with a logic analyzer By adding tne Asynchronous Signature Probe to tne 9000 Series you gain the ability to per form real time measurement of such asynchro Nous circuits as e DMA controllers
41. ports allow data transfer to and from the tester One is isolated for use with the UUT The non isolated pert is typically used for connection to a computer or printer 2Mb total memory approximately S00Kb of working memory lets you develop large apolications The 9105A has 1 5Mb memory oo Micro floppy disk drive allows the transfer of programs anc data between 11903 and 9195s A 5 i EFIT 20 Mb hard disk sia convenient storage of multiple programs i asi onSI00A only baa 16 hexadecimal keys as well as alpha numeric keys allow programmers to easily respond to system promoats Annunciators display RER E Prai BUSY STOPPED RUN UUT show when a disk is being accessed and indicate the 2 availability of more display information MORE SOFT KEYS MORE IN FORMATION HELP kay provides context oriented ihel Hiiri int immediate Mode HF Fuses Mode control keys aia pplication of th testroutines Loe Repeat Stop Gantinue f 1i ac PE A RANY loins dk iH once Handy DIP clips used to al ach the module to the chip are availab a jin all popular pin configurations from 4 through 1 40 pins Up to four modules may 3e used i imultaneously allowing you to st upto t60 pins at a time 1 0 Modules contain extemal clock connections for trout eshoot gt ing tl aac reat ov j p keys alldw the retrieval fata at specie addresses STIM Key uiis a
42. rted eas om ee a Adapter kits available for other microprocessors Easy connection to unit under test ere miatea t ee oe a a Intelligent pods with built in software Quick memory tests Tr em te et o e Quick looping Reads and Writes Built in self diagnostics LT ge ee Available on some pod models only See Tabie 1 for a listing of pods offering these features How the Interface Pod Works The interface pod functions as the test inter face between the suspect circuit board and the troubleshooter mainframe adapting the gener al architecture of the maintrame to that of the specific microprocessor system under test When you plug the pod into the unit under test you are effectively replacing the microproces sor in that unit with the micro processor in the pod This unique test connection gives the Fluke troubleshooter mainframe the ability to access board and system components directly through the central control element of the entire system the microprocessor As a result you get ex ceptionally high confidence test results Unlike emulators and development systems intended for software debugging these inter face pods are designed specifically for hard ware troubleshooting Each pod is a self con tained system with its Own microprocessor RAM ROM and 1 0 memory space This means that the unit being tested does not need to be operating for the Fluke troubleshooter to begin t
43. the time saved by these built in tests alone would more than justify their cost Of the five built in tests you should run the bus test first since it verifies the integrity of the microprocessors basic communication net work To test the remainder of the kernel you need to enter the location of RAM ROM and I O forthe unit under test so the troubleshooter will know what addresses to read from and write to You can enter this information manually through the front panel keyboard or download it from a minicassetie or if you have the RS 232C interface you can download it froma host computer or system controller If address information is not readily available from the unit s documentation there is a LEAAN al gorithm to let you generate a memory map from a known good board Once entered memory map information can be stored on a minicassette for later use 9005A 9010A Beyond the Bus The 9000 Series Troubleshooters aren t limit ed to finding kerne relatec problems they can also isolate failures in synchronous Circuitry outside the bus The troubieshocting probe that comes with the 9000 Series will heip you track such off the bus failures to their source This probe is a powerful fault finding tool useful both for monitoring logic action and for inject ing stimulus pulses In monitoring or response mode the trouble shooting probe takes signatures counts events and shows high low logic states in each node probed In
44. tific calculator Second for more extensive test routines you can use the 9010A s Language Compiler de veloping programs off line on a personal com puter and then downloading them to either a 9010A or 9005A The Compiler runs on a number of popular personal computers includ ing the BM PC and Kay Pro II as well as on the Fluke 1720A and 17224 Instrument Con trollers For more information see the descrip tion of the Language Compiler on page 163 A Powerful Test System Using the Fluke 9020A The combination of a Fluke 9020A Micro System Troubleshooter with an IBM or IBM compatible personal computer and Fiuke s TestWriter software see page 164 for more information gives you a powerful system for performing large scale guided fault isolation In this system the 9020A is used to stimulate and gather response information from the unit under test the personal computer acts as both the system controller and the storage medium and the TestWriter software minimizes program mer time through simplified data entry pro cedures This test configuration makes developing test programs so easy that it opens the door to new types of tests tests that previously would have required too much programming time to be cost effective And it makes performing the tests so simple that virtually any technician can immediately begin troubleshooting without go ing through the extensive training required to use more traditional test tech
45. turns a power ful test solution into an economical one At very low cost the 9105A delivers powerful automat ed tests developed on the 9100A to the factory floor or service center An easy to use interface allows any operator to quickly test and trouble shoot Guided Fault Isolation GFI programs isolate faults to the node level so both function al testing and troubleshooting can truly be au tomated The 9100A and 9105A combine to offer unmatched power flexibility and econo my to factory board test and service center repair Both testers interface with the unit under test UUT through the following hardware compo nents A microprocessor interface pod the pod emulates the microprocessor actions on the UUT e A single point probe to measure UUT re sponses at any node within or beyond the microprocessor kernel the probe can also provide stimulus at any node Omodules whichaliow testing of up to 160 nodes simultaneously Test Techniques For Every Fart of the Board The 9100 Series can detect and is plate faulty components on all types of micro rocessor based circuit boards Types of te ts include built in functional testing of the micr processor BUS RAM and ROM The 9100 Seri s will also isolate faults in both synchronous a d asynch ronous Circuitry and through its micr processor interface pods can emulate a broad range of microprocessor chips Together thes 3 capabili ties let you test your
46. uments to troubleshoot complex microproce ssar based products with special measurement and contro problems The 9020A has no progra iming keys or cassette tape capability so test sequences must be xecuted through the RS 2 2C or IEEE 488 port Read Write Emulation The 9000 Series Micro System Tre ubleshoct ers eliminate tedius manual probing echniques instead they take control of the un under test by plugging into its mMicroproces ior socket They then emulate the actions of th micropro cessor both reading data from and vriting data to the unit s RAM ROM and i70 ac dresses Micro System Troubleshooters 9000 Series Built in Tests Fluke nas taken the trouble out of verifying that the kernel the hear of the microproces sor system is operating properly by includ ing built in kernel tests in all the 9000 Series Troubleshooters These tests initiated by a sin gle keystroke check the electrical integrity of the microprocessor bus the read write capabil ity of the I O registers the data in ROM and RAM operation A fifth built in test provides more extensive RAM tests when necessary checking for pattern sensitive failures The five tests which cover more than 50 of the components on most boards check for the problems that are otten the most difficultto iden tify and isolate including failures that lock up tne microprocessor bus Even if the trouble shooters had no other capabilili s
47. y you get it without having to write any program code at ail With the pod connected you can complete ihe built in kernel tests Then you can go on troubleshoot ing using your knowledge of the unit under test to guide you The mainframe keypad includes both hexadecimal and alphanumeric keys so you can manually enter whatever data is needed Digital Test Systems To troubleshoot in Immediate Mode select the first node you wish to test and attach the selected interface device 17 0 module or probe Then synchronize the interface device to the appropriate bus cycle Next key in the stimulus data and measure the response The O Mod ule and Probe measurement resulls are shown on the mainframe s three line display In the case of the single point probe color annuncia tors on the probe itself indicate logic levels high low or tri state After completing the testing of the first node you select another node and repeat the pro cess When you locate the circuit at which the input data is good bul the output data is bad you have successfully isolated the fault Obviously to be able to work effectively in Immediate Mode you need a high degree of familiarity with the board under test both to determine the best probing sequence and to recognize whether the response is good or bad Automatic operation guides the operator from start to finish The 9100 Series Guided Fault Isolation cap ability alows automation of t
Download Pdf Manuals
Related Search