画像解析による表面あらさの測定
Contents
1. 1 2 CCD 3 37 22 1989 1 1 2 3 4 5 mm 26 26 26 26 26 5 6 6 6 7 5 6 6 6 7 5 4 4 4 20 18 15 12 26 20 18 18 18 17 1100 1100 1100 1100 1200 5 5 5 5 4 mw min 0 87 2 0 2 5 2 6 2 72. 5 2 1 38 5 5 7 9 8 1 1 0 87m min 4 2 6mm min 2 1 1
3. 2 3 Measurement of Roughness by Means of Image Analysis Method Yoshiki Mrzuranr Toshihiko Apsg Shin ichi Suwr and Toshio TAKAHASHI Several techniques are applied for measuring roughness of metal surface Irregular patterns like crater are observed under the optical microscopic observation of mmetal surface cut by Wirecut Electrical Discharge Machine Wirecut EDM As the determination of roughness of the surface was difficult from the opiical microscopic image the image analysis was applied for this surface SKD steels cut by Wirecut EDM were used for samples Five kinds of roughness sarnples were prepared by changing electric processing condition of Wirecut EDM The following results were obtained 1 As surfaces became rougher the total bright part of the microscopic image decreased and also average area values of each brjght part decreased 2 The faster catting speed of Wirecut EDM became the rougher surface of samples became and the average area values of each bright part of the microspic image decraesed 3 The relation between roughness and area percent of bright parts was reverse Correlation Coefficients of variance for Ra Rs Raax and R were 0 7 3 1 5 7 and 1 6 respectively Correlation coefficients for Ra R Rmax and R were 95 2 90 1 85 8 and 97 6 respectively 4
4. 2 SKD WO 1 0 25mm TPIAS 512x512 256 8 4 NEC PC9801 150 CCD 8 256 2
5. 39 0 01 3 3 0 009 3 FR 0 008 0 007 0 6 1 0 1 4 1 8 2 2 2 6 2 8 mm min 5 1 4 R i 0 0193 X 2 665 Y1 X 0 72 R Y2 0 1143 X 16 685 Y2
6. 402 90 5 zm 3 3 1 1 1 25gm 1 9 59 1 38
7. 3 1 Rmax Y3 0 158 XX 19 751 Y3 5 7 R Y4 0 0222X 3 307 Y4 1 6 Ra R Raax R 40 22 1989 95 2 90 1 85 8 97 6 5 CCD
8. 2 1 38 5 2 16 9 3 13 6 4 10 8 5 7 9 2 6 1 Rs 16 2 R 2 E a 22 14 0 i 0 10 20 30 40 50 0 10 20 80 40 50 3 2 3 Rs 0 2 8 8 2 6 2 4 2 0 10 20 30 49 50 0 10 20 30 40 50 8 2 2 8 18 R 2 4 lt a E L 2 2 3 14 D 2 0 amp 1 8 12 1 0 007 0 008 0 009 0 01 0 007 0 009 0 009 0 0 mnt mm 2 3 Rx 0 4 Re 3 0 Es a El O28 lt ne 2 6 a C 2 4 12 0 007 0 008 0 009 0 0 07 0 008 0 009 0 tna ms 4 170 2
9. 1 2 3 R R Rs Ra 0 7 3 1 5 7 1 6 95 2 90 1 85 8 97 6 4 5 p 165 172 2 p 4 5 1966 3 PIAS User s manual REV 8 0
10. 4 p 83 86 1983 5 p 364 369 1987 6 FANUC TAPE CUT WO FANUC 1 63 11 8
11. 1 3 2 R R Rx R 4 5
12. Roughness was expressed for a function of total bright parts in the microscopic image The following equation was obtained for R R 0 0193x area percentage of bright parts 2 665 1
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