近磁界プローブセットXF1
Contents
1. near field probes have been developed to clarify this phenomenon They can be used at a distance of around 1 cm to the module and operated via the 50 ohm input of a spectrum analyzer Their sheath current 15 attenuated The probes frequency response was measured above an E field source of 1x1 mm 2 at a distance of 0 5 mm 2 5 mm 5 mm 7 5 10 gt 30MHz 2 gt gt gt 505mm SM B RF 1uU RF E 09 gt 30MHz 2 gt gt gt 100 10mm SMB RF 1uU XF E 04 lt 330MHz 6GHZ355 gt 505mm SMA XF E 09 lt 330MHz 6GHZ355 gt 10010mm SMA 336 0021 1 Z 147 5 Tel 048 764 9969 Fax 050 3488 9847 Email info wavecrestkk co jp2. LANGER EMV Technik Near Field Probeset gt pm s gt JEL AFI H Field 43 i gt XF R 400 1 H Field 4 45 gt 3 1 H Field 3 4 gt 3 1 H Field 93 is_ XF U 2 5 1 E Field 93 Ls_sXF E 10 XF R 400 1 p 25MM 50 mw Qu we Nc 63 10 A AL lt FA HAY lt 530MHz 6GHZ3s55 25mm MHz 6000 XF R 3 1 HF AV 9 ohe hb u A ADF EnA Se Vi VI POCA SIC ORK lt cmp 5 lt Yc 3 lt lt Lagre FRU ANG lt gt 30MHz 66 2 555 Imm XF B 3 1 Moe uw PNIDN AL 95750 43 h 4 9 3 10 AAF At SUVA lt _530MHZ 66 2 gt gt gt 2mm 3000 6000 A U D 43 hban 0 5mm ib uA bb 3 ME lt lt Ye 9 lt lt gt 30MHz 66 2 gt __5 0 5mm MHz XF E 10 AA 3 Ar Ab 48 ni 0 5 0 2 lt 530MHzZ 3 2 555 0 2mm 5 H 336 0021 1 Z 147 5 Tel 048 764 9969 Fax 050 3488 9847 Email info wavecrestkk co jp LANGER EMV Technik Disturbances are emitted if an electronic module generates an electric field and this field leaves the module Four sensitive passive
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