ユーザーマニュアル FLIR Ex シリーズ
Contents
1. FLIR Systems 525 C 977 F2. Landriani 1777 o EEL Herschel
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4. T559828 r AD 24529 24541 ja JP 4 3 1 http www infraredtraining com community boards 3 2
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7. 13 5 2 Ed T559828 r AD 24529 24541 ja JP 43 13 T559828 r AD 24529 24541 ja JP 44 FLIR Systems FLIR Systems 1978 FLIR Systems 1958 5 AGEMA Infrared Systems AGA Infrared Systems XEN 3
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10. FLIR Systems FLIR Systems 1 6 ISO 9001 FLIR Systems
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15. 14 2 FLIR Systems Infrared Training Center ITC ITC ITC 14 3 FLIR Systems
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21. Herschel Melloni NaCl 1930 100 17 3 Macedonio Melloni 1798 1854 1829 Nobili Herschel 0 2 C 0 05 C
22. FLIR Ex MSX FLIR Ex 0 575 kg 2 m FLIR Ex 120 x 90 NETD 0 10 C 0 27 F 100 mK edid 0 5 m 1 6 EDITT FPA BRORBRE gt MSX
23. 1 1 MSDS
24. 1 2 FLIR Systems 13 FLIR Camera Monitor USB FLIR HKEY_ LOCAL_MACHINE SYSTEM CurrentControlSet Control Lsa LmCompatibilityLevel 2 1 4 exportquestions flir com 1 5 2015 FLIR Systems Inc FLIR Systems
25. 3 T559828 r AD 24529 24541 ja JP 66 19 3 NI s 3 2 2 SW LW 3 T 0 88 e Trefl 20 C e Taim 20 C
26. MSX FLIR Ex FLIR Ex MSX FLIR Ex 0 575 kg 2 m FLIR Ex 160 x 120 NETD 0 06 C 0 11 F 60 mK
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28. 3 7 FLIR Systems 3 8 o T559828 r AD 24529 24541 ja JP 5 FLIR Customer Support Center Home Answers Ask a Question Product Registration Downloads My Stuff Service FLIR Customer support Get the most out of your FLIR products Get Support fof Your FLIR Products Welcome to the FLIR Customer Support Center This portal will help you as a FLIR customer to get the most out of your FLIR products The portal gives you access to e The FLIR Knowledgebase e Ask our support team requires registration Software and documentation requires registration FLIR service contacts Find Ans
29. T559828 r AD 24529 24541 ja JP 46 14 FLIR Systems 14 4 e Las e 4 N ha aes OF 2 e f t VA ru 2 uen RO oH Y VAY 1 D Y r _ w 4 14 4 T559828 r AD 24529 24541 ja JP 47 E T yi FOV FPA IFOV IR Laser LocatlR NETD Ku 2 E J E RS TRI DA Hr T Aum IR IR IR
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48. Melloni 40 3 John Herschel 1840 John Herschel John 17 4 Samuel P Langley 1834 1906 Langley 1880
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60. CD ROM FLIR Tools T559828 r AD 24529 24541 ja JP 35 3 13 kg 6 9 385 x 165 x 315 mm 15 2 x 6 5 x 12 4 EAN 13 4743254001015 UPC 12 845188004965 e 1911093 Tool belt e 1198528 Hard transport case FLIR Ex series 198530 Battery e 198531 Battery charger incl power supply e T198532 Car charger 198534 Power supply USB micro e 1198529 Pouch FLIR Ex and ix series e 198533 USB cable Std A lt gt Micro B 198583 FLIR Tools license only 1559828 r AD 24529 24541 ja JP 36 10 Camera with built in IR lens f 6 5 mm 45 m O Q L tY N lt mm 8 cH S UJ oO N lt sk N Ne ga E DY Jh E 5 ui AAA zQ ESL a Cc 2 Ll io 8 E 5 e gs m O 6 BN 5 1 z fuzz i NA D gt s e TE 8 r 3 LIBBBHBBPBIE KE RS J sm 251752 J i US epz ul69 6 C TE 7i New 23 N LO SEA a INS i Y Y a 1 H NIE N gd 2 b e CN 34
61. CD ROM FLIR Tools CT EAM 1559828 r AD 24529 24541 ja JP 26 385 x 165 x 315 mm 15 2 x 6 5 x 12 4 EAN 13 4743254000995 UPC 12 845188004941 JAIN I A 7 e 911093 Tool belt e 198528 Hard transport case FLIR Ex series 198530 Battery e T198531 Battery charger incl power supply e T198532 Car charger e 198534 Power supply USB micro e 1198529 Pouch FLIR Ex and ix series e T198533 USB cable Std A lt gt Micro B 198583 FLIR Tools license only 1559828 r AD 24529 24541 ja JP 27 9 5 FLIR E5 P N 63905 0501 Rev 23380 FLIR Ex FLIR Ex MSX FLIR Ex
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68. T559828 r AD 24529 24541 ja JP 60 18 18 5 Wilhelm Wien 1864 1928 6 000 K 0 5 um 300 K 9 7 hm EE 77 K 38 um 18 6 100 K 1000 K Planckian Wien 1 W cm2 um 2 um 18 3 3 Stefan Boltzmann Planck 0 c Wo W oT Watt m Stefan Boltzmann Josef Stefan 1835 1893 Ludwig Boltzmann 1844 1906 4 W
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75. T559828 r AD 24529 24541 ja JP 45 14 FLIR Systems FLIR Systems y z n ALL LAN V S gt w P x Nw SEE JSS E ez lt NU 5c 4 D N a N DE x P E A v i i z 2s h E mie A c os I 4 p y F OR 4 p Les E NM EY a T g 1 4 aur a a ih A 4 ill z Hl NERA ap 4 L 4 mira J cum s D E j 2 Fi uv SS E 14 2 Thermovision Model 661 1969 25 kg 20 kg 15 kg 220 VAC 10L 6 kg A FLIR One 2014
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83. Indigo Systems FSI Inframetrics Cedip 2007 FLIR Systems Extech Instruments 2007 lara Tecnolog as 2008 Salvador Imaging 2009 OmniTech Partners 2009 Directed Perception 2009 e Raymarine 2010 ICx Technologies 2010 TackTick Marine Digital Instruments 2011 e Aerius Photonics 2011 e Lorex Technology 2012 Traficon 2012 MARSS 2013 DigitalOptics 20134 PATENT SPECIFICATION lt 3 253 498 uv EET United States Patent Office Patented May 31 1966 Inventors PER JOHAN LINDBERG and HANS GUNNER MALMBERG 1 057 624 L s prism has in our invention an even number of sides and s 3 253 498 t over a i MECHANISM FOR ELE is rotated about an axis 2 as indicated by the arrow in e Date of Application and filing Complete Specification Nov 15 1963 MOC FIG 4 that is perpendicular to the paper in FIG 1 Pi No 45167 63 Per Johan Lindberg Stockholm and Hans Gunnar Malm The said collecting optics has an optical axis 4 that in M t berg Solna Sweden assignors to AGA Aktiebolaget a 5 tersects said rotating axis 2 and is
84. iPhone 0 9 kg TT FLIR Systems 14 1 FLIR Systems
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87. 8 20 NUC 8 20 1 1 8 20 2 8 20 3 2 8 21 8 27 7 8 21 1 1 8 21 1 2
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94. 0 75 3 um P 3 6 um 6 15 um 15 100 um um nm 10 000 1 000 nm 1 p 1 pm 18 3 Kirchhoff Gustav Robert Kirchhoff 1824 1887 T559828 r AD 24529 24541 ja JP 58 18 18 2 Gustav Robert Kirchhoff 1824 1887
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96. 17 2 Marsilio Landriani 1746 1815 Herschel Herschel Herschel T559828 r AD 24529 24541 ja JP 55 17 Herschel 75 E Herschel Herschel
97. AC 90 260 VAC 5 VDC HA 15 C 50 C 5 F 122 F 40 C 70 C 40 F 158 F IEC 60068 2 30 24 95 zs WEEE 2012 19 EC RoHs 201 1 65 EC C Tick EN 61000 6 3 EN 61000 6 2 FCC 47 CFR 15 B enee 0 575 kg 1 27 RE x lB x BS 244 x 95 x 140 mm 9 6 x 3 7 x 5 5 ee ASS iss eas FORE USB EU CD ROM FLIR Tools CT EAM 1559828 r AD 24529 24541 ja JP 32 385 x 165 x 315 mm 15 2 x 6 5 x 12 4 EAN 13 4743254001008 UPC 12 845188004958 JAIN I A 7 e 911093 Tool belt e 198528 Hard transport case FLIR Ex series 198530 Battery e T198531 Battery charger incl power supply e T198532 Car charger e 1
98. 8 10 1 1 2 3 A 811 8 77 7 8 77 2 1 2 3 8 12 8 72 7
99. T559828 r AD 24529 24541 ja JP 68 20 FLIR Systems 20 1 1 Mikael A Bramson Infrared Radiation A Handbook for Applications Plenum press N Y 2 William L Wolfe George J Zissis The Infrared Handbook Office of Naval Research Department of Navy Washington D C 3 Madding R P Thermographic Instruments and systemsa Madison Wisconsin University of Wisconsin Extension Department of Engineering and Applied Science 4 William L Wolfe Handbook of Military Infrared Technology Office of Naval Research Department of Navy Washington D C 5 Jones Smith Probert External thermography of buildings 1 Proc of the Society of Photo Optical Instrumentation Engineers vol 110 Industrial and Civil Applications of Infrared Technology June 1977 London 6 Paljak Pettersson Thermography of Buildings Swedish Building Research Institute Stockholm 1972 7 Vicek J Determination of emissivity with imaging radiometers and some emissivities at A 5 um Photogrammetric Engineering and Remote Sensing 8 Kern Evaluation of infrared emission of clouds and ground as measured by weather satellites Defence Documentation Center AD 617 417 9 Ohman Claes Emittansm tningar med AGEMA E Boxa Teknisk rap
100. 14 USB Micro PC Mac 25 C 77 F 4 Benes 2 5 90 2 AC AC 90 260 VAC 5 VDC HA 15 C 50 C 5 F 122 F 40 C 70 C 40 F 158 F IEC 60068 2 30 24 95 WEEE 2012 19 EC RoHs 2011 65 EC C Tick EN 61000 6 3 EN 61000 6 2 FCC 47 CFR 15 B EE 0 575 kg 1 27 RE x lB x BS 244 x 95 x 140 mm 9 6 x 3 7 x 5 5 s aa ick 2 USB EU
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104. DUIDJ099 HulAdooojoyd BIUBU09UU OIUOJ19 9 SUB9UU Aue Aq Jo uuoj Aue ui peyiusueJ Jo uejs s JBA811 91 e ul D9J01S peonpoudai eq Aew DuiweiJp siy jo Wed ON epiwp iow pamasa SI U6u OU sueis S JJ ZL0Z O FLIR August 8 2013 AQ320035 CE Declaration of Conformity This is to certify that the Systems listed below have been designed and manufactured to meet the requirements as applicable of the following EU Directives and corresponding harmonising standards The systems consequently meet the requirements for the CE mark Directives Directive 2004 108 EC Directive 2006 95 EC Standards Emission Immunity Safety Power Supply Systems FLIR Systems AB Quality Assurance j Ne if J FA rn Svensson irector 4 f 7 cau HV A J Electromagnetic Compatibility Low voltage Directive Power Supply EN 61000 6 3 Electro magnetic Compatibility Generic standards Emission EN 61000 6 2 Electro magnetic Compatibility Generic standards Immunity EN 60950 or other Safety of information technology equipment FLIR EX FLIR Systems AB Antennv gen 6 P O Box 7376 SE 187 15 T by Sweden Telephone 46 8 753 25 00 Telefax 46 8 753 23 64 Registered No 556256 6579 www flir se 12 12 1 72 7 7
105. JP 18 8 14 22 2 2 2 8 14 8 8 14 3 1 1 2
106. SUITABLE FOR SUCH USE NO WARRANTIES FOR THE SOFTWARE THE SOFTWARE is provided AS IS and with all faults THE ENTIRE RISK AS TO SATISFACTORY QUALITY PERFORMANCE ACCURACY AND EFFORT INCLUDING LACK OF NEGLIGENCE IS WITH YOU ALSO THERE IS NO WARRANTY AGAINST INTERFERENCE WITH YOUR ENJOYMENT OF THE SOFTWARE OR AGAINST INFRINGEMENT IF YOU HAVE RECEIVED ANY WARRANTIES REGARDING THE DEVICE OR THE SOFTWARE THOSE WARRANTIES DO NOT ORIGINATE FROM AND ARE NOT BINDING ON MS No Liability for Certain Damages EXCEPT AS PROHIBITED BY LAW MS SHALL HAVE NO LIABILITY FOR ANY INDIRECT SPECIAL CONSEQUENTIAL OR INCIDENTAL DAMAGES ARISING FROM OR IN CONNECTION WITH THE USE OR PERFORMANCE OF THE SOFTWARE THIS LIMITATION SHALL APPLY EVEN IF ANY REMEDY FAILS OF ITS ESSENTIAL PURPOSE IN NO EVENT SHALL MS BE LIABLE FOR ANY AMOUNT IN EXCESS OF U S TWO HUNDRED FIFTY DOLLARS U S 250 00 Limitations on Reverse Engineering Decompilation and Disassembly You may not reverse engineer decompile or disassemble the SOFTWARE except and only to the extent that such activity is expressly permitted by applicable law notwithstanding this limitation SOFTWARE TRANSFER ALLOWED BUT WITH RESTRICTIONS You may permanently transfer rights under this EULA only as part of a permanent sale or transfer of the Device and only if the recipient agrees to this EULA If the SOFTWARE is an upgrade any transfer must also include all prior versions of the SOFTW
107. for proper focussing at the fixed scanning aperture 35 every refractive index of said prism n two values of x PN p indicated deflection as a function of the angle of rota FIG 2 is a diagram which shows the scanning deflec The larger of said two values of x corresponds to the It is a further object of the present inven tion for various refractive indices of the tion as a function of the rotating angle of the prism for image surface 7 that is generated by the rays in the tion to provide improved scanning mechan prim TES 60 various indices of refraction of said prism plane of the paper i e the x y plane and forming small 20 ism for continuously and automatically scan Fig 3isa view showing the paraxial image FIG 3 is a view showing said paraxial image surface angles with the x axis The smaller value of x corre ning a ficld of view for ascertaining the energy surface for rays in two perpendicular planes for rays in two mutually perpendicular planes for different 40 sponds to the image surface 8 that is generated by the levels in such field or different indices of re raction of the indices of refraction of said prism rays which are parallel with the x z plane and form It is a still further object of the present prism FIG 4 is a side view showing the essential components small angles with the x y plane invention to provide a scanning mechanism for The scanning mechanism of the present in 65 of a complete scanning mechanism and I
108. mid M ee thin p ical drawi and as such is not shown in short time is of mechanical nature Our invention uses specially advantageous both for yiclding a lincar scan infra red gne x radi eps wil tthe b m Hi a PA rotating refractive prism for scanning in one direction and for allowing a relatively plane image surface This infra red or ultra violet regions o ectro Hitherto the main difficulty in achieving Scanning in a direction essentially perpendicular to said is pointed out in FIG 2 and FIG 3 As is also shown T erem mre eges eia a site high Scanning E ips has been of a mech 75 direction is slower than in the first mentioned direction in FIG 2 La larger index of refraction of said prism gives bout its longi ical nature present invention uses a and is accomplished by other means as by a nodding mir 55 a greater length of scan tudinal axis the end faces of the prism being rotating refractive prism for fast scanning in z 1 ror in the collecting optics Said slower scanning can The material of said prism must in our invention be polygons each of which polygon has an even one direction scanning perpendicular to this also be accomplished by tilting the rotating axis of said transparent for radiation in the energy spectrum of in number of sides of which opposite sides are direction is slower and can be accomplished prism The resulting scanning pattern is like the pattern terest and it is preferable if the sides of said prism are pa
109. prism is in 70 Put signals from said element are amplified and filtered our invention of the form of a plane parallel refractive and may be used to modulate the intensity of a moving prism which is in one case 1 shown in FIG 1 Said spot on a cathode ray tube The movement of said B 14 1 1960 350 000 A FLIR Systems 3 1 2007
110. 0 93 0 69 0 67 0 89 0 78 0 76 0 70 0 94 0 24 0 31 0 05 0 1 0 16 0 39 0 79 0 84 0 91 0 93 W Fa so Fa T ZE T 700 LA 700 5 500 1000 50 500 200 600 0 40 0 50 0 36 0 15 0 20 0 25 0 70 0 65 0 71 0 79 0 95 0 98 0 37 0 48 WI A sa vr H H ww vr S T559828 r AD 24529 24541 ja JP 7 20 20 1 T SW 2 5um LW 8 14 um LLW 6 5 20 nm 1 2 3 C 4 55 6 100 J 200 400 J 122 122 1227 200 227 200 1000 20 22 22 gt 0 045 0 07 0 09 0 041 0 045 0 85 0 37 0 37 0 1 0 2 0 11 0 40 0 045 d xir J ON eu Eh eu a Na xir xW xW xW SS S NO 20 ZU m PVC 0 N 0 04 6 0 07 Oo 538 0 10 0 064 0 94 g
111. 0114 4 ZL200730151141 4 ZL200730339504 7 ZL200820105768 8 ZL200830128581 2 ZL200880105236 4 ZL200880105769 2 ZL200930190061 9 ZL201030176127 1 ZL201030176130 3 ZL201030176157 2 ZL201030595931 3 ZL201130442354 9 ZL201230471744 3 ZL201230620731 8 1 8 EULA Terms You have acquired a device INFRARED CAMERA that includes software licensed by FLIR Systems AB from Microsoft Licensing GP or its affiliates MS Those installed software products of MS origin as well as associated media printed materials and online or electronic documentation SOFTWARE are protected by international intellectual property laws and treaties The SOFTWARE is licensed not sold All rights reserved IF YOU DO NOT AGREE TO THIS END USER LICENSE AGREEMENT EULA DO NOT USE THE DEVICE OR COPY THE SOFTWARE INSTEAD PROMPTLY CONTACT FLIR Systems AB FOR INSTRUCTIONS ON RETURN OF THE UNUSED DEVICE S FOR A REFUND ANY USE OF THE SOFTWARE INCLUDING BUT NOT LIMITED TO USE ON THE DEVICE WILL CONSTITUTE YOUR AGREEMENT TO THIS EULA OR RATIFICATION OF ANY PREVIOUS CONSENT GRANT OF SOFTWARE LICENSE This EULA grants you the following license Youmay use the SOFTWARE only on the DEVICE NOT FAULT TOLERANT THE SOFTWARE IS NOT FAULT TOLERANT FLIR Systems AB HAS INDEPENDENTLY DETERMINED HOW TO USE THE SOFTWARE IN THE DEVICE AND MS HAS RELIED UPON FLIR Systems AB TO CONDUCT SUFFICIENT TESTING TO DETERMINE THAT THE SOFTWARE IS
112. 2 on wwe ules o x Su 8 HE 3 8 S x CD UUUUZ GG UUUUC 88L g uiz utLg Z N m O e LL LL peyqiuoJd s mej Sn 0 WeJuoo UOISJ9AI suons nb Aue uim WOdsIY suosenbyodxe 0 19431 esee q suoneIn6ay uodx3 Sn ol joslqns eq Aew 19npoid Ajdde Kew senpoooJd esueor suoneJepisuoo JoyJew IBUOID9 oj joalqns eq Aew sjonpold sanje IBUIUUOU uo peseq SI ejep jeuorsueuiiq 99OU Jeuunj 3nouj eBueuo ol joefqns suoneorioeds OU suiejs S wol uoissiuued UIM jnouyw aSIMJayjo Jo DUIDJ099 Buikdooojoud BIUBUO9UU OIUOJJO9 9 sueaw Aue Aq Jo woz Aue ur peyiuusue Jo U91SAS eaaa e ur peJojs peonpoJdaj eq Kew Buiweup siy zo Wed ON 89pIMDIUOA peAJesai szyu y OU SWISS WITH ZL0Z 10 Charger and Power pack m O C LLI LL D tY oe SN lt mm 2 Hoz ur co U d 9 lt V sk CO Ne QC o 8 B J gt Q O x 9 LLI F a4 zo T LL e lt O lt lt 8 O N Ss g gc m O cc SN 5 1 cO LO st co CN w m O Q LLI LL L peyqiuoud s mej Sn o euoo UOISJ9AI suons nb Aue uw uoo uj suonsenbyodxe ol 13431 9SB9ld SUOBIn59d uodx3 Sn o joe qns eq Aew onpoid ldde Aew seunpeooJd esueor suonejepisuoo Jaye jeuoiba o joefqns eq Aew sjonpoJg SenleA IBUIUUOU uo peseq SI ejep jeuoisuawiq eonou Jeuunj ynoyym eBueuo o josfqns suoneoyioedg OU suejs S 1d tuoJJ UOISSIUUJ9d uepuM nOUIA 9SIWUSU10 Jo
113. 2 in the y di This invention relates to scanning mechan and ko Leda 4 d examp di small value rection as a function of the turning angle p and index of 10 isms and in particular to such mechanisms atte dex re ihe ee Other objects and various further features of novelty refraction of said prism n whereby electro magnetic radiation is picked s n pos in wi ch z and invention will be pointcd out x occur to or ig y in FIG 3 refers to the same axis as in P up and applied thereby to radiation responsive ig 1 is a side view of a scanning prism skilled in the art from a reading of the following specifica 30 2 FIG 3 shows the necessary form 7 and 8 of the men a and illustrates the deflection of rays of clectro tion in conjunction with the accompanying drawings image surfaces of said optical system in order that said MM ME md a eu Ys magnetic radiation bythe pia sad de ou ss Said drawings show the principle of the invention field of view shall be scanned without aberrations for A ced FIG 1 is a side view of a scanning prism showing the various values of refractive index of said prism Refer sing of the rays at a fixed in 15 It is an object of the present invention to g ys al Scanning aperture d la adt ob i i i D z x a leflected rays in said prism and the necessary image sur ring to FIG 3 there are for every rotating angle o and you an EL scanning mechanism of Fig 2 graphically illustrates the scanning face
114. 8 0 97 W 0 86 IO 20 0 91 20 0 95 20 400 0 95 0 97 20 0 98 z 9 N 6 0 05 0 14 0 18 0 18 0 016 0 03 F2 ID Hh SE Kb EP 7 00 1000 1500 7 0 8 ID K 1094 ID KP F2 F2 F2 F2 I Ot E gt E 3 1 1 22 26 53 ID ud 0 10 0 12 0 17 0 05 0 10 0 18 0 06 0 07 0 10 0 16 0 98 ID ud z 200 600 500 1000 T559828 r AD 24529 24541 ja JP 7 m m m 900 1100 Te ID K C1 20 20 1 T SW 2 5um LW 8 14 um LLW 6 5 20 nm 1 2 3 C 4 55 6 B No ed 3 j _ 600 C 0 59 0 61 CELE TE 200 0 03 100 0 61 0 04 0 09 0 03 0 07 0 3 0 4 n 0 8 0 9 20 20 21 O LW SW SW LLW SW 0 88 0 85 0 85 0 879 0 95 0 97 O 100 a LLW 0 935 LLW 0 909 x 093 3 0 76 0 78 A 3 0
115. 9 2 J T NG TS ED a 24 9 3 TE FRANK BSS 6 EBD a r 24 9 4 FEIRES see utata anak ta ananas ata cats See NONE 25 9 5 28 9 6 BR EGR 31 9 7 m e EE AEE EENAA AEN AEE TETT 34 10 PSTN Be o an 37 11 CEA O S E E E din Mu yaw E A E E Oi E IAE 39 12 SE us u eR Se 40 12 1 40 40 2 40 ee 40 2 40 SEI PITT 40 2 40 40 13 JPPB MEER REPREHENE RETENTO 41 131 Cosi qur p MEME 41 XN NEL TT M 41 15 1 2 Eder e DE EA UEM LE NE EP EE E 41 19 9 YTI mE E I eoe ae a t ied 41 19 27 cu Nt bt E E d Ene e E 41 creo ari MR 41 GS Ge 722 E 42 42 9 42 13 4 E EEE A 43 3 43 43 BS GAR RN RR 43 43 cocto Mi NT CT 43 14 FLIR Systems WT uuu u u uu sa usus aus RUE iaaa aa 45 14 4 46 4 2 46 143 JAA YR ee een Musae e uini aunq ir con 46 14 4 rii 47 15 a E EA E AE N E EA E A fi 48 16 L HE ode E E T ES 2 CnC oe E 51 I h SEL Oe c 51 162 WHE tentes ll ey ee oe mm Ee 51 16 2 1 51 6S si do E dopo i
116. 98534 Power supply USB micro e 1198529 Pouch FLIR Ex and ix series e T198533 USB cable Std A lt gt Micro B 198583 FLIR Tools license only 1559828 r AD 24529 24541 ja JP 33 9 7 FLIR E8 P N 63903 0303 Rev 23380 FLIR Ex FLIR Ex MSX FLIR Ex FLIR Ex MSX FLIR Ex 0 575 kg
117. ARE EXPORT RESTRICTIONS You acknowledge that SOFTWARE is subject to U S export jurisdiction You agree to comply with all applicable international and national laws that apply to the SOFTWARE including the U S Export Administration Regulations as well as end user end use and destination restrictions issued by U S and other governments For additional information see http www microsoft com exporting 1 9 EULATerms Qt4 Core and Qt4 GUI Copyright 2013 Nokia Corporation and FLIR Systems AB This Qt library is a free software you can redistribute it and or modify it under the terms of the GNU Lesser General Public License as published by the Free Software Foundation either version 2 1 of the License or at your option any later version This library is distributed in the hope that it will be useful but WITHOUT ANY WARRANTY without even the implied warranty of MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE See the GNU Lesser General Public License http www gnu org licenses Igpl 2 1 html The source code for the libraries Qt4 Core and Qt4 GUI may be requested from FLIR Systems AB T559828 r AD 24529 24541 ja JP 1
118. EEUU c CC 11 7 4 Da M NITRATE RCM 12 12 12 8 Pe Wie umu a passe 13 8 1 JY lg B Loic soror eed Mapas tab sms ssashapaqs 13 pud c M oo 13 8 1 2 FLIR Sh RR ERROR 13 8 1 3 USB ens 13 8 2 vn a LE MUS Et 13 8 3 ETNEN E RECTE 13 SES NN 13 9882 14 8 3 3 essem rene tee rire enis 14 DTE U ee eee ee 0 14 8 4 EST ep 26 Iru ee i E 14 1559828 r AD 24529 24541 ja JP V 8 5 8 6 8 7 8 8 8 9 8 10 8 11 8 12 8 13 8 14 8 15 8 16 8 17 8 18 8 19 8 20 8 21 BAT SMR NEMUS 14 ee pasa an saya ee m aras 14 B EIER d 2 bc pea de der e eps 14 JU oe PEE 14 250 a M 14 15 15 GO 15 15 RM NC i A 15 15 15 9 CRI 15 0 15 mm RRRRRHeem 15 on 15 n 15 mig JL A dETIC d 2 16 SOROR MEZ NR RUP 16 GERE EH nsn ita oma ortum ues Md cer Me OR
119. LE NENNEN 10 C 35 C 50 F 95 F WR 0 C 32 F 2 C 3 6 F 2 hG T559828 r AD 24529 24541 ja JP 28 JPEG 14 USB Micro PC Mac 25 C 77 F 4 Benes 2 5 90 2 AC AC 90 260 VAC 5 VDC HA 15 C 50 C 5 F 122 F 40 C 70 C 40 F 158 F IEC 60068 2 30 24 95 zs WEEE 2012 19 EC RoHs 201 1 65 EC C Tick EN 61000 6 3 EN 61000 6 2 FCC 47 CFR 15 B enee 0 575 kg 1 27 RE
120. Y go 20 20 AW RRR TM Intertek T559828 r AD 24529 24541 ja JP 1 zb i RD E 1 1 1 hag ERN 1 1 2 1 1 3 1 1 4 EE 1 1 5 YA 1 1 6 1 1 7 Ei det uU LE IA M ee a aS 1 1 8 E UEAN e emer ee ta tua um tu peii IA MARE AIL LE 1 1 9 EUELA TONNS 222 sese ent ct 6t cent 6 oe see En delta aia e E tM d crc aes 1 2 oer TP A NC Tm 2 3 ESD IS D MN EET TP ETT TT 5 3 1 5 3 2 5 3 3 5 3 4 ded i L0LaSo EE ub 5 3 5 nbl umbo Xn 5 3 6 SS POTES 5 3 7 5 3 8 nS N ED 5 4 6 4 1 eo 6 4 2 M aim q Su nunan Rk a LEN LS S EE 6 4 3 E LE un l Su maw Da Sytem inset etal muna s 7 5 A 8 5 1 A sa Secs nade nec M se 8 6 io 9 7 c Me ETC NETT 10 7 1 ar s UST RENTE IE RE saa 10 ys EC SERM a RE 10 nu A c E T 10 7 2 10 ToN P rER 10 O uns l yuaya as 10 7 3 EL Get REI cc TEM 11 dud 11
121. cc 53 1 53 8S i sikana 54 16 6 54 T559828 r AD 24529 24541 ja JP vii 17 DIDA E CBE SERE ETC TE eee i 4 55 18 pcc Eoi cT 58 GR OE aes bac sucess EM UD REM 58 Bo 07 474 E 58 183 UA MBs Rte M SM MM MM MMC M n ana Li SUE 58 18 3 1 Planck OE Bl s ud octo o och o ee 59 18 3 2 Wien 60 18 3 3 Stefan Boltzmann 61 1894 JERE R ttti anemia lu aa ama ge sma aun 62 184 7 63 19 RI 65 20 Dt 69 WA ca rs ae a a erg te net ere i 69 20 atte Ae 69 T559828 r AD 24529 24541 ja JP viii 1 4 FLIR Systems FLIR Systems 1 FLIR Systems FLIR Systems 60 2
122. iation having a maximum deviation from the di We AGA AKTIEBOLAG formerly Svenska ally on the axis of the collecting refractive ning of a field of view for ascertaining energy levels in rection of the optical axis In FIG 1 designates the Akticbolaget Gasaccumulator of Liding system through which radiation passing such field 20 angle of rotation of the prism and x y and z are the weden a Swedish Company do hereby de through the prism can pass and a radiation 45 It is a further object of the invention to provide means axes of a coordinate system x being along the optical axis clare the invention for which we pray thata responsive clement behind said aperture for for optical scanning of said field of view many times per and z parallel to the axis of rotation 2 A point on the 5 patent may be granted to us and the method picking up such radiation second image surface 5 is defined by these coordinates as in by which it is to be performed to be par Other objects and features of the present A further specific object is to provide means for more dicated in the case of a point x y in FIG 1 the z co ticularly described in and by the following invention will be apparent from the followi accurate and efficient scanning of a field of view the 25 ordinate of which is 0 since it is in the x y plane statement description given pm of le per 50 dead or nonutilized scanning time being reduced to a The deflection of rays is shown in FIG
123. l 25 5 Cl Q v T559828 r AD 24529 24541 ja JP 17 25 2 C m D P t Thermal blending 24 4 Clm By amp L 5 a Digital camera MSX Picture in picture 8 73 2 1 2 3
124. ml ja JP 12154 2014 03 06 T505012 xml ja JP 12154 2014 03 06 T505007 xml ja JP 21877 2014 12 08 T505004 xml ja JP 12154 2014 03 06 T505000 xml ja JP 12154 2014 03 06 T505005 xml ja JP 12154 2014 03 06 1505001 xml ja JP 12154 2014 03 06 T505006 xml ja JP 12154 2014 03 06 T505002 xml ja JP 18260 2014 10 06 1559828 r AD 24529 24541 ja JP 80 FLIR Corporate Headquarters FLIR Systems Inc 27700 SW Parkway Ave Wilsonville OR 97070 USA Telephone 1 503 498 3547 Website http www flir com Customer support http support flir com Copyright 2015 FLIR Systems Inc All rights reserved worldwide Disclaimer Specifications subject to change without further notice Models and accessories subject to regional market considerations License procedures may apply Products described herein may be subject to US Export Regulations Please refer to exportquestions flir com with any questions Publ No 1559828 Release AD Commit 24529 Head 24541 Language ja JP Modified 2015 04 08 Formatted 2015 04 08
125. perpendicular thereto e Complete Specification Published Feb 1 1967 corporation of Sweden The image surface S generated by said collecting optical Feb I Filed May 14 1962 Ser No 194 622 st is situa insi D ism i h c priority application Sweden May 19 1961 System is situated inside said prism Just outside the Crown Copyright 1967 Circle 3 generated by said rotating prism and on the 2997 ical axis 4 i 6 is located through 2 Claims Cl 88 1 optical axis 4 a scanning aperture 6 is located through 10 which a radiation passes to the radiation energy respon Index oceptence This invention relates to an improved optical scanning sive clement 12 such as a photocell bolometer or the like x H4 F6H mechanism for receiving electromagnetic radiation and depending upon the energy spectrum of interest Int CL H 04 n 3 06 to radiation responsive means utilizing such optical scan When said prism rotates the scanning aperture 6 scans ning a line on said image surface 5 and when a corner of said COMPLETE SPECIFICATION It is an object of the invention to provide improved op 15 prism passes the scanning aperture 6 there is a substan x tical scanning means of the character indicated tially instantancous return of the scan Scanning Mechanism It is another object of the invention to provide im In FIGS 1 and 4 there is shown an incoming ray of proved means for continuously and automatically scan rad
126. port AGEMA 1999 AGEMA E Box AGEMA 1999 10 Mattei S Tang Kwor E Emissivity measurements for Nextel Velvet coating 811 21 between 36 C AND 82 C 4 11 Lohrengel amp Todtenhaupt 1996 12 ITC Technical publication 32 13 ITC Technical publication 29 SW 20 2 20 1 T SW 2 5 um LW 8 14 um LLW 6 5 20um 1 2 3 C 4 5 6 Krylon 1602 T559828 r AD 24529 24541 ja JP 69 20 20 1 T SW 2 5um LW 8 14 um LLW 6 5 20 nm 1 2 3 C 4 55 6 3 0 94 2 0 40 0 60 0 93 0 95 1 0 28 3 40 400 E Lek HNO3 COR Z 27
127. rallel a collecting refractive system having by other means for example as by an oscil 80 of common television coated with suitable material in order to reduce reflec 40 an image surface within the prism the axis of lating mirror in the collecting optics This Said prism can be rotated very rapidly according to our 60 tions N W which system intersects the longitudinal axis slower scanning can also be accomplished by invention and several thousands of scans per second can The entry area of the rays coming from said optical of the prism an aperture situated substanti tilting the rotating axis of the prism This be accomplished In this way our invention allows com System for varying turning angles e does not extend plete scanning of said field of view many times per second near the comers of the prism zn our invention which may Pr therefore be rounded This improves both the air resist exceeding the frame frequency of ordinary motion pic tures Referring to the drawings the arrangement according to our invention is characterized by an image surface gen erated inside the circumscribed circle of said prism by a 2 a ance and the mechanical strength of the prism When said prism rotates and the scanning in the other direction is accomplished in said collecting optics the radiation energy responsive element 12 scans said field t 3 LA of view for various energy levels in such field The out collecting optics 9 in FIGURE 4 Said
128. t N W PVC 0 J 7 Atte SAR S Jj 7 Atte SAK eo N c co co co e co c1 CO On T 0 07 0 86 0 19 0 26 0 08 0 13 0 1 0 3 0 87 0 94 0 68 A J NM Ai AU V IN UW Oo gt gt in O A Nl ANI NI Jl gt g 600 1000 700 2500 W W SW H H v WIN u x M M X w 7 CO N T559828 r AD 24529 24541 ja JP 7 20 20 1 T SW 2 5um LW 8 14 um LLW 6 5 20 nm 1 2 3 C 4 55 6 XR E525 1000 95 1230 SIO2 1500 0 29 3396 SiO2 64 Al203 1000 0 80 1100 0 85 V V V V V MV V M M 1200 2 j 272 0 59 7j c 20 0 85 2 2 0 88 0 93 T T a
129. t is apparent from FIG 3 that the aberrations which 25 rapid scanning of a field vention is particularly applicable E receiving FIG 5 is a perspective view of a particular form of a are caused by the prism can be neutralized to a sub A still further object of the present in electromagnetic radiation within the optical scanning prism 45 stantial degree by a suitable choice of image surface ion i i i D s z Briefly stated our invention is in the following specifica In this way it is possible according to our invention to vention is to provide a scanning mechanism ultra violet or infra red regions of the electro po Pues whereby for continuous scanning the retrace magnetic spectrum the incoming radiation tion characterized as an arrangement for scanning a field achieve very high resolution in the optical scanning n z E 5 er of view where the incoming radiation is focused on a t is prefera if the refractive index of said prism time is a relatively small value being focused on a radiation ive ele 70 G 5 so a As BID VEO HE dex of di OD Cesponar radiation energy responsive element has a value between 3 and 6 for the wave lengths used 30 According to the present invention there is ment which may be of a kind well known in n ei a id i i i n ided a scanning mechanism for receivi the art end udi s sh ia the The main difficulty of scanning a field of view in a 50 Said index of refraction having a value of about 4 is Dom
130. wers We store all resolved problems in our solution database Search by product category keywords or phrases Search by Keyword Search All Answers See All Popular Answers To find a datasheet for a current product click on a picture To find a datasheet for a legacy product click here FLIR Ex FLIR Exx FLIR Kxx FLIR T4xx FLIR TB FLIR G3xx ThermaCAM FLIR GF3xx FLIR Ax FLIR Ax5 FLIR A3xx GasFindIR Product catalog Accessories Please right click the links below and select Save Target As to save the file Or Al o Wf US Letter 28 Mb Fay P ac Ad 27 4 Mb amp i Q 9 Important legal disclaimer dangers warnings and cautions 434 http SUDport flir com 4 2 T559828 r AD 24529 24541 ja JP 6
131. x lB x BS 244 x 95 x 140 mm 9 6 x 3 7 x 5 5 ee ASS iss eas FORE USB EU CD ROM FLIR Tools CT EAM 1559828 r AD 24529 24541 ja JP 29 385 x 165 x 315 mm 15 2 x 6 5 x 12 4 EAN 13 4743254001114 UPC 12 845188005146 JAIN LA e 911093 Tool belt e 198528 Hard transport case FLIR Ex series 198530 Battery e T198531 Battery charger incl power supply e T198532 Car charger e 198534 Power supply USB micro e 1198529 Pouch FLIR Ex and ix series e T198533 USB cable Std A lt gt Micro B 198583 FLIR Tools license only 1559828 r AD 24529 24541 ja JP 30 9 6 FLIR E6 P N 63902 0202 Rev 23380 FLIR Ex FLIR Ex
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