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601-273E - NSG 3060 User Manual english.indd

1. IEC DC LINES L N 12 RLEVEL 1 11 500 V 12 Asynch L1 gt N 60s 10 pulse 104 IEC DC LINES L N 12 R LEVE 2 1 2 500 V 12 Asynch L1 gt N 60s 10 pulse 2 2 1000 V e 12 Asynch L1 gt N 60 s 10 pulse IEC DC LINES L N 12 RLEVEL 3 1 3 500 V 12 Asynch L1 gt N 60 s 10 pulse 2 3 1000 V 12 Asynch L1 gt N 60 s 10 pulse 3 3 2000 V 12 Asynch L1 gt N 60 s 10 pulse IEC DC LINES L N 12 RLEVEL 4 1 4 500 V 12 Asynch L1 gt N 60 s 10 pulse 2 4 1000 V Fa 12 Asynch L1 gt N 60s 10 pulse 3 4 2000 V 12 Asynch L1 gt N 60 s 10 pulse 4 4 4000 V 12 Asynch L1 gt N 60 s 10 pulse IEC DC LINES L N 30 RLEVEL 1 11 500 V 30 Asynch L1 gt N 60 s 10 pulse IEC DC LINES L N 30 RLEVEL 1 1 2 500 V 30 Asynch L1 gt N 60 s 10 pulse 2 2 1000 V 30 Asynch L1 gt N 60 s 10 pulse IEC DC LINES L N 30 RLEVEL 1 1 3 500 V 30 Asynch L1 gt N 60 s 10 pulse 2 3 1000 V 30 Asynch L1 gt N 60 s 10 pulse 3 3 2000 V Pa 30 Asynch L1 gt N 60s 10 pulse IEC DC LINES L N 30 R LEVEL 1 1 4 500 V 30 Asynch L1 gt N 60 s 10 pulse 2 4 1000 V 30 Asynch L1 gt N 60s 10 pulse 3 4 2000 V 30 Asynch L1 gt N 60 s 10 pulse 4 4 4000 V 30 Asynch L1 gt N 60s 10 pulse IEC UNSH UNSY MM O LINES LEVEL 1 11 500 V 12 Asynch Output 60s 10 pulse IEC UNSH UNSY MM O LINES LEVEL 2 1 2 500 V 12 Asynch Outp
2. 5 6 1000 V Fi 0270780 Li gt L3 60s 100056 66 1000V Fi 27 L2 gt L3 605 10puse TEC 3PH POWER LINES LX LX LEVEL 3 16 2000V FI 0270780 1 gt N 60s 100056 26 2000V 0 270790 D gt N 60s 10puse 36 2000V 0270780 L3 gt N 60s 100056 46 2000V 0270780 L1 gt L2 60s 10puse 56 2000V 0270780 L1 gt L3 60s 100056 66 2000V 0270780 L2 gt L3 60s 100056 TEC 3PH POWER LINES LX LX LEVEL 4 1 6 4000V O 270790 1 gt N 60s 100056 26 4000V z O 270790 D gt N 60s 100056 36 4000V 0270780 L3 gt N 60s 100056 46 4000V 0270780 L1 gt L2 60s 10 pulse 56 4000V 0270780 L1 gt L3 60s 10 pulse 66 4000V 0 270790 L2 gt L3 605 10 pulse IEC 3PH POWER LINES LX PELEVEL 1 1 4 500 V 12 0 270780 L1 gt PE 60s 10puse 2 4 500 V 12 0 270790 L2 gt PE 60s 10puse 3 4 500 V 12 0 270780 L3 gt PE 60s 100056 20 500 V 12 0270780 N gt PE 60s 10puse TEC 3PH POWER LINES LX PE LEVEL 2 1 4 1000 V 12 0 270790 L1 gt PE 60s 10puse 2 4 1000 V e 12 0270780 L2 gt PE 60s 100056 3 4 1000 V 12 0 270790 L3 gt PE 60s 100056 20 1000 V 12 0 270790 N gt PE 60s 10puse TEC 3PH POWER LINES LX PELEVEL 3 1 4 2000V Fi 12 0 270790 L1 gt PE 60s 10puse 24 2000V 12 27 L2 gt PE 60s 100056 34 2000V 12 0 270780 L3 gt PE 60s 10puse 44 2000V 12 0270780 N
3. TASEO Advanced Test Solutions for EMC 101 102 IEC 1 PH POWER LINE L PE LEVEL 1 11 500V r 300 270780 L gt PE 60s 10 pulse IEC 1 PH POWER LINE L PE LEVEL 2 12 500V Fi 0 0 270790 L gt PE 60s 10 pulse 2 2 7000 V 300 0 270780 L gt PE 60s 10 pulse IEC 1 PH POWER LINE L PE LEVEL 3 113 500V z 0 0 270790 L gt PE 60s 10 pulse 23 1000V t 300 0 270780 L gt PE 60s 10 pulse 373 2000 V 0 0 270790 L gt PE 605 10 pulse IEC 1 PH POWER LINE L PE LEVEL 4 14 500V E 300 0 270790 L gt PE 60s 10 pulse 2 4 10007 30 ohm 0 270 90 L gt PE 60s 10 pulse 3 4 2000 V t 3000 0 270 90 L gt PE 60s 10 pulse D 4000 V 30ohm 0 270 90 L gt PE 60 s 10 pulse IEC 1 PH M FEEDER LINE N PE LEVEL 1 11 500 V 12 0 270 90 N gt PE 60 s 10 pulse IEC 1 PH M FEEDER LINE NPE LEVEL 2 12 500V 12 0 270790 N gt PE 60s 10 pulse 2 2 1000 V E 12 0 270780 N gt PE 60s 10 pulse IEC 1 PH M FEEDER LINE NPE LEVE 3 13 500V 12 0 270790 N gt PE 60s 10 pulse 2 3 1000 V P 12 0 270780 N gt PE 60s 10 pulse 33 2000V 12 0 270790 N gt PE 60s 10 pulse IEC 1 PH M FEEDER LINE NPE LEVEL 4 1 4 500V t 12 0 270790 N gt PE 60s 10 pulse 2 4 1000 V 1
4. 3 pulses 3 pulses IEC DCV VARIATION 3S 120 09 3 pulses IEC DCV VARIATION 105 120 09 3 pulses IEC DCV VARIATION 100MS_ 80PC IEC DCV VARIATION 300MS_ 80PC IEC DCV VARIATION 158 80 09 3 pulses 3 pulses IEC DCV VARIATION 3S 80 09 38 3 pulses IEC DCV VARIATION 10S 80 0 10s 3 pulses NSG 3060 EMC test system Basic Standard IEC 61000 4 11 2002 6 2 T Decrease File name implemented Uvar Phase __ Rep time _ T Event ts td T Increase ti Test duration IEC 50HZ VOLTAGE VARIATION 70 0 10s 25 cycle 3 pulses IEC 60HZ VOLTAGE VARIATION 70 D 105 30 cycle 3 pulses ANSI C 62 45_ 2002 Combination w ave File name implemented Voltage Polarity 1 06620 06 256 Coupling Rep time Test duration ANSI 1 PH BASIC 1 CAT A1 2000V 0 270 90 L N gt PE 10s 10 pulse ANSI 1 PH BASIC 1 CAT A2 4000 V 0 270 90 L N gt PE 20s 10 pulse ANSI 1 PH BASIC 1 CAT A3 6000 V 0 270 90 L N gt PE 20s 10 pulse ANSI 1 PH BASIC 2 CAT A1 2000V 0 270 90 L gt N 10s 10 pulse ANSI 1 PH BASIC 2 CAT A2 4000 V 0 270 90 L gt N 20s 10 pulse ANSI 1 PH BASIC 2 CAT A3 6000 V 0 270 90 L gt N 20s 10 pulse ANSI 3 PH BASIC 1 CAT A1 2000V 0 270 90 L1 L2 L3 N gt PE 10s 10 pulse ANSI 3 PH BASIC 1 CAT A2 4000 V 0 270
5. 8 5 6 Phase Touching the Phase field it will come up with a red frame to indicate the selected parameter being ready for change The value can be changed either with the red wheel or using the keypad Touching the Synch Asynch button it will change repetitively In synch mode the angle can be changed either with the red wheel or using the keypad Synch mode is only available if a CDN is connected and if the EUT power AC is switched on 8 5 7 Coupling Touching the coupling prefix repetitively it will change from surge output manual CDN ANSI coupling and IEC coupling TASEO Advanced Test Solutions for EMC 79 80 Surge output The surge output selection will activate the HV surge pulse output This selec tion is used if pulse need to applied directly to an EUT like for testing of non energized EUTs socalled component testing Manual CDN The factory settings for this selection is equal the surge output But it is pos sible to compensate the loss of an external manual CDN s To do so the CDN hast to be sent with the unit to a Teseq facility for modification ANSI coupling Touching the coupling line selection it will come up with a window The ap propriate coupling network 1 phase or 3 phase is automatically given by the selected CDN The 2 phase selection can be done only if a three phase coupler is connected It is possible to use a three phase coupler also as a single phase CDN Make sure that the EUT connector
6. NSG 3060 EMC TEST SYSTEM USER MANUAL 601 273E 2 advanced Test Solutions for EMC NSG 3060 EMC TEST SYSTEM USER MANUAL CONTENTS 2 1 3 1 3 2 33 3 4 3 5 3 6 3 7 4 1 4 2 4 3 44 4 5 4 6 4 7 5 1 5 2 53 6 1 6 1 1 6 1 2 6 1 3 Explanation of symbols Introduction General description Standards and applications ESD test Burst test Combination wave and ring wave test Telecommunication wave test Mains quality test Magnetic fields with mains frequency option Pulsed magnetic fields option Safety instructions General nstallation nstallation of an EUT power switch Applicable safety standards Test execution User warnings Generator Dangers concerning the EUT First steps nstallation of the NSG 3060 system Connecting the test system to the ground reference plane ounting in a 19 rack Mainframe description Front panel EUT output connection Reference ground connector Surge output sockets 10 10 12 12 12 13 14 14 14 15 16 16 17 18 18 19 20 21 22 23 24 24 25 25 25 26 27 6 1 4 6 1 5 6 1 6 6 2 6 2 1 6 2 2 6 2 3 6 2 4 6 2 5 6 2 6 7 1 1 2 73 74 75 7 6 7 6 1 7 6 2 7 6 3 7 6 4 7 6 5 7 6 6 df 1 7 1 LAD 78 8 1 8 2 8 2 1 8 2 2 8 2 3 8 3 8 3 1 8 3 2 8 3 3 Burst output socket ndicator LEDs Touch screen and user interface Rear panel ains power input AC EUT mains input DC EUT input Ground connection point
7. Test configuration for power line coupling Test configuration for external coupling Ring wave parameters Voltage Impedance Phase Coupling Repetition time Test duration Technical data ring wave generator Telecom wave test Voltage Impedance Phase Coupling Repetition time Test duration 63 63 63 63 64 65 65 65 66 70 70 70 72 72 73 73 77 77 77 77 78 78 78 79 79 79 79 82 82 82 83 84 84 84 85 85 85 TASEO Advanced Test Solutions for EMC 8 7 8 7 1 8 7 2 8 7 3 8 7 4 8 7 5 8 7 6 8 7 7 8 7 8 8 8 8 9 8 10 8 10 1 8 10 2 8 10 3 8 10 4 8 11 8 11 1 8 11 2 8 12 9 1 9 2 9 3 9 4 9 5 10 11 11 1 11 2 11 3 11 4 11 5 12 13 13 1 13 2 Mains power quality PQT Sample graphs of dips interrupts Mains power quality generator Voltage U Var Phase Repetition time T Event Test duration Dips and interrupts characteristics Variation test 4 11 automatic procedure Power magnetic field testing 4 8 automatic procedure Pulsed magnetic field testing 4 9 The optional magnetic field loop antenna INA 701 and INA 702 Pulse wave shape adapter INA 753 Generator setting Technical data pulsed magnetic field test Power magnetic field test 4 8 automatic procedure Automatic magnetic field option MFO 6502 Technical data power magnetic field test Standard test parameter Description of the 25 pin D Sub signals Interlock Trigger to scope output signal Synchron
8. GR L N gt PE Impedance za Perant sl Test mows ies A R Asynch Duration 10 Pu o EE ADD STEP CW Parameter window 8 4 3 Voltage TO va uch the polarity button ALT in the example to select test polarity Polarity ues are positive POS negative NEG or alternating ALT On odd pulse number there will be one pulse less in negative then in positive Positive pulse will be first executed TO uch the voltage button 200 V in the example to enter the test voltage A red frame is displayed around the field The voltage value may be entered using the wheel or the keypad 8 4 4 Impedance To ch uch the impedance button 2 ohms in the example it will repetitively ange between 2 and 12 Q NSG 3060 EMC test system 8 4 5 Phase Touch the Synch Asynch button Asynch in the example to activate the syn chronization of test pulses to the EUT mains frequency When this button is set to Asynch the phase value button in the example will display When this button is set to Synch the user must also set the phase value To set the phase value touch the phase value button A red frame is displayed around the field The phase value may be entered using the wheel or the keypad The value is in degree units and may range from 0 to 359 Synch mode is only available if the EUT power is switched on 8 4 6 Coupling Touch the coupling mode bu
9. System interface connector 25 pin D sub Synchro Bus system The standard user interface SUI ain menu System window General settings Equipment Communication onitoring EUT supply voltage EUT supply frequency Test action at EUT fail input EUT power supply by EUT fail input Exit EUT on Ok SD card properties Viewing the current SUI version Updating SUI software via the SD card Language Setting test parameters The red menu bar The bottom bar Load user test Load standard test Save test Burst generator setting Test configuration with power line coupling Test configuration with external coupling Burst parameters window 27 27 27 28 28 29 30 31 31 32 34 35 36 36 39 39 42 42 42 43 43 43 43 43 44 45 48 49 49 53 53 55 58 61 61 61 62 8 3 4 8 3 5 8 3 6 8 3 7 8 3 8 8 3 9 8 3 10 8 3 11 8 3 12 8 4 8 4 1 8 4 2 8 4 3 8 4 4 8 4 5 8 4 6 8 4 7 8 4 8 8 4 9 8 5 8 5 1 8 5 2 8 5 3 8 5 4 8 5 5 8 5 6 8 5 7 8 5 8 8 5 9 8 5 10 8 6 8 6 1 8 6 2 8 6 3 8 6 4 8 6 5 8 6 6 Voltage Frequency Phase Coupling Burst time Repetition time Test duration Burst generator technical data Derating Combination wave Surge parameter setting Test configuration for power line coupling Test configuration for external coupling Voltage Impedance Phase Coupling Repetition time Test duration Surge generator technical data Ring wave RW
10. 12 0 270790 L2 gt L3 60s 10 pulse TEC 3 PH M FEEDER LINE LX LX LEVEL 3 16 1000V ri 12 0 270780 L1 gt N 60s 10 pulse 2 6 1000 V 12 0 270790 L2 gt N 60 s 10 pulse 3 6 1000V 12 0 270 90 L3 gt N 60s 10 pulse 4 6 10007 12 0 270790 L1 gt L2 60 s 10 pulse 5 6 1000V 12 0 270780 L1 gt L3 60 s 10 pulse 6 6 1000V 12 0 270790 L2 gt L3 60 s 10 pulse TEC 3 PH M FEEDER LINE LX LX LEVEL 4 116 2000 V 12 0 270790 Li gt N 60s 10 pulse 26 2000V m 12 0 270790 L2 gt N 60s 10 pulse 316 2000 V z 12 0 270790 L3 gt N 60s 10 pulse 4 6 2000V Fi 12 0 270780 LT gt L2 60s 10 pulse SS 2000 V z 12 0 270790 LT gt L3 60s 10 pulse 6 6 2000V E 12 27 9 2 gt L3 60s 10 pulse NSG 3060 EMC test system IEC 3 PH POWER LINE LX LX LEVEL 1 1 6 250 V F 30 0 270790 L1 gt N 60s 10 pulse 2 6 250V z 30 0 270790 L2 gt N 60s 10 pulse 3 6 250V r 30 0 270 90 L3 gt N 60 s 10 pulse 4 6 250V 30 0 270790 LT gt L2 60s 10 pulse 5 6 250 V 30 0 270790 L1 gt L3 60 s 10 pulse 6 6 250V 30 0 270790 L2 gt L3 60s 10 pulse IEC 3 PH POWER LINE LX LX LEVEL 2 1 6 500V 30 0 270790 L1 gt N 60 s 10 pulse 2 6 500V z 30 0 270790 L2 gt N 60s 10 pulse 3 6 500V 30 0 270790 L3
11. L2 L3 N PE 750us 300 ms 120s ANSI IEC 3PH POWER LINES LEVEL 2 1 2 1000V 5 kHz Asynch L1 L2 L3 N PE 15ms 300 ms 120s 2 2 1000 V 100 kHz Asynch L1 L2 L3 N PE 750us 300 ms 120 s ANSI IEC 3PH POWER LINES LEVEL 3 1 2 2000V 5 kHz Asynch L1 L2 L3 N PE 15ms 300 ms 120 s 2 2 2000V 100 kHz Asynch L1 L2 L3 N PE 750us 300 ms 120 s ANSI IEC 3PH POWER LINES LEVEL 4 1 2 4000 V 5 kHz Asynch L1 L2 L3 N PE 15ms 300 ms 120 s 2 2 4000V 100 kHz Asynch L1 L2 L3 N PE 750us 300 ms 120 s ANSI IEC CAP COUP LEVEL 1 1 2 250 V 5 kHz Asynch Burst output 15ms 300 ms 120 s 2 2 250 V 100 kHz Asynch Burst output 75069 300 ms 120 s ANSI IEC CAP COUPL LEVEL 2 1 2 500 V 5 kHz Asynch Burst output 15ms 300 ms 120 s 2 2 500 V 100 kHz Asynch Burst output 750us 300 ms 120 s ANSI IEC CAP COUPL LEVEL 3 1 2 1000V 5 kHz Asynch Burst output 15ms 300 ms 120s 2 2 1000V 100 kHz Asynch Burst output 750us 300 ms 120 s ANSI IEC CAP COUPL LEVEL 4 1 2 2000V 5 kHz Asynch Burst output 15ms 300 ms 120 s 2 2 2000 V 100 kHz Asynch Burst output 750us 300 ms 120 s Basic Standard IEC 61000 4 5 File name implemented Polarity Impedance Phase Test duration IEC 1PH POWER LINES L N LEVEL 1 2 0 270 90 10 pulse IEC 1PH POWER LINES L N LEVEL 2 2 0 270 90 10 pulse 2 0 270 90 10 pulse IEC 1PH POWER LINES L N LEVEL 3 2 0
12. The Telecom Surge Module TSM 3751 generates test pulse of 10 700 us as described in IEC EN 61000 4 5 2005 and IEC 60060 1 ITU K series ANSI IEEE C62 41 and several EN standards and the safety standard of UL 1950 Since tolerance can be taken into account it will cover the 9 720 us pulse given in ANSI TIA 968_B Therefore the pulse will fulfil the new IEC recommendation of open circuit voltage of 10 700 us and the short circuit current pulse measuring of 5 320 us The test voltage satisfies the basic requirement of IEC up to 4 kV and surpasses the UL1950 safety test recommendation of 7 KV 3 5 Mains quality test The mains quality test includes the simulation of dips and interruptsouts of the mains power supply in accordance with IEC EN 61000 4 11 and for DC power supplies in accordance with IEC EN 61000 4 29 A voltage dip occurs when the supply voltage falls considerably below the nominal level for a relatively short time e g for a few cycles whereas an inter rupt means that the voltage falls to zero for a similar period 3 6 Magnetic fields with mains frequency option Mains frequency magnetic field tests or POWERM tests involve the simulation of the magnetic fields typically generated by the current flow in power supply cables as specified in IEC EN 61000 4 8 Such magnetic fields can affect the operation of items of equipment that are sensitive to them The NSG 3060 performs this test by causing a heavy current to flow in a
13. directly in A m the internal software makes the calculation and drives the combination wave pulse moduel to generate the right current Two safety banana plugs provide a convenient means to connect the loop antenna two Fischer HV plugs allow connection to Surge Hi and Lo outputs of NSG 3060 TASEO Advanced Test Solutions for EMC 93 94 The field generated in the loop antenna is directly proportional to the current flowing through it Field strength A m H Cf x Where H is the generated field Cf the coil factor and the current generated by the combination wave pulse module 8 10 3 Generator setting Generally surge generators get set by voltage the current they deliver will depend on the load impedance In this case the load consists of the loop antenna plus the wave shape adapter which is fix and stable So there is a direct relationship between the generator voltage setting and the current delivered to the load As the current in the loop antenna and the generated field coil factor are proportional there will be a direct relationship between the surge generator s voltage setting and the generated field In case an INA 702 loop antenna is used the termination plug labelled Pulse needs to be used 8 10 4 Technical data pulsed magnetic field test Parameter Value Pulsed field 1 to 1200 A m in 1 A m steps higher possible with lower coil factor Polarity positive negative alternate Repeti
14. gt PE 60s 10puse TEC 3PH POWER LINES LX PE LEVEL 4 1 4 4000V FI 12 0270780 L1 gt PE 60s 100056 24 4000V 12 0270780 L2 gt PE 60s 100056 34 4000V 12 0270780 L3 gt PE 60s 100056 44 4000V Fi 12 0270780 N gt PE 60s 10puse IEC DC LINES L NLEVEL 1 11 500V z 2 Asynch IT gt N 60s 10 pulse IEC DC LINES L N LEVEL 2 1 2 500 V 2 Asynch UT gt N 60s 10 pulse 2 2 1000 V 2 Asynch L1 gt N 605 10puse IEC DC LINES L N LEVEL 3 13 500V FI 2 Asynch UT gt N 60s 10puse ER 1000 V 2 Asynch UT gt N 60s 100056 38 2000V 2 Asynch LI gt N 60s 10puse TEC DC LINES L N LEVEL 4 1 4 500 V 2 Asynch L1 gt N 60s 100056 2 4 1000V FI 2 Asynch LI gt N 60s 100056 34 2000V 2 Asynch LI gt N 60s 10 pulse 44 4000V Fi 2 Asynch L1 gt N 60s 10 pulse TASEO Advanced Test Solutions for EMC 99 100 IEC UNSH UNSYMM FO LINES LEVEL 1 11 500V 2 Asynch Surge Output 60s 10 pulse IEC UNSH UNSYMM FO LINES LEVEL 2 12 500 V 2 Asynch Surge Output 60s 10 pulse 2 2 1000 V 2 Asynch Surge Output 60s 10 pulse IEC UNSH UNSYMM FO LINES LEVEL 3 13 500V Fi 2 Asynch Surge Output 60s 10 pulse ER 1000 V Z Asynch Surge Output 60s 10 pulse 38 2000V 2 Asynch Surge Output 60s 10 pulse IEC UNSH UNSYMM FO LINES LEVEL 4 14 500 V 2 Asynch Surge Ou
15. supply voltage variations the width of the trigger signal shall change according to the duration of the voltage dip or interrupts 9 3 Synchronization Sync signal Output signal Between pin 7 hi and pin 2 8 15 20 low nactive state at 24 V in the active state lt 2 4 V The sync signal consists of a level that goes low for each cycle of the mains frequency The reference is the signal at the power supply input EUT supply N The position timewise of the sync signal corresponds to the specified phase angle converted into time irrespective of the supply frequency gt The sync signal is only active while an AC test is in prog ress and Fsync is set to sync 9 4 Pulse enable next step input Between pin 17 hi and pin 2 8 15 20 low Input open inactive input shorted active If this input is activated during a test run the test is halted exactly the same as the pause function in the control software The test will continue to run as soon as the input is made inactive again If the input is already active before a test is implemented then the test cannot start NSG 3060 EMC test system 95 EUT fail input 111 Between pin 6 hi and pin 2 8 15 20 low Input open inactive input shorted active This connection serves as a control input that can be activated externally The EUT can activate this input if it is capable of reporting a disturbance effect caused during an EMC test Such events are ti
16. 306x coupling network User manuals 2 HV surge cables Fischer Fischer connector 1 HV burst cable SHV SHV connector 1 system cable connects the CDN to the NSG 2 mains power cables for the test system 1 termination plug interlock blind connector 1 ground cable to reference ground plane 1 EUT power input connector with cable 1 EUT power output connector WIN 3000 Remote control software trial version Ethernet cable typ SFTP CAT 56 2 m Ordered options Check the instrument for signs of transport damage Any damage should be reported to the transportation company immediately NSG 3060 EMC test system 5 1 Installation of the NSG 3060 system 23 The mains power voltage indicated on the instrument must correnspond with the local supply voltage mains voltage 85 265 VAC universal power unit mains frequency 50 60 HZ Voltage 85 255 VAC Frag range 5060 Hr Mains switch Fuse holder with fuses 2 x 3 1 5 AT D Mains power input Mains switch fuse holder and power input To replace a fuse 1 Disconnect the mains cable 2 Pull the fuse holder out of the connector 3 Remove the damaged fuse s 4 Insert 1 or 2 x 3 15 AT fuses 5 Replace the fuse holder 6 Plug the mains cable into a power outlet with a solid ground connection 7 Note the polarity of all input and output connections 8 Place the test system so that there is sufficient free space around the cooling air inlets on both sides an
17. 4 11 4 29 Dips amp interrupts to phase L TASEO Advanced Test Solutions for EMC m 11 MAINTENANCE AND FUNCTION CHECK Ml 11 1 General Inside the test system there are no adjustable elements accessible to the user neither for calibration nor for maintenance purpose The housing of the test system must not be opened exceptional for SW update via SD card Should any maintenance or adjustment become necessary the whole test system together with an order or fault report should be sent in to a 16560 service center Maintenance by the user is restricted to cleaning the outer housing performing a function check and verification of the pulse parameters The only exception concerns the exchange of modules or the upgrading of the system with new modules In such cases the instructions accompanying the modules are to be strictly observed 11 2 Cleaning n general a moist cloth is sufficient for cleaning the outer housing includ ing the touch panel If necessary add a small amount of a mild non foaming household cleanser No chemicals acid etc should be used for cleaning purposes Before beginning to clean the test system ensure that it is switched off and the mains power cable is unplugged from the supply NSG 3060 EMC test system 11 3 Function check 115 The safety measures described previously must be strictly observed while carrying out a function check As soon as the test system is switched on the Power
18. 90 L1 L2 L3 N gt PE 20s 10 pulse ANSI 3 PH BASIC 1 CAT A3 6000 V 0 270 90 L1 L2 L3 N gt PE 20s 10 pulse ANSI 3 PH BASIC 2 CAT A1 2000V 0 270 90 L2 gt L1 10s 10 pulse ANSI 3 PH BASIC 2 CAT A2 4000 V 0 270 90 L2 gt L1 20s 10 pulse ANSI 3 PH BASIC 2 CAT A3 6000 V 0 270 90 L2 gt L1 20s 10 pulse ANSI 3 PH BASIC 3 CAT A1 2000V 0 270 90 L3 gt L2 10s 10 pulse ANSI 3 PH BASIC 3 CAT A2 4000 V 0 270 90 L3 gt L2 20s 10 pulse ANSI 3 PH BASIC 3 CAT A3 6000 V 0 270 90 L3 gt L2 20s 10 pulse ANSI 3 PH BASIC 4 CAT A1 2000V 0 270 90 L1 gt L3 10s 10 pulse ANSI 3 PH BASIC 4 CAT A2 4000 V 0 270 90 L1 gt L3 20s 10 pulse ANSI 3 PH BASIC 4 CAT A3 6000 V 0 270 90 L1 gt L3 20s 10 pulse TASEO Advanced Test Solutions for EMC 107 108 ANSI C 62 45_ 2002 Ring wave File name implemented Voltage Polarity Impedance Phase Coupling Rep time Test duration ANSI 1 PH BASIC 1 CAT A1 12R LN PE 2000V 12 0 270 90 L N gt PE 10s 10 pulse ANSI 1 PH BASIC 1 CAT A2 12R LN PE 4000 V 12 0 270 90 L N gt PE 20s 10 pulse ANSI 1 PH BASIC 1 CAT A3 12R LN PE 6000 V 12 0 270 90 L N gt PE 20s 10 pulse ANSI 1 PH BASIC 1 CAT A1 30RLN PE 2000V 0 270 90 10 puls
19. 90 L2 gt PE 60s 10 pulse 3 4 2000 V 12 0 270 90 L3 gt PE 60s 10 pulse 4 4 2000 V 12 0 270 90 N gt PE 60s 10 pulse IEC 3 PH M FEEDER LINE LX PE LEVEL 4 1 4 4000 V 12 0 270 90 L1 gt PE 60s 10 pulse 2 4 4000 V 12 0 270 90 L2 gt PE 60s 10 pulse 3 4 4000 V 12 0 270 90 L3 gt PE 60s 10 pulse 4 4 4000 V 12 0 270 90 N gt PE 60s 10 pulse IEC 3 PH POWER LINE LX PE LEVEL 1 1 4 500 V 30 0 270 90 L1 gt PE 60 s 10 pulse 2 4 500 V 30 0 270 90 L2 gt PE 60s 10 pulse 3 4 500 V 30 0 270 90 L3 gt PE 60 s 10 pulse 4 4 500 V 30 0 270 90 N gt PE 60s 10 pulse IEC 3 PH POWER LINE LX PE LEVEL 2 1 4 1000 V 30 0 270 90 L1 gt PE 60s 10 pulse 2 4 1000 V 30 0 270 90 L2 gt PE 60s 10 pulse 3 4 1000 V 30 0 270 7 90 L3 gt PE 60s 10 pulse 4 4 1000 V 30 0 270 90 N gt PE 60s 10 pulse IEC 3 PH POWER LINE LX PE LEVEL 3 1 4 2000 V 30 0 270 90 L1 gt PE 60s 10 pulse 2 4 2000 V 30 0 270 90 L2 gt PE 60s 10 pulse 3 4 2000 V 30 0 270 7 90 L3 gt PE 60s 10 pulse 4 4 2000 V 30 0 270 90 N gt PE 60s 10 pulse IEC 3 PH POWER LINE LX PE LEVEL 4 1 4 4000 V 30 0 270 7 90 L1 gt PE 60s 10 pulse 2 4 4000 V 30 0 270 7 90 L2 gt PE 60s 10 pulse 3 4 4000 V 30 0 270 90 L3 gt PE 60 s 10 pulse 4 4 4000 V 30 0 270 90 N gt PE 60s 10 pulse TASEO Advanced Test Solutions for EMC 103
20. A D PE e e Supplemental 1 Low High L e O N e PE e e Diagnostic 1 Low High e L e e N e e kl PE e ANSI coupling modes for a 1 phase CDN 75 Basic 2 Low High e e L e N e o PE e e Supplemental 2 Low High e e L e N e PE e e Diagnostic 2 Low High e L e N e e PE e TASEO Advanced Test Solutions for EMC 76 High low The coupling path will be shown by open or closed relay signs The relay but tons ae not selectable they are for information only By touching the OK button the selected coupling will be activated With cancel it will close the window without saving the coupling selection By touching the button Show Graphics it will illustate a graphical setting IEC coupling When IEC coupling is selected the window in figure below displayed Touch the individual High and Low output coupling buttons L N and PE in the example to select an open or closed relay Touch OK to enable the coupling selection and close the window Touch Cancel to close the window without saving the coupling selection Touch Show Graphics to display a graphical example of the coupling selec tion IEC coupling selection window NSG 3060 EMC test system 8 4 7 Repetition time 77 Touch the Repetition time button 60
21. EUT outpu Reference ground connector NSG 3060 front panel 6 1 1 EUT output connection This is the power output connection for the EUT An EUT mains power connector is included with the system The connector contains a phase pin L Live Neutral pin N and a ground pin for connection of the EUT The pins in the connector must be correctly wired to the corresponding conductors in the EUT power cable If the test system is connected to a DC power source as supply for the EUT the user must ensure that the polarity at this connector corresponds with that at the EUT power connector TASEO Advanced Test Solutions for EMC 26 EUT output connection Note For DC power supply L positive N negative The pins in the connector are designed for a maximum current of 16 A WARNING Never attempt to connect or disconnect an EUT while a test is being performed 6 1 2 Reference ground connector This terminal provides a solid reference ground connection point to the test system If a CDN is connected then the ground strap must be connected from the CDN to the ground reference plane There is no need to connect the ground connector from the generator itself since the burst connector provides the reference ground from the generator to the CDN Reference ground connector Reference ground connector The NSG 3060 can be efficiently connected to the GRP using the ground strap supplied with t
22. LED should light up If this is not the case then please check the mains power connection to the test system as well as the fuses voltage selector and any other cabling The instrument automatically carries out a diagnostic routine once it has been successfully switched on The generator cannot perform any test while the interlock circuit is open Pulse generation can be observed at the output connectors by means of an oscilloscope This is a practical way to check that the system is functioning correctly but should never be used for reference or calibration purposes exceed its max input voltage Teseq recommends the use of a HV differential probe type MD 200 or MD 200A along with the INA 6560 safety banana adapter as well as CAS 3025 and MD 300 See paragraph Options Do not connect the oscilloscope directly in order not to 11 4 Calibration The combination of high voltages and high frequencies in a single pulse makes the calibration of EMC pulse generators particularly demanding and difficult Teseq has one of the few accredited test laboratories in Europe that is in the position to undertake calibrations in this specialized field TASEO Advanced Test Solutions for EMC 116 11 5 Warranty Teseq grants a warranty of 2 years on this test system effective from the date of purchase tiona During this period any defective components part will be repaired or replaced free of charge or if necessary the test
23. Test step Voltage Polarity Impedance Phase Coupling Rep time Test duration IEC 1PH POWER LINES L N LEVEL 1 11 500 V 2 0 2707 90 L gt N 60 s 10 pulse IEC 1PH POWER LINES L N LEVEL 2 1 2 500 V 2 0 270 90 L gt N 60 s 10 pulse 2 2 1000 V 2 0 2707 90 L gt N 60 s 10 pulse IEC 1PH POWER LINES L N LEVEL 3 1 3 500 V 2 0 270 90 L gt N 60 s 10 pulse 2 3 1000 V 2 0 2707 90 L gt N 60 s 10 pulse 3 3 2000 V 2 0 270 90 L gt N 60 s 10 pulse IEC 1PH POWER LINES L N LEVEL 4 1 4 500 V 2 0 2707 90 L gt N 60 s 10 pulse 2 4 1000 V 2 0 2707 90 L gt N 60 s 10 pulse 3 4 2000 V 2 0 2707 90 L gt N 60 s 10 pulse 4 4 4000 V 2 0 270 90 L gt N 60 s 10 pulse IEC 1PH POWER LINES L PE LEVEL 1 11 500 V 12 0 270 90 L gt PE 60s 10 pulse IEC 1PH POWER LINES L PE LEVEL 2 1 2 500 V 12 0 270 90 L gt PE 60s 10 pulse 2 2 1000 V 12 0 270 90 L gt PE 60s 10 pulse IEC 1PH POWER LINES L PE LEVEL 3 1 3 500 V 12 0 270 90 L gt PE 60 s 10 pulse 2 3 1000 V 12 0 2707 90 L gt PE 60 s 10 pulse 3 3 2000 V 12 0 2707 90 L gt PE 60 s 10 pulse IEC 1PH POWER LINES L PE LEVEL 4 1 4 500 V 12 0 2707 90 L gt PE 60 s 10 pulse 2 4 1000 V 12 0 2707 90 L gt PE 60 s 10 pulse 3 4 2000 V 12 0 2707 90 L gt PE 60 s 10 pulse 4 4 4000 V 12 0 270 90 L gt PE 60 s 10 pulse IEC 1PH POWER LINES N PE LEVEL 1 11 500 V 12 0 2707 90 N gt PE 60s 1
24. Touch the Exit button to return to the Test parameters window Example burst pulse graph NSG 3060 EMC test system 8 3 Burst parameter setting 61 The generation of high voltage bursts and high frequency pulses is part of the EFT burst package test required in the international standard EN IEC 61000 4 4 The test NSG 3060 generates bursts of interference that simulate the interfer ence that is generated when inductively loaded switches are operated With their very steep rising and falling edges these interference pulses spread over a frequency spectrum of over 300 MHz and may occur wherever electrical currents are switched off in connection with motors circuit breakers relays fluorescent lamps etc Therefore nearly all the relevant standards concerning the testing of electronic equipment require the performance of burst tests 8 3 1 Test configuration with power line coupling n a power line coupling test tne NSG 3060 generates the interference signal which is superimposed on the EUT power signal 8 3 2 Test configuration with external coupling In an externally coupled test the interference signal is delivered through the NSG 3060 s coaxial burst output connector on the front panel and fed to an external coupling clamp The signal is then applied to signal or data line cables The same SHV type connector may also be used for connection of a 3 phase CDN or for a CDN suitable for 1 phase gt 16 A and all other C
25. automated CDN and complementary automated equipment like variac step transformer etc need to be linked together Thereby the termination connector needs to be moved to the system output plug of the last unit of the system Since time critical information might not be transferred quick enough transmis sion time for one message frame takes about 20 ms an additional bus called the synchro bus is used instead where speed matters The master controller NSG 3060 EMC test system together with the function units in the same instrument can access this bus The controller also makes this bus available to other instruments via a connector on the rear panel The interfaces for the interbus interlock and synchro bus are bundled together in a sub miniature D connector These three interfaces are looped through from one instrument to another Signal Re mark Working direction Mains synchronization Mains voltage passes through the zero crossing point with rising signal level Connects interrupts HV supply and From coupling network From each controller to ENER EUT power relay 2 wires interlock circuit The NSG 3060 software can stop atest EUT fail run if a fault caused by the test proce BA DET dure occurs in the EUT and is reported The controller watchdog puts this signal To the function module Watchdog on the bus when it is overlooked by its to which an error signal controller to avoid s
26. gt N 60s 10 pulse 4 6 500 V 30 0 270790 L1 gt L2 60s 10 pulse 5 6 500 V 30 0 270790 L1 gt L3 60 s 10 pulse 6 6 500V z 30 0 270790 L2 gt L3 60s 10 pulse IEC 3 PH POWER LINE LX LX LEVEL 3 1 6 1000 V 30 0 270790 L1 gt N 60 s 10 pulse 2 6 1000 V P 30 0 270790 L2 gt N 60s 10 pulse 3 6 1000 V 30 0 270790 L3 gt N 60s 10 pulse 4 6 1000 V 30 0 270790 L1 gt L2 60 s 10 pulse 5 6 1000V 30 0 270790 L1 gt L3 60s 10 pulse 6 6 1000 V 30 0 270790 L2 gt L3 60 s 10 pulse IEC 3 PH POWER LINE LX LX LEVEL 4 1 6 2000 V z 30 0 270790 L1 gt N 60s 10 pulse 2 6 2000 V 30 0 270790 L2 gt N 60s 10 pulse 3 6 2000 V 30 0 270790 L3 gt N 60s 10 pulse 4 6 2000 V 30 0 270790 L1 gt L2 60 s 10 pulse 5 6 2000 V 30 0 270790 LT gt L3 60s 10 pulse 6 6 2000 V Fi 30 0 27 90 L2 gt L3 60 s 10 pulse IEC 3 PH M FEEDER LINE LX PE LEVEL 1 1 4 500 V 12 0 270 90 L1 gt PE 60s 10 pulse 2 4 500 V 12 0 270 90 L2 gt PE 60 s 10 pulse 3 4 500 V 12 0 270 90 L3 gt PE 60s 10 pulse 414 500 V 12 0 270 90 N gt PE 60s 10 pulse IEC 3 PH M FEEDER LINE LX PE LEVEL 2 1 4 1000 V 12 0 270 90 L1 gt PE 60 s 10 pulse 2 4 1000 V 12 0 270 90 L2 gt PE 60s 10 pulse 3 4 1000 V 12 0 270 90 L3 gt PE 60s 10 pulse 4 4 1000 V 12 0 270 90 N gt PE 60 s 10 pulse IEC 3 PH M FEEDER LINE LX PE LEVEL 3 1 4 2000 V 12 0 270 90 L1 gt PE 60 s 10 pulse 2 4 2000 V 12 0 270
27. in the example to set the test repetition time A red frame is displayed around the field The repetition time may be entered using the wheel or the keypad Touch the units button s in the example to set the time unit Time units are s and min 8 4 8 Test duration Touch the Test Duration button 10 in the example to set the test duration time A red frame is displayed around the field The duration time may be entered using the wheel or the keypad Touch the units button pulse in the example to set the unit Unit values are pulse and cont continuous 8 4 9 Surge generator technical data Parameter Value Pulse voltage open circuit 200 V to 6 6 kV in 1 V steps Pulse current Short circuit 100 A to 3 3 kA Impedance MAG Polarity Positive negative alternate Phase synchronization Asynchronous synchronous 0 to 359 in 1 steps Coupling ANSI IEC external manual Pulse repetition 10 600 s in 1 sec steps ESTONII Test duration 1 to 9999 pulses Continuous Repetition rate depends on voltage 200 to 4400V 10 s repetition time 4401 to 6600V 20 s repetition time 8 5 Ring wave RW The ring wave is specified in the ANSI IEEE Std C62 41 2 2002 and IEC EN 61000 4 12 TASEO Advanced Test Solutions for EMC 78 8 5 1 Test configuration for power line coupling The test pulse is injected directly into the EUT power supply lines as they pass through the CDN of
28. occur during testing m EUTs are often functional samples that have not yet been subjected to safety tests It is therefore pos sible that the EUT could be damaged by internal overloads or may even start to burn E As soon as the EUT shows signs of being disrupted the test should be stopped and the power to the EUT switched off E Internal disruption of the electronics can result in the interference voltage or the EUT supply voltage being present on the EUT s outer casing m Electrical breakdown or arcing from connections that are overstressed voltagewise during the test E Explosion of components with fire or fragmentation as a result of energy dissipated e g from the resul tant supply current or ignition of vaporized plastic materials E_ Faulty behaviour by the EUT e g a robot arm strikes out or a temperature controller fails etc TASEO Advanced Test Solutions for EMC 21 22 5 FIRST STEPS Emmi This chapter contains a short checklist with steps that should be taken before the instrument is switched on and put into operation Check the packaging for signs of damage in transit Any damage should be reported immediately to the transportation company Lift the NSG 3060 test system out of its packaging by grasping of the mounted grips using the following list check that all the items ordered have been delivered 9 10 dh 12 13 14 NSG 3060 generator CDN
29. on the CDN does match accordingly 1 phase ANSI coupling possibilities NSG 3060 EMC test system EUT supply Set the EUT supply in mode 1 phase 2 phase or 3 phase Make sure that the EUT connector on the CDN does match accordingly the EUT supply selection EUT supply input at the rear of the automated CDN otherwise the coupling path setting will be switched incorrect SR EUT supply selection has to be in line with the connected Coupling The coupling mode can be set via multiple button touch between basic supple mental and diagnostic Those wording are equal to the ANSI standard Depend ing on selected EUT supply mode different coupling mode level are selected For the ANSI coupling path High low The coupling path will be shown by open or closed relay signs The relay buttons are not selectable they are for information only By touching the OK button the selected coupling will be activated With cancel it will close the window without saving the coupling selection By touching the button Show Graphics it will illustrate a graphical setting IEC coupling IEC coupling is not recommended for ring wave however it can be selected by touching the coupling line selection it will come up with a window The desired line to ground or lines to ground can be set as well as line to line coupling The coupling paths will be shown as open or closed relay signs With touching the OK button the selected coupling
30. power from the EUT power outlet on the front panel of the CDN where the mains voltage has the interfer ence signal superimposed on it 8 4 2 Test configuration for external coupling In this mode the interference pulses are switched to the surge Hi and Lo output sockets on the front panel to which an external data line signal coupler can be connected By using such an external signal coupler it is possible to superim pose the interference signal as specified in the standards on communication cables and other kinds of data lines The same coaxial HV output sockets may also be used for connection to all other CDNs max 30 Front time T1 1 67 x T 1 2 US 30 Time to half value T2 50 us 20 Wave shape of open circuit voltage 1 2 50 us wave shape definition according to IEC EN 61000 4 5 NSG 3060 EMC test system 71 max 30 Front time T1 1 25 x T 8 US 20 Time to half value T2 20 us 20 Wave shape of short circuit current 8 20 us wave shape definition according to IEC EN 61000 4 5 WARNING Using improper equipment when measuring HN surge pulses can result in personal injury or equipment damage NOTE Teseq recommends using a Teseq MD 200 or MD 200A differential probe in combination with a Teseq INA 6560 Fischer to banana adapter for surge pulse verifica tion TASEO Advanced Test Solutions for EMC 72 Combination Wave Window Volt ml 200 V
31. s steps 1 10 min 1 to 9999 pulses Continuous 8 6 Telecom wave test 83 The telecom wave test in compliance with IEC EN 61000 4 5 2005 and IEC 60060 1 ITU K series ANSI IEEE C62 41 and the safety standard of UL 1950 is used to test port of symmetrical driven communication lines The same purpose will cover the 9 720 us pulse given in ANSI TIA 968 B which is alSo part of the modules thanks to the tolerance of pulse given in the standard mentioned above it can be cover by 10 700 us pulse Front time T1 1 67 x T 10 US 30 Time to half value T2 700 Us 20 Waveform of open circuit voltage 10 700 us waveform defination according to IEC 80060 1 Front time T1 1 25 x T 5 US 20 Time to half value T2 320 us 20 TASEO Advanced Test Solutions for EMC 84 not be set higher than 6 6 kV this for safety reason to prevent damages to the CDN To set the 7 kV range on the telecom pulse the CDN system cable needs to be disconnected and the HV output of the Generator has to be disconnect from the CDN M WARNING If a CDN is connected the voltage can Telecom Surge test 200 5 yal at a Gi Impedance E 60 Phase a el ees 10 Pa 5 ER Telecom parameter window 8 6 1 Voltage Touching the Repetition Time field it will come up with a red frame to indicate the selected parameter being ready for change The value can be changed either with
32. system will be replaced by another of equivalent value The decision regarding the method of reinstating the func capability is at the sole discression of Teseq Excluded from the warranty is damage or consequential damage caused through negligent operation or use as well as the replacement of parts subject to degradation The warranty is rendered invalid by any intervention on the part of the customer or a third party The faulty items have to be returned in their original packagin ga Teseq accept no responsibility for damage in transit NSG 3060 EMC test system 12 DECLARATION OF CONFORMITY CE Pen The equipment is CE certificated The following standards apply Standard Type of standard Remark number Safety requirements for electrical equipment for use Product family do a gt EN 61010 n measurement control regulation and laboratory standard ARK plications Di o ectromagnetic compatibility EMC generic stan or interference radiation Part 6 3 for residential iness and trade applications as well as small busi esses Di EA Generic standard EN 61000 6 3 30am Si p ectromagnetic compatibility EMC generic stan for interference radiation Part 6 4 industrial ap ications m Generic standard 61000 6 4 CO m E ectromagnetic compatibility EMC generic stan ard for interference immunity Part 6 1 for residential
33. the optimum benefit from this manual and to ensure safety during operation of the equipment The following symbol draws your attention to a circumstance where non observation of the warning could lead to inconvenience or impairment in the performance Example This connection must not be confused with the Equip ment under Test EUT power input The following symbol draws your attention to a circumstance where non observation of the warning could lead to component damage or danger to the operating personnel Example Never connect or disconnect the EUT while the test EF system is performing a test TASEO Advanced Test Solutions for EMC 10 O Pm 2 1 General description 2 INTRODUCTION The NSG 3060 test system enables cable borne EMC electromagnetic com patibility immunity tests to be carried out on electrical equipment intended for household office light industrial or commercial use The test system is a concept from Teseq AG for electromagnetic immunity testing purposes and fulfills the requirements to accomplish CE marking tis an open system built on a modular principle that communicates through a serial and standardized bus system and has open interfaces available Opera tion is performed by means of standardized operator interfaces As a result of its modularity and the use of industry standards for the interfaces operating elements and expansion functions the most widely varied instrument configu
34. to level 4 Combination wave IEC 61000 4 5 2005_Ed_2 1 Phase power lines L N coupling level 1 up to level 4 1 Phase power lines L PE coupling level 1 up to level 4 1 Phase power lines N PE coupling level 1 up to level 4 3 Phase power lines Lx Lx coupling level 1 up to level 4 3 Phase power lines Lx PE coupling level 1 up to level 4 DC Line L N coupling level 1 up to level 4 Unshielded unsymmetrical I O lines level 1 up to level 4 Unshielded symmetrical communication lines level 1 up to level 4 TASEO Advanced Test Solutions for EMC 56 Combination wave ANSI C62 54 2002 1 Phase EUT Basic 1 Location Cat A1 up to Cat A3 1 Phase EUT Basic 2 Location Cat A1 up to Cat A3 3 Phase EUT Basic 1 Location Cat A1 up to Cat A3 3 Phase EUT Basic 2 Location Cat A1 up to Cat A3 3 Phase EUT Basic 3 Location Cat A1 up to Cat A3 3 Phase EUT Basic 4 Location Cat A1 up to Cat A3 Ring wave IEC 61000 4 12 1 Ph Power Lines L N major feeder line 12 Q level 1 up to level 4 1 Ph Power Lines L PE major feeder line 12 Q level 1 up to level 4 1 Ph Power Lines N PE major feeder line 12 Q level 1 up to level 4 1 Ph Power Lines L N outlet line 30 Q level 1 up to level 4 1 Ph Power Lines L PE outlets line 30 Q level 1 up to level 4 1 Ph Power Lines N PE outlets line 30 level 1 up to level 4 3 Ph Power Lines Lx Lx major feeder line 12 Q level 1 up to level 4 3 Ph Power Lines Lx Lx outlets lin
35. with IEC EN 61000 4 4 simulate the high voltage high frequency interference pulses typically produced when an inductively loaded switch is operated Without countermeasures such interference may occur when a current through an electromagnetic device e g motor circuit breaker relay fluorescent lamp etc is switched off This type of interference can affect other equipment in either of following two ways Firstly the interference can be coupled directly into the target equipment NSG 3060 EMC test system via the mains power cable The interference can be transmitted from the source along the mains power cable connected to the target Interference from the mains can reach any other piece of equipment connected to the same power source in a similar way however this does not all have to occur in the same section of a building Alternatively the interference can be capacitively coupled into any target device in the vicinity The system enables a test to be performed using both standardized coupling methods The EUT is connected to the mains power socket on the front panel of the test system for the direct mains injection test Capacitively coupled tests require the interference to be superimposed onto the signal or data line cables via an external coupling clamp that is connected to the burst output on the front panel of the system 3 3 Combination wave and ring wave test The surge test in compliance with IEC EN 61000 4 5 ANSI C 62 41
36. 0 10 pulse ANSI 3 PH BASIC 3 CAT A1 12RL3 L2 2000V 0 270 90 10 pulse ANSI 3 PH BASIC 3 CAT A1 12RL3 L2 4000 V 0 270 90 10 pulse ANSI 3 PH BASIC 3 CAT A1 12RL3 L2 6000 V 0 270 90 10 pulse ANSI 3 PH BASIC 3 CAT A1 30RL3 L2 2000V 0 270 90 10 pulse ANSI 3 PH BASIC 3 CAT A1 30RL3 L2 4000 V 0 270 90 10 pulse ANSI 3 PH BASIC 3 CAT A1 30RL3 L2 6000 V 0 270 90 10 pulse ANSI 3 PH BASIC 4 CAT A1 12RL1 L3 2000V 0 270 90 10 pulse ANSI 3 PH BASIC 4 CAT A1 12RL1 L3 4000 V 0 270 90 10 pulse ANSI 3 PH BASIC 4 CAT A1 12RL1 L3 6000 V 0 270 90 10 pulse ANSI 3 PH BASIC 4 CAT A1 30RL1 L3 2000V 30 0 270 90 L1 gt L3 10s 10 pulse ANSI 3 PH BASIC 4 CAT A1 30RL1 L3 4000 V 30 0 270 90 L1 gt L3 20s 10 pulse ANSI 3 PH BASIC 4 CAT A1 30RL1 L3 6000 V 30 0 270 90 L1 gt L3 20s 10 pulse NSG 3060 EMC test system 9 DESCRIPTION OF THE 25 PIN D SUB 109 SIGNALS Pen 9 1 Interlock Between Pin 5 hi and Pin 2 8 15 20 low This connection is an integral part of the interlock safety circuit If a number of units are incorporated in a system then these connections can be daisy chained together to form a single safety circuit If no external interlock circuit is required then the shorting connection must be made by using the terminator connector supplied Otherwise pulse generation in the system will be inhib ited A built in circuit breaker enables the EUT po
37. 0 pulse IEC 1PH POWER LINES N PE LEVEL 2 1 2 500 V 12 0 270 90 N gt PE 60s 10 pulse 2 2 1000 V 12 0 270 90 N gt PE 60s 10 pulse IEC 1PH POWER LINES N PE LEVEL 3 1 3 500 V 12 0 270 90 N gt PE 60s 10 pulse 2 3 1000 V 12 0 270 90 N gt PE 60s 10 pulse 3 3 2000 V 12 0 270 90 N gt PE 60s 10 pulse IEC 1PH POWER LINES N PE LEVEL 4 1 4 500 V 12 0 270 90 N gt PE 60s 10 pulse 2 4 1000 V 12 0 270 90 N gt PE 60s 10 pulse 3 4 2000 V 12 0 270 90 N gt PE 60s 10 pulse 4 4 4000 V 12 0 270 90 N gt PE 60s 10 pulse 0 270 90 IEC 3PH POWER LINES LX LX LEVEL 1 1 6 500 V 0 270 90 L1 gt N 60s 10 pulse 2 6 500 V 0 270 90 L2 gt N 60s 10 pulse 3 6 500 V D 0 270 90 L3 gt N 60s 10 pulse 10 pulse 0 270 90 5 6 500 V 0 270 90 Li gt L3 60s 10 pulse 6 6 500 V 0 270 90 L2 gt L3 60s 10 pulse IEC 3PH POWER LINES LX LX LEVEL 2 1 6 1000 V 0 270 90 L1 gt N 60 s 10 pulse 2 6 1000 V 0 270 90 L2 gt N 60 s 10 pulse 3 6 1000 V 0 270 90 L3 gt N 60s 10 pulse 10 pulse ai pl rl ol R pl pl nl nl
38. 10 ms to 10 000 ms 1 sto 108 1 to 250 cycles for 50 Hz to 300 cycles for 60 Hz Increasing time Ti 10 ms to 5 000 ms 1sto5s 1 to 250 cycles for 50 Hz 1 to 300 cycles for 60 Hz Test duration 1s to 99 999 s 1 min to 70 000 min 1 10 99 999 pulse Continous A Automatic accessories for power quality test All automated standard accessories for PQT test provides a convenient means of reducing the incoming supply voltage It is required for power quality testing PQT and is fully compliant with the latest revision of IEC EN 61000 4 11 2004 Once detected the functions are available in the user interface software Its fully automatic controlled driven from NSG 3060 with the step transformer INA 6502 the Uvar settings 0 40 70 80 will appear Connecting the single variac VAR 3005 S16 or VAR 6501 the settings of Uvar will be possible in volts or of Uin Therefore Uin needs to be set first in the General settings menu Uin in this case is the actual input voltage of the single variac Connecting the double variac VAR 3005 D16 or VAR 6502 it is important that Uin in the General setting needs to be set first before entering the variation screen The value of Uin is variable with the double variac NSG 3060 EMC test system For proper operation of the plug and play detection mechanisms it is strongly recommended to power on first the accessory and then the NSG 3060 main frame Powering on
39. 2 0 270790 N gt PE 60s 10 pulse 3 4 2000 V t 12 0 270780 N gt PE 60s 10 pulse 20 4000 V 12 0 270790 N gt PE 60s 10 pulse IEC 1 PH POWER LINE N PE LEVEL 1 11 500 V 30 ohm 0 270790 N gt PE 60 s 10 pulse IEC 1 PH POWER LINE N PE LEVEL 2 1 2 500 V 30 ohm 0 270 90 N gt PE 60 s 10 pulse 2 2 1000 V 30 ohm 0 270 90 N gt PE 60 s 10 pulse IEC 1 PH POWER LINE NPE LEVEL 3 113 500V z 0 0 270790 N gt PE 60s 10 pulse ES 7000 V t 300 0 270790 N gt PE 60s 10 pulse 313 2000 V 30chm 0 270790 N gt PE 60s 10 pulse IEC 1 PH POWER LINE NPE LEVEL 4 14 500V Fi 300 0 270780 N gt PE 60s 10 pulse 2 4 1000 V 30chm 0 270790 N gt PE 60s 10 pulse 3 4 2000V E 300 0 270790 N gt PE 60s 10 pulse 20 4000 V 5 0 270790 N gt PE 605 10 pulse IEC 3 PH M FEEDER LINE LX LX LEVEL 1 1 6 250V F 12 0 270790 L1 gt N 60s 10 pulse 2 6 250V 12 0 270780 L2 gt N 60s 10 pulse 3 6 250V 12 0 270790 L3 gt N 60 s 10 pulse 4 6 250 V 12 0 270 90 L1 gt L2 60 s 10 pulse 5 6 250 V 12 0 270790 L1 gt L3 60 s 10 pulse 6 6 250V z 12 0 270790 L2 gt L3 60s 10 pulse TEC 3 PH M FEEDER LINE LX LX LEVEL 2 1 65 500 V ri 12 0 270780 L1 gt N 60s 10 pulse 2 6 500V 12 0 270790 L2 gt N 60s 10 pulse 3 6 500V t 12 0 270790 L3 gt N 60s 10 pulse 4 6 500V z 12 0 270790 LT gt L2 60s 10 pulse 5 6 500V E 12 0 270790 L1 gt 13 60s 10 pulse 6 6 500V
40. 270 90 10 pulse 2 0 270 90 10 pulse 2 0 270 90 10 pulse IEC 1PH POWER LINES L N LEVEL 4 2 0 270 90 10 pulse 2 0 270 90 10 pulse 2 2 0 270 90 10 pulse 0 270 90 10 pulse IEC 1PH POWER LINES L PE LEVEL 1 0 270 90 10 pulse IEC 1PH POWER LINES L PE LEVEL 2 0 270 90 10 pulse 0 270 90 10 pulse IEC 1PH POWER LINES L PE LEVEL 3 0 270 90 10 pulse 0 270 90 10 pulse 0 270 90 10 pulse IEC 1PH POWER LINES L PE LEVEL 4 0 270 90 10 pulse 0 270 90 10 pulse 0 270 90 10 pulse 0 270 90 10 pulse IEC 1PH POWER LINES N PE LEVEL 1 0 270 90 10 pulse IEC 1PH POWER LINES N PE LEVEL 2 0 270 90 10 pulse 0 270 90 10 pulse IEC 1PH POWER LINES N PE LEVEL 3 12 0 270 90 10 pulse 12 0 270 90 10 pulse 12 0 270 90 10 pulse IEC 1PH POWER LINES N PE LEVEL 4 12 0 270 90 10 pulse 12 0 270 90 10 pulse 12 0 270 90 10 pulse 12 0 270 90 10 pulse TASEO Advanced Test Solutions for EMC 97 98 Basic Standard IEC 61000 4 5 NSG 3060 EMC test system File name implemented
41. 4 8 2001_Ed_1 1 50 HZ CF 9 8 level 1 up to level 4 60 HZ CF 9 8 level 1 up to level 4 Pulsed magnetic field IEC 61000 4 9 2001_Ed_1 1 CF 0 98 level 3 up to level 5 Dip and Interrupts for AC power lines IEC 61000 4 11 2002_Ed_2 50 Hz AC Power Lines Class 2 Dips 0 0 5 Cycle dips up to 25 Cycle 60 Hz AC Power Line 5 e 60 Hz AC Power Line 50 Hz AC Power Lines 50 Hz AC Power Lines 60 Hz AC Power Lines 60 Hz AC Power Lines Hz AC Power Line KZ a KZ Class 2 Dips 0 0 5 Cycle dips up to 30 Cycle Class 3 Dips 0 0 5 Cycle dips up to 250 Cycle Class 3 Dips 0 0 5 Cycle dips up to 300 Cycle Class 2 Short interruption 0 250 Cycle dips Class 3 Short interruption 0 250 Cycle dips Class 2 Short interruption 0 300 Cycle dips Class 3 Short interruption 0 300 Cycle dips TASEO Advanced Test Solutions for EMC 58 50HZ Voltage variation 60HZ Voltage variation Dips and interrupts for DC lines IEC 61000 4 29 2000 DC Voltage Dips 40 0 01 supto 1s DC Voltage Dips 70 0 01 s up to 1 s DC voltage interruption 0 0 001 s up to 1s DC voltage variation 85 0 1 sup to 10 s DC voltage variation 120 0 1 s up to 105 DC voltage variation 80 0 1 sup to 105 8 2 3 SAVE TEST The Save Test button is used to save the current test to a file for later use Touch the Save Test button A keyboard is displayed Touch the individual keys
42. 5 Asynch Surge Output 60s 10 pulse 3 4 2000V Fi 15 Asynch Surge Output 60s 10 pulse 44 4000V z 15 Asynch Surge Output 60s 10 pulse SHIELDED IO COMM LINES LEVEL 1 11 500V Fi 15 Asynch Surge Output 60s 10 pulse SHIELDED IO COMM LINES LEVEL 2 1 2 500V 15 Asynch Surge Output 60s 10 pulse ES 1000V 15 Asynch Surge Output 60s 10 pulse SHIELDED IO COMM LINES LEVEL 3 13 500V FI 15 Asynch Surge Output 60s 10 pulse 23 1000 V 15 Asynch Surge Output 60s 10 pulse 38 20007 z 15 Asynch Surge Output 60s 10 pulse SHIELDED IO COMM LINES LEVEL 4 1 4 500V 15 Asynch Surge Output 60s 10 pulse 2 4 1000 V 15 Asynch Surge Output 60s 10 pulse 34 2000V FI 15 Asynch Surge Output 60s 10 pulse 44 4000V 15 Asynch Surge Output 60s 10 pulse NSG 3060 EMC test system Basic Standard IEC 61000 4 12 2006 2 File name implemented Test step Voltage Polarity impedance Phase Coupling Rep time Test duration IEC 1 PH M FEEDER LINE L N LEVEL 1 11 250 V 12 o 270780 L gt N 60s 10 pulse IEC 1 PH M FEEDER LINEL NLEVEL 2 12 250 V 12 0 270 80 L gt N 60s 10 pulse 2 2 500V 12 o 270790 L gt N 60s 10 pulse IEC 1 PH M FEEDER LINEL NLEVEL 3 1 8 250 V 12 0 270780 CH 60s 10 pulse ER 500V j 12 o 270790 L gt N 60s 10 pulse 3 3 1000 V 12 o 270790 _L
43. AC address Media Access Control MAC technology provides a unique identification and access control for devices on an IP network This address can not be changed Media Access Control assigns a unique number the MAC address to each network adapter The MAC address for the NSG 3040 network interface card displayed in the communication screen is unique to that card and cannot be changed TASEO Advanced Test Solutions for EMC 41 42 7 6 Monitoring Monitoring EUT Supply Voltage EUT Supply Frequency Test Action St at EUT Fail Input Op EUT Power Supply at EUT Fail Input Off Monitoring window Touch the Monitoring button to view EUT power input parameters and to control test activity and EUT power input in the event of EUT failure 7 6 1 EUT supply voltage EUT supply frequency The EUT supply voltage EUT supply frequency fields display the actual EUT voltage frequency when the AC EUT input supply is connected and EUT power is switched On When the input supply is not connected and or the EUT is switched off these fields will display 0 V and 0 Hz Thereby the EUT AC input supply must be connected and the EUT power has to be switched On Otherwise the screens show 0 V and 0 Hz 7 6 2 Test action at EUT fail input Touch the Test action at EUT fail input button Stop in the example to specify the test action taken if the EUT fail signal is deledted When the button is set to Stop and t
44. C 38 EUT OFF ON When the NSG 3060 is powered on the EUT power is automatically set to OFF Touch the EUT OFF ON button to turn power to the EUT on or off FACTORY SETTINGS Touch the Factory settings button to reset the properties associated with each of the buttons in the General settings window to the original factory settings OK Touch the OK button to save all settings and return to the system window Interlock action Touch the Interlock action button EUT Power on in the example to keep EUT power on when the interlock is activated or to have it automatically shut off EUT Power off when the interlock is activated Expert mode Touch the expert mode button Off in the example to Active to change parameters during a running test When the button is set to Off parameters can be changed only when the NSG 3060 is in stop mode Expert mode only available for burst pulse FFT Voltage Uin This button is used only when an optional VAR 6502 or VAR 3005 variac is connected to the NSG 3060 The value entered in this field is the voltage mea sured at the mains socket and is used as the 100 reference point for voltage variation tests Touch the voltage Uin button 230 in the example Use the wheel or keypad to set the input voltage Uin setting will be saved and is valid for all following tests Uin are changeable via WIN 3000 dialoge to be used in sequence mod
45. DNs with a minimum 400 MHz digital oscilloscope to accu EB NOTE A Teseq CAS 3025 calibration set must be used rately verify the EFT pulse parameters TASEO Advanced Test Solutions for EMC 62 Single pulse Pulse burst 100 ______ 90 Burst lt 20 Faust 50 10 Pie ee i t rep Burst wave shape and timing definitions tr 5ns 30 tp 50 ns 30 into 50 Q tp 50 15 ns 100 ns into 1000 Q 8 3 3 Burst parameters window Burst window obw E Volt al 200 Burst Time 15 el Frequency den a 2 300 e D a ama 120 Burst parameter setting window NSG 3060 EMC test system 8 3 4 Voltage Touch the Polarity button ALT in the example to select test polarity Polarity values are positive POS negative NEG or alternating ALT On odd pulse number there will be one pulse less in negative then in positive Positive pulse will be first executed Touch the Voltage button 200 V in the example to enter the test voltage A red frame is displayed around the field The voltage value may be entered using the wheel or the keypad 8 3 5 Frequency Touch the Frequency button 5 in the example to set the test frequency A red frame is displayed around the field The frequency value may be entered using the wheel or the keypad Touch the units button KHz in the example to set the frequency unit Freq
46. GG van uration 120 s ADD STEP ra 5 DT Aselected test can be started During run mode the changeable parameter can be touched the value window is highlighted with a red frame like the voltage frame shown in the examples above The value can now be changed via wheel and by pressing again the START button the value will be accepted and on the pulse output the new value is displayed 8 2 The bottom bar Following functions are not available in this version 8 2 1 LOAD USER TEST Touch the Load User Test button to display a list of all test files that have been created and saved by the user Only files for the selected test type are displayed Figure 8 5 shows the load user test window with several burst tests displayed The user can scroll through the tests by touch the UP and DOWN arrows on the right side of the screen to scroll through the tests Touch the button to the left of the test name to select it A red border is dis played around the selected test Figure 8 6 shows the Load User Test window with a test selected Touch the OKT button to load the test and return to the test parameter window TASEO Advanced Test Solutions for EMC 53 54 Touch the Delete button to delete a saved test A window asking the user to confirm or cancel this action will be displayed see figure 8 7 Touch OK to delete the file or Cancel to cancel this action NOTE Once a test has been d
47. HZ CLASS 2 S INT OPC 300CY CLE 250 cycle 3 pulses o 10s 300 cycle 3 pulses File name implemented IEC 50HZ CLASS 3 S INT OPC 250CY CLE 0 10s 250 cycle 3 pulses IEC 60HZ CLASS 3 S INT OPC 300CYCLE o 10s 300 cycle 3 pulses RE KA KI KA IEC DCV DIPS 101 5 40 0 01 s 3 pulses IEC DCV DIPS 30MS_ 40PC 0 03 s 3 pulses IEC DCV DIPS 100MS_ 40PC IEC DCV DIPS 300MS_ 40PC IEC DCV DIPS 15 40PC 0 1 s 3 pulses 3 pulses IEC DCV DIPS 101 5 70 0 3 pulses IEC DCV DIPS 30MS 70 0 3 pulses IEC DCV DIPS 100MS 7000 3 pulses IEC DCV DIPS 300MS_ 70PC IEC DCV DIPS 1S 70PC 3 pulses 70 10s 1s 3 pulses IEC DCV INTERRUPTION 11 9 OPC 10s 00015 3 pulses IEC DCV INTERRUPTION 3MS OPC 10s 00035 3 pulses IEC DCV INTERRUPTION 10MS_ OPC IEC DCV_INTERRUPTION 30MS_ 0PC IEC DCV INTERRUPTION 100MS_ OPC IEC DCV INTERRUPTION 300MS OPC 0 0 0 105 0 015 3 pulses 0 0 035 _ 3 41505 0 15 Dokes 0 3 s 3 pulses IEC DCV INTERRUPTION 18 OPC 1s 3 pulses IEC DCV VARIATION 100MS_ 85PC IEC DCV VARIATION 300MS _ 85PC IEC DCV VARIATION 1S _ 85PC Dis 3 pulses 85 10s 0 3 s 3 pulses 15 3 pulses IEC DCV VARIATION 3S _ 85PC 38 3 pulses IEC DCV VARIATION 10S 85 09 10s 3 pulses IEC DCV VARIATION 100MS_ 120PC IEC DCV VARIATION 300MS_ 120PC IEC DCV VARIATION 158 120PC
48. IEC LEVEL 5 TASEO Advanced Test Solutions for EMC 106 Basic Standard IEC 61000 4 11 2002 Ed 3 File name implemented Phase Rep time T Event ts Test duration IEC 50HZ CLASS 2 DIPS OPC 0 5 CYCLE 0 315 45 10 ms 3 pulses IEC 60HZ CLASS 2 DIPS OPC 0 5 CYCLE 0 315 45 8333us 3 pulses IEC SOHZ CLASS 2 DIPS OPC 1 CYCLE 0 315 45 1cycle 3 pulses IEC 60HZ CLASS 2 DIPS OPC 1 CYCLE IEC 50HZ CLASS 2 DIPS 70PC 25 CYCLE IEC 60HZ CLASS 2 DIPS 70PC 30 CYCLE 0 315 45 1cycle 3 pulses 0 3157 45 105 25 cycle 3 pulses 0 315 45 30 cycle 3 pulses IEC 50HZ CLASS 3 DIPS OPC 0 5 CYCLE 0 315 45 10ms__ 3 pulses IEC 60HZ CLASS 3 DIPS OPC 0 5 CYCLE IEC SOHZ CLASS 3 DIPS OPC 1 CYCLE IEC 60HZ CLASS 3 DIPS OPC 1 CYCLE 0 315 45 8333 us 3 pulses 0 315 45 105 1cycle 3 pulses 0 315 45 1cycle 3 pulses IEC SOHZ CLASS 3 DIPS 40PC 10 CYCLE 0 315 45 10 cycle 3 pulses IEC 60HZ CLASS 3 DIPS 40PC 12 CYCLE 0 315 45 12 cycle 3 pulses IEC SOHZ CLASS 3 DIPS 70PC 25 CYCLE 0 315 45 25 cycle 3 pulses IEC 60HZ CLASS 3 DIPS 70PC 30 CYCLE IEC 50HZ CLASS 3 DIPS 80PC 250 CYCLE IEC 60HZ CLASS 3 DIPS 80PC 300 CYCLE 0 315 45 30 cycle 3 pulses 0 3157 45 105 250 cycle 3 pulses 0 315 45 300 cycle 3 pulses IEC SOHZ CLASS 2 S INT OPC 250CY CLE IEC 60
49. L2 L3 N PE 750069 300 ms 120 s ANSI IEC 3PH POWER LINES LEVEL 4 1 2 4000 V 5 kHz Asynch L1 L2 L3 N PE 15 ms 300 ms 120s 2 2 4000 V 100 kHz Asynch L1 L2 L3 N PE 750us 300 ms 120 s ANSI IEC CAP COUPL LEVEL 1 1 2 250 V 5 kHz Asynch Burst output 15 ms 300 ms 120 s 2 2 250 V 100 kHz Asynch Burst output 750us 300 ms 120 s ANSI IEC CAP COUPL LEVEL 2 1 2 500 V 5 kHz Asynch Burst output 15 ms 300 ms 120 s 2 2 500 V 100 kHz Asynch Burst output 750us 300 ms 120 s ANSI IEC CAP COUPL LEVEL 3 1 2 1000V x 5 kHz Asynch Burst output 15 ms 300 ms 120 s 2 2 1000V 100 kHz Asynch Burst output 750us 300 ms 120 s ANSHIEC CAP COUPL LEVEL 4 1 2 2000V 5 kHz Asynch Burst output 15 ms 300 ms 120 s 2 2 2000V 100 kHz Asynch Burst output 750us 300 ms 120 s Basic Standard IEC 61000 4 4 2004_Ed_2 Test Test Frequenc Burst Rep duratio File name implemented step Voltage Polarityjy Phase Coupling time__ time n ANSI IEC 1PH POWER LINES LEVEL 1 1 2 500 V 2 2 500 V ANSI IEC 1PH POWER LINES LEVEL 2 1 2 1000 V 2 2 1000V ANSI IEC 1PH POWER LINES LEVEL 3 1 2 2000 V 5 kHz Asynch L N PE 15ms 300 ms 120 s 2 2 2000V 100 kHz Asynch L N PE 750us 300 ms 120 s ANSI IEC 1PH POWER LINES LEVEL 4 1 2 4000 V 5 kHz Asynch L N PE 15ms 300 ms 120 s 2 2 4000 V 100 kHz Asynch L N PE 750us 300 ms 120 s ANSI IEC 3PH POWER LINES LEVEL 1 1 2 500 V 5 kHz Asynch L1 L2 L3 N PE 15ms 300 ms 120 s 2 2 500 V 100 kHz Asynch L1
50. Volts If a manual voltage source being connected then the dips interrupts level will follow the manually set voltage at the EUT input 8 7 4 Phase Touching the Phase field it will come up with a red frame to indicate the selected parameter being ready for change The value can be modified either with the red wheel or using the keypad Touching the Synch Asynch button it will change repetitively In synch mode the angle can be modified either with the red wheel or using the keypad Synch mode is only available along with a automated CDN and if the EUT power AC is switched on 8 7 5 Repetition time Touching the Repetition Time field it will come up with a red frame to indicate the selected parameter being ready for change The value can be modified either with the red wheel or by using the keypad Touching the units repetitively will change from s min cycle Hs to ms 8 7 6 T Event Touching the T Event field it will come up with a red frame to indicate the selected parameter being ready for change The value can be modified either with the red wheel or using the keypad Touching the units repetitively will change from ms s cycle We cycle or ps 8 7 7 Test duration Touching the Test Duration field it will come up with a red frame to indicate the selected parameter being ready for change The value can be modified either with the red wheel or using the keypad Touching the units repetitively will chan
51. a maximum of 10 test steps When the first test step is programmed TEST 1 X is displayed in the upper right corner and the step can no longer be changed from the Test parameters window To change a step the user must first delete it using the Show Step button then use Add Step to re enter the step Refer to sections 8 3 8 9 for detailed information on setting parameters for specific types of tests EXPERT MODE The Expert Mode button can be used only if Expert Mode is set to On in the System General settings window see section 7 3 Expert Mode is a fast effective method of activating critical threshold values Touch the Expert Mode button to manually adjust test parameters using the wheel while a test is in progress Expert Mode only for burst pulse The Expert Mode allows the user to change parameters during a running test if this mode is set Active in the system setting For safety reasons in the in the burst menu the expert mode needs to be activated as well The Expert Mode can be activated only for the following parameter E Volt please note the voltage change is only possible if the polarity is set to Neg or Pos E Frequency m Phase E Burst time NSG 3060 EMC test system Burst Electrical Fast Transient test Burst c ell oos Volt at 200 v Burst Time 75 ste a a Repetition Frequency d 12 Time 300 ms F ee DES ve Phase a
52. able for test objects with dimensions up to 0 6 x 0 6 x 0 5m I xX w xh For the pulsed magnetic field test two types of loop can be supplied The INA 701 is a coil with a factor of 0 89 It enables field strengths up to 3 6A m for mains frequency fields 50 or 60Hz when used with the MFO 6501 or MFO 6502 current Sources option and 1200A m for pulsed magnetic fields NSG 3060 EMC test system The INA 702 is a 1 x 1m loop 11 turns coil factor 9 8 when fitted with the power plug It enables the generation of field strengths of up to 40A m for mains frequency fields 50 or 60Hz when used with the MFO 6501 or MFO 6502 current sources option The INA 702 becomes a single turn loop when fitted with the pulse plug which allows the generation of pulsed field strengths up to 1200A m where the urrent is generated by surge generator O 8 10 2 Pulse wave shape adapter INA 753 In order to meet the pulse waveform required by IEC 61000 4 9 the wave shape adapter INA 753 needs to be used with NSG 3060 and the INA 701 or 702 loop antennas The pulse wave shape adapter INA 753 is a standard accessory for the NSG 3060 It provides a convenient means for interconnecting the surge generator output with the loop antennas INA 701 or 702 and insures that the generated pulsed magnetic field has the wave shape as specified in the application stan dard The control is fully automatic driven from the NSG The user will setup his tests
53. and IEC EN 61000 4 12 Ed 2 0 2006 Duplicates high voltage high energy interfer ence as experienced with a lightning strike Generally speaking the interference finds its way into household equipment via the mains power supply This kind of interference can affect equipment in either of two ways Firstly the interference can be coupled directly into the equipment via the mains supply The interference is conveyed directly from the source e g lightning strike to external power cables Every item of equipment connected to this power source will be affected by the interference pulses Alternatively the pulses from the source of the interference or its associated mains cables can be coupled into other equipment positioned nearby Surge pulse interference can also occur on signal and data lines through cou pling effects and electrical discharges The system enables tests to be carried out using both coupling methods The EUT is connected to the mains power socket on the front panel of the test system for direct mains injection tests Externally coupled tests require the TASEO Advanced Test Solutions for EMC 13 interference to be superimposed onto signal data line cables via an external coupling unit that is connected to the surge output on the front panel of the system 3 4 Telecommunication wave test The 10 700 us telecom wave generator module is used to test ports intended for connection to symmetrical communication lines
54. ch OK to enable the coupling selection and close the window Touch Cancel to close the window without saving the coupling selection Touch Show Graphics to display a graphical example of the coupling selec tion ne ED wT ref w Cl ml cancel Coupling selection window Note Burst coupling is always to HF reference ground 8 3 8 Burst time Touch the burst time button 15 in the example to set the burst time A red frame is displayed around the field The burst time may be entered using the wheel or the keypad NSG 3060 EMC test system Touch the units button ms in the example to set the time unit Time units are s ms us and spikes 8 3 9 Repetition time Touch the Repetition time button 300 in the example to set the test repeti tion time A red frame is displayed around the field The repetition time may be entered using the wheel or the keypad Touch the units button ms in the example to set the time unit Time units are 5 and ms 8 3 10 Test duration Touch the Test Duration button 120 in the example to set the test dura tion time A red frame is displayed around the field The duration time may be entered using the wheel or the keypad Touch the units button s in the example to set the time unit Time units are s min h and cont continuous 8 3 11 Burst generator technical data Parameter Value Pulse amplitude 200 V to 4 8 kV in 1 V S
55. ch the Repetition time button 60 in the example to set the test repeti tion time A red frame is displayed around the field The repetition time may be entered using the wheel or the keypad Touch the units button s in the example to set the time unit Time units are s and min Touching the units repetitively will change from s to min 8 6 6 Test duration Touch the Test Duration button 10 in the example to set the test duration time A red frame is displayed around the field The duration time may be entered using the wheel or the keypad Touch the units button pulse in the example to set the unit Unit values are PULSE and CONT continuous TASEO Advanced Test Solutions for EMC 85 86 Parameter Pulse voltage open circuit Pulse current Short circuit Impedance Polarity Phase synchronization Coupling Pulse repetition Value 200 V to 7 7 kV in 1 V steps 13 3 A to 513 3 A 15 400 Positive negative alternate Asynchronous Synchronous 0 to 359 in 1 steps external manual 20 to 30 s up to 600 s in 1 sec steps Test duration 1 to 9999 pulses Continuous Repetition rate depends on voltage 200 to 4400V 20 s repetition time 4401 to 7700V 30 s repetition time 8 7 Mains power quality PQT The PQT test involves the emulation of mains voltage dips and brief interrup tions as specified in the international standard EN IEC 61000 4 11 The gen
56. ck circuit EUT reports a fault to the 7 6 sync2 EUT fail NSG 3060 software The Gees 0 master est is stopped External device receives 10 from the active 18 Sync3 ae he Trigger to Scope signal 1 101 0 116 oscilloscope rom the generator slave controller and 8 master controller From external device 17 Sync4 Pulse enable External 66 0950059 to the slave and est run master controllers TASEO Advanced Test Solutions for EMC 31 32 Pin Sync line Signal Remark Working direction Freely definable sync bus Freely definable for 4 Syncs signal later options Freely definable sync bus Freely definable for 16 Sync signal later options Internal usage 3 Sync7 Reserved debug mode 2 8 GND Sync bus ground return 15 20 y e 24V Interbus 24 V suppl 14 21 PRS 19 Interlock return Interlock return line All e Interbus lines others See chapter System interface connector functions for more detail 6 2 6 Synchro Bus system This connection includes external device control and interlock capability If the NSG is used only as a stand alone unit the termination connector needs to be plugged otherwise the unit will not start All connected accessories will be detected automatically Written tests are linked with this accessories so if other accessory is connected it may get an error if the test contains not the suitable accessories Any
57. d 1 phase coupler for EFT Burst 4 8 kV amp Surge 6 6 kV with EUT supply up to 270 V 16 A Automated 1 phase coupler for Surge 6 6 kV with EUT supply up to 270 V 16 A 6 Manua 6 Manua Manua GE ZS p to 480 V 32 A 90 VAC 90 VAC 1000 VDC 100 A 3 phase co utomated 3 phase coupler for FT Burst 4 8 kV only with EUT supply utomated 3 phase coupler for FT Burst 4 8 kV and Surge 6 6 kV with EUT supply up to 480 V 32 A Automated 3 phase coupler for Surge 6 6 kV only combi with EUT supply up Automated 3 phase coupler for Surge 6 6 kV only combi with EUT supply up Automated 3 phase coupler for Surge 6 6 kV only combi th EUT supply up anual 3 phase co V only with EUT nation and ring wave to 480 V 32 A nation and ring wave to 480 V 63 A nation and ring wave to 480 V 100 A upler for EFT Burst supply up to upler for EFT Burst 8 kV only with EUT supply up to 1000 VDC 200 A 3 phase coupler for Surge 8 kV only combination and ring wave with EUT current up to 100 A 3 phase coupler for Surge 8 kV only combination and ring wave with EUT current up to 200 A CDN 117 118 CDN HSS 2 CDN 3425 121 Coupling networks for signal data lines Surge Coupling network for 2 kV surge pulse 1 2 50 us IEC EN 61000 4 5 on unshielded symmetrical high speed telecom lines Ethernet Burst EFT Capacitive co
58. d behind the fan outlet on the rear panel 9 Switch the system on and operate as instructed in this manual TASEO Advanced Test Solutions for EMC 24 5 2 Connecting the system to the ground reference plane As mentioned in the standard the generator must be placed on a ground ref erence plane which is connected to ground A good high frequency ground connection between the test system and the ground reference plane GRP is absolutely essential for performing burst tests correctly Connect the ground terminal on the front panel of the NSG 3060 to the ground reference plane using the link and bolts supplied If a CDN is connected please refer to section Reference ground connector 5 3 Mounting in a 19 rack When the NSG 3060 test system is combined with other equipment it can be useful to mount the instrument in a 19 rack The unit is 19 wide and 7U in height an additional 5U is required for the CDN 3061 An optional rack mount kit is available NSG 3060 EMC test system 6 MAINFRAME DESCRIPTION 25 O EMI The 3060 housing NSG is specially designed for EMC applications and is EMC approved Burst output 6 1 Front panel E Surge low output Start Stop Pause button Color touch screen HE Surge high output M LEDs E Reference ground connector ground point Wheel BR Surge low input RE Wheel sensitivity keys D Surge high input M LEDs EH Burst inpu E
59. dot may be used After touching ENTER the keypad will close and the new setting are saved The Delete key will delete all text entered The backspace button lt will delete the last letter entered Touch the Cancel button to return to the test parameter window without saving the file IP address An IP address Internet protocol address is a unique address that certain elec tronic devices use identify and communicate with each other on a computer network utilizing the Internet Protocol standard IP Any participating network device must have its own unique address Touch the IP address button to enter the IP address A red frame will be displayed around the field Enter the IP address using the wheel or keypad Subnet A subnet is a logical grouping of connected network devices which is used to partition networks into segments Devices on a subnet are share a contiguous range of IP address numbers A subnet mask defines the boundaries of an IP subnet and hides the network address portion of an IP address For example if a network has a base IP address of 192 168 0 0 and has a subnet mask of 255 255 255 0 then any data going to an IP address outside of 192 168 0 X will be sent to that network s gateway The correspondence between subnet masks and IP address ranges follows defined mathematical formulas by assigning a value of 1 to every digit in the network address portion of the binary IP address These mask
60. e NSG 3060 EMC test system 7 4 Equipment Equipment detail NA NA NA SUI 3000 080313 NA MODMC_MU 0001 23A 357 HvS6601 0001 14g 1 EFT6601 0001 14g 14 RW6601 0001 14k 000000 Equipment window 4 5 2007 1 1 2003 1 1 2003 1 1 2003 4 5 2007 1 1 2003 1 1 2003 1 1 2003 V Bayer V Bayer V Bayer V Bayer Touch the Equipment button to access a list of all internal and external genera tor modules including firmware versions serial numbers calibration dates and certificate numbers The red vertical bar on the right of the equipment window displays three buttons Exit Up and Down EXIT Touch the Exit button to return to the system window UP DOWN If the system includes more than 5 modules touch the Up and Down arrows to scroll through the 7 5 Communicatio Communication IP Address 172 20 65 32 Port 1025 i MAC Address 90 0C D2 00 03 57 list n SubNet Gateway Communication window 255 0 0 0 0 0 0 0 FACTORY SETTINGS ray TASEO Advanced Test Solutions for EMC 39 40 Touch the Communication button to view and enter the network address information required to integrate the NSG 3060 into a local area network or connect it to a PC By touch the IP address SubNet Port or Gateway field the key board will appear and the new numbers can be added To enter a new address only the number key and the
61. e 30 level 1 up to level 4 3 Ph Power Lines Lx PE Comm Mode major feeder line 12 Q level 1 up to evel 4 3 Ph Power Lines Lx PE Comm Mode outlets lines 30 Q level 1 up to level 4 DC Lines L1 Pos N Neg 12 Q level 1 up to level 4 DC Lines L1 Pos N Neg 30 Q level 1 up to level 4 Unshielded unsymmetrical I O lines level 1 up to level 4 Unshielded symmetrical lines communication lines level 1 up to level 4 Ring wave ANSI C 62 45 2002 1 Phase EUT Basic 1 Location Cat A1 up to Cat A3 12 Q 1 Phase EUT Basic 1 Location Cat A1 up to Cat A3 30 Q 1 Phase EUT Basic 2 Location Cat A1 up to Cat A3 12 Q 1 Phase EUT Basic 2 Location Cat A1 up to Cat A3 30 Q NSG 3060 EMC test system 3 Phase EU T Basic 1 Locati on Cat A1 up to Cat A3 12 Q 57 3 Phase EUT Basic 1 Location Cat A1 up to Cat A3 300 3 Phase 3 Phase 3 Phase 3 Phase U UT Basic 2 Locat Basic 2 Locat UT Basic 3 Locat UT Basic 3 Locat 3 Phase EUT Basic 4 Locat 3 Phase EUT Basic 4 Locat ion Cat A1 up to Cat A3 12 Q ion Cat A1 up to Cat A3 300 ion Cat A1 up to Cat A3 12 Q ion Cat A1 up to Cat A3 30 Q ion Cat A1 up to Cat A3 12 Q ion Cat A1 up to Cat A3 30 Q Telecom pulse IEC 61000 4 5 2005_Ed_2 Symmetrica operated all lin es to PE level 1 up to level 4 Shielded I O communication lines level 1 up to level 4 Power magnetic field IEC 61000
62. e ANSI 1 PH BASIC 1 CAT A2 30R LN PE 4000 V 0 270 90 10 pulse ANSI 1 PH BASIC 1 CAT A3 30R LN PE 6000 V 0 270 90 10 pulse ANSI 1 PH BASIC 2 CAT A1 12RLN PE 2000V 0 270 90 10 pulse ANSI 1 PH BASIC 2 CAT A2 12RLN PE 4000 V 0 270 90 10 pulse ANSI 1 PH BASIC 2 CAT A3 12RLN PE 6000 V 0 270 90 10 pulse ANSI 1 PH BASIC 2 CAT A1 30RLN PE 2000V 0 270 90 10 pulse ANSI 1 PH BASIC 2 CAT A2 30R LN PE 4000 V 0 270 90 L gt N 10 pulse ANSI 1 PH BASIC 2 CAT A3 30R LN PE 6000 V 0 270 90 L gt N 10 pulse ANSI 3 PH BASIC 1 CAT A1 12RL1L2L3N PE 2000V 0 270 90 L1 L2 L3 N 10 pulse ANSI 3 PH BASIC 1 CAT A1 12RL1L2L3N PE 4000 V 0 270 90 L1 L2 L3 N 10 pulse ANSI 3 PH BASIC 1 CAT A1 12RL1L2L3N PE 6000 V 0 270 90 L1 L2 L3 N 10 pulse ANSI 3 PH BASIC 1 CAT A1 30RL1L2L3N PE 2000V 0 270 90 L1 L2 L3 N 10 pulse ANSI 3 PH BASIC 1 CAT A1 30RL1L2L3N PE 4000 V 0 270 90 L1 L2 L3 N 10 pulse ANSI 3 PH BASIC 1 CAT A1 30RL1L2L3N PE 6000 V 0 270 90 L1 L2 L3 N 10 pulse ANSI 3 PH BASIC 2 CAT A1 12RL2 L1 2000V 0 270 90 10 pulse ANSI 3 PH BASIC 2 CAT A1 12RL2 L1 4000 V 0 270 90 10 pulse ANSI 3 PH BASIC 2 CAT A1 12RL2 L1 6000 V 0 270 90 10 pulse ANSI 3 PH BASIC 2 CAT A1 30RL2 L1 2000V 0 270 90 10 pulse ANSI 3 PH BASIC 2 CAT A1 30RL2 L1 4000 V 0 270 90 10 pulse ANSI 3 PH BASIC 2 CAT A1 30RL2 L1 6000 V 0 270 9
63. e EUT input should be connected through a properly rated power switch device which should be located close to the test setup In order to ensure easy and quick access to the EUT power the switch should be clearly and visibly labeled as EUT power ON OFF The in house power distribution must be equipped with a proper circuit breaker and an emergency off button as per IEC 61010 1 2001 The test setup should only be accessible to trained per EF sonnel Dimensioning of the mains supply and rating of fuse protection of the AC or DC power supply must conform with local electrical codes and EUT requirements Inappropriate arrangement mounting cabling or handling of the EUT or ground can hamper or negate the effectiveness of the NSG 3040 s safety features 4 4 Applicable safety standards The NSG 3060 conforms to the safety requirements specified in IEC 348 and offers all the features necessary for safe and efficient operation Development and manufacture is in compliance with ISO 9001 The system complies with the safety requirements of IEC EN 61010 1 Safety requirements for electrical equipment for measurement control and laboratory use NSG 3060 EMC test system Like all mains powered generators the system is designed for high voltage working safety in accordance with VDE 0104 Interference immunity has been tested in accordance with EN 61326 1 It is the user s responsibility to ensure that the test rig does not emit exce
64. ed digits are not permitted to change when assigning IP addresses to devices on the local area network NSG 3060 EMC test system Touch the SubNet button to enter the subnet mask A red frame will be dis played around the field Enter the subnet mask using the wheel or keypad Gateway A gateway is a node on a network that serves as an entrance to another network In enterprises the gateway is the computer that routes the traffic from a workstation to the outside network that is serving the Web pages In homes the gateway is the ISP that connects the user to the internet nenterprises the gateway node often acts as a proxy server and a firewall The gateway is also associated with both a router which use headers and forward ing tables to determine where packets are sent and a switch which provides the actual path for the packet in and out of the gateway The gateway address is usually set at 0 0 0 0 Touch the Gateway button to enter the gateway address A red frame will be displayed around the field Enter the gateway address using the wheel or keypad Port Network ports can be either physical or virtual connection points The NSG 3060 has a physical Ethernet port that allows it to be connected to a PC or router The port address for the NSG 3060 should be set to 1025 Touch the Port button to enter the port number A red frame will be displayed around the field Enter the port number using the wheel or keypad M
65. eleted it cannot be restored Load User test FlashDisk UserTest EFT 1EC61000 4 4 2004 LEVEL2FOR DATA LINES EFT 1EC61000 4 4 2004 LEVEL1 FOR DATA LINES EFT 1EC61000 4 4 2004 LEVEL3 FOR DATA LINES EFT RAMPING TEST EFT LONGTERM TEST LEVEL2 COUPLING ON L1 PE EFT Load user test window Load User test FlashDisk UserTest EFT 1EC61000 4 4 2004 LEVEL2FOR DATA LINES EFT 0300044 3 Do you really want to delete the selected file 1EC61000 4 4 www mi sg LONGTERM TEST LEVEL2 COUPLING ON L1i PE EFT Delete test confirmation window NSG 3060 EMC test system Load User test FlashDisk UserTest EFT 55 1EC61000 4 4 2004 LEVEL2FOR DATA LINES EFT 0300044 3 Do you really want to delete the selected file 1EC61000 4 4 LONGTERM TEST LEVEL2 COUPLING ON Li PE EFT Delete test confirmation window 8 2 2 LOAD STANDARD TEST The NSG 3060 includes European generic standards from the IEC EN 61000 4 x and ANSI IEEEE C62 41 which are conform to many standard derivates and product standards Depending on selected pulse the appropriate IEC or ANSI standard test can be selected A complete list can be found in section Standard test parameter Following standard tests are in the SUI Burst IEC 61000 4 4 2009 Ed2 and ANSI 1 Phase power lines level 1 up to level 4 3 Phase power lines level 1 up to level 4 Capacitive coupling clamp lines level 1 up
66. erator causes disturbances on the EUT supply line that is brought out to the EUT power outlet socket of the 1 ohase CDN A dip have occurred when the nominal voltage falls by a significant amount during a certain number of cycles The standard specifies dips of 20 30 and 60 i e the voltage falls to 80 70 and 40 of the nominal level respectively An external variable transformer variac transformer with taps or a DC power source is to be fed into the appropriate pins of an extra input socket for freely selectable voltage dips An interruption occurs when the supply voltage disappears completely for a certain number of cycles or falls to a value less than 5 of its nominal volt age NOTE Dips and interrupts appear on the phase L line only NSG 3060 EMC test system 8 7 1 Sample graphs of dips interrupts 87 a Voltage dip 30 AAA 1 t cycles u b voltage dip 60 t cycles c Voltage dip 100 8 7 2 Mains power quality generator Dips and Drops Window Voltage Uvar 0 Phase ia IDG T Event SE 10 ms Repetition Test Time a 10 s Duration 3 Putse 1 EEE PQT Parameter window TASEO Advanced Test Solutions for EMC 88 8 7 3 Voltage U Var If no automatic variac or automatic transformer being connected then the voltage dips or interrupts will always occur to 0 Touching the units repetitively it will change from to
67. erland nor any of its subsidiary sales orga nizations can accept any liability for personal material or consequential injury loss or damage that may result from improper use of equipment and acces sories 4 1 General The NSG 3060 must be operated only by authorized and trained specialists The generator is to be used only for the purpose specified by the manufacturer The user is directly responsible for ensuring that the test setup does not cause excessive radiated interference which could affect other instrumentation The test system itself does not produce any excessive EM radiation However the injection of interference pulses into a EUT can result in it and or its associated cables radiating electromagnetic radiation To avoid unwanted radiation the standards organizations recommend that the test setup be operated inside a Faraday cage NSG 3060 EMC test system WARNING Because of its construction the NSG 3060 17 is not suitable for use in an explosive atmosphere WARNING Personnel fitted with a heart pacemaker must neither operate the instrument nor approach the test setup while a test is being executed Only approved accessories connectors adapters etc are to be used to ensure safe operation WARNING Connect the EUT only after the initial system EM self test has finished 4 2 Installation The NSG 3060 test system conforms to protection class 1 Local installation regulations must be respected to ens
68. f Ss i SN OZ SSS SEEESEE ES Onn e Son e Advanced Test Solutions for EMC NOZ MO E ZH 5410612 000000 00000 0000 0001 00L BHES RRE EES E m LOD 5 1 0 S Up Ky Z 0 szo L Sen 56 0 51 z a gt S Hd et S Oo 5 SG SG SOL SOL 00L soz soz 000 didHl i E 0000 68 NSG 3060 EMC test system 69 0096 NA ol ZH 540612 0000001 00000 00001 000 00L SA m LO 0 1 f LO sto szo SLO L szQ Sen s Sp L S o oa SL a sz 1 sz z ss 001 SG SOL 507 0001 5072 DJ a 0000L dul 00000L TA3SEO Advanced Test Solutions for EMC 70 8 4 Combination wave Surge parameter setting The surge test generates high voltage pulses as specified in the international standards EN IEC 61000 4 5 and ANSI C62 41 8 4 1 Test configuration for power line coupling Test pulses are injected directly into the EUT power supply lines as they pass through the mains CDN 306x The EUT obtains its
69. g plug with 2 m of cable for supplying the EUT from a normal mains outlet is included with the system The connector is comprised of the pole contact La No 1 the variable voltage pole contact Lb No 3 the neutral return contact N No 2 and the ground connection to the EUT The zero cross reference for synchronization purpose is taken all the time from L to N AC EUT mains input E 1L Phase black E 3 Variable voltage pole red or brown E 2N Neutral blue E 4 GND Earth green yellow Wire colors and functions Black Phase conductor La Pin 1 Blue Neutral return Pin 2 Red or brown Variable voltage pole Lb Pin3 Green yellow Ground conductor Pin 4 TASEO Advanced Test Solutions for EMC 30 30 25 20 B Wire 2 5 mm EM Wire 1 5 mm Operating current VK EM Wire 1 0 mm 20 40 60 80 100 120 C Ambient temperature The additional variable voltage pole contact Lb No 3 enables a variac or alter native AC source or a DC source to be connected for PQT tests In this way the voltage at the phase L line at the EUT output connector can be varied in relation with the voltage at this contact occur on these power lines Such voltages can under certain circumstances destroy power supplies It is the user s responsibility to provide adequate protection at the source input WARNING Pulse overshoot spikes of
70. ge from Pulse Continuous s to min NSG 3060 EMC test system 8 7 8 Dips and interrupts characteristics 89 Parameter Dips 8 interrupts Uvar with optional variac Uvar step transformer Peak inrush current capability Switching times Phase synchronization Repetition time Event time T Event Test duration Value From EUT voltage input to 0 V 0 up to 265 V or up to 115 of Uin 16 A max 10 0 40 70 80 gt 500 A at 230 V 1 to 5 us 100 Q load Asynchronous synchronous 0 to 359 in 1 steps US 40 99 999 ms 1 99 999 Si 1 11999 min 11 BS cycle 1 99 999 US 20 99 999 ms 1 99 999 Si 1 1999 cycle ES Vag cycle 1 3 000 Si 1 99 999 min 1 70 000 pulse 1 99 999 Continuous 1 Effective minimal dip voltage 8 V As specified in IEC 61000 4 11 chapt 5 1 a test voltage level from 0 to 20 of the rated voltage is considered as a total interruption 8 8 Variation test 4 11 automatic procedure Parameter Uvar with optional variac Phase synchronization Repetition time Value up to 265 V in 1 V steps or up to 115 of Uin in 1 steps asynchronous synchronous 0 to 359 in 1 steps 1000 ms to 35 min 1 to 99 999 cycles TASEO Advanced Test Solutions for EMC 90 Decreasing time Td abrupt 1 ms to 5 000 ms 151025 1 to 250 cycles for 50 Hz 1 to 300 cycles for 60 Hz Time at reduced voltage Ts
71. gt N 60s 10 pulse IEC 1 PH M FEEDER LINEL NLEVEL 4 1 4 250 V 12 o 270 0 L gt N 60s 10 pulse 2 4 500 V 12 0 27090 L gt N 60s 10 pulse 3 4 1000V z 12 0 270790 L gt N 60s 10 pulse 2000 V P 12 o 270790 L gt N 60s 10 pulse IEC 1 PH POWER LINEL NLEVEL 1 Vu 250 V 30 o 270790 L gt N 605 10 pulse IEC 1 PH POWER LINEL NLEVEL 2 1 2 250V 30 0 270790 L gt N 60s 10 pulse 2 2 500 V 30 0270780 L gt N 605 10 pulse IEC 1 PH POWER LNE LN LEVEL 3 1 8 250 V 30 0 2707 80 L gt N 60s 10 pulse ER 500 V z 30 o 270790 L gt N 60s 10 pulse 3 3 1000V z 30 0 270790 L gt N 60s 10 pulse IEC 1 PH POWER LINEL NLEVEL 4 174 250V 30 0270780 L gt N 605 10 pulse 2 4 500V p 30 0 270780 L gt N 60s 10 pulse 34 1000V z 0 0 2707 0 L gt N 605 10 pulse 414 2000 V z 30 0 270790 L gt N 60s 10 pulse IEC 1 PH M FEEDER LINE L PE LEVEL 1 11 500V 12 o0 270780 L gt PE 60s 10 pulse TEC 1 PH M FEEDER LINE L PE LEVEL 2 12 500V 18 0 27080 L gt PE 605 10 pulse 2 2 1000V 12 0 270 90 L gt PE 60s 10 pulse IEC 1 PH M FEEDER LINE L PE LEVEL 3 13 500V 12 0 2707 0 L gt PE 60s 10 pulse 2 3 100077 12 0 270790 L gt PE 60s 10 pulse 33 2000V z 12 0 27080 L gt PE 605 10 pulse IEC 1 PH M FEEDER LINE L PE LEVEL 4 14 500V 12 0 270 90 L gt PE 60s 10 pulse 2 4 1000 V z 18 0 27080 L gt PE 605 10 pulse 3 4 2000 V 12 0 270790 L gt PE 60s 10 pulse 474 4000 V 18 0 27080 L gt PE 605 10 pulse
72. he EUT fails the test stops The test can be restarted by pressing the Start key on the front panel When the button is set to Pause and the EUT fails the test goes into pause mode The test can be continued by pressing the Start key on the front panel When the button is set to CONT the test will continue even if the EUT stops functioning NSG 3060 EMC test system 76 3 EUT power supply at EUT fail input 43 Touch the EUT power supply at EUT fail Input button Off in the example to specify the action taken if an EUT fail signal is generated When the button is set to On EUT power stays on after the EUT fail signal is generated When the button is set to Off EUT power shuts down when the EUT fail signal is generated 7 6 4 Exit Touch the Exit button to return to the system window without saving changes 7 6 5 EUT on This button displays the EUT input power status 7 6 6 Ok Touch the Ok button to save changes and return to the system window 7 7 SD card properties This feature is not yet implemented DI This function is actually not supported SD card properties window The NSG 3060 includes an integrated SD card slot which can be used to down load software updates TASEO Advanced Test Solutions for EMC A4 7 7 1 Viewing the current SUI version The current SUI software version is displayed in the equipment detail window To access this window 1 Touch the system button in t
73. he main menu to display the system window 2 Touch the equipment button to display the equiment detail list TASEO Advanced Test Solutions for EMC SC alez System button in the main menu System window EE Equipment button in the system window Equipment detail SUI 3000 0001 00A Identifies the SUI version MODMC_MU 0001 23A 4 5 2007 HvS6601 0001 14g 11 1 1 2003 11 2003 EFT6601 0001 14g 14 1 1 2003 1 1 2003 RW6601 0001 14k 35 1 1 2003 1 1 2003 Equipment detail list with SUI software version displayed NSG 3060 EMC test system 7 7 2 Updating SUI software via the SD card To change the SUI software first switch off the generator and remove all power cords and cables Open the top housing cover of the generator as described below EP WARNING Before opening the generator make sure that it is turned OFF and disconnected from all power and signal cables To open the NSG 3060 the user must first remove the sides panels Each side panel has 4 snap fixtures which will separate when outward pressure is applied 1 Pull outward on the indentation in the front of the side panel A blunt tool which will not scratch the paint on the panel may be used 2 Pull outward to separate the panel from the snap fixtures 3 Remove the upper screws on both sides of the generator cover 4 Remove the NSG 3060 cover The SD card slot is located at the right front of the generator in back of the front pane
74. he system This ground link must be used for burst tests to obtain reproducible test results NSG 3060 EMC test system 6 1 3 Surge output sockets These sockets high low connects the surge output signal to a 1 phase or 3 phase coupling unit or to a CDN CDN 117 118 for data lines These coaxial sockets are also used to connect the generator to the optional magnetic field coil for tests with pulsed magnetic fields The surge output is potential free floating The inner conductor of each con nector is the surge high and surge low connection respectively while the outer conductor screen is connected to the NSG 3060 s ground point 6 1 4 Burst output socket This socket connects the instrument to a 1 phase or 3 phase CDN or to a burst coupling clamp for capacitive coupled burst tests on data lines 6 1 5 Indicator LEDs The five indicator LEDs serve to show the most important test system condi tions LED indicator Function Power on Instrument system in operation Pulse Shows the occurrence of a pulses or a test event High voltage active Shows that high voltage is present in the instrument EUT Power on Indicates when the EUT power supply is present at the EUT connector on the front panel Error Indicates that a system error has occurred The LEDs switch on and off during the boot period and when errors occur 6 1 6 Touch screen and user interface The color 7 touch screen display controls include a wheel and 3 sensitivi
75. iness and trade applications as well as small busi eS Generic standard EN 61000 6 1 Es ZK eben DE na n 5 Electromagnetic compatibility EMC generic stadard Generic standard EN 61000 6 2 for interference immunity Part 6 2 for industrial ap plications Product family Electrical equipment for measurements control and EN 60326 1 standard aboratory use The requirements cannot be fulfilled in some cases The true purpose of an interference generator is to produce interference signals Emission limitations can therefore only be complied with if the equipment is operated inside a Faraday cage Deviations from the requirements are stated and explained in the appendix to the conformity declaration The interference immunity has been tested successfully as per EN 61326 1 TASEO Advanced Test Solutions for EMC 13 TECHNICAL DATA Pen 13 1 Dimensions weight Parameter Dimensions NSG 3060 Weight NSG 3060 Dimensions CDN 3061 C16 Weight CDN 3061 C16 13 2 Options Parameter CAS 3025 MD 200A MD 300 INA 166 INA 167 NSG 3060 EMC test system Value W 449 mm 17 77 H 310 mm 12 9 7 HU D 565 mm 22 2 22 kg 48 5 b approx W 449 mm 17 7 H 221 5 mm 8 7 5 HU D 565 mm 22 2 20 kg 44 Ib approx Value Burst EFT verification set High voltage differential probe C
76. ization Sync signal Output signal Pulse enable next step input EUT fail input Coupling network CDN 3061 Maintenance and function check General Cleaning Function check Calibration Warranty Declaration of conformity CE Technical data Dimensions weight Options NSG 3060 EMC test system 86 87 87 88 88 88 88 88 89 89 91 91 92 93 94 94 95 95 95 96 109 109 110 110 110 111 112 114 114 114 115 115 116 117 118 118 118 13 3 13 4 13 5 14 15 Accessories for IEC EN 61000 4 11 Accessories for IEC EN 61000 4 8 4 9 Accessories for IEC EN 61000 4 4 4 5 System description Addresses 119 119 120 122 123 TASEO Advanced Test Solutions for EMC WARNING Lethal danger from high voltages and the risk of radiating illegal electromagnetic interference This system must be used only for EMC test purposes as specified in these operating instructions The NSG 3060 must be installed and used only by autho rized and trained EMC specialists Personnel fitted with a heart pacemaker may not operate the instrument and must not be in the vicinity of the test setup while it is in operation When the system is used in conjunction with options accessories or other equipment the safety instructions concerning those devices must also be observed NSG 3060 EMC test system 1 EXPLANATION OF SYMBOLS Pen Please take note of the following explanations of the symbols used in order to achieve
77. l 5 Press the SD card to release it Remove the card from the slot To install a new SD card proceed to step 7 6 To download new software from a PC to the SD card insert the card in the SD port of the PC and copy the software to the SD card The file name must remain SUI3000AP EXE Remove the SD card from the PC 7 Insert the SD card in the NSG 3060 Follow steps 1 4 in reverse to replace the generator cover and side panels 8 Restart the NSG 3060 The new software version will boot automatically and may be verified in the equipment detail window see section 7 7 1 TASEO Advanced Test Solutions for EMC 45 46 Removing the NSG 3060 side panels and cover The SD card is placed on the upper right position e ef NSG 3060 SD card slot NSG 3060 EMC test system 47 Removing the SD card 9013000 DER ar File Edit view Favorites Tools Help Address ICH F AutoCopy Program Files SUI3000 Mj Go Folders Name Size Type Date Modified EJ Removable Disk F ih SUI8000AP 15546 KB Application 19 05 2008 13 11 EJ Autocopy a EJ Program Files 5013000 Windows explorer displaying the SUI program filename SUI3000AP EXE on the SD card removable disk F EB NOTE Do not change the SUI program filename TASEO Advanced Test Solutions for EMC 48 7 8 Language Language Selector Language selector window Touch the Language button to open the
78. language selector window The SUI software can be displayed in English German French Japanese or Chinese Note Only English is available at this time The NSG 3060 will automatically reboot if the language is changed OK Touch the OK button to save all settings and return to the system window EXIT Touch the Exit button to return to the system window without saving set tings NSG 3060 EMC test system 8 SETTING TEST PARAMETERS O Em The main menu displays a button for every type of test that can be performed by the NSG 3060 Buttons for tests that are not available on the system as configured are grayed out The user can set parameters for available tests and create new tests in the test parameter window Figure 8 1 shows the test parameter window for burst tests While the input fields differ for each type of test the red side bar and bottom bar remain the same Burst window ANSI coupling E Volt Pos 200 V Burst Time il EUT OFF i Frequency 100 Hz e ms test II TE EE ad a Duration JE Z es Bottom bar es A ere EH Example of the burst test window showing the red bar and bottom bar Red bar 8 1 The red menu bar EXIT Touch the Exit button to return to the system window without saving set tings TASEO Advanced Test Solutions for EMC 49 50 EUT OFF EUT ON Touch the EUT Off EUT On button to switch EUT power off o
79. magnetic field coil such that the current and frequency produce a proportional field within the coil parameters NSG 3060 EMC test system The magnetic field coils available as accessories are connected to the mag netic field option MFO which in turn is connected to the system 3 7 Pulsed magnetic fields option Tests with pulsed magnetic fields or PULSEM tests simulate the type of inter ference produced by surge pulses as a result of lightning strikes to buildings and other metallic structures such as freestanding masts ground conductors grounding networks etc as specified in IEC EN 61000 4 9 Magnetic fields of this type can upset the operation of installations that find themselves within such fields The NSG 3060 erforms this test by causing a heavy current to flow in a magnetic field coil such that the amplitude of the pulse current produce a proportional field within the coil parameters The magnetic field coils available as accessories are connected to the surge pulse output socket via an INA 753 pulse shaping network TASEO Advanced Test Solutions for EMC 16 4 SAFETY INSTRUCTIONS E The NSG 3060 system and its accessories operate at high voltages D Improper or careless operation can be fatal These operating instructions form an essential part of the equipment and must be available to the operator at all times The user must obey all safety instruc tions and warnings Neither Teseq AG Luterbach Switz
80. me date stamped by the system and are stored together with the current test parameters for subsequent use in a test report if required TASEO Advanced Test Solutions for EMC m 10 COUPLING NETWORK CDN 3061 Mm Parameter Instrument Supply Decoupling attenuation Standard conform pulse Mains decoupling Connections EUT supply EUT VAC EUT VDC EUT current EFT burst NSG 3060 EMC test system Value 85 265 VAC Remanent pulse 15 max Mains side crosstalk 15 max 12 50 US up to 6 6 kV 8 20 us up to 3 3 kA 1 5 MH Pulse input s from generator Cable connector for EUT supply input and output Power inlet for CDN 1 phase P N PE 50 to 270 V rms 50 60 Hz Phase Neutral 400 Hz max 0 to 270 VDC 1x 16 A rms continuous over heat protected 1 X 25 A rms for 30 min Standard coupling all lines to HF refe rence ground GND IEC EN 61000 4 4 and ANSI IEEE C62 41 L N PE gt GND Any lines and combination to ref GND L gt GND N gt GND PE gt GND LN gt GND L PE gt GND N PE gt GND Combination wave pulse Combination wave amp ring wave Ring wave ROT Line to line 2 Q 113 L gt N L gt PE N PE EC EN 61000 4 5 Lines to ground 12 0 L gt PE N gt PE L N gt PE ANSI IEEE C62 41 Basic 1 8 2 L N gt PE8L gt N Supplemetal 1 amp 2 N gt PE amp L gt PE Diagnostic 1 amp 2 N PESL amp L PEDN EC EN 61000 4 12 12 300 L gt N LSPE N PE L gt PE N gt PE L N gt PE EC EN 61000
81. o set the step delay unit The step delay depens on pulses and the minimum repetition rates OK Touch the OK button to save all settings and return to the test parameter window EXIT Touch the Exit button to return to the test parameter window without saving settings SHOW STEPS Touch the Show Steps button to view change the order of or delete individual test steps The show step window displays individual test steps in the order that they will be executed E UP DOWN Usethe UP and DOWN arrowsontherightside ofthe Show Stepwindow to change the test step order Touch a line number to select a step A red frame is displayed around the selected step Touch the UP button to move the step up in the list Touch the DOWN button to move the step down in the list m DEL Touch a line number to select a step A red frame is displayed around the selected step Touch the DEL button to delete the step D OK Touch the OK button to save all settings and return to the test parameter window m EXIT Touch the Exit button to return to the Test parameter window without saving settings TASEO Advanced Test Solutions for EMC 51 52 ADD STEP Multi step tests can be programmed manually in the test parameters window using the Add Step button Touch the Add Step button create a new step with the values currently dis played in the Test parameters window The user can program
82. oftware error applies i Any function unit or external instrument Global start trigger can generate this signal or an external E with delay function instrument receives a trigger to scope SC and MC signal sync1 to Sync3 Three freely definable synchronization bus signals Freely definable for later options TASEO Advanced Test Solutions for EMC 33 34 7 THE STANDARD USER INTERFACE SUI EM The NSG 3060 Standard User Interface SUI consists of A 7 color touch panel A wheel for setting parameters A wheel sensitivity keys labeled 1 10 and 100 to denote the units A Start key show symbol to start tests A Stop key show symbol to stop tests A Pause key show symbol to pause tests m V EN HR lt Gb czej NSG 3060 touch screen keys and wheel CAUTION Never use a metal sharp or pointed tool for ER touching the panel Use a soft towel for cleaning Never use aggressive cleaning liquids As soon the unit is powered and switched on the boot procedure starts approx 30 seconds and the Start menu is displayed NSG 3060 EMC test system g TASEO Advanced Test Solutions for EMC ESD simulators compact user friendly and ready for tomorrow s standards Air and contact discharge operation 200V to 30KV Touch screen display amp battery powered Compliant with industry standards IEC ANSI SAE ISO e
83. r on Note the EUT can work only in combination with an automated accessory such as a variac step transformer or automated CDN RAMP VALUE The Ramp value button is active only if a rampable parameter in the test window is selected All rampable parameters are identified by a small gray ramp icon This icon will turn red when a parameter is ramped Voltage Ramping Ramping static Step Delay 1 s Start 200 y Stop Step d a 8 lt lt Ramping window for voltage parameter m Ramping mode Touch the Ramping mode button Static in the example to change the ramping mode from static to linear In linear mode the user can set Start Stop and Step values m Start Touch the Start button 200 V inthe example A red frame is displayed around the field Enter the Start value using either the wheel or the keypad m Stop Touch the Stop button 4800 v in the example A red frame is displayed around the field Enter the Stop value using either the wheel or the keypad m Step Touch the Step button 1 V in the example A red frame is displayed around the field Enter the Step value using either the wheel or the keypad NSG 3060 EMC test system E Step delay Touch the Step delay button 17 in the example A red frame is displayed around the field Enter the Step Delay value using either the wheel or the keypad Touch the Unit button s in the example t
84. rations can be readily constructed from the basic building blocks Single function generators customer specific combinations multifunction generators for comprehensive test routines to product standards generic standards and basic standards as well as combinations with special coupling devices are all easily configurable A master controller in the NSG 3060 system architecture takes care of all the real time control functions and communicates with all the function modules both within the instrument s casing and external devices via an interbus link The system has a simple construction All function units contain a slave control ler All these units are connected together through their slave controllers and networked with the central master controller via a field bus Interbus Informa tion concerning the special features and their adjustable parameters are stored directly in the function modules In addition to this bus system the NSG 3060 system also has a further interface standard Ethernet with which the system NSG 3060 EMC test system can be controlled via single PC a computer network or even via the Internet 11 This modularity enables the function units to be re combined in ever newer instruments and subsystems The function units can be readily expanded to cope with new standards and new function units for new parameters can be incorporated in existing systems To ensure optimal user and equipment safety only ind
85. ssive electromagnetic interference EMI that might affect other equipment The test system itself does not produce any excessive radiation however the injection of interference pulses into the EUT can result in the device and or its associated cables radiating EMI To avoid radiating unwanted interference the standards organzations recommend that the test setup be located in a Faraday cage Since the purpose of the test system is to produce interference signals for interference immunity testing the requirements in the IEC EN 61000 series concerning limiting the radiated EMI can only be complied with by operating the test system inside a Faraday cage 4 5 Test execution unauthorized persons do not have access during the execution of a test If a safety contact Interlock is used as a means of access control to the test zone e g a Faraday cage then an additional contact connected in series is necessary to provide protection for parts of the EUT that are likely to be touched accidentally D WARNING The test area must be organized so that During a test the EUT together with its accessories and cables are to be considered live at all times The test system must be stopped and the EUT supply discon nected before any work can be carried out on the EUT This can be achieved simply by opening the interlock circuit The EUT is to be tested only in a protective cage or under a hood which provides protection against elec
86. tc d Interchangeable and moulded network modules Adjustable discharge detection 150 self test function Loading system parameters please wait SUI boot up screen 7 1 Main menu TASEO Advanced Test Solutions for EMC EM Wel DS z NIE EEK INTERLOCK Main menu The main menu is displayed following boot up The main menu shows the pos sible pulses or tests which are available to the user depending on the NSG 3060 s configuration Faded generator icons Telecom 10 700 us pulse and V D oltage variation mean that the generator is configured to generate those ulses but the proper unit is not connected The empty buttons are reserved for future applications In the red bar there are two buttons System and Reset Interlock Touching the Reset interlock button will close the interlock The interlock must be closed before starting a test TASEO Advanced Test Solutions for EMC 35 36 7 2 System window TO uch the System button to display the System window System window E zaj tod cl Q om mm System window Th e System window displays 6 buttons General Equipment Communication Monitoring SD card properties and language In the red bar there are two bu ttons Factory settings and exit FACTORY SETTINGS Touch the Factory settings button to reset the properties associated with each of the buttons in the system windo
87. ted T 86 10 8460 8080 F 86 10 8460 8078 chinasales Qteseq com Germany Teseq GmbH T 49 30 5659 8835 F 49 30 5659 8834 desales teseq com Singapore Teseq Pte Ltd T 65 6846 2488 F 65 6841 4282 singaporesales Qteseq com Taiwan Teseq Ltd T 886 2 2917 8080 F 886 2 2917 2626 taiwansales Q teseq com USA Teseq Inc T 1 732 417 0501 F 1 732 417 0511 Toll free 1 888 417 0501 usasales Q teseq com To find your local partner within Teseq s global network please go to www teseq com Manufacturer Teseq AG 4542 Luterbach Switzerland T 41 32 681 40 40 F 41 32 681 40 48 sales teseq com France Teseq Sarl T 33 139 47 42 21 F 33 13947 4092 francesales teseq com Japan Teseq K K T 81 3 5725 9460 F 813 5725 9461 japansales teseq com Switzerland Teseq AG T 41 32 681 40 50 F 41 32 681 40 48 sales teseq com UK Teseq Ltd T 44 845 074 0660 F 44 845 074 0656 uksales teseq com September 2013 Teseq Specifi cations subject to change without notice Teseq is an ISO registered company Its products are design ed and manufactured under the strict quality and environmental requirements of the ISO 9001 This document has been carefully checked However Teseq does not assume any liability for errors or inaccuracies
88. teps open circuit 100 V to 2 4 kV 50 Q matching system Voltage step 1V 10V 100V Polarity Positive negative alternate Frequency Hz 100 99 999 ki Ia TOO Phase Asynchronous synchronous 0 to 359 in 1 steps Coupling ANSI IEC external manual Burst time USE an ms 1 99 999 S 1 1999 Spike 1 1000 TASEO Advanced Test Solutions for EMC 65 66 Repetition time ms 1 99 999 1 4200 70 min Test duration S 1 99 999 min 1 99 999 mr os HOO Continuous 8 3 12 Derating Some parameter combinations will not be accepted due to the power limitation of the HV power supply The following error message will be displayed when an invalid combination of parameters is entered Communication Error accept parameter NACK 13 UNSUCCESSFUL COMMAND Invalid parameter error message The following graphs show the relationship between voltage trep tburst and frequency and show the range of possible parameter combinations that can be used in testing Each graph includes two voltage settings which are shown in different line thick nesses in relation to the trep values given for 20 10 5 2 1 0 5 0 2 and 0 1 ms The appropriate trep value bold trep for the bold line are labeled on the border of the graph Combinations of values that are below the line are allowed NSG 3060 EMC test system O O Wn n o N Lb ol CH o Z Z HE 2 H 7 HI 4 f
89. the NSG 3060 main frame before the acces sories may result in non detection of accessories 8 9 Power magnetic field testing 4 8 automatic procedure Parameter Value AC field 1 to 40 A m in 1 A m steps Frequency 50 Hz 60 Hz Coil factor 0 01 to 99 99 Test duration 1 to 9 999 pulses continuous 8 10 Pulsed magnetic field testing 4 9 Tests with pulsed magnetic fields simulate the type of field produced by surge pulses such as those occurring during lightning strokes on buildings and other metallic structures such as free standing masts lightning conductors earth networks etc The NSG 3060 in conjunction with the pulse wave shape adaptor and a loop antenna it generates these fields in accordance with the IEC 61000 4 9 standard by inducing a surge current into magnetic field loop a few meters from the loop antenna while magnetic fields are generated Also keep away magnetic field sen sitive devices and items such as credit cards magnetic key cards etc which might be influenced by the field m It is recommended for the user to stay away at least TASEO Advanced Test Solutions for EMC 91 92 8 10 1 The optional magnetic field loops INA 701 and INA 702 Tests with mains frequency according IEC EN 61000 4 8 in conjunction with the MFO 6501 6502 option and pulsed magnetic fields are performed using the magnetic field loops designed for NSG 3060 These are rectangular loops measuring 1 x 1m and are suit
90. the red wheel or using the keypad 8 6 2 Impedance Touch the impedance button 15 ohms in the example it will repetitively change between 15 and 40 0 8 6 3 Phase Since telecom pulse always is injected asynchronous into telecommunication it may stay always to Asynch But it is possible that in some rear cases a synchronisation to the power is needed for investigation purpose so the phase angle can be set Touch the Synch Asynch button Asynch in the example to activate the syn chronization of test pulses to the EUT mains frequency NSG 3060 EMC test system When this button is set to Asynch the phase value button in the example will display When this button is set to Synch the user must also set the phase value To set the phase value touch the phase value button A red frame is displayed around the field The phase value may be entered using the wheel or the keypad The value is in degree units and may range from 0 to 359 Synch mode is only available if the EUT power is switched on 8 6 4 Coupling Touch the coupling mode button SURGE OUTPUT or MANUAL CDN Surge output Select SURGE OUTPUT when a pulse is to be applied directly to the EUT for example in component testing of non powered EUTS Manual CDN This setting will compensate the loss of an external MANUAL CDN such as the CDN 3083 or CDN 117 118 The internal impedance will be reduced by 0 37 Q 8 6 5 Repetition time Tou
91. the test system The EUT obtains its power from the EUT power outlet on the CDN of the test system where the voltage has the interfer ence signal superimposed on it 8 5 2 Test configuration with external coupling Hereby the interference pulses are brought out to the Hi and Lo output sockets on the front panel to which an external coupler can be connected 8 5 3 Ring wave parameters T Rise time T Oscillation period The open circuit voltage waveform is defined by the following parameters M Rise time 0 5 Us E Ringing frequency 100 kHz Note No short circuit current waveform is specified for the 100 kHz ring wave Because the purpose of the ring wave is not to provide high energy stress to the EUT the precise specification of the current waveform is unnecessary NSG 3060 EMC test system Ring Wave Window Repetition Time Test Phase async Duration Ri ng wave parameter window 8 5 4 Voltage Touching the Volt field it will come up with a red frame to indicate the selected parameter being ready for change The value can be changed either with the red wheel or using the keypad Touching the prefix repetitively it will change from Alternate to Positive and Negative On odd pulse number there will be one pulse less in negative then in positive Positive pulse will be first executed 8 5 5 Impedance Touching the Impedance field it will repetitively change between 12 30 and 200
92. tion time 10 s to 10 min in 1 s steps Impedance 20 Coil factor 0 35 to 99 99 in 0 01 step Test duration 1 to 9 999 pulses Continuous Phase synchronization Asynchronous synchronous 0 to 359 in 1 steps NSG 3060 EMC test system 8 11 Power magnetic field test 4 8 automatic procedure 95 Mains frequency magnetic fields simulate the kind of stray fields that occur around current carrying power supply lines The optional MFO can be connected to the NSG 3060 using the convenient user interface for easy test setting The automated MFO together with the INA 701 or 702 loop antenna generates test conditions in accordance with the IEC 61000 4 8 standard by inducing a strong current into a magnetic field loop 8 11 1 Automatic magnetic field option MFO 6502 The automatic current generator type MFO 6502 magnetic field option is a standard accessory for the Teseq NSG 30xx series It is required for magnetic field testing for fields up to 40 A m MFO 6502 is designed to drive INDUCTIVE LOADS ONLY m as magnetic field loops Connecting capacitive loads will destroy the Instrument For more information refer to the MFO manual 8 11 2 Technical data power magnetic field test Parameter Value Field strength 1 to 99999 mA m in 1 mA m steps 1 to 100 A m in 1 A m steps Frequency 50 Hz 60 Hz Coil factor 0 01 to 99 99 in 0 01 steps Test duration 1 to 9 999 S 1 to 166 min Continuous TASEO Advanced Test Sol
93. to enter a file name in the black bar above the keyboard The Delete key will delete all text entered The backspace button lt will delete the last letter entered Touch the Enter button to save the file under the name entered All letters and numbers as well as hyphens spaces and dots can be used in file names The maximum file name is 40 characters including spaces The system automatically generates a file extension to identify the type of test For example all burst tests will are given the extension EFT Touch the Cancel button to return to the test parameter window without saving the file NSG 3060 EMC test system i LONGTERM TEST LEVEL2 COUPLING ON L1 PE BESSE dal Keyboard with filename entered KEYPAD Touch the Keypad button to display a numeric keypad The Keypad button is active only when the user has selected a parameter that requires a numeric entry Touch individual numbers to enter them touch C to clear an entry and touch Enter to enter the value in the field After touching Enter the keypad will close TASEO Advanced Test Solutions for EMC 60 Keypad SHOW GRAPHICS Touch the Show Graphics button to display waveforms coupling diagrams and other graphical information for the selected test Touch the More button to view additional information Touch the Back button to view previous graphics
94. tput 60s 10 pulse 2 4 1000 V 2 Asynch Surge Output 60s 10 pulse 34 2000V 2 Asynch Surge Output 60s 10 pulse 44 4000V FI z Asynch Surge Output 60s 10 pulse IEC UNSH SYMM COMM LINES LEVEL 1 11 500 V 2 Asynch Surge Output 60s 10 pulse IEC UNSH SYMM COMM LINES LEVEL 2 1 2 500 V 2 Asynch Surge Output 60s 10 pulse 2 2 1000 V 2 Asynch Surge Output 60s 10 pulse IEC UNSH SYMM COMM LINES LEVEL 3 113 500 V 2 Asynch Surge Output 60s 10 pulse ER 1000 V 2 Asynch Surge Output 609 10 pulse 38 2000V 2 Asynch Surge Output 60s 10 pulse IEC UNSH SYMM COMM LINES LEVEL 4 1 4 500 V 2 Asynch Surge Output 60 s 10 pulse 2 4 1000 V 2 Asynch Surge Output 60s 10 pulse 34 20007 2 Asynch Surge Output 60s 10 pulse 44 4000V z 2 Asynch Surge Output 60s 10 pulse Basic Standard IEC 61000 4 5 2005_Ed_2 File name implemented Test step Voltage Polarity Impedance Phase Coupling Rep time Test duration SYMM OPERATED ALL LINES TO PE LEVEL 1 11 500V 15 Asynch Surge Output 60s 10 pulse SYMM OPERATED ALL LINES TO PE LEVEL 2 1 2 500V 15 Asynch Surge Output 60s 10 pulse 2 2 1000 V 15 Asynch Surge Output 60s 10 pulse SYMV OPERATED ALL LINES TO PE LEVEL 3 13 500V Fi 15 Asynch Surge Output 60s 10 pulse 23 7000 V 15 Asynch Surge Output 60s 10 pulse 38 2000V 15 Asynch Surge Output 60s 10 pulse SYMM OPERATED ALL LINES TO PE LEVEL 4 14 500V Fi 15 Asynch Surge Output 60s 10 pulse 274 1000V E 1
95. tric TASEO Advanced Test Solutions for EMC 20 shock and all manner of other dangers pertaining to the particular EUT see User warnings Generator The user must observe safety instruction for all the instruments and associated equipment involved in the test setup Test setup configuration is to be strictly in compliance with the methods described in the relevant standard to ensure that the test is executed in a compliant manner 4 6 User warnings Generator dangers that can occur during testing D WARNING Users must be aware of the following Local burning arcing ignition of explosive gases EUT supply current surge caused by a flashover or breakdown resulting from the superimposed high voltage Disturbance of other unrelated electronics tele communications navigational systems and heart pacemakers through unnoticed radiation of high frequency energy In the test system the interference voltage corresponding to the level called for in the relevant test specification is superimposed also on the EUT s protective earth conductor Earth contacts or pins e g as in German and French mains plugs as well as the EUT earth itself can therefore be at an elevated voltage level that would make touching dangerous In many power connectors even the screws are linked to the protective earth NSG 3060 EMC test system 4 7 Dangers concerning the EUT WARNING Users must be aware of the following dangers that can
96. tton ANSI COUPLING in the example to select SURGE OUTPUT MANUAL CDN ANSI COUPLING or IEC COUPLING Surge output Select SURGE OUTPUT when a pulse is to be applied directly to the EUT for example in component testing of non powered EUTS Manual CDN This setting will compensate the loss of an external manual CDN such as the CDN 3083 or CDN 117 The internal impedance will be reduced by 0 37 0 ANSI coupling When ANSI COUPLING is selected the window The appropriate coupling net work 1 or 3 phase is displayed automatically depending on the type of CDN connected to the NSG 3060 TASEO Advanced Test Solutions for EMC 73 74 ANSI coupling selection window EUT supply Touch the EUT supply button 1 phase in the example to select a 1 2 or 3 phase EUT supply mode supply input on the rear panel of the CDN and the con nections to the EUT from the front panel of the CDN Otherwise the coupling path setting will be switched incorrectly D NOTE The EUT supply selection must match the EUT Coupling Touch the coupling button suppl in the example to select basic supplemen tal or diagnostic coupling mode These modes are identical to those defined in the ANSI standard Different coupling options are displayed depending on the EUT supply mode selected NSG 3060 EMC test system Basic 1 Low High J L e N e
97. ty keys used to 1 10 or 100 steps per wheel click The Start Stop and Pause keys are used to control the procedure All user interface function menus and sub menus are described in chapter 7 standard user interface TASEO Advanced Test Solutions for EMC 27 28 6 2 Rear panel System configured with NSG 3060 top with CDN 3061 bottom Mains power on off switch and fuse holder E Mains power connection E Spare interface slot Master controller with Ethernet connector Ground connection point System interface input Mains power connection on off switch and fuse holder zaj Ground connection point m E EUT power input NSG 3060 rear panel 6 2 1 Mains power input The mains input is the connection point for power to the NSG 3060 NOTE Do not confuse the Mains power input with the EUT power input This input contains the mains power input connector and the mains fuses WARNING Before operating the NSG 3060 make sure M that the voltage shown on the mains input module cor responds with the voltage of the local supply to which the instrument will be connected and that the fuses are correctly rated 2 x 3 15 AT NSG 3060 EMC test system System interface connector System interface output 6 2 2 AC EUT mains input 29 The EUT mains input is the connection point for the power source which sup plies power to the EUT The 4 pin connector is a special 16 A type A matin
98. uency values are Hz and KHZ 8 3 6 Phase Touch the Synch Asynch button Asynch in the example to activate the syn chronization of test pulses to the EUT mains frequency When this button is set to Asynch the phase value button in the example will display When this button is set to Synch the user must also set the phase value To set the phase value touch the phase value button A red frame is displayed around the field The phase value may be entered using the wheel or the keypad The value is in degree units and may range from 0 to 359 8 3 7 Coupling Touch the Coupling mode button IEC COUPLING in the example to select BURST OUTPUT MANUAL CDN ANSI COUPLING or IEC COUPLING TASEO Advanced Test Solutions for EMC 63 64 Burst output Burst output must be selected if an external capacitive coupling clamp e g CDN 8014 8015 is connected to the NSG 3060 Manual CDN The factory setting for manual CDN is the same as for burst output ANSI and IEC coupling In burst testing it does not matter if ANSI or IEC coupling mode is selected since the ANSI standard refers to IEC EN 61000 4 4 Touch the coupling line selection field L1 N PE in the example to display the coupling selection window Touch the individual high output coupling line buttons L N and PE in the example to select an open or closed relay The Low output field Ref ground in the example is always fixed Tou
99. up to 900 V can 6 2 3 DC EUT input For DC voltages L positive N negative In DC applications the positive and negative lines are to be connected to La and N respectively The polarity at this EUT power input connector must be the same as at the EUT output connector The connector s ground contact must be connected to a good solid ground point NSG 3060 EMC test system Capacitors in the coupler can cause ground leakage currents of up to 4 A the EUT power supply network The test system must therefore be properly grounded and powered from a supply that is not protected by a residual current detector RCD The power source to this connector provides the power for the EUT Burst and surge interference signals are coupled into this supply line internally Power is also delivered via this route for PQT mains quality testing purposes 6 2 4 Ground connection point Like the reference ground connector on the front panel this ground terminal provides a solid connection point to the NSG 3060 s chassis ground 6 2 5 System interface connector 25 pin D sub Pin Sync line Signal Remark Working direction Mains voltage passes 7 synco Mains hrough the zero crossing TO a coupling synchronization point with rising signal level network Puts the NSG 3060 into an From each controller 5 sync1 Interlock idle state The Error LED g Ech ights in this state o interlo
100. upling clamp for data line coupling per IEC 61000 4 TASEO Advanced Test Solutions for EMC 2 14 SYSTEM DESCRIPTION EM Description Housing Mains on off Indicator LED s on front panel Safety functions Ambient conditions Self test Relevant safety standards Relevant EMC standards Test system for EMC tests with mains borne inter ference in accordance with the EN 61000 6 1 and 2 standards for burst surge and mains quality tests Operation via touch screen or software wise via a PC ink Ethernet TCP IP interface Pulse output to external coupling networks Housing for bench top or rack use Bench top housing made of metal with moulded plastic front panel Supplementary rack mounting kit On off switch on rear panel of the instrument Power on LED yellow Pulse LED green High voltage active LED red EUT Power on LED green Error LED red Main fuses interlock EUT fail input 5 to 40 C 20 to 80 relative humidity non con densing 68 106 kPa atmospheric pressure Routines for functional self test IEC 61010 1 safety requirements for electrical equipment used for measurement and control purposes as well as laboratory use IEC EN 61000 6 1 and 2 generic standards for electro magnetic interference immunity NSG 3060 EMC test system Headquarters Teseq AG 4542 Luterbach Switzerland T 41 32 681 40 40 F 41 32 681 40 48 sales teseq com www teseq com China Teseq Company Limi
101. ure the safe flow of leakage currents WARNING Operation without a ground connection is EM forbidden Two independent ground connections are necessary one for the test system and one for the EUT These must be connected back to the local permanent installation or to a fixed permanent ground conductor Operate the equipment only in dry surroundings Any condensation that occurs must be allowed to evaporate before putting the equipment into operation Do not exceed the permissible ambient temperature or humidity levels Use only officially approved connectors and accessory items Ensure that a reliable return path for the interference current is provided between the EUT and the generator The ground reference plane and the ground connections to the instruments as described in the relevant test standards serve this purpose well TASEO Advanced Test Solutions for EMC The test system may only be opened by a qualified specialist upon specific instruction given by the manufacturer Since the instrument works on prin ciple with two independent power supplies one for the generator and one for the EUT the NSG 3060 must be disconnected from both sources before any modifications to the test setup are undertaken Besides the mains connections themselves certain components also operate at high voltages and are not provided with any form of extra protection against accidental contact 4 3 Installation of an EUT power switch Th
102. urrent probe Rack mounting 5 HU Rack mounting 7 HU 13 3 Accessories for IEC EN 61000 4 11 119 Parameter INA 6501 INA 6502 VAR 3005 S16 VAR 3005 D16 Value Manual step transformer 16 Arms 0 40 70 80 Automatic step transformer 16 Arms 0 40 70 80 Automatic single variable transformer 16 Arms Automatic double variable transformer 16 Arms 13 4 Accessories for IEC EN 61000 4 8 4 9 Parameter MFO 6501 MFO 6502 NA 701 NA 702 NA 703 NA 3251 NA 752 Value Magnetic field option manual for 4 8 Magnetic field option automatic for 4 8 Magnetic field loop 1x 1m for AC with MFO max 4 A m 4 8 for surge max 1200 A m 4 9 Magnetic field loop 1x 1m for AC with MFO max 40 A m 4 8 for surge max 1200 A m 4 9 Magnetic field coil 1 x 1 m max 330 A m 4 8 Cable to interconnect INA 703 with MFO 6501 OR 6502 Pulse shape adapter for 4 9 INA 752 needed to surge generator TASEO Advanced Test Solutions for EMC 120 Parameter CDN 3061 C16 PQM CDN 3061 C16 CDN 3063 S16 CDN 3063 B32 CDN 3063 C32 CDN 3063 S32 CDN 3063 S63 CDN 3063 S100 CDN 3083 B100 CDN 3083 B200 CDN 3083 S100 CDN 3083 S200M NSG 3060 EMC test system 13 5 Accessories for IEC EN 61000 4 4 4 5 Value Automated 1 phase coupler for EFT Burst 4 8 kV Surge 6 6 kV and Dips Interrupts and Variations with EUT supply up to 270 V 16 A Automate
103. ustry standard and cor rectly specified plugs and sockets are used throughout High voltage outputs are switch protected TASEO Advanced Test Solutions for EMC 12 3 STANDARDS AND APPLICATIONS E The NSG 3060 test system is designed primarily for cable borne transient inter ference tests as specified in the European generic standards IEC EN 61000 6 1 covering equipment for household office and light industrial use and IEC EN 61000 6 2 for applications in industrial environments The NSG 3040 generates these tests in accordance with IEC EN 61000 4 2 4 5 11 12 and 29 Acces sories are available for generating optional tests to IEC EN 61000 4 8 and 9 and to ANSI IEEE C 62 41 The EU directive No 89 336 EEC for the assignment of the CE symbol refers to these standards and to this type of equipment 3 1 ESD test ESD tests in accordance with IEC EN 61000 4 2 must be performed with a separate ESD simulator such as the Teseq NSG 435 NSG 437 or NSG 438 The standard calls for both air and contact discharges and the simulator is sup plied with special tips for each type of test In the case of air discharges the simulator is discharged by holding the tip close to the Equipment Under Test EUT Then while depressing the trigger moving it closer to the target area until a discharge occurs Contact discharges occur with the tip of the simulator in direct contact with EUT 3 2 Burst test Burst tests in compliance
104. ut 60s 10 pulse 2 2 1000 V a 12 Asynch Output 60s 10 pulse IEC UNSH UNSY MM O LINES LEVEL 3 1 3 500 V 12 Asynch Output 60s 10 pulse 2 3 1000 V 12 Asynch Output 60 s 10 pulse 3 3 2000 V 12 Asynch Output 60 s 10 pulse IEC UNSH UNSY MM O LINES LEVEL 4 1 4 500 V 12 Asynch Output 60s 10 pulse 2 4 1000 V 12 Asynch Output 60 s 10 pulse 3 4 2000 V 12 Asynch Output 60s 10 pulse 414 4000 V 12 Asynch Output 60 s 10 pulse IEC UNSH SYMM COMM LINES LEVEL 1 11 500 V 12 Asynch Output 60s 10 pulse IEC UNSH SYMM COMM LINES LEVEL 2 1 2 500 V 12 Asynch Output 60s 10 pulse 2 2 1000 V PY 12 Asynch Output 60 s 10 pulse IEC UNSH SYMM COMM LINES LEVEL 3 1 3 500 V 12 Asynch Output 60s 10 pulse 2 3 1000 V 12 Asynch Output 60 s 10 pulse 3 3 2000 V 12 Asynch Output 60 s 10 pulse IEC UNSH SYMM COMM LINES LEVEL 4 1 4 500 V 12 Asynch Output 60s 10 pulse 2 4 1000 V Fa 12 Asynch Output 60 s 10 pulse 3 4 2000 V 12 Asynch Output 60 s 10 pulse 4 4 4000 V 12 Asynch Output 60 s 10 pulse Test File name implemented Test step i Frequency oa Ces Factor IEC 50HZ CF 9 8 LEVEL 1 1 Alm 50Hz Hz SEIN Tame sone SE 3Am sowz os os ECBOFZ CFOS LEVEL 2 samf eom 60s e SEI EE A IEC 60HZ CF 9 8 LEVEL 3 10 A m 60 Hz 60s IEC 50HZ CF 9 8 LEVEL 4 30 A m 50 Hz 60s Seas 30 Alm _60 Hz NSG 3060 EMC test system Basic Standard IEC 61000 4 9 2001_Ed_1 1 105 File name implemented M to A m Ratio GEES IEC LEVEL 4
105. utions for EMC 96 8 12 Standard test parameter Basic Standard IEC 61000 4 4 2004 Ei 2 File name implemented Test step Voltage Polarity Frequency Phase Coupling Burst time Rep time Test duration ANSHEC 1PH POWER LINES LEVEL 1 1 2 500V 5 kHz Asynch L N PE 15 ms 300ms 120s 2 2 500V 100kHz _ Asynch L N PE 750us 300ms 120s ANSFIEC 1PH POWER LINES LEVEL 2 1 2 1000V x 5 kHz Asynch L N PE 15 ms 300ms 120s 2 2 1000V 100k z Asynch L N PE 750us 300ms 120s ANSFIEC 1PH POWER LINES LEVEL 3 1 2 2000 V x 5 KHz Asynch L N PE 15 ms 300ms 120s 22 2000V x 100k z Asynch L N PE 750us 300ms 120s ANSFIEC 1PH POWERLINES LEVEL 4 1 2 40007 5 kHz Asynch L N PE 15 ms 300ms 120s 22 40007 700 KHz Asynch L N PE 750us 300ms 120s ANSFIEC 3PH POWERLINES LEVEL 1 1 2 500V 5 kHz Asynch L1 L2 L3 N PE 15 ms 300ms 120s 2 2 500V 100kHz _ Asynch L1 L2 L3 N PE 750us 300ms 120s ANSFIEC 3PH POWER LINES LEVEL 2 1 2 1000V x 5 kHz Asynch L1 L2 L3 N PE 15 ms 300ms 120s 2 2 1000V x 100kHz _ Asynch L1 L2 L3 N PE 750us 300ms 120s ANSFIEC 3PH POWER LINES LEVEL 3 1 2 2000V x 5 kHz Asynch L1 L2 L3 N PE 15 ms 300ms 120s NSG 3060 EMC test system 2 2 2000 V 100 kHz Asynch L1
106. w to the original factory settings EXIT TO uch the Exit button to return to the main menu REMOTE To pa uch Remote button to enter remote controlled screen No inputs via touch nel are possible The NSG can now be controlld via WIN 3000 remote control software Touch Exit on screen and in WIN 3000 to use NSG manually 7 3 General settings TO General settings Beeper volume Expert mode Off uch the General button to display one of the following windows General settings window with no optional hardware CDN variac etc connected NSG 3060 EMC test system General settings 37 Beeper volume On Interlock action a On Expert mode Off FACTORY SETTINGS xl OK General settings window with optional EUT switch connected General settings Beeper volume On vonage 230 Interlock action EUT OFF Expert mode le feile FACTORY SETTINGS E General settings window with optional automated variac connected Beeper volume During the surge test there is a beep sound to alert the user Touch the beeper volume button On in the example to switch the sound on and off The red vertical bar on the right side of the General settings window displays 4 buttons Exit EUT OFF ON Factory Settings and OK EXIT Touch the Exit button to return to the system window without saving set tings TASEO Advanced Test Solutions for EM
107. wer supply also to be switched off while the interlock function only blocks the generation of pulses or any other ongoing test resp The interlock is a safety function to ensures the following E The interlock forms a bus to which all instruments in a system are connected E The interlock feature can be connected to external safety devices door contacts test enclosure hoods etc m If any part of the interlock circuit is interrupted all the generator modules are inhibited from producing or switching high voltages Additionally the power supply to the EUT can be switched off too E Activation of this safety feature is reported to the master controller E The master controller is also notified when the interlock facility is reset E Once the interruption is over and the re instatement of the interlock has been acknowledged then power to the EUT is restored TASEO Advanced Test Solutions for EMC 110 Activation of the interlock function is achieved without the help of micropro cessors and software This ensures that the safety feature is not affected or hindered in the event of a program crash 9 2 Trigger to scope output signal Between Pin 18 hi and Pin 2 8 15 20 low Inactive state at 24 V in the active state lt 2 4 V Note The trigger signal has generally a duration of approx 50 us e g for surge testing In case of bursts its width shall change according to the length of the event During PQT testing
108. will be taken With cancel it will close the window without saving the coupling selection With touching the button Show Graphics it will show a graphical setting TASEO Advanced Test Solutions for EMC 82 8 5 8 Repetition time Touching the Repetition Time field it will come up with a red frame to indicate the selected parameter being ready for change The value can be changed w i EM m maj Si EM either with the red wheel or using the keypad Touching the units repetitively will change from s to min 8 5 9 Test duration Touching the Test Duration field it will come up with a red frame to indicate ected parameter being ready for change The value can be changed the se either with the red wheel or using the keypad Touching the units repetitively it will change from Pulse to Continuous 8 5 10 Technical data ring wave generator Parameter Pulse voltage open circuit Pulse current short circuit Impedance Polarity Phase synchronization Coupling Pulse repetition Test duration Repetition rate depends on voltage 10 s repetition time 20 s repetition time 200 to 4400V 4401 to 6600V NSG 3060 EMC test system Value 200 V to 6 6 kV in 1 V steps 16 6 10 550 A 10 12 0 6 6 10 220 A 10 30 0 120 300 2000 Positive negative alternate Asynchronous synchronous 0 to 359 in 1 steps ANSI IEC external manual 10 600 s in 1

601-273E - NSG 3060 User Manual english.indd

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