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MIZ-22 Eddy Current Tester

1. Multi Purpose Plate Standard with 5 Piece Cer 950 5701 tified Conductivity Coupon Option Material Aluminum o x 009 006 003 Paint Thickness Simulation N A 950 5800 Standard Material Vellum Connections Connect the probe to the instrument REFLECTION connector Page 5 53 MIZ 22 Operating Guide Complete the following steps in sequence to setup calibrate and perform an alloy sorting test Setup step1 Set the instrument variables according to your conductivity standards and shim Figure 5 24 is shown as an example of a possible setup More information about changing the SET values is on page 4 47 Figure 5 24 Default IACS Display Lock character 00 IACS D FREQ 60K PROBE REFL SET1 100 6 SET2 29 60 CONDUCTIVITY IN IACS SET3 8 400 SET4 3 300 SET5 0 900 SHIM 7 2 SET VALUES LIFTOFF IN MILS NEW CAL S P These values will vary depending on your conductivity standards and shim Page 5 54 5 0 Application Examples Conductivity Measurement Example Step 2 step 3 step 4 Highlight the NEW CAL line as shown in figure 5 25 Use the LEFT or RIGHT arrow button to toggle through the set values until SET is shown on the display as shown in figure 5 25 Place the probe on the corresponding conductivity standard and visually verify the value on the instrument and the standard is the same
2. Description Part No Catalog No E F G A B P Q 5 32 CSK en py H J C D Q 3 16 CSK 100 B K L M p K Aircraft Skin Standard Material Aluminum N A 950 5600 Connections Connect the probe to the instrument REFLECTION connector Complete the following steps in sequence to setup and perform a corrosion test Setup step 1 step 2 step 3 Set the instrument variables as illustrated in figure 5 2 Place the probe on a defect free area of the standard Press the balance button on the instrument Page 5 9 MIZ 22 Operating Guide step4 Scan the probe across flaws K L and M consecutively Figure 5 2 Corrosion Indication 02 CORROS 1 F1 2 OFF XY POS1 POS2 FREQ 20K PHASE 240 GAIN 34 5 V H 15 15 FILTER OFF ALARM OFF PROBE REFL SCREEN A PRINT i 0 012 0 008 0 004 Page 5 10 5 0 Application Examples Alloy Sorting Example 5 4 Alloy Sorting Example The ability of eddy current to detect changes in conductivity makes it ideal for sorting materials Using the same principles eddy current can also be used to detect heat damaged material The requirements for this sorting test are listed in table 5 3 Table 5 3 Requirements for Alloy Sorting Example Description Part No Catalog No 10 4802 P
3. Figure 5 25 Calibration Display FREQ 60K PROBE REFL SET1 100 6 SET2 29 60 SET3 8 400 SET4 3 300 SET5 0 900 SHIM 7 2 SET VALUES SET WITH PROBE AS IND 00 IACS S 4 Page 5 55 MIZ 22 Operating Guide step5 With the probe remaining on the standard press the UP or DOWN arrow button to set the calibration point An audible beep verifies the calibration is set step6 Press the LEFT or RIGHT arrow button until the SHIM value is highlighted as shown in figure 5 26 Figure 5 26 Shim Value Display 00 IACS D FREQ 60K PROBE REFL SET1 100 6 SET2 29 60 SET3 8 400 SET4 3 300 SET5 0 900 SHIM 7 2 i SET VALUES SET WITH PROBE AS IND S p Page 5 56 5 0 Application Examples Conductivity Measurement Example step 7 step 8 step 9 step 10 Place the probe and the selected shim on the conductivity standard Visually verify the IACS value with the selected shim are the same for the instru ment and the standard With the probe remaining on the standard press the UP or DOWN arrow button to set the calibration point An audible beep verifies the calibration is set Repeat steps 3 through 8 for SET2 through SETS Use the LEFT or RIGHT arrow button to toggle until the AJR value is displayed as shown in figure 5 27 Page 5 57 MIZ 22 Operating Guide Figure 5 27 Air Value 00
4. step4 Insert the probe in hole A step5 Rotate the probe 360 Figure 5 5 Countersink Flaw Indication r a o O5 CNTRSNK N 1 F1 2 OFF POS2 100K 145 16 5 15 15 OFF OFF PROBE DIFF SCREEN A A PRINT I gt 1 The VH scale is adjustable to KS enhance the signal to lift off separa tion Page 5 19 MIZ 22 Operating Guide 5 7 Triggered Sweep with Filter Example Filters can be used to suppress unwanted signals such as low frequency rotational noise due to angle of probe or incorrect size This example uses both filters with two types of test coils differential and absolute The requirements for this example are listed in table 5 7 Table 5 6 Requirements for Triggered Sweep with Filter Description Part No Catalog No ABSOLUTE COIL i T a os ki can DIFFERENTIAL COIL t QUICK DISCONNECT I MICROTECH 4 PIN CONN Rotating Probe Gun N A 2000 02 05 Rotating Bolthole Probe MBH S amp 921 8400 Absolute coil Frequency Range 50 400 kHz Rotating Bolthole Probe A MBH SC 2 amp 921 8420 Differential coil Frequency Range 50 400 kHz Page 5 20 5 0 Application Examples Triggered Sweep with Filter Example Table 5 6 Requirements for Triggered Sweep with Filter Cont Description Part No Catalog No Multi Purpose Plate
5. A Page 3 2 3 0 Installation Power Requirements 3 2 1 3 2 2 Power Connector The power connector connects with a standard instrumentation line cord to provide AC voltage for battery charging and instru ment operation The third wire of the line cord should be properly connected to earth ground The power source may be 115 or 230 VAC 50 or 60 Hz Plug the power cord onto the front panel using the receptacle marked POWER and then connect to an appropriate power source Storage Battery The storage battery contains a nominal 10 VDC battery pack comprised of 9 four ampere hour size D cells in series The battery life is good for at least 1000 recharge cycles when used according to manufacturer s specifications It is always a good idea to have a spare battery pack on charge during a work session Spare battery packs are available from Zetec Page 3 3 MIZ 22 Operating Guide 3 3 Turning On Unit and Backlight Use the following steps for turning on the MIZ 22 and its backlight step 1 step 2 step 3 Before plugging the instrument into the AC line assure that the voltage select switch located on the inner lid of the battery pack is placed in the proper setting refer to figure 3 1 To turn the MIZ 22 on hold the ON OFF switch in for approximately 1 second then release The power turns on when the switch is released At this time the instrument goes through a brief s
6. Complete the following steps in sequential order to perform this mix Setup step1 Set the instrument variables to those shown in figures 5 13 and 5 14 Figure 5 13 Set FREQ1 P 99 DEFAULT 1 F1 2 0F XY POS1 POS2 FREQ1 400K PHASE 186 GAIN 18 0 V H 10 10 FILTER OFF ALARM OFF PROBE DIFF SCREEN A Co J Page 5 36 5 0 Application Examples Signal Mixing Example Figure 5 14 Set FREQ2 Wa 99 DEFAULT gt i 2 0FF Post POS2 FREQ2 100K PHASE 186 GAIN 18 0 V H 10 10 FILTER OFF ALARM OFF PROBE DIFF SCREEN A PRINT H P step2 After setting up F1 and F2 notice that both frequencies are displayed as shown in figure 5 14 Figure 5 15 Two Frequency Mix Setup P 99 DEFAULT rh 1 ue 2 N n POS2 PHASE 299 GAIN 27 5 V H 08 08 FILTER OFF ALARM OFF PROBE DIFF SCREEN A PRINT Y Page 5 37 MIZ 22 Operating Guide step 3 step 4 Adjust the phase as necessary for both F1 and F2 until the displayed lift off signal is horizontal Generate the signal of interest for mixing in this case a lift off signal see figure 5 16 by placing the probe on a defect free area of the standard Figure 5 16 Lift Off Signal 99 DEFAULT gt 1 F1 2 F2 P XY XY POSI POS2 FREQ1 400K PHASE 186 GAIN 18 0 V H 10 10 FILTER OFF DRAW BUFFR DATA 1986 VIEW 0282
7. DIFFERENTIAL connector Page 5 46 5 0 Application Examples Signal Mixing Example Complete the following steps in sequence to setup and perform a mix that sup presses the signal from a tube support Setup step1 Set the instrument variables according to table 5 91 Table 5 11 Instrument Settings for Tube Support Suppression Mix F1 F2 MIX FREQUENCY 400 kHz 100 kHz 400 amp 100 PHASE 210 160 037 GAIN 36 0 24 0 20 0 V H 08 08 10 10 07 07 step2 Place the tube support ring over a defect free area of tubing Also place the probe in a defect free area step3 Press BAL step4 Pull the probe past the support ring at a rate not to exceed ft sec Within six seconds press HOLD 1 These settings are for reference Different settings can be used to achieve a similar result Page 5 47 MIZ 22 Operating Guide step5 Complete steps 8 through 20 in section 5 9 1 to perform the mix The signals in figures and 5 22 and 5 23 show the results of the mix Figure 5 22 Tube Support Suppression Mix 09 TUBING h 1 xS 2 F1 ae POS2 400K amp 100K PHASE 037 GAIN 20 0 V H 07 07 FILTER OFF DRAW BUFFR DATA 0256 VIEW 0165 MIX MENU SCREEN A PRINT HP STBF nce Signal after mix Signal before mix Page 5 48 5 0 Application Examples Signal Mixing Example Figure 5 23 100 Thru Wall Signal at
8. IACS FREQ 60K PROBE REFL SET1 100 6 SET2 29 60 SET3 8 400 SET4 3 300 SET5 0 900 SHIM 7 2 i SET VALUES SET WITH PROBE AS IND A p step11 After all of the SET values have been calibrated hold the probe in the air and press the UP or DOWN arrow button to set the calibration point at zero as shown in figure 5 27 An audible beep verifies the calibration is set step12 Use the lt FUNC or FUNC gt button to deselect the NEW CAL function which exits the calibra tion procedure The MIZ 22 is now ready to proceed with conductivity measurement Page 5 58 5 0 Application Examples Direct Coating Thickness Measurement Example 5 11 Direct Coating Thickness Measure ment Example The requirements for a coating thickness test are the same as for the conductivity measure ment example which are listed in table 5 14 Follow the same procedure as the conductiv ity measurement example to setup the test The thickness value in mils is displayed in the box below the conductivity value After the SHIM spacer value is calibrated you can directly measure a coating thickness with the MIZ 22 at the same time as a conductivity measurement During calibra tion a known value is used to represent a nonconductive coating such as paint thickness This known value should be somewhat close to the thickness that is expected during the test Examples of items used as shims could be a sing
9. MIX MENU SCREEN PRINT A HP STBF none Step 5 step 6 Cursor is on lift off signal Press the BAL button Rock the probe from side to side to generate a horizontal lift off signal Page 5 38 5 0 Application Examples Signal Mixing Example step 7 Press the HOLD button to view the MIX MENU line EA It doesn t matter which channel is V being displayed either F1 or F2 step 8 step 9 step 10 step 11 Use the lt FUNC or FUNC gt button to highlight the DRAW BUFFR line Press any arrow button to draw display the buffered data Use the lt FUNC or FUNC gt button to highlight the DATA line With DATA highlighted use the arrow buttons to move the cursor until the signal of interest is displayed Use the lt FUNC or FUNC gt button to highlight the VIEW line With the VIEW line highlighted use any arrow button to adjust the width of the cursor The width of the cursor corresponds to how much of the buffered data is viewed on the screen Page 5 39 MIZ 22 Operating Guide step 12 step 13 step 14 step 15 step 16 step 17 step 18 Use the lt FUNC or FUNC gt button to highlight the MIX MENU line With the MIX MENU line highlighted press any arrow button to open the Mix Menu at the top of the data display Use the lt FUNC or FUNC gt button to move within the Mix Menu Highlight the M 1 or M 2
10. Operation 4 1 Optional accessories for the MIZ 22 2 9 P Phase 4 16 Pixels 2 2 Power connector 3 3 3 9 Power Receptacle 2 7 Power requirements 3 2 Power up commands 4 64 Print a stored image how to 4 11 PRINT SCRN 4 39 Probe Connector Differential 3 6 Single 3 6 Probe connectors 2 6 3 5 Probe for conductivity test 4 44 Probe gun interface 4 68 Probe Type 4 34 Probes 2 9 R Rating Label 2 20 Raw data 4 63 REFL 4 34 Reflection probe for conductivity testing 4 44 Remote 2 7 REMOTE connector 4 62 Remote connector 3 7 Page I 5 MIZ 22 Operating Guide Remote Connector Pin Out 3 7 Return policy 1 4 Rotating probe gun 2 10 RS 232C computer interface 4 62 S Sample setup data worksheet 5 60 Sampling rate 2 11 SAVE 4 31 Screen A B 4 35 Screen memory 4 36 Self Test 4 70 self test 3 4 Set values menu line in IACS mode 4 47 Set 1 5 in IACS mode 4 47 Setup number 4 5 Signal mixing 2 17 Signal mixing example 5 33 SING 4 34 Specifications 2 11 Alarm 2 16 Battery Pack 2 18 Dimensions 2 18 Display 2 15 Filter 2 16 Frequency range 2 14 Gain adjustment range 2 14 Inputs 2 17 Outputs 2 17 Phase 2 14 Power Requirements 2 18 Page I 6 Index Storage battery 3 3 Storage Temperature Range 2 19 Store and View Screen Image Buffer 4 8 SUPPRESS 4 31 Surface crack example 5 5 System Description 2 1 T T D SP 5 52 Test design considerations 5 1 Turning on unit and backlig
11. With the correct printer selection highlighted activate the print by pressing either the UP or DOWN arrow button The cursor disappears for several seconds and the system deacti vates while the data is written to the print buffer Page 4 39 MIZ 22 Operating Guide 4 3 Special Features The MIZ 22 has two special features digital conductivity measurement and non conduc tive coating thickness measurement Descrip tions for each of these features are included in this section of the operating guide 4 3 1 Digital Conductivity Measure ment All materials have a characteristic resistance to the flow of electricity Those with the highest resistivity are classified as insulators those having an intermediate resistivity are classi fied as semiconductors and those having a low resistivity are classified as conductors The conductors which include most metals are of greatest interest in eddy current inspection The relative conductivity of the common metals and alloys varies over a wide range Capacity for conducting current can be measured in terms of either conductivity or resistivity In eddy current inspection frequent use is made of measurement based on the International Annealed Copper Standard I ACS In this system the conductivity of annealed unalloyed copper is arbitrarily rated at 100 Page 4 40 4 0 Operation Special Features and the conductivities of other metals and alloys are ex
12. 13 the cursor width is 065 When the VIEW menu line is highlighted the RIGHT and LEFT arrow keys adjust the cursor width in units of ten In both the single and dual frequency modes the cursor width is adjustable from 10 to 4990 data points The UP and DOWN arrows expand and reduce the view of the strip chart area Six settings are available VIEW k0 original size VIEW original size x 2 VIEW k2 original size x 4 VIEW k3 original size x 8 VIEW 4 original size x 16 VIEW 5 original size x 32 Page 4 27 MIZ 22 Operating Guide Figure 4 14 shows the same data buffer as figure 4 13 except with the VIEW 5 expansion setting Figure 4 14 Expand Reduce Strip Chart r BAT voltage 5 02 DIFF A 2 0FF 1 F1 XY POS1 POS2 FREQ 300K PHASE 103 GAIN 24 5 V H 10 10 FILTER1 02 DRAW BUFFR DATA 3100 PRINT k HP STBF a The VIEW line toggles the display between six different settings The Expand Reduce Strip Chart feature is especially useful for data acquired with Zetec s High Speed Rotating Probe Gun The user is able to expand the view large enough to separate individual pulses in small areas with many pulses While in the HOLD mode you can also store STBF one screen image into the non volatile reference Page 4 28 4 0 Operation Instrument Setup memory Which is retained when the power is switched off This stored image can then be recalled RC
13. Figure 5 8 Absolute Coil Signal with FILTER 2 99 ROT ABS A F 1 F1 2 OF SWP POS1 POS2 FREQ 100K PHASE 232 GAIN 16 0 V H 04 04 FILTER2 06 DRAW BUFFR DATA 0256 VIEW 0165 PRINT H STBF RCB 7 Page 5 25 MIZ 22 Operating Guide Figure 5 9 shows a signal using a differential coil probe without a filter The low frequency rotational noise is due to probe angle or fill factor Figure 5 9 Differential Coil Signal without Filter 99 ROT DIF A FF 1 F1 2 0 SWP POS1 POS2 FREQ 100K PHASE 210 GAIN 16 0 V H 05 05 FILTER OFF DRAW BUFFR DATA 0256 VIEW 0165 PRINT H STBF RCB 2 Page 5 26 5 0 Application Examples Triggered Sweep with Filter Example A differential coil signal with FILTER 1 is shown in figure 5 10 The filter has removed the rotational noise that was shown in figure 5 9 The small negative lobes are a residual of the filter process Figure 5 10 Differential Coil Signal with FILTER 1 1 F1 2 OF SWP POS1 POS2 FREQ 100K PHASE 210 GAIN 16 0 V H 05 05 FILTER1 06 DRAW BUFFR DATA 0256 na En a a cw iei PRINT 99 ROT DIF A F HP STBF e Page 5 27 MIZ 22 Operating Guide 5 8 C scan Example Bore testing with rotating probes is the state of the art method The aircraft maintenance industry places considerable demand on signal processing and signal analysis while
14. button to change the value Toggle off the shim set point and you will notice the menu field for SHIM updates with the new value NEW CAL After the Set Values have been selected according to the calibration standards the MIZ 22 is ready for calibration using the probe and standards It is important to remember that each time you change the frequency setting or replace the probe you will have to recalibrate the instrument To perform the calibration sequence Use the 4 or gt button to highlight the NEW CAL menu field as shown in figure 4 23 Page 4 50 4 0 Operation Special Features Figure 4 23 Calibration Mode r 00 IACS h FREQ 60K PROBE REFL SET1 100 6 SET2 29 60 SET3 8 400 SET4 3 300 SET5 0 900 SHIM 7 2 SET VALUES SET WITH PROBE AS IND a 4 step2 Use the 4 or gt button to toggle through the set values to display the value that matches the first calibration standard step 3 Place the probe on the corresponding conductivity standard step 4 Visually verify the value on the instrument and the standard is the same Page 4 51 MIZ 22 Operating Guide step5 With the probe remaining on the standard press the a or v button to set the calibration point An audible beep indicates the calibration is set step6 Repeat steps 2 through 5 for each calibration standard After calibrating with the standards you must calibrate with e
15. grid of 6 x 9 major divisions Each division is 0 375 square and contains 21 x 21 pixels Special messages such as the visual alarm indicator and battery voltage are displayed in this area On the right side of the display a 64 x 128 pixel area is the function menu Page 2 2 2 0 Product Description Front Panel Controls Figure 2 1 Front Panel Controls 2 1 1 oe Gas EDDY CURRENT ns RUMEN ZETEC 2 1 5 PROBE exe No Xe SINGLE REFLECTION DIFFERENTIAL p x fd E E a KEY 2 1 1 2 1 2 2 1 3 2 1 4 2 1 5 2 1 6 2 1 7 2 1 8 2 1 9 2 1 10 Display Screen Function and Directions Arrows ON OFF Button CLEAR Button BALance Button HOLD Button PROBE Connectors REMOTE Connector ANALOG OUTPUT POWER Receptacle Page 2 3 MIZ 22 Operating Guide 2 1 2 Function And Direction Arrows The keypad provides ten membrane style switches Four of the keys ON OFF BAL CLR and HOLD operate once for each key press The two FUNC keys and the four direction arrows UP DOWN LEFT RIGHT have a repeat function that is enabled whenever the key is held in for more than a brief moment The FUNC keys provide movement of the inverse video cursor through the various setup parameters The top key moves the cursor up and in the MIX MENU field to the right The bottom key move
16. reducing the human factor Rotating probes and C scan cascaded scan presentation are developments to answer this problem A rotating probe with overlapping axial indexing provides a helical scan to ensure 100 coverage The image presented on the instrument is a C scan in a pseudo 3D graphic representation of the internal bore Compre hensive information on geometrical faults can be obtained from this signal image Additionally the flaw location within multi layered assemblies becomes more straight forward The requirements for a C scan example are listed in table 5 7 Page 5 28 5 0 Application Examples C scan Example Table 5 7 Requirements for C scan Example with Scanner Description Part No Catalog No DIFFERENTIAL COIL i y QUICK DISCONNECT T MICROTECH 4 PIN CONN Indexing Rotating Probe N A 2000 02 05 Gun Rotating Bolthole Probe A MBH SC 921 8420 Frequency Range 50 400 kHz Page 5 29 MIZ 22 Operating Guide Table 5 7 Requirements for C scan Example with Scanner Cont Description Part No Catalog No Multi Purpose Plate Stan N A 950 5700 dard Material Aluminum Connections Connect the probe to the probe gun REMOTE connector from probe gun to REMOTE on instrument Amphenol 4 pin from probe gun to DIFFERENTIAL instrument con nector Complete the followi
17. 26 EAU MKMENU nan Gani da laki 4 30 MEL nana ian AA a aaa 4 32 Table of Contents 4 2 12 Probe Type sses 4 34 4 2 13 Auto Clear and Screen AJB seen 4 35 4 2 14 Printer Control man 4 39 4 3 Special Features 4 40 43 1 Digital Conductivity Measurement 4 40 4 32 Nonconductive Coating Thickness Measure ment4 57 4 4 Auxiliary Features 4 59 4 41 Battery Voltage Readout eee 4 59 4 4 2 Automatic Turn Off man 4 59 443 Battery Pack emma 4 60 AAA Analog OutputS naaa 4 62 445 Computer Interface aan 4 62 4 4 6 Probe Gun InterfacCe aaa 4 68 447 Se Test emma 4 70 5 0 Application Examples 5 1 5 1 Test Design Considerations 5 1 5 2 Surface Crack Example 5 5 5 3 Aircraft Skin Corrosion Example 5 8 5 4 Alloy Sorting Example 5 11 5 5 Fastener Hole Example 5 14 5 6 Countersink Example 5 17 5 7 Triggered Sweep with Filter Example 5 20 Table of Contents 5 8 C scan Example 5 28 5 9 Signal Mixing Example 5 33 5 9 1 Mixing Out Lift Off Signals eee 5 35 5 9 2 Mixing Out Varying Spacing eee 5 43 5 9 3 Tube Support Signal Suppression Mix 5 46 5 10 Conductivity Measurement Example 5 50 5 10 1 Gema ii 5 50 5 10 24 Temperaire nn aa An San 5 51 5 10
18. 400 kHz 09 TUBING 1 MX 2 F1 XY OFF ALARM OFF PROBE DIFF SCREEN A PRINT P Signal after mix E Distorted signal before mix Flaw is overlaid partially by support ring signal before mix Page 5 49 MIZ 22 Operating Guide 5 10 Conductivity Measurement Example The MIZ 22 has the ability to directly measure the conductivity of materials in a IACS read out Variables such as geometry temperature and frequency selection determine an accurate conductivity measurement 5 10 1 Geometry Due to the edge effect a surface area on the test material of at least 1 2 square is necessary In general it is not advisable to inspect any closer than 3 2 mm 1 8 from the edge of a part depending on variables such as coil size and test frequency Curvature of the test piece can also affect the measurement Another consideration is the minimum required thickness of the material The minimum thickness required increases as the conductivity value decreases For help in determin ing the minimum thickness reference the information in equation 4 3 When setting up the instrument as well as during a test keep the probe as perpendicular to the test piece as possible Page 5 50 5 0 Application Examples Conductivity Measurement Example 5 10 2 Temperature 5 10 3 As the probe changes in temperature small geometrical and electrical effects will change the co
19. Page 4 47 MIZ 22 Operating Guide step2 Press the 0 or button to toggle through the set points to the one you want to change In this example we are using SET2 step3 Use the A or w button to change the value Figure 4 21 SET Adjustment f SET1 100 6 SET2 29 60 SET3 8 400 SET4 3 300 SET VALUE STDH2 i ET5 0 900 00 IACS D FREQ 60K PROBE REFL SHIM 7 2 SET VALUES NEW CAL Qa S step 4 step 5 Select a new set point Notice the menu field for SET2 updates with the new value Repeat steps 2 and 3 for each set point you need to change Page 4 48 4 0 Operation Special Features The SHIM spacer is a known value that is used to represent a nonconduc tive coating such as paint thickness Examples of items used as shims could be a single piece of paper about three mils 0 003 thickness or Teflon tape of varying thickness To set the shim value step1 Highlight the SET VALUES menu field see figure 4 22 Figure 4 22 Shim Value Adjustment r 00 IACS NN FREQ 60K PROBE REFL SETI 100 6 SET2 29 60 SET3 8 400 SET4 3 300 STD H SHIM SET5 0 900 SHIM SET SET VALUE NEW a 4 step2 Use the 4 or gt button to toggle through the selections until STD SHIM highlights on the display Page 4 49 MIZ 22 Operating Guide step 3 step 4 step 1 Use the 4 or w
20. data enhancement mix on the data displayed in the buffer display window The CLEAR function erases any mix coefficients that may have been created in the past This function also needs to be activated prior to creating anew mix With the DATA function in this menu highlighted you can move the view window with the arrow keys to display the signal of interest without leaving the MIX MENU Two types of mixes are available with the MIZ 22 a least squares data suppression mix and a data enhance ment mix With the MIX function highlighted the up and down arrow keys toggle between MIX 1 and MIX 2 Use the HOLD button to exit the MIX MENU and return to normal operation of the MIZ 22 Page 4 31 MIZ 22 Operating Guide 4 2 11 1 MIX 1 This method provides only for the suppression of unwanted signals When the SUPPRESS function is used the data from the selected signal is used to provide a solution for the mix equation where the resulting output is as close to zero as possible The coefficients are determined based on this one condition The output of the MIX 1 channel displays a minimal size signal when the undesir able effect is scanned This same signal combination is used to display all signals And so the signal output from flaw indications is thus based on minimizing unwanted signals Typically if proper frequen cies are chosen the flaw response should be clearly distinguishable from other anomalies an
21. in table 5 4 Table 5 4 Requirements for Fastener Hole Example Description Part No Catalog No a Pe UW Cee ae ee Differential Bolthole Probe Z2 125 SC 920 8220 Freq Range 50 400 kHz Page 5 14 5 0 Application Examples Fastener Hole Example Table 5 4 Requirements for Fastener Hole Example Cont Description Part No Catalog No Multi Purpose Plate Stan N A 950 5700 dard Material Aluminum Connections Connect the probe to the instrument DIFFERENTIAL connector 1 OD of probe Complete the following steps in sequence to setup and perform a fastener hole test Setup step1 Adjust the distance between the coil and the probe handle to approximately 0 5 13mm step 2 Set the instrument variables as illustrated in figure 5 4 step3 Insert the probe into HOLE N hole without a flaw and balance the MIZ 22 step4 Insert the probe into HOLE J step5 Rotate the probe 360 Page 5 15 MIZ 22 Operating Guide Figure 5 4 Fastener Hole Flaw Indication 04 FASTEN A 1 F1 2 0FF POS1 POS2 FREQ 100K PHASE 148 GAIN 16 5 V H 15 15 FILTER OFF ALARM OFF PROBE DIFF SCREEN A PRINT i N The V H scale is adjustable to V enhance the signal to lift off
22. sensitivity than the single output reference figure 4 16 Figure 4 16 P Probe Type 00 DEFAULT 1 F2 2 OFF XY POS1 POS2 FREQ 4 0K PHASE 132 GAIN 34 0 V H 10 10 FILTER OFF _ ALARM OFF BPROBE REFL AUTCLR 01 PRINT te Z Use the direction arrows to select between DIFF differen tial SING single or REFL reflection connectors Page 4 34 4 0 Operation Instrument Setup 4 2 13 Auto Clear and Screen A B The MIZ 22 can be set to continually erase old data or to store the signal on the screen To choose between the modes set the cursor on the AUTCLR field The MIZ 22 has the unique ability in the AUTOCLEAR mode to retain the newer data on the screen while erasing older data This is analogous to variable persistence on an analog storage scope To set the mode to AUTOCLEAR use the UP or DOWN direction button to toggle between AUTCLR SCREEN A and SCREEN B reference figure 4 17 In the XY display mode the number on the right hand side of the line is the approximate number of seconds in tenths that the data persists on the screen before it is erased Use the RIGHT and LEFT direction arrows to increase or decrease the number between 2 and 50 0 2 5 0 seconds However while in either the SWP or SCAN mode this number represents other factors For example in the Page 4 35 MIZ 22 Operating Guide SWP display mode the number represents the n
23. the line cord should be properly connected to earth ground The power source may be 115 or 230 VAC 50 or 60 Hz A line voltage selector switch is provided on the inner lid of the battery pack It must be placed in the proper setting before the instrument is connected to the AC line Page 3 9 MIZ 22 Operating Guide The next section of this guide is about the operation of the MIZ 22 instrument Page 3 10 4 0 Operation The MIZ 22 combines a dual display signal process ing circuitry and alarm circuits into one lightweight sealed unit It can be operated on battery or AC power If you are familiar with Zetec s MIZ 20A you will find the MIZ 22 is an enhanced version With two simultaneous frequencies signal mixing data filter ing and special display capabilities the MIZ 22 s capability to detect defects is improved In the single frequency mode above 10 kHz it provides a sample rate of 1250 samples per second as opposed to 330 for the MIZ 20A The frequency range is the same 50 Hz to 2 MHz In the dual frequency mode the second frequency is obtained by dividing the primary frequency by an integer from 2 to 10 The sample rate in this mode above 10 kHz is 400 samples per second The primary frequency range during dual frequency operation is 1 kHz to 2 MHz Page 4 1 MIZ 22 Operating Guide Two types of signal mixing are available a least squares data suppression mix MIX 1 and a data e
24. toggle between FILTER 1 FILTER 2 or FILTER OFF When FILTER 1 is used with an absolute coil rising edges show as positive signals and falling edges as negative signals In this case FILTER 2 should be used because it restores the original signal direction resulting in a more natural presenta tion of the flaw When the test coil is differential FILTER 1 generally gives the best presentation Page 4 23 MIZ 22 Operating Guide 4 2 9 Alarm The MIZ 22 alarm function provides audio and visual indications when the eddy current signal falls within a defined area reference figure 4 12 The defined area is shown with a box on the screen The alarm is selected for either Display 1 or Display 2 and can be either inside or outside the box You can change the center position of the alarm box when the CHNG CENT line is highlighted With this function enabled any arrow key moves the box s position in the corresponding direction Additionally you can change the size of the alarm box when the CHNG SIZE line is highlighted Use any of the arrow keys as shown in figure 4 12 to change the box s size in the corresponding direction The alarm indication is also present as a logic level on pin 3 of the remote connector which may be used to control external equipment Page 4 24 4 0 Operation Instrument Setup Figure 4 12 Alarm Control r 00 beru N 1 F2 2 0F XY POS1 PO
25. which is protected by copyright All rights are reserved No part of this document may be reproduced transmitted transcribed stored in a retrieval system or translated into any language or computer language in any form or by any means electronic mechanical magnetic optical chemical manual or otherwise without the express prior written permission of Zetec Inc PO Box 140 Issaquah WA 98027 Copyright Zetec Inc 1992 1993 1995 1996 Page 1 3 MIZ 22 Operating Guide 1 3 1 4 Maintenance Agreement Zetec s liability is limited to servicing or replacing defective parts except those items which would require periodic replacement due to normal wear during use This does not include calibration nor minor maintenance as outlined in Zetec Operating Manuals Return Policy When you receive the MIZ 22 instru ment check for carton damage Note any signs of damage and or appropriate shipping forms If the shipping carton is damaged upon receipt request the carrier s agent be present when the item is unpacked If concealed damage is found immediately file a claim with the carrier The next section of this guide is a complete descrip tion of the MIZ 22 Eddy Current Instrument Page 1 4 2 0 System Description The portable MIZ 22 is a versatile eddy current instrument designed for defect detection thickness measurement direct conductivity measurement and sorting by metallurgical differences
26. 20 Page 2 22 2 0 Product Description Hazardous Locations Usage Table 2 2 U L Approved Probe List Cont Part Number Type Sa DP 625 R Reflection Ring 931 0080 RR0112 2 Reflection Ring N A DT20P Pencil 909 0020 000 DT30PS Pencil 909 0030 000 39DT 106 Pencil 909 0106 000 39DT 136 Pencil 909 0136 000 9DT45P Pencil 909 0045 000 9DT61S Pencil 909 0061 000 DT21P Pencil 909 0021 000 DT31PS Pencil 909 0031 000 39DT107 Pencil 909 0107 000 39DT137 Pencil 909 0137 000 9DT46P Pencil 909 0046 000 9DT62S Pencil 909 0062 000 DT22P Pencil 909 0022 000 DT32PS Pencil 909 0032 000 39DT108 Pencil 090 0108 000 39DT 138 Pencil 909 0138 000 9DT47P Pencil 909 0047 000 9DT63S Pencil 909 0063 000 A ADJ MBH F Bolthole 921 8427 000 Page 2 23 MIZ 22 Operating Guide Table 2 2 U L Approved Probe List Cont Catalog Part Number Type Number A AD MBH F HF Bolthole 921 8428 000 A AD MBH SC Bolthole 921 8425 000 A MBH S SC Bolthole 921 8417 000 A MBH SC Bolthole 921 8420 000 A ADJ MBH HSC Bolthole 921 8426 000 A MBH HSC Bolthole 921 8421 000 A SC BH Manual Bolthole 921 8424 000 90 degree BK Drop Point D 4948 1 A Table 2 3 U L Approved Accessories Catalog Number Accessory 2000 02 01 Rotating Bolth
27. 22 Eddy Current Tester MIZ Operating Guide 28 April 2000 28 April 2000 Zetec Inc 1992 ZETEC P O Box 140 Issaquah Washington 98027 0140 U S A Tel 425 392 5316 Fax 425 392 2086 Printed in the United States of America Table of Contents 1 0 General DescriptiOn 1 1 1 1 Warranity aaa 1 2 1 2 Copyright aa 1 3 1 3 Maintenance Agreement 1 4 1 4 Return Policy aan 1 4 2 0 System Description e 2 1 2 1 Front Panel Controls 2 2 2 1 1 Display Screen 2 2 2 1 2 Function And Direction ATTOWS ssassn 2 4 2 1 3 a ne e a 2 5 ARA Ce anaa a 2 5 2 1 5 Balance Button onsin 2 6 2 1 6 Hold BUttON cesses 2 6 2 1 7 Probe COnneCtOrs manamana 2 6 2 1 8 Remote A TEA KAA 2 7 2 19 Analog Output mmm 2 7 2 1 10 Power Receptacle 2 7 Table of Contents 2 2 2 3 2 4 2 5 2 6 2 7 Functional Block Diagram 2 8 Equipment Supplied 2 8 Optional Accessories 2 9 ZAT Pr AAA nh AAA 2 9 2 4 2 Rotating Probe GUN man 2 10 243 Equipment Cases oo mmm 2 10 SpecificatioOns 2 11 2 5 1 Conductivity Feature 2 12 2 5 2 Frequency Range an 2 14 2 0030 Pua AAA A aan 2 14 2 5 4 Gain Adjustment Range a 2 14 2 5 5 De na a A 2 15 250 Menga a a AA 2 15 20 2 Ain
28. 3 Frequency Selection 5 51 5 11 Direct Coating Thickness Measurement Example5 59 5 12 Sample Setup Data Worksheet 5 60 List of Figures pogei i ge a lhc TL lc TL lc TL lc TL TL TL TL TL TL TL TL TLL TLL TLL TLL TL TL TL ee TL di De mer a oT nm a7 TT igure 2 1 gure 2 2 gure 3 1 gure 3 2 gure 4 1 gure 4 2 gure 4 3 gure 4 4 gure 4 5 gure 4 6 gure 4 7 gure 4 8 gure 4 9 gure 4 10 gure 4 11 gure 4 12 gure 4 13 gure 4 14 gure 4 15 gure 4 16 gure 4 17 gure 4 18 gure 4 19 gure 4 20 gure 4 21 gure 4 22 igure 4 23 gure 4 24 gure 4 25 gure 4 26 gure 4 27 igure 4 28 gure 5 1 gure 5 2 gure 5 3 Front Panel Controls emmm 2 3 Functional Block Diagram mmm 2 8 Battery Pack Top Assembly Detail c cece 3 2 Front Panel ConnectiOnS memana 3 5 ON OFF CONT es Gi bina ia da ddan 4 3 Display Menu mmm anna 4 5 Setup Control Im au dana a KE KA nan 4 7 Screen Image Buffer Menu Selection seess 4 8 View Buffer Mode memana 4 11 Display Parameters csccssssssssessessssssssssssssssnesees 4 12 Frequency CONtIOL eects 4 15 Phase Control nn dn AAA A adaa 4 17 Gain Control nn Lana Beh Kana da ana da 4 19 na aaa 4 21 a AA A 4 23 Alarm Control en AA AA aa 4 25 PEG inaa AN A dai 4 27 Expand Reduce Strip Chart maa 4 28 MiX Meni aanne AAA AAA AAA Mines 4 30 Prob Type iinoa nad an Saka 4 34 Auto Clear Control an an nd in ad da b
29. 400 mA rate For optimum perfor mance of the cells it is best not to keep them on charge at the full 400 mA rate for an extended period of time such as a week For optimum battery life periodically discharge the batteries fully by Page 4 60 4 0 Operation Auxiliary Features leaving the instrument turned on until it automatically shuts itself off Recharge the batteries immediately after this full discharge Do not leave the batteries in a discharged condition Whenever possible avoid charging the batteries at the full rate unit turned off when the ambient temper ature is above 90 F 32 2 C This helps to prolong cell life and maximize cell capacity Normal lifetime for the batteries under which they will retain 90 charge is 1 000 recharge cycles However in an emergency situation of total battery failure they can be temporarily replaced with standard alkaline D cells Sge Never plug the instrument into an Rs AC line or use the instrument in an explosive atmosphere if the cells are replaced with any type but Ni Cad Page 4 61 MIZ 22 Operating Guide 4 4 4 4 4 5 Analog Outputs The V and H analog outputs provide a voltage corresponding to the vertical and horizontal position of the data dot on Display 1 The V range is 42 5 volts and the H range is 43 8 volts Both outputs are at approximately zero volts when the data dot is in the center of the test area of the screen C
30. 7 5 V H 08 08 FILTER OFF ALARM BUFFR DATA 2566 VIEW 0851 MIX MENU SCREEN A PRINT HP STBF per Page 5 42 5 0 Application Examples Signal Mixing Example 5 9 2 Mixing Out Varying Spacing The requirements for mixing out a varying spacing are listed in table 5 9 Table 5 9 Requirements for Mixing Out Varying Spacing Description Part No Catalog No 10 4880 f Detachable Tip Driver DTDP 500 SP 910 4880 Pick Up Spot Probe Frequency Range 500 Hz 30 kHz Spot Face Thickness Stan D 0433 N A dard Material Aluminum Connections Connect the probe to the instrument REFLECTION connector Page 5 43 MIZ 22 Operating Guide Complete the following steps in sequen tial order to perform this mix Setup step1 Set the instrument variables to those shown in figure 5 19 step 2 Follow the same steps used to mix out the lift off signal in section 5 9 1 on page 5 35 Reference 5 19 through 5 21 for representa tive displays Figure 5 19 Response To Varying Gap Spacing Between Layers r T VD A Na Se XY Varying Gap Response Post POS2 ee ae 10K amp 5 0K Sea Pisce naa i aoe ei ana PHASE 080 oe Beas fe GAIN 26 0 V H 10 10 FILTER OFF ALARM OFF PROBE REFL SCREEN A 07 MIX2 h 1 MX 2 F2 XY PRINT
31. ARD BOARD BOARD BOARD 5V 15V 15V 5V DATA ADDRESS 2 3 Equipment Supplied The MIZ 22 is supplied as a complete instrument with detachable line cord and operating guide A foam padded shipping case with handle is optional At least one Page 2 8 2 0 Product Description Optional Accessories 2 4 probe is required for eddy current inspec tion with the MIZ 22 Probes and coils must be ordered separately since the proper configuration and type must be selected for each testing application Optional Accessories The MIZ 22 has optional accessories available such as probes rotating probe guns and shipping cases 2 4 1 Probes Zetec offers a full line of probes suitable for surface flaw detection deep penetration work fastener hole inspection tube testing conductivity measurement and more Consult with our Applications Department to determine the best probe for your situation The general purpose nature of the circuitry also makes the MIZ 22 compatible with probes from most other manufacturers Page 2 9 MIZ 22 Operating Guide 2 4 2 2 4 3 Rotating Probe Gun The Zetec rotating probe gun is specifically designed for use with the MIZ 22 It offers two speeds remote instrument control and can be supplied with probes in a variety of diameters With the instrument s sampling rate of 1250 samples per second the MIZ 22 supp
32. BF for data comparisons A useful application of this function is storing the reference signal from a standard and then comparing this signal with the present test data Use the FUNC buttons to highlight either the STBF or RCBF function With the function highlighted pressing any of the arrow buttons activates the function Page 4 29 MIZ 22 Operating Guide 4 2 11 Mix Menu Press the HOLD button to view the MIX MENU line in the display menu as seen in figure 4 15 If the MIX MENU lines doesn t appear verify that F2 is ON With the MIX MENU line highlighted press the LEFT or RIGHT arrow key to view the mix menu Once the mix menu is displayed use the lt FUNC and FUNC keys to highlight the differ ent functions Each function must be highlighted before it can be activated by pressing the up or down the arrow key Figure 4 15 Mix Menu a U Mix menu xY Pa ee BAT voltage 00 DEFAULT D 1 F1 2 0FF POS1 POS2 FREQ 200K PHASE 070 GAIN 34 0 V H 20 20 FILTER OFF DRAW BUFFR DATA 2715 VIEW 294 MIX MENU PRINT HP BF STBF RC P With the MIX MENU line highlighted press an arrow key to view the mix menu Page 4 30 4 0 Operation Instrument Setup The SUPPRESS function performs a least squares data suppression mix on the data displayed in the buffer display window The SAVE function is active only during MIX2 It performs a least squares
33. D FREQ 60K PROBE REFL SET1 100 6 SET2 29 60 SET3 8 400 SET4 3 300 SET5 0 900 SHIM 7 2 i i SET VALUES SET WITH PROBE AS IND A I Page 4 54 4 0 Operation Special Features step2 With the probe held in air press the or button to set the calibra tion point An audible beep indicates the calibration is set step3 Press the or button to deselect the NEW CAL function and exit the calibration mode Calibration is now complete measure parts as required Page 4 55 MIZ 22 Operating Guide step 1 step 2 Drift Compensation During a test session the conductivity function should be checked for drift every 15 minutes To compensate for any drift after calibration complete the follow ing steps Place the probe on the test coupon or standard in the range where you are testing shown in figure 4 26 Highlight the corresponding SET as Figure 4 26 Drift Compensation CONDUCTIVITY IN IACS LIFTOFF IN MILS 00 IACS FREQ PROBE SET1 SET2 SET3 SET4 SET5 SHIM SET NEW Pp 60K REFL 100 6 29 60 8 400 3 300 0 900 7 2 VALUES CAL a A step 3 Press any arrow button The MIZ 22 zeros the calibration curve to the standard Page 4 56 4 0 Operation Special Features 4 3 2 Nonconductive Coating Thick ness Measurement Requirements and setup for a noncon ductive coating thickness test ar
34. D Page 5 44 5 0 Application Examples Signal Mixing Example Figure 5 20 Flaw Response with Varying Gap Spacing r o Varying Gap amp 07 MIX2 E XY Flaw Response 1 MX hi z 4 XY Mix Flaw POS1 POS2 10K amp 5 0K PHASE 080 GAIN 26 0 V H 10 10 FILTER OFF ALARM OFF PROBE REFL SCREEN A PRINT HP d Figure 5 21 Flaw Response on Mix r Ea Flaw Response 07 MIX2 gt 1 MX 2 0OF Se r ORME a XY Desay E A ae seats eae Re pease ts POS1 POS2 10K amp 5 0K aa PHASE 080 GAIN 26 0 a Deele a a cate V H 10 10 i i FILTER OFF erty a D Bags W ALARM OFF egy o oi DN ge of PROBE REFE oS te SCREEN A Signal separated for clarity PRINT HP Page 5 45 MIZ 22 Operating Guide 5 9 3 Tube Support Signal Suppression Mix The requirements for mixing out a tube support signal are listed in table 5 9 Table 5 10 Requirements for Mixing Out Tube Support Signal Description Part No Catalog No c a M o M DIFFERENTIAL COILS Bobbin Probe or equivalent A BS 770 1602 ZAT AY Carat a ASME Standard with Sim N A 950 0030 ulated Tube Support Ring Material Various Connections Connect the probe to the instrument
35. S2 FREQ 40K l PHASE 132 GAIN 34 0 V H 10 10 FILTER OFF p A LA E PROBE REFL AUTCLR 01 Qa PRINT 4 The arrows shown below indicate which and how each arrow key changes the size of the alarm box Page 4 25 MIZ 22 Operating Guide 4 2 10 Data Buffer The data buffer is only available during the HOLD mode While in the HOLD mode the instrument s memory retains the last six seconds of data in the single frequency mode and ten seconds in the dual frequency mode Once you are in the HOLD mode pressing any button except the FUNCS gt lt FUNC and ON OFF buttons draws a horizontal strip chart of the data buffer The DATA menu line shows the center of the display cursor location in the data buffer This cursor is highlighted in figure 4 13 It is adjust able from start to end of the data buffer The RIGHT and LEFT arrow keys are the coarse fast adjustment in units of ten The UP and DOWN arrow keys are the fine slow adjust ment in units of one Page 4 26 4 0 Operation Instrument Setup Figure 4 13 Data Buffer r Cursor be BAT voltage 0 02 DIFF D 2 0FF 1 F1 XY POS1 POS2 FREQ 300K PHASE 103 GAIN 24 5 V H 10 10 FILTER1 02 DRAW BUFFR DATA 3100 MEWO s PRINT HP STBF 7 a Adjust the width of the buffer display cursor The VIEW K0 line shows the width of the buffer display cursor In figure 4
36. Setup mna 5 37 Lift Off SIQMal an ngaa Ka a A ati 5 38 Mrs sis iniinis 5 41 MX Channel Display emmm 5 42 Response To Varying Gap Spacing Between Layan oiua AS An baila inde digital 5 44 Flaw Response with Varying Gap Spacing 5 45 Flaw Response ON MIX memana 5 45 Tube Support Suppression MIX emma 5 48 100 Thru Wall Signal at 400 KHZ aaa 5 49 Default 1ACS Display mmm 5 54 Calibration Display mmm 5 55 Shim Value Display man 5 56 Na ba aid tine a EA 5 58 List of Tables Table 2 1 Table 2 2 Table 2 3 Table 3 1 Table 3 2 Table 4 1 Table 4 2 Table 4 3 Table 5 1 Table 5 2 Table 5 3 Table 5 4 Table 5 5 Table 5 6 Table 5 7 Table 5 8 Table 5 9 Table 5 10 Table 5 11 Table 5 12 Battery Life with Accessories 2 18 U L Approved Probe List 2 21 U L Approved Accessories 2 24 Probe ConnectorS 3 6 Remote Connector Pin Out 3 8 Nominal Electrical Conductivity of Various Materials 0000 0000005 4 41 Power Up Commands 4 64 FORTH Commands 4 66 Requirements for Surface Crack Test 5 5 Requirements for Aircraft Skin Corrosion Festi weds sadaaueded posed Rein A SA 5 8 Requirements for Alloy Sorting Example 5 11 Requirements for Fastener Hole Example 5 14 Requirements for Countersink Test Example sce fn AAA ET 5 17 Requirements for Tri
37. Stan N A 950 5700 dard Material Aluminum Connections Connect the probe to the probe gun REMOTE connector from probe gun to REMOTE on instrument Amphenol 4 pin from probe gun to DIFFERENTIAL instrument con nector Complete the following steps in sequence to setup and perform a triggered sweep with filter test Setup step1 Set the instrument variables as shown in figure 5 6 Page 5 21 MIZ 22 Operating Guide step2 Select atest frequency that allows good flaw detection with low surface noise 50 200 kHz step3 Set a medium gain 10 20 step4 Set AUTCLR on set the SWEEP off step5 Insert the probe into a standard With motor off balance on a defect free area of the standard Keep the probe as perpendicular as possible and set the speed to high Figure 5 6 Absolute Coil Signal without Filter 99 ROT ABS A 1 F2 2 0FF SWP POS1 POS2 FREQ 100K PHASE 232 GAIN 16 0 V H 06 06 FILTER OFF DRAW BUFFR DATA 0256 VIEW 0165 PRINT H STBF RCB 74 Page 5 22 5 0 Application Examples Triggered Sweep with Filter Example step 6 step 7 step 8 Use manual rotation to set the lift off noise if present to horizontal This is particularly important for tests using the triggered sweep because it is the vertical signal that is displayed and it is desirable to keep it low in noise Set SWEEP to on After a few mome
38. a work session Using the standard that is closest in value to the material you are testing renull the instrument as necessary Temperature Considerations The temperature of the instrument standard and test piece must be within 2 C 3 6 F to avoid introducing measurement errors Ki If the instrument is used before a warm up period check the nearest standard before making a measurement and renull the instru ment when necessary Page 2 13 MIZ 22 Operating Guide 2 5 2 Frequency Range Frequency 1 Adjustable from 50 Hz to 2 MHz e Frequency 2 Adjustable from 100 Hz to 1 MHz 2 5 3 Phase e Manually adjustable in 1 degree steps from 0 to 359 degrees 2 5 4 Gain Adjustment Range e 0 to 49 5 dB in 1 2 GB steps e Ratio of vertical to horizontal amplitude adjustable from 01 50 to 50 01 Page 2 14 2 0 Product Description Specifications 2 5 5 Display e 128 x 256 pixel Liquid Crystal Display Viewing area 2 3 x 4 6 5 84 x 11 68 cm e Contrast ratio minimum 12 1 e Built in heater auto turn on below 40 F 4 4 C and backlight Data can be displayed in three modes triggered sweep C scan and X Y impedance plane modes 2 5 6 Memory e Non volatile data retained with power off Stores 100 setups Stores 10 screen images for viewing or printing Volatile data not stored with power off Temporary 6 5 second buffer memory available in HOLD mod
39. ach standard to include a shim value These steps calibrate the instrument for nonconductive coating thickness measure ments in conjunction with conductivity measurements To calibrate the shim value step1 Use the 4 or P button to toggle through the set values until the value that matches the first calibration standard with SHIM displays as shown in figure 4 24 Page 4 52 4 0 Operation Special Features Figure 4 24 Calibration with Shim 00 IACS FREQ 60K PROBE REFL SET1 100 6 SET2 29 60 ONDUCTIVITY amp SPACER SET3 8 400 SET4 3 300 SET5 0 900 SHIM 7 2 SET VALUES SET WITH PROBE AS IND A 4 step 2 Place the probe on the corresponding conductivity standard together with the shim step3 Visually verify the value on the instrument and the standard is the same step 4 With the probe remaining on the standard press the a or button to set the calibration point An audible beep indicates the calibration is set Page 4 53 MIZ 22 Operating Guide step5 Repeat steps 1 through 4 for each standard and shim After calibrating with the standards and shim you can set the final calibration point as probe in air to zero To set the air value step1 Use the 4 or p button to toggle through the set values until the 0 000 value and AIR displays as shown in figure 4 25 Figure 4 25 Probe in Air Calibration Point 00 IACS
40. an nn aaa 2 16 25 8 a aaa a o a 2 16 2 5 9 Signal ea 2 17 25 10 pU a aA AAA ak 2 17 A GUUS a EE 2 17 2 5 12 Power Requirements ema 2 18 2 5 13 Battery Pack mmm 2 18 2 5 14 DiImMensiOnS emmm 2 18 Environmental 2 19 2 6 1 Operating Temperature Range 2 19 2 6 2 Storage Temperature Range 2 19 203 un ann A A Aan an ni oh 2 19 204 Lihi A EA A 2 19 Hazardous Locations Usage 2 20 2 7 1 Hazardous Locations voces 2 20 2 7 2 ULL Approved Accessories a 2 21 Table of Contents 3 0 Installation j sccc sein iawn 3 1 3 1 Unpacking ee cscccdem aaa 3 1 3 2 Power Requiremenis 3 2 3 2 1 Power COMM ctl memana 3 3 3 2 2 Storage Battery seein 3 3 3 3 Turning On Unit and Backlight 3 4 3 4 Front Panel Connections 3 5 3 4 1 Probe COMME COIS eects 3 5 3 4 2 Remote Connector maaa 3 7 3 43 Vand H Connectors a maaa 3 9 3 4 4 Power Connector sses 3 9 4 0 Operation wamewcuserictnseniintnciareadscnisearenetdvan 4 1 4 1 Turning On Unit and Backlight 4 2 4 2 Instrument Setup aaa 4 4 MEL EU EEA AA RAR 4 5 4 2 2 Store and View Screen Image Buffer 4 8 4 2 3 Display Parameters man 4 12 ALA a ciin 4 14 42 50 Pra AA A EE nines 4 16 A256 Ga a A 4 18 ALT VAS caligna 4 20 42 8 a FINES ai aE i a A 4 22 A298 Alanna aa 4 24 4 2 10 Data Buffer naaa 4
41. as electronic balancing Page 2 11 MIZ 22 Operating Guide printer interface triggered sweep and analog outputs are included in the instru ment Even with all this performance and versatility the overall design goal of easy operation allows the new operator to quickly learn the system 2 5 1 Conductivity Feature The MIZ 22 has three conductivity measurement frequencies 60 120 and 240 kHz e Conductivity Measurement Accuracy lInstrument accuracy is certified as Class l 0 5 IACS materials with conductivity range between 0 9 and 25 IACS 0 5 and 14 5 MS m Class II 0 5 l ACS materials with conductivity range between 16 and 60 IACS 9 5 and 35 MS m Class lll 1 l ACS materials with conductivity range between 60 and 102 IACS 35 and 70 MS m Combined instrument and standard accuracy above 15 IACS is 1 of value below 15 is 3 of value Page 2 12 2 0 Product Description Specifications Conductivity Measurement Error caused by lift off 1 up to three mils Lift Off Measurement Accuracy 0 5 mil when measuring a coating thickness on material equal to or greater than 3 5 IACS 2 0 mils when less than 3 5 IACS Drift Compensation The MIZ 22 is certified to drift less than 0 5 IACS over a 15 minute period in a stable environment After a 15 minute warm up period complete the calibration routine and then check the instrument every fifteen minutes during
42. ast pressed The information in memory is updated whenever the operator changes a setup parameter With the entire setup line highlighted as shown in figure 4 3 use the UP or DOWN arrow button to toggle through the available setups 0 to 99 Press the LEFT arrow button to store the configuration Any change to the Setup automatically invokes the following on screen message Last active configuration is in temporary storage Changes will be lost unless stored To store 1 Select config number 2 Press left arrow It is possible to store a new setup with a unique name or change the name of a recalled setup Use the LEFT or RIGHT arrow button to highlight the individual character you want to change Then use the UP or DOWN arrow buttons to toggle to the new character The new character can be either a letter number or standard keyboard character Page 4 6 4 0 Operation Instrument Setup Figure 4 3 Setup Control On screen store message r lt STORE 65 AN N STORED 1 F2 2 OFF XY POS1 POS2 FREQ 4 0K PHASE 132 GAIN 34 0 V H 10 10 FILTER OFF ALARM OFF PROBE REFL AUTCLR 01 z S PRINT Use the UP or DOWN arrow keys to display the available setups Page 4 7 MIZ 22 Operating Guide 4 2 2 Store and View Screen Image Buffer The MIZ 22 contains a buffer feature that saves up to 10 screen images along with all the setup informatio
43. ature extremes some stabilization time should be allowed for the probe before tests are performed Similarly for a test such as conductivity an instrument should be calibrated on a standard which is close to the same temperature as the object under test Examples of common eddy current tests performed on the MIZ 22 are included here as general guidelines Many creative variations are possible EA Specific gain and phase values are V probe instrument and material dependent The exact settings for a similar result will vary according to the situation Page 5 4 5 0 Application Examples Surface Crack Example 5 2 Surface Crack Example The depth of surface cracks can be estimated by comparing the phase and amplitude of the generated eddy current signal with a test standard The requirements for this test are listed in table 5 1 Table 5 1 Requirements for Surface Crack Test Description Part No Catalog No 10 4802 Probe Detachable Tip DT 100 125 910 4802 Spring Loaded Surface Scan Probe Frequency Range 50 500 kHz Page 5 5 MIZ 22 Operating Guide Table 5 1 Requirements for Surface Crack Test Cont Description Part No Catalog No Multi Purpose Plate Stan N A 950 5700 dard Material Aluminum Connections Connect the probe to the instrument DIFFERENTIAL connector Com
44. d positions the signal dot to the selected position on the screen Hold Button Pressing the HOLD button causes the MIZ 22 to stop acquiring new data While in the HOLD mode the instru ment s memory retains the last six seconds of data in the single frequency mode and ten seconds in the dual frequency mode The operator can select any portion of this data to be displayed on the screen Probe Connectors The MIZ 22 provides probe connec tors for reflection driver pickup single absolute and differential type probes Page 2 6 2 0 Product Description Front Panel Controls 2 1 8 2 1 10 Remote The REMOTE connector is designed to control the Zetec Rotating Probe Gun although other rotating devices may be used Analog Output The V and H ANALOG OUTPUTS provide a voltage corresponding to the vertical and horizontal position of the data on Display 1 only Power Receptacle This receptacle is used with a power cord when operating the MIZ 22 on AC power instead of battery power Page 2 7 MIZ 22 Operating Guide 2 2 Functional Block Diagram Reference figure 2 2 for a complete block diagram of the MIZ 22 Figure 2 2 Functional Block Diagram gt DISPLAY KEYPAD ANALOG REMOTE OUT CONN PROBE BATTERY BWA SAN yee PACK CONN M 9 12 VDC PONE E DISPLAY ANALOG CPU BO
45. d resemble the signal from a flaw that is not affected by the undesirable effect You can refer to the application examples in section 5 0 for further discussion about signal mixing Page 4 32 4 0 Operation Instrument Setup 4 2 11 2 MIX 2 In order to provide an alternative method to the user MIX 2 is also available with the MIZ 22 instru ment This mix provides a method for both suppression of unwanted signals and enhancement of desired signals When an undesirable signal is selected and the SUPPRESS function used the mathematical solution is driven towards a zero output solution When a desirable signal such as a flaw of interest is selected and the SAVE function used the mathemati cal solution is driven towards provid ing a mix signal output that matches the flaw signal as seen in the primary frequency channel Successive pressing of the SUPPRESS and SAVE functions are used to develop a mix solution that either better reduces the response from unwanted signals or better enhances the response from a desirable signal Page 4 33 MIZ 22 Operating Guide 4 2 12 Probe Type To change probe types place the cursor on the PROBE field and use the direction arrows to select between the DIFF differential SING single or REFL reflection connec tors When not performing reflection type work it is generally preferable to use the differential input which requires a balance coil and thus has a higher
46. e allows on screen manipu lation of data Two display screens can be alternately accessed for comparison of separate data Page 2 15 MIZ 22 Operating Guide 2 5 7 2 5 8 Alarm An alarm box is provided for either Display 1 or Display 2 e Any required position or size can be set Either the inside or outside gated area can be set to trigger e Audio and visual indicators provided Filters Filters allow for separation of desired test data from the effects of lift off and motion e Filter 1 1st Derivative Differential This filter is generally used with differential coils Filter is adjustable in 15 steps from 01 to 15 Filter 2 2nd Derivative Differential Primarily used with an absolute coil this filter allows for a more natural presentation of the flaw signal Filter is adjustable in 15 steps from 01 to 15 Page 2 16 2 0 Product Description Specifications 2 5 9 Signal Mixing 2 5 10 2 5 11 e MIX 1 This method provides a least squares data suppression mix e MIX 2 As an alternative to MIX 1 this method provides a data enhancement mix in addition to the suppression function Inputs Separate probe connectors are provided for differential single absolute and reflection driver pickup type probes e Remote connector provides RS 232 data bus for computer controlled setups external sweep trigger input for rotating probe and remote balance and hold c
47. e either FUNC button until the PRINT or second from bottom menu line is highlighted Press the LEFT or RIGHT arrow buttons to toggle the function between STORE BUF 0 through STORE BUF 9 VIEW BUF 0 through VIEW BUF 9 PRINT EPS2 PRINT HP and PRINT EPS1 With any VIEW BUF highlighted as shown in figure 4 5 press the UP or DOWN arrow button to redraw the image on the display In the upper right hand portion of the display grid a reference number is displayed that identifies the recalled screen image 1 This menu line has more than one function and can display as STORE BUF and VIEW BUF also Page 4 10 4 0 Operation Instrument Setup Figure 4 5 View Buffer Mode Reference number of stored image is displayed here 06 65 SETUP A F E A A gt 1 F2 2 0F edema Ce TREE vases XY E a ee oe POS1 POS2 a A cranes EA FREQ 4 0K PHASE 132 4 i A GAIN 34 0 feriti aaa EV 10 10 PO A oi i i II FILTER OFF niati Sanad Kanda ALARM OFF slice Fe le an Pee deh PROBE REFL Poi of of of ft ff AUTCLR 01 Menu selection for viewing the screen image buffer To print an image Whenever needed stored images can be recalled and printed The reference number prints with the screen image For more information about printing see section 4 2 14 on page 4 39 Page 4 11 MIZ 22 Operating Guide 4 2 3 Display Parameters The MIZ 22 is capable of displaying one or tw
48. e the same as conductivity measurement Follow the same process as the conductivity measurement section to setup the test During calibration a known value is used to represent a nonconductive coating such as paint thickness This known value should be somewhat close to the thickness that is expected during the test Examples of items used as shims could be a single piece of paper about three mils 0 003 thickness or Teflon tape of varying thickness Higher thickness readings may be more accurate at a lower test frequency The optimum frequency should be determined by experiment ing with the test piece After the SHIM spacer value is calibrated you can directly measure a coating thickness with the MIZ 22 at the same time as a conductivity measurement The thickness value in Page 4 57 MIZ 22 Operating Guide thousands of an inch mils displays in the box below the conductivity value Figure 4 27 Nonconductive Coating Thickness Measurement Display FREQ 60K PROBE REFL SET1 100 6 SET2 29 60 CONDUCTIVITY IN IACS SETS 8 400 SET4 3 300 SET5 0 900 SHIM 7 2 SET VALUES NEW CAL 00 IACS gt P Thickness value displays here Page 4 58 4 0 Operation Auxiliary Features 4 4 Auxiliary Features The MIZ 22 has several auxiliary features Descriptions for each of these features are included in this section of the operating guide 4 4 1 Battery Vol
49. ecreases the scale by one Page 4 20 4 0 Operation Instrument Setup Figure 4 10 V H Ratio Control A 00 Derat N 1 F2 2 0FF l XY POS1 POS2 FREQ 4 0K PHASE 132 GAIN 34 0 ME 10 10 FILTER OFF ALARM OFF PROBE REFL AUTCLR 01 PRINT S Q Use the UP and DOWN direction arrows to vary the V H ratio Page 4 21 MIZ 22 Operating Guide 4 2 8 Filters Three selections are available for the filter FILTER1 FILTER2 or FILTER OFF Both are differential filters and provide either the first derivative or the second derivative of the signal With the LEFT and RIGHT arrow keys select the delta time increment The filter corresponds with the channel A filter is not provided for the MIX channel These filters can be used to suppress unwanted signals To enable the function set the cursor to the filter field and use the UP or DOWN direction arrow to toggle between FILTER 1 FILTER 2 or FILTER OFF reference figure 4 11 When the filter is on a value from 01 to 15 appears in the field This is the filter time constant A value of 01 is the highest pass 15 the lowest Page 4 22 4 0 Operation Instrument Setup Figure 4 11 Filter Control r 00 bera 1 F2 2 0FF XY POS1 POS2 FREQ 4 0K PHASE 132 GAIN 34 0 V H 10 10 _ ALARM OFF PROBE REFL AUTCLR 01 Q PRINT P Use the UP or DOWN direction arrow to
50. ed to produce a signal channel that has little or no response to the unwanted signals yet does produce a signal from the flaws of interest Better results can be achieved digitally Rather than manually manipulating the signal with phase rotators and amplifiers as with analog instrumentation a computer can solve for the best result using mathematical techniques The digital approach uses a setof simultaneous linear equations that describe the output signal channel as a mathematical combination of the primary and subtracter signal channels Using least squares techniques the coefficients of the indepen dent variables are determined based on the signals selected and the type of mix function used Generally the two frequencies chosen for a mix operation have a ratio in the range of 2 1 to 4 1 Page 5 34 5 0 Application Examples Signal Mixing Example 5 9 1 Mixing Out Lift Off Signals The requirements for mixing out lift off signals are listed in table 5 8 Table 5 8 Requirements for Mixing Out Lift Off Signals Description Part No Catalog No A Cs Probe Detachable Tip DT20P 909 0020 Pencil unshielded Frequency Range 50 500 kHz Multi Purpose Plate Stan N A 950 5700 dard Material Aluminum Connections Connect the probe to the instrument DIFFERENTIAL connector Page 5 35 MIZ 22 Operating Guide
51. elf test cycle after which the setup menu will be displayed on the screen The self test operates properly only if a probe is not attached to the single connector Refer to section 4 4 7 on page 4 70 for more details regarding the self test The ON OFF button also controls the backlight After the instrument is powered up a brief tap on the button toggles the backlight on or off The unit consumes about 25 more power when the backlight is on so for battery operation it should be used only when required Page 3 4 3 0 Installation Front Panel Connections step4 Toturn the unit off press the ON OFF switch and hold for approximately one second Both the instrument and backlight turn off 3 4 Front Panel Connections The diagram in figure 3 2 illustrates the location of the connectors on the front panel Figure 3 2 Front Panel Connections Ge EDDY CURRENT INSTRUMENT ZETEC N PROBE l 2 SOW C9 amp 4 2 SINGLE REFLECTION DIFFERENTIAL 3 4 1 Probe Connectors The MIZ 22 provides probe connectors for reflection driver pickup single absolute and differential type probes Page 3 5 MIZ 22 Operating Guide The probe connectors are wired as listed in table 3 1 Table 3 1 Probe Connectors iaa N Location Function Reflection Pin A Drive Coil Pin B Test Coil PinC Test Return Pin D Drive Return Single Cent
52. er Test Coil Ring Test Return Differential Pin A Reference Coil Pin B Test Coil PinC Test Return Pin D Reference Return Page 3 6 3 0 Installation Front Panel Connections 3 4 2 Remote Connector The REMOTE connector provides signals for the RS 232C computer interface and for the Zetec rotating probe gun Also available are the vertical analog output and alarm indica tor signals for use with external indicator devices The REMOTE connector pin out and corresponding signal levels are as listed in table 3 2 Page 3 7 MIZ 22 Operating Guide Table 3 2 Remote Connector Pin Out Pin Signal Logic Level Maximum 1 Ground 2 Nominal 10 VDC Power 750 mA 3 Alarm Out TTL Level 2mA 4 Analog Out 2 5 V Range 5 mA 5 Sweep Trig In 0 V True 12V 6 Spare Input TTL Level 5V 7 Balance In 0 V True 5V 8 RS 232 In 12 V 9 Hold In 0V True 5V 10 RS 232 Out 5 mA Page 3 8 3 0 Installation Front Panel Connections 3 4 3 3 4 4 V and H Connectors The V vertical and H horizontal outputs provide an analog representation of the current location of the DISPLAY 1 data dot on the screen The connectors are specified as follows V 2 5V 5mA max H 3 8V 5mA max Power Connector The power connector connects with a standard instrumentation line cord to provide AC voltage for battery charging and instru ment operation The third wire of
53. erview of the MIZ 22 s conductivity measure ment process 1 Set Values including Shim 2 Complete New Calibration includ ing Shim and Air values 3 Perform Conductivity and Noncon ductive Coating Thickness Measure ments 4 Periodically Compensate for Drift during Measurement Worksession When setting up the instrument as well as during a test always keep the probe as perpendicular to the test piece as possible Complete all the steps sequentially in both the SET Page 4 46 4 0 Operation Special Features step 1 VALUES and NEW CAL sections before making any measurements SET VALUES The five set points labeled SETI through SETS are the calibration points that are preset when the instrument is manufactured and represent a calibration curve You can adjust these values to match those of your current calibration standards However it s recommended that the standards you use should be fairly close to the instrument s preset values As a minimum three set points must be used to calibrate The three coupon values must be as close as possible to the lower or upper three set points for the best results Five set points are required for the most accurate results over the entire measurement range To change a set point Use the 4 or gt button to highlight the SET VALUES menu field as shown in figure 4 21 This action changes the read out area to display the set point one at a time
54. es not flow through the sensing coil it does not undergo these geometry changes which Page 5 2 5 0 Application Examples Test Design Considerations would otherwise introduce drift into the signal Eddy current coils are optimized for certain frequency ranges and the frequency chosen depends on the desired depth of penetration into the test object Depending upon probe sensitivity and instru ment gain an operating frequency of 100 Hz might penetrate a half inch of aluminum however smaller flaws may be missed at this frequency A signal of 1 MHz provides excellent response to surface variations however this frequency may generate unwanted noise due to variations in contact of the probe to the material Some degree of experimentation is generally required to optimize the frequency for a particular test The test procedure itself can be as important as choosing the probe and operating frequency Every instrument has a certain frequency response which means that the signal of interest must be present for a certain minimum period of time before it will generate a response This is an important consideration in automated testing where the material of interest may be moved past the probe very quickly Another procedural consideration is tempera ture Both probes and test materials are subject to changes from temperature If a Page 5 3 MIZ 22 Operating Guide portable instrument is moved between temper
55. from 0 to 49 5 dB in 1 2 dB steps An example of the gain value is seen in figure 4 9 The LEFT and RIGHT direction arrows change the number by 6 steps or 3 dB The UP and DOWN direction arrows change the number in single steps Both front end analog amplification and digital scaling to the display are affected by changes in the gain number up to a value of 36 Above 36 the front end is at maximum gain and all further increases affect the display scaling only The mix channel has a maximum gain of 27 5 dB Page 4 18 4 0 Operation Instrument Setup Figure 4 9 Gain Control F 1 F2 2 0FF XY POS1 POS2 FREQ 4 0K PHASE 132 GAIN 34 0 V H 10 10 FILTER OFF _ ALARM OFF PROBE REFL AUTCLR 01 00 DEFAULT 2 PRINT I Each step represents 1 2 dB Page 4 19 MIZ 22 Operating Guide 4 2 7 V H Scaling The vertical to horizontal deflection scale is varied from 01 to 50 using the direction arrow buttons reference figure 4 10 This ratio controls the display scaling only and does not affect the front end analog gain The ratio is limited to a value less than 50 whenever the gain is set above 36 You can adjust the vertical or horizon tal scales independent of each other The UP arrow button increases the vertical scale by one the DOWN arrow button decreases the scale by one The RIGHT arrow button increases the horizontal scale by one the LEFT arrow button d
56. function and with the arrow buttons make sure that M 1 is displayed Highlight the CLEAR function and then activate the function with the up or down arrow button Highlight the SUPPRESS function and use the up or down arrow button to activate the function and perform the mix Exit the Mix Menu by pressing the lt FUNC or FUNC gt button until the Mix Menu disappears Highlight Display 1 and select MX for the display Page 5 40 5 0 Application Examples Signal Mixing Example step 19 Highlight Display 2 and select either F1 or F2 for the display shown in figure 5 17 gt EK The mix residual should appear V very small compared to the signal in Display 2 step 20 Press the HOLD button to return to normal MIZ 22 operation Figure 5 17 Mix Residual r I 08 MIX1 a 1 MX Lift Of gt i xy XY mielone aan SA A post POS 100K amp 400K PHASE 294 GAIN 27 5 V H 08 08 FILTER OFF DRAW BUFFR DATA 1986 VIEW 0282 MIX MENU SCREEN A PRINT HP STBF ner Page 5 41 MIZ 22 Operating Guide step21 Scan the probe over defects E F G and H Adjust the gain and V H to attain the desired signal length The display in figure 5 18 shows the lift off signal mixed out Figure 5 18 MX Channel Display 08 MIX1 a 1 MX 2 OFF XY POS1 POS2 100K amp 400K PHASE 299 GAIN 2
57. ggered Sweep with PING aoaaa E e tad ae s 5 20 Requirements for C scan Example with Scanneri se ace law te Sean a A batan 5 29 Requirements for Mixing Out Lift Off Signals nn sess was ye ee eee ae 5 35 Requirements for Mixing Out Varying SPACiNGiet a2cngPesteee dhe inde 5 43 Requirements for Mixing Out Tube Support Signal sii staan keke ebay det oe 5 46 Instrument Settings for Tube Support Suppression Mix 5 47 Requirements for Conductivity Measurement 5 52 1 0 General Description This operating guide is designed to familiarize the user with the specifications operation and applica tions of the MIZ 22 Eddy Current Instrument We recommend reading the entire guide through at least once after which the Table of Contents and Index can be used for a quick reference to any specific subject A technical manual is available for the MIZ 22 at an additional charge For more information about the contents or availability of this manual please contact our customer service department Zetec Inc would like to provide its product users with the most useful manuals possible We appreciate your comments and suggestions to help in achieving this goal 1 MIZ is a registered trademark of Zetec Inc Page 1 1 MIZ 22 Operating Guide 1 1 Warranty The Zetec products listed in the current equipment catalog are warranted for a period of one 1 year from date of shipmen
58. he following procedure Write the first signal to one screen Use the LEFT or RIGHT direction arrow to select the other screen Write the second signal Page 4 37 MIZ 22 Operating Guide step 4 Continuously hold down the LEFT or RIGHT arrow button The screens will be alternately displayed at the keypad repetition rate Figure 4 18 Screen A B P 00 DEFAULT V 1 F2 2 OFF XY POS1 POS2 FREQ 4 0K PHASE 132 GAIN 34 0 V H 10 10 FILTER OFF _ ALARM OFF PROBE REFL S PRINT I You can toggle between two screens to directly compare signals Page 4 38 4 0 Operation Instrument Setup 4 2 14 Printer Control The MIZ 22 prints a graphic display of the test data and the accompanying setup to a HP 320 Epson or Seiko DPU 411 Type II Thermal printer The printers can be battery operated Except for the Seiko printer printers require the Zetec Micro Buffer catalog number 2000 02 03 To select the print function move the cursor to the PRINT field If the print function mode is not shown see page 4 8 for information about selecting the print mode for the MIZ 22 With the PRINT field highlighted you can use the RIGHT or LEFT arrow button to toggle the print selection between STORE BUF VIEW BUF EPS2 HP EPS1 HP is the correct selection for ThinkJet printers EPS1 is the correct selection for an Epson printer and EPS2 is the correct selection the Seiko printer
59. he display shown in figure 4 28 for a sample of the self test screen Page 4 71 MIZ 22 Operating Guide Figure 4 28 Self Test Display Example A 2 MIZ 22 VERT 078 HORZ 078 DEV 000 PASSED VERT 090 0 HORZ 000 0 QUAD 090 7 PASSED SELF TEST FREQ 100K 135 PHASE 242 00 berat N 1 F2 2 0FF XY POS1 POS2 FREQ 4 0K PHASE 132 GAIN 34 0 V H 10 10 FILTER OFF _ ALARM OFF PROBE DIFF AUTCLR 01 PRINT I A wide deviation in expected results indicates some sort of catastrophic failure A failure of only a few percent may be acceptable however this demonstrates the need for routine calibration The next section of this manual has examples of several applications for the MIZ 22 Page 4 72 5 0 Application Examples Since there are so many attributes of an object that can be examined by eddy current testing each partic ular situation requires its own unique test setup There are however several fundamental variables that need to be considered in order to optimize results Following is a summary of some of these considerations The relative importance of each depends upon the specific test 5 1 Test Design Considerations The type of probe has a significant bearing on the outcome of a test The shape of the probe is important since it needs to have close contact with the test piece for good sensitiv ity Small changes in the co
60. ht 3 4 4 2 U U L approved accessories 2 21 Unpacking 3 1 UP or DOWN arrow key 4 6 V V and H analog outputs 4 62 V and H connectors 3 9 V and H outputs 2 2 V H ratio 4 20 VIEW 4 27 View a stored image how to 4 10 W Warning Labels 2 20 Page I 7 Warranty 1 2 Y Y T sweep 4 63 Z Zetec Micro Buffer 4 39
61. i e conductiv ity or permeability changes of ferrous or nonferrous materials This compact tester combines signal processing circuitry display and alarm circuits into one lightweight sealed unit It can be operated on battery or AC power and itis U L listed for use in hazardous locations The liquid crystal display on the MIZ 22 presents the phase and amplitude vectors of the eddy current signal as a combined two dimensional pattern The design incorporates a wide gain range and flexible alarm circuitry Any degree of signal analysis is possible from a simple go no go comparison between test parts and reference sample signals to in depth investigation of small variations in metallurgy Page 2 1 MIZ 22 Operating Guide The V and H outputs permit the user to record analog test data The Remote connector is an RS 232 serial interface which allows external computer control and transmission of data to a printer or terminal The sealed front panel controls are designed for easy operation Instrument settings are indicated on the digital LCD 2 1 Front Panel Controls Reference figure 2 1 for the location of each front panel control described in the following sections 2 1 1 Display Screen The liquid crystal display LCD is comprised of 256 horizontal and 128 vertical picture elements or pixels From left to right the first 192 x 128 pixels are used for the data display area This first area is overlaid with a
62. in at 4 36 Sereen A B ain dana A aa dan ana 4 38 Default IACS Display mna 4 43 T D 2 SP Reflection Probe mmm 4 44 SET ACJUStMEN sissies 4 48 Shim Value Adjustment 4 49 Calibration Mode 4 51 Calibration With SIM emma 4 53 Probe in Air Calibration Point man 4 54 Drift COMPENSATION memana 4 56 Nonconductive Coating Thickness Measurement Display meman 4 58 Self Test Display Example rreren 4 72 Surface Crack Indication eee 5 7 Corrosion Indication meman 5 10 Alloy Sorting Example emma 5 13 List of Figures mr Upe D ae mes D Bi lc TL TL TL a Dr a TT a Dr r amr a Ke a D Dan a igure 5 4 gure 5 5 gure 5 6 gure 5 7 gure 5 8 gure 5 9 gure 5 10 gure 5 11 gure 5 12 gure 5 13 gure 5 14 gure 5 15 gure 5 16 gure 5 17 gure 5 18 gure 5 19 gure 5 20 gure 5 21 gure 5 22 gure 5 23 gure 5 24 gure 5 25 gure 5 26 gure 5 27 Fastener Hole Flaw Indication mana 5 16 Countersink Flaw Indication man 5 19 Absolute Coil Signal without Filter cscs 5 22 Absolute Coil Signal with FILTER 1 a 5 24 Absolute Coil Signal with FILTER 2 aaa 5 25 Differential Coil Signal without Filter a 5 26 Differential Coil Signal with FILTER 1 5 27 C scan Of Flaw Indications esses 5 31 Buffered Data citi iain Ala 5 32 Set PREQ Tirinaro aidan innate 5 36 Set FREQ Zana A A Aa 5 37 Two Frequency Mix
63. k 4 60 Battery voltage readout 4 59 C C scan example 5 28 CHNG CENT 4 24 CHNG SIZE 4 24 CLEAR 4 31 Clear button 2 5 Command ASCII 4 64 Computer interface 4 62 Conductivity measurement 4 40 5 52 Conductivity sorting example 5 50 Copyright 1 3 Countersink example 5 17 D Data buffer 4 26 Data enhancement mix 4 31 DATAH 4 26 4 31 DIFF 4 34 Digital conductivity 4 40 Dimensions 2 18 Page I 2 Index Display parameters 4 12 DRAW BUFFER 4 26 E Environmental factors 2 19 Equipment cases 2 10 Equipment supplied with MIZ 22 2 8 F Fastener hole example 5 14 Filter 4 22 FORTH commands 4 66 Frequency 4 14 Front panel connections 3 5 Front panel controls 2 2 display screen 2 2 Function and direction arrows 2 4 Functional block diagram 2 8 G Gain 4 18 General Description 1 1 H Hazardous locations usage 2 20 HOLD 4 30 Hold button 2 6 HOLD mode 4 26 Page I 3 MIZ 22 Operating Guide Humidity 2 19 Installation 3 1 Instrument setup 4 4 L Least squares data supression mix 4 31 Lighting 2 19 Logic Level 3 8 Maintenance Agreement 1 4 Mix menu 4 30 MIX 1 4 32 MIX 2 4 31 4 33 Mixing out lift off signals 5 35 Mixing out varying spacing 5 43 N NEW CAL menu line in IACS mode 4 50 Ni Cad D cell batteries 4 60 Nickel Cadmium Ni Cad D cells 4 60 O ON OFF button 2 5 Operating Temperature Range 2 19 Page I 4 Index
64. le piece of paper about 3 0 mils 0 003 thickness or Teflon tape of varying thickness Higher thickness readings may be more accurate at a lower test frequency The optimum frequency should be determined by experimenting with the test piece Page 5 59 MIZ 22 Operating Guide 5 12 Sample Setup Data Worksheet Test Name Probe P N Standard P N 2 A 1 XY POS1 FREQ 7 PHASE GAIN V H FILTER ALARM POS2 PROBE AUTCLR Q PRINT Page 5 60 5 0 Application Examples Sample Setup Data Worksheet Test Name Probe P N Standard P N D 2 A 1 XY POS1 FREQ PHASE GAIN V H FILTER ALARM POS2 PROBE AUTCLR s PRINT Page 5 61 MIZ 22 Operating Guide Test Name Probe P N Standard P N POS1 POS2 FREQ K PHASE GAIN V H FILTER _ ALARM PROBE AUTCLR s PRINT p Page 5 62 Index Symbols IACS 5 50 A A B screen 4 35 Aircraft skin corrosion example 5 8 Alarm 4 24 Alloy sorting example 5 11 Analog Output 2 7 Analog outputs 4 62 Application examples 5 1 AUTCLR 4 35 Auto clear 4 35 Automatic turn off 4 59 Auxiliary features 4 59 Page I 1 MIZ 22 Operating Guide B Balance button 2 6 Basic Instrument Specifications Frequency Range 2 14 Memory 2 15 Battery life 4 61 Battery pac
65. lears the screen same as the front panel key BMP Sends 4420 bytes of screen bitmap display n SU Sends 200 bytes of configuration number n n ISU Receives 200 bytes of configuration to number n n SET Sets system configuration to number n Use FUNCS to update display 1D Sends 2 bytes of screen data d1H d1V 2D Sends 4 bytes of screen data d1H d1V d2H d2V 1R Sends 4 bytes of raw data f1H f1V 2R Sends 8 bytes of raw data f1H f1V f2H f2V Page 4 66 4 0 Operation Auxiliary Features Table 4 3 FORTH Commands Cont Command Response n BAUD Sets baud rate on serial port to n Default is 9600 DOIT Enters character command mode from FORTH Page 4 67 MIZ 22 Operating Guide 4 4 6 Probe Gun Interface The MIZ 22 probe gun interface is provided by the REMOTE and the probe connectors The REMOTE connector is designed to interface with Zetec s Motorized Rotating Bolthole Scan Gun and High Speed Bolthole Scan Gun Contact Zetec for more information about both of these items Other rotators may also be used The REMOTE connector provides nominal 10 VDC power for the probe gun motor on pin 2 ground on pin 1 and a trigger input on pin 5 The trigger input is meant to be a ground closure which occurs once every rotation of the probe The MIZ 22 automatically calculates the sweep speed of the display according to the time between the triggers The
66. ly the position origin of either display is movable to anywhere on the display when POS 1 or POS2 is highlighted Use any of the arrow keys to move the position origin of the display on the screen Page 4 13 MIZ 22 Operating Guide 4 2 4 Frequency The frequency displayed in the menu is the frequency of the channel in Display 1 Reference the illustration in figure 4 7 for an example The primary frequency range F1 of the MIZ 22 is 50 Hz to 2 MHz To change the frequency move the cursor to the FREQ field The LEFT and RIGHT direction arrows divide or multiply the frequency by factors of 10 The UP and DOWN direction arrows change the value in steps of 1 of the decade range The second frequency F2 is adjust able from 1 2 to 1 10 of the primary frequency F1 For example if the prime frequency is 400 kHz then F2 is adjustable from 200 kHz to 40 kHz The dual frequency minimum for F1 is 1 kHz To adjust the second frequency select F2 under Display 1 Move the cursor to the FREQ field Use the DOWN arrow to turn F2 on and reduce the frequency Use the UP arrow to increase the frequency and turn F2 off Page 4 14 4 0 Operation Instrument Setup With MX selected under Display 1 you can change the frequency order of a mix channel to either F1 F2 or F2 F1 With the FREQ line highlighted use any arrow key to flip the frequency order After the frequency is selected press BAL CLR or move the cu
67. maximum trigger repetition rate is 10 per second There is no minimum rate although if no trigger is present with SWEEP on the instrument does not sweep The REMOTE connector also provides balance pin 7 and hold pin 9 inputs so the operator may control these functions from push buttons on the probe gun These Page 4 68 4 0 Operation Auxiliary Features are ground closures which are electrically paralleled with the front panel keys The Zetec probe gun is designed to provide the signals for a two coil system either a differential or reflection type The cable included with the Zetec probe gun provides a splitter to divide the signals from the gun between REMOTE and the appropriate probe connector When interfacing to the REMOTE connector with an accessory not manufactured by Zetec care should be taken not to short the DC power output pin 2 to ground pin 1 When operating from battery power a short at this point blows the fuse F4 in the battery pack Since the MIZ 22 has a high sampling rate of 1250 samples per second it also supports the Zetec High Speed Scanner that rotates at up to 1500 revolutions per minute Page 4 69 MIZ 22 Operating Guide 4 4 7 Self Test The MIZ 22 self test executes automatically whenever unit power is turned on EA The self test executes properly only V if a probe is not attached to the SINGLE BNC connector The self test checks the detection ci
68. ment is powered up a brief tap on the button toggles the backlight on or off EA The unit consumes about 25 V more power when the backlight is on so for battery operation it should be used only when required More information about battery life is listed in table 2 1 on page 2 18 4 2 Instrument Setup The illustration in figure 4 2 shows the location of the display menu This menu displays the current setup parameters You can move the highlight or cursor around in the menu by pushing the FUNC gt or lt FUNC buttons When a menu line is highlighted the function can be adjusted The following sections explain each parame ter label and its function Page 4 4 4 0 Operation Instrument Setup Figure 4 2 A Q Display Menu 00 Derat N 1 F2 2 0FF XY POS1 POS2 FREQ 4 0K PHASE 132 GAIN 34 0 V H 10 10 FILTER OFF ALARM OFF PROBE REFL AUTCLR 01 A PRINT a Display Menu All of the current setup parameters are displayed 4 2 1 Setup The top line of the setup menu provides access to the 100 0 to 99 possible test setups stored by the MIZ 22 The setups are stored in non volatile memory which are retained when the power is off or the battery pack is disconnected Each stored setup is comprised of essentially all the information present Page 4 5 MIZ 22 Operating Guide in the setup menu Also stored is the balance point calculated when BAL was l
69. mmand 73 131 bytes of info flag on information new funcs cr test info flag off Q 81 triggers the serial trigger sweep 82 initialize set 83 Sends 4 1R bytes of raw data f1H f1V T 84 Sends 8 2R bytes of raw data f1H f1V f2H f2V CTRL J 10 J direction 6 user key arrow CTRL K 11 T direction 8 user key arrow CTRL L 12 direction 5 user key arrow CTRL H 8 lt direction 7 user key arrow Page 4 64 4 0 Operation Auxiliary Features Table 4 2 Power Up Commands Cont Command ASCII Response Forth ASCII Value Command lt 60 func gt 11 user key gt 62 lt func 9 user key Cc 67 CLR 10 user key B 66 BAL 14 user key H 72 HOLD 12 user key F 70 Enable exec stop on FORTH com mand line V 86 2 bytes dis 1d play 1 screen data W 87 4 bytes dis 2d play 1 amp 2 screen data 64 200 bytes su of setup 33 1200 bytes of su setup M 77 4420 bmp bytes of screen 63 cursor loca function tion emit Page 4 65 MIZ 22 Operating Guide The MIZ 22 must be placed into the Forth command line mode by typing F before the following commands are recognized Forth commands must be terminated with a CR ASCII 13 Table 4 3 FORTH Commands Command Response FUNCS Updates the screen status display BAL Performs the balance function same as the front panel key CLR C
70. n Once stored images can be recalled for viewing or printing Images are stored in non volatile retained when the power is off or the battery pack is disconnected memory This feature gives an operator the option of storing images at one location and then printing at a different location Figure 4 4 Screen Image Buffer Menu Selection r 65 SETUP 1 F2 2 OFF XY POS1 POS2 FREQ 4 0K PHASE 132 GAIN 34 0 V H 10 10 FILTER OFF ALARM OFF PROBE REFL AUTCLR 01 A d Menu location for store and view screen image buffer and print function Page 4 8 4 0 Operation Instrument Setup To store an image With the screen image drawn on the display use either FUNC button until the PRINT or second from bottom menu line is highlighted Use the LEFT or RIGHT arrow buttons to toggle the function between STORE BUF 0 through STORE BUF 9 VIEW BUF 0 through VIEW BUF 9 PRINT EPS2 PRINT HP and PRINT EPS1 With any STORE BUF highlighted press the UP or DOWN arrow button to activate the function To confirm the image has been stored the message STORED flashes on the display All images remain in memory until you store a new image with the same number 1 This menu line has more than one function and can display as STORE BUF and VIEW BUF also Page 4 9 MIZ 22 Operating Guide To view an image A stored screen can be recalled at any time To do so us
71. nductivity reading For best results the test piece probe and standards should be kept at the same temperature for the duration of the setup and test Frequency Selection Traditionally conductivity measure ments have often been performed at 60 kHz The MIZ 22 offers a choice of three frequencies that can enhance the accuracy of the measurement In general to obtain the best response use a higher frequency for a material with a lower conductivity value Page 5 51 MIZ 22 Operating Guide The requirements for a conductivity measure ment test are listed in table 5 14 Table 5 12 Requirements for Conductivity Measurement Description Part No Catalog No Driver Pick Up Spot Probe T D SP 931 0200 0 375 diameter with 6 ft cable 5 Certified Conductivity Itis recommended that the conduc Coupons 100 4 29 3 tivity coupons you use are fairly 8 1 3 332 and 1 047 close to the instrument s preset IACS values These options for standards are available from Zetec if needed 100 4 29 5 8 1 3 332 1 047 5 Piece Conductivity Cou Dwg No 2 4705 pon Set Certified Page 5 52 5 0 Application Examples Conductivity Measurement Example Table 5 12 Requirements for Conductivity Measurement Cont Description Part No Catalog No
72. ng steps in sequence to setup and perform a C scan test Setup step1 Set the instrument variables as illustrated in table 5 11 step2 Insert the probe into hole O Page 5 30 5 0 Application Examples C scan Example step 3 step 4 step 5 Start the probe gun to initiate the C scan Adjust the phase as necessary to minimize the lift off effects Insert the probe into hole K Figure 5 11 C scan of Flaw Indications 04 FASTEN 360 1 F1 2 0FF SCAN POS1 POS2 FREQ 100K PHASE 160 GAIN 20 0 V H 10 10 FILTER2 03 ALARM OFF PROBE DIFF 4 SCREEN A PRINT P step 7 step 8 Adjust the gain to get the desired response from the EDM notch With the probe fully extended insert the probe through hole R Energize the gun and activate the indexing by pulling the trigger This will cause the probe to travel through the hole with an axial travel of 0 025 per revolution Page 5 31 MIZ 22 Operating Guide The C scan is halted by turning off the gun This allows any portion of a fastener hole to be viewed with the DRAW BUFR function as seen in figure 5 12 Figure 5 12 Buffered Data 4 FASTEN 01 F1 2 0FF SCAN POS1 POS2 FREQ 100K PHASE 160 GAIN 20 0 V H 10 10 FILTER2 03 DRAW BUFFR DATA 2715 VIEW 294 MIX MENU PRINT STBF HP Page 5 32 5 0 Applicati
73. nhancement mix MIX 2 In addition the MIZ 22 is capable of supporting rotating probe sweeps up to 1500 r min C scan also known as waterfall plots are also supported This section gives complete details about operating all the instrument s features 4 1 Turning On Unit and Backlight The illustration in 4 1 shows the location of the ON OFF function keys Complete the following steps in sequence to turn ON the MIZ 22 and the backlight step 1 To turn the MIZ 22 on hold the ON OFF reference figure 4 1 switch in for approximately one second then release The power turns on when the switch is released At this time the instrument goes through a brief self test cycle after which the setup menu is displayed on the screen The self test operates properly only if a probe is not attached to the SINGLE connec tor Page 4 2 4 0 Operation Turning On Unit and Backlight Figure 4 1 ON OFF Control 1 sec lt a MIZ 22 EDDY CURRENT INSTRUMENT BAL gt g AE PROBE E QIE ert ews Hold the ON OFF switch in for approximately 1 second If the self test fails press the HOLD button and then cycle the power keeping the HOLD button depressed This action shows the calibration loop on the display for diagnostic purposes Page 4 3 MIZ 22 Operating Guide step2 The ON OFF button also controls the backlight After the instru
74. nts the sweep will automatically stabilize Use FILTER 1 for the differential coil probe and FILTER 2 for an absolute coil probe Use of the filter will keep the probe balanced when it makes the transition from air to metal and will remove low frequency noise When selecting a filter value decrease the number raise the high pass until noise is suppressed while adequately maintaining good amplitude of the flaw signal The signal shown in figure 5 6 represents an absolute coil signal without any filtering You will notice the low frequency rotational noise due to angle of probe or fill factor Page 5 23 MIZ 22 Operating Guide Figure 5 7 shows an absolute coil signal with FILTER 1 The rotational noise is mostly removed but the rising and falling slopes show as positive and negative excursions Figure 5 7 Absolute Coil Signal with FILTER 1 99 ROT ABS 1 F2 2 OFF SWP POS1 POS2 FREQ 100K PHASE 210 GAIN 16 0 V H 05 05 FILTER1 06 DRAW BUFFR DATA 0256 VIEW 0165 PRINT H STBF RCB zy Page 5 24 5 0 Application Examples Triggered Sweep with Filter Example An absolute coil signal with FILTER 2 is shown in figure 5 8 The rotational noise is entirely removed and the negative excursion is mostly eliminated This filter results in a flaw presen tation more like the original figure 5 6 The small negative lobes are a residual of the filter process
75. o channels With the first display selected see figure 4 6 the UP and DOWN arrow buttons select three channel choices of F1 primary frequency F2 second frequency and MX combination of F1 and F2 Figure 4 6 Display Parameters A Display 1 Display 2 00 er 2 0FF bo XY POS1 POS2 FREQ 4 0K PHASE 132 GAIN 34 0 V H 10 10 FILTER OFF _ ALARM OFF PROBE REFL AUTCLR 01 Q PRINT w Use the UP and DOWN arrow keys to select three channel choices In single frequency mode 2 OFF all choices will actually display F1 The channel information shown in the Page 4 12 4 0 Operation Instrument Setup menu is for this displayed channel In order to change the channel parame ters the channel must be displayed in Display 1 The channel will retain these parameters when selected in Display 2 The MIZ 22 can be set to display data in either an XY impedance plane mode a YT triggered sweep mode or a cascaded scan The LEFT and RIGHT arrow keys select the choice of the display type between XY SWP sweep or SCAN C scan The MIZ 22 automatically synchro nizes the sweep to a trigger at pin 5 on the REMOTE connector In the absence of an external trigger or the trigger happening too fast the unit will not sweep The second display has four channel choices F1 F2 MX and OFF If the second display is enabled the display type is only the XY type Additional
76. ole Scanner The next section of this manual is about the installa tion of the MIZ 22 instrument Page 2 24 3 0 Installation This section of the operating guide starts with unpacking the instrument after it arrives and then goes through the system setup until it is ready for operation 3 1 Unpacking Use the following steps to unpack the MIZ 22 when it arrives step 1 step 2 step 3 Carefully remove the MIZ 22 from the shipping carton by grasping the carrying handle on the top and place the instrument on an appropriate work surface with the handle facing upward Reach under the bottom of the instru ment and pull the leg found there all the way forward This angles the front display to the best advantage for use Remove the front cover by unfasten ing the two buckles on the top and sliding it to the left Page 3 1 MIZ 22 Operating Guide 3 2 Power Requirements The MIZ 22 can be operated on battery or AC power Before plugging the instrument into the AC line assure that the voltage select switch located on the inner lid of the battery pack is placed in the proper setting refer to figure 3 1 to reference the location of the voltage select switch Figure 3 1 Battery Pack Top Assembly Detail W O S Battery Cable 4 008025 O gp Charger Power 4 008022 a D 115 Voltage Select Switch 4 008064 O O
77. omputer Interface The MIZ 22 has an RS 232C computer interface through the front panel REMOTE connector Pin 1 is for ground pin 10 for transmit from the MIZ 22 and pin 8 for receive No handshaking is required The data format is 9600 baud no parity single stop bit The computer or terminal can exercise all the functions available on the MIZ 22 keypad with the exception of power on or off This allows full setups to be sent to the instrument which stores in non volatile memory just as if they had been entered on the keypad Page 4 62 4 0 Operation Auxiliary Features In addition the MIZ 22 can be commanded to trigger the Y T sweep to send the current setup to the computer or to send one of the two types of eddy current data raw data or screen data Raw data consists of 2 bytes each for the X and Y components digitized data direct from the analog to digital converter before it has been scaled or rotated for the screen Screen data returns one byte each corresponding to the present horizontal 0 to 192 pixels and vertical 0 to 128 pixels position of the data dot The commands listed in tables 4 2 and 4 3 are provided for external computer control Page 4 63 MIZ 22 Operating Guide The commands in table 4 2 are recognized in the power up character command mode by the MIZ 22 Table 4 2 Power Up Commands Command ASCII Response Forth ASCII Value Co
78. on Examples Signal Mixing Example 5 9 Signal Mixing Example The mixing of eddy current signals from two or more test frequencies is a multiparameter technique used with multifrequency test methods This technique combines the results of testing at more than one frequency to separate the test variables As an example the test variables can include the following effects lift off variation caused by probe wobble flaws caused by cracking or corrosion By far the most important aspect of the multiparameter technique is detecting and sizing flawed conditions in the presence of the undesirable effects of other variables These undesirable effects such as lift off are minimized or eliminated while retaining the signals from the desirable parameters such as flaws The key is to select frequencies such that the ratio of Haw Sa Aa z is greater for the primary frequency than for the subtracter frequency Frequency selection that provides this difference will usually also provide a phase relationship between flaw signals and unwanted signals that differs between primary and subtracter frequencies In the analog instrumentation approach the X and Y signal components of the subtracter Page 5 33 MIZ 22 Operating Guide channel frequency are rotated and scaled such that the resulting unwanted signal matches the same signal in the primary frequency The outputs of these primary and subtracter channels are then combin
79. ontrols Outputs Vertical and horizontal analog outputs available on BNC connec tors for chart recorders and other instruments Remote connector provides RS 232 data bus for screen dumps to printer and transfer of test data to computer External alarm indicator and vertical analog signal are also present on the remote connector Page 2 17 MIZ 22 Operating Guide 2 5 12 2 5 13 Power Requirements AC input 115 230 VAC 50 60 Hz 33 watt maximum e Switch selectable on inner lid of battery pack Battery Pack Contains nine NI CAD D cells with built in charger Under full charge the unit operates for approximately 8 hours without any accessories turned on However battery life is reduced while accessories are operating as listed in table 2 1 Table 2 1 Battery Life with Accessories Accessory Backlight 1 5 hours Heater below 40 F 0 to 2 hours depending on ambient temperature Zetec Probe Gun 1 5 hours 2 5 14 Dimensions e Size 6 5 high x 10 5 wide x 14 5 deep 16 51 cm x 26 67 cm x 36 83 cm Weight 20 pounds 9 072 kg Page 2 18 2 0 Product Description Environmental 2 6 Environmental Several environmental factors may affect the operation of the MIZ 22 Reference the following sections for more information about these factors 2 6 1 Operating Temperature Range e 20 to 125 F 6 7 to 51 7 C 2 6 2 Storage Tempe
80. orts the Zetec High Speed Scanner Equipment Cases Two custom designed cases are available a hard shell foam lined case for shipping the instrument or a lightweight padded bag with shoulder strap for ease of carrying the unit The second case also allows the operator to view and operate the instrument without any unpacking Page 2 10 2 0 Product Description Specifications 2 5 Specifications The MIZ 22 is a portable eddy current instrument designed for defect detection thickness gauging and measurement of the conductivity of electrically conductive materials Two simultaneous frequencies signal mixing data filtering and special display capabilities enhance the MIZ 22 s ability to detect defects While using one frequency this instrument has a maximum sampling rate of 1250 samples per second to increase its produc tion rate and quality of data However while using two frequencies the maximum sample rate is 400 samples per second The instrument utilizes a liquid crystal display for both presentation of X Y impedance plane data and for read out of operating parameters The rugged aluminum housing and waterproof construction make the instrument suitable for use under a variety of inclement conditions as well as in the laboratory The high gain analog inputs and micropro cessor based design provide excellent sensitivity and stability in the signal processing of the unit Many additional features such
81. plete the following steps in sequence to setup and perform a surface crack test Setup step 1 Set the instrument variables as illustrated in figure 5 1 step2 Place the probe on a defect free area of the standard step 3 NULL the instrument Page 5 6 5 0 Application Examples Surface Crack Example step4 Scan the probe across NOTCHES E SPa G and H consecu tively Figure 5 1 Surface Crack Indication Tr 1 F1 2 0FF oVsuRFACE NN POS2 200K 075 21 0 20 20 OFF OFF PROBE DIFF SCREEN A PRINT i The V H scale is adjustable to enhance the signal to lift off separa tion o Page 5 7 MIZ 22 Operating Guide 5 3 Aircraft Skin Corrosion Example Corrosion of hidden surfaces can be detected using eddy current It is a comparative technique in that readings made in a suspect area are compared with instrument readings obtained from sound non corroded material The requirements for this test are listed in table 5 2 Table 5 2 Requirements for Aircraft Skin Corrosion Test Description Part No Catalog No 10 4880 f Detachable Tip DTDP 500 SP 910 4880 Driver Pickup Spot Probe Frequency Range 500 Hz 30 kHz Page 5 8 5 0 Application Examples Aircraft Skin Corrosion Example Table 5 2 Requirements for Aircraft Skin Corrosion Test Cont
82. pressed as a percent age of this standard In the metric system these same ratings are based on units of Megasie mens meter MS m The conversion between conductivity in MS m and IACS is shown in equation 4 1 Equation 4 1 MS m to IACS Conversion MS m 1 7241 IACS Both the IACS and MS m conductiv ity ratings of several common metals and alloys are given in table 4 1 Table 4 1 Nominal Electrical Conductivity of Various Materials IACS MS m Material 1 72 1 Inconel 2 5 1 5 304 Stainless Steel 3 5 2 Titanium 8 5 Pure Lead 9 5 Aluminum Silicon Bronze 16 9 Platinum Palladium 22 30 13 17 Beryllium Copper 27 16 Yellow Brass 5056 Aluminum Page 4 41 MIZ 22 Operating Guide Table 4 1 Nominal Electrical Conductivity of Various Materials Cont IACS MS m Material 28 16 Cartridge Brass 29 17 AL 2024 T4 30 17 Tungsten 32 19 AL 7075 T6 35 20 5052 Aluminum 421 24 AL 6061 T6 42 24 Commercial Bronze 47 27 AL 6061 T3 60 35 AL 1100 F 65 38 Pure Aluminum 75 44 Pure Gold 95 983 55 57 Machining Copper 101 59 Oxygen Free Copper 104 61 Pure Copper 106 62 Pure Silver 1 Material in stock at Zetec Refer to the Zetec Probe Catalog for more information 2 Depends on degree of precipitation hardening 3 Depends upon oxygen content and other trace impurities With
83. r service depart ment Figure 4 20 T D SP Reflection Probe 0 375 dia To determine the minimum thickness required for a test sample of various conductivity materials at different frequencies refer to equations 4 2 and 4 3 Page 4 44 4 0 Operation Special Features Equation 4 2 Calculation of Standard Depth of Penetration 26 oe 6 standard depth of penetration in inches f frequency in Hertz conductivity in IACS Equation 4 3 Calculation for Minimum Thickness 2 68 minimum thickness required for test sample 6 standard depth of penetration in inches Test Sample Minimum Thickness in 0 100 0 090 0 080 0 070 0 060 0 050 0 040 0 030 0 020 0 010 0 60 kHz 120 kHz 240 kHz Conductivity in IACS Keep in mind that each time you change the frequency or probe you will have to complete the calibration routine Page 4 45 MIZ 22 Operating Guide Before using the MIZ 22 s conductiv ity measurement feature the calibra tion curve values must be set and conductivity values verified with certified standards The shim value for nonconductive coating measure ments is set at the same time as any other Set Values Once the calibration routine is complete you can use the calibrated Set Values to zero the measurement range and compensate for drift The following list is an ov
84. rature Range e 0 to 140 F 17 7 to 60 C 2 6 3 Humidity 0 to 100 percent 2 6 4 Lighting e Internal backlight allows operation in total darkness Display maintains full contrast in brightest sunlight Page 2 19 MIZ 22 Operating Guide 2 7 Hazardous Locations Usage The MIZ 22 is Underwriters Laboratories approved for use in Class I Group D Hazardous Locations which include aircraft environments where explosive fuel vapors may be present Essentially this approval means that under battery operation there is no failure mechanism present in the instrument that will cause ignition of such vapors Rating and warning labels are on the top surface of the unit and on the inner lid of the battery pack The labels concern both general usage and hazardous environments For operator safety all of these precautions should be followed 2 7 1 Hazardous Locations When operating specifically in hazardous locations only accessories probes or other items connected to the front panel that have been approved by U L should be used The evaluation is based on the measure ment of the inductance and resistance of the device Page 2 20 2 0 Product Description Hazardous Locations Usage Items presently approved are various eddy current probes and accessories Other items will be added to the list as required Contact Zetec Inc to arrange a review of any accessory for which you desire hazardous loca
85. rcuitry for proper operation of the probe signal During self test a probe signal is simulated internally The signal is demodulated and checked for amplitude and phase accuracy If the unit passes the test a right triangle is drawn on the screen after which the screen is cleared and normal operation proceeds If the test fails the results are briefly displayed on the screen If you want to show the calibration loop on the display for diagnostic purposes press the HOLD button and then cycle the power while keeping the HOLD button depressed At this point operation will not proceed unless the power is cycled on the MIZ 22 Page 4 70 4 0 Operation Auxiliary Features While the MIZ 22 is in the self test mode all other functions are disabled with the exception of the UP and DOWN arrow keys These keys toggle through the following seven test frequencies and restart the internal cycling e 100 Hz 1 0 kHz 10 kHz 100 kHz 400 kHz 1 0 MHz 2 0 MHz Two sets of test results are shown on the left side of the screen The upper set is the X and Y amplitude error During the test the instrument generates two signals of a known amplitude which are 90 apart in phase The X and Y amplitudes are required to measure 80 8 counts from the A D converter The phase between the two signals is required to be measured as 90 3 The second set of results is for a quadrature phase error check Reference t
86. robe Detachable Tip DT 100 125 910 4802 Spring Loaded Surface Scan Probe Frequency Range 50 500 kHz Page 5 11 MIZ 22 Operating Guide Table 5 3 Requirements for Alloy Sorting Example Cont Description Part No Catalog No Multi Purpose Plate Stan N A 950 5700 dard Material Aluminum Connections Connect the probe to the instrument DIFFERENTIAL connector Complete the following steps in sequence to setup and perform a conductivity test Setup step1 Set the instrument variables as illustrated in figure 5 3 step2 Hold the probe away from any conductive materials step 3 Balance the probe Page 5 12 5 0 Application Examples Alloy Sorting Example step4 Center the probe on each of the conductivity calibration blocks Figure 5 3 Alloy Sorting Example 03 CONDUC 1 F1 2 OFF XY POS1 POS2 FREQ 60K PHASE 197 GAIN 04 0 V H 10 10 FILTER OFF ALARM OFF PROBE DIFF SCREEN A PRINT I A Lead 8 3 IACS B Aluminum 29 IACS C Aluminum 46 IACS D Copper 100 7 IACS Page 5 13 MIZ 22 Operating Guide 5 5 Fastener Hole Example Special probe shapes and sizes are designed with specific test parameters in mind In this example the probe s outside diameter is slightly smaller than the fastener hole it is intended to inspect The requirements for testing a fastener hole are listed
87. rsor to cause data acquisition to begin Figure 4 7 Frequency Control A 00 perut NN 1 F2 2 0FF XY POS1 POS2 PHASE 132 GAIN 34 0 V H 10 10 FILTER OFF _ ALARM OFF PROBE REFL AUTCLR 01 A PRINT I To change the frequency move the cursor to the FREQ field Page 4 15 MIZ 22 Operating Guide 4 2 5 Phase The phase value of Display 1 is shown on the menu Phase rotation is generally used to place a signal within a frame of reference that is familiar to the user For instance the lift off signal from a probe is generally placed on the horizontal axis See figure 4 8 for an example of the menu On the PHASE function line a number between 0 to 359 appears on the right hand side of the field When the line is highlighted the UP and DOWN direction arrows change the phase in units of one and the LEFT and RIGHT direction arrows change the phase in units of ten The rotation proceeds in a clockwise manner from 0 to 359 Page 4 16 4 0 Operation Instrument Setup Figure 4 8 Phase Control r 00 Derat N 1 F2 2 0FF XY POS1 POS2 FREQ 4 0K IN PHASE 132 GAIN 34 0 V H 10 10 FILTER OFF ALARM OFF PROBE REFL AUTCLR 01 A PRINT I The phase value of Display 1 is shown on the menu Page 4 17 MIZ 22 Operating Guide 4 2 6 Gain The gain number of Display 1 is shown in the menu and can be varied
88. s the cursor down and in the MIX MENU field to the left The direction arrows have different functions depending on the position of the cursor They are used variously to turn functions on and off to change parameters to enter configuration names and to manipulate the alarm area When the cursor is moved entirely out of the setup menu the direction arrows are disabled The direction arrows are explained in detail in the descriptions of the specific setup items Page 2 4 2 0 Product Description Front Panel Controls 2 1 3 ON OFF Button The ON OFF button is used to turn the MIZ 22 on and off To turn the MIZ 22 on hold the ON OFF switch in for approximately one second then release The power turns on when the switch is released The ON OFF button also controls the backlight After the instrument is powered up a brief tap on the button toggles the backlight on or off To turn the unit off press the ON OFF switch and hold it for approximately one second Both the instrument and backlight turn off Clear Button The CLR button can be used at any time to erase the test data area of the screen except when the HOLD function is activated The setup menu on the right hand side is unaffected Page 2 5 MIZ 22 Operating Guide 2 1 5 Balance Button The balance button causes the instru ment to adjust the horizontal and vertical amplifiers of the analog section to approximately zero volts an
89. separa tion Page 5 16 5 0 Application Examples Countersink Example 5 6 Countersink Example The special shape of the countersink probe is designed to match the size and angle of a countersink hole In this example the differ ential coil is located at an angle that keeps the surface to coil spacing a constant The requirements for a countersink inspec tion are listed in table 5 5 Table 5 5 Requirements for Countersink Test Example Description Part No Catalog No e ane gt IERS a A Differential Countersink A MBH CSSC 920 8330 Probe Freq Range 50 400 kHz Adapter Cable Zetec 4 pin N A 940 1721 to Microtech 4 pin Page 5 17 MIZ 22 Operating Guide Table 5 5 Requirements for Countersink Test Example Cont Description Part No Catalog No E F G A B D 5 32 CSK MEO H J C D Q 3 16 CSK 100 K L M 008 P P Aircraft Skin Standard N A 950 5600 Material Aluminum Connections Connect the probe to the instrument DIFFERENTIAL connector Complete the following steps in sequence to setup and perform a countersink hole test Setup step1 Set the instrument variables as illustrated in figure 5 5 step2 Insert the probe in hole B hole without a flaw step 3 Balance the probe Page 5 18 5 0 Application Examples Countersink Example
90. t to original purchaser They are warranted to conform to Zetec specifica tion and to be free from defects in material or manufacture when used with Zetec equipment Liability is limited to servicing or replacing defective parts except those items which would require periodic replacement due to normal wear during use This does not include calibra tion nor minor maintenance as outlined in Zetec Operating Manuals In no event shall Zetec Inc be liable under any circumstances for loss of profits or other contingent consequential or special damages Units are to be returned transportation prepaid by the buyer and returned to buyer freight collect This warranty shall not apply to products which have been subjected to misuse improper installation repair alteration neglect accident inundation fire or operation outside published maximum ratings Page 1 2 1 0 General Description Copyright 1 2 Copyright The information contained in this document is subject to change without notice Neither Zetec Inc nor any person acting on behalf of Zetec Inc makes any warranty expressed or implied with respect to the use of any information apparatus method or process disclosed in this document Zetec Inc shall not be liable for errors contained herein or for incidental or consequential damages in connection with the furnishing perfor mance or use of this material This document contains proprietary information
91. tage Readout The battery voltage readout can be accessed at any time by placing the instrument in the HOLD mode Also the voltage appears automatically whenever it is below 9 6 volts At this point there would be about 30 minutes of useful battery life remain ing When the unit is plugged into the AC line a voltage regulator supplies DC input power In this case the read out indicates between 10 2 and 10 6 volts 4 4 2 Automatic Turn Off The MIZ 22 turns itself off if the battery voltage drops to 9 0 volts in order to prevent damage or deteriora tion of the cells At this time the unit should be placed on charge The batteries should not be left in a discharged condition for a prolonged period of time Page 4 59 MIZ 22 Operating Guide 4 4 3 Battery Pack The MIZ 22 battery pack is comprised of nine Nickel Cadmium Ni Cad D cells arranged in series and the required charging circuitry The battery pack also includes a built in AC receptacle which allows a spare battery pack to be kept on charge while the MIZ 22 is in use A voltage select switch is located on the inner lid of the battery pack to allow for 115 or 230 VAC operation Sge Failure to set the switch properly ce may cause damageto the instru ment The cells are charged at a nominal 400 mA when the unit is turned off and 100 mA when it is on If the batteries are fully discharged they will require 16 hours to recharge at the
92. the MIZ 22 you can directly measure metals and alloys to display Page 4 42 4 0 Operation Special Features conductivity as a numerical read out in IACS To switch to the instru ment s conductivity measurement mode use the or button to highlight the SETUP menu field Use the a or v button to toggle through the available setups until the instrument displays 00 IACS An illustration of the Conductivity display is shown in figure 4 19 Figure 4 19 Default IACS Display Lock character a FREQ 60K PROBE REFL SET1 100 6 SET2 29 60 CONDUCTIVITY IN IACS SET3 8 400 SET4 3 300 SET5 0 900 SHIM 7 2 SET VALUES NEW CAL LIFTOFF IN MILS 00 IACS D A P Fixed decimal locations To change the frequency between 60 120 and 240 kHz you must first disable the setup lock Informa Page 4 43 MIZ 22 Operating Guide tion about the setup lock is located on page 4 7 With the lock disabled highlight the FREQ line and use any arrow button to select between the three operating frequencies 60 120 and 240 kHz EA Deselecting the FREQ line V automatically locks the new frequency but you are still able to reset values and calibrate The reflection probe shown in figure 4 20 is required for conductivity testing with the MIZ 22 and it is sold as a separate item For more informa tion about this probe please contact the Zetec s custome
93. tion approval 2 7 2 U L Approved Accessories The following tables are lists of the approved probes and accessories as of April 1988 Table 2 2 U L Approved Probe List Part Number Type Saris Z 144 P Pencil 910 6000 Z 145 P Pencil 910 6010 Z 146 P Pencil 910 6020 Z 147 P Pencil 910 6030 Z 148 P Pencil 910 6040 Z 145 P S Pencil N A P 3 ADJ Pencil 914 6120 P 9025 ADJ Pencil 912 6400 P 9031 ADJ Pencil 912 6410 Z 145 PRA Pencil 910 8100 Z 1995 GCD Pencil N A PF9025 1X2 Pencil N A PF9025 2X1 Pencil N A Page 2 21 MIZ 22 Operating Guide Table 2 2 U L Approved Probe List Cont Part Number Type vise PF 2 Pencil JA PFC9025 3 Pencil JA PFC 3 Pencil JA PF9025 1X2H Pencil JA PF9025 2X1H Pencil JA PF4550 2XH Pencil JA 10 11605REF COIL Reference JA Z2 125 Bolthole 920 8200 Z2 125 2 Bolthole 920 8300 MBH S 125 Rotating Bolthole 921 8400 Z 4500 375 Spot 925 8500 Z 600 375 Spot 925 8502 Z 100 125 Spot 925 8504 Z 25 125 Spot 925 8506 Z 5 125 Spot 925 8508 Z 3 125 Spot 925 8510 2 351009 Shielded Spot N A 550 5000 Low Freq Spot 927 8650 SP 4500 375 Low Freq Spot N A DP 750 SP Reflection Spot 930 8820 DP 500 SP Reflection Spot 930 8810 DP 270 SP Reflection Spot 930 8802 DP Differential Reflection Spot N A 1000 62000 Low Freq Ring N A DP 310 R Reflection Ring 931 00
94. umber of sweeps But while in the SCAN mode the display will erase and restart after each complete C scan plot is drawn on the display Pressing the BAL button also restarts the C scan plot The screen memory is volatile therefore the test data will not be retained when power is switched off Figure 4 17 Auto Clear Control P 00 DEFAULT V 1 F2 2 OFF XY POS1 POS2 FREQ 4 0K PHASE 132 GAIN 34 0 V H 10 10 FILTER OFF _ALARM OFF PROBE REFL AUTCLR 01 S PRINT I Set the mode to AUTOCLEAR using the UP or DOWN direction arrow 1 A characteristic of data that can be lost during power failure Page 4 36 4 0 Operation Instrument Setup step 1 step 2 step 3 The MIZ 22 has two screen memories to which it can store and display data To select the store on screen mode use the UP or DOWN direction arrows to toggle the display line between SCREEN A SCREEN B or AUTCLR Once the display line indicates a screen you can toggle between SCREEN A and SCREEN B with the LEFT and RIGHT arrow buttons as shown in figure 4 18 The display line indicates the screen to which data is being written and from which the signal is being displayed Data will accumulate on the screen until the CLR button is pressed The alternate screen can be selected at any time by using the LEFT or RIGHT direction arrow to toggle between the two This lets you directly compare signals by using t
95. upling of the source magnetic field to the test object can cause variations in results which will overwhelm the desired test data In addition to the shape of the probe several coil configurations are available The coils in Page 5 1 MIZ 22 Operating Guide an eddy current system must generate the source magnetic field as well as detect the secondary magnetic field from the test piece The same coil can do both jobs and the simplest version of this is the single or absolute coil The instrument detects changes across this coil with no other reference to zero from the large initial offset generated by the coil itself Hence the gain of such a system is somewhat limited An improved situation is to include a second coil to electrically balance out the first This is called a differential probe The second coil is sometimes contained within the probe connector or even in the instrument itself The best sensitivity for a differential configu ration is achieved however when the second coil is mounted in such a way as to see a similar material as does the test object In this way maximum balance and highest gain can be achieved A variation on both single and differential probes is the reflection or driver pickup configuration In this case the source coil is separated from the sensing coil This is particularly useful in low frequency work where the source coil tends to heat up and change shape Since drive current do

MIZ-22 Eddy Current Tester

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