here - Bedzyk Research Group
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1. 2 01 1 99 1 98 1 97 1 96 1 96 4 Circle ISKW User Manual v5 NU X Ray Lab M J Bedzyk July 1 2010 Appendix C Mathematica Codes for 2D Graphics SetDirectory Users bedzyk Desktop Data amp Analysis 4circlel 8kw Summer2008 BTO STO Si 001 july08 Users bedzyk Desktop Data amp Analysis 4circlel18kw Summer2008 BTO STO S1001 july08 datal Import HLcts_data csv CSV ListContourPlot datal PlotRange gt All ContourLabels gt Automatic FrameLabel gt H K Si r l u L Si r lu AspectRatio gt Automatic PlotLabel gt hklmesh scans at BaT103 2 0 2 peak hklmesh scans at BaTiO3 2 0 2 peak L Sirlu 185 1 90 1 95 2 00 H K Siriu 4 Circle 18K W User Manual v5 NU X Ray Lab M J Bedzyk July 1 2010 Appendix D Parafocusing and Sagittal focusing Side view Fig 1 Top Defocusing effect of mosaic crystals in the plane perpendicular to the diffraction plane The beam divergence is increased in 2tSinOg due to crystal mosaicity t Bottom Parafocusing effect of a mosaic crystal in the diffraction plane Several rays with the same energy coming from the source point S are diffracted by different crystallites inside the mosaic crystal according to Bragg s law This requires that the ray has to travel inside the crystal until it finds a crystallite with the correct orientation The diffracted rays converge to a point S assuming that the penetration depth and footprint on the crystal are dis2. You of course can go to PHI 180 YO middle value of omega YO should equal tth 2 Op Chisg 3 5327e 6 R H deg b Ideg Fig 4 The Si 004 RC peak 0 position as a function of the azimuthal angle d The fit to the data determines the miscut angle between the 004 xtal direction and the surface normal 350 400 iii E g Si 202 S b eg ho E Qio wh gt ca202 This gives 20 0 y should be 45 At this point is incorrect gt an 47 299 23 6495 gt umvr chi 45 this is the case for moving to the Si 202 gt ascan phi 50 140 900 5 this course scan will pass through one of the 4 fold symmetric 202 peaks Found 202 peak at 133 6 a full 360 phi scan shows all 4 peaks separated in 90 intervals gt dscan phi 1 1 40 5 gt umv phi CEN 133 57 gt dscan th 2 2 40 5 gt umv th CEN gt dscan chi 2 2 40 A umy chi CEN gt d2scan tth 2 2 th 1 1 40 5 umv tth CEN umv th look up th in scan table repeat above e thru h centering scans until no change gt orl 202 4 Circle ISKW User Manual v5 NU X Ray Lab M J Bedzyk July 1 2010 k gt prlm_ paste this in your NoteBook label it as 1 202 peak and T 0 24 If you want to do scans in this vicinity of recip space you should do gt or_swap m gt pa this will tell you the primay and secondary HKL used for determining the orientation matrix n You can now describe the 3D crystallo
3. ListPlot3D dataKLS1202 PlotRange gt All AxesLabel gt K L CPS BoxRatios gt 1 2 5 1 PlotLabel gt KL Mesh Scan at Si 202 cI Mesh Scan at Au 202 200000 CPS 100 O00 4 Circle ISKW User Manual v5 NU X Ray Lab M J Bedzyk July 1 2010 ListContourPlot dataHLSi202 PlotRange gt All FrameLabel gt H L AspectRatio gt Automatic PlotLabel gt HL Mesh Scan at 1 202 HL Mesh Scan at Si 202 1 96 1 98 2 00 2 02 2 04 H ListDensityPlot dataHLSi202 PlotRange gt All ColorFunction gt Hue Mesh gt Automatic FrameLabel gt H L AspectRatio gt Automatic PlotLabel gt HL Mesh Scan at Si 202 2 04 HL Mesh Scan at Si 202 2 02 2 00 1 98 1 96 RG 2 00 202 2 04 H 4 Circle ISKW User Manual v5 NU X Ray Lab M J Bedzyk July 1 2010 ListPlot3 D dataHLSi202 PlotRange gt All AxesLabel gt H L Counts ____ PlotLabel gt HL Mesh Scan at Si 202 HL Mesh Scan at Sif202 4 Circle ISKW User Manual v5 NU X Ray Lab M J Bedzyk July 1 2010 MatLab Codes clear all D zeros 11 1681 D load HLmesh txt ti 1 96 0 001 2 04 XI YI meshgrid ti ti ZI griddata X Y Z X1 YI figure 1 imagesc X Y ZI 1 81 1 81 figure gcf set gca YDir normal title HL Mesh Scan at S1 202 fontsize 14 fontweight b xlabel H fontsize 10 fontweight b ylabel L fontsize 10 fontweight b colorbar HL Mesh Scan at Si 202 x 10 2 04 2 03 2 02
4. Use Long distance Microscope of Zoom Video camera to insure goniometer pin 1s in diffractometer rotation center i Manually adjust X amp Y of goniometer head until pin XY position 1s invarient to rotation i Adjust zsamp until pin Z position is invarient to x rotation g Make sure incident beam coincides with diffractometer center by taking a burn at the pin or by using an X ray eye to see silhouette shadow of pin in beam center If the beam is not going through the diffractometer center solicate expert help from Jerry Carsello or someone in Bedzyk s group 5 Sample Alignment Procedure a Mount sample and laser align surface normal with axis Use tripod mounted Laser Level 1 Observe laser reflected beam from sample mirror surface at a couple of meters from sample ii Adjust the 2 arcs of the goniometer head until laser reflected beam position is invarient to rotation i Adjust x until the reflected laser beam is at the incident beam height 1 gt set chi 90 now the axis is perfectly horizontal 2 Note that at x 0 the axis and 9 axis are aligned and have the same right handed sense of rotation b Align sample surface with incident beam i Adjust zsamp until the sample surface is roughly cutting the beam in half as observed by the detector counts ii gt dscan th 2 2 40 5 gt umvth CEN gt set th0 iii gt dscan zsamp 1 1 40 5 gt umv zsamp CEN iv repeat steps 1 and iii until no further adjustment
5. 11 2 mrad at 20 44 977 You can use these values in conjuntion to compute FWHM Q and use this in the 1D interference function to determine the vertical domain size Doo of the BTO film and compare that to the film thickness that will be found later in the low angle XRR measurement D 21 AQ 27 0 04A7 157 A gt dscan th 1 5 1 5 30 1 this transverse scan peak has a th FWHM 0 716 at 22 40 The in plane domain size is Dj 12 Locate BTO 001 peak Detector Cts 5 sec a b 2500 2000 E Ol CH CH wf CH CH CH gt ubr 0 0 1 35 gt d2scan tth 2 2 th 1 1505 i D 27 AQ 2n 0 04A 157 s32_tth_th_scan_BTO001 s32_tth_th_scan_BTO 001 top FWHM 0 49 at 22 05 Detector Cts 5 sec O 1 4 1 45 1 5 1 55 1 6 1 65 1 7 Two_Theta Q Du Fig 6 The BaTiO 001 tth th scan O 4x sin 20 2 4 Circle ISKW User Manual v5 NU X Ray Lab M J Bedzyk July 1 2010 13 OOL Specular Reflecivity scan for BTO STO Si 001 a gt a2scan tth 0 0765 80 0765 th 0 03825 40 0382 2000 3 b gt See Fig 7 OOL Specular Reflecivity i 004 BaTiO 001 BaTiO 002 Detector Cts 3 sec Fig 7 OOL Specular Reflecivity Q An sin 20 2 i i QO 4m sin 20 2 4 Circle 18K W User Manual v5 NU X Ray Lab M J Bedzyk July 1 2010 14 Now locate the BTO 202 Bragg peak With the cube on cube rotated 45 epitaxy the BTO 202 in Si reciprocal lattice units r l u
6. Notice that due to the large vertical gaps in the slits before the monochromator and on the detector arm there is a very large 1 vertical divergence in the instrument This comes from the vsdgap 14mm vertical source divergence gap of the manually adjusted slit in front of the mono 14mm 850 mm 16 5mrad 0 94 Therefore you want to scan in th and tth while integrating in the chi vertical direction Otherwise what you will see in the scanned peak widths 1s this large instrumental broadening Therefore if you want to do a reciprocal space 2D map scan in th at different tth Or reduce vertical divergence by reducing vsdgap The flux and vertical divergence of the incident beam on the sample are proportional to vsdgap for 2 lt vsdgap lt 20 You could also reduce the vertical gaps of the detector and guard slits 8 Finding small miscut angle of surface relative to low index crystal crystal planes a b 9 Find off normal low index substrate Bragg peak Misscut_Phi_VS_theta y m1 Sin M0 m2 m3 Error 0 00042029 0 068168 0 00029718 NA NA Rotate PHI in 45 steps d At each PHI find the theta center for the Si 004 Bragg peak Make a PHI Theta table in K graph Fit this data to Y A Sin X X0 YO 1 A Miscut degree angle We found 0 35 miscut ii X0 PHI angle that you should go to so that the plane formed by surface normal and 001 is perpendicular to scattering plane Also this makes alpha beta
7. are needed c Record STB Straight thru beam condition i gt umvr zsamp 2 ii gt prim this prints out a wa wh and ct i Make sure to record in your Notebook and in this STB printout the Filter setting e g T 0 24 x 0 01 SHOW ZSAMP SCAN gt EXPLAIN HOW BEAM WIDTH CAN BE DETERMINED gt AND HOW BEAM VERTICAL MISALIGNMENT CAN BE DIAGNOSED 6 Find the first allowed substrate Bragg peak near the specular rod 4 Circle 18K W User Manual v5 NU X Ray Lab M J Bedzyk July 1 2010 Si 004 Peak Reflected photons sec 5 10 410 3 10 210 110 STB 2 9 x 10 p s at hsdgap 0 7 mm q 3 a a SE SON ob w Reflected photons sec wir Ge vi Y i 0 08 fo Y CBR EEN 0 06 e FWHM th deg 5 bD o A Q Value Error CS 0 53037 0 010077 7 1 4865e 5 NA 0 02 0 99691 NA L I 0 0 2 0 4 0 6 0 8 1 1 2 1 4 hsdgap mm Fig 3 The Si 004 rocking curve RC peak reflected p s and FWHM dependence on hsdgap the horizontal width of the slit 850 mm from the source and 110 mm before the monochromator Over this range the monitor cps are directly proportional to hsdgap The fit confirms that the RC FWHM is a direct measure of the incident beam divergence and that the effective horizontal source size is 0 53 mm gt ca004 gives tth and th for the S1 004 peak base on Braggs Law gt an 69 0985 34 5493 This takes tth and th to the respective values
8. in deg gt dscan th 2 2 40 5 gt umy th CEN record FWHM 0 055 gt pplot i Since the Si 004 angular acceptance width Darwin width 3 5 arcsec 0 001 is very small and since the Cu Kal wavelength spread AA A 2x10 is very small this FWHM is a direct measure of the incident beam horizontal divergence from the parafocussing Graphite monochromator See Fig 3 This FWHM corresponds to a transverse AQ QAw 22 d Aw 0 0044 1 A at the Si 004 gt dscan chi 2 2 40 5 gt umv chi CEN record FWHM 1 57 gt pplot i There should be a small flat top region at the peak of the chi scan so that you will be integrating in this direction of reciprocal space If there is no flat top you need to increase the vertical gap size of the slits on the detector arm gt d2scan tth 2 2 th 1 1 40 5 umv tth CEN umv th look up th in scan table record FWHM 0 097 in tth i This corresponds to a longitudinal AQ Qcot 8 A0 0 0057 1 gt ct now reduce filters until ct shows 40kcps lt DET lt 150kcps i for this S1 004 T 0 24 and DET 99 9kcps Repeat steps c to e until th chi and tth converge tth should precisely match Braggs Law for Cu Kal and substrate lattice constant 4 Circle ISKW User Manual v5 NU X Ray Lab M J Bedzyk h gt or0004 this is for the orientation matrix July 1 2010 l gt prim Paste this in your NoteBook Label it as S1 004 peak at T 0 24 7 Adjusting the vertical divergence
9. should appear at H K 2 if the fillm is coherently strained to match the Si lattice If it is relaxed to bulk lattice constants it should be at H K 1 92 The in Si r l u relaxed BTO L 5 431 4 03 2 2 70 a b Cc mo gt ubr 1 92 1 92 2 70 follow centering procedure described in Step 7 above gt for i 1 82 i lt 2 02 i 0 002 br i i 2 6 Iscan 2 6 2 8 100 1 You can do a 360 phi scan to prove the 4 fold symmetry single crystal epitaxy of the thin film gt ascan phi 0 360 3600 5 See Fig 8 g Fig 9 shows the set of H K scans at different L thru the BTO 202 peak Detector Cts 0 5 sec Phi Scan Fig 8 4 fold symmetric S114202 peaks 4 Circle ISKW User Manual v5 NU X Ray Lab M J Bedzyk July 1 2010 hklmesh scans at BaTiO3 2 0 2 peak L Sirlu 185 1 90 1 95 2 00 H K Siriu Fig 9 Reciprocal space map through BaTiO 202 There is broadening due to the convolution with the 1 vertical divergence of the instrument Examination of this scan indicates that as expected the BTO and unseen STO epitaxy has BTO 110 parallel to Si 100 Futhermore the peak at 1 921 1 921 2 702 indicates that BTO is fully relaxed unstrained with bulk like RT lattice constants at BTO a 2 5 431A 1 921 N2 3 998 A and BTO c 2 5 431A 2 702 4 020 A The ideal BTO RT bulk lattice parameters are a 3 9924 and c 4 032A See Appendix C for Mathematica codes that can be used t
10. 4 Circle ISKW User Manual v5 NU X Ray Lab M J Bedzyk July 1 2010 4 Circle User Manual Detector Slit Filter Box Guard Slit l Monitor Detector H E ad Ss Ki Fig 1 NU X ray Lab 4 Circle Diffractometer at end of 18 KW Cu rotating anode beam line Rotating Anode z S Graphite 002 g Y ParaFocusing amp 2 a Sagital Focussing E Q Monochromator Q A W S Fig 2 Top view schematic diagram of beamline components Not to scale 4 Circle 18K W User Manual v5 NU X Ray Lab M J Bedzyk July 1 2010 Beamline Components In sequence starting from source refer to Fig 2 18KW Ultrex Rigaku Rotating Anode donated by Abbott Labs in 2006 e Cu Anode Cu Ka 1 5406 A Cu Ko A 1 54443 A e Point Source Normal Focus 0 5 mm x 10 mm 18 KW max power o The effective source size should be 0 5 mm high by 1 mm wide due to 6 take off angle But we measure the width to be 0 5 mm wide See Fig 3 e Nominal operating power 50 KV 240 mA e Huber slits for controlling horizontal and vertical divergence See Fig 3 o Nominal setting hsdgap 0 7 mm wide by 14 mm high o 1 full turn of the dial on a Huber slit translates the blade 0 50 mm e Graphite 002 Grade ZY A lt 0 5 mosaic from Advanced Ceramics Corp Size 25 x 25 x 2 mm Para focusing in the horizontal direction Sagittal focusing in the vertical direction with R 225 mm 2doo2 6 708 A Cu Ka 0 13 28 1 to 1 focusing Fj F2 F
11. Rs sin 980 mm This is the distance from the source to the mono and from the mono to the sample See Appendix D for ray diagrams illustrating Parafocusing and Sagittal focusing e Incident beam intensity monitor Nal detector collecting scattered x rays from Co coated Kapton foil Ip 8900 cps at hsdgap 0 7 mm and vsdgap 14 mm e Huber incident beam slits for passing Cu Ka and blocking Cu Kay o Nominal setting ka2cen 0 ka2gap 0 5 mm wide by 1 mm high e Huber 4 circle diffractometer o Motorized Z sample zsamp 0 should put pin in COR Center of Rotation Huber 1006 X Y y goniometer Sample holder 2 theta arm Nominal settings guard slit gshhcen 0 64 gshgap 1 1 gsvcen 1 4 gsvgap 8 XIA filter box T 0 24 x 0 01 for STB straight thru beam See Appendix A for SPEC Macros for controlling XIA Filter Box detector slit dshhcen 0 05 dshgap 1 0 dsvcen 1 9 dsvgap 12 Cyberstar Nal X ray detector 0 3usec 740V Gain 8 LL 2 5 UL 6 5 e Auxillary equipment o Laser Level on Tripod X ray Eye Goniometer pin High power zoom lens camera OO OOQ O O O O O O Operating Procedures 1 Introduction In describing the procedures for operating the 4 circle we will use as an example the following MBE grown thin film sample 200 A BaTiO 20 A SrTiO Si 001 substrate The STO SrT103 fillm will be very difficult to sense because it 1s so thin We will study the thicknesses of the layers b
12. graphic direction of the miscut Use Fig 4 and Step 7e 133 57 to do this ke HL Mesh Scan at Si 202 KL Mesh Scan at Sif 202 2 04 2 02 2 00 1 96 EI 2 00 202 E aera aaa aie H K Fig 5 HL and KL mesh scans reciprocal space maps through Si 202 The HL scan is much more broadened due to the convolution with the 1 vertical divergence of the instrument In this case the H scan part of the mesh scan is primarily a chi scan while the k scan is primarily a th scan See Appendix B for Mathematica and MatLab codes that can be used to generate these types of 2D plots 10 Now you have given SPEC the info it needs to generate a orientation matrix that can transform substrate xtal H K L coordinates into 20 0 X coordinates The extra angle degree of freedom allows you the freedom to do things like constrain the incident and exit angles to be equal Le a P a The scans in Fig 5 are i gt br2 02 gt hklmesh L 1 96 2 04 40 H 1 96 2 04 40 2 ii gt br 2 0 2 gt hkimesh K 005 005 20 L 1 99 2 015 251 gt br2 02 11 Now locate the BTO 002 peak The in Si r l u relaxed BTO L 5 431 4 03 2 2 70 4 Circle 18K W User Manual v5 NU X Ray Lab M J Bedzyk July 1 2010 a b gt ubr 0 0 2 70 The peak was found at the bulk like BTO lattice constant position indicating that the film was fully relaxed gt d2scan tth 2 2 th 1 1 1005 This longitudinal scan peak has a FWHM 28 0 643
13. lters 1234 this will set filter 1 2 3 4 as the current condition to start Use commands above to insert or remove filters To go back to manual control mode for the filter box simply flip the filter box to off status at the front panel 4 Circle ISKW User Manual v5 NU X Ray Lab M J Bedzyk July 1 2010 Appendix B Mathematica and MatLab Codes for 2D Graphics Mathematica Codes SetDirectory Users bedzyk Desktop Data amp Analysis 4circlel 8kw Summer2008 BTO STO Si 001 july0O8 BTO STO Si001 ci Users bedzyk Desktop Data amp Analysis 4circlel8kw_ Summer2008 BTO_STO_Si001_ july08 BT O STO Si001 c Directory Users bedzyk Desktop Data amp Analysis 4circlel8kw_ Summer2008 BTO_ STO S1001 july08 BT O STO _ Si001 c dataK LSi202 Import s172 KLScanSi202 csv CSV dataHLSi202 Import s169 HLScanSi202 csv CSV ListContourPlot dataK LS1202 PlotRange gt All FrameLabel gt K L AspectRatio gt Automatic PlotLabel gt KL Mesh Scan at 1 202 KL Mesh Scan at Sif202 2015 2 010 1 995 1 990 0 HOH d dl ee n bah F i et ee in 00H 0 002 0 000 0 002 0 004 K 4 Circle ISKW User Manual v5 NU X Ray Lab M J Bedzyk July 1 2010 ListDensityPlot dataK LS1202 PlotRange gt All ColorFunction gt Hue Mesh gt Automatic FrameLabel gt K L AspectRatio gt Automatic PlotLabel gt KL Mesh Scan at Si 202 KL Mesh Scan at Si 202 2 015 2 010 2 005 2 000 1 995 1 990 HH 0 002 0000 000M2 0 004
14. nd circle This parafocusing occurs in 1 1 magnification geometry for which the distance F between source and crystal and crystal and image plane are equal Fig 3 7 The radiation is focused at the detector by Bragg Brentano focusing or parafocusing in the scattering plane meridional plane and by a cylindrical curvature in the sagittal plane 2 H Legall H Stiel V Arkadiev and A A Bjeoumikhov OPT EXPRESS 14 4570 2006 3 G E Ice and C J Sparks Nucl Instrum and Methods in Phys Res A 291 110 1990 NU X Ray Lab M J Bedzyk July 1 2010 4 Circle 18K W User Manual v5 AXIS of Revolution Error Fig A7 A flat crystal m the merdional plane deviates from the Rowland circle of radius Rm causing focusing errors in the meridional plane of scatter An extended source also contributes to the errors A cylindrical curvature of radius R F sin0 provides for sagittal focusing Fig 5 Sagittal focusing mixes the horizontal divergence as shown here into the scattering plane
15. o generate these types of 2D plots 4 Circle 18K W User Manual v5 NU X Ray Lab M J Bedzyk July 1 2010 Appendix A SPEC Macros for controlling XIA Filter Box SPEC Macros available for convenient operation FOURC gt prim Sends to X ray lab printer ct wh FOURC gt pplot Sends to X ray lab printer splot FOURC gt inifilters initializes autofilter function FOURC gt setfilter 1234 set filter 1 2 3 4 as the current condition to start FOURC gt insertfil wxyz insert filters 1 2 3 4 For example insertfil 124 will insert filters 1 2 amp 4 FOURC gt insert_all insert all filters FOURC gt removefil wxyz removes filters 1 2 3 4 Check to see if macros are loaded by issuing the command e g FOURC gt inifilter If SPEC says Not a command or macro then you need to load macros 1 Load basic macros h l At the fourc terminal window FOURC gt qdo home user4circle macros 4cstart mac 29 66 This 4cstart macros includes all necessary functions like pplot prim 2 Load autofilter controlling macros Ji k L P Enable disable autofilter control by flipping the on off switch button in the front panel of XIA filter box in the cart to ON FOURC gt qdo home user4circle macros pfcusave mac Flip the filter box to NO filter condition by moving all 1 2 3 4 filter switches to out status FOURC gt inifilters this will initialize autofilter macros FOURC gt setfi
16. tances much smaller than the source crystal distance The crystal S distance is equal to the S crystal distance thus the parafocusing effect happens in a magnification ratio 1 1 When another ray dotted with the same energy encounters a crystallite deeper in the crystal it is reflected to a point close but different from S producing a broadening in the focal spot due to the penetration of the beam inside the crystal bulk The same concept could be applied to rays of a different energy but clearly they will be focused to another different point due to the fact that the Bragg angle is different The parafocusing effect can also be understood as produced by crystallites that follow a curved surface dashed circle like a spherical mirror The crystallite orientation must follow the Rowland circle to assure that the Bragg law will be fulfilled Therefore the 1 1 magnification geometry is Just a consequence of the Rowland condition 1 M Sanchez del Rio M Gambaccini G Pareschi A Taibi A Tuffanelli and A Freund Proc SPIE 3448 246 1998 4 Circle ISKW User Manual v5 NU X Ray Lab M J Bedzyk July 1 2010 HOPG crystal Crystallites parafocusing NE c w oi Source Image plane 5 Ae Fig 2 Diffraction properties of HOPG The mosaic focusing is illustrated for a monochromatic beam thick lines Rays emitted by a point source are focused into a point in the image plane if the crystallites are lying on a Rowla
17. vertical gap of slit before graphite mono at 14 mm Manually set vertical gap of incident beam slit before sample at 1 mm Flip Shutter Switch UP Red Warning Light ON at Rotating Anode Head sj Con Ep E P 4 Diffractometer Alignment Procedures a FOURC gt an 0 0 gt umv chi 90 gt umv zsamp 15 Takes 20 0 to 0 x to 90 b gt umv hsdgap 0 7 gt umv ka2gap 0 5 gt umv gshgap 10 gt umv dshgap 1 c gt umv dsvgap 15 and gt umv gsvgap 15 should be nearly wide open so you integrate in y direction d XIA Filters T 0 24 0 01 2 4 x10 Top and bottom Filters ON others OFF e Check to make sure that only the single beam of the Cu Kal and not Ka2 1s transmiting through the incident beam slit ka2cen ka2gap 1 Make sure nothing is blocking the beam at the sample position il gt dscan tth 5 540 5 gt umv tth CEN gt set tth 0 gt pplot 4 Circle ISKW User Manual v5 NU X Ray Lab M J Bedzyk July 1 2010 1 You should see one and only one symmetrical peak otherwise some Ka2 is coming thru 2 The peak should be 13 000 cts per 0 5 sec with FWHM 0 1 a This is 3x10 photons per second in the incident beam 3 If your findings for this scan are significantly below these expectated values then you need to solicate expert help from Jerry Carsello or someone in Bedzyk s group 4 Subsequent steps f and g should be skipped unless you think the incident beam and diffractometer center have been misaligned f
18. y low angle XRR We will determine the miscut angle of the surface relative to the S1 001 We will determine the single crystal quality of the BTO film RTP 4 Circle 18K W User Manual v5 NU X Ray Lab M J Bedzyk July 1 2010 f We will determine the epitaxial orientation of the BTO film g We will determine the out of plane and in plane BTO lattice constants to define the strain state of the film 1 e Is the BTO film coherently strained or fully relaxed or partly strained 2 Startup Computer at LINUX PC a Open 1 Terminal b Create your own folder with your name and change to that directory i user4circle euler mkdir YourDirectoryName ii ed YourDirectoryName c foure This takes you into SPEC 1 qdo home user4circle macros prpeak i FOURC gt on BTO_STO_Si001_b log This will make a log file of everything you do in SPEC iii FOURC gt startup 1 Answer questions 2 newfile All of your scans will be found in this filename you must give BTO STO S1001 b 3 setlat Set your sample substrate lattice constants 5 431 4 setaz Set the HKL for the surface normal direction 0 0 1 d Open a 2 Terminal i cd YourDirectory Name ii newplot this program will let you load your SPEC file and plot any of the scans 3 Power up 18KW generator Target ON X Ray ON Voltage Arrow up to 50 KV SLOWLY Current Arrow UP to 240 mA SLOWLY Put all XIA filters IN to protect Nal Cyberstar detector Manually set
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