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J990SeriesProgrammingManual 2.1 MB

1. forcevalue lt the valu forced gt This is a double value 3 2 28 June 1995 J990 Series Programmer s Manual Customizing Templates Tlib_ set_ppmu_ force bounds measure irange vrange This function which resides in T1ib 0 is used to set the maximum and minimum force values Tlib_maxforce and Tlib_minforce for given voltage and current ranges of the pin PMU The function is of type void and does not return a value Acceptable values for the function parameters are measure 0 measure voltage or 1 measure current vrange TT_PPMU_RANGE_20V and irange TTI_PPMU_RANGE_2MA TT_PPMU_RANGE_200UA TT_PPMU_RANGE_20UA TT_PPMU_RANGE_2UA or TT_PPMU_RANGE_200NA Tlib_floatpins Pinlist This function is used to open the connection from the test station to the DUT pin DUTcon leaving the pin to float For example if HASVALUE beforepat amp amp HASVALUE floatpins Pin P for P floatpins HASVALUE P NEXT P Tlib_floatpins P writesys pause_for_relay It cannot be used for VS connections Each call to this function saves the connect state on a stack Tlib_unfloatpins This function is used to close the connection from the test station to the DUT pin so that the pin no longer floats For example Pin P for P floatpins HASVALUE P NEXT P Tlib_unfloatpins
2. One pattern or a list of patterns can be specified with this parameter The second instance shown in the example above funct_spec_levels uses two patterns a march pattern and an address complement pattern The dotests parameter specifies whether writesys test_func should be issued after a pattern is executed this will determine if functional pass fail results are to be read back The choices are 0 no 1 yes or 2 fails only In the example instances the choice of yes is selected This is the default value calset nominal_level_cal value waves wave_timing_nominal value levels nominal_levels The calset parameter is used to select a calset for the instance The calset will optimize calibration of the test system resources to the specific requirements of the instance Creation of calibration database files caladr caldb is described in Chapter 1 9 Writing the Test Program lf a calset is not specified calibration values are inherited from the context in which the instance is executed For example the main t file may have already specified a calset to use using the writesys select_cal_data statement Once a calibration file has been created it must be included in the workspace wspadr file for example June 1995 3 1 21 Using Templates J990 Series Programmer s Manual job 3993_1Mx4 explicit_timing waveform wave_timing_70ns waveform wave_timing_80ns waveform diMx4_calsets
3. In this example P is initialized to the first symbol in the floatpins list The forloop continues while there are entries left in the floatpins list At the end of each iteration through the loop the Pin pointer is incremented to the next pin symbol in the list This function must be called once for each call to TLIB_floatpins It restores values from the pin connection stack June 1995 3 2 29 Customizing Templates J990 Series Programmer s Manual Tlib_alarmcheck This function checks for VS kelvin or overload alarms and reports them with a message The function is of type void returning no value This function is useful anytime the user wants to scan for VS alarms Tlib_save_levels Pinlist This function saves all functional levels vih vil voh vol vch vel ioh iol and vt and stores them in a structure for later data retrieval Tlib_zero_levels Pinlist This function sets all functional levels vih vil voh vol vch vel ioh iol and vt to 0 Tlib_restore_levels Pinlist This function restores all functional levels vih vil voh vol vch vel ioh iol and vt that were stored during the Tlib_save_levels call The user will get an error if he tries to restore levels that were not previously stored Tlib_save_all_vs This function saves all VS data main alt ilimit etc and stores them in a structure for later data retrieval Tlib_zero_all_vs This function sets all VS levels to 0 Tli
4. comment line comment file comment version my version string use pinset pin pindb pins hldset name set type capture main comment set 1 capture patgen mode 100MHz default bus ads inmux form bus mux ix y ads 0 px0 py0 x scram form addr data 0 Oxff y scram form addr data 0 Oxff outmux form mux bit 0 sx0 addr mux form pin samux0 bus amuxl bus amux0 amuxl a0 al ads sec 0 11 data mux form pin bus dmux0 dmuxl DQ0 ads0 4 1 module form module bus clear enable AO Al A2 ads off catchram form array by mode cs enable cs compare mode slice scan enable scan compare pin pseudo site or pin 0 1 Oxff 0x03 capture 0 Oxff 0x03 DOO 0 DQ2 June 1995 4 4 13 Memory Fail Processing Low Level Programming J990 Series Programmer s Manual failmap form pin pseudo site cs enable cs compare by mode mod scan enable scan compare DQO 0 1 Oxff 0x03 1 capture Oxff 0x03 display processor input fmm enable on head 0 clear enable on shorz comp 2047 vert comp 1 horz width 2047 fail count enable on topo mux px0 pxl px2 px3 py0 pyl py2 py3 topo invert form block addr data 0 0 3 ra mux form board mux slice A 0 0 B 1 2 ra form analyzer start stop 0 0 1023 ra or mode or4 rfl mux form modul
5. H EMPLATE_RETURN This macro is the way to return control to the test program from the template without executing any more code in that particular section of the template Template code cannot employ the standard C return construct return For example TEMPLATE_BODY_BEGIN basic_func_Template Instance Ip Ip readsys instance if HASVALUE pattern standard template parameter names used writesys patgen_start pattern else TLIB_EPR No pattern to run specified TLIB FORCETEMPLATEFAIL TEMPLATE ABORT TEMPLATE RETURN if HASVALUE tnum standard template parameter names used writesys testnumber tnum writesys test_func TEMPLATE RETURN GI TEMPLATE_BODY_END basic_func_Template 3 2 22 June 1995 J990 Series Programmer s Manual Customizing Templates TLIB_CALDATA TEMPLATE TEMPLATE ABORT ID This macro is used to abort template code in the middle of execution This kind of abort usually accompanies some kind of error check for instance if an error exists the template will flag the error and stop execution This macro returns control to the test program TEMPLATE _ABORT sets a flag that indicates to the software that the entire template should be aborted not just the present section of the template at the next TEMPLATE_RETURN statemen
6. 3 2 24 June 1995 J990 Series Programmer s Manual Customizing Templates TLIB_PATSTART This macro is used to call a function C function returning an integer before the patgen is started most often used for device preconditioning before the vectors run The on condition setup will remain in effect until cleared in the TEMPLATE_POST_BODY section through a call to Tlib_patstart_clear which resets the function pointer to the function in effect before the instance was executed Typically setting up on_patgen_start conditions should be performed only in the TEMPLATE_PRE_BODY section For example TLIB_PATSTART patstart standard Teradyne parameter names used TLIB_PATSTOP This macro is used to call a function C function returning an integer after the patgen is stopped useful for postconditioning The on condition setup will remain in effect until cleared in the TEMPLATE_POST_BODY section through a call to Tlib_patstop_clear which resets the function pointer to the function in effect before the instance was executed Typically setting on_patgen_start conditions should be performed only in the TEMPLATE_PRE_BODY section For example TLIB_PATSTOP patstop standard Teradyne parameter names used TLIB_CHECK_DISABLE This macro is used to disable the comparator on pins designated in the disable_comp_pins parameter in the instance for the background_Template of the test program It is normally e
7. June 1995 4 4 11 Memory Fail Processing Low Level Programming J990 Series Programmer s Manual Setup Generation and Interactive Modifications mfpdb and mfpadr Translators High Level Low Level MFP Translators Pin Names and Sites Software caches are generated on the first call to the low level function calls in a given ADR file or instance The software caches will be rebuilt if the ADR file changes or if the pseudo site mapping is changed In general you may interactively change an MFP ADR file without reloading your job The MFP software system will detect the fact that the mfpadr file is newer than the corresponding mfpdb file reload and rebuild the software caches This section describes the low level ASCII form of the MFP software system for the 1G900 software The memory fail processor software includes templates a high level database generator a set of hardware drivers and translators to convert a database file to ASCII and ASCII to database During normal high level operation an ASCII file and database file are not required The high level code builds an in memory database and calls hardware drivers to load the hardware using the generated database If desired you may request the high level database generator to dump an ASCII file That file may be modified and used as an alternative to high level MFP when necessary Alternatively you may hand generate an ASCII input file The translators are imple
8. LFG Output logic 0 logic 1 a b a b aORb aORb a OR b a OR b a AND b a AND b a AND b a AND b a XOR b a XNOR b Data is programmed in eight groups of eight sets each Data sets are selected by each pattern instructions Data groups can be changed at any point in the pattern and take effect in the next cycle 2 1 16 June 1995 J990 Series Programmer s Manual Programmer s Guide to the Hardware Waveform Generation Waveform generation on J990 Series test systems is done uniquely for each channel Each channel has 32 edgesets which contain both format and timing information for a single cycle The edgesets are programmed prior to starting the patgen While the patgen is running any of the 32 edgesets can be randomly selected to produce waveforms at the device Channel N Edgeset 31 Himing edged Channel 0 Figure 2 1 11 32 Edgesets for Each Channel Edgesets are typically programmed using waveform databases waveadr or wavedb files Both the timing edges and format are specified in the eqset statement in the waveform database June 1995 2 1 17 Programmer s Guide to the Hardware Available Timing Edges J990 Series Programmer s Manual Each edgeset contains six timing edges for the channel Each channel type drive only and IO have a different set of edges as described below Drive Only Channel Edges Edge Table 2 1 2 Drive Only Edges Description do Used to start the sur
9. continued on next page June 1995 5 1 15 Using Dual MPG Mode J990 Series Programmer s Manual Example continued CI WRITE_CYCLI mpg HAINE xdgadr xa xdevadr xa dset 0 mpg alt swale NaS BE xdgadr xa xdevadr xa dset 0 DAE EIEN ydgadr ya ydevadr ya Wesa ydgadr ya ydevadr ya rep RPT_FULL_MUX READ_CYCL mpg Borgel valeKor kya xdgadr xa xdevadr xa dset 0 mpg alt swale ane sya xdgadr xa xdevadr xa dset 0 El DAE EIERN ydgadr ya ydevadr ya Wesa ydgadr ya ydevadr ya rep RPT_FULL_MUX J WRITE_CYCLI mpg Borgel valiake kya xdgadr xa xdevadr xa dset 1 mpg alt ixa ne kya xdgadr xa xdevadr xa dset 1 idee EEK ydgadr ya ydevadr ya ALO Latine ydgadr ya ydevadr ya Cee DERE aE UM UX continued on next page 5 1 16 June 1995 J990 Series Programmer s Manual Example continued READ_CYCL mpg Boel O Va xdgadr xa xdevadr xa dset 1 mpg alt xa inc ya xdgadr xa xdevadr xa dset 1 EJ INACTIV ime litre ydgadr ya ydevadr ya alighor absLialhe ydgadr ya ydevadr ya F PARREMTSEULESeMUX Using Dual MPG Mode June 1995 5 1 17 Using Dual MPG Mode caladr J990 Series Programmer s Manual The caladr file must be set up to calibrate drive only chann
10. 5 fast x scan read data set 1 max to min March RAS_ONLY_CYCLE xreg XMAX yreg YMAX xa load reg ya load reg xena next jam reg yena next jam reg dgroup next 0 rep RPT_WAKEUPS 1 8 14 June 1995 J990 Series Programmer s Manual Creating Pattern Database Files SVM Database Example continued DRAM March Pattern WRITE_CYCLI ixa inc ya inc link Pl xdevadr xa ydevadr ya xdgadr xa ydgadr ya dset 0 rep RPT_FULL_ADDR_SIZE READ_CYCLE xa inc ya inc link xdevadr xa ydevadr ya xdgadr xa ydgadr ya dset 0 loop FULL_ADDR_SIZE WRITE_CYCLI xa hold ya hold xdevadr xa ydevadr ya xdgadr xa ydgadr ya dset 1 eloop 1 PI PI READ_CYCLI xa inc ya inc link xdevadr xa ydevadr ya xdgadr xa ydgadr ya dset 1 rep RPT_FULL_ADDR_SIZE INACTIVE_CYCLE stop end vector form end mpgset form June 1995 7 8 15 Creating Pattern Database Files J990 Series Programmer s Manual Using the eloop Opcode The eloop Opcode Typical Usage This section provides additional information on the use of the eloop end loop opcode in svmset statements In particular some common mistakes in the use of eloop produce runtime errors this section describes how these segments of code can be written to avoid these errors The syntax for the eloop opcode is eloop VLABEL This opcode which must be paired wi
11. En Database High Level Object Figure 1 10 3 Conceptual Diagram Purpose of Workspace Database 1 10 2 June 1995 J990 Series Programmer s Manual Creating Workspace Database Files Creating the Workspace Database The workspace database is created by editing an ascii database wspadrr file including all the required statements This can be done with the ADRedit tool or a standard text editor such as vi The ADR file is then translated to create the binary database file wspdb A script build workspace is also supplied with the system software to help build the workspace database file This script is helpful when creating a workspace from scratch as it will put in names for all the databases and modules in a directory It then performs some default grouping of objects to create the job Some editing of the objects would then be performed by the programmer to create a fully specified workspace An alternative method of creating a workspace is to translate all database files specifying a workspace database file During translation the names of all database sets will be placed into a binary workspace database That binary workspace database can be converted to ASCII ADR form where it can be edited to create the database groupings Contents of the Workspace Database The Workspace database consists of set declarations chanset pinset etc and group definitions waveform level job etc inside a wspadr file
12. The current monitor for the specified VS is enabled causing it to measure the current through the force line resistance on the output side of the VS buffer The A D converter reads the analog current value and generates a digital equivalent which is then compared with the programmed high and low limits in the test statement If the digital value falls outside this range a failure is recorded The test statement automatically datalogs the results June 1995 3 1 31 Using Templates J990 Series Programmer s Manual Test System Test System Mainframe Test Head Sense ames D Force U DAC H AM lt T Voltage Drop Current Monitor A D Conversion test ivs Current Value Digital Figure 3 1 6 Voltage Source Current Monitor Dynamic ICC Test Procedure For dynamic ICC tests the pattern generator is used to exercise the device continuously Then with voltage applied to the power pin s the average resultant ICC is measured To measure ICC using the current monitor 1 Select the appropriate pattern from the pattern memory It may be necessary to create a pattern with an infinite loop to ensure continuous execution of the pattern generator The pattern should not enable the comparators Program the VS to the appropriate force value Start the pattern generator Program a minimum pause time 1ms or less This additional time may be required to charge the bypass capacitors 5 Specify h
13. This sets up the display processor hardware appropriately for the given TT_MFP_OP_TYPE arguments lt MASKs gt is masked or unmasked e Nis 0 or 1 based on which head the scan data comes from tt_mfp_do_scan The syntax of this statement is tt_mfp_do_scan This function performs the scan operation In most cases this function is called for you by the tt_bitmap_save function or the tt bitmap save all function tt_mfp_scan_completed This syntax of this function is tt_mfp_scan_completed This function is called after all scan operations that are to be done with the current capture data are completed It will put the hardware back in a state where functional testing may be resumed tt_mfp_create_crik This function call creates a custom CRIK Catch RAM Index Key map The syntax of this function is tt_mfp_create_crik slices_flex_array The slices_flex_array argument is the name of a flex array contain the CRIK mapping to be created A flex array is an array whose first element represents the total number of elements contained in the array In the case of the slice_flex_array the remaining elements represent Catch RAM slice numbers An example follows Suppose that a CRIK is desired for slices 0 4 8 12 this could be accomplished with the following code int my_slice_flex_array 4 0 4 8 12 crik_custom tt_mfp_create_crik my_slices_flex_array In this example the first element in m
14. V X DQ 0 DQ 1 DQ 2 DO 3 DQ 4 DQ 5 DQ 6 DQ 7 i l i l i 4k value patgen 0 choice Main value x_y_bit px0 px1l px2 px3 px4 Hox px6 px7 px8 px9 px10 px Bl Bal py0 oye py2 py3 py4 pyo py6 py7 py8 py9 iob0 iobl iob2 value h_v_expr MON MAL May 2 Ma RAR HAS MAO MAT RES MONT Ma OM LM hO hIi2 Alehi 2 MAZARA MRSS RLT h4aehi2s MKSSh12 hesthi2 hie hia Heth l2 hos 2 ALON MELLT aloe Note The x_y_bit and the h_v_expr merit additional consideration Note first that the h12 bit differentiates between the left half DQ0 DQ3 and the right half DQ4 DQ5 This is shown in the figure below Likewise the h11 bit differentiates between the left quarter DQO DQ1 and the right quarter DQ2 DQ3 It will also differentiate between the left quarter and the 4 2 16 June 1995 J990 Series Programmer s Manual Memory Fail Processing Templates right quarter on the right half of the memory where h12 1 This is shown in the figure below Finally the h10 bits differentiates between the left and right eighth of the memory This is shown in the figure below h1o o nou road mo mO 0nt0 1 m1O 0nt0 1 h10 h10 h10 h10 Now all three bits can be put together for all the IO regions DQ DQ DQ DQ DQ DQ DQ DQ 000 001 010 011 100 101 110 111 000 00
15. Inform MFP system that all scans for the previous capture are complete tt_mfp_create_crik tt_mfp_destroy_crik tt_mfp_get_ra_error_count creates a custom CRIK Catch RAM Index Key map removes a CRIK Catch RAM Index Key map fetches redundancy analyzer error counts tt_mfp_get_ra_region_count tt_mfp_set_ra_all_rik tt_mfp_set_ra_cycle_count fetches redundancy analyzer region counts sets redundancy analyzer s all RIK for specified head sets redundancy analyzer cycle counts 4 3 2 June 1995 J990 Series Programmer s Manual Memory Fail Processing High Level Programming High Level Drivers Description tt_mfp_set_ra_error_ count tt_mfp_set_ra_ region _ count sets the redundancy analyzer error count sets the region count for specified redundancy analyzers tt_mfp_set_ra_ start cycle tt_mfp_set_ra_stop_ cycle tt_mfp_set_es tt_mfp_get_es sets the redundancy analyzer start cycle value sets the redundancy analyzer stop cycle value Registers the edgeset label to modify the period of when scanning or clearing the Catch RAM tt_mfp_set_waveform tt_mfp_get_waveform tt_mfp_file_checks_on tt_mfp_file_checks_off Registers the waveform to select during scanning or clearing of the Catch RAM Causes MFP to check for out of date mfpdb files and retranslate the file if necessary Causes MFP not to check for out of date mfp
16. if HASVALUE trap for S trap HASVALUE S NEXT S if S V Tlib_trap S if stop_on_first_fail amp amp failflag if Tlib_active_sites_count lt 1 break 4 lib_alarmcheck if HASVALUE postbody postbody IB_TIMER TLIB_STOPTIME TLIB_BOD EMPLATE_BODY_E func_Template EMPLATE_ POST _BO ova Y_BEGIN func_Template IB_TIMER TLIB_STARTIME TLIB_POSTBOD Tlib_pretest_clear lib posttest_clear Tlib_patstart_clear lib patstop_clear IB_TIMER TLIB_STOPTIME TLIB_POSTBOD ct ct FOWANA UU BPWN EF NN t EMPLATE_POST_BODY_END func_ Template June 1995 3 2 13 Customizing Templates J990 Series Programmer s Manual Lines 1 3 Initialization Statements Initialization Statements Lines 1 3 Line Code Type Description 1 include lt teradyne h gt C Include the teradyne h file during the preprocessing stage 2 include Include the func_Template h file during the func_Template h preprocessing stage 3 include lt Tlib h gt Include the Tlib h file during processing Lines 4 5 Template Identifiers Template Identifiers Lines 4 5 Line Code Type Description static char template Declare that the template name is func_Template na
17. logic state component and the non data edgeset component Data components generally fall in the middle of the waveform between two non data components and occur once per tester cycle Thus the fastest speed a tester can attain is its minimum period See the specifications for your system to determine the minimum period In a test system information needed to create waveforms is stored as three separate elements pattern information format information and waveform edge timing information This scheme makes use of the following input hardware Ol Pattern Memory O Pattern generator O Timing system O Formatting system O Input device driver Pattern memory contains the device truth table data the patterns of ones and zeros by which the device will be tested The pattern has input and output code for each channel of the tester Input data is sent in waveforms to input pins and output or compare data is used as predicted data against which the actual values on the output pins will be compared The pattern memory contains the data by which a logic 0 or 1 for each signal pin of the device is created as well as edgeset addresses containing code for applying the correct timing and format to logic data ignore bits to enable and disable the comparators and pattern sequence control codes opcodes for controlling pattern generator steps The pattern generator patgen provides data pattern seque
18. update Calls the Update section of the t file see page 3 2 10 TABLE Statement Allows for the grouping of several parameter statements in one template so multiple instances can be executed within one template PARM Statement Can be used with or without the table statement Contains the following PARANAME can be any alphanumeric name Note that the name selected here will be the name of the variable used in the template t file for that object Teradyne strongly recommends that the if a parameter fulfills the same functions as a parameter already used in a Teradyne template it should use the same name The purpose is to maintain a consistent interface between Teradyne and custom templates DATATYPE is the type of parameter Acceptable values are Cfuncptr Pointer to a C function returning an integer Double Double precision floating point variable Int Integer variable Label SVM or LVM vector location Level Level object constructed in workspace Pattern Pattern object constructed in workspace Pin Pin symbol from pinset Spec Spec from specset String ASCII Text surrounded by quotes Waveform Waveform object constructed in workspace Putting a set of parentheses around the datatype indicates that the parameter contains a list of values for that DATATYPE INSTED_PROMPT is a string of text surrounded by quotes containing the parameter prompt that will appear in Insted or the insadr file
19. A DY NE S E R l E S MEMORY TEST SYSTEMS Programmer s Manual V2 7 Version 560 539 08 Revision A 1991 1992 1993 1994 1995 Teradyne Inc This documentation contains trade secrets and confidential information furnished pursuant to a license to the user from Teradyne Inc Use and reproduction of these documents are restricted under the terms of the license Teradyne Inc 80801 Agoura Road Agoura Hills California 91301 U S A J990 Series Programmer s Manual Table of Contents Table of Contents Chapter LI Pong CORI sisii iaaa a aia 1 1 1 Chapter 1 2 Creating Pin Database Piles sccccisctsncenticnctiieicie detiediw eee 12 1 Chapter 1 3 Creating Channel Database Files 0 ccccceecseecesseeeeeeeeeeeaeeeeeeeeeseeeetenaeeeeaes 13 1 Chapter 1 4 Creating MUT Database Files ecccceeseeeeeeeeeeeeeeeeeneeeeaeeseeeeeeseeeeeeenaeeesaes 1 4 1 Chapter 1 5 Creating Specification Database Files 0 ccccccccsssceceseeeeeeeeseeeeeeeeeenieeeeesees 134 Chapter 6 Creating Level Database Pile ccccscscicsccanncasisttinacessicenmniciescniceeisecmancesacssanteasees 1 6 1 Chapter 1 7 Creating Waveform Database Files ccecececeeseeeeeeeeeeneeeeeneeeeeeeeeeaaeeeeaes PA Chapter 1 8 Creating Pattern Database Files oi i ccccssccesscscesscsesenssnssesscssuccennanisecsoesenadoeneeees 1 8 1 Chapter 1 9 Creating Calibration Database Files ssississiciiieriinsnineiinisiseianinenneinnnniaa
20. Figure 2 1 14 Pulse Low Format Pulse High PH Regardless of the actual data the channel goes low from dO to d1 high from d1 to d2 and low from d2 to d3 or the next cycle s d0 VIH VIL Figure 2 1 15 Pulse High Format 2 1 20 June 1995 J990 Series Programmer s Manual Programmer s Guide to the Hardware Return to Complement RC Complement data from d0 to d1 data from d1 to d2 returning to complement data from d2 to d3 or the next cycle s d0 VIH VIL Figure 2 1 16 Return to Complement Format Non Return NR Data from dO to d1 is determined by previous cycle valid data starts at d1 continuing until next cycle s d1 or possibly next cycle s d0 depending on the next cycle s format Edges dO d2 and d3 are effectively ignored when using this format VIH VIL Figure 2 1 17 Non Return Format June 1995 2 1 21 Programmer s Guide to the Hardware J990 Series Programmer s Manual Stay ST Regardless of the actual data keep the logic state that was present at the end of the previous cycle All timing edges are effectively ignored during the cycle Stay Data 1 Data 0 VIH do do di d2 do d1 d2 do If driver state is 1 at end of previous cycle Stay Data 1 Data 0 VIL do do d1 d2 d0 di d2 d0 If driver state is 0 at end of previous cycle Figure 2 1 18 Stay Format 2 1 22 June 1995 J990 Series Programmer s
21. Programmer s Guide to the Hardware J990 Series Programmer s Manual The overall system block diagram shown in the Figure 2 1 illustrates the basic subsystems including Ol Pattern generators Waveform generators timing and format IO channel cards Drive only channel cards Address scramblers OOo Oo Oo O Error Processing Catch RAM and redundancy analyzers O Address Data Source ADS bus Each of these subsystems will be described in detail in this chapter SUN computer system databus PATTERN GENERATOR ADDR CLOCK WAVEFORM patgen control address generator memory patgen redundancy analyzer data scan processor P history PC RAM EEA generators address scrambler topo inv C RAM US addr data history ADS bus DATA WAVEFORM timing generators PC RAM gt formatters error data history RAM h catch RAM drive only _channels _ voltage sources channels drive only channels have either a i pin PMU or a site PMU l depending on tester model J997 and J993 have Pin PMUs J994 has Site PMUs l l Figure 2 1 1 Overall System Block Diagram Drive only channels in the J997 and J993 have pin PMUs while the drive only channels in the J994 have a PMU per hardware site The J993 has an architecture similar to the J997 but it is optimized for high volume wafer applicati
22. TT_MFP_CRAM_CLEAR_SELECTION Arguments MFP_CRAM_CLE MFP_CRAM_CLEAR_LOWER TT_MFP_CRAM_CLEAR_BOTH 4 4 8 June 1995 J990 Series Programmer s Manual Memory Fail Processing Low Level Programming tt_mfp_clear_fmm This function call clears the fail map memory This syntax of this function is tt_mfp_clear_fmm count The count argument is the integer number of fail map memory locations to clear Count is defaulted to 1 M the entire fail map memory If it is desired to clear the entire fail map memory no argument is needed tt_mfp_clear_display_ram tt_mfp_get_fail_cnt This function call clears the display RAM This syntax of this function is tt_mfp_clear_display_ram count The count argument is the integer number of display RAM memory locations to clear Count is defaulted to 4 M the entire display RAM If it is desired to clear the entire display RAM no argument is needed This command reads the display processor fail counter The syntax for this function is tt_mfp_get_fail_cnt The hardware value returned an integer is only valid until a waveform is restored or the period value is changed If MFP function calls are used to do the scanning the function tt_mfp_get_saved_fc described below should be used since the hardware value may no longer be valid tt_mfp_get_saved_fc This command reads back the fail count that was saved when the tt_
23. When programming with the low level MFP interface you are provided with function interfaces for capture setup and scan setup however the actual scan and capture operations are left up to the programmer There are two versions of both the low level capture setup and scan setup One version takes a MFP setup instance name as an argument and the other version takes a mfpadr filename directly If the low level is called with an MFP setup instance then the input ADR file specified in that instance is extracted This input ADR file is the only portion of the instance that will be used all other fields are ignored No high level logic is ever applied when calling the low level interface functions All hidsets that are associated with a given capture configuration should appear in the same ADR file Thatis each DB file should contain one capture setup and may contain one or more related scan setups In this way all the software caches for the scan setups can be built using the same pseudo site to physical head site mapping The pseudo site part of these software caches will be built along with the capture setup portion which is why the related scan setups should be included with the capture setups June 1995 4 4 1 Memory Fail Processing Low Level Programming Low Level Function Calls J990 Series Programmer s Manual The following MFP low level function calls are available Function Type Function Call Map Sites to Pseudo
24. h14 h7 h14 h8 h14 h9 h14 h10 h14 h117h14 yo WTA x72 73 V4 tyn y6 MFT WE yo EL 2 RS Wel aw 4 2 18 June 1995 J990 Series Programmer s Manual Memory Fail Processing Templates d12X 10Y x8 topo interleave instance mfp mut topology Template define instance d12X_10Y_x8_topo_interleave mfp_mut_topology Template H Y Y OVOOCOOOOLTELLLLTL S Lee eat osent 1K 1 DO 012345670123490 T 8 due ar E E E Be a A gee a bad 7 A 0 7 V X A 4k Note DQ refers to the pseudo DQ as decoded by iob0 amp iobl value patgen 0 choice Main value x_y_bit px0 pox px2 px3 ox4 px5 px6 Mose px8 px9 px10 Moki py0 pyl py2 py3 py4 py 5 py6 w py7 py8 py9 10b0 iobl 10b2 value h_v_expr V0 Wz x72 V3 V4 y5 v6 TY i V8 yo 310 nE TAS n4 LS he h7 hse mo h10 h11 RHR ho Wha ho June 1995 4 2 19 Memory Fail Processing Templates J990 Series Programmer s Manual MFP MUT Topology Template 2 MFP MUT Topology Template 2 Insted name mfp_ mut topology 2 Template contains a description of the internal layout topology of the device This template can be used to generate custom topologies that differ from the default topology MFP generates from the MUT description template The template is based on address mapping functions included in the user s job and is appropriate for devices
25. 0 1 1 0 0 1 1 di2X_10Y_x8_scram mfp_addr_scram_Template A3 A4 A8 A9 A10 All A3 A4 A8 A9 0 0 0 0 0 0 1 1 1 1 value scram_expression px0 py1 px5 py0 voyo Note pxl px6 py py6 px2 px7 s py7 px3 px8 py3 py8 px4 Ww px9 px10 pxll py4 py9 Non address multiplexed RAMs specify a suffix parameter value of 0 for all pins specified in the addr pins list In the example above the mutadr equivalent to the first table entry is A0SO px0 pyl The mutadr equivalent to the last table entry is A9S1 py9 The figure on the next page shows the Insted display for the instance shown above It shows in a graphic format how the addr_pins the value suffix and the scram_expressions are related 4 2 4 June 1995 J990 Series Programmer s Manual Memory Fail Processing Templates d12X_10V_x4_scram Table__1 sn 4 D ms Address Pin Names Cycle Position Scramble Expression Ea 2 px1 ns 4 5 o y l O EEN S EESE S L o E e _ SSS SS en Se Ag o px9 11 0 px10 iz 0 px11 13 AO 1 pyo 14 a 1 py1 i Se 2 a ECI my EEN SSE Sees py EN SS py8 a ee eS ae pys ai Figure 4 2 1 Insted Table Display of the d12X_10Y_x8_scram Instance June 1995 4 2 5 Memory Fail Processing Templates MFP Address Scramble Template 2 J990 Series Pro
26. 0 2 volts will constitute a pass Values outside this constitute a fail Although the demo program uses this range the following typical range is more common 1 volts lolimval to 0 1 volts hilimval value pinlist DIODE_PINS value fload 0 choice off value mpause 0 015 value sequence 1 choice seq The pinlist parameter lists one or more pins on which tests are to be run The PMU tests will be run on all pins indicated If two forceval parameters are specified both will run on all pins listed The pinlist is defined in the pindb In this example DIODE_PINS are defined as DQS CLKS ADDRS The fload parameter which is turned off in this example allows the dynamic current load ILOAD circuitry to be used during testing to force current on the pins Only IO channels have ILOAD circuitry The ILOADS can provide forced current June 1995 Using Templates J990 Series Programmer s Manual greater in magnitude than the pin PMUSs can provide The ILOAD current sources are capable of forcing as much as 50 mA For pins that will use this feature the pins must be in HiZ compare mode use the driveroff parameter to ensure this The mpause parameter is used to allow PMU settling This pause will allows the force value to stabilize The mpause values specified is a double precision floating point number It ranges from 0 0 to 17 0e 3 17 ms The default value is 15 0e 3 15 ms The speci
27. 168 172 224 228 160 164 June 1995 1 3 7 Creating Channel Database Files J990 Series Programmer s Manual Table 1 3 3 J997 Signal Names According to Channel Numbers 1 3 8 June 1995 J990 Series Programmer s Manual Creating Channel Database Files Chan Sig Chan Sig Chan Sig Chan Sig Chan Sig 0 d30s4 56 dOs4 116 d3s4 172 d35s0 222 i022 1 d30s5 57 dOs5 117 d3s5 173 d35s1 223 i023 2 d30s6 58 dOs6 118 d3s6 174 d35s2 224 d36s0 3 d30s7 59 dOs7 119 d3s7 175 d35s3 225 d36s1 4 d31s4 60 dis4 226 d36s2 5 d31s5 61 dis5 af 227 d36s3 6 d31s6 62 dis6 128 dOs0 184 d30s0 228 d37s0 7 d31s7 63 dis7 129 dosi 185 d30s1 229 d37s1 8 d34s4 64 d32s4 130 dOs2 186 d30s2 230 d37s2 9 d34s5 65 d32s5 131 dOs3 187 d30s3 231 d37s3 10 d34s6 66 d32s6 132 dis0 188 d31s0 232 io48 11 d34s7 67 d32s7 133 disi 189 d31s1 233 io49 12 d35s4 68 d33s4 134 dis2 190 d31s2 234 io50 13 d35s5 69 d33s5 135 d1s3 191 d31s3 235 io51 14 d35s6 70 d33s6 136 d4s0 192 d2s0 236 io52 15 d35s7 71 d33s7 137 d4s1 193 d2s1 237 io53 138 d4s2 194 d2s2 238 io54 A 139 d4s3 195 d2s3 239 io55 24 d38s4 80 d36s4 140 d5s0 196 d3s0 240 d32s0 25 d38s5 81 d36s5 141 d5s1 197 d3s1 241 d32s1 26 d38s6 82 d36s6 142 d5s2 198 d3s2 242 d32s2 27 d38s7 83 d36s7 143 d5s3 199 d3s3 243 d32s3 28 d39s4 84 d37s4 200 io0 244 d33s0 29 d39s5 85 d37s5 201 io1 245 d33s1 30 d39s6 86 d37s6 152 d8s0 202 io2 246 d33s2 31 d39s7 87 d37s7 153 d8si 203 io3 247 d33s3 32 d
28. An example parm pipeline length Int Patgen pipeline length optional min 230 max 249 Example tdl File The following tdl file basic func_ Template tdl was created as a simpler version of the existing func_Template tdl on page 3 2 8 which runs functional tests on multiple sites using the patterns listed in the pattern parameter of the instance The basic_func_ Template is designed for the user who wants to run a functional test that would use only one pattern The pattern management parameters have been removed The example below will print the test title select a waveform level and calset and run the pattern define template basic _ func Template one parm autotitle In Use Automatic Datalog Title choice no 0 yes 1 default no parm title String Datalog Title optional parm levels Level Levels Name optional parm waves Waveform Waveform Name optional parm calset String Calset Name optional parm pattern Pattern Pattern Name parm tnum Int Test number optional min 1 max 65535 3 June 1995 3 2 7 Customizing Templates define template func Template per sit parm levels Level optional parm waves Waveform optional parm calset String optional parm patterns Pattern parm skip Pattern optional parm trap Pattern optiona
29. Argument values and their meanings are as follows June 1995 4 3 9 Memory Fail Processing High Level Programming head pseudo_ site J990 Series Programmer s Manual This is the integer head number It can be Oor 7 This is an integer in the range 0 to num sites 1 where num_sites is the number of devices to be tested in parallel num_sites comes from the Bitmap Usage Template mfp_mut_topology_instance_name TT_MFP_OP_TYPE TT_MFP_CURRENT TT_MFP_UNMASKED TT_MFP_NULL_OP TT_MFP_MASKED TT_MFP_MASK TT_MFP_ACCUM This is the name of one of the instances of the MFP Memory Under Test Topology Template or it is NULL If NULL is specified an automatically generated default topology will be used The default topology will display lOs side by side Any of these will set up for the current last captured image to be scanned out If masking was enabled in the MFP setup instance this will set up to scan out the current fails masked by the last saved mask image for that site The bitmap display will only show new fails from the most recent capture which are not also present in the mask image If masking was enabled in the MFP Setup instance this will set up to scan out the mask image itself for the given site Note the difference between this argument and the TT_MFP_MASKED argument If accumulate was enabled in the MFP setup instance this will set up to scan out the accumulated failures of all captures on t
30. DC_SPECSET_NAME eqset FILENAME OWDB OVERLAY_WAVEFORM_EQSET_NAME eqset FILENAME OLDB OVERLAY LEVEL EOSET NAME 21 b Define the overlay waveforms and overlay levels as group objects in the group form statement as shown below c Add the newly created overlay objects to the job group as shown below 1 13 2 June 1995 J990 Series Programmer s Manual Overlay Level and Waveform Files group default comment OV group form type overlay_waveform OVERLAY_WAVEFORM_NAME AC_SPECSET_NAME name elements ERLAY_WAVEFORM_E OSET_NAME overlay_level OVERLAY_ LEVEL NAME DC_SPECSET_ NAME job OVERLAY_ LEVEL EQSET NAME JOB_NAME OVERLAY_WAVEFORM_NAME OVERLAY_LEVEL_NAME 4 Translate the oladr owadr and wspadr files to db binary files using the adr900 translator command Building Overlays from Existing Specsets and Eqsets The next two methods are used for creating overlays that are combinations of existing specsets and eqsets Both can only be done when running a job The overlays will only exist in memory while a job is being run After the session has been ended the overlays that you created will disappear Note that the eqsets and specsets used in overlays must be a part of the job group in the workspace
31. For more information about channel allocation and selection for Catch RAM Redundancy and Bitmap applications refer to the J990 Series Catch RAM Manual Chapter 3 1 Catch RAM DIB Wiring Considerations Selecting Drive Only Channels Drive only channels are associated with a hardware site For example a single drive only channel card in the J997 has two signals fanned out to four sites eight channels total When cards are added to a J997 system it can be expanded to provide additional functions up to 40 functions or it can be expanded to provide additional sites up to 8 sites A fully stuffed J997 system can have 40 independent functions for eight sites Alternatively if only 20 functions are needed then up to 16 sites can be used It is important to know how many drive only channels are in a particular system and how it is stuffed before selecting drive only channels for a test program June 1995 1 3 3 Creating Channel Database Files J990 Series Programmer s Manual Channel Selection Programming The guidelines for selecting drive only channels include O Start by selecting the list of drive only channels to be used for the testing application For example if testing 8 devices 1Mx4 DRAMs then each site willneed 14 drivers 10 address and 4 clocks Since each driver signal is fanned out to four sites 28 drive only channels would be needed 28 drivers x 4 hardware sites is equivalent to 14 driver signals x 8
32. WRITES TO DATABASE ONLY run FUNCTION then t2 would be 16 ns June 1995 1 13 5 Overlay Level and Waveform Files J990 Series Programmer s Manual ANULL reloads the original database values For example if the following were run writesys select_waveform tight_timing TRANSFERS FROM DATABASE TO HARDWARE writesys select_overlay_waveform loose timing TRANSFERS FROM DATABASE TO HARDWARE writesys spec_value t2 tight_timing 18ns WRITES TO DATABASE ONLY writesys update_overlay_waveform NULL WRITES TO HARDWARE ONLY run FUNCTION then t2 would be 16 ns Note that updates using the NULL argument always affect the last update or selection If however the following were run writesys select_waveform tight_timing TRANSFERS FROM DATABASE TO HARDWARE writesys select_overlay_waveform loose timing TRANSFERS FROM DATABASE TO HARDWARE writesys spec_value t2 tight_timing 18ns WRITES TO DATABASE ONLY writesys update_waveform NULL WRITES TO DATABASE ONLY run FUNCTION then t2 would be 16 ns Interactive Usage of Overlays Overlays can be applied using the 1G900 tool Job State which involves the following steps 1 From Jobtool trap on a test test type or instance 2 From Jobtool summon Job State from the Tools menu 3 In Job State s main window select an overlay listed in either the Overlay Waveform or Overlay Le
33. one based on piks pin index keys and the other based on pins These function calls take advantage of the C function overloading feature the correct function will be selected based on the arguments to the function call The syntax of the pik form is tt_mfp_set_addr_mux pik amux_O_bit amux_l_bit amux_0_ bus The syntax of the pin form is tt_mfp_set_addr_mux pin amux_O_bit amux_l_bit amux_0_ bus The first argument is either a pin or a pik The pik argument is a pik number integer The pin argument is a pin name as defined in the pin database The amux_o_bitand amux_1_bit arguments may be an integer between 0 31 inclusive This will set the specified pik or pin to the specified ADS or SEC bit The amux_0_bus and amux_1_bus arguments may be TT_MFP_ADS or TT_MFP_SEC Both bus arguments are defaulted to TT_MFP_ADS they can be omitted if this selection is satisfactory 4 4 4 June 1995 J990 Series Programmer s Manual Memory Fail Processing Low Level Programming tt_mfp_set_inmux This function call is used to program the X and Y address scramblers RAM input multiplexers The syntax of this function call is tt_mfp_set_inmux which mux pg_bit bus The which argument is either TT_MFP_X_SCRAM or TT_MFP_Y_SCRAM The mux argument is an integer of value 0 15 inclusive it selects one of 16 X or 16 Y address scrambler multiplexers The pg_bit is one of the TT_MFP_INMUX_XY types The bus argument may be TT_M
34. registers reg RAM pattern controller data set RAM data gen s 0 amp 1 counters va addr waveform generator scram Catch RAM amp address generator display scan data gen s 0 amp 1 data generators 0 and 1 PROC processor Cntl control REGS reg registers register scram scrambler SRC soruce dgen data generator ADDR address SEL select fmt cntl format control CNTR counter drv drive TG Timing Generator fmtr formatter Figure 2 1 7 SVM Location Contents Diagram June 1995 2 1 9 Programmer s Guide to the Hardware Pattern Flow Control J990 Series Programmer s Manual To control the flow of the pattern there are several counters which are used to keep track of the number of cycles in a loop or on a single pattern location These counters are set up with a value then decremented until zero is reached O O 28 bit repeat counter using accumulator to repeat a certain number of cycles on a single pattern step 4 nestable loop counters 28 bits to program loops of multiple steps 7 utility counters which are independent of loop counters and each other used for conditional branching of pattern flow e 4 counters have 28 bits c1 c2 c3 and c4 e 3 counters have 14 bits c5 c6 and c7 Asynchronous timed interrupt with automatic branching to pattern subroutine for DRAM device refresh capability Refre
35. value floatpins value startpat value stoplabel value tnuml 40 value forcespecl value tnum2 60 value forcespec2 3 1 28 June 1995 J990 Series Programmer s Manual Using Templates define instance io_ hi leakage pin _ pmu Template postbody postbody_ function prebody prebody_function posttest value mpause 0 0005 value lolimval value hilimval valu levels leakage_levels value pinlist DQO DOI DQ2 DQ3 value fload 0 choice off value irange 15 choice 20UA value measure 1 choice Current value sequence 1 choice seq value autotitle 0 choice no value forceval2 value forcevall 5 5 value lolimspec IL_1o value hilimspec IL_hi value forcespec2 value tnum2 value forcespecl value tnuml 90 value stoplabel value startpat value floatpins value waitflagsfalse value waitflagstrue value duringpat value beforepat value driveroff value driver0 ADDRS DOS value driverl RAS CAS WE OE value calset value waves value title2 value title value patstop value patstart e e e e Notes pretest Leakage test use the pin_pmu_Template just as the continuity tests do These notes will describe the differences but will not repeat the notes under the continuity test Review the notes on page 3 1 8 if needed The sequence paramet
36. 0 Each data generator selects one of these data sources which can be inverted For example logic 1 data can be generated by inverting the logic 0 selection Selection of these functions is available on the fly in the data set In addition the function of each LFG is programmed on the fly in the data set The function of the LFG can be AND OR NOR XOR and so on see page 2 1 16 These functions are performed on the two address bits that are selected to drive each LFG The address selections are done with the databus prior to the patgen burst scrambled 32 address patgen alt data gen data generator address generator 1 D data gen 1 invert switchable on the fly TOPO i patgen i invert RAM e ee 226K D Figure 2 1 10 Data Generation on the Memory Patgen June 1995 2 1 15 Programmer s Guide to the Hardware J990 Series Programmer s Manual This data can also be inverted based on selectable address bits topological inversion so data is generated based on how the device array will store the data Because the data generation is two bits wide two bits of topo inversion are available for each topo RAM The topo RAM is implemented as four separate 256kx2 blocks The two data generator data bits are available for selection onto the ADS bus making these bits available to each channel s waveform generator Table 2 1 1 LFG Functions
37. 0 through 1023 OOo oO d mode may be capture capture invert scan disp or scan ra May be defaulted and is not required slice may be 0 through 3 May be a LIST 2 3 or a RANGE 0 3 of numbers Ly iscan enable may be 0 through 1023 Ly Scan compare may be 0 through 1023 Ol spin may be any device pin name found in the pinlist May be a single pin only May be defaulted and is not required Ol pseudo site may be 0 through 31 May be a single site only May be defaulted and is not required O or pin may be any device pin name found in the pinlist May be a single pin only May be defaulted and is not required June 1995 4 4 19 Memory Fail Processing Low Level Programming J990 Series Programmer s Manual failmap form The failmap form statement is used to program the Fail Map Memory FMM hardware for bitmap capture The following is an example failmap form pin pseudo site cs enable cs compare mode scan enable scan compare DQO 0 1 Oxff 0x03 capture Oxff 0x03 Required fields include pin and at least one other field O ipin may be any device pin name found in the pinlist It may be a single pin only pin may be defaulted and is not required Pin all may be used to specify data for all test system channels in the failmap form This might be used to disable channels not used by the test program Pin name all is reserved pin name in the 1G900
38. 1 36 Drive only Channel Cards Support 2 Functions For 4 Sites J997 J993 It is important to note that each function is split in half Four site drives are located on the drive only channel board for sites 0 through 3 and four site drivers with the same function are located on the drive only channel board for sites 4 through 7 A second function from the WaveGen board will supply the remaining site drivers on the selected channel boards This arrangements permits some applications not requiring many sites or not needing many drive functions to be implemented using fewer channel boards resulting in a less costly test head stuffing June 1995 2 1 43 Programmer s Guide to the Hardware J990 Series Programmer s Manual Drive Only Channel Fanout to the Test Head J994 Figure 2 1 37 shows the fanout for J994 systems Channel cards for the J994 are different from those used in the J997 or J993 J994 channel cards contain 16 drivers per card twice as many as the other systems Addr Clock WaveGen Board 4 Addr Clock WaveGen Board 3 Addr Clock WaveGen Board 2 Address Clock Channel Card 4 Functions x 4 Sites Addr Clock WaveGen Board 1 Addr Clock WaveGen Board 0 site 0 se Addr SEE ste 2 _Addr 3 EEF sites Boats 8 Channels X 4 Quadrants X 4 Sites
39. 100 pA 2 UA 10 nA 20 uA 10 nA 200 uA 100 nA 2 mA 1 uA Since there is a single pin PMU controller all pins have the same range selected For the job executive software a ganged test will generate a single pass fail result 0 pass 1 fail for the pin list being tested A fail will occur if any pin in the list exceeded the programmed limits This is a hardware readback A sequential test will perform a parallel measurement on the specified pin list then the measured values are logged individually in sequence 2 1 56 June 1995 J990 Series Programmer s Manual Programmer s Guide to the Hardware System Parametric Measurement Unit System PMU Using the Relay Matrix Using the FET Matrix There is also a system PMU which can be used to supply high current up to 200 mA It can be connected to any pin in the test head using either a FET matrix or a relay matrix however for the J994 only the system PMU can only be connected to the drive only channels through the FET matrix the relay matrix cannot be used The FET matrix provides very fast connections while the relay matrix allows more current to the pin There is a single system PMU The system PMU may be used to provide an different force function than the pin PMU For example if the pin PMU is programmed to force voltage the system PMU can force current Depending on whether the FET matrix or relay matrix is used different ranges are a
40. 14 lolimval hilimval The forceval1 parameter is set to 0 0001 Forceval1 is a double precision floating point number It is the value to be forced by the PMU Here the force value is a current this is because the measure value is a voltage The PMU will force a voltage and measure a current of vice versa Volts or amperes are the presumed units For example 10 mA must be entered as 10 0e 3 or 0 01 Either forceval1 or forcespec1 must be programmed For the forcespec1 parameter you name a spec from the levels database and that spec will be the PMU force value If both the forceval1 parameter and the forcespec1 parameter is specified the forcespeci parameter will be used Forceval2 and forcespec2 are used if the PMU will be used for a second set of tests The thum1 parameter test number to be assigned the in conjunction with forceval1 is used for the first set of tests and tnum2 parameter will be used with the second set of tests In this example forceval2 forcespec2 and tnum2 are not used The irange current range parameter is a choice of 13 2MA 14 200UA 15 20UA 16 2UA 17 200NA Default 16 2UA All five ranges are available for sensing current but only ranges 13 2MA and 14 200UA are available for forcing current The lolimval and the hilimval parameters specify the limits the constitute pass or fail for the measure parameter In this case voltage is being measured A value between 2 volts and
41. 2 8 MFP Setup Template Parameters Insted Prompt Parameter MUT Description Instance mut_ description_ instance Data Type String Entry Required No MFP Setup Template has the following parameters listed in order of appearance Description Specifies the instance containing the MUT description Either mfpadr_infile must be specified or there MUST be entries in each of the following fields mut_description_instance addr_scram_instance dgen_instance bitmap_usage_instance mut_topology_instances Capture Both Scrambling Instance addr_scram_ instance String No Specifies the instance containing capture and scan address scramble information the scan_scram_instance parameter is used this parameter specifies capture only address scramble information Either mfpadr_infile must be specified or there MUST be entries in each of the following fields mut_description_instance addr_scram_instance dgen_instance bitmap _usage_instance mut_topology_instances 4 2 22 June 1995 J990 Series Programmer s Manual Table 4 2 8 MFP Setup Template Parameters Continued Entry Insted Prompt Parameter Data Type Required Scan Only scan_scram_ String No Scrambling instance Instance Memory Fail Processing Templates Description Specifies the instance containing scan only scrambling information This parameter is usually left blank When this parameter is used the addr_sca
42. 7 7 5 dgenadr 7 7 6 1 8 3 dgendb 1 1 6 insadr 1 1 5 1 11 2 leveladr 1 1 5 1 6 2 Jeveldb 1 1 5 mfpadr files dual mpg programming MFP templates 5 1 5 mutadr 1 1 5 mutdb 7 7 5 pinadr 1 1 5 1 2 2 pinadfr files dual mpg programming for 5 1 4 pindb 7 7 5 1 2 2 Specadr 1 1 5 1 5 2 Specdb 7 7 5 Srcadr 1 1 6 1 8 6 Srcadfr files dual mpg programming for 5 1 13 Srcdb 1 1 6 Startadr 1 1 6 1 8 22 Startdb 7 7 6 Svmadr 1 1 6 1 8 8 Svmadfr files dual mpg programming for 5 1 13 svmdb 1 1 6 t file customizing templates 3 2 9 tdl file customizing templates 3 2 3 waveadr 1 1 6 waveadr files Index dual mpg programming for 5 7 10 wavedb 7 7 6 wspadr 7 7 6 7 10 3 wspadr files dual mpg programming for 5 7 78 wspdb 1 1 6 7 10 3 Numerics 100 MHz mode 2 7 3 200 MHz Mode 2 1 5 60 MHz mode 2 1 4 A accum parameter 4 2 8 addr_pins parameter 4 2 2 addr_scram_instance parameter 4 2 22 address counter 2 1 11 address generation 2 1 11 address scrambling 1 4 1 2 1 11 2 1 14 adjust until parameters 1 5 1 ADRedit tool 7 7 4 ADS bus 2 1 7 AEL 1 9 1 arithmetic logic units ALUs 2 7 73 AT900 1 1 3 1 12 3 autotitle instance parameter 3 7 5 B background_Template 1 11 3 3 1 4 bias supply 2 7 53 bitmap_usage_instance parameter 4 2 23 build_workspace 1 10 6 c caladr 1 9 2 Calcsheet 1 1 4 1 6 1 caldb 1 9 2 calibration 1 9 1 calset instance parameter 3 1 21 calsets
43. A8 AY A10 All A12 A13 A14 AO Al A2 A3 A4 A5 A6 A7 A8 AY A10 All A12 A13 A14 value suffix 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 1 al il il 1 1 al il 1 1 il 1 1 1 1 value scram_expression px0 pxl px2 px3 px4 px5 px6 px7 py0 pyl py2 py3 py4 py5 py6 px0 pxl px2 px3 px4 px5 px6 px7 py0 pyl py2 py3 py4 py5 py6 MFP Bitmap Usage Template Template Parameter Description Number of Sites to Bitmap in Specify the number of sites to bitmap n Parallel parallel Store Mask Data Specify if you want to store mask data on off Accumulate Bitmaps Specify if you want to store accumulate data on off define instance mfp_bitmap_usage mfp_bitmap_usage_Template value num_sites 1 value mask 0 choice Off value accum 0 choice Off 5 1 6 June 1995 J990 Series Programmer s Manual Using Dual MPG Mode MFP Data Generation Template Template Parameter Description Selects which MPG Options are Main 0 Alt 1 or Both 2 In dual MPG mode Both is the appropriate choice since data generation and topo inversion will be the same for both MPGs Which Patgen List only the primary IO channels secondary Data Pins Names channels are programmed automatically Suffix does not apply to dual MPG for IO pins always Cycle Position use cycle 0 Select here which dgen 0 or 1 will be routed to the corresponding data pin All secondary channels odd numbers channels in the c
44. Binary Database ee Database Editor File File t 2 Create program flow file AT900 Flow Code wspadr wspdb 3 Create workspace file Workspace ADRS00 Workspace Translator File Database 4 Create Makefile Text Makefile Editor wspdb 5 Load and Link Loading 990 Test Program Database and Executable Modules 1G900 Tools 6 Run and Debug Figure 1 1 1 Illustration of Programming Steps 1 1 2 June 1995 J990 Series Programmer s Manual Programming Overview Programming Process Create database files Database files are created by editing ASCII files ASCII Database Representation or ADR files then translating them with the adr900 command to create binary data for the test program to use Alternatively some of the binary database files can be created directly with G900 tools These databases contain hardware setups and device test conditions for the program to use including O Pin and channel mapping Memory under test description Device specifications Timing waveforms and level equations oOo Oo 0 Test patterns and data generation O Calibration conditions ASCII database files use a adr extension and binary database files use a db extension All data sent to the test system hardware except the test instructions instanc
45. Driver transitions will not occur at d0 and d3 PCRAM Data 0 1 PCRAM Data 0 0 VIH VIL Figure 2 1 23 Using Mach2 Mode with Non Return Format First Half Second Half PCRAM Data 0 1 PCRAM Data 1 0 VIH VIL di do d2 d4 d3 d5 Figure 2 1 24 Using Mach2 Mode and Formatter Muxing with Non Return Format June 1995 2 1 27 Programmer s Guide to the Hardware J990 Series Programmer s Manual IO Compare Modes In addition to driving data IO channels can also compare data Either window strobes or edge strobes can be selected Figure 2 1 25 shows examples of edge and window strobe When programming edge strobes the c2 edge is used to strobe The c1 edge should be placed on top of the c2 edge that is c1 should be programmed to the same value Note also as shown in the figure edges can be programmed across the cycle boundary dO For edge strobes that means the strobe can be delayed into the next cycle or several cycles This is shown in the figure when the c2 edge strobe of the second cycle is delayed into the third The normal c2 edge strobe for the third cycle also occurs as programmed For window strobing both c1 and c2 are used to define the length of the strobe Like edge strobe window strobes can be delayed into later cycles Either the entire window strobe can be delayed into a later cycle see cycles 5 and 7 in the window strobe example or the c2 edge can be delayed acro
46. Expect valid voltage above Voh or below Vol 4 L Expect logic low 5 H Expect logic high 6 W Hold window strobe 7 X Don t care IO channel vectors are most commonly programmed in this symbolic mode where the state symbol is either 0 1 M V L W or X and the pin symbol has the S extension in the vector form header The single character vector after the period will cause the vector to apply to all pins in the pin symbol vector form IOS S header using symbolic vector 0 drive data in this cycle L expect data in this cycle When using algorithmic address or data to drive the channel the states of the channel are driven partially by the ADS bus The Isb of the three bit input to the 8 state model will come from the ADS bus The bit on the ADS bus will then determine whether the channel expects a 0 or a 1 or drives a 0 or a 1 States 0 1 L and H in the SVM will be most commonly used for this application Either state 0 or 1 can be used when driving data that is coming from the ADS bus either state L or H can be used when expecting data from the ADS bus 1 8 10 June 1995 J990 Series Programmer s Manual Creating Pattern Database Files Drive only channels can have four bits of data that drive the channel state However the number of bits that are used depends on the mode of the channel Table1 8 4 Drive Only Channels Vector Bits Number of Vector Bits Used which ones Fmt
47. MFP MFP address scrambling template 5 1 5 bitmap usage template 5 1 6 data generation template 5 1 7 MUT description template 5 1 7 MUT topology template 5 1 8 setup template 5 1 9 MFP Address Scramble Template 4 2 2 4 2 4 example instance 4 2 4 4 2 7 4 2 21 MFP Address Scramble Template 2 4 2 6 4 2 7 MFP Bitmap Usage Template 4 2 8 4 2 9 example instance 4 2 9 MFP Dgen Template example instance 4 2 12 MFP MUT Description Template 4 2 13 4 2 14 example instance 4 2 14 MFP MUT Topology Template 4 2 15 4 2 19 example instances 4 2 16 4 2 19 MFP MUT Topology Template 2 4 2 20 example 4 2 21 MFP see also memory fail processing MFP Setup Template 4 2 22 4 2 25 example instance 4 2 25 mfp insadr files dual mpg programming for 5 7 5 mfpadr_infile parameter 4 2 24 mfpadr_outfile parameter 4 2 24 minimum pulse width guidelines 2 2 7 mpause instance paramter 3 1 10 MPG Memory Pattern Generator dual mpg programming of 5 7 7 See also dual mpg mpgset statements 7 8 8 MUT database file 7 4 7 mut_description_instance parameter 4 2 22 mut_topology_instances parameter 4 2 24 mutsets 1 1 5 1 4 5 N non return See NR NR guidelines for 2 2 12 num_outputs parameter 4 2 13 num_sites parameter 4 2 8 O offline loading dual mpg test programs offline 5 1 21 orientation parameter 4 2 13 output current leakage 3 1 24 See also leakage tests output system 3 7 73 output_pins parameter 4 2 13 overlays 1 13 1 P para
48. Main FOR Function Lines 35 108 87 switch dotests 88 case 0 90 case 2 91 if failflag 0 92 93 94 95 writesys test_func 96 break C AT900 C Get the dotest parameter value in the current instance If the dotest value is 2 i e do test func if fails only go to If the dotest value is O i e don t do test func go to the next line if not go to line 90 Get out of switch statement and go to line 98 the next line if not go to line 93 If the dotest value is 1 i e do test func go to the next line If failflag is the same value as 0 false go to line 92 if not go to line to 93 Get out of switch statement and go to line 98 if not go to line 94 The dotest value is neither 1 2 nor 0 go to the next line Start pattern burst in the current instance get the pass fail information and datalog the results Get out of the switch statement and go to line 98 98 99 100 if HASVALU for S trap NE C Macro C If the current instance has a trap parameter go to the next step if not go to line 104 Define S as equal to trap Ss trap If S has a value go to the next step if not go to line 104 HASVALUE S Select the next trap value NEXT S If S has the same value as V go to line 101 if not go to line 99 and select the next trap value NEXT S 1
49. OV Voltage on shorted pins will be negligible voltage on open pins will be high In general to test for shorts and opens with the pin PMU do the following 1 Set all power VCC and ground pins to OV This is programmed using the levels parameter in the instance Using the pin PMUs establish a background of OV on all signal pins Set the pin PMUs to force a small negative current Generally a value of about 100uA is selected Make sure the clamp voltage is appropriate for the memory under test In the example instance 100uA is used The forceval1 parameter specifies the value 4 Set test limits to an appropriate high and low level for the memory under test A high limit failure indicates a short and a low limit failure indicates an open A typical value for these limits are 0 1 V and 1 0V This is programmed using the lolimval and hilimval parameters in the instance The appropriate template will be one of the pin PMU templates pin_pmu_Template pin_pmu_table_Template pin_pmu_alternate_Template or pin pmu _alternate table Template The J994 test system also uses the pin pmu_ Template even though these systems have site PMUs For the differences see the sequence discussion on page 3 1 10 June 1995 Using Templates Continuity Test Instances J990 Series Programmer s Manual Below is an example instance as it appears in the diMx4 DRAM demo program An instance such as this could be created using Insted or
50. SVM pin data vm vm ads Data input from data generator vm vm vm Clock normal vm vm Clock mach2 vm vm vm SCIO Address from memory pattern generator vm ads ads SCIO data input from data generator vm ads ads When using drive only pins in the formatter mux mode the database software programs the X and the Y half of the channel to have the same selections Source select RAM location 0 is reserved by Teradyne for programming all bits to come from vector memory vm User programmed labels are loaded starting at location 1 June 1995 1 8 7 Creating Pattern Database Files J990 Series Programmer s Manual Source Select Database Examples Pin Data Selections for DRAM Pins use pinset diMx4pins pindb diMx4 pins srcset dram_srcset src form label ADDRS DOS CLKS srclocl 0 0 ads vm vm ads 0 O vm for mach2 operations CLKS should be 0 vm vm Multi Function Pin Address and Clock use pinset mfpins pindb multi function pinset srcset mfpin_srcset src form label AC_PIN DQS CLKS addr_func 0 O ads vm vm ads 0 0 vm clk_func 0 O vm vm vm ads 0 0 vm for mach2 operations CLKS should be 0 vm vm Contents of the Svmaar File The SVM PCRAM database is defined with the ADR mpgset statement inside a svmadr file Only one mpgset statement is allowed per file The use pinset statement must appear before the SVM definitions The SVM database will also contain an e
51. Second Edition Al Kelley amp Ira Pohl The Benjamin Cummings Company Inc 1992 The Annotated C Reference Manual Margaret A Ellis amp Bjarne Stroustrup AT amp T Bell Laboratories Addison Wesley Publishing 1990 C Primer Stanley B Lippman AT amp T Bell Laboratories Addison Wesley Publishing 1990 7 1 12 June 1995 J990 Series Programmer s Manual Creating Pin Database Files Chapter 1 2 Creating Pin Database Files Objective Create pinadr and pindb files Reference ADR900 Reference Manual Introduction The pin database file contains a list of individual device pins pin groups that the test program will use and the type of tester resource each pin is connected to This file is used by other modules and databases which need to program tester hardware based on the pin names The pin database creates a symbol for each device pin and pingroup These symbols are used by the waveform level patgen datagen src and MUT databases in order to program the hardware by referencing device pins The hardware resource type for each pin is also specified so checking can be done by other database software to make sure correct programming is done for each pin D1Mx4J pinadr Pin Resource Resource Name Type Mode io inout DQ1 io inout WE drive only in drive only in vs Figure 1 2 4 Illustration of Pin Database for 1Mx4 DRAM SOJ June 1995 1 2 1 Creating Pin Database Files J990 Series Progra
52. Sites function Capture setup functions Scan setup functions tt mfp_adr map pseudo sites tt mfp_lowlevel_adr capture setup tt mfp_lowlevel_ capture setup tt mfp_lowlevel_adr scan setup tt mfp lowlevel_ scan setup Address Clock Channel Multiplexers Address Scrambler RAM Input Multiplexers Address Scrambler RAM Output Multiplexers tt_mfp_set_addr_mux two versions tt_mfp_set_inmux tt_mfp_set_outmux Clear Functions Catch RAM Fail Map Memory and Display RAM tt_mfp_clear_catchram tt_mfp_clear_fmm tt_mfp_clear_display_ram Display Processor Functions tt_mfp_get_fail_cnt tt_mfp_get_saved_fc tt_mfp_save_fail_cnt Disable Capture Functions for Catch RAM or FMM IO Channel Multiplexers tt_mfp_disable_catchram tt_mfp_disable_fmm tt_mfp_set_data_mux 2 versions Scanning functions Catch RAM or FMM to Display RAM Topological inversion function tt_mfp_adr_map_pseudo_sites The syntax of this function call is tt_mfp_scan_catchram_dr tt_mfp_scan_fmm_dr tt_mfp_set_topo_block tt_mfp_adr_map_pseudo_sites mfp_ADR_filename This function is called to map the physical active sites onto the pseudo sites that the MFP system deals with The first N active sites are mapped to the N pseudo sites able to be set up for the specified ADR file When to change this mapping is left up to the programmer However if no mapping has been specif
53. The test program job is defined as a group object and multiple job groups can be defined in one workspace The job group object contains all the databases and executable modules that are to be linked and loaded to create the job Flags to be passed to the linker and loader are also specified in the workspace flag statement set and set form statements The set statement contains a set form table which names all database sets and the file names modules which contain them The purpose of these statements is to declare all databases which will be used in the workspace and include the location where they can be found set set form type name module pinset d1iMx4_ pins diMx4pins pindb chanset d1iMx4 j_chans d1Mx4j chandb specset nom_levs levels specdb specset timing_70ns timing specdb specset timing_nominal timing specdb eqset levels_eqns pin_levels leveldb eqset simple_wave_eqns simple_wave_egqns wavedb mpgset dram_patterns dram_patterns svmdb dgenset pattern_data datagen dgendb srcset srcset dram_src srcdb mutset d1Mx4 dx4 mutdb startset march patterns startdb June 1995 7 10 3 Creating Workspace Database Files J990 Series Programmer s Manual flag and flag form statements The flag statement contains a flag form table that specifies the flags to be passed to the standard linker Id and the Teradyne linker tld Recommended tidflags include m and recommended I
54. XLOOP xa inc loop XMAX loop on XMAX eloop XLOOP sya inc eloop XLOOP2 A variant of this approach that does not use a dummy step is shown next The WIDTH must be reduced by one xreg XMIN yreg YMIN xa jam reg ya jam reg loop HEIGHT write 0 read 0 if flags goto OUT_OF_HERE_1 write 1 ya inc XLOOP 1 XLOOP2 write 0 loop WIDTH 1 read 0 if flags goto OUT_OF_HERE_2 write 1 ya inc eloop XLOOP2 inactive xa inc yreg YMIN ya jam reg eloop XLOOP1 OUT_OF_HERE_2 Loop_pop OUT_OF_HERE_1 Loop_pop 1 8 18 June 1995 J990 Series Programmer s Manual Creating Pattern Database Files Pattern Scaling Pattern scaling allows patterns located in svmadr files to contain expressions which can be changed at runtime The pattern can modify primary operands loop counts repeat counts utility counters or MPG initializers xreg yreg allowing a number of different size patterns to be derived from one svmaadr file Step 1 Create runtime expressions These runtime expressions are entered as a string of characters enclosed in braces They can contain any legal C expression of variables and arithmetic symbols The resulting integer value is used in a writesys mpg_op call to update hardware Within a pattern object the following fields can accept runtime expressions Pattern
55. a Srcadr file Only one srcset statement is allowed per file The use pinset statement must appear before the source select programming One sreset programs the conditions for the source select ram for each pin being used The source select RAM determines what pin data ADS or SVM will affect each pin state which ultimately determines what a pin function is Address Clock or Data Within the srcset statement is a src form table The table has the source selections for each pin There are three source selections for each pin and each source selection should be programmed The selections will depend on the desired pin function O Selection vm designates the bit to come from vector memory SVM PCRAM in the J990 Series O Selection ads designates the bit to come from the ADS bus O Selection 0 designates the bit to be held low Selections are programmed in MSB LSB order Recommended source selections per pin function and mode are contained in the table below Table1 8 1 Recommended Source Selections Drive Only Pins Description Address from memory pattern generator Address from SVM pin data Data input from data generator Clock normal Clock mach2 1 8 6 June 1995 J990 Series Programmer s Manual Creating Pattern Database Files Table1 8 2 Recommended Source Selections IO Pins Description bit2 bit1 bitO Address from memory pattern generator vm ads Address from
56. a template The tools for writing a template are the Unix VI or Sun s Text Edit Additional examples beyond those provided in this chapter can be found in 399x templates 1 The tester root directory is j99x where j99x is the name of test system used i e j997 It is always lowercase For example on a J997 Memory Test System the template directory is located at 3997 templates In a J994 Memory Test System the template directory is located at j994 templates June 1995 3 2 1 Customizing Templates J990 Series Programmer s Manual Overview of Process There are several steps to customizing templates Two files need to be created or existing approximations edited to create a custom template These files are the tal template description language file and the t template source code file The h file header file that is included in a the t file is produced automatically from the tdl file through the tdl_to_h command The tdl file is the file used by Insted when it displays and edits instance parameters The tfile is the template source code that is executed when an instance of that template is executed with the EXECUTE macro 1 Select the standard Teradyne template closest in structure to the template you are trying to create Teradyne strongly recommends that the user copy an existing template to another directory and modify the copy to meet the specific requirement always renaming the new template to some other name
57. a text editor Example Instances define instance continuity pin _pmu Template postbody postbody_ function prebody prebody_function posttest value forcevall 0 0001 value measure 0 choice Voltage value irange 14 choice 200UA value lolimval 2 value hilimval 0 2 value pinlist DIODE_PINS value fload 0 choice off value mpause 0 015 value sequence 1 choice seq value autotitle 0 choice no value forceval2 value forcespec2 value tnum2 value forcespecl value tnuml 10 value lolimspec value hilimspec value stoplabel value startpat value floatpins value waitflagsfalse value waitflagstrue value duringpat value beforepat value driveroff value driver0 CLKS ADDRS DQS value driverl value calset value waves value levels power_off_levels value title2 value title value patstop value patstart e e e e Notes pretest Continuity tests are implemented with the pin_pmu_Template in this instance This instance of the pin_pmu_Template is simply called continuity define instance continuity pin_pmu_Template June 1995 J990 Series Programmer s Manual Using Templates The first few values in the instance set the PMU voltages 0 0001 choice Voltage schouce SZ 00UA 2 022 forcevall measure 0 irange
58. also be defined in the specification databases but it is primarily the value of a specification that is used by the software The value of the specification is used to manipulate the hardware and is also varied by the Shmoo and Specsheet tools The specification databases can be created using one of four methods O Create an ADR file specadr containing specset statements using a text editor then translate the ADR file into binary database file specdb using adr900 O Use the ADRedit tool to both create and translate the ADR file m Use the Specsheet tool to create binary database files specdb Use the Specsheet tool to create an ADR database file specadr and manually translate it to create the binary Either of the first two methods is recommended for beginning programmers June 1995 1 5 1 Creating Specification Database Files J990 Series Programmer s Manual Shmoo Tool Adjust Until Parameter Search Routines Sa Specs Equations Hardware Device Waveform Waveform Taming Equations Hardware Specs Specsheet Tool Specification Equation Databases Databases Figure 1 5 3 Relationship of Specifications to Hardware and Software Contents of the Specaor File The Spec database is defined with the ADR specs and specset statements inside a specadr file Multiple specs and specset statements are allowed per file specs statement The specs statement effectively declares t
59. alternate MPG The header names are mpg and mpg alt The information contained in each of the two clauses will independently control each MPG to generate two sets of addresses and data per cycle one for early half and one for late half The mpgset should look like this mpgset sram_patterns dual mpg The vector form should look like this vector form CYCLE_DEFINITION mpg mpg instructions for the main MPG mpg alt mpg instructions for the alternate MPG 0p Single opcode for the pattern generator June 1995 5 1 13 Using Dual MPG Mode The tollowing is an example of a scan pattern written to operate in dual MPG mode default INACGREVEeCYETER SCOS CCRC vel mpg xreg 0 yreg 0 AMOR ONROIlCTE CROIS OE sya hold svoeholal v cenold E hold xconst next xaluk zero yaluk zero xdevadr xa ydevadr ya xdgadr xa ydgadr ya dgroup next hold dset 0 Ca Hela Clee Ostels sisp PUSA TEA MECREENOLE mutsim idle xaluj zero yaluj zero mpg alt xreg 0 yreg 0 Sorel clove lies EIo INOG Roxie lake lkzel Bier ME yoy deveikel Bye Noke xconst next hold yconst next hold xena next hold yena next hold xaluk zero yaluk zero xdevadr xb ydevadr yb xdgadr xb ydgadr yb dgroup next hold dset 0 refresh disable xaluj zero yaluj zero holdy syv constanexts hola xena next hold yena next hold xaluop xor yaluop xor xdevinv off sexo Gaini
60. and max adjust until parameters from to resolution When first creating a program it is recommended to just program the value of a spec as this reduces the program complexity and development time When the other value parameters associated with a spec need to be used they can be added specset timing_nominal comment Nominal Timing for Basic Functional Tests default start ratio 0 min nil stop nil from nil to nil 0 max 0 seq order 0 backoff 0 result nil first fail resolution 0 1 log setup 0 set form symbol tRC tRAC tCAC tOE tAA tRAS CCAS tRCD_min tRCD_max ET CHIZ method successive maxloops 25 value 200 120 30 30 60 130 50 25 50 3 5 Level specs and timing specs are usually contained in separate files It is recommended that level spec file names contain levels and timing spec file names contain timing such as levels specadr and timing specadr June 1995 1 5 3 Creating Specification Database Files J990 Series Programmer s Manual Specification Database Example Level Specs for DRAM specs default format 6 1 units V devspec yes comment nil item nil spec form symbol description Vcc Supply Voltage Vih Input High Voltage Vil Input Low Voltage Voh Output High Voltage Vol Output Low Voltage default format 6 0 units mA devspec yes comment nil item nil s
61. and system PMU tests The first half of the array Tlib_tnumarray 0 is used for the test numbers of the first of 2 setups for parametric tests say low voltage associated with the tnum1 parameter of the pin_pmu_Template The second half of the array Tlib_tnumarray 1 is associated with the second of 2 setups for parametric tests say high force voltage This array is used to process test numbers for the PMU and PPMU Templates Tlib_debug This variable is an integer type and is used to flag whether the template code is being debugged or not The user can program some statements to output additional status messages to the screen if this variable is set Then if Tlib_ debug is set to 1 in tdbxtool using the command assign Tlib_debug 1 to putthe template code in the special mode more debug data will be outputted For example Spec S refspec if Tlib_debug PR n Spec Wss readsys spec_symbol S Tlib_specs_modified This variable is of integer type and is used to track whether the template code has changed the value of any spec in the spec database or not This statement must always accompany any writesys spec_value statement inthe template code Whenever values are modified they should first be saved in a storage place so that they can be restored at the end of the template When modifying the spec value set Tlib_specs_modified 1 When restoring the original value reset Tlib_specs_modified 0 Fo
62. be changed during a pattern generator run changing the source of any of the three source select bits on the fly The output of the eight state model lookup hardware is the three bits that define one of the eight possible states the IO channel can be placed in This data goes to the IO channel formatters The formatters interpret the bits and places themselves in the specified state In the default mode the eight state model does not change the bits each bit is passed through unchanged However if desired the eight state model lookup can be reprogrammed so that a different IO channel state is generated from the three bits that come into the eight state model lookup table If the source select RAM specifies all bits to come from the SVM and the eight state model is at its default setting then the symbol used in the pattern 0 1 m x etc will set the state of the formatter What is often useful is to specify ADS as the source for bit 0 and svm as the source for bit 1 and bit 0 The source select syntax for this arrangement is vm vm ads This produces the mapping shown in Table 2 1 5 As is shown in the table bit 0 will choose between drive 0 and drive 1 With bit 0 coming from the ADS bus that means the data generator is supplying the data This is desired However note that the data generator also chooses between expect midband and expect valid in the table This is not desirable The ignore ADS bits are used for this Each one of th
63. caldb calsets The waves parameter allows a waveform from the workspace to be specified In this instance the wave _timing_nominal waveform is selected This is defined in the workspace file as Using Functional Test Instances waveform wave_timing_nominal timing_nominal spec_wave_eqns_1 This segment is part of the group clause in the workspace file It allows a waveform which consists of a timing spec object and a timing equation object The timing_nominal element is defined in the d1Mx4_timing specadr file The timing_nominal element contains the nominal timing specifications The spec_wave_eqns_1 is an equation set eqset from the wave database d1Mx4_wave_eqns wavead r It contains the timing equations and formats The levels parameter has been previously described see page 3 1 10 The remaining specified parameters prebody and postbody have also been described see page 3 1 11 Functional instances are used just as other instances are you use the import Instance statement to import the instance into your main t file and then include the instance in your test flow For example the func_spec_levels instance is used as follows in the demo program EXECUTE funct_spec_levels FAIL DO funct _ spec_ levels sort_bin FAIL FUNCT LEVELS 3 1 22 June 1995 J990 Series Programmer s Manual Using Templates A more complex example that uses several functional test inst
64. clause for identifying pin groups For more information regarding the syntax of ADR statements see the ADR900 Reference Manual Specific guidelines for the pin database contents O Use upper case for pin names as this makes it easy to distinguish them in source code and other database modules Ol Inthe standard datalog formats the test result field represents a hexadecimal bitmask of the pins that failed A bitmask can be created only when the logical name of the failing pin s ends in a number For example 1 0 16 would be represented as 0_0 10000fnR However in the expanded datalog formats failing pins are listed for each site after the test result A zero represents a pass and a non zero represents a fail 1 2 2 June 1995 J990 Series Programmer s Manual Pinaar File Example comment d1iMx4pins pinadr pinset diMx4 pins default pin form default Nee comment 1Mx4 pre n S S OAWDs D D Fl PPP PP PP Pe Jo O1 amp N H mode inherit group form CLKS ADD INP IOS DOS OUT ALL POW f no comme ame comme Write DRAM SOJ Pin Names nt nil n fda nable Row Addr Select Column Addr Select Outpu Addre Addre Addre Addre Addre Addre Addre Addre Addre Addre Data Data Data Data 5V P Vss G name RS UTS PUTS PINS ER_PINS t Enable ss 0 ss 1
65. comes from ADS bus due to source select programming No pin state data is required DOS are always programmed to drive 0 0 when writing and expect 0 L when reading but actually data comes from ADS bus due to source select all clocks RAS CAS WE OE are always programmed to drive the logic state that is needed for a particular cycle type For starting a page mode 7 operation the logic state for RAS is 0 and for ending a page the RAS state is 1 June 1995 1 8 13 Creating Pattern Database Files J990 Series Programmer s Manual SVM Database Example continued DRAM March Pattern mpgset dram_ patterns vector form CYCLE DEFINITION mpg op default INACTIVE CYCLE ssrc srclocl sEv 0 xreg 0 yreg 0 xa hold xb hold xc hold xd hold ya hold yb hold yc hold yd hold xconst next hold yconst next hold xena next hold yena next hold xaluj zero xaluk zero xaluop xor yaluj zero yaluk zero yaluop xor xdevadr xa ydevadr ya xdevinv off ydevinv off xdgadr xa ydgadr ya xdginv off ydginv off dgroup next hold dset 0 disp push failcntr off disp ign fails off disp clr off catch clr off mutsim idle mutsim inv off refresh disable March pattern solid data dgroup 0 1 preset a counters to max address for use in a forward march A while performing wakeup cycles 2 fast x scan write data set 0 3 fast x incr read data set 0 4 write data set 1
66. counters XA XB XC XD YA YB YC YD can be incremented incremented linked decremented decremented linked jammed from SVM registers not masked by enable bits loaded from ALU masked by enable bits held no action Oo Oo Oo loaded from SVM registers masked by enable bits Oo Oo Oo Address counter actions increment decrement etc happen prior to the device cycle This means that counter values should be preset to be one less than their desired starting value when the pattern step is incrementing the counters They should be present to be one more than the desired starting value when they will be decremented The address enable fields prevent bits in the counters from being incremented and control the effective address field There are separate X and Y enable values which can be preset on the fly by loading from the SVM registers Address counters cannot be compared against registers in order to determine coincidence conditions for pattern flow control and branching Flow control and branching are determined by the user flags repeat loop and utility counters only June 1995 2 1 11 Programmer s Guide to the Hardware J990 Series Programmer s Manual Preset Registers Xreg Yreg 16 bits p 4 16 bits Enable Registers Xena Yena 16bits 16 bits Address Scramblers y Address Counters J XA YA X XB YB K XC
67. dO off d3 mode if the cycle is to be a HiZ only cycle for read only cycles the d0 edge must be placed 500 ps after d3 Also the previous cycle must end in a HiZ state To achieve this detect only cycle the system should be specifically calibrated for SCIO with switching mode dO off d3 Previously HiZ HiZ Po d3 do 500 ps 10 For the IO switching modes zstate d0 off d3 and zstate d3 off d2 the minimum IO off time is chan mux off chan mux on 100 MHz mode 3 5 ns 2 5 ns do di d2 d3 do si de Format RC and IO zstate d0 off d3 11 For the 60MHZ pattern generator mode the test system cycle time is between 16 984ns and 8 0us For the 100MHz pattern generator mode test system cycle time is between 9 984ns and 8 0us 2 2 6 June 1995 990 Series Programmer s Manual Timing Guidelines 12 Edges can be delayed from one tester cycle into another as long as the following conditions are met Q The edge is not delayed for more than 8us Q For the 60MHz pattern generator mode the edge is not delayed for more than 4 cycles Also the edge is not within 17ns of the end of the Ath cycle within 17ns of the end of the 3rd cycle for J993 01 systems Q For the 100MHz pattern generator mode the edge is not delayed for more than 8 cycles Also the edge is not within 17ns of the end of the 8th cycle Q The edge does not cross a like edge 13 In all formats d1 mu
68. default Example 1 inmux form bus mux x ly ads 0 px0 py0 ads 1 pxl pyl Required fields include mux and at least one of x or y O bus may be ads sec or ads sec In this release ads sec are always programmed identically bus can be defaulted and is not required If no bus is selected the driver will default to ads sec Ol mux may be 0 to 15 for the x mux selectors and 0 to 15 for the y selectors If a muxer is not mentioned in this form it will be set to ZERO O xand y may be px0 through px15 or py0 through py15 or ZERO June 1995 4 4 15 Memory Fail Processing Low Level Programming J990 Series Programmer s Manual Example 2 defaults the bus ads sec is assumed by the driver inmux form mux x Ly 0 px0 py0 1 pxl pyl Example 3 forces the default bus so both the ads and sec input multiplexers will be loaded with the same data default bus ads sec inmux form mux x ny 0 px0 py0 1 pxl pyi x scram form The x scram form is used to program the contents of the x scramble RAM Address followed by a stream of data 16384 units of data 14 bits each plus address field range for database design The following is an example x scram form bus addr data ads 1024 0 1 2 3 Required fields include adadr and data O bus may be ads sec or ads sec bus can be defaulted and is
69. expressions are evaluated and values calculated at program load time by the database loader The specifications used with the equations are determined by the workspace This allows multiple specs to be used with a single set of equations The 1G900 database software builds a dependency tree for each specification used in an equation database This allows the software to recalculate all the equations and generate tester values when a spec changes This is used when specs are updated and when a spec is varied by adjust until Specsheet or Shmoo June 1995 1 7 3 Creating Waveform Database Files Waveform Database Example Wave Equations for DRAM Pins use pinset d1Mx4pins pindb d1Mx4_pins patgen freq 60MHz pins comment Pin modes for functional tests default comment nil patgen main mach2 off chan mux off driver on driver init hi pins form pin ADDRS RAS CAS OE W eqset simple_wave_eqns fmt mux on fmt mux off fmt mux off fmt mux off fmt mux off DOS io zstate d0 off d3 scio off comp on default comment nil dvar form name default_per default_dl default_d2 default_d3 default_d4 default_d5 Refresh interval equation tvar form name per_refresh Edgeset equations default comment nil pin comment nil equation form edgeset read_edges strobe edge J990 Series Programmer s Manual equa
70. first execute the test on all input pins at 0 volts and then at 5 5 volts Since two tests are run two test numbers are needed for the datalog The tnum parameters specify test numbers and as expected two are specified tnum1 set to 40 and tnum2 set to 60 The first instance sets the IO pins to HiZ using the driveroff value The second instance has a more elaborate setup The address and IO pins are set to VIL using the diver0 parameter and the clock pins are set to VIH using the driver1 parameter The numerical value of these settings are defined by the levels parameter Using Leakage Instances Using Leakage instances is done just like other instances you create the instance using Insted import the instance into your main t file and execute it in the test flow using the EXECUTE macro See page 3 1 5 for an example 3 1 30 June 1995 J990 Series Programmer s Manual Using Templates ICC Tests Background Information Test Description This section will provide background about Icc tests The ivs Template is commonly used for Icc tests The ivs_Template uses the current monitors that are part of the VS hardware to make measurements It is the easiest of the ivs templates and is recommended for cases where the expected current is at least 10 mA For tests less than 10 mA the ivs_monpin_Template or the ivs_pmu_Template could be used refer to the J990 Series Templates Reference Manual Icc tests are used to detect excess current
71. flag 42 int x readsys testnumber AS writesys testnumber x 1 44 45 46 if HASVALUE skip OTs flag 0 48 for S skip HASVALUE S NEXT S 49 if S V 50 flag 1 break if flag continue if HASVALUE driverl for P driverl HASVALUE P NEXT P writesys set_driver_mode P 1 j writesys set_driver_state P 1 OS OO O O1 01 O1 O1 C1 O1 O1 HM NH L oO O1 BRUNE 3 2 12 June 1995 J990 Series Programmer s Manual Customizing Templates H UO O O O LO WO LO LO LO LO OO OO OO O0 OO DO DD II III III ID D D OD LO I oO O1 amp ND H LO I OO O1 amp ND APOLON oO O1 amp NH Lo I O O amp ND POLCON oO UW BS W if HASVALUE driver0 for P driver0 HASVALUE P writesys set_driver_mode P 1 writesys set_driver_state P NEXT P if HASVALUE driveroff for P driveroff HASVALUE P NEXT P writesys set_driver_mode P 0 writesys patgen_start V failflag 0 writesys patgen_ wait if readsys cr failflag 1 JOB_SERIAL if readsys cr Tlib_remove_site if dotests 0 writesys instance_result Ip TT_CM_FAIL switch dotests case 0 NEVER break case 2 IF PATTERN FAILS if failflag 0 break case 1 ALWAYS default writesys test_func break
72. is TT_MFP_OP_TYPE This is the operation type argument The following are arguments of this type TT_MFP_OP_TYPE Arguments _MFP_NULL_OP _MFP_CURRENT TT_MFP_ACCUM TT_MFP_MASK _MFP_MASKED T_MFP_UNMASKED These TT_MFP_OP_TYPE arguments are passed to the MFP high level driver functions The meaning of some of these arguments vary depending on which function is being called Accordingly descriptions of these arguments will be included in the discussion of the high level functions calls below TT_MFP_TOPO_INV Another argument type is TT_MFP_TOPO_INV This type has two arguments TT_MFP_TOPO_INV Arguments TT_MFP_TOPO_INV_OFF TT_MFP_TOPO_INV_ON The TT_MFP_TOPO_INV type indicates if capture should be done with topological data inversion enabled or disabled The topological data itself comes from the data generator template instance June 1995 4 3 5 Memory Fail Processing High Level Programming J990 Series Programmer s Manual tt mfp map pseudo sites The syntax of this function call is tt_mfp_map_pseudo_sites mfp_setup_instance_name This function is called to map the physical active sites onto the pseudo sites that the MFP system deals with The first N sites from the ORed list of active sites on each head are mapped to the N pseudo sites that can be set up by the specified MFP instance The same set of sites
73. load for a pin 1 Program VT to a point between the expected VOH and VOL levels 2 Program IOH and IOL according to the device spec sheet During functional testing the voltage on output pins swings toward either VOH or VOL With ILOADs enabled a voltage swing above VT toward VOH causes the device to sink current from IOH and a swing below VT toward VOL causes the device to source current to IOL Dynamic load circuitry can also be used during continuity testing in place of the PMUs June 1995 3 1 19 Using Templates Functional Test Instances J990 Series Programmer s Manual This section describes functional test instances The demo programs contain many other instances of the func_ Template Instance Examples define instance basic _ functional func Template value stop_on_ first _fail 0 choice no value patterns march diagonal_patt value dotests 1 choice yes value autotitle 0 choice no value tnum 1 value trap value skip value driveroff value driverO value driverl value calset nominal_level_cal value waves wave_timing_nominal value levels nominal_levels value title value patstop value patstart value postbody postbody_function value prebody prebody_function value posttest value pretest define instance funct_spec_levels func_Template valu D D D D D D D D D D O patterns march _ patt add
74. logic and the cumulative reject CR latch will be set If the expected data is logic zero the output must be less than VOL for the entire time C1 to C2 the ow pass region in Figure 3 1 4 If the output level rises above VOL a low fail will be processed by the error detection logic and the cumulative reject CR latch will be set If the expected data is a midband level the output during the period C1 to C2 must be less than VOH and greater than VOL the midband pass region in Figure 3 1 4 If the output level rises above VOH or drops below VOL a midband fail will be processed by the error detection logic and the cumulative reject CR latch will be set Edge strobe mode is similar to window strobe mode except that data must be true only at C2 C1 and C2 must be programmed the same VOH and VOL are programmable to any value within the pin electronics ranges with a resolution of 0 5mV The minimum width of a window strobe is 1 75 ns The edge strobe is a gate transition and has no pulse width 3 1 18 June 1995 J990 Series Programmer s Manual Using Templates Dynamic Current Load The dynamic current load circuit ILOAD is connected to the device output Dynamic load circuits simulate actual in circuit loading conditions and allow device output pins to sink or source a measurable load current depending on whether the output voltage is above or below a programmed threshold voltage VT To program the dynamic current
75. mach2 mode this edge drives the second piece of data Under zstate d3 off d2 it turns off the drivers d3 This edge controls channel muxing For zstate d3 it controls the state of the drivers For zstate dO off d3 this edge turns off the drivers and for zstate d3 off d2 this edge turns on the drivers ci This edge is the beginning of the window strobe c2 This edge is the end of the window strobe Under edge strobe mode c2 should be set equal to c1 Guidelines For Using NR The non return format is used to drive data to the DUT without providing complement data transitions For J990 test systems there are specific issues that will help the programmer use the NR format effectively For I O channels and drive only channels not in formatter mux mode the d0 edge should be programmed 2ns after the d1 edge This allows the formatter to correctly set up the data for the cycle The transition for the device will occur at the d1 edge See Figure 2 2 10 Please note d2 d1 2ns unless otherwise specified For drive only channels in address mux mode the placement of the dO and di edges is the same as above but in addition the d3 edge for the Y half of the cycle should be placed 2ns after the d4 edge Unlike I O channels however the edge transition to the device will be seen at the dO and d3 edges See Figure 2 2 11 Another issue arises when going from NR format in one cycle to a return format Return High Return Lo
76. main or alt The main_alt parameter specifies which one is to be used for the forceval The choices are 0 main or 1 alt The default is main The remaining parameters used in the examples have been explained earlier tnum on page 3 1 30 calset on page 3 1 21 postbody and prebody on page page 3 1 11 Using lec instances is done just like other instances you create the instance using Insted import the instance into your main t file and execute it in the test flow using the EXECUTE macro See page 3 1 5 for an example June 1995 3 1 37 Using Templates J990 Series Programmer s Manual 3 1 38 June 1995 J990 Series Programmer s Manual Customizing Templates Chapter 3 2 Customizing Templates Creating Custom Templates Introduction While the previous chapter in this section gave instructions on how to use the standard Teradyne templates and implement instances in a test program this chapter describes the process of creating and modifying templates to create templates specific to the user that is custom templates Although the standard templates supplied by Teradyne have been designed for the utmost flexibility some test scenarios may require the use of a template customized to the user s particular need The goals of this chapter are to describe how AT900 commands combine to compose tests in a test program to understand template files and how they interact and to understand the rules and symbols involved in writing
77. method can be further subdivided into two approaches The first is the high level approach The high level approach uses high level function calls within the job program to set up the Catch RAM capture data and scan the Catch RAM to create Bitmaps Chapter 4 3 Memory Fail Processing High level Programming will describe this approach The second job driven approach is to use low level drivers along with hand tuned MFP databases This approach can be used for applications that go beyond the capability of the high level function calls Chapter 4 4 Memory Fail Processing Low level Programming describes this approach The primary MFP template is the MFP Setup Template An instance of this template ties instances of all the other templates together into one coherent setup Each distinct fail capture setup is represented by an instance of this template Many different scans may be done from a single MFP Setup instance but it will support only one arrangement of Catch RAM slices and Scramble RAM contents multiplexer settings ADS bit assignment etc for fail capture In the MFP Setup instance you specify the names of all of the other instances which should be part of a particular capture setup Insted views all of these parameters the other template instances as optional since it is possible to specify only the name of an ADR file which will bypass the high level setup generation code entirely However assuming you do not wish to override the
78. not add 399x templates into the path to include Tlib h into the t file then you should use the 1 399x templates switch on the at900 command line to compile the t file Optional Add the custom template into a library of templates such as libtemplates o which is part of the standard Template collection by entering Id r o libcusttemp o CUSTOM o The line above produces a single o file that can be added to the test program workspace This is a simpler method of listing the custom templates in the workspace than manually entering the name of each custom template in the workspace file Finally always give a custom template a unique name different than any other standard or custom template name Start all custom template filenames with ct_ 3 2 34 June 1995 J990 Series Programmer s Manual Memory Fail Processing Overview Introduction Note Using the MFP Software Chapter 4 1 Memory Fail Processing MFP Overview Memory fail processing software provides support for programming the fail processing hardware Catch RAM and related hardware for the purposes of bitmapping redundancy analysis and other failure processing functions The MFP software provides complete low level syntax for all fail processing hardware in addition to high level support for bitmapping of most memory devices The software consists of the following parts O MFP templates MFP database ADR to DB translator DB to A
79. objects This distinction between lower level databases and higher level objects is important to understand before actually creating the databases O The lower level databases for specs and level equations are grouped to form a higher level object called a evel level specset eqset O The lower level databases for specs and waveform equations are grouped to form a higher level object called a waveform waveform specset eqset O The lower level databases for dgen svm mut src and start are grouped to form a higher level object called a pattern pattern dgenset svmset mutset srcset startset These higher level objects and the remaining databases are all grouped together to create a test program The combination of databases and test program definitions is performed by the workspace This is illustrated by the figure which follows The lines in the illustration are defined by the workspace June 1995 1 1 7 Programming Overview J990 Series Programmer s Manual Test Program Job Template Executable Flow Object Code Code compiled C Instances insadr files Calibration Conditions calset Pin Modes Channel Wiring pinset chanset Pattern Waveform Datagen SVM PCRAM dgenset svmset Level Eqns eqset MUT Description Ware Pans eqset mutset Device Specs Source Selections specset srcset Start Conditions Device Specs startset specset Figure 1 1 2 Te
80. optional indicates that the entering of a value for this parameter is optional If optional does not appear then a value is taken from choice default min or max which are discussed below June 1995 3 2 5 Customizing Templates J990 Series Programmer s Manual choice CHOICE _PROMPT VALUE provides a list of valid values for the parameter The strings in quotes appear in the Insted tool An example parm attribute Int Attributes choice DO DA D2 D3 ea Hog oo O1 amp WN EF If a parenthesis is placed around the VALUE then one of two syntax options can be used Identical to the syntax above the first syntax allows the user to select one or more choices parm attribute Int Attributes choice DO DA D2 D3 Ga oon oo O1 amp WN EF The second syntax option allows user one selection from a list of choices each of which are composed of several values parm attribute Int Attributes choice DI D2 2 3 Dab D2 DBM 2 3 4 MEL C20 5 6 0 default CHOICE_PROMPT is the default value that will be assumed if a choice is not entered An example parm stor_mode Int FVM storage mode choice all 0 vector 1 fails only 2 vector amp fails 3 default all 3 2 6 June 1995 J990 Series Programmer s Manual Customizing Templates min lt VALUE gt and max lt VALUE display in the Insted tool the minimum and maximum values for the parameter
81. software system Ol pseudo site may be 0 through 31 It may be a single site only pseudo site may be defaulted and is not required O cs enable may be 0 through 1023 CM cs compare may be 0 through1023 Cl mode may be capture capture invert or scan disp It may be defaulted and is not required Ol scan enable may be 0 through 1023 Ll Scan compare may be 0 through 1023 display processor The display processor statement is used to program the Display RAM controls The following is an example display processor input fmm enable on clear enable on horz comp 2047 vert comp 1 horz width 2048 fail count enable on Required fields include at least one field O input may be fmm cram single cram 0 mask hi cram mask lo or lo cram mask hi Note cram selections are J99x only O enable may be on or off O clear enable may be on or off O horz comp may be 0 through 4095 4 4 20 June 1995 J990 Series Programmer s Manual Memory Fail Processing Low Level Programming Ol vert comp may be 0 through 4095 O horz width may be 0 through 2047 O fail count enable may be on or off None of the display processor attributes may be defaulted All are optional topo mux The topo mux statement selects which patgen addresses are assigned to the topological invert RAM The following is an example topo mux bus ads addr px
82. source of data Up to 32 bits of address and data can be selected to be presented on the ADS bus In addition to the ADS bus another bus the SEC secondary bus exists The SEC bus is a secondary source of algorithmic address and data for the DUT Like the ADS bus it is 32 bits wide The alternate memory pattern generator communicates with other hardware in the system through the SEC bus alt data gen patgen 0 controller data i topo generators inversion address generators x address scramblers history RAM ADS bus Figure 2 1 6 Address and Data Generation to the ADS bus This address and data information is also sent to the History RAM also known as Fail Vector Memory or FVM The FVM can store in sequence the address and data values that are generated by the memory patgen The FVM also stores fail information from the IO channels and is used when debugging a test program or characterizing device failures June 1995 2 1 7 Programmer s Guide to the Hardware J990 Series Programmer s Manual Pattern Control using the Subroutine Vector Memory SVM There are 1024 locations in the Subroutine Vector Memory SVM Within each pattern control location there are values for O Oooo oO Oo Oo O Opcode and operand for pattern flow and control Memory patgen address counter controls and presets Address counter selections Arithmetic Logic Unit ALU control fu
83. ss 2 ss 3 ss 4 sso ss 6 ss 7 ss 8 ss 9 nput Output 0 nput Output 1 nput Output 2 nput Output 3 ower Pin ND Pin pref no comment nil elements WE RAS CAS OB CLKS ADDRS DOO DQ1 DO2 DO3 DQ0 DQ1 DQ2 DO3 DOO DQ1 DO2 DO3 CLKS ADDRS IOS VCC Ne EEE Creating Pin Database Files Groups n H H H H D P D H H H be He He He H H H E 62 I ee DS D Di oA nou nou H H H H nou mode Gh ick CT e and Types resource type drive o drive o drive o drive o drive o drive o drive o drive o drive o drive o drive o drive o drive o drive o AO Al A2 A3 A4 A5 A6 A7 A8 AY nly nly nly June 1995 1 2 3 Creating Pin Database Files J990 Series Programmer s Manual 1 2 4 June 1995 J990 Series Programmer s Manual Creating Channel Database Files Introduction Chapter 1 3 Creating Channel Database Files Objective Create chanadr and chandb files Reference ADR900 Reference Manual J990 Series Catch RAM Manual The channel database file contains a description of how the analog interface interface board is wired This description includes the list of tester channels and voltage sources that are electrically connected to each device pin on each test site The channel database is stored in chanadr files which contain chansets If a single test program will be used
84. statement 7 72 2 input current leakage 3 7 24 See also leakage tests input system 3 7 13 instance databases 7 17 2 basic steps to creating 3 7 2 instances 7 77 7 creating basic steps 3 7 2 Insted 1 1 4 1 11 2 1 11 5 IO channels 1 3 3 2 1 50 IO compare modes 2 1 28 IO Switching Modes 2 1 30 IOH 2 1 51 IOL 2 1 51 3 1 9 3 1 9 1 9 12 June 1995 J990 Series Programmer s Manual Index irange instance parameter 3 1 9 ivs_pmu_Template 1 11 4 ivs_Template 1 11 4 ivspin instance parameter 3 7 37 J job_ main function 1 12 1 1 12 2 job driven bitmapping 4 3 4 L leakage tests 3 1 24 defined 3 1 24 with the pin PMU 3 7 26 with the system PMU 3 7 25 level database example 7 6 4 levels instance parameter 3 1 10 logic function generators LFGS 2 1 15 lolimspec instance parameter 3 7 30 lolimval instance parameter 3 7 9 mach2 mode 2 1 27 macro definitions 4 4 77 macros 3 2 10 EXECUTE 1 12 2 FAIL_DO 1 12 3 PASS DO 1 12 3 main o 1 1 5 main t 7 7 5 makefile 1 1 1 1 1 3 1 1 6 mask parameter 4 2 8 measure instance parameter 3 1 30 memory fail processing accumulate mode 4 1 3 ADR files 4 1 4 ADR translators 4 4 12 high level drivers 4 7 3 high level functions 4 3 2 high level programming 4 7 3 hidsets 4 7 5 low level programming 4 1 4 4 4 1 mask mode 4 7 3 parallel capture 4 7 3 Setup Template 4 1 2 using the software 4 1 1 workspace requirements 4 1 5 Memory Fail Processing See
85. template or pin PMU template and so on To create a background instance simply add an instance referencing the background_Template to any one of your job s instance database files using Insted or a text editor and reference the file in your flow As arule you should always execute an instance of the background_Template once per job as the first instance executed in the job flow control file This is true even if you don t plan to program any of the background parameters or change them from their default state As you can see from the example below this instance does not need to be complex New instances of the Background Template may be executed at any time through the main t file to change job level parameters define instance init_program_variables background_Template patstart posttest value dotime 0 choice no value title value autotitle 0 choice no value disable_comp_pins value utilbits_clear value utilbits_set value floatpins value error value alarm value jobstop value patstop e e e Notes pretest The example instance above shows how the background_Template is used The first line defines the name of the instance define instance init_program_variables background_Template Here the instance is called init_program_variables In this instance most template parameters are not used All template parameters for the background_Template
86. the cycle s vector state for a pin symbol Use pin group symbols whenever possible as this will allow the software to take advantage of the hardware s parallel loading capability broadcast write Similar to other ADR programming statements the default clause defines the default conditions for each step in the vector form statement It is recommended that you have a default for each SVM and MPG field Each pattern location contains pin state information vectors and memory patgen MPG operations and SVM opcodes flow control These are grouped by parentheses label one pattern step pin state information vectors Memory Patgen operations Clas SVM Blow controdk saa A label is a way to create a name for a pattern RAM location June 1995 1 8 9 Creating Pattern Database Files J990 Series Programmer s Manual Basic Vector Programming The pin state data for each cycle is referred to as a vector Depending on the pin s mode and channel type various vector states are available These vectors are stored in the per pin SVM Each of the available states is programmed with a symbol IO channels have three bits of vector data which drive an eight state model For example when in the normal mode the eight available IO channel states are Table1 8 3 Eight State Model State Symbol Description 0 0 Drive 0 data 1 1 Drive 1 data 2 M Expect midband voltage between Voh and Vol 3 V
87. the value of other parameters If these parameters are not filled in they will generate runtime errors e all other parameters are required to have a value The parameters are integers character strings doubles these are used for values such as voltages and nanoseconds do not include the actual unit after the number 1G900 objects like levels waveforms patterns or pins names of functions These functions must be typed as extern c int abc Repeat this step until all instances have been created The tree or list will be updated every time a new instance is created showing the templates and the instances 6 Save the instances to an Instance Database file This will create the insadr file that will be used by the test program Oo Oo Oo Select Save as from the File button Select Instance to a File from the Object Type menu Next to Directory enter the correct path and directory into which the file will be saved This may have already been set when loading the workspace If there are other instance files in the directory they will appear at the bottom of the screen Select one of the listed files or enter a new file name next to Object Name and press the Save As button If an existing file name is selected the existing file will be overwritten after confirmation If a new name is entered then a new file will be generated An instance database file will be an ADR file which contains a define insta
88. this example the d12xX_10Y_x8_mfp_setup instance contains the information that will setup the scramble RAM ADS bit assignments and so on The capture set up will occur the topological inversion RAM will be programmed and because of the TT_MFP_TOPP_INV_ON argument topological inversion will be 4 3 8 June 1995 J990 Series Programmer s Manual Memory Fail Processing High Level Programming active The TT_MFP_NULL_OP argument means that only the current test portion of the Catch RAM will be set up for capture If no mask or accumulate operations are being undertaken all of the Catch RAM will be available for current test capture The function call treats the use of TT_MFP_NULI_ OP identically to TT_MFP_CURRENT however the use of TT_MFP_NULL_OP in this function call suggests that no accumulate or mask operations are currently in use This high level programming function call will assert five hardware load driver sets cram bg disable hldset This disables all Catch RAM slices so that only the slices explicitly enabled later will capture data capture main hldset This sets up scramble RAM image and multiplexers ADS bit assignments multiplexers and channel multiplexers one of topo invert on hidset or topo invert off hldset The choice is based on the value of the TT_MFP_TOPO_INV argument These hidsets program the topo invert RAM and its input multiplexers according to the equations specified in the associated d
89. through device power supply pin s In a Icc test the pattern generator is used to place the input pins in a continuously changing sequence of states Therefore expect a pattern parameter will need to be programmed in the instance A voltage Vcc is forced on the power pin s and the averaged resultant current is measured This means that the test will need to be repeated several times The instance includes a parameter samples which repeats the test a specified number of times For both tests the measured current value should be less than that specified for the device The system provides two resources that can be used to perform static and dynamic ICC tests O The voltage source current monitor Ol The system PMU Current Monitor for ICC Tests Power supply current is easily measured with the current monitor The only connections required are the hardwired connections between the power pin of the device and the VS force and sense lines on the DIB As Figure 3 1 6 shows the current monitor is already set up in the J990 Series mainframe to make the measurement Static ICC Test Procedure To measure static ICC using the current monitor 1 Program the VS to the appropriate force value 2 Program a minimum pause time 1ms or less to let the device power up This additional time may be required to charge the bypass capacitors 3 Program the drivers to a known state 4 Perform the test and specify high and low pass limits
90. timing and control signal paths are used throughout the system These two paths A Path and B path are used together to achieve up to 100 MHz operation of the pattern and waveform generators Generally the system is programmed to operate in this mode as this permits the most flexibility in terms of edge placement from cycle to cycle PC RAM Address I O channels address main main address to drive only drive only formatters channels Figure 2 1 2 System Operation in the 100 MHz mode June 1995 Programmer s Guide to the Hardware J990 Series Programmer s Manual 60 MHz Mode When the system is run in the slower 60MHz mode only the A path is used Using the 60 MHz mode on a J997 results in more timing programming restrictions that must be adhered to but will assure compatibility with the J994 or J993 test systems for which this mode is the standard operating mode main PC RAM Address to I O i H O channels formatters data amp j address 1 main memory P address scrambler address to Drive only grive only EM High Speed Bus 100 MHz formatters channels A Path Bus 60 MHz Figure 2 1 3 System Paths in the 60 MHz mode 2 1 4 June 1995 J990 Series Programmer s Manual Programmer s Guide to the Hardware Dual Synchronous Patgen Operation 200 MHz mode main patgen control alternate patgen control When operating at speeds higher than 100 MHz
91. to NULL and may be omitted The headmask argument specifies which head the function call applies to The headmask argument may be O 1 head 0 only 01 2 head 1 only 10 O 3 headsOQand1 11 The default headmask is 3 which will set the all start cycles the same for both heads The headmask argument may be omitted tt mfp set ra region count This function call sets the region count for the specified redundancy analyzers The format of the function call is tt_mfp_set_ra_region_ count count analyzer_list headmask The count argument is the integer value the redundancy analyzer s region count should be set to The analyzer_list is the name of a flex array that contains a list of the redundancy analyzers to be used This list of redundancy analyzers is sometimes referred to as a RIK or redundancy analyzer index key For an example of how to create a flex array see the tt_mfp_create_crik discussion on page 4 3 11 If NULL is specified instead of the name of analyzer list then the current the current RA all RIK will be used see the tt_mfp_set_ra_all_rik discussion on page 4 3 13 Note that if an analyzer_list is specified the RA all RIK will be reset to the value of the analyzer_list once this function call is executed The analyzer_list defaults to NULL 4 3 14 June 1995 J990 Series Programmer s Manual Memory Fail Processing High Level Programming and may be omitted The headmask argument sp
92. two memory pattern generators operate in parallel both receiving A Path and B Path information The A Path and B Path information for each memory pattern generator gets combined at the formatter to achieve 200 MHz operation The IO channels must use channel muxing on each channel that is to operate at 200 MHz Drive only channels can use either formatter muxing or channel muxing to operate at 200 MHz The J994 and J993 are also capable of operating in dual synchronous mode allowing them to achieve an operating speed of 120 MHz PC RAM Address D channels formatters data amp i address main main memory address patgen scrambler address alternate m data drive only S only formatters channels alternate alternate 1 memory address alternate address patgen scrambler 1 EM High Speed Bus 100 MHz E A Path amp B Path Buses 60 MHz each Figure 2 1 4 Dual Synchronous Patgen Operation 200 MHz mode June 1995 Programmer s Guide to the Hardware Asynchronous Patgen Operation main patgen control alternate patgen control The pattern generator controller which controls pattern flow and edgeset selection is separated from the memory pattern generator which generates algorithmic J990 Series Programmer s Manual address and data Two pattern generators and two memory patgens can be present in the system The two pattern generators are used independently to achie
93. where the number of rows columns or lOs is not an even power of two Table 4 2 7 MFP Memory Under Test Topology Template 2 Parameters Entry sx Insted Prompt Parameter Data Type Required Description Which Patgen patgen Integer No Specifies which patgen MPG defaulted scrambler will be used Choices are 0 Main 1 Alt and 2 Both Default 2 Both positive Width of the MUT Me Migi math integer S width 24 y bits ios positive Height of the MUT Me nein hoighi integer nee height 2 xbits Name of the user function which maps h v to x y b patgen x y User function addr_func C function No These functions must be included by the user in one of the device program s t files X scramble RAM Hv bits Sain list of No H V bits to connect into X strings scramble RAM i list of H V bits to connect into the Y Y scramble RAM hv bits y_in strings No scramble RAM list of Patgen x y bits to connect into Input to bypass lines unscram_in No strings bypass lines list of Patgen x y bits and I O select Output of x scramble RAM x_out No bits to output from X scramble strings RAM list of Patgen x y bits and I O select Output of y scramble RAM y_out No bits to output from Y scramble strings RAM What address of the ADS bus list of Output from bypass lines unscram_out strings No muxes will receive information from the patgen bits The user should wrap each such functi
94. 0 Series Programmer s Manual Pin Parametric Measurement Unit Pin PMU Each IO and drive only channel on the J997 has a Pin PMU typically used for leakage measurements and contact continuity tests Each Pin PMU has independent force values and can make measurements in parallel The measured result can then be read back from each independent channel In addition each Pin PMU can be programmed to have the test limits in hardware When a measurement is taken the hardware will provide a measured value and a pass fail result for each channel A ganged pass fail result can also be read back when multiple pins are accessed simultaneously The Pin PMU controller is a central resource shared by all of the Pin PMUs It controls the range selection and the force current measure voltage vs force voltage measure current selection which globally controls all Pin PMUs There is one voltage range available which applies when forcing or measuring voltage Range Resolution 4 V to 8 V 0 5 mV However it is possible to force voltage up to 12 V if using the 2 mA current range and the current does not exceed 200 uA When forcing current three current ranges are available Range Resolution 200 uA 40 nA 2 mA 400 nA 50 mA 5 uA The 50 mA is provided by the current loads on the IO channels and is not available on the drive only channels When measuring current five current ranges are available Range Resolution 200 nA
95. 0 and 2 to the ADS bus Note that the source is set for both the X and Y half The system can be programmed with separate source selects for the X and Y halves The typical syntax for a drive only channel to be used as a clock is 0 0 vm For mach2 operation the clock should be 0 vm vm Only the X half of the channel is used and the drive data comes from the SVM A symbol of 0 or 1 in the pattern would program the clock to be low or high The typical syntax for a drive only channel to be used for address is 0 0 ads This causes the ADS input to drive the channel The address driver will then follow the address generated by the address counters inside the memory pattern generator June 1995 2 1 35 Programmer s Guide to the Hardware J990 Series Programmer s Manual Source Select PAM X Half 3 Source Selections e Dri 7 Bit 0 Drive data D1 Drive data D2 Bit1 Mach2 only Unused Inversion Source Select RAM Y Half 3 Source Selections gt gt Drive data D4 Bit2 vo DI gt amp Drive data D5 Bit Mach2 only D Unused Inversion Figure 2 1 32 Source Select for Drive Only Channels 2 1 36 June 1995 J990 Series Programmer s Manual Programmer s Guide to the Hardware Source Select Programming for SCIO Applications Those applications that require both drive and compare in the same cycle will use sa
96. 0 pxl py3 py4 Up to 8 address lines may be assigned MSB on the left and LSB on the right Required fields include addr and its data O bus may be ads sec or ads sec bus can be defaulted and is not required If no bus is selected the driver will default to ads sec topo invert form The topo invert form statement is used to program the topological data inversion RAM The following is an example topo invert form bus block addr data ads 0 0 3 ads 0 ay 0 Required fields include adadr and data O bus may be ads sec or ads sec bus can be defaulted and is not required If no bus is selected the driver will default to ads sec block may be 0 through 3 block may be defaulted If left out block will be assumed to be 0 O addr may be 0 through 1023 O data may be 0 through 3 O no invert 1 invert dgenO 2 invert dgen1 3 invert dgenO and dgeni June 1995 4 4 21 Memory Fail Processing Low Level Programming J990 Series Programmer s Manual rfl bus form The rfl bus form statement is used to program the region fail latch modules bus selection for the upper and lower region fail latch RAM The following is an example rfl bus form board upper bus lower bus A ads ads B sec ads Required fields include board and at least one of upper bus or lower bus O board may be A or B upper bus and lower bus may be ad
97. 01 104 105 Tlib_trap if stop_on_first_fail amp amp failflag if Tlib_active_sites_count lt 1 Function C C Function Trap on the value in S trap in the current pattern go to line 99 and select the next trap value NEXT S If stop_on_first_fail and failflag are true go to line 105 if they are not go to line 35 and select the next pattern in the pattern parameter If there are no more active sites see line 81 go to the next line if not go to line 35 and select the next pattern in the pattern parameter 106 break C Get out of the main for loop and go to line 109 June 1995 3 2 19 Customizing Templates J990 Series Programmer s Manual Lines 109 113 Remaining Lines in the Body Section Body Section Continued Lines 109 113 Line Type Description 109 Tlib_alarmcheck Function Check for VS Kelvin or overload alarms and return message if there are such problems 110 Jif HASVALUE postbody C If a function exists in the Postbody parameter of the current Macro instance go to line 111 if not go to line 112 111 postbody Execute the function specified by the Postbody parameter in the current instance 112 TLIB_TIMER TLIB_STOPTIME Macro Stops a timer that measures the execution time of the body TLIB_BOD and datalogs the results 113 TEMPLAT
98. 048576 width 4 shape rows 1024 columns 1024 address map function form pin physical A0 O pro A0S1 pco A1S0 pri A1 1 pcl A2S0 pr2 A2S1 pc2 A3 0 pr3 A3 1 pc3 A4S0 pr4 A4S1 pc4 A5 0 pr5 A5S1 pc5 A6 0 pr6 A6S1 pc A7S0 pr7 A7S1 pc A8 0 pr8 A8 1 pc8 A9 0 pr9 A9S1 pc9 data map data form pin physical DQS nil June 1995 1 4 11 Creating MUT Database Files J990 Series Programmer s Manual 1 4 12 June 1995 J990 Series Programmer s Manual Creating Specification Database Files Introduction Chapter 1 5 Creating Specification Database Files Objective Create specadr and specdb files Reference ADR900 Reference Manual An important part of device oriented programming is the specification of device specifications and parameters These device specifications specs are taken directly from a device datasheet and entered into specification databases The specification databases are later used with level and waveform equations to define how the hardware is to be programmed In general timing AC and level DC specifications are placed in separate database files Each file can contain any number of sets of specification values called specsets For example a timing database file may have a specset of minimum specification values for a functional test another specset for maximum values etc Spec limits Shmoo axis ranges and adjust until parameters can
99. 1 010 011 100 101 110 111 h12 L h10 h11 These bits match the IO bits iobO iob1 and iob2 As shown above h10 matches the least significant bit of the IO selects iob0 Likewise h11 matches iob1 and h12 matches iob2 Finally note that halfway through the memory the addresses invert That is for DQO DQ3 the addresses start with 0 and increase to 1k For DQ4 DQ7 the addresses start at 1k and decrease to 0 Refer to the example on the previous page Since h12 differentiates between the left half and the right half The h12 bit is exclusive ORed with the other bits to obtain the inversion in the h_v_expr June 1995 4 2 17 Memory Fail Processing Templates J990 Series Programmer s Manual d12X 10Y x8 topo block yx instance mfp_ mut_topology Template define instance d12X_10Y_x8_ topo block_yx mfp_mut_topology_ Template H X 0 4k 0 4k 0 4k 0 4k 4k 0 4k 0 4k 0 4k 0 i OI i i V X DQ 0 DQ 1 DQ 2 DO 3 DQ 4 DQ 5 DQ 6 DQ 7 i i l i 1k value patgen 0 choice Main value x_y_bit px0 Fox LE px2 px3 ox4 TORON px6 FORTE px8 px9 px10 Vox td py0 HD py2 oy3 py4 pyo py6 py7 py8 py9 iob0 iob1 iob2 value h_v_expr hO h14 WHA RHIANT hH2 hH14 TRS IA Nh4 KIA h5 h14 h6
100. 1 1 6 1 9 1 channel database 1 3 1 1 3 5 June 1995 1 1 Index J990 Series Programmer s Manual channel multiplexing 2 7 5 2 1 25 3 1 16 chansets 1 1 5 columns parameter 4 2 13 comparators 3 1 17 3 1 18 3 1 26 with ICC tests 3 1 34 continuity tests 3 1 6 corner_list_Template 7 77 3 cumulative reject CR latch 3 7 18 current monitor with ICC tests 3 1 31 3 1 31 3 1 32 3 1 34 D data generator 2 1 11 2 1 15 data generator database example 7 8 5 data sheet 3 1 15 3 1 24 data_pins parameter 4 2 10 datalog output 3 7 37 datasheet_Template 1 11 4 device output protection diodes 3 1 24 device pins 7 2 1 1 3 4 device shape 1 4 1 device size 1 4 1 device topology 1 4 1 dgen parameter 4 2 77 dgen_instance parameter 4 2 23 dgensets 1 1 6 DIB device interface board DSR device sense return connections 3 1 31 wiring for ICC tests 3 1 31 dotests instance parameter 3 7 27 dotime instance parameter 3 7 5 drive only 2 7 42 drive only channels 1 3 3 2 1 49 driver channel numbers according to site function J993 J995 J997 1 3 7 driverO instance parameter 3 7 10 driver1 instance parameter 3 7 10 driveroff instance parameter 3 7 10 drivers 3 1 15 3 1 26 formats 2 1 19 with ICC tests 3 1 33 dual mpg caladr programming for 5 7 78 chanadr programming for 5 1 5 database conversion 5 1 4 definition of 5 7 7 explanation of 5 7 2 mfp insadr programming for 5 7 5 offline usage 5 7 27 pinadr programming f
101. 1 9 1 Chapter 1 10 Creating Workspace Database Files 0 ecccececseeeeeseeeseeeeeeeeeeeeeeeeteaaeeesaes 1 10 1 Chapter 1 11 Creating Instance Database Files 0 ccceccceceeteeeeeeeeeeeaeeseeeeeeseeeeeenaeeeeaes 1 11 1 Chapter 1 12 Creating a Flow Control Module 3eme 1 12 1 Chapter 1 13 Overlay Level and Waveform Files cceccceceeseeeeeeeeeeeeeeeeeeeeeeeeeseaaeeesaes 1 13 1 Chapter 2 1 Programmer s Guide to the Hardware ccccccscceeeeeeeeeeeeeeeeeseeeseeeeeeaeeteaes 2 1 1 CMTC 22 Miming Gudens ssr e ER 22 1 Cha US PU Tempe nn acces etecioetemiii adie ein ieee renee S11 Chapter 2 Guslomizing Templates anaoui a n A D 3 2 1 Chapter 4 1 Memory Fail Processing MFP Overview esessesssssesssssssesrsessrressrrssrrnssns 4 1 1 Chapter 4 2 Memory Fail Processing MFP Templates 4 2 1 Chapter 4 3 Memory Fail Processing MFP High Level Programming 4 3 1 Chapter 4 4 Memory Fail Processing MFP Low Level Programming 4 4 1 Chapter ST Using Dual MPG MOJEG nr nn aire ado ennemie d ten 5 1 1 4 ARE RE 1 1 June 1995 iii Table of Contents J990 Series Programmer s Manual June 1995 J990 Series Programmer s Manual Programming Overview Chapter 1 1 Programming Overview Introduction This document provides essential programming guidelines for the J990 Series Test systems It covers the s
102. 11 x_y_bit parameter 4 2 15 Y Y address values 2 1 11 June 1995
103. 15 sy0 through sy15 dgenO dgen1 or ZERO The ADS bus only may have as an input alt dgen0 or alt dgen1 addr mux form mcs channel cards The addr mux form is used to program drive only channel connections to the ADS or SEC bus The following is an example addr mux form pin amux0 bus amuxl bus amux0 amuxl a0 ads sec 0 11 June 1995 4 4 17 Memory Fail Processing Low Level Programming J990 Series Programmer s Manual Required fields include pin and at least one of amux0 or amux1 pin may be any device pin name or pin group name found in the pinlist CO amux0 bus may be ads or sec Can be defaulted and is not required Driver defaults to ads amux1 bus may be ads or sec Can be defaulted and is not required Driver defaults to ads Ol amux0 may be a bus bit selection 0 through 31 Ol amux1 may be a bus bit selection 0 through 31 data mux form dcs channel cards The data mux form is used to program I O channel formatter connections to the ADS bus The following is an example data mux form pin bus dmux0 dmuxl DQ0 ads0 4 1 Required fields include pin and at least one of dmux0 or dmux1 pin may be any device pin name or pin group name found in the pinlist O bus may be ads0 or ads1 bus can be defaulted and is not required If no bus is selected the driver will default to adsO m dmux0 may be a bus bit selection 0 throug
104. 16 Channels per Card X 10 Cards per 128 Drivers Supported per WaveGen Quadrant X 4 Quadrants 640 Address Board Clock Channels Figure 2 1 37 Drive only Channel Cards Supports 4 Functions For 4 Sites J994 Just as with the other members of the J990 series the J994 splits the function among multiple channel cards four cards for each function This arrangement may allow fewer channel cards to be used with some applications 2 1 44 June 1995 J990 Series Programmer s Manual Programmer s Guide to the Hardware Drive Only Channel Configuration for Up to 8 Sites J997 or J993 Each drive only channel board supports two functions for four sites or eight drive signals The signal fanout actually supports eight sites as each function is routed to two channel boards Drive Only Channel WaveGen Board SiteO Site1 Site4 Function Site2 Se ADDRO Sites e siie Site0 Function Site1 Site4 WE Site2 2E Site3 Site6 Site7 Function ADDR1 Drive Only FNO Channel Board Drive Only sites 0 3 Channel Board Function sites 4 7 OE Function ADDR2 Function ADDR3 Function ADDR4 Function RAS Figure 2 1 38 Example Drive Only Function Assignments for Eight Sites When eight sites or less are being tested on the J997 or J993 there are 40 drive only functions available June 1995 2 1 45 Programmer s Guide to the Hardware J990 Series Programmer s Manual Driv
105. 1995 1 9 1 Creating Calibration Database Files Creating Calsets J990 Series Programmer s Manual To create a calset and add it to your test program do the following 1 Create a caladr containing one or more calsets ADRedit can supply the complete framework for the file and can also be used to create the file The file can also be created or edited with any text editor Translate the caladr file to a caldb file using the adr900 command For example gt adr900 dram_calsets caladr The file produced by the ADR translator will be given a caldb extension however it will still be an ASCII file not a binary file The caldb file will be organized in the precise format used by the AEL program Do not edit the caldb file If later changes are required modify the caladr file and retranslate Include the caldb file in your workspace The caldb file name is placed in the job group in the wspadr file For example job 3993_1Mx4 explicit_timing waveform wave_timing_70Ons waveform wave_timing_80ns waveform diMx4_calsets caldb calsets Note that the file name is enclosed in quotes Add appropriate calsets to your job flow by including them in instances using the Insted tool For example define instance icc_standby_low power ivs_ Template value levels icc_ low power _ levels value calset icc_ level _ cal After the job program is loaded and run is entered for the first time the caldb file wi
106. 397 templates m C_func_Template tdl Objects For Selection C_func_Template tdl FMAX_Template tdl VCC_standby_Template tdl adjust_update_Template tdl attribute_margins_Template tdl background_Template tdl corner_list_Template tdl datasheet_Template tdl Figure 1 11 4 Including a Template into the Editor O Include all the templates which will be needed then close the include panel Each included template will appear in the tree display or template list 4 Select a template for editing by double clicking the left mouse button select button on a template icon or list or by using the Open button A instance will automatically be created from the selected template and the instance Editor Panel will appear O Change the existing text next to the Name field to the desired name of the instance Press return The instance will be renamed to the specified name June 1995 7 11 7 Creating Instance Database Files J990 Series Programmer s Manual 5 Edit the parameters for the instance by filling in values next to the blanks o o Values can be filled in by entering text directly from the keyboard or using the pull down and pop up panels next to each field Entering a return after each field will prompt Insted to accept the parameter and verify it e optional parameters will be surrounded by brackets and are displayed in lighter color text Some parameters are shown as optional but may be required based on
107. 4 2 4 4 3 tt_mfp_map_pseudo_site 4 3 6 TT_MFP_OP_TYPE MFP arguments 4 3 5 TT_MFP_OUTMUX_BIT 4 4 7 tt_mfp_rect 4 4 11 tt_mfp_save_fail_cnt 4 4 9 tt_mfp_scan_completed 4 3 11 tt_mfp_scan_fmm_dr 4 4 10 tt_mfp_scan_setup 4 3 9 tt mfp_set data mux 4 4 70 tt mfp set es 4 3 16 tt mfp_set_inmux 4 4 5 tt_mfp_set_outmux 4 4 7 tt_mfp_set_topo_block 4 4 77 tt_mfp_set_waveform 4 3 16 tt_mfp_test_func_setup 4 3 7 TT_MFP_TOPO_INV MFP arguments 4 3 5 U use pinset statement 7 6 2 V Vch 2 1 51 Vel 2 1 51 vector opcodes 3 1 15 vectors 3 1 15 voltage sources VS 2 1 53 3 1 13 3 1 26 3 1 32 3 4 83 buffer 3 1 31 VS buffer See voltage sources VS VS See voltage sources VS vs form 1 6 3 Ww waveform database example 7 7 4 waveform database file 1 7 2 waveform formats 3 7 15 3 1 17 3 1 18 See also timing edges vectors waveset formats waveset formatting waveform generators 2 1 77 waveforms 3 1 15 3 1 17 3 1 17 3 1 18 waves instance parameter 3 7 22 waveset address 3 1 15 June 1995 L5 Index J990 Series Programmer s Manual waveset formats 3 1 15 3 1 16 waveset formatting 3 7 16 waveset timing 3 7 16 Wavetool 5 7 20 window strobe 3 1 17 3 1 18 defined 3 1 18 workspace 1 1 1 1 1 3 workspace database 1 10 1 example 1 10 7 writesys patgen_ start 3 1 15 writesys patgen_ stop 3 1 15 writesys patgen_ stop mode 3 1 15 X X address values 2 1
108. 5 411 d18s7 467 d16s7 274 io66 320 d22s0 362 i026 412 d19s4 468 d17s4 275 io67 321 d22s1 363 io27 413 d19s5 469 d17s5 276 io68 322 d22s2 364 i028 414 d19s6 470 d17s6 277 io69 323 d22s3 365 i029 415 d19s7 471 d17s7 278 io70 324 d23s0 366 io30 416 d28s4 279 io71 325 d23s1 367 io31 417 d28s5 280 d28s0 326 d23s2 368 d12s0 418 d28s6 480 d26s4 281 d28s1 327 d23s3 369 d12s1 419 d28s7 481 d26s5 282 d28s2 328 io40 370 d12s2 420 d29s4 482 d26s6 283 d28s3 329 i041 371 d12s3 421 d29s5 483 d26s7 284 d29s0 330 i042 372 d13s0 422 d29s6 484 d27s4 285 d29s1 331 io43 373 d13s1 423 d29s7 485 d27s5 286 d29s2 332 i044 374 d13s2 424 d24s4 486 d27s6 287 d29s3 333 i045 375 d13s3 425 d24s5 487 d27s7 288 d18s0 334 i046 376 io8 426 d24s6 289 d18s1 335 io47 377 io9 427 d24s7 A 290 d18s2 336 d26s0 378 iot0 428 d25s4 496 d22s4 291 d18s3 337 d26s1 379 ioti 429 d25s5 497 d22s5 292 d19s0 338 d26s2 380 io12 430 d25s6 498 d22s6 293 d19s1 339 d26s3 381 io13 431 d25s7 499 d22s7 294 d19s2 340 d27s0 382 i014 500 d23s4 295 d19s3 341 d27s1 383 i015 yi 501 d23s5 296 d14s0 342 d27s2 384 d10s4 440 d20s4 502 d23s6 297 d14s1 343 d27s3 385 d10s5 441 d20s5 503 d23s7 298 d14s2 344 i056 386 d10s6 442 d20s6 299 d14s3 345 io57 387 d10s7 443 d20s7 300 d15s0 346 io58 388 diis4 444 d21s4 301 d15s1 347 io59 389 d11s5 445 d21s5 302 d15s2 348 io60 390 d11s6 446 d21s6 303 d15s3 349 io61 391 d11s7 447 d21s7 350 i062 392 di4s4 448 d12s4 351 i063 393 d14s5 449 d12s5 394 d14s6 450
109. 7 1995 7 Time Scale ns 2 Waveform Size 1x period ns 10 20 10 sym addr 11 11 read_edges read_edges Figure 5 1 6 Wavetool Display Hazards Since dual MPG is a patgen mode it violates no system timing hazards Therefore programmers should pay close attention to hazard warnings The most common timing violation when using dual MPG mode to achieve increased test frequency is the minimum pulse width spec Keep in mind that both data pulses and surround data pulses must meet this spec 5 1 20 June 1995 J990 Series Programmer s Manual Using Dual MPG Mode Offline When loading a dual MPG test program offline you will normally receive a warning message telling you that the system offline model does not have an SEC bus While this will have no impact on how the test program executes it can be easily fixed by adding a w flag to the flag block of the workspace file For example flag flag form name elements type tflags w m tldflags need w for off line sim A tflags m tldflags lflags g ldflags June 1995 5 1 21 Using Dual MPG Mode J990 Series Programmer s Manual 5 1 22 June 1995 J990 Series Programmer s Manual Index Symbols define _ template statement 3 2 5 adr 1 1 3 db 1 1 3 caladr 1 1 6 1 9 1 caladr files dual mpg programming for 5 7 78 caldb 1 1 6 1 9 1 chanadr 1 1 5 1 3 1 chanadr files dual mpg programming for 5 1 5 chandb
110. 8s4 154 d8s2 204 io4 248 i032 33 d8s5 a 155 d8s3 205 io5 249 i033 34 d8s6 96 d6s4 156 d9s0 206 io6 250 i034 35 d8s7 97 d6s5 157 d9si 207 io7 251 io35 36 d9s4 98 d6s6 158 d9s2 208 d6s0 252 i086 37 d9s5 99 d6s7 159 d9s3 209 d 6s1 253 i037 38 d9s6 100 d7s4 160 d38s0 210 d 6s2 254 i038 39 d9s7 101 d7s5 161 d38s1 211 d6s3 255 i039 40 d4s4 102 d7s6 162 d38s2 212 d7s0 256 d20s0 41 d4s5 103 d7s7 163 d38s3 213 d7s1 257 d20s1 42 d4s6 164 d39s0 214 d7s2 258 d20s2 43 d4s7 165 d39s1 215 d7s3 259 d20s3 44 d5s4 112 d2s4 166 d39s2 216 io16 260 d21s0 45 d5s5 113 d2s5 167 d39s3 217 ioi7 261 d21s1 46 d5s6 114 d2s6 168 d34s0 218 io18 262 d21s2 47 d5s7 115 d2s7 169 d34s1 219 i019 263 d21s3 170 d34s2 220 io20 171 d34s3 221 io21 June 1995 1 3 9 Creating Channel Database Files J990 Series Programmer s Manual Table 1 3 3 J997 Signal Names According to Channel Numbers continued 1 3 10 June 1995 J990 Series Programmer s Manual Creating Channel Database Files Chan Sig Chan Sig Chan Sig Chan Sig Chan Sig 264 d24 J994 Channel Number to Signal Names and 452 d13s4 265 de4 Signal Name to Channel Number Charts 7 re 266 d24 454 d13s6 267 d2455 OIO UIUSI pages 0VYY UlVS I 455 d13s7 268 d25s0 314 d10s2 356 d17s0 269 d25s1 315 d10s3 357 d17s1 a 270 d25s2 316 d11s0 358 d17s2 408 d18s4 464 d16s4 271 d25s3 317 d11s1 359 d17s3 409 d18s5 465 d16s5 272 io64 318 d11s2 360 i024 410 d18s6 466 d16s6 273 io65 319 d11s3 361 i02
111. 90 Series Programmer s Manual use pinset diMx4 pins pindb d1Mx4_ pins range level 2v 7v The pinset specifies which test head resources need to be calibrated for the test program Range indicates which DC levels range will be used by the test program This is a choice among three 9 volt ranges 4V to 5V 3V to 6V and 2V to 7V calset nominal_level_cal patgen freq 60Mhz The first calset the nominal_level_cal contains nominal cal levels In the demo DRAM program this calset is used with the basic functional and nominal function instances Other calsets are used with tight timing instances such as those for characterizing specific parameters such as trac The patgen clause tells AEL at what frequency the patgen will be running This is a choice of 60Mhz 100Mhz or dual_60Mhz This choice is test system dependent and should match what isprogrammed in the waveadr file default yak O0 VOS NO chan mux off Seme MU Ota optimize d3_drive strobe edge Place all items you wish to default in the default clause Defaulted item can be overridden by specifying a header in the cal form clause and providing the desired values The vil and vih keywords calibrate the DC levels This is typically defaulted to the standard levels at which you will want to set VIL and VIH for your device The chan mux and fmt mux selection can be either off or on The optimize selection is used to specify the edg
112. 95 J990 Series Programmer s Manual Workspace Database Example 1Mx4 DRAM Program Workspace for J990 test program named Dx4J set set form flag Ch or PES CR OTE TEL flag form group default name tflags lflags group form type waveform RO te TEE Sede EPS Cos Cu name diMx4_pins d1iMx4 j_chans nom_levs spec_levs leakage_levs power_off_levs timing_70ns timing_80ns timing_nominal levels_eqns simple_wave_eqns spec_wave_egns_1 wav dram_patterns pattern_data srcset d1Mx4 march scan addrcompl vcc_bump read_write_loop refresh_loop refresh_test elements type rom tldflags Ng ldflags comment nil name wave_timing_70ns mod diM diM lev lev lev lev tim tim tim pin_levels leveldb Creating Workspace Database Files ule x4pins pindb x44 chandb els specdb els specdb els specdb els specdb ing specdb ing ing specdb dra dat dra dx4 pa pa pa pa pa pa pa PE CT EE CE CE ET FA elements timing_70n spec_wave_ simple_wave_eqns wavedb e_eqns wavedb S eqns_1 m_patterns svmdb agen dgendb m_src srcdb mutdb terns startdb terns startdb terns startdb terns startdb terns startdb terns startdb terns startdb June 1995 1 10 7 Creating Workspace Database Files J990 Series Programmer
113. A4 368 369 370 371 Pin 14 D12 AS 136 137 138 139 Pa N 157 D4 A6 312 313 314 315 Pin 16 D10 A7 196 197 198 199 Par Le DS A8 372 373 374 375 Pin 18 D13 OE 316 317 318 319 Pin 22 Dil CAS 128 129 130 131 Pins 23 DO DQ2 202 378 206 382 Pin 24 DQ3 203 379 207 383 Pan 25 7 VSS gnd gnd gnd gnd Pin 26 June 1995 1 3 5 Creating Channel Database Files J990 Series Programmer s Manual Table 1 3 1 J997 10 Channel Numbers According to Signal Names Signal Chan Signal Chan Signal Chan Signal Chan io0 200 io18 218 i036 252 i054 238 io1 201 i019 219 i037 253 i055 239 io2 202 io20 220 i038 254 io56 344 io3 203 io21 221 i039 255 i057 345 io4 204 io22 222 i040 328 i058 346 i05 205 i023 223 i041 329 i059 347 io6 206 i024 360 i042 330 io60 348 io7 207 io25 361 i043 331 i061 349 io8 376 io26 362 i044 332 1062 350 io9 377 i027 363 i045 333 1063 351 i010 378 i028 364 i046 334 i064 272 i011 379 i029 365 i047 335 1065 273 i012 380 i030 366 i048 232 1066 274 i013 381 i031 367 i049 233 i067 275 io14 382 i032 248 1050 234 1068 276 i015 383 i033 249 i051 235 1069 277 io16 216 i034 250 i052 236 io70 278 io17 217 i035 251 i053 237 io71 279 1 3 6 June 1995 J990 Series Programmer s Manual Table 1 3 2 J993 J995 J Creating Channel Database Files 997 Driver Channel Numbers According to Site Signal Names Slo
114. ADR900 This method allows for the most flexibility It involves creating overlay db files with ADR900 1 Define the specsets or use specsets in an existing specadr file 2 Create the overlay waveforms or overlay levels a For overlay waveforms Create a owadr file which uses waveadr file syntax but omits the following e The patgen freq statement spatgen driver driver init comp strobe mach2 scio chan mux and io in the pins form and mcgpins form statements The dvar form statement in the eqset statement e The fmtor palette clause in the equation form clause Note that equations in an overlay can reference the edges of the background waveform by prepending the edge with dollar sign symbol For example Background waveform prg d0 rw_inst 5ns Overlay waveform cs d0 rw_inst prg tCS b For overlay levels Create a oladr file that uses leveladr file syntax but omits the following e The range level statement The power seq and pause headings in the pins form statement The dvar form statement in the eqgset statement 3 Define the overlay objects in the workspace a If they do not already exist list the specsets and eqsets in the set form statement For example ES set set form type module name specset FP TLENAME SPECDB AC_SPECSET_NAME specset FP TLENAME SPECDB
115. Control Opcodes set cN expression loop expression rep expression MPG Instructions xreg expression yreg expression Step 2 Import the variables used in the runtime expressions The variables must be imported into the svmadr file The following are examples of the syntax import param int al or import param int al a2 a3 Variables defined by the import statements do not have to be declared anywhere else in the program The compiler will declare them The string that creates the runtime expression is not retained in the svmdb file To edit a runtime expression you must modify the svmadr file not the svmdb file Note that this modification method is not the same as expressions used in waveadr or leveladr equations Those equations can be modified at runtime in the db file Step 3 Run adr900 The translator and compiler creates a function for each pattern when the svmadr file is translated First the translator will create the function lt mpgset gt _update t where lt mpgset gt is the name of an mpgset This function is passed the arguments that set the expressions The translator also creates the file lt mpgset gt _update h to declare the function After translating the at900 compiler is automatically invoked to compile the lt mpgset gt _update t creating a lt mpgset gt _update o file The job s makefile does not have to be altered for this All three lt mpgset gt _update files will be created in whatever direc
116. DR reverse translator a set of high level interface functions which can be called from the job a set of low level hardware drivers code which generates hardware setups from high level template inputs OOoOdod Oo Oo 0 enhancements to the Bitmap Tool that provide a graphical user interface for MFP software J990 Series programmers who are not planning to use the Catch RAM or create Bitmaps should still use MFP software to program scramble RAM contents multiplexer settings ADS bit assignment and topological inversion Essentially there are two approaches to using the memory fail processing software One approach is the graphical user interface method New features and buttons for Bitmap tool support MFP operation Template instances required with either approach can be created using Insted An MFP database is automatically generated from the templates These databases can be edited with the ADR translator and reverse translator The Bitmap Tool Manual describes the use of the graphical user interface June 1995 Memory Fail Processing Overview J990 Series Programmer s Manual MFP Templates The second approach is the job driven interface method In this approach function calls are included in the main job flow to implement MFP operations As with the graphical user interface method MFP template instances are required These MFP templates are discussed in Chapter 4 2 Memory Fail Processing Templates The job driven interface
117. E_BODY_END func_t Mark the end of the Body section emplate Lines 114 121 Postbody Section Post Body Section Lines 114 121 Line Code Type Description 114 TEMPLATE POST_BODY_BEGIN Macro Mark beginning of Postbody section func_Template 115 TLIB_TIMER TLIB_STARTIME Starts a timer that measures the execution time of the TLIB_POSTBOD postbody and datalogs the results 116 Tlib_pretest_clear Function Clear pretest setup conditions 117 Tlib_posttest_clear Clear postest setup conditions 118 TLlib_patstart_clear Clear patstart setup conditions 119 Tlib_patstop_clear Clear patstart setup conditions 120 TLIB_TIMER TLIB_STOPTIME Macro Stops a timer that measures the execution time of the TLIB_POSTBOD postbody and datalogs the results 121 TEMPLATE POST_BODY_END Mark the end of the Postbody section func_Template 3 2 20 June 1995 J990 Series Programmer s Manual Customizing Templates C Variable Declarations Often variables need to be defined in template code in addition to the variables defined through the processing of the tdl file Typically these are variables used to increment through loops or store values As an example if HASVALUE beforepat amp amp HASVALUE floatpins Pin P increment variable of type Pin required for P floatpins HA
118. FP_ADS TT_MFP_ADW or TT_MFP_ADS TT_MFP_ADW The bus argument is defaulted to be TT_MFP_ADS TT_MFP_ADW and may be omitted If the TT_MFP_ADS TT_MFP_ADW argument is selected both ADS and ADW multiplexers will be programmed identically June 1995 4 4 5 Memory Fail Processing Low Level Programming J990 Series Programmer s Manual TT_MFP_INMUX_XY type The TT_MFP_INMUX_XY type specifies the bits of the input multiplexers for the X and Y address scramblers The arguments for the TT MFP_INMUX XY type are TT_MFP_INMUX_XY Arguments TT_MFP_IN 4 4 6 June 1995 tt_mfp_set_outmux J990 Series Programmer s Manual Memory Fail Processing Low Level Programming This function call is used to program the address scramble RAM output multiplexers These multiplexers are sometimes referred to as the ADS input multiplexers The syntax of this function call is tt_mfp_set_outmux mux scram_out_bit bus The mux argument is an integer of value 0 31 inclusive these are used to specify which output multiplexer is to be programmed The scram_out_bit is one of the TT_MFP_OUTMUX_BITs The bus argument may be TT_MFP_ADS TT_MFP_ADW or TT_MFP_ADS TT_MFP_ADW The bus argument is defaulted to be TT_MFP
119. General concepts that apply to all template customization General description of the structure of the template source code Description of template macros defined by Teradyne Description of template Tlib variables and their usage Declaring template C variables OO ONO How to write statements for error checking etc It is far more efficient to modify an existing Teradyne template than to create a new template from scratch By modifying an existing template from 399x templates the programmer can make use of example code already present and have code that follows all of the recommendations listed in this chapter already in front of him Template Source Code Structure The source code is partitioned into five major sections all of which must be present in the source code t file Includes This section will typically have the following three include statements teradyne h will always be present in any template The last include statement will be the h file that was created from running tdl_to_h on the tdl file earlier in the chapter include lt teradyne h gt include Tlib h include CUSTOMNAME Template h include teradyne h must always be present in any template to include Teradyne specific settings needed for compile and load operations include Tlib h is required for using Teradyne macros which are used to write t file code To add the correct path in the include statement use the 99x templa
120. HASVALUE waves writesys select_waveform waves 2 Parameter has hidden default in code This method will directly set a value if the instance parameter does not have a value For example if HASVALUE tnum writesys testnumber tnum else writesys testnumber 1 3 2 32 June 1995 J990 Series Programmer s Manual Customizing Templates Enums to Variables This is another way to set up a default but it is not recommended It requires the user to look through the template code in order to see what would happen if he did not enter a value 3 Use default in tdl file This is the recommended way of establishing a specific default value for a parameter The default is documented in the Insted tool and the default can be changed like any other database entry rather than by searching through deeply embedded code For example parm samples Int Samples default 80 If the user does not enter a value for the samples parameter in this example the value will be 80 Many AT900 commands take only enumerated data types like those defined at the front of the readsys writesys statement description section of the Syntax Reference Manual However the user may want to use a variable in the statement since template code is general purpose in its intent Variables provide flexibility and can save a lot of coding time To convert a statement that only uses enums to one that uses a variable use the same technique shown
121. MFP software is also highly interactive You can change the setups freely without doing a job reload In general when you make an interactive change the MFP software will detect the change and do some recomputation and cache rebuilding at the next job run This will result in a delay the first time the modified job is run but not on subsequent executions You may modify instance values at any time with Insted The MFP driver functions will detect that instance values have changed and re run the setup generation code the next time that instance is used Note if the next time the instance is used is during an operation by Bitmap tool there will be a delay in the plotting process If you are doing job driven bitmapping based on a custom ADR file you may also edit that ADR file at any time The MFP drivers will detect that the mfpadr file is newer than its corresponding mfpdb file and will automatically retranslate reload database values and so on the next time the ADR file is referenced Any translation errors will appear in the job IO window MFP objects must be added to the job s workspace file along with other changes as described below 1 Copy the file tt_mfp svmadr from 399x etc to your job directory and add write permission to it 2 Edit the file to add the job s pinset name and to force any required pin states in the pre coded patterns in the file Pin states only need to be edited if it is important to keep devices in a disab
122. MFP_HLD_TYPE_SCRAM inmux form outmux form x scram form y scram form addr mux form data mux form FP_HLD_TYPE_TOPO topo mux and topo invert form FP_HLD_TYPE_MODULE module form FP_HLD_TYPE_CATCHRAM catchram form FP_HLD_TYPE_FATLMAP failmap form FP_HLD_TYPE_DISPLAY_PROC display processor FP_HLD_TYPE_RFL_MUX rfl mux form FP_HLD_TYPE_RFL_BUS rfl bus form FP_HLD_TYPE_RA_MUX ra mux form June 1995 4 4 3 Memory Fail Processing Low Level Programming J990 Series Programmer s Manual TT _MFP_HLD TYPE Pe gt Description arguments FP_HLD_TYPE_RA_FORM ra form FP_HLD_TYPE_RA ra FP_HLD_TYPE_INMUX inmux form l FP_HLD_TYPE_OUTMUX outmux form l FP_HLD_TYPE_ADDR_MUX addr mux form FP_HLD_TYPE_DATA_MUX data mux form l FP_HLD_TYPE_X_SCRA x scram form l FP_HLD_TYPE_Y_SCRA y scram form FP_HLD_TYPE_TOPO_MUX topo mux FP_HLD_TYPE_TOPO_INVERT topo invert form FP_HLD_TYPE_ALL Everything contained in the hldset tt_mfp_set_addr_mux This function is used to select ADS input bits for each multiplexer on a drive only ACS channel There are two versions of this function call
123. MPG instructions can be modified via the patedit tool Patdebug has three new fields to display the X Y and data generator information for the alternate MPG These fields are named Mpg Alt X Addr Mpg Alt Y Addr and Mpg Alt Data respectively Display of this information can be controlled from the View Layout button from patdebug s main panel Figure 5 1 5 shows a partial output from a scan pattern Notice that 3 additional fields Alt_X D Alt_Y D and AltDG D Filey View Edit _ Properties 000011 000011 000011 S000011 S000012 S000012 S000012 S000012 S000012 S000012 S000012 248 250 252 254 0 2 4 6 8 10 12 14 OD a G p Lo Lo Lo Co Co b A w O Ooo bO0O0OOCOC Figure 5 1 5 Patdebug Menu bO0O00000000COCC 1997 patdebug B2 7 5 DEBUG chanmux svmdb customerss EEE ESSCS 4 b L June 1995 5 1 19 Using Dual MPG Mode J990 Series Programmer s Manual Wavetool Wavetool s only changes are a result of using format muxing and channel muxing Consequently each drive only channel shows two pieces of data driven in a single cycle Each primary IO channel also shows two pieces of data driven or compared on the same cycle The secondary IO channel shows only the late half data This follows the concept of dual MPG since all the input output occurs on the primary IO channels and the secondary is muxed in only to drive compare the late half data LA 43 5
124. Manual Programmer s Guide to the Hardware Copy CP Copy or repeat the format and data that was used in the previous cycle Return to Complement Repeat Data 1 VIH VIL do di d2 do di d2 do Non Return Repeat Data 1 VIH VIL di d2 di d2 Pulse Low Repeat Data 0 VIH VIL Stay Repeat VIL do d di do dt d do If driver state is 0 at end of previous cycle Figure 2 1 19 Copy Format June 1995 2 1 23 Programmer s Guide to the Hardware J990 Series Programmer s Manual Format Muxing on Drive Only Channels Format Muxing on drive only channels only allows the channel to drive two independent pieces of data in one cycle This is commonly used to generate address multiplex waveforms and clock the channel at twice the patgen speed The driver format is independent in each half of the cycle VIH Invert Invert Second First Second Data l VIL do di d2 d3 d4 d5 mux Figure 2 1 20 Formatter Muxing with RC RC VIH VIL Figure 2 1 21 Formatter Muxing with PL PH 2 1 24 June 1995 J990 Series Programmer s Manual Programmer s Guide to the Hardware Channel Muxing Channel muxing utilizes two channel s edges on a single pin to generate waveforms at twice the formatter speed This muxes the adjacent channel s edges onto the current channel All programmed edges for both channels are combined into one cycle Channel m
125. Mux Mach2 When doing formatter muxing and Mach2 two bits are used for the first half of the cycle and two bits are used for the second half of the cycle When not doing formatter muxing only the first two bits can be used When the channel is not in mach2 mode only half of the available bits are used Drive only channel vectors are programmed in the memory mode where the state symbol is either 0 1 2 or 3 and the pin symbol has the M extension in the vector form header The single character vector after the period will cause the vector to apply to all pins in the pin symbol vector form no muxing or mach2 clock pin WE M header using memory vector 30 4 drive 0 in this cycle 1 drive 1 in this cycle When using algorithmic address or data to drive the channel the drive data is supplied by the ADS bus In this case the memory vector should be 0 June 1995 1 8 11 Creating Pattern Database Files J990 Series Programmer s Manual Vector Programming with Macros Since memory test patterns often use repetitive vector states these are easily programmed with macros Use the C preprocessor define statement to define the header and the states for each vector for each cycle type This effectively defines the cycle definitions that will be used in the pattern cycle definition macros define CYCLE DEFINITION e ign DOS S RAS M CAS M WE M OE M define RAS_ONLY
126. No PIG DiS comma guttam strings bypass lines list of X address bits X address bits pin_x_bits strings Yes LSB gt MSB list of Y address bits Y address bits pin_y_bits strings Yes LSB gt MSB 4 2 6 June 1995 J990 Series Programmer s Manual Memory Fail Processing Templates a The user should wrap each such function in an extern C block This means that the function definition is preceded by extern C and followed by an extra closing Example The following example instance shows programming for MFP Address Scramble Template 2 mfp_addr_scram instance mfp addr_ scram 2 Template define instance mfp_addr_scram mfp_addr _scram_ 2 Template value patgen 0 choice Main value addr_func mfp_addr_scram_func value x_in px0 pxl px2 px3 px4 px5 px6 px7 value y_in py0 pyl py2 py3 py4 py5 py6 value unscram_in value x_out A12 A7 A6 A5 AO A10 AY All value y_out A8 A13 A14 A4 A3 A2 Al value unscram_ out value pins_x_ bits A12 A7 A6 A5 A0 A10 AY All value pins_y_ bits A8 A13 A14 A4 A3 A2 Al Example The following example shows a user function that could be used to do one to one scrambling extern C int mfp_addr_scram TT_MFP_XYB unscram TT_MFP_XYB scram scram unscram return 0 June 1995 4 2 7 Memory Fail Processing Templates J990 Series Programmer s Manual MFP Bitmap Usage Template MFP Bitmap Usage Template Insted name mfp bitmap usage Templa
127. O Use the ADRedit tool to both create and translate the ADR file June 1995 1 4 1 Creating MUT Database Files J990 Series Programmer s Manual Row Address Decoding amp Scrambling Address Pins L Column Address Decoding Sd Datal O amp Scrambling WE Topo Inversion Data Pins Figure 4 1 1 Illustration of Memory Array as Perceived by MUT Database As the preceding figure illustrates the MUT database perceives the device as a memory array that is accessed by address pins that get decoded and scrambled The data that is stored in the array depends on the topological inversion logic 1 4 2 June 1995 J990 Series Programmer s Manual Creating MUT Database Files Row Address Decoding amp Scrambling Memory Array L oe Column Address Physical P ne o Decoding Co Array Scramble li Addresses Addresses S Setainbing A To Data I O po Inversion Data Pins Topologically Correct T Test System Hardware Data Paths Described by the Topological MUT Database Data Inversion Memory Array Data Figure 1 4 2 Illustration of Memory Array Testing as Perceived by MUT Database When the device is tested the tester must be set up to accurately test the memory array The patgen generates the address sequences for the memory array These are scrambled for the device pins so that when the device address decoding and scrambling is done the address produced by
128. Procedure for Creating Instances The typical procedure for creating new instances involves including template description files creating an instance from it then editing the parameters for that instance Repeat that procedure until all instances are created then saving the instances to an instance database file insadr 1 Bring up Insted using the Openwin menu or entering insted into any shelltool or cmdtool Insted will appear as an empty tool Select a workspace To select a workspace select the File button then Load The load panel appears Select Object Type and switch workspace to pick a new workspace Select your workspace created in Chapter 1 10 the wspdb file must exist Now all Insted buttons will be operational Include the templates that are needed from the Teradyne template directory for example j997 templates In the Insted Manager selecting the Include option from the File menu O Inthe Include window use the menu button to select the Template Definition File option from the Object Type menu A Nextto Directory input the correct directory and path to the location of the template files for example j997 templates After list of templates appears in the bottom of the screen highlight a template and press the Include button 7 11 6 June 1995 J990 Series Programmer s Manual Creating Instance Database Files ne Insted Manager Include Object Type v Template Definition File 4j
129. SPEC 80 2 define PASS SPEC 70 1 1 12 4 June 1995 J990 Series Programmer s Manual Function job _ main NM HHH HH job_main EXECUTE basic_functional FAIL DO basic_functional EXECUTE continuity FAIL DO continuity Job main flow After each type of test is performed binning is immediately performed if the any test of that type failed sort loop is performed at the end bin FAIL CONTIN PASS_DO continuity bin FAIL_BFUNC EXECUTE leakage FAIL_DO leakage bin FAIL_LEAKAGE 7 EXECUTE icc_standby FAIL DO icc_standby bin FAIL_ICC_STDBY EXECUTE icc_operating FAIL DO icc_ operating bin FAIL_ICC_OPER EXECUTE funct_spec_7Ons FAIL DO funct_spec_70ns EXECUTE funct_spec_80ns FAIL DO funct_spec_80ns bin FAIL_SPI EC_FUNC PASS_DO funct_spec_80ns bin PASS_SPI PASS_DO funct_spec_70ns bin PASS_SPEC_70 return 0 EC_80 Creating a Flow Control Module June 1995 1 12 5 Creating a Flow Control Module J990 Series Programmer s Manual Function bin 7 bin int bin _ num printf s Sort Bin d n readsys current_siteset bin_ num if bin _num lt 3 writesys sort_nokeep bin_num TT_BIN_PF_PASS else writes
130. SVALUE P NEXT P Tlib_floatpins P writesys pause_for_relay In this example beforepat is a pattern object Floatpins is a list of Pin symbols Both are instance parameters set to values using Insted In this example a variable of type Pin was required in order to loop through pin symbols in a forloop Variables can be defined just about anywhere in the template code The following high level types are defined for you and match the list of datatypes available when defining parameters in the tdl file June 1995 3 2 21 Customizing Templates J990 Series Programmer s Manual Template Macros The following is a list of the macros used to write templates These macros make template writing easier and less prone to error For additional examples beyond those mentioned in this chapter review the existing standard templates in 399x templates EMPLATE PRE BODY _BEGIN EMP LATE PRE BODY _END N T T TEMPLATE BODY _BEGIN T T T EMP LATE _BODY_END EMP LATE POST _ BODY _ BEGIN EMP LATE POST_BODY_END These symbols mark the beginnings and ends of each of the three sections ofthe template code These macros must be present The symbol placed in the parenthesis is the name of the template For example H EMPLATE PRE BODY _BEGIN basic_ func Template EMPLATE PRE BODY _ END basic _func Template GI H
131. Sets up parameters for the entire job program by performing the following tasks Enabling and or disable utility bits Disabling comparators on pins for debug oO Oo 0 Switching open the normal state for a device pin Ol Programming of AT900 on conditions change_conditions_ Template The change conditions template can be used to provide basic functional test capability at a very primitive level however its main use is to change the current waveform level pattern calset or test number interactively in Insted This template is typically used to change conditions inherited by shmoo To use change conditions put an empty instance in the insadr file All parameters of the template are optional Do not execute the instance in your normal job flow Then at a trap use Insted to open the change condition instance and select whatever parameter desired Execute the instance and shmoo will run under the new conditions corner_list_Template This template specifies a series of functional tests called corners Each test is fully specified the pattern waveform levels and names are individually entered in the template The template provides many options for selecting which corner s out of the list are to be executed by an instance It is particularly useful for interactive use in conjunction with Insted func_Template Implements a functional test using a list of one or more patterns The template sets up th
132. TEMPLATE_PRE_BODY section 17 TLIB_PATSTOP pat stop Set up the call of a function C function returning an integer after the patgen is stopped used for post conditioning The on condition setup will remain in effect until cleared in the TEMPLATE_POST_BODY section via a call to Tlib_patstop_clear which resets the function pointer to the function in effect before the instance was executed Typically the setting up any on_patgen_start conditions should be performed only in the TEMPLATE_PRE_BODY section 18 TLIB_CHECK_DISABLE Disable the comparator for pins designated in the disable_comp_pins parameter in the instance for the Background Template of the test program It is normally executed once at the end of the TEMPLATE_PRE_BODY section 19 Tlib_initialize_siteset Function Declares to the template library a list of the initial sites 20 TLIB_TIMER Macro Stops a timer that measures the execution time of the TLIB_STOPTIME prebody and datalogs the results 1IB_PRE_BOD 21 TEMPLATE_PRE_BODY_END Mark the end of the Prebody section June 1995 3 2 15 Customizing Templates J990 Series Programmer s Manual Line 22 109 Body Section The Body section is where the actual test instructions reside It consists of preliminary setup information and a main for function Preliminary Setup Information Lines 22 34 Line Code Type Descripti
133. They must also be listed explicitly in the job group or implicitly through a waveform level overlay waveform or overlay level named in the job group Using AT900 Statements Within a t file enter one or both of the following AT900 commands writesys select_overlay_waveform OVERLAY _WAVEFORM_EQSET_NAME AC_SPECSET_NAME writesys select_overlay_level OVERLAY_LEVEL_EQSET_NAME DC_SPECSET_NAME The new overlay will be called tt_ow_AC_SPECSET_NAME_OVERLAY_WAVEFORM_EQSET_NAME or tt_ol_ DC_SPECSET_NAME_OVERLAY_LEVEL_EQSET_NAME Note that you may omit the specset name in the previous select statements to dynamically create an overlay containing the specified eqset and the specset in the current waveform or level Using Job State To create new overlays using the 1G900 tool Job State 1 From Jobtool trap on a test test type or instance 2 Summon Job State from the Jobtool s Tools menu 3 In Job State click the right mouse button over Overlay Level or Overlay June 1995 1 13 3 Overlay Level and Waveform Files J990 Series Programmer s Manual Waveform select Create from the pullright menu 4 Inthe Create window enter next to Name the name of the new overlay 5 From the Eq Set Table menu select List 6 Inthe List window select an eqset 7 From the Spec Set Table menu select List 8 Inthe List window select a specset 9 In
134. Y surround data for the cycle d4 This edge selects the valid data for the Y portion of the cycle d5 This edge selects the surround data for Y portion of the cycle Under mach2 mode this edge drives the second portion of the Y xdata 2 2 10 June 1995 J990 Series Programmer s Manual Timing Guidelines The following figure illustrates the use of these edges XI Xl X Data Selection Valid Data Surround di d2 Y Data Selection Valid Data Surround XY Mux Selection X Half Y Half do Resulting Waveform Note that the example shows surround by complement format sometimes referred to as return to complement format The surround data can also take other values For example in surround by low format sometimes referred to as return to low format the surround data is zero Figure 2 2 12 Drive Only Timing Edges June 1995 2 2 11 Programmer s Guide to the Hardware Timing Guidelines Input Output Timing Edges For IO channels the programmer has available six timing edges to setup the desired waveforms Each of these edges has a specific purpose Table 2 2 3 Input Output Edges Edge Purpose do This edge selects the initial surround data For zstate dO this edge controls the state of the drivers For zstate d0 off d3 this edge turns on the drivers d1 This edge selects the valid data for the cycle d2 This edge selects the final surround data for the cycle Under
135. YC J lt gt XD YD Y 16bits lt 16 bits K Data Generators ALUs v Constant Registers Xconstant Yconstant 4 16bits lt 16 bits Address Generator Figure 2 1 8 Address Generator Mempat Block Diagram 2 1 12 June 1995 J990 Series Programmer s Manual Programmer s Guide to the Hardware Arithmetic Logic Unit ALU for Address Generation There are separate X and Y ALUs used to generate complex address sequences The ALUs generate a value which can be loaded into the address counters and used as the source of address Each ALU has two inputs J and K which can be selected on the fly from one of any counter A B C D O ALU constant value O logic zero One of six actions can be performed by each ALU This action is performed on the current value of the J and K inputs O add O add linked O subtract O subtract linked o exclusive OR linked plus carry O exclusive NOR linked plus carry complemented exclusive OR The ALU operations are masked by the enable bits The ALU constant can be loaded from the SVM registers or rotated on the fly This becomes effective in the next cycle When loading the ALU constant all bits are updated regardless of the state of the counter enable register When rotating the ALU constant disabled bits are skipped The ALU constant cannot load and rotate at the same time and rotation cannot be linked X
136. _ADS TT_MFP_ADW and may be omitted If the TT_MFP_ADS TT_MFP_ADW argument is selected both ADS and ADW multiplexers will be programmed identically TT_MFP_OUTMUX_BIT type The TT MFP_OUTMUX BIT type is used to specify an address scrambler output multiplexer bit These bits are also known as the ADS input multiplexer bits The arguments for the TT_MFP_OUTMUX_BIT type are TT_MFP_OUTMUX LO ee ee NI June 1995 4 4 7 Memory Fail Processing Low Level Programming J990 Series Programmer s Manual TT_MFP_OUTMUX_BIT Arguments _MFP_OUTMUX_SYA4 FP_OUTMUX_SY5 tt_mfp_clear_catchram This function call clears the Catch RAM This syntax of this function is tt_mfp_clear_catchram which The which argument is one of the TT_MFP_CRAM_CLEAR_SELECTIONS described below This command defaults to TT MFP CRAM CLEAR BOTH which clears both halves of the Catch RAM If this is the desired outcome no argument need be specified TT_MFP_CRAM_CLEAR_SELECTION The TT_MFP_CRAM_CLEAR_SELECTION type is used to specify which part of Catch RAM memory is to be cleared This type has three arguments
137. _CYCLE ras_only_edges 1 X 0 1 lh il define READ_CYCLE read_edges 0 L 0 0 1 0 define WRITE_CYCLE write_edges 1 0 0 0 0 1 define INACTIVE CYCLE inactive _edges 1 ox 1 1 de 1 i mpgset dram_patterns vector form CYCLE DEFINITION mpg op default INACTIVE CYCLE pattern_name_ label WRITE_CYCLE mpg operations flow control opcodes READ_ CYCLE mpg operations flow control opcodes INACTIVE CYCLE mpg operations stop end vector form end mpgset 1 8 12 June 1995 J990 Series Programmer s Manual Creating Pattern Database Files SVM Database Example 1Mx4 DRAM March Pattern use pinset diMx4pins pindb diMx4 pins export label March import edge label ras_only_edges read_edges write_edges inactive_edges import src label srclocl define XMAX 1023 define YMAX 1023 define FULL_ADDR_SIZE 1048576 define RPT FULL ADDR SIZE 1048575 define RPT_WAKEUPS 7 cycle definition macros define CYCLE_DEFINITION e ign DQS S RAS M CAS M WE M OE M define RAS_ONLY_CYCLE ras_only_edges 1 X 0 T 1 1 define READ_CYCLE read_edges 0 EL 0 0 1 0 define WRITE_CYCLE write_edges 1 0 0 0 0 1 define INACTIVE_CYCLE inactive_edges 1 X 1 T 1 1 Notes ADDRS are not mentioned here since data actually
138. able changes on the fly while the patgen is running and all other functions are set using the databus Monitor Scope Enable Per Channel VIH Driver rae Calibration Q Connect Channel Drive Data rey CALcon ee ee Per Channel VIL Scope via Cal Matrix it System PMU Driver HiZ Load Enable Re Belay Mars Per Channel IOL PMU Matrix OQ Dynamic VT Per Channel Current Termination Voltage PPMU Enable PPMU Force Value System PMU FET Matrix Per Channel IOH Per Channel VOH Measurement Connect Mcon Na DUT Connect Connect Functional FUNcon DUTcon High Comparators Low Per Channel VOL Figure 2 1 43 10 Channel Block Diagram June 1995 2 1 51 Programmer s Guide to the Hardware J990 Series Programmer s Manual Dynamic Current Load Each IO channel has an individually programmable current load The IOH and IOL levels can be programmed between 300 uA and 50 mA This circuitry allows the device loading to be easily changed from test to test Impedance Lock Modern semiconductors have rise and fall times fast enough to warrant a transmission line environment but are usually designed with low impedance outputs and high impedance inputs The result is ringing sometimes severe enough to affect device operation To quiet the input to the comparators a pair of clamp diodes have programmable voltage references Vcl Vch The programmer has the c
139. ames output_pins Pinlist Yes Lists output pin names June 1995 4 2 13 Memory Fail Processing Templates J990 Series Programmer s Manual Example The following example instance shows programming for MFP MUT Description Template d12X_10Y_x8_ios_60MHz_mut_desc instance mfp_mut_description_Template define instance d12X_10Y_x8_60MHz_mut_desc mfp_mut_description_Template value speed 60 choice 60MHz value max_h_pxpy_bit py9 value max_v_pxpy_bit px11 value num_outputs 8 value output_pins DQO DQ1 DQ2 DQ3 DO4 DOS DO6 DQ7 4 2 14 June 1995 J990 Series Programmer s Manual Memory Fail Processing Templates MFP MUT Topology Template MFP MUT Topology Template Insted name mfp_mut_topology_ Template contains a description of the internal layout topology of the device This template can be used to generate custom topologies that differ from the default topology MFP generates from the MUT description template The template is based on per address bit equations and is appropriate for devices where the number of rows columns and IOs are all even powers of two The MFP MUT Topology Bit Table MFP MUT Topology Template contains an Insted table that lists an equal number of Patgen X Y bits H V bits These two lists must be the same length The next page contains several examples of the use of this template with different MUT topologies Parameters MFP MUT Topology Template has the following para
140. amming approach June 1995 Memory Fail Processing Overview J990 Series Programmer s Manual Low Level Programming ADR Files When programming with the low level MFP interface you are provided with function interfaces for capture setup and scan setup however the actual scan and capture operations are left up to the programmer There are two versions of both the low level capture setup and scan setup One version takes an MFP setup instance name as an argument and the other version takes an mfpadr filename directly If the low level is called with an MFP setup instance then the input ADR file specified in that instance is extracted This input ADR file is the only portion of the instance that will be used all other fields are ignored When the template input or high level function calls are not flexible enough to meet the user s needs a custom ADR file can be used Generally when you need to create a custom ADR file start with an MFP Setup template and request that an ADR file be generated based on values in those instances The generated ADR file can then be used as a starting point and further modified as needed To get the starter ADR file written out specify an ADR output file in the MFP Setup instance Note that this setup generation happens during job run at the first point where an MFP driver function is called which references that MFP Setup instance so you need an active job to make this happen There are two ways th
141. an locate custom templates automatically enter the following commands setenviG TEMPLATE PATH home HOSTNAME custom home HOSTNAME custom The setenv command allows Insted to also look in home lt hostname custom for tdl files For convenience add the setenv command to a login file 3 2 2 June 1995 J990 Series Programmer s Manual Customizing Templates 9 Optional Add the following command to the tdbxtool file use j99x templates j99x source exec templates home HOSTNAME custom other This will allow you to access the source code of Teradyne templates Teradyne Executive templates custom templates and other files from tdbxtool 10 Optional Add the custom template into a library of templates such as libtemplates o which is part of the standard Template collection by entering Id r o libcusttemp o CUSTOM o The line above produces a single o file that can be added to the test program workspace This is a simpler method of listing the custom templates in the workspace than manually entering the name of each custom template in the workspace file Creating the Custom Template The first step is selecting the appropriate template to modify from the list of standard Teradyne templates in j99x templates Once that is done then the programmer must edit the tdl file and the t file Editing the tdl File The tdl file is simply a list of the parameters that are used in the template The user of the templat
142. ances in a test flow is the following speed sort EXECUTE funct_spec_70 FAIL DO funct_spec_70 EXECUTE funct_spec_80 FAIL DO funct_spec_80 EXECUTE funct_spec_100 FAIL DO funct_spec_100 sort_bin FAIL FUNCT SPEC PASS_DO funct_spec_100 sort_bin PASS_SPEC_100 PASS_DO funct_spec_80 sort_bin PASS SPEC 80 PASS_DO funct_spec_70 sort_bin PASS SPEC 70 This speed sort portion of the main t file will execute three functional test instances that test a various speeds funct_spec_70 funct_spec_80 and funct_spec 100 The funct_spec_70 instance uses 70 ns timing the funct_spec_80 instance uses 80 ns timing and funct_spec_100 uses 100 ns timing June 1995 3 1 23 Using Templates J990 Series Programmer s Manual Leakage Tests Background Information Test Description This section describes leakage tests Leakage tests look at the current flowing through the device at the input and output pins Because voltages are present at these pins under normal operating conditions a certain amount of current leakage will occur Current outside specified ranges however is considered excessive and indicates a defective device J990 Series test systems can measure and test for input and output current leakage as well as high impedance or tri state output current leakage at the device pins Input current l
143. and PASS_DO execute blocks of code that only affect devices that have failed or passed respectively the executed instance EXECTUTE FAIL_DO and PASS DO are documented in the AT900 Reference Manual The sort_bin statements are function calls to another routine that controls binning The DUT will be binned to either the failed continuity bin or the failed basic functional bin 3 1 12 June 1995 J990 Series Programmer s Manual Using Templates Functional Tests Background Information Test Description Functional System Background about functional testing is provided first in this section followed by instance examples and analysis in the next section Functional tests are amongthe most important tests in a test program and some patterns can be very complex Fortunately the functional test instance is very straightforward It is almost entirely a matter of selecting a pattern to use from the pattern databases a wave from the wave database and a level from the levels database This is essentially all you do at the instance level Of course these databases need to be created with the right data in them The creation of these databases is covered in the Writing the Test Program section The background discussion reviews the considerations involved in functional testing to help guide in the creation of appropriate functional instances If more details are desired about any of the test system hardware or formats refer to the Progra
144. and Y will rotate independently Please note there are two independent ALUs one for X and one for Y In the XOR and XNOR functions carry in and carry out operate as follows Carry out None There is no carry in to the other ALU when in XOR or XNOR mode Carry in NOT ignored If there were a carry out from the other ALU it would affect the outcome Therefore if both X and Y ALUs are in the XOR and or XNOR modes they would operate as expected with no interaction However a carry would be generated if one of the ALUSs is in XOR or XNOR mode while the other is in an add add link subtract or subtract link mode In short a carry from an ALU can only occur when the ALU is doing an add add link subtract or subtract link Therefore to avoid having an ALU produce an undesireable carry that could affect an XOR or XNOR operation on the other ALU make sure that both ALUs are doing XOR or XNOR operations The ALUs will compute their results according to the function action programmed in the current cycle It is important to note that the values of the ALU inputs will come from the previous cycle Also the ALU constant must be preset one cycle prior to its use June 1995 2 1 13 Programmer s Guide to the Hardware J990 Series Programmer s Manual Address Scrambling patgen addresses 16X The address source selected by the memory patgen is used as inputs to the address scrambler The address scrambler generates d
145. and d2 for X data and d4 and d5 for Y data The source selection scheme for drive only channels is as follows O Ina simple non muxed drive only channel only one source of data is used Valid data appears from d1 to d2 Ina format muxed drive only channel two sources of data are used One bit is used for the first half of the cycle and the other bit for the second half Valid data appears from d1 to d2 and from d4 to d5 O Ina drive only channel that is using both Mach2 and format muxing four sources of data are used Two bits are used in the first half and two bits are used for the second half Valid data appears at d1 d2 d4 and d5 Depending on the mode of the channel various bits of the source select are used Basically each bit of the source select is associated with an edge BitO is associated with the d1 edge This bit is used in all modes O Biti is associated with the d2 edge This bit is used only when the channel is in Mach2 mode O Bit2 is associated with the d4 edge This bit is used only when the channel is in Format mux mode O Bit3 is associated with the d5 edge This bit is used only when the channel is in both Mach2 and Format mux modes The source select syntax for the drive only channels is similar to that of the lO channels An example would be 0 vm ads The 0 is required for the MSB This sets the unused multiplexers for both the X and Y half to logic 0 Bits 1 and 3 are set to SVM and bits
146. and databases which will be needed for each test Review the template reference documentation and the template code itself to select the templates to be used for each test Use Insted to specify the parameters to be used with the templates creating the Instance database file insadr file If the pins levels waveforms patterns and workspace have already been created and translated insted can read them to show which can be used as instance parameters Verify the Instance database file using the adr900 translator The insdb file can then be deleted as the insadr file is the one used in the job Add the instance database file and the template library to the workspace ADR file 1 11 2 June 1995 J990 Series Programmer s Manual Creating Instance Database Files Selecting Templates For a comprehensive description of all templates refer to the Templates Reference Manual You may also view the template code by looking at the t files located in the templates directory j99x templates Use the following summary as a general guide to using some of the basic templates background _ Template This template is used to alter the background or starting conditon of a test program from the Executive s default state This template is optional Because it can save a significant amount of processing time Teradyne recommends its inclusion in every job If none of the above tasks are needed in a test program it can be omitted
147. and eqset to create a waveform object The test program itself is a higher level databases object which contains all the databases and modules needed for linking a test program This means that the job is really defined in a workspace When the job is loaded the loader use the workspace to link all of the databases and modules to create the test program The workspace database name and the job name are both supplied to the loader Modular programming allows databases and modules to be shared between test programs The workspace can contain multiple jobs which may be appropriate for a family of devices which have similar characteristics and test conditions In essence the Workspace database defines the linkage between the test program and all the databases and executable modules that make it These linkages are represented by the lines in Figure 1 10 1 June 1995 1 10 1 Creating Workspace Database Files Executable Flow Code compiled C Level Eqns eqset Device Specs specset J990 Series Programmer s Manual Test Program Template Object Code Instances insadr files Calibration Conditions calset Datagen dgenset Pin Modes pinset hannel Wiring chanset econ SVM PCRAM svmset Wave Eqns eqset Device Specs MUT Description specset mutset Source Selections srcset Object Module Start Conditions startset
148. are optional except two which have defaults dotime and autotitle This instance does not program any of the optional parameters no data is provided for those parameters The two values programmed are set to the same level as the defaults It is not necessary to program defaulted parameters however it is very helpful for readability to specify the defaults explicitly June 1995 J990 Series Programmer s Manual Using Templates The two values programmed are ya lue dotime 0 chotce Dnon Vale AUOT 0 chosce no The dotime parameter specifies whether the instance execution times will be displayed A 0 after the dotime keyword indicates no execution times will be displayed the default A 1 after the dotime keyword indicates an execution time will be displayed The choice no segment is for the Insted display The Insted window will show the dotime parameter as no This is more human readable than Oor 1 The autotitle parameter specifies whether the template name and instance name will be automatically printed in the datalog In this example autotitle is set to 0 meaning no This is the default No other parameter is programmed in this example Using the Background Template To use this instance you would include it in your main t program in the initialization section of your program for example import Instance init_program_variables fvm_initialization Following this you would include the instance in you
149. at a hand tuned or created from scratch ADR file may be used with either high level functions or with low level driver calls The simplest case is to use the high level calls just as they would be used for unmodified template generated setups In this approach you start with template instances and specify an ADR output file The generated ADR file is modified as necessary and then it is specified in the MFP Setup instance as an ADR input file When a value is given for the ADR input file parameter the MFP high level drivers will bypass the normal setup generation phase and use the contents of that ADR file In this case it is important that the edits made to the ADR file do not include modification of hldset names The high level drivers determine which hidsets to send to hardware based on operation type and hidset name In general the high level drivers will assert several hidsets for a single action The second and more difficult approach is to use the custom ADR file in conjunction with the low level driver calls With this approach you specify in each driver call the name of the hidset and a bitmask of one or more form types hardware subsystems which should be sent from that hldset to hardware In this way you can choose to create large hldsets and assert only a portion of them in a given driver call or you can create small hidsets and assert them in their entirety perhaps making multiple driver calls to assert multiple hldsets to a
150. ation for Up to 16 Sites J994 Since each WaveGen Function is fanned out to 16 channel card drivers each function is independent for a test head with 16 or fewer sites Up to 40 functions can be programmed Addr Clock AT Channel Cards Addr 0 Clk 2 Clk 0 Addr 3 Addr 6 gt oO amp D 5 DS on a Addr 1 Clk 4 if Addr Clock WaveGen Board 4 Clk 5 Addr 8 Addr 7 Addr 1 Addr 2 Adar 4 Ik 3 Addr 5 p 4 Functions X 4 Sites 640 Chans on 40 brds stn Figure 2 1 40 Example Drive Only Function Assignments for Sixteen Sites June 1995 2 1 47 Programmer s Guide to the Hardware J990 Series Programmer s Manual Drive Only Channel Configuration for More than 16 Sites J994 If more than 16 sites are needed per test head the number of available WaveGen functions are reduced to 20 Two WaveGen functions will be programmed identically to cover the additional sites Addr Clock Addr Clock OS a eee 0 Za Le A0 P Channel Cards AO TE Z nr PTA0s 11 024 27 Cko I ab L Addr 3 Addr 6 Clk2 1 45 Clk25 31 7 D E Q Ik29 44 OIK254 27 D Clk2 7 lK220 23 Ad r 10 AES DDS aia Clk 4 0 19 CIKO 2 15 ClkOz 31 Die 1 A CT OIKO 11 CIKO 427 D Clk 7 lKO20 23 Addr 0 I gt ClkQo ig Clk 0 Clk 2 A3 215 A328 31 Addr 3 A gt t A3811 24 27 A
151. auses the transition to data from the surrounding format D2 the trailing edge in a waveform transition The D2 edge causes the transition from data back to the surrounding format D3 the MUX or 1 0 switching edge D3 is used to control format multiplexing channel multiplexing and I O switching D4 the leading edge in a waveform transition for the second piece of data for cycle The D3 edge cause the transition to data from the surrounding format D5 the trailing edge in a waveform transition for the second piece of data for a cycle The D5 edge cause the transition from data back to the surrounding format C1 the leading edge in an output strobe The C1 edge causes the compare window to open C2 the trailing edge in an output strobe The C2 edge causes the compare window to close Timing information is stored along with format information in a memory called edgeset memory Edgeset memory can store up to 32 different timing and format combinations all of which are available for a given pattern burst Formatting System The formatting system allows you to define the shape of a waveform by determining the behavior of the part of the wave that is not vector data The RL return low format for example forces the device input voltage level low to VIL in the non data areas of the waveform Another format RH return high forces non data voltage levels high to VIH Combined format and timing information for each p
152. b files Create dgenadr and dgendb files Create srcadr and srcdb files Create startadr and startdb files Reference ADR900 Reference Manual Programmer s Guide to the Hardware For programming flexibility memory test pattern programming is done in four databases Each database has a specific purpose and they can be used in various combinations Each database type also has a unique file extension qo Pattern Control RAM PCRAM Subroutine Vector Memory SVM database this database is used to program SVM hardware including pattern controllers algorithmic memory pattern generators MPG and pin state data vectors File extensions for this database are svmadr svmdb Data Generator database this database is used to program MPG data generator hardware including data set RAM and data generator selections for device pins File extensions for this database are dgenadr dgendb Source Select database this database is used to program pin state data source selection hardware The source select hardware is used to determine which pin data sources affect the pin s state File extensions for this database are srcadr srcdb Pattern Start database this database is used to program pattern start conditions including pattern locations SVM address and which pattern controllers main or alt File extensions for this database are startadr startdb June 1995 1 8 1 Creating Pattern Database Fil
153. b_restore_all_vs This function restores all VS levels that were stored during the Tlib_save_all_vs call The user will get an error if he tries to restore levels that were not previously stored Tlib_trap Pattern This function can be used to trap on a certain function name just after the program runs the pattern generator burst so that the user can examine the burst more closely Tlib_pmu_check_irange TT_RANGE irange This function returns the current range used by the PMU It returns a default range if the range passed to it is illegal This function is used in PMU templates to verify that the user s current range is correct Tlib_pmu_check_vrange TT_RANGE vrange This function returns the voltage range used by the PMU It returns a default range if the range passed to it is illegal This function is used in PMU templates to verify that the user s voltage range is correct 3 2 30 June 1995 J990 Series Programmer s Manual Customizing Templates Tlib pin pmu check _irange TT RANGE irange This function returns the current range used by the pin PMU It returns a default range if the range passed to it is illegal This function is used in pin PMU templates to verify that the user s current range is correct Tlib_setstop Label stoplabel This function inserts a stop opcode in the vectors at the label stoplabel passed to the function It is used to run a patgen burst up to the point the device is preconditione
154. begins Run and Debug the Program Use the 1G900 Executive to run the test program set up test result datalogging evaluate the results and view summary data The 1G900 Tools can be used to help debug the program by modifying databases in the job re executing tests characterizing device specifications and so on June 1995 Programming Overview J990 Series Programmer s Manual Creating Database Files Several of the files that make up the test program are database files Typically database files are created as ADR files then translated to create binary database files for the test program Any database file can be created with this method using a standard text editor vi textedit etc or using the ADRedit tool Some types of binary database files can be created directly using G900 tools Standard Text Editors vi textedit tool etc O can create all ADR database file types ADRedit tool O can create all ADR database file types O can create all binary database types by direct translation of ADR files Specsheet tool O can create specadr and specdb files Specification databases Calcsheet tool O can create leveladr leveldb waveadr wavedb files Level and Waveform Equation databases Patedit tool can create svmadr and svmdb files Pattern Control databases Insted tool O can create insadr files Instance databases 1 1 4 June 1995 J990 Series Programmer s Manual Programming Ove
155. bugging to be completed before test system time is consumed 7 1 10 June 1995 J990 Series Programmer s Manual Programming Overview Subsequent Chapters Each chapter of this document describes one step in the process of developing the device test program For the purposes of this manual these steps are 1 Create a pin database 2 Create a channel map database 3 Create a MUT database 4 Create the specification databases 5 Create the level databases 6 Create the waveform databases 7 Create the pattern databases 8 Create the calibration conditions database 9 Create instance databases 10 Create the program flow file 11 Create the workspace database 12 Create the program Makefile 13 Load and run the test program 14 Debug the test program June 1995 1 1 11 Programming Overview J990 Series Programmer s Manual Additional Reading and Reference Material Teradyne Documentation The following manuals are additional Teradyne documents that may be of special interest to the programmer J990 Series User s Manual 1G900 Tools Manual ADR Reference Manual AT900 Compiler Manual Templates Reference Manual Access Reference Manual Sun Documentation 560 253 01 SunOS V4 1 1 Beginners s Guide Note Sun Microsystems offers a full array of documentation and updates for its products A complete list may be obtained through Sun Microsystems Inc Other Books C by Dissection The Essentials of C Programming
156. cally named main t but any acceptable UNIX name can be used The main flow often contains program documentation and revision history notes The flow control module is created with any standard text editor It is then compiled by the AT900 compiler generating an object module which is linked into the program June 1995 1 12 1 Creating a Flow Control Module J990 Series Programmer s Manual Contents of Flow Control Module There are only two requirements for the main flow control module 1 It must include the standard Teradyne header file teradyne h include lt teradyne h gt This header file defines structures and macros which can be used in any AT900 language module 2 It must contain the function job main job_main lt flow code gt Inside the job_main function the programmer can execute any AT900 statement use most AT900 macros including execution of test instances and call other C or C functions The main function typically seen in C and C programs is reserved and controlled by Teradyne This code is executed when the test program is loaded It is the user function job_main which gets executed when the test program is run Typically the flow control module executes instances and makes branching decisions based on their results including sorting and binning Executing Instances Instances are first imported using the import statement outside of the job main function The EXECUTE ma
157. captured in the fail map memory to the display RAM The scan pattern runs left to right and top to bottom over the specified rectangle The format of this command is tt_mfp_scan_fmm_dr rectp do_clear The rectp argument is a pointer to a rectangular image of the device to scan The rectp is a tt_mfp_rect type The do clear argument is zero the display RAM will not be cleared prior to a scan If do_clear is any other value the display RAM will be cleared before scanning The default is to clear the display RAM before scanning non zero If the default condition is desired this argument can be omitted tt_mfp_set_topo_block tt_mfp_rect Macro Definitions The syntax of this function call is as follows F Selects which block of the topological invert RAM will be selected for use NOTE High level MFP always programs and uses block 0 Bus is defaulted and may be omitted extern int tt_mfp_set_topo_block int block int bus TT_MFP_ADS TT_MFP_ADW The tt_mfp_rect structure is defined as follows struct tt_mfp_rect int horz int vert int height int width In addition to the types described above the following macros are also used with the MFP high level function calls F Value returned if Display Processor fail counter overflows define TT MFP_FAIL_ CNT OVERFLOW OxffffffdG define TT MFP_ADS 1 define TT MFP_ADW2 define TT MFP_X_SCRAM 0 define TT_MFP_Y_SCRAM 1
158. ccomplish a single operation such as setting up for capture Chapter 4 4 Memory Fail Processing Low Level Programming describes in detail the ADR syntax and use of the translators June 1995 J990 Series Programmer s Manual Memory Fail Processing Overview Hidsets Hidsets hardware load driver sets provide grouping within the MFP ADR file of related hardware areas For instance in the setups generated from template input one hidset contains scramble RAM contents multiplexer settings and ADS assignments since all of these things are interrelated When you wish to create an ADR file from scratch you can group things any way you want within the constraints of the transfer types available in the tt_mfp_job h file That is because it is not possible to assert scramble RAM contents without programming multiplexers etc there is a transfer type named TT_MFP_HLD_TYPE_SCRAM which groups together such items Likewise those same forms should be grouped together in a single hldset since they need to be asserted together Setup Generation and Interactive Modifications MFP Workspace Requirements tt_mfp svmadr changes Setup generation occurs at first run time That is the first time you use a particular setup instance a lot of computation is done including the building of software caches to speed up subsequent calls This process takes awhile the first time you run the program but all subsequent executions are very fast The
159. ce Data is inverted when the quoted expression is true This expression is a function of physical row and column bits If no data inversion is needed on the data pins 0 or nil must be specified for the pin checkerboard data invert based on phys row bit 9 and col bit 8 data map data form pin physical DOS pr9 pc8 In addition this statement is needed to tell the job exec which pins are data pins The function is a quoted string and evaluated by the database in the same manner as equations are handled 1 4 8 June 1995 J990 Series Programmer s Manual Creating MUT Database Files Mutaar File Example 32Kx8 SRAM use pinset pins_s32Kx8 pindb pinset_s32Kx8 address scrambling with no topo invert mutset mut_s32Kx8 size swords 32768 width 8 shape rows 256 columns 128 address map function form physical pin pro A12 pr1 A7 pr2 A6 pr3 A5 pr4 AO pr5 A10 pr6 A9 pr7 A11 pc0 A8 pcl A13 pc2 A14 pc3 A4 pc4 A3 pcs A2 pc6 Al data map data form physical pin o DOS June 1995 1 4 9 Creating MUT Database Files J990 Series Programmer s Manual Pin Suffixes For Specifying Multiplexed Address or Data The address identifiers will be used to specify the address information to appear at the pin In the case of address multiplexed devices two pieces of address information will need to appear at the pin A pin suffix notation is
160. ce is to add the pattern to an existing mpgset then create a pattern startset in the Start database Once the pattern has been created it is added to the job workspace 1 8 22 June 1995 J990 Series Programmer s Manual Creating Calibration Database Files Introduction Chapter 1 9 Creating Calibration Database Files Objective Create caladr and caldb files Reference ADR900 Reference Manual AEL Reference Manual Calibration for J990 series test systems is controlled by system software called AEL Automatic Edge Lock AEL uses TDR techniques to program ramp slopes DC correction values and deskew DACs to compensate for variations in circuit components and channel path propagation Calsets allows AEL to calibrate some system resources to the specific requirements of the test program Every test program needs at least one calset to guide AEL to its optimum calibration Calsets calibrates the following parameters O timing deskew for dO d1 d2 d3 d4 d5 O strobe modes edge and window for c1 and c2 O multiplexing odd and even channels O multiplexing within the formatters O DC levels VIH VIL etc Up to fifteen calsets can be programmed for a given test program however only one calset is in effect at any given time The other calibration values will be stored until needed Note however that each calset adds to total calibration time Therefore do not put unnecessary calsets in a test program June
161. ch patgen cycle as being broken into an early half and a late half All the bits generated from the main MPG are the address and data for the early half of the cycle and all the bits generated from the alternate MPG are the address and data for the late half of the cycle Figure 5 1 2 illustrates this concept VIH VIL Late Half Addr amp Data from Main MPG Addr amp Data from Alt MPG Early Half Figure 5 1 2 Dual MPG with RC RC The second requirement of dual MPG is to drive or compare both bits of address or data in the same cycle on the same channel This is accomplished by using format muxing on drive only channels and channel muxing on IO channels Figure 5 1 3 and Figure 5 1 4 illustrate the concept in reference to dual MPG mode VIH Address VIL Figure 5 1 3 A C Format Muxing for Dual MPG with RC RC 1 RC Return Complement June 1995 5 1 3 Using Dual MPG Mode J990 Series Programmer s Manual Primary Channel s Data Secondary Channel s Data VIH VIL do di d2 do di d2 d3 d3 d3 do mux mux Figure 5 1 4 IO Channel Muxing for Dual MPG with RC RC Database Conversion pinaar Given this description of dual MPG operation certain test program databases must be converted to allow the test program to run in a dual MPG mode The following is a list of the databases which must be altered followed by a description of what needs to b
162. ching modes also known as zstate selection which is selected prior to running the patgen zstate d0 IO switch time at dO For cycles with the comparator enabled the driver will switch off go to HiZ at the dO edge time For cycles that are not comparing the driver will switch on at dO The dO edge can be placed anywhere in the cycle strobe Drive Cycle Compare Cycle Figure 2 1 27 Zstate d0 Waveforms zstate d3 10 switch time at d3 For cycles with the comparator enabled the driver will switch off go to HiZ at the d3 edge time For cycles that are not comparing the driver will switch on at d3 The d3 edge can be placed anywhere in the cycle strobe Drive Cycle Compare Cycle Figure 2 1 28 Zstate d3 Waveforms 2 1 30 June 1995 J990 Series Programmer s Manual Programmer s Guide to the Hardware zstate d0 off d3 IO switch time at d0 and d3 For cycles that are designed as drive the driver will switch on drive at d0 edge time and off go to HiZ at the d3 edge time For cycles that are not driving the driver will remain at HiZ i l dO di d2 ct c2 l l l l Valid HiZ A A Data strobe Drive Cycle Compare Cycle Figure 2 1 29 Zstate d0 off d3 Waveforms zstate d3 off d2 IO switch time at d3 and d2 For cycles that are designed as drive the driver will switch on drive at d3 edge time and off go to HiZ at the d2 edge time For cycles that are not driving the driver will remai
163. contains instances for each test Instances can be created either with an IG900 tool called Insted or with a text editor and ADR syntax For a discussion of how to use Insted see Chapter 1 11 June 1995 Using Templates J990 Series Programmer s Manual Basic Steps The basic steps to creating instance database files are 1 Decide what tests must be done 2 Decide which templates provide the test methodology to perform the test 3 Use ADR syntax or the 1G900 tool Insted to create the instances and instance database files Instance database files do not have to be translated with the adr900 command To run instances in a job a workspace file must be created with the following in its group statement O The instance database file name listed in the job clause of the group statement For more information regarding workspace and the group statement see Chapter 1 10 In addition to this the flow control file main t must include calls to the instances that you want to run ADR Syntax Instances are easily created using ADR syntax and an ASCII file Either a text editor or the ADRedit tool can be used The instance syntax is as follows define instance INSTANCE_NAME TEMPLATE NAME value PARAMETER DATA value PARAMETER DATA value PARAMETER DATA END DEFINE INSTANCE where define instance and value are reserved words PARAMETER is the reference to the template
164. cription mutset type name elements pattern march_patt march startset dram_patterns mpgset pattern_data dgenset srcset srcset d1Mx4 mutset A test program job is created by grouping any of the databases and objects together type name elements job Dx4J wave_timing_70ns waveform nominal_levels level march_patt pattern diMx4_pins pinset d1 1Mx4j_chans chanset dx4 insadr insadr j997 templates libtemplates o j997 etc exec_instances insadr j997 lib libexec_templates o main o flow tflags lflags Test programs that use templates will always contain the template library object module for example j997 templates libtemplates o For software version A2 00 the executive instances and templates for summary and datalog also need to be specified j997 etc exec_instances insadr and j997 lib libexec_templates o All test programs must contain flag objects a pinset a chanset and an executable module that contains job_main function June 1995 1 10 5 Creating Workspace Database Files J990 Series Programmer s Manual Procedure for Creating Workspace Database Use the following procedure to create a new workspace database for a test program This procedure will utilize all of the databases and modules in a specific directory to create a job 1 2 3 4 5 Make sure all required databases and modules exist in a single directo
165. cro is used inside a function to actually execute the instances Instances are defined in the instance database and essentially represent one call to a test template The instance will automatically be assigned a result 1 12 2 June 1995 J990 Series Programmer s Manual Creating a Flow Control Module Branching and Flow Control Based on Test Results The result from the instance can be used to affect the program flow This is accomplished with the FAIT DO and PASS_ DO macros These macros are used to execute a block of code on those devices which passed or failed an instance Program statements inside of a FAIL_DO block will be executed on those sites devices which failed the specified instance Program statements inside a PASS_DO block will be executed on those sites which passed include lt teradyne h gt import Instance funct test job_main EXECUTE funct _ test FAIL DO funct test statements executed on devices which FAIL PASS _ DO funct_test statements executed on devices which PASS The statements inside the FAIL_DO and PASS_ DO blocks are conditional If all devices pass then the code within the FAIL_Do will not be executed The parallel job executive automatically keeps track of those devices which passed or failed an instance It maintains a current siteset which is a list of sites that are considered active For example if a test program had been set up to run on
166. d be within the ranges specified in the device data sheet For devices that must be tested for output leakage or hi Z output leakage input current values should be used unless separate output and hi Z output current values are specified by the manufacturer s data sheet 3 1 24 June 1995 J990 Series Programmer s Manual Using Templates System PMU Resources The DC measurement system provides both a system PMU and a pin PMU capability either of which could be used to perform the input and hi Z leakage tests Because of its greater speed accuracy and true parallel measurement capability however the pin PMU is recommended over the system PMU where possible Let s look at these resources one at a time starting with the system PMU System PMU The system provides general parametric capabilities the ability to force voltage and measure current or force current and measure voltage through a system or central PMU The system PMU can force and measure voltages within the following ranges System PMU Voltage Force and Measure Ranges 2 V 20 V 40 V The system PMU can force and measure currents within the following ranges System PMU Current Force and Measure Ranges 2 uA 20 uA 200 HA 2 mA 20 mA 200 mA The force and sense lines of the system PMU can be switched to any channel of the test system through the FET matrix The voltage and current ranges available through the FET matrix are limited and the meas
167. d low voltages Can be used for more complex leakage tests Performs a voltage source current monitor test allowing for selection of pattern burst before and during a test and specification of pins to be grounded or open This template is often used for Icc operating tests Performs a voltage source current test by using the PMU connected to a VS pin A pattern can be run before and during the test This template is often used for Icc standby tests where the extra resolution of the PMU is desired datasheet_Template Performs an Adjust Until on a spec in an attempt to find the pass fail boundary Used for parameter characterization tests The spec can be characterized for a list of reference values such as Vcc 1 11 4 June 1995 J990 Series Programmer s Manual Creating Instance Database Files Using Insted The Instance Editor Insted provides editing capability for instances by accepting templates then providing a fill in the blank method for specifying parameters It checks to make sure all required parameters have been specified then creates the instance database file The view button in the main display window Insted Manager Display summons the templates list subwindow and the tree display subwindows Either subwindow can be used to view the existing instances in the database The tree subwindow does not illustrate flow but does show the relationship between templates and their instances Insted Manager File 7 Vie
168. d to the correct state for the intended test It is used in the standard Teradyne templates in the pin PMU and system PMU templates to designate a stopping point in the startpat vector burst at which measurements can be made Tlib_clearstop This function clears the stop opcode from the vector setup by the last Tlib_setstop function call Tlib_get_time This function is used to read back the current time The function returns the current time as an integer number of seconds It can be used to measure elapsed time as in the following example int starttime stoptime lapsedtime starttime Tlib_get_time stoptime Tlib_get_time lapsedtime stoptime starttime Tlib_start_timer This function declared in Tlib_time h is used to start the utility timer which produces a higher resolution time measurement than Tlib_get_time Tlib_stop_timer This function is used to return the elapsed time on the utility timer since the Tlib_start_timer Call June 1995 3 2 31 Customizing Templates J990 Series Programmer s Manual Important Coding Tips There are several important items to consider in coding a custom template This section provides some general observations For Loops When using for loops to increment variables of various types use the template macros HASVALUE and NEXT For example Pin P for P floatpins HASVALUE P NEXT P Tlib_unfloatpins In this
169. d12s6 395 d14s7 451 d12s7 June 1995 1 3 11 Creating Channel Database Files J990 Series Programmer s Manual 1 3 12 June 1995 J990 Series Programmer s Manual Creating Channel Database Files i June 1995 1 3 13 Creating Channel Database Files J990 Series Programmer s Manual 1 3 14 June 1995 J990 Series Programmer s Manual Creating MUT Database Files Introduction Chapter 1 4 Creating MUT Database Files Objective Create mutadr and mutdb files Reference ADR900 Reference Manual The MUT database file contains a description of the memory under test This description includes the device size shape topology internal layout address scrambling topological data inversion and defines what information is to appear on each device pin The MUT database is designed so that the programmer can describe the device in familiar terms that are not necessarily specific to the hardware Typically a programmer can create the MUT description using a device block diagram a diagram of the memory array layout topology and an address scrambling scheme The MUT database is used by the job exec to program the address scrambler and select specific address bits to drive the address pins on the device The MUT database can be created using one of two methods O Create an ADR file mutadr containing the mutset statement using a text editor then translate the ADR file into binary database file mutdb using adr900
170. d1Mx4_analyzer_list 6 5 8 12 16 int diMx4 ra error counts 6l int head 0 tt_mfp_get_ra_ error _ count diMx4_ ra _ error _counts diMx4_analyzer_ list head tt mfp get ra region count This function call fetches the redundancy analyzer region counts for the analyzers specified in the analyzer_list flex array Results are returned in a flex array ra_region_counts The format of the function call is tt_mfp_get_ra_region_count ra_region_counts analyzer_list head The ra_region_counts argument is a flex array in which the error counts will be 4 3 12 June 1995 J990 Series Programmer s Manual Memory Fail Processing High Level Programming stored This flex array must be equal in size to the analyzer_list see example for tt_mfp_get_ra_error_count above The analyzer_list is the name of a flex array that contains a list of the redundancy analyzers to be used This list of redundancy analyzers is sometimes referred to as a RIK or redundancy analyzer index key The head argument is used to specify which head is to have its errors read back The head argument is an integer of value 0 or 1 Only one head can have its errors read back at a time tt_mfp_set_ra_all_rik This function sets the redundancy anayzers s all RIK for the specified head A RIK is a redundancy analyzer index key A RIK is a flex array used to specify redundancy analyzer numbers The all RIK is the default RIK used by oth
171. db files The high level function calls assert hardware load driver sets hldsets to accomplish many of their functions These hidsets part of the MFP databases and thus subject to editing using ADR translators can be programmed independently with either the high level or low level programming approach These functions are declared in the tt_mfp_job n file Note Devices for which the number of outputs is not a multiple of 2 such as by 9 devices cannot use the high level programming approach These devices should use the low level programming approach described in Chapter 4 4 Memory Fail Processing Low Level Programming June 1995 4 3 3 Memory Fail Processing High Level Programming J990 Series Programmer s Manual Job Driven Bitmapping Flow The job driven bitmapping approach is illustrated in the following flow map_ pseudo sites f do_clear capture_setup one or more functional tests or instances of functional test templates capture _ complete tt bitmap _ save or tt bitmap save all Figure 4 3 2 Job Driven Bitmap Flow 4 3 4 June 1995 J990 Series Programmer s Manual Argument Types Memory Fail Processing High Level Programming A discussion of each function and its arguments follows First some argument types declared in tt mfp_job h and tt_mfp_types h used in many of the function calls need to be discussed TT_MFP_OP_TYPE One argument type
172. ddr 6 A D gt A3 4 7 PAS 20 23 A3 3 Ik 1 is 0 3 TA3 16 19 Addr 10 Clk 4 4 Functions X 4 Sites 640 Chans on 40 brds stn 3 more boards Figure 2 1 41 Example Drive Only Function Assignments for 32 Sites 2 1 48 June 1995 J990 Series Programmer s Manual Programmer s Guide to the Hardware Drive Only Channel Functional Description Each Drive only channel can be programmed independently This includes O Driver levels Drive Voltage High Vih Drive Voltage Low Vil O Device Under Test connect to isolate device pin O Functional connection to driver comparator circuit Measurement connection to Pin Site PMU System PMU and Cal matrix The J997 drive only channel has the Pin PMU just like the IO channel The J994 system has a site PMU which can connect to each drive only pin that is part of a particular hardware site The system PMU is available on all systems however for the J994 only the system PMU can only be connected to the drive only channels through the FET matrix the relay matrix cannot be used The channel is designed for a 50 ohm environment to assure signal fidelity The channel drive data changes on the fly while the patgen is running and all other functions are set using the databus The driver range is selected using the system databus and should be programmed prior to starting the patgen One of the following ranges must be selected O 4V to 5V O 3Vto 6V O 2V to 7V The system sho
173. device sites O Drive only channels should be assigned to each device pin to permit easy sequential wiring of the channels For example if device pins 1 and 2 were to be connected to drive only channels it makes sense to connect these to drivers 0 and 1 since these channels are adjacent on the interface board and in the test head Having a test head stuffing sheet available helps to choose signals that are adjacent in the test head O Select the sites of the drive only channels to be consistently connected to the device site For example driver 0 site 0 and driver 1 site 0 should go to the same device site Driver 0 site 1 and driver 1 site 1 should go to the same pins on a different site Once the list of signal names is assigned to the device pins use the signal name to channel number tables Tables 1 and 2 which follow to determine which channel numbers to specify in the chanadfr file Use the tables at the end of this chapter to determine signal names from channel numbers and vice versa Keep in mind that channel numbers represent a location on the interface board and do not correspond sequentially to the signal names Also not all channel numbers are used for a particular system type For example the J997 does not use channel numbers 16 through 23 These are unused locations on a J997 interface board When first writing a program it may be useful to start with a hypothetical channel database especially if a
174. dflags include g The flag objects are given names so they can be included in the job flag flag form name elements type tflags m tldflags lflags Sg ldflags group and group form statements The group and group form statements create higher level objects that consist of multiple things For example a level object consists of an equation set eqset and a specification set specset The job is also defined as a group object since it consists of multiple databases and executable modules Typically databases and modules are first grouped together to create objects waveform level pattern and these objects are then grouped to create a job group group form type name elements waveform WT ss 1 level L1 area pattern Pl rss job Jobname L1 WT Pl chanset pinset main o Waveforms are created by grouping a waveform equation eqset with a specification set specset type name elements waveform wave_timing_70Ons timing_70Ons spec_wave_eqns_1 1 10 4 June 1995 J990 Series Programmer s Manual Creating Workspace Database Files Levels are created by grouping a level equation eqset with a specification set specset type name elements level nominal_levels nom_levs levels_eqns Patterns are created by grouping Pattern control mpgset Data generator dgenset Source select srcset Pattern start conditions startset and a Memory under test des
175. e bus mux AO ads 0 BO ads sec ai rfl bus form board upper bus lower bus A ads ads B sec ads hldset namel set type scan main comment set 2 4 4 14 June 1995 J990 Series Programmer s Manual Memory Fail Processing Low Level Programming Hidset Statement There may be multiple hidset statements in one database but only one hidset may be of set type capture main while there may be many set type scans The following is an example hldset name set type capture main comment set 1 capture patgen mode 100MHz sat Required fields include hldset name The other optional fields are O set type may be capture main capture catchram topo invert scan main clear scan catchram or display processor O comment may be any quoted string O capture patgen mode may be quoted 100 MHz 60 MHz or 50 MHz Default Statements Default statements can precede any sub statement within an hldset If a default statement is not present and a hardware programming statement does not include a specific item to be programmed that hardware will not be touched One exception default is the bus statement which designates a target piece of hardware If none is mentioned then ADS SEC will be assumed inmux form The inmux form is used to program the scramble RAM input multiplexers Any multiplexers not programmed will be set to ZERO by
176. e 1995 J990 Series Programmer s Manual Creating MUT Database Files address map function form pro AO prl Al pr2 A2 pr3 A3 pr4 A4 pr5 A5 pr6 A6 pr7 A7 pcO A8 pci A9 pc2 A10 pc3 A11 pc4 A12 pc5 A13 pc6 A14 map value form This table defines address scrambling by explicitly listing values that are to appear atthe pins The user lists the address pins and scrambled pin values under the pin header the physical address identifiers and values in sequence under the physical header and the resultant scrambled pin address values Pin names and address identifiers are always listed in MSB to LSB order for binary decoding of a value list address map value form row address scrambling physical pin pr3 pr2 pri prod A3 A2 Al AO 0 15 15 13 T1 9 7 5 3 1 0 2 4 6 8 10 12 14 map value form col address scrambling physical pin pc3 pc2 pel peo A7 A6 A5 A4 0 15 0 2 4 6 8 10 12 14 TS 13 10 9 7 5 SL June 1995 1 4 7 Creating MUT Database Files J990 Series Programmer s Manual data The data clause contains a map data form table to define the topological data inversion on a per pin basis This clause is required and must include all pins that will receive data from the data generator map data form This table defines the data inversion topological invert and multiplexing of data information through the use of an expression function for the devi
177. e Only Channel Configuration for More than 8 Sites J997 or J993 When more than eight sites are being tested 20 functions are available In this case half of the 40 functions are providing the same signal as the other half The assignment of which channels will have the same function is up to the programmer There is no hardware requirement in this area This choice can be made with the interface requirements in mind Drive Only Channel f WaveGen Board Site0 Site1 Site4 Function Site2 ses ADDRO Sites Pr ee SiteO Function Sitet Site4 WE Site2 Sites Site6 Site3 Site7 Function Ser ADDR1 Drive Only Channel Board Drive Only sites 0 3 Channel Board Function sites 4 7 oe Sited EE Site1 Site4 Function Site2 Site5 WE Site3 __ Site6 Site7 SiteO Function Sitet Site4 Site6 Site3 gt Site7 Function ADDR1 Drive Only Pe he Channel Board Drive Only sites 8 11 Channel Board Function sites 12 15 OE Figure 2 1 39 Example Drive Only Function Assignments for Sixteen Sites The selections of which site drivers go to each device site is up to the programmer For example the site 0 driver signals can be connected to device site 5 This means the definition of the site is controlled by the software not the hardware 2 1 46 June 1995 J990 Series Programmer s Manual Programmer s Guide to the Hardware Drive Only Channel Configur
178. e all start cycles the same for both heads The headmask argument may be omitted tt_mfp_set_ra_stop_cycle This function sets the RA stop cycle value for all analyzers specified in the analyzer_list flex array The format for this function call is tt_mfp_set_ra_stop_cycle cycle analyzer_list headmask The cycle argument is the stop cycle value The analyzer_list is the name of a flex array that contains a list of the redundancy analyzers to be used This list of redundancy analyzers is sometimes referred to as a RIK or redundancy analyzer index key For an example of how to create a flex array see the tt_mfp_create_crik discussion on page 4 3 11 If NULL is June 1995 4 3 15 Memory Fail Processing High Level Programming J990 Series Programmer s Manual tt mfp set es tt mfp get es specified instead of the name of analyzer list then the current the current RA all RIK will be used see the tt_mfp_set_ra_all_rik discussion on page 4 3 13 Note that if an analyzer_list is specified the RA all RIK will be set to the value of the analyzer_list once this function call is executed The analyzer_list defaults to NULL and may be omitted The headmask argument specifies which head the function call applies to The headmask argument may be O 1 head 0 only 01 Ol 2 head 1 only 10 O 3 headsOand1 11 The default headmask is 3 which will set the all start cycles the same for both heads The headmask arg
179. e an ADR file waveadr containing the pins patgen and eqset statements using a text editor then translate the ADR file into binary database file wavedb using the ADR900 translator 1 Use the ADRedit tool to both create and translate the ADR file m Use the Calcsheet tool to create binary database files wavedb O Use the Calcsheet tool to create an ADR database file waveadr and manually translate it to create the binary Either of the first two methods is recommended for beginning programmers June 1995 1 7 1 Creating Waveform Database Files J990 Series Programmer s Manual Edgeset Waveform Values Equations Patgen Mode Specification Equation Databases Databases Figure 1 7 2 Relationship of Waveforms Equations to Hardware and Software Contents of the Waveaar File use pinset statement patgen statement pins statement The waveform database is defined with the ADR pins patgen and eqset statements inside a waveadr file Only one set of statements is allowed per file The use pinset statement must appear before the waveform definitions The use pinset statement effectively declares the pins that can be manipulated by the database file This declaration must appear before any other statements in the file The patgen statement establishes the patgen frequency mode that this waveform will operate under This is typically 60MHZ or 100MHz The pins statement defines the modes in whic
180. e are usually used for preconditioning and post processing of results The prebody_function and postbody_function for the demo program is located in the support_modules t file This prebody_function starts a timer to time how long it takes the instance to execute The postbody_function stops the timer and prints out the amount of time it took to execute the instance Using The Continuity Instance To use this instance import it into your main t file For example import Instance init_program_variables continuity Next include the instance in your test flow For example June 1995 3 1 11 Using Templates J990 Series Programmer s Manual EXECUTE basic _ functional FAIL DO basic_ functional EXECUTE continuity FAIL DO continuity sort_bin FAIL_CONTIN PASS_DO continuity sort_bin FAIL BFUNC This section of the main t program checks continuity with both the functional test system hardware and the PMU The first line executes an instance called basic_functional The basic_functional instance is discussed in the next section of this chapter This instance runs a simple march diagonal pattern If the functional tests complete without failure no continuity tests will be executed The FAIL_DO macro begins a loop which will execute the continuity template Note that FAIL_DO and PASS_ DO are two other macros often used in conjunction with EXECUTE to apply instances FAIL_DO
181. e changed in each pinadr mfp insadr Srcadr caladr chanadr waveadr svmadr wspadr Every IO pin on your device will now require two IO channels This is because channel multiplexing will be used to output the two bits of data in one cycle Each secondary channel s pin name must have a different name than it s primary counterpart but the last digit must be the same for both the primary and the secondary so that the FVM fail vector memory will denote failures from either channel as being from the same device pin For example a pin named DQO in a single MPG environment will now also have a secondary pin named DQ_0 For programming purposes think of this secondary pin in terms of timing control for the late half of the cycle In fact all input and output will take place on the primary pin s channel June 1995 J990 Series Programmer s Manual Using Dual MPG Mode chanadr mfp insadr For each of the pins in the pinadr file a corresponding channel must be assigned to it in the chanadr file Due to the hardware restrictions of channel muxing IO channels must be chosen using the following guideline Each set of two muxed 10 channels must be adjacent channels where the primary channel is an even numbered IO channel and the secondary channel is the next odd channel The name of the secondary IO channel must be different from the name of the primary IO channel and the last digit must be the same for both the primary a
182. e condition for which calibration should be optimized This is a choice among d0O_patgen_freq d0_drive d3_drive and d3_mux_surround These are selected based on the application In this example d3_drive is optimized This means that AEL would optimize for the d3 edge on an lO channel The d3 edge is used to change the IO channel from drive for writing data to the DUT to HiZ for reading data from the DUT Strobe can be window or edge Here edge is selected Three headers can be omitted from the defaults or the cal form clause in a caladr These are chan mux optimize and strobe If these headers are omitted AEL will not optimize these selections to the specifics of the test program 1 9 4 June 1995 J990 Series Programmer s Manual cal form cal form Creating Calibration Database Files pin SL ayallar EME MUSS CLKS ORO 80 off ADDRS 070 S40 on pin Syal VAN strobe optimize DOS 0 0 B0 edge d0_drive d3_drive The cal form clause completes the calset DQs clocks and address pins are all included in the pins list in the cal form clause The VIL and VIH values even though defaulted earlier are specified again in the cal form The new specifications override the default The VIL and VIH values are the same as the defaults in the first calset this is to be expected for the nominal_level_cal calset For a case where the VIH and VIL values are different see the spec_level_cal calset For cloc
183. e defaulted stop may be 0 through 65 535 May be defaulted fault addr may be a value from 0 through 16 777 215 error counter may be a value from 0 through 4 294 967 295 Ooo Oo 0 cycle counter may be a value from 0 through 4 294 967 295 June 1995 4 4 23 Memory Fail Processing Low Level Programming J990 Series Programmer s Manual ra or mode The ra or mode statement is used to program analyzer or modes The following is an example ra or mode or4 Required fields include or mode O or mode may be or2 or4 or10 or20 or orall 4 4 24 June 1995 J990 Series Programmer s Manual Using Dual MPG Mode Introduction Chapter 5 1 Using Dual MPG Mode As the speed of memory devices increases it becomes necessary to take advantage of tester modes that allow increased pattern testing speeds One such mode of operation is the Dual Memory Pattern Generator mode or dual MPG mode This mode allows the user to take advantage of a second Memory Pattern Generator MPG to generate device addresses and data at twice the tester s pattern generator frequency Dual MPG capabilities can be used to increase device test speeds and to test dual port RAMs Many have referred to this operating mode as dual patgen which is misleading The preferred terminology is dual MPG Dual MPG is a single pattern generator running a single pattern at twice the patgen frequency Dual pa
184. e eight states can be programmed to ignore the ADS inputs Also the ignore ADS bits are selected by the pattern independent of the source selections In this way states that are independent of the ADS data can be reliably selected Table1 8 2 on page 1 8 7 provides a list of recommended source selections Table 2 1 5 Example 10 Channel Source Select Bits Assignment Bit Assignment SVM SVM ADS 10 Channel State Bit 2 Bit 1 Bit 0 0 0 0 Drive 0 0 0 1 Drive 1 0 1 0 Expect Midband 0 1 1 Expect Valid 1 0 0 Expect Low 1 0 1 Expect High 1 1 0 Hold Window 1 1 1 Don t Care HiZ 2 1 34 June 1995 J990 Series Programmer s Manual Programmer s Guide to the Hardware Source Selections for Drive Only Channels The drive only channels do not use an eight state model They do however use source select RAM to determine if the source is the ADS bus SVM or logic 0 or their inverts The drive only channel formatters are divided into two halves the X half and the Y half Figure 2 1 32 shows the source select hardware for a drive only channel Both halves of the formatters are used when format multiplexing For non format multiplexing only the X half is used Although there are three source select multiplexers only the first two are used for each half resulting in a total of four bits used altogether The X half uses bits 0 and 1 and the Y half uses bits 2 and 3 These bits describe the drive data at d1
185. e instance This can be in addition to or instead of using the autotitle feature described above Typically printing of titling information should be performed only in the TEMPLATE_PRE_BODY section For example TLIB_TITLE title standard Teradyne parameter names used This macro is used to call a function C function returning an integer after initial test command setup has occurred but before the actual test command action occurs The on condition setup will remain in effect until cleared in the TEMPLATE_POST_BODY section through a call to Tlib_pretest_clear which resets the function pointer to the function in effect before the instance was executed Typically setting up on_pretest conditions should be performed only in the TEMPLATE_PRE_BODY section For example TLIB_PRETEST pretest standard Teradyne parameter names used This macro calls a function C function returning an integer after an actual test command has occurred but before the value is datalogged and marked for pass fail The on condition setup will remain in effect until cleared in the TEMPLATE_POST_BODY section through a call to Tlib_posttest_clear which resets the function pointer to the function in effect before the instance was executed Typically setting up on_posttest conditions should be performed only in the TEMPLATE_PRE_BODY section For example TLIB_ POSTTEST posttest standard Teradyne parameter names used
186. e specified waveform and level then runs the specified patterns Allows for the option of executing a single test or a test after each functional pattern Recommended for functional testing where a device pass fail is needed 1 Substitute for x the name of your system as in j994 or j997 June 1995 1 11 3 Creating Instance Database Files J990 Series Programmer s Manual fvm _ setup Template pin _pmu_ Template pin_pmu_alternate_ ivs_ Template ivs_pmu_ Template This template specifies fvm conditions It allows the programming of the patgen stop mode These are a choice among stop on stop opcode only run all patterns to completion stop on stop opcode OR CR latch stop patgen if all devices fail stop on stop opcode OR FVM stop stop patgen when FVM is full Oo Oo Oo stop on stop opcode OR FVM stop OR CR latch O stop on stack error this is ina ddition to above entries Various FVM parameters can also be set These parameters include patgen pipeline length FVM storage mode store fails only or all vectors preview and postview number of vectors to be stored before and after a failing event and others Perform one or two DC parametric tests on one or more pins using the pin PMUs The template can provide a pattern run before and during a test Often used for device pin leakage tests Template Same as pin_pmu_Template except provides for the specification of two lists of pins for alternating high an
187. e who is programming instances will have to fill in the parameters listed unless marked optional The main purpose of the tdl file is to format the Insted editor window so that parameters are listed in a certain order determine what the required parameters are define the minimum or maximum value and determine whether there is a default value if no value is present in the instance of that template The syntax for the tdl file is as follows June 1995 3 2 3 Customizing Templates qd fin taste parm i al ol Hoi templat J990 Series Programmer s Manual jj one L er site R 1 bel see parm below ig h PARANAME DATATYPE INSTED_PROMPT choice default min max opti al optiona 01 Gl te i ik I CHOICE _PROMPT VALU CHOICE _PROMPT VALUE 1 VALUE 01 VALUE l 01 01 Figure 3 2 1 DEFINE TEMPLATE Syntax NAME A none update 1 0 01 3 2 4 June 1995 J990 Series Programmer s Manual Customizing Templates Note DEFINE TEMPLATE Statement contains the following NAME is the name of the template followed by a modifier that defines the type of result that will be received The options are as follows none The template returns no result one The template returns one result regardless of the number of devices being tested per site The template returns a result per site
188. eakage is current flow into the reverse biased diodes and input protection network connected to the gates in the device Typically the impedance through undamaged gates is high and input current values are correspondingly low often in the picoamp range A defective gate or input protection network however can cause excessive current to flow Input leakage tests look for excessive current through device input pins and I O pins in input mode Output current leakage is current flow through the diodes and output protection network if these exist Output leakage tests look for excessive current through output only pins High impedance or tri state output current leakage is current flow through output pins that have been placed in high impedance mode High impedance mode is sometimes called hi Z tri state or off state mode High impedance mode is an intermediate state between on and off Current flow in this state should be minimal since the presence of current either sourced or drained is an indication of output mode High impedance output leakage tests look for excessive current through I O and output pins in high impedance mode For all leakage tests either the system PMU or the pin PMU can be used to force voltages on pins equal to the minimum and maximum input voltage levels At these voltages worst case leakage will occur Current measured by the PMU at minimum and maximum voltages shoul
189. ecifies which head the function call applies to The headmask argument may be Ol 1 head 0 only 01 Ol 2 head 1 only 10 O 3 headsOandi 11 The default headmask is 3 which will set the all start cycles the same for both heads The headmask argument may be omitted tt_mfp_set_ra_start_cycle This function sets the RA start cycle value for all analyzers specified in the analyzer_list flex array The format for this function call is tt_mfp_set_ra_start_cycle cycle analyzer_list headmask The cycle argument is the start cycle value The analyzer_list is the name of a flex array that contains a list of the redundancy analyzers to be used This list of redundancy analyzers is sometimes referred to as a RIK or redundancy analyzer index key For an example of how to create a flex array see the tt_mfp_create_crik discussion on page 4 3 11 If NULL is specified instead of the name of analyzer list then the current the current RA all RIK will be used see the tt_mfp_set_ra_all_rik discussion on page 4 3 13 Note that if an analyzer_list is specified the RA all RIK will be set to the value of the analyzer_list once this function call is executed The analyzer_list defaults to NULL and may be omitted The headmask argument specifies which head the function call applies to The headmask argument may be O 1 head 0 only 01 2 head 1 only 10 O 3 headsOQandi 11 The default headmask is 3 which will set th
190. ect_level statement Typically selecting of new levels objects should be performed only in the TEMPLATE_PRE_BODY section This is not true for the corner_list_Template For example the following statement would be used to select the level TLIB_ LEVEL levels standard Teradyne parameter names used June 1995 3 2 23 Customizing Templates J990 Series Programmer s Manual TLIB_WAVEFORM This macro is used to select a waveform object It accepts an argument of type waveform an object defined in the workspace file This macro has built in error checking that makes it superior to the writesys select_waveform statement Typically selecting of new waveform objects should be performed only in the TEMPLATE_PRE_BODY section This is not true for the corner_list_Template For example the following statement would be used to select the waveform TLIB_WAVEFORM waveforms standard Teradyne parameter names used TLIB_AUTOTITLE TLIB_TITLE TLIB_PRETEST TLIB_POSTTEST This macro is used to cause automatic titles to print the template name and the instance name used in the test program datalog Typically printing of titling information should be performed only in the TEMPLATE_PRE_BODY section For example TLIB_AUTOTITLE autotitle standard Teradyne parameter names used This macro is used to print out any user defined string to label th
191. ed only in their ASCII form no db equivalents exist main t main o The main program flow is provided in files with this name Test instances are executed in the main file and binning and sorting is controlled from these files specadr specdb for DC conditions or levels Files with these extensions are specification database files which contain all the level specs and level values for the job Database objects defined within these files are called specsets leveladr leveldb Files with these extensions are level equation database files which contain the level equations for calculating the voltages and currents at the device pins Database objects defined within these files are called eqsets specadr specdb for AC conditions or timing Files with these extensions are specification database files which contain all the timing specs and timing values all dash numbers for the job Database objects defined within these files are called specsets June 1995 1 1 5 Programming Overview J990 Series Programmer s Manual waveadr wavedb Files with these extensions are waveform equation database files which contain the timing equations used to generate edgesets Database objects defined within these files are called eqsets svmadr svmdb Files with these extensions are patterns database files which contain all the patterns used by the program These include functional patterns march march diagonal address complement page
192. ed to drive only channels The channels in the test head are referenced by both signal names and test head channel numbers For example IO channel 0 is also test head channel 200 on the J997 In general it is a good idea to select channels based on their signal name Driver 0 site 0 or IO channel 12 etc instead of the channel number O Signal names reflect how the tester is organized IO channels 0 through 7 and Drivers 0 through 7 are the first channels stuffed into the system Channel numbers reflect a location on the interface board Not all systems will have all channel numbers available In addition there are guidelines for selecting each type of channel There is a Channel Selection Guide available which gives additional help and guidance when selecting appropriate channels IO channels are totally independent as each has its own timing format and PMU IO channels can be selected with a minimum set of guidelines The guidelines for selecting IO channels include O Start by selecting the list of IO channels to be used for the testing application For example if testing 8 devices 1Mx4 DRAMs then 32 IO channels would be needed IO channels 0 through 31 would be a logical choice IO channels should be assigned to each device pin to allow for the shortest possible path length to the pin This will minimize capacitance at the device output and reduce strobe restrictions relative to the HiZ drive transitions
193. edge in cycle n 1 In addition for address clocks in address mux mode the d5 edge of cycle n should not be within 5ns of the d4 edge of cycle n 1 For 100 MHz the d5 edge of cycle n should not be within 5ns of the d4 edge of cycle n 2 60 MHz Pattern Generator Mode Cycle n Cycle n 1 100 MHz Pattern Generator Mode Cycle n Cycle n 1 d2 n di n 2 gt 5ns Figure 2 2 5 The Minimum d2 to d1 Time 2 2 4 June 1995 J990 Series Programmer s Manual Timing Guidelines 6 The minimum compare to drive time for the I O channels is 4ns plus the round trip time of the DIB This is due to transmission line physics Cycle n Cycle n 1 C2 n dO n 1 gt 4ns lt _ DIB round trip time or first drive edge Figure 2 2 6 The Minimum Compare to Drive Time 7 For I O channels in edge strobe mode the c2 and c1 edges must be programmed to the same value 8 For I O channels in window strobe mode the minimum window strobe width is 1 75ns For the J994 the strobe width is 3 0 ns Therefore the minimum time between c1 and c2 is 1 75ns In addition the c2 of cycle n must be at least 6 5ns away from the c1 of cycle n 1 Cycle n Cycle n 1 ctfn c2 n ci n t gt 1 75 ns 4 gt 6 5ns __ _ Figure 2 2 7 The Minimum Window Strobe Width June 1995 2 2 5 Programmer s Guide to the Hardware Timing Guidelines 9 For lO channels in SCIO
194. els with a special format muxing flag and IO channels with a special channel muxing flag only the primary IO channels should be specified The patgen frequency again referring to the Pattern Generator Controller remains the same fmt mux An exampie caiset range level 2v 7v calset nominal_level_cal ifdef J997 patgen freq 100Mhz else patgen freq 60Mhz endif default Balk 0h O VATTO senan MUTORE sEMESMUXSO TE optimize d0_ drive strobe edge ae orEm pan Baba vih CLKS 0 0 San on ADDRS 0 0 S40 on cal form pain strobe chan mux DQS edge on wspadr The workspace should require no changes if you are already using MFP in your test program However if MFP has not yet been incorporated into your test program you must make the necessary additions See chapter 4 of this manual for a full description of how to incorporate MFP into your test plan 5 1 18 June 1995 J990 Series Programmer s Manual 1G900 Tool Support Several 1G900 tools have been enhanced to support dual MPG mode The following is a description of what these enhancements are and how to use them Patedit Patdebug Using Dual MPG Mode The only change to patedit is the addition of the field mpg alt and consequently all the MPG instructions for the alternate MPG by SVM address The information should reflect the information from your svmadr file As with the main MPG instructions the alternate
195. ends on the mode of the channel but in general terms the state of the channel is selectable on the fly For example the table below illustrates the available eight states for the IO channel when operating in the normal mode Table 2 1 4 Eight State Model Default Mode Programming State Description Symbol Drive Low Drive High Expect Midband Expect Valid Hold Window 2 3 4 Expect Low 5 6 7 M V L Expect High H W X Don t Care HiZ 2 1 32 June 1995 J990 Series Programmer s Manual Source Selections for IO Channels Programmer s Guide to the Hardware The three source bits that decode to one of the eight states can be selected using the source select RAM to come from either the SVM or ADS or they can be forced to be 0 This selection is up to the programmer Each of the three bits is individually selected on the fly by accessing a source select RAM SVM i Source Select i RAM l Pointer i Pin State Data 3 Source Selections Bit 0 IO Channel 8 State _ State np p Bit 1 Model Bit2 Inversion Figure 2 1 31 Source Select for IO Channels Figure 2 1 31 shows the source select hardware block for IO channels The hardware shown in the figure with the exception of the ADS bus is replicated for every IO channel Each IO channel can be programmed independentl
196. enerator To data o Second 950 662 02 for B path SCRAM 0 16Kx14 SEC BUS Address 14 Generator 1 SCRAM 1 Alt MPG 64Kx16 Data Topo RAM gt alt Generator 8 2 data 2 SSS SSS SSS SSS Second 950 662 02 for B path _ 6 6 Each of the two MPG s are capable of producing 32 address bits and two data bits After the bits are descrambled the ADS bus is used to route address bits from the main MPG and data bits from both MPG s to the appropriate drive only or IO channels The SEC bus is used to route only address bits from the alternate MPG to the appropriate drive only channels Notice that both MPG s are driven from a single Pattern Generator Controller board 950 561 00 and that twice the number of address and data bits are being generated in every patgen cycle Figure 5 1 1 Dual Patgen Overview 5 1 2 June 1995 J990 Series Programmer s Manual Using Dual MPG Mode The first requirement of dual MPG is satisfied by acquiring a Dual Memory Pattern Generator board 950 595 00 and a second Address Descrambler board 950 662 02 Note that four Address Descrambler s are required for the J997 The first MPG will be referred to as the main MPG and the second as the alternate MPG Each MPG generates a single address or data bit for every device input or output pin at every patgen cycle To help conceptualize dual MPG think of ea
197. equal to driver P driver1 If P has a value go to the next step if not go to line 63 HASVALUE P Select the next driver value NEXT P 59 writesys AT900 Set the driver mode to on for the pins specified by P or set_driver_mode P 1 drivert 60 writesys Set the driver initial logical level to 1 for the start of a burst set_driver_state P 1 Then go to line 58 and select the next driver value NEXT P 63 if HASVALUE driver0 C If the current instance has a driverO parameter go to the Macro next step if not go to line 69 64 driver0 HASVAL Define P as equal to driverO P drivero If P has a EXT P value go to the next step if not go to line 69 HASVALUE P Select the next driverO value NEXT P 65 writesys AT900 Set the driver mode to on for the pins specified by P or set_driver_mode P 1 driver0 66 writesys Set the driver initial logical level to 0 for the start of a burst set_driver_state P 0 go to line 64 and select the next driverO value NEXT P 69 if HASVALUE driveroff C If the current instance has a driveroff parameter go to the Marco next step if not go to line 74 70 for P driveroff Define P as equal to driveroff P drivero If P has a HASVALUE P NEXT P value go to the next step if not go to line 74 HASVALUE P Select the next driverof
198. er after the initial test command setup has occurred and before the test command occurs The on condition setup remains in effect until cleared in the TEMPLATE_POST_BODY section via a call to Tlib_pretest_clear which resets the function pointer to the function in effect before the instance was executed Typically the set up of any on_pretest conditions should be performed only in the TEMPLATE_PRE_BODY section 15 TLIB_POSTEST posttest Set up the calling of a function C function returning and integer after actual test command has occurred but before the value is datalogged and marked for pass fail The on condition setup will remain in effect until cleared in the TEMPLATE_POST_BODY section via a call to Tlib_postest_clear which resets the function pointer to the function in effect before the instance was executed Typically the set up of any on_pretest conditions should be performed only in the TEMPLATE_PRE_BODY section 16 TLIB_PATSTART patstart Set up the call of a function C function returning an integer before the patgen is started most often used for device preconditioning before the vectors run The on condition setup will remain in effect until cleared in the TEMPLATE POST BODY section via a call to Tlib_patstart_clear which resets the function pointer to the function in effect before the instance was executed Typically setting up any on_patgen_start conditions should be performed only in the
199. er MFP function calls The format of the function call is tt_mfp_set_ra_all_rik analyzer_list headmask The analyzer_list argument is a flex array of redundancy analyzer numbers For more information on flex arrays see the tt_mfp_create_crik description on page 4 3 11 The headmask argument specifies which head the function call applies to The headmask argument may be O 1 head 0 only 01 Ol 2 head 1 only 10 O 3 heads0and1i 11 The default headmask is 3 which will set the all start cycles the same for both heads The headmask argument may be omitted tt_mfp_set_ra_cycle_count This function call is used to set redundancy analyzer cycle counts The format of this function call is tt_mfp_set_ra_cycle_count count analyzer_list headmask The count argument is the integer value the redundancy analyzer s cycle counter should be set to The analyzer_list is the name of a flex array that contains a list of the redundancy analyzers to be used This list of redundancy analyzers is sometimes referred to as a RIK or redundancy analyzer index key For an example of how to create a flex array see the tt_mfp_create_crik discussion on page 4 3 11 If NULL is specified instead of the name of analyzer list then the current the current RA all RIK will be used see the tt_mfp_set_ra_all_rik discussion on page 4 3 13 Note that if an analyzer_list is specified the RA all RIK will be reset to the value of the anal
200. er is set to ganged instead of sequence in the first instance example This means that the result of all pin PMU measurements will be ORed The datalog will record the results of this OR operation A failure of any individual PMU measurement will result in the failure of the ganged result June 1995 3 1 29 Using Templates J990 Series Programmer s Manual Both instances uses the lolimspec and hilimspec parameters instead of lolimval and hilimval These parameters will reference the spec database specadr specdb to assign the appropriate values To find the spec the instance will locate the level object named by the levels parameter This is leakage_ levels which is defined in the group clause of the workspace database file level leakage levels leakage_levs levels_egns The leakage_levs keyword is the name of a specset This will be found in the d1Mx4_levels specadr file Within that specset the IL_lo and IL_hi specs are defined Note that the pinlist parameters selects INPUTS for the input_leakage_ganged instance This is a pingroup consisting of the address However the io_hi_leakage template specifies the IO pins independently in the pinlist Either approach is valid In both instances the measure parameter is set to current this means the forceval is a voltage Notice that the input_leakage_ganged instance uses two forcevals forceval1 is set to 0 volts and forceval2 is set to 5 5 volts The template will
201. es must be translated to a binary database format Create program flow file Flow control is written in the AT900 language which is a Teradyne superset of C It is put into a T module i e a file with extension f then compiled with at900 command to generate a binary file 0 which will get linked into the program The flow file determines the test sequence and sorting binning that takes place Create workspace file The workspace file contains a list of the database names and executable modules that make up the test program It is the handle used by the IG900 Executive and 1G900 Tools for manipulating the test program The workspace file is written in ADR syntax and translated with the adr900 commana Create a Makefile The makefile specifies the commands to automatically translate and compile the source modules to create new binary files whenever the source code changes It also contains file dependencies This facilitates remaking the dependent modules when other modules change Makefiles are ASCII files created by the programmer that are used by the Unix make program Load and Link the Test Program Once all the database and executable modules are created including the workspace and makefile the program is ready to be linked and loaded Linking occurs automatically when the program is loaded During loading all equations are resolved in the databases and some tester RAM hardware that can be set before job execution
202. es J990 Series Programmer s Manual These pattern databases are created by editing ADR files then translating them to create binary database files This can be done by using the ADRedit tool to edit and translate the files or using a standard text editor and manually translating the files Pattern Objects These database files will each contain a database set mpgset dgenset srcset startset in addition to various other programming statements and declarations These database sets will be named and combined with a mutset in the workspace to create a pattern These pattern objects are included in the job when it is linked and loaded mpgset dgenset Workspace Pattern Databases pattern 7 Job srcset Job Test Program startdb startset mutset Figure 1 8 1 Relationship of Patterns Databases to Workspace and Job There are relationships between the various pattern databases that will determine the order in which they should be created Figure 1 8 2 shows the best sequence for creating the databases 1 8 2 June 1995 J990 Series Programmer s Manual Creating Pattern Database Files Order of Creation Datagen and Source Data sets defined in the Datagen database Select Databases and source locations defined in the Source select database will be used in the SVM database O Create Datagen and Source select databases first Labels created in the SVM database
203. ess and store instance data that contains data generator dgen connections and topological inversion information for the device MFP Dgen Template contains an Insted table that lists an equal number of Data pin names Cycle positions Data generator specifications Topological data inversion expressions Each horizontal line in the table specifies dgen usage and inversion information for one cycle of each data pin listed in column 1 of the table NOTE Each occurrence of an inversion expression for a particular dgen should match all other occurrences for that dgen MFP Dgen Template has the following parameters listed in order of appearance in Insted Table 4 2 4 MFP Dgen Template Parameters Insted Prompt Which Patgen Entry Parameter Data Type Required Description patgen Integer No Specifies which patgen MPG defaulted scrambler will be used Choices are 0 Main 1 Alt and 2 Both Default 0 Main Data Pin Names data_pins Pinlist Yes Pin table data column 1 fields Lists pin names for which dgen and inversion information is provided For each data_pins entry there must be corresponding entries in suffix dgen and topo_inv_expr 4 2 10 June 1995 J990 Series Programmer s Manual Table 4 2 4 MFP Dgen Template Parameters Continued Entry Insted Prompt Parameter Data Type Required Cycle Position suffix List of Yes integers Memory Fail Processi
204. evice address values based on the algorithmic address values from the patgen by accessing a location in the scramble RAM The address scrambler is divided into an X half and a Y half but since both X and Y address information can be affected this separation is for naming purposes only The X scrambler can affect up to 14 bits of address 16K locations and the Y scrambler can affect up to 16 bits of address 64K locations Both of these can be combined to generate up to 30 bits of scrambled address for the ADS bus In addition two address bits are unscrambled and can be selected to go directly to the ADS bus The bits to be scrambled are selected at the input to the scramble RAM and outputs scrambled address can be selected to be routed to the ADS bus scrambler 2 data generator topo inversion input selects scrambled X scrambler 0 address ADS 16K x 14 input selects scrambler 1 64K x 16 scrambled Y address 2 alternate data generator Figure 2 1 9 Address Scrambler Block Diagram 2 1 14 June 1995 J990 Series Programmer s Manual Programmer s Guide to the Hardware Data Generation Each memory patgen has two data generators each generating one bit of algorithmic data for the device Data can be from the O Logic Function Generators LFGS which can generate data as a function of address O Coincidence diagonal data when row X address equals the column Y address data will equal 1 O Logic
205. example P is initialized to the first symbol in the floatpins list The for loop continues while there are entries left in the floatpins list HASVALUE At the end of each iteration through the loop the Pin pointer is incremented to the next pin symbol in the list NEXT Background_Template Even though the user may want to use custom templates many job setups can be accomplished with an instance of the background_Template Therefore Teradyne strongly recommends that users use the background_ Template in their test programs if it is possible to do so Also IO pins that are input only will have their comparator disabled through the background_Template Optional Parameters and Defaults Many parameters are optional in the templates The user is not required to enter a value for these parameters However often the template code must act on the object for which the parameter entry was intended in the tdl file In this case the template software must have a way of determining default values for optional parameters There are three specific ways to set up defaults for template parameters 1 Parameter value inherited from environment This method is the simplest method The programmer only performs an action on a value if a value is present Otherwise he does nothing with any objects of that type This is the defaulting method used for most parameters It means that the waveform previously selected is not changed For example if
206. execution Channel Numbers SS ot HU Channel Selection Databus June 1995 2 1 53 Programmer s Guide to the Hardware J990 Series Programmer s Manual Figure 2 1 44 PIK Mapping Illustration the group PIKs shown are not accurate numbers 2 1 54 June 1995 J990 Series Programmer s Manual Programmer s Guide to the Hardware Voltage Sources Power for the DUTs is provided by the voltage sources The voltage sources include programmable current limits and current monitors to measure output current The voltage sources are supplied in groups of eight and up to sixteen are available per test head Each voltage source can supply 1A at up to 10V and 0 25 A at up to 20V Up to 8 voltage sources can be wired in parallel for greater currents Six current ranges are available for making measurements Range Resolution 1A 50 uA 100 mA 5 uA 5 mA 250 nA 1mA 50 nA 100 uA 5 nA 10 pA 500 pA Each voltage source has two voltage values main and alternate The pattern generator can control which is used for VBUMP testing If bump testing is not being used the main and alternate values can be set equal Each VS board also contains a bias supply The bias supply can be used at the test head for any low current 20 mA biasing June 1995 2 1 55 Programmer s Guide to the Hardware J99
207. f flag C If the flag parameter value is 1 in the instance go to next step if it is 0 go to line 46 42 int x readsys testnum C Read the current test number assign it to x and declare it ber Macro jas an integer 43 writesys testnumber AT900 Add 1 to the test number gt E D E 46 if HASVALUE skip C If the current instance has a skip parameter go to the next Macro step if not go to line 57 47 flag C Reset the flag to 0 or false 48 skip HASVAL C Define S as equal to skip S skip If S has a value then EXT S Macro go to the next step if not go to line 54 HASVALUE S Select the next skip value NEXT S 49 C If S has the same value as V go to the next line if not go to line 48 and select the next skip value NEXT S 50 Set the flag to 1 true 51 break Get out of the for loop started in line 48 and go to line 54 54 if flag If flag is true 0 go to the next line if not go to line 57 55 continue Go to line 34 and get the next skip parameter value in the current instance June 1995 3 2 17 Customizing Templates are J990 Series Programmer s Manual Main FOR Function Lines 35 108 C Macro if HASVALUE driverl 58 for P driverl HASVAL UE P NEXT P If the current instance has a driver parameter value go to the next step if not go to line 63 Define P as
208. f of the cycle di Clock in data for early half of the cycle d2 Clock in surround data for early half of the cycle d3 Clock in surround data for late half of the cycle d4 Clock in data for late half of the cycle d5 Clock in surround data for late half of the cycle 5 1 10 June 1995 J990 Series Programmer s Manual Using Dual MPG Mode For IO channels the following timing applies Channel Edge Description Clock in early half surround data and Primary do may be used to change the drive HIZ state Clocks in data for early half of the Primary d1 cycle Clock in surround data for early half of Primary d2 the cycle and maybe used to change drive HiZ state Muxes the primary channel to the DUT Primary d3 and may be used to change drive HIZ state Used to start the window strobe for the Primary c1 early half of the cycle Used to end window strobe or to place Primary c2 an edge strobe for the early half of the cycle Secondary do Clock in late half surround data and may be used to change the drive HIZ state Secondary di Clocks in data for late half of the cycle Secondary d2 Clock in surround data for late half of the cycle and maybe used to change drive HiZ state Secondary d3 Muxes the secondary channel to the DUT Secondary ci Used to start the window strobe for the late half of the cycle Secondary c2 Used to end window strobe or to place an edge strobe for the la
209. f the following fields mut_description_instance addr_scram_instance dgen_instance bitmap _usage_instance mut_topology_instances Hardware Setup Output File mfpadr_outfile String No Specifies the name of the hardware setup output file Hardware Setup Input File mfpadr_infile String No Specifies the name of the hardware setup input file Either mfpadr_infile must be specified or there MUST be entries in each of the following fields mut_description_instance addr_scram_instance dgen_instance bitmap_usage_instance mut_topology_instances 4 2 24 June 1995 J990 Series Programmer s Manual Example Memory Fail Processing Templates The following example instance shows programming for MFP Setup Template d12X 10Y x8 j997 60MHZ mfp_ setup instance mfp setup Template define instance value value value value value value value d12X_10Y_x8 3997 60OMHz mfp_ setup mfp_setup_Templat mut_description instance d12X 10Y x8_ios 01234567 60MHz mut_ desc addr_scram_ instance d12X_10Y_x8_scram dgen_instance d12X_10Y_x8_dgen bitmap_ usage _ instance d12X_10Y_x8_8duts bitmap _ usage mut_topology_instances d12X_10Y_x8_topo_ block d12X_10Y_x8_ topo block_yx d12X_10Y_x8_ topo_interleave mfpadr_outfile MFP _OUTPUT_ FILE mfpadr_infile June 1995 4 2 25 Memory Fail Processing Templates J990 Series Programmer s Manual 4 2 26 Ju
210. f value NEXT P 71 writesys AT900_ Set the driver initial logical level to O for the pin specified by set_driver_mode P 0 P or driveroff go to line 70 and select the next driveroff value NEXT P 74 writesys Start the pattern generator using the current pattern value patgen_start V 75 failflag 0 C Set failflag to O false 76 writesys patgen_wait AT900 Wait for patgen to stop 77 if readsys cr C Return an int type indicating failure s for the last pattern Macro burst If it is true a failure s occurred go to the next line 78 if it is false go to line 87 78 failflag 1 C Set failflag to 1 true 79 ERIAL AT900 Run a specified block of code on devices one at a time instead of running the block of code on the devices in parallel 80 Jif readsys cr C Return an int type indicating a failure for the last pattern Macro burst If it is true that a failure occurred go to line 81 if false go to line 79 and the next device 81 Tlib_remove_site Function Remove current site from the active site list 82 if dotests 0 C If the dotests parameter is the same as the value 0 go to line 83 if not go to line 79 and the next device 83 writesys instance_result AT900 Write the current site result as fail in the current instance Ip TT_CM FAIL Macro data structure 3 2 18 June 1995 J990 Series Programmer s Manual Customizing Templates
211. fied value in this instance is the same as the default This actual value has been specified in the instance as a memory aid The demo uses the default value but it may be quite safe to use a smaller value The mpause in this example could probably go down as low as 0 005 ms The sequence selection is a choice between 0 ganged or 1 sequential This selection determines if the results will be ganged or individual If the results are set to ganged all the results of tests are ORed meaning that a fail on any pin in the pinlist will result in a fail in the datalog Sequential means that the results of each pin pmus results will be listed separately in the datalog For the J994 which uses site PMuUs instead of pin PMUs a sequential result selection here means that the site PMU will test each pin at each site separately and datalog individual pins Ganged on the J994 is the same as on other systems with all test results ORed together In this example the sequence parameter is set to sequential for individual results For an explanation of autotitle see page 3 1 5 value driver0 CLKS ADDRS DQS value levels power_off_levels The driverO driver1 and driveroff parameters all take a pinlist The driverO parameter sets the drivers in the specified pinlist to VIL The driver1 parameter sets the drivers in the specified pinlist to VIH the driveroff parameter turns the specified pinlist drivers off HiZ The VIL and VIH values are provided by t
212. field and DATA is the field data that you will enter The following is an example of a basic functional instance define instance basic_functional func_Template value stop_on_first_fail 0 choice no value patterns four_cycle_patt march_diagonal_patt min_max_patt march_patt addrcompl_patt value dotests 1 choice yes value autotitle 0 choice no value tnum value trap value skip value driveroff value driverO value driverl value calset value waves wave_timing_nominal value levels nominal_levels value title value patstop value patstart value postbody 3 1 2 June 1995 J990 Series Programmer s Manual Using Templates value prebody value posttest value pretest END OF BASIC _FUNCTIONAL Instances use the following syntax rules O define instance INSTANCE_NAME TEMPLATE_NAME and value must be used in the syntax and placed in the order shown in the above examples O The matching parenthesis structure must be followed O Each instance must contain all of the referenced template s PARAMETERS even if the instance does not require it Parameters that are not programmed have no data after the parameter name The Insted tool creates the complete framework for you For a list of each template s parameters see the J990 Series Template Reference Manual Some of the PARAMETERS require DATA others do not For a description of each parameter and its requiremen
213. form statement Programs each group of the data set RAM hardware Data set RAM locations will be used in the SVM database defining which data set will be used in each pattern cycle Sets within the data groups will be programmed by nesting parenthesis data form group set dgen0 dgenl 1fg0 LES 0 0 lt data set 0 group 0 gt 1 lt data set 1 group 0 gt 1 0 lt data set 0 group 1 gt 1 lt data set 1 group 1 Sune De i 2 0 lt data set 0 group 2 gt 1 lt data set 1 group 2 gt 1 8 4 June 1995 J990 Series Programmer s Manual Creating Pattern Database Files Data Generator Database Example Pattern Data for 1Mx4 DRAM use pinset diMx4pins pindb diMx4 pins dgenset pattern _ data map pin dgen0 DQO DQ2 dgenl DQ1 DQ3 coin enablemask dgenO x3ff dgenl x3ff lfg form lfg a b 0 x0 y0 1 x0 y0 data form group set dgen0 dgenl 1fg0 solid data set0 0 set1 1 0 0 0 wow 1 1 o checkerboard data based on lsbs of address 0 1fg0 lfgl arb 1 1fg0 1fgl a b coin data 0 coin coin OM 1 coin coin wor 1fg1 wgw wom arb Warb KO wot June 1995 1 8 5 Creating Pattern Database Files J990 Series Programmer s Manual Contents of the Srcadr File The Source select database is defined with the ADR srcset statement inside
214. ge chan mux on read_edges per 10ns When detecting d0 d3 don t matter just cl amp c2 DQS_even Ee dO MOIS APIs HSM TS ADI DESTA DOS_even c2 MASSE DQS_odd WOM Se Wille Sri 4 SOS ES MDoS oddre 21 Haine write_edges per 10ns When driving d3 switches to that channel DOS_even Ee dO MOIS Walon Say We eo TAS MONS DOS_even c2 MOTS DQS_odd Oise 622 ST Su MS PASTS 4 BOSHA WD OSBOdGdmeZ ys 6ns 2 1 26 June 1995 J990 Series Programmer s Manual Programmer s Guide to the Hardware Mux Mode Programming Mach2 Mode The mux modes channel mux and format mux are programmed in the pins statement in the waveform database Whenever that waveform database is selected the pins are programmed for their selected mode The waveform database also contains the format and edge timing values for each edgeset for each channel being used Each channel can also be put into a mode to receive two bits of logic state data from the patgen This special mode is called Mach2 and it allows one patgen logic bit to be driven at d1 and a second bit to be driven at d2 These logic state bits can be programmed uniquely for each channel in the SVM This mode offers the most flexibility in generating logic signals for device clocks since the programmer can independently control the channel driver states at d1 and d2 Mach2 mode is only used with Non return NR formats for the channel
215. gen template instance or programs all the multiplexers and the first RAM location to zeros clear off hldsets this programs the Catch RAM modules to have clear enable disabled one of capture both hidset or capture lower hldset This choice is based on the value of the TT_MFP_OP_TYPE If the TT_MFP_OP_TYPE is TT_MFP_ACCUM or TT_MFP_MASK the capture both hldset will be selected If the TT_MFP_OP_TYPE is programmed to any other value the capture lower hldset is used These hidsets enable the appropriate Catch RAM slices and connect the right channels to the right slices tt_mfp_capture_completed tt_mfp_scan_setup This syntax of this function call is tt_mfp_capture_completed There are no arguments for this high level function This function is called after the capture patterns have been run It disables the Catch RAM slices and turns off patgen mode checking that occurs in start patgen after doing a setup for capture When patgen mode checking is active the current patgen mode is matched with the one specified in the MFP setup The syntax of this function call is tt_mfp_scan_setup head pseudo_site mfp_mut_topology_instance_name TT_MFP_OP_TYPE This function is called to set up for scanning from the Catch RAM to the Display RAM Those hardware load driver sets which are part of that setup are asserted Generally this function will be called for you by a call to tt_bitmap_save or tt_bitmap_save_all
216. grammer s Manual MFP Address Scramble Template 2 Insted name mfp_ addr scram 2 Template contains address scramble information for the memory under test This template is based on address mapping functions included in the user s job and are appropriate for devices where the number of rows columns or lOs is not an even power of two Parameters Table 4 2 2 MFP Address Scramble Template 2 Parameters Entry The MFP Address Scramble Template 2 has the following parameters Insted Prompt Parameter Data Type Required Description Which Patgen patgen Integer No Specifies which patgen defaulted MPG scrambler will be used Choices are Main Alt and Both Default Both Name of the user function which maps patgen x y to pin x y User function addr_func C function No Feu AOL ECTAmPNns These functions must be included by the user in one ofthe device program s t files list of Patgen x y bits to connect into X scramble RAM h v bits x_in strings No the X scramble RAM list of Patgen x y bits to connect into Y Serambi NEN BiS yan strings me the Y scramble RAM list of Patgen x y bits to connect into Input to bypass lines unscram_in No strings bypass lines list of Pin x y bits coming out from X Output of x scramble RAM x_ out strings No scramble RAM list of Pin x y bits coming out from Y Output of y scramble RAM y_out strings No scramble RAM Output from bypass lines unscram_out uat of
217. h 31 O dmux1 may be a bus bit selection 0 through 31 module form The module form statement is used to program catch RAM modules The following is an example module form module bus clear enable AO Al A2 ads off BO A3 B1 sec on Required fields include module and clear enable O module may be one of AO A1 A2 A3 BO B1 B2 B3 May be a LIST enclosed in parens A2 BO B3 O bus may be ads or sec bus can be defaulted and is not required If no bus is selected the driver will default to ads O clear enable may be on or off 4 4 18 June 1995 J990 Series Programmer s Manual Memory Fail Processing Low Level Programming catchram form The catchram form statement is used to program Catch RAM arrays and slices It consists of an outer array and an inner slice section The following is an example catchram form array by mod cs enabl cs compare mode slice scan enable scan compare pin pseudo site or pin 0 20 1 Oxff 0x03 capture 0 1 2 3 Ox3f 0x01 DQ1 0 DQ2 Required fields include array slice and at least one other field in each statement level O array may be 0 through 39 depends on system type and options installed May be a LIST 1 8 5 7 9 or a RANGE 0 20 of numbers by mode may be 1 2 or 4 May be defaulted and is not required cs enable may be 0 through 1023 ics compare may be
218. h each pin or pin group will be operating These modes are any of the hardware settings that are available per pin For all pin types O chan mux enable disable channel pin muxing O mach2 enable disable mach2 turbo mode O driver on off mode for driver prior to patgen burst O driver init logic state for driver prior to patgen burst For drive only channels only Ol fmt mux enable disable for formatter muxing XYmux 1 7 2 June 1995 J990 Series Programmer s Manual Creating Waveform Database Files eqset statement For IO channels only zstate HiZ IO switching mode for the channel scio enable disable same cycle io mode Oo comp enable disable for comparator O strobe window or edge mode for comparator strobe The eqset statement contains all the waveform timing equations and formats for each edgeset for each pin on the device Within the eqset are several clauses O default to program non unique or unused fields dvar form establish default equations for edges O tvar form program other timing related hardware that is not included in an edgeset such as the refresh interval refresh period O ivar form equations for intermediate variables O equation form programming of edge timing and formats per edgeset Most of the eqset programming is contained in the equation form Edgesets are defined here and will get assigned to an edgeset location in the tester according to the order in w
219. hanmuxed pair will be assigned the same dgen but on the alternate MPG Which dgen Invert Expression Nothing special required for dual MPG Sample MFP Data Generation Instance define instance mfp_dgen mfp_dgen_Template value patgen 2 choice Both value data_pins DQS value suffix 0 value dgen 0 value topo_inv_expr 0 MFP MUT Description Template Template Parameter Description Dual MPG requires an entry of 120 or 200 MHz for J997 Tester Speed in MHz and 120 MHz for all other memory testers This informs MFP that you will be using dual MPG mode XY orientation Normal implies X is rows Y is columns flipped is reverse Rows of X addresses Total number of rows in the device Cols of Y addresses Total number of columns in the device Number of Output Bits List only the number of IO pins on the device List only the primary pin names the even number channel Output bin Names in the chanmuxed pair June 1995 5 1 7 Using Dual MPG Mode J990 Series Programmer s Manual Sampie MFP MUT Description instance define instance mfp_mut_ description mfp_mut_description Template value speed 200 choice 200MHz Valhueromientat ton OR chouces Normal value rows 256 value cols 128 value num_outputs 8 value output_pins DQO DO1 DQ2 DQ3 DO4 DQ5 DOE DOQ7 MFP MUT Topology Template Template Parameter Description Se
220. he levels specified using the levels parameter described below In this example the clocks address and DQ pins are programmed using the driverO parameter so they are set to the VIL value To avoid confusion each pin should be programmed for only one of these driver conditions The execution order is driver1 driverO and driveroff If the same pin appears in more than one of the driver parameters the last state specified will be the state of the driver The levels parameter specifies the levels that will be used with the drivers and other DC values This includes setting all power and ground pins to 0 in this instance The level object is specified in the wspadr file inside a group For example in demo program the power_off_levels parameter references the following group clause 3 1 10 June 1995 J990 Series Programmer s Manual Using Templates group default comment nil group form type name elements level power_off_levels power_off_levs levels_egns The power_off_levs values can be found in the specadr and levels_eqns are defined in the leveladr The last two parameters programmed in the instance are the postbody and prebody functions value postbody postbody_function value prebody prebody_function The prebody parameter allows a function to be executed prior to executing the instance and the postbody parameter allows a function to be executed after the instance is executed Thes
221. he soft fails brought out by characterization are stored in the other half of the Catch RAM During the scanning phase of a bitmap plot the hard fails are subtracted out masked and the plot shows only the soft fails In the current tests accumulated tests bitmaps one half of the Catch RAM gets cleared before each test and stores current test fails The other half gets cleared only when directed by the user and is used to store the accumulated fails of all tests These applications are selected in the Bitmap Usage template Only one of these options may be selected at a time Enabling either option will result in half of the Catch RAM being dedicated for mask or accumulation reducing by half the number of devices which can be captured in parallel or the size of the bitmaps which can be constructed For job driven bitmapping see Chapter 4 3 MFP High Level Programming for a flow diagram illustrating the job driven bitmapping process the high level driver functions are most appropriate In conjunction with template instances and the MFP databases automatically derived from the instances these functions take care of most of the details involved in the creation of useful bitmaps The function calls assert hardware load driver sets hldsets to accomplish many of their functions These hldsets part of the MFP databases and thus subject to editing using ADR translators can be programmed independently with either the high level or low level progr
222. he specifications This declaration consists of the name symbol description string description units units and printing format string format Other attributes of the spec include a text label item device spec identifier devspec and a comment specs default format 6 1 units ns devspec yes comment nil item nil spec form symbol description tRC Random Read or Write Cycle Time tRAC Access time from RAS tCAC Access Time from CAS tOE Output Enable Time tAA Access Time from Column Address tRAS RAS Pulse Width tCAS CAS Pulse Width tRCD_min Min RAS to CAS Delay Time tRCD_max Max RAS to CAS Delay Time tT Driver Transition Time devspec no tHIZ Drive HiZ Transition devspec no A spec must be first declared in a specs statement before being defined in a specset statement in a specadr file 1 5 2 June 1995 J990 Series Programmer s Manual specset statement Creating Specitication Database Files The definition of a spec and its associated values is done by the specset statement A spec is typically assigned a value value and other optional parameters depending on how the spec will be used The value is used with the equations databases levels and waveforms to define a hardware value The optional parameters include O spec search and log maxloops etc 1 Shmoo axis parameters start and stop O spec limits min
223. hen be used as a starting point and further modified as needed To get the starter ADR file written out specify an ADR output file in the MFP Setup instance Note that this setup generation happens during job run at the first point where an MFP driver function is called which references that MFP Setup instance so you need an active job to make this happen There are two ways that a hand tuned or created from scratch ADR file may be used with high level functions or with low level driver calls The simplest case is to use the high level calls just as you would use for unmodified template generated setups In this approach you start with template instances and specify an ADR output file The generated ADR file is modified as June 1995 4 3 1 Memory Fail Processing High Level Programming High Level Programming J990 Series Programmer s Manual necessary and then it is specified in the MFP Setup instance as an ADR input file When a value is given for the ADR input file parameter the MFP high level drivers will bypass the normal setup generation phase and use the contents of that ADR file In this case it is important that the edits made to the ADR file do not include modification of hldset names The high level drivers determine which hidsets to send to hardware based on operation type and hidset name In general the high level drivers will assert several hidsets for a single action The second and more difficult approach
224. hich they appear in the database The first edgeset in the database will be loaded into edgeset 0 Each pin or pin group can have up to six edges per pin Drive only channels have up to six edges per pin when formatter muxing dO d1 d2 d3 d4 d5 and up to three edges when not d0 d1 d2 IO channels can have up to six edges per pin when doing IO switching d0 d1 d2 d3 c1 c2 and less when doing just drive or compare within the cycle d0 d1 d2 or c1 c2 Use pin group symbols whenever possible as this will allow the software to take advantage of the hardware s parallel loading capability broadcast write Unused edges should normally not be programmed in the edgeset In some cases unused edges will be automatically placed according to specific guidelines for the system For example when using non return format NR the dO edge will automatically be placed at or after the d1 edge value when unspecified by the programmer as this is a specific timing programming guideline for J990 Series Systems The dO edge is not used when using NR format so it does not need to be programmed When writing multiple waveform database files it is important to keep the edgesets loaded at the same edgeset locations in hardware This means if an specific edgeset will be programmed first edgeset 0 in hardware it should appear first in all waveform databases The equations for these hardware values can be any valid C expression These
225. high voltage vil driver low voltage voh comparator high voltage vol comparator low voltage vch comparator clamp high voltage vel comparator clamp low voltage vt HiZ termination voltage Oooo 0 Oo Oo ioh current load for logic high O iol current load for logic low Both ioh and iol should be programmed to be positive values as this is how the hardware values are defined Within the vs form both main and alternate voltage levels are programmed and the current limit current clamp specified The equations for these hardware values can be any valid C expression These expressions are evaluated and values calculated at program load time by the database loader The specifications used with the equations are determined by the workspace This allows multiple specs to be used with a single set of equations The 1G900 database software builds a dependency tree for each specification used in an equation database This allows the software to recalculate all the equations and generate tester values when a spec changes This is used when specs are updated and when a spec is varied by adjust until Specsheet or Shmoo June 1995 1 6 3 Creating Level Database Files J990 Series Programmer s Manual Level Database Example Level Equations for DRAM Pins comment pin_levels leveladr use pinset diMx4pins pindb d1Mx4_pins range level 3v 6v pins comment Pin groupings used for levels default co
226. his site since the last call to tt_mfp_do_clear mfp_setup_instance_name T T_MFP_ACCUM When this high level function call is used five hardware load driver sets are asserted lt topology_instance_name gt hldset This hldset s name matches the name of the topology instance specified as an argument in the tt_mfp_scan_setup function call The topology instance defines the layout that will be used in the scan setup If NULL is specified as the argument for the tt_mfp_scan_setup function the hldset named default topology will be used clear off hidset This programs the Catch RAM modules so that the clear enable function is disabled clear is turned off cram bg disable hidset This disables all Catch RAM slices so that only the slices explicitly enabled later will be used during scanning scan lt ULB gt site lt PSITE gt hidset This hldset enables the Catch RAM slices that should be scanned out Which slices are enabled depends on which TT_MFP_OP_TYPE argument is passed in to the tt_mfp_scan_setup function 4 3 10 June 1995 J990 Series Programmer s Manual Memory Fail Processing High Level Programming e lt ULB gt is upper if the TT MFP _OP_ TYPE argument is TT MFP_MASK or TT MFP_ACCU e lt ULBs gt is both if the TT MFP_OP_TYPE argument is TT MFP_MASKED e lt ULB gt is lower for all other cases e lt PSITE gt is the pseudo site number which is being scanned out scan disp lt MASK gt head lt N gt
227. hoice of programming these so they have no affect or setting Vcl and Vch close to the actual device voltage levels and using the clamping circuit 2 1 52 June 1995 J990 Series Programmer s Manual Programmer s Guide to the Hardware Pin Index Keys PIKs and the PIK Map RAM To control individual and parallel channel programming the system has a channel map RAM which selects a channel or set of channels for each programmed RAM location The address into this RAM is called a Pin Index Key PIK In essence a PIK is an address into the channel map RAM also known as the PIK map RAM The lower addresses of the RAM are mapped to correspond directly to the channel numbers PIK 0 accesses channel number 0 PIK 1 accesses channel number 1 etc Upper addresses PIKs are programmed by the job executive to access multiple channels in parallel based on the pin groups in the test program This permits the parallel programming of channels that have the same information For example address pins on a device are commonly programmed to have the same timing Assuming the test program programs the address pins as a group the timing for the address pins will be loaded in parallel These definitions are created in the pinadr database The device voltage sources are not addressed using PIKs Although the pinadr database will permit a group pin symbol to include both VS and PIK symbols this would force the pins to be addressed individually slowing
228. idelines 2 2 1 timing system 3 1 15 3 1 16 3 1 17 Tlib_alarmcheck template function 3 2 30 TLIB_AUTOTITLE template macro 3 2 24 TLIB_CALDATA template macro 3 2 23 TLIB_CHECK_DISABLE template macro 3 2 25 Tlib_clearstop template function 3 2 37 TLIB_DEB template macro 3 2 26 Tlib_debug template variable 3 2 27 TLIB_EPR template macro 3 2 26 Tlib_floatpins template function 3 2 29 TLIB_FORCETEMPLATEFAIL template macro 3 2 23 Tlib_get_time template function 3 2 37 TLIB_HASVALUE template macro 3 2 25 TLIB_LEVEL template macro 3 2 23 Tlib_maxforce template variable 3 2 27 Tlib_minforce template variables 3 2 27 TLIB_NEXT template macro 3 2 26 TLIB_PATSTART template macro 3 2 25 TLIB_PATSTOP template macro 3 2 25 Tlib_pin_pmu_check_irange template function 3 2 37 Tlib_pmu_check_irange template function 3 2 30 Tlib_pmu_check_vrange template function 3 2 30 Tlib_pmu_rngstring template function 3 2 28 TLIB_POSTTEST template macro 3 2 24 TLIB_PRETEST template macro 3 2 24 Tlib_restore_all_vs template function 3 2 30 Tlib_restore_levels template function 3 2 30 Tlib_save_all_vs template function 3 2 30 Tlib_save_levels template function 3 2 30 Tlib_set_pmu_force_bounds 3 2 28 Tlib_set_pmu_force_bounds template function 3 2 28 Tlib_set_ppmu_force_bounds template function 3 2 29 Tlib_setstop template function 3 2 37 Tlib_specs_modified 3 2 27 Tlib_specs_modified template variable 3 2 27 T
229. ied at capture setup time one will be created for you 4 4 2 June 1995 J990 Series Programmer s Manual Memory Fail Processing Low Level Programming tt_mfp_lowlevel_adr_capture_setup tt_mfp_lowlevel_capture_setup The syntax of these function calls is as follows tt_mfp_lowlevel_adr_capture_setup mfp_ADR_filename mfp_hldset_name MFP_HLD_TYPE tt_mfp_lowlevel_capture_setup mfp_setup_instance_name mfp_hldset_name MFP_HLD_TYPE tt mfp lowlevel adr scan setup tt mfp lowlevel scan setup The syntax of these function calls is as follows tt_mfp_lowlevel_adr_scan_setup mfp_ADR_filename mfp_hldset_name MFP_HLD_TYPE tt_mfp_lowlevel_scan_setup mfp_setup_instance_name mfp_hldset_name MFP_HLD_TYPE The arguments for these function calls are the same as for the capture setup calls described above Refer to the description above TT_MFP_HLD_TYPE The TT_MFP_HLD_TYPE argument defines which forms in the specified hldset mfp_hldset_name argument will be written to hardware It is a bitmask that may be ORed together to write multiple hardware elements from an hidset with a single call If TT_MFP_HLD_TYPE_ALL is selected for this argument then all forms in an hidset will be written An explanation of all the different form types in the descriptions below can be found later in this chapter TT_MFP_HLD_TYPE Description arguments TT_
230. ies Programmer s Manual Timing Guidelines 18 When using NR Non Return format on drive only channels in formatter mux mode for the X signal the d0 edge must be placed 2ns after the d1 edge The transition however will occur at the dO edge Likewise for the Y signal the d3 edge must be placed 2ns after the d4 edge The transition however will occur at the d3 edge Previous X Signal Y Signal Y Sigal o 8 Osage ekaee ee baer hate e eae ae di do d4 d3 gt 2ns le gt 2ns Figure 2 2 11 Minimum d1 to d0 and d4 to d3 Times NR Format Address Mux Mode June 1995 2 2 9 Programmer s Guide to the Hardware Timing Guidelines Drive Only Timing Edges For drive only channels in address mux mode the programmer has available six timing edges to setup the desired waveforms Each of these edges has a specific purpose Table 2 2 2 Drive Only Edges Edge Purpose do This edge controls the format muxing for going to the X half of the channel For channel muxing this edge muxes the specified channel s waveform to the output It is also used to set the X surround data for the cycle di This edge selects the valid data for the X portion of the cycle d2 This edge selects the surround data for the X portion of the cycle Under mach2 mode this edge drives the second portion of the X data d3 This edge controls the format mux for going to the Y half of the channel It is also used to set the
231. igh and low pass limits and perform the test Stop the pattern generator when done 3 1 32 June 1995 J990 Series Programmer s Manual Using Templates System PMU for ICC Tests The system PMU is used in much the same way as the current monitor The only major differences are in the connections that must be made Figure 3 1 7 Shows hardware connections prior to ICC testing Functional Electronics System PMU Voltage Source Figure 3 1 7 Hardware Connections Prior to ICC Testing Static ICC Test Procedure To measure power supply current with the system PMU resource 1 Power down the device remove all loads and input voltages 2 Turn off the voltage source for the pin to be tested Connect the system PMU to the first power pin to be tested a 9 Program the PMU to the appropriate force value and specify high and low pass limits 5 Program the drivers to a known state 6 Perform the test 7 Reconnect the power pin to the voltage source 8 Turn on the voltage source June 1995 3 1 33 Using Templates J990 Series Programmer s Manual Dynamic ICC Test Procedure Dynamic ICC tests using the system PMU is similar to the same test using the current monitor To measure dynamic ICC using the system PMU 1 Disable the comparators This will prevent the compare logic from detecting functional errors and possibly stopping the pattern generator prior to the end of the test 2 Select the appr
232. ill be selected based on the arguments to the function call The syntax of the pik form is tt_mfp_set_data_mux pik dmux_0_bit dmux_1l_bit The syntax of the pin form is tt_mfp_set_data_mux pin dmux_0O_bit dmux_1l_bit The first argument is either a pin or a pik The pik argument is a pik number integer The pin argument is a pin name as defined in the pin database The dmux_o bit and dmux_1_bit arguments may be an integer between 0 31 inclusive This will set the specified pik or pin for the specified ADS bit tt_mfp_scan_catchram_dr This function scans a rectangular image of the device that has been captured in the Catch RAM to the display RAM The scan pattern runs left to right and top to bottom over the specified rectangle The format of this command is tt_mfp_scan_catchram_dr rectp do_clear The rectp argument is a pointer to a rectangular image of the device to scan The rectp is a tt_mfp_rect type see page 11 The do clear argument is zero the display RAM will not be cleared prior to a scan If do_clear is any other value the display RAM will be cleared before scanning The default is to clear the display RAM before scanning non zero If the default condition is desired this argument can be omitted 4 4 10 June 1995 J990 Series Programmer s Manual Memory Fail Processing Low Level Programming tt_mfp_scan_fmm_dr This function scans a rectangular image of the device that has been
233. imum Pulse Width Between d1 and d2 Not Meeting Minimum Pulse Width Between di and d2 d1 d2 Figure 2 2 1 Minimum Pulse Widths 2 Edges may not cross over like edges That is di may not cross a subsequent d1 etc The following figure provides an example Cycle n Cycle n 1 Allowed d1 n di n 1 Not Allowed en E di n 1 di n Figure 2 2 2 Edges May Not Cross Over Like Edges 2 2 2 June 1995 J990 Series Programmer s Manual Timing Guidelines While using the 60MHz pattern generator mode an edge should be at least 20ns apart from a like edge This limit can be reduced to 17ns if fast regeneration mode is used Cycle n Cycle n 1 di n di gt 20ns n 1 Cycle n d1 n Figure 2 2 3 Edges Should be 20ns Apart 60 MHz Mode While using the 100MHz pattern generator mode on a J997 an edge should be at least 5ns apart from a like edge in the next cycle In addition an edge should be at least 20ns apart from a like edge that is two cycles apart Again this limit can be reduced to 17ns if the system is calibrated with fast regeneration mode Cycle n 1 di n 1 gt 5ns Cycle n 2 di n gt 20 ns gt 2 Figure 2 2 4 Edges Should be 5ns Apart 100 MHz Mode June 1995 2 2 3 Programmer s Guide to the Hardware Timing Guidelines 5 The d2 edge of cycle n should not be within 5ns of the d1
234. in is stored in edgeset memory Pin Electronics Ranges There are three pin electronics ranges for J990 Series systems for all channel resources including the pin PMUs The ranges can be programmed on a per test head basis 4v to 5v 3v to 6V 2V to 7V Since it takes 750 ms to alter the levels range changing ranges too frequently or using different ranges throughout your leveladr file will slow down your program 3 1 16 June 1995 J990 Series Programmer s Manual Using Templates Input Device Driver J990 Series drivers can force voltages associated with the data as defined by the selected waveform Each driver can put out a programmed input high voltage VIH corresponding to data 1 and an input low voltage VIL corresponding to data 0 to the device Output Testing and Fail Processing As input voltages are applied to the input pins the voltages on the output pins must be read and the results compared with the expected predicted values The mechanism used to compare the actual device output with the expected output consists of the following hardware Ol Pattern memory Pattern generator Timing system Formatting system Comparator logic Ooo Oo Oo Dynamic current load O Error detector and fail processor With this hardware the J990 Series test systems can strobe device output voltage levels detect pin failures and process failure information Pattern Memory Pattern Generator Timing and Formatting Sys
235. in the following example Normally the writesys pmu_gate statement looks like the following writesys pmu_gate TT_CM_PMUO TT_CM_ON which gates PMU 0 on This statement could also be written to use a variable in this case an integer variable selected in the instance database writesys pmu_gate TT_CM_VAL int whichpmu TT_CM ON This statement using TT_CM_VAL allows the whichomu parameter to be a variable whose value is selected in the instance database Since using TT_CM_VAL means accepting a variable rather than an enum the error checking should be done by the user in the tdl file by using min max and choice The correct integer values for enums in writesys statements can be found in 399x include tt_cm h June 1995 3 2 33 Customizing Templates J990 Series Programmer s Manual Preparing the Custom Template Executable Code Once the new tdl and t files have been edited it is easy to prepare the code for execution 1 Run tdl_to_h on the tdl file to create the h include file This h file will then be included in the t file at compilation of the t file For example tdl_to_h basic_func_Template tdl produces basic_func_Template h which is included in basic_func_Template t Compile the t file using the AT900 compiler For example at900 g c basic func Template t produces basic _func_Template o which is included in the job s workspace to be part of the test program If you did
236. in the mutset are size to describe the number of addresses and data width O shape to describe the number of address rows and columns O address to describe the information to appear at the address pins data to describe the information to appear at the data pins The size is expressed with the words argument to specify the number of addresses and the width argument for number of data bits size words 131072 width 8 128Kx8 device The shape is expressed with the rows and columns arguments These numbers describe the number of address rows and columns shape rows 512 columns 256 The address clause includes either the map function form or the map value form table to specify which pins are address pins and how the address scrambler is to be programmed In addition it also defines whether or not address muxing is on map function form This table describes the mapping of pins to physical address bits rows columns using boolean expressions to define the address scrambling Typically each pin s address will be described by giving a boolean expression containing physical address bit identifiers address map function form ipin physical AO ord pri Al Me prd pri A pr2 A Nec A CL w N D A one to one mapping of physical to scrambled address bits to the device pins is expressed by just mapping the physical address bits to the pins 1 4 6 Jun
237. is set up on each head For example Head 0 Active Sites Head 1 Active Sites Ofed pur dat 1 2 5 6 2 3 5 7 1 2 3 5 6 7 If the MFP setup allows for four active sites to be set up in parallel the pseudo site mapping for these active sites would be Pseudo Site PRY Bien on 0 1 1 2 2 3 3 5 The MFP setup instance contains a field in which the desired MFP bitmap usage instance is specified then this bitmap usage instance contains a parameter num_sites in which the number of pseudo sites is specified When to change this mapping is left to the programmer However if no mapping has been specified at do_clear or capture setup time a mapping will be created for you The following is an example map the first four active sites in the sitemask to Catch RAM printf MFP call Mapping active sites to MFP pseudo sites n tt_mfp_map_pseudo_sites d12X_10Y_x8_mfp_setup In this example the first four active sites in the sitemask are set up as Catch RAM pseudo sites These first four sites are the only ones from which fail data is collected The actual number of pseudo sites comes from the d12X_10Y_x8_mfp_setup instance which references the d12X_10Y_x8_bitmap_usage instance The d12X_10Y_x8_bitmap_usage instance contains a parameter num_sites which is set to four 4 3 6 June 1995 J990 Series Programmer s Manual Memory Fail Processing High Level Programming tt mfp_do_c
238. is to used the custom ADR file in conjunction with the low level driver calls With this approach you specify in each driver call the name of the hidset and a bitmask of one or more form types hardware subsystems which should be sent from that hldset to hardware In this way you can choose to create large hldsets and assert only a portion of them in a given driver call or you can create small hidsets and assert them in their entirety perhaps making multiple driver calls to assert the multiple hldsets to accomplish a single operation such as setting up for capture For job driven bitmapping the high level driver functions are most appropriate In conjunction with template instances and the MFP databases automatically derived from the instances these functions take care of most of the details involved in the creation of useful bitmaps The high level driver functions are High Level Drivers Description tt_mfp_map_pseudo_sites tt_mfp_do_clear maps the active sites onto MFP pseudo sites clears the Catch RAM all or portion based on arguments tt_mfp_func_test_setup tt_mfp_capture_setup tt_mfp_capture_complete set hardware up in preparation for simple functional testing set hardware up in preparation for capture inform MFP system that capture is finished tt_mfp_scan_setup tt_mfp_do_scan tt_mfp_scan_completed set hardware up in preparation for scanning scan from the Catch RAM to the Display RAM
239. ks format multiplexing is not used however address channels will use format multiplexing Therefore the fmt mux header is added to allow address channels to be calibrated in that mode For the IO pins dO will also be optimized Notice the parenthesis around the do_drive d3_drive syntax This is a standard ADR technique for adding a list of items under the same header Different calsets can be used at various points in the test program flow to adjust calibration values to the optimum for particular tasks June 1995 1 9 5 Creating Calibration Database Files J990 Series Programmer s Manual 1 9 6 June 1995 J990 Series Programmer s Manual Creating Workspace Database Files Introduction Chapter 1 10 Creating Workspace Database Files Objective Create wspadr and wspdb files Reference ADR900 Reference Manual Once all the test condition databases have been created waveform equations patterns levels equations specifications etc they need to be grouped together to form a test program This grouping is performed by the workspace database The workspace lists all of the databases sets and the files modules which contain them This is needed for loading of databases into the test program When a database is specified it is loaded from the correct module The workspace database also creates the higher level database objects that consist of lower level database objects For example combining a specific specset
240. l parm dotests Int choice yes 1 no 0 fails default yes parm stop_on_first_fail Int choice yes 1 no 0 default no parm tnum Int optional min 1 max 65535 parm autotitle Int choice no 0 yes 1 default no parm title String optional parm driverl Pin optional parm driver0 Pin optional parm driveroff Pin optional parm pretest Cfuncptr optional parm posttest Cfuncptr optional parm prebody Cfuncptr optional parm postbody Cfuncptr optional parm patstart Cfuncptr optional parm patstop Cfuncptr optional J990 Series Programmer s Manual Levels Name Waveform Name Calset Name Pattern Name s Pattern Names s To SKIP Pattern To TRAP On do test func only 2 ou Stop on first failing pattern Test Number s Use Automatic Datalog Title Datalog Title Set Il m Driver Pinlist Set Il Driver Pinlist Set Driver Off Pinlist Pretest Function Posttest Function Prebody Function Postbody Function Patgen Start Function Patgen Stop Function p 3 2 8 June 1995 J990 Series Programmer s Manual Customizing Templates Editing the Template t File General Recommendations In order to edit the t file to create a custom template several concepts and sets of rules need to be understand The concepts that will be covered in this section are
241. l Programmer s Guide to the Hardware The enabled modes for each IO channel determines how many of the six available edges will be used in a cycle and how they will be used For example edges c1 and c2 are only used when expecting device output data and the driver is HiZ Edges d0 and or d3 can be used to change the drive HiZ state of the channel When in strobe window mode c1 is programmed to occur before c2 When in strobe edge mode c1 should be programmed to occur at the same time as c2 Driver Formats On acycle by cycle basis the format can be changed for each channel by selecting a new edgeset The data shown in each figure below can come from the pattern generator or SVM channel data depending on the programming of the source selects The formats to choose from include Return to Low RL Logic low from d0 to d1 valid data from d1 to d2 gate edges and logic low from d2 until d3 or next cycle s d0 VIH VIL Figure 2 1 12 Return to Low Format Return to High RH Logic high from dO to d1 valid data from d1 to d2 gate edges and logic high from d2 until d3 or next cycle s d0 VIH VIL Figure 2 1 13 Return to High Format June 1995 2 1 19 Programmer s Guide to the Hardware J990 Series Programmer s Manual Pulse Low PL Regardless of the actual data the channel goes high from dO to d1 low from d1 to d2 and high from d2 to d3 or the next cycle s d0 VIH VIL
242. ld be used For states 0 1 4 and 5 use a source select of vm ads ads For states 2 3 6 and 7 use a source select of vm ads vm June 1995 2 1 39 Programmer s Guide to the Hardware J990 Series Programmer s Manual IO Channel Fanout to the Test Head In the J997 and J993 each test head is driven by up to 9 WaveGen Boards also known as a Hexadecimal Channel Slice or HCS board Each slice of these WaveGen boards generate signals for one IO channel There are also eight IO channels per IO channel board This means that each IO channel WaveGen board supports one IO channel board Eight IO slices per WaveGen board and eight IO channels per IO channel board times nine boards each gives a total of 72 IO channels per test head WaveGen DCS boards are located in the mainframe and IO channels are located in the test head Each IO slice has independent timing format and error logic control 10 Channel WaveGen Board 10 Channel Board 10 Slice a IO Channel a 10 Slice IO Channel a gt 10 Slice a IO Channel a 10 Slice IO Channel a gt 10 Slice a IO Channel gt 10 Slice IO Channel lt gt 10 Slice a IO Channel a 10 Slice xe IO Channel a gt 9 IO Channel WaveGen Boards x 8 IO Channels per board 72 10 channels Figure 2 1 33 J997 and J993 IO Channel Fanout In the J994 each test head is driven by up to 9 WaveGe
243. lear The syntax of this function call is tt_mfp_do_clear mpf_setup_instance_name TT_MFP_OP_TYPE This function sets up hardware appropriately selects a clear pattern and then runs that pattern to clear the specified portion of the Catch RAM Possible values for the OP_TYPE arguments are OP_TYPE arguments for Description tt_mfp_do_clear _MFP_NULL OP or Either of these will set up to clear only the current results even if _MFP_CURRENT masking or accumulation is enabled in the MFP setup instance _MFP_MASK This will set up to clear both the current and mask regions of the Catch RAM _MFP_ACCUM This will set up to clear both the current and accumulate regions of the Catch RAM The following is an example printf MFP call Clearing Catch RAM n tt_mfp_do_clear d12X_10Y_x8_mfp_setup TT_MFP_NULL_OP After sending a message to the jobio window this function call will clear the current results in the Catch RAM All scramble RAM tables and multiplexers will be set up as specified in the d12X_10Y_x8_mfp_setup instance One hldsets is asserted when this function is called clear both or clear lower one of these two hidsets will be asserted next This sets up the appropriate clear enable values on the Catch RAM modules to clear the specified regions The clear lower hidset is used when you are set up to do masking or accumulating and the OP_TYPE argument is set
244. lects which MPG Options are Main Alt or Both In dual MPG mode Both is Which Patgen the appropriate choice since we are describing the MUT topology of a single device but using both MPGs Patgen X Y Bit List patgen X Y bits and I O select bits Expression of H V bits determining values for the corresponding X Y or I O select bits H V bits are the horizontal and vertical address on the bitmap display Expression of H V Bits Sampie MFP MUT Topoiogy instance define instance mfp_mut_topology mfp_mut_topology_Template value patgen 2 choice Both value x_y_bit px0 pxl px2 px3 px4 px5 px6 px7 py0 pyl py2 py3 py4 py5 py6 iob0 value h_v_expr hod WL a2 ias h4 RO IA y h8 vO NALS WW v3 v4 v5 v6 5 1 8 June 1995 J990 Series Programmer s Manual Using Dual MPG Mode MFP Setup Template Template Parameter Description MUT Description Instance Capture Both SCRAM Name of MUT Description Instance Name of Address Scrambling Data Generator Instance Bitmap Usage Instance Instance Instance Scan Only SCRAM Name of Scan only address Instance scrambling instance Name of Dgen Instance Name of Bitmap Usage Instance MUT Topology Instance Output File Infile Name of MUT Topology Instance optional name of database output file optional name of database file to read Sampie MFP Setup instance define instance mfp_setup value mut_description_in
245. led state during Catch RAM clear and scan functions Do not alter the patterns other than adding pin data if required 3 Add the tt_mfp svmadr file to the job makefile Translate the tt_mfp svmadr file to the equivalent tt_mfp svmab file June 1995 Memory Fail Processing Overview J990 Series Programmer s Manual tt_mfp startadr changes workspace wspaar changes 1 Copy the tt_mfp startadr file from j99x etc to the job s directory Because no edits to this file should be required you may alternatively create a link to the tt_mfp startadr file by typing the following from the job s directory In s 399x etc tt_mfp startadr Add the tt_mfp startadr file to the job s makefile Translate the tt_mfp startaar file into the tt_mfp startdb file 1 Add the following include line to your workspace include j99x etc tt_mfp_wsp h 2 Add the tt_mfp_wsp_setup to the job group in the job s workspace wspadr file group default comment nil job XXXXXXXX tt_mfp_wsp_setup 3 You may optionally choose to include the tt_mfp_XXX_patterns into an SVM table in the workspace June 1995 J990 Series Programmer s Manual Memory Fail Processing Templates Introduction MFP Templates Chapter 4 2 Memory Fail Processing MFP Templates Memory Fail Processing software provides support for programming the error processing hardware for the purposes of bitmapping The MFP software provides a complete low
246. level syntax and high level support This chapter describes the high level templates The primary MFP template is the MFP Setup Template An instance of this template ties instances of all the other MFP templates together into one coherent setup Each distinct capture setup is represented by an instance of this template Many different scans may be done from a single MFP Setup instance but it will support only one arrangement of Catch RAM slices and Scramble RAM contents multiplexer settings ADS bit assignment etc for error capture In the MFP Setup instance you specify the names of all ofthe otherMFP instances which should be part of a particular capture setup Insted views all of these parameters the other template instances as optional since it is possible to specify only the name of an ADR file which will bypass the high level setup generation code entirely However assuming you do not wish to override the setup generation with your own ADR input file most of the instance parameters become mandatory The following list describes the parameters for the MFP setup instance O MFP MUT Description Template Instance mandatory MFP Address Scramble Template Instance mandatory MFP Bitmap Usage Template Instance optional MFP Scan Time Scramble Instance optional OOo Oo 0 MFP MUT Topology Template Instance optional may be list of different scan topologies C MFP Data Generator Template Instance mandatory If no topol
247. lib_start_timer template function 3 2 37 Tlib_stop_timer template function 3 2 37 TLIB_TITLE template macro 3 2 24 Tlib_tnumarray template array 3 2 27 Tlib_trap template function 3 2 30 Tlib_unfloatpins template function 3 2 29 TLIB_WAVEFORM template macro 3 2 24 Tlib_zero_all_vs template function 3 2 30 Tlib_zero_levels template function 3 2 30 tnum2 instance parameter 3 7 9 topo_inv_expr parameter 4 2 77 topological data inversion 1 4 1 tri state output current leakage 3 7 24 See also leakage tests tt_mfp_adr_map_pseudo_sites 4 4 2 tt_mfp_capture_completed 4 3 9 tt_mfp_capture_setup 4 3 8 tt_mfp_clear_display_ram 4 4 9 tt_mfp_clear_fmm 4 4 9 tt_mfp_disable_fmm 4 4 10 tt_mfp_do_clear 4 3 7 tt_mfp_do_scan 4 3 11 tt_mfp_file_checks_off 4 3 76 tt_mfp_file_checks_on 4 3 76 tt_mfp_get_es 4 3 16 tt_mfp_get_fail_cnt 4 4 9 tt_mfp_get_saved_fc 4 4 9 tt_mfp_get_waveform 4 3 16 TT_MFP_HLD_TYPE 4 4 3 TT_MFP_HLD_TYPE_ALL 4 4 4 TT_MFP_HLD_TYPE_CATCHRAM 4 4 3 TT_MFP_HLD_TYPE_DISPLAY_PROC 4 4 3 TT_MFP_HLD_TYPE_FAILMAP 4 4 3 TT_MFP_HLD_TYPE_MODULE 4 4 3 TT_MFP_HLD_TYPE_RA 4 4 4 TT_MFP_HLD_TYPE_RA_FORM 4 4 4 TT_MFP_HLD_TYPE_RA_MUX 4 4 3 TT_MFP_HLD_TYPE_RFL_BUS 4 4 3 TT_MFP_HLD_TYPE_RFL_MUX 4 4 3 TT_MFP_HLD_TYPE_SCRAM 4 4 3 TT_MFP_HLD_TYPE_TOPO 4 4 3 tt_mfp_lowlevel_adr_capture_setup 4 4 2 4 4 3 tt_mfp_lowlevel_adr_scan_setup 4 4 2 4 4 3 tt_mfp_lowlevel_capture_setup 4 4 2 4 4 3 tt_mfp_lowlevel_scan_setup 4
248. ling this function you should call tt_mfp_do_clear with appropriate arguments Argument values and their meanings are as follows TT_MFP_ TOPO_INV TT_MFP_TOPO_INV_ON Set up topological data inversion RAM and its input multiplexes according to the equations specified in the data generator template TT_MFP_TOPO_INV_OFF Disable topological data inversion TT_MFP_OP_TYPE TT_MFP_ACCUM Set up to capture into both the current and accumulative halves of the Catch RAM This will be ineffective if you have not specified in your bitmap usage instance that you wanted to enable accumulate mode TT_MFP_MASK Set up to capture the mask image for each currently enabled site This will enable capturing into both the current and mask halves of the Catch RAM You should call tt_mfp_do_clear mfp_setup_instance_name TT_MFP_MASK before making this call You must have enabled the masking feature in the bitmap usage instance TT_MFP_CURRENT TT_MFP_NULL_OP Either of these will set up to capture only to the current test portion of the Catch RAM They are the only valid choices if your bitmap usage instance specifies neither masking nor accumulate You should call tt_mfp_do_clear mfp_setup_instance_name TT_MFP_CURRENT before making this call The following is an example printf MFP call Catch RAM capture setup n tt_mfp_capture_setup d12xX_10Y_x8_mfp_setup TT_MFP_TOPO_INV_ON TT_MFP_NULL_OP In
249. ll be copied to an AEL configuration file and AEL will be executed 1 9 2 June 1995 J990 Series Programmer s Manual Caladr Example 1Mx4 DRAM use pinset diMx4_ pins pindb d1Mx4_ pins range level 2v 7v calset nominal _ level _ cal patgen default cal form pin CLKS ADDRS cal form pin DOS calset spec_level_cal patgen default cal form pin CLKS ADDRS cal form pin DOS freq 60Mhz vil 0 0 vih 3 0 chan mux off fmt mux off optimize d3_drive strobe edge Vi svih 0 0 3 0 0 0 3 0 vil vih 0 0 3 0 freq 60Mhz zvil 0 0 vih 3 0 chan mux off fmt mux off optimize d3_drive strobe edge vil svih 0 8 2 4 0 8 2 4 vil vih 0 8 2 4 Creating Calibration Database Files fmt mux off on strobe optimize edge d0_drive d3_drive fmt mux off on strobe optimize edge d0_drive d3_drive Notes This example is a caladr file containing two calsets For this device format multiplexing will be done for the device s address pins This will allow two independent address data bits X and Y to be generated in the same cycle by each address channel This is a normal requirement for address multiplexed DRAMs This mode is used exclusively throughout the job execution With all pins remaining in the same mode the calibration mode does not change June 1995 1 9 3 Creating Calibration Database Files J9
250. llel capture memory fail processing 4 1 3 parameters accum parameter 4 2 8 addr_pins parameter 4 2 2 addr_scram_instance parameter 4 2 22 bitmap_usage_instance parameter 4 2 23 columns parameter 4 2 13 data_pins parameter 4 2 10 dgen parameter 4 2 77 dgen_instance parameter 4 2 23 h_v_expr parameter 4 2 75 mask parameter 4 2 8 mfpadr_infile parameter 4 2 24 mfpadr_outfile parameter 4 2 24 mut_description_instance parameter 4 2 22 mut_topology_instances parameter 4 2 24 num_outputs parameter 4 2 13 num_sites parameter 4 2 8 orientation parameter 4 2 13 output_pins parameter 4 2 13 patgen parameter 4 2 2 4 2 6 4 2 10 4 2 15 4 2 20 rows parameter 4 2 13 scram_expression parameter 4 2 3 speed parameter 4 2 13 June 1995 1 3 Index J990 Series Programmer s Manual suffix parameter 4 2 2 4 2 11 topo_inv_expr parameter 4 2 11 x_y_bit parameter 4 2 15 PASS DO macro 1 12 3 Patdebug 5 1 19 Patedit 1 1 4 5 1 19 patgen parameter 4 2 2 4 2 6 4 2 10 4 2 15 4 2 20 pattern instance parameter 3 1 21 pattern flow 2 7 70 pattern generator 2 1 6 3 1 15 3 1 17 with dynamic ICC tests 3 1 32 3 1 34 pattern scaling 1 8 19 pattern sync conditions 2 1 56 period 3 1 15 3 1 16 pin database file 1 2 1 pin groups 1 2 1 pin PMU 2 1 54 3 1 25 3 1 26 current range settings 3 1 26 described 3 1 26 programming 3 7 26 voltage range settings 3 1 26 with leakage tests 3 1 24 with system PMU shorts and opens tests 3 1 7 pin_pmu_alte
251. m_instance parameter specifies capture only scrambling information Either mfpadr_infile must be specified or there MUST be entries in each of the following fields mut_description_instance addr_scram_instance dgen_instance bitmap _usage_instance mut_topology_instances Data Generator dgen_instance String No Instance Specifies the instance containing data generator connections and topological inversion information Either mfpadr_infile must be specified or there MUST be entries in each of the following fields mut_description_instance addr_scram_instance dgen_instance bitmap_usage_instance mut_topology_instances Bitmap Usage bitmap_usage_ String No Instance instance Specifies the instance that describes characteristics of the bitmap information to be captured Either mfpadr_infile must be specified or there MUST be entries in each of the following fields mut_description_instance addr_scram_instance dgen_instance bitmap_usage_instance mut_topology_instances June 1995 4 2 23 Memory Fail Processing Templates Table 4 2 8 MFP Setup Template Parameters Continued Insted Prompt Parameter MUT Topology Instance s mut_topology_ instances Data Type List of strings Entry Required No J990 Series Programmer s Manual Description Specifies the instance s that describe MUT topology Either mfpadr_infile must be specified or there MUST be entries in each o
252. main patgen TT_CM_PATGEN1 salt patgen The param int arguments are copied in the order they appear as arguments 4 to n 4 where n is the number of param int arguments The scaling function call will then look something like this where v1 to vN are values to bind to a1 aN lt mpgset gt _update TT_VEC_SVM_DOWNLOAD_IMAGE TT_VEC SVM DOWNLOAD IMAGE TT_CM_PATGENO vl V2 ET Mom re try SUN gt There are several ways to alter the pattern set by the first argument to this function If the download image is changed TT VEC SVM DOWNLOAD IMAGE the function can be executed at any time If the SVM image is changed TT _VEC SVM ONLY it should be done after the pattern is loaded In an on _patgen start function or after a writesys select_pattern 1 8 20 June 1995 J990 Series Programmer s Manual Creating Pattern Database Files Example test svmadr import param int xmin xmax ymin ymax mpgset Scan vector form xreg xmin yreg ymin loop xmax xmin ymax ymin 1 rep xmax xmin ymax ymin 2 1 workspace wspadr job Four_Meg_DRAM Scan_update o func_Template t include Scan_update h xmin 1023 xmax 1023 ymin 512 ymax 512 Scan_update TT_VEC_SVM_DOWNLOAD_IMAGE TT_VEC SVM DOWNLOAD IMAGE TT_CM_PATGENO xmin xmax ymin ymax June 1995 1 8 21 Creating Pattern Database Files J990 Series Programmer s Manual Content
253. mbling The act of converting physical addresses internal or patgen addresses to scrambled addresses device pin addresses The is done in hardware by the address scrambler 1 4 4 June 1995 J990 Series Programmer s Manual Creating MUT Database Files Address Identifiers Teradyne has devised certain address identifiers which will be used when actually writing a mutadr file pro prN are identifiers for physical row address bits There is a system defined relationship between these identifiers and the X address bits generated by the patgen i e xO prO etc These are the non scrambled row address bits pc0 pcN are identifiers for physical column address bits There is a system defined relationship between these identifiers and the Y address bits generated by the patgen i e yO pc0 etc These are the non scrambled column address bits contents of the Mutadr File The MUT database is defined with the ADR mutset statement inside a mutadr file Multiple mutset statements are allowed per mutadfr file The use pinset statement must appear before any mutset statements in the file For more information regarding the syntax of ADR statements see the ADR900 Reference Manual June 1995 1 4 5 Creating MUT Database Files J990 Series Programmer s Manual Mutset Contents size shape address The MUT description is contained in a mutset statement which has different sections or clauses The clauses with
254. me func_Template EMP LATE_ID func_ Declare the name of the template for the test system Template Executive or operating system Line 6 21 Prebody Section Prebody Section Lines 6 21 Line Code Type Description 6 TEMPLATE_PRE_BODY_BEGIN Macro Mark the beginning of the Prebody section func_Template Lines 7 19 hold one time setup information that is loaded during the preprocessing stage re IB_TEMPLATENAME Macro Initialize the template name for the Executive and template software 8 IB_TIMER Starts a timer that measures the execution time of the TLIB_STARTIME prebody and datalogs the results 1IB_PRE_BOD 9 TLIB_LEVEL levels Select a new levels object defined in the workspace file 10 TLIB_WAVEFORM waves Select a new waveform object defined in the workspace file 11 TLIB_CALDATA calset Select a new calset 12 TLIB_AUTOTITLE autoti Print the template and instance names in the test program tle datalog if autotitle parameter is yes 13 TLIB_TITLE title Print the current instance s title parameter 3 2 14 June 1995 J990 Series Programmer s Manual Customizing Templates Prebody Section Lines 6 21 Line Code Type Description 14 TLIB_PRETEST pretest Macro Set up the calling of a function C function returning an integ
255. me cycle lO The eight state model described on page 2 1 32 does not provide SCIO operations To achieve SCIO the IO channel formatters are put into SCIO mode This mode changes the eight state model inside the formatters enabling SCIO The commands for enabling the modes are scio validor scio midband These commands appear in the waveadr database Once one of these modes is selected a new eight state is selected as shown in Table 2 1 6 below Table 2 1 6 Eight State Model Valid Bit Assignments Programming IO Channel State Symbol drive 0 expect 0 drive 0 expect 1 drive 0 expect valid midband drive 0 expect don t care drive 1 expect 0 drive 1 expect 1 drive 1 expect valid midband drive 1 expect don t care a If scio midband is selected then midband replaces valid as shown in parenthesis in this table Once the desired SCIO mode is selected the source for the bits must be selected Examining Table 2 1 6 suggests what the proper arrangement should be Bit 0 selects between expect 0 and expect 1 This choice is a data generation choice Therefore bit O should have the ADS bus as its source Bit 1 selects between data and don t care or valid This distinction is programmed in the pattern Therefore bit 1 should be sourced from the SVM Bit 2 chooses between drive 0 and drive 1 This is a data generator consideration Therefore bit 2 should be sourced from the ADS bu
256. mented as standard ADR900 style translators which will create a DB file from an ASCII file or vice versa The user may translate when off line using ADR900 When used on line with MFP templates the ASCII file may be specified as an input file and translation will be automatic when the ASCII file is newer than the database file The file extensions are mfpdb for the database file and mfpadr for the ASCII file The ASCII file contains pin names and pseudo sites This allows the same ASCII file and mfpdb to be used with different chansets for the same program and the same ASCII file can be used on N or fewer real sites Hardware Initialization Prior to setting up hardware it is necessary to ensure that unprogrammed hardware hardware not being used by this job is not going to interfere with capture or scan operations For example if a Catch RAM slice is not used but its Scan Enable and Scan Compare registers are set to an arbitrary value then data from that unused slice could be ORed with data from a used slice during a scan operation The MFPHLD drivers are used to do the initialization The initialization is not automatic General ASCII File Layout Inside an hldset statement all entries are optional at least one is required Inside any one of the sub statements all entries are optional at least one is required 4 4 12 June 1995 J990 Series Programmer s Manual Memory Fail Processing Low Level Programming
257. meters listed in order of appearance in Insted Table 4 2 6 MFP MUT Topology Template Parameters Entry Insted Prompt Parameter Data Type Required Description Which Patgen patgen Integer No Specifies which patgen MPG defaulted scrambler will be used Choices are 0 Main 1 Alt and 2 Both Default 2 Both Patgen X Y Bit x_y_bit List of strings Yes Bit table data column 1 fields Lists patgen X Y bits and I O select bits For each x_y_bit entry there must be a corresponding entry in h_v_expr Expression of h_v_expr List of strings Yes Bit table data column 2 fields H V Bits Lists expressions of H V bit determining values for the corresponding patgen X Y or I O select bits H V bits are from the horizontal and vertical addresses on the bitmap display For each x_y_bit entry there must be a corresponding entry in h_v_expr June 1995 4 2 15 Memory Fail Processing Templates J990 Series Programmer s Manual Example The following example instances show programming for MFP MUT Topology Template The topologies are included as comments in the beginning of each instance d12X 10Y x8 topo block instance mfp_ mut topology Template define instance d12X 10Y_x8_ topo block mfp_ mut_topology Template H Y 0 1k 0 1k 0 1k 0 1k 1k 0 1k 0 1k 0 1k 0 0 i l i l
258. mfp_save_fail_cnt function described below was called The function returns an integer The syntax for this function is tt_mfp_get_saved_fc tt_mfp_save_fail_cnt This function call is used to save display processor hardware fail counts for use by bitmap or other programs before the hardware value becomes invalid The syntax of this function is tt_mfp_save_fail_cnt fc The fc argument is an integer fail count This function call is of type void If the user is doing bitmap interposing for scan the fail count should be read from hardware with the tt_mfp_get_fail_cnt command and then the value obtained should be saved with tt_mfp_save_fail_cnt This will make the value available for use by Bitmap in interactive mode June 1995 4 4 9 Memory Fail Processing Low Level Programming J990 Series Programmer s Manual tt_mfp_disable_catchram This command disables capture on all Catch RAM slices The format for this function call is tt_mfp_disable_catchram tt_mfp_disable_fmm This command disables FMM fail map memory channels The format for this function is tt_mfp_disable_fmm tt_mfp_set_data_mux This function is used to select ADS input bits for each multiplexer on a IO channel There are two versions of this function call one based on piks pin index keys and the other based on pins These function calls take advantage of the C function overloading feature the correct function w
259. mment nil pause nil pins form pin power seq VCC 1 pause lms INPUTS 2 DQS 3 eqset levels_eqns default vch nil vcl nil voh nil vol nil vt nil ioh nil iol nil equation form pin tvil vih INPUTS vil WV DQS iin ol a Vih voh Voh vol Vol ioh Ioh 101 Tol rte Maths VE 2 021 Vite Wa veh Voh 0 7 vol Vol 0 7 default vs form pin main salt VCC MVCC MS Or CC 30 01 0 27 ilimit 300ma 1 6 4 June 1995 J990 Series Programmer s Manual Creating Waveform Database Files Introduction Chapter 1 7 Creating Waveform Database Files Objective Create waveadr and wavedb files Reference ADR900 Reference Manual Programmer s Guide to the Hardware To manipulate the timing edgeset hardware based on device specifications a set of waveform equations is used These equations calculate test system timing values based on data from the specification databases set the patgen mode and set pin modes to be used for a patgen burst These equations and mode definitions are put into waveform equation databases Each pin or pin symbol can have multiple timing values and typically one format that can be programmed for each edgeset In addition the refresh interval period value is programmed by specifying an equation in the waveform database The waveform databases can be created using one of four methods O Creat
260. mmer s Guide to the Hardware section Functional tests verify that the device operates as described in the manufacturer s data sheet To perform a functional test patterns of low and high voltages interpreted as logical zeros and ones are placed on device input pins and the subsequent voltages on device output pins are measured and reinterpreted as ones and zeros If the device is functioning properly each input pattern should produce a given predictable output pattern when the memory under test is read back By using a correctly designed series of input patterns every cell of the device can be verified as operating correctly In theory a very large number of different and useful functional tests could be performed on a memory device Time and cost however require that functional tests be as efficient as possible Balancing these objectives can be a challenging part of test engineering design and should take into account the probable failure modes of the device and the consequences of not detecting a failure versus the economics of more testing Let s examine the basic components that make up the functional system To perform a functional test on a device the tester must provide O A voltage source to power the device O An input system to propagate patterns at the proper voltage levels An mechanism to test device output detect errors and process failures Functional testing resources are shown in Figure 3 1 3 Knowledge
261. mmer s Manual Note Contents of the Pinaadr File Another database the channel database will actually assign the device pin names to the tester channels This is covered in the next chapter The pin database is usually associated with a certain device package style as it also contains the physical package pin names and numbers For this reason a pin database may be desired for each package style a device will be tested in The pin database can be created using one of two methods O Create an ADR file pinadr containing the pinset statement using a text editor such as vi or Sun s Textedit Then translate the ADR file into binary database file pindb using adr900 O Use the ADRedit tool to both create and translate the ADR file ADRedit can be used to modify an existing ADR file start with the pinadr framework or create a new file ADRedit provides a button to perform the translation and move the cursor to the line in the file where translation errors are encountered For the pinadr file the translator also generates a h file that contains import statement references to the pin names This file is included in source code t modules that need to reference the pin symbols The pin database is defined with the ADR pinset statement inside a pinadr file One pinset statement is allowed per pinadr file Within the pinset statement there is typically a pin form clause for identifying individual pins and a group form
262. mpgset dgenset 7srcset smutset June 1995 1 10 9 Creating Workspace Database Files job Dx4J end of workspace adr file J990 Series Programmer s Manual wave_timing_70ns wave_timing_80ns wave_timing_nominal nominal_levels spec_levels i leakage_levels 7 waveform waveform waveform level level level power_off_levels level min_vcc_nom_levels level march_patt R scan_patt 7 addrcompl_patt k vcc_bump_patt 7 read_write_loop_patt pattern pattern pattern pattern pattern refresh_loop_patt pattern refresh_ test _patt pattern diMx4_pins gt d1 1Mx4j_chans A dx4 insadr pinset chanset insadr 3997 templates libtemplates o 3997 etc exec_inst ances insadr 43997 lib libexec_templates o main o flow adjust_spec o tflags lflags 1 10 10 June 1995 J990 Series Programmer s Manual Creating Instance Database Files Introduction Chapter 1 11 Creating Instance Database Files Objective Create insadr file Reference Template Programming Section 3 of this manual Template Reference Manual ADR900 Reference Manual 1G900 Tools Reference Manual Teradyne provides several test templates which are sets of instructions for performing specific tasks or tests The templates are executable test code without the needed parameters or test conditions When using the test templates the parameters for the templates a
263. n Template Code Overview There are several different symbols and languages that work together to form a template 1 AT900 statements 2 C C code 3 Teradyne Tlib h macros already defined for the user 4 Template library calls variables for the user Teradyne macros are various combinations of code created to make template writing easier and less error prone These macros are for the most part one for one substitutions done by the preprocessor during compiling or calls to Teradyne functions performed during compiling Macros often begin with TEMPLATE_ TLIB_ or TT_ and are always upper case The library of variables and functions are predefined by Teradyne When a program is compiled variables insert values and functions insert sets of code Teradyne variables often begin with Tlib_ 3 2 10 June 1995 J990 Series Programmer s Manual Customizing Templates As separate C and test system manuals provide comprehensive documentation on the AT900 and C statements available for the user this chapter focuses on creating templates using AT900 and the template macros and library calls Teradyne strongly recommends that a parameter used for the same purpose as a parameter in the Teradyne standard templates should use the same name so as to present a consistent template interface FUNC_TEMPLATE T The t file for the Func Template is shown on the following two pages June 1995 3 2 11 Customizing Templates J990 Series P
264. n Boards which are knows as Hex Channel Slice or HCS boards on the J994 Each J994 WaveGen board contains 16 IO channel slice Each slice off these WaveGen boards generate signals for a single IO channel Like the other members of the J990 series there is 2 1 40 June 1995 J990 Series Programmer s Manual Programmer s Guide to the Hardware a one to one relationship between the slices on the WaveGen board and the slices on the IO Channels WaveGen HCS boards are located in the mainframe and IO channels are located in the test head Each IO slice has independent timing format and error logic control wid Ghannel 10 Channel Board IO Slice IO Channel IO Slice IO Channel IO Slice IO Channel IO Slice IO Channel IO Slice IO Channel IO Slice IO Channel e gt IO Slice IO Channel IO Slice IO Channel e gt IO Slice IO Channel e gt IO Slice IO Channel e gt IO Slice IO Channel e gt IO Slice IO Channel e gt IO Slice IO Channel e gt IO Slice IO Channel e gt IO Slice IO Channel IO Slice IO Channel Z 5 6 Aa 9 IO Channel WaveGen Boards x 16 Channels per board 144 10 channels Figure 2 1 34 J994 IO Channel Fanout June 1995 2 1 41 Programmer s Guide to the Hardware J990 Series Programmer s Manual Drive Only Channel WaveGen Fanout J997 J994 and J993 For all members of the J990 series
265. n at HiZ Drive Cycle Figure 2 1 30 Zstate d3 off d2 Waveforms These modes are selectable in the waveform database by using the io clause in the pins statement June 1995 2 1 31 Programmer s Guide to the Hardware J990 Series Programmer s Manual Pin Data Sources and Source Select Memory Introduction The 8 State Model for IO Channels In general there are two sources of data for the channels the Address Data Source ADS bus and the SVM The ADS bus is 32 bits wide and provides algorithmic data from the address and data generators Each 10 channel can select one or two of the 32 bits from this bus which can provide both the drive and expect data for the channel Drive only channels can select one bit from the ADS bus The SVM can also provide data for the channels The SVM pin data can be used to affect the driver logic state expect data drive compare mode and LoZ HiZ state O Upto three bits of SVM data can be used for the IO channel to selectively decode to one of eight states O Up to four bits of SVM data can be used for the drive only channel state Selecting the source of data either ADS bus or SVM is required for each channel being used This is programmed in the source select database srcadr scrdb files using the srcset statement The state of an lO channel in an individual cycle is determined by three bits These three bits are decoded into an eight state model The eight available states dep
266. n be manipulated by the database file This declaration must appear before any other statements in the file The range statement defines the pin driver level range that is to be in effect for this level set One of four level ranges can be selected for the drivers Since it takes 750 ms to alter the levels range changing ranges too frequently or using different ranges throughout your leveladr file will slow down your program The pins statement defines the sequence to be used when manipulating the pin levels The sequence is executed in increasing order when the VS level is increasing or power is being turned on and in decreasing order when the VS levels is decreasing Typically the power pin on the device should be programmed with sequence 1 and driver pins programmed with a higher sequence number Extensive information on power sequencing can be found in the J990 Series ADR Reference Manual in the Pins Statement description 1 6 2 June 1995 J990 Series Programmer s Manual Creating Level Database Files eqset statement The eqset statement contains all the level equations for each pin on the device Drive only and IO channels are programmed with the equation form clause and voltage source pins are programmed with the vs form clause Within the equation form drive only pins have only two levels values O vih driver high voltage O vil driver low voltage IO pins have both driver and comparator levels O vih driver
267. n interface board is not yet available This will enable program debugging before wiring an interface When the interface wiring is known the channel database can be updated with the correct information 1 3 4 June 1995 J990 Series Programmer s Manual Creating Channel Database Files Channel Database Example Quad Site 1Mx4 DRAM DIB comment d1Mx4j chanadr phys name column is the pac chosen to help with coax u under the sit particular channel that pin is wired to under the channels wer VSS gnd The intended sit oct 0 oct 7 oct 1 site 2 site 3 site 0 site 1 oct 4 OGE 5 oct 2 chanset d1Mx4j_chans comment OCR 20 OET locations on DIB illus nder name column is the name which will be used by this program column is the channel number DIB location for the kage pin designator number cable placement entry is shown just for documenting code it serves no purpose trated as follows Channels for 1Mx4 DRAM SOJ DIB default comment nil chan form name site0 sitel site2 site3 phys name signal DQO 200 376 204 380 Pin 1 DOI 201 377 205 381 Pin 2 WE 140 141 142 143 Bim 3 7 DS RAS 132 133 134 135 Pin 4 7 D1 A9 192 193 194 195 Pin 5 5 D2 AO 212 213 214 215 Bim 9 D7 Al 152 153 154 155 Pin 10 D8 A2 156 157 158 159 Pin 11 DI A3 208 209 210 211 Pa yl 2 D6 VCC 0 1 2 3 PTT LS
268. nce statement for each instance that was created This file can be edited using Insted or a standard text editor like vi 1 11 8 June 1995 J990 Series Programmer s Manual Creating Instance Database Files When creating new instances Insted should be used because it can show objects defined in the workspace When a single instance parameter is to be modified in the database file it may be quicker to just edit the insadr file with vi A sample define instance statement from an Instance database file is shown below This is only one portion of the insadr file define instance funct_nominal func_Template value patterns addrcompl_patt march_patt value stop_on_first_fail 0 choice no value dotests 1 choice yes value autotitle 0 choice no value tnum value trap value skip value driveroff value driverO value driverl value calset value waves wave_timing_nominal value levels nominal_levels value title functional test nominal conditions value patstop value patstart value postbody value prebody value posttest value pretest 7 Specify the Instance Database file in the job group in the workspace database O Use a text editor to edit the wspadr file and proceed to the group object for the job e Add the instance database file name as part of the job object enclosing the name in quotes e Add the template library file name as part of
269. nce control It executes locations in the pattern memory either sequentially or under patgen memory opcode control Opcodes include such commands as stop goto call return and the like The writesys patgen_start statement starts the pattern generator The pattern generator runs until a stop opcode is encountered in the pattern code or a stop condition specified in the background template is encountered By default the test system CPU pauses in program execution until the pattern generator has stopped running In addition the pattern generator will stop on first fail You can override both of these defaults however For more information regarding this please see the AT900 Reference Manual for documentation concerning the writesys patgen_start writesys patgen_stop_mode and writesys patgen_stop statements as well as the background conditions template June 1995 3 1 15 Using Templates J990 Series Programmer s Manual Timing System The timing system places edge transitions and timed strobe points at programmable locations in the waveform Programmable edges for timing purposes are t0 a tester reference point for each pin from which edge transitions are measured One period is the time from any t0 to the next tO DO the leading edge in a waveform transition to form the surround data for a return type format It does not need to be the same as t0 D1 the leading edge in a waveform transition The D1 edge c
270. nctions Selection of a location of the pin data source select RAM Data generator set and group selections Edgeset address location selection Error processing control bits for Catch RAM and display processor Channel data pin state for each pin The pattern controller operates at 100 MHz with unrestricted operation The SVM is distributed throughout the system Some SVM hardware is contained on the pattern generators some on the memory patgens and some is present on the waveform generators The pattern controller also selects which device voltage source level either main or alternate will drive the device This is used for VS bump testing The channel data controls the pin state on a cycle by cycle basis For IO channels this pin state data includes drive and compare modes For drive only channels this channel data consists of logic state data for the driver The source selects will determine how this pin state data is used June 1995 J990 Series Programmer s Manual Programmer s Guide to the Hardware OPCODE OPERAND ADDR PRESET PRESET ALU ADDR PRESET DATA CHANNEL SRC EDGE ERROR CNTR ENABLES REGS CNTL SRC BUS DATA SET DATA SEL SET PROC CONTROL SELECT GROUP per ADDR CNTL dgen scram VO drv 7 bits 28 bits 24 bits 2 bits 32 bits 22 bits 8 bits 8 bits 4bits 3 bits 3 bits 4 bits 4 bits 5bits 7 bits OR m gt enable preset
271. nd the secondary so that the FVM fail vector memory will denote failures from either channel as being from the same device pin For example DQO 200 primary channel for DQO DQ 0 201 Secondary channel for DQO The mfpadr file consists of a set of MFP template instances This section discusses the support for dual MPG that is built into these templates MFP Address Scrambling Template Template Parameter Description Selects which MPG Options are Main 0 Alt 1 or Which Patgen Both 2 In dual MPG mode Both is the appropriate choice since address scrambling will be the same for both MPGs An address pin will be entered for each address bit that goes to the DUT during a single patgen cycle Address Pin Names Therefore dual MPG requires that each address pin be listed twice once for early half and once for late half of the cycle Acutally refers to whether we are programming the X half 0 or Y half 1 of the cycle for format muxing For dual MPG we will refer to it as early half 0 and late half 1 Cycle Position An expression of patgen bits that will correctly Scramble Expression program this address pin during the selected half of the cycle June 1995 Using Dual MPG Mode J990 Series Programmer s Manual Sampie MFP Address Scrambling instance define instance mfp_addr_scram mfp_addr_scram_Template value patgen 2 choice Both value addr_pins AO Al A2 A3 A4 A5 A6 A7
272. ne 1995 J990 Series Programmer s Manual Memory Fail Processing High Level Programming Introduction Hidsets ADR Files Chapter 4 3 Memory Fail Processing MFP High Level Programming The Bitmap program together with MFP template instances can be used to capture fail data in the Catch RAM and display the data in bitmaps This approach was explained in Chapter 4 2 An alternative users may want to consider is to use a job driven approach for capture and scan operations This chapter will describe high level function calls and provide examples of their usage High level function calls often assert send to hardware several hidsets when they are called Hidsets provide grouping within the mfpadr file and the mfpdb database of related hardware areas For instance in the setups generated from template input one hidset contains scramble RAM contents multiplexer settings and ADS assignments since all of these things are interrelated Hldsets appear in the MFP ADR database and can be auto generated from template instances created by modifying auto generated ADR databases or created completely from scratch When the template input or high level function calls are not flexible enough to meet the user s needs a custom ADR file can be used Generally when you need to create a custom ADR file start with a MFP Setup template and request that an ADR file be generated based on values in those instances The generated ADR file can t
273. ng Templates Description Pin table data column 2 fields For IO pins specifies the connections to the dmux0 and dmux1 inputs dmux1 is generally used only for SCIO or mach2 For drive only pins specifies the connections for the X and Y halves of the channel Choices are 0 dmux0 1 dmux1 For each data_pins entry there must be corresponding entries in suffix dgen and topo_inv_expr Which Dgen dgen List of Yes integers Pin table data column 3 fields Specifies the data generator connection for each pin in data_pins For each data_pins entry there must be corresponding entries in suffix dgen and topo_inv_expr Choices are 0 dgen 0 1 dgen 1 Invert Expression topo_inv_expr List of strings Yes Pin table data column 4 fields For each data_pins entry there must be corresponding entries in suffix dgen and topo_inv_expr Contains quoted strings giving a topological inversion expression for each pin in data_pins topo_inv_expr may be 0 to indciate no inversion June 1995 4 2 11 Memory Fail Processing Templates J990 Series Programmer s Manual Example The following example instance shows programming for MFP Dgen Template d12X 10Y x8 dgen instance mfp_ dgen Template define instance d12X_10Y_x8_dgen mfp_dgen_ Template value value patgen 0 choice Main value data_pins DOS value suffix 0 value dgen 0 value topo_inv_ex
274. not required If no bus is selected the driver will default to ads sec Ol addr may be 0 through 16 383 may be a LIST or a RANGE Ol data may be 0 through 16 383 may be a LIST or a RANGE y scram form The y scram form is used to program the contents of the y scramble RAM Address followed by a stream of data 4 4 16 June 1995 J990 Series Programmer s Manual Memory Fail Processing Low Level Programming The following is an example y scram form bus addr data ads 2048 5 4 3 2 1 0 Required fields include addr and data O bus may be ads sec or ads sec bus can be defaulted and is not required If no bus is selected the driver will default to ads sec addr may be 0 through 65 535 may be a LIST or a RANGE Ol data may be 0 through 65 535 may be a LIST or a RANGE outmux form The outmux form is used to program the scramble RAM output multiplexers also may be viewed as the ADS BUS input multiplexers Any multiplexers not programmed will be set to ZERO by default The following is an example outmux form bus mux bit ads 0 sx0 ads 1 sy0 Required fields include mux and bit O bus may be ads sec or ads sec bus can be defaulted and is not required If no bus is selected the driver will default to ads sec O mux may be 0 through 31 If a muxer is not mentioned in this form it will be set to ZERO bitmay be sx0 through sx
275. ny loops described later on Line 36 is divided into three sections 1 V patterns T tnum defines the initial states for the fields in the executed instance 3 2 16 June 1995 J990 Series Programmer s Manual Customizing Templates 2 HASVALUE V declares that if V has a value then go to the next line If there are no patterns or all of the patterns values have been already analyzed then go to the end of the for function line 108 3 NEXT V NEXT T are increment instructions to select the next patterns and tnum value from the instance loaded in memory after the main forloop has been executed Below is a description of each line in the main for function of func_Template t Please note that the missing lines are beginning or end braces in the code Main FOR Function Lines 35 108 Line Code Type Description 35 for V patterns C See page 3 2 16 T tnum HASVALUE Macro NEXT V NEXT T 36 if dotests If the dotests parameter value is 1 true in the instance go to the next line if not go to line 46 37 if HASVALUE If the tnum parameter value exists in the instance then go to the next line if not go to line 41 38 if T gt 0 C If T is greater than 0 execute the next statement if not go to line 46 39 writesys testnumber T AT900 Write the tnum value to the Executive for datalogging 41 else i
276. of these resources is required before functional tests can be written Each is discussed in the section that follows June 1995 3 1 13 Using Templates J990 Series Programmer s Manual Pattern Generator Voltage VIH Source Channel Data Memory Pattern NN SENTE Driver Disable Y AN N AN N Address N NN N NS Edgeset Y Y Memory N N N NN N AN N AN Data Timing Format IOH N AN N Formatter Waveform 7 Generator VT Dynamic Load Compare Logic IOL Error Detection amp e CR POR Strobe Fail Processing vVOoL Figure 3 1 3 System Basic Functional System Voltage Source The J990 Series Memory Test Systems vary in the number of voltage sources they have The Square headed handler systems have 32 voltage sources and the Round headed prober systems have 16 voltage sources Voltage source connections are hardwired on the device interface board DIB with force and sense lines tied as closely as possible to the power pin s to provide a Kelvin connection Each voltage source has a programmable current limit 3 1 14 June 1995 J990 Series Programmer s Manual Using Templates Input Data and Levels Pattern Memory Pattern Generator The system hardware must deliver waveforms to input pins with the precise waveshape voltage levels and transition timing edges specified by the device data sheet Waveforms are usually divided into the data
277. ogrammer s Manual Using Templates Functional Electronics Aco vcc Voltage Source Figure 3 1 5 System Hardware Connections Prior to DC Testing In general to perform a DC measurement on a signal pin Program the pin PMU force and measure conditions Connect the pin to the pin PMU Perform the test PO D Reconnect the pin to the functional electronics June 1995 3 1 27 Using Templates J990 Series Programmer s Manual Leakage Instances The following are example instances as they appear in ADR syntax These examples show input and output leakage tests Instance Example define instance input_leakage_ganged pin_pmu_Template value sequence 0 choice ganged value lolimval value hilimval value levels leakage_levels value lolimspec IL_1o value hilimspec IL_hi value fload 0 choice off value mpause 0 015 value irange 15 choice 20UA value measure 1 choice Current value autotitle 0 choice no value forceval2 5 5 value forcevall 0 value pinlist INPUTS value pretest value posttest value prebody prebody_function value postbody postbody_function value patstart value patstop value title value title2 value waves value calset value driverl value driverO value driveroff DQS value beforepat value duringpat value waitflagstrue value waitflagsfalse
278. ogy instance is specified a default one will be generated which will lay out lO s side by side June 1995 4 2 1 Memory Fail Processing Templates J990 Series Programmer s Manual MFP Address Scramble Template The MFP Address Scramble Template Pin Table Parameters MFP Address Scramble Template Insted name mfp addr_ scram Template contains address scramble information for the memory under test This template is based on per address bit equations and is appropriate for devices where the number of rows columns or IOs are powers of two MFP Address Scramble Template contains an Insted table that lists an equal number of Address pin names Cycle positions Scramble expressions Each horizontal line in the table represents scramble information for one cycle of each address pin listed in column 1 of the table MFP Address Scramble Template has the following parameters listed in order of appearance in Insted Table 4 2 1 MFP Address Scramble Template Parameters Insted Prompt Which Patgen Entry Parameter Data Type Required Description patgen Integer No Specifies which patgen MPG defaulted scrambler will be used Choices are 0 Main 1 Alt and 2 Both Default 0 Main Address Pin Names addr_pins Pinlist Yes Pin table data column 1 fields Lists pin names for which scramble information is provided For each addr_pins entry there must be corresponding ent
279. on TEMP LATE_BODY_BI Mark the beginning of the Body section func_template Pattern V Declare that V is a pattern object Pattern S Declare that S is a pattern object Declare that P is a pin symbol which can be a list of device pins or a pin group Int T Declare that T is of Teradyne integer data type Instance IP Declare that lp is a pointer to an instance int flag Declare flag as an integer type int failflag Declare failflag as an integer type LIB_TIMER TLIB_STARTIME Starts a timer that measures the execution time of the TLIB_BOD body and datalogs the results Ip readsys instance Load the instance in the pointer location lp and assign it to Ip if HASVALUE prebody If a function exists in the prebody parameter of the current instance go to line 34 if not go to line 35 prebody Execute the function specified by the prebody parameter in the current instance 34 flag 0 C Declare that the variable flag is equal to zero or false Main FOR Function Line 35 for V patterns T tnum HASVALUE V NEXT V NEXT T The next line is the beginning of a for function Line 35 analyzes the current instance loaded in line 31 It uses the values in the instance s patterns and tnum fields to determine the outcome of conditional code which activates various statements The for function holds ma
280. on in an extern block This means that the function de inition is preceded by extern Cc and followed by an extra closing 4 2 20 June 1995 J990 Series Programmer s Manual Memory Fail Processing Templates Example The following example instance shows programming for MFP MUT Topology Template 2 mfp_mut topology low level instance mfp_mut_topology 2 Template define instance mfp_mut_topology_low_level mfp_mut_topology_2 Template value patgen 0 choice Main value width 1152 value height 256 value addr_func mfp_hv_2_xyb_func value x_in vO vl v2 v3 v4 v5 v6 v7 value y_in h0 hl h2 h3 h4 h5 h6 h7 h8 h9 h10 value unscram_in value x_out px0 pxl px2 px3 px4 px5 px6 px7 value y_out py0 pyl py2 py3 py4 py5 py6 iob0 iobl iob2 iob3 e unscram_out Example The following example shows a user function for a nine IO device where each IO is to be displayed side by side for a given Y address before proceeding to the next Y address extern C int mfp_topol TT_MFP_Hv hv TT_MFP_XYB xyb xyb gt x hv gt v xyb gt b hv gt h 9 xyb gt y hv gt h 9 return 0 June 1995 4 2 21 Memory Fail Processing Templates MFP Setup Template J990 Series Programmer s Manual MFP Setup Template Insted name mio setup Template lists all MFP instance references that describe device and hardware conditions for one capture setup Parameters in Insted Table 4
281. ons It has a frequency of 60 120 MHz and support 72 lOs and 320 address clock channels per test head Up to 16 sites per test head can be tested on a J993 Another version of the J993 the J993 01 can support 32 sites per test head June 1995 J990 Series Programmer s Manual Programmer s Guide to the Hardware The J994 the third member of the series also shares the same system architecture but it is optimized for high volume package testing applications Unlike the J997 and J993 which have round heads the J994 has a square test head which can be configured with up to 144 IOs per test head and 640 address clock drivers Two test heads can be installed ina system Each of these test heads can test up to 32 devices in parallel The drive only channels in the J994 utilize a site PMU instead of a pin PMU The J994 is a 60 120MHz system System Frequency Modes 100 MHz Mode main patgen control EM High Speed Bus 100 MHz A Path amp B Path Buses 60 MHz each memory address patgen scrambler The systems have the flexibility to operate at a standard speed and in a high speed mode they can also operate synchronously and asynchronously These modes include O Normal 100 MHz mode or Normal 60 MHz mode O Dual Synchronous 200 MHz mode or Dual Synchronous 120 MHz Mode Dual Asynchronous Mode Each of these modes is described briefly in the next few pages When the system is operating in the 100 MHz mode J997 two
282. opriate pattern from the pattern memory It may be necessary to create a pattern with an infinite loop to ensure continuous execution of the pattern generator 3 Program the PMU to the appropriate force value and specify high and low pass limits Start the pattern generator Program a minimum pause time 1ms or less This additional time may be required to charge the bypass capacitors Perform the test Stop the pattern generator 3 1 34 June 1995 J990 Series Programmer s Manual ICC Instances Instance Examples The following are example ICC instances define instance icc_ras_refresh ivs_ Template value mpause 0 value duringpat refresh_ loop patt value lolimspec value hilimspec Iccr value lolimval 0 001 value hilimval value forceval 5 5 value ivspin VCC value irange 0 choice 1 A value samples 10 value waves wave_timing_nominal value levels icc_levels value autotitle 0 choice no value main_alt 0 choice main value forcespec value tnum 103 value floatpins value waitflagsfalse value waitflagstrue value beforepat value driveroff value driverO value driverl value calset icc_level_cal value title value patstop value patstart value postbody postbody_function value prebody prebody_function value posttest value pretest Using Templates June 1995 3 1 35 Using Templa
283. or 5 7 4 programming with 5 7 7 Srcadr programming for 5 7 13 Svmadr programming for 5 7 13 timing edges 5 7 10 waveadr programming for 5 7 70 wspadr programming for 5 7 78 dual patgen definition of 5 7 7 duringpat instance parameter 3 1 36 dynamic current load 2 1 51 dynamic load circuits 3 1 17 3 1 26 programming 3 1 19 E edge strobe 3 1 17 3 1 18 defined 3 1 18 edge transitions See timing edges t1 timing edge t2 timing edge t3 timing edge eqset statement 1 1 5 1 1 6 1 6 1 1 6 3 equation form 1 6 3 error detector 3 1 13 3 1 17 example flow file 7 72 4 EXECUTE macro 1 12 2 Executive 1 1 3 F fail processor 3 1 13 3 1 17 FAIL_DO macro 1 12 3 FET matrix 3 7 25 fload instance parameter 3 1 9 flow control 7 7 7 1 1 3 1 12 1 for function 3 2 16 forcespeci instance parameter forcespec2 instance parameter forceval1 instance parameter 3 format Muxing 2 1 24 formatting system 3 7 15 3 1 16 3 1 17 func_Template 7 77 3 functional system 3 1 13 3 1 26 with leakage tests 3 1 27 functional tests 3 7 73 G guidelines for timing 2 2 7 H h_v_expr parameter 4 2 15 Hazards 5 1 20 high impedance output current leakage 3 7 24 See also leakage tests hilimspec instance parameter 3 7 30 hilimval instance parameter 3 7 9 I O switching with t3 timing edge 3 7 76 ICC tests 3 1 31 static 3 7 31 3 1 33 with current monitor 3 1 31 3 1 32 with system PMU 3 7 37 3 1 33 impedance lock 2 7 57 import
284. pec form symbol description Ioh Output High Current format 6 1 Iol Output Low Current format 6 1 Icc Operating Current Random Read Write Iccs Standby Current Icclp Low Power Standby Current Iccr RAS only Refresh Current Iccp Page Mode Operating Current default format 6 3 units uA devspec yes comment nil item nil spec form symbol description Ii Input Leakage Current Io Output Leakage Current specset nom_levs comment Nominal Levels for Functional Tests default start 0 stop 0 from 0 to 0 ratio 0 seq order 0 min nil max nil backoff 0 result nil first fail resolution 0 5 log setup 0 method successive maxloops 25 set form symbol value Vcc 5 0 Vih 3 0 Vil 0 0 Voh 2 0 Vol 0 8 Ioh 3 0 Iol 25 05 Icc 80 Iccs 2 Icclp 1 Iccr 80 Iccp 60 Ii 0 Io 0 1 5 4 June 1995 J990 Series Programmer s Manual Creating Level Database Files Introduction Chapter 1 6 Creating Level Database Files Objective Create leveladr and leveldb files Reference ADR900 Reference Manual In order to manipulate the hardware based on device specifications a set of equations is used These equations calculate test system values based on data from the specification databases These equations are put into level databases for calculating pin and voltage source levels and waveform databases for calculating timing values This cha
285. ple will not be pushed on the stack because the eloop blocks the push attempted by the rep statement A stack underflow error will occur Another erroneous example is nested loops as shown below xreg XMIN yreg YMIN xa jam reg ya jam reg loop HEIGHT XLOOP write 0 loop WIDTH read 0 if flags goto OUT_OF_HERE write 1 ya inc eloop XLOOP inactive xa inc yreg YMIN ya jam reg eloop XLOOP OUT_OF_HERE Loop_pop loop_pop In this example WIDTH will not be pushed on the stack and a stack underflow error will occur Corrected Examples An approach that you can take if you want to loop back to a rep step is to adda SVM step before the rep step and loop to the earlier step An example of this is shown below loop YMAX dummy extra SVM step here read xa inc rep XMAX now repeat to XMAX read sya inc eloop 2 June 1995 1 8 17 Creating Pattern Database Files J990 Series Programmer s Manual A variant of this approach is shown next notice the change in the number of repeat steps loop YMAX read xa inc extra SVM step here read xa inc rep XMAX 1 repeat to XMAX 1 read sya inc eloop 2 For nested loops the best approach is to split the eloops so that each loop references a different VLABEL One approach using a dummy step is shown below loop YMAX XLOOP2 dummy extra SVM step
286. pr px0 4 2 12 June 1995 J990 Series Programmer s Manual Memory Fail Processing Templates MFP MUT Description Template MFP MUT Description Template Insted name mfbp_ mut description Template contains a description of the overall characteristics of the device including test system speed number of row and column addresses number of device outputs and a list of output pin names Parameters MFP MUT Description Template has the following parameters listed in order of appearance in Insted Table 4 2 5 MFP MUT Description Template Parameters Entry Insted Prompt Parameter DataType Required Description Tester Speed in MHz speed Integer No Specifies the test system speed defaulted Choi oices are 60 60MHZ 100 100MHz 120 120MHz 200 200 MHz Default 0 60MHZ for J993 J994 and J995 test systems This field is required and NOT defaulted for J997 test systems XY orientation orientation List of No Specifies XY orientation 0 normal Integers or 1 flipped Numer of X rows Integer No Specifies the number of X addresses addresses Supported only for backwards compatibility Number of Y cols Integer No Specifies the number of Y addresses addresses Supported only for backwards compatibility Number of Output num_outputs Integer Yes Specifies number of output bits listed Bits in Output Pin Names list Minimum 1 must be a power of 2 Output Pin N
287. pter discusses the level databases Each pin or pin group can have multiple level values that need to be programmed for example Vil and Vih Each value for each pin symbol can have an equation The level databases can be created using one of four methods O Create an ADR file leveladr containing pins and eqset statements using a text editor then translate the ADR file into binary database file leveldb using the ADR900 translator O Use the ADRedit tool to both create and translate the ADR file m Use the Calcsheet tool to create binary database files leveldb O Use the Calcsheet tool to create an ADR database file leveladr and manually translate it to create the binary Either of the first two methods is recommended for beginning programmers June 1995 1 6 1 Creating Level Database Files J990 Series Programmer s Manual Pin Levels Level Hardware Equations VS Hardware Device Level Specs Specification Equation Databases Databases Figure 1 6 1 Relationship of Levels Equations to Hardware and Software contents of the Leveladr File use pinset statement range statement pins statement The level database is defined with the ADR pins and eqset statements inside a leveladr file Only one pins and one eqset statement are allowed per file The use pinset and range statements must appear before the level definitions The use pinset statement effectively declares the pins that ca
288. r d1Mx4_mut mutset Here the refresh_loop_patt pattern is executed The next instance uses a read write loop pattern Both of these are patterns are pattern objects as defined in the group clause of the workspace database wspadr file For example The hilimspec and lolimspec parameters are described on page 3 1 30 The hilimval and lolimval parameters are described on page 3 1 9 the forceval parameter is described on page 3 1 9 Note however that this forceval refer specifies the voltage to be forced by the voltage sources not the pin PMU Voltage sources have a range of 20 0 to 20 0 volts value ivspin VCC value irange 0 choice 1 A value samples 10 The ivspin parameter is used to specify the pin on which current is to be measured and if specified the voltage is to be forced The pin named VCC in this case is defined in the pinset clause part of the pin database pinadr pindb The irange parameter is discussed on page 3 1 9 The samples parameter specifies the integer number of current samples to be taken by the current monitor Here 10 is specified Note that the default is 80 samples If this number is not desirable specify another number here The waves parameter is described on page 3 1 22 The levels parameter is described on page 3 1 10 The autotitle parameter is described on page 3 1 5 Marne Ome Choc eme Using Icc Instances The voltage sources can be programmed to
289. r example writesys spec_value SPEC waves newvalue Tlib_specs_modified 1 writesys spec_value SPEC waves restorevalue Tlib_specs_modified 0 June 1995 3 2 27 Customizing Templates J990 Series Programmer s Manual Tlib_set_pmu_ force bounds measure vrange irange This function which resides in Tlib o is used to set the maximum and minimum force values Tlib_maxforce and Tlib_minforce for given voltage and current ranges of the PMU The function is of type void and does not return a value Acceptable values for the function parameters are measure 0 measure voltage or 1 measure current vrange TT_PMU_RANGE_40V TT_PMU_RANGE_20V or TT_PMU_RANGE_2V and irange TT_PMU_RANGE_200MA TT_PMU_RANGE_20MA TT_PMU_RANGE_200UA TT_PMU_RANGE_20UA or TT_PMU_RANGE 2UA Tlib_pmu_rngstring measure irange vrange forcevalue This function is used to help print out information about errors in the force value of the PMU or pin PMU The function takes four parameters measure 0 measure voltage 1 measure current vrange TT_PMU_RANGE_40V TT_PMU_RANGE_20V TT_PPMU_RANGE_20V or TT_PMU_RANGE_2V irange TT_PMU_RANGE 200MA TT_PMU_RANGE 20MA GE GE TT_PMU_RANGE_2M TT_PPMU_RANGE_2 TT_PMU_RANGE_20 TT_PPMU_RANGE_200UA GE_20 NGE_2 GE_2U NGE_2 NG TT_PMU_RAN TT_PPMU_RA TT_PMU_RAN TT_PPMU_RA TT_PPMU_RA
290. r test flow For example EXECUTE init program variables The EXECUTE macro is used to execute an instance The EXECUTE macro is described in the AT900 Reference Manual June 1995 3 1 5 Using Templates J990 Series Programmer s Manual Continuity Tests Background Information Test Description This section provides a background discussion about continuity tests The following section will provide an example instance along with an analysis of the instance Continuity shorts and opens tests are tests for shorted and open connections within the device that is for excessively low impedance paths shorts and excessively high impedance paths opens to adjacent device pins power supplies and ground In addition shorts and opens tests identify electrical malfunctions in all parts of the test environment circuit the device the tester the DIB and the DIB to device interface probe card socket and handler contactors For these reasons test programs almost always include continuity tests at the beginning of the test flow These tests not only identify bad devices they screen out those circuits that have such gross defects that further testing would be a waste of time and money Continuity tests can be done using the functional hardware system or pin PMUs Sometimes a program will execute a small number of functional tests and if they pass it is reasonable to assume that the
291. rather than creating a new template from scratch WARNING NEVER MODIFY THE STANDARD TERADYNE TEMPLATES IN j99x TEMPLATES ONLY MODIFY A COPY 2 Edit the Teradyne template tdl file to meet the specific requirements for the custom template parameter list Always save the new template tdl file to another unique name 3 Runtd1_to_hon the new tdl file to create the h file for inclusion into the new template t file for the custom template tdl_to_h CUSTOMNAME_Template tdl The output file name will be CUSTOMNAME_Template h 4 Rename the template t file to a new filename t use same prefix as given to the tdl file in step 2 It is very important to not confuse the standard Teradyne templates with a custom template Edit the template t file to perform the requirements of the custom template Compile the new template t code with AT900 compiler For example at900 g c basic_func_Template t produces basic_func_Template o which is included in the job s workspace to be part of the test program If you did not add j99x templates into the path to include Tlib h into the t file then you should use the I 399x templates switch on the at900 command line to compile the t file 7 Place the new tdl h t and o files in a directory which can be accessed by the users of the system 8 Include the new o file in your workspace file wspadr Optional The default dl path for the Insted tool is j99x templates So Insted c
292. rcompl_patt stop_on_first_fail 0 choice no dotests 1 choice yes autotitle 0 choice no tnum trap skip driveroff driver0 driverl calset waves wave_timing_nominal ooo D D D o END OF FUNCT_SPEC_LE levels spec_levels title patstop patstart postbody prebody posttest pretest 3 1 20 June 1995 J990 Series Programmer s Manual Using Templates Notes Functional tests are implemented with instances of the func_Template Two sample instances of many are shown above a basic functional test instance and an instance that runs functional test with nominal spec levels The demo program contains several other functional test instances for your use ualticys Pop sone tims er IMOE chorceMnot value patterns march_diagonal_patt value dotests 1 choice yes The stop_on_first_fail parameter is a choice of yes or no If the template contains more than one pattern this parameter will determine if instance execution should stop after the first pattern failure The pattern parameter is used to specify the pattern name It is a pattern as specified in the group clause of the workspace adr file wspadr Here the instance march_diagnal_patt is the selected pattern This pattern is defined as pattern march_diagonal_patt march_diagonal startset dram_patterns 7 mpgset pattern_data dgenset srcset 7 srcset d1iMx4_ mut mutset
293. re are no opens or shorts This can be a desirable approach because a small number of functional tests can be executed faster than PMU tests If the functional tests fail however PMU tests would de required to determine which pins are shorted or opened This is the approach used in the d1Mx4 demo program it will be described in this section Most digital devices have their inputs and outputs protected by diodes connected to ground as shown in Figure 3 1 1 vcc AO GND Figure 3 1 1Static Protection Diode to Ground These diodes prevent static damage to the internal circuitry of the device This assumption is not valid for all devices however and care should be taken when adapting the sample program A device with analog inputs for example may not have static protection diodes at all and digital CMOS devices tend to have structures like that shown in Figure 3 1 2 June 1995 J990 Series Programmer s Manual Using Templates vcc AO GND Figure 3 1 2 Static Protection Diodes to Power and Ground Here static protection diodes are connected to the power bus as well as to ground In this case shorts and opens tests may need to be done twice reversing the voltage and current polarities to test the diode to the power bus PMU Shorts and Opens Test The pin PMU is commonly used to test for continuity In general the method is to force a small negative current on one pin while all other pins are held at
294. re specified by the programmer to create instances Instances are therefore fully specified tests These instances are executed in the test program to generate test results These sum of these tests constitute the program flow The databases created in the previous chapters contain test conditions These databases will be specified as parameters for the templates A single template or instance can be used multiple times within a test program June 1995 1 11 1 Creating Instance Database Files J990 Series Programmer s Manual Executable Test Conditions Test Code Instances Figure 1 11 1 Test Conditions Databases specdb leveldb svmdb etc and Executable Code templates Combined to Create Instances Creating Instance Databases Instances are usually created with Insted the instance editor and are stored in instance databases Instance databases are stored in ASCII form and are contained in files with the insadr extension Since the instance database will be created by Insted the procedure for creating the insadr file will be different from creating the test conditions databases In addition the test conditions will be used as parameters in the instance database Once the instance database file has been created it will be included in the workspace database for the test program The basic sequence for creating test instances is oO O Decide what tests are to be done and list the conditions
295. ries in suffix and scram_expression Cycle Position suffix List of Yes Pin table data column 2 fields integers Specifies cycle position X d0 d2 or Y d3 d5 half of pin for each pin in addr_pins For each addr_pins entry there must be corresponding entries in suffix and scram_expression Choices are 0 X 1 Y 4 2 2 June 1995 J990 Series Programmer s Manual Memory Fail Processing Templates Table 4 2 1 MFP Address Scramble Template Parameters Continued Entry Insted Prompt Parameter Data Type Required Scramble Expression scram_expression List of strings Yes Description Pin table data column 3 fields Contains quoted strings giving the scramble expression for each pin in addr_pins For each addr_pins entry there must be corresponding entries in suffix and scram_expression Each addr_pins entry must have a px or py term or an expression of them showing the patgen x and y bits to be mapped to that pin If no scrambling is desired use px0 for AO px1 for A1 etc June 1995 4 2 3 Memory Fail Processing Templates Example J990 Series Programmer s Manual The following example instance shows programming for MFP Address Scramble Template d12X 10Y x8 scram instance mfp_addr scram Template define instance value patgen 0 choice Main value addr_pins AO Al AS A6 AO Al A5 A6 A2 A7 A2 A7 value suffix 0 0 PRO
296. rnate_Template 7 77 4 pin_pmu_Template 7 77 4 pin index keys PIKs 2 7 52 pinlist instance parameter 3 7 9 3 1 30 pins statement 7 6 7 pinset statement 7 2 2 pinsets 7 7 5 PMU see pin PMU or system PMU postbody instance parameter 3 7 17 prebody instance parameter 3 7 77 program flow 1 11 1 create flow file 7 7 3 programmable current load 2 7 57 R rows parameter 4 2 13 runtime expressions 1 8 19 S same cycle IO 2 1 37 scaling functions 1 8 19 SCIO 2 1 37 SCIO mode 2 1 37 scram_expression parameter 4 2 3 SEC bus 2 1 7 sequence instance parameter 3 1 10 3 1 29 Shmoo 1 5 1 shmoo axis ranges 1 5 1 shorts and opens tests 3 1 6 3 1 19 with the system PMU 3 1 7 signal names 1 3 4 single patgen definition of 5 1 1 source select 2 1 35 source select bits 2 1 33 source select database examples 1 8 8 source select memory 2 1 32 source select RAM 2 1 33 spec limits 1 5 1 specification database example 1 5 4 specification database files 1 5 1 specset statement 1 1 5 1 5 1 1 5 2 1 5 3 specsets 1 1 5 Specsheet 1 1 4 1 5 1 speed parameter 4 2 13 srcset statement 1 1 6 1 8 6 start patgen statement 3 1 15 startset statement 1 8 22 startsets 1 1 6 stop_on_first_fail instance parameter 3 1 21 Subroutine Vector Memory SVM 2 1 8 suffix parameter 4 2 2 4 2 11 SVM database example 1 8 13 svmsets 1 1 6 system block diagram 2 1 2 system PMU 2 1 55 current range settings 3 1 25 described 3 1 25 voltage range setting
297. rogrammer s Manual include lt teradyne h gt include func_Template h include Tlib h static char templatename func Template EMPLATE_TID func_ Template EMPLATE_PRE BODY BEGIN func Template B TEMPLATENAME B TIMER TLIB_STARTIME TLIB_PREBOD B_ LEVEL levels AVEFORM waves ALDATA calset UTO E autotitle T R Ba E LIB fir IBL TLIB_POS LIB_PA LIB_PA IB_CHE title pretest EST posttest ART patstart OP patstop K_DISABLE Tlib_initialize siteset IB_TIMER TLIB_STOPTIME TLIB_PREBOD EMPLATE_PRE_BODY_END func_Template EMPLATE_ BODY _BEGIN func_ Template Pattern V Pattern S Pin P Int T Instance Ip int flag int failflag TLIB_TIMER TLIB_STARTIME TLIB_BOD Ip readsys instance if HASVALUE prebody prebody Ua H as AYA O1 amp NN DH Lo JO UT amp NH LO 1 d Q U NNN D HR N w N N U A WUWU GC ND ND ND DY LU OO J oO U1 amp N H CO I flag 0 for V patterns T tnum HASVALUE V NEXT V NEXT T if dotests if HASVALUE T if T gt 0 writesys testnumber T 40 41 else if
298. round data for a cycle The surround data depends on the channels format di d2 Starts gates the data for a cycle Ends the data for a cycle starting the surround data d3 Format mux edge used to switch to the second piece of data for a cycle Commonly used to switch to column address when address multiplexing d4 d5 Starts gates the second piece of data for a cycle Ends the second piece of data for a cycle and starts the surround data a The d2 edge ends the data gate except when using Mach2 mode in which d2 starts the second piece of data from the SVM The enabled modes for each drive only channel determines how many of the six available edges will be used in a cycle For example edges d3 d4 and d5 are only used when format muxing the channel IO Channel Edges Table 2 1 3 IO Edges Edge Description do Used to start the surround data or change the drive HiZ state for a cycle The surround data depends on the channel s format di Starts gates the data for a cycle d2 Ends the data for a cycle starting the surround data d3 Used to end the surround data or change the drive HiZ state for a cycle ci First strobe edge of comparator Used to start the window strobe for the channel c2 Second strobe edge of the comparator used to end the window strobe interval Used as the only edge in edge strobe mode 2 1 18 June 1995 J990 Series Programmer s Manua
299. rview Components of a Test Program Each test program consists of several files with various file extensions To better understand the process of creating a complete program the following list describes each of the file types that can occur and describes their contents Within each database file there is one or more sets which are database objects For each of these file types the adr version is the ASCII version and the db version is the translated binary form pinadr pindb Files with these extensions are pin database files that contain a list of pin types and pin groups These files are used by other modules which depend on it Database objects defined within these files are called pinsets chanadr chandb Files with these extensions are channel database files that contain the site device pin mapping to test system channels a representation of how the DIB is wired Database objects defined within these files are called chansets mutadr mutdb Files with these extensions are memory under test database files containing a description of the device They are ultimately used by the 1G900 Executive to program the address and data path within the test system including address scrambling and topo inversion Database objects defined within these files are called mutsets insadr Files with this extension are Instance database files containing the grouping of templates and parameters used by the test program Instance files are us
300. ry Change the current working directory to that place cd lt jobdir gt Run the applications script build_workspace to create a starting workspace ADR file The script will look at the contents of the ADR databases and the source code modules to determine what to put into the workspace It will create a file Workspace wspadr in the current working directory 3997 demo scripts build_workspace Edit the file Workspace wspadr to make it suitable for the desired test program Correctly name all level waveform pattern and job objects that are contained in the group form table It is recommended to use the ADRedit tool for this task Make sure all objects in the workspace have unique names This is a requirement Translate the Workspace wspadr file to create the Workspace wspdb file Resolve any translation errors by editing the ADR file then attempting translation again 2 adr900 Workspace wspadr Make note of all waveform objects level objects and pattern objects that have been created and defined in the workspace The names of these objects will be specified in the test program and instance databases Once the workspace database has been created changes or additions to the test program will most likely affect the workspace This workspace ADR file will be edited frequently as a test program is being developed For example a new pattern must be defined in the workspace if the test program will use it 1 10 6 June 19
301. s or sec rfl mux form The rfl mux form statement is used to program the region fail latch address bit selects for the A and B boards The following is an example rfl mux form module bus mux AO ads 0 BO ads sec al Required fields include module and mux O module may be one of AO A1 A2 A3 BO B1 B2 or B3 O bus may be ads sec or ads sec bus is optional and will default to ads sec by the driver mux may be 0 through 31 or ZERO 4 4 22 June 1995 J990 Series Programmer s Manual Memory Fail Processing Low Level Programming ra mux form The ra mux form statement programs slice to analyzer connections The following is an example ra mux form mux slice 0 0 Hd 2 Required fields include mux and slice Ol mux may be 0 through 71 O slice may be 0 through 38 or ZERO not including 9 19 or 29 which are hardware or ed with the previous mux 819 18 19 28 29 38139 ra form The ra form statement is used to program the redundancy analyzer controls The following is an example ra form analyzer start stop fault addr error counter cycle counter 0 0 1023 0 0 0 Required fields include analyzer and at least one of start stop fault adar error counter or cycle counter O analyzer may be 0 through 35 May be a LIST 1 3 5 7 or a RANGE 0 35 start may be 0 through 65 535 May b
302. s Therefore the appropriate source selects for SCIO would be ads vm ads However Figure 2 1 31 on page 2 1 33 shows that bit2 cannot be sourced from the ADS bus The solution is quite simple Use the eight state model lookup table to remap the bit assignments to swap bit 2 and bit 1 This is shown in Table 2 1 7 June 1995 2 1 37 Programmer s Guide to the Hardware Table 2 1 7 SCIO Eight State Remapping J990 Series Programmer s Manual Bit Assignments Standard Bit Assignments remap State State Bit 2 Bit 1 Bit 0 Bit 2 Bit 1 Bit 0 0 0 0 0 0 0 0 0 0 0 1 1 0 0 1 1 0 1 0 2 1 0 0 4 0 1 1 3 1 0 1 5 1 0 0 4 0 1 0 2 1 0 1 5 0 1 1 3 1 1 0 6 1 1 0 6 1 1 1 7 1 1 1 7 In Table 2 1 7 bits 2 and 1 in the standard mapping were interchanged in the remap With this remap the source selects can be set to vm ads ads The eight state lookup table would be remapped as The remapping is programmed in the srcadr database For example 0 to0 1to1 2 to 4 3to5 4to2 5to3 6 to6 7to7 srcset abc data map form IOS 076325410 ignore ads form IOS 00 2 1 38 June 1995 J990 Series Programmer s Manual Programmer s Guide to the Hardware Since either drive or detect data is needed for all eight states the ignore ADS bits cannot be used Therefore to prevent the data generator output from switching between valid and don t care states two source selects shou
303. s 3 1 25 with ICC tests 3 1 31 3 1 33 3 1 34 with leakage tests 3 1 24 3 1 25 with shorts and opens tests 3 1 7 T tO timing edge See period t1 timing edge 3 1 16 t2 timing edge 3 1 16 t3 timing edge 3 1 16 TEMPLATE_ABORT template macro 3 2 23 TEMPLATE_BODY_BEGIN template macro 3 2 22 TEMPLATE_BODY_END template macro DAP TEMPLATE_ID template macro 3 2 23 TEMPLATE_POST_BODY_BEGIN template macro 3 2 22 TEMPLATE_POST_BODY_END template macro 3 2 22 TEMPLATE_PRE_BODY_BEGIN template macro 3 2 22 TEMPLATE_PRE_BODY_END template mac ro 3 2 22 TEMPLATE_RETURN template macro 3 2 22 templates 1 11 1 background_Template 7 77 3 3 1 4 datasheet_Template 1 11 4 func_Template 7 77 3 ivs_pmu_Template 7 77 4 ivs_ Template 1 11 4 MFP Address Scramble 4 2 2 4 2 4 MFP Address Scramble 2 4 2 6 MFP Bitmap Usage 4 2 8 4 2 9 MFP Dgen 4 2 12 MFP Dgen Template 4 2 70 MFP MUT Description 4 2 13 4 2 14 MFP MUT Topology 4 2 15 4 2 19 MFP MUT Topology 2 4 2 20 MFP Setup 4 2 22 4 2 25 pin_pmu_alternative_Template 7 77 4 pin_pmu_Template 7 77 4 test system CPU 3 1 15 threshold voltage VT 3 1 19 timing edges 2 7 18 3 1 15 drive only purpose of each edge 2 2 10 dual mpg drive only channels 5 7 10 14 June 1995 J990 Series Programmer s Manual Index dual mpg IO channels 5 1 11 IO purpose of each edges 2 2 12 See also period t1 timing edge t2 timing edge t3 timing edge See also timing guidelines timing gu
304. s Manual waveform wave _timing_80ns timing_80ns spec_wave_eqns_1 waveform wave _ timing _ nominal timing_nominal simple_wave_eqns level nominal_levels nom_levs levels_eqns level spec_levels spec_levs levels_eqns level leakage_ levels leakage_levs levels_eqns level power_off_ levels power_off_levs levels_eqns pattern march _patt march startset dram_patterns mpgset pattern_data dgenset srcset srcset d1Mx4 mutset 1 10 8 June 1995 J990 Series Programmer s Manual pattern pattern pattern pattern pattern pattern scan_patt addrcompl_patt vcc_bump_patt Creating Workspace Database Files scan dram_patterns pattern_data srcset diMx4 addrcompl dram_patterns pattern_data srcset d1Mx4 vcc_bump dram_patterns pattern_data srcset diMx4 read_write_ loop patt refresh_loop patt refresh_ test _patt read_write_loop dram_patterns pattern_data srcset d1Mx4 refresh_loop dram_patterns pattern_data srcset d1iMx4 refresh_test dram_patterns pattern_data srcset d1Mx4 startset mpgset dgenset sreset smutset startset mpgset dgenset srcset smutset startset mpgset dgenset sreset smutset startset mpgset dgenset srcset smutset startset mpgset dgenset sreset smutset startset
305. s of the Startadr File The pattern start database is defined with the ADR startset statement inside a Startadr file Only one startset statement is allowed per file A startset object is actually defined by a the name clause within the startset statement so in effect one startset statement can create multiple startset objects The names of these startset objects will be placed into the workspace A startset includes where the pattern will start label for both main and alt pattern controllers Not all pattern labels need to be put into a startset only those labels which will be starting locations for patterns Currently the startset requires programming of fields not used by the J990 Series hardware These fields relating to LVM hardware on the J971 system should be programmed to nil Pattern Start Database Example comment patterns startadr create startsets march scan addrcompl fast_page LA refresh_loop read_ write loop and page _ loop startset Adding Patterns default start alt nil svm alt nil start form name svm march arch scan Scan addrcompl Addrcompl fast_page Fast_page read_write_loop Read_write_loop refresh_loop Refresh_loop page_loop Page_loop to a Test Program When patterns are to be added to a test program usually only the SVM and Start databases need to be changed The data generator and source select databases are usually unchanged The typical sequen
306. scan etc and supplementary patterns looping pattern etc Database objects defined within these files are called svmsets dgenadr dgendb Files with these extensions are data generator database files that specify the datagen hardware sets that will become part of the pattern objects Database objects defined within these files are called dgensets Startadr startdb Files with these extensions are pattern start database files containing all the pattern label references that determine where and how to start the patgen Database objects within these files are called startsets srcadr srcdb Files with these extensions are source select ram database files used with pattern objects Database objects within these files are called srcsets caladr caldb Files with this extension are calibration database files which contain the conditions for system calibration Database objects within these files are called calsets wspadr wspdb Files with this extension are workspace database files used to reference all modules and databases and their contents The job is loaded and linked by using a list of objects within this file Makefile A makefile is a Standard UNIX makefile used to control compilation and translation of source code files and their interdependency 1 1 6 June 1995 J990 Series Programmer s Manual Programming Overview Database Grouping Database objects sets are sometimes grouped to create higher level
307. seen by the address scrambler physical array address X and Y address seen by the data generator data generator bits prior to topo inversion Some or all of the sync conditions can be used Each condition is enabled separately The sync is available at the test head for connecting to an oscilloscope and can be used to control FVM capture June 1995 2 1 59 Programmer s Guide to the Hardware J990 Series Programmer s Manual 2 1 60 June 1995 J990 Series Programmer s Manual Timing Guidelines Chapter 2 2 Timing Guidelines Introduction This chapter illustrates various timing formats used by J990 Series Test Systems Use it as a guideline when developing your test programs It applies to all systems except as noted within the text General Timing Guidelines The following rules provide guidance in programming timing edges 1 To guarantee that a pulse will occur on the device pin timing values must be programmed to allow enough time to meet the minimum pulse width or duration for the voltage swing The following table provides the minimum pulse widths Table 2 2 1 Minimum Pulse Width Amplitude volts Minimum Pulse Width ns at 50 points 2 0 V 2 496 ns 2 5 ns 3 0 V 2 976 ns 3 0 ns 5 0 V 5 984 ns 6 0 ns a For the J993 01 minimum pulse width is 4 0 ns The following example shows representative waveforms June 1995 2 2 1 Programmer s Guide to the Hardware Timing Guidelines Meeting Min
308. setup generation with your own ADR input file most of the instance parameters become mandatory The following list describes the parameters for the MFP setup instance O MFP MUT Description Template Instance mandatory MFP Address Scramble Template Instance mandatory MFP Bitmap Usage Template Instance optional MFP Scan Time Address Scramble Instance optional OO OF 0 MFP MUT Topology Template Instance optional may be a list of different scan topologies MFP Data Generator Instance mandatory If no topology instance is specified a default one will be generated which will lay out IO s side by side There are two different forms of the address scramble and topology templates One form is based on per address bit equations and is used for devices for which the number of rows columns and IOs are all even powers of two The alternate form addr_scram2 and topology2 is based on address mapping functions included in the user s job and it is used for devices for which the number of rows columns or lOs are not an even power of two The user must use the same form equation or function based for both templates they cannot be mixed For a full description of each of the templates see Chapter 4 2 June 1995 J990 Series Programmer s Manual Memory Fail Processing Overview Parallel Capture Mask Accumulate Support High Level Programming In the bitmap usage template you specify the number of devices that
309. sh interrupts are generated by an asynchronous 24 bit counter with 32 768 nS resolution Refresh interrupts can be enabled disabled or forced The pattern controller also permits the calling and return from pattern subroutines reducing the number of pattern locations needed Pattern sequences can be shared between patterns by putting them into subroutines and calling them from the main pattern flow Pattern subroutines can be called from within a subroutine since the pattern controller allows up to four nested calls Four user flags are also available to the pattern controller to affect pattern flow These flags can be set cleared and compared for logic high and logic low both in the pattern and by the CPU These can be used to perform handshaking between the pattern generator and the CPU 2 1 10 June 1995 J990 Series Programmer s Manual Programmer s Guide to the Hardware Address Generation The memory patgens generate address values that drive the address scrambler and data generator Each memory patgen generates a 16X 16Y field The address values for the data generator can be different from those used by the address scrambler X address values can come from one of five sources XA XB XC XD counters and the X register in SVM Y address values can come from one of five sources Ol YA YB YC YD counters and the Y register in SVM The selected address source can also be inverted complemented Each of the address
310. sites 0 1 2 and 3 on test head 0 the current siteset would be ho 0 3 If an instance was executed and site 2 failed then the FAIL_DO code would be executed with only site 2 active Site 2 h0 2 would be the current siteset while the code within the FAIL_DO was executed Sites 0 1 and 3 h0 0 1 3 would be the current siteset while a the PASS_ DO block was executed Because the parallel job exec keeps track of active passing and failing sites this reduces the amount of logic that must be coded into a test program FAIL_DO and PASS_DoO statements can be nested Instances can be executed and FAIL_DO and PASS_Do blocks can be placed inside FAIL_DO and PASS_Do Compiling Flow Files Once the flow file has been edited it must be compiled with the AT900 compiler which will generate an object module at900 main t Once the object module exists it must be specified in the workspace ADR file wspadr It must be listed as part of the job object June 1995 1 12 3 Creating a Flow Control Module J990 Series Programmer s Manual Example Flow File File main t include lt teradyne h gt int bin int import Instance basic_functional continuity leakage icc_standby icc_operating funct_spec_70ns funct_spec_80ns Sort Bin Number Definitions define FAIL_BFUNC 14 define FAIL_CONTIN 13 define FAIL_LEAKAGE 12 define FAIL_ICC_STDBY11 define FAIL_ICC_OPER10 define FAIL_SPEC_FUNC9 define PASS
311. ss cycle boundaries resulting in a long window strobes that traverse multiple cycles This is shown in the multiple cycle window strobe example do do Edge Strobe Window Strobe Multiple Cycle Window Strobe do do d0 dO dO do do Figure 2 1 25 Examples of Edge and Window Strobes 2 1 28 June 1995 J990 Series Programmer s Manual Programmer s Guide to the Hardware Figure 2 1 26 illustrates the four types of window strobes you can program The conditions are expect high expect low expect midband or expect valid The window strobe conditions are determined with respect to the programmed values of VOH and VOL These output voltages are the voltages used on the comparator circuit on the 1O channel cards see Figure 2 1 43 on page 2 1 51 0 feb n NR NS BANG WOO Wd y 7 1 Expect Midband Figure 2 1 26 Window Strobe Formats June 1995 2 1 29 Programmer s Guide to the Hardware J990 Series Programmer s Manual IO Switching Modes The IO channels can also be set up to perform IO switching which is necessary for testing common IO devices As discussed earlier the valid data will normally appear between the gating edges di and d2 Edges c1 and c2 control the strobe timing The remaining edges dO and d3 can be used to control the IO switching which affect when the driver is on LoZ and when it is off HiZ The IO channel can be put into one of four IO swit
312. st Program Objects and Database Structure 7 1 8 June 1995 J990 Series Programmer s Manual The Executive and Programming Overview Related Software Processes Test program execution is controlled by the 1G900 Executive The executive runs the test program and manages the software interface datalog summary ASCII Commands etc Figure 1 1 3 shows the operation of the G900 Executive Jobtool Production Menu UNIX Shell Custom Tool Control ACL Commands ACL Executive Test Program Software Tester Model Hardware Figure 1 1 3 1G900 Executive June 1995 Programming Overview J990 Series Programmer s Manual Program execution actually begins within the executive before passing to the job_main segment of the test program At the end of test program control returns to the executive ASCII Control Language ACL is used to issue executive commands Jobtool or demo _jobtool the Production Menu Control PMC interface UNIX shell commands acl commands and any custom tools all operate by issuing ACL commands to the executive The executive communicates with test system hardware with read and write commands there may be intermediary layers These reads and writes may occur directly to the hardware or to the tester software model The tester model is a software simulation of the tester address space in memory When operating offline the executive can operate against the model allowing some de
313. st be less than d2 For drive only channels d4 must be less than d5 14 When channel muxing the time between the cycles must be gt 5 ns For example channel 200 is muxed with channel 201 These muxings take place on d3 The time between the d3 edge of channel 201 and the next d3 edge of channel 200 must be gt 5 ns For drive only channels these restrictions are for the d0 edges 15 For drive only channels in formatter mux mode if both the X and Y half of the channel are driven the d3 to next dO time must be at least 4ns X Signal Y Signal X Signal gt 4ns Figure 2 2 8 Minimum d3 to Next d0 Time June 1995 2 2 7 Programmer s Guide to the Hardware Timing Guidelines 16 For drive only channels in formatter mux mode if the cycle is a Y only cycle for page mode or similar mode the d0 edge must be placed 500ps after d3 Also the previous cycle must end with Y Using the MCS hardware X only cycles follow the same timing guidelines as the Y cycles Previous Y Signal YSignal Pe en d3 do 500 ps Figure 2 2 9 Y Only Cycle Minimum d3 to Next d0 Time 17 When using NR Non Return format on I O channels or drive only channels not in formatter mux mode the dO edge must be placed 2ns after the d1 edge The transition will occur at the d1 edge gt 2ns Figure 2 2 10 Minimum d1 to d0 time NR Format None Formatter Mux Mode 2 2 8 June 1995 J990 Ser
314. stance addr_scram_instance scan_scram_instance value value alue lt dgen_instance g lt a lt D o mfp_setup_Templat lue bitmap_usage_instance lue mut_topology_instance alue mfpadr_outfile value mfpadr_infile mfp_mut_description mfp_addr_scram mfp_dgen mfp_bitmap_usage mfp_mut_topology June 1995 Using Dual MPG Mode J990 Series Programmer s Manual waveadr In the beginning of every waveadr file the patgen frequency is given The patgen frequency referring to the Pattern Generator Controller board will remain at 60 or 100 MHz for J997 and 60 MHz for all other memory testers For example patgen freq 100MHZz In the pins form statement you must declare all drive only pins to have format muxing mode turned on For all IO pins you must declare channel muxing mode to be turned on For example pins form pin E fmt mux on W fmt mux on G fmt mux on ADDRS fmt mux on DOS io zstate d0 scio off comp on strobe edge chan mux on DQ_S io zstate d0 scio off comp on strobe edge chan mux on The timing edges follow the same rules as prescribed by drive only format muxing and IO channel muxing guidelines The only difference is the reference to early half and late half of a cycle For drive only channels the following timing applies Edge Description do Clock in surround data for early hal
315. t MCS Card Signal MCS 0 Slot 13 P30 P29 P28 P24 P23 MCS 1 Slot 14 MCS 2 Slot 15 MCS 3 Slot 16 MCS 4 Slot 17 Site 0 Slot Site 1 Site2 Site3 Site 4 Site5 Site6 Site7 128 132 192 196 136 140 208 212 152 156 312 316 368 372 296 300 352 356 288 292 256 260 320 324 264 268 336 129 133 193 197 137 141 209 213 153 157 313 317 369 373 297 301 353 357 289 293 257 261 321 325 265 269 337 341 281 285 185 189 241 245 169 173 225 229 161 165 130 134 194 198 138 142 210 214 154 158 314 318 370 374 298 302 354 358 290 294 258 262 322 326 266 270 338 342 282 286 186 190 242 246 170 174 226 230 162 166 131 135 195 199 139 143 211 215 155 159 315 319 371 375 299 303 355 359 291 295 259 263 323 327 267 271 339 343 283 287 187 191 243 247 171 175 227 231 163 167 56 60 112 116 40 44 96 100 32 36 384 388 448 452 392 396 113 117 41 45 97 101 33 37 385 389 114 118 115 ie se 102 34 38 386 390 453 393 397 465 469 409 413 441 445 497 501 425 429 481 485 417 421 394 398 466 470 410 414 442 446 498 502 426 430 482 486 418 468 408 412 440 444 496 500 411 415 443 447 499 503 427 431 483 487 419 P32 P72 P73 428 P77 480 484 416 420 P78 280 284 184 188 240 244
316. t When an immediate abort is desired after a designated error TEMPLATE RETURN should always follow TEMPLATE_ABORT This is shown in the TEMPLATE_RETURN example above This macro is used to identify the template for the test system executive The template name is placed here as an argument This macro appears before the start of the template code TEMPLATE _ID basic_func_Template This macro is used to select a calset This macro has built in error checking making it a better choice than the writesys select_calset statement Typically selecting of new calset objects should be performed only in the TEMPLATE_PRE_BODY section For example the following statement would be used to select the calset TLIB_CALDATA my_calset string is the parameter passed TLIB_FORC ETEMPLATEFAIL TLIB_LEVEL This macro is used to indicate that execution of the template produced a failure of some kind This can be used to flag a failure of execution of the template due to errors encountered in the data in the instance or to flag failures in patgen bursts or elsewhere even though no tests were actually performed see the example shown in the TEMPLATE_RETURN section above This macro is used to select a new levels object It accepts an argument of type level an object defined in the workspace file This macro has extensive built in error checking making ita superior choice to the writesys sel
317. t that uses waveform or level may be substituted with overlay_waveform and overlay_level respectively The standard rules found in the AT900 Reference Manual still apply 1 13 4 June 1995 J990 Series Programmer s Manual Overlay Level and Waveform Files To use overlays with AT900 always begin by inserting the following import statement in the t job flow file GI import overlay_waveform OVERLAY_WAVEFORM_NAM import overlay_level OVERLAY_LEVEL_NAME To select an overlay object use the following AT900 select statements writesys select_overlay_waveform OVERLAY_WAVEFORM_NAMBE writesys select_overlay_ level OVERLAY LEVEL NAME Similar to selecting a waveform or level these statements write the current values to the memory structure and to the hardware Only those edges specified in the database will affect the hardware items not programmed are not set You must first select a waveform and then select an overlay waveform so the edges can be manipulated by the waveform overlay without modification to the background waveform Overlay levels should be used in the same manner No more than one set of a background waveform and an overlay waveform can be active at one time To select another overlay waveform you must always select or re select a background waveform and then select the new overlay waveform The same is true for levels To modify or update portions of the overla
318. te contains parameters that specify characteristics of bitmap information to be captured Parameters MFP Bitmap Usage Template has the following parameters listed in order of appearance in Insted Table 4 2 3 MFP Bitmap Usage Template Parameters Entry Insted Prompt Parameter Data Type Required Description Number of Sites to num_sites Integer Yes Specifies the number of sites that will Bitmap in Parallel be captured in parallel Store Mask Data mask Integer No Specifies whether to reserve half of the Catch RAM for storing mask data mask and accum cannot both be On Choices are 0 Off 1 On Accumulate Bitmaps accum Integer No Specifies whether to reserve half of the Catch RAM for storing accumulative bitmaps mask and accum cannot both be On Choices are 0 Off 1 On 4 2 8 June 1995 J990 Series Programmer s Manual Memory Fail Processing Templates Example The following example instance shows programming for MFP Bitmap Usage Template d12X 10Y x8 amp 8duts bitmap _ usage instance mfp_ bitmap usage Template define instance d12X 10Y_x8_ 8duts bitmap usage mfp_ bitmap usage Template value num_ sites 8 value mask 0 choice Off value accum 0 choice Off June 1995 4 2 9 Memory Fail Processing Templates J990 Series Programmer s Manual MFP Dgen Template The MFP Dgen Template Pin Table Parameters MFP Dgen Template Insted name mio dgen Template is used to proc
319. te half of the cycle June 1995 5 1 11 Using Dual MPG Mode J990 Series Programmer s Manual For example write_edges per 20ns ADDRS mer Sane dl ee do all d2 do d4 STIS AA das MSN SA do lal d2 d3 Gal C2 do NOTS dl MS ns sy d2 OTS M d3 WEE Ooms Si OTSA eZ MONS read_edges per 20ns ADDRS er Site ll see do al d2 d3 d4 WES TS d5 18ns do dl d2 d3 Gul C2 dd dl d2 de CH eZ ISTIS u Note that during a read cycle the timing edges dO di d2 and d3 have no effect and that only c1 and c2 edges can have any meaning 5 1 12 June 1995 J990 Series Programmer s Manual Using Dual MPG Mode srcaar This file simply requires the addition of the secondary IO pins in the src form in order to program a source set for these channels For dual MPG mode the source set of the primary lOs should match the source set of the secondary lOs srcset src_set_sram_patterns src form label E W G ADDRS DOS DQ_S src_set_1 vm vm vm 0 0 ads vm vm ads vm vm ads src_set_init vm vm vm 0 0 vm vm vm ads vm vm ads svmadr The most significant change required for dual MPG mode is in writing the patterns The patterns that were designed to run in a single MPG mode must be rewritten for dual MPG operation The essential difference is that each vector is split into two parts one to control the main MPG and another to control the
320. tems Comparator Logic The pattern generator executes patterns from the pattern memory selecting the appropriate edgesets timing and format for each cycle A timed strobe of the device output is then compared with the expected output of the device The result of this comparison is sent to the error detector and fail processor for use in fail detection The comparator logic or compare logic circuits compare the device output voltage level with the expected values Two voltage values can be specified for each output pin an output high voltage VOH and an output low voltage VOL Comparators are programmed to look for an output value for a specified duration window strobe mode or at a specified time edge strobe mode Figure 3 1 4 shows a window strobe compare waveform June 1995 3 1 17 Using Templates TO VOH VOL J990 Series Programmer s Manual C1 C2 TO Expect High Pass Region VOH Expect Midband Pass Region VOL Expect Low Pass Region Figure 3 1 4 Compare Waveform Window Strobe The comparator is programmed to look for a high fail low fail or midband fail In window strobe mode If the expected data for the window is logic one the comparator will expect the output for that pin to be greater than VOH for the entire time C1 to C2 the high pass region in Figure 3 1 4 If the output level drops below VOH a high fail will be processed by the error detection
321. teps required to create a basic test program including examples For the most part this section is a set of step by step instructions for programming and running a J990 test program In a logical sequence each chapter in this section covers one of the steps Basic Programming Sequence The recommended process for developing a J990 test program is described below 1 Create a set of database files This can be done by creating ASCII database files and translating them to their binary equivalents or creating the binary database directly with 1G900 tools Create the program flow control file and compile it to create executable code for linking into the test program Create a workspace file that groups the databases and files to form a test program Create a makefile to help facilitate program changes Load and link the program modules and databases Use the 1G900 executive software and IG900 tools to run the test program evaluate results and debug the test program 1 Even though some binary databases can be created through the use of the IG900 tools this document advocates the use of ASCII database programming With ASCII database program ming programs can be created and modified within a TTY terminal or window This method also creates a source code master of the test program June 1995 Programming Overview J990 Series Programmer s Manual IG Tools y i c adr db 1 Create database files ASCII
322. tes J990 Series Programmer s Manual define instance icc_ operating ivs Template levels icc_levels value mpause 0 001 value forceval 5 5 value lolimval 0 001 value hilimval value lolimspec value hilimspec Icc value ivspin VCC value irange 0 choice 1 A value samples 10 value duringpat read_write_loop_patt value pretest value posttest value prebody prebody_function value postbody postbody_function value patstart value patstop value title value calset icc_level_cal value driverl value driver0O value driveroff value beforepat value waitflagstrue value waitflagsfalse value floatpins value tnum 102 value forcespec value main_alt 0 choice main value autotitle 0 choice no e e Notes waves wave_timing_nominal The mpause parameter is explained on page 3 1 10 value duringpat refresh_loop_patt The duringpat parameter is used to specify a pattern that is usually designed to loop endlessly For this instance the pattern will be started before the Icc test is done and repeat throughout the execution of the instance When the instance is finished the pattern will be stopped 3 1 36 June 1995 J990 Series Programmer s Manual Using Templates pattern refresh_loop patt refresh_loop startset dram_patterns smpgset pattern _ data dgenset srcset Srese
323. tes switch when the t file is compiled with the AT900 compiler This simply places 99x templates in front of Tlib h include CUSTOMNAME_Template h must always be present It is the name of the h file created from running tdl_to_h Template Identifiers This section has just two statements Both contain the name of the template you are writing For the example template this section looks like Internal template variables arrays functions static char templatename CUSTOMNAME Template State Template I D 7 TEMPLATE _ID CUSTOMNAME_ Template The rest of the template code is contained in three sections prebody body and June 1995 3 2 9 Customizing Templates J990 Series Programmer s Manual postbody This format organizes the template in to three parts the first part containing one time setups the second part containing steps that perform tests and the third part containing clean up code from the setup Update Section Optional This section contains code that can be called either when a job is loaded or through Insted s Update messages Although there are no restrictions as to what code may be placed in this section it is most often used for caching information to make instances run faster Prebody Section This section is used for one time setups for a template This section performs actions like selecting the levels waveforms calsets print the test title etc Note
324. tgen which is officially called dual asynchronous patgen is a mode involving two pattern generators running two patterns simultaneously The standard mode of operation is single patgen which uses one patgen to run one pattern at the normal patgen frequency This chapter describes the requirements and necessary changes for converting an existing single MPG test program to a dual MPG test program to effectively double the test frequency Memory Fail Processing MFP software completely supports the dual MPG operation Throughout this chapter there will be references to the MFP templates and function calls Please refer to chapter 4 of this manual for a complete description of MFP June 1995 Using Dual MPG Mode J990 Series Programmer s Manual What is Dual MPG The concept of dual MPG is simply to double the frequency by generating not one but two addresses or data bits for each device input or output pin at each patgen cycle To accomplish this the dual MPG must be able to generate enough address and data bits for two device cycles and secondly must drive or compare two bits of data using a single channel 950 662 02 950 561 00 950 595 00 Address Descrambler Fanout Pattern Generator Memory Pattern J997 4 required Controller Generator Dual J993 J994 J995 2 required 14 SCRAM 0 Address 6 16Kx14 Generator a D m Main MPG 16 n Tope RAM T Q Data 8 2 lait G
325. th a loop opcode will decrement the loop counter and branch to VLABEL if the counter is non zero This may be a branch to a vector with a loop opcode Note however that eloop blocks any pushes on the loop stack for the next cycle If the branch is to a loop N opcode a nop is performed instead If VLABEL is omitted the branch address is set to the previous unmatched loop N address When the loop counter is zero a pop loop stack into the loop counter and continue to the next vector occurs Typically the eloop opcode will be matched with an opening loop N opcode The following is an example of this usage loop 512 loop start location other code eloop loop end location In this example the loop will be repeated 512 times It may be desirable to eloop to a different location than the opening loop N opcode An example of this is shown below loop 512 LABELX eloop LABELX Now the code between the two LABELX steps will be looped on 512 times The code between the loop 512 step and the first LABELX step will be executed once the first time through the loop If this action is desired take care that you do not eloop to a rep opcode or a nested loop N opcode 1 8 16 June 1995 J990 Series Programmer s Manual Creating Pattern Database Files Common Mistakes Here is an example which will cause a stack underflow error loop YMAX read xa inc rep XMAX read ya inc eloop 1 XMAX in this exam
326. that the prebody section is not the same as the prebody function which can be an argument to a template The prebody function is an interpose function which gives the user a chance to add in his own code as the first step of the body section in a template Body Section This section performs the statements involved in performing the actual measurement or test This section must contain the code required to make each measurement valid in the template That means that if code is required to precondition a device before any leakage test then that code should be present in this section Postbody Section This section is used for one time cleanups from a template The code present in this section would restore connections to hardware from a certain test when done check for alarms after the test clear any on_patgen_start on_patgen_stop on_pretest or on_posttest functions Note that the postbody section is not the same as the postbody function which can be an argument to a template The postbody function is an interpose function which gives the user a chance to add in his own code as the last step of the body section in a template When an instance is executed the Prebody Body and Postbody section are run sequentially The Update section is usually run when a value s has been changed because either a job was loaded i e the hardware changes from not having value settings to having value settings or a value was edited during a debug sessio
327. the Create window select Create 10 To select an overlay and view the results a In Job State s main window select the new overlay listed in either the Overlay Waveform or Overlay Level menu and press Update b Select Results from the View menu c Inthe Results window select Once to run the test over again or Cycle to run the test repeatedly from the Restart menu Editing Overlays Overlays created by any of the previous methods can be edited on a value by value and equation by equation basis with Specsheet and Calcsheet 1 From Jobtool trap on a test test type or instance 2 Summon Job State from the Jobtool s Tools menu 3 Select an overlay waveform or overlay level from the List window which can be summoned from either the Overlay Waveform or Overlay Level menu located in the Job State s main window 4 Select Update 5 Summon Specsheet or Calcsheet from the Jobtool s Tools menu 6 From either Specsheet or Calcsheet press Debug 7 Change the desired value s and equation s 8 Press Update to update the database and the hardware 9 If desired save the changes by using either the Save or Save as option in the File menu Procedures for Using Overlays in a Job There are several ways in which overlays may be applied to a job within AT900 or through an IG900 tool AT900 Overlays can be implemented within a job by using AT900 statements in the main t flow file Any readsys or writesys statemen
328. the job object enclosing the name in quotes Example j997 templates libtemplates o June 1995 7 11 9 Creating Instance Database Files A sample job group f J990 Series Programmer s Manual rom a wspadr file appears below job Dx4J wave_timing_70ns waveform wave_timing_80ns waveform wave_timing_nominal waveform nominal_levels level spec_levels level march_patt pattern scan_patt pattern addrcompl_patt pattern d256Kx4_pins pinset d256Kx4j_chans chanset d256Kx4 insadr INSADR 3997 templates libtemplates o main o flow tflags lflags 1 11 10 June 1995 J990 Series Programmer s Manual Creating a Flow Control Module Introduction Chapter 1 12 Creating a Flow Control Module Objective Create main t and main o files Reference AT900 Reference Manual Once all the test conditions and workspace databases have been created the last program module to be created is the flow control The flow control module is written in AT900 language and controls the execution of tests and instances At least one flow control module file must be created for a job There will be one job_main function defined in the file and this function contains the executable code which will be run when the test program is run The flow control module can contain any combination of AT900 and C programming statements The flow control module contains the main flow of the program and is typi
329. the patgen is the same as that accessed in the memory array The same technique is done for topologically inverted data that is stored in the array The gray area in the figure represents the test system hardware that is set up based on the contents of the MUT database June 1995 1 4 3 Creating MUT Database Files J990 Series Programmer s Manual Definition of MUT Terminology row or column coordinate or location physical address scrambled address topology The following set of terms are used in this manual with respect to memory devices These are used to describe the axis of adevice They are not tied to the horizontal and vertical axis of the display They are used as modifiers when describing addresses or coordinates Locations on a display that correspond to memory cells The terms row coordinates or column coordinates can be used to reference the coordinates or locations along the row or column axis Other coordinate terms include device coordinates array coordinates and RA region coordinates Row or column address that corresponds to a bit or bits within an array These are generated by the patgen These can be considered the internal address Row or column address that are presented to the device pins These are generated by the address scrambler These can be considered the external address General term that is used to refer to the layout of the device usually as it applies to the display address scra
330. there are up to 40 programmable drive only functions A function is an individually programmable timing and format signal usually applied to individual input pins on a device Drive only functions are typically used for address and clocks Eight functions are located on each of five Drive Only Wavegen boards also known as Memory Channel Slice or MCS boards Drive Only Channel WaveGen Board Function o gt 5 WaveGen boards x 8 Functions Board 40 Drive Only Functions Figure 2 1 35 Drive Only Channel Functions Each WaveGen board supports four channel cards 2 1 42 June 1995 J990 Series Programmer s Manual Programmer s Guide to the Hardware Drive Only Channel Fanout to the Test Head J997 and J993 The fanout between the drive only WaveGen boards located in the mainframe and drive only channel cards in the system vary among the various members of the J990 series Figure 2 1 36 shows the fanout for J997 and J993 systems Drive Only Channel WaveGen Board SiteO Site1 Site4 Site2 Site5 Function Sites gt Site6 p Site7 Site0 Site1 Site4 Sitel Function Site2 Site5 Site3 Site6 Site7 Function Drive Only _ Channel Board Drive Only sites 0 3 Channel Board sites 4 7 Function Function 40 Drive Only Functions x Function 8 Site Drivers per function 320 Drivers per Test Head Function Function Figure 2
331. tion RAS ERP 5 0ns 15 0ns 20 0ns 25 0ns 35 0ns equation comment REF Refresh Interval Period pin fmt edge equation sper tRAS tRP ADDRS re fmtl re d1 MO d2 RAS d1 tRAH d4 CAS d1l ET a3 ADDRS d4 ADDRS d2 2 ADDRS d2 d5 CAS d1 tCAH RAS pl d1 ADDRS d1 tT d2 RAS d1 tRAS CAS pl al RAS dl ERCD_ max tT 1 7 4 June 1995 J990 Series Programmer s Manual Creating Waveform Database Files d2 RAS d1l tCSH WE st a0 MO OE pl al DOS cl COE tT d2 DOS C2 gt TOD min DQS re cl RAS d1 tRAC c2 TDS CL write_edges sper read_edges ADDRS re fmtl re dl read_edges d2 read_edges d4 read_edges d3 read_edges d5 read_edges RAS pl dl read_edges d2 read_edges CAS pl dl read_edges d2 read_edges WE pl d1 CAS d1 tT d2 WE dl tWP OE st dO TON DOS rc d1 CAS d1 tT d2 CAS dl tDH do DOS dl tHIZ tPW min d3 DQS d2 tHIZ tPW min end equation form end eqset June 1995 1 7 5 Creating Waveform Database Files J990 Series Programmer s Manual 1 7 6 June 1995 J990 Series Programmer s Manual Introduction Creating Pattern Database Files Chapter 1 8 Creating Pattern Database Files Objective Create svmadr and svmd
332. to either TT_MFP_NULL_OP or TT_MFP_CURRENT The clear both hldset is asserted if you are not set up to do masking or accumulating or if you are set up to do masking or accumulating and you select TT MFP _MASK or TT_MFP_ACCUM The choice of whether you will be doing masking accumulate or standard bitmapping is made in the mfp_bitmap_usage instance referenced by the setup instance called with this function call tt_mfp_func_test_setup The syntax of this function call is tt_mfp_func_test_setup mfp_setup_instance_name TT_MFP_TOPO_INV TT_MFP_OP_TYPE This function has the same functionality as tt_mfp_capture_setup except that it leaves the Catch RAM disabled and does not enforce any patgen mode checking in the start patgen driver Basically the scramble RAMs multiplexers topo invert RAM and data generator are set up for functional testing It is recommended that this function call be used to set up scramble RAMs multiplexers and so on even if you do not otherwise plan to use the Catch RAM June 1995 4 3 7 Memory Fail Processing High Level Programming J990 Series Programmer s Manual it mfp_ capture setup The syntax of this function call is as follows tt_mfp_capture_setup mfp_setup_instance_name TI_MFP_TOPO_INV TT_MFP_OP_TYPE This function is called to setup for capture Those hldsets which are part of that setup are asserted i e their software caches are sent to hardware Before cal
333. tory the svmdb file is created in Step 4 Add lt mpgset gt _update o file to the workspace database The function created i e the lt mpgset gt _update o file must be included in the job s workspace This is shown in the example provided on page 1 8 21 Step 5 Create a scaling function to call the compiler generated function This function must be executed before the pattern which is to be scaled is run It can be executed by including it in template code in your main t file or elsewhere If your mpgsets are combined into an svmtable be sure to call all the scaling functions for all mpgsets June 1995 1 8 19 Creating Pattern Database Files J990 Series Programmer s Manual The function generated by the compiler will have the following arguments void lt mpgset gt _ update TT_VEC_SVM_UPLOAD tt_upread TT_VEC_SVM_UPLOAD tt_upwrite TT_CM VAL tt_patgen int al int a2 int a3 int aN The tt_upread argument is the same as readsys mpg_op namely TT_VEC_SVM_DOWNLOAD_IMAGE 7SVM copy only TT_VEC_SVM_ONLY SVM memory only Set this to the desired source of the data The tt_upwrite argument indicates the recipient of the altered data It is like tt_upread with the addition of a modify both option TT_VEC_SVM_DOWNLOAD_IMAGE 7svm copy only TT_VEC_SVM_ONLY SVM memory only TT_VEC_SVM_MODIFY_BOTH 7Both SVM and copy The tt_patgen argument is one of see writesys mpg_op TT_CM_PATGENO
334. ts refer to the J990 Series Template Reference Manual More than one instance can be placed in an instance database file Examples of this are provided in this chapter Procedure Overview The remainder of this chapter describes various instances listed in the table below Additional instances are provided in the demo program Table 3 1 1 Example Instances Instance Name Template Name Purpose init_program_variables background_Template diMx4 DRAM Background Setup continuity pin_pmu_Template diMx4 DRAM Continuity Test input_leakage_ganged pin_pmu_Template diMx4 DRAM Input Leakage Test io_hi_leakage pin_pmu_Template diMx4 DRAM Output Leakage Test icc_ras_refresh ivs_Template diMx4 DRAM Icc Test icc_operating ivs_Template diMx4 DRAM Icc Test basic functional func_Template diMx4 DRAM Functional Test funct_spec_levels func_Template diMx4 DRAM Functional Test June 1995 3 1 3 Using Templates J990 Series Programmer s Manual Background Initialization Instances The following instance from the diMx4 DRAM demo program deals with background initialization Background Initialization Example Instance The Background Template background_ Template initializes many job level setup parameters at the beginning of the job program Do not confuse this with setting up for an individual test within a job execution this is usually done with the test template for the test you wish to execute i e functional test
335. ts in template code Pin P if HASVALUE driverl for P driverl HASVALUE P NEXT P writesys set_driver_mode P 1 writesys set_driver_state P 1 TLIB_EPR This macro is used for outputting an error from the template code to the datalog For example if HASVALUE duringpat if readsys patgen_busy writesys patgen_stop else TLIB_EPR duringpat stopped before testing was complete n TLIB_DEB The macro TLIB_DEB is used to output a formatted string For example if fval gt 40 0 fval lt 40 0 sprintf Tlib_ebuf force value 7 21f V out of range aborting n fval IB_DEB LIB_FORCETEMPLATEFAIL EMP LATE ABORT EMPLATE RETURN 3 2 26 June 1995 J990 Series Programmer s Manual Customizing Templates Tlib Variables Functions The following is a list of global variables used in template code to interface with template software and the test system executive All template macro and variable definitions are in Tlib h unless otherwise specified Tlib_minforce Tlib_maxforce These global variables are of type double and are set to the maximum and min imum values by the force range of the PMU These variables are set in the Tlib_set_pmu_force_bounds function and used for reference Tlib_tnumarray 2 TEMPLATE_MAXCHANS This array is used to store test numbers for pin PMU
336. uld also be calibrated in the same range the channel will be used in There is only one range per test head This range applies to drive only and IO channels Monitor Scope Enable Calibration 10KQ Connect CALcon to TDR Circuit or Scope via Cal Matrix System PMU Relay Matrix PMU Matrix Pin PPMU Enable PMU PPMU Force Value System PMU FET Matrix i Per Channel VIH Driver Timed Channel Per Channel VIL La Measurement Connect Mcon NX Functional DUT Connect Connect FUNcon DUTcon June 1995 2 1 49 Programmer s Guide to the Hardware J990 Series Programmer s Manual Figure 2 1 42 Drive Only Channel Block Diagram 2 1 50 June 1995 J990 Series Programmer s Manual Programmer s Guide to the Hardware IO Channel Functional Description Each IO channel can be programmed independently This includes O Driver levels Drive Voltage High Vih Drive Voltage Low Vil O Comparator levels Compare Voltage Low Vol Compare Voltage High Voh Current Load High loh Current Load Low lol Termination Voltage Vt Voltage Clamp Low Vcl Voltage Clamp High Vch O Device Under Test connect to isolate device pin O Functional connection to driver comparator circuit Measurement connection to Pin PMU System PMU and Calibration matrix The channel is designed for a 50 ohm environment to assure signal fidelity The channel drive data and HiZ Load en
337. ument may be omitted These two statements register the edgeset label to modify the period of when scanning or clearing the FMM Example extern void tt_mfp_es Label es extern Label tt_mfp_get_es tt_mfp_set_waveform tt_mfp_get_waveform These two statements register the waveform to select during scanning or clearing of the FMM By default edgeset zero s period is modified as appropriate and then restored If the user has registered an edgeset label then that edgeset is modified instead Example extern void tt_mfp_set_waveform Waveform wf extern Waveform tt_mfp_get_waveform tt_mfp_file_checks_on tt_mfp_file_checks_off By default MFP checks for out of date mfpdb files and retranslates them if necessary Since this check requires disk access it may hinder performance if using mfpadr files This checking can be toggled using the following functions extern void tt_mfp_file_checks_on j extern void tt_mfp_file_checks_off 4 3 16 June 1995 J990 Series Programmer s Manual Memory Fail Processing Low Level Programming Introduction Low level Programming Chapter 4 4 Memory Fail Processing MFP Low Level Programming Memory Fail Processing software provides support for programming the error processing hardware for the purposes of bitmapping The MFP software provides a complete low level syntax and high level support This chapter describes the low level approach
338. urements are slightly less accurate See your respective J990 Series test system specification for more information on the system PMU Note that while the system PMU could be used to test for leakage it is a shared resource and the test would have to be performed one pin at a time Pin by pin testing is time consuming not only because of the increase in test time but also because of the added per pin connection and disconnection times June 1995 3 1 25 Using Templates J990 Series Programmer s Manual System Pin PMU In addition to a system PMU the DC measurement system also provides pin PMU resources Pin PMUs are specifically designed for small current measurements like leakage testing and they have both accuracy and the speed advantages over the system PMU when used for this purpose The pin PMU can force current measure voltages within the following ranges Pin PMU Force Current Measure Voltage Ranges 200 uA 2 mA 50 mA The pin PMU can force voltage measure currents within the following ranges PinPMU Current Force Measure Ranges 200 nA 2 LA 20 HA 200 uA 2 mA Program Pin PMU Leakage Tests Programming a test system for a DC type tests is a simple procedure Note that by default the signal pins of the device are connected to the functional electronics driver comparator and dynamic loads and the power pin is connected to the voltage source see Figure 3 1 5 3 1 26 June 1995 J990 Series Pr
339. used to identify the two halves of the address pin cycle This notation is PINNAME SUFFIX OOo oO d where PINNAME is a pin defined in a pinset and suffix is O or 1 SUFFIX 0 means which data will be presented to the device first SUFFIX 1 means which data will be presented to the device second where first is defined as xgate or dO d1 d2 time and second means the ygate or d3 d4 d5 time as defined by the formatter mux hardware and the waveform database For example when address multiplexing two address bits are identified for each address pin address map function form pin physical AO O pro Aa0 1 pco A1S0 pri A1 1 pcl When multiplexing both address and data onto a pin pin suffixes must be used in both the address clause and the data clause address map function form pin physical ADOSO pro AD1 0 pco data map data form pin physical ADOS1 nil AD1 1 nil For pins that are dual purpose sometimes address sometimes data pin suffixing is typically not used since only one bit of data is needed per cycle 1 4 10 June 1995 J990 Series Programmer s Manual Creating MUT Database Files Mutaar File Example Address Multiplexed 1Mx4 DRAM MUT Database for 1Mx4 DRAM Device 10 Address Pins 4 Data I O Pins Address multiplexed inputs no scrambling or topo inversion use pinset d1lMx4pins pindb d1Mx4_pins mutset d1Mx4 size words 1
340. uxing is possible on both the drive only and IO channels For drive only channels the dO edge of the adjacent channel determines when that channel s edge will mux onto the current channel For IO channels the d3 edge of the adjacent channel determines when that channel s edges will mux onto the current channel The d3 edge of the current channel in the next cycle toggles back VIH Invert Invert Data Data VIL Channel Muxing with RC RC Figure 2 1 22 Channel Muxing with RC RC IO channels While very high frequencies can be achieved with this mux mode the adjacent channel may not be usable It is possible to use formatter muxing and channel muxing on the drive only channels to get four independent pieces of drive data in one cycle The only limitation would be the analog performance of the channel driver itself Channel muxing is also used to do double strobing in a cycle Two adjacent IO channels are muxed together which combines the drive and detect portions of both channels Channel muxing on IO channels can be used to get an edge strobe and a window strobe in the same cycle June 1995 2 1 25 Programmer s Guide to the Hardware J990 Series Programmer s Manual An exampie of a set of timing that works for chan mux under zstate d0 on an IO pin in inout mode pins form DOS_even io zstate d0 scio off comp on strobe edge chan mux on DOS_odd io zstate dO scio off comp on strobe ed
341. vailable Three ranges are available for voltage forcing and measuring Range Resolution 2V 100 uV 20 V 1 mV 40 V 10 mV Six ranges are available for current forcing and measuring Range Resolution 2 LA 100 pA 20 LA 1 nA 200 HA 10 nA 2 mA 100 nA 20 mA 1 HA 200 mA 10 uA Two ranges are available for voltage forcing and measuring Range Resolution 2V 100 uV 4Vto 18V 1 mV Five ranges are available for current forcing and measuring 2 pA 100 pA 20 uA 1 nA 200 LA 10 nA 2 mA 100 nA 20 mA 1 pA When forcing current a programmable current clamp is available which will limit the voltage on the pin This is useful when an open circuit condition occurs and the voltage is to be limited It can be programmed from 1 V to 40 V with 100 mV June 1995 2 1 57 Programmer s Guide to the Hardware J990 Series Programmer s Manual resolution 2 1 58 June 1995 J990 Series Programmer s Manual Programmer s Guide to the Hardware Patgen Sync Conditions The central FVM circuit also controls the pattern sync conditions The sync signal is a calibrated signal with nominal accuracy relative to the driver signals The sync pulse is generated when all sync conditions are met for a cycle These programmable sync conditions include O Oo Oo Oo Oo m SVM address SVM accumulator value used for loop and repeat counters cycle counter X and Y address
342. ve asynchronous operation This is useful for testing multiport devices such as video RAMs Flag signals can be used for handshaking between the two patgens so they can sync up when desired in the functional test pattern The signals from each patgen drive different channels in the test head The channels to be driven by each patgen are selectable A path Address amp Data main address scrambler B path Address alternate amp Data alternate memory address patgen scrambler Figure 2 1 5 Dual Asynchronous Patgen Operation drive only formatters drive only formatters to drive only channels to drive only channels June 1995 J990 Series Programmer s Manual Programmer s Guide to the Hardware Algorithmic Address and Data on the ADS bus The patgen controllers drive the memory patgens which generate algorithmic address and data for the memory device The algorithmic address information physical or memory array address is routed through the address scrambler which can generate device pin addresses scrambled addresses The data generator can generate algorithmic data information which can be topologically inverted based on address bits The scrambled address information and data are put onto the Address Data Source ADS bus which routes this information to the waveform generators Each pin s waveform generator can select a unique bit from this ADS bus to be used as a
343. ve sonst SOS chin in UNIES MON SMU SAM VIOLE xaluop xor yaluop xor xdevinv off g SOCR OE IE J990 Series Programmer s Manual ydevinv off SvaGgainive Ort CHS CIE OE xd hold VARNON ydevinv off EVOO Onesie continued on next page 5 1 14 June 1995 J990 Series Programmer s Manual Using Dual MPG Mode Example continued scan preset lsb of the x counters to 0 main and 1 alt y counters to 0 set th nable masks to mask out the x lsb of both main and alt counters preload x counters to xmax ycounters to ymax write O s xfast through entire array read O s xfast through entire array write 1 s xfast through entire array read 1 s xfast through entire array T INACTIVE_ CYCLE preset last bit of counters to 0 mpg and 1 mpg alt mpg xreg 0x0 xa jam reg dgroup next 0 Gampog sake xreg 0x1 xa jam reg dgroup next 0 nop INACTIVE_CYCLE mask out lsb of counters to inc by 2 s preset counters max 1 mpg and max mpg alt mpg xreg XMAX 1 yreg YMAX xena next jam reg yena next jam reg mpg alt xreg XMAX 1 yreg YMAX xena next jam reg yena next jam reg nop INACTIVE_ CYCLE mask out lsb of counters to inc by 2 s preset counters max 1 mpg and max mpg alt mpg xreg XMAX 1 yreg YMAX xa load reg ya load reg Cmpg alt xreg XMAX 1 yreg YMAX xa load reg ya load reg nop
344. vel menu and press Update 1 13 6 June 1995 J990 Series Programmer s Manual Introduction Programmer s Guide to the Hardware Chapter 2 1 Programmers Guide to the Hardware This section provides conceptual descriptions of the system hardware from a programming standpoint Block diagrams of the hardware are included with references to those pieces of software used to program the hardware New J990 Series programmers will find this section useful for gaining knowledge about test system capabilities The J990 Series consists of three system types the J997 the J994 and the J993 The J997 has the highest performance in the series It has the following features Oo Oo Ooo Oo oO m 100 200 MHz pattern generator patgen operation single dual or dual asynchronous pattern generator operation e two data generators per pattern generator 16X 16Y address generation 1 or 2 round test heads up to 16 device test sites in parallel per head up to 32 sites total 72 IO channels per test head 320 Drive only channels per test head divisible as e 40 drive only channels per site for up to 8 sites e 20 drive only channels per site for up to 16 sites up to 320 Megabits of Catch RAM for error processing 32 edge sets timing and format 1024 pattern control steps e 3 pattern control bits per IO channel per pattern location e 4 pattern control bits per drive only channel per pattern location June 1995 2 1 1
345. w Return to Complement in the following cycle For the first cycle out of NR format the initial complement or return data is not available 2 2 12 June 1995 J990 Series Programmer s Manual Timing Guidelines No format muxing di do di d2 do di d2 1 Complement Not Available Format muxing Complement Not Available Complement Not Available Figure 2 2 13 Initial Complement For NR format If necessary a dummy cycle can be used in the test pattern to allow the formatter time to reset so it can provide complement data June 1995 2 2 13 Programmer s Guide to the Hardware Timing Guidelines 2 2 14 June 1995 J990 Series Programmer s Manual Using Templates Introduction Chapter 3 1 Using Templates After the databases for a test program has been developed templates are used to generate instructions for specific tests In general you select the template for the test you want to perform and then input the data for the particular test into the template A template can be used over and over and different sets of data may be applied to it One set of data and the name of a template to which the data is applied is called an instance An instance database file holds one or more instances A job may use one or more instance database files The objective of this chapter is two fold to describe opens shorts functional leakage and ICC tests and to show how to create an instance database file that
346. w vw Debug 7 Tree Display z PAS background ee g g g g o init_ progr continuit input_lee input_lee io_leakage TEMPLATES co E datasheet Template__1 voltage_timing_char Figure 1 11 2 Insted Main Display Window Template List and Tree Display To edit a particular instance the Editor Panel is used It shows a blank line for each available template variable Parameters are specified by entering values into the blanks June 1995 7 17 5 Creating Instance Database Files GS Ce Name funct_corners_pass_fail J990 Series Programmer s Manual Instance Editor corner_list_Template funct_corners_pass_fail Use Automatic Datalog Title Datalog Title SETUP Function Name DATA Function Name Minimum Data Field Width Output or 1 0 Pin Names a a 9 a a 9 DQO DQ1 DQ2 DQ3 DB List Edit Table__1 Corner Names waveform Names Level Names Pattern Names ABCDEFGHI ns wave_timing_70ns wave_timing_70ns DB List Edit vcc_nom_levels min_vcc_nom_levels DB List Edit in_max_patt march_patt addrcompl_patt DB List Edit 500 Min 1 Max 65535 Base Test Number IMMEDIATE Corner Name INCLUDE Test Number s Range s Corner Match String Waveform Match String Level Match String Pattern Match String HAE E Figure 1 11 3 Instance Editor Panel
347. will be used in the Start database O Create SVM database second SVM Database O Create Start database last Contents of the Dgenaar File map pin statement coin enablemask statement lfg form statement Start Database Figure 1 8 2 Order of Creation of the Patterns Databases The Data Generator database is defined with the ADR dgenset statement inside a dgenaar file Only one dgenset statement is allowed per file The use pinset statement must appear before the data generator programming One dgenset contains all the conditions for data set ram coincidence masking logic function generator input selections and pin selections of data generator outputs These are programmed in separate statements within the dgenset Each pin is assigned to a data generator output either dgen0 or dgent1 Programs the coincidence masking register to a value that is based on the address size of the device The coincidence masking register is used when data as a function of address coincidence is needed X Y Only those address bits enabled should be considered for coincidence Programs the input selections to the logic function generators LFG s The inputs into the LFGs are patgen address bits x0 x15 yO y15 For example a checkerboard data pattern will typically select the LSB for both row and column addresses x0 y0 June 1995 1 8 3 Creating Pattern Database Files J990 Series Programmer s Manual data
348. with interface boards that are wired differently a separate chanset statement would be created for each of the interfaces The channel database can be created using one of two methods O Create an ADR file chanadr containing the chanset statement using a text editor then translate the ADR file into binary database file chandb using adr900 O Use the ADRedit tool to both create and translate the ADR file June 1995 1 3 1 Creating Channel Database Files J990 Series Programmer s Manual pins pinnadr Comment Row Select COINS elect Address 0 Data I O 0 dip _dib chanadr Pin Chan RAS 103 CAS 1 AO aba DQO 200 zip_dib chanadr Pin Chan RAS 233 CAS TPB AO CEL DQO 200 soj_dib chanadr Pin Chan RAS 103 CASEY AO RO DOOM AOK Figure 1 3 1 One Test Program Can be Used With Different Interfaces 1 3 2 June 1995 J990 Series Programmer s Manual Creating Channel Database Files Selecting Channels for the Device Pins Selecting IO Channels Note Since there are two types of channels in a J990 Series test head the programmer must select either a drive only or an IO channel to be connected to the device pin This decision should be based on whether there will be output data from the device that the tester needs to compare Device output pins should be connected to IO channels O Device input pins including data in pins should be connect
349. xecuted once at the end of the TEMPLATE PRE BODY section HASVALUE e This macro is used to check to see whether the parameter has a value in the instance or not Instances which have optional parameters must use this macro to check for to see if a value is present before acting on it This macro is used throughout all sections of a template for this purpose For example if HASVALUE tnum writesys testnumber tnum In this example the testnumber is only changed if the tnum parameter in the instance has a value June 1995 3 2 25 Customizing Templates J990 Series Programmer s Manual NEXT This macro is used to increment through a list of objects for a particular parameter In the following example the variable P is defined to be of type Pin and is used to increment through a list of pins The driveri parameter to the template is defined with parentheses around it in the tdl file indicating that the parameter can take a list of pins symbols as its argument In this example the outer loop first checks to see if there is a list of pins If there is a list the Pin variable is set to the first pin symbol in the driver list The drivers are set to the high state Then the Pin variable Pis incremented to point to the next entry in the driver list If there is a pin symbol the same operation is performed on that pin This forloop is typical most will have a similar structure for incrementing through lis
350. xport statement to allow other modules and databases to reference SVM labels that it defines It will also typically contain an import statement so it can reference edgeset and srcset labels within the patterns The mpgset contains a vector form statements which contains the default and actual pattern information for each location of SVM A header is used to define the table programming layout for the vector form Pattern labels are defined by inserting pattern names into the vector form Multiple patterns labels are usually defined in one mpgset mpgset cycle definition header vector form default LABEL pattern step for one SVM location pattern step for one SVM location pattern step for one SVM location pattern step for one SVM location RER SS 1 8 8 June 1995 J990 Series Programmer s Manual Creating Pattern Database Files mpgset cycle definition header default Pattern Locations The header is used to declare the fields that will be programmed in tabular format and their order It includes a list of pins with vector programming suffixes which establishes the vector states that will be allowed for each pin in each cycle e ADDRS M CLKS S DOS S mpg op header vector form E X X X Coy K cycle E X X X Gea Care poyele E X X X as fs peyete E X X X cycle where E is the edgeset for this location X is
351. y The values of bits 0 1 and 2 determine which of the eight states will be selected Bit 0 is the LSB These bits enter the eight state model lookup which maps the three bits to the eight states The default mapping is shown in Table 2 1 4 on page 2 1 32 Not all the bits need to come from the same place Bits 0 and 1 can independently select data from the ADS bus the SVM pin state data or logic 0 Any bit can be inverted before entering the eight state model lookup If bits O and 1 select their data from the ADS bus they do not have to be the same ADS bus bit The multiplexers selecting data from the ADS bus are completely independent permitting one data generator input on bit 0 and the other data generator bit on bit 1 if desired Bit 2 the MSB can get its data from either the SVM or logic 0 The input used for each of the 3 source select bits is determined by the source select RAM The source select RAM contains 16 locations Each location specifies which input ADS SVM 0 or their inverts will be used for all 3 bits Location 0 is predefined by the job executive It selects SVM for bit 0 SVM for bit 1 and SVM for bit 2 Locations 1 through 15 are available for the programmer to use as desired The particular contents of these locations within the source select RAM is June 1995 2 1 33 Programmer s Guide to the Hardware J990 Series Programmer s Manual established at load time The source select pointer however can
352. y selections in the hardware use the following AT900 statements writesys update _overlay_waveform OVERLAY _WAVEFORM_ NAME writesys update _overlay_ level OVERLAY LEVEL NAME In addition to overlays you can also update overlay waveforms and overlay levels Note that the location where the statement transfers or writes data i e from the database to the hardware to the hardware only or to the database only affects test results For example if the waveform named tight_timing had the values t1 10ns t2 12ns and t3 14 ns the overlay named loose timing had a single edge value of t2 16 ns and the following commands were entered writesys select_waveform tight_ timing TRANSFERS FROM DATABASE TO HARDWARE writesys select_overlay_waveform loose timing TRANSFERS FROM DATABASE TO HARDWARE writesys spec_ value t2 tight_timing 18ns WRITES TO DATABASE ONLY writesys update_overlay_waveform tight_ timing WRITES TO HARDWARE ONLY run FUNCTION then the function would use 18 ns for a timing value If however the following were run writesys select_waveform tight_ timing TRANSFERS FROM DATABASE TO HARDWARE writesys select_overlay_waveform loose timing TRANSFERS FROM DATABASE TO HARDWARE writesys spec_value t2 tight_timing 18ns WRITES TO DATABASE ONLY writesys update_waveform tight_timing
353. y_slice_flex_array is 4 indicating that four Catch RAM slice numbers will follow in the array June 1995 4 3 11 Memory Fail Processing High Level Programming J990 Series Programmer s Manual tt mfp destroy_crik This command removes a CRIK created using the tt_mfp_create_crik function from the list of available CRIKs The format of the function is tt_mfp_destroy_crik crik The CRIK argument is the name of a CRIK created using the tt_mfp_create_crik function call tt_mfp_get_ra_error_count This function call fetches the redundancy analyzer error counts for the analyzers specified in the analyzer_list flex array Results are returned in a flex array ra_error_count The format of the function call is tt_mfp_get_ra_error_count ra_error_counts analyzer_list head The ra_error_counts argument is a flex array in which the error counts will be stored This flex array must be equal in size to the analyzer_list see example below The analyzer_list is the name of a flex array that contains a list of the redundancy analyzers to be used This list of redundancy analyzers is sometimes referred to as a RIK or redundancy analyzer index key The head argument is used to specify which head is to have its errors read back The head argument is an integer of value 0 or 1 Only one head can have its errors read back at a time An example follows Read back region counts for analyzers 0 4 8 12 16 on head 0 int
354. you wish to capture in parallel The MFP software will attempt to generate a setup that allows the capture of that many parts simultaneously However if based on the device size testing speed IO channel selection J994 only Catch RAM option and desire to do masking or accumulative bitmapping there is insufficient Catch RAM available the MFP code will reduce the number of parallel sites and display a warning message The setups for parallel capture are described in terms of pseudo sites rather than physical sites Pseudo sites are numbered by MFP software starting with pseudo site number 0 and incrementing up by one until the number of sites specified in the bitmap usage template have been mapped to Catch RAM hardware or less if Catch RAM memory is not available Physical sites are numbered the same as in the chanadr file specified by site N The concept of pseudo sites allows the user to generate a setup with any number of devices in parallel and use it with various different active site lists without needing to modify or regenerate the setup The MFP drivers look at the active site mask when called and assign the first N active sites to the N pseudo sites There is support for setting up the Catch RAM in a split mode for two types of applications masked unmasked bitmaps and current test accumulated tests bitmaps For masked unmasked bitmaps the mask usually hard fails is stored in one half of the Catch RAM while all fails hard plus t
355. ys sort_nokeep bin_num TT_BIN_PF_FAIL return 0 1 12 6 June 1995 J990 Series Programmer s Manual Overlay Level and Waveform Files Introduction Chapter 1 13 Overlay Level and Waveform Files Objective Create oldb and owdb files Reference ADR900 Reference Manual Overlay waveforms and overlay levels provide another method for moving edges Instead of creating an entirely new wavedb or leveldb to move an edge you can use a small owdb or oldb file called an overlay In addition overlays can shorten job program generation time and reduce load time by cutting down on file space For example overlay waveforms can lower the number of waveform databases that must be created when shmooing several combinations of edges with different dependencies Overlay levels may be used in the same way Another benefit is overlays allow the equations in the original waveform or level to be left unchanged after a session of editing and shmooing the equations used in an overlay A main difference between overlay objects and waveform and level objects is overlays contain only a few pins and edges whereas waveforms and levels require all edges of a pin to be explicitly defined or defaulted Procedures for Creating Overlays The following are methods for creating overlay waveforms and overlay levels June 1995 1 13 1 Overlay Level and Waveform Files J990 Series Programmer s Manual Creating Overlays with
356. yzer_list once this function call is executed The analyzer_list defaults to NULL and may be omitted The headmask argument specifies which head the function call applies to The headmask argument may be June 1995 4 3 13 Memory Fail Processing High Level Programming J990 Series Programmer s Manual O 1 head 0 only 01 O 2 head 1 only 10 O 3 headsOandi 11 The default headmask is 3 which will set the all start cycles the same for both heads The headmask argument may be omitted tt mfp set ra error count This function is used to set the redundancy analyzer set error count The syntax of the function call is tt_mfp_set_ra_ error _ count count analyzer_ list headmask The count argument is the integer value the redundancy analyzer s error counter should be set to The analyzer_list is the name of a flex array that contains a list of the redundancy analyzers to be used This list of redundancy analyzers is sometimes referred to as a RIK or redundancy analyzer index key For an example of how to create a flex array see the tt_mfp_create_crik discussion on page 4 3 11 If NULL is specified instead of the name of analyzer list then the current the current RA all RIK will be used see the tt_mfp_set_ra_all_rik discussion on page 4 3 13 Note that if an analyzer_list is specified the RA all RIK will be reset to the value of the analyzer_list once this function call is executed The analyzer_list defaults

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