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Model 6517A Electrometer User`s Manual

1. Cal operation Condition B15 B12 B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 BO 8 AA Y Y y Y Seq Idle Calc Arm Trig Cal PTR Transition NTR Filter B15 B12 B11 B10 B9 B8 B7 Be B5 B4 B3 B2 B1 BO y y Al Y Al Gees Seq Idle Calc Arm Trig Cal opetan EE B15 B12 B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 Bo Ur To Operation Summary Bit OSB of Status Byte Register See Figure 3 13 Figure 3 7 Operation event status j OR Le A p 8 i cal B15 B12 B4 B3 B2 B1 BO dle Idle Layer Arm Waiting in an Arm Seq Sequnce Test Running Calc Calculating Reading Trig Waiting in Trigger Layer Cal Calibrating amp Logical AND OR Logical OR Operation Event Enable Register PTR Positive Transition Filter NTR Negative Transition Filter 3 9 IEEE 488 Reference Figure 3 8 Arm event status 3 10 From ORed Summary of Sequence Event Status See Figure 3 7 To Bit B6 Arm of Operation Event Condition Register See Figure 3 5 Arm Condition Register B14 B2 PIR Arm NTR Transition Filter B14 B2 Arm Event Re
2. POWER LINE GROUND Figure 2 84 Eliminating ground loops 2 21 2 Triboelectric effects Triboelectric currents are generated by charges created be tween a conductor and an insulator due to friction Here free electrons rub off the conductor and create a charge imbal ance that causes the current flow For example bending a tri axial cable causes friction between the center conductor HI and its surrounding insulator resulting in triboelectric cur rents Triboelectric currents can be minimized as follows e Use low noise cables These cables are specially de signed to minimize charge generation and use graphite to reduce friction The Keithley Model 7078 TRX triax cables are low noise e Use the shortest cables possible and secure them i e taping or tying to a non vibrating surface to keep them from moving 2 21 3 Piezoelectric and stored charge effects Piezoelectric currents are generated when mechanical stress is applied to certain insulating materials i e crystalline In some plastics pockets of stored charge cause the material to behave in a similar manner When building test fixtures choose good insulating materi als and make connecting structures as rigid as possible Make sure there are no mechanical stresses on the insulators 2 21 4 Electrochemical effects Error currents also arise from electrochemical effects when ionic chemicals create weak batteries on a circuit board These ba
3. 6517A 7 200 A LO 00kQ 100V 100kQ Figure 2 15 Floating V source 2 4 6 Test fixtures Whenever possible use shielded low leakage test fixtures to make precision measurements Keithley test fixtures Keithley offers a variety of different test fixtures The ones that are typically used with the Model 6517A are described as follows Model 8002A High Resistance Test Fixture This test fix tures allows resistance measurements as high as 10 5Q Fea tures include e A 3 lug max connector and dual binding posts make connections to the Model 6517A simple e Two in line DUT connection posts that are mounted on a guard plate e Light free environment for light sensitive DUT e Safety Interlock When connected to the Model 6517A voltage cannot be sourced to the test fixture when the lid is Open e Screw terminal on test fixture chassis for connection to safety earth ground Note Figure 2 33 in paragraph 2 7 1 shows connections to the Model 6517A and the equivalent circuit Model 8009 Resistivity Test Fixture This test fixture al lows volume resistivity in the range from 10 to 10 8Q cm and surface resistivity in the range from 10 to 10 Q sq Features include e A 3 lug max connector and dual binding posts make connections to the Model 6517A simple e Guarded electrodes that can accommodate samples up the Ye thick and 4 x 4 e Safety Interlock When connected to the Model 6517A the V
4. Menu item Description SCAN Scan layer menu SOURCE Select scan source IMMEDIATE Use to pass operation immediately into the measure layer EXTERNAL Use external triggers to control scanning MANUAL Use TRIG key to control scanning GPIB Use bus triggers to control scanning TRIGLINK Use Trigger Link triggers to control scanning Enter Trigger Link lines TIMER Use a timer to control scanning and enter interval between scans 0 001 999999 999 sec HOLD Use to hold up the measurement in the scan layer DELAY Use to delay scan in the layer 0 001 999999 999 sec COUNT Define number of scans to be performed INFINITE Repeat scanning indefinitely ENTER SCAN COUNT Specify count 1 99999 CONTROL Select trigger control mode SOURCE Enable Source Bypass ACCEPTOR Disable Source Bypass ARM Arm layer menu SOURCE Select arm source IMMEDIATE Use to arm meter immediately and pass operation into the scan layer EXTERNAL Use external triggers to arm meter MANUAL Use TRIG key to arm meter GPIB Use bus triggers to arm meter TRIGLINK Use Trigger Link triggers to arm meter Enter Trigger Link lines RT CLOCK Use clock to arm instrument Enter time and date HOLD Use to hold up the measurement in the arm layer COUNT Define number of times to arm meter INFINITE Continuously re arm meter ENTER ARM COUNT Specify count 1 99999 CONTROL Select trigger control mode SOURCE Enable Source Bypass ACCEPTOR Disable Source Bypass INIT Ena
5. 2 19 2 COMMUNICATION The COMMUNICATION menu option allows you to select and configure the GPIB or RS 232 bus NOTE Selecting the alternate interface GPIB or RS 232 resets the instrument to the pow er on defaults This reset action causes the instrument to exit from the MAIN MENU GPIB The GPIB menu is used for the following operations e To select the IEEE 488 bus GPIB e To view or change the IEEE 488 address e To select the GPIB language SCPI or DDC e To select the talk only mode and its parameters e To select the data elements to send e To view the status byte of the instrument Changing between Addressable and Talk only causes triggers to be halted ADDRESSABLE With the instrument set for Address able it can listen and talk to a bus controller e ADDRESS This menu item lets you check and or change the IEEE 488 address of the instrument At the factory the address is set to 27 but it can be changed to any value from 0 to 30 After selecting ADDRESS the present IEEE 488 ad dress will be displayed If you wish to change the ad dress use the RANGE A and Y keys to display the desired number and press ENTER es LANGUAGE This menu item is used to select the language for the GPIB NOTE Selecting the alternate language SCPI or DDC resets the instrument to the power on defaults This reset action causes the in strument to exit from the MAIN MENU SCPI Sele
6. Minimum recommended Range source resistance pA 1 GQ to 100 GQ nA 1 MQ to 100 MQ uA 1 KQ to 100 kQ mA 1 Q to 100 Q 2 29 Front Panel Operation Source capacitance DUT source capacitance will also affect the noise perfor mance of the Model 6517A ammeter In general as source capacitance increases the noise also increases To see how changes in source capacitance can affect noise gain let us again refer to the simplified ammeter model in Figure 2 28 The elements of interest for this discussion are the source ca pacitance Cg and the feedback capacitance Cp Taking into account the capacitive reactance of these two elements our previous noise gain formula must be modified as follows OutputVyNorsp Input Vyoysp Zp Zs Here Zp represents the feedback impedance made up of Cp and Rp while Zg is the source impedance formed by Rg and Cg Furthermore R Zp ener eae 2mfRpC 1 and R Zs S 2mfR Cy 1 Note that as Cg increases in value Ze decreases in value thereby increasing the noise gain Again at the point where Zs Zp the input noise is amplified by a factor of two The maximum value of source capacitance Cg for the Mod el 6517A ammeter is 10 000pF You can however usually measure at higher source capacitance values by inserting a resistor in series with the ammeter input but remember that any series resistance will increase the voltage burden by a factor of Iy Borprs For examp
7. Released by source instrument acceptor instruments Figure 2 71 Semi synchronous Trigger Link specifications For example assume that a Model 6517A is connected to two Model 7001 or 7002 Switch Systems for semi synchro nous operation as shown in Figure 2 72 All three instru ments are programmed to use trigger line 1 The two Model Tigger Link Connector Model 6517A 7001 or 7002 Switch System Figure 2 72 Typical semi synchronous mode connections Front Panel Operation 7001s 7002s have relay settling times of 1Omsec and 50msec respectively The Model 6517A is designated as the trigger control source and the two Model 7001 7002 units as trigger control acceptors Assume that the Model 6517A initially performs a measure ment After the reading is done the Model 6517A drives the trigger line low The negative going edge triggers both Mod el 7001s 7002s to close a channel While the Model 7001s 7002s are in the process of closing a channel they hold the trigger line low Ten milliseconds after switch closure the first Model 7001 7002 releases the trigger line However the second Model 7001 7002 continues to hold the line low since it is not finished Fifty milliseconds after switch closure the second Model 7001 7002 releases the trigger line The posi tive going edge triggers the Model 6517A to make a mea surement and subsequently pull the trigger line back down to close the next channels This proces
8. To retain the displayed address press EXIT four times to return the instrument to the measurement display state To change the primary address use the lt and gt keys and the RANGE A and keys to display the new ad dress value 0 to 30 The ad and keys control cur sor position and the A and W keys increment and decrement the selected digit With the desired address value displayed press ENTER The address will be stored in non volatile memory That is it will not be lost when the instrument is turned off Press EXIT three times to return to the measurement display state NOTE Each device on the bus must have a unique primary address Failure to observe this precaution will probably result in erratic bus operation 3 3 IEEE 488 Reference 3 4 GPIB programming language selection When using the Model 6517A over the GPIB interface you can use either SCPI commands and common commands or DDCs Most of the information in this manual documents the SCPI programming language See paragraph 3 28 for infor mation on using the DDC progrmming language Perform the following steps to check or change the GPIB programming language 1 Display the MAIN MENU by pressing the MENU key 2 Use the cursor keys lt q and gt to place the cursor on COMMUNICATION and press ENTER The COM MUNICATIONS SETUP menu will be displayed 3 Place the cursor on GPIB and press ENTER The GPIB PRINTER SETUP menu will
9. EXTERNAL Use this option to select the external trigger source Once the test is armed it will start when the Model 6517A receives an external trigger via the EXT TRIG IN connector Note that the TRIG key can instead be used to start the test TRIGLINK Use this option to select the trigger link trigger source After selecting TRIGLINK you will be prompted to select the trigger link line Once the test is armed it will start Front Panel Operation to start the test Table 2 20 CONFIGURE SEQUENCE menu structure Default Menu item Description parameter APPLICATIONS Select type of test DEV CHAR Device Characterization Tests DIODE LEA KAGE CURRENT Diode Leakage Current Test START V Specify start voltage 1V STOP V Specify stop voltage 10V STEP V Specify step voltage 1V DELAY Specify delay lsec CAPACITOR LEA KAGE CURRENT Capacitor Leakage Current Test BIAS V Specify bias voltage 1V STORE nnnnn READINGS Specify number of readings 10 INTERVAL Specify time interval 1 sec CABLE INSULATION RESIS TANCE Cable Insulation Resistance Test BIAS V Specify bias voltage 1V STORE READINGS Specify number of readings 5 INTERVAL Specify time interval 1 sec RESISTOR Resistor Voltage Coefficient Test VOLTAGE COEFFICIENT Specify Ist test voltage 1V SOURCE V1 Specify Ist delay lsec DELAY 1 Specify 2nd test voltage 2V SOURCE V2 Specify 2nd delay 1 sec DELAY 2 R RESISTIVITY Resistance Resistivity Tests NORMAL Standar
10. FILL AND STOP This control selection fills the buffer with the requested number of readings and stops You can then recall the readings PRETRIGGER This selection continuously stores readings until a user programmed trigger event occurs It then stores post trigger readings For example with a buffer size of 100 readings there can be 50 readings stored before the trigger event and 50 readings stored after the trigger The first read ing after the trigger is reading zero Pretrigger readings have reading numbers and relative time stamps with a minus sign post trigger readings have reading numbers and relative time stamps with a plus sign After selecting PRETRIG GER configure pretrigger control further as follows e PERCENTAGE or READING COUNT Specify the number of readings to store before the trigger event as a percentage of the total number of stored readings or as a number of pretrigger readings You will be prompted to enter the percentage or count value e EVENT Selects the source of the pretrigger or mark point event This can be a Manual GPIB Trig ger Link or External trigger CONTINUOUS With this control selection readings are al ways stored in the buffer The process continues with the oldest readings being overwritten in a circular manner until storage is interrupted with the EXIT key NEVER Gets set to this if data storage has been interrupted Pressing the STORE key changes NEVER to FILL AND
11. IEEE 488 Reference 3 21 7 QUEue commands Description Parameters Query Description NEXT STATus QUEue NEXT Read Error Queue As error and status messages occur they are placed into the Error Queue This query command is used to read those messages The Error Queue is a first in first out FIFO register Every time you read the queue the old est message is read and that message is then removed from the queue The queue will hold up to 10 messages If the queue becomes full the message 350 Queue Overflow will occupy the last memory location in the register On power up the Error Queue is empty When the Error Queue is empty the message 0 No error is placed in the Error Queue The messages in the queue are preceded by a number Negative numbers are used for SCPI defined messages and positive numbers are used for Keithley defined messages The mes sages are listed in Table 2 5 After this command is sent and the Model 6517A is addressed to talk the oldest message in the queue is sent to the computer Note The STATus QUEue NEXT query command performs the same function as the SYS Tem ERRor query command see System subsystem ENABle lt list gt STATus QUEue ENABle lt list gt Enable messages for Error Queue lt list gt numlist where numlist is a specified list of messages that you wish to enable for the Error Queue ENABle Query list of enabled messages
12. Positive Transition PTR Register Bit Position B15 B12 B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 BO Event Seq Idle Calc Arm Trig Cal Decimal Weighting 2048 1024 512 64 E S Se ee eeg 1 1011 210 29 26 25 20 Value o O 1 1 ON Value 1 Enable Negative Transition 0 Disable Negative Transition B Negative Transition NTR Register Figure 3 36 Operation Transition Filter 3 120 IEEE 488 Reference Effects of positive transitions on the Trigger Event Register Positive transition effect on Trigger event Trigger Event Register Sequence 1 Sets B1 when waiting in Trigger Layer Bit Position B15 B2 B1 BO Event Seq1 Decimal Weighting 2 21 Value o 1 Value 1 Enable Positive Transition 0 Disable Positive Transition A Positive Transition PTR Register Bit Position B15 B2 B1 Event Seq1 Decimal Weighting 2 21 Value DI Value 1 Enable Negative Transition 0 Disable Negative Transition B Negative Transition NTR Register Figure 3 37 Trigger Transition Filter 3 121 IEEE 488 Reference 3 122 Effects of positive transitions on the Arm Event Register Positive transition effect on Arm e
13. READings lt n gt TRACe FEED PRETrigger AMOunt READings lt n gt Specify number of pre trigger readings lt n gt 0 to MAXimum Specify number or readings DEFault Half of MAXimum MAXimum Buffer size as programmed by TRACe POINts MINimum 0 READings Queries number of pre trigger readings READings DEFault Queries RST default number of readings READings MAXimum Queries largest allowable number of readings READings MINimum Queries lowest allowable number of readings This command is used to specify how much of the defined buffer POINts will be used to store pre triggered readings This command is essentially the same as the PERCent command except the amount is expressed as an exact value instead of a percent Sending a value that exceeds the defined size of the buffer see POINts generates an error The command is ignored 3 139 IEEE 488 Reference 3 140 Parameters Query Description Parameters Query Description SOURce lt name gt TRACe FEED PRETrigger SOURce lt name gt Specify pre trigger event lt name gt EXTernal Use External Trigger as pre trigger event TLINk Use Trigger Link as pre trigger event BUS Use bus trigger as pre trigger event MANual Use TRIG key as pre trigger event SOURce Query pre trigger event source This command is used to specify the event for the pre trigger storage mode With the pre trigger mode selected CONTrol PRETrigger readings are continuou
14. ARM SOURce EXTernal RM SOURce TLINk RTCLock HOLD ARM LAYer2 TCONfigure DIRection SOURce Source Bypass Enabled Arm Layer 2 ARM LAYer2 IMMediate Output Trigger Source Bypass Enabled H Another Scan 2 ARM LAYer2 COUNt lt n gt INFinite Scan Layer ARM LAYer2 SOURce IMMediate RM LAYer2 SOURce MANual RM LAYer2 SOURce BUS RM LAYer2 SOURce TlMer RM LAYer2 SOURce EXTernal ARM LAYer2 SOURce TLINk ARM LAYer2 SOURce HOLD ARM LAYer2 DELay lt num gt TRIGger TCONfigure DIRection SOURce Source Bypass Enabled TRIGger IMMediate Trigger Layer Another Measure 2 Output Trigger TRIGger COUNt lt n gt INFinite Measure Layer Control Measure Event Source Detection TRIGger SOURce IMMediate TRIGger SOURce MANual TRIGger SOURce BUS TRIGger SOURce TIMer TRIGger SOURce EXTernal RIGger SOURce TLINk TRIGger SOURce HOLD TRIGger DELay lt num gt Selecting alternate interface GPIB or RS 232 or selecting alternate GPIB language SCPI or DDC SYSTem PRESet and RST default Figure 3 14 Trigger Model IEEE 488 bus operation 3 19 IEEE 488 Reference Device Action The primary device action is a measure ment However the device action could include a function change and a channel scan if scanner is enabled A channel is scanned closed before a measurement is made When scanning internal channels the pr
15. Equivalent Circuit Relay Coil Flyback Diode Figure 2 81 Sample externally powered relays 2 122 External Power 5V to 30V Transistor Switch NOTE If any LIMITS control is enabled LOLIM or 2 HILIM1 or 2 High Low or Pass the OUTPUT STATE menu does not check or change the output status Refer to paragraph 2 19 5 for information on limits DIGOUT menu items The DIGOUT menu is used to configure the following oper ations e Check or change the STATE ON or OFF of the four digital output lines e Check or change the LOGIC SENSE of the digital out put lines The logic sense can be active high ON 5V or active low ON OV STATE Use this menu item to check or change the state on or off of the four digital output lines The actual level of an on line is determined by the sense which is controlled by the next menu item LOGIC SENSE The state on or off of a digital output line is changed by placing the cursor on the desired line and pressing the RANGE A or YW key These keys simply toggle the state With the lines configured as desired press ENTER LOGIC SENSE Use this menu item to check or change the sense of the digital output lines The sense of each line can be active high ON 5V or active low ON OV When LOGIC SENSE is selected you will be prompted to select the desired output line e TTLI TTL2 TTL3 OR TTL4 Selects the digital output line and displays the f
16. LIMIT SET 2 Limit Set 2 menu CONTROL Enable disable limit set 2 LOLIM2 Set value of low limit 2 HILIM2 Set value of high limit 2 STROBE CONTROL PASS PATTERN STATUS MSG GENERAL DIGOUT STATE LOGIC SENSE SERIAL A D CONTROLS LINE SYNC DATA STAMP LIMIT CTRL TIMESTAMP TYPE RELATIVE TIME REAL TIME RESET TIME RESET RDG DISPLAY NUMERIC FORMAT DECIMAL CHAR CLOCK TIME DATE FORMAT Enable disable limit strobe signal of digital output 4 when trigger occurs Specify patterns on digital outputs to signify limit pass Enable disable status message mode General menu Digital output menu Check change states of digital output lines Check change sense of digital output lines Display serial number memory option SCPI version and firmware revisions A D menu Enable disable line synchronization Also displays power line frequency Configure A D to measure additional inputs humidity and external temperature Enable disable A D hardware limit Configure timestamp Check or change type Reference timestamp to relative time Reference timestamp to real time Reset relative timestamp to zero Reset reading number to zero Display menu Select measurement units engineering or scientific Select period or comma as decimal point Clock menu Check or set time of day Check or set date Select clock format 12 hour or 24 hour format 2 109 Front Panel Operation 2 19 1 SAVESETUP The SAVESET
17. Select this option if using the Model 8009 Resistivity Test Fixture This option automatically sets the parameters for the volume resistivity calcula tion see paragraph 2 7 2 since the electrode dimen sions are known e USER Use this option if using another manufactur er s test fixture or a custom built test fixture This op tion is also used for the Model 8009 test fixture if using an effective area coefficient less than one B lt 1 After selecting this option you will be prompted to enter the value for K Paragraph 2 7 2 explains how to calculate K VSOURCE The VSOURCE menu item is used to select either AUTO V Source or MANUAL V source e MANUAL Select this option if you wish to manually set the V Source range and level for the ohms function e AUTO Select this option if you wish the Model 6517A to automatically select the optimum V Source range and level for the ohms function 40 000V for the 2MQ through 200GQ ranges and 400 00V for the 2TQ through 200TQ ranges With AUTO V Source selected you will not be able to manually set the V Source range or level while in the ohms function 2 41 Front Panel Operation WARNING A hazardous voltage 400V may auto matically be set for the ohms function when AUTO V Source is selected Table 2 11 identifies the ohms ranges that use the high voltage 2 7 4 Multiple display There is one multiple display that is unique to the ohms func tion Meas
18. ccsc csssesseesdatedascsteanivedsveascasvbcoaasesabeaessctsabenacs conesenscd svannssanseanasdns cosdeisanbeseis Interlock CONMECHONS ET iao H td wired iter OCK ss ss2 ccseseesicessestans deuseasesetanscnstesincebaaeosa less E EERE ENEE ER ESED Ee Typical connections for unguarded voltage measurements sssssseessseresrereresrssrrrrsreresrretrrerenrerenre Typical connections for guarded voltage measurements 0 0 0 0 eee cee ceeceseeeeceseeeeceeeeseceeeeeeeeeeeeteneeaey Ee E Unguarded voltage measurements Guarded voltage measurements rissies eer ENEE Sen ve aetctsesedieesevsensenvecdsenaspyvaennasbsvosihunsuebesey Typical connections for current measurements eee cee csecsseeseceseeseceecesececeeeeeeeeseaseaeeeeeeaeeeaeeaey Connections for guarded floating current MeasUreMENts ee eeeeeseeceseneeeececseeseesecaecateeeeaecaeeeeaeeas Voltage burden considerations sse seccssscssvccsiesnsasscasevsissosenesbssssesesbaceeoavvenisessscesabsnderseassonsesseesesnasesssdepaes HOULCE resistance and CapacCwlani Ce ee Sov sesvasvsedraessivscokuesssveas sdoass Se EES High impedance current measurements cceececseceeeceeseceseecesceceaeeeneeceeeecseceeeeenseeesaecterecsaeeeneeenees os Floating current measurements ioris ninth ees eE iene lait Typical connections for resistance Measurements eee ceeee cee ceeeceecescesecaeeseceeceeseeeeeeeeeeeaeeeneeaey Connections for resistance measurements using Model 8002A test fixture
19. 807 RS 232 OFLO Characters Lost EE 808 ASCII only with RS 232 EE 850 Invalid Test Sequence Setting EE 851 Test Sequence Running SE 860 Interlock Violation Error EE 861 Vsource Limit too low for auto EE 900 Internal System Error EE 950 DDC Reading overflow SE 951 DDC Reading Available SE 952 DDC Buffer full SE 953 DDC Mode IDDC Error EE 954 DDC Mode IDDCO Error EE 955 DDC Trigger Overrun Error EE 956 DDC No Remote Error EE 957 DDC Number Error EE 958 DDC Ready SE SE Status event EE Error event 2 3 4 Multiple displays Each measurement function has its own set of multiple dis plays shown in the bottom line of the front panel display The PREVious and NEXT DISPLAY keys scroll through the selections for the present function The multiple displays can show a reading in a different form or give additional information about the reading for exam ple e Top line shows a reading bottom line shows a zero cen ter bar graph with adjustable limits To scroll through the multiple displays available for each measurement functions repeatedly press and release the NEXT DISPLAY key The same action with the PREVious DISPLAY key does a reverse scroll through the displays To return to the default reading display just press and hold ei ther key Multiple displays that are specific to a particular function or operati
20. ROUT SCAN INT ROUT SCAN LSEL INT Valid function command words i e WOLT DC RESistance etc E 5 SCPI Conformance Information Introduction The Model 6517A complies with SCPI version 1991 0 Ta bles 3 4 through 3 16 list the SCPI confirmed commands and the non SCPI commands implemented by the Model 6517A F 1 Device Dependent Command Summary Mode Command Description Execute X Execute other device dependent commands Function FO Volts F1 Amps F2 Ohms V I F3 Coulombs F4 External feedback F5 Ohms V T Range EXTERNAL VOLTS AMPS OHMS COULOMBS FEEDBACK RO Auto Auto Auto Auto Auto RI 2V 20pA 200TQ 2nC 2V R2 2V 20pA 20TQ 2nC 2V R3 20V 200pA 2TQ 20nC 20V R4 200V 2nA 200GQ 200nC 200V R5 200V 20nA 20GQ 2uC 200V R6 200V 200nA 2GQ 2uC 200V R7 200V 2uA 200MQ 2uC 200V R8 200V 20uA 20MQ 2uC 200V R9 200V 200uA 2M Q 2uC 200V R10 200V 2mA 200kQ 2uC 200V R11 200V 20mA 200kQ 2uC 200V R12 200kQ g Disables autorange M anual ohms only Zero Check CO Zero check off Cl Zero check on Zero Correct ZO Zero correct disabled Z1 Zero correct enabled Reference NO Reference disabled NI Reference enabled Digital Filter PO Digital filter disabled P1 Digital filter enabled Device Dependent Command Summary G 2 Mode Command Description Reading Mode BO Electrometer B1 Buffer reading B2 Maximum reading B3 Minimum reading B4 Volt
21. STATe lt b gt Enable or disable voltage limit OFF V STATe Query state of voltage limit y MCONnect lt b gt Enable or disable V Source LO to ammeter LO con OFF nection MCONnect Query Low connection CURRent Path for current limit RLIMit Path to control resistive current limit STATe lt b gt Enable or disable resistive I limit OFF STATe Query resistive I limit LIMit Path to check current compliance STATe Query state of current compliance Notes 1 RST and SYSTem PRESet have no affect on the state of the output lines However cycling power sets all output lines false OFF 3 52 Table 3 12 STATus command summary IEEE 488 Reference Default Command Description parameter SCPI Ref STATus V MEASurement Path to control measurement event registers EVENt Read the event register Note 2 3 21 1 ENABle lt NRf gt Program the enable register Note 3 3 21 2 ENABle Read the enable register PTRansition lt NRf gt Program the positive transition register Note 4 3 21 3 PTRansition Read the positive transition register NTRansition lt NRf gt Program the negative transition register Note 5 213 21 NTRansition Read the negative transition register 4 CONDition Read the condition register OPERation Path to control operation status registers y 3 21 5 EVENt Read the event register Note 2 y ENABle lt NRf gt Program the enable register Note 3 V 3 21 1 ENABle
22. Source Ohms accuracy Assume that the test voltage is set for 100 000V AUTO mea surement range is enabled and the resistor you are measur ing is reading exactly 01 0000MQ Also assume that the amps reading is 1 000e 04 A 100 000uA on the 200uA range This reading is available as a multiple NEXT display MEAS and SRC Amps accuracy for the 100A reading 200uA range is cal culated as follows Accuracy rdg counts 0 1 of 100uA 5 counts 0 1yA 5 counts 0 1nA 0 005uA 0 105yA A 6 Specifications Note 5 counts on the 200uA range equals 000 005uA Thus the accuracy range for a 100 000HA reading is 99 895uA to 100 105uA V Source accuracy 100V on the 100V range is calculated as follows Accuracy setting offset 0 15 of 100V 10mV 0 15V 0 01V 0 16V Thus the accuracy range for the 100V V Source setting is 99 84V to 100 16V Ohms can then be calculated R V I using amps and V Source accuracy as follows 100 16V Ohms Upper Limit Accuracy SCENE 1 00265MQ 99 84V Ohms Lower Limit Accuracy 100 105uA 0 99735MQ Accuracy 2650 Thus the accuracy range for the 01 0000MQ Manual V Source reading is 00 9974MQ to 01 0027MQ A 1 4 Calculating coulombs accuracy From the specifications Coulombs is calculated as follows Accuracy rdg counts The following example shows how to compute accuracy for the 2uC range Assume
23. Surface Resistivity Surface resistivity is defined as the electrical resistance of the surface of an insulator material It is measured from electrode to electrode along the surface of the insulator sample Since the surface length is fixed the measurement is independent of the physical dimensions i e thickness and diameter of the insulator sample Surface resistivity is measured by applying a voltage poten tial across the surface of the insulator sample and measuring the resultant current as shown in Figure 2 33 The Model 6517A automatically performs the following calculation and displays the surface resistivity reading Ps KR Ps Surface resistivity per square R Measured resistance in ohms V D Kg P g where P The effective perimeter of the guarded electrode mm g Distance between the guarded electrode and the ring electrode mm Refer to Figure 2 34 to deter mine dimension g Guard Top Electrode gt Sample Ring Guarded HI HI Electrode 6517A f 6517A V Source Picoammeter LO LO Se kd Figure 2 33 Surface resistivity measurement technique For circular electrodes P Dy Do D g refer to Figure 2 34 to determine dimension Do Ring Electrode Guarded Electrode gt e s D Do Dz lt D3 gt D gt Le D gt Sample Guarded Electrode Rin
24. TSOurce Query trigger source TLINe lt NRf gt Specify TLINk line 1 to 6 1 3 25 1 TLINe Query TLINk line DLEakage Diode leakage test path STARt lt NRf gt Specify start voltage 1000 to 1000 1V 3 25 2 STARt Query start voltage STOP lt NRf gt Specify stop voltage 1000 to 1000 10V 3 25 3 STOP Query stop voltage STEP lt NRf gt Specify step voltage 1000 to 1000 1V 3 25 4 STEP Query step voltage MDELay lt NRf gt Specify measure delay 0 to 10000 0 sec 1 sec 3 25 5 MDELay Query measure delay CLEakage Capacitor leakage test path SVOLtage lt NRf gt Specify bias voltage 1000 to 1000 1V 3 25 6 SVOLtage Query bias voltage SPOints lt NRf gt Number points 1 to Max Buffer 10 3 25 21 SPOints Query number of points SPINterval lt NRf gt Interval between points 0 to 99999 9 sec lsec 3 25 22 SPINterval Query interval CIResistance Cable insulation resistance test path SVOLtage lt NRf gt Specify bias voltage 1000 to 1000 1V 3 25 6 SVOLtage Query bias voltage SPOints lt NRf gt Number points 1 to Max Buffer 5 3 25 21 SPOints Query number of points SPINterval lt NRf gt Interval between points 0 to 99999 9 sec 1 sec 3 25 22 SPINterval Query interval RVCoefficient Resistor voltage coefficient test path SVOLtage 1 lt NRf gt Specify source voltage 1 1000 to 1000 1V 3 25 6 SVOLtage 1 Query source voltage MDELay 1 lt NRf gt Specify measure dela
25. The instrument is placed in the talker idle state by sending it an UNT Untalk command addressing it to listen or with the IFC Interface Clear command IEEE 488 Reference LSTN This indicator is on when the Model 6517A is in the listener active state which is activated by addressing the instrument to listen with the correct MLA My Listen Ad dress command Listen is off when the unit is in the listener idle state The unit can be placed in the listener idle state by sending UNL Unlisten addressing it to talk or by sending IFC Interface Clear over the bus SRQ The instrument can be programmed to generate a service request SRQ when one or more errors or conditions occur When this indicator is on a service request has been generated This indicator will stay on until the serial poll byte is read or all the conditions which caused SRQ have ceased to exist See paragraph 3 8 6 for details 3 7 3 LOCAL key The LOCAL key cancels the remote state and restores local operation of the instrument Pressing LOCAL also turns off the REM indicator and re turns the display to normal if a user defined message was dis played Note that the LOCAL key is also inoperative if the LLO Lo cal Lockout command is in effect 3 8 Status structure The status structure for the Model 6517A is summarized in Figure 3 5 Instrument events such as errors are monitored and manipulated by seven status register sets Notice that
26. Timestamp type for bus readings is coupled to timestamp type for buffer readings Thus if you change timestamp type 2 124 from this menu structure it also changes in the CONFIG DATA STORE menu structure see paragraph 2 16 1 RESET TIME This item is used to reset the relative time stamp to 0 000000 seconds The timestamp also resets to zero seconds when the instrument is turned on It has no ef fect on the real time clock RESET RDG This menu item is used to reset the reading number to zero The reading number also resets to zero when the instrument is turned on DISPLAY This menu item is used to select the exponent mode engi neering units or scientific notation for display readings and lets you specify displayed decimal points as either periods or commas NUMERIC FORMAT This item is used to select the expo nent mode e ENGR Use this option to display readings using en gineering units Oe 1 00000yA SCIENTIFIC Use this option to display readings us ing scientific notation i e 1 00000e 06 A The two following options are available for the scientific nota tion exponent mode FLOATING With this selection the exponent value will change automatically to provide optimum reading resolution FIXED With this selection the exponent value will re main fixed Only the mantissa part of the reading will change After selecting FIXED the currently selected exponent value will be displayed If you chan
27. ed to safety earth ground as shown in Figure 2 21 should be used for voltage measurements at or above 30V 6 Press Z CHK to disable zero check and take a reading from the display NOTE To disable zero correct enable zero check and press REL 6517A 237 ALG 2 Red HI Cable Measured Voltage WS _1 Black LO Shield Optional A Connections 5 GND PREAMP OUTPUT ao 9 ke Ranging Amp To A D Converter COMMON 2V ANALOG OUTPUT NNA B Equivalent circuit Figure 2 20 Typical connections for unguarded voltage measurements 19 Kate Front Panel Operation 237 ALG Cable Measured Voltage Safety Earth Ground A Connections CRT PREAMP OUTPUT 2 Input 6517A 12 gt COMMON ANN 2V ANALOG OUTPUT B Equivalent circuit Figure 2 21 Typical connections for guarded voltage measurements 2 20 WARNING Ranging Amp gt To A D Converter 2 5 2 Volts configuration The following information explains the various configura tion options for the volts function The configuration menu is summarized in Table 2 8 This menu is accessed by pressing CONFIG and then V Paragraph 2 3 5 summarizes the rules for navigating through the menu structure Note that a function does not have to be selected in order to be configured When the fu
28. figured from the CONFIGURE SEQUENCE menu DEV CHAR CABLE See paragraph 2 14 2 for details Resistor voltage coefficient test High valued resistors often have a change in resistance with applied voltage This change in resistance is characterized as 2 62 the voltage coefficient Voltage coefficient is defined as the percent change in resistance per unit change in applied volt age R1 R2 1 Voltage Coefficient Ri x vvi This test makes two resistance measurements at two different voltage levels and calculates the voltage coefficient The test circuit is shown in Figure 2 51 The resistor should be placed in a shielded test fixture that is designed to minimize leakage resistance such as the Model 8002A test fixture If using the Model 8002A refer to Figure 2 32 for connection informa tion If using a different test fixture refer to Figure 2 31 for basic connection information For this test the first specified voltage SOURCE V1 is ap plied to the resistor and after the specified delay DELAY 1 a resistance measurement is made The second voltage Front Panel Operation SOURCE V2 is then applied and after the next delay DE LAY 2 a second resistance measurement is made The Model 6517A then automatically calculates the voltage coef ficient and stores it in the buffer This test is selected and con HI 7078 TRX Cable figured from the CONFigure SEQUENCE menu DEV CHAR RESISTOR See paragraph
29. gt 250V and resultant current surge could damage the input circuitry A typical test circuit to measure the leakage current of a capacitor is shown in Figure 2 7 When Switch S is closed an initial surge of charging current will flow and the high voltage will be seen across the input of the Model 6517A 2 10 Input High O j Max Input Signal Input Low 500V Peak Chassis Ground Max Input Signal 250VRMS DC to 60Hz sine wave 10 seconds maximum in mA ranges 500V Peak Figure 2 6 Maximum input levels ee s Capacitor S Under Test y 6517A Ammeter Figure 2 7 Capacitor test circuit without protection Adding a resistor and two diodes 1N3595 as shown in Fig ure 2 8 will provide considerable extra protection The resis tor must be large enough to limit the current through the diodes to 10mA or less It must also be large enough to with stand the supply voltage The protection circuit should be en closed in a light tight conductive shield This same protection circuit is useful when measuring the in sulation resistance of films or high voltage cables Without such added protection a pinhole or other defect could cause an arc destroying the electrometer input Protection Circuit o s I Capacitor R HI Under Test See 6517A V D1 D2 O LO Figure 2 8 Capacitor test circuit with protection 2 4 2 High resistance meter connections The Model 6517
30. is used to enable or disable an instrument operation 1 or ON enables the operation and 0 or OFF disables the operation e Upper case characters indicate the short form version for each command word e Default Parameter Listed parameters are both the RST and SYSTem PRESet defaults unless noted otherwise Param eter notes are located at the end of each table e SCPI A check mark indicates that the command and its parameters are SCPI confirmed An unmarked command in dicates that it is non SCPI SCPI confirmed commands that use one or more non SCPI parameters are explained by notes Table 3 4 CALCulate command summary Default Command Description parameter SCPI Ref CALCulate 1 Subsystem to control CALC1 y 3 13 1 FORMat lt name gt Select math format NONE POLynomial PERCent RATio Polynomial y DEViation PDEViation LOG10 FORMat Query math format V KMATh Path to control math calculations MAOFactor lt NRf gt Set a0 for POLynomial 9 999999e30 to 9 999999e30 0 MAOFactor Query a0 factor MA1Factor lt NRf gt Set al for POLynomial 9 999999e20 to 9 999999e20 1 MA1Factor Query al factor MA2Factor lt NRf gt Set a2 for POLynominal 9 999999e30 to 9 999999e30 0 MA2Factor Query a2 factor PERCent lt NRf gt Specify target value for percent calc 1 9 999999e35 to 9 999999e35 PERCent Query target value REFerence lt NRf gt
31. lt mo gt to 12 Specify month lt day gt 1 to 31 Specify day DATE Query the date This command is used to set the date for the RTCLock control source Setting an invalid date i e February 29 1994 for the clock event results in an error and the previous date is retained TIME lt hr gt lt min gt lt sec gt ARM SEQuence 1 LAYer RTCLock TIME lt hr gt lt min gt lt sec gt Set time for RTCLock control source lt hr gt 0 to 23 Specify hour 24 hour format lt min gt 0 to 59 Specify minute lt sec gt 0 00 to 59 99 Specify second round to 1 100 sec DATE Query the time This command is used to set the time for the RTCLock control source Note that the time must be set using the 24 hour format i e hour 13 is 1pm Setting an invalid time results in an error and the previous time is retained TIME returns the time to nearest hundredth of a second 3 147 IEEE 488 Reference 3 25 TSEQuence Subsystem 3 25 1 3 148 The commands in this subsystem are used to configure and control the built in test sequences and are summarized in Table 3 16 Detailed information on the test sequences are provided in paragraph 2 14 In your test programs use the OPC command before arming TSEQuence ARM the test The OPC command allows previous command operations to finish before arming the test Failure to do so may cause unfavorable results The programming example at the end of this sub system de
32. o1 of on Value 1 Event Bit Set Events OSB Operation Summary Bit 0 Event Bit Cleared MSS Master Summary Status RQS Request Service ESB Event Summary Bit MAV Message Available QSB Questionable Summary Bit EAV Error Available MSB Measurement Summary Bit Figure 3 18 Status Byte Register The bits of the Status Byte Register are described as follows Bit 0 Measurement Status MSB Set bit indicates that a measurement event has occurred The event can be identified by reading the Measurement Event Status Register using the STA Tus MEASurement command see paragraph 3 20 for details Bit 1 Not used Bit 2 Error Available EAV Set bit indicates that an error or status message is present in the Error Queue The message can be read using one of the following SCPI commands SYSTem ERRor STATus QUEue See paragraphs 3 21 and 3 20 for details Bit 3 Questionable Summary Bit QSB Set bit indicates that a calibration error has oc curred Bit 4 Message Available MAV Set bit indicates that a message is present in the Output Queue The message is sent to the computer when the Model 6517A is addressed to talk 3 35 IEEE 488 Reference 3 11 13 TRG trigger Description Bit 5 Event Summary Bit ESB Set bit indicates that an enabled standard event has oc curred The event can be identified by reading the Standard Event Status Register using the ESE que
33. s sseeseeseseeseeerrsrereressrerrereersreernsreresenes Digital filter averaging and advanced filter types s s nsnseneneeneseessseesesterstreseretsrstserssenensrnenserersersesens GONMEGULONS seess dee ee See current RE EE asynchronous example Si le asynchronous example ZE vcccscissvecescotesssvsceserncsasibsatiesbevtgscieoneseanteasetens semi synchronous example e ce seececeeeeceeceeeseeeeeeecaeeseecaeesaecaesaecseeeseees repeating filter MOSS c sis issseddissnvssanessiecssascanascaeevasesndenscaitsaipsonedebesaesdeeeed 3 Figure 3 1 Figure 3 2 Figure 3 3 Figure 3 4 Figure 3 5 Figure 3 6 Figure 3 7 Figure 3 8 Figure 3 9 Figure 3 10 Figure 3 11 Figure 3 12 Figure 3 13 Figure 3 14 Figure 3 15 Figure 3 16 Figure 3 17 Figure 3 18 Figure 3 19 Figure 3 20 Figure 3 21 Figure 3 22 Figure 3 23 Figure 3 24 Figure 3 25 Figure 3 26 Figure 3 27 Figure 3 28 Figure 3 29 Figure 3 30 Figure 3 31 Figure 3 32 Figure 3 33 Figure 3 34 Figure 3 35 Figure 3 36 Figure 3 37 Figure 3 38 Figure 3 39 Figure 3 40 D Figure D 1 Figure D 2 Figure D 3 IEEE 488 Reference US EE bee TEEE 488 TEE code TEEE 488 connector location RS 232 ML ACSC OL CLM ogee cashes cas ce enon i aiie aaea e ERO EDE NaS AEE EEEREN Model 6517A status register structure eessesesesseseseeetrstesteresreestetstesertrettereseetesrersteetntenteresereteserer ste Standard event status aita ci
34. see SAVE at a specific memory location The POWERON options are explained as follows BENCH Use this option to return the instrument to the bench default conditions see Table 2 30 the next time it is turned on GPIB With this option the unit returns to the GPIB default conditions see Table 2 30 the next time it is turned on USER SETUP NUMBER Using this option the instrument powers on to as user setup saved at a specific memory loca tion see SAVE After selecting USER SETUP NUMBER you will be prompted to enter the memory location number of the setup that you wish the instrument to power up to Note that 0 is a valid memory location Use the range keys A and V to key in the desired memory location and press ENTER RESET Use this menu option to reset the instrument to the bench or GPIB default conditions see Table 2 30 The RESET op tions are explained as follows BENCH With this option the instrument returns to the bench default conditions see Table 2 30 After selecting BENCH the instrument returns to the normal display of readings after requesting an ENTER to confirm your selec tion GPIB With this option the unit returns to the GPIB default conditions see Table 2 30 After selecting GPIB the instru ment returns to the normal display of readings after request ing an ENTER to confirm your selection Note that the instrument goes to the Idle state Front Panel Operation Table 2 30 F
35. tion results in an error The autorange commands RANGe AUTO and CRANge AUTO are coupled to the com mands that manually select the measurement range RANGe lt n gt and CRANge lt n gt When autorange is enabled the parameter value for the manual range command changes to the auto matically selected range value Thus when autorange is disabled the instrument remains at the automatically selected range When a valid manual range command is sent autoranging dis ables When using auto range upper and lower range limits can be established for Auto V Source Ohms to keep the instrument from autoranging to ranges that are not going to be used see next commands ULIMit lt n gt SENSe 1 RESistance AUTO RANGe AUTO ULIMit lt n gt Set upper limit for Auto V Source Ohms 3 93 IEEE 488 Reference Parameters Query Description Parameters Query Description LLIMit lt n gt SENSe 1 RESistance AUTO RANGe AUTO LLIMit lt n gt Set lower limit for Auto V Source Ohms lt n gt Oto100e18 Range limit for Auto V Source Ohms DEFault 100e18 MINimum 0 MAXimum Same as DEFault ULIMit Query upper range limit ULIMit DEFault Query RST default upper limit ULIMit MINimum Query lowest allowable upper limit ULIMit MAXimum Query largest allowable upper limit LLIMit Query lower range limit LLIMit DEFault Query RST default lower limit LLIMit MINimum Query lowest allowable lower limit LLIMit
36. vice is ready NDAC Not Data Accepted NDAC is also controlled by the accepting device The state of NDAC tells the source whether or not the device has accepted the data byte The complete handshake sequence for one data byte is shown in Figure D 2 Once data is placed on the data lines the source checks to see that NRFD is high indicating that all active devices are ready At the same time NDAC should be low from the previous byte transfer If these conditions are not met the source must wait until NDAC and NRED have the correct status If the source is a controller NRFD and NDAC must be stable for at least 100nsec after ATN is set true Because of the possibility of a bus hang up many con trollers have time out routines that display messages in case the transfer sequence stops for any reason Once all NDAC and NRFD are properly set the source sets DAV low indicating to accepting devices that the byte on the data lines is now valid NRFD will then go low and NDAC will go high once all devices have accepted the data Each IEEE 488 Bus Overview device will release NDAC at its own rate but NDAC will not be released to go high until all devices have accepted the data byte The sequence just described is used to transfer both data talk and listen addresses as well as multiline commands The state of the ATN line determines whether the data bus con tains data addresses or commands as described in the fol lowing par
37. 0 0 eee eeeeeeeeeeeeeeees Surface resistivity measurement technique eee ee eeeeeeeseeeeeeeeeseeseecaecsaecaeceaeaecsaeeseseeeeeseeeeseeeneeaey Circular electrode dimensions EE E Volume resistivity measurement technique eeceeecesseceneeceeeeeeeeeneeceeesneceneesaeceaeeceaeesseeeeeeesaeeeeeeedere es Connections for measurements using Model 8009 test fette Typical connections for charge measurements 0 0 eee ceseeeeceeeeeeceeeeeeeeeeeeeeeaeesaecaaesaesseeeaeeaeens V source independent configuration eeceecceeeeceseecssecenceceeeeeneeeeneesaeesececeeeesseeceeeecseeeeaeeseeesaeeesee ed Vil Figure 2 39 Figure 2 40 Figure 2 41 Figure 2 42 Figure 2 43 Figure 2 44 Figure 2 45 Figure 2 46 Figure 2 47 Figure 2 48 Figure 2 49 Figure 2 50 Figure 2 51 Figure 2 52 Figure 2 53 Figure 2 54 Figure 2 55 Figure 2 56 Figure 2 57 Figure 2 58 Figure 2 59 Figure 2 60 Figure 2 61 Figure 2 62 Figure 2 63 Figure 2 64 Figure 2 65 Figure 2 66 Figure 2 67 Figure 2 68 Figure 2 69 Figure 2 70 Figure 2 71 Figure 2 72 Figure 2 73 Figure 2 74 Figure 2 75 Figure 2 76 Figure 2 77 Figure 2 78 Figure 2 79 Figure 2 80 Figure 2 81 Figure 2 82 Figure 2 83 Figure 2 84 viii V source FVMI configuration eian E EE E EE E ER EEE Typical 2V analog output Typical preamp Out COMMECTIONS eegen vised eases ieo eE OEE RE EEE EEE ESEESE EEE KTERE Electrometer input circuitry external feedback mode Shielded fix
38. 0 n lt 0 D e 0 d 0 S 0 a x D x x x x x a x a Figure D 3 Command codes D 6 IEEE 488 Bus Overview Table D 2 Hexadecimal and decimal command codes Decimal Command Hex value value GTL 0l 1 SDC 04 4 GET 08 8 LLO 11 17 DCL 14 20 SPE 18 24 SPD 19 25 LAG 20 3F 32 63 TAG 40 5F 64 95 SCG 60 7F 96 127 UNL 3F 63 UNT SF 95 Table D 3 Typical addressed command sequence Data bus Step Command ATN state ASCII Hex Decimal 1 UNL Set low 3F 63 2 LAG Stays low 3B 59 3 SDC Stays low EOT 04 4 4 Returns high Assumes primary address 27 Table D 4 Typical common command sequence Data bus Step Command ATN state ASCII Hex Decimal 1 UNL Set low 3F 63 2 LAG Stays low 3B 59 3 Data Set high 2A 42 4 Data Stays high R 52 82 5 Data Stays high S 53 83 6 Data Stays high T 54 84 Assumes primary address 27 D 7 IEEE 488 Bus Overview Typical command sequences For the various multiline commands a specific bus sequence must take place to properly send the command In particular the correct listen address must be sent to the instrument be fore it will respond to addressed commands Table D 3 lists a typical bus sequence for sending the addressed multiline commands In this instance the SDC command is being sent to the instrument UNL is generally sent as part of
39. 3 66 Description An alternate way to perform the calculation and read the result is by using the query form of the command MMediate When this command is sent the calculation is performed and the re sult is queried This example assumes that there are readings stored in the buffer and CALC 2 is enabled PRINT 1 output 27 calc2 form max Select MAX format PRINT 1 output 27 calc2 imm Perform math and query result PRINT 1 enter 27 Get response message from 6517A DATA CALCulate2 DATA Read CALC 2 result This query command is used to read the result of the CALC 2 operation If CALC 2 is disabled or NONE is selected the raw reading will instead be read Note that this command does not initiate a calculation This command is used to simply read the result of the last calculation 3 13 3 CALCulate3 Parameters Query Description Parameters Query Description IEEE 488 Reference This Calculate subsystem is used to configure and control the limit tests LIMIT 1 test and LIM IT 2 test See paragraph 2 19 6 for details on limit tests DATA lt n gt CALCulate3 LIMit 1 UPPer DATA lt n gt Specify upper LIMIT 1 CALCulate3 LIMit 1 LOWer DATA lt n gt Specify lower LIMIT 1 CALCulate3 LIMit2 UPPer DATA lt n gt Specify upper LIMIT 2 CALCulate3 LIMit2 _LOWer DATA lt n gt Specify lower LIMIT 2 lt n gt 9 999999e35 to 9 999
40. 3 Binary transfer mode DIGITAL FILTER Median and averaging ENVIRONMENT Operating 0 50 C relative humidity 70 non condensing up to 35 C Storage 25 to 65 C WARM UP 1 hour to rated accuracy see manual for recommended procedure POWER 105 125V or 210 250V external switch selected 90 110V internal switch selected 50 60Hz 50VA PHYSICAL Case Dimensions 90mm high x 214mm wide x 369mm deep 3 in x 8 in x 14 in Working Dimensions From front of case to rear including power cord and IEEE 488 connector 15 5 inches Net Weight lt 4 6 kg lt 10 1 lbs Shipping Weight lt 9 5 kg lt 21 lbs Specifications subject to change without notice ATI Accuracy calculations The information shows how to calculate accuracy for volts amps ohms and coulombs A 1 1 Calculating volts accuracy From the specifications Volts is calculated as follows Accuracy rdg counts The following example shows how to compute accuracy for the 2V range Assume that the voltage you are measuring is reading exactly 1 00000V on the 2V range From the specs Accuracy 0 025 of 1V 4 counts 0 00025V 4 counts 0 00025V 0 00004V 0 00029V Note 4 counts on the 2V range equals 0 00004 V Thus the accuracy range for the 1 00000V reading is 0 99971V to 1 00029V A 1 2 Calculating amps accuracy From the specifications Amps is calculated as follows Accuracy rdg counts The followi
41. ADVANCED Program a simple average filter 1 100 rdgs with noise tolerance window 0 100 of range AVERAGING MODE Select moving average or repeating average mode MEDIAN Configure median filter DISABLE Disable median filter ENABLE Enable median filter and specify range 1 5 RESOLUTION Display resolution menu AUTO Default to resolution appropriate for integration time 3 5d 4 5d 5 5d 6 5d Select a specific resolution 2 21 Front Panel Operation EXT FDBK This option is used to enable or disable the external feedback mode External feedback is explained in paragraph 2 11 The following menu items are used to control external feedback OFF Disable external feedback ON Enable external feedback SPEED The speed parameter sets the integration time of the A D converter the period of time the input signal is measured al so known as aperture The integration time affects the us able resolution the amount of reading noise as well as the ultimate reading rate of the instrument Any triggers received while the instrument is processing a reading are ignored From the front panel the integration time is specified in pa rameters based on a number of power line cycles NPLC where PLC for 60Hz is 16 67msec and 1 PLC for 50Hz and 400Hz is 20msec The SPEED parameters for all functions except frequency are explained as follows FAST Sets integration time to 0 01 PLC Use FAST if speed is of primary impo
42. Bit Position B15 B3 B2 B1 BO Event Lay2 Lal Decimal Weighting 4 Z 22 21 Value o1 o1 Value 1 Enable Sequence Event Events Lay1 Layer 1 0 Disable Mask Sequence Event Figure 3 33 Sequence Event Enable Register PTRansition lt NRf gt STATus MEASurement PTRansition lt NRf gt Parameters Query STATus QUEStionable PTRansition lt NRf gt STATus OPERation PTRansition lt NRf gt STATus OPERation TRIGger PTRansition lt NRf gt STATus OPERation ARM PTRansition lt NRf gt STATus OPERation ARM SEQuence PTRansition lt NRf gt Lay2 Layer 2 Program Measurement Transition Filter PTR Program Questionable Transition Filter PTR Program Operation Transition Filter PTR Program Trigger Transition Filter PTR Program Arm Transition Filter PTR Program Sequence Transition Filter PTR lt NRf gt 0 Clear register lt NRf gt 128 1 Set bit BO 256 2 Set bit Bl 512 4 Set bit B2 1024 8 Set bit B3 2048 16 Set bit B4 4096 32 Set bit B5 8192 64 Set bit B6 16384 65535 PTRansition Query PTR register Set bit B7 Set bit B8 Set bit B9 Set bit B10 Set bit B11 Set bit B12 Set bit B13 Set bit B14 Set all bits These commands are used to program the positive transition PTR registers A positive transition is defined as a 0 to 1 state change in the condition register Thus when an event is programmed for a positive transition the appropriate bit in the correspondin
43. COEFFICIENT 5 DIGIT 18 28 C 0 18 C amp 28 50 C RANGE RESOLUTION rdg counts rdg counts C 20 pA 100 aA2 1 30 0 1 5 200 pA 1 fA2 145 Ol l 2 nA 10 fA 0 2 30 0 1 2 20 nA 100 fA 0 2 5 0 03 1 200 nA 1 pA 0 2 5 0 03 1 2 pA 10 pA 0 1 10 0 005 2 20 pA 100 pA 01 5 0 005 1 200 pA 1nA 01 5 0 005 1 2mA 10 nA 0 1 10 0 008 2 20 mA 100 nA 01 5 0 008 1 1 When properly zeroed 5 digit 1 PLC power line cycle median filter on digital filter 10 readings 2 aA 10 18A fA 10 15A INPUT BIAS CURRENT lt 3fA at Tcay Temperature coefficient 0 5fA C INPUT BIAS CURRENT NOISE lt 750aA p p capped input 0 1Hz to 10Hz bandwidth damping on Digital filter 40 readings INPUT VOLTAGE BURDEN at Tay 1 C lt 20uV on 20pA 2nA 20nA 2pA 20pA ranges lt 100uV on 200pA 200nA 200pA ranges lt 2mV on 2mA range lt 4mV on 20mA range TEMPERATURE COEFFICIENT OF INPUT VOLTAGE BURDEN lt 10uV C on pA nA pA ranges PREAMP SETTLING TIME to 10 of final value 2 5s typical on pA ranges damping off 4s typical on pA ranges damping on 15ms on nA ranges 2ms on pA and mA ranges NMRR gt 95dB on pA 60dB on nA pA and mA ranges at 50Hz or 60Hz 0 1 COULOMBS ACCURACY TEMPERATURE 1 Year 1 2 COEFFICIENT 5 DIGIT 18 28 C 0 18 C amp 28 50 C RANGE RESOLUTION rdg counts rdg counts C 2nC 10 fC 0 445 0 04 3 20 nC 100 fC 0 445 0 04 1 200 nC 1 pc 0 445 0 04 1 2 uC 10 pC 0 445 0 0
44. COUNt Query filter count ADVanced Path to configure and control advanced filter NTOLerance lt n gt Specify noise tolerance level 0 to 100 1 NTOLerance Query noise tolerance level STATe lt b gt Enable or disable digital filter OFF STATe Query state of digital filter MEDian Path to control the median filter 3 19 11 STATe lt b gt Enable or disable median filter ON STATe Query state of median filter RANK lt NRf gt Specify rank for median filter 1 to 5 1 RANK Query rank GUARd lt b gt Enable or disable guard OFF 3 19 13 GUARd Query state of guard XFEedback lt b gt Enable or disable external feedback OFF 3 19 15 XFEedback Query state of external feedback 3 47 IEEE 488 Reference Table 3 10 Continued SENSe command summary Default Command Description parameter SCPI Ref CURRent DC Path to configure Amps V APERture lt n gt Set integration rate in seconds 166 67e 6 to 200e 3 Note 1 V 3 19 4 AUTO lt b gt Enable or disable auto aperture OFF AUTO ONCE Enable and then disable auto aperture AUTO Query auto aperture APERture Query aperture integration rate V NPLCycles lt n gt Set integration rate line cycles 0 01 to 10 1 V 3 19 5 AUTO lt b gt Enable or disable auto NPLC OFF AUTO ONCE Enable and then disable auto NPLC AUTO Query auto line cycle integration NPLCycles Query line cycle integration rate V RANGe Path
45. For example spec ifying a value less than or equal to 100 selects the 100V range Specifying a value greater than 100 selects the 1000V range You cannot select the 100V range if the programmed amplitude see next command is greater than 100V A setting conflict error will result 3 19 7 Parameters Query Description Parameters Query Description REFerence lt n gt Parameters IEEE 488 Reference VSOurce AMPLitude lt n gt SENSe 1 RESistance MANual VSOurce AMPLitude lt n gt Set V Source level for Manual V Source Ohms lt n gt 100 to 100 Set voltage for 100V range 1000 to 10000 Set voltage for 1000V range DEFault OV MINimum Greatest allowable negative value MAXimum Greatest allowable positive value AMPLitude Query programmed V Source level AMPLitude DEFault Query RST default V Source level AMPLitude MINimum Query lowest allowable level AMPLitude MAXimum Query largest allowable level This command is used to set the V Source level for Manual V Source Ohms With Auto V Source Ohms selected you will not be able to adjust the V Source level The amplitude level is limited by the selected V Source range see previous command When on the 100V range attempts to set the amplitude to a value that exceeds 100V will result in a Setting Conflicts error The amplitude may also be limited by the SOURce VOLTage LIM it AMPLitude command Attempts to set an amplitude that exceed
46. INT FUNC TEMP DIG TEMP RTD ALPH TEMP RTD BETA TEMP RTD DELT TEMP RTD RZER TEMP RTD TYPE To varies per function varies per function varies per function varies per functio varies per functio varies per functio varies per functio 200k 200k 200k 12 OFF varies per function varies per function varies per function varies per function varies per function 10 0 8 very complicated algo rithm very complicated algo rithm varies per transducer varies per RTD type varies per RTD type varies per RTD type varies per RTD type USER If APER AUTO is ON DIG AUTO is ON ANER AUTO is ON ANER AUTO is ON AVER AUTO is ON AVER AUTO is ON AVER AUTO is ON RES OCOM is ON and RES RANG UPP gt 200k RES OCOM is ON and RES RANG AUTO ULI M gt 200k RES OCOM is ON and RES RANG AUTO LLI M gt 200k CURR DC METH is ICIR CURR DC METH is ICIR CURR DC AVER AUTO is ON CURR DC AVER AUTO is ON CURR DC AVER AUTO is ON CURR DC AVER AUTO is ON CURR DC AVER AUTO is ON TEMP DIG AUTO is ON TEMP RTD TYPE is not USER TEMP RTD TYPE is not USER TEMP RTD TYPE is not USER TEMP RTD TYPE is not USER IEEE 488 Conformance Information Table E 2 cont Coupled commands Command Also changes To If ROUT CLOS ROUT SCAN LSEL NONE ROUT OPEN ROUT SCAN LSEL NONE the command actually opens a channel ROUT OPEN ALL ROUT SCAN LSEL NONE
47. Leakage Current which follows Step 9 of this procedure Front Panel Operation 8 Disable zero check by again pressing Z CHK and press OPER to source voltage to the DUT NOTE A flashing VOLTAGE SOURCE OPER ATE LED indicates that the V Source has gone into current limit The programmed voltage is not being applied to the load In this situation try using a lower voltage for the measurement Resistance l l l l l Measured l l i to shield l l Shield Optional LO connected 6517A 237 ALG 2 Cable 9 Take the reading from the display INPI 250V PEAK E WARNING Place the V Source in standby before making or breaking connections to the test fixture or DUT WARNING No e KOM er PREAMP OUT COMMON V SOURCE S QQ INTERNAL OPERATOR Note V Source low internally connected to electrometer A Connections A Connections Input Amplifier JTE MN Output Source gt LO PREAMP OUTPUT Meter Connect e Relay A s l TE o gt COMMON 12 low Ranging Amp y e NWN 2V ANALOG OUTPUT To A D Converter gt B Equivalent Circuit B Equivalent circuit Figure 2 31 Typical connections for resistance measurements 2 34 KEITHLEY 7078 TRX 3 Triax Cable Note Set fixture mode switch to picoammeter operation Warning C
48. Query Description Parameters Query Description Parameters Query Description LIMit STATe lt b gt SOURce VOLTage LIMit STATe lt b gt Control voltage limit lt b gt 0 or OFF Disable voltage limit 1 or ON Enable voltage limit STATe Query state of voltage limit This command is used to enable or disable voltage limit When enabled the programmed volt age limit is in effect When disabled voltage limit is determined by the selected range Attempts to enable voltage limit when the present V Source level amplitude exceeds the limit value will generate a settings conflict error MCONnect lt b gt SOURce VOLTage MCONnect lt b gt Control LO connection lt b gt ONorl Enable LO connection OFF or 0 Disable LO connection MCONnect Query LO connection This command is used to control the internal V Source LO to Ammeter LO connection When enabled V Source LO is connected to Ammeter LO This connection simplifies the connection requirements for ohms measurements and source voltage measure current measurements When disabled this connection is broken CURRent Commands RLIMit STATe lt b gt SOURce CURRent RLIMit STATe lt b gt Control resistance current limit lt b gt Oor OFF Disable resistance current limit 1 or ON Enable resistance current limit STATe Query state of resistance current limit This command is used to enable or disable resistance current limit for the V Source When en
49. SET PAGE SIZE Set number line between form feeds 1 255 ELEMENTS Select GPIB data elements reading units reading number relative humidity chan nel number timestamp internal temperature external temperature status STATUS Display IEEE 488 bus status byte RS 232 Select and configure RS 232 CONTROL Select operating mode SEND RECEIVE Send receive mode TALK ONLY Talk only mode set up printer interval and formfeeds BAUD Select baud rate 19 200 9600 4800 2400 1200 600 or 300 BITS Select number of data bits 7 or 8 PARITY Select parity none odd or even STOP Select stop bits 1 or 2 ELEMENTS Select data elements reading units reading number relative humidity channel number timestamp internal temperature external temperature status TEST Self test menu FRONT PANEL TESTS Test display board KEYS Verify operation of front panel keys DISPLAY PATTERNS Verify operation of display CHAR SET Display the entire character set CAL Calibration menu COMPREHENSIVE See 6517 Service Manual POINT CALS See 6517 Service Manual CAL DATES See 6517 Service Manual OFFSET ADJ Null input offset current and voltage burden CAL OPT See 6517 Service Manual 2 108 Table 2 29 cont Front Panel Operation MAIN MENU STRUCTURE Menu item Description LIMITS Limits menu LIMIT SET 1 Limit Set 1 menu CONTROL Enable disable limit set 1 LOLIM1 Set value of low limit 1 HILIM1 Set value of high limit 1
50. Set integration rate line cycles 0 01 to 10 1 V 3 19 5 AUTO lt b gt Enable or disable auto NPLC OFF AUTO ONCE Enable and then disable auto NPLC AUTO Query auto line cycle integration NPLCycles Query line cycle integration rate V RANGe Path to configure measurement range V 3 19 6 UPPer lt n gt Select range 0 to 210 200 V UPPer Query range V AUTO lt b gt Enable or disable auto range Note 4 V AUTO ONCE Set range based on present input signal V ULIMit lt n gt Set upper limit for auto range 0 to 210 200 ULIMit Query upper limit LLIMit lt n gt Set lower limit for auto range 0 to 210 2 LLIMit Query lower limit AUTO Query auto range V REFerence lt n gt Specify reference 210 to 210 0 V 3 19 7 STATe lt b gt Enable or disable reference OFF V STATe Query state of reference 0 or 1 y ACQuire Use input signal as reference REFerence Query reference value V DIGits lt n gt Specify measurement resolution 4 to 7 6 3 19 9 AUTO lt b gt Enable or disable auto resolution AUTO ONCE Enable and then disable auto resolution AUTO Query auto resolution DIGits Query resolution AVERage Path to control the average filter 3 19 10 TYPE lt name gt Select filter type NONE SCALar ADVanced SCALar TYPE Query filter type TCONtrol lt name gt Select filter type MOVing or REPeat Note 3 TCONtrol Query filter type COUNt lt n gt Specify filter count 1 to 100 10
51. Set reference value for Ratio Deviation and Deviation 1 9 999999e35 to 9 999999e35 REFerence Query reference value STATe lt b gt Enable or disable calculation Note y STATe Query state of math function y DATA Path to read math result of calculation y LATest Return last reading y FRESh Return new reading y IMMediate Recalculate input data y CALCulate2 Subsystem to control CALC 2 y 3 13 2 FORMat lt name gt Select math format MEAN SDEViation MAXimum NONE V MINimum PKPK or NONE FOR Mat Query math format y STATe lt b gt Enable or disable calculation Note y STATe Query state of math function y IMMediate Recalculate raw input data in buffer V DATA Read math result of CALC 2 y 3 42 Table 3 4 Continued CALCulate command summary IEEE 488 Reference Default Command Description parameter SCPI Ref CALCulate3 Subsystem to control CALC 3 limit tests y 3 13 3 LIMit 1 Path to control LIMIT 1 test y UPPer Path to configure upper limit y DATA lt n gt Set upper limit 9 999999e35 to 9 999999e35 1 y DATA Query upper limit y SOURce lt NRf gt Specify digital output 0 to 15 0 V SOURce Query source y LOWer Path to configure lower limit y DATA lt n gt Set lower limit 9 999999e35 to 9 999999e35 1 y DATA Query lower limit y SOURce lt NRf gt Specify digital output 0 to 15 0 y SOURce Query source y STATe lt b
52. TRIGLINK With this selection the measure source is con trolled by the Trigger Link of the Model 6517A Trigger Link is an enhanced trigger system that uses up to six lines to direct trigger pulses to an from other instruments When the Model 6517A receives a trigger over the Trigger Link it performs a device action as defined by the trigger model In addition to a measurement this may include range changing filtering calculations data storing scanning and other operations See paragraph 2 15 5 for details on using the Trigger Link 2 77 Front Panel Operation NOTE The front panel TRIG key see MANU AL is active with the Trigger Link select ed Pressing the TRIG key performs a device action After selecting TRIGLINK as the measurement event select one of the following trigger link modes e ASYNCHRONOUS The asynchronous trigger link mode is used for trigger configurations that require in put and output triggers to be routed on separate lines After selecting this trigger link mode you will be prompted to select an input line and then an output line Note that you cannot use the same trigger line for both input and output e SEMI SYNCHRONOUS In this mode the input and output triggers for the Model 6517A are assigned to the same line After selecting this trigger link mode you will be prompted to select the trigger line TIMER Use the timer to control the time interval between measurements The tim
53. When AUTO ONCE is sent auto resolution turns on momentarily and then disables While enabled resolution is selected automatically Auto resolution then disables but the selected value is retained The auto resolution command DIGits AUTO is coupled to the command that manually selects resolution DIGits lt n gt When auto resolution is enabled the parameter value for DIGits lt n gt changes to the automatically selected resolution value Thus when auto resolution is disabled the instrument remains at the automatically selected resolution 3 19 10 AVERage commands Parameters Query Description The AVERage commands are used to configure and control the digital filter See paragraph 2 17 for details TYPE lt name gt SENSe 1 VOLTage DC AVERage TYPE lt name gt Select filter type Volts SENSe 1 CURRent DC AVERage TYPE lt name gt Select filter type Amps SENSe 1 RESistance AVERage TYPE lt name gt Select filter type Ohms SENSe 1 CHARge AVERage TYPE lt name gt Select filter type Volts lt name gt NONE No digital filter selected SCALar Select scalar filter ADVanced Select advanced filter TYPE Query the digital filter type This command is used to select the digital filter type The SCALar filter is a simple averaging type filter The ADVanced filter is similar except that it incorporates a noise window to allow faster response time to large signal step changes The NTOLerance comma
54. its operation loops back up to point A where it waits for an input trigger Note that Bypass is no longer in effect The trigger pulse from the Model 7001 7002 triggers the Model 220 to output the next programmed current level After the current level is set the Model 220 outputs a trigger pulse point G The trigger pulse applied to the Model 7001 7002 from the Model 230 places operation at point B The Bypass is again in effect because this is the beginning of a new scan This al lows operation to drop down to point C where the first chan nel is again closed and eventually measured As previously explained all ten channels are scanned and measured After the last channel of the second scan is closed and mea sured the Model 7001 7002 returns to the idle state Semi synchronous operation In the Semi synchronous Trigger Link mode all triggering input and output is controlled by a single line When the normally high 5V trigger line is pulled low OV a trigger occurs on the negative going edge When the trigger line is released a trigger occurs on the positive going edge see Figure 2 71 The advantage of this single line trigger is that as long as one of the instruments in the system holds the line low the trigger is suppressed In other words the trigger does not occur until all instruments in the system are ready Trigger on Trigger on negative going positive going edge edge vi 5V OV 7 t Pulled low by
55. lines are summarized in Figure D 3 Hexadecimal and the decimal values for the various commands are listed in Table D 2 D 5 IEEE 488 Bus Overview ale 1 U0q X OIG 4d LOIA DO 30N VZLS9 PO Aq payu w jdu JOU JONLNOOD FAYL LOL pue AYNDISNOONN TO TaT1VaVd Add AANDINOOD 110d 14 T1WaWd Idd Das 99d dNOND dNOND GNVWWOD GNVWWOD AAVGNODAS AANVWId OVL Sal N Dy dNOND dNOND dNOND AJO ss3AAAY ssIAAAY GNVWWOD G NYWWOD VL Nasi WSYAAINN Oesch qad o inn SL O INA GL sn IS SL L u oE U vl N D lt vl Su OS vL 0 L w 6z l Ww 6z l S so XD l Dit 8z ZL 1 8z gt ZL Sd dd ZL o o H D LL y L LL os LA LL 0 z 9z Z OL 97 OL H ans 11 OL 0 0 A j Sz A 6 Gz 6 6 Ode W3 1OL LH 6 0 0 x y vz D 8 H vz 8 8 ddS NWO 13D sg 8 0 0 0 M 3 EZ M A D EZ A Z j EIE 144 A ffe A J 7 A 9 d TZ 9 9 x NAS OV 9 0 L o n IZ N S E IZ S S Add Wb dd ONA S o o 1 o 1 p oz H v d oz v t ja 9d Das 103 v o lol j o s 2 6L S 3 6L 2 D I L 0 o 1 q EI y z g EI rA 7 za XLS z 0 o o b e ZL fe L y ZL L L i on 1a WS HOS L Ion o d EI d 0 914 0 0 dS 210 NN 0 0 0 0 0 Ta T Tt Tt a Z W Z a 9 Gig s Vsi ri ri OI Die az vz OU WL in mio mum fol a oO fa sug gt gt gt gt gt gt gt gt O e L o s DE bs WE 0 S L 9 0 a L II gB Le S Leg Leg L 5 0 E 0 a L L n lt 0 n lt
56. multiple display and measurement considerations for the ohms function 2 8 Charge measurements Provides the basic proce dure to measure charge Includes configuration infor 2 9 2 10 2 11 2 12 2 13 2 14 2 15 2 16 2 17 2 18 2 19 2 20 mation multiple displays and measurement consider ations for the coulombs function Voltage source Covers V source operation includ ing how to use the safety interlock Analog outputs Provides information needed to use the 2V analog output and the preamp output Using external feedback Explains how to use ex ternal feedback to extend the capabilities of the Model 6517A Range and resolution Covers both manual and auto ranging and resolution Zero check and relative Provides details on the zero check and relative REL features Test sequences Covers the test sequences that can be configured and run Triggering Details types of trigger modes as well as trigger sources that can be used Buffer Covers use of the reading buffer including programming the buffer size recalling data and time stamp Filter Covers the use of the digital filter types that can be used to reduce reading noise Math Describes the calculations that can be per formed on readings Menu Covers selections controlled from the main menu such as saving instrument setups communica tion configuration GPIB and RS 232 and limits Sca
57. the channel list is sent to the computer ROUTe OPEN lt list gt Open closed channel lt list gt chanlist Specify channel to open ALL Open all channels where chanlist 1 to 10 OPEN lt list gt Query specified channel The OPEN lt list gt command is used to open a channel on the internal scanner card Since only one channel can be closed the chanlist for this command can only consist of one channel An alternate way to open a closed channel is to simply use the ALL parameter It opens whichever channel is closed IEEE 488 Reference 3 18 3 OPEN ALL The OPEN lt list gt query command is used to determine the state opened or not opened of each channel specified by the list parameter For this command the chanlist can consist of mul tiple channels See the CLOSe command for examples to express a chanlist After sending this query command and addressing the Model 6517A to talk the values for the specified channels are sent to the computer A value of 1 indicates that the channel is open and a 0 indicates that the channel is not open ROUTe OPEN ALL Open closed channel This action command is used to open a closed channel on the internal scanner card Note that this command performs the same function as the ROUTe OPEN ALL command that was pre viously discussed 3 18 4 SCAN commands Parameters Query Description Parameters Query INTernal lt list gt ROUTe SCAN INTerna
58. to direct trigger pulses to and from other instruments Oper ation passes into the measure layer when the Model 6517A receives a trigger over the Trigger Link See paragraph 2 15 5 for details on using the Trigger Link Front Panel Operation NOTE The front panel TRIG key see MANU AL is active with the Trigger Link select ed Pressing the TRIG key passes operation into the measure layer After selecting TRIGLINK you will be prompted to select an input line and then an output line Note that you cannot use the same trigger line for both input and output TIMER Use the timer feature to control the time interval be tween scan sequences when scanning The timer can be set for an interval from 0 001 seconds Imsec to 999999 999 seconds with I msec resolution The first scan sequence occurs immediately while all subse quent scans start at the end of the programmed timer interval If however the programmed timer interval is shorter than the time it takes to complete a single scan the next scan will not start until the previous one is done NOTE The front panel TRIG key see MANU AL is active with the timer selected Pressing the TRIG key after the comple tion of a scan sequence starts the next scan sequence assuming the Model 6517A is programmed for another scan sequence see COUNT HOLD When HOLD is selected the scan source is sup pressed As a result operation does not pass into the measure layer until HO
59. 1 output 27 init opc 6 PRINT 1 enter 27 Wa LINE INPUT 2 A 8 3 19 4 APERture lt n gt Parameters Query Description IEEE 488 Reference PRINT 1 output 27 data fresh 9 PRINT 1 enter 27 10 LINE INPUT 2 B 11 PRINT B 12 END Comments 1 Returns the Model 6517A to System Preset defaults 2 Disables continuous initiation and places the Model 6517A in the idle state 3 4 Configures the Model 6517A to perform 10 measurements 5 Disables zero check 6 7 8 Takes the instrument out of idle and asserts OPC which holds up execution of subsequent GPIB commands until all 10 measurements are completed and the Model 6517A returns to the idle state 9 10 11 12 Aquires and displays the last reading on the computer CRT Every time the program is run the tenth reading will be acquired and displayed on the CRT SENSe 1 VOLTage DC APERture lt n gt Set aperture for Volts SENSe 1 CURRent DC APERture lt n gt Set aperture for Amps SENSe 1 RESistance APERture lt n gt Set aperture for Ohms SENSe 1 CHARge APERture lt n gt Set aperture for Coulombs lt n gt 166 6666666667e 6 to 200e 3 Integration period in seconds DEFault Power line cycle integration 16 67msec for 60Hz power line 20msec for 50Hz and 400Hz power line MINimum 166 6666666667e 6sec MAXimum 200msec APERture Query programmed aperture value APERture DEFault Query
60. 1 0 0 0 10470 0 1 0 1 0 8566 0 1 1 0 0 8566 0 1 1 1 0 7248 1 0 0 0 0 13462 1 0 0 1 0 10470 1 0 1 0 0 10470 1 0 1 1 0 8566 1 1 0 0 0 9423 1 1 0 1 0 7852 1 1 1 0 0 7852 1 1 1 1 0 6730 0 0 0 0 1 11779 0 0 0 1 1 9423 0 0 1 0 1 9423 0 0 1 1 1 7852 0 1 0 0 1 8566 0 1 0 1 1 7248 0 1 1 0 1 7248 0 1 1 1 1 6282 1 0 0 0 1 10470 1 0 0 1 1 8566 1 0 1 0 1 8566 1 0 1 1 1 7248 1 1 0 0 1 7852 1 1 0 1 1 6730 1 1 1 0 1 6730 1 1 1 1 1 5889 0 N not included 1 Y included 2 95 Front Panel Operation 2 16 1 Configuring data storage The data storage configuration menu is used for the follow ing operations e To select the buffer control e To clear the buffer of readings and statistics e To specify the number of readings to store e To specify the source of readings to be stored e To select optional data elements The buffer is configured from the CONFIG DATA STORE menu see Table 2 23 This menu is displayed by pressing CONFIG and then STORE Rules for navigating menu struc tures are provided in paragraph 2 3 5 Table 2 23 CONFIGURE DATA STORE menu structure Menu item Description Count Select buffer size Enter count Enter number of readings to store Use trigger model Use finite measure count from trigger model Control Select type of buffer control Fill and stop Fill buffer with readings and stop Pretrigger Wait for pretrigger event store before and after readings Percent
61. 1D GS 14 OE SO 30 1E RS 15 OF SI 31 1F US Message sent or received with ATN true ASCII Character Codes and IEEE 488 Multiline Interface Command Messages ITEEE 488 Decimal Hexadecimal ASCII Messages 32 20 SP MLA 0 33 21 MLA 1 34 22 me MLA 2 35 23 MLA 3 36 24 MLA 4 37 25 MLA 5 38 26 amp MLA 6 39 27 MLA 7 40 28 MLA 8 41 29 MLA 9 42 2A X MLA 10 43 2B MLA 11 44 2C i MLA 12 45 2D MLA 13 46 2E MLA 14 47 2F MLA 15 48 30 0 MLA 16 49 31 1 MLA 17 50 32 2 MLA 18 51 33 3 MLA 19 52 34 4 MLA 20 53 35 5 MLA 21 54 36 6 MLA 22 55 37 7 MLA 23 56 38 8 MLA 24 57 39 9 MLA 25 58 3A MLA 26 59 3B i MLA 27 60 3C lt MLA 28 61 3D MLA 29 62 3E gt MLA 30 63 3F UNL TEEE 488 Decimal Hexadecimal ASCII Messages 64 40 MTA 0 65 41 A MTA 1 66 42 B MTA 2 67 43 C MTA 3 68 44 D MTA 4 69 45 E MTA 5 70 46 F MTA 6 71 47 G MTA 7 72 48 H MTA 8 73 49 I MTA 9 74 4A J MTA 10 75 4B K MTA 11 76 4C L MTA 12 77 4D M MTA 13 78 4E N MTA 14 79 4F O MTA 15 80 50 P MTA 16 81 51 Q MTA 17 82 52 R MTA 18 83 53 S MTA 19 84 54 T MTA 20 85 55 U MTA 21 86 56 V MTA 22 87 57 W MTA 23 88 58 X MTA 24 89 59 Y MTA 25 90 5A Z MTA 26 91 5B MTA 27 92 5C MTA 28 93 5D MTA 29 94 SE MTA 30 95 5F UNL Message sent or received with ATN true Numbers shown repre sent primary address resulting in MLA My Listen Address C 2 Message sent or received with ATN true Numb
62. 1mA is the 2mA range Thus the 2mA range is selected as the upper range limit With this upper limit the instrument cannot uprange to the 20mA measurement range The lower range limit is selected by specifying the lowest expected reading that you expect to measure Note See next command to set the autorange limit for coulombs LGRoup lt name gt SENSe 1 CHARge RANGe AUTO LGRoup lt name gt Select coulombs autorange limit lt name gt HIGH 200nC to 2uC autorange limit LOW 2nC to 20nC autorange limit LGRoup Query coulombs autorange limit This command is used to set the autorange limit for the coulombs function With HIGH selected the instrument will only autorange between the two high coulombs ranges 200nC and 2uC With LOW selected the instrument will only autorange between the two low coulomb ranges 2nC and 20nC UPPer lt n gt SENSe 1 RESistance AUTO RANGe UPPer lt n gt Set measurement range for Auto V Source Ohms SENSe 1 RESistance MANual CRANge UPPer lt n gt Set measurement range for Manual V Source Ohms Parameters Query Description Parameters Query Description IEEE 488 Reference lt n gt Oto 100e18 Expected reading in ohms Auto V Source ohms 0 to 21e3 Expected reading in ohms Manual V Source ohms DEFault 100e18 Auto V Source ohms 21e3 Manual V Source ohms MINimum 0 MAXimum Same as DEFault UPPer Query programmed measurement range UPPer DEFau
63. 3 18 3 18 1 3 18 2 3 18 3 3 18 4 3 19 3 19 1 3 19 2 3 19 3 3 19 4 3 19 5 3 19 6 3 19 7 3 19 8 3 19 9 3 19 10 3 19 11 3 19 12 3 19 13 3 19 14 KE lee EE Eyent ET E LST EE tes Status byte and service request GRO Trigger Model HEEE 488 Operation ws ccccsssssssesbesessicsssossstassnasesnstsenesecebessbeveseseenaeeabasvasnsedseccsabesbsecaisonsesoeennsfes geegent Es One E KE EL EE aar We EE ESE event enable query ESR event status register QUCTY E IDN Identification EIER egen casbiesicsateeksesiasensucesannessccesanvecaysesiaeactuwnsubeam sabedecasbeiuorsennebavecnsbws W ISSE OPC op ration complete e E OPT option identification query En soa PRCT recalls EE t KE P reset the Model 65 17 E oa SAV save the current setup in memory SRE lt NRf gt service request enable EE SRE service request enable query STB 2 Status byte QUENY sevesssxeiscs oases saecsbeseesseedsvseesseevacs vasnvbasce suas bagassbeteea leet saeasaseebesetpesnvanetasnsetsepsanon PUR Gy TEE A e KN EE E a R EE les WAI wait to continue Signal oriented measurement Commande Ee ER E SEHR ECH CR EE ee e GE UE d EE UE sci vescessevsunsvepsstsaccvasseansebassniass E EE EE EE EEEE AE ERE EERE RER EI EEES Era CEET EEEE ES ERSS ICAT AbrationeSUbSy Stem enee reien aaisen eiee NE EEE EEEIEE EEES EEE AE E TE SEEE EEEn IDIR AEDA AE a a PEE E TRORM a
64. 6 5 digit resolution or they can default to a setting appropriate for the selected inte gration time 3 5d 4 5d 5 5d or 6 5d Sets resolution to the specified num ber of digits AUTO Optimizes the resolution for the present integration time setting See Table 2 19 for the default resolutions of the volts amps ohms and coulombs functions 2 5 3 Voltage measurement considerations Some considerations for making accurate voltage measure ments are summarized in the following paragraphs Addi tional measurement considerations are summarized in paragraph 2 21 For comprehensive information on precision measurements refer to the Low Level Measurements hand book which is available from Keithley LOADING EFFECTS Circuit loading can be detrimental to high impedance volt age measurements To see how meter loading can affect ac curacy refer to Figure 2 22 Rg represents the resistance component of the source while Ryy represents the input re sistance of the meter The percent error due to loading can be calculated using the formula in the illustration To keep the error under 0 1 the input resistance Ry must be about 1000 times the value of the source resistance Rg The input resistance of the Model 6517A is gt 2 x 10E 4Q Thus to keep the error under 0 1 the source resistance of the measured voltage must be lt 2 x 10E Q Source Meter WN ES Rin Error 100s Rs Rin Figure 2 22 Meter loading C
65. B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 BO Event VSC FLC OL BPT SRA BFL BHF BAV RUF RAV HL2 LL2 HL1 LL1 ROF Decimal Weighting 16384 8192 4096 2048 1024 512 256 128 256 32 16 8 4 2 1 214 213 212 Qu 210 29 28 27 26 25 24 23 22 21 20 Value 0 1 0 1 O 1 1 oi 0 1 OI 0 1 0 1 0 1 0 1 0 1 O 1 O 1 Of Value 1 Enable Measurement Event Events VSC V Source Compliance 0 Disable Mask Measurement Event FLC Fixture Lid Closed OL Out of Limits BPT Buffer Pretriggered SRA Sequence Reading Available BFL Buffer Full BHF Buffer Half Full BAV Buffer Available RUF Reading Underflow RAV Reading Available HL2 High Limit 2 LL2 Low Limit 2 HL1 High Limit 1 LL1 Low Limit 1 Figure 3 28 ROF Reading Overflow Measurement Event Enable Register Bit Position B15 B14 B13 B12 B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 BO Event Warn Seq Coul Hum Cal BAV RUF RAV Temp Amp Volt Decimal Weighting f16384 4096 2048 512 256 128 256 32 16 beer Deng 2 1 214 212 211 29 28 27 26 25 24 21 20 Value 0 1 On on 1 on o 1 on OI o 1 OI OI Value 1 Enable Questionable Event 0 Disable Mask Questionable Event Events Warn Comman
66. COUNt lt n gt Set arm layer count ARM SEQuence 1 LAYer2 COUNt lt n gt Set scan layer count STRIGger SEQuence 1 COUNt lt n gt Set measure layer count lt n gt 1 to 99999 Specify count INF Sets count to infinite DEFault Sets count to 1 MINimum Sets count to 1 MAXimum Sets count to 99999 COUNt Queries programmed count COUNt DEFault Queries RST default count COUNt MINimum Queries lowest allowable count COUNt MAXimum Queries largest allowable count These commands are used to specify how many times operation loops around in the specified layer of operation For example if the measure count is set to 10 operation continues to loop around in the measure layer until 10 measurements are performed After the 10th measurement operation proceeds back up to the scan layer ARM SEQuence 1 LAYer2 DELay lt n gt Set scan layer delay STRIGger SEQuence 1 DELay lt n gt Set measure layer delay lt n gt 0 to 999999 999 Specify delay in seconds DEFault 0 second delay MINimum 0 second delay MAXimum 999999 999 second delay DELay Query the programmed delay DEI aw DEFault Query the RST default delay DELay MINimum Query the lowest allowable delay DELay MAXimum Query the largest allowable delay These delay periods are used to delay operation in the specified layer After the programmed event occurs the instrument waits until the delay period expires before proceeding on in the Trigger Model Note that t
67. Common Commands implemented by 6517 See paragraph 3 11 13 Calibration query information See Service Manual 14 Trigger macro for DDT Not applicable 15 Macro information Not applicable E 1 IEEE 488 Conformance Information Table E 1 cont IEEE 488 documentation requirements 16 7 18 19 20 21 22 23 Requirement Storage area for PUD and PUD Resource description for RDT and RDT Effects of RST RCL and SAV TST information Status register structure equential or overlapped commands Operation complete messages Description or reference Response to IDN identification See paragraph 3 11 4 Not applicable Not applicable See paragraphs 3 11 9 3 11 8 3 11 10 and Tables 3 4 through 3 16 See paragraph 3 11 14 See paragraph 3 8 All are sequential except INIT and INIT CONT ON which are overlapped OPC see paragraph 3 11 5 OPC see paragraph 3 11 6 WAT see paragraph 3 11 15 E 2 Table E 2 Coupled commands IEEE 488 Conformance Information Command Also changes To If TRIG COUN TRAC POIN AUTO OFF TRAC POIN AUTO is ON and TRIG COUN is an illegal buffer size TRAC POIN TRIG COUN TRAC POIN AUTO is ON TRAC FEED PRET AMO READ TRIG COUN TRAC POIN AUTO is TRAC FEED PRET A ON MO PERC 100 TRAC FEED CONT TRIG SOUR TIM TRAC FEED CONT is PRET and TRIG SOUR is neither IMM nor TIM TRAC
68. Electrometer LO can be connected to chassis ground at the rear panel of the Model 6517 by installing the ground link between the COMMON binding post and the chassis ground binding post You may have to experiment to determine which method provides the best noise performance CAUTION Do not make floating measurements with electrometer LO connected to chas sis ground If the rear panel ground link is installed between COMMON and chassis ground remove it before floating the instrument Guard shield Guarding is used to greatly reduce leakage current in a high impedance test circuit Leakage resistance exists in the input cable between conductor paths and in the test fixture at connectors and insulators The concept of guarding is to surround the input high node or DUT with a guard shield that is at the same potential Current cannot flow through a leakage resistance that has a OV drop across it The generic connection for the guard shield is shown in Figure 2 12 which also summarizes the measurements that guard is used for Notice that a safety shield is also used since guard ed measurements can place hazardous voltages on the guard shield see Safety Shield Metal Safety Shield AS Metal Guard Shield l l l gt Connect to 6517A Guard l Device or l via triax cable l Circuit Under i l Test l Safety Use Guard for Earth 1 Guarded voltage measurement Ground 2 Guarded floating current measur
69. Electrometer input circuitry 2 54 Electrometer input connecto Electrostatic interference 2 127 Enable registers 3 15 Error and status messages 3 7 ESE event enable query 3 28 Event registers Exponent mode Engineering or Scientific External scanning 2 125 External feedback SE External triggering 2 F Features 1 1 Filters 2 100 Floating circuits 2 13 Front panel aspects of IEEE 488 operation 3 7 G GENERAL 2 120 General bus commands General Test Sequence Commands 3 148 GET group execute trigger 3 6 GPIB primary address selectio GPIB programming language selection Ground loopg 2 126 GTL go to local High resistance meter connectiong 2 11 Humidity 2 127 I IEEE 488 bus connections IEEE 488 bus overvie IEEE 488 conformance presse IEEE 488 primary address 2 4 IEEE 488 status indicators 3 7 IFC interface clear 3 Information messages Inspection 1 2 Interface function codes Interlock and test fixture Internal scanning 2 125 L Light 2 127 Line fuse replacemen Line power connections 2 2 LIMITS 2 118 LLO local lockout LOCAL key Logarithmic 2 106 Logarithmic SE i ielding and guarding Low noise cables sh M Magnetic fieldg 2 Manual addendal 2 Math 2 105 range Menu 2 107 Multiple displays 2 7 42 42 N Navigating menus 2 9 Non decade current gains 2 57 Non standard coulombs ranges O Ohms co
70. INF 1 d 3 24 4 COUNt Query arm count V SOURce lt name gt Select control source HOLD IMMediate RTCLock IMMediate Note 2 3 24 6 MANual BUS TLINk or EXTernal SOURce Query control source V SIGNal Loop around control source V 3 24 8 TCONfigure Path to configure Triggers 3 24 9 DIRection lt name gt Enable SOURce or disable ACCeptor DIRection Query direction ACCeptor ASYNchronous Path to configure asynchronous Trigger Link ILINe lt NRf gt Select input line 1 to 6 ILINe Query input line 2 OLINe lt NRf gt Select output line 1 to 6 OLINe Query output line 1 RTCLock Path to configure the RTCLock control source 3 24 10 DATE lt yr gt lt mo gt lt day gt Specify the date for the clock event DATE Query the date for the clock event TIME lt hr gt lt min gt lt sec gt Specify the time for the clock event TIME Query the time for the clock event LAYer2 Path to program Arm Layer 2 V IMMediate Loop around control source d 3 24 3 COUN lt n gt Specify scan count 1 to 99999 or INF Note 3 V 3 24 4 COUNt Query scan count d DELay lt n gt Program delay 0 to 999999 999 sec 0 V 3 24 5 DELay Query delay d SOURce lt name gt Select control source HOLD IMMediate TIMer IMMediate Note 2 3 24 6 MANual BUS TLINk or EXTernal SOURce Query control source V TIMer lt n gt Set timer interval 0 to 999999 999 sec 0 1 V 3 24 7 TIMer Query timer V SIGNal Loop
71. IT Configure Staircase Sweep from DV to 20V in 2V steps CALL send 27 TSEQ TYPE STSW status CALL send 27 TSEQ STSW STAR 0 status CALL send 27 TSEQ STSW STOP 20 status CALL send 27 TSEQ STSW STEP 2 status FALE CALL send 27 TSEQ STSW STIM 0 3 status CALL send 27 TSEQ TSO IMM status VUNNU Wait for commands to complete processing DATA1S SPACES 600 CALL send 27 OPC status CALL enter DATA1 length 27 status Start Test Sequence CALL send 27 TSEQ ARM status Wait for SRO buffer full WaitSRQ IF NOT srq THEN GOTO WaitSRQ CALL spoll 27 poll status IF poll AND 64 D THEN GOTO WaitSRQ IT Dump buffer readings to computer CRT CALL send 27 TRACE DATA status CALL enter DATA1 length 27 status A 1 FOR I 1 TO 11 r MIDS DATA1S A 13 PRINT r A A 14 NEXT I END The UNIT subsystem see Table 3 17 is used to select measurement units for temperature read ings TEMPerature lt name gt UNIT TEMPerature lt name gt Select temperature units lt name gt C or CEL C temperature units F or FAR F temperature units K K temperature units TEMPerature Query temperature units This command is used to select the units for temperature readings internal and external This com
72. LLOCkout lt b gt Enable or disable local lockout RS 232 only OFF 3 22 14 MACRo 3 22 14 TRIGger Paths to configure Basic triggering 3 22 14 EXECute Select basic triggering 3 22 15 MOD lt name gt Specify trigger mode CONTinuous or ONEShot CONTinuous SOURce lt name gt Specify source IMMediate MANual BUS EXTer IMMEdiate nal or TIMer TIMer lt n gt Specify timer interval 0 001 to 99999 999 sec 0 1 INTerlock Query if interlock cable connected to fixture 1 yes 3 22 16 Note Clearing the Error Queue Power up and CLS Clears the Error Que RST SYSTem PRESet and STATus PRESet No effect 3 55 IEEE 488 Reference Table 3 14 TRACe command summary ETEMperature VSOurce NONE Power up Command Description defaults SCPI Ref TRACel DATA Use TRACe or DATA as root command 23 CLEar Clear readings from buffer 3 23 1 FREE Query bytes available and bytes in use V 3 23 2 POINts lt n gt Specify size of buffer V 3 23 3 AUTO lt b gt Enable or disable auto buffer sizing V AUTO Query state of auto buffer sizing V ACTual Query number of readings stored in the buffer POINts Query buffer size y FEED Path to control Feed commands 3 23 4 PRETrigger Path to configure pre trigger storage AMOunt Path to specify number of pre trigger readings PERCent lt n gt Specify 0 to 100 of buffer PERCent Query percentage READings lt n g
73. NOd O NOd 40 mod k g g g g oun Dn ysanbay oer x0 EC ml e IWD 1013 pueume ao E Z Z Z Z IAS 81S 7a Su puuma K 9 9 9 9 aso aso Jaa e aad 1013 ay adg sain e S S S S 9 SSW SDY TKO JAD 10113 AND e t i L asa asa T T e E XO AYW AYW MO DdO adw uomgado K G a a is Ier D aer L bag L bas L bas bas 1 1 ke7 40881 uy ER 13185189Y 13185189Y o 0 o o AVA AVI aen smeis L L Smets ua 4aysi8ay 13451894 EEE saysi8ay 5 5 quan uepuet att Waat uonisues uomipuo gt asw asw Kee CS D s Kzn ER v i JasiBay Jasiay 33u ayqeuy akg qsanbay smeis DIALS anand nding Kam st oH s SL SI 0z siew K st OH s SL ZU 019Z skemjy k eu eu eu eu Sure Pueume kosa ES DSA DSA 2uerdwo u 324N0S A Di Di Di Di a ou a D74 Pasold pri am bas o P s bag Bag Arewuing rat 2u nb k Ki 10 10 JO sun omg anand 10117 Toy eH no jno gt nop Arewung squiojno gt k Tag Tag Idg Tag Pos Jang D s D s wyo wyo Arewuins suyo k vas vas VAS Vas aiqeieay Bupe y 2u nb s K um mn um wink Aeuuume Aypiuwiny k 74a 09 EE 74 n4 ang yo ELE eD eD 3 Arewuns uonesqyed 209 209 209 2079 Wm HeH mung r330 Et A O Z Z Z Ae AVE AVE ANS Ava a1qereay sung Ei 3 9 g 1221807 any _ Ny and ANY Moyepun Bupeoy CL H S g Ava OH Ava Ava Ava aiqeiieay Supeoy due dwa dat Arewuing ainesaduay TH TH TH TIH z mur ysiH ELE e Dau Dau Dau ZT z mun wen emm ff z H KI nH D TH 1 uw ys lt sduy sduiy sduny Arewiuung
74. Other components that are not safety related may be purchased from other suppliers as long as they are equivalent to the original component Note that se lected parts should be purchased only through Keithley Instruments to maintain accuracy and functionality of the product If you are unsure about the applicability of a replacement component call a Keithley Instruments office for information To clean an instrument use a damp cloth or mild water based cleaner Clean the exterior of the instrument only Do not apply cleaner directly to the instrument or allow liquids to enter or spill on the instrument Products that consist of a circuit board with no case or chassis e g data acquisition board for installation into a computer should never require cleaning if handled according to in structions If the board becomes contaminated and operation is af fected the board should be returned to the factory for proper cleaning servicing KEITHLEY IMPORTANT Model 6517A Specification Change Please note the following specification change for the Model 6517A This unit is manufac tured to operate with a line voltage of 120 240 VAC 10 not 105 125 210 250 VAC as stat ed in the manuals Table of Contents 1 1 1 2 1 3 1 4 1 5 1 6 1 7 1 8 2 1 2 2 2 2 1 2 2 2 2 2 3 2 2 4 2 2 5 2 2 6 2 3 2 3 1 2 3 2 2 3 3 2 3 4 2 35 2 4 2 4 1 2 4 2 2 4 3 2 4 4 2 4 5 2 4 6 2 5 2 5 1 2 5 2 2 5 3 2 6 2 6 1 2 6 2 2 6
75. PLC power line cycle 16 67msec for 60Hz 20msec for 50Hz and 400Hz FAST Select 0 01 PLC MEDIUM Select 0 1 PLC HIACCURACY Select 10 PLC SET SPEED EXACTLY Set integration time in PLC 0 01 10 SET BY RSLN Default to setting appropriate for resolution FILTER Filter menu AVERAGING Configure digital averaging filter TYPE Select type of average filter NONE No average filtering performed AVERAGING Program a simple average filter 1 100 rdgs ADVANCED AVERAGING MODE 2 40 Program a simple average filter 1 100 rdgs with noise tolerance window 0 100 of range Select moving average or repeating average mode MEDIAN Configure median filter DISABLE Disable median filter ENABLE Enable median filter and specify range 1 5 RESOLUTION Display resolution menu AUTO Default to resolution appropriate for integration time 3 5d 4 5d 5 5d 6 5d Select a specific resolution AMPSREL Enable or disable amps REL AUTORNG Autorange menu USE ALL RANGES Use all ranges when autoranging SET LIMITS Limit the ranges used in the autorange search MIN AUTO Specify the minimum range in the search MAX AUTO Specify the maximum range in the search DAMP Enable or disable damping MEAS TYPE Resistance measurement type menu RESISTANCE Select the resistance measurement mode RESISTIVITY Select the resistivity measurement mode SURFACE Configure surface resistivity measurements VOLUME Configure volume resistivity measurements VSOU
76. Panel Operation cables The basic procedure to make guarded voltage mea surements is provided in paragraph 2 5 1 To understand the concept of guarding let us first review the unguarded circuit shown in Figure 2 23 Eg and Rg repre sents the resistance and voltage components of the source and Ry and C represents the leakage resistance and cable capacitance of the triax input cable The equivalent circuit shows the divider that is formed If Rg is large enough the divider will significantly attenuate the voltage seen at the in put of the Model 6517A see CABLE LEAKAGE RESIS TANCE Also Rg and the cable capacitance Cg could create a long RC time constant resulting in a slow measure ment response see INPUT CAPACITANCE Center Conductor Triax Cable Source To 6517A Input Es Inner Shield O LO Rs NW V On eg To 6517A s R C1 Input o OLO Equivalent Circuit Figure 2 23 Unguarded voltage measurements Guarding the circuit minimizes these effects by driving the inner shield of the triax cable at signal potential as shown in Figure 2 24 Here a unity gain amplifier with a high input impedance and low output impedance is used Since the cen ter conductor HI and the inner shield Guard of the cable are at virtually the same potential the potential across Ry is zero so no current flows Also with a zero potential across C there is no capacitor charging proc
77. RST default aperture value APERture MINimum Query minimum aperture value APERture MAXimum Query maximum aperture value The integration period measurement speed for the Model 6517A can be set using either of two commands NPLCycle paragraph 3 19 5 or APERture The NPLC method specifies the inte gration period as the number of power line cycles per integration while aperture specifies the time in seconds per integration Refer to Section 2 for details on integration SPEED The re lationship between NPLC and aperture is expressed as follows Aperture NPLC f where Aperture is the integration rate in seconds per integration NPLC is the number of power line cycles per integration f is the power line frequency For 400Hz line power use 50Hz to calculate aperture IEEE 488 Reference Parameters Query Description When the integration period is set using the APERture command the value for the NPLCycle command changes accordingly to reflect the new integration period Conversely if the integra tion period is set using the NPLCycle command the value for the APERture command chang es accordingly On power up the instrument uses the NPLC value to determine the integration period Thus if using a different power line frequency NPLC will remain the same but aperture may change Note If line synchronization is enabled see LSYNc command in SYSTem subsystem the in tegration period will not start
78. Read the serial poll byte PRINT S IT Display the decimal value of the serial poll byte 3 7 Front panel aspects of IEEE 488 opera tion The following paragraphs discuss aspects of the front panel that are part of IEEE 488 operation including messages sta tus indicators and the LOCAL key 3 7 1 Error and status messages Table 2 4 summarizes the error and status messages associ ated with remote programming using SCPI and Common Commands Additional information on errors associated with RS 232 operation is provided in paragraph 3 25 3 7 2 IEEE 488 status indicators The REM remote TALK talk LSTN listen and SRQ service request annunciators show the present IEEE 488 status of the instrument Each of these indicators is briefly described below REM This indicator shows when the instrument is in the remote state Note that REM does not necessarily indicate the state of the REN line as the instrument must be ad dressed to listen with REN true before the REM indicator turns on When the instrument is in remote all front panel keys except for the LOCAL key are locked out When REM is turned off the instrument is in the local state and front panel operation is restored TALK This indicator is on when the instrument is in the talker active state The unit is placed in this state by address ing it to talk with the correct MTA My Talk Address com mand TALK is off when the unit is in the talker idle state
79. Readings 10 10 Advanced Off Off Readings 10 10 Noise Tolerance Level 1 1 Filter Mode Moving Repeat Median Filter On On Rank 1 1 I Amps Damping Off On Range Manual 20mA Manual 20mA Autorange Off Off Limits Use all ranges Use all ranges Limits Limit Set 1 and 2f Off Off Low Limit 1 0 1 0 Action 0 0 High Limit 1 0 1 0 Action 0 0 Strobe Control Off Off Pass Pattern 0 0 Math Off On Function Polynomial Polynomial Percent Target Value 1 0 1 0 Polynomial Constants a0 0 0 0 0 al 1 0 1 0 a2 0 0 0 0 Deviation Reference 1 0 1 0 Deviation Reference 1 0 1 0 Ratio Reference 1 0 1 0 Q Coulombs Auto Discharge Off Off Range Manual 2uC Manual 2uC Autorange Off On Limits High High R Ohms Amps Rel Off Off Damping Off Off Measurement Type Resistance Resistance Resistivity Type Surface Surface Fixture User User Ks Kv 1 0 1 0 Thickness 1 0 mm 1 0 mm Table 2 30 cont Factory default conditions Front Panel Operation Bench default Function or operation SYSTem PRESet GPIB default RST R Ohms Auto V Source Ohms Range 2MQ 2MQ Autorange Off On Limits Use all ranges Use all ranges Manual V Source Ohms Range Manual 200kQ Manual 200kQ Autorange Off Off Limits N A N A V Source Manual Manual Relative Off Off Value Auto 0 0 0 0 Resolution Auto 5 5d Auto 5 5d Scanning Scan Type Internal Internal Internal Scan Channels All All Count 10 10 Memory Yes Yes Scan Mode Vol
80. SPD Serial Poll Disable Low Disables serial polling Addressed SDC Selective Device Clear Low Returns unit to default conditions GTL Go To Local Low Returns device to local Unaddressed UNL Unlisten Low Removes all listeners from the bus UNT Untalk Low Removes any talkers from the bus Common High Programs IEEE 488 2 compatible instruments for common operations SCPI High Programs SCPI compatible instruments for particular operations Uniline commands ATN IFC and REN are asserted only by the controller SRQ is asserted by an external device EOI may be asserted either by the controller or other devices depending on the direction of data transfer The following is a description of each com mand Each command is sent by setting the corresponding bus line true REN Remote Enable REN is sent to set up instruments on the bus for remote operation When REN is true devices will be removed from the local mode Depending on device configuration all front panel controls except the LOCAL button if the device is so equipped may be locked out when REN is true Generally REN should be sent before attempt ing to program instruments over the bus EOI End or Identify EOI is used to positively identify the last byte in a multi byte transfer sequence thus allowing data words of various lengths to be transmitted easily IFC Interface Clear IFC is used to clear the interface and return all dev
81. STOP Front Panel Operation CLEAR ALL This action yes or no can be used at any time to clear the data buffer of all stored readings and buffer statistics TIMESTAMP A timestamp is included with each buffer reading if it is se lected as a data element see ELEMENTS This menu selec tion is used to check and or change the timestamp type and format TYPE This menu item is used to check and or change the timestamp type Note that changing the timestamp type clears the buffer e RELATIVE TIME With this selection timestamps are oriented to a timer with the first buffer reading timestamped at 0 000000 seconds Each following timestamp is then based on the currently selected for mat see FORMAT With the ABSOLUTE format se lected the timestamp for each reading is referenced in seconds to the first buffer reading With the DELTA format selected each timestamp is referenced in sec onds to the previous timestamp e REAL TIME With this selection timestamps are oriented to the real time clock and are based on the cur rently selected format see FORMAT With the ABSO LUTE format selected each reading is simply timestamped with the actual time and date Time can be expressed in the 12 hour AM PM format or the 24 hour format see CLOCK in paragraph 2 19 8 With the DELTA format selected the first buffer reading is timestamped at 00000d 00h 00m 00 00s zero days hours minutes and seconds Each subseque
82. SYStem PRESet default conditions Default conditions are listed in the SCPI tables Tables 3 4 through 3 16 With one of the SAV parameters selected the instrument powers on to the setup that is saved in the specified memory location using the SAV command SYSTem VERSion Read SCPI version This query command is used to read the version of the SCPI standard being used by the Model 6517A Example code 1991 0 The above response message indicates the version of the SCPI standard SYSTem ERRor Read Error Queue As error and status messages occur they are placed into the Error Queue This query command is used to read those messages The Error Queue is a first in first out FIFO register that can hold up to 10 messages Every time you read the queue the oldest message is read and that message is then removed from the queue If the queue becomes full the message 350 Queue Overflow occupies the last memory loca tion in the register On power up the queue is empty When the Error Queue is empty the mes sage 0 No error is placed in the Error Queue 3 129 IEEE 488 Reference 3 22 5 3 22 6 3 130 The messages in the queue are preceded by a number Negative numbers are used for SCPI defined messages and positive numbers are used for Keithley defined messages Table 2 5 lists the messages NOTE The SYSTem ERRor query command performs the same function as the STA Tus QUEue query command s
83. Semi synchronous Semi sync line 1 Number of channels Use Scanlist length Channel trigger control Source Indicates that the setting is the RESET and factory default condition To run the test and store the readings in the Model 6517A press STORE on the electrometer enter the desired number of readings ten and press ENTER The Model 6517A waits with the asterisk annunciator lit for a Trigger Link trigger from the Model 7001 7002 Press STEP on the Model 7001 7002 to start the scan 7001o0r 7002 Press STEP to start scan Wait for Trigger Link Trigger Scan Channel Pull Trigger Line Low Scanned 10 Channels 2 Figure 2 74 Operation model for semi synchronous Trigger Link example Front Panel Operation The following explanation on operation is referenced to the operation model shown in Figure 2 74 Wait for Trigger Link Trigger Make Measurement Release Trigger Line Td Made 10 Measurements 2 2 93 Front Panel Operation A The BENCH RESET condition arms the Model 6517A and places electrometer operation at point A in the flowchart where it is waiting for a Trigger Link trigger Note that since both the arm layer and scan layer are programmed for Immediate Source operation immediately drops down to the measure layer at point A Pressing STEP takes the Model 7001 7002 out of the idle state and places operati
84. Source goes into standby when the test fixture lid is open e Screw terminal on test fixture chassis for connection to safety earth ground Note Figure 2 37 in paragraph 2 7 1 shows connections to the Model 6517A and the equivalent circuit Custom built test fixtures Two examples of custom built test fixtures are shown in Fig ures 2 16 and 2 17 The first is a dedicated test fixture to source voltage and measure current to a single DUT resis tance measurements The second is a multi purpose test fix ture that can be used to make any Model 6517A measurement Front Panel Operation These two examples illustrate the basic techniques that should be applied when building a test fixture These same basic tech niques should be used if you need to build a more complex test fixture to accommodate your test measurement requirements The test fixture in Figure 2 16 assumes that ammeter input LO is connected to V Source LO inside the Model 6517A This LO to LO connection is controlled from the METER CONNECT selection in the CONFIGURE V SOURCE menu see paragraph 2 9 1 The following requirements recommendations and guide lines are provided in order to build a quality test fixture that is safe to use NOTE After building a test fixture you should clean it see Handling and Cleaning Test Fixtures Test fixture chassis 1 The chassis of the test fixture should be metal so that it can function as a shield for the DUT or test
85. Table 3 5 Table 3 6 Front Panel Operation TAME fuse selection WEE Data checked Gn pOWer Up vs sive sesesses size dvenceaseedtedeodhavesd ste oububanbvess E Power up error MeSsagES rseson renis ehna eeraa aE aaa ea E EE Typical display exponent Values enge verte enee eege EE aeea AAEE TEENER TENE EEEE StAtUs aNd error Messag S ecrire einr iese aee eap eea EES E A EROE EEEE EEE EE EEEE EEEE AE EKRE EET Multiple Next displays by function ss sssoeseneseesseeesestssrsesesetstsrsreerssesensrsteserrserstetrseeernreeensestnsesee EXIT Key attente EE REEE R EE renr PRE AEE aaron Ee EEE rarr E RE CONFIGURE VOLTS men Structure i scccc ccasccssuscessvecnssbesseesteseentcnsseadecesnsvecneteassvessusnetsvest ee CONFIGURE AMPS men strugctupe sesiis ieis retenien reseo oeta REESEN EKS E tnae rE ENEE Minimum recommended source resistance values Ohms reading ranges and AUTO N Source uo eee cecessecseceseceeceseeeecaeeeceeeeeeeteeeeeseaeeeeesaeesaeeaees CONFIGURE OHMS menu Structure 5 c ccsccheceuesencvesessbesseeseeseetensseodceesnssncuseadsvasessestivensssnvasens CONFIGURE COULOMBS men structure V SOUPCE E WE CONFIGURE V Source menu structure Typical 2V analog Output Valu s c csscccsiccceiesivsiciiasescecstbaces stavecndsnnssavlcssnseacuetestivnsvestousvestesbesseee Full range PREAMP OUT Valles iessisis3 sscsdtseveessasseaznvesasesanoes sieessiebbontvesessbesccnabinuns seadesnscenvabeveanes depos Inte
86. This menu item selects the event that controls the scan source IMMEDIATE With this selection operation passes immedi ately into the measure layer EXTERNAL With this selection external triggers are used to control the scan source A trigger stimulus applied to the Model 6517A passes operation into the measure layer The external trigger is applied to the rear panel EXTERNAL TRIGGER BNC connector See paragraph 2 15 4 for de tailed information on external triggering NOTE The front panel TRIG key see MANU AL is active with external triggering se lected Pressing the TRIG key passes operation into the measure layer MANUAL With this selection the front panel TRIG key controls the scan source Operation passes into the measure layer when the TRIG key is pressed NOTE The front panel TRIG key is active when EXTERNAL GPIB TRIGLINK or TIM ER is selected GPIB With this selection bus triggers control the scan source Operation passes immediately into the measure layer when a bus trigger GET or TRG is received by the Model 6517A See Section 3 for detailed information on bus trig gers NOTE The front panel TRIG key see MANU AL is active with bus triggering selected Pressing the TRIG key passes operation into the measure layer TRIGLINK With this selection the scan source is con trolled by the Trigger Link of the Model 6517A Trigger Link is an enhanced trigger system that uses up to six lines
87. UNTERMINATED after EE indefinite response 430 Query DEADLOCKED EE 420 Query UNTERMINATED EE 410 Query INTERRUPTED EE 350 Queue overflow EE 330 Self Test failed EE 314 Save recall memory lost EE 285 Program syntax error EE 284 Program currently running EE 282 Illegal program name EE 281 Cannot create program EE 260 Expression Error EE 241 Hardware missing EE 230 Data corrupt or stale EE 224 Illegal parameter value EE 223 Too much data EE 222 Parameter data out of range EE 221 Settings conflict EE 220 Parameter Error EE 215 Arm deadlock EE 214 Trigger deadlock EE 213 Init ignored EE 212 Arm ignored EE 211 Trigger ignored EE 210 Trigger error EE 202 Settings lost due to rtl EE 201 Invalid while in local EE 200 Execution error EE 178 Expression data not allowed EE 171 Invalid expression EE 170 Expression error EE 168 Block data not allowed EE 161 Invalid block data EE 160 Block data error EE 158 String data not allowed EE 154 String too long EE 151 Invalid string data EE 150 String data error EE 148 Character data not allowed EE 144 Character data too long EE 141 Invalid character data EE 140 Character data error EE 128 Numeric data not allowed
88. Voltage burden considerations Front Panel Operation NOISE Noise can seriously affect sensitive current measurements The following paragraphs discuss how source resistance and input capacitance affect noise performance Source resistance The source resistance of the DUT will affect the noise per formance of current measurements As the source resistance is reduced the noise gain of the ammeter will increase as we will now discuss Figure 2 28 shows a simplified model of the feedback amme ter Rg and Cg represents the source resistance and source ca pacitance Vg is the source voltage and V yorsg 8 the noise voltage Finally Rp and Cy are the feedback resistance and capacitance respectively The source noise gain of the circuit can be given by the fol lowing equation OutputVynorse InputVyoyspU Rp Rs Note that as Rg decreases in value the output noise increas es For example when R Reg the input noise is multiplied by a factor of two Since decreasing the source resistance can have a detrimental effect on noise performance there are usually minimum recommended source resistance values based on measurement range Table 2 10 summarizes mini mum recommended source resistance values for various measurement ranges Note that the recommended source re sistance varies by measurement range because the Rp value also depends on the measurement range Table 2 10 Minimum recommended source resistance values
89. address of 27 The primary address may be set to any value between 0 and 30 as long as address con flicts with other instruments are avoided Note that control IEEE 488 Reference lers are also given a primary address so do not use that address either Most frequently controller addresses are 0 or 21 but you should consult the controller s instruction manual for details Whatever primary address you choose you must make certain that it corresponds with the value specified as part of the controller s programming language To check the present primary address or to change to a new one perform the following procedure 1 2 10 Display the MAIN MENU by pressing the MENU key Use the cursor keys Ca and to place the cursor on COMMUNICATION and press ENTER The COM MUNICATIONS SETUP menu will be displayed Place the cursor on GPIB and press ENTER NOTE If you are switching from the RS 232 in terface to the GPIB interface the instru ment will reset to the power on defaults In this case you will have to repeat steps 1 2 and 3 to display the GPIB PRINTER SET UP menu Place the cursor on ADDRESSABLE and press EN TER The ADDRESSABLE GPIB menu will be dis played Place the cursor on ADDRESS and press ENTER The current primary address of the instrument will be displayed For example if the instrument is set to prima ry address 27 the following message will be displayed ADDRESS 27 0 30
90. amp MSB of Status Le A Byte Register See Figure 3 13 amp eh Measurement Event vsc ric OL BPT SRA BFL BHF BAV RUF RAV HL2 LL2 HL1 LL1 ROF Enable B15 B14 B13 B12 B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 BO Register VSC V Source Compliance HL1 High Limit 1 FLC Fixture Lid Closed LL1 Low Limit 1 OL Out of Limits ROF Reading Overflow BPT Buffer Pretriggered amp Logical AND SRA Sequence Reading Available OR Logical OR BFL Buffer Full PTR Positive Transition Filter BHF Buffer Half Full NTR Negative Transition Filter BAV Buffer Available RUF Reading Underflow RAV Reading Available HL2 High Limit 2 LL2 Low Limit 2 Figure 3 11 Measurement event status 3 13 IEEE 488 Reference Always Warn Seq Coul Ohms Hum Cal Temp Amp Volt Questionable Zero 2 TETN Sy Condition B15 B14 B13 B12 B11 B10 B9 B8 B7 B5 B4 B3 B2 B1 BO Register 0 y y y y y y y y y y Always Warn Seq Coul Ohms Hum Cal Temp Amp Volt PIR Questionable Zero Transition B15 B14 B13 B12 B11 B10 B9 B8 B7 B5 B4 B3 B2 B1 BO NTR
91. an error and of course not be executed C Valid commands that precede an invalid command in a multiple command program message will be executed D Valid commands that follow an invalid command in a multiple command program mes sage will be ignored 3 25 IEEE 488 Reference 3 26 Response messages A response message is the message sent by the instrument to the computer in response to a query command program message 1 Sending a response message After sending a query command the response message is placed in the Output Queue When the Model 6517A is then addressed to talk the response message is sent from the Output Queue to the computer Multiple response messages GPIB If you send more than one query command in the same program message see Multiple command messages the multiple response message for all the queries is sent to the computer when the Model 6517A is addressed to talk The responses are sent in the or der that the query commands were sent and are separated by semicolons Items within the same query are separated by commas The following example shows the response message for a program message that contains four single item query commands 0 1 1 0 RS 232 Interface Instead of commas a lt CR gt lt LF gt will separate each response from multiple queries in the same program message Response Message Terminator RMT Each response message is terminated with an LF line feed a
92. by placing the cursor on HOLD and press ing ENTER The instrument returns to the SETUP arm layer menu COUNT This menu item defines the number of times operation re turns to the arm layer INFINITE Use this selection to continuously return opera tion to the arm layer ENTER ARM COUNT With this selection the user deter mines the number of times operation returns to the arm layer You can program the Model 6517A to arm up to 99999 times CONTROL Use this menu item to enable or disable the source bypass The source bypass is used to bypass the arm event on the first pass through the arm layer SOURCE With this selection the source bypass is enabled The arm event will be bypassed on the first pass through the arm layer This allows operation to proceed into the scan lay er without having to wait for the programmed event ACCEPTOR With this selection the source bypass is dis abled Continuous Initiation The INIT item of the ADVANCED TRIGGERING menu is used to enable or disable continuous initiation ON Use this option to enable continuous initiation The in strument will not go into idle when all trigger model opera tions are done Operation will instead start over from the top of the advanced trigger model OFF Use this option to disable continuous initiation After all advanced trigger model operations are done the instru ment will go into idle Halting triggers The HALT option of the ADVANCED TRIG
93. can only be sent over the RS 232 interface LLOCkout lt b gt SYSTem LLOCkout lt b gt Enable or disable front panel keys lt b gt 0 or OFF Disable local lockout 1 or ON Enable local lockout LLOCkout Query state of local lockout This command is used to enable or disable local lockout If enabled the front panel keys are locked out non operational when the instrument is in remote see REMote If disabled the front panel keys are operational in remote The instrument must be in remote in order to use this command Taking the instrument out of remote see LOCal restores front panel keys operation but does not change the status of the LLOCkout command Note that this command can only be sent over the RS 232 interface 3 22 15 Basic Trigger Commands Description The following commands are used to configure the Model 6517A for basic triggering See para graph 2 15 for details on basic triggering EXECute SYSTem MACRo TRIGger MODE lt name gt Specify trigger mode When this action command is sent the instrument will exit from advanced triggering and select basic triggering Sending this command while already in basic triggering has no effect on the instrument MODE lt name gt SYSTem MACRo TRIGger EXECute Select basic triggering 3 135 IEEE 488 Reference 3 136 Parameters Description Parameters Description Parameters lt name gt CONTinuous Continuous trigger mode ONEShot On
94. circuit mounted inside The chassis of the test fixture will be connected to chassis ground of the Model 6517A via the triax cable 2 The test box must have a lid that closes to prevent con tact with live circuitry inside WARNING Safe operation requires that a safety in terlock switch be used to place the V Source in standby when the test fixture lid is open or ajar see Interlock 3 The test fixture chassis must have a screw terminal that is used exclusively for connection to safety earth ground WARNING To provide protection from shock haz ards the test fixture chassis must be properly connected to safety earth ground A grounding wire 18 AWG or larger must be attached securely to the test fixture at a screw terminal designed for safety grounding The other end of the ground wire must be attached to a known safety earth ground Front Panel Operation Guard plate A metal guard plate will provide guarding or noise shielding for the DUT or test circuit It will also serve as a mounting panel for DUT or test circuits The guard plate must be insu lated with 1000V spacing from the chassis of the test fixture Connectors terminals and internal wiring Figures 2 16 and 2 17 show the types of connectors needed to use the test fixtures with the Model 6517A All connectors except the triax connector must be insulated from the chassis of the test fixture The outer shell of the triax connector must be referenced
95. coefficient test 0 to 10000 Diode leakage test Delay in seconds Delay in seconds MDELay Query measure delay This configuration command is used for the following tests Diode Leakage Test Resistor Volt age Coefficient Test This command is used to specify the measure time for the specified test Note that the Resistor Voltage Coefficient Test uses two measure delays delay 1 and delay 2 3 25 6 3 25 7 IEEE 488 Reference SVOLtage lt NRf gt TsEQuence CLEakage SVOLtage lt NRf gt Bias voltage cap leakage test TSEQuence ClResistance SVOLtage lt NRf gt Bias voltage cable insulation res test TSEQuence RVCoefficient SVOLtage 1 lt NRf gt Bias voltage 1 Res voltage coef test TSEQuence RVCoefficient SVOLtage2 lt NRf gt Bias voltage 2 Res voltage coef test TSEQuence SRESistivity sVOLtage lt NRf gt Bias voltage Sur resistivity test TSEQuence VRESistivity sVOLtage lt NRf gt Bias voltage Vol resistivity test TSEQuence S Resistance SVOLtage lt NRf gt Bias voltage Sur insulation res test Parameters lt NRf gt 100 0 to 100 0 Volts 100V range 1000 to 1000 Volts 1000V range Query SVOLtage Query soak voltage Description This configuration command is used for the following tests Capacitor Leakage Test Cable Insulation Resistance Test Resistor Voltage Coefficient Test Surface Resistivity Test Volume Resistivity Test Surface Insulation Resistance Test This command is used to specify the bias voltage fo
96. command messages Multiple commands can be sent in the same program mes sage as long as they are separated by semicolons Example showing two commands in one program message stat pres stat oper enab lt NRf gt When the above message is sent the first command word is recognized as the root com mand stat When the next colon is detected the path pointer moves down to the next com mand level and executes the command When the path pointer sees the colon after the semicolon it resets back to the root level and starts over Commands that are on the same command level can be executed without having to retype the entire command path Example stat oper enab lt NRf gt ptr lt NRf gt ntr lt NRf gt After the first command enab is executed the path pointer is at the third command level in the structure Since ptr and ntr are also on the third level they can be typed in without repeating the entire path name Notice that the leading colon for ptr and ntr are not includ ed in the program message If a colon were included the path pointer would reset to the root level and expect a root command Since neither ptr nor ntr are root commands an error would occur IEEE 488 Reference 3 Command path rules A Each new program message must begin with the root command unless it is optional e g SENSe If the root is optional simply treat a command word on the next level as the root B The colon at th
97. commands are used to enable or disable LIMIT 1 and LIMIT 2 tests When enabled the test sequence for limits will be performed every time the instrument performs a measurement Testing is performed in the following sequence Low Limit 1 High Limit 1 Low Limit 2 and High Limit 2 Any limit test LIMIT 1 or LIMIT 2 not enabled is simply not performed Note that when a limit test LIMIT 1 or LIMIT 2 is enabled the digital output port cannot be controlled from the Source Subsystem A fail indication see FAIL for LIMIT 1 or LIMIT 2 is cleared when the respective limit test is disabled FAIL CALCulate3 LIMit 1 FAIL Read LIMIT 1 test results CALCulate3 LIMit2 FAIL Read LIMIT 2 test results These commands are used to read the results of LIMIT 1 and LIMIT 2 tests 0 Limit test passed 1 Limit test failed The response message 0 or 1 only tells you if a limit test has passed or failed It does not tell you which limit upper or lower has failed To determine which limit has failed you will have to read the Measurement Event Register see paragraph 3 21 1 Reading the results of a limit test does not clear the fail indication of the test A failure can be cleared by using a CLEar command or by disabling the test STATe OFF Description Parameters Query Description Parameters Query Description IEEE 488 Reference CLEar commands IMMediate CALCulate3 LIMit 1 CLEar IMMediate Clear LIMIT 1 t
98. cursor on it and pressing ENTER Cursor position is denoted by the blinking menu item or parameter The cursor keys lt q and control cursor position 3 A displayed arrow lt q and on the bottom line indi cates that there are one or more additional items mes sages to select from Use the appropriate cursor key to display them 4 A numeric parameter is keyed in by placing the cursor on the digit to be changed and using the RANGE A or V key to increment or decrement the digit 5 A change is only executed when ENTER is pressed En tering an invalid parameter generates an error and the entry is ignored 6 The EXIT key is used to back out of the menu structure Any change that is not entered is cancelled when EXIT is pressed The EXIT key has additional actions and are summarized in Table 2 7 7 The VOLTAGE SOURCE VY and A keys are used adjust the V Source value The V Source is decremented or in cremented by placing the cursor on the desired digit and pressing W or A With the cursor on the polarity sign pressing V or A toggles the polarity Pressing CONFIG and then W or A displays the CONFIGURE V SOURCE menu 2 4 Connections electrometer high resistance meter and V source The following information provides basic information on electrometer high resistance meter and V source connec tions Also covered is the use of low noise cables and shield Table 2 7 EXIT key actions Front Panel Operation in
99. discussed in paragraphs 2 5 2 and 2 12 AMPSREL Leakage current in a test fixture can corrupt a resistance mea surement This leakage current can be cancelled by perform ing a REL on the current component of the measurement With this menu item you can use the established amps REL value for the resistance measurement See Cancelling Test Fixture Leakage Current in paragraph 2 7 1 ENABLED Use this option to use the amps REL value Af ter this option is selected the instrument will display the sta tus of REL for the ohms function and for the amps function If REL for the amps function is disabled then no amps REL operation will be performed on the measurement DISABLED Use this option if you do not wish to use the amps REL value for resistance measurements Front Panel Operation AUTORNG The AUTORNG option is used to configure autorange for the ohms function This option allows you to speed up the autor anging search process by eliminating upper and or lower measurement ranges For example if you know that readings will not exceed 1GQ you can specify the 2GQ range to be the maximum range When the instrument autoranges as suming AUTO range is enabled it will not search into the ohms ranges above 2GQ Note that the 2TQ 20TQ and 200TQ ranges are not available for AUTO range Table 2 12 CONFIGURE OHMS menu structure Menu item Description SPEED Measurement speed integration time menu NORMAL Select 1
100. elsewhere in this manual The interface function codes for the Model 6517A are listed in Table B 1 The codes define Model 6517A capabilities as follows Table B 1 Model 6517A interface function codes Code Interface function SH1 Source Handshake capability AHI Acceptor Handshake capability T5 Talker basic talker talk only serial poll unaddressed to talk on LAG L4 Listener basic listener unaddressed to listen on TAG SR1 Service Request capability RL1 Remote Local capability PPO No Parallel Poll capability DC1 Device Clear capability DI Device Trigger capability CO No Controller capability El Open collector bus drivers TEO No Extended Talker capability LEO No Extended Listener capability SH Source Handshake Function SH1 defines the abil ity of the instrument to initiate the transfer of message data over the data bus AH Acceptor Handshake Function AH1 defines the ability of the instrument to guarantee proper reception of message data transmitted over the data bus T Talker Function The ability of the instrument to send data over the bus to other devices is provided by the T func tion Instrument talker capabilities T5 exist only after the instrument has been addressed to talk L Listener Function The ability for the instrument to receive device dependent data over the bus from other devic es is provided by the L function Listener capabilities L4 of the instr
101. essesee ce ceseceecseesecaeeseceseeeeseaeeeeeeaeseaecaeesaecaaesaecseseaeeeeeeees DISPlay command Summary ENEE xi Table 3 7 Table 3 8 Table 3 9 Table 3 10 Table 3 11 Table 3 12 Table 3 13 Table 3 14 Table 3 15 Table 3 16 Table 3 17 B Table B 1 D Table D 1 Table D 2 Table D 3 Table D 4 Table D 5 E Table E 1 Table E 2 Xil FOR Mat command Sum Seite iebieaaiSissncsscbseasbecssuctesuroantius EENS OUT put Command SUMMALY sc sccszscssessseesesseseies besuecetess se cocahs EEE EEEE EE Eo EEEE E EEEE E CEE EEE r RESER EEE fost ROUTe command SUM ary isset iee ieee reene esner E E eE T KORE TEORA NEE EE R EEEE AASE SENEE KUSEE EE SENSe command erung nainii issricessr tterna ia ea aE er E RER ea Eare E E rani Ea nats eaa a e hess SOURCE command SUMMATY snerru Ee ironii e EENE shaves EEEE E EENE S EE EET E EES STATUS command SUMMA evssivscscsvisessaccssnsvessscavncvasesssoss anessipsosedevabensceessaeebonsanasenpseusseandeved AEN SYSTem command Summary ees Egeter TRA Ce command Sumi ary wcsscsscseccssibcccosteeabtassscenabenscssaesseuscepsnesgadacedstssusevededaanhdasvscaplsnubesvapectniteptansenaes Trigger EE ere EE TSEQuen ce command SUMMATY sicscciscssseeseesessbiascscenessdeessepscbasespuSevoasveousensieesansy saves EK EOE ERORE EERE HEK KeS UNIT command SUmMar yess niei isana EE EEEE EE AE EEES ENEE due Interface Function Codes Model 6517A interface function codes se eesseeseeeesseneeseersereessrere
102. feedback network and Ay is the open loop gain of the electrometer typically greater than 55x106 Note that the input impedance is Zin 10MQ Zrp when zero check is enabled 3 The voltage at the PREAMP OUT terminal is given by the formula V IZfg 4 Any feedback elements should be housed in a suitable shielded enclosure see paragraph 2 11 2 below Insula tors connected to Input HI should be made of Teflon or other high quality insulating material and should be thoroughly cleaned to maintain the high input imped ance and low input current of the Model 6517A If these insulators become contaminated they can be cleaned with methanol and then with clean pressurized air 2 11 2 Shielded fixture construction Since shielding is so critical for proper operation of external feedback it is recommended that a shielded fixture similar to the one shown in Figure 2 43 be used to house the feedback element The fixture is constructed of a commercially avail able shielded fixture modified with the standard BNC con nectors replaced with triaxial female connectors For convenience a banana jack can be mounted on the box to make the necessary PREAMP OUT connection Alternately a wire could be run through a rubber grommet mounted in a hole in the side of the box Note that input low is connected to chassis ground within the shielded box This connection can be made by using a small solder lug secured with a screw 1 Front Panel Opera
103. function in use be fore it was last armed If the Alternating Polarity sequence calculates a current of zero lt Infinity gt will be displayed but the sequence will continue A lower current range should be selected The Alternating Polarity Test is selected and configured from the CONFIGURE SEQUENCE menu APPLICA TIONS R RESISTIVITY ALT POLARITY See para graph 2 14 2 for details Surface Insulation Resistance SIR test This test is used to measure the insulation resistance between PC board traces Figure 2 53 shows the connections and the equivalent circuit Note that the drawing shows a Y test pattern for the measurement This is a typical test pattern for SIR tests When this test is run a specified voltage BIAS V is applied to the test pattern for a specified time BIAS TIME This bias period is used to polarize the test pattern The test 154 10 Imeas m Background Current pA Icalc aes 5 ess 10 Voltage 15 50V 20 Ly Ly Ly Le 50V 0 30 60 90 120 Figure 2 52 Alternating polarity resistance resistivity test 2 65 Front Panel Operation 6517A n a PC Board Test Pattern 7078 TRX Cable WARNING See 5 PREAMP OUT COMMON 250V PED V SOURCE SE a i ane ou gt WM kel Note Ammeter LO internall
104. gt Enable or disable limit test OFF y STATe Query state of limit test y FAIL Query test result 1 pass 0 fail y CLEAR Path to clear failed test y IMMediate Clear failed test indication y AUTO lt b gt Enable or disable auto clear ON y AUTO Query auto clear y LIMit2 Path to control LIMIT 2 test d UPPer Path to configure upper limit y DATA lt n gt Set upper limit 9 999999e35 to 9 999999e35 1 y DATA Query upper limit y SOURce lt NRf gt Set digital output 0 to 15 0 y SOURce Query source digital output value y LOWer Path to configure lower limit y DATA lt n gt Specify lower limit 9 999999e35 to 9 999999e35 1 y DATA Query lower limit y SOURce lt NRf gt Specify digital output 0 to 15 0 y SOURce Query source digital output value y STATe lt b gt Enable or disable limit test OFF y STATe Query state of limit test y FAIL Query test result 1 pass 0 fail y CLEAR Path to clear failed test y IMMediate Clear failed test indication y AUTO lt b gt Enable or disable auto clear ON y AUTO Query auto clear y PASS Path to define pass digital output pattern SOURce lt NRf gt Specify digital output 0 to 15 0 CLIMits Command path for composite limits y FAIL Query composite result of LIMIT 1 and LIMIT 2 tests y 1 pass 0 fail BSTRobe Path to control limit binning strobe STATe lt b gt Enable or disable strobe OFF STATe Query sta
105. in Amps specification OHMS Alternating Polarity Method The alternating polarity sequence compensates for the background offset currents of the material or device under test Maximum tolerable offset up to full scale of the current range used Using Keithley 8002A or 8009 fixture REPEATABILITY Alpg x R Vay Ty 0 1 16 instrument temperature constant 1 C ACCURACY VgpcErr Ivwpagbt x R VALT where Alpg is a measured typical background current noise from the sample and fixture Varr is the alternating polarity voltage used VspcEtr is the accuracy in volts of the voltage source using Vagy as the setting ImgaSEtt is the accuracy in amps of the ammeter using Vay R as the rdg VOLTAGE SOURCE ACCURACY TEMPERATURE 1 Year COEFFICIENT 5 DIGIT 18 28 C 0 18 C amp 28 50 C RANGE RESOLUTION setting offset setting offset C 100 V 5 mV 0 15 10 mV 0 005 1 mV 1000 V 50 mV 0 15 100 mV 0 005 10 mV MAXIMUM OUTPUT CURRENT 10mA active current limit at lt 11 5mA for 100V range 1mA active current limit at lt 1 15mA for 1000V range SETTLING TIME lt 8ms to rated accuracy for 100V range lt 50ms to rated accuracy for 1000V range NOISE lt 150uV p p from 0 1Hz to 10Hz for 100V range lt 1 5mV p p from 0 1Hz to 10Hz for 1000V range TEMPERATURE THERMOCOUPLE ACCURACY 1 Year THERMOCOUPLE 18 28 C TYPE RANGE rdg C K 25 C to 150 C 0 3 1 5 C 1 Excluding pr
106. ing number can be reset to zero from the GENERAL MENU see paragraph 2 19 7 e UNIT The units of the reading e CH The channel number the reading was taken on e HUM Relative humidity reading if the Model 6517 RH is being used The humidity sensor is enabled from the A D CONTROLS item of the GENERAL MENU see paragraph 2 19 7 e ETEMP The external temperature reading if the Model 6517 TP is being used The humidity sensor is enabled from the A D CONTROLS item of the GEN ERAL MENU see paragraph 2 19 7 e TIME The real time or relative timestamp for each reading Timestamp type is selected from the TIMES TAMP item of the GENERAL MENU see paragraph 2 19 7 e STATUS The reading status information normal reading measurement overflow or underflow relative reading e VSRC The actual output level of the V Source RS 232 The RS 232 menu is used for the following operations e To select the RS 232 Interface To select the control mode send receive or talk only e To set the parameters for talk only e To set the parameters for the RS 232 interface baud rate number of data bits and stop bits and parity To select the data elements to send See Section 3 of this manual for details on using the instru ment over the RS 232 serial interface CONTROL Use this menu item to select one of the operat ing modes for the RS 232 Interface e SEND RECEIVE This is the normal operating mode fo
107. is restricted such as rack mounting a separate main input power dis connect device must be provided in close proximity to the equip ment and within easy reach of the operator For maximum safety do not touch the product test cables or any other instruments while power is applied to the circuit under test ALWAYS remove power from the entire test system and discharge any capacitors before connecting or disconnecting cables or jump ers installing or removing switching cards or making internal changes such as installing or removing jumpers Do not touch any object that could provide a current path to the com mon side of the circuit under test or power line earth ground Always make measurements with dry hands while standing on a dry insulated surface capable of withstanding the voltage being measured The instrument and accessories must be used in accordance with its specifications and operating instructions or the safety of the equip ment may be impaired Do not exceed the maximum signal levels of the instruments and ac cessories as defined in the specifications and operating informa tion and as shown on the instrument or test fixture panels or switching card When fuses are used in a product replace with same type and rating for continued protection against fire hazard Chassis connections must only be used as shield connections for measuring circuits NOT as safety earth ground connections If you are using a tes
108. is a barrel adapter that allows you to connect two triax cables together Both ends of the adapter are terminated with 3 lug female triax connectors 1 3 Front Panel Operation 2 1 introduction This section contains detailed information for front panel op eration of the Model 6517A It is organized as follows 2 2 Power up Covers information on connecting the in strument to line power warm up period default condi tions and the power up sequence 2 3 Display Covers display formats and messages as sociated with operation 2 4 Connections Electrometer input and voltage source output Provides basic information on the connections used for typical electrometer and high resistance meter measurements Summarizes guarding and shielding techniques and explains the potential hazards present ed by floating circuits Recommends cables and test fixtures that can be used and provides guidelines for building a test fixture 2 5 Voltage measurements Provides the basic proce dure to measure voltage Includes configuration infor mation and measurement considerations for the volts function 2 6 Current measurements Provides the basic proce dure to measure current Includes configuration infor mation and measurement considerations for the amps function 2 7 Resistance measurements Provides the basic pro cedures to perform resistance and resistivity measure ments Includes configuration information the
109. list y EXTernal lt n gt Specify external scan list 1 to 400 channels 10 EXTernal Query the external scan list LSELect lt name gt Select scan operation INTernal EXTernal or NONE NONE LSELect Query scan operation STIMe lt n gt Specify settling time for internal card 0 to 99999 9999 0 seconds STIMe Query settling time SMEThod lt name gt Select scan method for internal scan VOLTage or VOLTage CURRent SMEThod Query scan method VSLimit lt b gt Enable or disable 200V limit for internal card ON VSLimit Query state of 200V limit Table 3 10 SENSe command summary Default Command Description parameter SCPI Ref SENSe 1 3 19 1 FUNCtion lt name gt Select measurement function VOLTage DC VOLT DC V 3 19 2 CURRent DC RESistance CHARge FUNCtion Query function y DATA Path to returnreadings V 3 19 3 LATest Return the last instrument reading V FRESh Query fresh readings y 3 46 Table 3 10 Continued SENSe command summary IEEE 488 Reference Default Command Description parameter SCPI Ref VOLTage DC Path to configure volts V APERture lt n gt Set integration rate in seconds 166 67e 6 to 200e 3 Note 1 V 3 19 4 AUTO lt b gt Enable or disable auto aperture OFF AUTO ONCE Enable and then disable auto aperture AUTO Query auto aperture APERture Query aperture integration rate V NPLCycles lt n gt
110. lt day gt Set date for clock Parameters Query Description lt yr gt 1994 to 2093 Specify year lt mo gt to 12 Specify month lt day gt 1 to31 Specify day DATE Query the date This command is used to set the date for the real time clock Setting an invalid date i e Febru ary 30 1995 result in an error and the previous date is retained 3 22 9 TIME lt hr gt lt min gt lt seC gt SYSTem TIME lt hr gt lt min gt lt sec gt Set time for clock Parameters Query Description lt hr gt 0 to 23 Specify hour 24 hr format lt min gt 0 to 59 Specify minute lt sec gt 0 00 to 59 99 Specify second rounded to 1 100 sec TIME Query the time This command is used to set the time for the real time clock Note that the time must be set using the 24 hour format i e hour 13 is 1PM Setting an invalid time results in an error and the pre vious time is retained TIME returns the time to the nearest hundredth of a second 3 22 10 TSTamp commands Parameters Query Description 3 132 The following commands are used to configure and control the timestamp For more informa tion on timestamp see paragraphs 3 16 FORMat ELEMents and 3 23 7 TRACe TSTamp FOR Mat TYPE lt name gt SYSTem TSTamp TYPE lt name gt Select timestamp type lt name gt RELative Select relative time timestamp RTClock Select real time timestamp TYPE Query timestamp type This com
111. lt n gt SENSe 1 VOLTage DC RANGe AUTO ULIMit lt n gt Set upper limit for Volts SENSe 1 CURRent DC RANGe AUTO ULIMit lt n gt Set upper limit for Amps LLIMit lt n gt SENSe 1 VOLTage DC RANGe AUTO LLIMit_ lt n gt Set lower limit for Volts SENSe 1 CURRent DC RANGe AUTO LLIMit lt n gt Set lower limit for Amps 3 91 IEEE 488 Reference Parameters Query Description Parameters Query Description Ohms Ranges lt n gt Oto 210 Range limit for volts 0 to 21e 3 Range limit for amps DEFault 210 volts 21e 3 amps MINimum 0 volts and amps MAXimum Same as DEFault ULIMit Query upper range limit ULIMit DEFault Query RST default upper limit ULIMit MINimum Query lowest allowable upper limit ULIMit MAXimum Query largest allowable upper limit LLIMit Query lower range limit LLIMit DEFault Query RST default lower limit LLIMit MINimum Query lowest allowable lower limit LLIMit MAXimum Query largest allowable lower limit Automatic range changes slow down the reading rate By setting upper and lower measurement range limits you can prevent inadvertent range changes to ranges that you are not going to use The upper range limit is selected by specifying the maximum expected reading that you expect to measure For example if the maximum expected reading is approximately 1mA let the pa rameter lt n gt 0 001 or le 3 The lowest most sensitive range that can measure
112. meter input LO is connected to a noise or guard shield then the shock hazard will also be present on that shield Front Panel Operation HI 6517A Ry Voltmeter 200V R RR A R h A Voltage measurement 6517A Ry Ammeter ai R3 200V R H B Current measurement Figure 2 14 Floating measurements The V Source of the Model 6517A can also be operated above earth ground as shown in Figure 2 15 In this circuit the V Source is floating 100V above ground Thus a shock hazard 100V exists between V Source LO and chassis ground A shock hazard exists at a voltage level equal to or greater than 30V rms To avoid possible shock hazards al ways surround exposed floating circuits and shields with a safety shield as explained in paragraph 2 4 4 Safety Shield 2 14 WARNING The maximum voltage common mode between electrometer LO and chassis ground is 500V The maximum voltage between V Source LO and earth chas sis ground is 750V Exceeding these val ues may create a shock hazard WARNING When floating input LO above 30V from earth chassis ground hazardous volt age will be present at the analog outputs PREAMP OUTPUT and 2V ANALOG OUTPUT Hazardous voltage may also be present when the input voltage ex ceeds 30V in the volts function CAUTION Connecting PREAMP OUTPUT COM MON or 2V ANALOG OUTPUT to earth chassis ground while floating the input may damage the instrument
113. of 6 2 4 The actual true state high or low of each digital output line depends on its programmed polar ity Polarity is programmed from the OUTPut Subsystem see paragraph 3 17 Note that when the binning strobe is enabled see BSTRobe command path output line 4 is not considered to be part of the digital output pattern The binning strobe uses line 4 With the strobe enabled parameter values 8 through 15 are treated the same as parameters 0 through 7 3 69 IEEE 488 Reference Description Parameters Query Description Description Program fragment 3 70 CLIMits FAIL CALCulate3 CLIMits FAIL Read composite result of limit tests This query command is used to obtain the composite result of the LIMIT 1 and LIMIT 2 tests The composite result is the logical OR ed summary of LIMIT 1 and LIMIT 2 1 One or both tests have failed 0 Both tests have passed In the event of a failure 1 you can determine which test s has failed by using the fail com mand of each limit LIMit1 FAIL and LIMit2 FAIL This command like the other fail commands does not clear the fail indication for LIMIT 1 or LIMIT 2 BSTRobe STATe lt b gt CALCulate3 BSTRobe STATe lt b gt Control binning strobe lt b gt 1orON Enable binning strobe 0 or OFF Disable binning strobe STATe Query state of binning strobe This command is used to enable or disable the strobe for the binning operation When enabled di
114. of the Model 7001 7002 is set for Source the scan does not wait at point A for a trigger Instead it bypasses Wait for Trigger Link Trigger and pro ceeds to point B Note that this Bypass is in effect only on the first pass through the model Since Channel Trigger Source of the Model 7001 7002 is also set to Source the scan does not wait at point B for a trigger Instead it bypasses Wait for Trigger Link Trig ger and closes the first channel point C Note that the By pass is in effect only on the first pass through the model D After the relay settles the Model 7001 7002 outputs a Trigger Link trigger pulse point D Since the instrument is programmed to scan ten channels operation loops back up to point B where it waits for an input trigger Note that Bypass is no longer in effect The trigger pulse from the Model 7001 7002 triggers the Model 6517A to make a measurement of DUT 1 After the measurement is complete the electrometer outputs a Trigger Link trigger pulse point E The trigger applied to the Model 7001 7002 from the Model 6517A closes the next channel in the scan which in turn triggers the electrometer to measure the next DUT This process continues until all ten channels are scanned and measured After the last channel is scanned and measured oper ation proceeds to point F where the Model 7001 7002 out puts a trigger pulse Since the Model 7001 7002 is programmed to perform two scans
115. peak value of readings in buffer NONENo calculation FOR Mar Query programmed math format This command is used to specify the format for the CALC 2 math calculation The calculation operations for CALC 2 use data stored in the buffer With NONE selected no CALC 2 calculation will be performed With one of the other formats selected and CALC 2 enabled see STATe the calculation is performed every time the IMMe diate or MMediate command is executed Details on MEAN SDEV MAX and MIN are provided in paragraph 2 16 3 PKPK MAX MIN where MAX is the largest reading in the buffer MIN is the lowest reading in the buffer STATe lt b gt CALCulate2 STATe lt b gt Control CALC 2 lt b gt Oor OFF Disable CALC 2 calculation 1 or ONEnable CALC 2 calculation STATe Query state on or off of CALC 2 This command is used to enable or disable the CALC 2 calculation When enabled the selected CALC 2 format will be calculated when the MMediate or IMMediate command is executed IMMediate CALCulate2 IMMediate Perform CALC 2 IMMediate Perform calculation and read result equivalent to CALCulate2 MMediate DATA The MMediate command is used to perform the selected CALC 2 operation on the readings in the buffer assuming CALC 2 is enabled see STATe After performing the calculation the re sult can be read by using the CALCulate2 DATA query command 3 65 IEEE 488 Reference Program fragment
116. place the instrument in idle which by definition completes the initiate command Since continuous initiation is on operation continues on into the Trigger Model Af ter sending the TRG command an ASCII 1 is placed in the Output Queue and the MAN bit sets when the TRG command is finished After OPC is executed additional commands cannot be sent to the Model 6517A until the pending overlapped commands have finished For example INITiate CONTinuous ON fol lowed by OPC locks up the instrument and requires a device clear DCL or SDC before it will accept any more commands IEEE 488 Reference NOTE See OPC TRG and WAI for more information Program fragment PRINT 1 output 27 syst pres Select defaults PRINT 1 output 27 init cont off abort Place 6517A in idle PRINT 1 output 27 arm coun 1 Program for 5 measurements and stop idle PRINT 1 outpu PRINT 1 outpu 27 arm lay2 coun 1 27 trig coun 5 sour tim ct ct ct PRINT 1 output 27 init opc IT Start measurements and send oOpc PRINT 1 enter 27 IT Get response when 6517A goes into idle INE INPUT 2 a Read contents of Output Queue PRINT a Display the ASCII 1 3 11 7 OPT option identification query Determine which option s installed Description The response message provides the model number of the option installed in the option slot of the Model 6517A If
117. problem always use the shortest possible triax input cable and or use guarding 2 For current and resistance measurements the increased input capacitance caused by a long input cable can result in noisy readings To minimize this problem always use the shortest possible triax input cable and or enable damping see paragraphs 2 6 2 and 2 7 2 Damping will reduce the noise but it will also slow down the response time of the measurement Shielding and guarding The following information covers the basics on using noise shields guard shields and safety shields Noise shield A noise shield is used to prevent unwanted signals from being induced on the electrometer input Effec tive shielding encloses the device or circuit under test and ex tends to the electrometer input via a triax cable The generic connection for the noise shield is shown in Figure 2 11 which also summarizes the measurements that may benefit from it Metal Noise Shield eo gt Connect to 6517A LO chassis ground i l Device or or both via triax cable l Circuit Under Use Noise shield for 1 Unguarded voltage measurements 2 Unguarded current measurements ee below 14A 3 Low level charge measurements Figure 2 11 Noise shield Typically the noise shield is connected to electrometer input LO However sometimes better noise performance can be achieved by instead connecting the noise shield to both elec trometer LO and chassis ground
118. remote state Instead the instrument must be addressed to lis Tor ten after setting REN true before it goes into remote SLEEP S EE 8 8 i PRINT 1 abort Talker idle tate t EE Note that the instrument need not be in remote to be a talker Tat S ALK annunciator Program fragment PRINT 1 remote 27 Place 6517A in remote turn on REM annunciator Note that all front panel controls except for LOCAL and POWER are inoperative while the instrument is in remote You can restore normal front panel operation by pressing the LOCAL key Table 3 1 General bus commands and associated statements Command Programming statement Effect on Model 6517 REN REMOTE 27 Goes into effect when next addressed to listen IFC ABORT Goes into talker and listener idle states LLO LOCAL LOCKOUT LOCAL key locked out GTL LOCAL 27 Cancel remote restore front panel operation for 6517A LOCAL Cancel remote restore front panel operation for all devices DCL CLEAR Returns all devices to known conditions SDC CLEAR 27 Returns Model 6517A to known conditions GET TRIGGER 27 Initiates a trigger SPE SPD SPOLL 27 Serial Polls the Model 6517A 3 5 IEEE 488 Reference 3 6 3 LLO local lockout The LLO command is used to prevent local operation of the instrument After the unit receives LLO all its front panel controls except POWER are inoperative In this state press ing LOCAL will not restore control to the front panel The GTL c
119. send the uniline commands ATN Attention The ATN line is one of the more impor tant management lines in that the state of this line determines how information on the data bus is to be interpreted IFC Interface Clear As the name implies the IFC line controls clearing of instruments from the bus REN Remote Enable The REN line is used to place the instrument on the bus in the remote mode EOI End or Identify The EOI is usually used to mark the end of a multi byte data transfer sequence SRQ Service Request This line is used by devices when they require service from the controller Handshake lines The bus handshake lines operate in an interlocked sequence This method ensures reliable data transmission regardless of the transfer rate Generally data transfer will occur at a rate determined by the slowest active device on the bus One of the three handshake lines is controlled by the source the talker sending information while the remaining two lines are controlled by accepting devices the listener or lis teners receiving the information The three handshake lines are DAV DATA VALID The source controls the state of the DAV line to indicate to any listening devices whether or not data bus information is valid NRED Not Ready For Data The acceptor controls the state of NRFD It is used to signal to the transmitting device to hold off the byte transfer sequence until the accepting de
120. sets when the trace buffer is no longer full For details on register structure see para graph 3 8 The NTR registers are shown in Figures 3 34B through 3 39B Included is the decimal weight of each bit The sum of the decimal weights of the bits that you wish to set is the parameter lt NRf gt that is sent with the command For example to program RAV B5 and BFL B9 mea surement events for negative transitions send the following command stat meas ntr 544 where BFL bit B9 Decimal 512 RAV bit B5 Decimal 32 lt NRf gt 544 IEEE 488 Reference Effects of negative transitions on the Measurement Event Register Measurement event Negative transition effect on Measurement Event Register Reading overflow Low limit 1 High limit 1 Low limit 2 High limit 2 Reading available Reading Underflow Buffer available Buffer half full Buffer full Sequence reading available Buffer pretriggered Out of Limits Error Fixture lid closed V source compliance Sets BO when a reading has gone from overflow to normal Sets B1 when the reading is no longer less than the low limit 1 setting Sets B2 when the reading is no longer greater than the low limit 1 setting Sets B3 when the reading is no longer less than the low limit 2 setting Sets B4 when the reading is no longer greater than the high limit 2 setting Sets B5 when the next reading is being taken Sets B6 when the reading underflow condition has
121. that the charge you are measuring is reading exactly 1 00000uC on the 2uC range From the specs Accuracy 0 4 of 1uC 5 counts 0 004uC 5 counts 0 004uC 0 00005uC 0 00405 uC Note 5 counts on the 2uC range equals 0 00005uC Thus the accuracy range for the 1 00000uC reading is 0 99595uC to 1 00405uC A 1 5 Calculating Resistance Resistivity Accuracy and Repeatability using the Alternating Polarity Method From the specifications accuracy and repeatability when using a Model 8002A or 8009 test fixture are calculated as follows Repeatability Algg Xx R Varr 0 1 10 instrument temp constant 1 C Accuracy VepcErr ImgasErr X R Vapr where e Alpe is a measured typical background cur rent noise from the sample and fixture over the measurement time programmed under normal measurement conditions 1 PLC same range filters off etc e Varis the alternating polarity voltage used e VsrcErr is the accuracy in volts of the volt age source using Va 7 as the setting e IweaseEtr is the accuracy in amps of the am meter using Vay7 R as the reading The following example shows how to calculate accuracy and repeatability for a 10 3 ohms sample measured in a Model 8009 test fixture with 50V stimulus and a background current of 4pA The user selected measurement time for the Alternat ing Polarity measurement is 15 seconds Algg is measured with no voltage applied under normal mea sure
122. the programmed V Source level to the test fixture 4 Select the lowest possible measurement range to display the current reading This reading is the leakage current in the test fixture 5 Press REL to zero the reading This cancels the leakage current reading 6 Press OPER to place the V Source in standby and enable zero check 7 Perform the following steps to establish the amps REL value for the ohms function A Press CONFIG and then R to display the CONFIG URE OHMS menu B Select the AMPSREL menu item C Select YES to establish the amps REL value D Use the EXIT key to back out of the menu structure 8 Re install the DUT in the test fixture 9 Select the ohms function R and proceed to step 8 of the resistance measurement procedure 2 7 2 Resistivity measurements The Model 6517A can make surface resistivity measure ments from 10 to 10 ohms and volume resistivity mea surements from 10 to 10 8 ohm cm Typical resistivity test fixtures such as the Model 8009 use circular electrodes In order to use these test fixtures the in sulator sample must be large enough such that all the surfac es of the electrodes make contact with the sample 2 36 NOTE When using the Model 8009 test fixture you do not have to make any calculations For volume resistivity you only need to know the thickness in mm of the sam ple The Model 6517A will automatically perform the calculation and display the reading
123. the se quence to ensure that no other active listeners are present Note that ATN is true for both the listen command and the SDC command byte itself Table D 4 gives a typical common command sequence In this instance ATN is true while the instrument is being ad dressed but it is set high while sending the common com mand string IEEE command groups Command groups supported by the Model 6517A are listed in Table D 5 Common commands and SCPI commands are not included in this list Table D 5 IEEE command groups HANDSHAKE COMMAND GROUP NDAC NOT DATA ACCEPTED NRFD NOT READY FOR DATA DAV DATA VALID UNIVERSAL COMMAND GROUP ATN ATTENTION DCL DEVICE CLEAR IFC INTERFACE CLEAR REN REMOTE ENABLE SPD SERIAL POLL DISABLE SPE SERIAL POLL ENABLE ADDRESS COMMAND GROUP LISTEN LAG LISTEN ADDRESS GROUP MLA MY LISTEN ADDRESS UNL UNLISTEN TALK TAG TALK ADDRESS GROUP MTA MY TALK ADDRESS UNT UNTALK OTA OTHER TALK ADDRESS ADDRESSED COMMAND GROUP D 8 Table D 5 IEEE command groups ACG ADDRESSED COMMAND GROUP GTL GO TO LOCAL SDC SELECTIVE DEVICE CLEAR STATUS COMMAND GROUP RQS REQUEST SERVICE SRQ SERIAL POLL REQUEST STB STATUS BYTE EOI END IEEE 488 Conformance Information Information The IEEE 488 2 standard requires specific information about how the Model 6517A implements the standard Paragraph 4 9 of the IEEE 488 2 stan
124. the test would start when the single scan mode is selected and initiated Asynchronous Trigger Link example 2 In this example the test system Figure 2 68 includes a Model 6517A to measure each DUT at two different current levels that are provided by a Model 220 current source With the source set to the first current level the ten channels are scanned and measured The source is then set to the second current level and the ten channels are again scanned and measured Since this example uses an instrument that does not have Trigger Link Model 220 the Model 8502 Trigger Link Adapter is required Connections are shown in Figure 2 69 For this example the Model 220 is programmed for External Triggering and is set to source the first current level The Models 6517A and 7001 7002 are configured as follows 2 87 Front Panel Operation Trigger Link Cable 8501 1 8502 Trigger Link Adapter 5 o BNC to BNC inn Channel Cables 2 Ready 7501 Ir e External Trigger Model 6517A Bo 7002 Scanner Figure 2 67 Connections using Trigger Link adapter ie o bur 4 7 1 1 o O OUTPUT i DUT t EE 2 Le o o e e 7 ie pe ae rene l aw 1 10 220 Current Source 10 Le oo Model 6517A i Card 1 7158 MUX Card Figure 2 68 DUT test system asynchronous example 2 2 88
125. the trace buffer pretrigger event has occurred PTR or the operations associated with the pretrigger have been completed NTR Bit B12 Out of Limits OL Set bit indicates that signal transients i e noise spikes exceed the range limit PTR See paragraph 2 3 2 Range Messages for more information Bit B13 Fixture Lid Closed Set bit indicates that a fixture using the interlock cable is closed If no interlock cable is connected to the 6517A bit is also set If the interlock cable is connected to the 6517A but not to the fixture bit is not set PTR Bit B14 VSC Set bit indicates that the V source is in compliance PTR Bit B15 Always zero Bit Position B15 B14 B13 B12 B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 BO Event VSC FLC OL BPT SRA BFL BHF BAV RUF RAV HL2 LL2 HL1 LL1 ROF Decimal Weighting 16384 8192 4096 2048 1024 512 256 128 256 32 16 8 4 2 1 214 213 212 ew 210 9 28 27 26 25 9 3 3 2 29 Value 0 0 1 O 1 O 1 O 1 1 o1 1 1 1 1 1 1 1 0 1 oi Value 1 Measurement Event Set Events VSC V Source Compliance 0 Measurement Event Cleared FLC Fixture Lid Closed OL Out of Limits BPT Buffer Pretriggered SRA Sequence Reading Available BFL Buffer Full BHF Buffer Half Full BAV Buffer Available RUF Rea
126. the voltage on the in put may be significantly larger than the displayed value For example if a 150V rel value is stored an applied voltage of 175V will result in a displayed value of only 25V Multiple display of rel One of the multiple displays allows you to view the read ing without rel applied on the bottom line of the display and the rel d reading on the top line The display is available by repeatedly pressing either the NEXT or PREVious DIS PLAY key to scroll through the multiple displays of the par ticular function The following is a typical message for a rel multiple display 000 012 mA Actual 001 012 without REL 2 59 Front Panel Operation 2 13 3 Zero correct The Z CHK and REL keys work together to cancel zero cor rect any internal offsets that might upset accuracy for volts and amps measurements Perform the following steps to zero correct the volts or amps function 1 Select the V or I function 2 Enable Zero Check 3 Select the range that will be used for the measurement or select the lowest range 4 Press REL to zero correct the instrument REL indicator light on and ZCor displayed 5 Press Z CHK to disable zero check 6 Readings can now be taken in the normal manner Note that the instrument will remain zeroed even if the in strument is upranged If downranged re zero the instrument To disable zero correct press REL with zero check enabled 2 14 Test sequence
127. there is no option installed then a zero 0 will be returned 3 11 8 RCL recall Return to a setup stored in memory Parameters lt NRf gt 0 to 9 Specify memory location This command is used to return the Model 6517A to a setup configuration stored at a memory location The SAV command is used to store a setup configuration at a memory location see paragraph 3 11 10 The Model 6517A is shipped from the factory with SYSTem PRESet defaults loaded into the available setup memories If a recall error occurs the setup memories default to the SYS Tem PRESet values 3 11 9 RST reset the Model 6517A Description When the RST command is sent the Model 6517A performs the following operations 1 Returns the Model 6517A to the RST default conditions see SCPI tables 2 Cancels all pending commands 3 Cancels response to any previously received OPC and OPC commands 3 11 10 SAV save the current setup in memory Parameters lt NRf gt 0to9 Specify memory location The SAV command is used to save the current instrument setup configuration in memory for later recall Any control affected by RST can be saved by the SAV command The RCL com mand is used to restore the instrument to a saved setup configuration IEEE 488 Reference 3 11 11 SRE lt NRf gt service request enable Program Service Request Enable Register SRE service request enable query Read Service Request Enable Register lt NRf gt
128. these display messages see paragraph 2 3 2 For the ohms function each measurement range has a lower reading limit that is one decade below the selected range For example the 20MQ range has a lower reading limit of 2MQ Measuring a device that is less than 2MQ will cause the UN DERFLOW message to be displayed See paragraphs 2 3 2 and 2 7 Ohms Ranges for more information With AUTO range selected the instrument will automatical ly go to the most sensitive optimum range to make the mea surement Note that with AUTO range selected for the ohms function the instrument cannot go to the 2TQ 20TQ or 200TQ ranges since a hazardous voltage level 400V may be selected by the instrument You must select these ohms ranges manually For the amps ohms and coulombs function you can set au torange limits to speed up the autoranging process Setting limits eliminates upper and or lower ranges from the autor ange search This speeds up the measurement process These limits are set from the AUTORANGE option of the appropri ate function configuration menu 2 12 2 Display resolution The Model 6517A can display readings at 3 5 4 5 5 5 or 6 5 digit resolution The display resolution of a reading depends on the selected resolution setting fixed or auto The default display resolution for every function is 5 5 digits Table 2 18 summarizes the relationship between speed SET B Y RSLN setting and the selected resolution setting With auto
129. these seven status register sets feed directly or indirectly into the Status Byte Register More detailed illustrations of these register sets are provided by Figures 3 6 through 3 12 3 7 IEEE 488 Reference r SL SL SL SI o1z statt K st H sl SL SL z stet SL SL SL S1 me shemiy k vt OH ri Di D k Di Di Di Di D D D D k EL EL EL L EI CT EL Di SL L L Di fal ZL ZL Z
130. to chassis ground Thus DO NOT insulate the outer shell of the triax connector from the metal chassis of the test fixture DUT and test circuits are to be mounted on the guard plate using insulated terminals To minimize leakage select termi nals that use virgin Teflon insulators Inside the chassis of the test fixture you may use coaxial ca ble to extend guard from the triax connector to the DUT The shield guard of the cable should extend as far as possible to the DUT Interlock When a normally open SPST momentary switch is properly implemented as a safety interlock the V Source will go into standby whenever the test fixture lid is open or ajar See para graph 2 9 4 for more information on the interlock feature of the Model 6517A NOTE An Interlock Violation Error message will be displayed when the interlock is open The switch must be mounted inside the test box such that it will be closed when the lid of the test fixture is closed Open ing the lid must cause the interlock switch to open There must never be enough clearance to allow finger access inside the box while the switch is closed The interlock must be de signed so that it cannot be defeated By using an appropriate bulkhead connector on the test fix ture the Keithley Model 6517 ILC 3 Interlock cable can be used to connect the interlock switch to the Model 6517A see Figure 2 18A The connector needed is shown in Figure 2 18C Figure 2 18B shows t
131. to configure measurement range V 3 19 6 UPPer lt n gt Select range 0 to 21e 3 20e 3 V UPPer Query range v AUTO lt b gt Enable or disable auto range Note 4 V AUTO ONCE Set range based on present input signal V ULIMit lt n gt Set upper limit for auto range 0 to 21e 3 20e 3 ULIMit Query upper limit LLIMit lt n gt Set lower limit for auto range 0 to 21e 3 2 e 12 LLIMit Query lower limit AUTO Query auto range V REFerence lt n gt Specify reference 21e 3 to 21e 3 0 V 3 19 7 STATe lt b gt Enable or disable reference OFF V STATe Query state of reference V ACQuire Use input signal as reference REFerence Query reference value V DIGits lt n gt Specify measurement resolution 4 to 7 6 3 19 9 AUTO lt b gt Enable or disable auto resolution AUTO ONCE Enable and then disable auto resolution AUTO Query auto resolution DIGits Query resolution AVERage Path to control the average filter 3 19 10 TYPE lt name gt Select filter type NONE SCALar ADVanced SCALar TYPE Query filter type TCONtrol lt name gt Select filter type MOVing or REPeat Note 3 TCONtrol Query filter type COUNt lt n gt Specify filter count 1 to 100 10 COUNt Query filter count ADVanced Path to configure and control advanced filter NTOLerance lt n gt Specify noise tolerance level 0 to 100 1 NTOLerance Query noise tolerance level STATe lt b gt Enable or disable digital filter O
132. trigger model down to the device action where a measurement occurs Control Sources In general each layer contains a control source which holds up operation until the programmed event occurs The control sources are described as follows e Immediate With this control source selected event detection is immediately satisfied allowing operation to continue e Manual Event detection is satisfied by pressing the TRIG key Note that the Model 6517A must be taken out of remote before it will respond to the TRIG key Pressing LOCAL takes the instrument out of remote e GPIB Event detection is satisfied when a bus trigger GET or TRG is received by the Model 6517A e RT Clock Event detection in the Arm Layer is satis fied when the programmed time and date occurs The real time clock control source is not available in the Scan Layer and Measure Layer Front Panel Operation e Timer Event detection is immediately satisfied on the initial pass through the layer Each subsequent de tection is satisfied when the programmed timer interval 1 to 999999 999 seconds elapses A timer resets to its initial state when operation loops back to a higher layer or idle Note that a timer is not available in the Arm Layer e External Event detection is satisfied when an input trigger via the EXTERNAL TRIGGER connector is re ceived by the Model 6517A e Triglink Event detection is satisfied when an input trigger
133. two instruments Models 182 428 486 487 2001 2002 6517 6517A 7001 side by side in a standard 19 inch rack Model 4288 3 Side by side Rack Mount Kit Mounts a Model 6517A and a Model 199 side by side in a standard 19 inch rack Model 4288 4 Side by side Rack Mount Kit Mounts a Model 6517A and a 54 inch instrument Models 195A 196 220 224 230 263 595 614 617 705 740 775 etc side by side in a standard 19 inch rack Model 5156 Electrometer Calibration Standard Set This calibration fixture contains standardized resistors and capac itors needed to calibrate the Model 6517A Model 6517 ILC 3 Safety Interlock Cable Designed to connect the lid interlock circuit of the Model 8009 test fix ture to the interlock circuit of the Model 6517A Model 6517 RH Humidity Probe with Cable This sensor allows the Model 6517A to make relative humidity measure ments 0 to 100 Also included is an extension cable part number CA 129 1 Model 6517 TP Thermocouple with Leads This type K thermocouple sensor allows the Model 6517A to make exter nal temperature measurements from 190 C to 1350 C Model 6521 Low Current Scanner Card This 10 channel low current scanner card is terminated with BNC connectors and plugs into the option slot of the Model 6517A Model 6522 Low Current Low Voltage Scanner Card This 10 channel low current low voltage scanner card is ter minated with triax connectors and plugs into the option slot
134. until the beginning of the next power line cycle For example if a reading is triggered at the positive peak of a power line cycle the integration period will not start until that power line cycle is completed The integration period starts when the positive going sine wave crosses zero volts See paragraph 2 12 8 for more details AUTO lt b gt I ONCE SENSe 1 VOLTage DC APERture AUTO lt b gt IONCE Control auto aperture volts SENSe 1 CURRent DC APERture AUTO lt b gt IONCE Control auto aperture amps SENSe 1 RESistance APERture AUTO lt b gt IONCE Control auto aperture ohms SENSe 1 CHARge APERture AUTO lt b gt IONCE Control auto aperture coulombs lt b gt 1 or ONEnable auto aperture 0 or OFF Disable auto aperture ONCE Enable and then disable auto aperture AUTO Query state of auto aperture These commands are used to enable or disable auto aperture for the specified measurement function With auto aperture enabled the instrument automatically optimizes the aperture value for the present resolution setting This is the same as selecting SET BY RSLN from the front panel Table 2 17 provides the integration times for SET BY RSLN AUTO Note that the times are provided as NPLC values To convert to aperture times use the formula in paragraph 3 19 4 The ONCE parameter is analogous to a momentary toggle switch When AUTO ONCE is sent auto aperture turns on momentarily and then disables While enabled it automa
135. using shielded cable The shield should always be connected to a solid connector that is connected to signal low If circuit low is floated above ground observe safety pre cautions and avoid touching the shield Meshed screen or loosely braided cable could be inadequate for high impedances or in string fields Note however that shielding can increase capacitance in the measuring cir cuit possibly slowing down response time 2 Reduction of electrostatic fields Moving power lines or other sources away from the experiment reduces the amount of electrostatic interference seen in the measure ment 2 21 8 Magnetic fields A magnetic field passing through a loop in a test circuit will generate a magnetic EMF voltage that is proportional to the strength of the field the loop area and the rate at which these factors are changing Magnetic fields can be minimized by following these guidelines e Locate the test circuit as far away as possible from such magnetic field sources as motors transformers and magnets e Avoid moving any part of the test circuit within the magnetic field e Minimize the loop area by keeping leads as short as possible and twisting them together 2 21 9 Electromagnetic interference EMI The electromagnetic interference characteristics of the Mod el 6517A Electrometer High Resistance Meter comply with the electromagnetic compatibility EMC requirements of the European Union as denoted by the CE mark
136. via the TRIGGER LINK is received by the Mod el 6517A e Hold With this selection event detection is not satis fied by any of the above control source events and oper ation is held up Source Bypasses As can be seen in the flowchart each layer has a path that allows operation to loop around the con trol source Each path is called a source bypass When a source bypass is enabled and the external or trigger link triglink control source is selected operation loops around the control source on the initial pass through the lay er If programmed for another event detection in the layer the bypass loop will not be in effect though it is still enabled The bypass loop resets be in effect if operation loops back to a higher layer or idle In the Arm Layer and Scan Layer enabling a source bypass also enables the respective output trigger In the Trigger Lay er its output trigger is always enabled and occurs after every device action See Output Triggers for more information Delays The Scan Layer and the Measure Layer have a programmable delay 0 to 999999 999 seconds that is en forced after an event detection Device Action The primary device action is a measure ment However the device action could include a function change and a channel scan if scanner is enabled A channel is scanned closed before a measurement is made When scanning internal channels the previous channel opens and the next channel
137. with Measure Source set to 2 84 TRIGLINK and Trigger link mode set to ASYNCHRO NOUS You must also select input and output lines for the measure layer Input and output triggers can be set to any of the six lines but they cannot use the same line For example if you select line 1 for input triggers then output triggers must use one of the other five lines 2 through 6 During operation in the measure layer each Trigger Link in put trigger makes a measurement After the user pro grammed DELAY and the measurement settling time the Model 6517A outputs a Trigger Link completion pulse typ ically to a scanner to close the next channel The measure layer is configured using he CONFIGURE TRIGGER menu see paragraph 2 15 3 The scan layer and or arm layer can also be programmed for Trigger Link where Scan Source is set to TRIGLINK and Arm Source is set to TRIGLINK When using Trigger Link in these layers you must also select input and output lines as you did in the measure layer Keep in mind that you can use the same lines in the scan and arm layers as selected in the measure layer Asynchronous Trigger Link example 1 In a typical test system you may want to close a channel and then measure the DUT connected to the channel with a meter Such a test system is shown in Figure 2 64 which uses a Model 6517A Electrometer to measure ten DUTs switched by a Model 7158 multiplexer card in a Model 7001 7002 Switch System The Tr
138. 0 Clears enable register 1 Set MSB bit Bit 0 4 Set EAV bit Bit 2 8 Set QSB bit Bit 3 16 Set MAV bit Bit 4 32 Set ESB bit Bit 5 128 Set OSB bit Bit 7 255 Sets all bits The SRE command is used to program the Service Request Enable Register This command is sent with the decimal equivalent of the binary value that determines the desired state 0 or 1 of each bit in the register This register is cleared on power up This enable register is used along with the Status Byte Register to generate service requests SRQ With a bit in the Service Request Enable Register set an SRQ occurs when the corre sponding bit in the Status Byte Register is set by an appropriate event For details on register structure refer to paragraph 3 8 The Service Request Enable Register is shown in Figure 3 17 Notice that the decimal weight of each bit is included in the illustration The sum of the decimal weights of the bits that you wish to set is the value that is sent with the SRE command For example to set the ESB and MAN bits of the Service Request Enable Register send the following command SSE 34 where ESB bit B5 Decimal 32 MAN bit B4 Decimal 16 lt NRf gt 48 The contents of the Service Request Enable Register can be read using the SRE query com mand Bit Position B7 Bo B5 B4 B3 B2 B1 BO Event OSB ESB MAV QSB EAV Decimal Weighting 128 32 16 8 4 27 25 2
139. 1 indicates that the test has failed 3 11 15 WAI wait to continue Prevent the execution of commands until all previous commands are completed Description There are two types of device commands Sequential commands and Overlapped commands A Sequential command is a command whose operations are allowed to finish before the next com mand is executed An Overlapped command is a command that allows the execution of subse quent commands while device operations of the Overlapped command are still in progress The WAI command is used to hold off the execution of subsequent commands until the device op erations of all previous Overlapped commands are finished The WAI command is not needed for Sequential commands There are three Overlapped commands in the Model 6517A INITiate INITiate CONTinuous ON and TRG NOTE See OPC OPC and TRG for more information The INITiate commands take the Model 6517A out of the idle state The device operations of INITiate are not considered complete until the Model 6517A goes back into idle By sending Program fragment IEEE 488 Reference the WAI command after the INITiate command all subsequent commands will not execute until the Model 6517A goes back into idle The TRG command issues a bus trigger which could be used to provide the arm scan and mea sure events for the Trigger Model By sending the WAI command after the TRG command subsequent commands will not be executed
140. 17A V Source Ammeter LO LO B Equivalent Circuit Figure 2 47 Connections diode leakage current test Test Parameters Volts ow gt 4 Start V 1V Stop V 10V Step V 1V 3 A Delay 1 sec 2 A i Measurement A T T T T T T T T Delay in seconds Figure 2 48 Default measurement points diode leakage current test 2 61 Front Panel Operation 7078 TRX Cable HI 6517A WAFINING no INTERNAL OP SSEFVICE BY OL Capacitor DUT Resistor Q Note Ammeter LO internally connected to V Source LO See Paragraph 2 9 1 A Connections pS z g ary l I HI HI 6517A 6517A V Source e Ammeter LO LO B Equivalent Circuit Figure 2 49 Connections capacitor leakage current test Cable insulation resistance test This test is used to measure the insulation resistance of a ca ble Figure 2 50 shows the connections for this test The re sistance of the insulator between the shield and the inner conductor is being measured The cable sample should be kept as short as possible to minimize input capacitance to the ammeter For this test a fixed voltage BIAS V is applied across the in sulator for a specified time to allow the charging effects of cable capacitance to stabilize The resistance is then mea sured and stored in the buffer This test is selected and con
141. 2 B1 Seq1 B15 B14 B2 B1 Bo Register o A amp Seq B15 B14 B2 In Bo Enable Register Seq 1 Sequence 1 Set bit indicates that the 6517A is in the trigger layer of Sequence 1 amp Logical AND OR Logical OR PTR Positive Transition Register NTR Negative Transition Register IEEE 488 Reference Zero VSC FLC OL BPT SRA BFL BHF BAV RUF RAV HL2 LL2 HL1 LL1 ROF e B15 B14 B13 B12 B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 BO Condition Register Always BPT BFL BHF BAV RUF RAV HL2 LL2 HL1 LL1 ROF PTR Measurement Zero vSC FLC OL SRA B15 B14 B13 B12 B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 BO NTR Transition Filter 0 Y Y y y Y y y Y y y y y y Y Y y Always Zero VSC FLC OL BPT SRA BFL BHF BAV RUF RAV HL2 LL2 HL1 LL1 ROF Measurement Event B15 B14 B13 B12 B11 B10 B9 B8 B7 Be B5 B4 B3 B2 B1 Bo Register or T Le n E amp To Measurement Summary Bit
142. 2 14 2 for details 6517A WARNING no INTERNAL INPU 250V PEAK Cable Sa Center Insulator a Conductor A Conne Cable 6517A Resistan V Source ___ B Equivale Figure 2 50 Connections cable insulation resistance test Note Ammeter LO internally connected to V Source LO See Paragraph 2 9 1 ctions ce 6517A Ammeter nt Circuit 2 63 Front Panel Operation 6517A 7078 TRX HI Cable INPUT 250V PEAK Note Ammeter LO internally connected to V source LO see paragraph 2 9 1 A Connections Shield Ener a d 6517A TC V Source Bas Ee 6517A Ammeter B Equivalent Circuit Figure 2 51 Test circuit resistor voltage coefficient test Standard Method Resistivity tests Surface and Volume This test is used to measure the resistivity surface or vol ume of an insulator sample When used with the Model 8009 Resistivity Test Fixture the test conforms to the ASTM D 257 standard For detailed information on resistivity mea surements refer to paragraph 2 7 2 Figures 2 33 and 2 35 show the test circuits for the respective measurement and Figure 2 36 shows the connections to the Model 8009 Refer to the instruction manual for the Model 8009 to install the in sulator sample in the test fixture When this test is run the V Source will initially be set to source OV for a specified time PRE DISCH tim
143. 2 interface and the CECHP driver demonstrates how se rial poll can be used to detect an SRQ CLS OPEN ieee FOR OUTPUT AS 1 OPEN ieee FOR INPUT AS 2 PRINT 1 output 27 cls Clear Status Byte Register PRINT 1 output 27 ese 32 Unmask command errors PRINT 1 output 27 sre 32 Unmask event sum mary message PRINT 1 output 27 ese Error missing parameter SLEEP 1 PRINT 1 SPOLL 27 Serial poll 6517A INPUT 2 S Read Status Byte Register S S OR 191 OR register with a mask IF S 255 THEN GOSUB srq Go to subroutine to acknowledge SRQ END IF PRINT END srq PRINT SRO Has Occurred ROS bit B6 is set 1 RETURN IEEE 488 Reference 3 9 Trigger Model IEEE 488 operation The following information describes the operation process of the Model 6517A over the IEEE 488 bus The flowchart in Figure 3 14 which summarizes operation over the bus is called the Trigger model It is called the trigger model be cause operation is controlled by SCPI commands from the Trigger subsystem see paragraph 3 23 Notice that key SCPI commands are included in the trigger model Idle and initiate The instrument is considered to be in the idle state whenever it is not operating within one of the layers of the trigger mod el The front panel ARM indicator is off when the instrument is in the idle state Wh
144. 21 29 28 27 26 25 24 21 20 Value 0 1 1 1 1 1 v1 1 1 1 1 OI Value 1 Enable Negative Transition 0 Disable Negative Transition Events Warn Command Warning Cal Calibration Summary Seq Sequence Test Summary Temp Temperature Summary Coul Coulombs Summary Amp Amps Summary Hum Humidity Summary Volt Volts Summary B Negative Transition NTR Filter Figure 3 35 Questionable Transition Filter 3 119 IEEE 488 Reference Effects of positive transitions on the Operation Event Register Positive transition effect on Operation event Operation Event Register Calibrating Sets BO at the start of calibration Trigger layer Sets B5 when waiting in the Trigger Layer Arm layer Sets B6 when waiting in an arm layer Calculating Sets BO when a reading is being calculated Idle Sets B10 when entering the idle state Sequence Test Running Sets B11 when a sequence test is running Bit Position B15 B12 B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 BO Event Seq Idle Calc Arm Trig Cal Decimal Weighting 2048 1024 512 64 32 pr e eg 1 1011 210 29 26 25 20 Value mm lo loa li 1 on Ton ll 1 om Value 1 Enable Positive Transition 0 Disable Positive Transition
145. 24 2 3 142 The Trigger subsystem is made up of a series of commands and subsystems to configure the three layers of the Trigger Model see paragraph 2 7 and 3 9 for details These commands and subsystems are summarized in Table 3 15 INITiate commands Description Parameters Query Description Parameters Query Description ABORt IMMediate INITiate IMMediate Take 6517A out of idle This command takes the Model 6517A out of the idle state After all programmed operations are completed the instrument leaves the trigger layers and returns to the idle state if continuous ini tiation is disabled see next command CONTinuous lt b gt INITiate CONTinuous lt b gt Control continuous initiation lt b gt Oor OFF Disable continuous initiation 1 or ON Enable continuous initiation CONTinuous Query continuous initiation When continuous initiation is selected ON the instrument is taken out of the idle state At the conclusion of all programmed operations the instrument returns to Arm Layer 1 POFLag lt name gt INITiate POFLag lt name gt Control No Operation Pending flag lt name gt INCLude Include No Operation Pending flag EXCLude Exclude No Operation Pending flag POFLag Query Pending Operation Flag status This command is used to include or exclude the No Operation Pending flag in the internal pro cess of determining whether all pending operations of an initiate command are complete
146. 3 General Information reel le e n PAETE eau daisesis sesessnupasnsavcebuesnann ss dave capsbasevecadinnn AE EE E E e Beater haen Ee eege eene eg dee Edel Warranty WLOrMatOn s cssccssacisessssasessresscascescecasnsceacobanesbeaecsnves EEE EREE EEK EEES SRE SEE EE ERO eE ERE ER EEE ER EEEE E eied Mangal addenda cscs sss eutaegesgagSe erseagi att cucadobans DREES SE EEEE Safety Symbols Gul terns s sceccsccsssessincesesessansveasteanenynnsnsasbasnnoasibsaecesabeveaovesvsessisvessdenure bnasssisbeunssenpaSbnanssucessereaeal e EE rn E Optons and ACCESSOMES EE Front Panel Operation TPO IDTE E NS E EH Cime power connec NONS erreneren o E a AE D Line EE E oasia aiiai ia iaie oie Power p E Power on default conditions sssi iesene eeuna na E ae hae NE EEE eaaa E a ease poa Warm Up Period orare E E Bes TEEE 488 primary e nna a o ob las a a e a D MUS EE EE Exponent mode Engineering or Scientific hn Information E GD Status And Srror Mes SAGeS iiss sick sete cesecsecessececeschuaedesegsbeas AER cade castesseeb EEE E ENES aaoi Multiple GAS EE Navigatie E EE Connections electrometer high resistance meter and N soumce cee Electrometer input CONNECIOR E adds Mees cuadl aaeevicueactescspart High resistance Meter connections ceeseeececseceeseceeecessecestecaeeesseeeceecaeeeeaeceeeesaeceaeeceaeeeneeeeneeaeeeaaeesaes i Voltage source output connections ssssesssssssessrssreseesstestesstsstesstsstesresseserestrseseesete
147. 4 23 22 Value o 1 0 1 o oa oa On Value 1 Enable Service Request Events OSB Operation Summary Bit ent ESB Event Summary Bit 0 Disable Mask Service MAV Message Available Request Event QSB Questionable Summary Bit EAV Error Available MSB Measurement Summary Bit Figure 3 17 Service Request Enable Register IEEE 488 Reference 3 11 12 STB status byte query Read the Status Byte Register Description The STB query command is used to acquire the value in decimal of the Status Byte Register The Status Byte Register is shown in Figure 3 18 The binary equivalent of the decimal value determines which bits in the register are set All bits except Bit 6 in this register are set by other event registers and queues Bit 6 sets when one or more enabled conditions occur The STB query command does not clear the status byte register This register can only be cleared by clearing the related registers and queues Register and queue structure are explained in paragraph 3 8 For example for an acquired decimal value of 48 the binary equivalent is 00110000 This bi nary value indicates that Bits 4 and 5 of the Status Byte Register are set Bit Position B7 B6 B5 B4 B3 B2 B1 BO MSS Event OSB RQS ESB MAV QSB EAV MSB Decimal Weighting 128 64 32 16 8 4 1 27 26 25 24 23 22 29 Value on o 1 o1 o
148. 4 1 l Specifications apply immediately after charge acquisition Add IQay 4fA T 4fA RE TA where T4 period of time in seconds between the coulombs zero and measurement Qay average charge measured over T4 and RC 300 000 typical 2 When properly zeroed 5 2 digit 1 PLC power line cycle median filter on digital filter 10 readings INPUT BIAS CURRENT lt 4fA at Tat Temperature coefficient 0 5fA C Specifications A 3 OHMS Normal Method TEMPERATURE ACCURACY COEFFICIENT 5 DIGIT 10 100 Range 10 100 Range RESO 18 28 C 1Yr 0 18 C amp 28 50 C AUTO AMPS RANGE LUTION rdg counts rdg counts V SOURCE RANGE 2 MQ 10 Q 0 125 1 0 01 1 40 V 200 pA 20 MQ 100 Q 0 125 1 0 01 1 40 V 20 pA 200 MQ 1 KQ 0 15 1 0 015 1 40 V 2 pA 2 Ga 10 ka 0 22541 0 035 1 40 V 200 nA 20 GQ 100 KQ 0 225 1 0 035 1 40 V 20 nA 200 GQ 1 MQ 0 35 1 0 110 1 40 V 2 nA 2 TQ 10 MQ 0 35 1 0 110 1 400 V 2 nA 20 TQ 100 MQ 1 02541 0 105 1 400 V 200 pA 200 TQ 1 GQ 115 1 0 125 1 400 V 20 pA I Specifications are for auto V source ohms when properly zeroed 5 digit 1 PLC median filter on digital filter 10 readings If user selectable voltage is required use manual mode Manual mode displays resistance up to 10 Q calculated from measured current Accuracy is equal to accuracy of V source plus accuracy of selected Amps range PREAMP SETTLING TIME Add voltage source settling time to preamp settling time
149. 5 APPLICATIONS This menu item is used to select the application DEV CHAR Use this menu item to select and configure one of the device characterization tests DIODE Use this option to select and configure the Diode Leakage Current Test After selecting LEAKAGE CURRENT you will be prompted to enter the start voltage stop voltage step voltage and the delay After entering these test parameters use the EXIT key to back out of the menu structure CAPACITOR Use this option to select and configure the Capacitor Leakage Current Test After selecting LEAKAGE CURRENT you will be prompted to enter the bias voltage number of readings and the time interval After entering these test parameters use the EXIT key to back out of the menu structure CABLE Use this option to select and configure the Cable Insulation Resistance Test After selecting INSULATION RESISTANCE you will be prompted to enter the bias volt age number of readings and time interval After entering these test parameters use the EXIT key to back out of the menu structure RESISTOR Use this option to select and configure the Resistor Voltage Coefficient Test After selecting VOLT AGE COEFFICIENT you will be prompted to enter the first voltage first delay second voltage and second delay After entering these test parameters use the EXIT key to back out of the menu structure RESISTIVITY Use this menu item to select and configure one of the st
150. 5 20 Value 0 0 1 DI y Value 1 Operation Event Set Events Seq Sequence Test Running 0 Operation Event Cleared Idle Idle state of the 6517A Calc Calculating Reading Arm Waiting for Arm Trig Waiting for Trigger Meas Measuring Cal Calibrating Figure 3 24 Operation Event Register IEEE 488 Reference Trigger Event Register Bit BO Not used Bit B1 Sequence 1 Seq1 Set bit indicates that the instrument is in the trigger layer PTR or that the instrument has exited from the trigger layer NTR Bits B12 through B14 Not used Bit B15 Always zero Bit Position B15 B14 B2 B1 BO Event Es Seq1 Decimal Weighting o 2 21 Value 0 o1 Value 1 Event Bit Set Event Seq Sequence 1 0 Event Bit Cleared Figure 3 25 Trigger Event Register Arm Event Register Bit BO Not used Bit B1 Sequence 1 Seq1 Set bit indicates that the instrument is in an arm layer PTR or that the instrument has exited from the arm layers NTR Bits B2 through B14 Not used Bit B15 Always zero Bit Position B15 B14 B2 B1 BO Event _ Seq1 Decimal Weighting Value 0 DI Value 1 Event Bit Set Event Seq1 Sequence 1 0 Event Bit Cleared Figure 3 26 Arm Event Register 3 113 IEEE 488 Reference 3 21 2 3 114 E
151. 517A in idle PRINT 1 output 27 init opc IT Start measurements and send OPC SLEEP 2 Wait two seconds GOSUB ReadRegister Read register to show that OPC is not set PRINT 1 output 27 abort Place 6517A back in idle GOSUB ReadRegister Read register to show that OPC is now set END ReadRegister IEEE 488 Reference PRINT 1 output 27 esr IT Query Standard Event Status Reg ister PRINT 1 enter 27 Get response message from 6517A LINE INPUT 2 aS IT Read decimal value of register PRINT a Display decimal value of register RETURN 3 11 6 OPC operation complete query Place a1 in the Output Queue after all pending operations are completed Description On power up or when CLS or RST is executed the Model 6517A goes into the Operation Complete Command Query Idle State OQIS In this state there are no pending overlapped commands There are three overlapped commands used by the Model 6517A INITiate CONTinuous ON INITiate TRG When the OPC command is sent the Model 6517A exits from OQIS and enters the Operation Complete Command Active State OQAS In OQAS the instrument continuously monitors the No Operation Pending flag After the last pending overlapped command is completed No Op eration Pending flag set to true an ASCII character 1 is placed into the Output Queue the Mes sage Available MAV bit in the Status Byte sets and the instrument goes back
152. 7 67 27 40 The IEEE 488 standards also include another addressing mode called secondary addressing Secondary addresses lie in the range of 60 7F Note however that many devices including the Model 6517A do not use secondary addressing Once a device is addressed to talk or listen the appropriate bus transactions take place For example if the instrument is addressed to talk it places its data string on the bus one byte at a time The controller reads the information and the appro priate software can be used to direct the information to the desired location Bus lines The signal lines on the IEEE 488 bus are grouped into three different categories data lines management lines and hand shake lines The data lines handle bus data and commands while the management and handshake lines ensure that prop er data transfer and operation takes place Each bus line is ac tive low with approximately zero volts representing a logic 1 true The following paragraphs describe the operation of these lines Data lines The IEEE 488 bus uses eight data lines that transfer data one byte at a time DIO1 Data Input Output through DIO8 Da ta Input Output are the eight data lines used to transmit both data and multiline commands and are bidirectional The data lines operate with low true logic Bus management lines The five bus management lines help to ensure proper inter face control and management These lines are used to
153. 7001 or 7002 Switch System Tigger Lin oe Front Panel Operation T igger Link Cables 8501 Model 6517A O00 0 2 G aam cwe ys Trigger Link Rdapter EEE E 23 4 5 6 External Trigger GE lt BNC to BNC Cables 7501 220 Current Source Figure 2 69 Trigger Link connections asynchronous example 2 Model 1 2 Model 6517A odel 7001 or 700 Idle state Idle state x Bench reset INIT CONT ONS Reset INIT CONT OFF ist 1 1 1 Arm layer Scan list 1 1 1 10 Arm source Immediate Arm count 1 Arm trigger control Acceptor Scan layer Scan source Immediate Scan count Infinite Scan trigger control Acceptor Measure layer Measure source TrigLink Trigger link mode Asynchronous Input line 3 Output line 4 Measure count 20 Measure trigger control Acceptor Indicates that the setting is the BENCH RESET and factory default con dition Arm layer Arm spacing Immediate Arm count 1 Arm trigger control Acceptor Scan layer Scan spacing TrigLink Trigger link mode Asynchronous Input line 2 Output line 1 Number of scans 2 Scan trigger control Source Channel layer Channel spacing TrigLink Trigger link mode Asynchronous Input line 4 Output line 3 Number of channels 20 Channel trigger control Source Indicates th
154. 7A can be set using either of two commands APERture paragraph 3 19 4 or NPLCycle Aperture specifies time in seconds per integration while NPLC expresses the integration period by basing it on the power line fre quency See paragraph Section 2 for details on integration SPEED When the integration period is set using the NPLCycles command the time value for the AP ERture command changes accordingly to reflect the new integration rate Conversely if the in tegration period is set using the APERture command the value for the NPLCycle command changes accordingly On power up the instrument uses the NPLC value to determine the integration period Note If line synchronization is enabled see LSYNc command in SYSTem subsystem the in tegration period will not start until the beginning of the next power line cycle For example if a reading is triggered at the positive peak of a power line cycle the integration period will not start until that power line cycle is completed The integration period starts when the positive going sine wave crosses zero volts See paragraph 2 19 8 for more details AUTO lt b gt ONCE SENSe 1 VOLTage DC NPLCycles AUTO lt b gt IONCE Control auto NPLC for volts SENSe 1 CURRent DC NPLCycles AUTO lt b gt IONCE Control auto NPLC for amps SENSe 1 RESistance NPLCycles AUTO lt b gt IONCE Control auto NPLC for ohms SENSe 1 CHARge NPLCycles AUTO lt b gt lIONCE Control auto NPLC for coulo
155. 7A dis plays the OUT OF LIMITS message instead of the inaccu rate reading Note that the positive peaks of the input signal which exceed full scale will not cause an OVERFLOW condition on the 20nA range since the average reading over the 16 67ms inte gration period is less than full scale The A D hardware limit detection circuit can be disabled which in turn disables the OUT OF LIMITS message How ever the presence of OUT OF LIMIT readings may result in measurements that are slightly severely or totally inaccu rate Paragraph 2 19 7 explains how to disable the OUT OF LIMIT message When both OVERFLOW and OUT OF LIMITS conditions occur the OVERFLOW message will be displayed Front Panel Operation 30 25 20 lt 75 10 DCA Reading on 200 nA range 20nA 5 0 time 16 67ms Figure 2 A Input signal lt c DCA Reading lt 20nA 0 time 16 67ms Figure 2 B Measurement on 20nA range 2 3 3 Status and error messages During Model 6517A operation and programming you will encounter a number of front panel messages Typical messag es are either of status or error variety as listed in Table 2 5 The most recent status or error messages can be momentarily displayed Just enter a configuration menu or the main menu and press the PREV range key The display is blank if no message is queued 2 5 Front Panel Operation Table 2 5 Status and error messages Number Description Event 440 Query
156. 99 Press ENTER when done Maximum and minimum The maximum and minimum multiple display shows the maximum and minimum readings since the display was en tered See Figure 2 4 The maximum and minimum values are reset by the following e Pressing the present function key e Leaving the display by changing function or entering a menu The resolution units and prefix on the bottom line are the same as shown for top line reading 15 6266 WV Max 05 7460 Min 15 8286 Maximum ll Minimum value value Figure 2 4 Maximum and minimum multiple display Relative humidity and external temperature This display provides the relative humidity and the external temperature readings Note that the appropriate sensors have to be connected to instrument and they have to be enabled in order to get valid readings See paragraph 2 22 for details 2 3 5 Navigating menus There are basically two types of menu structures the Main Menu and the Configure menus The Main Menu accesses items for which there are no dedicated keys and Configure menus are used to configure measurement functions and oth er instrument operations Use the following rules to navigate through the menu struc ture 1 The top level of the Main Menu is accessed by pressing the MENU key A Configuration menu is accessed by pressing CONFIG and then the desired function V I etc or operation TRIG STORE etc 2 A menu item is selected by placing the
157. 9999 9 sec 1 sec 3 25 7 STIME Query bias time MVOLtage lt NRf gt Specify measure voltage 1000 to 1000 500V 3 25 10 MVOLtage Query measure voltage MTIMe lt NRf gt Specify measure time 0 to 9999 9 sec 1 sec 3 25 11 MTIMe Query measure time DTIMe lt NRf gt Specify discharge time 0 to 99999 9 sec 2 sec 3 25 8 DTIMe Query discharge time ALTPolarity Alternating polarity resistance resistivity test path OFS Voltage lt NRf gt Specify offset voltage 1000 to 1000 UN S257 OFS Voltage Query offset voltage ALTVoltage lt NRf gt Specify alternating voltage 1000 to 1000 10V 3 25 18 ALT Voltage Query alternating voltage MTIMe lt NRf gt Specify measurement time 0 5 to 9999 9 sec 15 sec 3 25 11 MTIMe Query measurement time DISCard lt NRf gt Specify number of initial readings to discard 0 to 9999 3 3 25 19 DISCard Query number of initial readings to discard READings lt NRf gt Specify number of readings to store See paragraph 3 25 19 1 3 25 20 READings Query number of readings to store SIResistance Surface Insulation Resistance test path SVOLtage lt NRf gt Specify bias voltage 1000 to 1000 50V 3 25 6 SVOLtage Query bias voltage STIME lt NRf gt Specify bias time 0 to 99999 9 sec 1 sec 3 29 1 STIME Query bias time MVOLtage lt NRf gt Specify measure voltage 1000 to 1000 100V 3 25 10 MVOLtage Query measure voltage MTIMe lt NRf gt Specify measure time 0
158. 999e35 Specify limit value DEFault Set specified upper limit to 1 Set specified lower limit to 1 MINimum Set specified limit to 9 999999e35 MAXimum Set specified limit to 9 999999e35 UPPer Query specified upper limit UPPer DEFault Query RST default upper limit UPPer MINimum Query lowest allowable upper limit UPPer MAXimum Query largest allowable upper limit LOWer Query specified lower limit LOWer DEFault Query RST default lower limit LOWer MINimum Query lowest allowable lower limit LOWer MAXimum Query largest allowable lower limit These commands are used to set the upper and lower limits for LIMIT 1 and LIMIT 2 The ac tual limit depends on which measurement function is currently selected For example a limit value of 1u is 1uA for the amps function and 1uC for the coulombs function A limit value is not range sensitive A limit of 2 for volts is 2V on all measurement ranges SOURce lt NRf gt CALCulate3 LIMit 1 UPPer sOURce lt NRf gt Specify pattern upper LIMIT 1 failure CALCulate3 LIMit 1 LOWer SOURce lt NRf gt Specify pattern lower LIMIT 1 failure CALCulate3 LIMit2 UPPer SOURce lt NRf gt Specify pattern upper LIMIT 2 failure CALCulate3 LIMit2 LOWer SOURce lt NRf gt Specify pattern lower LIMIT 2 failure lt NRf gt 0 to 15 Specify digital pattern for output port SOURce Query source value for specified limit These commands are used to specify which line s of the Digital Output Port will go true
159. A Ay A3 Aa A6 Ao By By B3 Bs A A A A2 A3 Ao Ae A6 P B2 B5 Readings 5 i d 1 8 Ay Ay Ay Au A2 A6 Ae Ae Ae By Bs Ay A A Au Au A6 A6 A6 Ae A6 Bs Mode repeating Reading Reading 1 2 Type advanced Conversions A2 A3 A4 As A6 By B2 B3 B4 B5 Ay A Ay A Ay Ae B B By B3 B4 Readings 5 Au Ay Au A2 A3 Ae By By By B2 B3 Ay Ay Ay Au A2 Ae By By By By B2 Mode repeating A A A Ai e Bi Bi B Bi Noise level 1 of range Reading Reading 1 2 Figure 2 75 Digital filter averaging and advanced filter types 2 102 Front Panel Operation Conversion 10 Conversion 11 Conversion 12 9 10 11 8 9 10 7 8 9 6 7 8 9 5 Reading e 6 gt Reading e 7 gt Reading D 4 1 D 5 2 D 6 3 e 3 D 4 e 5 2 3 4 Conversion 1 Conversion 2 Conversion 3 A Type Average Readings 10 Mode Moving Conversion 10 Conversion 20 Conversion 30 9 19 29 8 18 28 7 17 27 6 16 26 ba 5 H Reading 15 Reading 25 gt Reading e 4 1 D 14 2 D 24 3 D 3 D 13 D 23 2 12 22 Conversion 1 Conversion 11 Conversion 21 B Type Average Readings 10 Mode Repeating Figure 2 76 Digital filter moving and repeating filter modes 2 17 3 Configuring the filters AVERAGING Each measurement function has its own filter configuration and is summarized in Table 2 27 Choosing the filter parameters for each function fol
160. A uses the Force Voltage Measure Current FVMI configuration to measure resistance From the known voltage and measured current the resistance is calcu lated R V I and displayed The resistance to be measured is connected to the center con ductor of the INPUT triax connector and the V SOURCE OUT HI binding post as shown in Figure 2 9A This config uration assumes that V Source LO is internally connected to ammeter LO via the METER CONNECT option of the CONFIGURE V SOURCE menu structure see paragraph 2 9 1 The equivalent circuit for this configuration is shown in Figure 2 9B WARNING The maximum common mode voltage the voltage between V Source Elec trometer LO and chassis ground is 500V peak Exceeding this value may create a shock hazard V SOURCE T 250V PEAK OU R Note V SOURCE LO connected to ammeter input LO via METER CONNECT option of CONFIGURE V SOURCE Menu A Basic connections Ammeter DEET EN LO II HI HI B Equivalent circuit Figure 2 9 Force voltage measure current Front Panel Operation 2 4 3 Voltage source output connections The voltage source output is accessed at the rear panel V SOURCE OUT HI and LO binding posts as shown in Figure 2 10A Using these terminals simply places the independent V Source in series with the external circuit RL as shown in Figure 2 10B The V Source can also be used be with the Electrometer to form the Force Voltage Meas
161. ABLE LEAKAGE RESISTANCE In an unguarded voltage measurement leakage current oc curs in the input triax cable between the center conductor HI and the inner shield LO This leakage resistance shunts the voltage source to be measured If the resistance of the source is not significantly less than the leakage resistance of the cable then measurement errors will occur The effects of leakage resistance can be eliminated by using guard to make high impedance voltage measurements See GUARDING for more information In general guarding should be used when the resistance of the voltage source is 10 Q or greater INPUT CAPACITANCE At very high resistance levels the very large time constants created by even a minimal amount of capacitance can slow down response time considerably For example measuring a source with an internal resistance of 100GQ would result in an RC time constant of one second when measured through a cable with a nominal capacitance of 10pF If 1 accuracy is required a single measurement would require at least five seconds Basically there are two ways to minimize this problem 1 keep the input cable as short as possible and 2 use guard ing Of course there is a limit to how short the cable can be Using guard can reduce these effects by up to a factor of 1000 see Guarding GUARDING Guarding should be used for high impedance voltage mea surements and for voltage measurements that use long input Front
162. Analog Output Low to keep the resistor out of the loop when using external feedback elements To keep loading errors under 0 1 the device connected to the PREAMP OUT should have a minimum input impedance of 100kQ CAUTION To prevent damage to the Model 6517A do not connect a device to PREAMP OUT that will draw more than 100uA For example at 200V the impedance connected to PREAMP OUT must be at least 2MQ 200V 100UA 2MQ Table 2 17 Full range PREAMP OUT values Full range Function Range value Volts 2V 2V 20V 20V 200V 200V Amps 2nA 2uA 2mA 2V 20pA 20nA 20UA 20mA 20V 200pA 200nA 2004A 200V Coulombs 2nC 20nC 200nC 20V 2uC 200V PREAMP OUT value for the Ohms function corresponds to the value for the Amps range that is being used to make the measurement Model 6517A Front Panel Operation HI LO Model 1683 Test Lead kit A Connections Measuring Device Figure 2 41 Typical preamp out connections Re HI D Vout Vin gt HI S Vout ube lt lt lIn gt LO lt lt V S Preamp Out E Preamp Out IN S Ri s Ri E Common Common 3 lt 1Q gt 1Q GND GND 5 NZS Volts Amps and Ohms CG Vout Qin HI c d 7 F Qn gt Lo lt lt ar Preamp Out S R Common a GND i ve Coulombs B Equivalent Circuits 2 53 Front Panel Operation 2 11 Using external feedback The external feedbac
163. Areas to check for light leaks include doors and door hinges tubing entry points and connectors or connector panels 2 21 7 Electrostatic interference Electrostatic interference occurs when a electrically charged object is brought near an uncharged object thus inducing a charge on the previously uncharged object Usually effects of such electrostatic action are not noticeable because low impedance levels allow the induced charge to dissipate quickly However the high impedance levels of many Model 6517A measurements do not allow these charges to decay rapidly and erroneous or unstable readings may result These erroneous or unstable readings may be caused in the following ways 1 DC electrostatic field can cause undetected errors or noise in the reading 2 AC electrostatic fields can cause errors by driving the in put preamplifier into saturation or through rectification that produces DC errors 2 127 Front Panel Operation Electrostatic interference is first recognizable when hand or body movements near the experiment cause fluctuations in the reading Pick up from AC fields can also be detected by observing the electrometer preamp output on an oscillo scope Line frequency signals on the output are an indication that electrostatic interference is present Means of minimiz ing electrostatic interference include 1 Shielding Possibilities include a shielded room a shielded booth shielding the sensitive circuit and
164. Buffer Pretriggered SRA Sequence Reading Available BFL Buffer Full BHF Buffer Half Full BAV Buffer Available RUF Reading Underflow RAV Reading Available HL2 High Limit 2 LL2 Low Limit 2 HL1 High Limit 1 LL1 Low Limit 1 P FA S ROF Reading Overfl A Positive Transition PTR Register GE B15 B14 B13 B12 B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 BO VSC FLC OL BPT SRA BFL BHF BAV RUF RAV HL2 LL2 HL1 LL1 ROF 16384 8192 4096 2048 1024 512 256 128 256 32 16 8 4 2 214 213 212 211 210 29 28 27 28 25 24 23 22 21 20 on oi on Ou of OI 0 1 o 1 oi 0 1 0 1 OI OI 0 1 0 1 Value 1 Enable Negative Transition Events VSC V Source Compliance Measurement Transition Filter FLC Fixture Lid Closed OL Out of Limits BPT Buffer Pretriggered SRA Sequence Reading Available BFL Buffer Full BHF Buffer Half Full BAV Buffer Available RUF Reading Underflow RAV Reading Available HL2 High Limit 2 LL2 Low Limit 2 HL1 High Limit 1 LL1 Low Limit 1 ROF Reading Overflow A Negative Transition NTR Register 0 Disable Negative Transition IEEE 488 Reference Effects of positive transitions on the Questionable Event Register Positive transition effect on Questionable event Questionable Event Register Volts Summary Sets BO when an invalid volts measurement occurs Amps Summary Sets B1 w
165. CONMECHONS i s5ccveielcibscessceass noesbdacceadissdenseeddvensssabbsosdebnenbbegeesacnsuadcacaabonbasssuaestederadeenevacseel es Trigger link connector DUT test system Trigger Link connections Operation model for asynchronous trigger link example MI Connections using Trigger Link adapter eee ee ceeeeee cae cseeceeeseeaeceaeeaecseceseceeeeseseeeseeteaesaaeeaesaaeeaeed DUT test system asynchronous example A7 Trigger Link connections Operation model for asynchronous Trigger Link example 7 Semi synchronous Trigger Link specifications eee ec eeeeeceseeeeceeeeeeeeseeeeecaeeesecaeesaecaaesaecaeesaeeeeeasens Typical semi synchronous mode connections ln Trigger Link connections Operation model for semi Digital filter moving and Limits bar graph example Using limit test to sort 100KQ resistors eeeeeeeeseceeeseeseceeeeescsaeeeesecsaeseescesecneeaceseesecaseeeaesaeeeseeesaeaeees Digital I O port s eeeseea Digital I O port simplified schematte ec seeecceecscessesececseeecesecaeeececsaeeeesecsecnevseeaecnecaeeeesaecaeeeeeeesaeeeees Satople externally powered eler ee t Diese deed ridsbeasvecdstasnseys Laune Cycle synchronization sesirik teen rinset antena a aor aer a Ee enee Pie EEEE a ELENE EERE ERENS Multiple ground points create a ground loop ss sssssesssseeseseeseseesrsrssrerrsrerrsreeretenrrstssrrtssrertereeenreetnreereeeset Eliminating ground loops synchronous Trigger Link example
166. EE 124 Too many digits in number EE 123 Exponent too large EE 2 6 Table 2 5 cont Status and error messages Number Description Event 121 Invalid character in number EE 120 Numeric data error EE 114 Header suffix out of range EE 113 Undefined header EE 112 Program mnemonic too long EE 111 Command Header Separator Error EE 110 Command Header Error EE 109 Missing Parameter EE 108 Parameter not allowed EE 105 GET not allowed EE 104 Data Type Error EE 103 Invalid Separator EE 102 Syntax Error EE 101 Invalid Character EE 100 Command Error EE 000 No Error SE 101 Operation Complete SE 121 Device calibrating SE 122 Device settling SE 123 Device ranging SE 124 Device sweeping SE 125 Device measuring SE 126 Device calculating SE 161 Program running SE 171 Waiting in trigger Layer SE 172 Waiting in arm layer 1 SE 173 Waiting in arm layer 2 SE 174 Re entering the idle layer SE 301 Reading overflow SE 302 Low limit 1 event SE 303 High limit 1 event SE 304 Low limit 2 event SE 305 High limit 2 event SE 306 Reading Available SE 307 Voltmeter Complete SE 308 Buffer Available SE 309 Buffer half full SE 310 Buffer full SE 311 Bu
167. EE 488 bus 3 10 Program message syntax Covers the syntax rules for common commands and SCPI commands 3 11 Common commands Covers the IEEE 488 2 com mon commands used by the Model 6517A 3 12 SCPI Signal oriented measurement commands Covers the signal oriented commands used by the Model 6517A 3 13 3 26 SCPI command subsystems Covers the SCPI commands used by the Model 6517A 3 27 RS 232 interface Explains how to use the Model 6517A from the RS 232 interface 3 28 DDC programming language Summarizes the use of device dependent command DDC programming using the DDC language The IEEE 488 is an instrumentation data bus with hardware and programming standards originally adopted by the IEEE Institute of Electrical and Electronic Engineers in 1975 and given the IEEE 488 designation In 1978 and 1987 the stan dards were upgraded to IEEE 488 1978 and IEEE 488 1 1987 respectively The Model 6517A conforms to these standards The Model 6517A also conforms to the IEEE 488 2 1987 standard and the SCPI 1994 Standard Commands for Pro grammable Instruments standard TEEE 488 2 defines a syntax for sending data to and from instruments how an in strument interprets this data what registers should exist to record the state of the instrument and a group of common commands The SCPI standard defines a command language protocol It goes one step farther than IEEE 488 2 and de fines a standard set of commands to control every p
168. ENABle Read the enabled messages y DISable lt list gt Specify messages not to be placed in queue Note 7 DISable Read the disabled messages CLEar Clears all messages from Error Queue Notes 1 Commands in this subsystem are not affected by RST and SYSTem PRESet The effects of cycling power CLS and STATus PRESet are explained by the following notes 2 Event Registers Power up and CLS Clears all bits of the registers STATus PRESet No effect 3 Enable Registers Power up and STATus PRESet Clears all bits of the registers CLS No effect 4 PTR Registers Power up and STATus PRESet sets all bits of the registers CLS No effect 5 NTR Registers Power up and STATus PRESet clears all bits of the registers CLS No effect 6 Error Queue Power up and CLS Clears the Error Queue STATus PRESet No effect 7 Enable Disable Error Queue Messages Power up Clears list of messages CLS and STATus PRESet No effect 3 54 IEEE 488 Reference Table 3 13 SYSTem command summary Default Command Description parameter SCPI Ref SYSTem PRESet Return to SYST PRES defaults V 3 22 1 POSetup lt name gt Select power on setup RST PRESet or SAVO SAV9 3 22 2 POSetup Query power on setup VERSion Query rev level of SCPI standard V 3 22 3 ERRor Query read Error Queue Note y 3 22 4 LSYNc Path to control line synchronization of measurements 3 22 5 STATe lt b g
169. ENSe 1 VOLTage DC RANGe UPPer lt n gt Set measurement range for Volts SENSe 1 CURRent DC RANGe UPPer lt n gt Set measurement range for Amps SENSe 1 CHARge RANGe UPPer lt n gt Set measurement range for Coulombs lt n gt Oto 210 Expected reading in volts 0 to 21e 3 Expected reading in amps Oto2 le 6 Expected reading in coulombs DEFault 210 volts 21e 3 amps 2 1e 6 coulombs MINimum 0 all functions MAXimum Same as DEFault RANGe UPPer Query programmed measurement range RANGe UPPer DEFault Query RST default range RANGe UPPer MINimum Query lowest measurement range RANGe UPPer MAXimum Query highest measurement range This command is used to manually select the measurement range for the specified measurement function The range is selected by specifying the expected reading as an absolute value The Model 6517A will then go to the most sensitive range that will accommodate that expected read ing For example if you expect a reading of approximately 10mA simply let the parameter lt n gt 0 01 or 10e 3 in order to select the 20mA range AUTO lt b gt ONCE SENSe 1 VOLTage DC RANGe AUTO lt b gt lIONCE Control auto range for Volts SENSe 1 CURRent DC RANGe AUTO lt b gt IONCE Control auto range for Amps SENSe 1 CHARge RANGe AUTO lt b gt IONCE Control auto range for Coulombs lt b gt 1orON Enable auto range 0 or OFF Disable auto range ONCE Enable and then dis
170. FF STATe Query state of digital filter MEDian Path to control the median filter 3 19 11 STATe lt b gt Enable or disable median filter ON STATe Query state of median filter RANK lt NRf gt Specify rank for median filter 1 RANK Query rank DAMPing lt b gt Enable or disable damping OFF 3 19 12 DAMPing Query state of damping 3 48 Table 3 10 Continued SENSe command summary IEEE 488 Reference Default Command Description parameter SCPI Ref RESistance Path to configure resistance V APERture lt n gt Set integration rate in seconds 166 67e 6 to 200e 3 Note 1 V 3 18 4 AUTO lt b gt Enable or disable auto aperture OFF AUTO ONCE Enable and then disable auto aperture AUTO Query auto aperture APERture Query aperture V NPLCycles lt n gt Set integration rate line cycles 0 01 to 10 1 V 3 18 5 AUTO lt b gt Enable or disable auto NPLC OFF AUTO ONCE Enable and then disable auto NPLC AUTO Query auto line cycle integration NPLCycles Query line cycle integration rate V AUTO Path to configure Auto V Source ohms RANGe Measurement ranges 3 19 6 UPPer lt n gt Select range 0 to 100e18 2e6 UPPer Query range AUTO lt b gt Enable or disable auto range Note 4 AUTO ONCE Set range based on present input signal ULIMit lt n gt Set upper limit for auto range 0 to 100e18 200e12 ULIMit Query upper limit LLIMit lt n gt Set lower l
171. Filter 0 y y y y y y y y y y Always Warn Seq Coul Ohms Hum Cal Temp Amp Volt Questionable Zero KETI Event B15 614 B13 B12 1 B11 B10 B9 68 B7 B5 B4 B3 B2 B1 BO Register To Questionable Summary Bit g QSB of Status Byte Register See Figure 3 13 Warn Seq Coul Ohms Hum Cal Temp Amp Volt Questionable m ee Event Enable B15 B14 B13 B12 B11 B10 B9 B8 B7 B5 B4 B3 B2 B1 BO Register Warn Command Warning Seq Sequence Test Summary Coul Coulombs Summary Ohm Ohms Summary Hum Humidity Summary Figure 3 12 Questionable event status 3 8 1 Condition registers As shown in the illustrations all status register sets except the standard event status register set have a condition regis ter A condition register is a real time read only register that constantly updates to reflect the current operating conditions of the instrument For example while a calculation is being performed bit B9 Calc of the Operation Condition Regis ter is set When the calculation is completed bit BO clears The CONDition query commands in the STATus Sub system are used to read the condition registers See para graph 3 20 for details 3 8 2 Transition filters As shown in the illustrations all status register sets except the standard event status register set have a transitio
172. For the Model 6517A to respond to Trigger Link compatible triggers the Front Panel Operation appropriate layers of the trigger model must be programmed for it For example if you want Trigger Link input triggers to control the measuring process you must program Measure Source for TRIGLINK trigger events Typically a Trigger Link output trigger from the Model 6517A would be used to trigger a scanner to close the next channel There are two modes of operation for Trigger Link asyn chronous and semi synchronous In the asynchronous mode separate lines are used for input and output triggers in the semi synchronous mode the same line is used for both input and output triggers H 5 Trigger Link Line O00 OO QQ Line 1 Line 2 Line 3 Line 4 Line 5 Line 6 Digital Common Digital Common TRIGGER LINK ONDUR AA Figure 2 63 Trigger link connector Asynchronous operation In the asynchronous operating mode Trigger Link functions fundamentally in the same manner as External Triggering see paragraph 2 15 4 Like External Triggering the asyn chronous mode uses separate lines for input and output trig gers Also the asynchronous mode uses the same TTL compatible pulses as External Triggering The specifications for the input and output trigger signals of asynchronous mode are shown in Figures 2 59 and 2 60 respectively For typical asynchronous Trigger Link operation the mea sure layer is configured
173. G trigger 3 36 TSEQuence Subsystem TSTamp commands TSTamp FORMat lt name gt 3 141 TST self test quer VERSion B 129 VSControl lt name gt 3 102 WAI wait to continue XFEedback lt b gt 3 102 ZCHeck lt b gt 3 131 i 1 A Advanced trigger configuration 2 77 A D Controls 3 134 Amps configuration 2 Analog outputs 2 50 ASCII character codes and IEEE 488 multiline interface command messages Basic measurement procedure 2 18 2 43 Basic Trigger Commands Basic trigger configuration Dasz Buffer multiple displays 2 100 C Cal zz Calculate multiple display 2 107 Calculate subsystems 3 62 Charge measurement considerations 2 45 Charge measurements Q Common commands COMMUNICATION 2 116 Condition registers Configure Test Sequence 2 68 Configuring data storage 2 96 Configuring the filters Connections Connections electrometer niet resistance meter and V source 2 9 Coulombs configuration 2 43 2 43 Current measurement Steel 28 Current measurements D Deviation 2 105 Device dependent command summary G 1 Digital Filters 2 101 Digital Output Commands 3 106 een Displa 4 Display resolution 2 57 Downloading commands using ProComm DCL device E a DDC LE ming language 3 158 1 2 E Electrochemical effects 2 127 Electromagnetic interference EMI
174. GERING menu is used to disarm the instrument and place it in the idle state You can press the TRIG key to resume front panel triggers Enabling ON continuous initiation will also take the instru ment out of idle Front Panel Operation 2 15 4 External triggering The Model 6517A has BNC connections on the rear panel for external triggering see Figure 2 58 The EXT TRIG IN jack allows the Model 6517A to be triggered by other instru ments The MTR COMP OUT jack allows the Model 6517A to trigger other instruments EXT TRIG MTR COMP IN OUT Figure 2 58 External triggering connectors External trigger The EXT TRIG IN jack requires a falling edge TTL com patible pulse with the specifications shown in Figure 2 59 In general external triggers can be used as events to control measure operations For the Model 6517A to respond to ex ternal triggers the appropriate layers of the trigger model must be configured for it Paragraphs 2 15 2 and 2 15 3 ex plain how to program the three layers of the measurement Triggers on Leading Edge TTL High 2V 5V TTL Low lt 0 8V r Jus er Minimum Figure 2 59 External triggering and asynchronous trigger link input pulse specifications Meter complete The MTR COMP OUT jack provides a TTL compatible out put pulse that can be used to trigger other instruments The specifications for this trigger pulse are shown in Figure 2 60 Front Panel Operation Meter Compl
175. HI to LO with a 0 1uF capacitor will recude this noise Ammeter LO to V Source LO connection The METER CONNECT option of the CONFIG V SOURCE menu see Table 2 15 is used to make or break the internal connection between V Source LO and ammeter LO and is summarized as follows 1 From the CONFIG V SOURCE menu select METER CONNECT to display the connection options on or off To connect meter LO to V Source LO place the cursor on the ON option and press ENTER Conversely to discon nect meter LO from V Source LO place the cursor on OFF and press ENTER 3 Use the EXIT key to back out of the menu structure 2 48 2 9 2 Setting voltage source value The following information covers the V Source display and explains how to select range and set the voltage value Displaying voltage source value With the instrument in the normal measurement display state the programmed voltage source value is displayed on the right hand side of the secondary display If in another dis play state you can display the voltage source as follows e If a multiple NEXT display is currently being dis played press and hold in the NEXT key or PREV key until the NEXT display state is cancelled e Ifina menu structure use the EXIT key to back out of it While in the multiple NEXT display state you can tempo rarily display the voltage source value by pressing the A or Vv key The voltage source value will appear on the second ary dis
176. However it is still possible for sensitive measurements to be affected by external sources In these instances special precautions may be required in the measurement setup Sources of EMI include e Radio and TV broadcast transmitters 2 128 e Communications transmitters cellular phones and handheld radios including e Devices incorporating microprocessors and high speed digital circuits e Impulses sources as in the case of arcing in high voltage environments The effect on instrument performance can be considerable if enough of the unwanted signal is present The effects of EMI can be seen as an unusually large offset or in the case of im pulse sources erratic variations in the displayed reading The instrument and experiment should be kept as far away as possible from any EMI sources Additional shielding of the instrument experiment and test leads will often reduce EMI to an acceptable level In extreme cases a specially con structed screen room may be required to sufficiently attenu ate the troublesome signal External filtering of the input signal path may be required In some cases a simple one pole filter may be sufficient In more difficult situations multiple notch or band stop filters tuned to the offending frequency range may be required Connecting multiple capacitors of widely different values in parallel will maintain a low impedance across a wide fre quency range Keep in mind however that s
177. INTERNAL OPERATOR SEAVICABLE PARTS SEAVICE BY Oh WW INTERLOCK ker Model 6517A 8607 Banana Plug Cables Warning Connect of fixture to safety earth ground using safety ground wire supplied with 8002A test fixture Figure 2 36 Connections for measurements using Model 8009 test fixture 2 7 3 Ohms configuration The following information explains the various configura tion options for the ohms function The configuration menu is summarized in Table 2 12 This menu is accessed by press ing CONFIG and then R Paragraph 2 3 5 summarizes the rules for navigating through the menu structure Note that a function does not have to be selected in order to be configured When the function is selected it will assume the programmed status SPEED The SPEED parameter sets the integration time of the A D converter the period of time the input signal is measured al so known as aperture It is discussed in paragraph 2 5 2 FILTER Use this menu item to configure the two basic filter types av eraging and median Note that you can use either the averag ing filter the median filter or both The filter menu is available from the function configuration menus i e press CONFIG V or by pressing CONFIG FIL TER with the desired function already selected All of the pa rameters menu items for FILTER are explained in paragraph 2 17 RESOLUTION The RESOLUTION parameter sets the display resolution It is
178. IREFerence lt b gt 3 97 KEY lt NRf gt J 3 130 LLEVel lt NRf gt 3 153 LSYNe STATe lt b 3 130 LTIMe lt NRf gt 3 154 MDELay lt NRf gt 3 150 MEDian Commands 3 100 MSELect lt name gt 3 103 MTIMe lt NRf gt 3 153 MVOLtage lt NRf gt 3 152 NPLCycles lt n gt 3 89 NTRansition lt NRf gt j 3 124 OFSVoltage lt NRf gt 3 154 OPC operation complete OPC operation complete query 3 32 OPEN ALL 3 82 OPEN Maal OPT option identification queryf3 33 PDTIMe lt NRf gt 3 152 POINts lt n gt 3 138 POSetup lt name gt 3 129 PTRansition lt NRf gt 3 117 QUEue commands 3 127 RCL recall READings lt NRf gt REFerence lt n gt RESistivity commands 3 103 RNUMber RESet ROUTe subsystem 3 81 RST reset the Model 6517A 3 33 SAV save the current setup in memory SCAN commands SEN Se subsystem SENSe 1 subsystem Geet SOURce lt name gt 3 144 SOURCce subsystem SPOInts lt NRf gt 3 155 SPINterval lt NRf gt 3 155 SRE lt NRf gt service request enable 3 34 SRE service request enable query STARt lt NRf gt STATus subsystem STB status byte query 3 35 STEP lt NRf gt 3 150 STIMe lt NRf gt 3 151 STOP lt NRf SVOLtage lt NRf SYSTem subsystem 3 129 TIME lt hr gt lt min gt lt sec gt 3 132 TIMer lt n gt 3 144 TRACe subsystem TR
179. IXTURE MODEL then the interlock cable MUST be connected to that test fixture Measurement type sur face or volume is automatically selected by the switch position on the test fixture Attempts to change measurement type from the menu will be ignored If the inter lock cable is not connected then the set tings for volume or surface will not work properly and you will not be able to change measurement type from the menu Front Panel Operation SURFACE Select this option to make surface resistivity measurements After the option is selected the following menu items are used to configure the resistivity measure ment MODEL 8009 Use this option if you are using the Model 8009 Resistivity Test Fixture This option automatically sets the parameters for the surface resistivity calculation see paragraph 2 7 2 since the electrode dimensions are known USER Use this option if using another manufacturer s test fixture or a custom built test fixture After selecting this op tion you will be prompted to enter the value for K Para graph 2 7 2 explains how to calculate K VOLUME Select this option to make volume resistivity measurements After the option is selected the following menu items are used to configure the resistivity measure ment THICKNESS Use to specify in millimeters the thickness of the sample FIXTURE MODEL Use this menu item to select the test fixture that you are going to use e MODEL 8009
180. KEITHLEY Model 6517A Electrometer User s Manual A GR Bee MEAS U HERE ONFIDENCE WARRANTY Keithley Instruments Inc warrants this product to be free from defects in material and workmanship for a period of 1 year from date of shipment Keithley Instruments Inc warrants the following items for 90 days from the date of shipment probes cables rechargeable batteries diskettes and documentation During the warranty period we will at our option either repair or replace any product that proves to be defective To exercise this warranty write or call your local Keithley representative or contact Keithley headquarters in Cleveland Ohio You will be given prompt assistance and return instructions Send the product transportation prepaid to the indicated service facility Repairs will be made and the product returned transportation prepaid Repaired or replaced products are warranted for the balance of the original warranty period or at least 90 days LIMITATION OF WARRANTY This warranty does not apply to defects resulting from product modification without Keithley s express written consent or misuse of any product or part This warranty also does not apply to fuses software non rechargeable batteries damage from battery leakage or problems arising from normal wear or failure to follow instructions THIS WARRANTY IS IN LIEU OF ALL OTHER WARRANTIES EXPRESSED OR IMPLIED INCLUDING ANY IMPLIED WARRANTY OF MERCHANTABILITY
181. L Overload LJ Calibration only LJ Certificate of calibration required LI Data required attach any additional sheets as necessary Show a block diagram of your measurement system including all instruments connected whether power is turned on or not Also describe signal source Where is the measurement being performed factory controlled laboratory out of doors etc What power line voltage is used Ambient temperature F Relative humidity Other Any additional information If special modifications have been made by the user please describe Be sure to include your name and phone number on this service form Specifications are subject to change without notice All Keithley trademarks and trade names are the property of Keithley Instruments Inc All other trademarks and trade names are the property of their respective companies KEITHLEY Keithley Instruments Inc Sales Offices BELGIUM CHINA FINLAND FRANCE GERMANY GREAT BRITAIN INDIA ITALY JAPAN KOREA NETHERLANDS SWEDEN TAIWAN 28775 Aurora Road e Cleveland Ohio 44139 e 440 248 0400 e Fax 440 248 6168 1 888 KEITHLEY 534 8453 e www keithley com Bergensesteenweg 709 B 1600 Sint Pieters Leeuw e 02 363 00 40 Fax 02 363 00 64 Yuan Chen Xin Building Room 705 12 Yumin Road Dewai Madian Beijing 100029 e 8610 82251886 Fax 8610 82251892 Halsuantie 2 00420 Helsinki Finland e 09 53 06 65 60 F
182. L that have the same general meaning regardless of the instru ment Table 3 1 lists the general bus commands Also includ ed is the programming statement for each command using the Keithley KPC 488 2 IEEE interface and the HP style Universal Language Driver CECHP Note that the com mands requiring that a primary address be specified assume that the address is set to 27 This is the address that is set at the factory 3 6 1 REN remote enable The remote enable command is sent to the Model 6517A by the controller to set up the instrument for remote operation Generally the instrument should be placed in the remote mode before you attempt to program it over the bus Simply setting REN true does not actually place the instrument in the IEEE 488 Reference 3 6 2 IFC interface clear The IFC command is sent by the controller to place the Mod el 6517A in the local talker and listener idle states The unit responds to the IFC command by cancelling front panel TALK or LISTEN lights if the instrument was previously placed in one of those states Note that this command does not affect the status of the in strument settings data and event registers are not changed To send the IFC command the controller need only set the IFC line true for a minimum of 100usec Program fragment PRINT 1 output 27 idn Send query com mand PRINT 1 enter 27 Read data turn on TALK annuncia
183. L fal fal fal fal k ZL fal ZL fal e bes o Ps b s bag Suruuny pat 2u nb lt LL LL LL LL K LL LL LL LL lt HS HS HS 26 lam OL OL OL OL k OL OL OL OL lt wed Se wed DJED Supeoy SunejnsjeD k 6 6 6 6 K 6 6 6 6 k g g g g k D 8 D D e g g g g EE EE Z Z w n Zhe ee Z Z SC Z Z A Z 191607 ke wiy wy wy WHY K sadeq uuy ue ur Sunem k 9 9 9 9 9 9 9 9 k Sur Sur Sur FUL K mie 193344 ul SumeM A k D D A A S S p k v v v v v D D v r O r v r K E e E E E lt z S z z e z z z z zker zker zker zke z 34e7 uuy uy K L L L L 1 bas L bas L bas L bas sade wuy ue uj ier Lie Lie Lie Lade way uy K eD re eD IED _ Bunesqued 0 0 0 0 K D D D D POSES Aomst aon EI 19485189Y 13181839Y 19185189Y Jon Aomst on POSES Aomst on 4asi8ay ayqeuy Wa uonsueut uompuo jqeuz quan uonsued uonipuop ajqeuq quan uonisuesj uonpuop Wad uonesado uonesado uonesadO Wa wy wy wy Wa aouanbas aouanbas aouanbas uonesado wuy asu nb ER esuodso4 1618 HEH SSW ESN ER aydq od elas u s 4q SCH ION SI SCT mue skemy ug Ueuung uonesado ger EL Las emm A D oH i SI SL 017 siew sneg euuunme Jotspiwba2iAiae 40 Jsanbay ssSw SOY l l k Pri Pri Pri vI ug Arewiuing Maat gei ZU El T T Gs SS lqereay adessow AVW LI Ke D ug Arewiung ajqeuonsand asd a o fal zI fal zz jqejreay 103 AVI S k D Ome ML IL IL ug Arewiung yuawanse W JSW or or or or XO lt 6 6 6 6 SSW smeig Arewiuung aew 121807
184. LD is cancelled by selecting one of the other scan source selections Select HOLD from the SELECT SCAN SOURCE menu by placing the cursor on HOLD and pressing ENTER The instrument returns to the SETUP SCAN LAYER menu DELAY This delay is used to hold up operation in the scan layer Af ter the scan event occurs the instrument waits until the delay period times out 0 to 999999 999 sec before proceeding to the measure layer COUNT This menu item defines the number of times operation re turns to the scan layer INFINITE Use this selection to continuously return opera tion to the scan layer 2 79 Front Panel Operation ENTER CHAN COUNT With this selection the user deter mines the number of times operation returns to the scan lay er You can program the Model 6517A to scan up to 99999 times CONTROL Use this menu item to enable or disable the source bypass The source bypass is used to bypass the scan event on the first pass through the scan layer SOURCE With this selection the source bypass is enabled The scan event will be bypassed on the first pass through the scan layer This allows operation to proceed into the measure layer without having to wait for the programmed event ACCEPTOR With this selection the source bypass is dis abled Configuring arm layer The arm layer is used for the following operations e To select the arming event SOURCE for the instru ment e To designate the number
185. LED Use this selection to disable strobe control ENABLED Use this selection to enable strobe control Front Panel Operation PASS PATTERN This item allows you to program the on off states of the dig ital output lines for when all limit tests pass Note that when the binning strobe is enabled digital output line 4 cannot be used Selecting PASS PATTERN displays the digital output pat tern that occurs when all limit tests pass To change the pat tern use the cursor keys and the range keys The range keys toggle the parameter values between OFF and ON Limits example This example sorts a quantity of 100kQ resistors into five bins according to the following tolerances e Values less than 90kQ outside 10 tolerance e Values greater than 110k outside 10 tolerance e Values between 90kQ and 99kQ meets 10 toler ance e Values between 101kQ and 110kQ meets 10 toler ance e Values between 99kQ and 101kQ meets 1 toler ance The desired test is shown in Figure 2 78 Use the following procedure to program the limits 1 From the LIMITS menu set the limit values and actions according to the following table Limit Value Action LOLIM1 90kQ DIGOUTI ON others OFF HILIM1 110kQ DIGOUT2 ON others OFF LOLIM2 99kQ DIGOUTI ON DIGOUT2 ON others OFF HILIM2 101kQ DIGOUT3 ON others OFF 2 Enable the binning strobe signal from the STROBE CONTROL item of the LIMIT
186. MAXimum Query largest allowable lower limit Automatic range changes slow down the reading rate By setting upper and lower measurement range limits you can prevent inadvertent range changes to ranges that you are not going to use Note that these limits can only be set for Auto V Source Ohms They are not available for Man ual V Source Ohms The upper range limit is selected by specifying the maximum expected reading that you expect to measure For example if the maximum expected reading is approximately 1GQ let the pa rameter lt n gt 1e9 The lowest most sensitive range that can measure 1GQ is the 2GQ range Thus the 2GQ range is selected as the upper range limit With this upper limit the instrument cannot uprange to the 20GQ or higher measurement range The lower range limit is selected by specifying the lowest expected reading that you expect to measure VSOurce RANGe lt n gt SENSe 1 RESistance MANual VSOurce RANGe lt n gt Set V Source range for Manual V Source Ohms lt n gt 0 to 1000 Specify output in volts DEFault 100V range MINimum 100V range MAXimum 1000V range RANGe Query V Source range RANGe DEFault Query RST default V Source range RANGe MINimum Query lowest allowable range RANGe MAXimum Query largest allowable range This command is used to select the optimum V Source range for Auto V Source Ohms Speci fying the output voltage value automatically selects the most sensitive range
187. MMUNICATIONS e Select RS 232 NOTE Switching from the GPIB interface to the RS 232 interface resets the instrument to the power on defaults In this case you will have to repeat step 1 to display the RS 232 SETUP menu 2 Continue on to select the interface mode Select SEND RECEIVE to send and receive commands or select TALK ONLY to send readings directly to a listener i e serial printer e Select CONTROL e Select SEND RECEIVE or TALK ONLY 3 Set the BAUD rate number of data BITS type of PAR ITY and the number of STOP bits as follows IEEE 488 Reference e Select BAUD e Select 19200 9600 4800 2400 1200 600 or 300 e Select BITS e Select Tor 8 e Select PARITY e Select NONE ODD or EVEN e Select STOP e Select lor2 4 Continue on to select the data elements that you want to include for each conversion Use a manual range key to toggle between yes y and no n e Select ELEMENTS RDG RDG UNIT CH HUM ETEMP TIME STATUS Data elements can be selected over the RS 232 interface us ing the FORMat ELEMents command see paragraph 3 15 All other RS 232 interface configuration settings have to be changed from the front panel MAIN MENU e Select Computer From your communications software configure the RS 232 interface for your computer as follows e RTS CTS OFF e XON XON ON e Local cho ON e Use VT 100 Terminal Emulation e Make sure the RS 232 parameters baud rate data bit
188. MP A timestamp is available for readings sent over the bus and for readings stored in the buffer This GENERAL menu se lection is used to configure the timestamp for readings sent over the bus From the front panel readings are sent over the bus via the COMMUNICATION selection of the MAIN MENU see paragraph 2 19 2 See paragraph 2 16 1 to con figure the timestamp for buffer readings Specifically this selection is used to perform the following operations e Select the type of timestamp relative or real time e Reset the relative timestamp to zero e Reset the reading number to zero Timestamp and the reading number are only included with each reading if they are selected as GPIB or RS 232 data el ements see paragraph 2 19 3 The menu items for TIMESTAMP are explained as follows TYPE This item is used to check or change timestamp type Note that changing the timestamp type clears the buffer The two timestamp types are described as follows e RELATIVE TIME With this selection timestamps are oriented to a timer and reference each reading to a point in time The timer starts at 0 000000 seconds when the instrument is turned on or when the relative timestamp is reset see RESET TIME After 99 999 999999 seconds the timer resets to zero seconds and starts over e REAL TIME With this selection timestamps are oriented to the real time clock and provide the current time 24 hour format and date for each reading
189. Model 6517A is addressed to talk This command can be used to monitor the storage process IEEE 488 Reference 3 23 4 FEED Commands Parameters Query Description Parameters Query Description PERCent lt n gt TRACe FEED PRETrigger AMOunt PERCent lt n gt Specify percent of pre trigger readings lt n gt Oto 100 of buffer for pre trigger readings DEFault 50 of buffer for pre trigger readings MINimum 0 of buffer for pre trigger readings MAXimum 100 of buffer for pre trigger readings PERCent Query percent of pre trigger readings This command is used to specify how much of the defined buffer POINts will be used to store pre triggered readings When a pre trigger store is started see FEED CONTrol readings are continuously stored in the buffer When the pre trigger event occurs see PRETrig ger SOURce post trigger readings will then fill the part of the buffer that is not reserved for pre trigger readings For example assume 25 of a 100 point buffer is reserved for pre trigger readings When the pre trigger store is started readings continuously fill the buffer When the pre trigger event oc curs subsequent readings will then be stored starting at buffer location 26 and continue until buffer location 100 is filled Storage stops after buffer location 100 is filled The result is 25 pre trigger readings and 75 post trigger readings See paragraph 2 16 1 for more information on pre trigger
190. NABle lt NRf gt Parameters Query Description Sequence Event Register Bit BO Not used Bit B1 Layer 1 Lay1 Set bit indicates that instrument operation is in arm layer 1 PTR or that operation has exited from arm layer 1 NTR Bit B2 Layer 2 Lay2 Set bit indicates that instrument operation is in arm layer 2 PTR or that operation has exited from arm layer 2 NTR Bits B12 through B14 Not used Bit B15 Always zero Bit Position BO Event Decimal Weighti SH Besch es ecimal Weighting edd Reg Value 0 0 1 o1 Value 1 Event Bit Set Event Lay1 Layer 1 0 Event Bit Cleared Lay2 Layer 2 Figure 3 27 Sequence Event Register STATus MEASurement ENABle lt NRf gt Program Measurement Event Enable Register STATus QUEStionable ENABle lt NRf gt Program Questionable Event Enable Register STATus OPERation ENABle lt NRf gt Program Operation Event Enable Register STATus OPERation TRIGger ENABle lt NRf gt Program Trigger Event Enable Register STATus OPERation ARM ENABle lt NRf gt Program Arm Event Enable Register STATus OPERation ARM SEQuence ENABle lt NRf gt Program Sequence Event Enable Register lt NRf gt 0 Clear register lt NRf gt 128 Set bit B7 1 Set bit BO 256 Set bit B8 2 Set bit Bl 512 Set bit B9 4 Set bit B2 1024 Set bit B10 8 Set bit B3 2048 Set bit B11 16 Set bit B4 4096 Set bit B12 32 Set bit B5 8192 Set bit B13 64 Set bit B6 16384 Set
191. No calculation selected POLY Percent calculation selected Polynomial 2 106 DEV Percent deviation calculation selected DEV Deviation calculation selected RAT Ratio calculation selected LOG Logarithmic calculation selected Pressing MATH a second time disables the calculation Table 2 28 CONFIGURE MATH menu structure Menu item Description None Select no calculation when MATH key is pressed Polynomial Select polynomial calculation and enter constants Percent Select percent calculation and enter target reference value DEV Select percent deviation calculation and enter reference value DEVIATION Select deviation calculation and enter reference value Ratio Select ratio calculation and enter ref erence value Log10 Select logarithmic base 10 calcula tion NONE With this menu item no math operation goes into effect when the MATH key is pressed The MATH annunciator lights but NONE is displayed on the top line POLYNOMIAL This menu item selects the polynomial calculation and al lows you to program the polynomial constants The a2 constant is displayed first You can retain the displayed value or key in a new value In either case press ENTER to display the al constant Retain or change this constant and press ENTER to display the a0 constant If you change the a0 constant be sure to again press ENTER PERCENT This menu item selects the percent calculation and lets yo
192. OR FITNESS FOR A PARTICULAR USE THE REMEDIES PRO VIDED HEREIN ARE BUYER S SOLE AND EXCLUSIVE REMEDIES NEITHER KEITHLEY INSTRUMENTS INC NOR ANY OF ITS EMPLOYEES SHALL BE LIABLE FOR ANY DIRECT INDIRECT SPECIAL INCIDENTAL OR CONSEQUENTIAL DAMAGES ARISING OUT OF THE USE OF ITS INSTRUMENTS AND SOFTWARE EVEN IF KEITHLEY INSTRUMENTS INC HAS BEEN ADVISED IN ADVANCE OF THE POSSIBILITY OF SUCH DAMAGES SUCH EXCLUDED DAMAGES SHALL INCLUDE BUT ARE NOT LIM ITED TO COSTS OF REMOVAL AND INSTALLATION LOSSES SUSTAINED AS THE RESULT OF INJURY TO ANY PERSON OR DAMAGE TO PROPERTY KEITHLEY Keithley Instruments Inc 28775 Aurora Road e Cleveland Ohio 44139 e 440 248 0400 e Fax 440 248 6168 1 888 KEITHLEY 534 8453 e www keithley com Sales Offices BELGIUM Bergensesteenweg 709 e B 1600 Sint Pieters Leeuw e 02 363 00 40 Fax 02 363 00 64 CHINA Yuan Chen Xin Building Room 705 e 12 Yumin Road Dewai Madian e Beijing 100029 e 8610 82251886 Fax 8610 82251892 FINLAND Halsuantie 2 e 00420 Helsinki Finland e 09 53 06 65 60 e Fax 09 53 06 65 65 FRANCE 3 all e des Garays e 91127 Palaiseau C dex e 01 64 53 20 20 Fax 01 60 11 77 26 GERMANY Landsberger Strasse 65 82110 Germering e 089 84 93 07 40 Fax 089 84 93 07 34 GREAT BRITAIN Unit 2 Commerce Park Brunel Road e Theale Berkshire RG7 AAR 0118 929 75 00 Fax 0118 929 75 19 INDIA 1 5 Eagles Street Langford Town Bangalore 560 025 080 212 80 27 Fax 080 212 80 05 ITALY Vi
193. OURce VOLTagel LEVell MMediate AMPLitude lt n gt Set V Source amplitude Parameters lt n gt 100to 100 Set voltage for 100V range 1000 to 1000 Set voltage for 1000V range DEFault OV MINimum Greatest allowable negative value MAXimum Greatest allowable positive value Query VOLTage Query programmed amplitude VOLTage DEFault Query RST default value VOLTage MINimum Query minimum amplitude VOLTage MAXimum Query maximum amplitude Description This command is used to set the amplitude for the V Source Notice that three commands in the path are enclosed by brackets to indicate that they are optional Thus this command can be sent in the following form SOURce VOLTage lt n gt 3 106 Parameters Query Description Parameters Query Description IEEE 488 Reference Note that the amplitude level is limited by the selected range and programmed voltage limit see RANGe and LIMit When on the 100V range attempts to set the amplitude to a level that ex ceeds the 100V range will result in a Setting Conflicts error Attempts to set an amplitude that exceeds a programmed voltage limit will set the amplitude to that limit The MINimum and MAXimum parameters are also affected by range and voltage limit Setting the V Source to the MINimum or MAXimum amplitude selects the greatest negative or pos itive value allowed by the programmed limit or range The V Source output operate and standby is contro
194. On power up all error messages are enabled and will go into the Error Queue as they occur Sta tus messages are not enabled and will not go into the queue This command is used to specify which messages you want enabled Messages not specified will be disabled and prevented from entering the queue When this command is sent all messages will first be disabled then the messages specified in the list will be enabled Thus the returned list ENABle will contain all the enabled messages Messages are specified by numbers see Table 2 4 The following examples show various forms for expressing a message numlist Numlist 110 Single message 110 140 222 Messages separated by commas 110 222 Range of messages 100 through 222 110 222 230 Range entry and single entry separated by a comma Note To disable all messages from entering the Error Queue send the following command stat que enab 3 127 IEEE 488 Reference Parameters Query Description Program fragment 3 128 Description DIiSable lt list gt STATus QUEue DISable lt list gt Disable messages for Error Queue lt list gt numlist where numlist is a specified list of messages that you wish to disable for the Error Queue DISable Query list of disabled messages On power up all error messages are enabled and will go into the Error Queue as they occur Sta tus messages are not enabled and will not go into the queue This command i
195. POIN TRAC POIN AUTO OFF TRAC FEED CONT NEV TRAC FEED PRET AMO READ TRAC POIN TRAC FEED PRET AMO PERC 100 TRAC FEED PRET AMO PERC TRAC FEED PRET AMO READ TRAC POIN TRAC FEED PRET AMO PERC 100 TRAC FEED CONT NEV TRAC FEED PRET AMO READ TRAC FEED PRET AMO PERC TRAC FEED PRET AMO READ TRAC POIN 100 TRAC FEED CONT NEV TRAC CLE TRAC FEED CONT NEV APER APER AUTO OFF NPLC AUTO OFF NPLC APER line frequency Di varies per function DIG AUTO is ON NPLC LAPER AUTO OFF NPLC AUTO OFF APER NPLC line frequency DIG varies per function DIG AUTO is ON DIG DOG AUTO OFF APER varies per function APER AUTO is ON NPLC varies per function NPLC AUTO is ON RANG UPP RANG AUTO OFF REF ACQ RER presently displayed reading E 3 IEEE 488 Conformance Information Table E 2 cont Coupled commands Command DET FUNC RES OCOM CURR DC METH FREQ THR VOLT TTL TEMP TRAN TEMP RTD TYPE TEMP RTD ALPH E 4 Also changes APER DIG ANER SIAT AVER COUN n AVER TCON n AVER ADV STAT n AVER ADV NTOL n RES RANG UPP RES RANG AUTO ULIM RES RANG AUTO LLIM CURR DC RANG UPP gt CURR DC RANG AUTO CURR DC AVER STAT CURR DC AVER COUN CURR DC AVER TCON CURR DC AVER ADV STAT CURR DC AVER ADV NTOL FREQ THR VOLT RANG FREQ THR VOLT LEV ROUT SCAN INT ROUT SCAN
196. Q 20TQ or 200TQ ranges since a hazardous voltage level 400V may be selected by the instrument You must select these ranges manually To speed up the auto range process you can set upper and or lower range limits Eliminating ranges in the auto range search speeds up the measurement process See paragraph 2 7 3 AUTORNG for details With AUTO V Source selected the Model 6517A will dis play the ohms measurement range and the V Source value With MANUAL V Source selected the amps range for the measurement and the V Source value will be displayed NOTE Since AUTO ohms uses the Source V Measure I measurement method a cur rent measurement overflow will result in an UNDERFLOW error Conversely a OA measured current will result in an OVERFLOW error To avoid confusion use NEXT to show the measured current on the secondary display Table 2 11 Ohms reading ranges and AUTO V Source AUTO V Source Test Amps Reading range voltage range 200kQ 2MQ 40V 200A 2MQ 20MQ 40V 20HA 20MQ 200MQ 40V 2uA 200MQ 2GQ 40V 200nA 2GQ 20GQ 40V 20nA 20GQ 200GQ 40V 2nA 200GQ 2TQ 400V 2nA 2TQ 20TQ 400V 200pA 20TQ 200TQ 400V 20pA 2 7 1 Resistance measurements The Model 6517A can make resistance measurements up to 107 Q using the force voltage measure current FVMI tech nique From the known sourced voltage and measured cur rent the Model 6517A calculates and displays the resultant resista
197. R the settings for the current measurements made internally to the sequence are preset to the settings for the amps function If the amps function is set to a specific range the sequence defaults to that range If the amps function is autoranging the sequence will default to autoranging The range can be changed after the sequence is armed by pressing the A V or auto keys The Alternating Polarity sequence will not autorange past the 2nA range If the resistance resistivity to be measured is high and a more sensitive range is required the user must set this range manually using the A or W keys For the 20 pA and 200 pA ranges use a measure time of at least 15 seconds Front Panel Operation While in the armed condition the sequence parameters may be changed CONFIG SEQ the range may be changed the output result type may be changed resistance surface of volume resistivity and the resistivity parameters edited To run the sequence press TRIG after arming Pressing EXIT after arming disarms the sequence and returns the Model 6517A to the function in use when it was armed During execution the sequence will show until the first reading becomes available and is sent to the buffer After this the latest calculated value will be displayed If at the end of any alteration the current exceeds the amps range in use the error 618 Resistivity OutOfLimit will occur and the sequence will abort returning it to the
198. RCE Select AUTO or MANUAL V Source USE ALL RANGES With this selection all ohms ranges except the 2TQ 20TQ and 200TQ ranges are used in the autoranging search process SET LIMITS This selection allows you to specify minimum and maximum ranges in the autoranging search process e MIN AUTO Use to select the lowest range that you want the instrument to autorange to e MAX AUTO Use to select the highest range that you want the instrument to autorange to DAMP High capacitance seen at the input will increase reading noise This capacitance can be attributed to a long input cable or to the capacitance of the source or a combination of both Enabling damping will reduce this type of noise However damping will also slow down the response of the measure ment Don t confuse damping with filtering Damping is used to re duce noise caused by input capacitance while filtering is used to reduce noise caused by a noisy input signal ON Enable current damping OFF Disable current damping MEAS TYPE The MEAS TYPE option is used to select and configure the measurement type for the ohms function RESISTANCE Use this menu item to configure the ohms function to make normal resistance measurements RESISTIVITY Use this menu item to configure the ohms function to make surface or volume resistivity measure ments NOTE If the Model 6517A is already configured to use the Model 8009 Resistivity Test Fixture see F
199. Read the enable register y S212 PTRansition lt NRf gt Program the positive transition register Note 4 y PTRansition Read the positive transition register y 3 21 3 NTRansition lt NRf gt Program the negative transition register Note 5 V NTRansition Read the negative transition register y 3 21 4 CONDition Read the condition register y ARM Path to control arm event registers y 3 21 5 EVENt Read the event register Note 2 y ENABle lt NRf gt Program the enable register Note 3 y 3 21 1 ENABle Read the enable register y 3 21 2 PTRansition lt NRf gt Program the positive transition register Note 4 y PTRansition Read the positive transition register y 3 21 3 NTRansition lt NRf gt Program the negative transition register Note 5 y NTRansition Read the negative transition register y 3 21 4 CONDition Read the condition register y SEQuence Path to control sequence status registers y 3 21 5 EVENt Read the event register Note 2 y ENABle lt NRf gt Program the enable register Note 3 V 3 21 1 ENABle Read the enable register y 3 21 2 PTRansition lt NRf gt Program the positive transition register Note 4 y PTRansition Read the positive transition register y 3 21 3 NTRansition lt NRf gt Program the negative transition register Note 5 y NTRansition Read the negative transition register y 3 21 4 CONDition Read the condition register V TRIGger Path to control trigger status register
200. Register is programmed and queried using the ESE and ESE Common Com mands respectively see paragraph 3 11 2 All other enable registers are programmed and queried using the ENABle and ENABle commands in the STATus Subsystem see paragraph 3 20 An enable register is not cleared when it is read The Enable registers are affected by the following operations e Cycling power Clears all enable registers e STATus PRESet clears the following enable registers Operation Event Enable Register Questionable Event Enable Register Measurement Event Enable Register IEEE 488 Reference e STATus PRESet sets all bits of the following enable registers Trigger Event Enable Register Arm Event Enable Register Sequence Event Enable Register e ESE 0 Clears the Standard Event Status Enable Register 3 8 5 Queues The Model 6517A uses two queues the Output Queue and the Error Queue The queues are first in first out FIFO reg isters The Output Queue is used to hold readings and re sponse messages and the Error Queue is used to hold error messages and status messages The Model 6517A status model Figure 3 5 shows how the two queues are structured with the other registers Output Queue The Output Queue is used to hold data that pertains to the normal operation of the instrument For exam ple when a query command is sent the response message is placed in the Output Queue When data is placed in the Output Que
201. S menu 3 Set a pass pattern of all lines off from the PASS PAT TERN item of the LIMITS menu 4 Enable the control of the digital output lines by limit set 1 and limit set 2 from the LIMIT SET 1 and LIMIT SET 2 menus This sets the digital output lines to the pass pattern all OFF in this example Since binning is enabled digital output 4 is also OFF Note that the actual state high or low of the digital output lines depends on the polarity ACTIVE HIGH or ACTIVE 2 119 Front Panel Operation LOW This is programmed from the DIGOUT selection of the GENERAL menu Tolerance N Bande KS 10 gt 1 Resistance se 90kQ 99kQ 101kQ 110kQ Bit 001 011 000 100 010 Patterns lt gt and LOLIM1 LOLIM2 HILIM2 HILIM1 Limits Figure 2 78 Using limit test to sort 100kQ resistors 2 19 6 STATUS MSG This selection is used to enable or disable the status messag es mode When enabled status messages are displayed to identify specific operations that are performed ON Enable the status message mode OFF Disable the status message mode The instrument may become so busy displaying status mes sages that key presses are no longer acknowledged You may have to clear status message display by pressing the EXIT key or sending a bus command DISPlay SMESsage OFF to get out of this mode Figure 2 79 Digital I O port 2 120 2 19 7 GENERAL The GENERAL menu is used fo
202. Source is selected Table 2 11 identifies the ohms ranges that use 400V The V Source setting AUTO or MANUAL is selected from the VSOURCE item of CONFIGURE OHMS menu see paragraph 2 7 3 for details 2 32 Ohms Ranges Each measurement range for the ohms function has a lower reading limit that is one decade below the selected range For example the 20MQ range has a lower reading limit of 2MQ The reading ranges for the ohms function are listed in Table 2 11 Ohms measurements are performed by sourcing voltage and measuring current Thus ohms ranges are actually current ranges with ohms displayed When the resistance of the DUT device under test is too low for the selected ohms range the resultant current will ex ceed full scale and cause the UNDERFLOW message to be displayed This message indicates that the measured resis tance is below the lower reading limit of the selected range This problem can be resolved by manually selecting the next lower range or by using AUTO range There are three ways you can be assured of optimum range selection e Use AUTO range e Select the next lower range when UNDERFLOW is dis played With the MANUAL V Source selected use the multiple NEXT display that provides the actual measured cur rent This allows you to check that the selected amps range is the lowest range that can handle the measured current Note that with AUTO range selected the instrument cannot go to the 2T
203. T The units of the reading e CH The channel number the reading was taken on Front Panel Operation e HUM Relative humidity reading if the Model 6517 RH is being used The humidity sensor is enabled from the A D CONTROLS item of the GENERAL MENU see paragraph 2 19 7 e ETEMP The external temperature reading if the Model 6517 TP is being used The humidity sensor is enabled from the A D CONTROLS item of the GEN ERAL MENU see paragraph 2 19 7 e TIME The real time or relative timestamp for each reading Timestamp type is selected from the TIMES TAMP item of the GENERAL MENU see paragraph 2 19 7 e STATUS The reading status information normal reading measurement overflow or underflow relative reading e VSRC The actual output level of the V Source 2 19 3 CAL The CALIBRATION menu is used to calibrate the Model 6517A COMPREHENSIVE POINT CALS and CAL OPT These procedures for calibration are locked These proce dures require accurate calibration equipment and should only be performed by qualified personnel Refer to the Mod el 6517 Service Manual for details CAL DATES Use this menu item to view or change the calibration dates Use the VIEW option of the menu to display the last calibra tion date and the next calibration date The DISPLAY AT POWERUP option controls whether the next calibration date is displayed during the power up sequence The CHANGE option is locked to enabl
204. T Metal Guard Plate i VW VW R 2 gt 1GQ B Guarded Figure 2 29 High impedance current measurements Floating current measurements As discussed in para graph 2 5 4 for voltage measurements guarding uses a con ductor at essentially the same potential as the sensitive input to drastically reduce leakage currents in high impedance test circuits No current can flow when there is a OV drop across a leakage resistance For floating current measurements ammeter input low is used as the guard since it totally surrounds input high via the input triax cable and it is at nearly the same potential as in put high In reality the ammeter drops lt 1mV and is known as the voltage burden Figure 2 30A shows an unguarded floating current measure ment in a high impedance circuit The goal is to measure the current Ip through resistor R However a leakage path Ry exists from ammeter input LO to test circuit common Since the ammeter drops lt ImV approximately 10V is dropped by R The current through Ri will be approximately 10nA 10V 1GQ 10nA Thus the current that is measured by the Model 6517A is the sum of the two currents I Ip 10nA Obviously if Ip is a low level current then the 10nA leakage current will corrupt the measurement Front Panel Operation Figure 2 30B shows the guarded version of the same circuit Notice that the only difference is that the connections to the electrometer are reversed Resistor Ry
205. T at OFF will generate a Setting Conflict Error Setting STATe to ON during a scan or test sequence will change TCON to REPeat NTOLerance lt n gt SENSe 1 VOLTage DC AVERage ADVanced NTOLerance lt n gt Specify noise tolerance for Volts SENSe 1 CURRent DC AVERage ADVanced NTOLerance lt n gt Specify noise tolerance for Amps SENSe 1 RESistance AVERage ADVanced NTOLerance lt n gt Specify noise tolerance for Ohms SENSe 1 CHARge AVERage ADVanced NTOLerance lt n gt Specify noise tolerance for Coulombs lt n gt lto 100 Specify noise tolerance in percent DEFault 1 MINimum 0 MAXimum 100 NTOLerance Query noise tolerance NTOLerance DEFault Query RST default noise tolerance NTOLerance MINimum Query lowest allowable noise tolerance NTOLerance MAXimum Query largest allowable noise tolerance Each measurement function can utilize the advanced filter which adds a noise tolerance window to the averaging algorithm These commands are used to set the noise tolerance level of the ad vanced filter for the specified function The ADVanced STATe commands are used to enable or disable the advanced filter The noise tolerance level is expressed as a percent of the last averaged reading In general if the noise is within this window the reading is simply based on the normal averaging algorithm If a reading is outside this window then the advanced averaging algorithm is used See paragra
206. TUS SOLS A A A A NE EE E E E E RTE ET E AEE E E EE DEET Storing and recalling teadinNg S 2 ssccsis ssucsssanvesssdavasevsenndenscantseinecnndessasssoadessscenduncanavaabsecsivsntenscash SEANCE Buber multiple displays si ss chsseisvecehneadeeisetevevssiendenavveseaSuudewseeveeetvesio rE SRA AE ERE tee Dees i La EE Digital Fite rs e e E EE Mega r eare E a REENE EKE E EEEn paee ete Re EERS EVE aa e aii Conte unm the filters eegen etl tae oie ni ren ean E oeaan raea EEEa NESKEN e AEAEE eas dee Danie i Math eeet A ees EE EeER Ee E E Polynomial a sSeks iere EE eege POLCOM Es sicentsccssaseasescaeeievasssyaescaites vaceuaperdancsvetesbanbealicanssntecsdandes dens EE E EE E EEE E EEEE EEE EE EEEE ESS 2 18 3 2 18 4 2 18 5 2 18 6 2 18 7 2 18 8 2 19 2 19 1 2 19 2 2 19 3 2 19 4 2 19 5 2 19 6 2 19 7 2 20 2 20 1 2 20 2 2 21 2 21 1 2 21 2 2 21 3 2 21 4 2 21 5 2 21 6 2 21 7 2 21 8 2 21 9 2 22 3 1 3 2 3 2 1 3 2 2 3 3 3 4 3 5 3 6 3 6 1 3 6 2 3 6 3 3 6 4 3 6 5 3 6 6 3 6 7 3 6 8 3 7 3 7 1 3 7 2 3 7 3 3 8 3 8 1 Se EE E e ME IR EN Ke E D RTE elle EE VE Selecting and confi EE Uses n seai taes naasten enos Calculate multiple display sioviccseccssasessescisshesiescdateasscesinescudevedetsnnsesevenseabbeuscduassuicsleanseaidoasnbevuesegesSenenes E EE D TEE swe ka E D External scanning Other measurement considerations ee eeeeseeceeeeesseeeecececessecesecesaeceneeceueeesseeeneecaeee
207. U6 Attributes of top display characters U7 Attributes of bottom display characters YY LFCR CRLF 0 LF 0 CR 00 None blinking character 0 other Hit Key Hn Hit front panel key n 1 to 31 see Figure 3 40 for key press codes Buffer Size In n 2 to 15868 if buffer elements are not changed using Hit Key command G 3 Index NUMBER 2V analog output 2 51 SYMBOL Ee ADIScharge Commands 3 102 ALTVoltage lt NRf gt 3 154 APERture lt n gt 3 87 AVERage commands 3 98 CALCulate 1 CALCulate2 3 65 CALCulate3 3 67 CALibration subs stem 3 71 CLEa CLOSe lt list CLS clear sta us 3 27 lt CONDition 3 126 COUNt lt n gt 3 143 COUNt lt NRf gt 3 154 DAMPing lt b gt 3 101 DATA DATA commands 3 85 DATE lt yr gt lt mo gt lt day gt 3 132 DELay lt n gt 3 143 DIGits lt n gt 3 97 DTIMe lt NRf gt ELEMents lt item list gt 3 141 ENABle lt NRf gt ERRor 3 129 ESE lt NRi gt event enable 3 28 ESE event enable query 3 28 ESR event status register query 3 29 EVENt 3 109 FEED Commands 3 139 FORMat subsystem FREE 3 137 FUNCtion lt name gt 3 85 GUARd lt b gt 3 101 HLEVel lt NRf gt j 3 153 HTIMe lt NRf gt 3 153 IDN identification query 3 30 IMMediate 3 143 INITiate commands 3 142 INTerlock 3 137
208. UP option of the main menu is used for the following operations e To save the present instrument configuration in non volatile memory e To restore the instrument to a previously saved instru ment configuration e To set the instrument s power on configuration To reset the instrument to a factory default configura tion SAVE Use this menu item to save the present instrument setup in a specific memory location You can store up to 10 setups in non volatile memory After selecting SAVE you will be prompted to save the present setup in a memory location Note that the numbering of setup locations starts with setup 0 You can save the setup in memory location 0 or you can use the RANGE A and V keys to enter a different value With the desired memory lo cation displayed press ENTER RESTORE Use this menu item to return the instrument to a setup that was previously stored see SAVE in memory After selecting RESTORE you will be prompted to enter the memory location number of the setup that you wish to re store Note that 0 is a valid memory location Use the range keys A and W to key in the desired location and press EN TER The instrument will immediately restore that setup configuration POWERON Use this menu item to select the instrument setup that goes into effect on power on 2 110 The instrument can be set to power on to the factory bench defaults the factory GPIB defaults or to a user setup stored
209. URE TRIGGER menu structure Menu item Description BASIC Select and configure basic triggering MODE Select trigger mode CONTINUOUS Use for continuous triggering ONE SHOT Use for one shot triggering SOURCE Select source of triggers IMMEDIATE Use to make measurements immediately MANUAL Use TRIG key to control measuring GPIB Use bus triggers to control measuring EXT Use external triggers to control measuring TIMER Use a timer to control measuring Enter trigger interval 0 001 999999 999 sec ADVANCED Select and configure advanced triggering MEASURE Measure layer menu SOURCE Select measure source IMMEDIATE Use to make measurements immediately EXTERNAL Use external trigger to control measuring MANUAL Use TRIG key to control measuring GPIB Use bus triggers to control measuring TRIGLINK Use Trigger Link triggers to control measuring Enter Trigger Link mode and lines TIMER Use a timer to control measuring and enter interval between triggers 0 001 999999 999 sec HOLD Use to hold up the measurement in the measure layer DELAY Use to delay measurement in the measure layer 0 001 999999 999 sec COUNT Define number of measurements to make INFINITE Repeat measuring indefinitely ENTER CHAN COUNT Specify count 1 99999 CONTROL Select trigger control mode SOURCE Enable Source Bypass ACCEPTOR Disable Source Bypass 2 71 Front Panel Operation Table 2 21 cont CONFIGURE TRIGGER menu structure
210. When the test is configured you specify the start volt age START V the step voltage STEP V the stop voltage STOP V and the DELAY between steps Figure 2 48 shows an example using the default test parameters When the test is run 10 current measurements will be performed one at each voltage step and stored in the buffer This test is selected and configured from the CONFIGURE SEQUENCE menu DEV CHAR DIODE See paragraph 2 14 2 for details Capacitor leakage current test This test is used to measure the leakage current for a capaci tor The magnitude of the leakage is dependent on the type of dielectric and the applied voltage Figure 2 49 shows the connections for this test A resistor and a diode are used to limit noise for the measurement For this test a fixed voltage BIAS V is applied to the capac itor for specified time intervals to allow the capacitor to charge current decays exponentially with time The leakage current is measured at each interval and stored in the buffer This test is selected and configured from the CONFigure SE QUENCE menu DEV CHAR CAPACITOR See para graph 2 14 2 for details Front Panel Operation 6517A WARNING no INTERNA 5 Z E 6 A PREAME QUT COMMON SOURCE ee 9 9 i PERATOR S HI 7078 TRX Cable Diode DUT Note Ammeter LO internally Ka connected to V Source LO See Paragraph 2 9 1 A Connections I 6517A 65
211. YSTem ZCORrect STATe lt b gt Control Zero Correct lt b gt 0 or OFF Disable Zero Correct 1 or ON Enable Zero Correct ZCORrect Query state of Zero Correct This command is used to enable or disable Zero Correct There are two methods to perform zero correction The first method is consistent with the way zero correction is performed from the front panel That is zero correct is enabled and then this command is used to enable zero cor rect The following command sequence performs zero correction SYSTem ZCHeck ON Enable zero check SYSTem ZCORrect ON Perform zero correction The second method to perform zero correction is to first acquire the zero correct value and then use this command to enable zero correct The zero correction is done with zero check disabled The following command sequence demonstrates this method SYSTem ZCHeck ON Enable zero check SYSTem ZCORrect ACQuire lt Acquire zero correct value SYSTem ZCHeck OFF Disable zero check SYSTem ZCORrect ON Perform zero correction See ZCORrect ACQuire for more information 3 133 IEEE 488 Reference Description 3 22 13 A D Controls Parameters Query Description Parameters Query Description Parameters Query Description 3 134 ZCORrect ACQuire SYSTem ZCORrect AC Quire Acquire zero correct value This command is used to acquire a zero correct value for zero correction The value can only be acquired while zer
212. able auto range AUTO Query autorange on or off These commands are used to control autoranging With autoranging enabled the instrument au tomatically goes to the most sensitive range to perform the measurement see paragraph 2 12 4 for details The ONCE parameter is analogous to a momentary toggle switch When RANGe AUTO ONCE is sent auto range enables and the most sensitive range is selected for the input signal Auto range will then disable but the selected measurement range is retained Note that the in IEEE 488 Reference strument must currently be on the specified function in order for ONCE to be effective Using ONCE while on any other function results in an error The autorange command RANGe AUTO is coupled to the command that manually selects the measurement range RANGe lt n gt When autorange is enabled the parameter value for RANGe lt n gt changes to the automatically selected range value Thus when autorange is dis abled the instrument remains at the automatically selected range When a valid RANGe lt n gt command is sent autoranging disables When using auto range upper and lower range limits can be established to keep the instrument from autoranging to ranges that are not going to be used see AUTO ULIMit and AU TO LLIMit commands NOTE Allow sufficient time for settling when autoranging over multiple ranges or down to the lower current ranges or erroneous readings may occur ULIMit
213. abled a 1MQ resistor is placed in series with the HI VVSOURCE OUT lead to extend the current limit capabilities of the V Source When disabled normal current limit occurs at ImA LIMit STATe SOURce CURRent LIMit STATe Query current compliance This command is used to determine if the V Source has reached its current compliance limit of 1mA The response message is explained as follows 0 Current compliance not reached 1 Current compliance reached 3 21 3 21 1 IEEE 488 Reference STATus subsystem EVENt Description The STATus subsystem is used to control the status registers of the Model 6517A These regis ters and the overall status structure is explained in paragraph 3 8 The commands in this sub system are summarized in Table 3 12 STATus MEASurement EVENt Read Measurement Event Register STATus QUEStionable EVENt Read Questionable Event Register STATus OPERation EVENt Read Operation Event Register STATus OPERation TRIGger EVENt Read Trigger Event Register STATus OPERation ARM EVENt Read Arm Event Register STATus OPERation ARM SEQuence EVENt Read Sequence Event Register These query commands are used to read the event registers After sending one of these com mands and addressing the Model 6517A to talk a decimal value is sent to the computer The binary equivalent of this value determines which bits in the appropriate register are set The event registers are shown in Figures 3 22 t
214. actory default conditions Bench default Function or operation SYSTem PRESet GPIB default RST A D Controls Line Synchronization Off Off Data Stamp Temperature external Off Off Humidity Off Off Hardware Limit On On Buffer Control Fill and stop Fill and stop Count No effect No effect Timestamp No effect No effect Elements No effect No effect Display Yes Yes Clock No effect No effect Communications Interface GPIB or RS 232 No effect No effect GPIB Address No effect No effect Language No effect No effect Talk Only printer setup Interface TEEE 488 TEEE 488 Interval 1 1 Formfeed Off Off Page Size 60 Lines 60 Lines Elements see note see note RS 232 Control send receive or talk only No effect No effect Talk Only printer setup Interval 1 1 Formfeed Off Off Page Size 60 Lines 60 Lines Baud Rate No effect No effect Data Bits No effect No effect Parity No effect No effect Stop Bits No effect No effect Elements see note see note Digital Output States No effect No effect Logic Sense No effect No effect Display Numeric Format Engineering Engineering Scientific Format Floating Exp Floating Exp Decimal Character Period Period Temperature Units C C 2 111 Front Panel Operation 2 112 Table 2 30 cont Factory default conditions Bench default Function or operation SYSTem PRESet GPIB default RST Filter On Off Digital Filter On On Averaging On On
215. ad of clearing all instruments simultaneously as is the case with DCL Program fragment PRINT 1 clear 27 IT Clear 6517A 3 6 7 GET group execute trigger GET is a GPIB trigger that is used as an arm scan and or measure event to control operation The Model 6517A will react to this trigger if it is the programmed control source GET can also be used as the pre trigger for the reading buff er The control source is programmed from the SCPI TRIG ger subsystem With the instrument programmed and waiting for a GPIB trigger the following program fragment will provide the GET Program fragment PRINT 1 trigger 27 Trigger 6517A from over the bus This sends IEEE 488 commands UNT UNL LISTEN 27 GET When the command is executed the trigger event oc curs The command TRIGGER just sends GET Any other listeners are triggered when the command is executed 3 6 8 SPE SPD serial polling The serial polling sequence is used to obtain the Model 6517A serial poll byte The serial poll byte contains impor tant information about internal functions as described in paragraph 3 8 6 Generally the serial polling sequence is used by the controller to determine which of several instru ments has requested service with the SRQ line However the serial polling sequence may be performed at any time to ob tain the status byte from the Model 6517A Program fragment PRINT 1 spoll 27 Serial poll the 6517A INPUT 2 S IT
216. age Enter percentage of stored readings before trigger Reading count Enter count of stored readings before trigger Event Select source for pretrigger event Continuous Store readings in buffer continuously Never Readings are not stored Clear all Clear all stored readings and buffer statistics Timestamp Configure timestamp Type Check or change type Relative Time Reference timestamp to relative time Real Time Reference timestamp to real time Format Select timestamp format Absolute Reference each timestamp to the first buffer reading relative or to the time and date real Delta Reference each timestamp to the previous buffer reading Elements Enable disable optional data elements timestamp humidity external temperature channel and V Source Display Enable disable storage display 2 96 COUNT With this menu selection you specify the number of read ings to store ENTER COUNT This item allows you to specify the buffer size in number of readings The maximum buffer size is sum marized in Table 2 22 The minimum buffer size is one reading Note that with only one reading stored in the buffer the buffer math operations MIN MAX StdDev may not be useful or may not return valid data USE TRIGGER MODEL This selection lets you default to the measure count in the present trigger configuration as long as the measure count is a finite value CONTROL This menu item controls the type of data storage
217. age SPINterval lt NRf gt Parameters Query Description TSEQuence ClResistance SPINterval lt NRf gt lt NRf gt 0 to 99999 9 sec Interval between measurement points SPINterval Query interval This command specifies the time interval between measurement points for the following tests Capacitor Leakage Test Cable Insulation Resistance Test 3 25 23 Test sequence programming example The following QuickBASIC 4 5 program uses the CEC KPC IEEE 488 interface card The stair case sweep test will meaure current at each voltage step The test will sweep from OV to 20V in 2V steps When the test is finished the readings which are stored in the buffer are dumped to the computer and then displayed on the CRT Quick Basic 4 5 CEC KPC card SINCLUDE ieeegb bi CALL initialize 21 0 CLS CALL send 27 RST status CALL send 27 CALC1 STAT OFF status CALL send 27 CLS status CALL spoll 27 KIspoll status IT Configure status model to SRQ on Buffer Full CALL send 27 STAT MEAS ENAB 512 status CALL send 27 SRE 1 status 3 155 IEEE 488 Reference 3 26 UNIT Subsystem 3 156 Parameters Query Description Set to send ascii readings CALL send 27 FORM DATA ASCII status CALL send 27 FORM ELEM READ status Select autoranging amps CALL send 27 SENS FUNC CURR status CALL send 27 SENS CURR RANG AUTO ON status
218. age source Data Store QO Conversion rate Ql One reading per second Q2 One reading every 10 seconds Q3 One reading per minute Q4 One reading every 10 minutes Q5 One reading per hour Q6 Trigger mode Q7 Disabled Voltage Source Value V nnnn nn or V n nnnnEtn Voltage source value 1000V to 1000V 50mV increments Voltage Source Operate 00 Source output off OV Ol Source output on programmed value Data Format GO Reading with prefix NDCV 1 23456E 00 G1 Reading without prefix 1 23456E 00 G2 Reading with prefix and buffer suffix if in B1 NDCV 1 23456E 00 012 Trigger Mode TO Continuous trigger by talk Tl One shot trigger by talk T2 Continuous trigger by GET T3 One shot trigger by GET T4 Continuous trigger by X T5 One shot trigger by X T6 Continuous trigger by external trigger T7 One shot trigger by external trigger SRQ MO Disable SRQ MI Reading overflow N2 Buffer full M8 Reading done M16 Ready M32 Error EOI and Bus Hold Off KO Enable EOI and bus hold off on X K1 Disable EOI enable bus hold off on X K2 Enable EOI disable bus hold off on X K3 Disable both EOI and bus hold off on X Terminator YO LFCR Y1 CRLF Y2 LF Y3 CR Y4 None Device Dependent Command Summary Mode Command Description Status Word UO Status word 617 FRRCZNTOBGDQMMKY Y Ul Error conditions U2 Data conditions U3 Buffer size and readings stored U4 Top display data U5 Bottom display data
219. agraph DATA SOURCE DAV SOURCE VALID ALL READY ACCEPTOR NRFD a ALL ACCEPTED NDAC ACCEPTOR Figure D 2 IEEE 488 handshake sequence Bus commands The instrument may be given a number of special bus com mands through the IEEE 488 interface This section briefly describes the purpose of the bus commands which are grouped into the following three categories 1 Uniline Commands Sent by setting the associated bus lines true For example to assert REN Remote Enable the REN line would be set low true 2 Multiline Commands General bus commands which are sent over the data lines with the ATN line true low 3 Common Commands Commands that are common to all devices on the bus sent with ATN high false 4 SCPI Commands Commands that are particular to each device on the bus sent with ATN false These bus commands and their general purpose are summa rized in Table D 1 D 3 IEEE 488 Bus Overview Table D 1 IEEE 488 bus command summary State of Command type Command ATN line Comments Uniline REN Remote Enable X Set up devices for remote operation EOI X Marks end of transmission IFC Interface Clear X Clears interface ATN Attention Low Defines data bus contents SRQ X Controlled by external device Multiline Universal LLO Local Lockout Low Locks our local operation DCL Device Clear Low Returns device to default conditions SPE Serial Enable Low Enables serial polling
220. ale San Gimignano 38 e 20146 Milano e 02 48 39 16 01 Fax 02 48 30 22 74 JAPAN New Pier Takeshiba North Tower 13F 11 1 Kaigan 1 chome Minato ku Tokyo 105 0022 81 3 5733 7555 Fax 81 3 5733 7556 KOREA 2FL URI Building e 2 14 Yangjae Dong Seocho Gu Seoul 137 888 e 82 2 574 7778 e Fax 82 2 574 7838 NETHERLANDS Postbus 559 e 4200 AN Gorinchem e 0183 63 53 33 Fax 0183 63 08 21 SWEDEN c o Regus Business Centre Frosundaviks All 15 4tr e 16970 Solna e 08 50 90 46 00 Fax 08 655 26 10 TAIWAN 13F 3 NO 6 Lane 99 Pu Ding Road Hsinchu Taiwan ROC e 886 3 572 9077 Fax 886 3 572 9031 5 03 Model 6517A Electrometer User s Manual All references to the Model 6517 also apply to the Model 6517A 1996 Keithley Instruments Inc All rights reserved Cleveland Ohio U S A Third Printing July 2000 Document Number 6517A 900 01 Rev C Manual Print History The print history shown below lists the printing dates of all Revisions and Addenda created for this manual The Revision Level letter increases alphabetically as the manual undergoes subsequent updates Addenda which are released between Revi sions contain important change information that the user should incorporate immediately into the manual Addenda are num bered sequentially When a new Revision is created all Addenda associated with the previous Revision of the manual are incorporated into the new Revision of the manual Each new Revision includes a r
221. alue of this capacitor depends on the particular transistor being used and the max imum current level expected Compensation at maximum current is required because the dynamic impedance will be minimum at this point It should be noted that the response speed at lower currents will be compromised due to the in creasing dynamic impedance which is given by the follow ing formula Z 7 kT ql 0 026 1 25 C Using the above transistors a minimum RC time constant of 100usec at maximum input current would be used At Im max of 100A this value would correspond to 0 4uF Note that at 100nA this value would increase the RC response time constant to 100msec A minimum capacitance of 100pF is recommended Although the input signal to this particular circuit is assumed to be a current conversion to voltage input could be per formed by placing a shunt resistor across the input However the nominal voltage burden of 1mV must be considered as an error signal that must be taken into account Further processing of the current response can be achieved by using the suppress feature For example REL could be enabled with a reference input current applied For all subse quent currents the natural logarithm of the ratio of the mea sured current to the suppressed current would then be displayed Vpisp VreL KT q In IREAp Io In ert Zoll kT q On Uetanllep H 0 26 I In IpEap IREL 25 C NOTE The circuit topology of Figur
222. ammed for another event detection in the layer the bypass loop will not be in effect even though it is still enabled The bypass loop resets be in effect if operation loops back to a higher layer or idle In Arm Layer 1 and Arm Layer 2 enabling a source bypass also enables the respective output trigger In the Trigger Lay er its output trigger is always enabled and occurs after every device action See Output Triggers for more information e MMediate Each time an MMediate command is sent operation loops around the respective control source It is used when you do not wish to wait for the programmed event to occur or when the HOLD control source is selected Note that in Arm Layer 1 and the Trigger Layer MMediate also loops operation around the delays es SIGNal Same function as an MMediate command Delays Arm Layer 2 and the Trigger Layer have a pro grammable Delay 0 to 999999 999 seconds that is asserted after an event detection Note however that a Delay can be bypassed by sending an MMediate or SIGNal command IEEE 488 Reference SYST PRES Interface Changes Idle INIT IMM or and INIT CONT ON SAS 2 Initiate INIT IMM or INIT CONT ON ARM TCONfigure DIRection SOURce Source Bypass Enabled Arm Layer 1 ARM IMMediate ARM COUNt lt n gt INFinite Arm Layer a Arm Event Detection ARM SOURce IMMediate RM SOURce MANual RM SOURce BUS
223. ammed status SPEED The SPEED parameter sets the integration time of the A D converter the period of time the input signal is measure also known as aperture It is discussed in paragraph 2 5 2 FILTER Use this menu item to configure the two basic filter types av eraging and median Note that you can use either the averag ing filter the median filter or both The filter menu is available from the function configuration menus i e press CONFIG V or by pressing CONFIG FIL TER with the desired function already selected All of the pa rameters menu items for FILTER are explained in paragraph 2 17 RESOLUTION The RESOLUTION parameter sets the display resolution It is discussed in paragraph 2 5 2 AUTO DISCHARGE The AUTO DISCHARGE option is used to enable or disable auto discharge When enabled auto discharge resets the charge reading to zero at the specified level After the inte grator resets the charge measurement process simply re starts at zero The AUTO DISCHARGE selections are as follows OFF Use this selection to disable auto discharge With auto discharge disabled you can use zero check to reset the inte grator ON Use this selection to enable auto discharge After select ing ON you will be prompted to enter the discharge level The charge reading will reset every time the specified charge level is reached Note that if you specify a level that exceeds the measurement range the display will ov
224. and after calculation can be viewed with one of the multiple displays as described in paragraph 2 18 8 When necessary the resulting Y value is displayed in scientific notation 2 18 2 Percent This operation lets you specify a target reading value The displayed reading will be expressed as a percentage of the Front Panel Operation target value often in scientific notation The percentage cal culation is performed as follows Input Reading 100 Ee Target Value As an example consider the default target value for percent age calculations where 100 1 000000e 00 Therefore a 1 V input would be 100 of the target value and a typical reading would be displayed as follows 100 000 V With the calculate multiple display selected as described in paragraph 3 18 8 the display would be 100 000 V Reading 1 00000 where the bottom line shows the reading in the units and multiplier prefix of the top line before the percentage calcu lation is performed 2 18 3 Percent deviation The following math calculation provides the percent devia tion between the normal display reading and the user speci fied reference value Dev SE 100 where X is the normal display reading Y is the specified reference value Percent Deviation is enabled through the CONFIGURE MATH menu see paragraph 2 18 7 2 18 4 Deviation The following math calculation provides the deviation be tween the normal display readi
225. andard method resistivity tests or the alternating polarity test NORMAL Use this menu item to select and configure one of the standard method Resistivity Tests SURFACE Use this option to select and configure the Sur face Resistivity Test You will be prompted to enter the pre discharge time bias voltage bias time measure voltage mea sure time and discharge time After entering these test param eters use the EXIT key to back out of the menu structure VOLUME Use this option to select and configure the Vol ume Resistivity Test You will be prompted to enter the pre 2 68 discharge time bias voltage bias time measure voltage mea sure time and discharge time After entering these test param eters use the EXIT key to back out of the menu structure ALT POLARITY Use this menu to select and configure the Alternating Polarity Resistance Resistivity Test You will be prompted to enter the offset voltage alternating voltage mea sure time readings to discard and readings to store After en tering these test parameters use the EXIT key to back out of the menu structure See paragraph 2 14 1 for more details SIR Use this menu item to select and configure the Surface Insulation Resistance Test After selecting SUR INSUL RES TEST you will be prompted to enter the bias voltage bias time measure voltage and measure time After entering these test parameters use the EXIT key to back out of the menu structur
226. anual for information on in stalling the sample in the test fixture When this test is run the V Source will alternate between two voltages V OFS V ALT and V OFS V ALT at timed inter vals MEAS TIME Current measurements are taken at the end of each of these alternations and after calculation of LA resis tance values are computed LA 1S a weighted average of the latest four current measurements each at the end of a separate alterna tion The resistance value is then converted to a resistivity value if the meter has been configured for resistivity measurements The first few readings can be rejected DISCARD XXX RDGS as the sample or resistance achieves a steady state response to the alternating voltage After this the alternation will continue until a specified number of readings STORE XXX RDGS have been stored in the buffer The time required to complete a sequence is STORE DISCARD 4 MEAS TIME For example a se quence alternating at 15 second intervals discarding 3 readings and storing 3 readings will take 2 5 minutes Figure 2 52 shows an example of the Alternating Polarity test using the test parameters shown and the resulting sample cur rent from a typical high resistance sample Note that the sample currents shown exhibit some capacitive decay as many high re sistance samples also tend to have significant capacitance When the Alternating Polarity sequence is first armed by pressing SEQuence and then ENTE
227. ard form the Model 6517A has four coulombs ranges allowing it to measure charge between 10fC and 2 1uC Different charge measurement ranges can be used by placing an external feedback capacitor between the PREAMP OUT and Input HI and then placing the instrument in the external feedback mode Charge is related to capacitance and voltage by the formula Q CV where Q is the charge in coulombs C is the capaci tance in farads and V is the voltage in volts The Model 6517A display will read charge directly in units determined by the value of C For example a 10uF capacitor will result in a displayed reading of 10uC V In practice the feedback capacitor should be greater than 100pF for feedback stability and of suitable dielectric mate rial to ensure low leakage and low dielectric absorption Polystyrene polypropylene and Teflon dielectric capacitors are examples of capacitor types with these desirable charac teristics The capacitor should be mounted in a shielded fix ture like the one in Figure 2 43 To discharge the external feedback capacitor enable zero check The discharge time constant will be given by t LOMO Cpp Allow five time constants for discharge to within 1 of final value 2 11 5 Logarithmic currents The use of a diode junction in the external feedback path per mits a logarithmic current to voltage conversion This rela tionship for a junction diode is given by the equation V mkT q Int lol Ion Whe
228. are Wave Sweep High Level 1V 1V High Time 1 sec 1 sec Low Level 1V 1V Low Time 1 sec 1 sec Cycle Count 10 10 Table 2 30 cont Factory default conditions Front Panel Operation Bench default Function or operation SYSTem PRESet GPIB default RST Test Sequence Staircase Sweep Start 1V 1V Stop 10V 10V Step 1V 1V Step Time 1 sec 1 sec Start Source Manual Manual Triglink Line Line 1 Line 1 Triggers Advanced armed Advanced idled Advanced Measure Layer Source Immediate Immediate Triglink Mode Asynchronous Asynchronous Triglink Input Line 2 Line 2 Triglink Output Line 1 Line 1 Delay 0 0 sec 0 0 sec Count Infinite 1 Control Acceptor Acceptor Scan Layer Source Immediate Immediate Triglink Input Line 2 Line 2 Triglink Output Line 1 Line 1 Delay 0 0 sec 0 0 sec Count Infinite 1 Control Acceptor Acceptor Arm Layer Source Immediate Immediate Triglink Input Line 2 Line 2 Triglink Output Line 1 Line 1 Count 1 1 Control Acceptor Acceptor Basic Trigger Mode Continuous Continuous Trigger Source Immediate Immediate Timer Interval 0 1 sec 0 1 sec V Volts External Feedback Off Off Guard Off Off Range Manual 200V Manual 200V Autorange Off On V Source Range 100V 100V Voltage Limit Off Off Value 1000V 1000V Resistive I Limit Off Off Meter Connect Off Off Zero Check On On Note The default selects all elements except HUM DT and ET 2 115 Front Panel Operation
229. around control source V 3 24 8 TCONfigure Path to configure Triggers 3 24 9 DIRection lt name gt Enable SOURce or disable ACCeptor Bypass ACCeptor DIRection Query direction ASYNchronous Path to configure asynchronous Trigger Link ILINe lt NRf gt Select input line 1 to 6 2 ILINe Query input line OLINe lt NRf gt Select output line 1 to 6 1 OLINe Query output line 3 57 IEEE 488 Reference Table 3 15 Continued Trigger command summary Default Command Description parameter SCPI Ref TRIGger SEQuence 1 Path to program Trigger Layer d IMMediate Loop around control source d 3 24 3 COUNt lt n gt Set measure count 1 to 99999 or INF Note 3 y 3 24 4 COUNt Query measure count d DELay lt n gt Set delay 0 to 999999 999 sec 0 y 3 24 5 DELay Query delay V SOURce lt name gt Select control source HOLD IMMediate TIMer IMMediate Note 2 3 24 6 MANual BUS TLINk or EXTernal SOURce Query control source V TIMer lt n gt Set timer interval 0 to 999999 999 sec 0 1 V 3 24 7 TIMer Request the programmed timer interval V SIGNal Loop around control source d 3 24 8 TCONfigure Path to configure Triggers 3 24 9 PROTocol lt name gt Select protocol ASYNchronous or SSYNchronous ASYNchronous PROTocol Query protocol DIRection lt name gt Enable SOURce or disable ACCeptor Bypass ACCeptor DIRection Query direction AS YNc
230. ary consideration when making charge measurements is the input bias offset current of the integrating amplifier Any such current is integrated along with the input signal and reflected in the final reading The Model 6517A has a maximum input bias of 4fA 4 x 10 A for change at 23 C This input offset translates into a charge of 4fC per second at a temperature of 23 C This value must be subtracted from the final reading to obtain the correct value Input bias current may be reduced by performing the offset adjustment procedure explained in paragraph 2 19 3 OFF SET ADJ EXTERNAL VOLTAGE SOURCE When using an external voltage source the input current should be limited to less than 1mA by placing a resistor in se ries with the high input lead The value of this resistor should be at least R 1000 x V ohms where V is the voltage across the resistor or the compliance of the current being integrated MEASUREMENT TIMES Long measurement times may degrade charge measurement accuracy See the Model 6517A coulombs specifications in Appendix A 2 45 Front Panel Operation ZERO CHECK HOP and AUTO DISCHARGE HOP Using the zero check feature going from the enabled state to the disabled state causes a sudden change in the charge reading and is known as zero check hop This sudden change in charge also occurs when the auto discharge feature resets the charge reading to zero This hop in charge can be elimi nated by tak
231. at the setting is the RESET and factory default condition 2 89 Front Panel Operation Notice that the Model 6517A is reset to BENCH defaults With this selection the electrometer stays armed Since the arm source and scan source are set to Immediate the Model 6517A waits in the measure layer for a trigger To run the test and store the readings in the Model 6517A press STORE on the electrometer enter the desired number of readings 20 and press ENTER The Model 6517A waits with the asterisk annunciator lit for a Trigger Link trigger from the Model 7001 7002 Press STEP on the Model 7001 7002 to start the scan The following explanation on operation is referenced to the oper ation model shown in Figure 2 70 7001or 7002 Press STEP Bypass Wait for Trigger Link Trigger Bypass Wait for Trigger Link Trigger Scan Channel Trigger Output Trigger 7001or Measurement and Output Trigger Trigger 220 Output to source _Trigger Trigger next current LU level 220 and Output Trigger Performed 2 Scans Figure 2 70 Operation model for asynchronous Trigger Link example 2 2 90 A Pressing STEP on the Model 7001 7002 takes it out of the idle state and places operation at point A in the flowchart Since the arm layer is programmed for Immediate Spacing operation drops down to the scan layer at point A Since Scan Trigger Control
232. ates that all pending selected device oper ations are completed and the Model 6517A is ready to accept new commands This bit only sets in response to the OPC query command see paragraph 3 11 6 Bit B1 Not Used Bit B2 Query Error QYE Set bit indicates that you attempted to read data from an empty Output Queue Bit B3 Device dependent Error DDE Set bit indicates that an instrument operation did not execute properly due to some internal condition such as setting conflict errors and buffer sizing nad mismatch errors Bit B4 Execution Error EXE Set bit indicates that the Model 6517A detected an error while trying to execute a command Bit B5 Command Error CME Set bit indicates that a command error has occurred Com mand errors include 1 TEEE 488 2 syntax error Model 6517A received a message that does not follow the defined syntax of the IEEE 488 2 standard 2 Semantic error Model 6517A received a command that was misspelled or received an op tional IEEE 488 2 command that is not implemented 3 The instrument received a Group Execute Trigger GET inside a program message Bit B6 User Request URQ Set bit indicates that the LOCAL key on the Model 6517A front panel was pressed Bit B7 Power On PON Set bit indicates that the Model 6517A has been turned off and turned back on since the last time this register has been read 3 11 4 IDN identification query Read the identifica
233. ax 09 53 06 65 65 3 all e des Garays e 91127 Palaiseau C dex e 01 64 53 20 20 Fax 01 60 11 77 26 Landsberger Strasse 65 e 82110 Germering e 089 84 93 07 40 Fax 089 84 93 07 34 Unit 2 Commerce Park Brunel Road e Theale Berkshire ROT 4AB 0118 929 75 00 Fax 0118 929 75 19 1 5 Eagles Street Langford Town Bangalore 560 025 e 080 212 80 27 Fax 080 212 80 05 Viale San Gimignano 38 e 20146 Milano 02 48 39 16 01 e Fax 02 48 30 22 74 New Pier Takeshiba North Tower 13F 11 1 Kaigan 1 chome e Minato ku Tokyo 105 0022 e 81 3 5733 7555 e Fax 81 3 5733 7556 2FL URI Building 2 14 Yangjae Dong Seocho Gu Seoul 137 888 e 82 2 574 7778 e Fax 82 2 574 7838 Postbus 559 e 4200 AN Gorinchem 0183 63 53 33 Fax 0183 63 08 21 c o Regus Business Centre Frosundaviks All 15 4tr e 16970 Solna e 08 50 90 46 00 Fax 08 655 26 10 13F 3 NO 6 Lane 99 Pu Ding Road Hsinchu Taiwan ROC e 886 3 572 9077 Fax 886 3 572 9031 Copyright 2003 Keithley Instruments Inc Printed in the U S A 5 03
234. bit Serial polling causes bit B6 RQS to re set Serial polling is discussed in more detail later in this paragraph see Serial Poll and SRQ Any of the following operations clear all bits of the Status Byte Register e Cycling power e Sending the CLS common command Status Summary Messages NR 4 Read by Serial Poll i RQS Service STB Q Request OSB B6 Generation Serial Poll B7 Mss ESB B5 Status Byte Register MAV B4 EAV B2 MSB BO QSB B3 B1 OR 4 Read by STB p t OSB B7 SRE SRE ESB B5 Service Request MAV Enable Register B4 EAV B2 MSB BO QSB B3 B1 OSB Operation Summary Bit MSS Master Summary Status RQS Request for Service ESB Event Summary Bit MAV Message Available QSB Questionable Summary Bit EAV Error Available MSB Measurement Summary Bit amp Logical AND OR Logical OR Figure 3 13 Status byte and service request SRQ 3 16 NOTE The MAV bit may or may not be cleared Service Request Enable Register This register is pro grammed by the user and serves as a mask for the Status Summary Message bits BO B2 B3 B4 B5 and B7 of the Status Byte Register When masked a set summary bit in the Status Byte Register cannot se
235. bit B14 65535 Set all bits ENABle Query enable register These commands are used to set the contents of the event enable registers see Figures 3 28 through 3 33 An ENABle command is sent with the decimal equivalent of the binary value that determines the desired state 0 or 1 of each bit in the appropriate register Each event enable register is used as a mask for events see EVENt for descriptions of events When a bit in an event enable register is cleared 0 the corresponding bit in the event register is masked and thus cannot set the corresponding summary bit of the next register set in the sta IEEE 488 Reference tus structure Conversely when a bit in an event enable register is set 1 the corresponding bit in the event register is unmasked When the unmasked bit in the event register sets the summary bit of the next register set in the status structure will set The decimal weighting of the bits for each event enable register are included in Figures 3 28 through 3 33 The sum of the decimal weights of the bits that you wish to set is sent as the pa rameter lt NRf gt for the appropriate ENABle command For example to set the BFL and RAV bits of the Measurement Event Enable Register send the following command stat meas enab 544 where BFL bit B9 Decimal 512 RAV bit B5 Decimal 32 lt NRf amp 544 Bit Position B15 B14 B13 B12 B11
236. ble operate or disable standby V source output OFF y TTL 1 LSENse lt name gt Path to set polarity of digital output line 1 LSENse Select polarity active high AHIGh or active low ALOW AHIGh TTL2 Query polarity of line 1 LSENse lt name gt Path to set polarity of digital output line 2 LSENse Select polarity active high AHIGh or active low ALOW AHIGh TTL3 Query polarity of line 2 LSENse lt name gt Path to set polarity of digital output line 3 LSENse Select polarity active high AHIGh or active low ALOW AHIGh TTL4 Query polarity of line 3 LSENse lt name gt Path to set polarity of digital output line 4 LSENse Select polarity active high AHIGh or active low ALOW AHIGh Query polarity of line 4 3 45 IEEE 488 Reference Table 3 9 ROUTe command summary Default Command Description parameter SCPI Ref ROUTe CLOSe lt list gt Path and command to close specified channel V 3 18 1 STATe Query closed channel V CLOSe lt list gt Query specified channels 1 closed 0 open V OPEN lt list gt Open specified channel or all channels V 3 18 2 OPEN ALL Open all channels V 3 18 3 OPEN lt list gt Query specified channels 1 open 0 closed V SCAN Command path to configure and control scan operations V 3 18 4 INTernal lt list gt Specify internal scan list 2 to 10 channels All 10 V INTernal Query the internal scan
237. ble or disable continuous initiation HALT Use to halt triggers Press TRIG key to resume triggering 2 72 2 15 1 Trigger model The following information describes triggering of the Model 6517A from the front panel The flowchart of Figure 2 56 which is the simplified trigger model summarizes basic front panel triggering The flowchart of Figure 2 57 which is the complete trigger model summarizes advanced front panel triggering Continuous Shot Output Trigger Control Event Source Detection Immediate Manual GPIB External Timer Device Action Figure 2 56 Basic trigger model BASIC TRIGGER MODEL As shown in Figure 2 56 the basic trigger model provides the fundamental trigger options needed for many instrument operations Basic triggering is selected and configured from the BASIC menu item of the CONFIGURE TRIGGER menu Refer to Figure 2 56 for the following explanation of the basic trigger model Idle While in the idle state the instrument cannot perform mea surements The front panel ARM indicator is off when the in strument is in idle Pressing TRIG takes the instrument out of idle ARM indicator turns on Trigger Mode With the continuous trigger mode selected operation contin uously loops around the control source to make measure Front Panel Operation ments device action This trigger mode provides continuous reading conversions With the one shot
238. bration Laine VOltase SWITCH s scssveceescczcsccanseesneacshtvescanins vesbecks Senn cvceasbeieovesScoecevere EES ee Eege TmpPUtsSi stall 35 ivepecdeucescegbaeysSbehivw de teat oceans clays aelys ep ieacvedi occa tues Sil cesadien teas besden cuiehenddedellnesedeuweevvecdevesssveerdenne ts Measurement On 200A E ieesees Bar graph zero at left multiple display cesses ssseecssecseeeceeceseeeesecneceeescesecaesaeesesaesaeeesacsaseesseeseeaedeenees Zero centered bar graph multiple display ecesceeeseesseeeececeeceeseceeeceaeceseeceseecsaeeeeeecseeeeseceeeeeseetedeerees Maximum and minimum multiple display 2 ec ceecceeeecsseeeeceeteceeseceeeceaeceseeceneecsaeseneeeeeeseaeceeeecsseesedeerees Input connector configurations 5sscsscscdscteadesctaessescessassunbcesdetavasenascdsnsenissctavsnsntesthesevacessaevbasssaietavasesedoopers Maximum input EE H Capacitor test circuit without protection Eh Capacitor test Circuit with protection sessies dE EEN styebenstesbevscd scesabveseuseaveessebedesvesvibers Force voltage measure current V SOULCE OUDPUL 23 sisc susie chiveks ses sesubentonspecustevnelsdustaasaesisebiGuceass D AOS E ME Guard shield genee ageEdeSeEge eet Ee Egeter e A E E ove cdsessabassaansbaseausasseustvsuesdessonvsiboans et e EE PO atin V SOURCE scre eege DebeeEeeEE Seege Test fixture to source voltage measure current resistance measurements s ssssessrssssrssrsssereee Multipurpose test GX tite
239. cleared Sets B7 when the trace buffer has become empty Sets B8 when the trace buffer is no longer half full Sets B9 when the trace buffer is no longer full Sets B10 when an Alternating Polarity measurement is being read Sets B11 when the trace buffer pretrigger operations are completed Sets B12 when the out of limits error has cleared Sets B13 when fixture lid is opened Sets B14 when V source comes out of compliance Effects of negative transitions on the Questionable Event Register Questionable event Negative transition effect on Questionable Event Register Volts Summary Amps Summary Temperature Summary Humidity Summary Ohms Summary Coulombs Summary Sequence Test Summary Sets BO when a subsequent valid volts measurement occurs Sets B1 when a subsequent valid amps measurement occurs Sets B4 when a subsequent valid external temperaure reading oc Sets BO when a subsequent valid relative humidity reading occurs Sets B10 when a subsequent valid ohms measurement occurs Sets B11 when a subsequent valid coulombs measurement occurs Sets B12 when the sequence test is re started Effects of negative transitions on the Operation Event Register Operation event Negative transition effect on Operation Event Register Calibrating Trigger layer Arm layer Calculating Idle Sets BO at the end of calibration Sets B5 when leaving the Trigger Layer Sets B6 when leaving an arm layer Sets BO when the readi
240. closes break before make Also included in the device action is the internal settling time delay for the relay Output Triggers In the Arm Layer and Scan Layer the output triggers are enabled only if their respective source by passes are also enabled If a trigger link triglink control source is selected the output trigger pulse is available on the selected TRIGGER LINK output line For all other control 2 75 Front Panel Operation source selections the trigger pulse is available at the METER COMPLETE connector In the Measure Layer the output trigger is always enabled and occurs after every device action If the control source is set for external immediate manual GPIB or timer the out put trigger pulse is available at the METER COMPLETE connector If the trigger link triglink control source is se lected output trigger action occurs on the selected TRIG GER LINK output line as follows e Ifthe asynchronous Trigger Link mode is selected the output trigger pulse is available on the programmed output line e Ifthe semi synchronous Trigger Link mode is selected and the source bypass is disabled the Trigger Link line is released goes high e If the semi synchronous Trigger Link mode is selected and the source bypass is enabled the Trigger Link line is pulled down low and then released Counters All three layers use programmable counters which allow operation to return to or stay in the respective laye
241. controlled enabled or dis ground or to a voltage This will result in abled from the A D CONTROLS DATA STAMP item of erroneous readings The thermocouple the GENERAL MENU Measurement units C F or K are must be electrically insulated before at selected from the DISPLAY TEMP UNITS item of the taching it to a device that is at chassis ground or has a voltage on it 2 129 IEEE 488 Reference 3 1 Introduction This section contains information on remote operation for the Model 6517A and is organized as follows 3 2 Connections Explains instrument connections to the TEEE 488 bus and RS 232 interface 3 3 GPIB address selection Explains how to set the pri mary address from the front panel 3 4 GPIB programming language selection Explains how to select the SCPI or DDC programming lan guage 3 5 QuickBASIC 4 5 programming Summarizes pro gramming using QuickBASIC 4 5 with the KPC 488 2 interface and Universal Language Driver CECHP 3 6 General bus commands Covers the general IEEE 488 commands required for basic operations such as placing the unit in remote 3 7 Front panel aspects of IEEE 488 operation Covers status indicators messages that pertain to bus opera tion and the use of the LOCAL key 3 8 Status structure Explains the various registers and queues that make up the status structure of the Model 6517A 3 9 Trigger model Explains the operation process Trig ger Model over the IE
242. ct for its intended function They must be trained in electrical safety procedures and proper use of the instru ment They must be protected from electric shock and contact with hazardous live circuits Maintenance personnel perform routine procedures on the product to keep it operating properly for example setting the line voltage or replacing consumable materials Maintenance procedures are de scribed in the manual The procedures explicitly state if the operator may perform them Otherwise they should be performed only by service personnel Service personnel are trained to work on live circuits and perform safe installations and repairs of products Only properly trained ser vice personnel may perform installation and service procedures Keithley products are designed for use with electrical signals that are rated Measurement Category I and Measurement Category II as described in the International Electrotechnical Commission IEC Standard IEC 60664 Most measurement control and data I O sig nals are Measurement Category I and must not be directly connect ed to mains voltage or to voltage sources with high transient over voltages Measurement Category II connections require protection for high transient over voltages often associated with local AC mains connections Assume all measurement control and data I O connections are for connection to Category I sources unless other wise marked or described in the Manual Exercise ext
243. ct output trigger line scan layer TRIGger SEQuence 1 TCONfigure ASYNchronous OLINe lt NRf gt Select output trigger line measure layer lt NRf gt 1 Line 1 lt NRf gt 4 Line 4 2 Line 2 5 Line 5 3 Line 3 6 Line 6 OLINe Query programmed output line These commands are used to select an output line for the asynchronous Trigger Link of the spec ified layer Keep in mind that asynchronous Trigger Link input and output cannot share the same line If you assign the output to a line that is already being used for the input an error occurs and the command is ignored Parameters Query Parameters IEEE 488 Reference SSYNchronous LINE lt NRf gt TRIGger SEQuence 1 TCONfigure SSYNchronous LINE lt NRf gt Specify semi synchronous Trigger Link line for measure layer lt NRf gt 1 Line 1 lt NRf gt 4 Line 4 2 Line 2 5 Line 5 3 Line 3 6 Line 6 LINE Query programmed output line This command is used to select one of the six trigger lines for the semi synchronous Trigger Link 3 24 10 RTCLock commands Parameters Query Description Parameters Query Description The following commands are used to specify the date and time for the RTCLock control source see paragraph 3 24 6 for details DATE lt yr gt lt mo gt lt day gt ARM SEQuence 1 LAYer RTCLock DATE lt yr gt lt mo gt lt day gt Set date for RTCLock control source lt yr gt 1994 to 2093 Specify year
244. ct this option to use the SCPI program ming language to control the instrument DDC Select this option to use Device Dependent Command programming This mode allows you control both a Model 6517A and a 617 electrometer over the GPIB using the same DDC commands See Section 3 of this manual for details 2 116 TALK ONLY In the talk only mode the Model 6517A ig nores commands from the bus and merely outputs data as re quested by the printer When the instrument is in the talk only mode the TALK annunciator turns on The options for TALK ONLY are explained as follows e INTERFACE With the IEEE 488 option of this item data elements are sent to an IEEE 488 bus printer set for listen always With the CENTRONICS option data el ements are sent to a printer with a Centronics parallel interface The printer must be connected with a Model 8530 IEEE 488 to Centronics Printer Adapter Cable e INTERVAL The INTERVAL option controls how often readings are printed expressed as 1 out of nnnn readings e FORMFEED Use the FORMFEED option of the menu to enable or disable the sending of a formfeed character to the printer after printing a user selectable number of lines per page 1 255 lines ELEMENTS This menu item lets you select the data ele ments sent Use one of the range keys to toggle between yes y and no n e RDG The numeric value of the reading e RDG The buffer location of the reading The read
245. d For more information on the No Operation Pending flag refer to paragraphs 3 11 5 OPC and 3 11 6 OPC ABORt Abort operation When this action command is sent the Model 6517A aborts operation and returns to the top of the Trigger Model If continuous initiation is disabled the instrument goes the idle state If con tinuous initiation is enabled operation continues on into Arm Layer 1 The abort command resets the source bypasses of the Trigger Model If scanning the scan point er resets back to the first channel in the scan list 3 24 3 3 24 4 3 24 5 IMMediate Description COUNt lt n gt Parameters Query Description DELay lt n gt Parameters Query Description IEEE 488 Reference ARM SEQuence 1 LAYer 1 IMMediate Bypass arm control source ARM SEQuence 1 LAYer2 IMMediate Bypass scan control source and delay TRIGger SEQuence 1 IMMediate Bypass measure control source and delay These action commands are used to bypass the specified control source of the Trigger Model They are used when you do not wish to wait for the programmed event Note from the Trigger Model Figure 3 14 that arm lay2 imm and trig imm also bypass the delay The instrument must be waiting for the appropriate event when this command is sent Other wise an error occurs and the command is ignored When the command is sent the bypass occurs and operation continues on ARM SEQuence 1 LAYer 1
246. d Method Resistivity Tests SURFACE Surface Resistivity Test PRE DISCH Specify pre discharge time 0 2 sec BIAS V Specify bias voltage 500V BIAS TIME Specify bias time 1 sec MEAS V Specify measurement voltage 500V MEAS TIME Specify measurement time 0 sec DISCHARGE Specify discharge time 2 sec VOLUME Volume Resistivity Test PRE DISCH Specify pre discharge time 10 sec BIAS V Specify bias voltage 500V BIAS TIME Specify bias time 1 sec MEAS V Specify measurement voltage 500V MEAS TIME Specify measurement time 0 sec DISCHARGE Specify discharge time 2 sec when the Model 6517A receives a trigger via the selected trigger link line Note that the TRIG key can instead be used 2 69 Front Panel Operation Table 2 20 cont CONFIGURE SEQUENCE menu structure Default Menu item Description parameter ALT POLARITY Alternate Polarity Test V OFS Specify offset voltage OV V ALT Specify alternating voltage 10V MEAS TIME Specify measurement time 15 sec DISCARD RDGS Specify discarded readings 3 STORE RDGS Specify readings to store 1 SIR SUR INSUL RES TEST Surface Insulation Resistance Test BIAS V Specify bias voltage 50V BIAS TIME Specify bias time 1 sec MEAS V Specify measurement voltage 100V MEAS TIME Specify measurement time lsec SWEEP Sweep Tests SQUARE WAVE Square Wave Sweep Test HI LEVEL Specify high level voltage 1V HI TIME Specify time at high level sec LO LEVEL Speci
247. d Warning Cal Calibration Summary Seq Sequence Test Summary Temp Temperature Summary Coul Coulombs Summary Amp Amps Summary Hum Humidity Summary Volt Volts Summary Figure 3 29 Questionable Event Enable Register 3 115 IEEE 488 Reference 3 116 Bit Position Event Decimal Weighting Value Figure 3 30 Operation Event Enable Register Figure 3 31 B15 B12 B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 BO Seq Idle Calc Am Trig Cal 2048 1024 512 64 32 SS S Sa eg 1 1011 210 29 26 25 20 0 1 0 1 0 1 1 0 1 OI Value 1 Enable Operation Event Events RS 232 RS 232 Interface Error 0 Disable Mask Operation Event Idle Idle state of the 6517A Arm Waiting for Arm Trig Waiting for Trigger Meas Measuring Cal Calibrating Bit Position B15 B2 B1 BO Event Seq1 Decimal Weighting 2 21 Value o1 Value 1 Enable Trigger Event 0 Disable Mask Trigger Event Trigger Event Enable Register Figure 3 32 Arm Event Enable Register Event Seq1 Sequence 1 Bit Position Event Decimal Weighting Value Value 1 Enable Arm Event B15 B2 B1 BO Event Seq1 Sequence 1 0 Disable Mask Arm Event 3 21 3 IEEE 488 Reference
248. d be set for CRLF as follows OPEN ieee FOR OUTPUT AS 1 OPEN ieee FOR INPUT AS 2 PRINT 1 intem crlf A typical program fragment includes an OUTPUT command and an ENTER command The OUTPUT command sends a program message command string to the Model 6517A If the program message includes a query command then the ENTER command is required to get the response message from the Model 6517A The ENTER command addresses the Model 6517A to talk The following example program fragment demonstrates how OUTPUT and ENTER are used Note that the commands assume address 27 which is the fac tory set address of the Model 6517A PRINT 1 output 27 func volt ac func PRINT 1 enter 27 If you wish to display the response message on the CRT the computer will have to read the message and then printed it to the CRT display as follows LINE INPUT 2 AS PRINT AS The following programming example shows how all the above statements are used together The program fragment is shown in bold typeface OPEN ieee FOR OUTPUT AS 1 Open driver OPEN ieee FOR INPUT AS 2 Open driver PRINT 1 intemm crlf IT CRLF terminator Select volts and query PRINT 1 output 27 func volt dc func PRINT 1 enter 27 Get response messag LINE INPUT 2 A IT Read response messag PRINT AS Display message 3 6 General bus commands General bus commands are those commands such as DC
249. d measured 2 16 Buffer The Model 6517A has a buffer to store reading data The max imum possible number of stored readings depends on how many optional data elements are selected Table 2 22 shows the minimum guaranteed values of the MAX value for vari ous element choices The basic data elements include the reading units reading and status overflow or underflow The reading indicates the location of the reading in the buffer In addition to these items recalled data also includes statistical information such as minimum maximum average and standard deviation which are part of the NEXT displays see paragraph 2 16 3 Optional data elements include timestamp humidity exter nal temperature and channel number for scanning When selected the timestamp is available on the primary display along with the reading If a scan was performed the channel number will also be displayed along with the reading if it was selected as a data element Humidity and external tempera ture are available as a NEXT display see paragraph 2 16 3 The following paragraphs discuss configuration of the buffer as well as recalling buffered data The CONFIG DATA STORE menu structure is shown and summarized in Table 2 23 Front Panel Operation Table 2 22 Maximum buffer readings Buffer elements CHANNEL TIMESTAMP ETEMperature HUMIDITY VSOURCE Max Buffer Size 0 0 0 0 0 15706 0 0 0 1 0 11779 0 0 1 0 0 11779 0 0 1 1 0 9423 0
250. d returns to OCIS When used with the INITiate or INITiate CONTinuous ON command the OPC bit of the Stan dard Event Status Register will not set until the Model 6517A goes back into the idle state The initiate operations are not considered finished until the instrument goes into the idle state NOTE The INITiate POFLag command see paragraph 3 24 1 is used to include or exclude the No Operation Pending flag in the internal process of determining whether all pending operations of an initiate command are completed When used with the TRG command the OPC bit will not set until the operations associated with the TRG command and the initiate command are finished The TRG command is con sidered to be finished when the Device Action completes or when operation stops at a control source to wait for an event see Trigger Model in paragraph 3 9 In order to use OPC exclusively with the TRG command you will have to first force the com pletion of the initiate command so that only the TRG command is pending To do this send the ABORt command to place the instrument in idle which by definition completes the initiate command Since continuous initiation is on operation continues on into the Trigger Model Af ter sending the TRG command the OPC bit sets when the TRG command is finished GOSUB ReadRegister Clear register by reading it PRINT 1 output 27 init cont off abort Place 6
251. dard Std 488 2 1987 lists the documentation requirements Table E 1 provides a summary of the require ments and provides the information or references the manual for that information Table E 1 IEEE 488 documentation requirements Requirement Description or reference 1 TEEE 488 Interface Function Codes See Appendix B 2 Behavior of 6517A when the address is set outside the Cannot enter an invalid address range 0 30 3 Behavior of 6517A when valid address is entered Address changes and bus resets 4 Power On Setup Conditions Determine by SYSTem POSetup para 3 22 2 5 Message Exchange Options a Input buffer size 256 bytes b Queries that return more than one response message None unit c Queries that generate a response when parsed All queries Common Commands and SCPI d Queries that generate a response when read None e Coupled commands See Table E 2 6 Functional elements required for SCPI commands Contained in SCPI command subsystems tables see Tables 3 4 through 3 16 7 Buffer size limitations for block data Block display messages Top display 20 characters max bottom display 32 characters max 8 Syntax restrictions See paragraphs 3 10 through 3 25 9 Response syntax for every query command See paragraphs 3 10 through 3 25 10 Device to device message transfer that does not follow None rules of the standard 11 Block data response size See paragraph 3 15 12
252. ding Underflow RAV Reading Available HL2 High Limit 2 LL2 Low Limit 2 HL1 High Limit 1 LL1 Low Limit 1 ROF Reading Overflow Figure 3 22 Measurement Event Register IEEE 488 Reference Questionable Event Register Bit BO Volts Summary Volt Set bit indicates that na invalid volts measurement has oc curred PTR or a subsequent valid volts measuurement has occurred NTR Bit B1 Amps Summary Amp Set bit indicates that an invalid amps measurement has oc curred or a subsequent valid amps measurement has occurred NTR Bits B2 and B3 Not used Bit B4 Temperature Summary Temp Set bit indicates that an invalid external tempera ture measurement has occurred PTR or a subsequent valid temperature measurement has oc curred NTR Bit B5 B6 and B7 Not used Bit B8 Calibration Summary Cal Set bit indicates that an invalid calibration constant was detected during the power up sequence PTR The instrument will instead use a default calibra tion constant This error will clear after successful calibration of the instrument Bits B9 Humidity Summary Hum Set bit indicates that an invalid relative humidity mea surement has occurred PTR or a subsequent valid temperature measurement has occurred NTR Bits B10 Ohms Summary Ohm Set bit indicates that an invalid ohms measurement has occurred PTR or a subsequent valid ohms measurement has occurred NTR Bits B11 C
253. e Average 1 6345e 00 The equation used to calculate the mean is where x is a stored reading and nis the number of stored readings Note If n 0 the result is NAN not a number 6 StdDev This operation displays the standard deviation of the stored readings for example StdDev 1 4944e 03 2 100 The equation used to calculate the standard deviation is 2 l n n gt Xi i 1 n 1 n E y Il where x is a stored reading and nis the number of stored readings Note If n lt 1 the result is NAN not a number NOTE These statistics are invalid if the measure ment function changed during data store e g when scanning different functions The Model 6517A uses IEEE 754 floating point format for math calculations The last display in this series allows you to dump the buff ered readings to a printer See paragraph 2 19 2 for details on configuring printers 2 17 Filters Filtering stabilizes noisy measurements caused by noisy in put signals The Model 6517A uses two types of filters digital and me dian The displayed stored or transmitted reading is simply the result of the filtering processes Note that both the digital and median filters can be in effect at the same time When FILTER is enabled the selected filter configuration for that measurement function is in effect Filtering is en abled by pressing the FILTER key FILT annunciator turns on Pre
254. e SWEEP Use this menu item to select and configure one of the sweep tests SQUARE WAVE Use this option to select and configure the Square Wave Sweep Test You will be prompted to enter the high level voltage time at the high level low level volt age and time at the low level After entering these test pa rameters use the EXIT key to back out of the menu structure STAIRCASE Use this option to select and configure the Staircase Sweep Test You will be prompted to enter the start voltage stop voltage step voltage and the step time After entering these test parameters use the EXIT key to back out of the menu structure CONTROL This menu item is used to select the trigger source that will start the armed test The SEQ key is used to arm the selected test see paragraph 2 14 3 MANUAL Use this option to select the manual trigger source Once the test is armed it will start when the TRIG key is pressed IMMEDIATE Use this option to select the immediate trig ger source The test will start as soon as it is armed LID CLOSURE Use this option to select the lid of the Model 8009 or 8002A test fixture as the trigger source Once the test is armed it will start when the lid of the test fixture is closed GPIB Use this option to select the GPIB trigger source Once the test is armed it will start when the Model 6517A receives a bus trigger GET or TRG Note that the TRIG key can instead be used to start the test
255. e lect the volts V function The Z CHK key toggles zero check between the on and off states NOTE The input circuit configuration changes with zero check enabled See paragraph 2 13 for details 2 Enable or disable guard as needed Guard is controlled from the GUARD option of the Voltage Configuration menu see paragraph 2 5 2 NOTE The Grd message on the display indi cates that guard is enabled on 3 To achieve optimum accuracy for low voltage measure ments it is recommended that you zero correct the instru ment To do so select the lowest measurement range 2V and press REL The REL indicator turns on and the ZCor message is displayed Correcting zero on the low est range will correct all ranges because of internal scaling NOTE If guard is enabled the ZCor message will replace the Grd message Keep in mind that guard is still enabled even though the Grd message is not displayed Select a manual measurement range that is consistent with the expected reading or enable auto range see paragraph 2 12 for detailed range information Connect the Model 6517A to the voltage to be mea sured Figure 2 20 shows typical connections for un guarded measurements and Figure 2 21 shows typical connections for guarded measurements WARNING Hazardous voltage may be present on the inner shield of the triax cable when GUARD is on A safety shield connect Front Panel Operation
256. e if the scan list is made up of four channels you can program a count of 12 With this count value the instrument repeats the scan three times An advantage of repeating channels rather than scans is that delays in the scan layer of operation are avoided The mea sure layer delays among all 12 channels are the same INFINITE Use this selection to continuously repeat mea surements and looping in the measure layer ENTER CHAN COUNT With this selection the user deter mines the number of readings per scan You can program the Model 6517 to measure up to 99999 times CONTROL Use this menu item to enable or disable the source bypass The source bypass is used to bypass the measure event on the first pass through the measure layer SOURCE With this selection the source bypass is enabled The measure event will be bypassed on the first pass through the scan layer This allows operation to proceed to the Delay and Device Action without having to wait for the pro grammed event ACCEPTOR With this selection the source bypass is dis abled Configuring scan layer The scan layer is used for the following operations e To select the scanning event SOURCE for the instru ment e To delay operation in the scan layer e To designate the number of scan sequences the instru ment will perform COUNT e To enable or disable the Source Bypass The scan layer is configured from the SCAN item of the AD VANCED menu SOURCE
257. e to allow any charge to dissipate The V Source will then apply a spec ified voltage BIAS V to the electrodes of the test fixture for a specified time BIAS TIME This bias period allows currents in the test circuit to stabilize The V Source then ap plies the test voltage MEAS V and after a specified delay MEAS TIME the Model 6517A measures the resistivity of the sample and stores the reading in the buffer Note that the test voltage MEAS V is typically at the same level as the bias voltage BIAS V 2 64 The Surface Resistivity Test and the Volume Resistivity Test are selected and configured from the CONFIGURE SE QUENCE menu R RESISTIVITY NORMAL SURFACE and VOLUME See paragraph 2 14 2 for details Alternating Polarity Resistance Resistivity test The Alternating Polarity Resistance Resistivity test is de signed to improve high resistance resistivity measurements These measurements are prone to large errors due to back ground currents By using an alternating stimulus voltage it is possible to eliminate the effects of these background cur rents This test will measure Surface or Volume resistivity or Resistance as selected in the CONFIGURE RESIS TANCE menu For detailed information on resistivity mea surements refer to paragraph 2 7 2 Figures 2 33 and 2 35 show the test circuits for the respective measurements and Figure 2 36 shows the connections to the Model 8009 Refer to the Model 8009 Instruction M
258. e 2 44 works for positive input currents only For bipo lar input signals an external offset bias must be applied or use a PNP transistor for Q1 2 11 6 Non decade current gains The Model 6517A electrometer input uses internal decade resistance feedback networks for the current ranges In some applications non decade current gains may be desirable As shown in Figure 2 45 an external feedback resistor Rpg can be used to serve this purpose Limitations on the magnitude of the feedback current require that the value of Rpg be greater than 10 Q 2 12 Range and resolution The range and resolution setting fixed or auto for each mea surement function are saved when changing functions 2 12 1 Measurement range The measurement range affects the accuracy of the measure ment as well as the maximum signal that can be measured The measurement ranges for each function are listed in the specifications The maximum input signal level for voltage current and charge measurements is 105 of the measure ment range For example the maximum signal level on the 2V range is 2 1V 2V x 1 05 2 1V When the integrated average input level exceeds the selected range the OVER FLOW message will be displayed However if a stray out of range transient such as a noise spike occurs the message OUT OF LIMIT will be displayed assuming the integrated Front Panel Operation signal level is still within the selected range For details on
259. e beginning of a program message is optional and need not be used Example Stat pres stat pres C When the path pointer detects a colon it will move down to the next command level An exception is when the path pointer detects a semicolon which is used to separate commands within the program message see next rule D When the path pointer detects a colon that immediately follows a semicolon it resets back to the root level E The path pointer can only move down It cannot be moved up a level Executing a com mand at a higher level requires that you start over at the root command 4 Using common commands and SCPI commands in same message Both common com mands and SCPI commands can be used in the same message as long as they are separated by semicolons A common command can be executed at any command level and will not affect the path pointer Example stat oper enab lt NRf gt ptr lt NRf gt ESE lt NRf gt ntr lt NRf gt 5 Program Message Terminator PMT Each program message must be terminated with an LF line feed EOI end or identify or an LF EOI The bus will hang if your computer does not provide this termination The following example shows how a multiple command program message must be terminated rout open all scan 1 5 lt PMT gt 6 Command execution rules A Commands are executed in the order that they are presented in the program message B An invalid command will generate
260. e bus With EXTernal selected the test will start when an external trigger is received via the EXT TRIG IN connector on the rear panel With TLINK selected the test will start when an external trigger is received via the TRIG LINK connector on the rear panel The TLINe command is used to select which trigger link line to use for the input trigger With LCLOsure selected the test will start when the test fixture lid is closed This will only work for test fixtures such as the Models 8002A and 8009 that incorporate the safety interlock feature If any sequence is armed when this command is sent it will not take effect until the next sequence arm event TLIne lt NRf gt TSEQuence TLIne lt NRf gt Specify trigger link line lt NRf gt 1 Line 1 lt NRf gt 4 Line 4 2 Line 2 5 Line 5 3 Line 3 6 Line 6 TLINe Query trigger link line This command is used to specify the input trigger link line for the TLINk control source This command is not used if a different control source is selected see TSOUrce TSEQuence DLEakage STARt lt NRf gt Start voltage diode leakage test TSEQuence STSWeep STARt lt NRf gt Start voltage staircase sweep test lt NRf gt 100 0 to 100 0 Volts 100V range 1000 to 1000 Volts 1000V range 3 149 IEEE 488 Reference Query Description 3 25 3 STOP lt NRf gt Parameters Query Description 3 25 4 STEP lt NRf gt Parameters Query Description 3 25 5 Pa
261. e for Amps SENSe 1 RESistance REFerence STATe lt b gt Control reference for Ohms SENSe 1 CHARge REFerence STATe lt b gt Control reference for Coulombs lt b gt lorON Enable reference 0 or OFF Disable reference STATe Query state of reference These commands are used to enable or disable Reference for the specified function When en abled the displayed reading will include the programmed reference value see REFerence lt n gt and ACQuire When disabled the displayed reading will not include the reference value ACQuire SENSe 1 VOLTage DC REFerence ACQuire Acquire Reference Volts SENSe 1 CURRent DC REFerence ACQuire Acquire Reference Amps SENSe 1 RESistance REFerence ACQuire Acquire Reference Ohms SENSe 1 CHARge REFerence ACQuire Acquire Reference Coulombs When one of these commands is sent the measured input signal is acquired and established as the reference value This command is typically used to zero the display For example if the in strument is displaying a 1nA offset sending this command and enabling Reference see STATe zeroes the display This command is functional only if the instrument is on the specified measurement function Sending this command while in any other function causes an error Also if the latest reading is 3 19 8 IREFerence lt b gt Parameters Query Description 3 19 9 DIGits lt n gt Parameters Query Description IEEE 488 Reference
262. e it requires the CAL switch to be pressed The option allows you to change the calibration date and next calibration date Refer to the Model 6517 Service Manual for instructions OFFSET ADJ Use this menu item to calibrate voltage burden and input off set current After selecting OFFSET ADJ you will be prompted to connect a short to the input triax connector and then press ENTER The message Performing V offset cali bration will be displayed while calibration is in process When finished you will be prompted to remove the short cap the triax input connector and then press ENTER The message Performing I Bias calibration will be displayed while calibration is in process 2 117 Front Panel Operation 2 19 4 TEST The SELF TEST MENU is used as a diagnostic tool to iso late problems with the Model 6517A Information on using these test procedures is included in the optional Model 6517 Service Manual 2 19 5 LIMITS The LIMITS menu is used for the following operations e To set and control the limit values that determine the PASS FAIL and HI LO status of subsequent measure ments e To set the digital output patterns that signify passing or failing limit checks e To enable disable a binning strobe signal on digital out put 4 for triggering a user supplied device handler NOTE Since the logic sense of the digital output lines is programmable high true or low true this discussion of limits uses the
263. e set to Immediate e The count values in all three layers of the Trigger Model are set to one 1 e The delay in all three layers of the Trigger Model are set to zero 0 Program fragment Description Program fragment IEEE 488 Reference e The Model 6517A is placed in the idle state e All math calculations are disabled e Buffer operation is disabled A storage operation currently in process will be aborted e Autozero controls are set to the RST default values e The acquisition method is set to normal e All operations associated with switching cards scanning are disabled This command is automatically asserted when the MEASure command is sent PRINT 1 output 27 conf res Perform CONFigure operations READ This command is typically used to acquire a post processed reading after the instrument has been configured by the CONFigure command The CONFigure command places the instru ment in a one shot measurement mode Every time the READ command is then sent a mea surement conversion will occur and the reading will be acquired When this command is sent the following commands will be executed in the order that they are presented ABORt INITiate FETCh When ABORt is executed the instrument will go into the idle state if continuous initiation is disabled Otherwise operation will re start at the beginning of the Trigger Model If the instrument is in the idle state INITiate will tak
264. e shot trigger mode This command is used to specify the basic trigger mode With CONTinuous triggering the Model 6517A will continuous trigger readings after the selected source event occurs see SOURce With ONEShot selected a single reading will be triggered every time the selected source event occurs SOURce lt name gt SYSTem MACRo TRIGger SOURce lt name gt Specify control source lt name gt IMMediate Immediate triggering MANual Manual trigger event BUS Bus trigger event EXTernal External trigger event TIMer Timer trigger event This command is used to specify which control source will be used as the trigger event for instru ment readings If in the continuous trigger mode see MODB the instrument will continuously make readings when the specified event occurs If in the one shot mode each event will cause a single reading to occur With IMMediate selected the trigger event will be satisfied immediately In IMMediate readings will be made continuously With MANual selected the trigger event occurs when the front panel TRIG key is pressed Note that the instrument must be in local in order for the TRIG key to be active With BUS selected the trigger event occurs when a bus trigger TRG or GET is sent With EX Ternal selected the trigger event occurs when an input trigger is received via the rear panel EXT TRIG IN connector While in the one shot mode with TIMer selected trigger events occur at a programmed ti
265. e that the V Source for Auto V Source Ohms is controlled from the SENSe Subsystem see paragraph 3 19 6 Ohms ranges OUTPut2 Subsystem LSENse lt name gt OUTPut2 TTL 1 LSENse lt name gt Set polarity of line 1 OUTPut2 TTL2 LSENse lt name gt Set polarity of line 2 OUTPut2 TTL3 LSENse lt name gt Set polarity of line 3 OUTPut2 TTL4 LSENse lt name gt Set polarity of line 4 lt name gt AHIGh Set polarity of specified line to active high ALOW Set polarity of specified line to active low LSENse Query polarity of specified line These commands are used to set the polarity of the digital output lines When set for active high AHIGh polarity the specified output line is true ON when the output level is high The output line is false OFF when the output level is low When set for active low ALOW polarity the output line is true ON when the output level is low The output line is false OFF when the output level is high The logic levels true or false of the digital output lines are set from the SOURce Subsystem see paragraph 3 19 IEEE 488 Reference 3 18 ROUTe subsystem 3 18 1 3 18 2 CLOSe lt list gt Parameters Query Description Description OPEN lt list gt Parameters Query Description The commands in this subsystem are used to configure and control switching and are summa rized in Table 3 9 ROUTe CLOSe lt list gt Close specified channel lt list g
266. e the instrument out of the idle state If continuous initiation is enabled INITiate CONTinuous ON then the INITiate command will generate an error and ignore the command The FETCh for details Note that an Init ignored error will not cancel the execution of the FETCh command PRINT 1 output 27 conf res IT Select one shot ohms PRINT 1 output 27 read Perform READ operations PRINT 1 enter 27 IT Get response message from 6517A 3 39 IEEE 488 Reference 3 40 sMEASure lt function gt 2 where lt function gt VOLTage DC CURRent DC RESistance CHARge Volts function Amps function Ohms function Coulombs function This command combines all of the other signal oriented measurement commands to perform a one shot measurement and acquire the reading When this command is sent the following commands are executed in the order that they are pre sented IEEE 488 Reference SCPI command subsystems SCPI commands are categorized into subsystems and are summarized in Tables 3 4 through 3 16 Following the tables the subsystems are covered in the following alphabetical order 3 13 3 19 3 20 3 21 3 22 3 23 3 24 3 25 3 26 Calculate subsystems Use CALCulate1 to configure and control the math operations Use CALCulate2 to manipulate readings stored in the buffer and use CALCulate3 to configure and control the limit tests CALibrate
267. e timestamp and relative time timestamp The real time timestamp provides the time 24 hour clock format and date for each reading sent over the bus The relative timestamp operates as a timer that starts at zero seconds when the instrument is turned on or when the relative timestamp is reset S YSTem TSTamp RELative RESet The timestamp for each reading sent over the bus is referenced in seconds to the start time After 99 999 999999 seconds the timer resets back to zero and starts over Timestamp is also available for buffer readings Timestamp can be referenced to the first reading stored in the buffer absolute format which is timestamped at 0 seconds or can provide the time between each reading delta format The TRACe TSTamp FOR Mat command is used to select the absolute or delta format For the delta format real time timestamp is expressed as the days hours minutes and seconds between each reading while the relative timestamp is expressed as seconds between each reading When using the absolute format for the relative timestamp any pre trigger readings will have a negative timestamp STATus This element indicates if the reading is normal N overflowed O or referenced R to another value zero Z underflow U out of limits L This element is not available for the binary formats HUMidity Relative humidity can be read by connecting and enabling the Model 6517 RH hu midity probe to the instrument The humidity probe i
268. e uA 2 19 Menu The main menu accesses the various instrument operations for which there are no dedicated keys such as setup storage communication setup calibration self test and limits The main menu structure is summarized in Table 2 29 The top level of the main menu is displayed by placing the instrument in the reading display state and then pressing the MENU key General rules to navigate the menu levels are provided in paragraph 2 3 5 2 107 Front Panel Operation Table 2 29 MAIN MENU STRUCTURE Menu item Description SAVESETUP Setup menu SAVE Save setup at a memory location 0 9 RESTORE Return 6517A to setup stored at a memory location 0 9 POWERON Power on Menu BENCH Power on to bench default setup conditions GPIB Power on to GPIB default setup conditions USER SETUP NUMBER Power on to setup stored at a memory location 0 9 RESET Reset Menu BENCH Return 6517A to bench default setup GPIB Return 6517A to GPIB default setup COMMUNICATION Communications Menu GPIB Select and configure GPIB ADDRESSABLE Addressable menu ADDRESS Check change IEEE 488 bus address 0 30 LANGUAGE Select SCPI or DDC language TALK ONLY GPIB Printer Talk only mode menu INTERFACE Select printer interface TEEE 488 Specify IEEE 488 printer CENTRONICS Specify Centronics parallel printer INTERVAL Specify printing interval every reading to 1 out of 9999 FORMFEED Formfeeds menu CONTROL Enable disable page breaks
269. e year If no calibration date is set the display shows that it is due now See the Model 6517 Service Man ual to set the calibration due date and paragraph 2 19 3 of this manual to set the display option After the power up sequence the instrument begins its nor mal display with zero check enabled Zero Check dis played Power up error messages Error messages that may be displayed during power up are summarized in Table 2 3 These are shown when one of the checksum tests of Table 2 2 fails Front Panel Operation Table 2 2 Data checked on power up Data Type of storage TEEE 488 address Electrically erasable PROM Power on default Electrically erasable PROM Calibration constants Electrically erasable PROM Calibration dates Electrically erasable PROM Instrument setups 10 in electrically erasable PROM Reading buffer Non volatile RAM Table 2 3 Power up error messages Message Action Error 515 The cal dates are set to factory Calibration dates lost default values but they are not stored into EEPROM To do this perform a compre hensive calibration Cal constants are set to factory default values but they are not stored into EEPROM To do this perform a comprehensive calibration Power on defaults are reset to factory defaults bench and stored into EEPROM GPIB address is reset to factory default 27 and stored into EEPROM Error 510 The reading buffer controls are Readin
270. easurement configuration allows EXTERNAL With this selection external triggers are used to control the measure source Each trigger stimulus applied to the Model 6517A performs a device action as defined by the trigger model In addition to a measurement this may in Front Panel Operation clude range changing filtering calculations data storing scanning and other operations The external trigger is applied to the rear panel EXTER NAL TRIGGER BNC connector See paragraph 2 15 4 for detailed information on external triggering NOTE The front panel TRIG key see MANU AL is active with external triggering se lected Pressing the TRIG key performs a device action MANUAL With this selection the front panel TRIG key controls the measure source A device action is performed when the TRIG key is pressed NOTE The front panel TRIG key is active when EXTERNAL GPIB TRIGLINK or TIM ER is selected GPIB With this selection bus triggers control the measure source When the Model 6517A receives a bus trigger GET or TRG it performs a device action as defined by the trig ger model In addition to a measurement this may include range changing filtering calculations data storing scanning and other operations See Section 3 for detailed information on bus triggers NOTE The front panel TRIG key see MANU AL is active with bus triggering selected Pressing the TRIG key performs a device action
271. ecify one or more switching channels Examples ROUTe SCAN 1 10 Specify scan list 1 through 10 ROUTe SCAN 2 4 6 Specify scan list 2 4 and 6 Angle brackets lt gt Angle brackets lt gt are used to denote parameter type Do not include the brackets in the program message For example SOURce TTL2 lt b gt The lt b gt indicates that a Boolean type parameter is required Thus to set digital input line 2 true you must send the command with the ON or parameter as follows SOURce TTL2 ON or SOURce TTL2 1 Query commands This type of command requests queries the currently programmed sta tus It is identified by the question mark at the end of the fundamental form of the com mand Most commands have a query form Example TRIGger TIMer Queries the timer interval Most commands that require a numeric parameter lt n gt can also use the DEFault MINi mum and MAXimum parameters for the query form These query forms are used to deter mine the RST default value and the upper and lower limits for the fundamental command Examples TRIGger TIMer DEFault Queries the RST default value TRIGger TIMer MINimum Queries the lowest allowable value TRIGger TIMer MAXimum Queries the largest allowable value Case sensitivity Common commands and SCPI commands are not case sensitive You can use upper or lower case and any case combination Examples RST rst SCAN scan SYST
272. ect IEEE 488 Reference 210 SENSe1 subsystem The SENSel subsystem is used to configure and control the measurement functions of the Model 6517A The commands for this subsystem are summarized in Table 3 10 2101 SENSe 1 subsystem This Sense 1 Subsystem is used to configure and control the measurement functions of the Mod el 6517A volts amps ohms and coulombs Note that a function does not have to be selected in order to program its various configurations When the function is later selected it assumes the programmed states 3 19 2 FUNCtion lt name gt SENSe 1 FUNCtion lt name gt Select measurement function Parameters Query Description lt name gt VOLTage DC Select Volts CURRent DC Select Amps RESistance Select Ohms CHARge Select Coulombs FUNCtion Query currently programmed function The FUNCtion command is used to select the measurement function of the instrument Note that parameter names are enclosed in single quotes However double quotes can instead be used For example func volt func volt Each measurement function remembers its own unique setup configuration such as range speed resolution filter and rel This eliminates the need to re program setup conditions every time you switch from one function to another 3 19 3 DATA commands Description The data commands are primarily used to return a reading to the computer Humidity external tempe
273. ed to request the latest post processed reading After sending this command and addressing the Model 6517A to talk the reading will be sent to the computer This command does not affect the instrument setup This command does not trigger a measurement It simply requests the last available reading Note that this command can repeatedly return the same reading In the absence of a new reading this command will simply return the old reading If your application requires fresh readings use the DATA FRESh command see SENSe Subsystem This command is automatically asserted when the READ or MEASure command is sent CONfFigure lt function gt where lt function gt VOLTage DC Volts function CURRent DC Amps function RESistance Ohms function CHARge Coulombs function CONFigure Query the selected function This command is used to configure the instrument for subsequent measurements on the specified function Basically this command places the instrument in a one shot measurement mode The READ command can then be used to trigger a measurement and acquire a reading see READ When this command is sent the Model 6517A will be configured as follows e The function specified by this command is selected e All controls related to the selected function are defaulted to the RST values e Continuous initiation is disabled INITiate CONTinuous OFF e The control sources in all three layers of the Trigger Model ar
274. ee STATus subsystem LSYNc STATe lt b gt system LSYNc STATe lt b gt Control line synchronization Parameters Query Description KEN lt NRf gt Parameters Query Description lt b gt Oor OFF Disable line synchronization 1 or ON Enable line synchronization STATe Query line synchronization This command is used to enable or disable line synchronization When enabled the integration period will not start until the beginning of the next power line cycle For example if a reading is triggered at the positive peak of a power line cycle the integration period will not start until that power line cycle is completed The integration period starts when the positive going sine wave crosses zero With line synchronization disabled the integration period starts when the reading is triggered See paragraph 2 19 7 for details on line synchronization SYSTem KEY lt NRf gt Simulate key press lt NRf gt 1 Range Up Arrow lt NRf gt 16 NEXT JV Source Up Arrow 17 Range Down Arrow 3 Left Arrow 18 ENTER 4 MENU 19 OPER 5 Q 20 TRIG 6 FITER 21 RECALL 7 LOCAL 22 1 8 PREV 23 Z CHK 9 AUTO 26 MV Source Down Arrow 10 Right Arrow 27 SEQ 11 EXIT 28 CONFIG 12 CARD 29 R 13 MATH 30 REL 14 STORE 31 INFO 15 V KEY Query last pressed key This command is used to simulate front panel key presses For example to select V volts you can send the following command to simulate pressing the V key isyst key 15 The parameter
275. ee paragraph 2 11 for informa tion on external feedback 3 19 16 VSControl lt name gt SENSe 1 RESistance VSControl lt name gt Select ohms V Source mode Parameters Query Description 3 102 lt name gt MANual Manual V Source Ohms AUTO V Source Ohms VSControl Query ohms V Source mode This command is used to select Manua IN Source ohms or Auto V Source ohms With MANual selected you can set the V Source level for ohms measurements See paragraph 3 19 6 Ohms Ranges to configure and control the V Source for Manual V Source ohms measurements With AUTO selected the V Source level is automatically set for the ohms measurement 40V or 400V IEEE 488 Reference 3 19 17 MSELect lt name gt SENSe 1 RESistance MSELect lt name gt Select ohms measurement type Parameters lt name gt NORMal Normal resistance measurements RESistivity Resistivity measurements Query MSELect Query ohms measurement type Description This command is used to select the ohms measurement type NORMal is used to make normal resistance measurements and RESistivity is used for resistivity surface and volume measure ments See paragraph 3 19 18 to configure resistivity measurements 3 19 18 RESistivity commands Parameters Query Description Parameters Query Description The following commands are used for resistivity measurements If using the Model 8009 Resis tivity Test Fixture the measurement type surface
276. eeheg A d vd BAT S ATE E EE AA E EEA E E A E E EAE doves seo caus Vases ebtehediee EEEN SIDA TE yt sMo E TIME lt hr gt lt M EN i SUS Tamp COMMMANS E es TRNWMBEEI RES Gt reenn E EA EEA EEEE E EN Zero check and zero correct Commande TS Vamp FOR Mat EE E RE e e e ER EE E EE D RE E D INITiate commands SE LN ne eo ee eee een Ow a D A De Da o TEE E TO ET REE E IEE rer ervey cerry nee errerereen vec itereirrrectrerrrrrererty E Ge LEHNEN TEE EIME E a TCON fipure commands E D MK Ee ee EE General Test Sequence Commands 0 sicchiesssuvessscesssesseuvessienveseauevesbsrosaesteebesstesnsvesdeststiesaceveanveaseefes STARE EE Ban Gael a a KE EE 3 25 4 3 29 95 3 25 6 3 25 7 3 25 8 3 25 9 3 25 10 3 25 11 3 25 12 3 25 13 3 25 14 3 25 15 3 25 16 3 25 17 3 25 18 3 25 19 3 25 20 3 25 21 3 25 22 3 25 23 3 26 3 27 3 27 1 3 27 2 3 27 3 3 27 4 3 28 vi UNIT SUDSY EE RS 232 Serial Interface E e HR SUTER abneaenecuuoyadaneennep uns A SEEE OSEERE aE er ae ue SV TEEN aeree cecen Ec reie r EE REEVE EET NEEE R EEEE EET EEE EEEE S AE vise PEE AES EEEE EE R ge BE EAN n o EEEE A 8 DIME lt NR EE DAM NY TA a E E E E E E EE E DAOI E ETA a e E E A E EE 8 RRE aba edie dss dane Seabesetde etna aatiaes canes vee eecensd S HLEVel lt NRf gt TAPE TIMI GS INR E se E aereeitp tase ease A LLEVel lt NRf gt ERD LEE fe ER M EE AA a Eaa Sa ss OFSVoltage lt NRf gt ALTVoltage lt NRf gt READ
277. el 6517A when V Source LO is not internal ly connected to ammeter LO see Ammeter LO to V Source LO Connection FVMI source When used to force voltage measure cur rent FVMI V Source LO is connected to ammeter LO as shown in Figure 2 39 Notice that the V SOURCE HI and INPUT HI terminals are used for this configuration The V Source LO to ammeter LO connection can be controlled from the METER CONNECT option of the CONFigure V SOURCE menu see Ammeter LO to V Source LO Connec tion Front Panel Operation WARMING no INTERNAL OPERATOR SERVICABLE PARTS SERVICE BY QUALIF RL INTERLOCK 4 KEITHI Model 6517A Connections 6517A I gt HI Ru V Source X LO Equivalent Circuit Figure 2 38 V source independent configuration 2 47 Front Panel Operation ORO PREAMP OUT COMMON 250V PE V SOUMCE 9 ON Se O H R INTERLOCK KEITHI Connections Model 6517A EREE EE Equivalent Circuit Note Ammeter LO internally connected to V Source LO via METER Connect option of CONFIG V Source menu When the voltage source is connected to a Figure 2 39 capacitor the inherent noise of the preamplifier V source FVMI is amplified This is expected performance Adding a series resistance will not decrease the noise configuration However shunting the output of the V SOURCE
278. em PRESet system preset Long form and short form versions A SCPI command word can be sent in its long form or short form version The command subsystem tables in this section provide the com mands in the long form version However the short form version is indicated by upper case characters Examples IEEE 488 Reference SYSTem PRESet Long form SYST PRES Short form SYSTem PRES Long and short form combination Note that each command word must be in long form or short form and not something in between For example SYSTe PRESe is illegal and will generate an error The command will not be executed Short form rules The following rules can be used to determine the short form version of any SCPI command or parameter A If the length is four letters or less there is no short form version Example sauto auto B The following rules apply to words that exceed four letters a Ifthe fourth letter of the word is a vowel delete it and all the letters after it Exam ple immediate imm Note The y in POLynomial is a vowel Thus polynomial pol b If the fourth letter of the word is a consonant retain it but drop all the letters after it Example output outp C If there is a question mark query or a non optional number included in the com mand word it must be included in the short form version Examples delay del layer2 lay2 D As previously explained command words or c
279. ements Figure 2 12 Guard shield For voltage measurements guarding should be used when the test circuit impedance is 21 GQ or when long input cables are used Guard is enabled from the Configure Voltage menu structure see paragraph 2 5 2 When enabled the guard po tential is placed on the inner shield of the triax input cable Figure 2 21 in paragraph 2 5 1 shows detailed connections for guarded voltage measurements See paragraph 2 5 3 Guarding for more information on guard For current measurements guarding should be used when the test circuit impedance 1GQ Significant leakage could occur across a DUT through insulators and corrupt the mea surement Input LO inner shield of the input triax cable is used as the guard Paragraph 2 6 3 Guarding explains how guarding affects high impedance current measurements and is shown in Figure 2 30 Front Panel Operation For floating current measurements a unique guard technique is used in a high impedance test circuit where significant leakage current may exist between the ammeter input and test circuit common This unique guard technique for float ing current measurements is explained in paragraph 2 6 3 Guarding and is shown in Figure 2 31 Safety shield A safety shield is required whenever a haz ardous voltage is present on the noise shield or guard shield or when a test circuit is floated above earth ground at a haz ardous voltage level see paragraph 2 4 5 A shock
280. en reading exceeds range limits Sets B1 when reading is less than the low limit 1 setting Sets B2 when reading is greater than the low limit 1 setting Sets B3 when reading is less than the low limit 2 setting Sets B4 when reading is greater than the high limit 2 setting Sets B5 after a reading is taken and processed Sets B6 when an ohms reading is below the lower range limit Sets B7 when the trace buffer has at least two readings Sets B8 when the trace buffer becomes half full Sets BO when the trace buffer becomes full Sets B10 when an Alternating Polarity test sequence reading becomes available Sets B11 when the trace buffer pretrigger event occurs Sets B12 when a noise spike occurs Sets B13 when fixture lid is closed Sets B14 when V source goes in compliance B15 B14 B13 B12 B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 BO vsc FLC OL BPT SRA BEL BHF BAV RUF RAV HL2 LL2 HLT LL1 ROF 16384 8192 4096 2048 1024 512 256 128 256 32 16 8 4 2 214 213 212 om 210 29 28 27 26 25 24 23 22 21 29 0 O 1 O 1 O 1 O 1 1 1 Von Tonon o1 1 O 1 1 oi Value 1 Enable Positive Transition Events VSC V Source Compliance 0 Disable Positive Transition FLC Fixture Lid Closed OL Out of Limits BPT
281. eneceeneesaeceaeeceeeeeaaeeeeeenas Ground OOPS E E PribOelecttic E E sadist ineasestansat tel E R a e ea Piezoelectric and stored charge effects ln Fl cttochemical E e an OT EE E Electromagnetic interference EMI ceccesceescesceeeceseeeeeeseeececaeesaecaaesaeceeceaecaeceseeeeseeseseeaeeeeeeaeeeeebeees Relative humidity and external temperature readings IEEE 488 Reference Introduction degen Conpnecthons assisia neaei ninan rE E a R EE R SE E Sa EESE SEE RE R AEE E EN Eosi aeia TEEE 488 bus CONMECHIONS sieci eaae ea EA D RS 232 serial interface ConnechHong GPIB primary address Selection c3 issccsistiecsvecgeeecsssactscevdschoessdeadeuscaskeds E E aE EE a e e aa ai iei ies GPIB programming language Selection eee eee ceseeseceeeeeecesceeeeeeeeseeeseeseecaaeseecaecnaecaeseaeaeesaeeeeeeeeeeeeeeeees QuickBASIC 4 5 programming El General bus commande REN remote enable TFC interface cleart lk EEO Wd Re e EE D E RE e TEE D DCL device clear E E SDC selective device clean GET group execute iS BEL NET aeaeo SPE SPD Serial E EE E Front panel aspects of IEEE 488 operation lk Error and status MeSSAQES lk TEEE 488 status De Tee ET D LOCALS EE D El CR Ren EE E Va ee iii 3 8 2 3 8 3 3 8 4 3 8 5 3 8 6 3 9 3 10 3 11 3 11 1 3 11 2 3 11 3 3 11 4 3 11 5 3 11 6 3 11 7 3 11 8 3 11 9 3 11 10 3 11 11 3 11 12 3 11 13 3 11 14 3 11 15 3 12 3 13 3 13 1 3 13 2 3 13 3 3 14 3 15 3 16 3 17
282. ent range 11 9685 V okenpnndunnnnndnm 20V Full Range 25 of 50 of S full range full range 75 of full range Figure 2 2 Bar graph zero at left multiple display Zero centered bar graph The zero centered bar graph is a graphical representation of a reading with plus and minus limits See Figure 2 3 The limits are expressed in a user selectable percentage of range The vertical lines displayed along the bar designate the plus and minus limits zero and halfway to either limit There are ten full segments between zero and each end so each full segment represents 10 of the limit When a line at the limit changes to an arrow the reading exceeds the programmed range 05 9577 VM eme there 50V 50 of range a L 50 of range 25 of range 25 of range 0 Figure 2 3 Zero centered bar graph multiple display The plus and minus percentage of range that is programmed 0 01 99 99 applies to all functions Because of round ing values greater than 99 5 are shown as 100 and like 2 8 wise values greater than 1 such as 1 67 are shown rounded to the nearest integer percent Perform the following to view or change the plus and minus percentage of range 1 From a measurement function press CONFIG and then NEXT or PREV DISPLAY The following is displayed ZERO BARGRAPH 50 00 2 Change the percentage by using the cursor keys and the RANGE A and keys to enter a numeric value 0 01 99
283. epeating average mode MEDIAN Configure median filter DISABLE Disable median filter ENABLE Enable median filter and specify range 1 5 2 104 2 18 Math Model 6517A math operations are divided into four catego ries e Math performed on single readings polynomial per cent percent deviation ratio and logarithmic e Math performed on buffered readings maximum and minimum values average and standard deviation e Math performed on single readings as a part of a pass fail limits test The first category is configured from the CONFIGURE MATH menu and is described in this paragraph Math oper ations on buffered readings are available in multiple displays of recalled data and are discussed in paragraph 2 16 3 Limit tests are described in paragraph 2 19 5 under main menu op erations Note that once enabled for a function the CONFIGURE MATH calculations are in effect across function changes NOTE The Model 6517A uses IEEE 754 floating point format for math calculations 2 18 1 Polynomial This math operation allows you to mathematically manipu late normal display readings X according to the following polynomial calculation Y a2 X al X a0 where X is the normal display reading a2 al and a0 are user entered constants Y is the displayed result The value of the a2 al and a0 constants can be changed through the CONFIGURE MATH menu see para graph 2 18 The before
284. er Query byte order This command is used to control the byte order for the IEEE754 binary formats For normal byte order the data format for each element is sent as follows Byte 1 Byte2 Byte3 Byte4 Single precision Byte 1 Byte2 000 Byte 8 Double precision For reverse byte order the data format for each element is sent as follows Byte4 Byte3 Byte2 Bytel Single precision Byte 8 Byte 7 000 Byte 1 Double precision The 0 Header is not affected by this command The Header is always sent at the beginning of the data string for each measurement conversion The ASCII data format can only be sent in the normal byte order The SWAPped selection is simply ignored when the ASCII format is selected 3 79 IEEE 488 Reference 3 17 Output Subsystems Parameters Query Description Parameters Query The Output subsystems are used to control the V Source standby or operate and set polarities for the digital output port Commands for these subsystems are summarized in Table 3 8 OUTPut1 Subsystem STATe lt b gt OUTPut1 STATe lt b gt Control V Source lt b gt ON orl Enable V Source operate OFF or 0 Disable V Source standby STATe Query state of V Source This command is used to enable or disable the V Source When enabled the V Source is placed in operate When disabled the V Source is placed in standby The V Source is configured from the SOURce subsystem see paragraph 3 19 Not
285. er can be set for an interval from 0 001 seconds 1msec to 999999 999 seconds with Imsec resolution The first measurement occurs immediately while all subse quent measurements occur at the end of the programmed timer interval If however the programmed timer interval is shorter than the time it takes to complete a single measure ment the next measurement will not start until the previous one is done NOTE The front panel TRIG key see MANU AL is active with the time selected Press ing the TRIG key after the completion of a measurement starts the next measurement assuming the Model 6517A is pro grammed for another measurement see COUNT HOLD When HOLD is selected the measure source is sup pressed As a result measuring is stopped and does not con tinue until HOLD is cancelled by selecting one of the other measure source selections Select HOLD from the SELECT MEASURE SRC menu by pressing the cursor on HOLD and pressing ENTER The instrument returns to the SETUP mea sure layer menu 2 78 DELAY This delay is used to hold up operation in the measure layer After the measure event occurs the instrument waits until the delay period times out 0 999999 999 sec before perform ing a device action COUNT With this selection you determine the number count of measurements per scan sequence The user programmed count can be smaller equal to or larger than the number of channels in the scan list For exampl
286. er for surface resistivity measurements when using a user supplied test fixture This command is not needed when using the Model 8009 test fixture The Ks parameter is calculated as follows Ks P g where P Effective perimeter in mm of the guarded electrode g Distance in mm between the guarded electrode and the ring electrode See paragraph 2 7 2 Surface Resistivity for detailed information on surface resistivity mea surements KVOLume lt NRf gt SENSe 1 RESistance RESistivity USER KVOLume lt NRf gt Specify Kv parameter for volume resistivity Parameters Query Description IEEE 488 Reference lt NRf gt 0 001 to 999 999 Kv parameter KVOLume Query programmed Kv parameter This command is used to specify the Kv parameter for volumeresistivity measurements when using a user supplied test fixture This command is not needed when using the Model 8009 test fixture Kv is the effective area of the guarded electrode for the particular electrode arrangement em ployed and is calculated as follows Note The following calculation assumes that the effective area coefficient B is zero which is typically used for volume resistivity 2 Kv di for B 0 where D1 Outside diameter of guarded electrode If using a different value for B use the calculation shown in paragraph 2 7 2 Volume Resistivity 3 105 IEEE 488 Reference 3 20 SOURce subsystem This subsystem is used to set
287. er interval is shorter than the time it takes to complete a single measure ment the next measurement will not start until the previous one is done NOTE The front panel TRIG key see MANU AL is active with the time selected Press ing the TRIG key after the completion of a measurement starts the next measurement 2 15 3 Advanced trigger configuration The following information explains how to configure the Model 6517A for advanced triggering If you instead wish to use basic triggering refer to paragraph 2 15 2 Advanced triggering is configured from the ADVANCED item of the CONFIGURE TRIGGER menu see Table 2 21 which is displayed by pressing the CONFIG key and then the TRIG key General rules for navigating the menu structure are pro vided in paragraph 2 3 5 Configuring measure layer The measure layer is used for the following operations e To select the measuring event SOURCE for the instru ment e To delay operation in the measure layer e To designate the number of measurements the instru ment will make COUNT e To enable or disable the Source Bypass The measure layer is configured from the MEASURE item of the ADVANCED TRIGGERING menu SOURCE This menu item selects the event that controls the measure source IMMEDIATE With this selection events such as TIMER and EXTERNAL triggers do not control the measurement interval Once the Model 6517A starts measuring it will take readings as fast as its m
288. er versions had different screws which were sil ver colored Do not attempt to use these type of connectors on the instrument which is designed for metric threads Figure 3 1 IEEE 488 connector 3 2 A typical connecting scheme for a multi unit test system is shown in Figure 3 2 Although any number of connectors could theoretically be stacked on one instrument it is recom mended that you stack no more than three connectors on any one unit to avoid possible mechanical damage Instrument Instrument Instrument Controller Figure 3 2 IEEE 488 connections NOTE In order to minimize interference caused by electromagnetic radiation it is recom mended that only shielded IEEE 488 ca bles be used The Models 7007 1 and 7007 2 shielded ITEEE 488 cables are available from Keithley Connect the Model 6517A to the IEEE 488 bus as follows 1 Line up the cable connector with the connector located on the rear panel The connector is designed so that it will fit only one way Figure 3 3 shows the location of the IEEE 488 connector on the instrument _ LINE RATING w 50 80HZ 50VA MAX AC ONLY d ARER WITH FF MENU HAZARD FE ING DIGITAL TRIG LINK KEITHLEY Figure 3 3 IEEE 488 connector location 2 Tighten the screws securely but do not overtighten them 3 Add additional connectors from other instruments as required 4 Make certain that the other end of the cable is p
289. erflow before the integrator resets 2 43 Front Panel Operation AUTORANGE ment autoranges assuming AUTO range is enabled it will t h into the high The AUTORANGE option is used to configure autorange for SE the coulombs function This option allows you to speed up the autoranging search process by eliminating the low 2nC and 20nC or high 200nC and 2uC measurement ranges For example if you know that the readings will not exceed 10nC you can select LO autorange limits When the instru LO 2nC 20nC Use this option to limit the autorange search to the low measurement ranges HIGH 200nC 2uC Use this option to limit the autorange search to the high measurement ranges 6517A WARNING No in 237 ALG 2 a Red HI Cable C A RS COMMON Misa Measured Q Charge E 3 Black LO Q Shield Optional i Input low connected to shield A Connections A Connections Input Amplifier Rangi Ke a i Triax Amp Q Input Cr Swi br eg gt gt al MN LO gt gt p Converter SR To A D S PREAMP OUTPUT 10 gt COMMON Wo 2V ANALOG OUTPUT WN B Equivalent Circuit B Equivalent circuit Figure 2 37 Typical connections for charge measurements 2 44 Front Panel Operation Table 2 13 CONFIGURE COULOMBS menu structure Menu item Description SPEED Measurement speed in
290. ers Query Description Parameters Query Description M8009 RSWitch SENSe 1 RESistance RESistivity M8009 RSWitch Query switch setting on Model 8009 When using the Model 8009 Resistivity Test Fixture the Model 6517A senses the switch setting Surface or Volume of the test fixture through the safety interlock cable and automatically con figures the instrument for that resistivity measurement type This query command is used to read the switch setting Surface or Volume of the Model 8009 Resistivity Test Fixture USER Commands The following commands are used to configure the instrument for resistivity measurements when using a user supplied test fixture These command are not needed if using the Model 8009 Resistivity Test Fixture RSELect lt name gt SENSe 1 RESistance RESistivity USER RSELect lt name gt Specify measurement type for user test fxiture lt name gt SURFace Surface resistivity VOLume Volume resistivity RSELect Query programmed resistivity measurement type This command is used to specify the resistivity type SURFace or VOLume for the user sup plied test fixture This command is not needed when using the Model 8009 test fixture KSURface lt NRf gt SENSe 1 RESistance RESistivity USER KSURface lt NRf gt Specify Ks parameter for surface resistivity lt NRf gt 0 001 to 999 999 Ks parameter KSURface Query programmed Ks parameter This command is used to specify the Ks paramet
291. ers shown are pri mary address resulting in MTA My Talk Address ASCII Character Codes and IEEE 488 Multiline Interface Command Messages TEEE 488 TEEE 488 Decimal Hexadecimal ASCII Messages Decimal Hexadecimal ASCII Messages 96 60 MSA 0 PPE 112 70 p MSA 16 PPD 97 61 a MSA 1 PPE 113 71 q MSA 17 PPD 98 62 b MSA 2 PPE 114 72 r MSA 18 PPD 99 63 c MSA 3 PPE 115 73 s MSA 19 PPD 100 64 d MSA 4 PPE 116 74 t MSA 20 PPD 101 65 e MSA 5 PPE 117 75 u MSA 21 PPD 102 66 f MSA6 PPE 118 76 v MSA 22 PPD 103 67 g MSA 7 PPE 119 77 w MSA 23 PPD 104 68 h MSA 8 PPE 120 78 D MSA 24 PPD 105 69 i MSA 9 PPE 121 79 y MSA 25 PPD 106 6A j MSA 10 PPE 122 7A Z MSA 26 PPD 107 6B k MSA 11 PPE 123 7B MSA 27 PPD 108 6C 1 MSA 12 PPE 124 7C MSA 28 PPD 109 6D m MSA 13 PPE 125 7D MSA 29 PPD 110 6E n MSA 14 PPE 126 TE MSA 30 PPD 111 6F o MSA 15 PPE 127 7F DEL Message sent or received with ATN true Numbers represent second ary address resulting in MSA My Secondary Address C 3 IEEE 488 Bus Overview Introduction Basically the IEEE 488 bus is simply a communication sys tem between two or more electronic devices A device can be either an instrument or a computer When a computer is used on the bus it serves to supervise the communication ex change between all the devices and is known as the control ler Supervision by the controller consists of determining which device will talk and whic
292. esecesceceneeesseeeceeseeeseeceececsaeceacecneceeaeceeeeesneeenaeees Operation Event Enable REgISter A S Trigger Event Enable Register EE Arm Event Enable Repisteteinoroconiioernri enesenn iie ann Ea A REE EE NR E EER EEES Sequence Event Enable Register csccsssssecssessbesecescsstoossoocseseveesosteonsboseobessesesesbaesedesssuaeesnenssbaeses Measurement Transition Filter ss esetiedieuggEee rch teg C nesenie aniar eiser eera ao E ES ARESO EEEE SEAS EE Questionable Transition Filter scseoneiee Eege EEEE NEE EE E RESETA EEN Aa K Operation Transition FER iccis csccssssvisaesiesconediespenscoscrescnse tevssseaiacssseevagu vesguesansusveensspensvesurtestgaceusesensates Trigger RTE ae RE unisini eeaeee aaa t o aeiaai Arm Transition Filtet csore ereer a EEEE EAEEREN RARE Sequence Transition Filter c c eegete EENEG Key PIrESS EE Rees IEEE 488 Bus Overview IS GEET TEEE 488 handshake Sequence iscv cc s sctccsc ieediebeosh veil eseu Aere eeu rira Eeee EASE rA CNE CE ed SES SA Command RE List of Tables 2 Table 2 1 Table 2 2 Table 2 3 Table 2 4 Table 2 5 Table 2 6 Table 2 7 Table 2 8 Table 2 9 Table 2 10 Table 2 11 Table 2 12 Table 2 13 Table 2 14 Table 2 15 Table 2 16 Table 2 17 Table 2 18 Table 2 19 Table 2 20 Table 2 21 Table 2 22 Table 2 23 Table 2 24 Table 2 25 Table 2 26 Table 2 27 Table 2 28 Table 2 29 Table 2 30 3 Table 3 1 Table 3 2 Table 3 3 Table 3 4
293. espective layer For example programming the Trigger Layer counter for infinity trig coun inf keeps operation in the Trigger Layer After each device action and subsequent output trig ger operation loops back to the Trigger Layer control source A counter resets when operation loops back to a higher layer or idle IEEE 488 Reference 3 10 Programming syntax The following information covers syntax for both common commands and SCPI commands For information not covered here refer to the IEEE 488 2 and SCPI standards Command words Program messages are made up of one or more command words 1 Commands and command parameters Common commands and SCPI commands may or may not use a parameter Examples SAV lt NRf gt Parameter NRf required RST No parameter used INITiate CONTinuous lt b gt Parameter lt b gt required SYSTem PRESet No parameter used Note that there must be at least one space between the command word and the parameter Brackets There are command words that are enclosed in brackets D These brackets are used to denote an optional command word that does not need to be included in the pro gram message For example INI Tiate IMMediate The brackets indicate that MMediate is implied optional and does not have to be used Thus the above command can be sent in one of two ways INITiate or INITiate MMediate Notice that the optional command is used without the brackets Do not
294. ess to slow down the measurement response 2 23 Front Panel Operation Not shown in Figure 2 24 is the outer shield of the triax cable which is connected to chassis ground The leakage between the inner shield and the outer shield is of no consequence since that current is supplied by the low impedance source rather than by the signal itself Center Triax Cable Conductor Source Guard A H 6517A Input Es Inner Shield NN 15kQ Figure 2 24 Guarded voltage measurements 2 6 Current measurements The Model 6517A can make current measurements from 10aA to 21mA 2 6 1 Basic measurement procedure To achieve optimum precision for low level current mea surements input bias current and voltage burden can be min imized by performing the offset adjustment procedures in paragraph 2 19 3 OFFSET ADJ NOTE After measuring high voltage in the volts function it may take a number of minutes for input current to drop to within speci fied limits Input current can be verified by placing the protection cap on the INPUT triax connector and then connecting a jumper between COMMON and chassis ground With the instrument on the 20pA range and zero check disabled allow the reading to settle until the input bias current is within specifications Perform the following steps to measure current 2 24 NOTE To ensure proper operation always enable zero check ZeroCheck displayed be fo
295. est TYPE Query selected test sequence This command is used to select the desired test sequence When test sequence is started see TSOurce the selected test will run according to how it is configured The commands in para graphs 3 25 2 through 3 25 15 are used to configure the test sequences 3 25 2 Parameters Query Description Parameters Query Description STARt lt NRf gt Parameters IEEE 488 Reference TSOurce lt name gt TSEQuence TSOurce lt name gt Select control source to start test lt name gt MANual Manual control source IMMediate Immediate control source BUS Bus trigger control source EXTernal External trigger control source TLINk Trigger link control source LCLosure Test fixture lid closure TSOurce Query control source to start test This command is used to select the event that will start the selected test sequence When the se lected control source event occurs the test will start With MANual selected the test will start when the SEQ key is pressed With IMMediate select ed the test will start as soon as the instrument is taken out of the idle state The INITiate and INITiate CONTinuous ON commands will take the instrument out of the idle state Note that if the instrument is already in the continuous measurement mode not in idle the test will start as soon as IMMediate is selected With BUS selected the test will start when a bus trigger TRG or GET is sent over th
296. est Fixture NOTE The connections in Figure 2 33 assume that V Source LO is internally connected to ammeter LO This internal connection is controlled from the METER CON NECT option of the CONFIGURE V SOURCE menu see paragraph 2 9 1 This LO to LO connection can instead be made by using an external cable to connect V Source LO to ammeter LO Select the ohms function by pressing the R key Ifthe manual V Source adjustment mode is selected use the lt q gt and the VOLTAGE SOURCE A and V keys to set the voltage level The V Source range can be changed from the RANGE item of the CONFIGURE V SOURCE menu See paragraph 2 9 2 for details on set ting range and level for the V Source Note that you will not be able to adjust the V Source if AUTO NV Source is selected WARNING To avoid a possible shock hazard do not use a voltage level that exceeds the max imum input voltage rating of the test fix ture For example the maximum input voltage to the Model 8002A High Resis tance Test Fixture must not exceed 200V peak Use the A and W RANGE keys to select the resistance measurement range or select AUTO range Note that with AUTO range selected the instrument will not go to the 2TQ 20TQ and 200TQ ranges NOTE For optimum accuracy leakage currents in the test fixture can be cancelled by per forming REL on the current component of the measurement To cancel leakage cur rent perform Cancelling Test Fixture
297. est failure CALCulate3 LIMit2 CLEar IMMediate Clear LIMIT 2 test failure These action commands are used to clear the fail indication of LIMIT 1 and LIMIT 2 tests Note that a failure is also cleared when the limit test is disabled STATe OFF AUTO lt b gt CALCulate3 LIMit 1 CLEar AUTO lt b gt Control auto clear LIMIT 1 CALCulate3 LIMit2 CLEar AUTO lt b gt Control auto clear LIMIT 2 lt b gt 1 or ON Enable auto clear for limit failure 0 or OFF Disable auto clear for limit failure AUTO Query state of auto clear With auto clear enabled the fail indication of a limit test clears when instrument operation en ters the idle state With auto clear disabled the fail indication will remain until it is cleared by the CLEar MMediate command PASS SOURce lt NRf gt CALCulate3 PASS SOURce lt NRf gt Specify pass pattern lt NRf gt 0 to 15 Specify digital pattern for output port SOURce Query programmed source value This command is used to specify which line s of the Digital Output Port will go true when there are no failures in the limit tests Each output line is assigned a decimal weight as follows Digital Output Decimal Weight Line 1 Line 2 Line 3 Line 4 o E H ra The parameter value for the digital pattern is determined by adding the decimal weights of the desired output lines For example if you want output lines 2 and 3 to go true when all enabled limit tests pass use a parameter value
298. ete TTL High 3 4V Typical TTL Low 0 25V Typical Minimum Figure 2 60 Meter complete and asynchronous trigger link output pulse specifications Typically you would want the Model 6517A to output a trig ger after the settling time of each measurement Settling time includes the internally set measurement settling time and the user programmed DELAY period An output com pletion pulse occurs after each measurement as long as the measure source is set to external timer manual or immedi ate See paragraphs 2 15 2 and 2 15 3 for details The Model 6517A can also output a completion pulse while in the scan and or arm layers of operation Figure 2 57 shows where these triggers occur in the trigger model If the scan layer Source Bypass is enabled Control Source and the Scan Source is programmed for External an output trigger occurs on each return path through the scan layer If the arm layer Source Bypass is enabled Control Source and the Arm Source is programmed for External an output trigger occurs on each return path through the arm layer See para graph 2 15 3 for programming the scan and arm layers 7001 or 7002 Switch System Cables 2 Figure 2 62 External trigger connections 2 82 External Trigger BNC to BNC External triggering example 1 In a typical test system you may want to close a channel and then measure the DUT connected to that channel with a mul timeter Such a test sys
299. ete bit in the Standard Event Status Regis ter after all pending commands have been executed OPC Operation complete query Places an ASCII 1 into the output queue when all pending selected device operations have been completed OPT Option identification query Returns an ID code that indicates which memory option is installed and whether or not the optional scanner card is installed RCL lt NRf gt Recall command Returns the Model 6517A to the setup configuration stored in the specified memory location RST Reset command Returns the Model 6517A to the RST default conditions SAV lt NRf gt Save command Saves the current setup to the specified memory location SRE lt NRf gt Service request enable command Programs the Service Request Enable Register SRE Service request enable query Reads the Service Request Enable Register STB Read status byte query Reads the Status Byte Register TRG Trigger command Sends a bus trigger to the 6517A TST Self test query Performs a checksum test on ROM and returns the result WAI Wait to continue command Wait until all previous commands are executed 3 11 1 CLS clear status Clear status registers and error queue Description 6517A The CLS command is used to clear reset to 0 the bits of the following registers in the Model Standard Event Status Register Operation Event Register Error Queue Trigger Event Register Sequence Event Register Arm Event Status Register Measurement E
300. evious channel opens and the next channel closes break before make Also included in the device action is the internal settling time delay for the relay Output Triggers In Arm Layers 1 and 2 the output trig gers are enabled only if their respective source bypasses are also enabled If a TLINk control source is selected the out put trigger pulse is available on the selected TRIGGER LINK output line For all other control source selections the trigger pulse is available at the METER COMPLETE con nector In the Trigger Layer the output trigger is always enabled and occurs after every device action If the control source is set for EXTernal IMMediate MANual BUS or TIMer the out put trigger pulse is available at the METER COMPLETE connector If the TLINk control source is selected output 3 20 trigger action occurs on the selected TRIGGER LINK output line as follows e Ifthe asynchronous Trigger Link mode is selected the output trigger pulse is available on the programmed output line e Ifthe semi synchronous Trigger Link mode is selected and the source bypass is disabled trig tcon dir acc the Trigger Link line is released goes high e If the semi synchronous Trigger Link mode is selected and the Source Bypass is enabled trig tcon dir sour the Trigger Link line is pulled down low and then re leased Counters All three layers use programmable counters which allow operation to return to or stay in the r
301. evised copy of this print history page Revision A Document Number o3al1A O00 011 December 1996 Revision B Document Number o3al1A O00 011 November 1999 Revision C Document Number o3l1A O00 011 July 2000 All Keithley product names are trademarks or registered trademarks of Keithley Instruments Inc Other brand and product names are trademarks or registered trademarks of their respective holders Raa Safety Precautions The following safety precautions should be observed before using this product and any associated instrumentation Although some in struments and accessories would normally be used with non haz ardous voltages there are situations where hazardous conditions may be present This product is intended for use by qualified personnel who recog nize shock hazards and are familiar with the safety precautions re quired to avoid possible injury Read and follow all installation operation and maintenance information carefully before using the product Refer to the manual for complete product specifications If the product is used in a manner not specified the protection pro vided by the product may be impaired The types of product users are Responsible body is the individual or group responsible for the use and maintenance of equipment for ensuring that the equipment is operated within its specifications and operating limits and for en suring that operators are adequately trained Operators use the produ
302. ey to back out of the menu structure 2 9 4 Interlock and test fixtures The voltage source should be used with a test fixture that in corporates a safety interlock switch such as the Keithley Model 8002A High Resistance Test Fixture or the Keithley Model 8009 Resistivity Test Fixture By using the interlock feature the Model 6517A cannot source voltage when the lid of the test fixture is open or ajar Interlock is automatically enabled when the appropriate in terlock cable is connected to the Model 6517A When used with the Model 8002A or 8009 the V Source will go into standby whenever the lid of the test fixture is open or ajar When using the V Source with the Model 8009 Resistivity Test Fixture use the Model 6517 ILC 3 Interlock Cable as shown in Figure 2 36 This cable uses an extra line to detect which resistivity measurement type is selected at the test fix ture surface or volume When using the V Source with the Model 8002A High Re sistance Test Fixture use the Model 8002 ILC 3 Interlock Cable as shown in Figure 2 32 This cable provides the 4 pin to 3 pin conversion required for the Model 8002A More in formation on the Model 8002A and 8009 test fixtures is pro vided in paragraph 2 4 6 WARNING Do not connect the interlock of the Model 6517A to the interlock of another instrument The interlock is designed to be connected to a single pole interlock switch of a test fixture If connecting two or more Model 6517As
303. fer stores readings continuously like ALWays until the programmed pre trigger event occurs When the pre trigger event occurs the section of the buff er specified for post trigger readings fill with new readings The storage process stops when the post trigger portion of the buffer becomes full with new readings see TRACe FEED PRETrig ger 3 23 5 DATA Description LAST Description IEEE 488 Reference TRACe DATA Send buffer readings When this command is sent and the Model 6517A is addressed to talk all the readings stored in the buffer are sent to the computer The format that readings are sent over the bus is controlled by the FORMat subsystem Note that the buffer elements selected by TRACe ELEMents see paragraph 3 23 7 must match the bus elements selected by FORMat ELEMents see paragraph 3 16 Otherwise the following error will occur when using this command to send buffer readings over the bus 313 Buffer amp format element mismatch TRACe LAST Read last Alternating Polarity reading stored in buffer When this query command is sent and the Model 6517A is addressed to talk the last reading stored in the buffer from the Alternating Polarity Resistance Resistivity test sequence is sent to the computer The format that the reading is sent over the bus is controlled from the FORMat subsystem Note that this command only works while the Alternating Polarity test sequence is running or waiting for a cont
304. ferent electrification time CURRENT MEASUREMENT CONSIDERATIONS Ohms measurements are performed by forcing voltage and measuring current FVMI Thus accurate measurements re quire accurate current measurements Current measurement considerations are covered in paragraph 2 6 3 2 8 Charge measurements Q The Model 6517A is equipped with four coulombs ranges to resolve charges as low as 10fC 10 4C and measure as high as 2 1uC In the coulombs function an accurately known ca pacitor is placed in the feedback loop of the amplifier so that the voltage developed is proportional to the integral of the in put current in accordance with the formula Lok _ Qs V afit e The voltage is scaled and displayed as charge 2 8 1 Basic measurement procedure NOTE After measuring high voltage in the volts function it may take a number of minutes for input current to drop to within speci fied limits Input current can be verified by placing the protection cap on the INPUT triax connector and then connecting a jumper between COMMON and chassis ground With the instrument on the 20pA range and zero check disabled allow the reading to settle until the input bias current is within specifications Auto Discharge The Model 6517A has an auto discharge feature for the coulombs function When enabled auto dis charge resets the charge reading to zero when the charge reading reaches the specified level After the integrator rese
305. ffer Overflow SE 312 Buffer Pretriggered SE 313 Reading out of Limit SE 315 V Source compliance detected SE 320 Buffer amp Format element mismatch EE 321 Buffer Sizing error set to MAX EE 322 Buffer Sizing error set to MIN EE Table 2 5 cont Status and error messages Front Panel Operation Number Description Event 350 to Calibration commands see Model 427 6517 Service Manual 510 Reading buffer data lost EE 511 GPIB address lost EE 512 Power on state lost EE 513 Calibration data lost EE 514 Calibration dates lost EE 515 Calibration tolerances lost EE 516 Calibration tables lost EE 517 Voltage Offset lost EE 518 Current Offset lost EE 519 Installed option id lost EE 520 Option card not supported EE 521 Cal Card Data Error EE 522 GPIB communication language lost EE 610 Questionable Calibration SE 611 Questionable Temperature SE 612 Questionable Humidity SE 617 Questionable Test Sequence SE 618 Resistivity I OutOfLimit EE 700 Low Battery detected EE 800 RS 232 Framing Error detected EE 801 RS 232 Parity Error detected EE 802 RS 232 Overrun detected EE 803 RS 232 Break detected EE 804 RS 232 Noise detected EE 805 Invalid system communication EE 806 RS 232 Settings Lost EE
306. for more information about the buffer TRACe DATA The bar l indicates that TRACe or DATA can be used as the root command for this subsystem From this point on the documentation in this manual uses TRACe If you prefer to use DATA simply replace all the TRACe command words with DATA TRACe CLEar Clear buffer This action command is used to clear the buffer of readings If you do not clear the buffer a sub sequent store will overwrite the old readings If the subsequent store is aborted before the buff er becomes full you could end up with some old readings still in the buffer TRACe FREE 2 Read status of memory This command is used to read the status of storage memory After sending this command and addressing the Model 6517A to talk two values separated by commas are sent to the computer The first value indicates how many bytes of memory are available and the second value indi cates how many bytes are reserved to store readings 3 137 IEEE 488 Reference 3 23 3 3 138 POINts lt n gt Parameters Query Description Parameters Query Description Description TRACe POINts lt n gt Specify buffer size lt n gt lto MAXimum Specify number or readings DEFault 100 MAXimum See table 2 22 MINimum 1 POINts Query buffer size This command is used to specify the size of the buffer When the specified number of readings are stored in the buffer the buffer is considered to be f
307. formation messages Press the INFO key to view context sensitive information from most of the displays An arrow lt q or gt on the bot tom line indicates that there is more information Use the cursor keys a and to view the complete line To exit an INFO display just press INFO ENTER EXIT or a func tion key Range messages The following display messages may occur when making measurements OVERFLOW This message is displayed when the inte grated average input signal level voltage current or charge exceeds 105 of full scale for the selected measure ment range For example on the 20nA measurement range the OVERFLOW message occurs when the integrated input level exceeds 21nA An OVERFLOW condition can be resolved by selecting a higher measurement range using AUTO range or reducing the magnitude of the input signal The OVERFLOW message will NOT occur during resis tance or resistivity measurements UNDERFLOW This condition is similar to OVER FLOW but pertains to resistance and resistivity measure ments An ohms measurement is performed by sourcing voltage and measuring current An ohms measurement that is too low causes the current to exceed full scale Thus the message UNDERFLOW is used to indicate that the mea sured resistance or resistivity is lower than the lower limit of the selected range The UNDERFLOW condition can usually be resolved by se lecting a lower ohms range or by using AUTO ra
308. fy low level voltage 1V LO TIME Specify time at low level lsec CYCLE COUNT Specify number of cycles 10 STAIRCASE Staircase Sweep Test START Specify start voltage 1V STOP Specify stop voltage 10V STEP Specify step voltage 1V STEP TIME Specify step time lsec CONTROL Select trigger source to start test Manual MANUAL Start when TRIG key pressed IMMEDIATE Start immediately LID CLOSURE Start when test fixture lid closed GPIB Start on GPIB trigger GET or TRG EXTERNAL Start when external trigger received TRIGLINK Start when trigger is received via the speci Line 1 fied Trigger Link line 2 14 3 Running the selected test 6 When the test is finished zero check will stay disabled Perform the following steps to run the selected test 1 2 Enable zero check and make sure the V Source is in standby OPERATE LED off Connect and configure the Model 6517A for the desired test as explained in paragraph 2 14 1 Select and configure the desired test as explained in paragraph 2 14 2 Press the SEQ key The selected test will be displayed Press ENTER to arm the test When the selected trigger source event occurs zero check will disable and the test will run 2 70 and the V Source will go into standby The measured readings for the test are stored in the buff er To access these readings press RECALL Notes 1 If the IMMEDIATE trigger source is selected the test will start immediately afte
309. g The concepts of guarding and floating circuits are introduced here NOTE Detailed connection schemes are included with the measurement procedures see paragraphs 2 5 1 2 6 1 2 7 1 and 2 8 1 2 4 1 Electrometer input connector The rear panel triax INPUT connector is a 3 lug female triax connector that will mate to a cable terminated with a 3 slot male triax connector Input configurations As shown in Figure 2 5 the input connector can be configured in two ways With GUARD off Figure 2 5A input low is connected to the inner shell of the connector This configuration is used for current resistance coulombs and unguarded voltage measurements NOTE Where possible make input low connec tions directly to the INPUT connector low terminal instead of using COMMON to avoid internal voltage drops that may af fect measurement accuracy With GUARD on Figure 2 5B guard is connected to the in ner shell of the triax connector Input low is accessed via the COMMON binding post through an internal 1Q resistor This configuration is used for guarded voltage measurements only Note that guard can only be enabled on for the volts function For ohms amps and coulombs guard is always dis abled off For voltage measurements guard is enabled or disabled from the Configure Voltage menu structure as ex plained in paragraph 2 5 2 The INPUT triax connector is also used for the Force Voltage Measure Current configuration Thi
310. g Electrode s gt Le D D g pol ae Do D 8 2 Test Fixture Dimensions cm Model 8009 D 2 000 in Do 2 125in D 2 250in 4 0 125 in Figure 2 34 Circular electrode dimensions Volume Resistivity Volume resistivity is defined as the electrical resistance through a cube of insulating material When expressed in ohm centimeters it would be the electri cal resistance through a one centimeter cube of insulating material If expressed in ohm inches it would be the electri cal resistance through a one inch cube of insulating material Front Panel Operation Volume resistivity is measured by applying a voltage poten tial across opposite sides of the insulator sample and measur ing the resultant current through the sample as shown in Figure 2 35 The Model 6517A automatically performs the following calculation and displays the volume resistivity reading K Py R Py Volume resistivity Ky The effective area of the guarded electrode for the par ticular electrode arrangement employed t Average thickness of the sample mm R Measured resistance in ohms V D For circular electrodes D Outside diameter of guarded electrode g Distance between the guarded electrode and the ring electrode B Effective area coefficient p t Electrode Sample Ring Electrode Guarded HI HI Electrode 6517A 6517A V Source Picoammeter LO Guard LO Figure 2 35 Volume resisti
311. g buffer data lost reset to factory defaults but they are not stored into NVRAM To do this store read ings in the buffer Error 314 Instrument setup is reset to Save recall memory lost bench defaults are stored in EEPROM Note Any of these error conditions may occur the first time a unit is turned on or after replacing the firmware Error 514 Calibration lost Error 512 Power on state lost Error 511 GPIB address lost 2 2 4 Power on default conditions Power on default conditions are those conditions the instru ment assumes when it is first turned on You can change these power on default conditions except the primary address by using the save setup feature that is available with the MENU key as described in paragraph 2 19 1 2 3 Front Panel Operation Depending on the installed memory option either one five or ten user defined setups can be stored any one of which could be selected as the power on default Table 2 30 in paragraph 2 19 1 lists the default conditions that are set at the factory to optimize bench and GPIB IEEE 488 operation 2 2 5 Warm up period The Model 6517A can be used within one minute after it is turned on However the instrument should be turned on and allowed to warm up for at least one hour before use to achieve rated accuracy 2 2 6 IEEE 488 primary address The IEEE 488 primary address of the instrument must be the same as the primary address you spec
312. g event register sets when the cor responding bit in the condition register changes from 0 to 1 For example if bit B9 of the Positive Transition Register of the Measurement Transition Filter is set then the buffer full event is pro grammed for a positive transition The BFL bit B9 in the Measurement Event Register sets when the trace buffer becomes full For details on register structure see paragraph 3 8 The PTR registers are shown in Figures 3 34A through 3 39A Included is the decimal weight of each bit The sum of the decimal weights of the bits that you wish to set is the parameter lt NRf gt that is sent with the command For example to program RAV B5 and BFL B9 mea surement events for positive transitions send the following command stat meas ptr 544 where BFL bit B9 Decimal 512 RAV bit B5 Decimal 32 lt NRf gt 544 3 117 IEEE 488 Reference 3 118 Effects of positive transitions on the Measurement Event Register Measurement event Positive transition effect on Measurement Event Register Reading overflow Low limit 1 High limit 1 Low limit 2 High limit 2 Reading available Reading underflow Buffer available Buffer half full Buffer full Sequence reading available Buffer pretriggered Out of Limits Fixture lid closed V source compliance Bit Position Event Decimal Weighting Value Bit Position Event Decimal Weighting Value Figure 3 34 Sets BO wh
313. ge measurements disable zero check before connecting the input signal If zero check is left enabled when you connect the input signal the charge will dissipate through the 1OMQ resistor see Figure 2 46 Ci N Input 10MQ gt Cin 20pF Volts Zp 100 mA 100kQ I 1000pF A 100MQ 220pF nA 100GQ II 5pF pA Cin Input 10MQ Ze Cin 20pF Amps and Ohms gt Cin 1 Input 10MQ 1000pF gt Cin 20pF Coulombs Figure 2 46 Equivalent input impedance with zero check enabled 2 13 2 Relative REL The rel relative operation subtracts a reference value from actual readings When rel is enabled by the REL key the in strument uses the present reading as a relative value Subse quent readings will be the difference between the actual input value and the rel value You can also enter and enable a relative value from the CONFIG REL display see configur ing rel A rel value can be established for each measurement func tion The state and value of rel for each measurement func tion are saved when changing functions Once a rel value is established for a measurement function the value is the same for all ranges For example if 15V is set as a rel value on the 20V range the rel is also 15V on the 200V and 2V ranges A relative value can be as large as the highest allowable read ing for the particular function Selecting a range that cannot accommodate the rel value does not cau
314. ge the ex ponent value be sure to press ENTER DECIMAL CHAR This item is used to select between peri ods and commas to signify decimal points on the front panel display e PERIOD This option selects the period as the dec imal point for readings e COMMA This option selects the comma as the decimal point for readings TEMP UNITS Use this menu item to select the units C K or F for internal or external temperature measurements CLOCK The Model 6517A has a real time clock that is used for time stamping bus and buffer readings real time timestamp and as a control source for the Arm Layer Arm Layer 1 This GENERAL MENU selection is used to set the time date and format 12 hour or 24 hour for the real time clock TIME This item is used to set the time for the clock If the 12 hour format is selected AM or PM will be displayed The absence of AM or PM denotes the 24 hour format The format for time can be changed with the FORMAT menu item Use the cursor keys and the range keys to set the time hours minutes seconds Press AUTO to set seconds to zero DATE This item is used to set the date for the clock Use the cursor keys and the range keys to set the date Note that the day of the week Sun Mon etc is automatically calculated and displayed for the date FORMAT This item is used to select the time format for the clock e 12 HOUR With this selection real time
315. ge time surface resistivity test TSEQuence VRESistivity PDTime lt NRf gt Pre discharge time volume resistivity test Parameters lt NRf gt 0 to 99999 9 seconds Query PDTime Query pre discharge time Description This configuration command is used for the following tests Surface Resistivity Test Volume Resistivity Test This command is used to specify the pre discharge time for the specified test 3 25 10 MVOLtage lt NRf gt TSEQuence SRESistivity MVOLtage lt NRf gt Measure voltage sur resistivity test TSEQuence VRESistivity MVOLtage lt NRf gt Measure voltage vol esistivity test TSEQuence SIResistance MVOLtage lt NRf gt Measure voltage sur insul resistance test Parameters lt NRf gt 100 0 to 100 0 Volts 100V range 1000 to 1000 Volts 1000V range Query MVOLtage Query measure voltage Description This configuration command is used for the following tests 3 152 Surface Resistivity Test Volume Resistivity Test Surface Insulation Resistance Test This command is used to specify the measure voltage for the specified test 3 25 11 MTIMe lt NRf gt Parameters Query Description 3 25 12 HLEVel lt NRf gt Parameters Query Description 3 25 13 HTIMe lt NRf gt Parameters Query Description 3 25 14 LLEVel lt NRf gt Parameters Query Description IEEE 488 Reference TSEQuence SRESistivity MTIMe lt NRf gt Measure time surface resistivity test TSEQuence VRESistivi
316. ger control Acceptor Scan layer Scan spacing Immediate Number of scans 1 Scan trigger control Acceptor Channel Layer Channel spacing External Number of channels Use Scanlist length Channel trigger control Source Indicates that the setting is the RESET and factory default condition Notice that the Model 6517A is reset to BENCH defaults With this selection the electrometer stays armed Since the arm source and scan source are set to Immediate the Model 6517A waits in the measure layer for a trigger With the Channel Trigger Control of the switch system set for Source scan operation initially bypasses the need for an external trigger to close the first channel Since arm spacing and scan spacing are set to Immediate the scan starts as soon Front Panel Operation as the scanner is taken out of the idle state by pressing the STEP key When the front panel STEP key is pressed e The scanner arms and closes the first channel e After Channel 1 1 settles a trigger is sent from Channel Ready of the Model 7001 7002 to External Trigger Input of the Model 6517A to trigger a measurement of DUT 1 e After the Model 6517A completes the measurement it outputs a trigger from Meter Complete Output to Exter nal Trigger of the Model 7001 7002 which closes the next channel e After Channel 1 2 settles a trigger is sent to the Model 6517A to trigger a measurement of DUT 2 This process continues unti
317. gister B14 B2 Seq Arm Event Enable Register B15 B14 B2 B1 BO Seq 1 Sequence 1 Set bit indicates that the 6517 is in the arm layer of Sequence 1 amp Logical AND OR Logical OR PTR Positive Transition Register NTR Negative Transition Register Figure 3 9 Sequence event status IEEE 488 Reference Sequence B2 B1 Bo NTR Transition Filter Sequence Event To Sequence 1 Bit Seq 1 of Arm Event Condition Register See Figure 3 8 OR B15 B14 B3 Always Lay2 Lay1 Zero E Sequence B15 B14 B3 B2 B1 Bo Condition Register f E Lay2 Lay1 PTR B15 B14 B3 E y Lay2 Lay1 B15 B14 B3 B2 B1 B0 Register 0 A amp Sequence Event B2 B1 Bo Enable Register Lay1 Layer 1 Set bit indicates that 6517 is in arm layer 1 Lay2 Layer 2 Set bit indicates that 6517 is in arm layer 2 amp Logical AND OR Logical OR PTR Positive Transition Register NTR Negative Transition Register IEEE 488 Reference Figure 3 10 Trigger event status 3 12 To Waiting for Trigger Bit Trig of Operation Event Condition Register See Figure 3 7 Trigger Condition Register Trigger Bo NTR Transition Filter Trigger Event Trigger Event Seq1 PTR B15 B14 B
318. gital output line 4 is used for the binning strobe pulse After the appropriate digital pattern is placed on the other three lines of the output port the gt 10usec strobe pulse is asserted on line 4 The strobe is used to inform your external binning circuit that the output port lines 1 2 and 3 is ready to be read IMMediate CALCulate3 IMMediate Perform CALC 3 When you change the configuration of the limit test the next reading is evaluated according to that new test configuration If the instrument is not in a continuous measurement mode e g waiting for a manual trigger the test will not be performed until the next reading conversion occurs This action command allows you to re process the current input data to test new limits For ex ample assume the instrument is in a non continuous measurement mode and requires a manual trigger to cause the next reading conversion Changing the test limits will not affect the last test result However sending the IMMediate command re processes the data and evaluates the read ing according to the new test limits Note that sending the MMediate command does not ini tiate a reading conversion PRINT 1 output 27 trig sour bus Place 6517A in one shot mode SLEEP 3 Wait three seconds PRINT 1 output 27 calc3 imm IT Re perform limit test IEEE 488 Reference 3 14 CALibration subsystem There are two calibrate commands that are accessible to the ope
319. gration times set by resolution all functions Auto resolution all functions ccccccccceessceceesececeseececescecesaececesaecesuneecesaeceseaaecesseesssaeecsesecessteecssaeeedesees CONFIGURE SEQUENCE menu Structure cccccecsssecesesceeeeeeceneeeecsseceecseecseaeecnsaeeeeseeeensseeenaas CONFIGURE TRIGGER menu structure Maximum buffer readings zebuerger dee eege eege tents CONFIGURE DATA STORE menu structure Fill and stop sequence Continuous SEQUENCE seirer erra oei eea E EE EEEN EEE EE Eo EE ERE EE EERE E E a En PEE E ER EE Vass sedabesvadessnns PHU ESET UE eei CONFIGURE FILTER meni Structure c scccscscsssessssscseaetssascsovecsoabioseseaaeseunsssenssessssaspsobesesesseennsoens CONFIGURE MATH menu StrUCtite s c sic casks abecssesstsacvesessbensesseeseenschave aces snepnduusnatsvasusssosivestivbeasees MAIN MENU STRUCTURE E Factory default CONGIMODS x5 cesndeescsstsessessseniss NEEN ENEE EE IEEE 488 Reference General bus commands and associated statements ecesceceseeeseeeeeeecseceececeseeesaeceneecaeeeneeeteeeeneceaees TEEE 488 2 common commands and queries cccceceseeseceseeeeceeceeeceeeeeeeeaeseeecaeesaecaaesaecseseaeeeeeeees Signal oriented measurement command SUMMALY 00 eee ee eee eeee cee eeeceeeeaeceseeaeceecaeceeeeseeeeeeseteeeead CAL Culate command eummarg ee eee ese ce cece cae ceseeeeceaeaecesceseceeeeeseaeeeeseaesaaecaeesaecaecaeceseaeeeesees CALibration command oummarg eee ese
320. h device will listen As a talk er a device will output information and as a listener a device will receive information To simplify the task of keeping track of the devices a unique address number is assigned to each one On the bus only one device can talk at a time and is ad dressed to talk by the controller The device that is talking is known as the active talker The devices that need to listen to the talker are addressed to listen by the controller Each lis tener is then referred to as an active listener Devices that do not need to listen are instructed to unlisten The reason for the unlisten instruction is to optimize the speed of bus infor mation transfer since the task of listening takes up bus time Through the use of control lines a handshake sequence takes place in the transfer process of information from a talker to a listener This handshake sequence helps ensure the credibili ty of the information transfer The basic handshake sequence between an active controller talker and a listener is as fol lows 1 The listener indicates that it is ready to listen 2 The talker places the byte of data on the bus and indi cates that the data is available to the listener 3 The listener aware that the data is available accepts the data and then indicates that the data has been accepted 4 The talker aware that the data has been accepted stops sending data and indicates that data is not being sent 5 The listene
321. haracters that are enclosed in brackets are optional and need not be included in the program message 3 23 IEEE 488 Reference 3 24 Program messages A program message is made up of one or more command words sent by the computer to the in strument Each common command is simply a three letter acronym preceded by an asterisk SCPI commands are categorized into subsystems and are structured as command paths The fol lowing command paths are contained in the STATus subsystem and are used to help explain how command words are structured to formulate program messages STATus Path Root OPERation Path PTRansition lt NRf gt Command and parameter NTRansition lt NRf gt Command and parameter ENABle lt NRf gt Command and parameter PRESet Command 1 Single command messages There are three levels to the above command structure The first level is made up of the root command STATus and serves as a path The second level is made up of another path OPERation and a command PRESet The third path is made up of three commands for the OPERation path The four commands in this structure can be executed by sending four separate program messages as follows stat oper ptr lt NRf gt stat oper ntr lt NRf gt stat oper enab lt NRf gt stat pres In each of the above program messages the path pointer starts at the root command stat and moves down the command levels until the command is executed Multiple
322. hazard exists at a voltage level equal to or greater than 30V rms Hazardous voltages up to 500V may appear on the noise guard shield when performing floating measurements or guarded measurements The generic connections for the safety shield are shown in Figure 2 13 The metal safety shield must completely sur round the noise or guard shield and must be connected to safety earth ground using 18 AWG or larger wire gt Connect to 6517A chassis l CS Deviceor I ground via triax cable l Circuit ny i Under i si i Test i 4 Use safety shielding whenever r d r 230V is present on the guard or RM oe e b noise shield Guarded measure l ments and floating measurements SR R Ko i can place hazardous voltages on Safety Metal the guard noise shield Earth Safety Ground Shield Connect the safety shield to safety earth ground using 18 AWG wire or larger Figure 2 13 Safety shield 2 4 5 Floating circuits Many measurements are performed above earth ground and in some test situations can result in safety concerns Figure 2 14 shows two examples where the Model 6517A floats at a hazardous voltage level In Figure 2 14A a shock hazard 100V exists between meter input LO and chassis ground If meter input LO is connected to a noise shield then the shock hazard will also be present on that shield In Figure 2 14B a shock hazard 200V exists between the meter input HI and LO and chassis ground If
323. he Arm Layer Arm Layer 1 does not use a delay 3 143 IEEE 488 Reference 3 24 6 3 24 7 3 144 SOURce lt name gt ARM SEQuence 1 LAYer 1 SOURce lt name gt Specify arm event control source Parameters Query Description TiMer lt n gt Parameters Query ARM SEQuence 1 LAYer2 SOURce lt name gt Specify scan event control source TRIGger SEQuence 1 SOURce lt name gt Specify measure event control source lt name gt HOLD Hold operation in specified layer IMMediate Pass operation through specified layer RTCLock Select real time clock as event Arm Layer 1 only MANual Select manual event BUS Select GPIB trigger as event TLINk Select Trigger Link as event EXTernal Select External Triggering as event TIMer Select timer as event not available for Arm Layer 1 SOURce Query programmed control source These commands are used to select the event control source for the specified layer With HOLD selected operation stops and waits indefinitely in the specified layer While in HOLD operation can be continued by sending the MMediate command or the SIGNal command Keep in mind however that if the layer count is gt 1 HOLD is again enforced when operation loops back around With IMMediate selected do not confuse SOURce IMMediate with MMediate operation immediately passes through the specified layer A specific event can be used to control operation through a layer With BUS selected o
324. he VOLTAGE SOURCE OPERATE indi 2 46 cator light is on To place the voltage source in standby press the OPER key This key toggles the V Source between op erate and standby V Source configuration Operations to configure the V Source are performed from the V Source configuration menu which is summarized in Table 2 15 The CONFigure V SOURCE menu is displayed by pressing CONFIG and then OPER or A or W Paragraph 2 3 5 summarizes the rules for navigating through the menu structure The various items of this configuration menu are explained in the following paragraphs Table 2 15 CONFIGURE V Source menu structure Menu item Description RANGE Select V Source range 100V or 1000V V LIMIT Voltage limit menu CONTROL Use to enable or disable V Limit LIMIT VALUE Set maximum absolute output limit RESISTIVE LIMIT Enable or disable resistive I Limit METER CONNECT Enable or disable internal V Source LO to ammeter LO connection 2 9 1 Sourcing options The voltage source can be used as an independent source or it can be internally connected to the ammeter to force voltage measure current FVMI Independent source When used as an independent source voltage is available at the V SOURCE HI and LO ter minals on the rear panel see Figure 2 38 In this configura tion the V Source functions as a stand alone voltage source The V Source is isolated gt 1GQ from the measurement cir cuits of the Mod
325. he dimensions of the hole that must be cut into the test fixture chassis to mount the connec tor Figure 2 18D shows how to wire the connector to the test fixture interlock switch As an alternative you can remove one of the plugs from the Model 6517 ILC 3 and hard wire the interlock cable directly to the interlock switch of the test fixture as shown in Figure 2 19 Interlock Switch 1 erry To 6517A kam Open Lid Open Switch Interlock 3 gt 4 gt D Insulated To 6517A Terminal V Source gt Post 2 Out HI i Screw Terminal for To 6517A E Safety Earth Ground Input g Guard Plate E z T Warning Test fixture must be connected to safety earth ground using 18 AWG wire A Interlock Connector or larger Banana Jack 3 Lug Female Triax Connector Figure 2 16 Test fixture to source voltage measure current resistance measurements 2 16 Front Panel Operation Interlock Switch Screw Terminal for 1 a Open Lid Open Switch To 6517A ay 2 Interlock 32 gt 4 gt i EE EE be Guard Plate To 6517A l Ut i a Ee e Insulate g Terminal i Post 5 To 6517A a 3 o Input Ge DUT gt or Test I Circuit l l l l l To 6517A Common O gt H Safety Earth Ground 1 Warning Test fixture must be connected to safety earth ground using 18 AWG wire A Interlock Connect
326. he settling time for the relay switches on the internal scanner card After each switch closes a measurement will not occur until after the specified settling time expires SMEThod lt name gt ROUTe SCAN SMEThod lt name gt Select switching method lt name gt VOLTage Break before make switching method CURRent Normal switching method SMEThod Query switching method IEEE 488 Reference Description Parameters Query Description This command is used to select the switching method during an internal scan The VOLTage method ensures that each switch will open break before the next switch in the scan closes make This method ensures that two or more channels cannot be closed at the same time Use the CURRent switching method for optimum speed in applications where break before make is not necessary VSLimit lt b gt ROUTe SCAN VSLimit lt b gt Control 200V V Source Limit lt b gt 0 or OFF Disable 200V V Source Limit 1 or ON Enable 200V V Source Limit VSLimit Query state of 200V V Source limit This 200V V Source limit is used to help protect internal scanner cards from high voltage that could damage them With the 200V limit enabled the V Source can never source more than 200V Note that the SOURce VOLTage LIMit command is also used to set the voltage limit of the V Source Of the two voltage limit methods the one that is set to the lower limit value absolute is the one that will be in eff
327. hen an invalid amps measurement occurs Temperature Summary Sets B4 when an invalid external temperature reading occurs Humidity Summary Sets B9 when an invalid relative humidity reading occurs Ohms Summary Sets B10 when an invalid ohms measurement occurs Coulombs Summary Sets B11 when an invalid coulombs measurement occurs Sequence Test Summary Sets B12 when a sequence test is aborted Bit Position B15 B14 B13 B12 B11 B10 B9 B8 B7 Bo B5 B4 B3 B2 B1 BO Event Warn Seq Coul Hum Cal BAV RUF RAV Temp Amp Volt Decimal Weighting 16384 4096 2048 512 256 128 256 32 16 amati 2 1 214 212 29 28 27 26 25 24 21 20 Value 0 1 on o 1 Of OI o 1 Of 0 1 DI 1 oi Value 1 Enable Positive Transition 0 Disable Positive Transition Events Warn Command Warning Cal Calibration Summary Seq Sequence Test Summary Temp Temperature Coul Coulombs Amp Amps Summary Hum Humidity Summary Volt Volts Summary A Positive Transition PTR Filter Bit Position B15 B14 B13 B12 B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 BO Event Warn Seq Coul Hum Cal BAV RUF RAV Temp Amp Volt Decimal Weighting 16384 4096 2048 512 256 128 256 32 16 Baesch eem 2 1 214 212
328. high megohm resistor will often vary with the applied voltage Such variation in resistance is known as the voltage coefficient and is usually expressed in percent volt or ppm volt values To obtain consistent test re 2 42 sults these resistors should always be biased at the same voltage The Model 6517A can be used to characterize such resis tance changes by measuring the resistance with a number of different applied voltages Once the variations are known the voltage coefficient of the resistor being tested can be de termined TEST VOLTAGE and ELECTRIFICATION TIME Test Voltage Typically specified test voltages to be ap plied to the insulator sample are 100V 250V and 1000V Higher test voltages are sometimes used however the maxi mum voltage that can be applied to the Model 8009 is 1000V which is the maximum output of the Model 6517A V Source Unless otherwise specified the applied direct voltage to the insulator sample should be 500V Electrification Time Electrification time also known as bias time is the total time that the specified voltage is ap plied to the insulator sample when the measurement is taken For example for an electrification time of 60 seconds the measurement is to be taken after the insulator sample is sub jected to the applied test voltage for 60 seconds The conven tional arbitrary electrification time is 60 seconds Keep in mind that special studies or experimentation may dictate a dif
329. hronous Path to configure asynchronous Trigger Link ILINe lt NRf gt Select input line 1 to 6 2 ILINe Query input line OLINe lt NRf gt Select output line 1 to 6 1 OLINe Query output line SSYNchronous Path to configure semi synchronous Trigger Link LINE lt NRf gt Select trigger line 1 to 6 1 LINE Query trigger line Notes 1 Defaults for continuous initiation SYSTem PRESet enables continuous initiation RST disables continuous initiation 2 TLINK and RTCLock Arm Layer 1 are non SCPI parameters for the SOURce command The command SOURce and all the other parameters are SCPI confirmed 3 Defaults for count Arm Layer 2 and Trigger Layer SYSTem PRESet sets the count to INF infinite RST sets the count to 1 Table 3 16 TSEQuence command summary Default Command Description parameter SCPI Ref TSEQuence ARM Arms selected test sequence 3 25 1 ABORt Stops a test sequence in process 3 25 1 TYPE lt name gt Specify test DLEakage CLEakage CIResistance DLEakage 3 25 1 RVCoefficient SRESistivity VRESistivity SIResistivity SQSWeep STSWeep ALTPolarity TYPE Query test type TSOurce lt name gt Specify trigger source MANual IMMediate BUS TLINk MANual 3 25 1 EXTernal LCLosure 3 58 Table 3 16 Continued IEEE 488 Reference TSEQuence command summary Default Command Description parameter SCPI Ref TSEQuence
330. hrough 3 27 Note that reading an event register clears the bits in that register For example assume that reading the Measurement Event Register results in an acquired deci mal value of 544 The binary equivalent is 0000001000100000 For this binary value bits B5 and B9 of the Measurement Event Register are set The significance of a set bit in these registers depends on how the transition filter is programmed see PTRansition and NTRansition commands If an event is programmed for a positive tran sition PTR the corresponding bit in this register sets when the event occurs If the event is in stead programmed for a negative transition NTR the bit sets when the event becomes not true Measurement Event Register Bit BO Reading Overflow ROF Set bit indicates that the reading exceeds the measurement range of the instrument PTR or the instrument has gone from an overflow condition to a nor mal reading condition NTR See paragraph 2 3 2 Range Messages for more information Bit B1 Low Limit 1 LL1 Set bit indicates that the reading is less than the Low Limit 1 setting PTR or that a subsequent reading is no longer less than the Low Limit 1 setting NTR Bit B2 High Limit 1 HL1 Set bit indicates that the reading is greater than the High Limit 1 setting PTR or that a subsequent reading is no longer greater than the High Limit setting NTR Bit B3 Low Limit 2 LL2 Set bit indicates that the readi
331. iately drops down to the measure layer at point A Pressing STEP takes the Model 7001 7002 out of the idle state and places operation at point B in the flowchart Since both the arm layer and scan layers are programmed for Immediate Spacing operation drops down to the Channel Layer at point B Since Channel Trigger Source is set to Source the scan does not wait at point B for a trigger Instead it bypass es Wait for Trigger Link Trigger and closes the first chan nel point C Note that the Bypass is in effect only on the first pass through the model D After the relay settles the Model 7001 7002 outputs a Channel Ready pulse point D Since the instrument is pro grammed to scan ten channels operation loops back up to point B where it waits for an input trigger Note that Bypass is no longer in effect and Q Remember that the Model 6517A operation is at point A waiting for a trigger The output Channel Ready pulse from the Model 7001 7002 triggers the electrometer to measure DUT 1 point E After the measurement is com plete the Model 6517A outputs a completion pulse point F and then loops back to point A where it waits for another in put trigger The trigger applied to the Model 7001 7002 from the Model 6517A closes the next channel in the scan This triggers the electrometer to measure the next DUT The pro cess continues until all ten channels are scanned and mea sured 7001o0r 7002 Press STEP to star
332. ice request SRQ Status structure STATUS MSG 2 120 Storing and recalling readings 2 98 T TCONfigure commands 3 145 45 7 TEST Test description Test fixtures Test sequence programming example 3 155 Test sequences 2 60 Transition filters 3 14 Triboelectric_effects 2 127 Trigger Link 2 83 Trigger model 2 73 Trigger Model IEEE 488 operation Trigger subsystem 3 142 Triggers 2 71 UNIT Subsyste Using external feedback 2 54 V Voltage and current limit Kal Voltage measurement consideration Voltage measurement Voltage source 2 46 Voltage source output connections 2 11 Volts configuration V Source Configuration Commands 3 106 Warm up period Warranty information Z Zero check 2 58 Zero check and zero correct commands 3 133 Zero check relative and zero correct 2 58 Zero correc 2 60 1 3 KEITHLEY Service Form Model No Serial No Date Name and Telephone No Company List all control settings describe problem and check boxes that apply to problem LI Intermittent LJ Analog output follows display LJ Particular range or function bad specify LJ IEEE failure L Obvious problem on power up J Batteries and fuses are OK 1 Front panel operational J All ranges or functions are bad LJ Checked all cables Display or output check one LI Drifts LJ Unable to zero LJ Unstable J Will not read applied input
333. ices to the talker and listener idle states ATN Attention The controller sends ATN while trans mitting addresses or multiline commands SRQ Service Request SRQ is asserted by a device when it requires service from a controller Universal multiline commands Universal commands are those multiline commands that re quire no addressing All devices equipped to implement such commands will do so simultaneously when the commands are transmitted As with all multiline commands these com mands are transmitted with ATN true LLO Local Lockout LLO is sent to the instrument to lock out the LOCAL key and thus all their front panel con trols DCL Device Clear DCL is used to return instruments to some default state Usually instruments return to their pow er up conditions SPE Serial Poll Enable SPE is the first step in the serial polling sequence which is used to determine which device has requested service SPD Serial Poll Disable SPD is used by the controller to remove all devices on the bus from the serial poll mode and is generally the last command in the serial polling sequence Addressed multiline commands Addressed commands are multiline commands that must be preceded by the device listen address before that instrument will respond to the command in question Note that only the addressed device will respond to these commands Both the commands and the address preceding it are sent with ATN t
334. ify in the controller s programming language The default primary address of the instrument is 27 but you can set the address to any value from 0 to 30 by using the MENU key Refer to paragraph 2 19 2 for step by step instructions on setting the primary address 2 3 Display The display of the Model 6517A is primarily used to display readings along with the units and type of measurement When not displaying readings it is used for informational messages such as menu headings and selections At the top of the display are annunciators to indicate various states of operation 2 3 1 Exponent mode Engineering or Scientific Readings on the display can be expressed in engineering units or in scientific notation as shown in Table 2 4 In the scientific mode the exponent can be fixed to a specified val ue or it can be floating In the floating mode the instrument will automatically select the exponent value All exponent mode selections are performed from the DIS PLAY option of the GENERAL menu which is part of the MAIN MENU see paragraph 2 19 7 for details 2 4 Table 2 4 Typical display exponent values Engineering units Scientific notation Value Display Value Display Picoamperes pA 107A e 12A Nanocoulombs nC 10 C e 9C Microamperes uA 10A e 6A Milliamps mA 107A e 3A Kilo ohms kQ 10 Q e3Q Mega ohms MQ 10 Q e6Q Giga ohms GQ 10 Q e9Q Tera ohms TQ rie e12Q Peta ohms PQ 10 Q e15Q 2 3 2 In
335. igger Link connections for this test system are shown in Figure 2 64 Trigger Link of the Model 6517A is connect ed to Trigger Link of the Model 7001 7002 Switch System Notice that only one Trigger Link cable is needed For this example the Models 6517A and 7001 7002 are configured as follows Front Panel Operation INPUT DUT 1 1 1 Output DUT i Se F RS DUT i 10 O Card 1 7158 MUX Card Figure 2 64 DUT test system 7001 or 7002 Switch System Model 6517A Trigger Link able 8501 Figure 2 65 Trigger Link connections asynchronous example 1 2 85 Front Panel Operation Model 6517A Idle State Bench reset INIT CONT ON Arm layer Arm source Immediate Arm count 1 Arm trigger control Acceptor Scan layer Scan source Immediate Scan count Infinite Scan trigger control Acceptor Measure layer Measure source External Measure count Infinite Measure trigger control Acceptor Indicates that the setting is the BENCH RESET and factory default con dition Model 7001 or 7002 Idle State Reset INIT CONT OFF Scan List 1 1 1 10 Arm layer Arm spacing Immediate Arm count 1 Arm trigger control Acceptor Scan layer Scan spacing Immediate Number of scans 1 Scan trigger control Acceptor Channel Layer Channel spacing External Number of channels Use Scanlist leng
336. igits DIGits Query selected resolution DIGits DEFault Query RST default resolution DIGits MINimum Query minimum allowable resolution DIGits MAXimum Query maximum allowable resolution These commands are used to select display resolution for the specified measurement function Even though the parameters for this command are expressed as integers 4 to 7 you can specify resolution using real numbers For example to select 3H digit resolution let lt n gt 3 5 for 4Hd let lt n gt 4 5 and so on Internally the instrument rounds the entered parameter value to the nearest integer 3 97 IEEE 488 Reference Parameters Query AUTO lt b gt ONCE SENSe 1 VOLTage DC DIGits AUTO lt b gt IONCE Control auto resolution Volts SENSe 1 CURRent DC DIGits AUTO lt b gt IONCE Control auto resolution Amps SENSe 1 RESistance DIGits AUTO lt b gt IONCE Control auto resolution Ohms SENSe 1 CHARge DIGits AUTO lt b gt IONCE Control auto resolution Coulombs lt b gt lorON Enable auto resolution 0 or OFF Disable auto resolution ONCE Enable and then disable auto resolution AUTO Query state of auto resolution These commands are used to enable or disable auto resolution for the specified function With auto resolution selected the instrument automatically selects the optimum resolution for the present integration time setting see Table 2 18 The ONCE parameter is analogous to a momentary toggle switch
337. ile in the idle state the instrument can not perform any measure or scan functions Over the bus there are two SCPI commands that can be used to take the in strument out of the idle state INITiate or NITiate CON Tinuous ON Notice that with continuous initiation enabled INIT CONT ON the instrument will not remain in the idle state after all programmed operations are completed However the instru ment can be returned to the idle state at any time by sending the RST command the RCL command or the SYST PRES command Trigger model layers As can be seen in Figure 3 14 the trigger model uses three layers Arm Layer Arm Layer 2 and the Trigger Layer For front panel operation these layers are known as the Arm Layer Scan Layer and Measure Layer Once the Model 6517A is taken out of the idle state opera tion proceeds through the layers of the trigger model down to the device action where a measurement occurs Control sources In general each layer contains a control source which holds up operation until the programmed event occurs The control sources are summarized as follows e IMMediate With this control source selected event detection is immediately satisfied allowing operation to continue e MANual Event detection is satisfied by pressing the TRIG key Note that the Model 6517A must be taken out of remote before it will respond to the TRIG key Press LOCAL or send LOCAL 27 over the bus to take the i
338. imit for auto range 0 to 100e18 2e6 LLIMit Query lower limit AUTO Query auto range MANual Path to configure Manual V Source ohms CRANge Path to configure measurement range 3 19 6 UPPer lt n gt Select range 0 to 21e 3 20e 3 UPPer Query range AUTO lt b gt Enable or disable auto range Note 4 AUTO ONCE Set range based on present input signal AUTO Query auto range VSOurce Path to control the V Source AMPLitude lt n gt Specify V Source level 0 to 1000V 0 AMPLitude Query V Source level RANGe lt n gt Select V Source range lt 100 selects 100V range gt 100 100 selects 1000V range RANGe Query V Source range OPERate lt b gt Enable operate or disable standby V Source output OFF OPERate Query state of V Source REFerence lt n gt Specify ohms reference 100e18 to 100e18 0 V 3 18 7 STATe lt b gt Enable or disable ohms reference OFF V STATe Query state of ohms reference V ACQuire Use input signal as ohms reference REFerence Query ohms reference value V IREFerence lt b gt Enable or disable amps reference 3 19 8 IREFerence Query state of amps reference DIGits lt n gt Specify measurement resolution 4 to 7 6 3 18 9 AUTO lt b gt Enable or disable auto resolution AUTO ONCE Enable and then disable auto resolution AUTO Query auto resolution DIGits Query resolution 3 49 IEEE 488 Reference Table 3 10 Continued SENSe comma
339. in SSRIS inci n te bdss stake be anac seeds save oubevececcaubobanseduboedessOanencuddeanessbesescapiveussustscastbbaceescaebbidesdtaneeanl ie DISCard lt NR ES sig o ch iis lass dee ewe RE Oe i ian Sian SPO mts EE es ell E TG ss Test sequence programming example RS 232 Interiace Cong uratlon sj ss sesscsncsscsanes shied vesceediesdeu ieee cvsduevessised satus deunosvbbancess subeuessdueeseslesvusvssdavenafie RS 232 Operating Considerations El RS 232 Interfac Error Messages iscc icccsssccisisstsestentiaieyscustscucisdaevoasse R SEE Ear E steve cubs saevoouscssucnedaevensys fee Downloading commands using Procomm DDC programming Lan Pua ge eeneioe ia eai en E E E D Specifications Interface Functions Codes ASCII Character Codes and IEEE 488 Multiline Interface Command Messages IEEE 488 Bus Overview IEEE 488 Conformance Information SCPI Conformance Information Device Dependent Command Summary List of Illustrations 2 Figure 2 1 Figure 2 A Figure 2 B Figure 2 2 Figure 2 3 Figure 2 4 Figure 2 5 Figure 2 6 Figure 2 7 Figure 2 8 Figure 2 9 Figure 2 10 Figure 2 11 Figure 2 12 Figure 2 13 Figure 2 14 Figure 2 15 Figure 2 16 Figure 2 17 Figure 2 18 Figure 2 19 Figure 2 20 Figure 2 21 Figure 2 22 Figure 2 23 Figure 2 24 Figure 2 25 Figure 2 26 Figure 2 27 Figure 2 28 Figure 2 29 Figure 2 30 Figure 2 31 Figure 2 32 Figure 2 33 Figure 2 34 Figure 2 35 Figure 2 36 Figure 2 37 Figure 2 38 Cali
340. in the enable register allows enables the ESB bit to set when the corresponding standard event occurs The Standard Event Enable Register is shown in Figure 3 15 and includes the decimal weight of each bit The sum of the decimal weights of the bits that you wish to be set is the parameter value that is sent with the ESE command For example to set the CME and QYE bits of the Standard Event Enable Register send the following command ESE 36 where CME bit B5 Decimal 32 QYE bit B2 Decimal 4 lt NRf gt 36 If a command error CME occurs bit B5 of the Standard Event Status Register sets If a query error QYE occurs bit B2 of the Standard Event Status Register sets Since both of these events are unmasked enabled the occurrence of any one of them causes the ESB bit in the Status Byte Register to set The Standard Event Status Event Register can be read by using the ESE query command IEEE 488 Reference G Ge xafene ox oe ave Decimal Weighting 128 64 32 16 8 4 27 28 25 24 23 24 Value om Von O 1 O 1 1 1 o1 Note Bits B8 through B15 are not shown since they are not used Value 1 Enable Standard Event 0 Disable Mask Standard Event Events PON Power On URQ User Request CME Command Error EXE Execution Error DDE Device dependent Error QYE Query Error OPC Operation Complete Figure 3 15 Standard Event Enable Regi
341. include the brack ets when using an optional command word Parameter types Some of the more common parameter types are explained as follows lt b gt Boolean Used to enable or disable an instrument operation 0 or OFF dis ables the operation and or ON enables the operation Example CURRent DC RANGe AUTO ON Enable auto ranging lt name gt Name parameter Select a parameter name from a listed group Example lt name gt NEVer NEXt ALWays PRETrigger TRACe FEED CONTrol PRETrigger lt NRf gt Numeric representation format This parameter is a number that can be ex pressed as an integer e g 8 a real number e g 23 6 or an exponent 2 3E6 Example STATus MEASurement ENABle Set bit B2 of enable register 3 21 IEEE 488 Reference 3 22 lt n gt Numeric value A numeric value parameter can consist of an NRf number or one of the following name parameters DEFault MINimum or MAXimum When the DEFault parameter is used the instrument is programmed to the RST default value When the MINimum parameter is used the instrument is programmed to the lowest allowable value When the MAXimum param eter is used the instrument is programmed to the largest allowable value Ex amples TRIGger TIMer 0 1 Sets timer to 100msec TRIGger TIMer DEFault Sets timer to 0 1sec TRIGger TIMer MINimum Sets timer to Imsec TRIGger TIMer MAXimum Sets timer to 999999 999sec lt list gt List Sp
342. ined as follows CONTROL This item enables or disables control of the dig ital output lines by the results of either or both limit set tests For example to let limit set 1 control the digital output lines highlight the CONTROL item in the previous menu and press ENTER Then highlight the ENABLE item in the next menu and press ENTER The instrument returns to the LIMIT SET 1 MENU LOLIM1 HILIM1 LOLIM2 HILIM2 These items allow you to set values for the low and high limits and the action performed on the digital output lines for each limit test fail ure After selecting a limit the value for that limit will be dis played To change the limit use the cursor keys and the range keys to display the desired value Note that you must enter values in scientific notation Press ENTER to select your value and display the next menu which selects the digital output action to be taken if the se lected limit is the first limit to be exceeded The digital out puts can be toggled between ON and OFF with the range keys Each measurement function has a multiple display for the limits bar graph It shows a pass fail indication and a graph ical representation of the reading compared to limit set 1 If low limit 1 is less than high limit 1 you will see a display similar to that shown in Figure 2 77 Note that the Model 6517A does not check the validity of the high and low limit values when you enter them If low limit 1 is greater than o
343. ined text message These commands define text messages for display A message can be as long as 20 characters for the top display and up to 32 characters for the bottom display A space is counted as a char acter Excess message characters results in an error An indefinite block message must be the only command in the program message or the last com mand in the program message If you include a command after an indefinite block message on the same line it will be treated as part of the message and is displayed instead of executed STATe lt b gt DISPlay WINDow 1 TEXT STATe lt b gt Control message top display DISPlay WINDow2 TEXT STATe lt b gt Control message bottom display lt b gt 0 or OFF Disable text message for specified display 1 or ON Enable text message for specified display STATe Query state of message mode for specified display These commands enable and disable the text message modes When enabled a defined message is displayed When disabled the message is removed from the display GPIB Operation A user defined text message remains displayed only as long as the instru ment is in remote Taking the instrument out of remote by pressing the LOCAL key or sending LOCAL 27 cancels the message and disables the text message mode RS 232 Operation A user defined test message can only be cancelled by using this command to disable the message or by cycling power Description Description Descript
344. ing a reading the instant zero check is disabled or when an auto discharge occurs and subtracting it from all subsequent readings A better way to deal with this hop in charge is to enable REL immediately after zero check is dis abled or when auto discharge resets the charge reading This action nulls out the charge reading caused by the hop 2 9 Voltage source The built in bipolar 1W voltage source of the Model 6517A can source up to 1000V the V Source may reach 1010V if it is uncalibrated The two voltage ranges of the voltage source are summarized in Table 2 14 Table 2 14 V Source ranges Maximum output Range Voltage Current Step size 100V 100V 10mA 5mV 1000V 1000V lmA 50mV WARNINGS The maximum common mode voltage for the V Source is 750V peak That is the voltage between V Source LO and earth chassis ground must never exceed 750V peak and the voltage between V Source HI and earth chassis ground must never ex ceed 1760V peak Exceeding these values may create a shock hazard See paragraph 2 4 5 for information on floating the V Source With the voltage source in operate the pro grammed voltage value possibly hazard ous will be applied to the output terminals of the voltage source Keep the voltage source in standby until ready to safely source voltage NEVER make or break any connections with the instrument in oper ate The voltage source is in operate when t
345. ing event register except that it is a real time register that constantly updates to reflect the current operating status of the instrument See EVENt for register bit descriptions Note from the status structure paragraph 3 8 that the condition registers precede the transition filters Thus only the PTR descriptions apply to the condition registers After sending one of these commands and addressing the Model 6517A to talk a decimal value is sent to the computer The binary equivalent of this decimal value indicates which bits in the register are set For example if sending stat meas cond returns a decimal value of 512 binary 0000001000000000 bit B9 of the Measurement Condition Register is set indicating that the trace buffer is full STATus PRESet Return registers to default conditions When this command is sent the SCPI event registers are affected as follows 1 All bits of the positive transition filter registers are set to one 1 2 All bits of the negative transition filter registers are cleared to zero 0 3 All bits of the following registers are cleared to zero 0 A Operation Event Enable Register B Questionable Event Enable Register C Measurement Event Enable Register 4 All bits of the following registers are set to one 1 A Trigger Event Enable Register B Arm Event Enable Register C Sequence Event Enable Register Note Registers not included in the above list are not affected by this command
346. ing filter TYPE Select type of average filter NONE No average filtering performed AVERAGING Program a simple average filter 1 100 rdgs ADVANCED Program a simple average filter 1 100 rdgs with noise tolerance window 0 AVERAGING MODE MEDIAN 100 of range Select moving average or repeating average mode Configure median filter DISABLE Disable median filter ENABLE Enable median filter and specify rank 1 5 RESOLUTION Display resolution menu AUTO Default to resolution appropriate for integration time 3 5d 4 5d 5 5d 6 5d Select a specific resolution AUTO RANGE Autorange menu USE ALL RANGES Use all ranges when autoranging SET LIMITS Limit the ranges used in the autorange search MIN AUTO Specify the minimum range in the search MAX AUTO Specify the maximum range in the search DAMPING Enable or disable damping 2 6 3 Current measurement considerations Some considerations for making accurate current measure ments are summarized in the following paragraphs Addi tional measurement considerations are summarized in paragraph 2 21 For comprehensive information on precision measurements refer to the Low Level Measurements hand book which is available from Keithley 2 28 INPUT BIAS CURRENT An ideal ammeter would read OA with an open input In practice however ammeters do have some current that flows when the input is open This current is known as the input bias offset current and may be large eno
347. ing in formation 2 20 2 External scanning When using external scanning you can configure the Model 6517A to measure up to 400 channels In order to synchro nize Model 6517A measurements with external channel clo sure connect the Model 6517A external trigger inputs or the trigger link to the external switching mainframe trigger in puts and outputs Refer to paragraphs 2 15 4 and 2 15 5 for examples on using external triggering and the trigger link Use the following information to configure the Model 6517A for external scanning and to start the external scan Refer to the documentation supplied with the switching mainframe and the scanner card for specific configuration and connec tion information The following procedure uses menu structures to configure the instrument for external scanning General rules to navi gate through the menus are provided in paragraph 2 3 5 1 Set up the Model 6517A for the desired measurement i e set function range etc NOTE If there is no card installed in the option slot of the Model 6517A external scan ning will automatically be selected If there is a card installed in the option slot you will have to select external scanning as explained in the following step 2 Press CONFIG and then CARD and perform step a or b A Option slot empty You will be prompted to spec ify the number of external channels inputs to scan After entering the value press ENTER B Card instal
348. interval Description 3 24 8 SIGNal Description IEEE 488 Reference These commands are used to set the interval for the scan layer and measure layer timers Note that the timer is in effect only if the timer is the selected control source Also note that the arm layer Arm Layer 1 does not use a timer ARM SEQuence 1 LAYer 1 SIGNal Bypass arm control source ARM SEQuence 1 LAYer2 SIGNal Bypass scan control source STRIGger SEQuence 1 SIGNal Bypass measure control source These action commands are used to bypass the specified control source and also when you do not wish to wait for the programmed event Keep in mind that the instrument must be waiting for the appropriate event when the command is sent Otherwise an error occurs and this com mand is ignored 3 24 9 TCONfigure commands Query Description Parameters Query Description PROTocol lt name gt TRIGger SEQuence 1 TCONfigure PROTocol lt name gt Specify Trigger Link protocol lt name gt ASYNchronous Asynchronous Trigger Link mode SSYNchronous Semi synchronous Trigger Link mode PROTocol Query programmed Trigger Link protocol This command is used to select the protocol for the measure layer Trigger Link With ASYN chronous selected separate trigger lines are used for input and output triggers With SS YNchro nous selected a single trigger line is used for both input and output triggers Note that the arm and scan layers only
349. into OQIS Addressing the Model 6517A to talk sends the ASCII 1 to the computer Note that the instrument always goes into OQAS when OPC is executed If there are no pend ing command operations e g trigger model in idle state the Model 6517A immediately places an ASCII 1 in the Output Queue sets the MAV bit and returns to OQIS When used with the INITiate or INITiate CONTinuous ON command an ASCII 1 will not be sent to the Output Queue and the MAV bit will not set until the Model 6517A goes back into the idle state The initiate operations are not considered finished until the instrument goes into the idle state NOTE The INITiate POFLag command see paragraph 3 24 1 is used to include or exclude the No Operation Pending flag in the internal process of determining whether all pending operations of an initiate command are completed When used with the TRG command an ASCII 1 will not be placed into the Output Queue and the MAV bit will not set until the operations associated with the TRG command and the ini Date command are finished The TRG command is considered to be finished when the Device Action completes or when operation stops at a control source to wait for an event see Trigger Model in paragraph 3 9 In order to use OPC exclusively with the TRG command you will have to first force the com pletion of the initiate command so that only the TRG command is pending To do this send the ABORt command to
350. ion Parameters Query IEEE 488 Reference ATTRibutes DISPlay WINDow 1 ATTRibutes Query attributes primary display DISPlay WINDow2 ATTRibutes Query attributes secondary display This query command is used to determine which characters on the display are blinking and which are not The response message provides that status of each character position for the spec ified display The primary display consists of 20 characters and the secondary display consists of 32 characters 1 Character is blinking 0 Character is not blinking For example assume the following menu is displayed with the SAVESETUP option blinking MAIN MENU SAVESETUP COMMUNICATION TEST The response message for disp attr primary display will result in 20 zeroes as follows 00000000000000000000 The response message for disp wind 2 attr secondary display will display 1s at the character positions for SAVESETUP as follows 11111111100000000000000000000000 DATA DISPlay WINDow 1 DATA Read top display DISPlay WINDow2 DATA Read bottom display These query commands are used to read what is currently being displayed on the top and bottom displays After sending one of these commands and addressing the Model 6517A to talk the dis played data message or reading will be sent to the computer CNDisplay DISPlay CNDisplay Clear cancel NEXT display This action command is used to clear the bottom display of NEXT or PREV message
351. ionable Event Register 3 111 IEEE 488 Reference 3 112 Operation Event Register Bit BO Calibrating Cal Set bit indicates that the instrument is calibrating PTR or cali bration is complete NTR Bits B1 B2 B3 and B4 Not used Bit B5 Waiting for Trigger Trig Set bit indicates that the instrument is waiting in the trig ger layer PTR of the trigger model or that it has left the trigger layer NTR Bit B6 Waiting for Arm Arm Set bit indicates that the instrument is waiting in an arm layer of the trigger model PTR or operation has proceeded from the arm layers into the trigger layer NTR Bits B7 and B8 Not used Bit B9 Calculating Calc Set bit indicates that the instrument is calculating a reading PTR or that the calculation is completed NTR Bit B10 Idle Set bit indicates that the instrument is in the idle state PTR or has left the idle state to perform an operation NTR Bit B11 Sequence Test Running Seq Set bit indicates that a Sequence Test is running PTR or that the test has finished NTR Bits B12 through B14 Not used Bit B15 Always zero Bit Position B15 B14 B12 B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 BO Event Seq Idle Calc Arm Trig Cal Decimal Weighting 2048 1024 512 64 KS Se a 1 1011 210 29 26 2
352. ions the output trigger pulse is available at the METER COMPLETE Output connector The output trigger in these two layers is disabled when the source bypass is disabled The output trigger in the measure layer is always enabled and occurs after the device action With ACCeptor selected the bypass is disabled This simply means that operation will not pro ceed through the specified layer until the appropriate event occurs ASYNchronous commands ILINe lt NRf gt ARM SEQuence 1 LAYer 1 TCONfigure ASYNchronous ILINe lt NRf gt Select input trigger line arm layer ARM SEQuence 1 LAYer2 TCONfigure ASY Nchronous ILINe lt NRf gt Select input trigger line scan layer TRIGger SEQuence 1 TCONfigure ASYNchronous ILINe lt NRf gt Select input trigger line mea sure layer lt NRf gt 1 Line 1 lt NRf gt 4 Line 4 2 Line 2 5 Line 5 3 Line 3 6 Line 6 ILINe Query programmed input line These commands are used to select an input line for the asynchronous Trigger Link of the spec ified layer Keep in mind that asynchronous Trigger Link input and output see OLINe cannot share the same line If you assign the input to a line that is already being used for the output an error occurs and the command is ignored OLINe lt NRf gt ARM SEQuence 1 LAYer 1 TCONfigure ASYNchronous OLINe lt NRf gt Select output trigger line arm layer ARM SEQuence 1 LAYer2 TCONfigure ASY Nchronous OLINe lt NRf gt Sele
353. is selection the arm source is controlled by the Trigger Link of the Model 6517A Trigger Link is an enhanced trigger system that uses up to six lines to direct trigger pulses to and from other instruments Operation pass es into the scan layer when the Model 6517A receives a trig ger over the Trigger Link See paragraph 2 15 5 for details on using the Trigger Link NOTE The front panel TRIG key see MANU AL is active with the Trigger Link select ed Pressing the TRIG key passes operation into the scan layer After selecting TRIGLINK you will be prompted to select an input line and then an output line Note that you cannot use the same trigger line for both input and output RT Clock With this selection the arm source is controlled by the real time clock When the programmed time and data oc curs the Model 6517A passes operation into the scan layer e SET TIME Use this selection to set the time hour minute and second for the arm event Set the time using the 12 hour format if AM or PM is displayed see CLOCK in paragraph 2 19 7 Otherwise set the time using the 24 hour format e SET DATE Use this selection to set the date month day and year for the arm event HOLD When HOLD is selected the arm source is sup pressed As a result operation does not pass into the scan lay er until HOLD is cancelled by selecting one of the other arm source selections Select HOLD from the SELECT ARM SOURCE menu
354. ister An event register is a latched read only regis ter whose bits are set by the corresponding condition register and transition filter Once a bit in an event register is set it remains set latched until the register is cleared by a specific clearing operation The bits of an event register are logically ANDed with the bits of the corresponding enable register and applied to an OR gate The output of the OR gate is ap plied to another register set or to the Status Byte Register The ESR Common Command is used to read the Standard Event Register see paragraph 3 11 3 All other event regis ters are read using the EVENT query commands in the STATus Subsystem see paragraph 3 20 An event register is cleared when it is read The following operations clear all event registers e Cycling power e Sending CLS 3 8 4 Enable registers As shown in the illustrations each status register set has an enable register An enable register is programmed by the user and serves as a mask for the corresponding event register An event bit is masked when the corresponding bit in the enable register is cleared 0 When masked a set bit in an event reg ister cannot set a bit in a following register set or in the Status Byte Register 1 AND 0 0 To use the Status Byte Register to detect events i e serial poll you must unmask the events by setting 1 the appro priate bits of the enable registers The Standard Event Status Enable
355. k function provides a means to extend the capabilities of the Model 6517A Electrometer to such uses as logarithmic currents non decade current ranges as well as non standard coulombs ranges The following para graphs discuss the basic electrometer input circuitry and methods to implement these functions 2 11 1 Electrometer input circuitry A simplified diagram of the electrometer input in the external feedback mode is shown in Figure 2 42 An input current ap plied to the inverting input of the op amp is nulled by a current feedback through the internal feedback network made up of Rpg and Crp Because the output of the op amp appears at the PREAMP OUT this internal network can be replaced by an external network connected between the preamp output and Input HI connections When using exter nal feedback the following factors must be taken into ac count i Crp oo AM Reg e Zero Check BT Pop am i 100MQ S PL lt To Ranging Amplifier Input oe 12 S Common i Pream Out gt p Chassis Figure 2 42 Electrometer input circuitry external feedback mode 2 54 1 The maximum current value that can be supplied by the preamp output is 20mA in amps and ohms 1mA in volts The maximum voltage span in external feedback is 20V 2 The input impedance in the external feedback mode is given by the relationship Ziy Zpp Ay where Zrp is the impedance of the external
356. l lt list gt Define internal scan list and enable scan lt list gt scanlist where scanlist is the specified list of channels 1 to 10 to be scanned INTernal Query programmed scan list This command is used to define the scan list for the internal scanner card The scan list can con tain 2 to 10 channels The following examples demonstrate the various forms for expressing a scan list list 2 4 6 Channels separated by commas 1 8 Range of channels 1 though 8 Range limits separated by a colon 1 5 7 Range entry and single entry separated by a comma Refer to Section 2 of this manual and the instruction manual for the scanner card for details on scanning EXTernal lt n gt ROUTe SCAN EXTernal lt n gt Specify number of external channels lt n gt 1 to 400 Specify number of external channels DEFault 10 external channels MINimum 1 external channel MAXimum 400 external channels EXTernal Query programmed number of external channels EXTernal DEFault Query RST default channel number value EXTernal MINimum Query minimum channel number value EXTernal MAXimum Query maximum channel number value Description Parameters Query Description Parameters Query Description Parameters Query IEEE 488 Reference The Model 6517A can operate with an external switch system such as the Keithley Model 7001 or 7002 The Model 6517A can measure up to 400 channels that are switched by
357. l lt b gt Control A D hardware limit Disable A D hardware limit Enable A D hardware limit lt b gt 0 or OFF 1 or ON HI Control Query state of A D hardware limit This command is used to control the A D hardware limit With the hardware limit ON the Out OfLimit error message is enabled to indicate that an out of range noise spike has occurred Disabling the hardware limit disables the error message With the hardware limit OFF noise spikes may cause the reading to be erroneous IEEE 488 Reference 3 22 14 RS 232 Interface Commands Description Description Parameters Query Description The following commands are provided for control enabled or disabled of front panel keys while using the RS 232 interface LOCal SYSTem LOCal Take 6517A out of remote Normally the Model 6517A is in local during RS 232 communications In this state front panel keys are operational However the user may wish to lock out front keys during RS 232 commu nications see LLOCkout This action command is used to take the Model 6517A out of the remote state and enables the operation of front panel keys Note that this command can only be sent over the RS 232 interface REMote SYSTem REMote Place the Model 6517A in remote This action command is used to place the Model 6517A in the remote state In remote the front panel keys will be locked out if local lockout is enabled see LLOCkout Note that this com mand
358. l all ten channels are scanned and measured The data store capability of the Model 6517A could be used to store the measurements as they occur Just press the STORE key to set the number of readings to store then press ENTER The Model 6517A waits with the asterisk annunci ator lit for an external trigger from the Model 7001 7002 be fore taking a reading storing it and sending a trigger pulse External triggering example 2 External triggering can also be used in a test system consist ing of a Model 6517A Electrometer and a Model 706 Scan ner with an appropriate scanner card The external trigger connections are the same as those shown in Figure 2 62 for the Models 6517A and 7001 7002 Chan nel Ready Output of the Model 706 is connected to External Trigger Input of the Model 6517A External Trigger Input of the Model 706 is connected to Meter Complete Output of the Model 6517A The trigger configuration of the Model 6517A does not change from the previous example The Model 706 is config ured for external triggering 2 15 5 Trigger Link The Model 6517A has enhanced external triggering capabil ities using the Trigger Link The Trigger Link has six lines allowing up to six instruments to be controlled over this trig ger bus The pin layout of the 8 pin micro DIN sockets used for the Trigger Link is shown in Figure 2 63 In general Trigger Link input triggers to the Model 6517A are used to control the measure operation
359. le the range of resistance listed in Table 2 10 will result in voltage burden values in the range of ImV to 1V A useful alternative to a series resistor is a series diode or two diodes in parallel back to back The diodes can be small signal types and should be in a light tight enclosure 2 30 Vo or eo w v v Current Source Model 6517A Ammeter Figure 2 28 Source resistance and capacitance GUARDING For current measurements guarding is used to drastically re duce leakage currents in high impedance test circuits Am meter input LO inner shield of the triax cable is used as the guard High impedance current measurements Significant leakage could occur across a high impedance lt 1GQ DUT through the insulators as shown in Figure 2 29A where Ry and Ru represent the leakage resistance So instead of mea suring just the current Ip through R you are also measuring the leakage current 1 The current measured by the amme ter is Ip zb By connecting ammeter input LO to the metal mounting guard plate as shown in Figure 2 29B the leakage current l is shunted to ammeter input LO and is not measured by the ammeter Thus the ammeter only measures Ip IMele l IR gt HI LO E det Ri Ru e e 6517A Ss E dE T J Metal Mounting Plate Insulators YZ YZ A Unguarded Im Ip IR gt AA HI Oi e Reeg Ris l 6517A alee lt L FE A gt
360. led if no edit operations are per formed within any three second period 2 Using the keys place the cursor on the digit to be changed use the A or W key to increment or decrement the value 3 Polarity changes can be made in two ways Increment or decrement the reading past OV to change polarity Place the cursor on the polarity sign or and press A or F to toggle polarity Front Panel Operation 4 When finished the voltage source edit mode will cancel EDIT annunciator off after three seconds 2 9 3 Voltage and current limit The V Source has a 1mA current limit for the 1000V range a 10mA limit for the 100V range and an adjustable voltage limit If the current limit is reached the VOLTAGE SOURCE OPERATE indicator flashes While in current lim it the programmed voltage value is not being sourced For example assume the voltage source is programmed to source 200V to a 100kQ load In this situation current limit occurs at approximately 100V 100kQ x 1mA 100V Thus the voltage source will only output 100V A resistive current limit is also available for the V Source When selected a 20MQ resistor is placed in series with the V Source HI lead This allows current to be limited For ex ample with a programmed voltage of 100V current will be limited to 5uA 100V 20MQ 5uA Setting a voltage limit NOTE While in Auto V Source Ohms the voltage limit of the V Source can only be set to a value that is g
361. led in option slot Select the ENTER NAL INPUTS CHANNELS option from the menu and then specify the number of external chan nels inputs to scan After entering the value press ENTER Use the EXIT key to back out of the menu structure 3 Press the CARD key and perform step a or b A Option slot empty The displayed message will prompt you to reset the external scanner Press EN TER when ready 2 125 Front Panel Operation B Card installed in option slot Select the PER FORM SCAN option from the menu and select EX TERNAL scanning NOTE The CHANNEL CLOSURES option is used to open close channels on the scanner card installed in the option slot For details see the instruction manual for that card The displayed message will prompt you to reset the external scanner Press ENTER when ready 4 The next message will prompt you to set the channel count CHAN COUNT of the external scanner to infi nite Press ENTER when ready 5 The next message will prompt you to select the trigger source for the Model 6517A SELECT TRIG SOURCE TRIGLINK EXTERNAL TIMER GPIB MANUAL IMMEDIATE These trigger sources are explained in paragraph 2 15 6 The next message will prompt you to set the external scanner to the trigger source that you selected in step 6 for the Model 6517A Press ENTER when ready 7 The next message will prompt you to set the scan list of the external scanner for the appropriate number of chan ne
362. les and when feasible utilize proper shielding and guarding techniques Low noise input cables Triax cables can generate enough triboelectric currents to corrupt the measurement These currents are caused by fric tion between the center conductor and the inner shield when the cable is flexed or allowed to move around The use of low noise cables help minimize these triboelectric currents See paragraph 2 21 2 for more information on minimizing tri boelectric currents The following low noise cables are recommended for use with the Model 6517 e Model 237 ALG 2 This 2 meter low noise triax ca ble is terminated with a 3 slot male triax connector on one end and three alligator clips on the other end The alligator clip with the red boot is connected to the center conductor input high The black booted clip is con nected to the inner shield input low or guard The green booted clip is connected to the outer shield chas sis ground Model 7078 TRX 3 This 3 foot low noise triax ca ble is terminated with a 3 slot male triax connector on either end Model 7078 TRX 10 This is the same as the Model 7078 TRX 3 except that it is 10 feet in length Model 7078 TRX 20 This is the same as the Model 7078 TRX 3 except that it is 20 feet in length 2 12 Notes 1 For voltage measurements the increased input capaci tance caused by a long input cable can significantly slow down the reading response To minimize this
363. lied to the METER COMPLETE connector on the rear panel of the instrument This out going trigger pulse can be used to trigger another instrument to perform an operation see paragraph 2 15 4 External Triggering ADVANCED TRIGGER MODEL As shown in Figure 2 57 the advanced trigger model pro vides more triggering options which are programmed from the ADVANCED menu item of the CONFIGURE TRIG GER menu Note that scanning operations use this trigger model Advanced triggering is selected and configured from the ADVANCED menu item of the CONFIGURE TRIGGER menu Refer to Figure 2 57 for the following explanation of the advanced trigger model 2 73 Front Panel Operation Figure 2 57 Halt triggers or enable scanning Idle Arm Layer Arm Layer 1 Scan Layer Arm Layer 2 Measure Layer Trigger Layer Advanced trigger model 2 74 TRIG or SCAN Arm Trigger Control Source Source Bypass Enabled Arm Count Arm Event Detection Immediate External Manual GPIB Triglink RT Clock Hold Source Bypass Enabled Scan Trigger Control Source Source Bypass Enabled Scan Event Detection Another Scan 2 Output Trigger Scan Count Immediate External Manual GPIB Triglink Timer Hold Source Bypass Enabled 2 Scan Delay Measure Trigger Control Source Source Bypass Enabled Measure Event Detection An
364. listing provides the key press code in numeric order Figure 3 40 also provides the key press code 3 22 7 CLEar Description IEEE 488 Reference The KEY command allows you to select the NEXT displays over the bus Sending SYS Tem KEY 16 over the bus is same as a single press of the NEXT key Sending SYSTem KEY 8 is the same as a single press of the PREV key The NEXT display that is selected depends on how many times the NEXT key is pressed using the KEY command The instrument can al ways be returned to the normal display by pressing the PREV key a similar number of times or by sending the DISPlay CNDisplay command For example you can display the bar graph by pressing the NEXT key twice as follows isyst key 16 key 16 To return to the normal display press the PREV key twice as follows syst key 8 key 8 The queue for the KEY query command can only hold one key press When KEY is sent over the bus and the Model 6517A is addressed to talk the key press code number for the last key pressed either physically or with KEY is sent to the computer 6517A ELEGTROMETER HIGH RESISTANCE METER VOLTAGE SOURCE OPERATE CHK DEL INFO LOCAL Figure 3 40 Key press codes SYSTem CLEar Clear Error Queue This action command is used to clear the Error Queue of messages 3 131 IEEE 488 Reference 3 22 8 DATE lt yr gt lt mo gt lt day gt SYSTem DATE lt yr gt lt mo gt
365. ll take readings as fast as its measurement configuration allows MANUAL With this selection the front panel TRIG key controls the measure source A device action is performed when the TRIG key is pressed NOTE The front panel TRIG key is active when EXT GPIB or TIMER is selected GPIB With this selection bus triggers control the measure ment interval When the Model 6517A receives a bus trigger GET or TRG it performs a measurement See Section 3 for detailed information on bus triggers NOTE The front panel TRIG key see MANU AL is active with bus triggering selected Pressing the TRIG key performs a mea surement EXT With this selection external triggers are used to control the measurement interval Each trigger stimulus applied to the Model 6517A results in a measurement The external trigger is applied to the rear panel EXTER NAL TRIGGER BNC connector See paragraph 2 15 4 for detailed information on external triggering NOTE The front panel TRIG key see MANU AL is active with external triggering se lected Pressing the TRIG key performs a device action TIMER Use the timer to control the time interval between measurements The timer can be set for an interval from 0 001 seconds 1msec to 999999 999 seconds with Imsec resolution The first measurement occurs immediately while all subse quent measurements occur at the end of the programmed timer interval If however the programmed tim
366. lled from the OUTPut subsystem see paragraph 3 17 RAN e lt n gt SOURce VOLTage RANGe lt n gt Select V Source range lt n gt 0 to 1000 Specify output in volts DEFault 100V range MINimum 100V range MAXimum 1000V range RANGe Query voltage range RANGe DEFault Query RST default range RANGe MINimum Query minimum range RANGe MAXimum Query maximum range This command is used to select the optimum range for the V Source Specifying the output volt age value automatically selects the most sensitive range For example specifying a value lt 100 selects the 100V range Specifying a value gt 100 selects the 1000V range You cannot select the 100V range if the programmed amplitude value is greater than 100 A set ting conflict error will result LIMit AMPLitude lt n gt SOURce VOLTage LIMit AMPLitude lt n gt Set voltage limit lt n gt 0 to 1000 Set voltage limit DEFault 1000V MINimum OV MAXimum 1000V LIMit Query voltage limit LIMit DEFault Query RST default limit LIMit MINimum Query minimum limit LIMit MAXimum Query maximum limit This command is used to set an absolute value limit for the V Source For example setting a limit of 75V limits the V Source output to 75V The specified voltage limit is only in effect if the limit is enabled see LIMit STATe If dis abled the limit is simply dictated by the selected range 3 107 IEEE 488 Reference 3 108 Parameters
367. log ical terms TRUE FALSE and ON OFF rather than HIGH and LOW There are two sets of limits each with high and low limit val ues You can program and enable one or both limit sets With both sets enabled the values can overlap of one set can be in cluded in the other The only restriction is that within the same set the high limit must be greater than the low limit for a valid test The limit test is performed after MATH operations Unit pre fixes are applied before the limit test for example e Low limit 10 0 High limit 10 0 A 1 5V reading passes PASS e Low limit 10 0 High limit 10 0 A 0 6MQ reading equals 600 000 FAIL Limit set 1 is available as a multiple display which shows a bar graph and a pass fail indication for the measurements While the limits bar graph is displayed the programmed val ues for limit set 1 can be viewed by pressing INFO The digital output lines can be programmed to reflect the re sults of limit tests The first test that fails sets a programma 2 118 ble digital output pattern where the test execution order is LOW1 HIGH1 LOW2 HIGH2 If all tests pass another programmable pattern is set Also see DIGOUT in para graph 2 19 7 LIMIT SET 1 and LIMIT SET 2 These menu items are similar in that you can enable or dis able either or both limit sets and program the high and low limit values for either or both limit sets The options for these menu items are expla
368. lows the same procedure There are three ways to display a filter con figuration menu To configure the filter of the present function just press CONFIG then FILTER e To configure the filter of another function and remain in the present function press CONFIG and the appropri ate function key then select FILTER from its menu e To configure the filter of another function and change to that function press the appropriate function key and CONFIG then FILTER Select this menu item to configure the digital filter TYPE Use to select the type of digital filter e NONE Use this selection for no digital filtering e AVERAGING Use this selection for a non win dowed averaging filter A message indicating the pres ently set number of reading conversions to average the stack size is displayed If you change the filter value be sure to press ENTER Note that the number of reading conversions selected for the averaging filter type is also coupled to that for the advanced filter type 2 103 Front Panel Operation e ADVANCED This selection is for an averaging filter with a noise window A message indicating the present ly set number of reading conversions to average the stack size is displayed You can retain the present filter value or you can key in an other value In either case press ENTER to display the max imum noise window The displayed level is the plus or minus percentage
369. ls This is the same number of external inputs that was specified in step 2 Press ENTER when ready 8 The next message will prompt you to STEP the external scanner to the first channel Press ENTER when ready 9 The next message will prompt you to set the scan count for the Model 6517A The scan count specifies how many times you wish to repeat the scan For example if the scan list has 40 channels and the scan count is 5 then 40 channels will be scanned five times Press EN TER when ready 10 The next message will ask if you wish to use the scan timer of the Model 6517A If you selected TIMER as the trigger source in step 6 select YES You will then be prompted to enter the interval between triggers 0 001 sec to 999999 999 sec Otherwise select NO 11 The next message will ask if you wish to store the read ings in the buffer If you select YES the number of read ings that will be stored in the buffer will be displayed Note that the buffer size is limited see paragraph 2 16 for details 12 The last message prompts you to start the external scan by pressing ENTER The selected trigger source will control the scan Note that the TRIG key is always active to allow you to step through the scan 2 126 2 21 Other measurement considerations The following measurement considerations apply to all pre cision measurements For comprehensive information on all measurement considerations refer to the Low Level Mea surements ha
370. lt Query RST default range UPPer MINimum Query lowest measurement range UPPer MAXimum Query highest measurement range These commands are used to manually select the measurement range for the ohms function The range is selected by specifying the expected reading as an absolute value The Model 6517A will then go to the most sensitive range that will accommodate that expected reading For example if you expect a reading of approximately 100MQ simply let the parameter lt n gt 100e6 in order to select the 200MQ range AUTO lt b gt ONCE SENSe 1 RESistance AUTO RANGe AUTO lt b gt IONCE Control auto range for Auto V Source Ohms SENSe 1 RESistance MANual CRANge AUTO lt b gt IONCE Control auto range for Manual V Source Ohms lt b gt 1orON Enable auto range 0 or OFF Disable auto range ONCE Enable and then disable auto range AUTO Query autorange on or off These commands are used to control autoranging With autoranging enabled the instrument au tomatically goes to the most sensitive range to perform the measurement see paragraph 2 12 4 for details The ONCE parameter is analogous to a momentary toggle switch When AUTO ONCE is sent auto range enables and the most sensitive rangeis selected for the input signal Auto range will then disable but the selected measurement range is retained Note that the instrument must be on the ohms function in order for ONCE to be effective Using ONCE while on any other func
371. lts 100V range 1000 to 1000 Volts 1000V range LLEVel Query low level voltage This configuration command is used for the following test Square Wave Sweep Test This command is used to specify the low level voltage for the square wave sweep test 3 153 IEEE 488 Reference 3 25 15 LTIMe lt NRf gt Parameters Query Description 3 25 16 COUN lt NRf gt Parameters Query Description TSEQuence SQSWeep LTIMe lt NRf gt Low level time square wave sweep test lt NRf gt 0 to 9999 9 seconds LTIMe Query low level time This configuration command is used for the following tests Square Wave Sweep Test This command is used to specify the low level time for the square wave sweep test TSEQuence SQSWeep COUNt lt NRf gt Specify cycle count lt NRf gt to MAX 2 See table 2 22 COUNt Query cycle count This command is used to specify how many times to repeat the programmed square wave cycle 3 25 17 OFSVoltage lt NRf gt Parameters Query Description TSEQuence ALTPolarity OFSVoltage lt NRf gt Specify offset voltage lt NRf gt 1000 to 1000 Offset voltage OFS Voltage Query offset voltage This command is used to specify the offset voltage for the Alternating Polarity Resistance Resistivity test 3 25 18 ALTVoltage lt NRf gt Parameters Query Description TSEQuence ALTPolarity ALTVoltage lt NRf gt Specify alternating voltage lt NRf gt 1000 to 1000 Alterna
372. mand controls the temperature reading units for the multiple displays buffer readings and readings sent out over the bus 3 27 RS 232 Serial Interface The Model 6517A has a built in RS 232 serial interface Over this interface you can send program messages to the instrument and receive response messages from the instru ment You can also place the instrument in the talk only mode which allows you to dump readings to an external lis tening device such as a serial printer The serial port of the Model 6517A can be connected to the serial port of a computer for send receive operation or to a listener such as a serial printer for talk only operation The connection requirements are covered in paragraph 3 2 2 The SCPI programming language can be used over the RS 232 Serial Interface to communicate with the Model 6517A The DDC programming language cannot be used over the RS 232 interface 3 27 1 RS 232 Interface Configuration Model 6517A The RS 232 Serial Interface is selected and configured from the COMMUNICATION option of the MAIN MENU The MAIN MENU is accessed from the front panel by pressing the MENU key The following information summarizes the steps to select and configure the RS 232 interface For details on using the MAIN MENU see paragraphs 2 19 2 19 2 and Table 2 12 Paragraph 2 3 5 provides general rules to navi gate through the menu structure 1 Select the RS 232 interface as follows e Press MENU e Select CO
373. mand is used to select the timestamp type RTClock selects the real time clock times tamp Readings are reference to the date and time RTClock is a 100 year max calendar with 10msec resolution RELative selects the relative time timestamp Readings are referenced in seconds to a timer The timer starts at zero seconds when the instrument is turned on or when the timestamp is reset see next command RELative is a 55 day max clock with lusec resolution Description IEEE 488 Reference RELative RESet SYSTem TSTamp RELative RESet Reset relative timestamp to 0 This action command is used to reset the relative time timestamp to zero seconds 3 22 11 RNUMber RESet SYSTem RNUMber RESet Reset reading number to zero Description When the reading number is included as a GPIB data element see paragraph 3 16 FOR MAT ELEMents each reading sent over the bus is assigned a number starting at 0 The read ing number resets to zero when the instrument is turned on or when this action command is asserted 3 22 12 Zero check and zero correct commands Parameters Query Description Parameters Query Description ZCHeck lt b gt SYSTem ZCHeck lt b gt Control Zero Check lt b gt 0 or OFF Disable Zero Check 1 or ON Enable Zero Check ZCHeck Query state of Zero Check This command is used to enable or disable Zero Check See paragraph 2 13 for details on Zero Check ZCORrect STATe lt b gt S
374. mbs lt b gt 1 or ON Enable auto NPLC 0 or OFF Disable auto NPLC ONCE Enable and then disable auto NPLC AUTO Query state of auto NPLC These commands are used to enable or disable auto NPLC for the specified measurement func tion With auto NPLC enabled the instrument automatically optimizes the NPLC value for the present resolution setting Table 2 17 provides the integration times for SET BY RSLN AUTO The ONCE parameter is analogous to a momentary toggle switch When AUTO ONCE is sent auto NPLC turns on momentarily and then disables While enabled it automatically selects the appropriate value as summarized in the tables When auto NPLC disables NPLC remains at the selected value IEEE 488 Reference NPLC AUTO is coupled to the command that manually sets the NPLC value NPLC lt n gt When auto NPLC is enabled the parameter value for NPLC lt n gt changes to the automatically selected NPLC value Thus when auto NPLC is disabled NPLC remains at the automatically se lected value Also a valid NPLC value sent using the NPLC lt n gt command disables auto NPLC Auto NPLC is also coupled to auto aperture Enabling or disabling auto NPLC also enables or disables auto Aperture Also a valid aperture value sent using the APERture command disables auto NPLC 3 19 6 RANGe commands Volts Amps and Coulombs Ranges Parameters Query Description Parameters Query Description UPPer lt n gt S
375. ment conditions and 15 seconds according to the user s choice for the measurement of readings are stored to the buffer Normal conditions require 1 PLC the same amps range that will be used for the Alternating Polarity measurement and sim ilar preconditioning to the normal measurements If the sam ples are normally inserted into the fixture and immediately measured the stored readings should be performed similarly af ter lid closure etc After the storage is complete the standard deviation 1 sigma of these values is taken This can be done by retrieving the standard deviation of the buffer over the bus or by pressing RECALL once and NEXT repeatedly scrolling through the second line displays to the standard deviation This is Algg Assume for example that the result was 55fA or 5 5x1074 A Repeatability 5 5x10 4 A x 1013 Q 50V 0 1 0 011 0 1 or 1 2 Note that with normal ohms methods the 4pA total back ground current contributes as much as 400 error VsrcErr 0 15 x 50V 10mV 0 085V from 100V V source range specs IpasErr 1 x 50V 10 3 Q 30 counts x 10 16 A count 5 3x10 4 A from 20pA spec Accuracy 0 085V 5 3x107 4 A x 10 3 Q 50V 0 0123 or 1 23 Interface Function Codes The interface function codes which are part of the IEEE 488 standards define an instrument s ability to support various interface functions and should not be confused with pro gramming commands found
376. mer in terval Each time the programmed interval elapses a reading is triggered Use the TIMer lt n gt command to set the timer interval TIMer lt n gt SYSTem MACRo TRIGger TIMer lt n gt Set the timer interval lt n gt 0 001 to 99999 999 Specify timer interval in seconds DEFault 0 1 seconds MINimum 0 001 seconds MAXimum 99999999 seconds This command is used to specify the time interval for the timer The SOURce TIMer command is used to select the timer as the control source 3 22 16 INTerlock Description IEEE 488 Reference SYSTem INTerlock Set the timer interval This query command is used to determine if the safety interlock cable is connected to the Model 6517A The response message is interpreted as follows 1 Interlock cable connected to the 6517A and fixture or not connected to 6517A at all 0 Interlock cable connected to 6517A but not connected to fixture or interlock cable connected to 6517A but fixture lid is open If the interlock cable is not connected the Model 6517A cannot determine the state of the test fixture lid open or closed or read the test fixture switch settings A potential safety hazard is present when the fixture lid is open 3 23 TRACe subsystem 3 23 1 3 23 2 CLEar Description FREE Description The commands in this subsystem are used to configure and control data storage into the buffer The commands are summarized in Table 3 14 See paragraph 2 16
377. monstrates how to use the OPC command You should use SRQ to indicate when a test sequence is finished The programming example at the end of this subsystem generates an SRQ when the buffer is full test sequence finished The readings are then sent to the computer where they are displayed General Test Sequence Commands Description Description Parameters Query Description ARM TSEQuence ARM Arm selected test sequence This action command is used to arm the selected test sequence see TYPE The test will start when the programmed source event occurs see TSOurce When using this command for the Alternating Polarity High Resistance Resistivity Measurements wait at least 0 3 seconds before using the TRG trigger command ABORt TSEQuence ABORt Step test sequence in process This command is used to stop a test sequence that is in process You can start it again by arming ARM the test and providing the programmed source event TSOurce TYPE lt name gt TSEQuence TYPE lt name gt Select test sequence lt name gt DLEakage Diode Leakage Test CLEakage Capacitor Leakage Test ClResistance Cable Insulation Resistance Test RVCoefficient Resistor Voltage Coefficient Test SRESistivity Surface Resistivity Test VRESistivity Volume Resistivity Test SIResistivity Surface Insulation Resistance Test SQSWeep Square Wave Sweep Test STSWeep Staircase Sweep Test ALTPolarity Alternating Polarity Resistance Resistivity T
378. n 3 62 The commands in this subsystem are used to configure and control the three Calculate sub systems and are summarized in Table 3 4 This subsystem is used to configure and control the Polynomial and Percent math calculations Detailed information on math calculations is provided in paragraph 2 18 FORMat lt name gt CALCulate 1 FORMat lt name gt Specify CALC 1 format lt name gt NONE No calculation PERCent Percent calculation POLynomialPolynomial calculation RATioRatio calculation DEViationDeviation calculation PDEViationPercent deviation calculation LOG10Logarithmic base 10 calculation FOR Mar Query programmed math format This command is used to specify the format for the CALC 1 math calculation With NONE se lected no CALC 1 calculation is performed With one of the other formats selected and CALC 1 enabled see STATe the result of the calculation is displayed The calculated reading is re freshed every time the instrument takes a reading KMATh commands MAOFactor lt NRf gt CALCulate 1 KMATh MAOFactor lt NRf gt Specify a0 factor lt NRf gt 9 999999e30 to 9 999999e30 MAOFactor Query a0 factor This command is used to define the a0 factor for the polynomial calculation MA1Factor lt NRf gt CALCulate 1 KMATh MA1 Factor lt NRf gt Specify a1 factor lt NRf gt 9 999999e20 to 9 999999e20 MA1Factor Query al factor This command is used to specify the al factor for
379. n are dis played e ENABLED Enables line synchronization e DISABLED Disables line synchronization Trigger 1 Trigger 2 Trigger 3 occursin occursin occurs in this region this region this region Power Line Frequenc 2 0 1 2 3 PLC A D A D A D Conversion Conversion Conversion 1 starts 2 starts 3 starts Note A D conversions assume an integration time of lt 1 PLC Power Line Cycle Figure 2 82 Line cycle synchronization Changing the state of line synchronization halts triggers and puts the instrument into idle Press TRIG to return to re arm triggers DATA STAMP This menu item is used to enable or disable humidity and or external temperature measurements The relative humidity reading is controlled by placing the cursor on HUMIDITY and using a range key A and V to toggle between the desired state ON or OFF In a similar manner 2 123 Front Panel Operation external temperature is enabled or disabled from the TEM PERATURE item Temperature measurements can be expressed in C F or K See DISPLAY of the GENERAL MENU to select the de sired reading unit LIMIT CTRL The Model 6517A incorporates an A D hard ware limit circuit to detect out of range noise spikes When enabled ON the OutOfLimit message is displayed when an out of range noise spike occurs With the hardware OFF the error message is disabled In the OFF state out of range spikes may cause erroneous readings TIMESTA
380. n filter A transition filter is made up of two registers that are pro grammed by the user It is used to specify which transition 0 to 1 or 1 to 0 in the corresponding condition register will set the corresponding bit in the event register 3 14 Cal Calibration Summary Temp Temperature Summary Amp Amps Summary Volt Volts Summary amp Logical AND OR Logical OR PTR Positive Transition Register NTR Negative Transition Register A filter can be programmed for positive transitions PTR negative transitions NTR or both When an event is pro grammed for a positive transition the corresponding bit in the event register sets when the corresponding bit in the con dition register changes for 0 to 1 Conversely when pro grammed for a negative transition the bit in the event register sets when the corresponding bit in the condition register changes from to 0 The PTR and NTR commands in the Status Subsystem are used to set or clear the individual bits of the transition filter registers while the PTR and NTR query commands are used to read the registers see paragraph 3 20 for details Reading a transition filter register does not affect its bit pat tern The following operations set 1 all bits of all PTR registers and clear 0 all bits of all NTR registers e Cycling power e Sending STATus PRESet 3 8 3 Event registers As shown in the illustrations each status register set has an event reg
381. n gt Specify filter count for Amps SENSe 1 RESistance AVERage COUNt lt n gt Specify filter count for Ohms SENSe 1 CHARge AVERage COUNt lt n gt Specify filter count for Coulombs lt n gt lto 100 Specify filter count DEFault 10 MINimum 1 MAXimum 100 COUNt Query filter count COUNt DEFault Query the RST default filter count COUNt MINimum Query the lowest allowable filter count COUNt MAXimum Query the largest allowable filter count These commands are used to specify the filter count In general the filter count is the number of readings that are acquired and stored in the filter buffer for the averaging calculation The larger the filter count the more filtering that is performed STATe lt b gt SENSe 1 VOLTage DC AVERage STATe lt b gt Control filter Volts SENSe 1 CURRent DC AVERage STATe lt b gt Control filter Amps SENSe 1 RESistance AVERage STATe lt b gt Control filter Ohms SENSe 1 CHARge AVERagel STATe lt b gt Control filter Coulombs lt b gt 0 or OFF Disable the digital filter 1 or ON Enable the digital filter STATe Query state of digital filter These commands are used to enable or disable the digital averaging filter for the specified func tion When enabled readings will be filtered according to how the filter is configured 3 99 IEEE 488 Reference Parameters Query Description Attempting to set STATe to ON with TYPE at NONE and MED STA
382. nce R V I The V Source level can be set automat ically by the Model 6517A or it can be manually set by the user The following steps summarize the basic steps to measure re sistance WARNING Make sure the V Source is in standby In standby the OPERATE indicator is off The OPER key toggles the V Source be tween standby and operate NOTE To ensure proper operation always enable zero check ZeroCheck displayed be fore changing functions V I R or Q The Z CHK key controls zero check 1 Enable zero check by pressing Z CHK 2 Select RESISTANCE from the MEAS TYPE selection of the ohms configuration menu The ohms configura tion menu is accessed by pressing CONFIG and the R see paragraph 2 7 3 for details NOTE Step 2 can be skipped if the instrument is already in the resistance measurement mode Select the V Source adjustment mode With AUTO V Source selected the instrument will automatically select Front Panel Operation the optimum V Source value 40V or 400V for the mea surement range With MANUAL V Source selected you select the V Source range and value The V Source ad justment mode is selected from the VSOURCE item of the CONFIGURE OHMS menu See paragraphs 2 7 Auto V Source and 2 7 3 VSOURCE for details Connect the resistance to be measured to the Model 6517A Figure 2 31 shows typical connections while Figure 2 32 shows connections using the Model 8002A High Resistance T
383. nce value REFerence DEFault Query RST default reference value REFerence MINimum Query lowest allowable reference value REFerence MAXimum Query largest allowable reference value These commands are used to establish a reference value for the specified function When Ref erence is enabled see REFerence STATe the result will be the algebraic difference between the input signal and the reference value Reading Input signal Reference On the ohms function the input signal is considered to be the computed resistance value seen at the input Thus the final result is the algebraic difference between the input resistance and the reference Note that a reference for the current component of a resistance measurement can be established see CREFerence for details From the front panel reference is called relative REL See Section 2 for more information on REL The REFerence lt n gt command is coupled to the ACQuire command The last command sent REFerence lt n gt or ACQuire establishes the reference When a reference is set using the REFerence lt n gt command the REFerence query command returns the programmed value Conversely when a reference is set using the ACQuire command the REFerence query com mand returns the acquired reference value STATe lt b gt SENSe 1 VOLTage DC REFerence STATe lt b gt Control reference for Volts SENSe 1 CURRent DC REFerence STATe lt b gt Control referenc
384. nction is selected it will assume the programmed status GUARD The GUARD option is used to enable or disable guard When disabled the inner shell shield of the triax connector and Front Panel Operation cable is connected to meter input LO This mode is used for unguarded voltage current and charge measurements When enabled the inner shell shield of the triax connector and cable is connected to guard which follows the potential of meter input HI This mode is used for guarded voltage mea surements Guarding is explained in paragraphs 2 4 4 and 2 5 4 Guard is only in effect when the instrument is in the volts function In any other function guard is not used The fol lowing menu items are used to control GUARD ON Enable guard OFF Disable guard Table 2 7 CONFIGURE VOLTS menu structure Menu item Description GUARD Enable or disable guard EXT FDBK Enable or disable external feedback mode SPEED Measurement speed integration time menu NORMAL Select 1 PLC power line cycle 16 67msec for 60Hz 20msec for 50Hz and 400Hz FAST Select 0 01 PLC MEDIUM Select 0 1 PLC HIACCURACY Select 10 PLC SET SPEED EXACTLY Set integration in PLC 0 01 10 SET BY RSLN Default to setting appropriate for resolution FILTER Filter menu AVERAGING Configure digital averaging filter TYPE Select type of average filter NONE No average filtering performed AVERAGING Program a simple average filter 1 100 rdgs
385. nd EOI end or identify The following example shows how a multiple re sponse message is terminated 0 1 1 0 lt RMT gt Message exchange protocol The message exchange protocol can be summarized by the two following rules Rule 1 You must always tell the Model 6517A what to send to the computer The following two steps must always be performed in this order to send information from the instrument to the computer 1 Send the appropriate query command s in a program message 2 Address the Model 6517A to talk Rule 2 The complete response message must be received by the computer before another program message can be sent to the Model 6517A 3 11 Common commands IEEE 488 Reference Common commands summarized in Table 3 2 are device commands that are common to all devices on the bus These com mands are designated and defined by the IEEE 488 2 standard Table 3 2 IEEE 488 2 common commands and queries Mnemonic Name Description CLS Clear status Clears all event registers and Error Queue ESE lt NRf gt Event Enable command Program the Standard Event Enable Register ESE Event Enable query Read the Standard Event Enable Register ESR Event status register query Read the Standard Event Status Register and clear it IDN Identification query Returns the manufacturer model number serial number and firm ware revision levels of the unit OPC Operation complete command Sets the Operation Compl
386. nd is used to set the window for the ADVanced filter The number of readings that are averaged by the filter is set with the COUNt command and the TCONtrol command is used to select the filter mode moving or repeating The STATe com mand is used to enable or disable the filter Setting TYPE to NONE with MEDian STATe set to OFF will set AVER STATe to OFF Parameters Query Description Parameters Query Description Parameters Query Description IEEE 488 Reference TCONtrol lt name gt SENSe 1 VOLTage DC AVERage TCONtrol lt name gt Select filter mode Volts SENSe 1 CURRent DC AVERage TCONtrol lt name gt Select filter mode Amps SENSe 1 RESistance AVERage TCONtrol lt name gt Select filter mode Ohms SENSe 1 CHARge AVERage TCONtrol lt name gt Select filter mode Coulombs lt name gt REPeat Select repeating filter mode MOVing Select moving filter mode TCONtrol Query filter mode These commands are used to select the filter mode REPeat or MOVing for the specified func tion These filter modes are explained in paragraph 2 17 1 MOV during scan or test sequence will generate a Settings Conflict Error TCON will be set to REPeat during a scan or test sequence if filter is ON and the appropriate function is encoun tered COUNt lt n gt SENSe 1 VOLTage DC AVERage COUNt lt n gt Specify filter count for Volts SENSe 1 CURRent DC AVERage COUNt lt
387. nd summary Default Command Description parameter SCPI Ref RESistance AVERage Path to control average filter 3 18 10 TYPE lt name gt Select filter type NONE SCALar ADVanced SCALar TYPE Query filter type TCONtrol lt name gt Select filter type MOVing or REPeat Note 3 TCONtrol Query filter type COUNt lt n gt Specify filter count 1 to 100 10 COUNt Query filter count ADVanced Path to configure and control advanced filter NTOLerance lt n gt Specify noise tolerance leve 0 to 100 1 NTOLerance Query noise tolerance level STATe lt b gt Enable or disable digital filter OFF STATe Query state of digital filter MEDian Path to control median filter STATe lt b gt Enable or disable median filter ON STATe Query state of median filter RANK lt NRf gt Specify range 1 to 5 1 RANK Query rank DAMPing lt b gt Enable or disable damping OFF 3 19 12 DAMPing Query state of damping VSControl lt name gt Select ohms V Source mode MANual or AUTO MANual 3 19 16 VSControl Query ohms V Source mode MSELect lt name gt Select ohms measurement type NOR Mal or RESistivity NORMal 3 19 17 MSELect Query ohms measurement type RESistivity Path to configure resistivity 3 19 18 STHickness lt NRf gt Volume specify sample thickness 0 0001 to 99 9999mm 1mm STHickness Query sample thickness FSELect lt name gt Specify test fixture M8009 or USER M8009 FSELect Q
388. ndbook which is available from Keithley 2 21 1 Ground loops Ground loops that occur in multiple instrument test set ups can create error signals that cause erratic or erroneous mea surements The configuration shown in Figure 2 83 introduc es errors in two ways Large ground currents flowing in one of the wires will encounter small resistances either in the wires or at the connecting points This small resistance re sults in voltage drops that can affect the measurement Even if the ground loop currents are small magnetic flux cutting across the large loops formed by the ground leads can induce sufficient voltages to disturb sensitive measurements Signal Leads Instrument o o B o o Lo T Instrument Instrument Pm Cl Typical ground loop causes current flow k na signal lead VV Power Line Ground Figure 2 83 Multiple ground points create a ground loop To prevent ground loops instruments should be connected to ground at only a single point as shown in Figure 2 84 Note that only a single instrument is connected directly to power line ground Experimentation is the best way to determine an acceptable arrangement For this purpose measuring instru ments should be placed on their lowest ranges The configu ration that results in the lowest noise signal is the one that should be used INSTRUMENT INSTRUMENT INSTRUMENT A B C o oO O O L Tt T
389. nds LATest CALCulate 1 DATA LATest Read CALC 1 result This query command is used to read the result of the CALC 1 calculation If CALC 1 is disabled or NONE is selected the raw reading will instead be read 3 63 IEEE 488 Reference Description Query Description Program fragment 3 64 FRESh CALCulate 1 DATA FRESh Recalculate CALC 1 This query command is used to return a new fresh math result of CALC1 This command will not request the same result twice If a new reading is triggered this command will wait until the math result is available When CALC1 is disabled there is no difference between SENS DA TA FRES and CALC DATA FRES IMMediate CALCulate 1 IMMediate Recalculate CALC 1 IMMediate Perform calculation and read result equivalent to CALCulate 1 IMMedi ate DATA When you change the math calculation the next instrument reading reflects the new calculation assuming CALC math is enabled If the instrument is not in a continuous measurement mode i e waiting for a trigger the displayed reading will not update to the reflect the new calculation until the next reading conversion occurs This action command allows you to re process the current input data to reflect a new calculation For example assume the instrument is in a non continuous measurement mode and requires a manual trigger to cause the next reading conversion Changing the calculation will not affect the curre
390. neering units or scientific notation and digital calibration MAXIMUM INPUT 250V peak DC to 60Hz sine wave 10s per minute maximum on mA ranges MAXIMUM COMMON MODEVOLTAGE DC to 60Hz sine wave Electrometer 500V peak V Source 750V peak ISOLATION Meter COMMON to chassis Typically 10102 in parallel with 500pE INPUT CONNECTOR Three lug triaxial on rear panel 2V ANALOG OUTPUT 2V for full range input Inverting in Volts mode Output impedance 10kQ PREAMP OUTPUT Provides a guard output for Volts measurements Can be used as an inverting output or with external feedback in Amps and Coulombs modes EXTERNAL TRIGGER TTL compatible External Trigger and Electrometer Complete GUARD Switchable voltage guard available DIGITAL I O AND TRIGGER LINE Available see manual for usage EMI RFI Meets VDE 0871 and FCC Class B limits EMC Conforms to European Union Directive 89 336 EEC SAFETY Conforms to European Union Directive 73 23 EEC meets EN61010 1 IEC 1010 TEST SEQUENCES Device Characterization Diode Capacitor Cable Resistor Resistivity Surface Insulation Resistance Sweep READING STORAGE 100 readings DDC mode 15706 max readings SCPI mode READING RATE To internal buffer 125 readings second To IEEE 488 bus 115 readings second 3 To front panel 17 readings second2 Bus transfer 2500 readings second3 10 01 PLC digital filters off front panel off temperature RH off 2 1 00 PLC digital filters off temperature RH off
391. nfiguration 2 39 Ohms measurement considerationg 2 42 Operate 2 50 Options and accessories Other measurement considerations 2 126 Output Subsystems P Percent 2 105 Percent deviation 2 105 Piezoelectric and stored charge effects Polynomial 2 105 Power i default Power u p 2 2 Power up sequence 2 3 Preamp p sequen Programming syntax 3 21 Queued3 15 QuickBASIC 4 5 programming 3 4 R RANGe commands 3 90 Range and resolution eatto2 105 Relative humi dity_ and external tempera ture readings 2 128 Relative REL 2 59 REN remote enable 3 5 Resistance and resistivity measurements 2 33 Resistance measurements 2 33 Resistivity measurements 2 36 RFI EMI RS 232 Interface Commands RS 232 Interface Configuration 3 157 RS 232 Interface Error Messages RS 232 Operating Considerations RS 232 Serial Interface 3 157 RS 232 serial interface con nection 3 3 RTCLock commands Running the selected test S Safety symbols and terms 3 SAVESETUP Scanning 2 125 SCPI conformance information F 1 SDC selective device clear 3 6 Selecting and configuring mathl 2 106 Setting voltage source value 2 48 Shielded fixture construction 2 54 Signal oriented measurement command Sourcing options 2 46 SPE SPD serial polling 3 6 Specifications 1 2JA 1 SRE service request enable query 3 34 Status and error messages 2 5 Status byte and serv
392. ng and the user specified ref erence value X Y Deviation Y where X is the normal display reading Y is the specified reference value 2 105 Front Panel Operation Deviation is enabled through the CONFIGURE MATH menu see paragraph 2 18 7 2 18 5 Ratio The following calculation divides the normal display reading by the user specified reference value Ratio x Y where X is the normal display reading Y is the specified reference value Ratio is enabled through the CONFIGURE MATH menu see paragraph 2 18 7 2 18 6 Logarithmic This calculation converts input readings to logarithmic base 10 values The calculation is shown as follows logig X Y where X is the input reading Y is the logarithmic result Example Assume that exactly 1mA is being measured by the Model 6517A logi9 1 000000mA 3 Note that this calculation uses the absolute value of the nor mal input reading since you cannot compute the log of a neg ative number 2 18 7 Selecting and configuring math The polynomial percent ratio percent deviation or logarith mic calculation is selected and configured from the CON FIGURE MATH menu see Table 2 28 The selected calculation is enabled by pressing the MATH key MATH annunciator turns on The Model 6517A then displays the result of the calculation using scientific notation where nec essary The following display messages indicate which math calculation is being used NONE
393. ng calculation is completed Sets B10 when leaving the idle state Sequence Test Running Sets B11 when the aborted test is restarted Effects of negative transitions on the Trigger Event Register Negative transition effect on Trigger event Trigger Event Register Sequence 1 Sets B1 when leaving the Trigger Layer 3 125 IEEE 488 Reference 3 21 5 3 21 6 3 126 CONDition Description PRESet Description Effects of negative transitions on the Arm Event Register Negative transition effect on Arm event Arm Event Register Sequence 1 Sets B1 when leaving an arm layer Effects of negative transitions on the Sequence Event Register Negative transition effect on Sequence event Sequence Event Register Layer 1 Sets B1 when leaving arm layer 1 Layer 2 Sets B2 when leaving arm layer 2 STATus MEASurement CONDition Read Measurement Condition Register STATus QUEStionable CONDition Read Questionable Condition Register STATus OPERation CONDition Read Operation Condition Register STATus OPERation TRIGger CONDition Read Trigger Condition Register STATus OPERation ARM CONDition Read Arm Condition Register STATus OPERation ARM SEQuence CONDition Read Sequence Condition Register These query commands are used to read the contents of the condition registers Each set of event registers except the Standard Event register set has a condition register A condition register is similar to its correspond
394. ng example shows how to compute accuracy for the 20mA range Assume that the current you are measuring is reading exactly 10 0000mA on the 20mA range From the specs Accuracy 0 1 of 10mA 5 counts 0 01mA 5 counts 0 01mA 0 0005mA 0 0105mA Note 5 counts on the 20mA range equals 00 0005mA Thus the accuracy range for the 10 0000mA reading is 9 9895mA to 10 0105mA Specifications A 5 A 1 3 Calculating ohms accuracy The following information shows how to calculate ohms ac curacy for both Auto V Source Ohms and Manual V Source Ohms Auto V Source ohms From the specifications Auto V Source Ohms accuracy is calculated as follows Accuracy rdg counts The following example shows how to compute Auto V Source Ohms accuracy for the 2MQ range Assume that the resistor you are measuring is reading exactly 1 00000MQ on the 2MQ range From the specs Accuracy 0 125 of IMQ 1 count 1250Q 1 count 1250Q 10Q 1260Q Note 1 count on the 2MQ range 0 00001 MQ equals 10Q Thus the accuracy range for the 1 00000MQ Auto V Source reading is 0 99874MQ to 1 00126MQ Manual V Source ohms Accuracy for Manual V Source Ohms is determined by cal culating the accuracy of the amps measurement and the ac curacy of the V Source Accuracy for ohms is then calculated R V D using the worst case amps and volts readings The following example shows how to compute Manual V
395. ng is less than the Low Limit 2 setting PTR or that a subsequent reading is no longer less than the Low Limit 2 setting NTR Bit B4 High Limit 2 HL2 Set bit indicates that the reading is greater than the High Limit 2 setting PTR or that a subsequent reading is no longer greater than the High Limit 2 setting NTR Bit B5 Reading Available RAV Set bit indicates that a reading was taken and processed PTR or that a subsequent reading is in process NTR Bit B6 Reading UNderflow RUF Set bit indicates that the ohms reading is less than the lower range limit PTR or the instrument has gone from an underflow condition to a normal reading condition NTR See paragraph 2 3 2 Range Messages for more information 3 109 IEEE 488 Reference 3 110 Bit B7 Buffer Available BAV Set bit indicates that there are at least two readings in the trace buffer PTR or the buffer has become empty NTR Bit B8 Buffer Half Full BHF Set bit indicates that the trace buffer is half full PTR or that the buffer is no longer half full NTR Bit B9 Buffer Full BFL Set bit indicates that the trace buffer is full PTR or that the buff er is no longer full NTR Bit B10 Sequence Reading Available SRA Set bit indicates that a fresh reading from the Alternating Polarity Test Sequence is available and has been placed in the buffer PTR Bit B11 Buffer Pretriggered BPT Set bit indicates that
396. ng tracks the display resolution of the instrument An overflow and out of limit read as 9 9E37 zero check reads as 9 91E37 un derflow reads as 0 00E00 CHANnel Corresponds the instrument reading to the channel number of a switching card If not scanning the channel number is 000 RNUMber The instrument keeps track of the number of readings it has performed This reading counter starts at zero when the instrument is turned on or when SYStem RNUMber RESet is sent over the bus When a reading is sent over the bus i e FETCh the RNUMber element indicates the reading number The instrument also keeps track of the number of readings it has 3 77 IEEE 488 Reference stored in the buffer When buffer readings are sent over the bus TRACe DATA each reading number is referenced to the first reading which is 0 stored in the buffer If using Pre trigger to store readings the pre trigger readings are assigned negative numbers UNITs This element attaches the function unit to the reading the time unit sec to the times tamp and the channel unit internal or external to the channel number An internal channel re fers to an internally installed switching card channel while an external channel refers to the channel for an external switch system This element is not available for the binary formats TIMEstamp A timestamp is available to reference each reading to a point in time There are two basic types of timestamps real tim
397. nge Para graph 2 7 Ohms Ranges covers range limits and explains how to select the optimum range for ohms measurements OUT OF LIMITS This message indicates that a momen tary or transient out of range condition appeared at the input even though the integrated or average signal was within the full scale range of the A D converter It usually indicates that there is too much noise on the input signal for a valid mea surement Generally the OUT OF LIMITS condition can be eliminated by better shielding of the signal source or by using other noise reduction methods Another solution is to select the next higher range or lower R range to keep the transients less than full scale The 2nA 20nA and 200nA ranges and the R measurements that use these current ranges are particularly susceptible to this condition because of the combination of speed and sen sitivity A sine wave signal riding on a dc bias level is used to dem onstrate an OUT OF LIMIT reading Figure 2 A shows a sine wave riding on a 20nA bias level If this signal is mea sured on the 200nA range at normal speed it would simply read 20nA which is the dc average If however you use the 20nA range the positive peaks of the sine wave will be clipped as shown in Figure 2 B Clipping occurs at 110 of full range 22nA on the 20nA range Because of clipping the measurement of the input signal is significantly less than 20nA To avoid these bad readings the Model 651
398. nning Summarizes internal scanning using one of the optional scanner cards and explains how to use the Model 6517A in an external scanning system Front Panel Operation 2 21 Other measurement considerations Covers the measurement considerations that generally apply to all measurements 2 22 Relative humidity and external temperature read ings Explains how to include these readings with each volts amps ohms and coulombs measurement 2 2 Power up 2 2 1 Une power connections Follow the procedure below to connect the Model 6517A to line power and turn on the instrument 1 First check to see that the line voltage selection switch see Figure 2 1 on the rear panel is in the correct posi tion for the operating voltage in your area The 115V po sition is for line power in a voltage range from 90V to 125V The 230V position is for line power in a voltage range from 180V to 250V The instrument will operate at a line frequency of 50Hz 60Hz or 400Hz CAUTION Operating the instrument on an incor rect line voltage may cause damage to the instrument possibly voiding the warranty SELECTED LINE VOLTAGE 90 110V 180 220V 105 125V 210 250V d gt LO Figure 2 1 Line voltage switch 2 Before plugging in the power cord make sure the front panel power switch is in the off 0 position 3 Connect the female end of the supplied power cord to the AC receptacle on the rear panel Connec
399. now represents the leakage from ammeter input HI to ammeter input LO and re sistor Rg represents the leakage from ammeter input LO guard to test circuit common As previously mentioned the ammeter drops lt ImV It then follows that there is a lt ImV drop across Ry Thus the current through Ri is lt lpA lt ImV 1GQ lt 1pA The current that is measured by the Model 6517A is the sum of the two currents I Ip lt 1pA The use of guarding reduced the leakage current from 10nA to lt IpA Note that the 10nA leakage current Ig from am meter input LO to test circuit low still exists but it is of no consequence since it is not measured by the Model 6517A 10V k HI 6517A l Ik 10nA lt hr LO 10V A ANN R R _ 10V _ Ke l Jeg 10nA k o VW A Unguarded A Unguarded 10V 6517A k LO S l Ip lt 1pA ME lt le HI 10V R 1mV R mV s e e Cie e Rg JON _ 1GQ die rag A k kl Ka B Guarded B Guarded Figure 2 30 Floating current measurements 2 31 Front Panel Operation 2 7 Resistance and resistivity measure ments The Model 6517A can make resistance measurements and resistivity measurements surface and volume High resis tance measurements above 1MQ may exhibit problematic background currents and can be improved using the Alter nating Polarity Test Sequence see paragraph 2 14 Auto V Source The Model 6517A has an auto V S
400. ns located in the manual The JA symbol on an instrument shows that high voltage may be present on the terminal s Use standard safety pre cautions to avoid personal contact with these voltages The symbol indicates that the test fixture i e Model 8009 must be connected to a safety earth ground using 18 AWG wire or larger The WARNING heading used in this manual explains dan gers that might result in personal injury or death Always read the associated information very carefully before per forming the indicated procedure The CAUTION heading used in this manual explains haz ards that could damage the instrument Such damage may in validate the warranty 1 6 Specifications Full Model 6517A specifications are found in Appendix A 1 2 1 7 Inspection The Model 6517A was carefully inspected both electrically and mechanically before shipment After unpacking all items from the shipping carton check for any obvious signs of physical damage that may have occurred during transit Note There may be a protective film over the display lens which can be removed Report any damage to the shipping agent immediately Save the original packing carton for pos sible future reshipment If an additional manual is required order the appropriate manual package e Model 6517A User s Manual Keithley P N 6517A 900 00 Model 6517 Getting Started Manual Keithley P N 6517 903 00 Model 6517 Service Manual Keithle
401. nstccsvezsavbel buen cnecedausen chee E oa dee e EESE ai EEEE Eae rese eana ianen Basic measurement Drocedure eseceeeecesecesseceececeeeeseeeeccecsecesaecesecesueceaeecsaeecsaeeeaeeceeeeenecerecsaeeeaeecnees Conlombs configuration issiran eaaa aaa e D Charge measurement Considerations ce ececeeeeeeeseeeseceeeceeceesaecsaesaeceecaeceeceaeeeseseseeseseseaseaeeeeeeaeeaaes KEE ee e e E D Setting voltage EE Voltage and current E InterlOck anid test Dette i siseses arses Seege enee Eed Eed WI E SECULO ODAN CD EA NET e tr UE Predmp OU EE Using external E e es Electrometer Input GUEGHEEN Sauerei enee Eed DEES Sender Shielded fixture construction External feedback procedure geesde anes isi the eegene dereen bd ees EES Non standard coulombs ranges 00 0 cece cee ceseeeeceseeeceseeeceeeeseseseeeecaeesuecaessaecaecsaecaecsaeeaeceeseeseeeeeeteas RTE ege ege sees baceeeceetscansesursguunevuectannve es Non decade current gains Rane and LESOLIMOD EE H Meas rement TE D Display LESOMMIMOM ss oi ices tices desekes ted spook neonne EE EE E TEEI EIEEE EE TEE E evebeonessaeeisecviainefees Zero check relative and Zero COLTECL ecceeeeesesesssesescecececcecesecccsescececeseeecsuscsseeeuscscscaceceeseceeeeeeeseseneseneseeeees KR E E Relative E EEN KE EE E A RTE D Test descriptions Configure Test E Rummin ge The SCleCted LOSE ss sdeege gene eegene viet an E EE na E EOE EE EA E R EE peubycdesdesubs ekesedasaesuoreasene
402. nstrument out of remote e BUS Event detection is satisfied when a bus trigger GET or TRG is received by the Model 6517A e TIMer Event detection is immediately satisfied on the initial pass through the layer Each subsequent de tection is satisfied when the programmed timer interval 1 to 999999 999 seconds elapses A timer resets to its initial state when operation loops back to a higher layer or idle Note that TIMer is not available in Arm Layer 1 e EXTernal Event detection is satisfied when an input trigger via the EXTERNAL TRIGGER connector is re ceived by the Model 6517 e TLINk Event detection is satisfied when an input trigger via the TRIGGER LINK is received by the Mod el 6517 e RTCLock Event detection is satisfied when the pro grammed time and date occurs Note that the real time clock is only available as a control source for Arm Lay er 1 e HOLD With this selection event detection is not sat isfied by any of the above control source events and op eration is held up Control source loops As can be seen in the flowchart each layer has three paths that allow operation to loop around the control source These three paths are described as fol lows e DIRection Source Bypass When a source bypass is enabled DIRection SOURce and the EXTernal or TLINk control source is selected operation will loop around the control source on the initial pass through the layer If progr
403. nt timestamp is refer enced in days hours minutes and seconds to the previous timestamp Timestamp type for buffer readings is coupled to timestamp type for bus readings Thus if you change timestamp type from this menu structure it also changes in the MAIN MENU structure see TIMESTAMP in paragraph 2 19 8 FORMAT This menu item is used to check and or change the timestamp format Note that if format is changed after readings are stored in the buffer the timestamps will change to reflect the alternate format e ABSOLUTE With this selection each timestamp provides the time and date that the reading was taken see REAL TIME timestamp type or the number of seconds from the first buffer reading that the reading was taken see RELATIVE TIME timestamp type 2 97 Front Panel Operation DELTA With this selection each timestamp is referenced to the timestamp for the previous reading This provides the time between buffer readings Timestamps are provided in days hours minutes and seconds see REAL TIME times tamp type or in seconds see RELATIVE TIME timestamp type ELEMENTS Optional data elements can be included for each reading stored in the buffer After selecting ELEMENTS the status of each optional data element will be displayed A y indi cates that the element is in included while a n indicates that the data element is not included To change the status of a data element place the cursor
404. ntly displayed reading However sending the MMediate command re processes that dis played reading to reflect the new calculation Note that sending the IMMediate command does not initiate a reading conversion An alternate way to perform the calculation and read the result is by using the query form of the command MMediate When this command is sent the calculation is performed and the re sult is queried PRINT 1 output 27 syst pres IT Select defaults PRINT 1 output 27 trig sour bus Place 6517A in one shot measure mode SLEEP 3 Wait three seconds PRINT 1 output 27 calc form pol IT Select polynomial math calculation PRINT 1 output 27 calc kmat ma0f 50 Set a0 to 50 PRINT 1 output 27 calc stat oni IT Enable calculation SLEEP 3 Wait 3 seconds PRINT 1 output 27 cal imm Perform calculation adds 50 to reading 3 13 2 CALCulate2 Parameters Query Description Parameters Query Description Query Description IEEE 488 Reference This Calculate subsystem is used to configure and control CALC 2 operations on readings stored in the buffer FORMat lt name gt CALCulate2 FORMat lt name gt Specify CALC 2 format lt name gt MEAN Mean value of readings in buffer SDEVStandard deviation of readings in buffer MAXLargest reading in buffer MINLowest reading in buffer PKPK Peak to
405. o check is enabled The internal offset will become the correction value Zero correction can then be performed with zero check disabled The description for ZCOR rect STATe provides a command sequence using an acquired zero correction value TSControl lt b gt SYSTem TSControl lt b gt Control external temperature readings lt b gt 0 or OFF 1 or ON Disable external temperature readings Enable external temperature readings TSControl Query state of temperature readings This command is used to control external temperature readings When enabled and the Model 6517 TP connected to the instrument the Model 6517A will make external temperature read ings Note that ETEMperature has to be a selected data element in order to include the temper ature reading in the data string See paragraphs 3 17 FORMat ELEMents and 3 23 TRACe ELEMents HSControl lt b gt SYSTem HSControl lt b gt Control humidity readings lt b gt 0 or OFF 1 or ON Disable humidity readings Enable humidity readings HSControl Query state of humidity readings This command is used to control humidity readings When enabled and the Model 6517 RH connected to the instrument the Model 6517A will make humidity readings Note that HUMid ity has to be a selected data element in order to include the humidity reading in the data string See paragraphs 3 17 FORMat ELEMents and 3 23 TRACe ELEMents HLControl lt b gt SYSTem HLContro
406. o range limit HIGH LGRoup Query auto range limit AUTO Query auto range y REFerence lt n gt Specify reference 2 le 6 to 2 1e 6 0 V 3 19 7 STATe lt b gt Enable or disable reference OFF y STATe Query state of reference V ACQuire Use input signal as reference REFerence Query reference value V DIGits lt n gt Specify measurement resolution 4 to 7 6 3 19 9 AUTO lt b gt Enable or disable auto resolution AUTO ONCE Enable and then disable auto resolution AUTO Query auto resolution DIGits Query resolution ON AVERage Path to control the average filter 3 19 10 TYPE lt name gt Select filter type NONE SCALar ADVanced TYPE Query filter type TCONtrol lt name gt Select filter type MOVing or REPeat MOVing TCONtrol Query filter type COUNt lt n gt Specify filter count 1 to 100 10 COUNt Query filter count ADVanced Path to configure and control advanced filter NTOLerance lt n gt Specify noise tolerance level 0 to 100 1 NTOLerance Query noise tolerance level STATe lt b gt Enable or disable filter OFF STATe Query state of digital filter MEDian Path to control the median filter STATe lt b gt Enable or disable median filter ON STATe Query state of median filter RANK lt NRf gt Specify rank for median filter 1 RANK Query rank ADIScharge Path to control auto discharge 3 19 14 STATe lt b gt Enable or disable auto discharge OFF STATe Query sta
407. obe errors Tea 5 C 1 PLC integration time HUMIDITY ACCURACY 1 Year RANGE 18 28 C rdg RH 0 100 0 3 0 5 1 Humidity probe accuracy must be added This is 3 RH for Model 6517RH up to 65 C probe environment not to exceed 85 C A 4 Specifications TEEE 488 BUS IMPLEMENTATION MULTILINE COMMANDS DCL LLO SDC GET GTL UNT UNL SPE SPD IMPLEMENTATION SCPI IEEE 488 2 SCPI 1993 DDC IEEE 488 1 UNILINE COMMANDS IFC REN EOI SRQ ATN INTERFACE FUNCTIONS SH1 AH1 T5 TEO L4 LEO SR1 BLL PPO DC1 DT1 CO E1 PROGRAMMABLE PARAMETERS Function Range Zero Check Zero Suppress EOI DDC mode only Trigger Terminator DDC mode only 100 Reading Storage DDC mode 15706 Max Reading Storage SCPI mode Calibration SCPI mode only V Source Output Display Format SRQ Status including V Source I Limit Output Format Guard ADDRESS MODES TALK ONLY and ADDRESSABLE TRIGGER TO READING DONE 150ms typical with external trigger RS 232 IMPLEMENTATION Supports SCPI 1991 0 Baud Rates 300 600 1200 2400 4800 9600 19 2k PROTOCOLS Xon Xoff 7 or 8 bit ASCII parity odd even none CONNECTOR DB 9 TXD RXD GND GENERAL DISPLAY 6 digit vacuum fluorescent multiline OVERRANGE INDICATION Display reads OVERFLOW RANGING Automatic or manual CONVERSION TIME Selectable 0 01 PLC to 10 PLC PROGRAMS Provide front panel access to IEEE address choice of engi
408. odel 8009 Resistivity Test Fixture This is a guarded test fixture for measuring volume and surface resistivities It can accommodate sheet samples 64 to 102mm 2 1 2 to 4 in in diameter and up to 3 175mm 1 8 in thick Models 8501 1 and 8501 2 Trigger Link Cables Connect the Model 6517A to other instruments with Trigger Link connectors e g Model 7001 Switch System The Model 8501 1 is one meter long the Model 8501 2 is two meters long Model 8502 Trigger Link Adapter Allows you to connect the Trigger Link of the Model 6517A to instruments that use the standard BNC In Out external triggering technique Model 8530 IEEE 488 to Centronics Printer Adapter Ca ble Translates the IEEE 488 connector pinout and signal level to a Centronics termination This permits a standard Centronics parallel printer to be connected to a Model 6517A in TALK ONLY mode Model 8606 High Performance Probe Tip Kit Consists of two spade lugs two alligator clips and two spring hook test probes The spade lugs and alligator clips are rated at 30V RMS 42 4V peak the test probes are rated at 1000V These components are designed to be used with high performance test leads terminated with banana plugs such as the Model 8607 High Performance Banana Cables Model 8607 High Performance Banana Cables Consists of two high voltage 1000V banana cables The cables are terminated with banana plugs that have retractable sheaths CS 751 Barrel Adapter This
409. of range window around the first reading conversion in the stack Be sure to press ENTER if you key in a different percentage Note that the number of reading conversions filter value se lected for the advanced filter is also coupled to that for the averaging filter AVERAGING MODE This selection determines the mode of an average filter for a measurement function either a mov ing or repeating average Table 2 27 CONFIGURE FILTER menu structure e MOVING This item selects a moving filter where a new reading conversion is shifted into a stack as the old est conversion is shifted out FIFO When the stack is full a simple average is taken to yield a reading e REPEAT This menu item selects a repeating filter where an average of a selected number of reading con versions is taken for each reading MEDIAN Use this selection to enable or disable the median filter DISABLE Use this selection to disable the median filter ENABLE Use this selection to enable the median filter and specify the rank If you change the rank be sure to press EN TER AVERAGING MODE Menu item Description FILTER Filter menu AVERAGING Configure digital averaging filter TYPE Select type of average filter NONE No average filtering performed AVERAGING Program a simple average filter 1 100 rdgs ADVANCED Program a simple average filter 1 100 rdgs with noise tolerance window 0 100 of range Select moving average or r
410. of the Model 6517A Model 6524 Hi R Software Package Designed to aid in making more repeatable high resistance resistivity measure ments Four windows driven programs increase measure ment precision ease download and analysis of Hi R data and allow cross correlation of environmental factors Models 7007 1 and 7007 2 Shielded IEEE 488 Cables Connect the Model 6517A to the IEEE 488 bus using shield ed cables and connectors to reduce electromagnetic interfer ence EMI The Model 7007 1 is one meter long the Model 7007 2 is two meters long Models 7078 TRX 3 7078 TRX 10 and 7078 TRX 20 Triax Cables These are low noise triax cables terminated at General Information both ends with 3 slot male triax connectors The 3 model is 3 ft 0 9m in length the 10 model is 10 ft 3m in length and the 20 model is 20 ft 6m in length Model 7078 TRX TBC Connector This is a 3 lug female triax bulkhead connector with cap for assembly of custom panels and interface connections Suitable for use with the Model 6517A V Source in high voltage applications Model 8002 ILC 3 Safety Interlock Cable Designed to connect the lid interlock circuit of the Model 8002A test fix ture to the interlock circuit of the Model 6517A Model 8002A High Resistance Test Fixture Used with the Model 6517A to make accurate high resistance measure ments of DUT Designed to minimize leakage currents that can corrupt the integrity of the measurement M
411. of times the instrument is to be armed COUNT e To enable or disable the Source Bypass The arm layer is configured from the ARM item of the AD VANCED menu SOURCE This menu item selects the event that controls the arm source IMMEDIATE With this selection operation passes immedi ately into the scan layer EXTERNAL With this selection external triggers are used to control the arm source A trigger stimulus applied to the Model 6517A passes operation into the scan layer The exter nal trigger is applied to the rear panel EXTERNAL TRIG GER BNC connector See paragraph 2 15 4 for detailed information on external triggering NOTE The front panel TRIG key see MANU AL is active with external triggering se lected Pressing the TRIG key passes operation into the scan layer 2 80 MANUAL With this selection the front panel TRIG key controls the arm source Operation passes into the scan layer when the TRIG key is pressed NOTE The front panel TRIG key is active when EX TERNAL GPIB or TRIGLINK is selected GPIB With this selection bus triggers control the arm source Operation passes immediately into the scan layer when a bus trigger GET or TRG is received by the Model 6517A See Section 3 for detailed information on bus triggers NOTE The front panel TRIG key see MANU AL is active with bus triggering selected Pressing the TRIG key passes operation into the scan layer TRIGLINK With th
412. ollowing options ACTIVE HIGH Use this option to set the sense of the selected output line to active high ACTIVE LOW Use this option to set the sense of the selected output line to active low To check or change output sense place the cursor on the ap propriate line and press ENTER Cursor position indicates the present logic sense for the selected line ACTIVE HIGH or ACTIVE LOW To change the sense place the cursor on the alternate selection and press ENTER SERIAL This item displays the serial number SCPI version and firm ware revision levels of the instrument The following infor mation is displayed Front Panel Operation Serial XXXXXX SCPI version 1991 0 software rev AXX AYY where XXXXXX is the serial number of the instrument AXX is the firmware level for the main microcon troller AYY is the firmware level for the display microcon troller A D CONTROLS With this GENERAL MENU item you can control line syn chronization and enable or disable humidity and external temperature measurements LINE SYNC Synchronizing A D conversions with the pow er line frequency increases common mode and normal mode rejection When line cycle synchronization is enabled the measurement is initiated at the first positive going zero crossing of the power line cycle after the trigger see Figure 2 82 When LINE SYNC is selected the power line frequency is displayed and the options for line synchronizatio
413. oltage Fuse type part no 90 125V 180 250V 1 2A 250V Slo Blo FU 71 1 4A 250V Slo Blo FU 96 4 2 2 3 Power up sequence On power up the Model 6517A performs self tests on its EPROM and RAM and checksum tests on data stored in non volatile memory See Table 2 2 If a failure is detected the instrument momentarily displays an error message and the ERR annunciator turns on Messages are listed in Table 2 3 NOTE If a problem develops while the instru ment is under warranty return it to Kei thley Instruments Inc for repair If the instrument passes the self tests the firmware revision levels and the communications status are displayed An ex ample of this display is shown as follows Model 6517A Rev B12 A02 IEEE Addr 27 SCPI The firmware revision levels left to right are for the main microcontroller and display microcontroller The revision level number may be different in your particular unit The TEEE 488 address is its default value of 27 and the SCPI lan guage is selected DDC will be displayed if the DDC lan guage is selected instead If the RS 232 interface is selected the message RS 232 enabled is displayed instead of the TEEE 488 address Next if the unit is configured to display the calibration due date at power up the unit shows the following Model 6517A Calibration due mmm dd yy where mmm is the month abbreviation dd is the day and yy is th
414. ommand restores control to the front panel Program fragment PRINT 1 remote 27 Place 6517A in remote PRINT 1 local lockout Lock out front panel including LOCAL key SLEEP 6 Wait 6 seconds PRINT 1 Local 27 Restore front panel operation 3 6 4 GIL go to local The GTL command is used to take the instrument out of the remote state Operation of the front panel keys will also be restored by GTL Program fragment PRINT 1 remote 27 Place 6517A in remote SLEEP 3 Wait 3 seconds PRINT 1 local 27 Take 6517A out of remote 3 6 5 DCL device clear The DCL command may be used to clear the IEEE GPIB in terface and return it to a known state Note that the DCL command is not an addressed command so all instruments equipped to implement DCL will do so simultaneously When the Model 6517A receives a DCL command it clears the Input Buffer and Output Queue cancels deferred com mands and clears any command that prevents the processing of any other device command A DCL does not affect instru ment settings and stored data Program fragment PRINT 1 clear Clear all devices 3 6 6 SDC selective device clear The SDC command is an addressed command that performs essentially the same function as the DCL command Howev 3 6 er since each device must be individually addressed the SDC command provides a method to clear only selected in struments inste
415. on lt NRf gt stAtus MeASurement NTRansition lt NRf gt Program Measurement Transition Filter NTR STATus QUEStionable NTRansition lt NRf gt Program Questionable Transition Filter NTR STATus OPERation NTRansition lt NRf gt Program Operation Transition Filter NTR STATus OPERation TRIGger NTRansition lt NRf gt Program Trigger Transition Filter NTR STATus OPERation ARM NTRansition lt NRf gt Program Arm Transition Filter NTR STATus OPERation ARM SEQuence NTRansition lt NRf gt Program Sequence Transition Filter NTR Parameters lt NRf gt 0 Clear NTR register lt NRf gt 128 Set bit B7 1 Set bit BO 256 Set bit B8 2 Set bit Bl 512 Set bit B9 4 Set bit B2 1024 Set bit B10 8 Set bit B3 2048 Set bit B11 16 Set bit B4 4096 Set bit B12 32 Set bit B5 16384 Set bit B14 64 Set bit B6 65535 Set all bits Query NTRansition Query NTR register Description These commands are used to program the negative transition NTR registers A negative tran sition is defined as a 1 to O state change in the condition register Thus when an event is pro grammed for a negative transition the appropriate bit in the corresponding event register sets when the corresponding bit in the condition register changes from to 0 For example if bit B9 of the Negative Transition Register of of the Measurement Transition Filter is set then the buffer full event is programmed for a negative transition The BFL bit B9 in the Measurement Event Register
416. on are discussed later in this section such as the cal culations display in math see Table 2 6 for paragraph refer ences Some of the displays that are common to all measurement functions are discussed here Time Day Date This display provides the time day of week and the date The time date and format 12 hour or 24 hour are set from the CLOCK option of the GENERAL MENU which is se lected from the MAIN MENU See paragraph 2 19 7 CLOCK for details Table 2 6 Multiple Next displays by function Paragraph Function Next display reference All Time day and date 2 3 4 Bar graph 2 3 4 Zero centered bar graph 2 3 4 Maximum and minimum values 2 3 4 Relative and actual values 2 13 3 Calculated and actual values 2 18 7 Limits bar graph 2 19 5 Relative humidity and external 2 3 4 temperature stamp R Source V and measure I values 2 7 4 2 7 Front Panel Operation Bar graph The normal bar graph with a zero at the left end is a graphical representation of a reading as a portion of a range See Figure 2 2 The vertical lines displayed along the bar designate 0 25 50 75 and 100 of full scale Each full segment of the bar represents approximately 4 of the range limit The right endpoint of the bar graph is plus full scale of the present range for positive readings and minus full scale for negative readings When the 100 line changes to an arrow the reading exceeds the pres
417. on at point B in the flowchart Since both the arm layer and scan layers are programmed for Immediate Spacing operation drops down to the Channel Layer at point B Since Channel Trigger Source is set to Source the scan does not wait at point B for a trigger Instead it bypass es Wait for Trigger Link Trigger and closes the first chan nel point C Note that the Bypass is in effect only on the first pass through the model D After the relay settles the Model 7001 7002 pulls down the Trigger Link trigger line point D Since the in strument is programmed to scan ten channels operation loops back up to point B where it waits for an input trigger Note that Bypass is no longer in effect and Q Remember that the Model 6517A operation is at point A waiting for a trigger When the trigger line is pulled low by the Model 7001 7002 the leading negative go ing edge triggers the Model 6517A to measure DUT 1 point E Note that the electrometer holds the trigger line low After the measurement is complete The Model 6517A releases the trigger line point F and then loops back to point A where it waits for another input trigger 2 94 When the Model 6517A releases the trigger line the leading positive going edge triggers the Model 7001 7002 to close the next channel in the scan This pulls the trigger line low trigger ing the Model 6517A to measure the next DUT The process continues until all ten channels are scanned an
418. on the data element status and press the RANGE A or W key The optional data elements are described as follows Timestamp When selected the timestamp will be dis played on the primary display for each stored reading The form that timestamp is displayed depends on the selected TYPE and FORMAT see TIMESTAMP Humidity and External Temperature When selected these readings are included in a NEXT display see paragraph 2 16 3 Note that the appropriate sensor has to be connected to the instrument and it has to be enabled via the DATA STAMP item of GENERAL menu see paragraph 2 19 7 Channel When selected the scanned channel number will be displayed on the primary display for each stored reading Note that if a scan was not performed a channel number will not be displayed even though it is a selected data element 2 98 V Source When selected the sourced voltage level will be available as a multiple NEXT display see paragraph 2 16 3 DISPLAY This menu item is used to enable or disable the display dur ing the storage process YES This option enables the display When enabled read ings are displayed along with the message that indicates that readings are being stored NO With this option selected the display and front panel are disabled FRONT PANEL DISABLED message dis played This option optimizes speed and provides a more uniform interval between readings Pressing LOCAL during the sto
419. onnect of fixture to safety earth ground using safety ground wire supplied with 8002A test fixture A Connections Input Amplifier Guard Plate ae Input H V Source Out V Source es 1O n mS Lid Interlock 8002A Test Fixture PREAMP OUTPUT COMMON NAA 2V ANALOG OUTPUT Front Panel Operation meiek To Interlock D nterlock Detection Circuits 8002 ILC 3 Interlock Cable WARIMING no INTERNAL OPERATOR SERVIGABLE PART 9090 01 ao 99 kee 8607 Banana Plug Cables Ee kemar kene Model 6517A Pan ing a To A D Converter 1Q B Equivalent Circuit Figure 2 32 Seet Connections for resistance measurements using Model 8002A test fixture 2 35 Front Panel Operation Cancelling test fixture leakage current Significant leakage in the test fixture can corrupt a resistance measurement This leakage current can be cancelled by per forming a REL on the current component of the resistance measurement Perform the following steps to cancel leakage current NOTE The following procedure assumes that steps 1 through 7 of the preceding resis tance measurement procedure has been performed 1 With the V Source in standby remove the DUT from the test fixture 2 Select the amps function I and then disable zero check Also make sure that REL is disabled REL indicator off 3 Press OPER to source
420. or output can be set high 5V or low OV and will sink up to 100mA The four output lines can also operate external sup plies from 5V to 30V Use the DIGITAL I O Menu to select the following options e STATE ON or OFF selectable for each output line 1 through 4 Use to check or change the output state e LOGIC SENSE ACTIVE HIGH or ACTIVE LOW selectable for each output line TTL1 through TTL4 Use to check or change the output sense Controlling digital circuitry Each of the four digital open collector outputs connector J1015 pins 4 through 7 includes a built in pull up resistor to 5V The output transistor is capable of sinking up to 1OOmA from voltages up to 30V The outputs can be controlled in dependently or tied to one of four limit values two high two low Paragraph 2 19 5 contains information on controlling digital outputs from the limits menu Pin 7 Digital Output 2 Pin 5 Digital Output 3 Pin 4 Digital Output 4 Digital Output T ee Flyback Diodes Figure 2 80 Digital I O port simplified schematic Front Panel Operation External voltage supply Each output can be operated from external voltage supplies voltage range from 5V to 30V applied through the exter nal device being driven Refer to Figure 2 80 for a simplified schematic of the digital I O The high current sink capacity of the output driver allows direct control of relays solenoids and lamps no additional circ
421. or erroneous readings may occur USE ALL RANGES With this selection all current ranges are used in the autoranging search process SET LIMITS This selection allows you to specify minimum and maximum ranges in the autoranging search process e MIN AUTO Use to select the lowest range that you want the instrument to autorange to e MAX AUTO Use to select the highest range that you want the instrument to autorange to DAMPING High capacitance seen at the input will increase reading noise This capacitance can be attributed to a long input cable or to the capacitance of the source or a combination of both Enabling damping will reduce this type of noise However damping will also slow down the response of the measure ment Do not confuse damping with filtering Damping is used to reduce noise caused by input capacitance while filtering is used to reduce noise caused by a noisy input signal ON Enable current damping OFF Disable current damping 2 27 Front Panel Operation Table 2 9 CONFIGURE AMPS menu structure Menu item Description SPEED Measurement speed integration time menu NORMAL Select 1 PLC power line cycle 16 67msec for 60Hz 20msec for 50Hz and 400Hz FAST Select 0 01 PLC MEDIUM Select 0 1 PLC HIACCURACY Select 10 PLC SET SPEED EXACTLY Set integration in PLC 0 01 10 SET BY RSLN Default to setting appropriate for resolution FILTER Filter menu AVERAGING Configure digital averag
422. or is off transistor switch is open This interrupts current flow through the external device Most applications use ac tive low ON 0V LOGIC SENSE Use the LOGIC SENSE menu to check or change the sense of each digital output lines refer to the LOGIC SENSE section of this para graph Model 6517 To other three l digital outputs Digital Output 1 7 Flyback Diode Pin 8 Digital Ground Outputs used as logic inputs To use the digital outputs as logic inputs to active TTL Low power TTL or CMOS inputs 1 Connect the Model 6517A digital outputs to the logic in puts 2 Connect the digital grounds 3 Using the STATE menu check output state setting of the Model 6517A output lines The STATE value for each output used should be ON 4 Using the LOGIC SENSE menu check the logic sense setting of the Model 6517A output lines TTL1 through TTL4 Make sure the correct LOGIC SENSE value is selected for each output line The LOGIC SENSE value varies according to the type of TTL Low power TTL or CMOS inputs used ACTIVE HIGH or ACTIVE LOW When low OV the output sink can drive at least 10 standard TTL inputs When high 5V the 10kQ pull up resistor will source gt 100uA while remaining at a gt 3 75V output a reli able logic high Pin 3 External Voltage Flyback Connection 5V to 30V External Power Relay Coil 5V to 30V Digital Output 1 DIGITAL OUT Connector J1015
423. or or larget Dual Banana Jacks 3 Lug Female Triax Connector Banana Jack Figure 2 17 Multi purpose test fixture 6517A e g s s Di S JOT e ome E Interlock Cable Interlock a Connector Interlock Test Fixture A Interlock Connection to Unit 444 004 Normally open SPST SS ya Momentary Switch A ee l 4224 004 Side View 4 m 000 Open lid Open Switch View from inside of test box Interlock Connector Keithley P N CS 659 3 pin CS 459 4 pin Switchcraft P N TB3M 3 pin TB4M 4 pin B Panel cutout dimensions C D Interlock Wiring Figure 2 18 Interlock connections 2 17 Front Panel Operation ee Normally Open 6517 ILC 3 Cable SPST Momentary Switel Clear Black Strain relief for cable 6517A Test Fixture Plug at test fixture end of cable removed Figure 2 19 Hard wired interlock Handling and cleaning test fixtures Dust body oil solder flux and other contaminants on con nector and terminal insulators can significantly decrease the leakage resistance resulting in excessive leakage currents Also contaminants on DUT and test circuit components can create a leakage path These leakage currents may be large enough to corrupt low level measurements Handling tips e Do not touch the bodies of DUT or test circuit compo nents If you cannot handle them only by their leads use clean cotton gloves to install them in the test fixture e Do not
424. or volume is automatically sensed by the Model 6517A through the safety interlock cable Also when using the Model 8009 you do not need to use the USER commands RSELect KSURface and K VOLume For detailed information on resistivity measurements refer to paragraph 2 7 2 FSELect lt name gt SENSe 1 RESistance RESistivity FSELect lt name gt Specify test fixture lt name gt M8009 Model 8009 Resistivity Test Fixtire USER User supplied test fixture FSELect Query selected test fixture This command is used to specify which test fixture is being used for resistivity measurements M8009 specifies the Model 8009 test fixture When using the Model 8009 the only parameter that needs to entered is the sample thickness for volume resistivity see next command Specify USER when using any other resistivity test fixture When using this type of test fixture you will have to be enter the other parameters for resistivity measurements see USER com mands STHickness lt NRf gt SENSe 1 RESistance RESistivity STHickness lt NRf gt Volume resistivity specify sample thickness lt NRf gt 0 0001 to 99 9999 Sample thickness in millimeters STHickness Query programmed sample thickness This command is used to specify the thickness in millimeters of the sample for volume resis tivity measurements Sample thickness is not required for surface resistivity 3 103 IEEE 488 Reference 3 104 Description Paramet
425. other Measure 2 Output Trigger Measure Count Immediate External Manual GPIB Triglink Timer Hold Measure Delay Take bypass path the first time a layer is entered Idle The instrument is considered to be in the idle state whenever it is not operating within one of the three layers of the trigger model The front panel ARM indicator is off when the instru ment is in the idle state While in the idle state the instrument cannot perform any measurement or scanning functions From the front panel there are three ways to put the instru ment into idle e Select RESET GPIB from the SAVESETUP option of the main menu Press the TRIG key to take a reading After each reading the instrument returns to the idle state Select HALT from the ADVANCED item of CONFIG URE TRIGGER menu Press the TRIG key to resume triggering The INIT ON option of the ADVANCED trigger menu structure will also take the instrument out of idle e Press the OPTION CARD key to place the Model 6517A in the scan mode Triggering will resume when the scan is started or if the scan is aborted by pressing EXIT Trigger Model Layers As can be seen in Figure 2 57 the trigger model uses three layers the Arm Layer Scan Layer and Measure Layer For TEEE 488 bus operation these layers are known as Arm Lay er 1 Arm Layer 2 and the Trigger Layer Once the Model 6517A is taken out of the idle state opera tion proceeds through the layers of the
426. oulombs Summary Coul Set bit indicates that an invalid Coulombs measure ment has occurred or a subsequent valid coulombs measurement has occurred NTR Bits B12 Sequence Test Summary Seq Set bit indicates that a sequence test has been aborted PTR Bits B13 Not used Bit B14 Command Warning Warn Set bit indicates that a Signal Oriented Measurement Command parameter has been ignored PTR or a subsequent Signal Oriented Measurement Command has executed successfully NTR Bit B15 Always zero Note Whenever a questionable event occurs the ERR annunciator will turn on The annunciator will turn off when the questionable event clears Bit Position B15 B14 B13 B12 B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 BO Event Warn Seq Coul Hum Cal BAV RUF RAV Temp Amp Volt Decimal Weighting 16384 4096 2048 512 256 128 256 32 16 gt 2 1 214 212 21 29 28 27 26 25 24 21 20 Value 0 o1 1 1 1 Of 0 1 O 1 0 1 0 1 OI OI Value 1 Questionable Event Bit Set 0 Questionable Event Bit Cleared Events Warn Command Warning Cal Calibration Summary Seq Sequence Test Summary Temp Temperature Summary Coul Coulombs Summary Amp Amps Summary Hum Humidity Summary Volt Volts Summary Figure 3 23 Quest
427. ource mode for resistance and resistivity measurements With AUTO V Source select ed the Model 6517A will automatically set the V Source to an optimum test voltage level either 40V or 400V The se lected test voltage and current measurement range depends on which ohms measurement range is being used see Table 2 11 With AUTO V Source selected the Model 6517A will display the ohms measurement range and the V Source val ue Note that with AUTO V Source selected you will not be able to manually adjust the V Source or change the V Source range when in the ohms function NOTE If AUTO V source ohms is on the voltage limit of the V source is lt 400V an ohms range that requires 400V is selected an er ror message will occur and the voltage source will be turned off See Setting a Voltage Limit in paragraph 2 9 3 to change the voltage limit value The published specifications for ohms only apply for the specified AUTO V Source test voltages If using the MANUAL V Source setting you must add the V Source errors to the amps measurement range er rors to determine the total ohms errors With the MANUAL V Source setting selected you can set the V Source to any value and change the V Source range while in the ohms function The Model 6517A will display the amps range that is being used for the measurement and the V Source value WARNING A hazardous voltage 400V may automat ically be set for the ohms function when AUTO V
428. over the bus The BORDer command and DATA command affect readings transferred from the buffer ONLY i e SENSE DATA or CALC DATA is always be sent in ASCII These commands are summarized in Table 3 7 DATA lt type gt length FORMat DATA lt type gt lt length gt Specify data format lt type gt lt length gt ASCii ASCII format REAL 32 TEEE754 single precision format REAL 64 TEEE754 double precision format SREal IEEE754 single precision format DREal IEEE754 double precision format NOTE When using the ASCii SREal or DREal parameter a lt length gt parameter is not re quired If you do not use a lt length gt parameter with the REAL parameter the lt length gt defaults to 32 single precision format DATA Query data format This command is used to select the data format for transferring readings over the bus For every reading conversion the data string sent over the bus contains the elements specified by the EL EMents command The specified elements are sent in a particular order The ASCII data format is in a direct readable form for the operator Most BASIC languages eas ily convert ASCII mantissa and exponent to other formats However some speed is compro mised to accommodate the conversion Figure 3 19 shows the ASCII format that includes all the data elements REAL 32 or SREal will select the binary IEEE754 single precision data format Figure 3 20 shows the normal byte order format for each da
429. overflowed OFLO or a reading has not been triggered an error occurs when this command is sent The ACQuire command is coupled to the REFerence lt n gt command See the description for REFerence for details SENSe 1 RESistance IREFerence lt b gt Control amps reference lt b gt ON orl Enable amps reference for ohms OFF or 0 Disable amps reference for ohms IREFerence Query state of amps reference for ohms This command allows you to use an established amps reference for the resistance measurement When an amps reference is established see paragraph 3 19 7 and this command is used to en abe the amps reference for ohms the current value used to compute resistance Iohm is the al gebraic difference between the input current and the reference Tohm Tinput J Treference Resistance R is then computed using LAc and the V Source output V R V A ohm Typically amps reference represents the leakage current in a test fixture Thus this command allows you to eliminate this leakage current for the resistance calculation SENSe 1 VOLTage DC DIGits lt n gt Specify resolution Volts SENSe 1 CURRent DC DIGits lt n gt Specify resolution Amps SENSe 1 RESistance DIGits lt n gt Specify resolution Ohms SENSe 1 CHARge DIGits lt n gt Specify resolution Coulombs lt n gt 4 3 5 digits 5 4 5 digits 6 5 5 digits 7 6 5 digits DEFault 6 5 5 digits MINimum 4 3 5 digits MAXimum 7 6 5 d
430. p lt 30V 5 Press Z CHK to disable zero check and take a reading from the display NOTE To disable zero correct enable zero check and press REL Front Panel Operation 6517A 237 ALG 2 Cable i l i i i f Measured A l I Current S i I Black LO Geer eege E Shield Recommended peta Ie Input low connected to shield a A Connections Input Amplifier Ranging Amp Ee WV l l l 2 l gt _ToA D l Converter l ls ha l l l l SE d PREAMP OUTPUT gt COMMON Ar gt 2V ANALOG OUTPUT S NVV B Equivalent circuit Figure 2 25 Typical connections for current measurements 2 25 Front Panel Operation Safety Shield Guard Shield 6517A s mA SE WARMING O 237 ALG 2 Black LO Cable Measured l 1 Current Q d PREAMP QUT COMMON Green GND RIP le eee ne ili EE Note Use for floating circuit where leakage from ammeter input Ww to circuit low is a consideration Safety Earth Ground Figure 2 26 Connections for guarded floating current measurements 2 26 2 6 2 Amps configuration The following information explains the various configura tion options for the amps function The configuration menu is summarized in Table 2 9 This menu is accessed by press ing CONFIG and then I Paragraph 2 3 5 summarizes the rules for navigating through the menu structure No
431. peration continues when a GPIB trigger GET or TRG is sent With TLINk selected operation contin ues when an input trigger via the Trigger Link is received With EXTernal selected operation continues when an External Trigger is received A real time clock event is available for the arm layer Arm Layer 1 With RTCLock selected event detection is satisfied at the programmed date and time allowing operation to continue on in the Trigger Model See paragraph 3 24 10 to set the date and time for the RTCLock control source A TIMer event is available for the scan and measure layers With TIMer selected for the speci fied layer the event occurs at the beginning of the timer interval and every time it times out For example if the measure layer timer is programmed for a 30 second interval the first pass through the measure layer control source occurs immediately Subsequent scan events will then occur every 30 seconds The interval for the timer is set using the TIMer command ARM SEQuence 1 LAYer2 TIMer lt n gt Set interval for scan layer timer STRIGger SEQuence 1 TIMer lt n gt Set interval for measure layer timer lt n gt 0 001 to 999999 999 Specify timer interval in seconds DEFault 0 1 second MINimum 0 001 second MAXimum 999999 999 seconds TIMer Query programmed timer interval TIMer DEFault Query RST default timer interval TIMer MINimum Query lowest allowable timer interval TIMer MAXimum Query largest allowable timer
432. ph 2 17 1 for details 3 19 11 MEDian Commands 3 100 Parameters Query Description Refer to paragraph 2 17 2 for details on using the median filter STATe lt b gt SENSe 1 VOLTage DC MEDian STATe lt b gt Control median Volts SENSe 1 CURRent DC MEDian STATe lt b gt Control median Amps SENSe 1 RESistance MEDian STATe lt b gt Control median Ohms SENSe 1 CHARge MEDian STATe lt b gt Control median Coulombs lt b gt lorON Enable median filter 0 or OFF Disable median filter STATe Query state of median filter This command is used to control on or off the median filter When enabled the instrument will determine and display the median reading for the specified number of readings The RANK command is used to specify the number of readings used to determine the median Note that the median filter can be used with the average filter When both of these filters are en abled each displayed reading will reflect the median for the average readings Parameters Query Description 3 19 12 DAMPing lt b gt Parameters Query Description 3 19 13 GUARd lt b gt Parameters Query Description IEEE 488 Reference Setting STATe to OFF with AVER TYPE set to NONE will set AVER STAT to OFF RANK lt NRf gt SENSe 1 VOLTage DC MEDian RANK lt NRf gt Specify median rank for Volts SENSe 1 CURRent DC MEDian RANK lt NRf gt Specify median rank for Am
433. play CNDisplay Clear NEXT or PREV display messages and cancel associated operations SMESsage lt b gt Enable or disable status message mode OFF SMESsage Query status message state ENABle lt b gt Enable or disable the front panel display Note 3 V ENABle Query state of the display d Notes 1 RST and SYSTem PRESet has no effect on a user defined message Cycling power cancels all user defined messages 2 RST and SYSTem PRESet has no effect on the state of the message mode Cycling power disables OFF the message mode 3 RST and SYSTem PRESet has no effect on the display circuitry Cycling power enables ON the display circuitry 3 44 IEEE 488 Reference Table 3 7 FORMat command summary Default Command Description parameter SCPI FOR Mat DATA lt type gt lt length gt Select data format ASCii REAL 32 REAL 64 SREal or DREal ASCii y DATA Query data format y ELEMents lt item list gt Specify data elements READing CHANnel RNUMber UNITs Note TSTamp STATus ETEMperature HUMidity and VSOurce ELEMents Query data elements BORDer lt name gt Select binary byte order NORMal or SWAPped SWAPped V BORDer Query byte order V Note All elements except ETEMperature HUMidity and VSOurce are the RST and SYSTem PRESet default Table 3 8 OUTput command summary Default Command Description Parameter SCPI OUTPutl V STATe lt b gt Ena
434. play for three seconds unless an editing operation is performed see Adjusting Voltage Source Value Selecting voltage source range NOTE The voltage source range cannot be changed while in Auto V Source Ohms see Auto V Source in paragraph 2 7 With the voltage source value displayed the position of the decimal point denotes the currently selected range For ex ample a reading of 000 000V is OV on the 100V range while a reading of 0000 00V is OV on the 1000V range The RANGE option of the CONFIG V SOURCE menu is used to change the V Source range and is summarized in Table 2 15 1 From the CONFIG V SOURCE menu select RANGE to display the range options 100V or 1000V Note that the 100V range provides better resolution 5mV vs 50mV for the 1000V range 2 Place the cursor on the desired range and press ENTER 3 Use the EXIT key to back out of the menu structure Adjusting voltage source value NOTE The voltage source value cannot be changed while in Auto V Source Ohms see Auto V Source in paragraph 2 7 The voltage source value can be changed while in operate While in operate the out put voltage will immediately update to re flect the displayed value 1 Select the voltage source edit mode by pressing the A V lt or gt key The EDIT annunciator turns on and the cursor position for the voltage source value is denot ed by the flashing digit Note that the voltage source edit mode will be cancel
435. ps SENSe 1 RESistance MEDian RANK lt NRf gt Specify median rank for Ohms SENSe 1 CHARge MEDian RANK lt NRf gt Specify median rank for Coulombs lt NRf gt to 5 Specify rank RANK Query rank The number of sample readings used for the median calculation is determined by the selected mage 1 to 5 as follows Sample readings 2 x R 1 where R is the selected range 1 to 5 For example a rank of 5 will use the last 11 readings to determine the median 2 x 5 1 11 Each new reading replaces the oldest reading and the median is then determined from the up dated sample of readings SENSe 1 CURRent DC DAMPing lt b gt Control damping for Amps SENSe 1 RESistance DAMPing lt b gt Control damping for Ohms lt b gt 0 or OFF Disable damping 1 or ON Enable damping DAMPing Query state of damping This command is used to control damping for the Amps and Ohms function Damping is used to decrease noise caused by high input capacitance However damping will also slow down the response of the measurement Note that damping is only valid for the lowest two current ranges 20pA and 200pA ranges SENSe 1 VOLTage DC GUARd lt b gt Control guard for Volts lt b gt 0 or OFF Disable guard 1 or ON Enable guard GUARd Query state of guard This command is used to control guard for the Volts function When enabled preamp output high which is used as guard is placed on the inner shell of the tria
436. ptional scanner card Models 6521 and 6522 The instrument can also be configured to operate with an external switching system i e Mod el 7001 or 7002 to scan external channels Trigger link This is a new trigger concept that pro vides more versatile and precise external triggering It is in addition to the standard Trigger In Meter Complete Out BNC external triggering techniques Digital calibration The instrument may be digitally calibrated from either the front panel or over the RS 232 interface or GPIB bus SCPI language 1 1 General Information 1 3 Warranty information Warranty information is located on the inside front cover of this instruction manual Should your Model 6517A require warranty service contact the Keithley representative or au thorized repair facility in your area for further information When returning the instrument for repair be sure to fill out and include the service form at the back of this manual to provide the repair facility with the necessary information 1 4 Manual addenda Any improvements or changes concerning the instrument or manual will be explained in an addendum included with the manual Be sure to note these changes and incorporate them into the manual 1 5 Safety symbols and terms The following symbols and terms may be found on an instru ment or used in this manual The bi symbol on an instrument indicates that the user should refer to the operating instructio
437. r For example programming the Measure Layer counter for infinity keeps operation in the Measure Layer After each device action and subsequent output trigger operation loops back to the Trigger Layer control source A counter resets when operation loops back to a higher layer or idle 2 15 2 Basic trigger configuration The following information explains how to configure the Model 6517A for basic triggering If you instead wish to use advance triggering refer to paragraph 2 15 3 Basic trigger ing is configured from the BASIC item of the CONFIGURE TRIGGER menu see Table 2 21 which is displayed by pressing the CONFIG key and then the TRIG key General rules for navigating the menu structure is provided in para graph 2 3 5 The BASIC TRIGGERING menu items are explained as fol lows MODE Use this menu item to select the trigger mode for basic trig gering CONTINUOUS Use this trigger mode to place the instru ment in the continuous measurement mode ONE SHOT Use this trigger mode to place the instrument in the one shot measurement mode In this mode the instru 2 76 ment waits for the selected control source event to occur be fore making a measurement see SOURCE SOURCE Use this menu item to select the control source event for one shot triggering IMMEDIATE With this selection events such as TIMER and EXTERNAL triggers do not control the measurement interval Once the Model 6517A starts measuring it wi
438. r aware that there is no data on the bus indi cates that it is ready for the next byte of data Bus description The IEEE 488 bus which is also frequently referred to a the GPIB General Purpose Interface Bus was designed as a parallel transfer medium to optimize data transfer without using an excessive number of bus lines In keeping with this goal the bus has only eight data lines that are used for both data and with most commands Five bus management lines and three handshake lines round out the complement of bus signal lines A typical set up for controlled operation is shown in Figure D 1 Generally a system will contain one controller and a number of other instruments to which the commands are giv en Device operation is categorized into three operators con troller talker and listener The controller does what its name implies it controls the instruments on the bus The talker sends data while a listener receives data Depending on the type of instrument any particular device can be a talker only a listener only or both a talker and listener There are two categories of controllers system controller and basic controller Both are able to control other instru ments but only the system controller has the absolute au thority in the system In a system with more than one controller only one controller may be active at any given time Certain protocol is used to pass control from one con troller to another IEEE 488 Bu
439. r equal to high limit 1 the following message is shown on the bottom line of the limits bar graph next display No bar graph LLIM1 gt HLIM1 The programmed values for limit set 1 are shown by press ing the INFO key from the limits bar graph next display LLIM1 HLIM1 Low Limit 1 C Limit 1 Average of midpoint Avenge of midpoint and Low Limit 1 and High Limit 1 Midpoint of Low Limit 1 and High Limit 1 A Defined points of display Reading Pass Fail indication 0 2836 Vv PASS HLIM1 Ka 30 of difference between midpoint and Low Level 1 LLIM1 geck 26 NOTES 1 Press INFO to view the programmed Low Limit 1 and High Limit 1 values 2 Multiple display of limit values do not use unit prefixes De volts not millivolts B Example Display with Limits 1V Figure 2 77 Limits bar graph example STROBE CONTROL This menu item enables or disables the use of digital output 4 as a binning strobe signal If enabled the strobe signal is set TRUE for greater than 10 microseconds after all limit tests have been performed on a new reading The FALSE to TRUE transition can be used to trigger an external device handler to check digital outputs 1 3 for sorting parts into bins When binning is enabled from the front panel or with the bus command CALCulate3 BSTRobe STATe ON the binning strobe signal is set to FALSE When binning is disabled the strobe signal is left unchanged DISAB
440. r it is armed With any other trigger source except LID CLOSURE selected the test can be started by pressing TRIG While a test is armed or running the flashing SEQ message is displayed on the Model 6517A Front Panel Operation 3 Readings are automatically stored in the buffer starting 2 15 Triggers at memory location reading zero 4 The Alternating Polarity test will be re armed upon The following paragraphs discuss front panel triggering trigger completion of a sequence When the selected trigger configuration and external triggering including example setups source event occurs the test will re run Readings may Model 6517A triggers are set up from the CONFIGURE be recalled or the ere re configured while the TRIGGER menu The menu structure is shown and summa 6517A awaits the trigger When the sequence is armed i i rized in Table 2 21 the first time trigger source is set to manual but can be re configured to any other trigger source To end the se Notice from Table 2 21 that there are two trigger configura quences press EXIT to return to normal operation tion structures BASIC and ADVANCED The basic menu structure can be used when simple trigger operations will suffice The advanced menu structure must be used when more sophisticated trigger operations such as scanning are required The differences between basic and advanced trig gering are explained in the next paragraph Table 2 21 CONFIG
441. r sending commands to the instrument and for send ing data from the instrument to the computer e TALK ONLY In the talk only mode the instrument ignores commands and simply outputs data as request ed by the printer When the instrument is in the talk only mode the TALK annunciator turns on The options for talk only are explained as follows INTERVAL This option controls how often readings are sent printed The interval is expressed as 1 out of nnnn readings FORMFEEDS This option is used to control enable or dis able page breaks and specify the number of lines per page When enabled a form feed occurs after the specified number of lines are printed BAUD Use this option to set the baud rate for the RS 232 serial interface Selections include 19200 9600 4800 2400 1200 600 and 300 bits per second BITS Use this option to select the number of data bits 7 or 8 to send over the RS 232 serial interface PARITY Use this option to select parity for the RS 232 se rial interface Selections include none odd or even parity STOP Use this menu item to select the number of stop bits to use 1 or 2 ELEMENTS This menu item lets you select the data ele ments sent Use one of the range keys to toggle between yes y and no n e RDG The numeric value of the reading e RDG The buffer location of the reading The read ing number can be reset to zero from the GENERAL MENU see paragraph 2 19 7 e UNI
442. r the following operations e To control the state and sense of the digital outputs e To view the serial number SCPI version and firmware revision levels of the Model 6517A To set line synchronization of readings display the fre quency of the line power and configure the A D to measure humidity and or external temperature e To configure timestamp e To choose the character displayed for a decimal and se lect measurement units es To set the real time clock DIGOUT Digital I O menu Access the DIGOUT menu as follows 1 From the main menu select the GENERAL menu 2 Use the lt and gt keys to highlight DIGOUT and press Enter The following will be displayed DIGOUT STATE LOGIC SENSE Digital I O port The Model 6517A s Digital I O port is an 8 pin micro DIN socket located on the rear panel The port s location and pin designations are shown in Figure 2 79 DIGITAL OUT Connector J1015 Pin Designation 5V Data In calibration fixture use Vext flyback connection 5V to 30V Digital output 4 Digital output 3 Digital output 1 Digital output 2 Digital ground ONAMBWNH ou ud wou th te tl Pin 2 is for use with Model 5156 Calibration Source The Model 6517A s Digital I O port can be used to control external circuitry The port provides four output lines and one input line input line is for calibration use only refer to the Model 6517 Service Manual Each open collect
443. r the in terface interrupts the Model 6517A microprocessor and forc es a device clear action to take place This clears any pending operation and discards any pending output Note that X is also recognized as a device clear character Reception of a break condition also causes a device clear ac tion and displays the appropriate error message see para graph 3 26 3 The Model 6517A signifies the completion of the device clear by echoing back the DCL followed by the carriage re turn and line feed characters Unique SCPI Commands The following SCPI com mands are unique to the RS 232 interface and cannot be used over the GPIB interface SYSTem LOCal Take the 6517A out of remote SYSTem REMote Put the 6517A in remote SYSTem LLOCkout lt b gt Enable or disable local lockout See paragraph 3 22 14 for more information on using these commands 3 27 3 RS 232 Interface Error Messages The following error messages are associated with RS 232 in terface operation These error messages are also listed in Ta ble 2 5 Note that any of the following errors will set bit B11 of the Operation Condition Register 800 RS 232 Framing error detected Start or stop bit mismatch between computer and Model 6517A 801 RS 232 Parity error detected Parity type mis match between computer and Model 6517A 802 RS 232 Overrun detected Data received before previous data can be read 803 RS 232 Break detected Me
444. r the specified test Note that the Resistor Voltage Coefficient Test uses two bias voltages bias voltage 1 and bias voltage 2 STIMe lt NRf gt TSEQuence SRESistivity STIMe lt NRf gt Bias time surface resistivity test TSEQuence VRESistivity STIMe lt NRf gt Bias time volume resistivity test TSEQuence SlResistance STIMe lt NRf gt Bias time sur insul resistance test TSEQuence STSWeep STIMe lt NRf gt Bias time staircase sweep test Parameters STIMe lt NRf gt 0 to 9999 9 Staircase Sweep test Delay in seconds 0 to 99999 9 all others Delay in seconds Query STIMe Query soak time Description This configuration command is used for the following tests Surface Resistivity Test Volume Resistivity Test Surface Insulation Resistance Test Staircase Sweep Test This command is used to specify the bias time for the specified test 3 151 IEEE 488 Reference 3 25 8 DTIMe lt NRf gt Parameters Query Description TSEQuence SRESistivity DTIMe lt NRf gt Discharge time sur resistivity test TSEQuence VRESistivity DTIMe lt NRf gt Discharge time vol resistivity test lt NRf gt 0 to 99999 9 seconds DTIMe Query discharge time This configuration command is used for the following tests Surface Resistivity Test Volume Resistivity Test This command is used to specify the discharge time for the specified test 3 25 9 PDTime lt NRf gt TSEQuence SRESistivity PDTime lt NRf gt Pre dischar
445. rage process will return the display and front panel back to normal 2 16 2 Storing and recalling readings Tables 2 24 through 2 26 detail the sequence of steps for the various modes of buffer control The tables assume the buffer is configured as explained in paragraph 2 16 1 Note that dur ing data storage the reading number on the bottom line of the display is one ahead of the reading on the top line There are multiple displays available when recalling buff ered readings These are explained in paragraph 2 16 3 Front Panel Operation Table 2 24 Fill and stop sequence Action Result Annunciator STORE STORE 00100 READINGS ENTER Storing reading xx of 100 on Storage complete press RECALL off RECALL _ Rdg 00000 Time 000 000000 sec Rdg 00099 Time 002 700473 sec EXIT normal reading display Table 2 25 Continuous sequence Action Result Annunciator STORE STORE 00100 READINGS ENTER Storing reading xx of 100 on 100 rdgs stored continuous ON RECALL Rdg 00000 Time 003 903546 sec EXIT 100 rdgs stored continuous ON RECALL Rdg 00000 Time 067 709331 sec EXIT 100 rdgs stored continuous ON EXIT STORAGE INTERRUPTED off Acquired 100 of 100 readings normal reading display Table 2 26 Pretrigger sequence Action Result Annunciator STORE STORE 00100 READINGS ENTER Waiting for pretrigger event on TRIG Storing reading xx of 50 Storage complete pres
446. rameters Query Description 3 150 MDELay lt NRf gt TSEQuence DLEakage MDELay lt NRf gt STARt Query stop voltage This configuration command is used for the following tests Diode Leakage Test Staircase Sweep Test This command is used to specify the start voltage for the specified test TSEQuence DLEakage STOP lt NRf gt TSEQuence STSWeep STOP lt NRf gt Stop voltage diode eakage test Stop voltage staircase sweep test lt NRf gt 100 0 to 100 0 1000 to 1000 Volts 100V range Volts 1000V range STOP Query stop voltage This configuration command is used for the following tests Diode Leakage Test Staircase Sweep Test This command is used to specify the stop voltage for the specified test TSEQuence DLEakage STEP lt NRf gt TSEQuence STSWeep STEP lt NRf gt Step voltage diode leakage test Step voltage staircase sweep test lt NRf gt 100 0 to 100 0 Volts 100V range 1000 to 1000 Volts 1000V range STEP Query step voltage This configuration command is used for the following tests Diode Leakage Test Staircase Sweep Test This command is used to specify the step voltage for the specified test Measure delay diode leakage test TSEQuence RVCoefficient MDELay 1 lt NRf gt TSEQuence RVCoefficient MDELay2 lt NRf gt Measure delay 1 resistor voltage coefficient test Measure delay 2 resistor voltage coefficient test lt NRf gt 0 to 99999 9 Resistor voltage
447. rator These commands are used to null out input bias current and voltage burden These commands are summarized in Table 3 5 To calibrate the instrument refer to the Model 6517 Service Manual VOFFset CALibration UNPRotected VOFFset Null voltage burden Description This action command is used to null voltage burden Before sending this command connect a short to the input triax connector Function changes and measurements cannot be made during the calibration process OFFset CALibration UNPRotected OFFset Null input offset current Description This action command is used to null input offset current Before sending this command cap the input triax connector Function changes and measurements cannot be made during the calibra tion process 3 71 IEEE 488 Reference 3 15 DISPlay subsystem Parameters Query Description Parameters Query Description The display subsystem controls the display of the Model 6517A and is summarized in Table 3 6 TEXT commands DATA lt a gt DISPlay WINDow 1 TEXT DATA lt a gt Define message top display DISPlay WINDow2 TEXT DATA lt a gt Define message bottom display lt a gt ASCII characters for message Types String aa a or aa a Indefinite Block Oaa a Definite Block XYaa a where Y number of characters in message Up to 20 for top display Up to 32 for bottom display X number of digits that make up Y 1 or 2 DATA Query the def
448. rature and change from calibration temperature readings can also be included in the data string if they are included as data elements See the FORMat Subsystem to select data elements LATest SENSe 1 DATA LATest Return latest reading This query command is used to read the latest instrument reading This command returns the raw reading or a reading that is the result of the Reference REL from the front panel opera tion For example if a reference value of 1 0 is established the reading returned by this com mand is the raw reading minus 1 0 Calculated MATH readings cannot be read with this command see the CALCulate subsystem to read math calculations The reading is returned in exponent form For example a 10V DC reading will be displayed on the CRT as follows 1 000000E 01 Notice that the measurement function is not included in the response message Thus you may want to perform a function query see previous command after a reading query IEEE 488 Reference Description Program Fragment 1 Program Fragment 1 FRESh SENSe 1 DATA FRESh2 Return new reading This query command is used to return a new fresh reading This reading will not request the same reading twice If a new reading is triggered this command will wait until the reading is available rather than request the old reading Sending this query command before the instrument is finished processing previous commands will cau
449. re q unit of charge 1 6022 x 1019 k Boltzmann s constant 1 3806 x 10 T temperature K 23 The limitations in this equation center on the factors Ig m and RB Ig is the extrapolated current for Vo An empirical proportional constant m accounts for the different character current conduction recombination and diffusion mecha nisms within the junction typically varying between 1 and 2 Finally RB constitutes the ohmic bulk resistance of the di ode junction material Io and RB limit the usefulness of the junction diode at low and high currents respectively The fac tor m introduces non linearities between those two extremes Because of these limitations most diodes have a limited range of logarithmic behavior 2 56 A solution to these constraints is to use a transistor config ured as a transdiode in the feedback path as shown in Fig ure 2 44 Analyzing the transistor in this configuration leads to the relationship V kT q In In hpp 1 hpp where hpg is the current gain of the transistor From this equation proper selection of Q1 would require a device with high current gain hpg which is maintained over a wide range of emitter currents Suitable devices for this application include Analog Devices AD812 and Preci sion Monolithics MAT 01 Use the enclosure in Figure 2 43 to shield the device Frequency compensation stabilization is accomplished by adding a feedback capacitor Cpg The v
450. re changing functions V I R or Q The Z CHK key controls zero check 1 With zero check enabled ZeroCheck displayed se lect the amps I function The Z CHK key toggles zero check between the on and off states NOTE The input circuit configuration changes with zero check enabled See paragraph 2 13 for details 2 To achieve optimum accuracy for low current measure ments it is recommended that you zero correct the in strument To do so select the lowest measurement range 20pA and press REL The REL indicator turns on and the ZCor message is displayed Correcting zero on the lowest range will correct all ranges because of internal scaling 3 Select a manual measurement range that is consistent with the expected reading or enable auto range see paragraph 2 12 for detailed range information 4 Connect the Model 6517A to the current to be mea sured Figure 2 25 shows typical connections for current measurements NOTE If measuring current in a floating circuit where significant leakage may exist be tween the ammeter input and circuit low connect the Model 6517A to the circuit as shown in Figure 2 26 Notice that amme ter input LO is connected to circuit high Paragraph 2 6 3 Guarding Floating Cur rent Measurements explains how this guarding technique affects the measure ment Also note that a safety shield should be used if the input of the ammeter is float ing at a hazardous voltage level V
451. readings 20V 1V 3V The readings are re arranged in an ascending order as follows 1V 3V 20V From the above readings it can be plainly seen that 3V is the median middle most reading The number of sample readings used for the median calcula tion is determined by the selected rank 1 to 5 as follows Sample readings 2 x R 1 where R is the selected rank 1 to 5 For example a rank of 5 will use the last 11 readings to de termine the median 2 x 5 1 11 Each new reading replaces the oldest reading and the medi an is then determined from the updated sample of readings 2 101 Front Panel Operation Voltage e of range B Window LL SE 2 1 of range of range A ie of range Integration Time Type averaging Conversions A2 A3 A4 A6 a Bo B3 B4 Bs A A AS A3 As S By B3 B4 l Ay A A A2 A4 By B2 B3 Readings 5 Ay D D A Ay As By By Ay Au Ay Au S A2 A4 As By Mode moving Reading Reading Reading Reading Reading Reading Reading Reading Reading Reading Reading 1 2 3 4 6 9 10 11 Type advanced Conversions A2 A3 A4 Ao By B2 B3 B4 B5 A A A Ag As By By By B3 B4 Readings 5 A4 By By By B2 B3 A3 By By By By B2 A B B B B Mode moving 2 1 1 1 1 B4 Noise level 1 of range Reading Reading Reading gescht Reading Reading Reading Reading Reading Reading Reading 1 2 3 6 7 8 9 10 11 Type averaging Conversions A2 A3 A4 As A6 By B2 B3 B4 Bs A
452. rein innrede E ae e a a e anit a E Operation event status Arm event Status nopee a R E E E E A E RER ARSA Sequence eyent Statlisyscsesiistan Hevea isan iee esie Ei agi denier ious acta aaa s aa biel dae ae Ae TRIS GER E EE Measurement event Status sisisi eseni ae inal aii de ae EE Questionable event status Status byte and service request GRO Trigger Model IEEE 488 bus operation 0 c eee cececsecssesseceseeseceecesecseseeeeeseeeeseseseaeeseeeaesaeesaeeaeeaee Standard Event Enable Register ccscsesssssescssesseesessscessossscocesersesoessetoneescansebenesbaescbensenseessesesserees Standard Event Status ROSiSter i c 055sicccsncsesessnsnetesciepensenss sesueevusseuoesesssdtscens cosauusdeasusseseiesencsqengessneedongetialeae Service Request Enable Register AA Status Byte EE ZS te formats geesde IEEE754 single precision data format 32 data bits eee eieeeesecsescceseeseeeteecseseeeeesecneeseesesaecaeeaeeaeeaeedees IEEE754 double precision data format 64 data buts Measurement Event Regester Questionable Event Regist isininennsne nenne a E R EE E E a a i Operation Event RESIS EL isiotu e A Eege Lee Trigger EE ATM Event EE Sequence Event Resister ss acjiviscsdleceecgeessiessctseivdsviwes dateausen chads E E EE EEE Measurement Event Enable Register ssssnessessseeseseesesesrsessesstrssesstestesstestessrsseessesseestessesseeetesseseresett K Questionable Event Enable Register ccecceesccessscescec
453. reme caution when a shock hazard is present Lethal voltage may be present on cable connector jacks or test fixtures The American National Standards Institute ANST states that a shock hazard exists when voltage levels greater than 30V RMS 42 4V peak or 60VDC are present A good safety practice is to expect that hazardous voltage is present in any unknown circuit before measuring Operators of this product must be protected from electric shock at all times The responsible body must ensure that operators are pre vented access and or insulated from every connection point In some cases connections must be exposed to potential human con tact Product operators in these circumstances must be trained to protect themselves from the risk of electric shock If the circuit is capable of operating at or above 1000 volts no conductive part of the circuit may be exposed Do not connect switching cards directly to unlimited power circuits They are intended to be used with impedance limited sources NEVER connect switching cards directly to AC mains When con necting sources to switching cards install protective devices to lim it fault current and voltage to the card Before operating an instrument make sure the line cord is connect ed to a properly grounded power receptacle Inspect the connecting cables test leads and jumpers for possible wear cracks or breaks before each use When installing equipment where access to the main power cord
454. resolu tion selected the instrument selects the optimum resolution for the present speed integration period setting See Table 2 19 See paragraphs 2 5 2 volts 2 6 2 amps 2 7 2 ohms and 2 8 2 coulombs to set display resolution and speed Model 6517A Zero Input IONO Check Current u N V Input i LO To Ranging Amplifier Figure 2 44 Commpn Wy Q1 Preamp d i Out i Chassis ch d Op Amp S Ss Transdiode logarithmic current configuration 2 57 Front Panel Operation a i Zero Input Check HI 10MQ Current gt p gt gt A VV Input b LO F E Ran ing 1Q f mplifier Common gt N V a Op Amp Rep S NZ Ge i Chassis gt gt Figure 2 45 Non decade current gains The display resolution for ohms readings may be less than what was selected For example assume for an ohms mea surement that the measured current is 00 100pA 20pA range 4 digit resolution If you discount the leading ze roes the amps reading actually has a usable resolution of 24 digits 100pA Since the current measurement only uses 2 2 digits the resolution of the ohms display will also be limited to 2 digits Table 2 18 Integration times set by resolution all functions Resolution Integration time Auto 1 00 PLC 3 5d 0 01 PLC 4 5d 0 02 PLC 5 5d 0 20 PLC 6 5d 2 00 PLC With AUTO resolution selected display re
455. rogram mable aspect of an instrument 3 1 IEEE 488 Reference A DDC language is also available for IEEE 488 bus opera tion In this mode device dependent commands DDCs are used instead of SCPI and common commands This mode is used when you want to use the Model 6517A as a drop in replacement for the Model 617 This allows an existing pro gram written for the Model 617 to be used by the Model 6517A without having to make any code modifications RS 232 serial port The Model 6517A has a serial port that can be used as an al ternative to the parallel IEEE 488 bus All commands except DDCs can be used over this serial port The serial port is based on the electrical and mechanical characteristics of the RS 232 C standard Typically the serial port is used with a controller that cannot accommodate an IEEE 488 bus inter face such as a notebook computer 3 2 Connections The following information shows how to make connections using the IEEE 488 bus or the RS 232 serial port 3 2 1 IEEE 488 bus connections The Model 6517A can be connected to the IEEE 488 bus through a cable equipped with standard IEEE 488 connec tors an example is shown in Figure 3 1 The connector can be stacked to allow a number parallel connections to one in strument Two screws are located on each connector to en sure that connections remain secure Current standards call for metric threads which are identified with dark colored screws Earli
456. rol source event to start the test sequence 3 23 6 TSTamp FORMat lt name gt TRACe TSTamp FORMat lt name gt Select timestamp format Parameters Query Description lt name gt ABSolute Reference to first buffer reading DELTa Time between buffer readings FOR Mar Query timestamp format This command is used to select the timestamp format for buffer readings With ABSolute select ed each timestamp is referenced to the first reading stored in the buffer With DELTa selected timestamps provide the time between each buffer reading See paragraphs 3 16 FORMat EL EMents and 3 22 SYSTem TSTamp for more information 3 23 7 ELEMents lt item list gt TRACe ELEMents lt item list gt Select elements for buffer Parameters Query Description lt item list gt TSTamp Includes timestamp HUMidity Includes humidity CHANnel Includes channel number ETEMperature Includes external temperature VSOurce Includes V source NONE None of the above elements NOTE Items in the list must be separated by commas ELEMents Query selected elements READing STATus RNUMber reading number and UNIT are always enabled for the buffer and are included in the response for the query ELEMents This command is used to include additional elements for each buffer reading A detailed descrip tion for each element is provided in paragraph 3 16 FORMat ELEMents 3 141 IEEE 488 Reference 3 24 Trigger subsystem 3 24 1 3
457. rom the CONFIGURE SEQUENCE menu SWEEP STAIRCASE See paragraph 2 14 2 for details The Staircase Sweep Test allows you to make measurements at staircased voltage levels When the test is configured you specify the START voltage the STEP voltage the STOP volt age and the delay STEP TIME between steps Figure 2 55 shows an example using the default test parameters When the test is run 10 measurements will be performed one at each voltage step and stored in the buffer This test is selected and configured from the CONFigure SE QUENCE menu SWEEP STAIRCASE See paragraph 2 14 2 for details Front Panel Operation Cycle 1 2 3 10 ooo 1V y y y ov eco 1V A A A A J Isec Test Parameters Hl Level 1V A A Measurements HI Time 1sec LO Level 1V LO Time 1sec Cycle Count 10 Figure 2 54 Default measurement points square wave sweep test Test Parameters Volts Ln gt Start 1V A A Stop 10V Step 1V 35 Step Time 1 sec Delay in seconds Figure 2 55 Default measurement points staircase sweep test 2 67 Front Panel Operation 2 14 2 Configure Test Sequence The CONFIGURE SEQUENCE menu is used to select and configure a test sequences and is summarized in Table 2 20 The top level of the menu is displayed by pressing CONFIG and then SEQ General rules to navigate the menu levels are provided in paragraph 2 3
458. roperly connected to the controller Most controllers are equipped with an IEEE 488 style connector but a few may require a different type of connecting cable Con sult the instruction manual for your controller for the proper connecting method NOTE The IEEE 488 bus is limited to a maxi mum of 15 devices including the control ler The maximum cable length is 20 meters or two meters times the number of devices whichever is less Failure to ob serve these limits may result in erratic bus operation 3 2 2 RS 232 serial interface connections The serial port of the Model 6517A can be connected to the serial port of a computer or listening device i e serial print er using an RS 232 cable terminated with DB 9 connectors The serial port uses the transmit Tx receive Rx and signal ground Gnd lines of the RS 232 standard Figure 3 4 shows the rear panel connector along with pin numbering and des ignations If your computer uses a DB 25 connector for the RS 232 in terface you will need a cable or an adapter with a DB 25 connector on one end and a DB 9 connector on the other wired straight through not null modem 54321 Pin Desi 3 To Nuraber esignation 2 Transmitted Data Tx 9876 3 Received Data Rx RS232 5 Signal Ground Gnd Rear Panel Connector Figure 3 4 RS 232 interface connector 3 3 GPIB primary address selection The Model 6517A is shipped from the factory with a pro grammed primary
459. rtance at the expense of increased reading noise and less usable resolution MEDIUM Sets integration time to 0 1 PLC Use MEDIUM when a compromise between noise performance and speed is acceptable NORMAL Sets integration time to 1 PLC A compromise like MEDIUM but NORMAL provides better noise perfor mance at the expense of speed HIACCURACY Sets integration time to 10 PLC Use HI ACCURACY when high common mode and normal mode rejection is required SET SPEED EXACTLY When this parameter is selected the present PLC value is displayed By using the cursor keys lt 4 and gt and the RANGE A and W keys you can enter any PLC value from 0 01 to 10 Be sure to press ENTER af ter keying in a new value Note that an integer PLC value will increase noise rejection SET BY RSLN This parameter optimizes the integration time for the present resolution setting See Table 2 18 for the default integration times for the volts ohms amps and cou lombs functions 2 22 FILTER Use this menu item to configure the two basic filter types av eraging and median Note that you can use either the averag ing filter the median filter or both The filter menu is available from the function configuration menus i e press CONFIG V or by pressing CONFIG FIL TER with the desired function already selected All of the pa rameters menu items for FILTER are explained in paragraph 2 17 RESOLUTION All functions can operate with 3 5 to
460. rue SDC Selective Device Clear The SDC command per forms essentially the same function as the DCL command except that only the addressed device responds Generally instruments return to their power up default conditions when responding to the SDC command GTL Go To Local The GTL command is used to remove instruments from the remote mode With some instruments GTL also unlocks front panel controls if they were previous ly locked out with the LLO command GET Group Execute Trigger The GET command is used to trigger devices to perform a specific action that depends on device configuration for example take a reading Al though GET is an addressed command many devices re spond to GET without addressing Address commands Addressed commands include two primary command groups and a secondary address group ATN is true when these com mands are asserted The commands include LAG Listen Address Group These listen commands are derived from an instrument s primary address and are used to address devices to listen The actual command byte is ob tained by ORing the primary address with 20 TAG Talk Address Group The talk commands are de rived from the primary address by ORing the address with 40 Talk commands are used to address devices to talk IEEE 488 Bus Overview SCG Secondary Command Group Commands in this group provide additional addressing capabilities Many de vices including
461. ry command see paragraph 3 11 2 Bit 6 Master Summary Status MSS Request Service RQS Set bit indicates that one or more enabled Status Byte conditions have occurred The MSS bit can be read using the STB query command or the occurrence of a service request RQS bit set can be detected by per forming a Serial Poll Bit 7 Operation Summary Bit OSB Set bit indicates that an enabled operation event has occurred The event can be identified by reading the Operation Event Status Register using the STATus OPERation query command see paragraph 3 20 for details Send a GPIB trigger to the Model 6517A The TRG command is used to issue a GPIB trigger to the Model 6517A It has the same effect as a group execute trigger GET The TRG command is used as an arm scan and or measure event to control operation The Model 6517A reacts to this trigger if GPIB is the programmed control source The control source is programmed from the TRIGger subsystem see paragraph 3 23 TRG can also be used as the pre trigger for buffer operation 3 11 14 TST self test query Run the self test and acquire the Result Description This query command is used to perform a checksum test on ROM and places the coded result 0 or 1 in the Output Queue When the Model 6517A is addressed to talk the coded result is sent from the Output Queue to the computer A returned value of zero 0 indicates that the test passed and a value of one
462. s parity and stop bits of your computer matches the RS 232 parameters of the Model 6517A 3 27 2 _RS 232 Operating Considerations Response Messages Queries After a query command is sent and parsed the response message will immediately be sent to the computer Thus the computer should be ready to receive the response message at that time Data Format The RS 232 interface only supports the ASCII data format Therefore whenever the RS 232 inter face is selected the data format will default to ASCII At tempts to change the data format using the FORMat DATA command will result in an error message and the ASCII data format will be retained Flow Control The Model 6517A does not support any form of hardware flow control Software flow control is in 3 157 IEEE 488 Reference the form of XS ON Q and X_OFF S characters If the input queue of the Model 6517A becomes more that 3 4 full 2048 characters maximum the instrument issue an X_OFF command The control program should respond to this and stop sending characters until the Model 6517A issues the X_ON which it will do once its input buffer has dropped be low half full The Model 6517A also recognizes X_OFF and X_ON sent from the controller An X_OFF will cause the Model 6517A to stop outputting characters until it sees an X_ON Incoming commands are processed after the lt LF gt character is received Device Clear Action A Control C C sent ove
463. s The Model 6517A has the following built in test sequences e Device Characterization Tests Diode Leakage Current Capacitor Leakage Cable Insulation Resistance Resistor Voltage Coefficient Resistivity Tests Normal Surface and volume Alternating Polarity e Surface Insulation Resistance SIR Test e Sweep Tests Square wave Staircase 2 60 2 14 1 Test descriptions The following information describes each test shows the connections to the Model 6517A and explains how to set up the Model 6517A for the measurements The results of a test are stored in the buffer If for example a test performs 10 measurements those 10 readings will be stored in the buffer at locations 0 through 9 If a test only per forms one measurement then that single reading will be stored at memory location 0 Note that when a test is per formed previous data stored in the buffer will be lost Diode leakage current test This test is used to measure the leakage current for a diode Figure 2 47 shows the connections and the simplified sche matic By sourcing a positive voltage the leakage current through the diode will be measured Note that if you source a negative voltage you will forward bias the diode Resistor R is used to limit current in the event that the diode shorts out or it becomes forward biased Select a value of R that will limit current to 20mA or less This test allows you to measure the current at various voltage levels
464. s y 3 21 5 EVENt Read the event register Note 2 y ENABle lt NRf gt Program the enable register Note 3 V 3 21 1 ENABle Read the enable register y 3 21 2 PTRansition lt NRf gt Program the positive transition register Note 4 y PTRansition Read the positive transition register y 3 21 3 NTRansition lt NRf gt Program the negative transition register Note 5 y NTRansition Read the negative transition register y 3 21 4 CONDition Read the condition register y 3 21 5 3 53 IEEE 488 Reference Table 3 12 Continued STATus command summary Default Command Description parameter SCPI Ref STATus QUEStionable Path to control questionable status registers y EVENt Read the event register Note 2 y 3 21 1 ENABle lt NRf gt Program the enable register Note 3 V 3 21 2 ENABle Read the enable register V PTRansition lt NRf gt Program the positive transition register Note 4 y 3 21 3 PTRansition Read the positive transition register y NTRansition lt NRf gt Program the negative transition register Note 5 y 3 21 4 NTRansition Read the negative transition register y CONDition Read the condition register y 3 21 5 PRESet Return status registers to default states y 3 21 6 QUEue Path to access error queue V 3 21 7 NEXT Read the most recent error message Note 6 y ENABle lt list gt Specify error and status messages for queue Note 7 y
465. s Overview TO OTHER DEVICES DEVICE 1 ABLE TO TALK LISTEN AND CONTROL COMPUTER DATA BUS DEVICE 2 ABLE TO TALK AND LISTEN 6517A DATA BYTE TRANSFER CONTROL DEVICE 3 ONLY ABLE TO LISTEN PRINTER GENERAL INTERFACE MANAGEMENT DEVICE 4 ONLY ABLE TO TALK D 101 8 DATA 8 LINES HANDSHAKE AC BUS MANAGEMENT Figure D 1 IEEE 488 bus configuration The IEEE 488 bus is limited to 15 devices including the controller Thus any number of talkers and listeners up to that limit may be present on the bus at one time Although several devices may be commanded to listen simultaneously the bus can have only one active talker or communications would be scrambled A device is placed in the talk or listen state by sending an ap propriate talk or listen command These talk and listen com mands are derived from an instrument s primary address The primary address may have any value between 0 and 31 and is generally set by rear panel DIP switches or pro grammed in from the front panel of the instrument The ac tual listen address value sent out over the bus is obtained by ORing the primary address with 20 For example if the pri D 2 mary address is 27 the actual listen address is 47 47 27 20 In a similar manner the talk address is obtained by ORing the primary address with 40 With the present ex ample the talk address derived from a primary address of 27 decimal would be 6
466. s RECALL off RECALL Rdg 00050 Time 004 999990 sec Rdg 00000 Time 000 000000 sec Rdg 00049 Time 004 899996 sec EXIT normal reading display Note A manual trigger is used as an example Other pretrigger events include GPIB trigger link and external 2 99 Front Panel Operation 2 16 3 Buffer multiple displays Math operations performed on buffered readings are avail able when readings are recalled Just press NEXT DISPLAY to view the math operation on the bottom line of front panel display in the following order Note that the appropriate data store element has to be selected in order to get the reading 1 RH and ET relative humidity and external tempera ture for example Rdg 00000 RH 35 ET 23 C Note In order to get these readings the appropriate sen sor has to be connected to the Model 6517 and it has to be enabled see A D CONTROLS in paragraph 2 19 7 2 V Source V Source output for example Vsource 0001 000V 3 MAX maximum reading in buffer for example MAX 1 635968e 00 at RDG 00090 Notes A Display response may be slow due to calculation of statistics for large buffers B Exponents are in terms of primary units of function on top line i e volts not millivolts 4 MIN minimum reading in buffer for example MIN 1 627611e 00 at RDG 00012 5 Average This math operation displays the mean value of the buffered readings for exampl
467. s and cancel the operations associated with them This command has no effect on any other message types SMESsage lt b gt DISPlay SMESsage lt b gt Control status message lt b gt 0 or OFF Disable status messages 1 or ON Enable status messages SMESsage Query state of status message mode 3 73 IEEE 488 Reference Description Query Description This command is used to enable disable the status message mode The status message mode is a diagnostic tool that provides real time messages that relate to the current operating state of the instrument Table 2 5 lists the status messages ENABle lt b gt DISPlay ENABle lt b gt Control display circuitry lt b gt 0 or OFF Disable display circuitry 1 or ON Enable display circuitry ENABle Query state of display This command is used to enable and disable the front panel display circuitry When disabled the instrument operates at a higher speed While disabled the display is frozen with the follow ing message FRONT PANEL DISABLED Press LOCAL to resume As reported by the message all front panel controls except LOCAL are disabled Normal dis play operation can be resumed by using the ENABle command to enable the display or by put ting the Model 6517 into local IEEE 488 Reference 3 16 FORMat subsystem Parameters Query Description The commands for this subsystem are used to select the data format for transferring instrument readings
468. s configuration utilizes the V source to make resistance measurements see para graph 2 4 2 and current measurements see paragraph 2 4 3 Condition EXIT key action Temporary message displayed e g TRIGGERS HALTED INFO message displayed Reading display hold Scanning Data storage is displayed Cancels display of temporary message Cancels INFO message returns to menu or normal reading display Cancels reading display hold resumes normal reading display Disables scanning Also stops data storage if enabled Stops data storage Temporary message STORAGE INTERRUPTED 2 9 Front Panel Operation Input High Input Low INPUT Chassis Ground 250V PEAK Volts Amps Ohms amp Coulombs A Unguarded GUARD off Input High 1Q Guard Chassis INPUT Ground COMMON Input Low 250V PEAK Volts only B Guarded GUARD on Figure 2 5 Input connector configurations Maximum input levels The maximum input levels to the Model 6517A are summarized in Figure 2 6 WARNING The maximum common mode input voltage the voltage between input low and chassis ground is 500V peak Ex ceeding this value may create a shock hazard CAUTION Connecting PREAMP OUTPUT COM MON or 2V ANALOG OUTPUT to earth while floating the input may dam age the instrument Input protection The Model 6517A incorporates protec tion circuitry against nominal overload conditions However a high voltage
469. s continues until all channels are scanned and measured Semi synchronous Trigger Link example This example uses the same test system Figure 2 64 that was used for the Asynchronous Trigger Link example 1 However triggering is done using the Semi synchronous mode Trigger Link connections are shown in Figure 2 73 The two instruments are configured as follows Trigger Link Cables 2 7001 or 7002 Switch System 2 91 Front Panel Operation Trigger Link 7001 or 7002 Switch System Figure 2 73 Trigger Link connections semi synchronous example Model 6517A Idle state Bench reset INIT CONT ON Arm layer Arm source Immediate Arm count 1 Arm trigger control Acceptor Scan layer Scan source Immediate Scan count Infinite Scan trigger control Acceptor Measure layer Measure source TrigLink Trigger link mode Semi synchronous Semi sync line 1 Measure count 10 Measure trigger control Acceptor Indicates that the setting is the BENCH RESET and factory default con dition 2 92 Trigger Link Cable 8501 Model 7001 or 7002 Idle state Reset INIT CONT OFF Scan list 1 1 1 10 Arm layer Arm spacing Immediate Arm count 1 Arm trigger control Acceptor Scan layer Scan spacing Immediate Number of scans 1 Scan trigger control Acceptor Channel layer Channel spacing TrigLink Trigger link mode
470. s enabled or disabled from the SYSTem Subsystem A reading of 999 99 means humidity is disabled This data element includes the hu midity reading in in the data string ETEMperature External temperature can be measured by connecting and enabling the Model 6517 TP temperature sensor to the instrument The temperature sensor is enabled or disabled from the SYSTem Subsystem A reading of 9999 99 means temperature is disabled This data element includes the temperature reading in C F or K in the data string Temperature units are selected from the UNIT subsystem VSOurce This element indicates the voltage that is being sourced by the V Source In standby OV is sourced The ASCII format shown in Figure 3 19 shows the byte order of the data string Keep in mind that the byte order can only be reversed for the binary formats When using this command to add an element you must include all elements that you want in the format For example if the reading is already specified and you want to add the time stamp you must include the READing parameter form elem time read Data elements for the item list can be listed in any order but are always sent in the order shown in Figure 3 19 Parameters Query Description IEEE 488 Reference BORDer lt name gt FORMat BORDer lt name gt Specify binary byte order lt name gt NORMal Normal byte order for binary formats SWAPped Reverse byte order for binary formats BORD
471. s from this point The two filter types are compared in Figure 2 74 Digital filter modes An additional filter parameter is the mode either moving or repeating A moving filter is a first in first out stack where the newest reading conversion replaces the oldest An aver age of the stacked reading conversions yields a reading Therefore after a selected number of conversions a moving filter gives a new reading for every new conversion A repeating filter takes a selected number of reading conver sions averages them and yields a reading It then flushes its stack and starts over This characteristic is useful when scan ning channels Filter modes are compared in Figure 2 76 Front Panel Operation Response time The various filter parameters have the following effects on the time needed to display store or output a filtered reading e Filter type The time to the first reading is the same for both types but thereafter moving mode yields a faster reading than repeating mode Also advanced has a faster response to changes in the input signal than averaging e Number of reading conversions Speed and accuracy are tradeoffs e Noise window For the advanced type a tradeoff of speed accuracy and response to input signal changes 2 17 2 Median filter The median filter is used to determine the middle most reading from a group of readings that are arranged according to size For example assume the following
472. s this programmed limit will set the amplitude to that limit The MINimum and MAXimum parameters are also affected by range and voltage limit Setting the V Source to the MINimum or MAXimum amplitude selects the greatest negative or pos itive value allowed by the programmed limit or range The V Source output operate or stand by is controlled from the OPERate command see next command VSOurce OPERate lt b gt SENSe 1 RESistance MANual VSOurce OPERate lt n gt lt b gt ON orl Enable V Source operate OFF or 0 Disable V Source standby OPERate Query state of V Source This command is used to enable or disable the V Source for Manual V Source Ohms When en abled the V Source is placed in operate When disabled the V Source is placed in standby SENSe 1 VOLTage DC REFerence lt n gt Specify reference Volts SENSe 1 CURRent DC REFerence lt n gt Specify reference Amps SENSe 1 RESistance REFerence lt n gt Specify reference Ohms SENSe 1 CHARge REFerence lt n gt Specify reference Coulombs lt n gt 210to 210 Reference for volts 21e 3 to 21e 3 Reference for amps 0 to 100e18 Reference for ohms 2 le 6 to 2 1le 6 Reference for coulombs DEFault 0 All functions MINimum Minimum value for specified function MAXimum Maximum value for specified function 3 95 IEEE 488 Reference 3 96 Query Description Parameters Query Description REFerence Query programmed refere
473. s used to specify which messages you want disabled Disabled messages are prevented from going into the Error Queue Messages are specified by numbers see Table 2 5 See QUEue ENABle for examples to ex press a numilist PRINT 1 output 27 stat que Disable messages and query dis 140 150 dis PRINT 1 enter 27 IT Get response message from 6517A CLEar STATus QUEue CLEar Clear Error Queue This action command is used to clear the Error Queue of messages IEEE 488 Reference 3 22 SYSTem subsystem 3 22 1 3 22 2 3 22 3 3 22 4 PRESet Description The SYSTem subsystem contains miscellaneous commands that are summarized in Table 3 13 SYSTem PRESet Return to SYSTem PRESet defaults This command returns the instrument to states optimized for front panel operation S YS Tem PRESet defaults are listed in the SCPI tables Tables 3 4 through 3 16 POSetup lt name gt SYSTem POSetup lt name gt Program power on defaults Parameters Query Description VERSion 2 Description ERRor Description lt name gt RST Select RST defaults on power up PRESet Select SYSTem PRESet defaults on power up SAVX Select saved defaults on power up where X 0 to9 POSetup Query power on setup This command is used to select the power on defaults With RST selected the instrument pow ers up to the RST default conditions With PRES selected the instrument powers up to the
474. sdwy k m m Du TTT L uw aen UA UOA YOA Arewuing syon K 404 JOU dO JOW MOLAO Burpeoy JasiBay 1015189 1035139 EEN 1335189 EEN aide Wa uonisuely vonpue ayqeu3 Wa uonisues Vonpue quay ajqeuonsand ajqeuonsand ajqeuonsenty quanq juawiainseayw jualwainseayy juawainseay ajqeuonsand juawainseay Figure 3 5 Model 6517A status register structure 3 8 IEEE 488 Reference V To Event Summary Bit ESB of Status Byte Register See Figure 3 13 Figure 3 6 Standard event status Always ESR Zero i PON URQ CME EXE DDE QYE opc Standard Event B15 B14 B8 B7 B6 B5 B4 B3 B2 B1 BO Status Register PON Power On amp URQ User Request CME Command Error a EXE Execution Error r amp d DDE Device Dependent Error Le QYE Query Error ER OPC Operation Complete L amp LA ra amp Logical AND a amp OR Logical OR A ESE Standard Event __ PON URQ CME EXE DDE QYE OPC Status Enable ESE B15 B14 B8 B7 B6 B5 B4 B3 B2 B1 BO Register From OR ed summary of From OR ed summary Arm Event Status see of Trigger Event Status Figure 3 7 see Figure 3 9 Y Y lt Seq Idle Calc Ami Trig
475. se an overflow condition but it also does not in crease the maximum allowable input for that range For ex ample on the 2mA range the Model 6517A still overflows for a 2 1mA input Front Panel Operation Configuring rel Pressing CONFigure REL displays the rel value for the present measurement function You can change the rel value using the cursor keys lt q and kand the RANGE A and V keys When ENTER is pressed the instrument returns to the measurement display state with that value of rel enabled If you try to enter an invalid rel value a message indicating the rel limit will be displayed and the rel operation will be cancelled Note that a bench or GPIB reset clears any stored rel values and disables rel for all functions Enabling rel From the normal reading display the REL key toggles the rel operation on and off Each time rel is enabled by the REL key the present reading becomes the new rel value for that function You cannot rel an overflow reading To make a new reading the rel value rel must first be disabled and then en abled again Disabling rel does not clear any stored rel value When rel is enabled the resulting reading is the algebraic difference between the actual input value and the rel value rel d reading actual value relative value With math enabled the rel d reading is acted on by the math operation displayed reading math operation rel d reading WARNING With rel enabled
476. se the Model 6517A to lock up One way to prevent this is to insert an appropriate delay in the program The required delay can be up to six seconds Program Fragment 1 shows how to use a specific delay with the FRESh command The OPC command can also be used to incorporate the necessary delay When OPC is used properly all previous commands will be allowed to finish before FRESh is executed Program Fragment 2 shows how to use OPC with the FRESh command Demonstrates FRESh using a specified delay period Comments PRINT 1 output 27 syst pres J PRINT 1 output 27 syst zch off 2 SLEEP 2 3 PRINT 1 output 27 data fresh 4 PRINT 1 enter 27 5 LINE INPUT 2 B 6 PRINT B 7 END Comments 1 Returns the Model 6517A to System Preset defaults continuous initiation 2 Disables zero check 3 Asserts a two second delay to allow the previous command to finish Note that a smaller delay may suffice or a larger delay may be required 4 5 6 7 Acquires and displays the latest fresh reading on the computer CRT Each time the program is run a fresh reading will be acquired and displayed on the CRT Demonstrates FRESh using OPC Comments PRINT 1 output 27 syst pres S PRINT 1 output 27 init cont off abort lt 2 PRINT 1 output 27 arm lay2 coun 1 3 PRINT 1 output 27 trig coun 10 4 PRINT 1 output 27 syst zch off 5 PRINT
477. seeseeesessesseeeseseeenten Low noise cables shielding and guarding 0 c eee ceeecsseceseeceeeesseeeceeseeeesecesceceaeceaeeceeeenaeeeneeaecenaeeeaes Floatinp CITCUITS neist ege Recbedsvaviavcecedenvics chs casaceu dE Wes thatasnediscatacbenetiaaaaaabtecd academe ates Test AX MES e E E OEE f Voltage meas rementsou secioni e a a aE T E A E E AE EEE EE SS Basic measurement Drocedure K e Voltage Measurement Congideratong Curent EE Basic Measurement Drocedure toaa nin o EE EEEE OSEERE REEE EE ERNER Eent ERT EEN Current measurement considerations 0 0 eee eee eee eeceeeeeeceseeseceecesececeeeeeeeeseaeeaeecaeeaaecaecsaecaecsaeeaeseseseesed 2 7 2 7 1 2 7 2 2 7 3 2 7 4 2 7 5 2 8 2 8 1 2 8 2 2 8 3 2 9 2 9 1 2 9 2 2 9 3 2 9 4 2 9 5 2 10 2 10 1 2 10 2 2 11 2 11 1 2 11 2 2 11 3 2 11 4 2 11 5 2 11 6 2 12 2 12 1 2 12 2 2 13 2 13 1 2 13 2 2 13 3 2 14 2 14 1 2 14 2 2 14 3 2 15 2 15 1 2 15 2 2 15 3 2 15 4 2 15 5 2 16 2 16 1 2 16 2 2 16 3 2 17 2 17 1 2 17 2 2 17 3 2 18 2 18 1 2 18 2 Resistance and resistivity MEASUFEMENMS eeeceeeceeeeceseecsseceeeececesseeeseeesseceseeceseecsaeceaceceeeeneeenecsaeeeseeeaeees RESISTANCE MEASUTEMEDIS ee ENEE EEEE E EER IRT EE EE EES AE Resistivity measurements ees geesde aeaee T Aa EEEn Kn S SERA R AE EAE ech Olims Confisibati on EAEE E d gl eet EE E Ohms measurement considerations Charee measurements QD scsvsci
478. sly stored in the buffer while waiting for the pre trigger source event With EXTernal source selected an external trigger via the rear panel EXTERNAL TRIGGER Input provides the pre trigger event With TLINk selected an input trigger via the Trigger Link provides the pre trigger event The Trigger Link line used for the input trigger is programmed from the Trigger subsystem see TRIGger TCONfigure command path With BUS selected a GPIB bus trigger GET or TRG provides the pre trigger event With MANual selected pressing the front panel TRIG key provides the pre trigger event CONTrol lt name gt TRACe FEED CONTrol lt name gt Specify buffer control lt name gt NEVer Disables buffer storage NEXT Fills buffer and stops ALWays Continuously stores readings in buffer PRETrigger Use Pretrigger mode to store readings CONTrol Query buffer control This command is used to select the buffer control With NEVer selected storage into the buffer is disabled With any of the other selections storage is performed as long as buffer feed is not set for NONE see TRACe FEED NONE When NEXT is selected the storage process starts fills the buffer and then stops The buffer size is specified by the POINts command When ALWays is selected the storage process starts and continues to store readings even after the buffer fills After the buffer fills readings overwrite the previously stored readings When PRETrigger is selected the buf
479. solu tion is set to 6 5 digits Table 2 19 Auto resolution all functions Resolution Integration time 3 5d 0 01 to lt 0 02 PLC 4 5d 0 02 to lt 0 20 PLC 5 5d 0 20 to lt 2 00 PLC 6 5d 2 00 to 10 00 PLC NOTE If SET BY RSLN integration is selected display resolution will be 6 5 digits and the inte gration time 1 0 PLC 2 58 2 13 Zero check relative and zero correct 2 13 1 Zero check When zero check is enabled on the input amplifier is re configured to shunt the input signal to low as shown in Fig ure 2 46 When you enable or disable zero check that state is assumed regardless of which function you select In other words you cannot set a unique zero check state on or off for each function Zero check is enabled by pressing the Z CHK key When en abled the Zerocheck message is displayed Pressing Z CHK a second time disables zero check NOTE To ensure proper operation always enable zero check before changing functions V LR or Q In coulombs enabling zero check dissipates the charge That is the charge reading is reset to zero When zero check is dis abled a sudden change in the charge reading zero check hop occurs This effect can be cancelled by enabling REL immediately after zero check is disabled REL is explained in paragraph 2 13 2 For voltage current and resistance measurements leave zero check enabled when connecting or disconnecting input sig nals For char
480. sresrtrrterrrretresteitestesreretsreresrnserreeerereee s IEEE 488 Bus Overview IEEE 488 bus command SUMMALY sosessccscessecessessasaccaseas sossessnsovnessapsepigcveansspaseabasespauntenseannsebeserestbesnecnasteed Hexadecimal and decimal command codes ei eeceeseceeceseceeceseeseceseeeeceeeeeeeeaeeeeecaeeeaecaeesaecaeaesaeenaeeas Typical addressed command seguence Typical comMOn command SEQUENCE v 65 0 3 08 ceeteascsetvesecvesnevesbova veeventenobsouses E E eo eese eeii ea eve IEEE command SOUPS E IEEE 488 Conformance Information TEEE 488 documentation requirements se esseeeesseeesesreeesreetrrtsretssterestrersretstentetesseeteserensrersreeenteeeees Coupled Commands EE General Information 1 1 Introduction This section contains general information about the Model 6517A Electrometer High Resistance Meter It is arranged in the following manner 1 2 Features 1 3 Warranty information 1 4 Manual addenda 1 5 Safety symbols and terms 1 6 Specifications 1 7 Inspection 1 8 Options and accessories 1 2 Features Some important Model 6517A features include e Full range of functions Exceptional sensitivity and accuracy for voltage current charge and V I resistance and resistivity surface and volume measure ments With the Models 6517 RH and 6517 TP relative humidity and external temperature can be measured e Voltage source The internal 1000V V Source can be configured with the ammeter
481. ssage indicates that a Break occurred device clear occurs 804 RS 232 Noise detected Noisy signals could corrupt the data 3 158 805 Invalid system communication RS 232 inter face selection lost on power up Instrument defaults to GPIB 806 RS 232 Settings lost RS 232 settings lost on power up Instrument defaults to 9600 baud rate 8 data bits no parity none and 1 stop bit 807 RS 232 OFLO Characters lost A character was received but discarded due to a lack of input buffer space Each line feed character lt LF gt clos es a buffer and opens another Thus if too many line feeds are sent in succession then all buffers will fill before they have a chance to be read 808 ASCII only with RS 232 You tried to select a data format using FORMat DATA other than ASCII 3 27 4 Downloading commands using ProComm There are several communication programs that can be used to send commands to the Model 6517A The following sum marizes the procedure to use ProComm to download a com mand file to the Model 6517A 1 Using a text editor type the commands into a file and save it An example file is shown as follows isyste pres func curr curr rang le6 syst zch off data fresh 2 Go into PCPlus terminal and set the communications settings to match the settings of Model 6517A baud rate data bits parity and stop bits 3 Press the PageUp key on the computer keyboard PC Pl
482. ssing FILTER a second time disables filter When FILTER is enabled the status of the two filters will be briefly displayed For example Filter Enabled Digital ADV 10 Median ON The above display message indicates that the advanced filter average 10 readings is in effect and the median filter is on If no digital filter is selected NONE and the median filter is off the message No Filters Selected will be displayed In this case enabling FILTER has no effect on the input signal Filtering is performed only on primary display measure ments it has no effect on multiple displays 2 17 1 Digital filters Digital filter types The Model 6517A has two types of digital filters averaging and advanced Both types are a simple average of one to 100 reading conversions The difference between them is the user programmable noise window of the advanced filter The noise window which is expressed as a percentage of range 0 100 allows a faster response time to large signal step changes e g scanned readings A reading conversion outside the plus or minus noise window fills the filter stack immediately If the noise does not exceed the selected percentage of range the reading is based on an average of reading conversions In this case the advanced filter works the same as the averaging filter If the noise does exceed the selected percentage the reading is a single reading conversion and new averaging start
483. ssing R 2 38 Ifthe manual V Source adjustment mode is selected use the a gt and the VOLTAGE SOURCE A and V keys to set the voltage level The V Source range can be changed from the RANGE item of the CONFIGURE V SOURCE menu See paragraph 2 9 2 for details on set ting range and level for the V Source Note that you will not be able to adjust the V Source if AUTO NV Source is selected Use the A and W RANGE keys to select the ohms mea surement range or select AUTO range Note that with AUTO range selected the instrument will not go the 2TQ 20TQ and 200TQ ranges Disable zero check by again pressing Z CHK Press OPER to place the V Source in operate and after an appropriate electrification period bias time note the resistivity reading Typically an electrification period of 60 seconds is used See paragraph 2 7 5 Electrification Time for details NOTE A flashing VOLTAGE SOURCE OPER ATE LED indicates that the V Source has gone into current limit The programmed voltage is not being applied to the load In this situation try using a lower voltage for the measurement 10 Place the V Source in standby by again pressing OPER and enable zero check WARNING Place the V Source in standby before making or breaking connections to the test fixture or DUT Front Panel Operation 6517 ILC 3 Interlock Cable Model 8009 uw A METER SOURCE INTERLOCK WARNING tuo
484. ster 3 11 3 ESR event status register query Read the Standard Event Status Register and clear it Description This command is used to acquire the value in decimal of the Standard Event Status Register see Figure 3 16 The binary equivalent of the returned decimal value determines which bits in the register are set This register is cleared on power up or when CLS is sent A set bit in this register indicates that a particular event has occurred For example for an ac quired decimal value of 48 the binary equivalent is 00110000 For this binary value bits B4 and B5 of the Standard Event Status Register are set These set bits indicate that a device dependent error and command error have occurred Bit Position B7 Bo B5 B4 B3 B2 B1 BO Event PON URQ CME EXE DDE QYE OPC Decimal Weighting 128 64 32 16 8 4 1 27 28 25 24 23 22 2 Value 0 1 o1 o1 O 1 Of 1 on Note Bits B8 through B15 are not shown since they are not used vent Bit Set Events PON Power On vent Bit Cleared URQ User Request CME Command Error EXE Execution Error DDE Device dependent Error QYE Query Error OPC Operation Complete Value 1 E O E Figure 3 16 Standard Event Status Register 3 29 IEEE 488 Reference The bits of the Standard Event Status Register are described as follows Bit BO Operation Complete OPC Set bit indic
485. subsystem Use to null input offset current and voltage burden Note Use the Model 6517 Service Manual to calibrate the instrument DISPlay subsystem Use to control display readings and messages FOR Mat subsystem Use to select the data format for transferring instrument read ings over the bus Output subsystems Use to control the V Source and select the polarity for the digital output lines ROUTe subsystem Use to control switching Sense subsystems Use to configure and control the measurement functions SOURCce subsystem Use to control the digital output port STATus subsystem Use to configure and control the status registers SYSTem subsystem Commands not covered by the other subsystems TRACe subsystem Use to control the reading buffer Trigger subsystem Use to configure the Trigger Model TSEQuence subsystem Use to configure and control test sequences UNIT subsystem Use to select temperature units 3 41 IEEE 488 Reference SCPI Command Summary Tables 3 4 through 3 16 summarize the commands for each SCPI subsystem General notes e Brackets are used to denote optional character sets These optional characters do not have to be included in the program message Do not use brackets in the program message e Angle brackets lt gt are used to indicate parameter type Do not use angle brackets in the program message e The Boolean parameter lt b gt
486. t chanlist Specify channel to be closed where chanlist is the channel 1 to 10 to be closed CLOSe lt list gt Query specified channel The CLOSe lt list gt command is used to close a channel on an optional scanner card installed in the Model 6517A Only one channel can be closed at a time Thus for this command the chan list must consist of only one channel When this command is sent any other closed channel will first open and then the specified channel will close The CLOSe lt list gt query command is used to determine the state closed or not closed of each channel specified by the list parameter For this command the chanlist can consist of multiple channels The following examples demonstrate the various forms for expressing the channel list List 2 Single channel 2 4 6 Multiple channels separated by commas 1 10 Range of channels 1 though 10 Range limits separated by a colon 1 5 7 Range entry and single entry separated by a comma After sending this query command and addressing the Model 6517A to talk the values for the specified channels are sent to the computer A value of 1 indicates that the channel is closed and a 0 indicates that the channel is not closed STATe ROUTe CLOSe STATe Query closed channel This query command is used to determine which if any channel on the internal scanner card is closed After sending this command and addressing the Model 6517A to talk
487. t Enable or disable line sync STATe Query line sync OFF 3 22 6 KEN lt NRf gt Simulate key press 1 to 31 see Figure 3 40 KEY Query the last pressed key CLEar Clears messages from the Error Queue V 3 22 7 DATE lt yr gt lt mo gt lt day gt Set date V 3 22 8 DATE Query date V 3 22 9 TIME lt hr gt lt min gt lt sec gt Set time 24 hour format y 3 22 10 TIME Query time y TSTamp Path to configure and control timestamp 3 22 11 TYPE lt name gt Select timestamp type RELative or RTClock TYPE Query timestamp type 3 22 12 RELative Path to reset timestamp RESet Reset relative timestamp to 0 sec RNUMber Path to reset reading number RESet Reset reading number to zero ZCHeck lt b gt Enable or disable zero check 3 22 12 ZCHeck Query state of zero check ZCORrect Path to control zero correct 3 22 12 STATe lt b gt Enable or disable zero correct OFF STATe Query state of zero correct ACQuire Acquire zero correction value TSControl lt b gt Enable or disable external temperature readings OFF 3 22 12 TSControl Query state of external temperature readings HL Control lt b gt Enable or disable the A D hardware limit ON 3 22 13 HL Control Query state of hardware limit HSControl lt b gt Enable or disable humidity readings OFF 3 22 13 HSControl Query state of humidity readings LOCal Take 6517 out of remote RS 232 only 3 22 13 REMote Put 6517 in remote RS 232 only
488. t Specify as a number READings Query number of readings SOURce lt name gt Select pre trigger source event EXTernal TLINk BUS or MANual SOURce Query pre trigger source event CONTrol lt name gt Select buffer control mode NEVer NEXT d ALWays or PRETrigger CONTrol Query buffer control mode y DATA Read all readings in the buffer V 323 5 LAST Read last reading stored in buffer by Alternating Polarity test 3 23 5 TSTamp Path to select timestamp format for buffer readings 3 23 6 FORMat lt name gt Select timestamp format ABSolute or DELTa POR Mat Query timestamp format ELEMents lt name gt Select reaeding elements TSTamp HUMidity CHANnel 3 23 7 SYSTem PRESet and RST have no effect on the commands in this subsystem 3 56 Table 3 15 Trigger command summary IEEE 488 Reference Default Command Description parameter SCPI Ref INITiate Subsystem command path V 3 24 1 IMMediate Initiate one trigger cycle d CONTinuous lt b gt Enable or disable continuous initiation Note 1 V CONTinuous Query continuous initiation V POFLag lt name gt INCLude or EXCLude no pending flag for initiate com INCLude mands POFLag Query pending operation flag ABORt Reset trigger system d 3 24 2 ARM SEQuence 1 Path to configure arm layers V LAYer 1 Path to program Arm Layer 1 y IMMediate Loop around control source V 3 24 3 COUNt lt n gt Specify arm count 1 to 99999 or
489. t subsystem erano EELER EEEE ESEE LE EE EAE solues EEE OENE Output EE ROUTe subsystem CLOSe lt list gt HOPE iS gt ET E A E E enenetenal ons SOPENGAL D E EE E E A E SCAN COMMANdS EE d ass ISENSe RE pysdsieesaassbesiadestouescncbees SENSe 1 subsystem d e EEN dE E EG PAPER E E NPLECycles EE aot RANGe Commands os sssievsesevacscessrssncsviasbbancs eE r REEE En EEEE R Ee SEE EE EE EATE KEA E EEEE EE EESE EEEE ERa Er a ii TRE FETENCE ET SIRE FerenGe TEE DIGIS SOS sc Soi aaeeea E steve soubesuacsat sus ous pbateauersshces svais steve ddacasteeyaaubasacsanseesceataauersanvesaysessnevebuas SA VERaie GOEDERT SEELEN MEDian Commands eege ees ege deen Eege eegne DE Aen vist geed see SKS IT i GUAR EE SAD IScharge Commands csser irinetan aeree E AE RNE E EE EEEE S EREE EEEa EEE 3 19 15 3 19 16 3 19 17 3 19 18 3 20 3 20 1 3 20 2 3 21 3 21 1 3 21 2 3 21 3 3 21 4 3 21 5 3 21 6 3 21 7 3 22 3 22 1 3 22 2 3 22 3 3 22 4 3 22 5 3 22 6 3 22 7 3 22 8 3 22 9 3 22 10 3 22 11 3 22 12 3 22 13 3 22 14 3 22 15 3 22 16 3 23 3 23 1 3 23 2 3 23 3 3 23 4 3 23 5 3 23 6 3 23 7 3 24 3 24 1 3 24 2 3 24 3 3 24 4 3 24 5 3 24 6 3 24 7 3 24 8 3 24 9 3 24 10 3 25 3 29 1 3 25 2 3 25 3 SY S Tem SUBS YStEND EENG a TPSEQuence Sage ees sanescaies sites R EE EEEa EEE oE EIEE EEE RO KT EREKET RORE tans castes EEE EEEn EE Eere KR RE E WEE SS IR IT NEE OU Bue Commands sc so eegene SE ee EE
490. t 400V see Auto V Source in paragraph 2 7 The V Source can be set to a maximum absolute value of voltage that can be sourced For example setting a value of 30V limits the voltage output from 30V to 30V The V LIMIT option of the CONFigure V SSOURCE menu is used to set the V Source voltage limit and is summarized in Table 2 15 1 From the CONFigure V SOURCE menu select V LIM IT to display the voltage limit selections CONTROL Use this selection to enable ON or dis able OFF the voltage limit When enabled the V Source will be limited to the specified voltage limit val ue see LIMIT VALUE LIMIT VALUE Use this selection to set the voltage limit using the A V lt and bk keys Make sure to press ENTER after changing the value 2 Use the EXIT key to back out of the menu structure Selecting resistive current limit Selecting the resistive current limit places a 20MQ resistor in series with the HI lead of the V Source The RESISTIVE LIMIT option of the CONFIGURE V SOURCE menu is 2 49 Front Panel Operation used to enable or disable resistive current limit and is sum marized in Table 2 15 1 From the CONFigure V SOURCE menu select RESIS TIVE LIMIT to display the options on or off 2 To select resistive current limiting place the cursor on the ON option and press ENTER Conversely to de se lect resistive current limiting place the cursor on OFF and press ENTER 3 Use the EXIT k
491. t bit B6 MSS RQS of the Status Byte Register Conversely when unmasked a set summary bit in the Status Byte Register sets bit B6 A Status Summary Message bit in the Status Byte Register is masked when the corresponding bit in the Service Request Enable Register is cleared 0 When the masked summary bit in the Status Byte Register sets it is ANDed with the cor responding cleared bit in the Service Request Enable Regis ter The logic 0 output of the AND gate is applied to the input of the OR gate and thus will not set the MSS RQS bit in the Status Byte Register A Status Summary Message bit in the Status Byte Register is unmasked when the corresponding bit in the Service Request Enable Register is set 1 When the unmasked summary bit in the Status Byte Register sets it is ANDed with the corre sponding set bit in the Service Request Enable Register The logic 1 output of the AND gate is applied to the input of the OR gate and thus sets the MSS RQS bit in the Status Byte Register The individual bits of the Service Request Enable Register can be set or cleared by using the following common com mand see paragraph 3 11 11 for details SRE lt NRf gt The Service Request Enable Register can be read using the following common query command see paragraph 3 11 11 for details SRE The Service Request Enable Register is not cleared when it is read using the SRE query command The Service Re quest Enable Regis
492. t fixture keep the lid closed while power is ap plied to the device under test Safe operation requires the use of a lid interlock 5 03 Ifa screw is present connect it to safety earth ground using the wire recommended in the user documentation The A symbol on an instrument indicates that the user should re fer to the operating instructions located in the manual The AN symbol on an instrument shows that it can source or mea sure 1000 volts or more including the combined effect of normal and common mode voltages Use standard safety precautions to avoid personal contact with these voltages The e symbol indicates a connection terminal to the equipment frame The WARNING heading in a manual explains dangers that might result in personal injury or death Always read the associated infor mation very carefully before performing the indicated procedure The CAUTION heading in a manual explains hazards that could damage the instrument Such damage may invalidate the warranty Instrumentation and accessories shall not be connected to humans Before performing any maintenance disconnect the line cord and all test cables To maintain protection from electric shock and fire replacement components in mains circuits including the power transformer test leads and input jacks must be purchased from Keithley Instru ments Standard fuses with applicable national safety approvals may be used if the rating and type are the same
493. t scan Wait for Trigger Link Trigger Scan Channel JL Trigger H ap Output Trigger Figure 2 66 Operation model for asynchronous trigger link example 1 External Triggering and Trigger Link As previously mentioned the trigger pulses for the asynchro nous Trigger Link are identical to the trigger pulses used for External Triggering The only thing that prevents them from being used together in a test system is connection incompat ibility Trigger Link uses an 8 pin micro DIN connector while External Triggering uses two BNC connectors This connection problem can be solved by using the Model 8502 Trigger Link Adapter The adapter has two 8 pin micro DIN connectors and six BNC connectors The micro DIN connectors mate directly to the Trigger Link connector on the Model 6517A using a trigger link cable The BNC con nectors mate directly to the External Triggering BNC con nectors on other instruments using standard male BNC to BNC cables Figure 2 67 shows how a Keithley Model 706 Scanner can be connected to the Trigger Link of the Model 6517A using the adapter With this adapter a Model 706 could be substituted Front Panel Operation Trigger LT 6517A Wait for Trigger Link Trigger Make Measurement Output Trigger for the Model 7001 7002 in the previous example Asyn chronous Trigger Link example 1 With the Model 706 set for External Triggering
494. t the other end of the power cord to a grounded AC outlet WARNING The power cord supplied with the Model 6517A contains a separate ground wire for use with grounded outlets When 2 2 proper connections are made instru ment chassis is connected to power line ground through the ground wire in the power cord Failure to use a grounded outlet may result in personal injury or death due to electric shock 2 2 2 Line fuse replacement A rear panel fuse located below the AC receptacle protects the power line input of the instrument If the fuse needs to be replaced perform the following steps WARNING Make sure the instrument is disconnect ed from the line and other equipment before replacing the line fuse 1 With the power off place the end of a flat blade screw driver into the rear panel LINE FUSE holder Push in gently and rotate the fuse carrier one quarter turn coun terclockwise Release pressure on the holder and its in ternal spring will push the fuse carrier out of the holder 2 Remove the fuse and replace it with the type recom mended in Table 2 1 CAUTION Do not use a fuse with a higher current rating than specified or instrument damage may occur If the instrument re peatedly blows fuses locate and correct the cause of the trouble before replacing the fuse Install the new fuse and fuse carrier into the holder by revers ing the above procedure Table 2 1 Line fuse selection Keithley Line v
495. ta element For example if three valid elements are specified the data string for each reading conversion is made up of three 32 bit data blocks Note that the data string for each reading conversion is preceded by a 2 byte header that is the binary equivalent of an ASCII sign and 0 REAL 64 or DREal selects the binary IEEE754 double precision data format and is shown in Figure 3 21 normal byte order shown This format is similar to the single precision format ex cept that it is 64 bits long 3 75 IEEE 488 Reference Reading Channel External Relative V Source Reading Time stamp Numer Number Temp Humidity Operate 1 II 1 ca r 1 1 1 234 567E 00NVDC 09 21 44 00 14 Sep 1 994 401 234rdg 400extchan 0025 0Cexttemp 065 3hum 001 0 000Vsrc I I Exponent Time Date Units Units Units Units C Units F F VDC Volts K K ADC Amps eet OHM Ohms Units OHMCM Volume extchan External Channel OHMSQ Surface intchan Internal Channel V Voltage coefficient COUL Coulombs 000 No Channel S 001 to 400 Channel number Status N Normal Z Zero Check Enabled O Overflow U Underflow R Reference Rel L Out of Limit Real time clock timestamp shown Figure 3 19 ASCII data format s sign bit 0 positive 1 negative e exponent bits 8 f fraction bits 23 Normal byte order shown For swapped byte order bytes sent in reverse order Header By
496. tage Voltage Settling Time 0 0 sec 0 0 sec Timer No No Interval 2 5 sec 2 5 sec V Source Limit Yes Yes External Scan External Inputs 10 10 Trigger Source Triglink Triglink Scan Count 10 10 Timer No No Interval 2 5 sec 2 5 sec Memory Yes Yes Speed Normal 1 PLC Normal 1 PLC Status Messages Off Off Timestamp No effect No effect 2 113 Front Panel Operation 2 114 Table 2 30 cont Factory default conditions Bench default Function or operation SYSTem PRESet GPIB default RST Test Sequence Diode Diode Diode Start Voltage 1V 1V Stop Voltage 10V 10V Step Voltage 1V 1V Delay 1 sec 1 sec Capacitor Bias Voltage 1V 1V Points 10 10 Interval 1 sec 1 sec Cable Bias Voltage 1V 1V Points 5 5 Interval 1 sec lsec Resistor Source V1 1V 1V Delay 1 1 sec 1 sec Source V2 2V 2V Delay 2 1 sec 1 sec Surface Resistivity Pre discharge Time 0 2 sec 0 2 sec Bias Voltage 500V 500V Bias Time 1 sec 1 sec Measure Voltage 500V 500V Measure Time 1 sec 1 sec Discharge Time 2 sec 2 sec Volume Resistivity Pre discharge Time 10 sec 10 sec Bias Voltage 500V 500V Bias Time 1 sec 1 sec Measure Voltage 500V 500V Measure Time 1 sec 1 sec Discharge Time 2 sec 2 sec Alternating Polarity Offset Voltage OV OV Alternating Voltage 10V 10V Measurement Time 15 sec 15 sec Discarded Readings 3 3 Stored Readings 1 1 SIR Bias Voltage 50V 50V Bias Time 1 sec 1 sec Measure Voltage 100V 100V Measure Time 1 sec 1 sec Squ
497. te 4 Byte 3 Byte 2 Byte 1 The Header is only sent once for each measurement conversion Figure 3 20 IEEE754 single precision data format 32 data bits 3 76 Parameters Query IEEE 488 Reference Bytes 3 4 5 and 6 not shown s sign bit 0 positive 1 negative e exponent bits 11 f fraction bits 52 Normal byte order shown For swapped byte order bytes sent in reverse order Header Byte 8 Byte 7 Byte 1 The Header is only sent once for each measurement conversion Figure 3 21 IEEE754 double precision data format 64 data bits ELEMents lt item list gt FORMat ELEMents lt item list gt Specify data elements for data string lt item list gt READing Includes reading in data string CHANnel Includes channel number RNUMber Includes reading number UNITs Includes units TSTamp Includes time stamp STATus Includes status of reading HUMidity Includes humidity reading ETEMperatrue Includes external temperature reading VSOurce Includes V Source output NOTE Each item in the list must be separated by a comma ELEMents Query elements in data string This command is used to specify the elements to be included in the data string for each mea surement conversion You can specify from one to all six elements Each element in the list must be separated by a comma These elements shown in Figure 3 19 are explained as follows READing Instrument reading The resolution of this readi
498. te of auto discharge LEVel lt NRf gt Specify level 2 2e6 to 2 2e6 2e 6 LEVel Query level Notes 1 16 67ms for 60Hz power line frequency and 20ms for 50Hz line frequency 2 RST OFF SYSTem PRESet ON 3 RST REPeat SYSTem PRESet MOVing 4 RST ON SYSTem PRESet OFF 3 51 IEEE 488 Reference Table 3 11 SOURce command summary Default Command Description parameter SCPI Ref SOURce Note 1 TTL 1 Path to set digital output line 1 3 20 21 LEVel lt b gt Enable or disable line 1 LEVel Query state of line 1 TTL2 Path to set digital output line 2 3 20 21 LEVel lt b gt Enable or disable line 2 LEVel Query state of line 2 TTL3 Path to set digital output line 3 3 20 21 LEVel lt b gt Enable or disable line 3 LEVel Query state of line 3 TTL4 Path to set digital output line 4 3 20 21 LEVel lt b gt Enable or disable line 4 LEVel Query state of line 4 VOLTage Path to set V Source level V 3 20 22 LEVel y IMMediate y AMPLitude lt n gt Set V source level 0 to 1000 volts 0 y AMPLitude Query V source level y RANGe lt n gt Select V source range lt 100 selects 100V range 100 y gt 100 selects 1000V range RANGe Query V source range y LIMit Path to control V source voltage limit y AMPLitude lt n gt Set voltage limit 0 to 1000 volts 1000 y AMPLitude Query voltage limit y
499. te of binning strobe IMMediate Re perform limit tests y Note ON is the RST default parameter and OFF is the SYSTem PRESet default 3 43 IEEE 488 Reference Table 3 5 CALibration command summary Command Description CALibration UNPRotected VOFFset IOFFset Null voltage burden Null input offset current These are the only two commands accessible to the operator To cali brate the instrument refer to the Model 6517 Service Manual Table 3 6 DISPlay command summary Default Command Description parameter SCPI DISPlay WINDow 1 Path to locate message to top display V ATTRibutes Query attributes of display characters 1 blinking character 0 other TEXT Path to control user text messages Note 1 V DATA lt a gt Define ASCII message a up to 20 characters V DATA Query text message V STATe lt b gt Enable or disable message mode Note 2 V STATe Query text message state V DATA Read data on top portion of display WINDow2 Path to locate message to bottom display d ATTRibutes Query attributes of display characters 1 blinking character other TEXT Path to control user text messages V DATA lt a gt Define ASCII message a up to 32 characters Note 1 V DATA Query text message V STATe lt b gt Enable or disable message mode Note 2 y STATe Query text message state V DATA Read data on bottom portion of dis
500. te that a function does not have to be selected in order to be configured When the function is selected it will assume the programmed status SPEED The SPEED parameter sets the integration time of the A D converter the period of time the input signal is measured al so known as aperture It is discussed in paragraph 2 5 2 FILTER Use this menu item to configure the two basic filter types av eraging and median Note that you can use either the averag ing filter the median filter or both The filter menu is available from the function configuration menus i e press CONFIG V or by pressing CONFIG FIL TER with the desired function already selected All of the pa rameters menu items for FILTER are explained in paragraph 2 17 RESOLUTION The RESOLUTION parameter sets the display resolution It is discussed in paragraph 2 5 2 and 2 12 AUTO RANGE The AUTO RANGE option is used to configure autorange for the amps function This option allows you to speed up the autoranging search process by eliminating upper and or low Front Panel Operation er Measurement ranges For example if you know that read ings will not exceed 1uA you can specify the 2UA range to be the maximum range When the instrument autoranges as suming AUTO RANGE is enabled it will not search into the current ranges above 2UA NOTE Allow sufficient time for settling when autoranging over multiple ranges or down to the lower current ranges
501. tegration time menu NORMAL FAST Select 0 01 PLC MEDIUM Select 0 1 PLC HIACCURACY Select 10 PLC SET SPEED EXACTLY Set integration time in PLC 0 01 10 SET BY RSLN Default to setting appropriate for resolution FILTER Filter menu AVERAGING Configure digital averaging filter TYPE Select type of average filter NONE No average filtering performed AVERAGING Program a simple average filter 1 100 rdgs ADVANCED range AVERAGING MODE MEDIAN Configure median filter DISABLE Disable median filter ENABLE RESOLUTION Display resolution menu AUTO 3 5d 4 5d 5 5d 6 5d AUTO DISCHARGE AUTORANGE Select a specific resolution Select 1 PLC power line cycle 16 67msec for 60Hz 20msec for 50Hz and 400Hz Program a simple average filter 1 100 rdgs with noise tolerance window 0 100 of Select moving average or repeating average mode Enable median filter and specify rank 1 5 Default to resolution appropriate for integration time Enable specify level or disable auto discharge Select autorange limits high or low 2 8 3 Charge measurement considerations Some considerations for making accurate charge measure ments are summarized in the following paragraphs Addi tional measurement considerations are summarized in paragraph 2 21 For comprehensive information on precision measurements refer to the Low Level Measurements hand book which is available from Keithley INPUT BIAS CURRENT A prim
502. tem is shown in Figure 2 61 which uses a Model 6517A Electrometer to measure ten DUTs switched by a Model 7158 multiplexer card in a Model 7001 or 7002 Switch System The external trigger connections for this test are shown in Figure 2 62 Channel Ready output of the Model 7001 or 7002 is connected to External Trigger Input of the Model 6517A Meter Complete Output of the Model 6517A is con nected to External Trigger input of the Model 7001 or 7002 For this example the Models 6517A and 7001 7002 are configured as follows 6517A EEN Deg l vA i DAT i 1 SC S ouer ZE 9 L o g ttt gZ I l l ot o i e DUT ee 2 ee l l i e HM I ie L le 3 DUT KR ote 10 lg o See Cadr 7158 MUX Card Figure 2 61 DUT test system QQA elo amn e ii Model 6517A Idle State Bench reset INIT CONT ON Arm layer Arm source Immediate Arm count 1 Arm trigger control Acceptor Scan layer Scan source Immediate Scan count Infinite Scan trigger control Acceptor Measure layer Measure source External Measure count Infinite Measure trigger control Acceptor Indicates that the setting is the BENCH RESET and factory default con dition Model 7001 or 7002 Idle State Reset INIT CONT OFF Scan List 1 1 1 10 Arm layer Arm spacing Immediate Arm count 1 Arm trig
503. ter clears when power is cycled or a pa rameter n value of zero is sent with the SRE command SRE 0 Serial poll and SRQ Any enabled event summary bit that goes from 0 to 1 will set RQS and generate a service request SRQ The user s test program can periodically read the Status Byte Register to IEEE 488 Reference check to see if a service request SRQ has occurred and what caused it In the event of an SRQ the program can for example branch to an appropriate subroutine that will ser vice the request Typically service requests SRQs are man aged by the serial poll sequence of the Model 6517A If an SRQ does not occur bit B6 RQS of the Status Byte Regis ter will remain cleared and the program will simply proceed normally after the serial poll is performed If an SRQ does occur bit B6 of the Status Byte Register will set and the pro gram can branch to a service subroutine when the SRQ is de tected by the serial poll The serial poll automatically resets RQS of the Status Byte Register This will allow subsequent serial polls to monitor Bit 6 for an SRQ occurrence generated by other event types After a serial poll the same event can cause another SRQ even if the event register which caused the first SRQ has not been cleared A serial poll clears RQS but does not clear MSS The MSS bit will stay set until all Status Byte event summary bits are cleared The following QuickBASIC 4 5 program using the KPC 488
504. th Channel trigger control Source Indicates that the setting is the RESET and factory default condition Notice that the Model 6517A is reset to BENCH defaults With this selection the electrometer stays armed Since the arm source and scan source are set to Immediate the Model 6517A waits in the measure layer for a trigger With the Channel Trigger Control of the Model 7001 7002 set for Source scan operation initially bypasses the need for a Trigger Link trigger to close the first channel Since arm 2 86 spacing and scan spacing are set to Immediate the scan starts as soon as the scanner is taken out of the idle state by press ing the STEP key To run the test and store the readings in the Model 6517A press STORE on the electrometer enter the desired number of readings ten and press ENTER The Model 6517A waits with the asterisk annunciator lit for a Trigger Link trigger from the Model 7001 7002 Press STEP on the Model 7002 to start the scan The scan ner s output pulse triggers the Model 6517A to take a read ing store it and send a trigger pulse The following explanation on operation is referenced to the operation mod el shown in Figure 2 66 A The BENCH RESET condition arms the Model 6517A and places electrometer operation at point A in the flowchart where it is waiting for a Trigger Link trigger Note that since both the arm layer and scan layer are programmed for Immediate Source operation immed
505. the Model 6517A do not use these com mands Unaddress commands The two unaddress commands are used by the controller to remove any talkers or listeners from the bus ATN is true when these commands are asserted UNL Unlisten Listeners are placed in the listener idle state by the UNL command UNT Untalk Any previously commanded talkers will be placed in the talker idle state by the UNT command Common commands Common commands are commands that are common to all devices on the bus These commands are designated and de fined by the IEEE 488 2 standard Generally these commands are sent as one or more ASCII characters that tell the device to perform a common opera tion such as reset The IEEE 488 bus treats these commands as data in that ATN is false when the commands are transmit ted SCPI commands SCPI commands are commands that are particular to each device on the bus These commands are designated by the in strument manufacturer and are based on the instrument model defined by the Standard Commands for Programma ble Instruments SCPI Consortium s SCPI standard Generally these commands are sent as one or more ASCII characters that tell the device to perform a particular opera tion such as setting a range or closing a relay The IEEE 488 bus treats these commands as data in that ATN is false when the commands are transmitted Command codes Command codes for the various commands that use the data
506. the external switching system This command is used to specify the number of external channels to scan The external scan by the Model 6517A is enabled by the ROUTe SCAN LSELect EXTernal command LSELect lt name gt ROUTe SCAN LSELect lt name gt Perform specified scan operation lt name gt INTernal Enable scan for internal scanner card EXTernal Enable scan for external scanner card NONE Disable all scan operations LSELect Query scan operation This command is used to select and perform the desired scan operation When INTernal is se lected the Model 6517A scans the channels of the internal switching card according to how the scan is configured see ROUTe SCAN INTernal EXTernal is used to measure channels that are controlled by an external switch system When EXTernal is selected the Model 6517A scans the channels of the external scanner card The ROUTe SCAN EXTernal command is used to specify the number of external channels to scan The NONE selection disables all operations associated with a scan STiMe lt n gt ROUTe SCAN STIMe lt n gt Specify settling time lt n gt 0 003 to 99999 999 Specify settling time in seconds DEFault 0 seconds MINimum 0 seconds MAXimum 99999 999 seconds EXTernal Query programmed settling time EXTernal DEFault Query RST default settling time EXTernal MINimum Query minimum settling time EXTernal MAXimum Query maximum settling time This command is used to specify t
507. the logic level true or false of each digital output line and is used to configure the V Source Note that the V Source is controlled standby operate from the OUT put subsystem The commands for this subsystem are summarized in Table 3 11 3 20 1 Digital Output Commands LEVel lt b gt SOURce TTL 1 LEVel lt b gt Control digital output line 1 SOURce TTL2 LEVel lt b gt Control digital output line 2 SOURce TTL3 LEVel lt b gt Control digital output line 3 SOURce TTL4 LEVel lt b gt Control digital output line 4 Parameters lt b gt Lor ON Set output line true 0 or OFF Set output line false Query LEVel Query logic level of specified line Description These commands are used to set the logic levels for the digital output port The actual level high or low of a digital output line depends on its programmed polarity see Output subsystem If the polarity of a line is active high then that line is high when it is set to be true 1 or ON and low when it is set to be false 0 or OFF Conversely if polarity is active low the line is low when it is set to be true and high when it is set to be false NOTE If a LIMITS control is enabled LOLIM1 or 2 HILIM1 or 2 High Low or Pass this command does not check or change the output status Refer to para graph 2 19 5 for information on limits 3 20 2 V Source Configuration Commands VOLTage Commands LEVel IMMediate AMPLitude lt n gt S
508. the polynomial calculation Parameters Query Description Parameters Query Description Parameters Query Description Parameters Query Description Description IEEE 488 Reference MA2Factor lt NRf gt CALCulate 1 KMATh MA2Factor lt NRf gt Specify a2 factor lt NRf gt 9 999999e20 to 9 999999e20 MA2Factor Query a2 factor This command is used to specify the a2 factor for the polynomial calculation PERCent lt NRf gt CALCulate 1 KMATh PERCent lt NRf gt Specify Percent target value lt NRf gt 9 999999e35 to 9 999999e35 Specify target value for Percent calculation PERCent Query Percent target value This command is used to specify the target value for the Percent calculation REFerence lt NRf gt CALCulate 1 REFerence lt NRf gt Set reference value for ratio deviation and percent deviation lt NRf gt 9 999999e35 to 9 999999e35 Specify reference value REFerence Query reference value This command is used to specify the reference value for the ratio deviation and percent devia tion calculation STATe lt b gt CALCulate 1 STATe lt b gt Control CALC 1 lt b gt 0 or OFF Disable CALC 1 calculation 1 or ONEnable CALC 1 calculation STATe Query state on or off of CALC 1 This command is used to enable or disable the CALC 1 calculation When enabled each instru ment reading will reflect the selected calculation see FORMat DATA comma
509. then be displayed 4 Place the cursor on ADDRESSABLE and press EN TER The ADDRESSABLE GPIB menu will be dis played 5 Place the cursor on LANGUAGE and press ENTER to display the GPIB LANGUAGE selections SCPI and DDC 6 The cursor position flashing menu item indicates the present GPIB progrmming language 7 To retain the present selection press ENTER or EXIT Press EXIT three more times to return the instrument to the measurement state 8 To change the programming language place the cursor on the alternate selection and press ENTER The instru ment will then reset to the power on default conditions 3 5 QuickBASIC 4 5 programming Programming examples are written in Microsoft QuickBA SIC 4 5 using the Keithley KPC 488 2 or Capital Equip ment Corporation IEEE interface and the HP style Universal Language Driver CECHP Before any programming example can be run the Universal Language Driver must first be installed From DOS execute the following command to install the driver cechp 3 4 If you include the CECHP command in your AUTOEX EC BAT file the driver will automatically be installed every time you turn on your computer Program fragments Program fragments are used to demonstrate proper program ming syntax As the name implies only a fragment of the whole program is used in order to avoid redundancy At the beginning of each program driver files have to be opened and the input terminator shoul
510. tically selects the appropriate value as summarized in the tables When auto aperture disables the aperture re mains at the selected value APERture AUTO is coupled to the command that manually sets the aperture value APERture lt n gt When auto aperture is enabled the parameter value for APERture lt n gt changes to the au tomatically selected aperture value Thus when auto aperture is disabled the aperture remains at the automatically selected value Also a valid aperture value sent using the APERture lt n gt command disables auto aperture Auto aperture is also coupled to auto NPLC Enabling or disabling auto aperture also enables or disables auto NPLC Also a valid NPLC value sent using the NPLC command disables auto aperture 3 19 5 IEEE 488 Reference NPLCycles lt n gt SENSel1 VOLTagel DC NPLCycles lt n gt Set NPLC for Volts SENSe 1 CURRent DC NPLCycles lt n gt Set NPLC for Amps SENSe 1 RESistance NPLCycles lt n gt Set NPLC for Ohms SENSe 1 CHARge NPLCycles lt n gt Set NPLC for Coulombs Parameters lt n gt 0 01 to 10Power line cycles per integration Query Description Parameters Query Description DEFault 1 MINimum 0 01 MAXimum 10 NPLCycles Query programmed NPLC value NPLCycles DEFault Query RST default value NPLCycles MINimum Query minimum NPLC value NPLCycles MAXimum Query maximum NPLC value The integration period measurement speed for the Model 651
511. timestamps for buffer readings are provided in the 12 hour format AM or PM Also the real time clock control source for the Arm Layer must be set using the 12 hour format e 24 HOUR With this selection real time timestamps for buffer readings are provided in the 24 hour format Also the real time clock control source for the Arm Layer must be set using the 24 hour format Note that real time timestamps for bus readings are always provided in the 24 hour format regardless of the FORMAT selection 2 20 Scanning The Model 6517A can be used with an internal scanner card Oe Model 6521 or 6522 or with external scanner cards in stalled in switching mainframes such as the Models 706 7001 and 7002 A scanner allows you to switch among a number of input sig nals to the Model 6517A for measurement The channel con trol and scanning capabilities depend on whether an internal or external scanner card is being used as well as on the ca pabilities of the scanner card in question 2 20 1 Internal scanning By installing one of the optional scanner cards in the rear panel option slot the Model 6517A can close and open indi vidual channels or scan through the channels Detailed operating instructions for internal scanning are pro vided in the instruction manual for that particular scanner Front Panel Operation card For example to use the Model 6521 scanner card refer to the Model 6521 6522 Instruction Manual for operat
512. ting voltage ALTVoltage Query alternating voltage This command is used to specify the alternating voltage for the Alternating Polarity Resistance Resistivity test 3 25 19 READings lt NRf gt Parameters Query Description 3 154 TSEQuence ALTPolarity READings lt NRf gt Specify number of readings to store lt NRf gt to MAXimum Specify number of readings DEFAULT 1 MAXimum See table 2 22 MINimum 1 READings Query number of readings to store This command is used to specify the number of readings to store for the Alternating Polarity Resistance Resistivity test 3 25 20 DISCard lt NRf gt Parameters Query Description 3 25 21 SPOints lt NRf gt Parameters Query Description IEEE 488 Reference TSEQuence ALTPolarity DISCard lt NRf gt Specify number of readings to initially discard lt NRf gt 0 to 9999 Number of readings to discard DISCard Query number of discarded readings This command is used to specify the number of initial readings to discard for the Alternating Polarity Resistance Resistivity test TSEQuence CLEakage SPOints lt NRf gt TSEQuence ClResistance SPOints lt NRf gt lt NRf gt to Max Buffer Size Number of points in test sequence SPOints Query number of points This command specifies the number of measurement points for the following tests Capacitor Leakage Test Cable Insulation Resistance Test 3 25 22 SPINterval lt NRf gt TSEQuence CLEak
513. tion Input LO Inner Shield Input HI Center Conductor LO Solder Lug 5 S B v 2 4 y A S Gi To 6517A idi From Signal input HI Th To Preamp Out 3 Feedback Element A Construction Feedback Element gt gt Preamp Out HI i i gt gt To Rangin Amp and A D LO Ss p P GND sy GND Se Input xn Shielded Z S mp S e wi Fixture 237 ALG 2 7078 TRX 3 Cable Cable B Equivalent Circuits Parts List Item Description MER Part Number Shielded Fixture Female Triaxial Banana Jack Triaxial Cable Triaxial Cable Pomona 2390 Keithley 7078 TRX TBC Keithley BI 9 2 Keithley 237 ALG 2 Keithley 7078 TRX 3 W CSN Figure 2 43 Shielded fixture construction 2 11 3 External feedback procedure 3 Use the following procedure to operate the Model 6517A in the external feedback mode 1 Connect the feedback element between the PREAMP OUT terminal and the Input High terminal 2 Select the volts V function 4 Select external feedback as follows A Press CONFIG V to display the CONFIGURE DCV menu B Place the cursor on EXT FDBK and press ENTER C Place the cursor on ON and press ENTER D Use the EXIT key to back out of the menu The display will shown the voltage measured at the out put of the input preamplifier PREAMP OUT 2 55 Front Panel Operation 2 11 4 Non standard coulombs ranges In its stand
514. tion code Description The identification code includes the manufacturer model number serial number and firmware revision levels and is sent in the following format KEITHLEY INSTRUMENTS INC MODEL 6517A xxxxxxx yyyyy zzzzz where XXXXXxXx is the serial number yyyyy zzzzz is the firmware revision levels of the digital board ROM and display board ROM IEEE 488 Reference 3 11 5 OPC operation complete Set the Operation Complete bit in the Standard Event Status Description Program fragment Register after all pending commands are complete On power up or when CLS or RST is executed the Model 6517A goes into the Operation Complete Command Idle State OCIS In this state there are no pending overlapped commands There are three overlapped command used by the Model 6517A INITiate CONTinuous ON INITiate TRG When the OPC command is sent the Model 6517A exits from OCIS and enters the Operation Complete Command Active State OCAS In OCAS the instrument continuously monitors the No Operation Pending flag After the last pending overlapped command is complete No Oper ation Pending flag set to true the Operation Complete OPC bit in the Standard Event Status Register sets and the instrument goes back into OCIS Note that the instrument always goes into OCAS when OPC is executed If there are no pend ing command operations e g trigger model in idle state the Model 6517A immediately sets the OPC bit an
515. to 9999 9 sec 1 sec 3 25 11 MTIMe Query measure time SOS Weep Square wave sweep test path HLEVel lt NRf gt Specify high level voltage 1000 to 1000 1V 3 25 12 HLEVel Query high level voltage HTIMe lt NRf gt Specify high level time 0 to 9999 9 sec 1 sec 3 25 13 HTIMe Query high level time LLEVel lt NRf gt Specify low level voltage 1000 to 1000 1V 3 25 14 LLE Vel Query low level voltage LTIMe lt NRf gt Specify low level time 0 to 9999 9 sec 1 sec 3 25 15 LTIMe Query low level time COUNt lt NRf gt Specify number cycles 3 25 16 COUNt Query cycle count STS Weep Staircase sweep test path STARt lt NRf gt Specify start voltage 1000 to 1000 1V 3 25 2 STARt Query start voltage STOP lt NRf gt Specify stop votlage 1000 to 1000 10V 3 25 3 STOP Query stop voltage STEP lt NRf gt Specify step voltage 1000 to 1000 1V 3 25 4 STEP Query step voltage STIME lt NRf gt Specify step time 0 to 9999 9 sec 1 sec 3129 7 STIME Query step time 3 60 IEEE 488 Reference Table 3 17 UNIT command summary Power up Command Description defaults UNIT TEMPerature lt name gt Select temperature units C CEL F FAR K C TEMPerature Query temperature units 3 61 IEEE 488 Reference 3 13 Calculate subsystems 3 13 1 CALCulate 1 Parameters Query Description Parameters Query Description Parameters Query Descriptio
516. to a single test fixture an isolated interlock switch for each instrument is required Connecting multiple instrument interlocks to the same switch could cause the safety in terlock system to fail 2 50 2 9 5 Operate WARNING With the instrument in operate OPER ATE indicator on the displayed volt age level possibly hazardous will be applied to the output terminals of the V Source The V Source should be kept in standby until ready to safely source voltage to a load The OPER key toggles the output between standby and op erate In standby the voltage source is removed from the rear panel output terminals In operate VOLTAGE SOURCE OPERATE indicator on the voltage source is applied to the output terminals A flashing VOLTAGE SOURCE OPERATE indicator de notes that the voltage source is in current limit as explained in paragraph 2 9 3 CAUTION A relay switch in series with OUTPUT HI is opened when the voltage source is placed in standby The transition to an open output creates a potential for noise spikes The open output allows dielec tric absorption to recharge capacitors to unexpected voltage levels 2 10 Analog outputs The Model 6517A has two analog outputs on the rear panel The 2V ANALOG OUTPUT provides a scaled 0 2V output with a value of 2V corresponding to full range input The PREAMP OUT is especially useful in situations requiring buffering These two analog outputs are discussed in the fol lo
517. to make V I resistance re sistivity measurements and to force voltage measure current e Two line display Readings and front panel messages are provided on the top line primary 20 character and bottom line secondary 32 character alphanumeric dis play The multiple display provides supplemental infor mation about the reading such as min max readings bar graphs for the reading and time and date Reading and setup storage Readings and setup data can be stored and recalled from memory Over 15 000 readings can be stored in the buffer and up to 10 instru ment setups can be stored in memory Test sequences Built in tests for the following appli cations device characterization resistivity high resis tance resistivity alternating polarity method surface insulation resistance and voltage sweeps GPIB interface Accommodates two separate lan guages for IEEE 488 operation The SCPI language conforms to the IEEE 488 2 and SCPI standards The 617 emulation mode DDC language allows the instru ment to be controlled using device dependent com mand programming RS 232 interface The instrument can instead be con trolled over this serial interface using SCPI commands Talk only mode From the front panel you can set the instrument to send readings to a printer Talk only is available over both the GPIB and RS 232 interfaces Scanning The Model 6517A has an option slot that will accommodate an o
518. touch any connector or terminal insulator e If installing a test circuit that is on a pc board handle the board only by the edges Do not touch any board traces or components Cleaning tips e Use dry nitrogen gas to clean dust off of connector and terminal insulators DUT and other test circuit compo nents If you have just built the test fixture remove any solder flux using methanol along with clean foam tipped swabs or a clean soft brush Clean the areas as explained in the next tip e To clean contaminated areas use methanol and clean foam tipped swabs After cleaning a large area you may want to flush the area with methanol Blow dry the test fixture with dry nitrogen gas e After cleaning the test fixture and any other cleaned devices or test circuits should be allowed to dry in a 50 C low humidity environment for several hours 2 18 2 5 Voltage measurements The Model 6517A can make unguarded or guarded voltage measurements from IuN to 210V Guard should be used if re sponse time or leakage resistance is a consideration The con cepts of guarding are discussed in paragraphs 2 4 4 and 2 5 3 2 5 1 Basic measurement procedure The voltage measurement procedure is summarized as follows NOTE To ensure proper operation always enable zero check ZeroCheck displayed be fore changing functions V I R or Q The Z CHK key controls zero check 1 With zero check enabled ZeroCheck displayed s
519. tput values within 15 of nominal value LO HI E o 1683 Model 6517A Test Lead kit Measuring Device Example Chart recorder A Connections Rg 4 99kQ Input from gt 10kQ 1 2V Analog Output Prescaler b lt lt 1Q COM R Input Resistance of 1 MM Z measuring device Model 6517A B Equivalent Circuit Figure 2 40 Typical 2V analog output connections 2 51 Front Panel Operation 2 10 2 Preamp out The PREAMP OUT of the Model 6517A follows the signal amplitude applied to the INPUT terminal Some possible uses for the inverting PREAMP OUT include buffering of the input signal as well as for guarding in the volts mode Connections and equivalent circuits for the preamp output are shown in Figure 2 41 Full range outputs for various functions and ranges are listed in Table 2 17 Since the PREAMP OUT signal is not corrected during calibration gain error of up to 15 may appear at this output depending on function and range selection For all volts range PREAMP OUTPUT accuracy is typically 10ppm WARNING High voltage may be present between the PREAMP OUT and COMMON ter minals depending on the input signal see Table 2 17 CAUTION Connecting PREAMP OUT COM MON or 2V ANALOG OUTPUT to earth while floating input may damage the instrument 2 52 Note that the PREAMP OUT output resistance is 1Q The output resistance appears between Input Low and
520. trigger mode selected operation waits for the selected control source event to occur before making a measurement device action A measurement occurs every time the source event is detected see Control Sources The trigger mode is selected from the BASIC MODE op tion of the CONFIGURE TRIGGER menu Control Sources With the one shot trigger mode selected a measurement de vice action does not occur until the selected control source event is detected The control sources are explained as fol lows e Immediate With this control source selected event detection is immediately satisfied allowing operation to continue Using this selection is effectively the same as using the continuous trigger mode e Manual Event detection is satisfied by pressing the TRIG key Note that the Model 6517A must be taken out of remote before it will respond to the TRIG key Pressing LOCAL takes the instrument out of remote e GPIB Event detection is satisfied when a bus trigger GET or TRG is received by the Model 6517A e External Event detection is satisfied when an input trigger via the EXTERNAL TRIGGER connector is re ceived by the Model 6517A e Timer Event detection is immediately satisfied on the initial pass through the layer Each subsequent de tection is satisfied when the programmed timer interval 1 to 999999 999 seconds elapses Output Triggers After every measurement device action a trigger pulse is app
521. ts the charge measurement process simply restarts at zero For more details and the procedure to configure auto discharge see paragraph 2 8 2 Use the following basic procedure to make charge measure ments NOTE To ensure proper operation always enable zero check ZeroCheck displayed be fore changing functions V I R or Q The Z CHK key controls zero check 1 Enable zero check by pressing Z CHK 2 Select the coulombs function and select the desired manual measurement range or auto range 3 Auto discharge is configured from the Coulombs Con figuration menu Refer to paragraph 2 8 2 to check or change its configuration 4 Connect the test cable to the Model 6517A With the in put open disable zero check and enable REL to zero the instrument 5 Connect the circuit to the INPUT of the Model 6517A as shown in Figure 2 37 NOTE Do not connect the circuit to the instru ment with zero check enabled 6 Take the charge reading from the display Front Panel Operation 2 8 2 Coulombs configuration The following information explains the various configura tion options for the coulombs function The configuration menu is summarized in Table 2 13 This menu is accessed by pressing CONFIG and then Q Paragraph 2 3 5 summarizes the rules for navigating through the menu structure Note that a function does not have to be selected in order to be configured When the function is selected it will assume the progr
522. tteries could generate a few nanoamps of current be tween conductors Ionic contamination may be the result of Front Panel Operation body oils salts or solder flux The problem is further en hanced by high humidity moisture that deceases insulation resistance When building test fixtures select insulators that resist water absorption and use the fixture in a moderate humidity envi ronment Also be sure that all insulators are kept clean and free of contamination Paragraph 2 4 6 provides general cleaning tips 2 21 5 Humidity Excess humidity can reduce insulation resistance on PC boards and in test connection insulators Reduction in insu lation resistance can of course seriously affect high imped ance measurements Also humidity moisture can combine with contaminants to produce offset currents caused by elec trochemical effects see paragraph 2 21 4 To minimize the effects of moisture keep humidity to a minimum ideally lt 50 and keep components and connectors in the test sys tem clean Paragraph 2 4 6 provides general cleaning tips 2 21 6 Light Some components such as semiconductor junctions and MOS capacitors on semiconductor wafers are excellent light detectors Consequently these components must be tested in a light free environment While many test fixtures i e Kei thley test fixtures provide adequate light protection others may allow sufficient light penetration to affect the test results
523. ture Gett SEH eieiei eh i ad WO aged Transdiode logarithmic Non decade current gains Equivalent input impedance with zero check enabled Al Connections diode leakage current 16SEC i2 ccicespsascan vets NEEN SESCH Eege eene Default measurement points diode leakage current test Connections capacitor leakage 1eSb cis scsctss vscabevseesbssesdsessacvecneussiaes enre E E EEE sdeeneustesisesedvensurvecdexssvsnsel ee Connections cable insulation resistance test cccccccccesssssceececsesececceesesssesecesesssaeececesssaesescecsssseseeesesee ee Test circuit resistor voltage Coefficient est Alternating polarity resistance resistivity test 0 0 0 eee esesecseessecseceseceeceseeseceaceeeceeeeeeeeeseeseaeesaesaeeaaecaeed Connections surface insulation resistance test cccccecssssceeceesestseceeesesseececesenseaeccecesssaeseeceessaeseseeenenees Default measurement points square wave SWEEP test eee eee cee ceteeteceeeeeceeceeeceeeeeeeeeeeeeteaeeaeetaeeaeeeaeey Default measurement points staircase SWEEP tOSt le Basic trigger model Advanced trigger model Extemmal tiggerne connectors i ciccseassssusccsnssvaeescansesasessasavedaceansa eE EEE PER EEEE RRE RaR Enei Retai eab resede er External triggering and asynchronous trigger link input pulse specifications nl Meter complete and asynchronous trigger link output pulse specfteatons eee ee eeeeeeeeeeeeeeeees DUT test system Extemnall trigger
524. ty MTIMe lt NRf gt Measure time volume resistivity test TSEQuence SIResistance MTIMe lt NRf gt Measure time surface insulation resistance test TSEQuence ALTPolarity MTIMe lt NRf gt Measure time alternating polarity test lt NRf gt 0 to 9999 9 seconds Note lt NRf gt 0 5 to 9999 9 seconds for Alternating Polarity Resistance Resistivity Test MTIMe Query measure time This configuration command is used for the following tests Surface Resistivity Test Volume Resistivity Test Surface Insulation Resistance Test Alternating Polarity Resistance Resistivity Test This command is used to specify the measure time for the specified test TSEQuence SQSWeep HLEVel lt NRf gt High level voltage square wave sweep test lt NRf gt 100 0 to 100 0 Volts 100V range 1000 to 1000 Volts 1000V range HLEVel Query high level voltage This configuration command is used for the following test Square Wave Sweep Test This command is used to specify the high level voltage for the square wave sweep test TSEQuence SQSWeep HTIMe lt NRf gt High level time square wave sweep test lt NRf gt 0 to 9999 9 seconds HTIMe Query high level time This configuration command is used for the following tests Square Wave Sweep Test This command is used to specify the high level time for the square wave sweep test TSEQuence SQSWeep LLEVel lt NRf gt Low level voltage square wave sweep test lt NRf gt 100 0 to 100 0 Vo
525. u specify the target value If you key in a new target value be sure to press ENTER DEV This menu item selects the percent deviation calculation and lets you specify the reference value If you key in a new ref erence be sure to press ENTER DEVIATION This menu item selects the deviation calculation and lets you specify the reference value If you key in a new reference be sure to press ENTER RATIO This menu item selects the ratio calculation and lets you specify the reference value If you key in a new reference be sure to press ENTER LOG10 This menu item selects the logarithmic base 10 calculation When MATH is enabled the absolute value of the input read ing will be converted to its log base 10 equivalent and dis played 2 18 8 Calculate multiple display One of the multiple displays lets you view the reading on the bottom line of the display and the result of the calculation on Front Panel Operation the top line This display is available by repeatedly pressing either the NEXT or PREVious DISPLAY key to scroll through the multiple displays for the particular function The following is a typical message for a percentage calculation 7 04310e 01 V Reading 0 704310 The display resolution on the bottom line follows that chosen for the top line The value on the bottom line tracks the units and prefix of the top line For example if the top line dis plays uA then the units on the bottom line ar
526. uch filtering may have detrimental effects such as increased response time on the measurement 2 22 Relative humidity and external temper ature readings With the appropriate options connected the Model 6517A can measure relative humidity and external temperature Hu midity and external temperature readings are provided as a multiple NEXT display for each function see paragraph 2 3 4 These readings can also be included as data elements for the bus interfaces GPIB and RS 232 and for the buffer See paragraphs 2 16 Buffer and 2 19 2 Communication for details Relative humidity The Keithley Model 6517 RH option is used to measure rel ative humidity This sensor plugs into the connector label HUMIDITY on the rear panel of the Model 6517A Note that an extension cable part number CA 129 1 is supplied for the humidity sensor Humidity measurements are controlled enabled or disabled from the A D CONTROLS DATA STAMP item of the GENERAL MENU see paragraph 2 19 7 Front Panel Operation External temperature GENERAL MENU The GENERAL MENU is covered in h 2 19 7 The Keithley Model 6517 TP option is a K type thermo Mate ER i couple sensor that is used to measure external temperature This sensor plugs into the connector labeled TEMP TYPE NOIE K on the rear panel of the Model 6517A Do not allow the exposed thermocouple sensor to come in contact with chassis External temperature readings are
527. ue the Message Available MAV bit in the Status Byte Register sets A data message is cleared from the Output Queue when it is read The Output Queue is considered cleared when it is empty An empty Output Queue clears the MAV bit in the Status Byte Register A message from the Output Queue is read by addressing the Model 6517A to talk after the appropriate query is sent Error Queue The Error Queue is used to hold error mes sages and status messages When an error or status event oc curs a message that defines the error status is placed in the Error Queue This queue will hold up to 10 messages When a message is placed in the Error Queue the Error Available EAV bit in the Status Byte Register is set An er ror message is cleared from the Error Status Queue when it is read The Error Queue is considered cleared when it is empty An empty Error Queue clears the EAV bit in the Sta tus Byte Register An error message from the Error Queue is read by sending either of the following SCPI query com mands and then addressing the Model 6517A to talk SYSTem ERRor STATus QUEue Refer to paragraphs 3 20 7 STATus QUEue and 3 21 5 SYSTem ERRor for complete information on reading er ror messages IEEE 488 Reference 3 8 6 Status byte and service request SRQ Service request is controlled by two 8 bit registers the Status Byte Register and the Service Request Enable Register The structure of these registers is sho
528. uery test fixture M8009 Path to query Model 8009 test fixture RSWitch Query switch setting surface or volume USER Path to configure user test fixture RSELect lt name gt Specify measurement type SURFace or VOLume SURFace RSELect Query measurement type KSURface lt NRf gt Surface specify K 0 001 to 999 999 1 000 KSURface Query K KVOLume lt NRf gt Volume specify K 0 001 to 999 999 1 000 KVOLume Query K 3 50 Table 3 10 Continued SENSe command summary IEEE 488 Reference Default Command Description parameter SCPI Ref CHARge Path to configure Coulombs y APERture lt n gt Set integration rate in seconds 166 67e 6 to 200e 3 Note 1 y 3 19 4 AUTO lt b gt Enable or disable auto aperture OFF AUTO ONCE Enable and then disable auto aperture AUTO Query auto aperture APERture Query aperture integration rate V NPLCycles lt n gt Set integration rate line cycles 0 01 to 10 1 V 3 19 5 AUTO lt b gt Enable or disable auto NPLC OFF AUTO ONCE Enable and then disable auto NPLC AUTO Query auto line cycle integration NPL Cycles Query line cycle integration rate y RANGe Path to configure measurement range V 3 19 6 UPPer lt n gt Select range 0 to 2 1e 6 2e 6 y UPPer Query range V AUTO lt b gt Enable or disable auto range ON V AUTO ONCE Set range based on present input signal V LGRoup lt name gt Specify HIGH or LOW aut
529. ugh to corrupt low current measurements The input bias current for the Model 6517A is listed in the specifications Input bias current may be reduced by per forming the offset adjustment procedure explained in para graph 2 19 3 OFFSET ADJ VOLTAGE BURDEN The input resistance of the ammeter causes a small voltage drop across the input terminals This voltage is known as the voltage burden If the voltage burden is large in relation to the voltage of the measured circuit then significant measure ment errors will occur Refer to Figure 2 27 to see how voltage burden affects cur rent measurements Assume Vg is 5mV and Rg is 5kQ to configure a 1A current source SmV 5kQ 1uA An ideal ammeter with zero voltage burden would measure the cur rent source as follows Es 5mV M R T ka T mA In practice however every ammeter has a voltage burden If the voltage burden Vp is ImN the current will be measured as follows L SS _ 5mV 1mV M Rs 5kQ 0 8mA The ImV voltage burden caused a 20 measurement error Percent error in a measured reading I due to voltage bur den can be calculated as follows 100 I error e M Vs Vp The voltage burden of the Model 6517A depends on the se lected range see specifications Voltage burden may be re duced by performing the offset adjustment procedure explained in paragraph 2 19 3 OFFSET ADJ Source Meter Vs save Voltage Burden Figure 2 27
530. uitry needed Each output channel contains a fly back diode for protection when switching inductive loads such as a low power solenoid or relay coils To use these fly back diodes connect the exter nal supply voltage to pin 3 of J1015 the digital I O port Make sure the external supply voltage is between 5V and 30V and the current required by the device does not exceed 100mA CAUTION Do not apply more than 100mA maxi mum current or exceed 30V maximum voltage on pin 3 of J1015 the digital I O port Applying current or voltage ex ceeding these limits may damage the in strument 10Q Mk Pin 3 External Voltage Flyback connection 5V to 30V 5V 10kQ lt Pin 6 Digital Output 1 Pin 7 Digital Output 2 Pin 5 Digital Output 3 Pin 4 Digital Output 4 lt Pin 8 Digital Ground ER 0 DIGITAL OUT Connector J1015 2 121 Front Panel Operation An externally powered relay connected to the digital output port is shown in Figure 2 81 Other externally powered de vices can be similarly connected by replacing the relay with the device When using the Model 6517A s collector outputs to turn on externally powered devices set the corresponding digital output line parameters as follows set through the GENERAL DIGITAL I O menus STATE ON LOGIC SENSE ACTIVE LOW In the low state OV the output transistor sinks current through the external device In the high state the output tran sist
531. ull AUTO lt b gt TRACe POINts AUTO lt b gt Control auto buffer sizing lt b gt 0 or OFF Disable auto buffer sizing 1 or ON Enable auto buffer sizing AUTO Query state of auto buffer sizing This command is used to enable or disable auto buffer sizing When enabled the buffer size de faults to the measure count value in the Trigger Model see TRIGger COUNt in Trigger sub system With auto buffer enabled changing the Trigger Model s measure count value changes the buffer size to that value If the TRIGger COUNt is greater than the maximum buffer size the buffer is adjusted to the maximum size and the following message is displayed 314 Buffer sizing error sized to MAX Disabling auto buffer sizing does not affect the size of the buffer It simply means that you must then use the POINts command to change the buffer size If you use the POINts command to change the buffer size while auto is enabled the buffer size changes to that value and auto buffer sizing disables If you try to enable auto buffer sizing while the measure count is programmed for infinite an error will occur and the command will be ignored You cannot have an infinite buffer size ACTual TRACe POINts ACTual Query number of readings in buffer This query command returns the number of readings that are currently stored in the buffer After sending this command the number of readings stored in the buffer will be sent to the computer when the
532. ument exist only after it has been addressed to listen SR Service Request Function SR1 defines the ability of the instrument to request service from the controller RL Remote Local Function RL1 defines the ability of the instrument to be placed in the remote or local modes PP Parallel Poll Function The instrument does not have parallel polling capabilities PPO DC Device Clear Function DC1 defines the ability of the instrument to be cleared initialized DT Device Trigger Function DTI defines the ability of the Model 6517 to have readings triggered C Controller Function The instrument does not have controller capabilities CO TE Extended Talker Function The instrument does not have extended talker capabilities TEO LE Extended Listener Function The instrument does not have extended listener capabilities LEO E Bus Driver Type The instrument has open collector bus drivers E1 ASCII Character Codes and IEEE 488 Multiline Interface Command Messages TEEE 488 TEEE 488 Decimal Hexadecimal ASCII Messages Decimal Hexadecimal ASCII Messages 0 00 NUL 16 10 DLE 1 01 SOH GTL 17 11 DC LLO 2 02 STX 18 12 DC2 3 03 ETX 19 13 DC3 4 04 EOT SDC 20 14 DC4 DCL 5 05 ENQ PPC 21 15 NAK PPU 6 06 ACK 22 16 SYN 7 07 BEL 23 17 ETB 8 08 BS GET 24 18 CAN SPE 9 09 HT TCT 25 19 EM SPD 10 0A LF 26 1A SUB 11 0B VT 27 1B ESC 12 OC FF 28 1C FS 13 OD CR 29
533. until the pointer for the Trigger Model has finished moving in response to TRG and has settled at its next state PRINT 1 output 27 syst pres Select defaults PRINT 1 output 27 init cont off abort Place 6517A in idle PRINT 1 output 27 arm coun 1 Program for 30 measurements and then stop idle PRINT 1 outpu PRINT 1 outpu 27 arm lay2 coun 1 27 trig coun 30 sour tim Ch Et EI PRINT 1 output 27 init wai IT Start measurements and send wal PRINT 1 output 27 data Query a reading PRINT 1 enter 27 IT Get reading after 6517A goes into idle INE INPUT 2 a Read the reading PRINT a Display the reading 3 37 IEEE 488 Reference 3 12 Signal oriented measurement commands The signal oriented command group is used to acquire readings using a set of high level instructions to control the measurement process These commands are summarized in Table 3 3 Table 3 3 Signal oriented measurement command summary Command Description FETCh READ CONFigure lt function gt Places the 6517A in a one shot measurement mode for the specified function MEASure lt function gt Performs an ABORt CONFigure lt function gt and a READ Requests the latest reading Performs an ABORt INITiate and a FETCh Description Query Description FETCh This query command is us
534. ure Current FVMI configura tion as shown in Figure 2 9 This configuration is used for re sistance measurements see paragraph 2 4 2 and current measurements For these measurements V Source LO and ammeter input LO can be connected internally via the METER CONNECT option of the CONFIGURE V SOURCE menu see paragraph 2 9 1 WARNING The maximum common mode voltage the voltage between voltage source low and chassis ground is 750V peak Ex ceeding this value may create a shock hazard LO HI V Source Out R A Basic connections V Source LO HI R B Equivalent Circuit Figure 2 10 V source output Front Panel Operation V source probes and cables The following probe and cable sets are available from Kei thley as options e Model 8606 High Performance Probe Tip Kit Con sists of two spade lugs two alligator clips and two spring hook test probes The spade lugs and alligator clips are rated at 30V RMS 42 4V peak the test probes are rated at 1000V These components are designed to be used with high performance test leads terminated with banana plugs such as the Model 8607 Perfor mance Banana Cables Model 8607 High Perofrmance Banana Cables Con sists of two high voltage 1000V banana cables The cables are terminated with banana plugs that have re tractable sheaths 2 4 4 Low noise cables shielding and guarding When making precision measurements you should always use low noise cab
535. ure Source When this NEXT display is selected the amps measurement and V Source value are shown on the secondary display The resistance measurement is shown on the primary display 2 7 5 Ohms measurement considerations Some considerations for making accurate resistance and re sistivity measurements are summarized in the following paragraphs High resistance measurements abvove 1MQ may exhibit problematic background currents see paragraph 2 21 and can be improved by using the Alternating Polarity Test Sequence see paragraph 2 14 Additional measure ment considerations are summarized in paragraph 2 21 For comprehensive information on precision measurements re fer to the Low Level Measurements handbook which is available from Keithley LEAKAGE RESISTANCE Even though the FVMI method for resistance measurements minimizes the effects of leakage resistance there some cases where leakage can affect the measurement For example test fixture leakage paths may appear in parallel with the device being measured introducing errors in the measurement These errors can be minimized by using proper insulating materials such as Teflon in test fixture terminals and keep ing them clean and moisture free Leakage currents in the test fixture can be cancelled by per forming a REL on the current component of the measure ment see Cancelling Test Fixture Leakage Current in paragraph 2 7 1 VOLTAGE COEFFICIENT The measured value of a
536. us will prompt you to type in a file name After typing in the file name press the Enter key The command file will be sent to the Model 6517A 3 28 DDC programming language The Model 6517A can be controlled over the GPIB interface using Device Dependent Command DDC programming The DDC programming language is selected from the COMMU NICATION item of the MAIN MENU see paragraph 3 4 Appendix G lists and summarizes the DDC commands For detailed information on Device Dependent Command pro gramming refer to the Model 617 instruction manual When 617 DDC mode is selected the 6517A will power up with digital filters for all functions disabled and all NPLCs set to 10 This allows the Model 6517A to accurately mimic the Model 617 s operation A Specifications A 2 Specifications VOLTS ACCURACY TEMPERATURE 1 Year COEFFICIENT 5 DIGIT 18 28 C 0 18 C amp 28 50 C RANGE RESOLUTION rdg counts rdg counts C 2V 10 pV 0 025 4 0 003 2 20 V 100 uV 0 025 3 0 002 1 200 V 1mV 0 06 3 0 002 1 1 When properly zeroed 5 digit 1 PLC power line cycle median filter on digital filter 10 readings NMRR 60dB on 2V 20V gt 55dB on 200V at 50Hz or 60Hz 0 1 CMRR gt 120dB at DC 50Hz or 60Hz INPUT IMPEDANCE gt 200TQ in parallel with 20pE lt 2pF guarded 10MQ with zero check on SMALL SIGNAL BANDWIDTH AT PREAMP OUTPUT Typically 100kHz 3dB AMPS ACCURACY TEMPERATURE 1 Year
537. use the asynchronous Trigger Link mode and therefore do not have to be selected DIRection lt name gt ARM SEQuence 1 LAYer 1 TCONfigure DIRection lt name gt Control Arm Source Bypass ARM SEQuence 1 LAYer2 TCONfigure DIRection lt name gt Control Scan Source Bypass STRIGger SEQuence 1 TCONfigure DIRection lt name gt Control Measure Source Bypass lt name gt SOURce Enable Source Bypass ACCeptor Disable Source Bypass DIRection Query Source Bypass state When a source bypass is enabled and the External or Trigger Link control source is selected operation loops around the appropriate control source on the initial pass through that layer Note that the source bypass for the scan and measure layers also loops around the delay If programmed for another pass through the specified layer count gt 1 the bypass loop is not in effect even though it is still enabled The bypass loop will be in effect if operation first goes back into the previous layer or idle Enabling the Source Bypass for the arm and scan layers also enables their output triggers When operation leaves the arm or scan layer the appropriate output trigger pulse occurs If the Trigger Link TLINk control source is selected the output trigger is available on the programmed Trig 3 145 IEEE 488 Reference 3 146 Parameters Query Description Parameters Query Description ger Link output line For all other control source select
538. vent Arm Event Register Sequence 1 Sets B1 when in an arm layer Bit Position B15 B2 B1 BO Event Seq1 Decimal Weighting Value Value 21 0 1 A Positive Transition PTR Register Bit Position Event Decimal Weighting Value Value Enable Positive Transition 0 Disable Positive Transition B15 B2 B1 BO Seq1 21 0 1 1 Enable Negative Transition B Negative Transition NTR Register Figure 3 38 Arm Transition Filter 0 Disable Negative Transition IEEE 488 Reference Effects of positive transitions on the Sequence Event Register Positive transition effect on Sequence Event Register Sequence event Layer 1 Sets B1 when in Arm Layer 1 Layer 2 Sets B2 when in Arm Layer 2 Bit Position B15 B3 B2 B1 BO Event Lay2 Lay1 Decimal Weighting 4 2 22 21 Value 0 1 of Value 1 Enable Positive Transition 0 Disable Positive Transition A Positive Transition PTR Register Bit Position Event Decimal Weighting Value B15 B3 B2 B1 BO eg Lay2 Lay1 4 2 22 21 DI 1 Value 1 Enable Negative Transition 0 Disable Negative Transition B Negative Transition NTR Register Figure 3 39 Sequence Transition Filter 3 123 IEEE 488 Reference 3 21 4 3 124 NTRansiti
539. vent Register Questionable Event Register This command also forces the instrument into the operation complete command idle state and operation complete query idle state 3 27 IEEE 488 Reference 3 11 2 3 28 ESE lt NRf gt event enable Program the Standard Event Enable Register ESE event enable query Read the Standard Event Enable Register Parameters Description lt NRf gt 0 Clear register 1 Set OPC BO 4 Set QYE B2 8 Set DDE B3 16 Set EXE B4 32 Set CME B5 64 Set URQ B6 128 Set PON B7 255 Set all bits The ESE command is used to program the Standard Event Enable Register This command is sent with the decimal equivalent of the binary value that determines the desired state 0 or 1 of the bits in the register This register is cleared on power up This register is used as a mask for the Standard Event Status Register When a standard event is masked the occurrence of that event will not set the Event Summary Bit ESB in the Status Byte Register Conversely when a standard event is unmasked enabled the occurrence of that event sets the ESB bit For information on the Standard Event Status Register and descriptions of the standard event bits see paragraph 3 11 3 The Status Byte Register is described in para graph 3 8 6 A cleared bit 0 in the enable register prevents masks the ESB bit in the Status Byte Register from setting when the corresponding standard event occurs A set bit 1
540. vity measurement technique Notes 1 Refer to Figure 2 34 to determine dimensions D1 and g 2 An effective area of coefficient B of 0 is typically used for volume resistivity 2 37 Front Panel Operation General measurement procedure The following steps summarize the basic steps to measure re sistivity NOTE To ensure proper operation always enable zero check ZeroCheck displayed be fore changing functions V I R or Q The Z CHK key controls zero check WARNING Make sure the V Source is in standby In standby the OPERATE indicator is off The OPER key toggles the V Source be tween standby and operate Enable zero check by pressing Z CHK Select and configure the desired resistivity measurement type from the MEAS TYPE RESISTIVITY option of the ohms configuration menu as explained in paragraph 2 7 3 Select the V Source adjustment mode With AUTO V Source selected the instrument will automatically select the optimum V Source value 40V or 400V for the mea surement range With MANUAL V Source selected you select the V Source range and value The V Source ad justment mode is selected from the V SOURCE item of the CONFIGURE OHMS menu See paragraphs 2 7 Auto V Source and 2 7 3 V SOURCE for details Connect the sample to be measured to the Model 6517A Figure 2 36 shows the connections to the Model 8009 for surface and volume resistivity measurements Select the ohms function by pre
541. when a limit test failure occurs The first failure in the test sequence determines the digital output pat tern Subsequent failures in the test sequence will not change the digital output pattern on the output port Each output line is assigned a decimal weight as follows Digital Output Decimal Weight Line 1 Line 2 Line 3 Line 4 GO E H ra 3 67 IEEE 488 Reference 3 68 Parameters Query Description Description The parameter value for the digital pattern is determined by adding the decimal weights of the desired output lines For example if you want output lines 2 and 3 to go true when the upper limit of LIMIT 1 is the first failure in the test sequence use a parameter value of 6 2 4 The actual true state high or low of each Digital Output line depends on its programmed po larity Polarity is programmed from the OUTPut subsystem see paragraph 3 17 Note that when the binning strobe is enabled see BSTRobe command path output line 4 is not considered to be part of the digital output pattern The binning strobe uses line 4 With the binning strobe enabled parameters 8 through 15 are treated the same as parameters 0 through 7 STATe lt b gt CALCulate3 LIMit 1 STATe lt b gt Control LIMIT 1 test CALCulate3 LIMit2 STATe lt b gt Control LIMIT 2 test lt b gt 1 or ON Enable specified limit test 0 or OFF Disable specified limit test STATe Query state of specified limit test These
542. wing paragraphs WARNING When floating input Low above 30V RMS from earth ground hazardous voltage will be present at the analog out puts Hazardous voltage may also be present when the input voltage exceeds 30V RMS in the volts function or when input currents exceed 30pA in the amps function CAUTION Connecting PREAMP OUT COM MON or 2V ANALOG OUTPUT to earth while floating the input may dam age the instrument 2 10 1 2V analog output The 2V ANALOG OUTPUT provides a scaled 0 2V output that is non inverting in the volts mode Connections for using Front Panel Operation Table 2 16 Typical 2V analog output values this output are shown in Figure 2 40 For a full range input Nominal 2V analog the output will be 2V typical examples are listed in Table 2 Range Applied signal output value 16 The 2V ANALOG OUTPUT signal is not corrected dur 20pA 10 4pA 1 04V ing calibration Gain errors of up to 15 may appear at this 2uA 1 65uA 1 65V output depending on function and range selection 200mV 140mV 1 4V 200V 35V 0 35V Note that the output impedance is 10kQ to minimize the ef 200kQ 175k 1 75V fects of loading the input impedance of the device connected 20GQ 9 5GQ 0 95V to the 2V ANALOG OUTPUT should be as high as possible 200pC 125pC 1 25V For example with a device with an input impedance of 20nC 19nC 1 9V 10MQ the error due to loading will be approximately 0 1 Ou
543. wn in Figure 3 13 Status Byte Register The summary messages from the status registers and queues are used to set or clear the appro priate bits BO B2 B3 B4 B5 and B7 of the Status Byte Register These bits do not latch and their states 0 or 1 are solely dependent on the summary messages 0 or 1 For ex ample if the Standard Event Status Register is read its reg ister will clear As a result its summary message will reset to 0 which in turn will clear the ESB bit in the Status Byte Reg ister Bit B6 in the Status Byte Register is either e The Master Summary Status MSS bit sent in re sponse to the STB command indicates the status of any set bits with corresponding enable bits set e The Request for Service RQS bit sent in response to a serial poll indicates which device was requesting ser vice by pulling on the SRQ line For description of the other bits in the Status Byte Register refer to paragraph 3 11 12 The IEEE 488 2 standard uses the following common query command to read the Status Byte Register STB When reading the Status Byte Register using the STB command bit B6 is called the MSS bit None of the bits in the Status Byte Register are cleared when using the STB command to read it The IEEE 488 1 standard has a serial poll sequence that also reads the Status Byte Register and is better suited to detect a service request SRQ When using the serial poll bit B6 is called the RQS
544. x input connector When dis abled input LO is placed on the inner shell of the triax connector For detailed information on guard see paragraphs 2 4 4 and 2 5 3 Guarding 3 101 IEEE 488 Reference 3 19 14 ADIScharge Commands Parameters Query Description Parameters Query Description 3 19 15 XFEedback lt b gt Parameters Query Description Auto discharge is used to reset the charge reading to zero See paragraph 2 8 for more informa tion STATe lt b gt SENSe 1 CHARge ADIScharge STATe lt b gt Control auto discharge lt b gt 1orON Enable auto discharge 0 or OFF Disable auto discharge STATe Query state of auto discharge This command is used to enable or disable the auto discharge feature for the Coulombs function When enabled the charge measurement will reset to zero when the specified level is reached see next command LEVel lt NRf gt SENSe 1 CHARge ADIScharge LEVel lt NRf gt Specify level lt NRf gt 2 2e6 to 2 2e6 Specify discharge level LEVel Query level for auto discharge This command is used to specify the coulombs level for auto discharge Charge will reset when the charge reading reaches the specified level SENSe 1 VOLTage DC XFEedback lt b gt lt b gt ONorl Enable external feedback OFF or 0 Disable external feedback XFEedback Query state of external feedback This command is used to enable or disable external feedback S
545. y connected to V Source LO See Paragraph 2 9 1 A Connections lege l I PC Board Test Pattern l l l l l l l l l l l I l l l l l l l l euer HI HI 6517A 6517A V Source e Picommeter LO LO B Equivalent Circuit Figure 2 53 Connections surface insulation resistance test voltage MEAS V is then applied and after a specified time MEAS TIMB the Model 6517A measures the resistance and stores the reading in the buffer This test is selected and configured from the CONFIGURE SEQUENCE menu SIR See paragraph 2 14 2 for details Sweep Tests Square Wave and Staircase The sweep tests are not geared to any specific application These voltage measure sweeps can be used for any type of measure ment volts amps ohms or coulombs Thus make sure to select the measurement function before running one of these tests The Square Wave Sweep Test allows you to make a series of measurements at an alternating high and low voltage level When the test is configured you specify the high voltage lev el HI LEVEL the time spent at the high level HI TIME the low level voltage LO LEVEL the time spent at the low level LO TIME and the number of cycles to repeat CY 2 66 CLE COUNT Figure 2 54 shows an example using the de fault test parameters When the test is run 20 measurements will be performed at each high and low level and stored in the buffer This test is selected and configured f
546. y 1 0 to 99999 9 sec 1 sec 3 25 5 MDELay 1 Query measure delay SVOLtage2 lt NRf gt Specify source voltage 2 1000 to 1000 2V 3 25 6 SVOLtage2 Query source voltage MDELay2 lt NRf gt Specify measure delay 2 0 to 99999 9 sec lsec 3 25 5 MDELay2 Query measure delay SRESistivity Surface resistivity test path PDTime lt NRf gt Specify pre discharge time 0 to 9999 9 sec 0 2 sec 3 25 9 PDTime Query pre discharge time SVOLtage lt NRf gt Specify bias voltage 1000 to 1000 500V 3 25 6 SVOLtage Query bias voltage STIME lt NRf gt Specify bias time 0 to 99999 9 sec 1 sec 3 25 7 STIME Query bias time MVOLtage lt NRf gt Specify measure votlage 1000 to 1000 500V 3 25 10 MVOLtage Query measure voltage MTIMe lt NRf gt Specify measure time 0 to 9999 9 sec 1 sec 3 25 11 MTIMe Query measure time DTIMe lt NRf gt Specify discharge time 0 to 99999 9 sec 2 sec 3 25 8 DTIMe Query discharge time VRESistivity Volume resistivity test path PDTime lt NRf gt Specify pre discharge time 0 to 99999 9 sec 10 sec 3 25 9 PDTime Query pre discharge time SVOLtage lt NRf gt Specify bias voltage 1000 to 1000 500V 3 25 6 SVOLtage Query bias voltage 3 59 IEEE 488 Reference Table 3 16 Continued TSEQuence command summary Default Command Description parameter SCPI Ref TSEQuence VRESistivity STIME lt NRf gt Specify bias time 0 to 9
547. y P N 6517 905 00 1 8 Options and accessories The following options and accessories are available from Keithley for use with the Model 6517A Model 237 ALG 2 Triax Cable This is a 2 meter 6 6 ft low noise triax cable terminated with a 3 slot male triax con nector on one end and 3 alligator clips on the other Model 237 BNC TRX Adapter This is a male BNC to 3 lug female triax adapter guard disconnected It is used to terminate a triax cable with a BNC plug Suitable for use with the Model 6517A V Source in high voltage applications Model 237 TRX T Adapter This is a 3 slot male to dual 3 lug female triax tee adapter for use with 7078 TRX triax ca bles Suitable for use with the Model 6517A V Source in high voltage applications Model 7078 TRX BNC Adapter This is a 3 slot male triax to female BNC adapter This adapter lets you connect a BNC cable to the triax input of the Model 6517A Suitable for use with the Model 6517A in high voltage applications Model 237 TRX TBC Connector This is a 3 lug female triax bulkhead connector with cap for assembly of custom panels and interface connections Suitable for use with the Model 6517A V Source in high voltage applications Model 1050 Padded Carrying Case A carrying case for a Model 6517A Includes handles and shoulder strap Model 4288 1 Single Fixed Rack Mount Kit Mounts a sin gle Model 6517A in a standard 19 inch rack Model 4288 2 Side by side Rack Mount Kit Mounts

Model 6517A Electrometer User`s Manual

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