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1. e A picklist will drop down It shows all of the inclusion types that the currently chosen standard contains A check marks the currently chosen inclusion type An example of what the picklist can look like Depending on the standard that has been chosen the picklist can contain other entries 4 Select the new type of inclusion you want e The new inclusion type will be assigned In the image the inclusion will now be displayed with a surrounding line in another color 5 If you want to you can change the type of further inclusions 6 Click your right mouse button to leave the edit mode and to accept the changes e The results will be updated 00739 118 Performing a materials science analysis Throwing Power 7 8 Throwing Power What is a throwing power measurement Use the Throwing Power solution to determine the quality of the copper plating on an HDI panel You can measure through holes microvias and filled microvias The Throwing Power solution is completely integrated into the Materials Solutions tool window The tool window works in a similar way to a software wizard As soon as you ve started an analysis process you ll be guided step by step through the measurement Before you start a throwing power measurement The following conditions must be met before you start a throwing power measurement 1 Prepare suitable cross sections through the panels To measure a through hole you will also
2. 141 Performing a materials science analysis Phase analysis Please note that the defined ROI will not be considered in this step in the analysis but only in the next step In this step in the analysis pixels which are outside of the ROI will thus also be shown in color 1 If necessary reduce or increase the intensity range of the first automatically created phase Make sure that the first phase covers the dark pixels You can only define the phase for the bright pixels in the next step In the image watch how the object areas found become larger and more objects are found e To reduce or increase the intensity range in the tool window s table change the values in the Min and Max fields Alternatively interactively change the lower and upper threshold values in the histogram shown at the bottom of the tool window Move the mouse pointer over the edge of the phase until the pointer changes and with the left mouse button pressed drag the edge in the required direction 2 Now define the second phase To do so click the Add Phase xe button and click the New Threshold d button Now click so long in the bright areas within the ROI until they are shown in the color of the phase 3 If necessary change the two phases which have already been defined To do that select the phase which you want to change in the table in the tool window 200 4 Click the Next button e The Materials Solutions tool window will d
3. Click the eye icon in front of the measurement layer to hide the measurements Click an empty cell without an eye icon to make the corresponding layer reappear Editing measurements You can edit existing measurement objects at any time To do so click the Select Measurement Objects iF button You can find the button either in the Measurement and RO tool window or on the toolbar Note When you load an image file with measurement objects it is only possible to edit the measurement objects if the image file has been saved in the TIF or VSI image file format You can move a measurement object while keeping the left mouse button depressed You can also change the size of a measurement object Move the pointer onto a marker By dragging the marker with the mouse button depressed you can adjust the frame s size as wished Click the Del key on your keyboard in order to delete the selected measurement object The measurement values in the Measurement and ROI tool window will be correspondingly updated You can at any time change the color font and line thickness of individual measurement objects Select one or more measurement objects in an image and click your right mouse button to open a context menu In the context menu you ll find several commands with which you can change the appearance of the selected measurement objects From the context menu select e g the Change Color command Select the color you would like fro
4. charts Even if you haven t purchased an industry standard yet you can still view the Chart Comparison analysis process To do this install a demo plate You can carry these step by step instructions out with the Demo single grain size demo plate An instruction on how to install demo plates can be found in the online help Note Real analyses complying with industry standards are however not possible using these demo plates Example image FerriteGrains tif When your software was installed several example images have been copied automatically You can follow these step by step instructions when you use the example image FerriteGrains tif Open this image and make sure that it has been selected in the document group You can find the information where the example images are located in the online help 1 Activate the Materials Solutions tool window Should this tool window not be visible use the View gt Tool Windows gt Materials Solutions command to have it displayed 2 Click the Chart Comparison button e Assoon as you ve started this analysis process you ll be guided step by step through the measurement A lot of your software s other functions will not be available while an analysis process is running e The Materials Solutions tool window displays the Image Source step 3 Inthe mage source group choose the Selected images option to analyze the example image This image must have been opened for this purpose and ha
5. User Manual OLYMPUS Stream IMAGE ANALYSIS SOFTWARE Any copyrights relating to this manual shall belong to Olympus Soft Imaging Solutions GmbH We at Olympus Soft Imaging Solutions GmbH have tried to make the information contained in this manual as accurate and reliable as possible Nevertheless Olympus Soft Imaging Solutions GmbH disclaims any warranty of any kind whether expressed or implied as to any matter whatsoever relating to this manual including without limitation the merchantability or fitness for any particular purpose Olympus Soft Imaging Solutions GmbH will from time to time revise the software described in this manual and reserves the right to make such changes without obligation to notify the purchaser In no event shall Olympus Soft Imaging Solutions GmbH be liable for any indirect special incidental or consequential damages arising out of purchase or use of this manual or the information contained herein No part of this document may be reproduced or transmitted in any form or by any means electronic or mechanical for any purpose without the prior written permission of Olympus Soft Imaging Solutions GmbH Adobe and Acrobat are trademarks of Adobe Systems Incorporated and be registered in various countries Olympus Soft Imaging Solutions GmbH All rights reserved Version 510 UMA _OlyStream19 Krishna_en_03_ O09July2013 Olympus Soft Imaging Solutions GmbH Johann Krane Weg 39 D 48149 Munster Phone 4
6. With a particle distribution measurement the software counts how many particles are in an image and classifies them for example according to their size or their form lt is a precondition that the particles can be detected by the software Therefore the particles must differ from the rest of the sample for example because they are darker or lighter In this case you can define a phase with an intensity range that covers the intensity values of all of the particles If the particles that you want to measure largely have the same intensity values then one phase is enough If you want to measure light and dark particles you will need a second phase All detected particles are measured according to a measurement parameter that you selected for example Area The results can be classified automatically For this you define a classification with up to 16 classes For some samples a coarse Classification with only 2 classes is sufficient whereas other samples require a more detailed classification with 10 classes for example ere Me 201 00 5 00 Class 1 Class 2 Class 3 Example of a particle distribution measurement In the image the particles have been detected and measured according to the Area measurement parameter The results are shown according to the defined classification In the example shown the particles were assigned to three size classes The diagram shows how many particles each size class has Class 1 Class
7. 1 Inserting a document that is currently open in your image analysis program into a MS Word or MS PowerPoint document 2 Inserting a document that is saved locally or is in your image analysis program s database into a MS Word or MS PowerPoint document 3 Inserting a field that contains information that is saved in your image analysis program into your MS Word or MS PowerPoint document This makes sense for example when you want to see the acquisition date of a certain image 4 You add one or more detail zooms to an image 5 You change the image properties and set for example whether or not the info stamp and the scale bar should be shown 6 You change the resolution of one or all images of the report If you want to share the report it may be sensible to reduce the resolution thereby also reducing the file size 7 You update all placeholders in your report This makes sense for example when you ve made changes to the documents in your image analysis program that the report doesn t contain yet 8 Inserting an MS Word or MS Excel document into the software s database This command is only available if your software supports the database functionality 9 Defining templates that you want to use for your work with reports With MS Word reports you define page templates in the DOC or DOCX file format With MS PowerPoint reports you define slide templates in the PPT or PPTX file format Selecting images in grouped o
8. 1 Inthe Measurement and ROI tool window click the Measurement and ROI Options button 2 Select the Measurement and ROI gt Results entry in the tree view 3 Clear the Show measurement objects Only of the active image check box Close the dialog box with OK e Now the results for both images will be shown simultaneously in the tool window 1 Inthe Measurement and ROI tool window click the Measurement and ROI Options button 2 Select the Measurement and ROI gt Results entry in the tree view e Inthe Statistic group you ll find various statistical parameters 3 Select the Mean check box Close the dialog box with OK 54 Measuring images Measuring images e Now in the Measurement and RO tool window under the measurement results the chosen statistical parameter 1 will by shown You can see there the mean value of the layer thickness for all of the measured images proe learasa O9VOOPKBGA Pal 257 78 i a 317 72 um ee 228 88 ym Measuring heights Task To be able to make height measurements you need to have a height map A height map is a gray value image whose gray values contain height information The multi dimensional image Clockwork is a Z stack Use the EFI algorithm to calculate the height map Measure the height difference between the brass colored gear wheel in the middle image segment and the silver colored gear wheel on the right hand side of the image 1 Load the Clockwork tif
9. 3 Click the Finish button e Through the materials analysis measurement the image has collected one or more additional layers can be seen in the Layers tool window If required save the image in TIF or VSI format to retain these newly created image layers 10605 04062012 137 Performing a materials science analysis Phase analysis 7 10 Phase analysis What is a phase analysis With a phase analysis you measure the percentage share by area of the phases in your samples A phase is a number of pixels which lie within a defined intensity range The intensity value range is limited by a top and a bottom intensity value These are the so called threshold values lt is a precondition for the phase analysis that the phases differ from the rest of the sample e g because they are darker or lighter You can define one or more phases If the parts of the sample objects whose percentage area you would like to measure largely have the same intensity values then one phase is enough If the objects have very different intensity values then several phases will have to be set up With a phase analysis you can define phases and measure the percentage area covered by this phase To the left you can see an example for a phase analysis with two phases light and dark In the right example a third phase was created for the same sample which covers the pixels lying between the dark and the light phase The resu
10. Chart comparison if the image that is to be checked is to be superimposed by the reference image The illustration on the left shows the image that is to be checked Because the slide control is located in near the Opaque position the reference image s structures can only be faintly recognized For the illustration on the right the slide control has been moved towards the Transparent position Now the reference image can be clearly recognized and the image that is to be checked can be only faintly recognized 3 If you want to choose another reference image in the Comparison group click that image with your left mouse button 4 When the reference image that is the most similar to the image that is to be checked has been chosen Click the Accept button e The chosen image s data will be accepted in the Results field e It s possible to accept several reference images for example with samples that have very different structures 5 Click the Next button e The Materials Solutions tool window will display the next step Note When you carry out analyses on the live image Click the Get Results button You will then see the Results step Otherwise when you ve finished analyzing one live image the next live image will always then automatically be offered for analysis 1 Select the Generate Workbook check box to have a document of the workbook type automatically created at the end of the analysis 2 Click the Finish bu
11. If you want to correct the automatically found particles use the buttons in the Validation group You will find step by step instructions on how to correct particles here 4 Click the Next button 1 Take a look at the results that are shown in the table Among other things the number of particles is shown here 2 Select the Generate Report check box if you would like to have a report automatically generated in MS Word once the analysis is completed 3 Select the Generate Workbook check box to have a document of the workbook type automatically created at the end of the analysis e Leave the Create chart check box cleared for these step by step instructions 4 Click the Save sample results button if you want to also determine the ferrite pearlite ratio in another cast iron analysis on the basis of the etched sample You can then load the graphite fraction determined here and won t need to enter it manually 5 Click the Next button Define the report that contains the measurement results e The Materials Solutions tool window switches back to the start position You can now use all of your software s functions again e Through the materials analysis measurement the image has collected one or more additional layers can be seen in the Layers tool window If 109 Image source step i Settings step Performing a materials science analysis Cast Iron Analysis required save the image in TIF or VSI forma
12. Only when you have done this will you have made the preparations that are necessary to ensure that you will be able to acquire high quality images that are correctly calibrated When you work with a motorized microscope you will also need to configure the existing hardware to enable the program to control the motorized parts of your microscope Process flow of the configuration To set up your software the following steps will be necessary Specifying which hardware is available Vv Configuring the interfaces hA Configuring the specified hardware Calibrating the system Your software has to know which hardware components your microscope is equipped with Only these hardware components can be configured and subsequently controlled by the software In the Acquire gt Devices gt Device List dialog box you select the hardware components that are available on your microscope You can find more information on this dialog box in the online help Use the Acquire gt Devices gt Interfaces command to configure the interfaces between your microscope or other motorized components and the PC on which your software runs You can find more information on this dialog box in the online help Usually various different devices such as a camera a microscope and or a stage will belong to your system Use the Acquire gt Devices gt Device Settings dialog box to configure the connected devices so that they can be correctly ac
13. The options in the Inspection Mode group are only relevant for scan areas not for XY positions Select the Single frame inspection option Now all of the images from a scan area will be individually analyzed with the selected materials science method Select the MIA image inspection option Now all of the images acquired from a scan area will be assembled directly as they are acquired like a puzzle into a stitched image to be analyzed with the selected materials science method In MIA inspection mode the individual images are acquired with a certain overlap area Your software will then use pattern recognition to look for two images with the same image information in the overlap area You determine the size of the overlap area in the Acquisition Settings gt Acquisition gt Automatic MIA dialog box You can open this dialog box for example via the Process Manager tool window In the tool window s toolbar click the Acquisition Settings i button Select the Acquisition gt Automatic MIA option in the tree view The illustration shows a sample on which one scan area 1 is defined 9 individual images are needed to fully acquire the scan area On the left the Single frame inspection option is selected If for example you do a phase analysis and output a workbook as a result you will now find the results for 9 images on the sample s worksheet On the right the MIA image inspection option is selected On the sample s worksheet
14. You can choose between Selected images and All images in report e The Selected images option is inactive if no images were selected while opening the command Specify in the mage Resolution group how you want to change the image resolution If you choose the User defined option you can enter any resolution of your choice between 96 and 600 dpi into the DPI field Click the OK button to change the image resolution Check whether you are satisfied with the changed image resolution If not change the image resolution anew e You can first reduce the image resolution then save the report and then increase the image resolution again This is possible because each time that you open the Change Image Resolution command the image is transferred from your software to MS Word or MS PowerPoint Once you are satisfied with the changes to the image resolution save the report Take a look at the new file size in the Windows Explorer Updating placeholders The Update Placeholders command makes it easy to have any changes made to the images after the report has been created also shown in the report Please take note that all changes made in your software have to be saved if they are to be displayed when the Update Placeholders command is used In MS Word or MS PowerPoint you open a report that you created some time ago In the meantime you had changed a lot of images in your image analysis software e g added measurements Now
15. e The Materials Solutions tool window will display the next step In this step in the analysis all of the objects used to determine the phase fraction will be shown in the color of the phase Objects which do not come up to the minimum area and which were thus shown hatched in the previous step in the 1 Take a look at the results that are shown in the table In the Image results field you will see the area fraction of each phase 2 If necessary manually change which objects your software uses to determine the area fraction of the phase You can delete or add objects 3 Click the Next button Select the results you want 143 Performing a materials science analysis Phase analysis Reporting step 1 Select the Default option to use the document template that has been defined as the default document template The document template determines e g the appearance of the report s header and footer 2 Inthe Content group select the check box for the pages the report should contain 3 Click the Finish button Through the materials analysis measurement the image has collected one or more additional layers can be seen in the Layers tool window If required save the image in TIF or VSI format to retain these newly created image layers 10611 25062012 144 Performing a materials science analysis Particle Distribution 7 11 Particle Distribution Measuring on ROIs What is a particle distribution
16. image e The Clockwork tif image is a Z stack The works of a clock was analyzed under a reflected light microscope In the process images of the works were acquired at different focus positions In the illustration the Z stack is displayed in the tile view Pay attention to the gear wheel that is only sharply reproduced in the middle of the Z stack Creating a height map Use the Process gt Enhancement gt EFI Processing command Select the Apply on gt All frames and channels option In the Algorithm list select the Reflected light entry Select the Create new document as output check box 2 3 4 5 Select the Height map check box 6 7 Close the dialog box with OK Measuring height Issuing the height difference 1 Measuring images Measuring images e You can see the EFI image with the clockwork s texture The resulting image is a multi layer image and is therefore accompanied by this icon 4 in the image window s title e The height map is a layer of the EFI image The texture image makes up the second layer The height information is therefore also present in the EFI image You can measure the height directly on the texture image gt R AS N N i x ode In the Measurement and ROI tool window click the 3D Line s button Now measure the height between two image objects Click for example the brass colored gear wheel and the silver colored gear
17. to change the threshold values your manual corrections will be deleted If necessary you will then again have to manually edit particles in the Image results step in the analysis 5 Click the Next button 151 Results step Reporting step Performing a materials science analysis Particle Distribution Note If you analyze several images of a sample in the same analysis process this step is only shown after the last image has been analyzed 1 Select the Generate Report check box if you would like to have a report automatically generated in MS Word once the analysis is completed N Select the Generate Workbook check box to have a document of the workbook type automatically created at the end of the analysis 0 Select the Generate chart check box so that at the end of the evaluation the system will automatically create the diagram shown in the mage results step as a separate document of type workbook gt If you want to save the current settings to a file click the Save settings button Then assign a descriptive name in the next dialog box e You can load these settings parameters when you analyze further images To do that for the new image in the mage Source step click the Load from file button The sample and image comments are saved as are the phases used and the settings in the Classification step in the analysis Click the Next button ah 1 Select the Default option to use the d
18. you will automatically have been assigned Administrator rights In contrast other users who also wish to work with the software will only have user rights as a Standard User With these rights the system configuration cannot be changed or viewed i e the Device List and Device Settings dialog boxes cannot be opened For this reason those users who did not themselves install the software but who are to be allowed to view or change the system configuration have to be assigned the necessary user rights Use the Too s gt User Rights command to open the User Rights dialog box In it select the required user then click the Properties button You can find more information on user rights in the online help When you use the MS Windows Vista operating system Switch the hibernation mode off To do so click the Start button located at the bottom left of the operating system s task bar Use the Control Panel command Open the System and Maintenance gt Power Options gt Change when the computer sleeps window Here you can switch off your PC s hibernation mode 00159 3 2 Configuring the system Preconditions Setting up a new hardware configuration In order to acquire correctly calibrated images the software requires information about your camera the objectives and the microscope camera adapior s magnification Set up your system with this in mind Your software is installed and the camera is connected to your PC T
19. Auto split particles check box has a significant effect on the image results On the left is the image where the morphological filter for separating objects has not been applied Mainly few and large objects have been found On the right is the same image where the morphological filter for separating objects has been applied Here more and smaller objects have been found 3 Select the Check classification check box which is displayed below the histogram e The additional Classification step will be added to the current analysis Note If you analyze several images of a sample in the same analysis process you can only check the classification for the first image of the sample The selected classification will be adopted for all other images of this sample This is why the Check classification check box is not available from the second image of the sample onwards 4 Click the Next button e The Materials Solutions tool window will display the next step In this step in the analysis only the pixels within or on the edge of the defined ROI will be considered All particles that will be used for the particle distribution measurement are shown hatched in this step 148 Performing a materials science analysis Particle Distribution 1 As the nodular graphite particles on the GlobularGraphite tif image are to be classified by their size in the Measurement list select the Area parameter e The particle distribution always use
20. Mark the course of the border with further left mouse clicks Then click with your right mouse button at the position in the image where the border is to end e The border will be shown in red 3 Define the second border To do this proceed exactly as you did when you defined the first border 101 Edit borders step Define layers step A Image results step Performing a materials science analysis Layer Thickness 4 Click your right mouse button to finish the definition of the two borders A ia fury e The borders will be shown in blue Click the Next button e The Materials Solutions tool window displays the Edit borders step Since you have already defined both of the borders and don t want to change them Click the Next button Click the Add layers button Click the first border Click the second border BR e The layer has now been defined The neutral fiber is plotted in green It always lies in the middle of the layer Click your right mouse button to finish the definition of the layer Click the Next button Take a look at the results of the current image shown in the Image results group This group contains a table with the measurement results e The values in the Steps Distance and Type fields can be edited when you double click in the cell you want to edit You can find more information on this topic in the online help e The lower part of the group contains several buttons w
21. Minimum and Maximum fields depends on the selected measurement parameter In the Number of classes field enter how many classes are to be used for the classification of particles For the GlobularGraphite tif image enter the value 3 Close the dialog box with OK 5 Look at the table in the tool window It contains the classification with the three classes Also look at the diagram below the table It displays how many particles are in each class 149 Image results step Performing a materials science analysis Particle Distribution aS 10 15 20 25 6 Click the Next button e The Materials Solutions tool window will display the next step In this step in the analysis all of the particles will be shown in the color of the class to which they belong All particles that do not belong to any of the defined classes are shown hatched in this step 1 Take a look at the displayed results in the Image results field You see how many particles each class contains 2 The Particle area fraction field displays the particle area fraction as a percentage This value informs you about the percentage the sum of the area of all particles found in this analysis has in comparison to the total area being analyzed the detection area The particle area fraction is determined by dividing the area of all found particles by the detection area It doesn t matter whether the found particles have been assigned to a class or not The detection
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23. On the Microscope Control toolbar click the button with the objective that you want to use for the image acquisition 3 Switch to the live mode and select the optimal settings for your acquisition in the Camera Control tool window Pay special attention to setting the correct exposure time This exposure time will be used for all of the frames in the time stack 4 Choose the resolution you want for the time stack s frames from the Resolution gt Snap Process list 5 Find the segment of the sample that interests you and focus on tt 26 Selecting the acquisition process Selecting the acquisition parameters Acquiring a time stack 10 11 12 13 14 Acquiring images Acquiring movies and time stacks Activate the Process Manager tool window Select the Automatic Processes option Click the Time Lapse button e The button will appear clicked You can recognize this status by the button s colored background e The t group will be automatically displayed in the tool window Should another acquisition process be active e g Z Stack click the button to switch off the acquisition process e The group with the various acquisition processes should now look like this Clear the check boxes Start delay and As fast as possible Specify the time that the complete acquisition is to take e g 10 seconds Enter the value 00000 00 10 for 10 seconds in the Recording time field You can directly
24. Process Manager tool window 6 Select the Automatic Processes option 7 Click the Z Stack e The button will appear clicked You can recognize this status by the button s colored background button e The Z group will be automatically displayed in the tool window 8 Select the Range entry in the Define list 9 Enter the Z range you want in the Range field In this example enter a little more than the sample s thickness 50 um e g the value 60 10 In the Step Size field enter the required Z distance e g the value 2 for a Z distance of 2 um The value should roughly correspond to your objective s depth of focus e Inthe Z Slices field you will then be shown how many frames are to be acquired In this example 31 frames will be acquired 9 Find the segment of the sample that interests you and focus on it To do this use the arrow buttons in the Z group The buttons with a double arrow move the stage in larger steps 10 Click the Start button e Your software now moves the Z drive of the microscope stage to the start position The starting positions lies half of the Z range deeper than the stage s current Z position 28 Acquiring images Acquiring an EFI image e The acquisition of the Z stack will begin as soon as the starting position has been reached The microscope stage moves upwards step by step and acquires an image at each new Z position e The acquisition has been completed when you can
25. Solutions command to have it displayed 3 Click the Phase Analysis button 4 Inthe mage source group choose the Selected images option to analyze the example image This image must have been opened for this purpose and have been selected in the document group 5 Select the Skip Sample information check box e By doing so you skip the Sample information step which is not relevant for this example image 6 Select the All images entry in the Check settings and results list 7 Click the Next button e The Materials Solutions tool window will display the next step 1 For the SprayCoatingt tif example image define a rectangular ROI which covers the part of the sample that you would like to analyze To do so click the Create Rectangular ROIs LI button and define the rectangle on the image by two mouse clicks e tis not absolutely necessary to define ROIs If you want to measure the entire image in the ROIs step in the analysis click directly on the Next button without defining a ROI 2 Click the Next button e The Materials Solutions tool window will display the next step All of the pixels which lie within a defined intensity range will be shown in color during this step in the analysis This intensity range is called a phase The intensity value range is limited by a top and a bottom intensity value These are the so called threshold values You can find more information on thresholds in the online help
26. Solutions tool window 3 Click the Layer Thickness button 4 Inthe mage source group choose the Selected images option to analyze the example image This image must have been opened for this purpose and have been selected in the document group Select the Skip Sample information check box 6 Select the All images entry in the Check settings and results list 7 Click the Next button 1 Click the Automatic button Inthe Layer type group click the icon for an open layer 3 Click the Next button 94 Automatic step 1 Performing a materials science analysis Layer Thickness You see the image on which some of the image structures are now shown in color because the first phase was automatically set up idee Se gt Since the required image structures are not yet shown in color select the Dark option in the Background group e Now the required image structures are shown in color 3 Click the Next button Define borders step 1 ral Here you see the image in which the contours are outlined in red Click the Define borders button Now specify which part of the contour represents a border Click the contour once with your left mouse button to activate the mode Then click with your left mouse button at the position in the contour where the first border is to begin Then click with your left mouse button at the position in the contour where the first border is to end e The b
27. Writing convention used in the documentation Example images that are automatically installed Switching to the help mode The documentation for your software consists of several parts the installation manual the online help and PDF manuals which were installed together with your software A quick setup guide describing the software activation is delivered with your software On the setup DVD several PDF manuals are provided e Inthe installation manual you can find the system requirements Additionally you can find out how to install and configure your software e Inthe user manual you will find both an introduction to the product and an explanation of the user interface By using the extensive step by step instructions you can quickly learn the most important procedures for using this software e The database is explained in its own user manual In the online help you can find detailed help for all elements of your software An individual help topic is available for every command every toolbar every tool window and every dialog box New users are advised to use the manual to introduce themselves to the product and to use the online help for more detailed questions at a later date In this documentation the term your software will be used for OLYMPUS Stream During the installation of your software some sample images have been installed too These example images might be of help to you when you familiarize yourse
28. You can then decide whether or not you still need the data 4 Navigation bar in the image window Multi dimensional images have their own navigation bar directly in the image window Use this navigation bar to determine how a multi dimensional image is to be displayed on your monitor or to change this 00139 2 4 Tool Windows What is a tool window Showing and hiding tool windows Docked tool windows Freely positioned tool windows Saving the tool window s position Tool windows combine functions into groups These may be very different functions For example in the Properties tool window you will find all the information available on the active document In contrast to dialog boxes tool windows keep visible on the user interface as long as they are switched on That gives you access to the settings in the tool windows at any time Which tool windows are shown by default depends on the layout you have chosen You can at any time make specific tool windows appear and disappear manually To do so use the View gt Tool Windows command Position of the tool windows The user interface is to a large degree configurable For this reason tool windows can be docked freely positioned or integrated in document groups Tool windows can be docked to the left or right of the document window or below it To save space several tool windows may lie on top of each other They are then arranged as tabs In this case activat
29. axis the form factor is shown along the Y axis the relative number of detected particles in is shown General procedure for a cast iron analysis made to determine the graphite fraction 1 Select the analysis process Click the Cast Iron button located in the Materials Solutions tool window hA 2 Image source step Choose the image you want to measure vy 3 Settings step Choose the sample type unetched Set the graphite parameters 4 Graphite Distribution step If chosen Determine the distribution of the graphite particles hA 5 Image results step Take a look at your image results If necessary Delete or separate detected particles or add new ones hA 6 Results step Document the results report or workbook 105 Image source step Performing a materials science analysis Cast Iron Analysis Determination of the ferrite pearlite ratio By using your software s Cast Iron solution you can also measure the ferrite pearlite ratio For this purpose the sample must have been etched Since graphite and pearlite have very similar gray values it s difficult to differentiate between these two fractions in a sample during the same analysis For this reason determining the ferrite pearlite ratio is done as follows To begin with your software determines by means of the definition of phases the ratio of the bright ferrite areas to the dark graphite and ferrite areas Duri
30. e Never Select this entry if the settings are never to be checked With this option the system will jump over some steps in the analysis and the Image results step will be displayed In general this setting is only sensible if you have saved the settings to be used as a parameter set and you load them before starting the analysis e First image Choose this entry if the settings are only to be checked for the first image and are then to be used for all other images even from other samples e First image per sample Choose this entry if you have several samples with several images per sample and the settings are to be checked for the first image of each sample e First image per scan area You ll only see this entry when you have chosen the Stage Path option Select this entry if the settings are only to be checked for the first image in each scan area and if the same scan area is to be used for other images e mage interval Select this entry if you would like to analyze several images and would like to check the settings at regular intervals If this entry is selected the mage interval field will become active In this field you could for instance enter 10 to check the settings for every tenth image 10265 12062012 68 ae Defining a new stage path Performing a materials science analysis Tool window Materials Solutions Setting the stage path The Materials Solutions tool window leads you step by step through a
31. e a a aea a ENE AR 21 AZ HOR MMAQES riore ae aar ea e 22 Acquiring an HDR image with an automatically set exposure range ccceeeeee eens 23 Acquiring more HDR images without setting the exposure range anew 0006 24 4 3 Acquiring MOVIES ANC time stacks ccccceeecceeceeeeeeeeeeaeeeeeeecaeeeeeeeessaeeeeeeeseaeeeeesssegeeeees 25 Recording lt a IMOVIC iwiaratect ona dosvennta eaeead cxctimnades aE tease ead 25 Acounng a TIME STACK casicevsmcanseeuieSciraiacontbinnanseeasthadtoiasonind E 26 AA dXCQUIMING az Slacken a nated a 28 PCCD LZ SLACK seia a a 28 ko jACQUINING AN EFI IMAC ereuernongn oia erii 29 Acquiring an EFI image without a motorized Z Crive cccecceeeseeeeeeeeeeeeeeeeeeeneeeeeeeens 30 A6 Creating SIICHEd Mage Sirani n aise Rae tot E R 34 Acquiring a stitched image without a motorized XY stage Manual MIA 06 34 Acquiring a stitched image with a motorized XY stage XY Positions MIA 38 Acquiring a stitched image with extended depth of fOCUS ccceceecsseeeeeeeeeeeeeeeeeeees 41 Automatically acquiring Several stitched IMAQES cccccsseeseeeeseeeeeeeeeeeeeeeeeesaeeeeeteas 42 Combining individual images into a stitched IMAGE ccccccseecceeceeeeeeeeseeeeeeeeeeaaeeeees 43 PrOCGSSING IMAGES icicsresises a a eee 45 Del GOMMCNUNG Mage Soano a a a aR 45 92 Processingimado Sissener a a 45 Measuring Images sriep aE RaRa 47 o OVO
32. end the measurement e Inthe Measurement and RO tool window table a new entry with a type of Asymmetry Lines will be shown Please note that all of the measured distances belong to a single measurement object In the Measurement and RO tool window table there may under certain circumstances be several length measurements assigned to a single entry in the Type or Name column You can now measure other images If the Asymmetry Lines button is still active click on the button again to finish measurement mode Save the image in the TIF or VSI file format The measurements will then also be saved in the image file They can at any time be edited deleted or augmented 4037 64 Performing a materials science analysis Tool window Materials Solutions 7 Performing a materials science analysis 7 1 Tool window Materials Solutions Use this tool window to measure an image or several images at the same time according to different material science analysis processes The Materials Solutions tool window works similarly to a software wizard As soon as you ve started an analysis process you ll be guided step by step through the measurement Overview of the supported analysis processes 1 Chart Comparison Grains Intercept Grains Planimetric Layer Thickness Cast Iron Inclusions Worst Field Throwing Power Porosity Phase Analysis 0 Particle Distribution 1 Automatic Measurement 2 Co
33. exposure range automatically takes about 30 seconds Pay attention to the progress bar located in the status bar When all elements in the tool window are active again the process has finished In the Total time field you can now see how long is needed for the HDR image acquisition e f in the Acquisition Settings gt Acquisition gt HDR dialog box the Automatic HDR preview check box is selected the HDR image will be acquired and shown automatically once the exposure range has been set If the HDR image has not been acquired automatically click the HDR button in the Camera Control tool window to start the image acquisition e The image acquisition will begin Pay attention to the progress bar located in the status bar 31 8 5 52 t shows how long the acquisition has taken and the total acquisition time The 23 Acquiring images HDR images progress bar contains the Cancel button which you can use to stop the current image acquisition e After the acquisition has been completed the HDR image will be shown in the document group 9 Check the image If you want to change the settings to use a different algorithm for the output rendering for example open the Acquisition Settings dialog box Select the Acquisition gt HDR option in the tree view e You can find more information on this topic in the online help 10 If you don t want to change any settings use the File gt Save As comma
34. from the differently focused frames in a Z stack are the sharpest and calculates an image that is sharply focused in all areas from them When your system is equipped with a motorized XY stage Use the XY Positions MIA acquisition process to acquire a stitched image of a larger part of the sample MIA stands for Multiple Image Alignment During the acquisition this acquisition process directly combines all of the images that are acquired into a stitched image just like a puzzle When your system is not equipped with a motorized XY stage Use the Manual MIA acquisition process and manually move the stage to have the different adjoining parts of the sample put on display one after the other By using this acquisition process directly during the acquisition you combine all of the images that are acquired into a stitched image just like a puzzle You can insert not only images but also documents which have another file format into a database That enables you to store all manner of data that belongs together in one location Search and filter functions make it quick and easy to locate documents Images will by default be saved in the TIF or VSI file format When you save an acquired image in TIF format a lot of important image information will be automatically saved with it for example data concerning the camera used the exposure time the resolution the time of creation and so on You can later view Measuring images Processing
35. image Click the Next button e The Materials Solutions tool window will display the next step e Should you be analyzing the live image and a database is open you ll be asked whether you want to save the acquired individual image in the database Note You will only see this step in the analysis if in the previous step the Skip Sample information check box wasn t selected 1 Enter information on your sample By default these fields are called Reference and Group e lf you have changed the default settings these fields can also have another name Additional information on changing the default settings can be found in the online help If you want to enter a comment about the sample This comment is valid for all of the images of this sample If you want to enter a comment about the current image too Click the Next button e The Materials Solutions tool window will display the next step Choose a line pattern that is appropriate for the structures in the image that is to be analyzed You can choose between various line patterns e The pattern determines along which lines intercept points in the image are looked for Take a look at the intercept points that have been found in the image If necessary change the settings to optimize the results shown Click the Next button e The Materials Solutions tool window will display the next step Check the results shown You can see the results of the current image a
36. image a chart or a workbook Select the Olympus gt Templates command and choose one of the following options nsert Image Placeholder Insert Chart Placeholder Insert Workbook Placeholder You can find more information on workbooks in the online help e The placeholder you ve selected will be inserted 165 Creating reports Working with the Olympus MS Office add in 4 If necessary you can change the size of the placeholder To do so move your mouse over a handle then with the left mouse button depressed drag it in the required direction The length width ratio remains unchanged so that the objects won t be distorted by this action 5 Doubleclick a placeholder for an image to change the default settings for its appearance e The mage properties dialog box opens You can find more information in the online help 6 If required insert additional placeholders for images charts or workbooks Make sure that your template isn t longer than a page 7 If you want to you can insert a placeholder for a field Additional information about a placeholder can be shown in this field for example the name or the date it was set up You will find additional information on inserting placeholders for fields further down 8 Save your template For page templates use the DOC or DOCX file format For slide templates use the PPT or PPTX file format As a storage location select the same directory that is set for your user template
37. images Analyzing images automatically Creating reports Controlling the microscope Before you start About your software this data again whenever you want simply by opening the image with your software You do not need to collect this data separately A PDF manual for your database is installed together with your software You can make various measurements on images and e g measure the length of a line the perimeter of an ellipse or an angle in degrees The measurement objects will be displayed in the image s drawing layer and can be faded in and out The measurement results will be shown in a sheet and can be differently sorted by a click of your mouse You can export measurement results for example to the XLS format for further editing in the MS Excel application program You can measure an image or several images at the same time according to different material science analysis processes The Materials Solutions tool window works similarly to a software wizard As soon as you ve started an analysis process you ll be guided step by step through the measurement The following material science analysis processes are available Chart comparison Grains Intercept Grains Planimetric Layer Thickness Cast lron Analysis Inclusions Worst Field Throwing Power Porosity Phase Analysis Particle Distribution Automatic Measurement Coating Thickness You can process the acquired images and retroactively optimize the im
38. materials science measurement In the Stage path settings step you define a stage path on your sample What is a stage path For most materials science analysis processes you can define several stage positions on each sample and can save them as a stage path Here stage positions can either be entire scan areas or individual XY positions The stage path contains the number of samples to be analyzed and information about which scan areas and or XY positions are defined on each sample For the materials science analysis the stage will move to the defined positions one after the other At each XY position an image will be automatically acquired For a scan area several images will automatically be acquired and will be assembled into a single image Each image acquired will be analyzed with the selected materials science analysis process The following stage path settings are available a a Choosing a stage path Defining samples Defining scan areas and or XY positions Aligning the sample Selecting the inspection mode Selecting the focus mode SS ee ON CO 1 2 3 4 5 6 1 Choosing a stage path To be able to take materials science measurements at different positions on one or more samples you have to define a stage path You can use a saved stage path or you can define a new one 1 Click the Creates a new stage path button to define a new stage path e A stage path is always linke
39. measured Right The contour completely contains the layer that is to be measured 4 Click your right mouse button to finish the definition of the contour e Now the first border has been defined It will be plotted in blue 5 Click the Next button e The Edit borders step in the analysis will be shown Edit borders step 1 Click the top Add contours button 2 Click the Next button Magic wand step 1 Then define the second contour To do so click the Add contours button Ja once more 2 Then click a position inside the copper wire 3 Take care again that the contour contains the inside of the copper wire as completely as possible and that its outline isn t discontinued anywhere At the same time this new contour mustn t touch the contour that has already 98 Edit borders step Define layers step Image results step Performing a materials science analysis Layer Thickness been defined Change the position of the slide control in the Tolerance field until the second contour looks roughly as shown below Click your right mouse button to finish the definition of the contour Click the Next button Since you have already defined both of the borders and don t want to change them Click the Next button Click the Add layers button Click the first border Click the second border e The layer has now been defined The neutral fiber is plotted in green It always lies in the middle of the laye
40. measured the required number power measurement of microvias e The Materials Solutions tool window displays the Report images step 18 Acquire three images to document the measurement You could for example acquire three different cross sections at a low magnification Or you acquire an overview image of a microvia and then acquire two images at a higher magnification showing interesting details If necessary change the sample for this Move the stage to the required location Select a suitable magnification and exposure time and focus on the sample Click on this button e The images acquired will be displayed in the Materials Solutions tool window to acquire the image 125 Performing a materials science analysis Throwing Power Acquire three images to finish the throwing power measurement 19 Open the database where you would like to save the measurement results In the database select the folder where the measurement results are to be saved or create a new record Additional information on inserting data into a database can be found in the online help 20 Click the Next button gt e The Materials Solutions tool window displays the Reporting step In the Template group you ll see a preview of the document template that has currently been chosen 21 Select the Add workbook to the database check box 22 Start the MS Word application 23 Click this button e With this the throwing power measu
41. measurements will then also be saved in the image file They can at any time be edited deleted or augmented Outputting various measurement parameters Task You want to measure the filaments in a Supraconductor Measure the hexagonal structure as a circular surface Have a variety of measurement parameters such as the area the perimeter and the diameter output Have the diameter shown in the image 1 Measuring areas 2 Viewing the listof 1 measurement parameters Acquire an image or load the Supraconductor tif example image In the Measurement and ROI tool window click the 2 Points Circle o button With your left mouse button click in the center point of the hexagonal structure Move your mouse and in the process drag out the circle Match the circular object as well as possible to the structure Click the left mouse button Click the 2 Point Circle o button again and switch off the measurement mode Take a look at the result in the Measurement and ROI tool window e The illustration shows the image of the superconductor with a circular measurement In the Measurement and ROI tool window click the Select Measurements re button e Inthe dialog box you ll see a list with all of the available measurement parameters At the bottom of the dialog box you ll see a list of the measurement parameters that are calculated for all objects 52 Outputting additional measurement parameters Outputting me
42. movie s file size 8 From the Compression list select the M JPEG entry and confirm with OK Please note Compressing the movie is only possible if the selected compression method codec has already been installed on your PC If the compression method has not been installed the AVI file will be saved uncompressed The selected compression method must also be available on the PC that is used for playing back the AVI Otherwise the quality of the AVI may be considerably worse when the AVI is played back 9 Close the Acquisition Settings dialog box with OK 10 Switch to the live mode and select the optimal settings for movie recording in the Camera Control tool window Pay special attention to setting the correct exposure time e This exposure time will not be changed during the movie recording 11 Find the segment of the sample that interests you and focus on it 25 Switching to the Movie recording mode Starting movie recording Stopping movie recording Task Selecting an objective Setting the image quality Acquiring images Acquiring movies and time stacks 12 Select the Movie recording check box 1 The check box can be found below the Live button in the Camera Control tool window T 2 E SAM easa e The Snap button will be replaced by the Movie button 13 Click the Movie button to start the movie recording e The live image will be shown and the recording of the movie will
43. need a flat section of It 2 The results of a throwing power measurement will always be saved ina database You should thus open the required database If no database exists yet create one using the database template supplied You can find more information in the online help 3 Align your microscope Make sure that your software is correctly configured You can find more information in the online help 5 Start your software Switch to live mode and select the best settings to acquire an image While a throwing power measurement Is in progress you may no longer alter all settings for the image acquisition e Check the white balance If necessary carry out a white balance You can find more information in the online help e Select the live image s resolution in the Camera Control tool window 119 Performing a materials science analysis Throwing Power General procedure for a throwing power measurement 1 Select the analysis process Click the Throwing Power button located in the Materials Solutions tool window 2 Settings step Select one of the following measurement methods Through holes Microvias Filled through holes Filled microvias y 3 Diameter step If you have selected the Through holes measurement method Place a flat section of the through hole under your microscope Measure the diameter of the through hole 4 Measurements step Place a cross section through the panel under your microsco
44. once more see the Start button in the Process Manager tool window and the progress bar has been faded out e You can see the acquired Z stack in the image window Use the navigation bar located in the image window to view the Z stack You can find more information on the navigation bar in the online help e The Z stack that has been acquired will be automatically saved You can set the storage directory in the Acquisition Settings gt Saving gt Process Manager dialog box The preset file format is VSI Note When other programs are running in the background on your PC for instance a virus scanning program it can interfere with the performance when a Z stack is being acquired 00367 4 5 Acquiring an EFI image What is EFI Creating an EFI image EFI is the abbreviation for Extended Focal Imaging By using the EFI acquisition process you can acquire images with your microscope which have practically unlimited depth of focus To do this EFI uses a series of differently focused separate images Focus series to calculate a resulting image EFI image that is focused in all of its parts At the left hand side the illustration shows a number of frames that were acquired at different Z positions In each of these frames there are only a few image segments that are displayed sharply focused These segments are shown in color These sharply focused image segments will be assembled into the EFI image right Your softwa
45. present in the image If the slide control is closer to the High position the phase contains a smaller part of the intensities This means that only a smaller part of the intensity values is detected as ferrite All of the pixels that have been detected as ferrite will be highlighted in yellow in the image e The threshold value has been correctly set when the ferrite is completely detected In the illustration 1 the threshold value has been set too high too many particles are detected as ferrite In the illustration 2 the threshold value has been set too low the ferrite is not detected completely The illustration 3 shows a correctly set threshold value 110 Image results step analysis Performing a materials science analysis Cast Iron Analysis Use the Closing pearlite phase slide control to define how rigid the voids that the pearlite contains are to be closed In this context a void in the pearlite is an area within the pearlite that has so bright intensity values that it is assigned to the ferrite In the image voids are visualized as an accumulation of small yellow points within the pearlite Using the Closing pearlite phase slide control is a means of correcting these voids To do so a morphological filter is applied Morphological filters are often used in image analysis to optimize the results of an automatic object In the illustration 1 the pearlite phase is little closed This is why ma
46. report instruction RCI file in which you specify which images and which page layout the report should contain Then you create a report which is displayed in MS Word at the touch of a button In MS Word you now only undertake small corrections of the report You can find more information on the Report Composer tool window in the online help Creating and editing For users who require reports in MS PowerPoint format For users that want to Ol rn tts insert images or documents that were created with the image analysis program in y Add in new or existing MS Word document 158 Creating reports Overview For this your image analysis program should be open in the background You can use the Olympus MS Office add in to insert images workbooks or charts from your software into an MS Word or MS PowerPoint document You can use templates to do this With MS Word reports you define page templates in the DOC or DOCX file format With MS PowerPoint reports you define slide templates in the PPT or PPTX file format The general process flow for report generation using the Report Composer tool window 1 New report instruction Switch to the Reporting layout and create or open a report instruction Place the documents you want in it 2 Generating a report Create a report 3 Working with the Olympus MS Word add in In MS Word Have a look at the report and make small changes if necessary y 4 Saving the report and the report i
47. respond positively to the warning message the particle will be deleted The display in the Image Results and Sample Results fields is updated You can also delete several particles at once by holding the Ctrl key pressed while clicking on the particles Add particles by first clicking on this button CS Then draw a freehand polygon around the particle to be added Make sure that the freehand polygon lies as exactly as possible on the edge of the particle to be added End the definition of the polygon with the right mouse button If you use several phases from the context menu select the phase to which the particle added should belong e g 1 or 2 The polygon added will be shown in the color of the phase The display in the Image Results and Sample Results fields is increased Merge particles by first clicking in the image on the particles which you want to merge Keep the Ctrl key pressed while you click on the particles Then click the Merge selected particles 6 button Split particles by first clicking on the Draw a line that will split particles button and then define a line between the particles you want to split Click the right mouse button and confirm the input The particle will be split and the split particles will then be shown in the color of the class to which they now belong Generally this is a different class than before Note If you have manually edited particles and return to the Threshold step in the analysis e g
48. s current position will be shown to you in thePos field 17 Click the top Set button to define the starting position for the Z stack acquisition e The current Z position will be adopted in the End field 18 Use the arrow buttons in the Z group to move your stage to the Z position at which the highest lying position on the sample is sharply focused 19 Click the bottom Set button to define the position at which the Z stack acquisition is to end 32 Acquiring images Acquiring an EFI image e The current Z position will be adopted in the End field 20 In the Step Size field enter the distance between two frames in the Z stack This Z distance should be small enough to ensure that no positions on the sample between two images remain blurred The higher your objective s Numerical Aperture is the smaller the Z spacing should be 21 Use the Enter key to confirm the Z distance that you ve set e The number of images in the stack will be automatically calculated on the basis of the Start and End values and the Z distance Starting an EFI 22 Select the Extended Focal Imaging 1 check box You can find the check cede box at the bottom of the Z group located in the Process Manager tool 23 Finish the live mode 24 Click the Start button e The EFI acquisition begins immediately e The acquisition will begin After the acquisition has been completed the EFI image will be shown in the document group This image
49. sample surface types Enter the curvature radius of the surface used in the Curvature radius of surface field This value must be known because it s needed for the calculation of the coating thickness 155 Performing a materials science analysis Coating Thickness e The curvature radius of the surface is only important for the measurement of the coating of soherical sample surfaces That s why this field isn t displayed when you ve selected a different sample surface type Measurement step 1 Move the mouse pointer onto the image window All other areas of your software can t be used in this step e The mouse pointer turns into across 2 Define the first coating s outer borderline by clicking three points on its outer border With cylindrical sample surfaces the outer borderline is defined by clicking twice on the ellipse s outer border taking the direction of the selected The illustration in the Measurement step shows how the borders of a coating have to be defined e The outer borderline is displayed It s has the color red by default You can set a different color or thickness for the borderline Make these settings before you start the analysis process You can find more information on the analysis process options in the online help p Define the first coating s inner borderline by clicking once on its inner border e The inner borderline is displayed If you only want to measure one coating the mouse poin
50. sample with two phases Here pores which do not meet the counting conditions will be shown with red hatching too The red hatching has a fixed specification so it cannot be seen whether the red hatched objects belong to the green or to the red phase 132 Performing a materials science analysis Porosity 1 Pore size parameter field In this Pore size parameter field you choose how the pore size is calculated Choose the Max Feret setting to use the maximum spacing of parallel tangents on opposing sides of particles Choose the Equivalent Circular Diameter setting to use the diameter of a circle which has the same area as the particle 2 Counting minimum and Counting maximum fields If necessary click on the button which shows the units to the right next to the Counting minimum field and select the units in which the image to be analyzed has been calibrated In the Counting minimum field enter the minimum size that an object must have to be considered when determining the number of pores In the Counting maximum field enter the maximum size that an object may have to be considered when determining the number of pores 3 Unit of pore density field If required in the Unit of pore density field change the units used to show the pore density in the result The unit is always a unit of area e g 1 mm or 1 um Your software will then calculate how densely the objects found lie next to one
51. shows that reference positions have been defined for this stage path 6 Click this button H next to the Stage path list to save the stage path along with the reference positions and the reference images 73 Performing a materials science analysis Tool window Materials Solutions On the left is an overview of a whole sample Define three reference positions 1 3 on the sample A reference image is acquired at each reference position The illustration shows the reference image at position 2 The reference image is displayed in the live image during the alignment of the sample to assist you with positioning On the right is a similar sample that is positioned differently on the stage The same stage path can be used on both samples with the aid of the reference positions 1 Begin a materials science analysis process that contains a stage path Reference positions for the stage path are already defined e Your software automatically starts a wizard in the Define Stage Path step Aligning a sample in the analysis You can cancel the wizard if you don t want to align the sample yet 2 Click the Yes button in the message box or click the Align images for sample alignment button shown above to align the current sample with the aid of saved reference images and reference positions e The Align images for sample alignment button is only available if reference positions have been defined for the selected stage path e A ye
52. start immediately e Inthe status bar a progress indicator is displayed At the left of the slash the number of already acquired images will be indicated At the right of the slash an estimation of the maximum possible number of images will be shown This number depends on your camera s image size and cannot exceed 2GB m 71 3639 e This icon on the Movie button indicates that a movie is being recorded at the moment 14 Click the Movie button again to end the movie recording e The first image of the movie will be displayed e The navigation bar for time stacks will be shown in the document group Use this navigation bar to play the movie e The software will remain in the Movie recording mode until you clear the Movie recording check box once more Acquiring a time stack In a time stack all frames have been acquired at different points of time With a time stack you can document the way the position on the sample changes with time To begin with for the acquisition of a time stack make the same settings in the Camera Control tool window as you do for the acquisition of a snapshot Additionally in the Process Manager tool window you have to define the time sequence in which the images are to be acquired You want to acquire a time stack over a period of 10 seconds One image is to be acquired every second 1 Switch to the Acquisition layout To do this use e g the View gt Layout gt Acquisition command 2
53. that when performing your own analyses you might want to load sample results e g the result of a previous cast iron analysis that determined the graphite fraction In this case make sure the Skip Sample information check box is cleared which will enable you to use the Load sample results button in the Sample information step 6 Select the All images entry in the Check settings and results list Click the Next button 106 Graphite Distribution step Performing a materials science analysis Cast Iron Analysis e The Materials Solutions tool window will display the next step 1 Click this button to set that you want to determine the graphite fraction in an unetched sample e lf the button for etched samples has been active before the settings possibilities in this window will now change 2 Use the slide control to define the threshold value for the graphite detection Observe the sample The threshold value has been correctly set when the graphite particles can be completely detected sites In the illustration 1 the threshold value has been set too high the detected particles are too coarse In the illustration 2 the threshold value has been set too low the particles are not detected completely The illustration 3 shows a correctly set threshold value 3 Select the graphite parameter that is to be determined To do so select the corresponding check box The possibilities listed below are ava
54. the point of contact with the neighboring image a e Two images were not correctly aligned with each other There is a misalignment When the manual alignment has been made the two images fit together seamlessly 11 Select the Cut Edges check box to clip the image in such a way that there are no longer any empty areas visible on its borders e Inthe preview the image edges that are to be clipped will be displayed semi transparently 12 Select the Equalize check box if the images aren t homogeneously illuminated Then the intensity values of the individual images will be matched with one another which will make the background appear more homogeneous 13 Click OK e Anew image with the name Image_ lt consecutive No gt will be created 00383 44 Processing images Commenting images 5 Processing images 5 1 Commenting images Using drawing objects Using annotations Entering an image comment There are several different ways of adding notes to an image The Drawing toolbar makes a variety of drawing functions line rectangle ellipse text available to you as well as options for color selection and line styles You can find more information on working with drawing objects in the online help You can use the Annotations tool window to mark interesting positions in an image to name them and to save them You can give each position a text or audio annotation In this way you will be able to j
55. the report is to be updated so that it shows the newest version of all of the images 1 2 If you only want to update one placeholder select just that one Use the Olympus gt Update Placeholders menu command e The Update Placeholders dialog box opens In the Update Placeholders dialog box specify whether or not all placeholders should be updated Select the Update fields linked with placeholder s check box if your report contains fields which should also be updated e You can find more information on this topic in the online help Click OK e The placeholders will be updated Insert Document You can insert a document at any position in a report If you have for example created a report using the Report Composer tool window and while you are viewing it notice that you ve forgotten an image you can retroactively insert it into the report 1 Position the mouse pointer on the location in the report where you want to insert a document Use the Olympus gt Insert Document command e The Insert Document dialog box opens 170 Creating reports Working with the Olympus MS Office add in In the area on the left select the source the document comes from You have the following possibilities e Select the Open Documents entry if you want to insert a document that is currently opened in your software e Select the Database entry if you want to insert a document that is part of the currently selected datab
56. was calculated from the variously focused separate images 00372 05072012 33 Acquiring images Creating stitched images 4 6 Creating stitched images What is a stitched f you acquire a stitched image move the stage in a way that different adjoining image parts of the sample are shown All of the images that are acquired are combined just like a puzzle into a stitched image The stitched image will display a large part of the sample in a higher X Y resolution than would be possible with a simple snapshot The illustration shows left four separate images On the right you see the stitched image made up from the four images Creating a stitched Your software offers you several ways of creating a stitched image image e Acquiring a stitched image without a motorized XY stage Manual MIA e Acquiring a stitched image with a motorized XY stage XY Positions MIA e Acquiring a stitched image with extended depth of focus e Automatically acquiring several stitched images Combining individual images into a stitched image Materials science The Materials Solutions tool window offers several materials science analysis acer hed ma a processes Most of these processes can also use stitched images an input 2 provided that you are working with a motorized XY microscope stage The acquisition of these stitched images are defined in the Stage path settings step within the materials science analysis process In this case you won t ne
57. well To do so select the Show ferrite detection check box in the Validation group Each detected ferrite particle will now be outlined in yellow i L7 daa Fy 3 Click the Next button 111 Results step Select the results you want Reporting step Define the report that contains the measurement results 00737 Performing a materials science analysis Inclusions Worst Field 7 Inclusions Worst Field What exactly is a non metallic inclusion Editing inclusions What is an inclusion worst field analysis An inclusion worst field analysis is one of several possible procedures used to detect non metallic inclusions in metal samples This analysis is e g used to measure the amount size and distribution of sulfides and oxides in steel With the measurement results different production processes can be compared or the quality of a product determined During the production processes non metallic inclusions can accrue within steel alloys Inclusions affect the chemical and mechanical properties of the steel The fewer inclusions there are in a steel and the smaller and homogeneous these are the better is its quality 1 2 3 ee ARIE Tee aS ee _ tev oo Microscope image of different inclusions in a polished steel sample The inclusions differ in their color and form The images show a sulfide inclusion 1 a silicate inclusion 2 and an aluminum inclusion 3 The nature and appea
58. wheel on the right hand side of the image Click the 3D Line a button in the Measurement and ROI tool window again then switch off the 3D measurement e Inthe Measurement and RO tool window and in the image the 3D Length measurement parameter is output with the line s complete length The 3D Intensity Projection measurement parameter measures the height difference between two points In the Measurement and ROI tool window click the Select Measurements rat button In the list of all of the available measurement parameters take a look at the parameter of the 3D Line object type Select the measurement parameter 3D Intensity Projection Insert this measurement parameter into the list of the displayed measurements Close the dialog box with OK e Inthe tool window you ll now see the 3D Intensity Projection measurement parameter It tells you how far in height the two gear wheels are from each other 56 Viewing the height map Showing hiding layers 1 1 Measuring images Measuring images Use the View gt Tool Windows gt Layers command to make the Layers tool window appear In the Layers tool window click the sign 1 and open the image s layers e You can now see the image s individual layers Height map 2 and texture image 3 The height map can t be seen because it s absolutely transparent at the moment e The measurements are on another layer 4 a Select the h
59. you will now find only one result for the same scan area as the individual images will be assembled to a single image before the analysis 5 Selecting the focus mode If you use a stage path during the measurement the stage will move to various positions which can be far removed from one another In this case it will generally be necessary to refocus several times during the measurement so that each individual image Is ideally focused and can be analyzed From the Focus Mode list select one of the following options Not refocusing on samples Manually refocusing on samples Using a focus map Using the software autofocus The selected focus mode applies for the entire stage path which means for all samples and all stage positions 10801 23052013 15 Performing a materials science analysis Chart comparison 7 2 Chart comparison What are chart comparisons In metallography chart comparisons are used as a means of quality control They make it possible to compare an image with numerous reference images The reference images are a part of the industry standards which have to be purchased by which the chart comparisons are carried out Example 1 During a qualitative grain size analysis you determine the grain size of metallic samples You compare the images that are to be checked with the reference images You assign the reference image with grains of the same size to each of the images that is to be checked E
60. 06 JIS G 5502 2001 GBT 9441 By using your software s Cast Iron Solution you can measure the graphite fraction and classify the detected particles For this purpose the sample must not be etched How the classes are defined depends on the standard according to which the cast iron analysis is carried out The standard is set in the program options lt ae w a k a You see the results of a cast iron analysis made of different forms of graphite The color coding of the particles indicates their belonging to a specific size class 1 form class 2 and a form factor 3 The results of an analysis can be displayed in a workbook Additionally or alternatively to that the results can be displayed in an MS Word report 104 Performing a materials science analysis Cast Iron Analysis While you are performing a cast iron analysis you can create a chart showing the graphite size the graphite form or the graphite nodularity You can also save these Sa as files AE 8 amp 8 7 6 5D 4 3 2 li o Yi Il O81 e Hae 3 Figure 1 shows a chart of the graphite size Along the X axis the size classes are shown along the Y axis the relative number of detected particles in is shown Figure 2 shows a chart of the graphite form Along the X axis the form classes are shown along the Y axis the relative number of detected particles in is shown Figure 3 shows a chart of the graphite nodularity Along the X
61. 10616 11042013 157 Creating reports Overview 8 Creating reports 8 1 Overview You can create reports with your software to document the results of your work and to make them available to third parties You can share reports as files or as printed documents Two programs are always involved in the creation of reports Your image analysis program and Microsoft Corporation s MS Word or MS PowerPoint application program Therefore these programs have to be installed on your PC when you work with reports You can use MS Word MS PowerPoint 2003 2007 or 2010 for working with reports Microsoft PowerPoint My Presentation ppt Hwee RTE OU We Wee Ale a na Fe ee BupraCanduotor it BupraCanduotor it 08 10 2006 17 17 28 08 10 2006 17 17 28 14mm 4 1 1mm i The illustration displays one report in MS Word format and one in MS PowerPoint format Different ways of generating reports The requirements for working with reports are very different depending on the user and the way you are working That s why there are different procedures for creating reports Creating MS Word For users who regularly create reports that are made up in the same way with a ip eports using the lot of images and who require these in MS Word format Report Composer tool window For this your image analysis program should be open in the foreground In the Report Composer tool window open or create a
62. 2 Class 3 Class 4 Class 5 Class 6 Class 7 You see the same particle distribution measurement as in the example above but now with a more detailed classification Now the particles were assigned to seven size classes You can choose whether you would like to measure the entire image or if the measurement should only be carried out on a part of the image a so called ROI 145 Performing a materials science analysis Particle Distribution Region Of Interest You can also define several ROIs The particle distribution will always be measured over all ROIs and the results do not differentiate between ROls Manually adjusting the You can manually adjust the result of the automatic image analysis You do this ieee eee interactively on the image Note that you are not changing the image itself but the image s measurement layer You can manually delete parts of the image which were detected as particles This can be necessary if for example artifacts in the image are recognized as particles because they have intensity values similar to the defined phase By manually deleting these particles the artifacts will no longer be considered when measuring the particle distribution In addition you can also manually add other image segments which were not detected as such but which are actually particles Additionally you can split particles manually and merge several previously selected small particles into one big particle Results of a
63. 86 Settings for the planimetric ANALYSIS cccccccccceeccesesseeeeeeeceeeeeeeeceeeeeeeeeeeeeeeeeessaaaaeess 87 F9 Lavr TMEKNOSS eiers a e EO ONE 91 Settings for layer thickness MEASUFEMENMS cccccceseeeeeeeceeeeeeeeceeeeeceeeseaaeeeeeeesaaeeees 93 Performing an automatic layer thickness measurement cccceeeeeceeeeceeeeeeeeeeseeees 94 Performing a layer thickness measurement with the magic wand closed layer 97 Performing a manual layer thickness measurement snsnsssssernrsesrrnrreenrnrrrnrrrrrenn 101 7 6 Cast Iron ANALYSIS as scctecsos neses accel cevassnedsnascet caved tad densenaed saetaebesiedeaeeyacsamtensscuaedamecaet eueaes 104 Performing a cast iron analysis Unetched Sample ceeeeeeeeeeeeeeeeeeeeeeeeaaeeeeeeees 106 Performing a cast iron analysis etched sample cceccceeeceeeeeeeeeeeeeeeeeeeeaeeeeeeeeas 110 Lf MACIUSIONS VVOISE Fiela iirinn a a 113 Performing an inclusions worst field ANALYSIS cccccsseeeeeceeseeeceeeeeeeeeeeeeeeeaeeeesaeess 114 EGU MEIUSIONS aie a a a a icuisanbaataaens 116 TO TAOWNO POWO e aea e o E suanautee 119 Defining throwing power measurements ccccseeececceeeeeeceseeeeseeeeeeseaeeeseneeeesseneesens 121 Performing a throwing power measurement s sssssssssssrrrrrrsrrrrreerrrrrerrrrrrenrnterenn 123 Kas POOSI seuaieter dunce vovaucnativivenellaatGnateincseaiavlsnecthwau Gestunetelaiielivnar nuevas acieave
64. 9 251 79800 0 Fax 49 251 79800 6060 Contents BS C1ONC VOU SCAN aien a TET 6 1 1 Which documentation comes along with your software ccccceecceeeeeeeseeeeeeaeeeeeeeeens 6 Online help for your SOPWALE ccccccccesssecceeceesseceeeceesseceeceeeeeeeeseesseeeeeseeaeeeesesaeaeeeeeeas 6 T2 HADOUL VOU SONWANE easca a aaee 7 Main features Of your software ccccceecccceeececeeeeeceeeeeceeceeeeeeeseueeseaeeseaeeeseaeeeseeessaeeesees 7 WISER WITCH ACC asrini e aE EEEREN 9 ZN HOVEIVICW aesan r a A ET a a A eet ala aitsala Nae 9 Zeek NAY OWNS aiieott aacactdo casi ste a dt tnd tutdeteanti subi a a r conerneibhed 11 20 gt WOCUIMENUOFOU P resoa aao 12 2A TOOIVVINGOWS a nonn Resse eee andes ee Re 13 2 5 WOKNO WithGOCUMeCIS 22 cictecceeei tle eee RecN Se 14 SAVING GOCUIMENIS Sic etoactendss inate sssitaetce a eet a tl 14 Closing COCUIMENIS riis face cea sitios lt dnciiS end ocsocsapeeiebhadoeniaaalstuvidascdsndzasidoetdapa sowie ANa 15 OPENING COCUMENIS wecansice Mal bee aA ee oe ee ace ee 15 Activating documents in the document group ceeeceeeeeeeeeeeeeeeeeeeeeeeaeeeeeeeeeaeeeeeeeeas 16 Configuring the system wiscvecsiecetesenecsveecnarseesswecstenewensbewcnecebssswecevawewessveueseseits 17 Ika AQWEIVICW arena n aan aE EN 17 Bree COngunmo Me Systemin NA N 18 PA COUT IMAGES ie seva ccs acevo ccs esesetcie iene iec eisvadcendcwesavetevesaveceueceseseseaceanceassuaueeens 21 Ads Acquiring a single IMAGE eneen
65. By default for a throat thickness measurement the measurement will be shown in the image You can also output the angle between the two pieces of metal which have been welded together in the image 1 Carry out a throat thickness measurement or load an image which contains a throat thickness measurement 2 Select the measurement object on the image For example select the corresponding measurement in the Measurement and RO tool window A 3 Click the right mouse button and select the Create Angle command in the context menu e In addition to the throat thickness the angle measured will also be shown in the image e This command creates another measurement object of type Angle In the Measurement and ROI tool window you will thus see two entries for the measured weld Note The measurements on a screen will automatically be numbered in sequence The angle measurement will thus always have a different measurement ID from the associated throat thickness measurement You can switch off the display of the measurement IDs if you find their display distracting To do so open the Tools gt Options gt Measurement and ROI gt Measurement Display dialog box and clear the Show D check box e With the commands in the context menu you can change the color of the labels of the measurement lines the reference lines or you can even alter the font 4038 Performing an asymmetry measurement Use the Asymmetry Lines measurement func
66. Click the Manual MIA button e The button will appear clicked You can recognize this status by the button s colored background e The Manual MIA group will be automatically displayed in the tool window a Should the Instant EFI acquisition process have been active it will be automatically switched off You can however use images with extended depth of focus for the stitched image To do this before you acquire each of the individual images click the Instant EFI button located in the Manual MIA group Make quite certain that the Auto Align button appears clicked It should then look like this e Then your software will search for the same image structures in neighboring individual images The stitched image will be put together in such a way that image areas that are the same will be superimposed 10 Click the Start button e Your software switches into the live mode 11 Bring the sample into focus 12 Click on one of the arrow buttons to set the side of the current image at which the next image is to be arranged For example click this button gt if the next image is to be laid to the right of the current image e Your system now acquires an image at the current position on the sample In the image window you now see on the left 1 the acquired image and on the right 2 the live image is displayed Since you haven t moved the sample the live image still shows the current sample position too which means t
67. Control toolbar contains buttons with all of your objectives with correct color codes e For stereo microscopes or inverted microscopes you find the zoom factors in the list to the right of the objectives 00156 20 Acquiring images Acquiring a single image 4 Acquiring images 4 1 Acquiring a single image You can use your software to acquire high resolution images in a very short period of time For your first acquisition you should carry out these instructions step for step Then when you later make other acquisitions you will notice that for similar types of sample many of the settings you made for the first acquisition can be adopted without change Selecting an objective Switching on the live image Setting the image quality Acquiring and saving an image 1 Switch to the Acquisition layout To do this use e g the View gt Layout gt Acquisition command e You can find the Microscope Control 1 toolbar at the upper edge of the user interface right below the menu bar To the right of the document group you can find the Camera Control 2 tool window On the Microscope Control toolbar click the button with the objective that you use for the image acquisition In the Camera Control tool window click the Live button e The live image 3 will now be shown in the document group Go to the required specimen position in the live image Bring the sample into focus The Focus ndicator t
68. Manual Magic Wand v 4 Magic wand step If you have selected the Magic wand definition method Define the contours 5 Define borders step If you have selected the Automatic or Magic wand definition method Define the borders 6 Define layers step Define the layers M 7 Image results step Take a look at the measurement results y 8 Results step Document the results report or workbook 00725 12062012 92 Performing a materials science analysis Layer Thickness Settings for layer thickness measurements In this step the following possibilities are available A eee 1 Settings group In the Settings group choose how the contours are to be defined To do this click the corresponding icon You can choose between the following definition methods an automatic definition a manual definition as a definition with the magic wand The current definition method is outlined in yellow An Automatic definition is suitable for samples whose layers feature distinct intensity differences e g light layers in front of a dark background With these samples as a rule the automatic threshold value setting used for this definition method functions well A Definition by Magic wand is suitable for samples that have irregular borders that would be very difficult to trace manually A Manual definition is suitable for samples in which there are only
69. The measurement 2 has been selected 1 Click one of the measurement results in the Measurement and RO tool window e The corresponding line will be marked in the image 2 Press the Del key e The measurement will be deleted both in the image and in the tool window e When a measurement has been deleted the image and the tool window contain one measurement less The IDs of the remaining measurements won t be changed by the deletion of a measurement When you ve completed the measurements you should switch off the measurement mode since otherwise you might inadvertently select your measurements and move them 3 Check whether one of the buttons on the Measurement and ROI tool window s toolbar appears clicked Release this button 51 Exporting results to MS Excel 1 Closing the image Measuring images Measuring images To do this click the Export to Excel button In the In Output dialog box you set up the directory in which the data is to be saved and enter the name of the MS Excel sheet Adopt the file type Excel Sheet xls Click the Save button to have the MS Excel sheet with the measurement results saved Click the Close Ed button located at the top right of the document group e You have changed the image because you ve added interactive measurements For this reason you ll receive a query whether you wish to save the image or not Save the image in the TIF or VSI file format The
70. The name of the active document will be shown in color Each type of document is identified by its own icon 3 Buttons in the document bar At the top right of the document bar you will see several buttons M Ey Click the button with a hand on it to extract the document group from the user interface In this way you will create a document window that you can freely position or change in size If you would like to merge two document groups click the button with the hand in one of the two document groups With the left mouse button depressed drag the document group with all the files loaded in it onto an existing one You can only position document groups as you wish when you are in the expert mode In standard mode the button with the hand is not available 12 q p Arrow buttons EJ Button with a cross User interface Tool Windows The arrow buttons located at the top right of the document group are to begin with inactive when you start your software The arrow buttons will only become active when you have loaded so many documents that all of their names can no longer be displayed in the document group Then you can click one of the two arrows to make the fields with the document names scroll to the left or the right That will enable you to see the documents that were previously not shown Click the button with a cross to close the active document If it has not yet been saved the Unsaved Documents dialog box will open
71. Z drive 1 Activate the Process Manager tool window 2 To open the Acquisition Settings dialog box click the Acquisition Settings button in the tool window s toolbar 3 Select the Acquisition gt Automatic EFI entry in the tree view 4 Inthe Algorithm list select the Transmitted light exp entry if you re working in the transmitted light mode and the Reflected light entry if you re working in the reflected light mode 5 Select the Automatic frame alignment check box when you re working with a stereo microscope and acquiring the sample at a viewing angle Otherwise clear this check box 6 Close the Acquisition Settings dialog box with OK 7 Carry out all the microscope settings 8 On the Microscope Control toolbar click the button corresponding to the objective you ve set 9 Activate the Camera Control tool window 10 Switch to the live mode 11 Optimize the exposure time The exposure time will be kept constant during the acquisition of the Z stack 12 Click the Autofocus AF button in the Camera Control tool window s toolbar to focus 13 Activate the Process Manager tool window 14 Select the Z Stack acquisition process 15 Select the Top and bottom entry in the Define list 16 Use the arrow buttons in the Z group to move your stage to the Z position at which the lowest lying position on the sample is sharply focused The arrow buttons move the stage either by steps of 2 um or of 20 um e The stage
72. a page of its own for every image Should only this check box have been selected and you have analyzed three images your report will contain exactly three pages Select the Show results in overlay check box if the image layer that contains the results is to be displayed along with the images 3 Click the Finish button The report will be generated and displayed in MS Word The workbook will be created It always contains a minimum of two worksheets On the first worksheet you ll see a Summary of the results On the second worksheet you ll see the details concerning the sample used Should you have analyzed several samples the workbook will contain additional worksheets The Materials Solutions tool window switches back to the start position You can now use all of your software s functions again 00701 12062012 85 Performing a materials science analysis Grains Planimetric 7 4 Grains Planimetric Editing grain boundaries The results of a grains planimetric analysis Documenting the results What is Grains Planimetric The grains planimetric analysis is used to measure grain sizes and to document them It is often used in material analyses for example when the quality of steel or other metals is being tested The grains planimetric analysis determines the grain size by means of the grains area In this way it differs from the intercept analysis that determines the grain size by means of the number of interc
73. age quality according to your requirements Numerous filters and functions are available for this purpose e g various smoothing or sharpness filters and functions to optimize the contrast As well as this you can mirror the images and also rotate them through an arbitrary number of degrees With an automatic image analysis your software searches for areas in an image that have the same intensity or color All of the areas that have the same intensity or color will be assigned to a phase and evaluated This makes it possible to automate typical measurement tasks You can for example determine the area ratios of the different phases in an image You can document the results of your work in a report To do this select the required page templates and images in the Report Composer tool window for example and generate an MS Word report In case you want to insert images workbooks or charts from your software into new or existing MS Word or MS PowerPoint documents use a special Olympus add in for this With the help of this add in you can access all documents and data that you created with your image analysis program from MS Word or MS PowerPoint You can apply different options to all the MS Word or MS PowerPoint report s images detail zooms for example It s sufficient for your image analysis program to be open in the background You can control your microscope s motorized parts via the software For example you can change an obje
74. ages e g by exchanging two images in the stitching area by Drag amp Drop D e The illustration shows the stitching area with four individual images On the left the images 1 and 2 are not in the correct position Image 1 green frame will therefore be dragged onto image 2 red frame On the right you see the stitching area after the two images have been interchanged 7 When the individual images overlap select the Correlation option in the Output gt Alignment list Then your software will search for the same image structures in neighboring 43 Checking a stitched image Acquiring images Creating stitched images individual images The stitched image will be put together in such a way that image areas that are the same will be superimposed 8 Click the OK button to carry out the automatic image alignment e The Multiple Image Alignment Manual Align dialog box opens e The stitched image will be displayed 9 Check the stitched image on display Use the zoom buttons in the dialog box to zoom in the stitched image in the dialog box 100 G e E 10 Should individual images have been incorrectly assembled you can manually shift one or more of them in respect to one another To do this click in the image you want to shift then drag it with your left mouse button depressed in the required direction e The currently selected image will be displayed semi transparently to make it easier for you to find
75. al images will be combined in their full X Y resolution The stitched image will thus display a large sample segment in a higher X Y resolution than would be possible with a single acquisition 1 Load the images you want to combine or acquire a suitable set of images e All of the images you want to combine must be of the same image type You can t e g have a gray value image combined with a true color image e When you acquire the images number their names sequentially e g Image001 Image002 and so on In many cases the images will then already be arranged in the right order in the Multiple Image Alignment dialog box 2 Open the Gallery tool window To do this use e g the View gt Tool Windows gt Gallery command 3 Select all of the images you want to combine in the Gallery tool window 4 Use the Process gt Multiple Image Alignment command This command is only active when more than one image of the same image type has been selected e The Multiple Image Alignment dialog box opens e The dialog box s stitching area will display a preview of the individual images 5 If necessary while keeping your left mouse button depressed drag on the bottom left hand corner of the dialog window to enlarge it Alternatively double click the header of the dialog box to enlarge the dialog box to full screen size 6 Check whether the images positions are correct You can change the arrangement of the individual im
76. ample In this case you can move the slide control to the far right towards the High position If not all of the grain boundaries stand out clearly against the background e g because some grain boundaries are brighter than others a larger intensity range has to be defined for the detection of the grain boundaries In this case move the slide control to the far left towards the Low position In the first illustration the selected threshold value is too high In the Image results step you can see that not all of the grain boundaries have been detected 88 Performing a materials science analysis Grains Planimetric In this illustration a lower value for the threshold values has been given In the Image results step you can see that all of the grain boundaries have now been detected Artifact removal With the help of this slide control you can specify to which size artifacts that are located within the grains are to be ignored for reconstructing the grain boundaries Your software now searches for groups of pixels that have the same intensity as the grain boundaries but which stand alone i e not near a grain boundary The detected artifacts will be ignored during the next step reconstructing the grain boundaries If the slide control is at the Weak position only bigger artifacts will be ignored while small artifacts will still be detected see illustration below If the slide control is at the Strong posi
77. ample under investigation This is done for each inclusion type separately The classification and naming convention of the inclusions differs from industry standard to industry standard The sizes are measured in accordance with the industry standards ASTM E 45 Method A DIN 50602 Method M ISO 4967 Method A GB T 10561 Method A JIS G 0555 Method A UNI 3244 Method M EN 10247 Method M L n EN 10247 Method M L d EN 10247 Method M L d EN 10247 Method M A n EN 10247 Method P A EN 10247 Method P L d The results of an analysis can be displayed in a workbook Additionally or alternatively to that the results can be displayed in an MS Word report 00733 Performing an inclusions worst field analysis Note You can follow these step by step instructions on your PC It describes how you can detect the worst inclusion in a sample Image source step 1 Load the NMIO_0 tif example image 3 e The largest non metallic inclusion is to be measured 2 Activate the Materials Solutions tool window Should this tool window not be visible use the View gt Tool Windows gt Materials Solutions command to have it displayed 3 Click the nclusions Worst Field button In the Image source group choose the Selected images option to analyze the example image This image must have been opened for this purpose and have been selected in the document group 5 Select the Skip Sample information check box 6 Select the All images entry i
78. and the image that is to be checked can be only faintly recognized 3 When you have selected the reference image that is the most similar to the image that is to be checked Click the Accept button e The chosen image s data will be accepted in the Results field e It s possible to accept several reference images for example with samples that have very different structures 4 Click the Next button 108 Image results step Results step Reporting step Performing a materials science analysis Cast Iron Analysis e The Materials Solutions tool window will display the next step 1 Take a look at the results that are shown in the table and also in the image Select the Show graphite detection check box in the Validation group e Every particle that has been detected will then be outlined with a colored line The color with which the particle is outlined shows you to which class it belongs The same colors will be used in the chart i ea ere On the left you see the colored identification of the particles in the image On the right you see the chart of graphite sizes that uses the same colors e Particles that have been detected but that aren t used for the analysis e g because they don t come up to the minimum size that has been set for the program options are shown with a dashed line 2 If you selected several graphite parameters in the Settings step toggle between the different charts 3
79. another on the defined surface The smaller the unit selected the lower the pore density will be 10631 04062012 133 Image source step ROIs step Threshold step Performing a materials science analysis Porosity Performing a porosity measurement Note You can follow these step by step instructions on your PC 1 Load the MacroscopicComponent tif example image e The porosity is to be measured in this image Activate the Materials Solutions tool window Should this tool window not be visible use the View gt Tool Windows gt Materials Solutions command to have it displayed Click the Porosity button In the Image source group choose the Selected images option to analyze the example image This image must have been opened for this purpose and have been selected in the document group Select the Skip Sample information check box e By doing so you skip the Sample information step which is not relevant for this example image Select the All images entry in the Check settings and results list Click the Next button e The Materials Solutions tool window will display the next step For the MacroscopicComponent tif example image define a polygonal ROI which encompasses the shape of the object To do that click the Create Polygonal ROIs fe button and use several mouse clicks in the image to define the corners of a polygon of arbitrary shape For the last corner click using the right instead of the
80. area can either be the whole image or one or more ROls With particles that are on the border of the detection area only the part that is inside the detection area is included in the calculation On the left is a ROI with a particle area fraction of 40 On the right is a ROI with a particle area fraction of 10 Performing a materials science analysis Particle Distribution 3 Inthe diagram below the Image results field the classification of the particles is shown graphically If many classes have been defined a look a the chart is the quickest way to know which class contains most particles Tip You can also select a different way of classifying the results Then the chart can look very different Use the Tools gt Options command and select the Materials Solutions gt Particle Distribution entry in the tree view This command is not available while an analysis is running BU 40 z0 55 50 0 13 0 31 5 1 5 4 65 Note You will get this diagram as a file in OWB format if in the Results step in the analysis you select the Generate chart check box 4 If necessary change the results manually You can delete and add particles Additionally you can split particles manually and merge several previously selected small particles into one big particle Delete particles by first clicking on the particle to be deleted in the image and then clicking on the Delete selected particles button If you
81. as a diameter between about 10 and 50 mm The ball indentation must have the minimum thickness of the sum of all coatings In case of a flat or spherical sample surface the grinding ball s indentation is round If the sample surface is curved in one direction the grinding ball s indentation is ellipse shaped You can choose between the following sample surfaces Flat Cylindrical convex Cylindrical concave Spherical convex or Spherical concave V Q Measurement order Coatings are always measured starting on the outside and working towards the inside This means that on the image the coating s outer border is defined first and following that the inner border The borderlines that have been defined in this way will be shown in color They are located in an additional image layer can be seen in the Layers tool window By default the borderlines are shown in red You can set a different color or thickness for the borderline ut o M 2 em You can see a coating thickness measurement on the flat sample surface One coating has been measured Results of a coating The coating thickness is measured in accordance with the industry standard that thickness measurement ig set in the program options The following industry standards are available e VDI 3824 2001 e EN 1071 2 2002 The results of an analysis can be displayed in a workbook Additionally or alternatively to that the results can be displayed in an MS Word repo
82. ase folder For this purpose the database must be opened in your software Should you work with a version of the software that doesn t support databases the Database entry is hidden e Select the File Explorer entry if you want to insert a document that is stored on your PC or in your network Select the required document in the document preview Click the nsert button e The required document will be inserted into the report e The Insert Document dialog box remains open Insert further documents now or close the dialog box e The path of all documents that you inserted will be saved That enables you to later update the inserted documents by using the Olympus gt Update Placeholders command in case the documents were changed after they have been inserted into the report Inserting a field You can insert a field into a report that describes the image in more detail All of the values that have been saved in your image analysis program for this image can be displayed in this field 1 6 7 8 Select the image in the report to which you want to insert a field If the image is in a grouped object first select the group and then select the image Use the Olympus gt Insert Field command e The nsert Field dialog box opens A description of this dialog box can be found in the online help e Inthe Placeholder list the name of the image into which you want to insert a field appears In the Available fields list se
83. asurement parameters in the image 2 4 D Measuring images Measuring images e A detailed description of this dialog box can be found in the online help Go to the list of all of the available parameters then click the Diameter measurement parameter e On the right an illustration shows you how the parameter is calculated You can see that there are different ways in which the diameter of a 2D object can be calculated Click the Mean entry in the list under the illustration to select the Mean Diameter measurement parameter When you do this the mean value of all of the possible diameters is determined Click the Add Mean Diameter button e This measurement parameter will be adopted in the list All of these measurement parameters will be displayed in the tool window Close the dialog box with OK Take a look at the result for the circle s diameter in the Measurement and ROT tool window Open the Select Measurements dialog box At the bottom of the list of all of the calculated measurement parameters click the Mean Diameter measurement parameter To the right of this list you ll see a button with a blue arrow Click this button to move the measurement parameter to the top of the list Close the dialog box with OK Take a look at the result for the circle s diameter in the image Note The measurement display in the image has to be updated once so that the settings that have been chan
84. asurement and ROI tool window To alter the measurement parameters shown follow these step by step instructions In particular ensure that at least the Length and Angle measurement parameters are displayed as they are both used for the throat thickness measurement 1 In the Measurement and ROI tool window click the Select Measurements re button e Adetailed description of this dialog box can be found in the online help In the Available measurements list click on the Measurement column title to alphabetically sort all of the parameters Select the Length measurement parameter in the Available measurements list This measurement parameter corresponds to the throat thickness un Click the Add Length button to have the Length measurement parameter added to the list of calculated measurement parameters Also add the Angle parameter to the list of calculated measurement parameters You can now further modify the display of the measurement parameters for a throat thickness measurement You can for instance delete all other measurement parameters currently shown so that the list of the measurement results becomes clearer Close the dialog box with OK Do a throat thickness measurement and examine the result in the Measurement and ROI tool window 61 Displaying measured angles in addition to the throat thickness in the image Loading an image Measuring asymmetry Measuring images Measuring welding seams
85. asurement negatively Set the smoothness as exactly as possible so that small structures or patterns only just stop being detected Don t choose a larger value than necessary If the image smoothness chosen is unnecessarily great real small grains won t be detected 89 Performing a materials science analysis Grains Planimetric In the first illustration the selected image smoothness is too small With this setting numerous structures e g patterns within the grains are detected and this negatively affects the results of the planimetric measurement In the second illustration a higher value for the image smoothness has been chosen You can clearly see that only a few structures were still detected within the grains Therefore the result of the planimetric measurement is more exact 10284 28062012 90 Performing a materials science analysis Layer Thickness 7 5 Layer Thickness What are layer thickness measurements By using layer thickness measurements you can measure layers on calibrated images automatically or interactively The object that is to be measured is the thickness of one layer or of several layers Each layer is defined by two borders and a neutral fiber The neutral fiber is a reference line which is there to specify the layer s course The neutral fiber is automatically defined by the program You can define either open or closed layer types When you have a closed layer type you can measure cir
86. ath button if you would like to use a stage path for several analyses The following information will be saved e The number of samples e The data entered about the sample e All of the defined stage positions i e the flags for individual XY positions and all defined scan areas e Inspection mode and focus mode In the Stage path list you will find all of the stage paths that already exist 1 Select a stage path from the list to load the sample information and stage positions defined in the stage path e f one of the positions in the stage path is outside of the currently defined stage area you will be presented with an error message In this case you will not be able to load the stage path Note The Stage path list contains the stage paths saved by you as well as those saved by any other user with Public access rights You will not see stage paths saved by other users with Private access rights You can edit the stage path and thus adapt it to the current sample 1 Double click on an entry in the Samples list to open the Sample information dialog box Here you can change all of the loaded sample information 2 Define new stage positions for individual samples or delete individual stage positions from the Scan Areas list 3 Click this button H next to the Stage path list to save the altered stage path under a new name or to overwrite the existing stage path Click this button next to the Stage path list to open the Manag
87. ating Thickness Note Which of theses analysis processes are available to you depends on the software license you ve acquired Maybe you will only see one or two analysis processes 65 Makeup of the tool window 1 Name of the analysis and Instructions group 2 Dynamic area 3 Current step in the analysis 4 Buttons Performing a materials science analysis Tool window Materials Solutions Starting an analysis process You start an analysis process by clicking the corresponding button Note A lot of your software s other functions aren t available while an analysis process is running For example you can t open the program options then Independent of which analysis process has been currently selected the tool window Is always configured in the same way It comprises static and dynamic areas The static areas 1 3 and 4 are located at the top and bottom edges of the tool window The contents of these areas is always largely similar The dynamic area 2 is located in the middle part of the tool window Its appearance differs according to which step and which analysis process has been chosen You ll find the name of the current acquisition process right at the top of the tool window In the nstructions group you will find an instruction of what to do in this step and if available additional information The contents of this area changes completely for each analysis process and
88. be displayed as an intercept point in the image Which line pattern is suitable for a specific task depends on the type of structures that are to be measured and their position in the image The following line patterns are available Three circles are placed in the center of the image The size of the measurement pattern corresponds to the diameter of the largest circle This line pattern is appropriate for images with structures distributed equally throughout the image or structures which progress from the middle of the image to the edges The cross consists of two diagonally crossed lines as well as a line each below and to the left of this cross The size of the measurement pattern corresponds to the length of the horizontal line below the cross The Cross and Circles line pattern combines the two line patterns Cross and Circles With this line pattern horizontal lines are distributed evenly across the measurement pattern With this line pattern vertical lines are distributed evenly across the measurement pattern With this line pattern horizontal and vertical lines are distributed evenly across the measurement pattern forming a grid 81 Grain boundary width Noise reduction Image source step Performing a materials science analysis Grains Intercept 2 Slide controls for changing the results displayed Two slide controls are available You can change the position of the slide controls however you want to in
89. bjects The commands in the Olympus menu Detail Zoom for example can only be carried out when an image has been selected in MS PowerPoint or MS Word You usually select an image with a simple mouse click When you are working with grouped objects however select the whole group with the first mouse click You can recognize it by the white selection markers The image only gets selected when you click on it a second time You can recognize it by the gray selection markers that are displayed additionally 164 Prerequisite The contents of a template Creating reports Working with the Olympus MS Office add in Supralonductor_tit i SupraConductor tit 1 FS 17 20 57 C106 17 26 57 on mm x mrs O gl mm E oe O Left A grouped object composed of an image and some text is selected Right The image a part of the grouped object is additionally selected You can recognize it by the gray selection markers see arrows Now you can carry out commands in the Olympus menu Detail Zoom for example Note During the installation of your image analysis program some predefined slide templates for working with reports in MS PowerPoint were installed too These slide templates contain grouped objects For this reason make sure that the image which is part of the grouped object is selected additionally before you open the Olympus menu 10404 23042013 Creating and editing a new template During the installation of your image analysis
90. carry out chart comparisons on live images you can immediately reject the samples that don t meet the required values If the Chart Comparison To be able to carry out chart comparisons with the image analysis program the aa a a PIA charts from at least one industry standard have to be installed Only then will the Ua ae Chart Comparison analysis process be displayed in the Materials Solutions tool window Window The industry standards that are to be used for the chart comparison have to be purchased They can be purchased through Olympus Soft Imaging Solutions You will receive a DVD for each industry standard that you purchase 76 Image source step Performing a materials science analysis Chart comparison Use the Quick Setup Guide which accompanies the DVD to install the industry standard s charts Note Even if you haven t purchased an industry standard yet you can still view the Chart Comparison analysis process To do this install a demo plate Using this you can get an impression of how this analysis process works Real analyses complying with industry standards are however not possible using these demo plates An instruction on how to install demo plates can be found in the online help 00723 06052013 Performing a chart comparison Prerequisites The Chart Comparison analysis process is only displayed in the Materials Solutions tool window when you have purchased at least one industry standard and have installed its
91. ce specified in the Scan Areas list Take this into account when defining the stage positions In the Inspection Mode group select how the scan areas are to be analyzed You can redefine scan areas and XY positions which have already been defined In contrast to deleting a stage position and then adding a new one the name of the stage position will not be changed You can for instance use this option to adjust an existing stage path for a different sample 1 From the Scan Areas list select one of the stage positions shown e g Rectangle 2 Move the XY stage to the position on the sample to which you would like to move the selected stage position Click this button Ral to redefine the selected Rectangle 2 stage position For a scan area you will also have to redefine the size in this case e The name of the new stage position will remain unchanged Rectangle 2 72 Defining the reference position Performing a materials science analysis Tool window Materials Solutions 4 Aligning the sample With some materials science inspection modes the measurement has to be carried out at certain positions on the sample In this case all samples on the stage have to be positioned the same way so that the stage path can go to the correct positions on the sample Use the functions in the Sample alignment group to compensate for differing alignments of the samples on the stage Example You can use the Automatic Measurement solut
92. ct Measurement Objects ir button to switch to a selection mode and then click on the measurement object in the image window You can find this button e g on the Measurement and ROI tool window s toolbar Directly after a throat thickness measurement the measurement object will automatically be selected 10 Click on the vertex 11 Keep the left mouse button pressed and drag the vertex towards the outer seam of the weld towards the base of the triangle In this way you are moving a second auxiliary line This auxiliary line must also lie with its full length just within the weld s cross section 60 Saving the image Finishing the measurement Adjusting measurement parameters Measuring images Measuring welding seams If the root of the weld is exposed drag another auxiliary line 3 from the vertex 1 The throat thickness is now the distance 2 between the two auxiliary lines which are perpendicular to the bisector of the angle 12 13 14 Save the image in the TIF or VSI file format The measurements will then also be saved in the image file They can at any time be edited deleted or augmented You can now measure other images If the Throat Thickness button is still active click on the button again to finish measurement mode Changing settings for a throat thickness measurement During each interactive measurement significantly more values are measured than can be shown in the image or in the Me
93. ct the Generate Workbook check box to have a document of the workbook type automatically created at the end of the analysis If you want to save the current settings to a file click the Save settings button Then assign a descriptive name in the next dialog box Define the report that contains the measurement results 00738 28062012 115 Performing a materials science analysis Inclusions Worst Field Editing inclusions You can manually edit the inclusions that your software found automatically In the mage results step you have the possibility of deleting splitting or joining inclusions and you can also change their type Please note If you have manually corrected inclusions and return to the Settings step e g to change the settings of the slide controls your manual corrections will be deleted Merging inclusions 1 Enlarge the display of the image until you can easily recognize the two inclusions that you want to join e Inthis example these two inclusions are to be joined 2 Inthe Edit inclusions group click the Merge inclusions button e The mouse pointer will change its form You will then be in edit mode The only thing you can do now is to add inclusions In this mode other work with your software isn t possible 3 With your left mouse buiton click the two inclusions Should you join two inclusions that belong to different inclusion types the inclusion type of the first inclusion you
94. cted stage position Editing stage positions Deleting stage positions You can mark several positions on your sample At each XY position an image will be acquired and will be analyzed with the selected materials science procedure 1 Select a sample from the Samples list 2 Move the XY stage to a position on the sample at which you would like to take the current materials science measurement e o navigate the XY stage you can for example use the Microscope Control or the Stage Navigator tool window Both tool windows will automatically be displayed in the Stage path settings step in the analysis e Inthe Stage path settings step your system will automatically switch to live mode so that you can examine the live image to check whether the position on the sample is suitable for analysis 3 Click this button Pes located next to the Scan Areas list e The current position of the XY stage will now be saved and assigned to the selected sample e The defined XY position will be marked by a flag in the Stage Navigator tool window 71 O O Adding scan m areas Editing stage positions Performing a materials science analysis Tool window Materials Solutions Move the XY stage to the next position on the sample where you would like to take a measurement e The stage will later be moved to the positions specified and in the sequence specified in the Scan Areas list Take this into account when defining the sta
95. ctive load an ND filter or open and close a shutter with your software To make this communication function the components must not only be motorized but also have been configured in the software 00017 15052013 8 User interface Overview 2 User interface 2 1 Overview The graphical user interface determines your software s appearance It specifies which menus there are how the individual functions can be called up how and where data e g images is displayed and much more Here the basic elements of the user interface are described Note Your software s user interface can be adapted to suit the requirements of individual users and tasks You can e g configure the toolbars create new layouts or modify the document group in such a way that several images can be displayed at the same time Appearance of the user interface The illustration shows the schematic user interface with its basic elements 1 Menu bar Document group Toolbars Tool windows Status bar Sr Sr _ 2 3 4 5 1 Menu bar You can call up many commands by using the corresponding menu Your software s menu bar can be configured to suit your requirements Use the Tools gt Customization gt Start Customize Mode command to add menus modify or delete them You can find more information in the online help 2 Document group The document group contains all loaded documents These can be of all
96. cular layer structures In this mode the measurement line s first point is automatically connected to its last point Se pas a a r E a a Saws 07509701 100 pma Measuring an open layer In the image two layers have been measured You can see 4 layer borders blue lines and two neutral fibers green lines The measurement lines yellow lines are shown for the currently selected layer Measuring a closed layer In the image the outer layer has been measured You can see the layer borders blue lines the neutral fiber green line and the measurement lines black lines Results ofa layer The results of an analysis can be displayed in a workbook Additionally or thickness measurement alternatively to that the results can be displayed in an MS Word report 91 Performing a materials science analysis Layer Thickness The borders that have been found the neutral fibers and the measurement lines will be saved together with the image if you save it in TIF or VSI format This information will be saved in a separate image layer that you can show and hide via the Layers tool window General procedure for a layer thickness measurement 1 Select the analysis process Click the Layer Thickness button located in the Materials Solutions tool window 2 Image source step Choose the image you want to measure 3 Settings step Choose the definition method you want to use Automatic
97. d to at least one sample With the new stage path a new entry in the Samples list will always also be produced If you click on the Creates a new stage path button the Sample information dialog box will be opened first 69 H Saving a stage path Using an existing stage path Managing existing stage paths Performing a materials science analysis Tool window Materials Solutions 2 Inthe Sample information dialog box you enter information about the sample By default the Reference Group and Comment fields are available to enter details for the sample e If you have changed the default settings the Reference and Group fields can also have another name You can change the default settings in the Tools gt Options gt Materials Solutions dialog box e You ll see this information when you create a workbook or a report at the end of the analysis 3 Close the Sample information dialog box with OK to create the new stage path e The new stage path is added to the Stage path list Once created the stage path is empty and still has to be completely defined e Now define scan areas and or XY positions on your sample Note There can only ever be one stage path active If you define a new stage path you will automatically remove all of the currently defined samples and stage positions You should thus save a stage path which you would like to use again before defining a new stage path Click the Saves the current stage p
98. dard contains 1 Inthe Style group choose how the images are to be arranged in the document group for the comparison Choose an arrangement in which the 107 Performing a materials science analysis Cast Iron Analysis GlobularGraphite tif image and the selected reference image are superimposed To do this click this button e Inthe Overview field you see the arrangement that has been chosen The selected reference image is framed in red EREE e The Cast Iron Distribution document will now be displayed in the document group It contains exactly one image 2 Compare the graphite distribution of the current image with that of the reference image Move the slide control below the Style field towards the Opaque position if the image that is to be checked is to superimpose the reference image Alternatively move the slide control towards the Transparent position if the image that is to be checked is to be superimposed by the reference image If you want to choose another reference image in the Overview field click that image with your left mouse button Mat The illustration on the left shows the image that is to be checked Because the slide control is located in near the Opaque position the reference image s structures can only be faintly recognized For the illustration on the right the slide control has been moved towards the Transparent position Now the reference image can be clearly recognized
99. de these minima in the profile are used to determine the intercept points In the illustration shown the grain boundaries are dark the process can however also be used on images with light grain boundaries The analysis of cascaded grain boundaries with multi phase materials is also possible An intercept analysis provides the so called G value which is defined as a characteristic grain size in the corresponding industry standards G is calculated from the number of intercept points and the mean intercept length The grain sizes are measured in accordance with the industry standards ASTM E112 GB T 6394 GOST 5639 ISO 643 DIN 50601 JIS G 0551 JIS G 0552 The results of an analysis can be displayed in a workbook Additionally or alternatively to that the results can be displayed in an MS Word report 00700 80 Circles Cross Cross and Circles Horizontal Lines Vertical Lines Horizontal and vertical lines Performing a materials science analysis Grains Intercept Settings for the intercept analysis In this step you make important settings for the analysis The following options are available A mog 1 Selection of the line pattern The line pattern determines along which lines the intercept points are looked for At every position along the line intensity deviations will be searched for in the intensity profile As soon as an intensity deviation fulfills the definition criteria set it will
100. dows that are available Every tool window is identified by its own icon The icons of the currently displayed tool windows will appear clicked You can recognize this status by the icon s background color Use this list to make tool windows appear 00037 2 5 Working with documents Autosave and close You can choose from a number of possibilities when you want to open save or close documents As a rule these documents will be images In addition your software supports some other document types You will find a list of supported documents in the online help Saving documents You should always save important documents immediately following their acquisition You can recognize documents that have not been saved by the star icon after the document s name There are a number of ways in which you can save documents 1 To save a single document activate the document in the document group and use the File gt Save As command 2 Use the Documents tool window Select the desired document and use the Save command in the context menu For the selection of documents the standard MS Windows conventions for multiple selection are valid 3 Use the Gallery tool window Select the desired document and use the Save command in the context menu For the selection of documents the standard MS Windows conventions for multiple selection are valid 4 Save your documents in a database That enables you to store all manner of data that b
101. e Stage Paths dialog box Here you can copy an existing stage path rename or delete it Note Public stage paths can be edited and even deleted by every user of your software 70 Adding and deleting samples Viewing and changing the sample data g Adding XY positions Performing a materials science analysis Tool window Materials Solutions 2 Defining samples Prerequisite The Samples list isn t available for all materials science analysis processes The Samples field lists all samples which are defined in the current stage path After the name of the sample in brackets you will find the number of stage positions currently defined for this sample Click this button oF to add a new sample to the current stage path The Sample information dialog box automatically opens Here you can enter information about the sample Select one of the samples listed Click this button xX to delete the selected sample All scan areas and XY positions which were defined for this sample will also be deleted Double click on a sample to open the Sample information dialog box with the current sample information and if necessary to edit it 3 Defining scan areas and or XY positions Use the Scan Areas group to define stage positions on the selected sample to edit existing stage positions and to move the XY microscope stage The following buttons are available ras Adding XY positions RA Moving the XY stage to the sele
102. e Undo Pipet a button to undo the last selections step by step Click on the Redo Pipet button to restore the last selections that were undone step by step Adding changing and deleting phases Click on the Add Phase 7 button to add a phase for which the threshold values are to be calculated automatically Double click on the field in the Phase Name column to enter a name for the phase Double click on the field in the Color column to choose a color The phase will be displayed in the color you have assigned it in the image window and in the histogram The intensity range for the phase will be automatically calculated In the Min field the lower threshold value will be specified In the Max field the higher value will be specified You can change the values here or you can change them interactively in the histogram Click on the Remove Phase X button to delete a phase It s only possible to remove a phase when at least two phases have been defined 3 Changing threshold values interactively in the histogram The histogram shows the intensity distribution of the active image If the image mainly consists of light and dark areas the histogram will show two peaks A peak is an intensity value or an intensity range which occurs particularly frequently in the image 131 Performing a materials science analysis Porosity The intensity range which was defined for a phase will be shown as a colored Slide in the histog
103. e image and can also be issued as a sheet Prerequisite For making measurements correctly calibrated images are an essential prerequisite Images that you have acquired with your software will have been automatically correctly calibrated when you have specified the objective you used Should the image not yet have been calibrated use the Image gt Calibrate Image command to carry out a calibration Selecting the measurement environment Switch to the Processing layout when you want to measure images You can find the Measurement and ROI tool window in the bottom section of this layout In this tool window you have fast access to all measurement functions and settings which relate to the measurement This tool window is at the same time the measurement display and contains all of the values that have been measured on the active image Note Should right at the bottom of the user interface several tool windows lie one over the other activate the Measurement and ROI tool window by clicking on the header of the Ir Measurement and ROI tab The tabs can be found under the tool windows Starting a measurement Begin a measurement by selecting the measurement function you want You will find the measurement function in the Measurement and ROI tool window on the Measurement and ROI toolbar or in the Measure menu As soon as you have clicked a measurement function your software will automatically switch to a measurement mode In the
104. e the required tool window by clicking the title of the corresponding tab below the window You can only position tool windows as you wish when you are in the expert mode You can at any time float a tool window The tool window then behaves exactly the way a dialog box does To release a tool window from its docked position click on its header with your left mouse button Then while keeping the left mouse button depressed drag the tool window to wherever you want it Tool windows and their positions are saved together with the layout and are available at the same position the next time you start your software Resetting the layout using the View gt Layout gt Reset Current Layout command will have the result that only the tool windows that are defined by default will be displayed 13 User interface Working with documents Buttons in the header In the header of every tool window you will find the three buttons Help Auto Hide and Close Click the Help button to open the online help for the tool window Click the Auto Hide button to minimize the tool window Click the Close button to hide the tool window You can make it reappear at any time for example with the View gt Too Windows command Context menu of the header To open a context menu rightclick a tool window s header The context menu can contain the Auto Hide and Transparency commands Additionally the context menu contains a list of all of the tool win
105. e to be measured in the schematic illustration Schematic illustration Required measurement parameters 1 d diameter of the through hole additional remarks further below 1 4 thickness of the surface plating B1 6 thickness of the plating inside the through hole d diameter of the microvia T thickness of the panel 1 S2 thickness of the surface plating Bmin minimum thickness at the bottom of the microvia additional remarks further below d diameter of the microvia T thickness of the panel 1 S2 thickness of the surface plating C1 C2 minimum corner plating thickness D the dimple s height or depth additional remarks further below d diameter of the microvia T thickness of the panel 1 4 thickness of the surface plating C1 4 minimum corner plating thickness at the top and bottom of the microvia Dt the dimple s height or depth at the upper side Db the dimple s height or depth at the lower side additional remarks further below You can t precisely measure the actual through hole diameter on the panel s cross section if the cross section doesn t run exactly through the center of the hole Therefore a separate measurement of the hole s diameter is needed on a flat section of the through hole Look for the minimum plating thickness in the area that is indicated in the illustration Measure this thickness to get theBmin parameter A Dimple represents the difference in heigh
106. ecome larger and more particles are found e To reduce or increase the intensity range in the tool window s table change the values in the Min and Max fields Alternatively interactively change the lower and upper threshold values in the histogram shown at the bottom of the tool window Move the mouse pointer over the edge of 147 Classification step Performing a materials science analysis Particle Distribution the phase until the pointer changes and with the left mouse button pressed drag the edge in the required direction Plea Cee oy ee ar De ee ee i1 J0 100 150 200 2 For this example leave the Auto split particles check box found below the histogram unselected e If this check box is selected a morphological filter for separating objects is applied before the objects are counted The parameters according to which the separation is carried out are preset Note With the selected GlobularGraphite tif example image the use of this morphological filter results in only slightly different results However with other images the results may be very different depending on the status of the Auto split particles check box For this reason check whether for your own images it s better to have this check box selected or not Example f ay Ses i gt F i a p r F k E a i O i a i M a a i cas je ya I P Example of an image for which the status of the
107. ective Selecting the storage location Selecting the compression method Setting the image quality With your software you can acquire movies and time stacks Recording a movie You can use your software to record a movie When you do this your camera will acquire aS many images as it can within an arbitrary period of time The movie will be saved as a file in the AVI format You can use your software to play it back 1 Switch to the Acquisition layout To do this use e g the View gt Layout gt Acquisition command 2 On the Microscope Control toolbar click the button with the objective that you want to use for the movie acquisition 3 Inthe Camera Control tool window s toolbar click the Acquisition Settings button e The Acquisition Settings dialog box opens Select the Saving gt Movie entry in the tree structure 5 You have to decide how a movie is to be saved after the acquisition Select theFilesystem entry in the Automatic save gt Destination list to automatically save the movies you have acquired e The Path field located in the Directory group shows the directory that will currently be used when your movies are automatically saved 6 Click the button next to the Path field to alter the directory e The AVI file format is preset in the File type list This is a fixed setting that cannot be changed 7 Click the Options button when you want to compress the AVI file in order to reduce the
108. ed the acquisition processes described in this topic Acquiring a stitched image without a motorized XY stage Manual MIA Task You want to acquire an image of a large sample area Use the Manual MIA acquisition process to acquire several individual images of adjoining positions on the sample and to have them combined into a stitched image MIA stands for Multiple Image Alignment Prerequisite The camera is aligned parallel to the XY stage The angle between camera and stage should be smaller than 1 1 Switch to the Acquisition layout To do this use e g the View gt Layout gt Acquisition command Selecting an objective 2 On the Microscope Control toolbar click the button with the objective that you want to use for the acquisition of the stitched image Setting the image 3 Switch to the live mode and select the optimal settings for your acquisition quality in the Camera Control tool window Pay special attention to setting the correct exposure time This exposure time will be used for all of the stitched image s individual images 34 Selecting the acquisition process P a Ae Selecting the acquisition parameters Acquiring a stitched image oo oo N 9 Acquiring images Creating stitched images Find the position on the sample at which you want to start acquiring the stitched image Finish the live mode Activate the Process Manager tool window Select the Manual Processes option
109. edit every number in the field To do so simply click in front of the number you want to edit Click the button with the lock 2 located to the right of the field to specify that the acquisition time is no longer to be changed Specify how many frames are to be acquired Enter e g 10 in the Cycles field e The nterval field will be updated It shows you the time that will elapse between two consecutive frames Click the Start button e The acquisition of the time stack will start immediately e The Start Process button changes into the Pause m button A click on this button will interrupt the acquisition process e The Stop m button will become active A click on this button will stop the acquisition process The images of the time stack acquired until this moment will be preserved e Atthe bottom left in the status bar the progress bar will appear It informs you about the number of images that are still to be acquired e The acquisition has been completed when you can once more see the Start button in the Process Manager tool window and the progress bar has been faded out e You will see the time stack you ve acquired in the image window Use the navigation bar located in the image window to view the time stack You can find more information on the navigation bar in the online help e The time stack that has been acquired will be automatically saved The storage directory is shown in the Acquisition Settings gt Saving
110. eginning and the end of this border will be indicated by two green crosses Now define the second border To do so click with your left mouse button again at the position where this border is to begin Then click with your left mouse button again at the position where this border is to end e The beginning and the end of this second border will be indicated by two blue crosses 95 Edit borders step Define layers step J Image results step Performing a materials science analysis Layer Thickness 5 Click once with your right mouse button in the image e The borders that have been defined will be plotted in blue Since you don t want to define any additional borders Then click once more with your right mouse button in the image to switch off the mode for defining the borders Click the Next button Since you have already defined both of the borders and don t want to change them Click the Next button Click the Add layers button Click the first border Click the second border g a ct Se hen er Sa TP a x Re al pee is m F a a ee Lo i 7 ae i e The layer has now been defined The neutral fiber is plotted in green It always lies in the middle of the layer Click your right mouse button to finish the definition of the layer Click the Next button Take a look at the results of the current image shown in the Image results group This group contains a table with the measurem
111. eight map in the Layers tool window Click the Set Layer Opacity 5 button located on the toolbar at the top of the tool window Drag the slider all the way to the right to an opacity of 100 then take a look at the height map e Low lying structures can be recognized by their dark gray values structures that lie higher by their bright gray values Click its eye icon to make the corresponding layer disappear By doing this you can e g for a time remove the measurements from the image Click an empty cell without an eye icon to make the corresponding layer reappear 00154 57 Measuring images Measuring welding seams 6 3 Measuring welding seams Starting a measurement Interactive measurement functions and weld measurements Loading an image What is a weld measurement Measuring the cross section of a weld is a method commonly used for judging a weld s quality With the Weld Measurement solution you can interactively measure microscope images of weld cross sections and can output the results on the image and in a table The following measurement functions are available Use this measurement function to determine the distance from several measurement points to a reference line a Multiple perpendicular lines Use this measurement function to construct the perpendicular bisector of the connection between two Asymmetry Lines reference points and to determine the distance of a measureme
112. elongs together in one location Search and filter functions make it quick and easy to locate saved documents Detailed information on inserting documents into a database can be found in the online help 1 When you exit your software all data that has not yet been saved will be listed in the Unsaved Documents dialog box This gives you the chance to decide which document you still want to save 2 With some acquisition processes the acquired images will be automatically saved after the acquisition has finished 14 Closing all documents Closing a document immediately Generating a test image User interface Working with documents 3 You can also configure your software in such a way that all images are saved automatically after image acquisition To do so use the Acquisition Settings gt Saving dialog box Here you can also configure your software in such a way that all images are automatically saved in a database after the image acquisition Closing documents There are a number of ways in which you can close documents 1 Use the Documents tool window Select the desired documents and use the Close command in the context menu For the selection of documents the standard MS Windows conventions for multiple selection are valid 2 To close a single document activate the document in the document group and use the File gt Close command Alternatively you can click the button with the cross Ed You will find this bu
113. en calculate how densely the objects found lie next to one another on the defined surface The smaller the unit selected the lower the pore density will be 6 Click the Next button e The Materials Solutions tool window will display the next step 136 Image results step Results step Reporting step Performing a materials science analysis Porosity In this step in the analysis all of the objects used to determine the percentage porosity value will be shown in the color of the phase Please note that even objects which were ignored when determining the pore count and were thus shown hatched in the previous step will be used to determine the percentage porosity value This is why these previously hatched objects will now again be shown in the color of the phase 1 Take a look at the results that are shown in the table In the mage results field you will see the pore count and the percentage porosity value 2 If necessary manually change which objects your software uses to determine the percentage porosity value You can delete or add objects 3 Click the Next button Select the results you want 1 Select the Default option to use the document template that has been defined as the default document template The document template determines e g the appearance of the report s header and footer 2 Inthe Content group select the check box for the pages the report should contain
114. ent If you would like to examine the individual measurements again later on save a workbook in the database in the Reporting step Click the Get Results button With this the actual throwing power measurement is finished Acquire pictures for the report now and then create the report To get statistically reliable measurement results you will have to measure several though holes or microvia You can set a required minimum number of between 1 and 10 To do this use the Tools gt Options gt Materials Solutions gt Throwing Power dialog box Three measurements is preset as the minimum number If you finish the measurement before that a corresponding warning message will be produced During the analysis the arithmetic mean of all of the measurements carried out will be calculated If the standard deviation for a measurement parameter exceeds 5 you will also be presented with a corresponding warning In this case measure another five structures on the panel to increase the statistical reliability 10594 25062012 Performing a throwing power measurement Example these step by step instructions describe the Microvias measurement method as an example for a throwing power measurement The other measurement methods which are available work in a similar way 1 Prepare the throwing power measurement Note all of the requirements for this listed here 2 Activate the Materials Solutions tool window Should this tool window not be vi
115. ent results e The values in the Steps Distance and Type fields can be edited when you double click in the cell you want to edit You can find more information on this topic in the online help e The lower part of the group contains several buttons with which you can change the way the layer thickness measurement is displayed You can find more information on this topic in the online help Sues the eelis SAAN in plea u e The measurement lines are shown in yellow in the image Click the Next button 96 Results step Reporting step Image source step ww Settings step Magic wand step Ja Performing a materials science analysis Layer Thickness Select the Generate Report check box if you would like to have a report automatically generated in MS Word once the analysis is completed Select the Generate Workbook check box to have a document of the workbook type automatically created at the end of the analysis Define the report that contains the measurement results e The Materials Solutions tool window switches back to the start position You can now use all of your software s functions again e Through the materials analysis measurement the image has collected one or more additional layers can be seen in the Layers tool window If required save the image in TIF or VSI format to retain these newly created image layers 00732 12062012 Performing a layer thickness measurement with the magic wand cl
116. ept points Samples with dark grain boundaries or samples with bright grain boundaries can be used The analysis of cascaded grain boundaries with multi phase materials is also ae The image shown above shows the results of an automatic detection of the grain boundaries The grain boundaries that have been detected are plotted in red first illustration Additionally it s possible to have the grains that have been found displayed in color second illustration When this is done the original image isn t changed because this information is written to another image layer You can manually edit the grain boundaries that your software found automatically When you do this you have the possibility of deleting superfluous grain boundaries and adding boundaries that are missing A grains planimetric analysis provides the so called G value which is defined as a characteristic grain size in the corresponding industry standards The grain sizes are measured in accordance with the industry standards ASTM E112 GB T 6394 GOST 5639 ISO 643 DIN 50601 JIS G 0551 JIS G 0552 The results of an analysis can be displayed in a workbook and in a chart Additionally the results can be displayed in a MS Word report G 4 15 00720 86 Performing a materials science analysis Grains Planimetric Settings for the planimetric analysis In this step you make important settings for the analysis You ll only see some of the setting option
117. er inclusions 8 Click your right mouse button to leave the edit mode and to accept the changes e The results will be updated Deleting an inclusion 1 Enlarge the display of the image until you can easily recognize the inclusion that is to be deleted 2 Inthe Edit inclusions group click the Delete inclusion button e The mouse pointer will change its form You will then be in edit mode The only thing you can do now is to delete inclusions In this mode other work with your software isn t possible 3 Position your mouse pointer on the inclusion that is to be deleted e The line surrounding the inclusion will be displayed bold 4 Click the left mouse button e The inclusion will be deleted 1y 5 Ifyou want to you can delete further inclusions 6 Click your right mouse button to leave the edit mode and to accept the changes e The results will be updated 117 Performing a materials science analysis Inclusions Worst Field Changing the inclusion type 1 Enlarge the display of the image until you can easily recognize the inclusion that is to be changed 2 Inthe Edit inclusions group click the Change inclusion type button e The mouse pointer will change its form You will then be in edit mode The only thing you can do now is to change an inclusion s type In this mode other work with your software isn t possible 3 Position your mouse pointer on the inclusion whose type is to be changed
118. es Main features of your software You can use your system to acquire high resolution images of a sample in a few steps Your system is comprised of your software and the hardware e g microscope and camera During image acquisition the data from the camera which is mounted on your microscope will be read out and displayed on your computer s monitor You can first examine the live image and adjust it optimally The live image will be constantly updated i e when you for example move the stage to a different position the live image will be changed accordingly You can switch the live image on and off and acquire a photo of the parts of the sample that interest you When you do this you will create a digital image that you can save and process or analyze with a variety of your software s functions A multi dimensional image is always made up of several frames These have for example been acquired at different times or in different focus positions With your software you can e g acquire a time stack or a Z stack For optimum viewing of multi dimensional images use the separate navigation bar that is shown directly in the image window when a multi dimensional image is loaded With your software you can acquire images which have a practically unlimited depth of focus These images are called EFI images EFI is the abbreviation for Extended Focal Imaging For the creation of an EFI image the software determines which of the pixels
119. every position 1 Select the XY Positions MIA acquisition process 2 Define several MIA scan areas You can find a step by step instruction on how to define an MIA scan area further above Begin with the area of the sample that is to be scanned first 3 Inthe Process Manager tool window click this button e The Stage Navigator tool window is shown When you have acquired an overview image of your sample you will see this area of the image in the stage navigator s image segment e Inthe Stage Navigator tool window the MIA scan areas that have been defined are displayed They are numbered serially in the order in which they were defined 4 Click the Start button to begin the acquisition of the stitched image e Each of the MIA scan areas will now be scanned and the stitched image created The scan areas will be scanned in the order that is predefined by the numbering e All of the stitched images will be acquired with the current camera and current acquisition settings e When the acquisition process has been completed you ll find a stitched image for each of the MIA scan areas in the document group 42 Acquiring images Selecting images Assembling images Acquiring images Creating stitched images Combining individual images into a stitched image Use the Process gt Multiple Image Alignment menu command to have several separate images combined as with a puzzle into a stitched image The individu
120. exposure range anew either automatically or manually You can also insert an HDR image acquisition into an acquisition process such as during the acquisition of a time lapse image or a Z stack The Process Manager tool window informs you about the status of the HDR image acquisition If the Activate HDR check box is selected in the Camera control tool window the Process Manager tool window shows the Active entry in the HDR field If the check box is deselected the Process Manager tool window shows the entry Off in the HDR field lt is not possible to record movies with HDR Because of this the Activate HDR check box is ignored while the Movie recording check box is selected 07510 04072011 22 Preparations Acquiring an HDR image Acquiring images HDR images Acquiring an HDR image with an automatically set exposure range With this procedure your software automatically determines the exposure range To do so your camera automatically acquires a set of images with various exposure times and measures the amount of over and underexposed pixels The exposure time continues to change until the amount of over and underexposed pixels is within defined limits At this point the exposure range has been defined How much the exposure time is adjusted by is determined by your software with regards to the minimum and maximum exposure time 1 Switch to the Acquisition layout To do this use e g the View gt Layout gt Acqu
121. fering exposure times so that no image segment is left over or underexposed Your software then detects the best exposed pixels in each acquired individual image and merges them into one new image Under correctly defined acquisition conditions the HDR image will no longer contain any under or overexposed image segments Just like with images acquired with Extended Focal Imaging EFI image an HDR image is a rendered image containing information from several images Er se ae eS a 7 na i ee ath r i i Mi r Eri a Here you can see an image acquired of a very reflective metal surface Example 1 shows an image which was not acquired using HDR The reflective segments of the surface are correctly exposed whereas other segments are completely underexposed Example 2 shows an image which was acquired using HDR Without overexposing the reflective segments of the surface now the structures in the dark image segments which were not recognizable before are visible A recently determined exposure range will continue to be used for all HDR images until you let your software determine the exposure range anew It is irrelevant whether the exposure range had been determined automatically or manually If you are acquiring several images of the same or similar parts of a sample you don t need to determine the exposure range each time If you change the sample or adjust settings on the microscope it is recommended to determine the
122. for each step in the analysis It is therefore described each time one of the different analysis process is presented Here you can see at which step in the analysis you are at this moment The current step is indicated by a blue arrow Here you find the buttons you use to proceed to the next step in the analysis or to return to the previous step You can also cancel an analysis here Depending on the current step in the analysis not all of the buttons are active 10242 3042013 66 1 Image source group Performing a materials science analysis Tool window Materials Solutions Selecting the image source The Materials Solutions tool window leads you step by step through a materials science measurement In the mage source step the following options are available A In this group you select the image that you want to analyze You can also analyze several images at the same time The following options are available e Live image option With this option the additional step Image acquisition will be shown In this step a live image will be acquired which will then be analyzed in the following steps When the mage results step has been completed a new image of the live image will be automatically acquired then analyzed This enables you to analyze as many images as you would like during the same measurement You can then either save the analyzed images or reject them e Selected images option L
123. foreground e MS Word or MS PowerPoint will now be shown in the foreground again The edited image will be displayed You can now continue to edit the report e lf your image analysis software was closed before you selected the Adjust Document command it is closed again If any images or databases had to be opened for this command they will be closed as well Your software supports the handling of workbooks A workbook is created for example when you open the Measurement and RO tool window and export a results sheet You can find more information on workbooks in the online help Note If you want to use workbooks in your reports MS Excel must be installed on your PC You require MS Excel 2003 2007 or 2010 Apart from the image and chart document type reports can also contain workbooks A workbook is imported as an Excel object in MS Word or MS PowerPoint You can further edit it in the report 1 In the report double click on the workbook If the workbook Is in a grouped object first select the group and then select the workbook e You will change into the edit mode You can recognize it by the fact that now the column headers and the row numbers are shown In edit mode as well as that you can see all of the workbook s worksheets If need be select the worksheet that you want to edit 3 Double click the workbook in order to switch to edit mode Make the required change e When you want to format individua
124. g box e You can load these settings parameters when you analyze further images To do that for the new image in the mage Source step click the Load from file button 4 Click the Next button Reporting step Define the report that contains the measurement results 00730 12062012 100 Image source step ww Settings step Manual step Hr Performing a materials science analysis Layer Thickness Performing a manual layer thickness measurement Note You can follow these step by step instructions on your PC They describe a layer thickness measurement on an example image 1 Load the Coating with porosity tif example image gt TF tt lj e On this image the middle layer is to be measured 2 Activate the Materials Solutions tool window 3 Click the Layer Thickness button In the Image source group choose the Selected images option to analyze the example image This image must have been opened for this purpose and have been selected in the document group 5 Select the Skip Sample information check box Select the All images entry in the Check settings and results list Click the Next button 1 Click the Manual button 2 Inthe Layer type group click the icon for an open layer 3 Click the Next button 1 Click the Add borders button 2 Define the first border To do so first click with your left mouse button at the position in the image where the border is to begin
125. g box The first one shown is the source image The second is the image that results when the current parameters are used e Most of the image processing operations need one or two of the parameters that are shown in the Settings group 4 Change the image processing operation s parameters After every change that is made in a parameter the operation will be immediately applied to the source image and the resulting image will be shown in the preview window Click the Default button to readopt the preset parameters in the Settings group when the current parameter doesn t make sense to you 45 Processing images Processing images 5 When you have found the optimal parameters click the OK button to have the active image processing operation applied to the image with the active parameters The image processing dialog box will closed Please note that the image processing operation changes the source image No new image document will be created You can however use the Edit gt Undo command to restore the source image 00175 46 Measuring images Overview 6 Measuring images 6 1 Overview Measuring with help of the tool window Working in the measurement mode Finishing the measurement mode Changing the default measurement mode Your software offers a wide range of measurement functions They enable you to quickly count objects and measure segments and areas All the results will be saved together with th
126. g on the outside and working towards the inside This means that the coating s outer border is defined first and following that the inner border 1 Load the CoatingThickness2_GrindingBallDiameter_40mm tif example image or alternatively the image that you want to measure 154 Settings step Performing a materials science analysis Coating Thickness Activate the Materials Solutions tool window Should this tool window not be visible use the View gt Tool Windows gt Materials Solutions command to have it displayed Click the Coating Thickness button In the Image source group choose the Selected images option to analyze the loaded image For this to work this image must be selected in the document group Select the Skip Sample information check box to skip the Sample information step e As soon as you click on the Next button you ll then go directly to the Settings step You can do this if you don t want to enter any information about the sample which is the case here Note If you want to analyze images from more than one sample in the same analysis process the Skip Sample information check box must be cleared Only then will the New Sample button be displayed With this button you can specify when an image to be analyzed belongs to a new sample 6 Select the First image entry in the Check settings and results list e lf you select the First image per sample entry you can check the settin
127. ge placeholder and two images have been selected in the report instruction automatically leads to the creation of two report pages ora Zhe s S 2 If you want to you can still make additional changes in the MS Word application program To do so use the Olympus add in or the Olympus toolbar 3 If you want to save the report instruction and the report Editing a report instruction You can make the changes described below to a report instruction These changes do not apply to reports the have already been created on the basis of this report instruction Therefore you must create a new report in order to see the changes you made This will generate a new MS Word document Any changes that you may have made in the first version of the report will not be contained in the newly created DOC file 1 1 Load the report instruction that you want to edit e Report instructions have the file extension RCI To delete a document template select it and press the Del key on your keyboard Drag the new document template onto the upper part of the report instruction e By doing so the document template is exchanged Please note that a report instruction can only contain one document template e A report instruction must not contain a document template at all When you leave the upper part of the report instruction empty the MS Word default document template will be taken Load the report instruction that you wa
128. ge positions Click the PR button again Repeat the two last steps until you have defined all of the positions on the sample Instead of individual positions you can also define a whole area on your sample for materials science analysis This area can be rectangular or circular 1 3 Click this button C to define a rectangular scan area To do so you move on the sample with the motorized XY stage to the rectangular area s s top left hand corner then to its the bottom right hand corner Click this button O to define a circular scan area by moving the XY stage You define the scan area by moving your XY stage to three points which are on the edge of the round scan area Your software will help here with corresponding message boxes e Your software will automatically calculate how many individual images are required to completely acquire and analyze the defined sample area The number of the individual images depends on the current magnification If you change the magnification the number of images will be recalculated You do not have to redefine the scan area e The scan area is displayed in the Stage Navigator tool window In the stage navigator s image display area you can directly see how many individual images are needed for the defined area at the current objective magnification If you change the magnification the display will be updated e The stage will later be moved to the positions specified and in the sequen
129. ged are also taken into account You update the measurement display for instance by adding another measurement or by once selecting an existing measurement in the image 53 Task Loading an image Measuring the layer thickness Displaying the measurement results of all of the images Viewing the statistical parameter Measuring images Measuring images Measuring several images You want to measure the thickness of a spray coating To do so you acquire several images of the coating Have the results from all images displayed simultaneously Take a look at the mean value for all of the measurements 1 Acquire an image or load one ee a AS F Shas oiim m a Bia i Terei E A aE paa E a eee AA aa i During the installation of your software some sample images have been installed too You can carry these step by step instructions out directly with the example images SprayCoating2 tif and SprayCoating4 tif 2 Activate the first image in the document group 3 Click the Arbitrary Line button located on the toolbar at the top of the Measurement and RO tool window Measure the thickness of the layer at several different places 4 Activate the next image Measure the thickness of the layer at several different places here also 5 Click the Arbitrary Line button again and switch off the length measurement e The layer s thickness has been measured on both images a eee te fogs oe
130. gs for each new sample Click the Next button e The Materials Solutions tool window will display the next step Select the sample surface type For the Coating Thickness2_GrindingBallDiameter_40mm tif example image select the Flat sample surface e You can choose between the following sample surfaces Flat Cylindrical convex Cylindrical concave Spherical convex or Spherical concave 9J gt V Select the crater shape The indentation that the grinding ball makes in the sample s surface is called a crater e lf the Flat Spherical convex or Spherical concave sample surfaces are selected this indentation is round The indentation is elliptical when the Cylindrical convex or Cylindrical concave sample surface types are selected If you selected the Cylindrical convex or Cylindrical concave sample surface types Select the direction of the ellipse s long axis This information is taken into account when calculating the coating thickness Specify how many coatings you want to measure in the Number of coatings field A maximum of 20 coatings can be measured Coatings are always measured starting on the outside and working towards the inside Enter the diameter of the grinding ball used in the Grinding ball diameter field The grinding ball s diameter must be known in order to produce an accurate coating thickness measurement If necessary change the suggested unit If you selected the Spherical convex or Spherical concave
131. gt Process Manager dialog box The preset file format is VSI Note When other programs are running on your PC for instance a virus scanning program it can interfere with the performance when a time stack is being acquired 27 Acquiring images Acquiring a Z stack 00304 4 4 Acquiring a Z stack Selecting an objective Setting the image quality Selecting the acquisition process Selecting the acquisition parameters Acquiring an image A Z stack contains frames acquired at different focus positions That is to say the microscope stage was located in a different Z position for the acquisition of each frame Note You can only use the Z Stack acquisition process when your stage is equipped with a motorized Z drive Acquiring a Z stack Example You want to acquire a Z stack The sample is approximately 50 um thick The Z distance between two frames is to be 2 um A 5 M 1 Switch to the Acquisition layout To do this use e g the View gt Layout gt Acquisition command 2 On the Microscope Control toolbar click the button with the objective that you want to use for the image acquisition 3 Switch to the live mode and select the optimal settings for your acquisition in the Camera Control tool window Pay special attention to setting the correct exposure time This exposure time will be used for all of the frames in the Z stack Search out the required position in the sample 5 Activate the
132. hat you now see the current image twice The two images overlap Since the live image is shown transparent you see both images in the overlap area simultaneously 13 Make a note of a significant structure on the live image s right border You will find the same sample structure in the overlap area On the illustration a significant structure has been indicated by a circle 35 Acquiring images Creating stitched images 14 Now move the stage very slowly to make the structure on the live image move to the left Keep moving the stage until the image structures in the overlap area lie as exactly over each other as possible The image structures need not lie precisely over each other since your software will match the individual images with each other e Inthe overlap area 3 the same image segments are shown now This enables your software to seamlessly combine the two images e You can reverse the direction in which your stage moves in the Device Settings gt Stage dialog box Depending on how you can best orient yourself the live image will then move to the left or to the right when you move your stage to the right 15 Check whether both images have been correctly combined Otherwise you can undo the last step by using the Undo last frame button You can then move the stage again and match the structures better e During the acquisition you can change the current stitched image s zoom factor e g to see ce
133. he camera driver is installed in MS Windows Specifying which hardware is available 1 Start your software 2 Use the Acquire gt Devices gt Device List command 3 Click the Create New Hardware Configuration E button e The Create New Hardware Configuration dialog box will open 4 Enter a name for the new hardware configuration in the Name field It is a good idea to choose a name combining the microscope and camera names for example BX51_DP25 e Under this name you can later reload this hardware configuration in the Device Settings dialog box 5 Select the Copy current hardware configuration option if you have previously chosen your camera and microscope Otherwise choose the Empty hardware configuration option 6 Close the Create New Hardware Configuration dialog box with OK to return to the Device List dialog box 18 Defining a hardware configuration Initializing your devices Configuring your camera Configuring the objective nosepiece Configuring the system Configuring the system e You will then find the new hardware configuration entered in the Configuration field e Once you have completely set up a new hardware configuration all entries from the Device List will be empty You can now enter a completely new definition for the hardware configuration Define the new hardware configuration in the Device List dialog box A description of this dialog box can be found in the online help Begin
134. hich cover a certain range of intensity values If the pores largely have the same intensity values one phase will be sufficient If the pores have very different intensity values then several phases will have to be set up 1 a P a amp Oe Porosity measurement on one image All of the pixels which lie within the defined intensity range will be shown in color during this step in the analysis In the example shown red has been selected for the phase The result of the automatic image analysis can be restricted by the definition of counting conditions Pores which do not meet the counting conditions will not be considered when determining the pore density and their number You can manually adjust the result of the automatic image analysis You do this interactively on the image Note that you are not changing the image itself but the image s measurement layer You can manually delete parts of the image which have been recognized as pores in image analysis one speaks of detected objects This can be necessary if for example artifacts in the image are recognized as pores because they have similar intensity values By manually deleting these objects the artifacts will be excluded from the analysis In addition you can also manually add other image segments which were not detected as such but which are actually pores With the manual addition and deletion of objects you always change the percentage porosity va
135. hing to a layout Which predefined layouts are there Your software s user interface is to a great extent configurable so that it can easily be adapted to meet the requirements of individual users or of different tasks You can define a so called layout that is suitable for the task on hand A layout is an arrangement of the control elements on your monitor that is optimal for the task on hand In any layout only the software functions that are important in respect to this layout will be available Example The Camera Control tool window is only of importance when you acquire images When instead of that you want to measure images you don t need that tool window That s why the Acquisition layout contains the Camera Control tool window whereas in the Processing layout it s hidden The illustration shows you the elements of the user interface that belong to the layout The layout saves the element s size and position regardless of whether they have been shown or hidden When for example you have brought the Windows toolbar into a layout it will only be available for this one layout 1 Toolbars 2 Tool windows 3 Status bar 4 Menu bar To switch backwards and forwards between different layouts click on the right hand side in the menu bar on the name of the layout you want or use the View gt Layout command For important tasks several layouts have already been defined The fo
136. holder for a field 1 Inthe template select the placeholder into which you want to insert a field 2 Use the Olympus gt Templates gt Insert Field Placeholder command e The nsert Field dialog box opens A description of this dialog box can be found in the online help e Inthe Placeholder list the name of the placeholder into which you want to insert a field appears 3 Inthe Available fields list select the field that is to be inserted The entries in this list are arranged hierarchically Click the plus sign to expand the list e Two types of field are available The Document Properties list contains fields that are by default in your software managed for this document type The Database fields list contains all of the fields that are available in the database for the selected placeholder For this purpose a database must have been opened 4 Keep the nsert Field dialog box open Position the mouse pointer on the location in the report where you want to insert the field 5 Inthe nsert Field dialog box click the nsert button e The placeholder for a field will then be displayed You can recognize it by the curly bracket and by the field name shown 6 If necessary add placeholders for further fields To do this repeat the last 3 steps Close the nsert Field dialog box Save the template 00402 25042013 Editing a report If you want to make some changes to a report you created using the Report Composer
137. ices You can see whether the devices are able to be successfully controlled in the Acquire gt Devices gt Device Settings device box Configuring the specified hardware 1 Use the Acquire gt Devices gt Device Settings command e Inthe tree view on the left side you can find all hardware components that you have chosen in the device list 2 Select the Lightpath entry in the Sort by list 3 In the tree view on the left hand side expand the Camera gt lt camera name gt entry e g DP25 Select the Camera Adapter entry 5 Select your camera adapter s magnification on the right hand side of the Magnification list The magnification is imprinted on your camera adapter Common values are 1 00 or 0 63 6 Inthe tree structure either select the General gt Manual Nosepiece entry if you have a manual microscope or General gt Nosepiece lt Name of the nosepiece gt if you have a motorized microscope 19 Configuring the mirror turret Finishing system configuration 10 Configuring the system Configuring the system e On the right hand side of the dialog box the current configuration of the nosepiece will be displayed When you configure the software for the first time the fields for the details referring to your objectives will be empty Choose the objectives which are currently fitted to the nosepiece from the right hand side of the Magnification lists Start with the smallest magnification a
138. ick the Remove button 5 Click OK e The Detail Zoom dialog box is closed The deleted detail Zoom will no longer be shown in the report 00406 25042013 174 OLYMPUS SOFT IMAGING SOLUTIONS GMBH Johann Krane Weg 39 48149 Munster Germany Phone 49 251 7 98 00 0 Fax 49 251 7 98 00 6060 info oss olympus ss com www olympus sis com
139. ience analysis Porosity 1 If necessary you can change the counting conditions Watch how more or less pores are found as the hatched objects in the image increase or decrease 2 Inthe Pore size parameter field choose how the pore size Is calculated e Choose the Max Feret setting to use the maximum spacing of parallel tangents on opposing sides of particles e Choose the Equivalent Circular Diameter setting to use the diameter of a circle which has the same area as the particle 3 The example image is calibrated in millimeters You should thus click on the button which shows the units at the right next to the Counting minimum field and select mm as the units 4 Inthe Counting minimum field enter the minimum size that an object must have to be considered when determining the number of pores In the Counting maximum field enter the maximum size that an object may have to be considered when determining the number of pores Watch how more or less objects are found as the hatched objects in the image increase or decrease During the analysis process you can use your software s zoom function as usual Move your mouse pointer onto the appropriate position in the image then use the mouse wheel to zoom into or out of the image 5 If required in the Unit of pore density field change the units used to show the pore density in the result The unit is always a unit of area e g 1 mm or 1 um Your software will th
140. ilable Which size classes form classes and form factors are used for the classification depends on the industry standard according to which the cast iron analysis is performed e Graphite size Sorts the detected particles into specific classes according to their size e Graphite form Sorts the detected particles into specific classes according to their form e Graphite nodularity Sorts the detected particles into specific classes according to their nodularity The nodularity is a unit of measure for the sphericity of the graphite e Graphite distribution Makes it possible to compare the distribution of the particles in the current image with the distribution in specific reference images When this check box has been selected the additional step the Graphite distribution will be added to the cast iron analysis The graphite distribution types A E can only be determined for lamellar graphite 4 Click the Next button e The Materials Solutions tool window will display the next step Prerequisite You will only see this step if in the previous step you selected the Graphite distribution check box In this step you can compare the particles that have been detected with reference images that show different distributions of graphite particles You can then determine which of the reference images shows a distribution that is most similar to that of the current image The reference images correspond to images that the chosen stan
141. in a report By doing so you can draw attention to especially interesting image details Each image can have up to eight detail zooms The detail zoom factor can be set individually for each detail zoom The maximum detail zoom factor is 10x The appearance of the scale bar and the info stamp can be set separately for each detail zoom Appearance of an MS Word report with an image and several detail zooms In this example the scale bar is shown in both the image as well as all the detail zooms Conversely the info stamp is only shown in the image Adding a detail zoom 1 Open the report in MS Word or MS PowerPoint and select the image to which you want to add a detail zoom If the image is in a grouped object you have to select the group first 2 Use the Olympus gt Detail Zoom command e The Detail Zoom dialog box opens The new detail zoom has already been set up 3 Select the detail zoom To do so click once within the black border in the image e The detail zoom in now selected which you can tell from the blue handles All other software controls in the right part of the dialog box will 172 Changing the size and shape Changing the position Creating reports Working with the Olympus MS Office add in now become active bo 4 Select the detail zoom and drag and drop it to the position you want 5 Change the detail zoom as necessary size shape magnification factor You can find more informa
142. ion to measure test structures on a wafer On the wafer define three positions that are located on every wafer to be measured If you now put a new wafer to be measured on the stage at the beginning of the measurement move the stage to the three reference positions This allows your software to recalculate the stage path 1 Click this button to start the definition of the reference position e A yellow triangle A on the button indicates that no reference positions have been defined yet for this stage path e The Acquire Reference Images for Sample Alignment dialog box opens It guides you step by step through the definition of the reference position 2 Move the stage to reference position 1 and focus In order for the sample alignment to work well the reference positions should meet the following conditions e The reference positions should be unambiguous e The reference positions should be as easy to find on the sample as possible e The reference positions should be as far away from each other as possible 3 Click the Next gt button to move to the next reference position e Your software now acquires an image at the first reference position This image is saved as a reference image together with the stage path Define reference positions 2 and 3 5 Click the Finish button to finalize the definition of the reference positions e The button in the Sample alignment group changes its appearance A green check on the button
143. isition command On the Microscope Control toolbar click the button with the objective that you want to use for the acquisition of the HDR image Switch to the live mode and select the optimal settings for your acquisition in the Camera Control tool window Carry out a white balance Then select an exposure time meaning that no part of the sample is overexposed e The automatic exposure time detection uses this value as a basis and raises the exposure time so as to correctly light even the dark parts of the sample Search for the part of the sample which you want to acquire an HDR image of This should be a position which has such significant differences in brightness that not all segments can be shown with optimal lighting Finish the live mode In the Camera Control tool window select the Activate HDR check box e Inthe upper part of the tool window the Snap button changes to the HDR button In the Determine exposure range group click the Automatic button to have the exposure range determined automatically e The necessary exposure range will now be determined To do so the camera automatically acquires several images which only differ in exposure time This acquisition occurs in the background which means that the images are not shown in the document group The exposure range determined in this way will continue to be used for all HDR images until you let your software determine the exposure range anew e Determining the
144. isplay the next step 142 Object filter step Image results step Results step Performing a materials science analysis Phase analysis In this step in the analysis only the pixels within the defined ROI are considered All objects which meet the conditions defined in the object filter will be shown in the color of the phases All objects which do not meet the conditions defined in the object filter will be shown in this step in the analysis in red hatching This means that these objects will not be taken into account when determining the percentage area of the 1 If necessary change the conditions for the object filter First adjust the units As the SprayCoating tif image was calibrated in micrometers click on the button showing the units to the right next to the Minimum object area field and select um as unit 2 Inthe Minimum object area field enter the minimum size that an object must have to be considered when determining the area fraction covered by the phase You can thus exclude small objects such as dust particles from the determination of the percentage area of the phase Watch how more or less object areas are found as the hatched objects in the image increase or decrease During the analysis process you can use your software s zoom function as usual Move your mouse pointer onto the appropriate position in the image then use the mouse wheel to zoom into or out of the image 3 Click the Next button
145. it possible to change the image display in an report for example to scroll the image segment 1 Double click the image to open the Image Properties dialog box If the image is in a grouped object first select the group and then double click the image 2 Inthe Display group select the Scale bar if calibrated Info Stamp and Border check boxes if these elements are to be displayed e The properties of these elements can be defined in the Options gt Image Information dialog box Click the Options button to open this dialog box 3 Inthe Size group select one of the options that specify how large the image is to be displayed in the report You can find more information on these options in the online help 4 If your settings should apply for all future images click the Set as Default button 5 Click OK e The mage Properties dialog box closes The changed image properties will be shown in the report now Adjusting documents In the report you can select a document of the image or chart type and select the Olympus gt Adjust Document command You will then change over to the image analysis software where you can edit the document and then automatically change back to the report Example In the MS Word or MS PowerPoint application program you edit a report that contains a lot of images With a certain image you notice that an important measurement is missing Using the Adjust Document command you change over
146. ith which you can change the way the layer thickness measurement is displayed You can find more information on this topic in the online help 102 Performing a materials science analysis Layer Thickness 2 Check the results shown in the image e The measurement lines are shown in yellow in the image 3 Click the Next button Results step Select the results you want Reporting step Define the report that contains the measurement results 00731 12062012 103 Performing a materials science analysis Cast Iron Analysis 7 6 Cast Iron Analysis Determination of the graphite fraction Results of a cast iron analysis made to determine the graphite fraction What is a cast iron analysis The quality and consistency of cast iron depends on the distribution and the morphology of its carbon content By using a cast iron analysis you can determine the cast iron s graphite fraction with the help of unetched samples As well as that with the help of etched samples you can determine the ferrite pearlite ratio The classification of the detected particles is performed according to the industrial standard that is selected in the program options Each standard requires a different classification of the detected particles These classifications are included in the software package purchased and are automatically installed with it The following standards are supported ASTM A 247 2006 EN ISO 945 EN ISO 945 1 KS D 4302 20
147. itn 128 Thresholds for porosity measurements cccceeecseeeeeeeeeeeeeeeeeeaeeeeeeeesaaeeeeeeaaeeeeeeeaas 130 Counting conditions for porosity measurements cccceeecceeceeeeeceeeceeceeeeeseaeeeesanes 132 Performing a porosity measurement cceeeeccceeeeseeeeeeseseeeeessaaseeeeensaeeeeesseaeeneesins 134 TaVOs FPhaseanalysi S erari a a a O a 138 PeMOLMING a phase ANALY SIS sesio a a aa 141 HiT Paico DISTINU s AES 145 Measuring the particle CIStriDUTION cccccccccseeeceecceeeeceecceaseeeseaaseeeeeseaaaeeesessaaess 147 Tele2 GOAUNG LT MICKNCS S innos n e e aale 153 Measuring the coating thickness amp sscincccesscecesncesdaeeayscosscesveceseinenccesaavsnesteemcassstesaedeehonas 154 Creating ODON iena 158 Beds OVENI EW ence te natesuat luli eciGalnae ache suncluns dre nebnnatiulenpeacbateeteaaiags 158 8 2 Working with the report COMPOSET ccceeeceeeeeeeeeeeeeaeeeeeeeeeaeaeeeeesaeaeeeeseaaeeeesessaaees 160 8 3 Working with the Olympus MS Office AdC iN cccceeeeeeeeeeeeeeeeeeeeaeaeeeeeeeeeeeeeeeeees 164 Creating and editing a new template cccccssssssssssseeeeeeeeeeeeeeeesueeesseseeeeeeseeeeeeees 165 EANN ACD Ol ea E E E tan aneces 167 Working WIth Ge tall Zoon surea eatea lai 172 Before you start Which documentation comes along with your software 1 Before you start 1 1 Which documentation comes along with your software Where do you find which information
148. l cells differently select the cell and use the Format Cells command in the context menu e When you want to format the complete worksheet differently e g other font or other background color select the complete worksheet e g with the keyboard shortcut Ctrl A then select the Format Cells command in the context menu e When you want to hide a column click on the column s header then select the Hide command in the context menu 4 Exit edit mode by clicking on any point in the report outside the workbook Changing image resolution By default all images in a report are transferred to reports with a resolution of 192 dpi In certain cases it can make sense to change the resolution of individual or all images in a report For example if you want to print the report you can raise the resolution Alternatively if you want to publish the report on the Internet you can reduce the resolution 1 Open the report in MS Word or MS PowerPoint Decide whether you want to change the resolution of all images or just certain images 2 If you only want to change the resolution of one individual image select that image If you want to change the resolution of all images you don t have to select any 169 Creating reports Working with the Olympus MS Office add in Select the Olympus gt Change Image Resolution command e The Change Image Resolution dialog box opens Select the option you want in the Apply to group
149. le As well as that with some materials science analysis processes the slide controls that are available in the Settings step will also be set to the saved position Click on the Get from image button if you want to use the settings used for an already analyzed image for the current analysis To make this possible the image that has already been analyzed must be opened in your software Select the Skip Sample information check box to skip the Sample information step As soon as you click on the Next button you ll then go directly to the Settings step This makes sense if you analyze numerous images of the same sample and you only want to enter the information on the sample with the first image Note When you analyze images of numerous samples make sure the Skip Sample information check box is not selected because otherwise you won t see the New Sample button This list is only of significance if you are analyzing several images If you are only analyzing one image leave the preset All images entry as it is If you select several images you can choose how frequently you would like to check the settings with which the images are analyzed If you would like to analyze a lot of images with the same settings you can automate the analysis The following entries are available in the Check settings and results list e All images Select this entry if the settings are to be checked for all images This option is preset
150. lect the field that is to be inserted The entries in this list are arranged hierarchically Click the plus sign to expand the list e Two types of field are available The Document Properties list contains fields that are by default in your software managed for this document type The Database fields list contains all of the fields that are available in the database for the selected placeholder For this purpose a database must have been opened Keep the nsert Field dialog box open Position the mouse pointer on the location in the report where you want to insert the field In the nsert Field dialog box click the nsert button e The field contents will be displayed in the report If necessary add further fields To do this repeat the last 3 steps Close the nsert Field dialog box Save the report Note Should you want to have the contents of a specific field regularly shown in your reports you can already insert this field that is to say a placeholder for this field into the page or slide template Then this field will be automatically filled out 171 Creating reports Working with the Olympus MS Office add in in every report You can find more information on setting up a template in the online help 00403 24042013 Working with detail zooms Note The following step by step instruction relates to reports in MS PowerPoint and MS Word formats You can insert detail zooms to individual images or all images with
151. left mouse button e If you would like to measure the porosity on your own images it may be more sensible to create a circular triangular or rectangular ROI You can also define several ROIs with different shapes The porosity will always be measured over all ROIs e tis not absolutely necessary to define ROIs If you want to measure the entire image in the ROIs step in the analysis click directly on the Next button without defining a ROI 2 Click the Next button e The Materials Solutions tool window will display the next step All of the pixels which lie within a defined intensity range will be shown in color during this step in the analysis This intensity range is called a phase The intensity value range is limited by a top and a bottom intensity value These are the so called threshold values You can find more information on thresholds in the online help 134 Counting conditions step Performing a materials science analysis Porosity Please note that the defined ROI will not be considered in this step in the analysis but only in the next step This is why the background color in this step is also shown in color 1 If necessary reduce or increase the intensity range of the phase In the image watch how the object areas found become larger and more objects are found e Todo this change the values in the Min and Max fields in the table in the tool window Alternatively interactively change the lowe
152. leting measurement object What happens to the measurement values Changing the color font and line thickness of individual measurement objects Measuring images Overview Displaying and saving measurement results The measurement results will be displayed directly on the image and in the Measurement and ROI tool window Use the View gt Tool Windows gt Measurement and ROI command to have the tool window displayed The measurements will be saved along with the image if you save the image in the TIF or VSI file format You can however also export the measurement results in a results sheet and save this as a file To do this use the Export to Excel or Export to Workbook command You find both of the commands e g in the Measure menu The measurement results will be shown on the image in a special data layer the measurement layer On your monitor image and measurement layer are shown together The data of each however is individually stored if you use the TIF or VSI image file format Try and picture the measurement layer as a transparency which is placed over the image When you measure an image the image data will not be changed by having the measurement results displayed on it You can at any time hide or show the measurement layers To do so use the Layers tool window There you have access to all of an image s layers The eye icon identifies all of the layers that are currently on display on your monitor
153. lf with your software 00018 Online help for your software In the online help you can find detailed help for all elements of your software An individual help topic is available for every command every toolbar every tool window and every dialog box When you use the help mode you ll have access to most online topics As soon as you use the Context help command you will find yourself in the help mode In the help mode a question mark will be attached to the mouse pointer Then you will be able to call for help on almost all of your software s functions There are various ways of switching to the help mode e Click the Context Help a button You can find this button on the Standard toolbar e Use the Help gt Context Help command e Use the Shift F1 shortcut 00087 Before you start About your software 1 2 About your software Acquiring images Acquiring and viewing multi dimensional images Acquiring an EFI image Acquiring stitched images Saving documents in a database Note Not every software package contains all of the features To support the different requirements on the software optimally a variety of packages are available for your software The larger software packages contain more features than the smaller packages For example the smaller packages contain only restricted database functionality Some of the functions described are therefore of no relevance to users of smaller packag
154. live image measure the diameter of the microvia The two helper lines stand vertically on the measured distance and help you to align the measured distance exactly with the microvia s borders 12 Move the stage so that the next distance to be measured can be clearly seen in the live image and adjust the focus If necessary select another objective magnification to be able to measure the distance with the best accuracy 13 Measure the required distance 14 Repeat the last steps until you have measured all of the required parameters For the last measurement parameter Bmin measure the lowest thickness of the coating within a certain area This area is circled in the schematic illustration e Assoon as you have measured all of the parameters which are required for the selected measurement method the Next and Get Results button will become active in the lower part of the dialog box Measuring the other 15 Click the Next button to conclude the measurement for the current microvia microvias l e The Materials Solutions tool window displays the Measurements step x e Asan intermediate step your software will save all of the values measured so far e All values from the last measurement will be deleted from the Measurements table 16 Now measure the next microvia To get statistically reliable measurement results you will have to measure several microvia Finishing the throwing 17 Click the Get Results button when you have
155. llow triangle A on the button indicates that the current sample isn t aligned yet e The Align images for sample alignment dialog box opens 3 Decide how the reference image should be displayed You have the following options in the Align images for sample alignment dialog box e Select the Show reference image as thumbnail option Now the reference image for the current position will be displayed as a small image on the top left of the live image e Select the Show reference image in overlay option Now the reference image is Superimposed in full size on the live image Use the Display opacity slide control to change the transparency of the reference image The smaller the value the more transparent the reference image is Select the value 0 if you don t want to see the reference image for orientation 4 Move the stage to the required reference positions one after another Orientate yourself using the displayed reference image 5 When you ve moved to the third reference position click the Finish button e Your software now compares the positions saved in the stage path with the current positions you moved the stage path to and positions the stage path accordingly 74 Performing a materials science analysis Tool window Materials Solutions e The button in the Sample alignment group changes its appearance A green check on the button shows that the sample is aligned 5 Selecting the inspection mode Prerequisite
156. llowing layouts are available Work with a database Database layout Acquire images Acquisition layout View and process images Processing layout Generate a report Reporting layout In contrast to your own layouts predefined layouts can t be deleted Therefore you can always restore a predefined layout back to its originally defined form To do this select the predefined layout and use the View gt Layout gt Reset Current Layout command 00013 11 User interface Document group 2 3 Document group Appearance of the document group W Button with a hand The document group contains all loaded documents These can be of all supported document types Document bar in the document group 1 2 3 Buttons in the document bar 4 Navigation bar in the image window 1 Document group in the user interface You will find the document group in the middle of the user interface In it you will find all of the documents that have been loaded and of course also all of the images that have been acquired Also the live image and the images resulting from e g any image processing function will be displayed there 2 Document bar in the document group The document bar is the document group s header E kE d pe For every loaded document an individual field will be set up in the document group Click the name of a document in the document bar to have this document displayed in the document group
157. lt of the automatic image analysis can be restricted by an object filter Objects which do not reach the minimum object size will not be considered when determining the percentage area of the phase In this way you can for example prevent dust particles being assigned to a phase and distorting the result Measuring on ROIs You can choose whether you would like to measure the entire image or if the measurement should only be carried out on a part of the image a so called ROI Region Of Interest You can also define several ROIs 138 Performing a materials science analysis Phase analysis On this image the percentage area of the phases is measured on two ROls Manually adjusting the You can manually adjust the result of the automatic image analysis You do this oom r ii pelt interactively on the image Note that you are not changing the image itself but I the image s measurement layer You can manually delete parts of the image which were detected as objects This can be necessary if for example artifacts in the image are detected as objects because they have intensity values similar to the defined phase By manually deleting these objects the artifacts will no longer be considered when determining the percentage area of this phase In addition you can also manually add other image segments which were not detected as such but which are actually objects With the manual addition and deletion of objects you always change the pe
158. lue of the image You can choose whether you would like to measure the entire image or if the measurement should only be carried out on a part of the image a so called ROI Region Of Interest You can also define several ROIs 128 Performing a materials science analysis Porosity On the image the porosity of an ROI is measured Results of a porosity The results of an analysis can be displayed in a workbook Additionally or measurement alternatively to that the results can be displayed in an MS Word report General procedure for a porosity measurement 1 Select the analysis process Click on the Porosity button located in the Materials Solutions tool window hA 2 Image source step Choose the image you want to measure 3 ROIs step Define the ROIs or measure the porosity of the whole sample 4 Threshold step Define the intensity range for the first phase and define other phases if necessary hA 5 Counting conditions step Define the pore size parameter and the minimum and maximum pore size 6 Image results step Take a look at your image results If necessary delete pores or add new ones 7 Results step Document the results report or workbook 10606 04062012 129 Performing a materials science analysis Porosity Thresholds for porosity measurements All of the pixels which lie within an automatically defined intensity range will be shown in color during thi
159. ly The stitched image will by default be automatically saved The storage directory is shown in the Acquisition Settings gt Saving gt Process Manager dialog box The preset file format is VSI 40 Without a motorized XY stage Fap n F With a motorized XY stage Acquiring images Creating stitched images Acquiring a stitched image with extended depth of focus The acquisition of a stitched image with extended depth of focus is both with and without a motorized XY stage possible 1 Start the Manual MIA acquisition process You can find a step by step instruction for doing this further above 2 Click the Instant EFI e The Instant EFI acquisition process will start at once Instead of the live image you now see the EFI image button in the Manual MIA group 3 Now move your microscope s Z drive slowly and change the focusing of the image Observe how the EFI image builds itself up e For each image that is acquired the sharpest image segment is adopted in the EFI image 4 When all of the image structures are sharply displayed click one of the direction arrows in the Manual MIA group to continue with the acquisition of the stitched image Note You now see the live image with the last focus settings That means that normally the live image won t be in focus 5 Bring the image into focus 6 Repeat the last steps for each of the stitched image s individual images for which you wan
160. m the color palette then close the dialog box with OK 48 ETA l Wl Measuring on multi dimensional images E Measuring on multi layer images Influence of the X Y calibration Influence of the zoom factor Measuring images Overview Measuring in the live mode All of the measurement functions are also available in the live image You can therefore e g quickly measure a segment in the live image Measuring on different image types You can combine a series of individual images into one image What results is e g a time stack in which all of the frames will have been acquired at different times You can make measurements on every separate image Display the required frame on your monitor To do this use the navigation bar in the image window Then carry out the measurement on this frame The measurement will be permanently linked to this frame i e the measurement will only be displayed on your monitor when the frame on which you made this measurement is also on display The measurement results will be shown in the Measurement and RO tool window You can give every measurement the number of the frame on which it was made To do so use e g the measurement parameter ndex t for time stacks With some functions e g with the mage gt Combine Color Images function a multi layer image will be created This multi layer image is made up of several layers You can find more information on multi layer images in
161. mal settings for your acquisition in the Camera Control tool window Pay special attention to setting the correct exposure time This exposure time will be used for all of the stitched image s individual images 14 Confirm the starting position in the Define MIA Scanning Area dialog box with OK 15 Move the XY stage to the bottom right hand corner of the MIA scan area 4 Confirm this position in the Define MIA Scanning Area dialog box with OK e Inthe Stage Navigator tool window the MIA scan areas that have been defined are displayed Here you can immediately see how many individual images are required for the acquisition of the stitched image when the current magnification is used Bead a M A x 20517 Y 22795 2 182 Acquiring a stitched P image 16 Click the Start button Acquiring images Creating stitched images The acquisition begins immediately The individual images are acquired then immediately assembled You can watch how the stitched image grows in the image window In the status bar at the bottom left of the user interface you will find a progress bar the number of images already acquired and the total number of frames e g 3 9 The acquisition has been completed when you can once more see the Start button in the Process Manager tool window and the progress bar has been faded out You see the completed stitched image in the image window The individual images won t be saved separate
162. measurement mode your mouse pointer will take on the shape of a cross on the image You can make as many measurements as you like with the measurement function that has been selected The continuous measurement mode is valid for all loaded images You can therefore easily measure numerous images one after the other The selected measurement function s button will keep its clicked appearance and in this way show you the current measurement function You can recognize this status by the button s background color You will remain in this measurement mode until you explicitly switch it off To do so click the Select Measurement Objects iF button You can find the button either in the Measurement and ROI tool window or on the toolbar The continuous measurement mode described above is preset by default You can change this default setting To do this use the Tools gt Options command Select the Measurement and ROI gt General entry in the tree view Select the Switch to Select Measurement Objects mode after creating a measurement object check box Then when you have completed a measurement you will automatically leave the measurement mode again This means you have to select the measurement function again before you start each interactive measurement 47 Saving the measurement results Showing and hiding measurement results in an image Moving measurement objects Increasing decreasing the size of measurement objects De
163. n the Check settings and results list 7 Click the Next button e The Materials Solutions tool window will display the next step Settings step 1 In the Evaluation method field set the standard you are going to use for the analysis 2 Use the slide control to define the threshold value for all of the inclusions Observe the sample The threshold value has been correctly set when the inclusions are completely recognized J The illustration shows a correctly set threshold value 114 Image results step Results step Reporting step Performing a materials science analysis Inclusions Worst Field Since in this sample there are no oxide inclusions set the Threshold oxide inclusions slide control at the position Low Select the Show ignored particles check box when you want to also have the particles that weren t included in the analysis shown e Particles will be ignored when they don t fulfill the requirements that were specified in the program options Click the Next button e The Materials Solutions tool window will display the next step Take a look at the results that are shown in the table Should you have analyzed several images of the same sample you can switch between a display of the image results for the current image and the results for all of the images To do this select either the mage option or the Sample option located below the table e The table with the measurement results contains a cla
164. n these areas and have additional images calculated into the EFI image Continue acquiring additional images until the whole sample has been sharply reproduced 14 In the Process Manager tool window click the Stop D button e The resulting image is not a Z stack but a standard image e The EFI image will be automatically saved You can set the storage directory in the Acquisition Settings gt Saving gt Process Manager dialog box The preset file format is VSI 31 Task Setting the EFI parameters Preparing for the acquisition of a Z stack Setting the Z stack Acquiring images Acquiring an EFI image O 15 In the Camera Control tool window click the Live ia button again Acquiring an EFI image with a motorized Z drive You have a thick section in the transmitted light mode or a sample with a very rough surface in the reflected light mode e g with holes grooves bumps peaks or slanting planes In the image it s only possible to bring one layer of the section or only part of the surface sharply into focus higher lying or deeper lying areas are outside the depth of focus range Acquire a Z stack through the complete thickness or height of the sample and have the EFI image calculated for you You can use the automatic Z stack acquisition process to acquire a sharply focused image of all of the sample Prerequisite You can only use the Z Stack acquisition process when your stage is equipped with a motorized
165. nager tool window click the Autofocus button e The Autofocus group will be automatically displayed in the tool window In the Autofocus group select the Multiposition MIA check box If the sample surface is not plane or if it is inclined to the objective choose the Every MIA frame option Now the software autofocus will be performed before every image acquisition In the Process Manager tool window click this button e The Stage Navigator tool window is shown When you have acquired an overview image of your sample you will see this area of the image in the stage navigator s image segment Set the magnification for the image segment in the Stage Navigator tool window To do this use the zoom buttons at the bottom left of the tool window 2 The current stage position will be shown by a yellow rectangle in the image segment 1 You should choose a magnification that enables you to see this 38 Acquiring images Creating stitched images rectangle clearly Tp TAHIL EEPE h 21517 Y22795 Z187 2 e You can find more information on the Stage Navigator tool window in the online help Defining the MIA scan area 11 In the Process Manager tool window click this button IL e The system will automatically switch into the live mode e The Define MIA Scanning Area dialog box opens 12 Move the XY stage to the top left hand corner of the MIA scan area you want 3 13 Focus then select the opti
166. nalyzed and in the Image source step click the Load from file button The sample and image comments the line pattern used and the position of the slide controls in the Settings step will be saved Click the Next button Select the Default option to use the document template that has been defined as the default document template The document template determines e g the appearance of the report s header and footer e Should you want to change the default document template use the Tools gt Options gt Report Composer gt Document Templates command Add the document template you want to the Templates list select it and click the Set as Default button In the Content group select the check box for the pages the report should contain e Select the Summary page check box if the first page of the report is to contain a Summary of all of the results of the current analysis The creation of a Summary page can for example be useful when you have analyzed a large number of images that belong to different samples e Select the One page per sample check box if the report should contain one page for every sample This page displays the overall results for all of the images belonging to that sample Using this setting is a good idea for example when you have analyzed images of different samples 84 Performing a materials science analysis Grains Intercept Select the One page per image check box if the report should contain
167. nd info stamp options Creating reports Working with the Olympus MS Office add in Part of the Detail Zoom dialog box The report page is indicated by the white background In this example both detail zooms were dragged so far from the image that they no longer fit on the report page You can see this from the gray background In this case your software shows a corresponding message box The detail zoom s position can then be adjusted one more time Select the entry you want from the Detail zoom factor list This factor specifies how much the detail will be zoomed Values from 1x not zoomed to 10x are available You can also enter a value of your choice into the field and press the Enter key You can specify whether or not the scale bar and info stamp should be shown for each detail zoom separately Additionally you can also configure the scale bar s appearance and the contents of the info stamp here These are the same options that you have for every image in the report in the mage Properties gt Options dialog box As a rule it is generally a good idea to show the scale in the detail zoom as well Deleting a detail Zoom 1 Select the image with the detail zoom that you want to delete If the image is in a grouped object you have to select the group first Use the Olympus gt Detail Zoom command 3 Select the detail zoom that you want to delete To do so click once within the black border in the image Cl
168. nd the overall results of all of the images that have already been analyzed for this sample Should you not be satisfied with the results for the current image Click the Back button to switch back to the Settings step Then you can try to improve the results for this image by choosing another line type or by moving the slide controls to another position Should you want to correct the intercept points that have been automatically found click the Add ntercepts or Delete Intercepts buttons This will enable you to add intercept points manually or to delete superfluous intercept points e You can find step by step instructions on how to correct intercept points in the online help Select the Check settings check box to have the Settings step displayed with every image e This enables you to individually change the slide control s setting before every individual image is analyzed This makes sense for example if the images that are to be analyzed are of greatly different quality and you need to adjust the noise reduction individually for each image 83 Results step Reporting step Performing a materials science analysis Grains Intercept e The Check settings button is only active if you analyze several images of a sample at the same time When you analyze images that you selected before the analysis began Click the Next button e Should you analyze images from the database you will then be asked whether you wan
169. nd to save the image Use the recommended TIF or VSI file format e These are the only formats which also save all the image information including the HDR entries together with the image This means that you can always see whether or not an image was acquired using HDR Open the Properties tool window and look at the data in the Camera group Acquiring more HDR images without setting the exposure range anew If you have just acquired HDR images of the same or a similar sample as a rule it is not necessary to determine the dynamic range anew In this case you have already completed the preparations for acquisition Such as carrying out a white balance and set the HDR image acquisition settings correctly such as choosing the optimal algorithm used for output rendering anyway In such circumstances acquiring an HDR image is especially easy Do the following 1 Inthe Camera Control tool window select the Activate HDR check box 2 Click the HDR button in the Camera Control tool window to start the image acquisition e The image acquisition will begin After the acquisition has been completed the HDR image will be shown in the document group 3 Check the image before saving it e This step can be left out if your software is configured to import images into a database directly after acquisition 07500 15072011 24 Acquiring images Acquiring movies and time stacks 4 3 Acquiring movies and time stacks Selecting an obj
170. nd increase up through the higher magnifications You can read the magnification off of the objective Choose each corresponding objective from the Objective Type list The type is written on the objective e Inthe Description field a description of the objective will be suggested You may change the description of the objective in the Description field if you wish If the objectives don t use air as their refraction medium select the immersion medium from the Refraction Index list In this case you find an appropriate label on the objective Select the General gt lt Name of the mirror turret gt entry in the tree view 1 Make a selection for every position whether it is occupied or not For 12 13 14 occupied positions either select a filter or fluorescence cube being used from the Filter list or enter the name of your filter module Select the Free entry for positions that have been purposely left free to keep the light path free of optical elements For example where the mirror turret is concerned it is especially important that one position is kept free in order not to impede the light path for the transmitted light microscopy Close the Device Settings dialog box with OK e n certain cases you receive a message telling you to check the calibrations You can perform calibration now or later To have this toolbar displayed use the View gt Toolbars gt Microscope Control command e The Microscope
171. ng the analysis the graphite fraction is entered and is then subtracted from the dark areas This graphite fraction has either been determined in an earlier measurement this value can then be imported or it can alternatively be estimated Using the pearlite area that has in this way been corrected the ferrite pearlite ratio is calculated k L L hi a l i Aa r bay te i eke ky ae JA a Jo aa n pna T 1 You see a Step in the analysis during the determining of the ferrite pearlite ratio The bright ferrite phase has been determined by your software shown in yellow here 00734 10052013 Performing a cast iron analysis unetched sample Note You can follow these step by step instructions on your PC They describe how the graphite fraction is determined 1 Load the GlobularGraphite tif example image e The graphite fraction is to be measured 2 Activate the Materials Solutions tool window Should this tool window not be visible use the View gt Tool Windows gt Materials Solutions command to have it displayed 3 Click the Cast ron button In the Image source group choose the Selected images option to analyze the example image This image must have been opened for this purpose and have been selected in the document group 5 Select the Skip Sample information check box e By doing so you skip the Sample information step which is not relevant for this example image However it is quite possible
172. nstruction If you want print the report or create a PDF file Save the report instruction and the report as well if needed The general process flow for report generation using the Olympus MS Office add in 1 Creating a new PPT or DOC file Create a new file or open an existing document 2 Working with the Olympus MS Office add in In MS Word or MS PowerPoint Use the function in the Olympus menu to place documents in the report 3 Working with the Olympus MS Office add in Use the functions in the Olympus menu to define a layout for the report info stamp detail zoom and border for example y 4 Saving the report Save the report If you want print it or create a PDF file 00112 22042013 159 Creating reports Working with the report composer 8 2 Working with the report composer The Report Composer tool window supports you when you are creating and updating report instructions In this tool window you also find the Create button that is used to start the report creation Note Two programs are involved in the creation of reports using the Report Composer tool window Your software and the MS Word application program You can use MS Word 2003 2007 or 2010 for working with reports Should the Report Composer tool window be hidden use the View gt Tool Windows gt Report Composer command to make it appear Creating a new report instruction To create a report first create a new report instructi
173. nt point from the perpendicular bisector Use this measurement function to determine the Bs Throat thickness thickness of a fillet weld s throat You will find the weld measurement functions in the Measure menu or as a button on the Measurement and RO tool window or toolbar Start a measurement e g by clicking the corresponding button The functions which you can use to measure welds behave just like the other interactive measurement functions offered by your software e g the Arbitrary Line measurement function All of the information on the interactive measurement functions also applies for the measurement of welds 10802 Measuring a throat thickness Use the Throat thickness measurement function to determine the thickness of a fillet weld s throat You can find the measurement function in the Measure menu or as a button on the Measurement and ROI tool window or toolbar Prerequisite The Throat Thickness measurement function will only be available if you purchased the Weld Measurement solution together with your software 1 If necessary use the View gt Tool Windows gt Measurement and ROI command to have the Measurement and RO tool window displayed 2 Acquire an image or load one 58 Measuring images Measuring welding seams The illustration shows a cross section of two welded pieces of metal The weld is circled How thick is the weld s throat 3 Seta zoom factor for your image window that
174. nt to edit In the report instruction select the page template you want to exchange Use the Del key on your keyboard to delete the selected page template from the report instruction 162 Shifting the page templates Deleting documents Adding documents Moving documents Creating reports Working with the report composer e By doing so you only deselect the page template no file will be deleted 4 Drag the new page template to the position in the report instruction where the deleted page template had been located e Every report has to contain at least one page template 1 To shift a page template to another place in the report instruction select it and with the left mouse button depressed drag it to a new position Drag amp Drop e n certain cases this may change the appearance of the report considerably All documents that come after this page template in the report instruction will use this page template in the report 1 Load the report instruction that you want to edit 2 Inthe report instruction select the documents that you want to delete e The standard MS Windows conventions apply to the multiple selection 3 Use the Del key on your keyboard to delete all of the selected documents in the report instruction e By doing so you only undo the document selection no file will be deleted You can add new documents to an existing report instruction at any time 1 Load the report instruction tha
175. ny voids have been detected within the pearlite see arrows The illustration 2 shows a pearlite phase that is more closed 4 In the Graphite fraction group select how this sample s graphite fraction is to be entered The graphite fraction will be subtracted from the detected pearlite fraction Using the pearlite area that has in this way been corrected the ferrite pearlite ratio is calculated This step is necessary because graphite and pearlite have very similar gray values and can therefore not be detected separately by the software There are two possibilities how to enter the graphite fraction e You select the Enter manually option and enter the value This option is always active You can have e g made a note of this value or have saved it in a report e You select the Result of unetched sample analysis option This option is only active if in the same analysis you have already measured the graphite fraction using an unetched part of the sample This option is also active if you measured the graphite fraction in a previous analysis saved these values in a parameter set and loaded them in the current analysis Sample information step Click the Next button e The Materials Solutions tool window will display the next step Take a look at the results that are shown in the table Among other things here you will find the ferrite pearlite ratio that has been measured Take a look at the displayed results in the image as
176. oaded images that are currently selected in the Gallery tool window Loaded images that are not selected in the Gallery tool window will be ignored for the analysis e Folder option All of the images in a specific directory You can choose the directory as you wish e Selected database images option All of the images you have currently selected in your software s database e Stage Path option All images which you would like to acquire with the saved stage path This option is only visible if your microscope stage has a motorized XY drive You can find more information about the acquisition of images using defined stage paths in the online help Not all materials science analysis processes support the use of stage paths This is why the Stage Path option is only available for these analysis processes Grains Intercept Grains Planimetric Inclusions Worst Field Porosity Phase Analysis Particle Distribution 67 2 Buttons to load saved settings 3 Skip Sample Information check box 4 Check settings and results list and Image interval field Performing a materials science analysis Tool window Materials Solutions Here you can load the settings that you want to use for the analysis Click on the Load from file button if you want to use settings that have been saved For example you can in this way load the comments from a sample that has already been analyzed and adapt them for the current samp
177. ocument template that has been defined as the default document template The document template determines e g the appearance of the report s header and footer 2 Inthe Content group select the check box for the pages the report should contain 3 Click the Finish button 4 Through the materials analysis measurement the image has collected one or more additional layers can be seen in the Layers tool window If required save the image in TIF or VSI format to retain these newly created image layers 7 2 x iia Note Use the Tools gt Options gt Count and Measure gt Display dialog box to specify whether the found particles should be displayed in outline or whether they should be filled You can change these settings at any time before or after the analysis for example and also for images that have already been saved in TIF or VSI format 10619 15052013 152 Performing a materials science analysis Coating Thickness 7 12 Coating Thickness What is a coating thickness measurement Using the Coating Thickness analysis process you can analyze ball indentation cuts of thin coatings and determine their coating thickness The sample under test should be a substrate which has one or more coatings that were applied using different coating methods PVD CVD VPS APS etc To determine the coating thickness a ball indentation is ground into the sample This is done using a grinding ball which h
178. olor test image With the Ctrl Alt T shortcut you can generate a test image that is made up of 256 gray values 15 Document group and database User interface Working with documents Activating documents in the document group There are several ways to activate one of the documents that has been loaded into the document group and thus display it on your monitor Use the Documents tool window Click the desired document there Use the Gallery tool window Click the desired document there Click the title of the desired document in the document group oe ea To open a list with all currently loaded documents use the Ctrl Tab shortcut Leftclick the document that you want to have displayed on your monitor 5 Inthe Window menu you will find a list of all of the documents that have been loaded Select the document you want from this list Please note that in the Database layout the document group will not be shown Select one of the other layouts e g the Processing layout to have the document group displayed 00143 08052012 16 Configuring the system Overview 3 Configuring the system 3 1 Overview Why do you have to configure the system Specifying which hardware is available Configuring the interfaces Configuring the specified hardware Calibrating the system After successfully installing your software you will need to first configure your image analysis system then calibrate it
179. on in your software You can also use a saved report instruction Note The report instruction has to contain at least one registered page template You can find more information on registering page templates in the online help 1 Switch to the Reporting layout 2 Click the New Report Instruction button You find this button in the Report Composer tool window e Anew document of the report instruction type will be created in the document group This document is at the same time the workspace in which you put the report together 3 If no default document template has been defined Drag the document template you want onto the upper part 1 of the report instruction You find a list of the available document templates in the upper part 2 of the Report Composer tool window e Ifadefault document template has been defined it will be automatically inserted in the upper part of the new report instruction e Creating a report is also possible when you leave the upper part of the report instruction empty In this case the default MS Word document template is used 4 Drag the page templates you want onto the lower part of the report instruction 3 You find a list of the available page templates in the lower part 4 of the Report Composer tool window 160 Creating reports Working with the report composer e Every report has to contain at least one page template e Make sure that the page templates contain the co
180. on the document view of your database in the online help 3 In your software open the database where the measurement results are saved 4 Switch to your database s document view Select the database folder which contains the measurement results If your database is based on the supplied database template then the database folder is a record of type Sample 5 In the gallery view double click for instance on the symbol for the workbook to view the measurement results e The workbook contains the values for all of the microvias measured e Statistical values e g standard deviation can also be displayed in the workbook You can specify exactly which statistical values will be shown To do this open the Tools gt Options gt Measurement and ROI gt Results dialog box 00501 25062012 127 Performing a materials science analysis Porosity 7 9 Porosity Manually processing the image porosity value Measuring on ROIs What is a porosity measurement With a porosity measurement you measure the percentage of the surface which is made up by pores in your samples as well as the number and density of the pores lt is a precondition for the measurement that the pores differ from the rest of the sample e g because they are darker or lighter The pores thus have differing intensity values to the rest of the sample making automatic analysis of the image possible For the image analysis so called phases are defined w
181. oolbar is there for you to use when you are focusing on your sample Check the color reproduction If necessary carry out a white balance Check the exposure time You can either use the automatic exposure time function or enter the exposure time manually Select the resolution you want In the Camera Control tool window click the Snap button e The acquired image will be shown in the document group Use the File gt Save As command to save the image Use the recommended TIF file format 00027 21 Acquiring images HDR images 4 2 HDR images What are HDR images Determining the exposure range HDR images and acquisition processes HDR images and movie recording Under the microscope certain samples with very reflective metal surfaces for example can have such strong differences in brightness that it is impossible to find an exposure time that is suitable for all areas of the sample For such samples an HDR image acquisition is recommended HDR stands for High Dynamic Range Dynamic range relates to the capacity of cameras or image processing software to display both the bright and the dark segments of an image well Before acquiring an HDR image the necessary exposure range needs to be determined for the current sample The exposure range is made up of a minimum and maximum exposure time as well as several exposure times between them Several individual images are then taken of the sample with dif
182. osed layer You can follow these step by step instructions on your PC They describe a layer thickness measurement on an example image 1 N Load the Copper Wire Section tif example image e The image shows a cross section through a copper wire The outermost layer is to be measured Activate the Materials Solutions tool window Click the Layer Thickness button In the Image source group choose the Selected images option to analyze the example image This image must have been opened for this purpose and have been selected in the document group Select the Skip Sample information check box Select the All images entry in the Check settings and results list Click the Next button Click the Magic Wand button In the Layer type group click the icon for a closed layer na Click the Next button Click the Add contours button Click the button for the HSV color space iv Then define the first contour To do this click once with your left mouse button on a position in the image that lies within the outermost layer e The contour will be shown by a red line 97 Performing a materials science analysis Layer Thickness Note Make sure that the contour completely includes the outer layer And that the contour s outline isn t discontinued at any point on the outer layer Change the position of the slide control in the Tolerance field until the contour completely includes the layer that is to be
183. ound 2 Acquire an image or load one During the installation of your software some sample images have been installed too You can follow these step by step instructions when you use the example image SupraConductor tif The measurement results will be written into the image according to the default settings in red font color and without a background This can t be easily read against the superconductor s structure Change the labeling settings 1 Use the Tools gt Options command 2 Click the Measurement and ROI gt Measurement Display entry in the tree view 3 Click in the Background Color field and choose e g the color Black Select the Text color gt Fixed colors option then select the color White from the palette to see the measurements in white and the labeling in black in the image 5 Close the dialog box with OK 50 Measuring lengths Deleting measurements Measuring images Measuring images Click the Arbitrary Line s button located on the toolbar at the top of the tool window 2 Click with your left mouse button at the starting point and end point of the reference distance 3 Ifyou have measured a reference distance you can immediately proceed with the next measurement Click the Arbitrary Line button again to end the length measurement 5 Take a look at the results in the tool window and in the image e The illustration shows the image with three executed measurements
184. ows gt Materials Solutions command to have it displayed 3 Click the Particle Distribution button In the Image source group choose the Selected images option to analyze the example image This image must have been opened for this purpose and have been selected in the document group 5 Select the Skip Sample information check box e By doing so you skip the Sample information step which is not relevant for this example image 6 Select the All images entry in the Check settings and results list e If you analyze your own images later on you can also select another entry from this list for example if you don t want to check the settings for every image anymore 7 Click the Next button e The Materials Solutions tool window will display the next step All of the pixels which lie within a defined intensity range will be shown in color during this step in the analysis This intensity range is called a phase The intensity value range is limited by a top and a bottom intensity value These are the so called threshold values You can find more information on thresholds in the online help Please note that the defined ROI will not be considered in this step in the analysis but only in the next step In this step in the analysis pixels which are outside of the ROI will thus also be shown in color 1 If necessary reduce or increase the intensity range of the phase In the image watch how the particle areas found b
185. particle The results of an analysis can be displayed in a workbook and in a chart distribution Additionally or alternatively to that the results can be displayed in an MS Word measurement report General procedure for a particle distribution measurement 1 Select the analysis process In the Materials Solutions tool window click the Particle Distribution button y 2 Image source step Choose the image you want to measure a 3 ROIs step Define the ROIs or measure the whole sample lt 4 Threshold step Define the intensity range of the phase lt 5 Classification step Check and change the classification y 6 Image results step Take a look at your image results If necessary delete particles or add new ones You can also manually split particles and merge separate particles into one 7 Results step Document the results report or workbook 10618 25062012 146 Image source step nt Seated ead Threshold step Performing a materials science analysis Particle Distribution Measuring the particle distribution Note You can follow these step by step instructions on your PC 1 Load the GlobularGraphite tif example image e Inthis image the dark nodular graphite particles are to counted and the particles are to be classified according to their size 2 Activate the Materials Solutions tool window Should this tool window not be visible use the View gt Tool Wind
186. pe Measure all of the parameters specified in the Measurements list Repeat this step in the analysis and measure other cross sections 5 Report images step Acquire three images for the final report 6 Reporting step Produce a report with the results of the throwing power measurement 00500 25062012 120 Performing a materials science analysis Throwing Power Defining throwing power measurements In this step you carry out the actual throwing power measurement The sequence and the measurement parameters are specified Your software will show all of the required measurement parameters in a diagram The following options are available i Ahk 1 Displaying the parameters to be measured 2 Performing the throwing power measurement 3 Continuing the throwing power measurement 1 Displaying the parameters to be measured Your software will provide you with visual support when performing the throwing power measurement The distance which is to be measured next will be drawn in the schematic illustration at the top of the Materials Solutions tool window The copper plating is shown in orange the panel in green 121 Measurement method Through holes Microvias Filled microvias Filled through holes Remarks about the required measurement parameters Performing a materials science analysis Throwing Power From the Measurements list choose any measurement parameter to show the distanc
187. program some predefined templates were installed too In addition to this you can define your own templates too With MS Word reports you define page templates in the DOC or DOCX file format With MS PowerPoint reports you define slide templates in the PPT or PPTX file format Note The procedure for creating a template is largely the same regardless of whether you are creating a page template or a slide template For this reason you can carry out the step by step instruction with either MS Word or MS PowerPoint open In a template placeholders are set up for the documents that the report is to contain There are placeholders for images charts workbooks and fields When for instance the report is to contain pages that have an image at the top and below it a chart you should then set up a template which has a placeholder for an image and a placeholder for a chart Note For technical reasons a template must consist of precisely one page For this reason create several separate files if you require several self defined template pages Creating a template and adding a placeholder for a document 1 In the MS Word or MS PowerPoint application program select the File gt New command 2 Select the Empty Document option MS Word or the Blank presentation option MS PowerPoint if you don t want to use an existing template but instead want to start from scratch 3 Decide whether you want to insert a placeholder for an
188. r Click your right mouse button to finish the definition of the layer Click the Next button Take a look at the results of the current image shown in the mage results group 99 Performing a materials science analysis Layer Thickness e The values inthe Steps Distance and Type fields can be edited when you double click in the cell you want to edit You can find more information on this topic in the online help e The lower part of the group contains several buttons with which you can change the way the layer thickness measurement is displayed You can find more information on this topic in the online help 2 Check the results shown in the image e The measurement lines are shown in the image To make them contrast better the color of the measurement lines was set to black before the measurement took place 3 Click the Next button Results step 1 Select the Generate Report check box if you would like to have a report automatically generated in MS Word once the analysis is completed e The additional step Reporting will be added to the current analysis In the lower part of the dialog box the Finish button will change into the Next button 2 Select the Generate Workbook check box to have a document of the workbook type automatically created at the end of the analysis 3 If you want to save the current settings to a file click the Save seitings button Then assign a descriptive name in the next dialo
189. r and upper threshold values in the histogram shown at the bottom of the tool window Move the mouse pointer over the edge of the phase until the pointer changes and with the left mouse button pressed drag the edge in the required direction 200 e One phase is enough for the MacroscopicComponent tif example image If you would like to measure the porosity on your own images later on then you may have to define additional phases You will need two phases for instance if you would like to measure light and dark pores You define a second phase by clicking on the Add Phase ae button and also setting the threshold values for the second phase so that the required objects are shown in color 2 Click the Next button e The Materials Solutions tool window will display the next step In this step in the analysis only the parts of the sample within the defined ROIs will be considered All objects which meet the counting conditions will be shown in this step in the color of the phase If you have defined several phases then several colors will be used for the display All objects which do not meet the counting conditions will be shown in this step with red hatching This means that these pores they could be residue particles or artifacts will not be considered when determining the number of pores found They will however still be taken into account when determining the percentage porosity value 135 Performing a materials sc
190. r microscope s Z drive to move your stage slowly through the height range of the sample s surface e Your software will acquire images at the various focal planes then it will set them together While this is being done the camera will acquire the images as quickly as possible The sharpness value of individual pixels will be calculated for every image If the sharpness values are higher than in the previous images the pixels in the composite EFI image will be adopted The EFI image contains the pixels with the highest sharpness values from all of the images acquired up till then e The sharpness map at the bottom left will show you which image areas will be sharply reproduced in the EFI image The brighter a pixel is in the sharpness map the higher is its sharpness value in the EFI image e Once the acquisition process has been started the sharpness map should only be bright at the deepest or highest parts of the sample the rest of the map is dark 12 Focus on the sample slowly once through all the focal planes After each change of the focus position wait until you see that further areas become brighter in the sharpness map e As the process continues more and more areas in the sharpness map should become brighter At the same time the EFI image will also get better and better 13 Check the EFI image and the sharpness map Are all areas of the image now sharp Are there any areas in the sharpness map that are still dark Focus o
191. r several phases in a gray value image you will have to begin by setting the threshold value for the darkest phase Then set the threshold value for the next brightest phase and so on Click on the New Threshold 5 button to set an initial value for the selected phase s threshold value range As soon as you move your mouse pointer onto the image it will change its shape to that of a pipette Click on one pixel or on the image area whose intensity value is to be utilized as the initial value for the threshold range All of the pixels that have the same intensity value will be colored in the image and displayed in the histogram The threshold value range initially contains only this one intensity value As a rule you will still need to expand this threshold value range Continue clicking relevant pixels or threshold value ranges until all of the required structures in the image are a part of the phase A Click on the Add Threshold a button to select additional pixels that are to belong to the threshold value range The image segments will be colored and displayed in the histogram The current threshold value range will continue to be expanded until it contains the intensity values of all of the selected pixels Click on the Shrink Threshold button to select pixels that aren t to belong to the threshold value range The threshold value range will continue to be reduced until it no longer contains the pixels you have selected Click on th
192. ram You can move the edges of the slide in the histogram To do that move the mouse pointer to the edge of the slide If you have more than one phase the phase that you would like to change must be selected in the table If the mouse pointer changes click with the left mouse button and drag the edge of the slide in the required direction The values in the Min and Max fields in the table will change In the image there will now be more or less pixels in the color of the phase 10626 04062012 Counting conditions for porosity measurements All objects which meet the counting conditions will be shown in this step in the image in the color of the phase If you have defined several phases the pores will be shown in the color of the phase to which they belong according to their intensity values All objects which do not meet the counting conditions will be shown in this step with red hatching in the image This means that these pores they could be residue particles or artifacts will not be considered when determining the pore density and pore count They will however still be taken into account when determining the percentage porosity value IROI 17 eee et ree es a ee es r i 7 oe Ba I 7 nm m gt ze To the left you can see a sample which only has one phase Pores which do not meet the counting conditions will be shown with red hatching To the right you can see a
193. rance of the non metallic inclusions depend on a variety of factors such as e g the steel type or the production process The inclusions are divided into different classes according to their appearance color form and size The classification is made according to different industry standards Since all inclusions are darker than the color of the steel they can easily be detected by means of an automatic image analysis When detecting the inclusions the inclusion worst field analysis searches for particles For the image analysis software a particle is a cohesive number of pixels that all lie within a defined intensity range For this reason you first have to define the intensity range Since between the different inclusions there are also intensity differences sulfides are e g brighter than oxides you can also define two intensity ranges Particle detection during an inclusion worst field analysis When a suitable definition of the gray value ranges has been made the sulfides green and the oxides red will be detected You can manually edit the inclusions that your software found automatically You have the possibility of deleting splitting or joining up inclusions and you can also change their type 113 Performing a materials science analysis Inclusions Worst Field Results of an inclusion The inclusion worst field analysis determines which is the largest non metallic worst field analysis inclusion within the s
194. rcentage area of the corresponding phase Results ofa phase The results of an analysis can be displayed in a workbook Additionally or analysis alternatively to that the results can be displayed in an MS Word report 139 Performing a materials science analysis Phase analysis General procedure for a phase analysis 1 Select the analysis process Click on the Phase Analysis button located in the Materials Solutions tool window 2 Image source step Choose the image you want to measure 3 ROIs step Define the ROIs or measure the whole sample y 4 Threshold step Define the intensity range for the first phase and define other phases if necessary 5 Object filter step Define the minimum object size 6 Image results step Take a look at your image results If necessary delete objects or add new ones Vv 7 Results step Document the results report or workbook 10610 25062012 140 Image source step te os ROIs step Threshold step Performing a materials science analysis Phase analysis Performing a phase analysis Note You can follow these step by step instructions on your PC 1 Load the SprayCoating tif example image e Inthis image the percentage area of the bright and the dark phases are to be measured within an ROI 2 Activate the Materials Solutions tool window Should this tool window not be visible use the View gt Tool Windows gt Materials
195. re offers you several ways of creating an EF l image e Acquiring an EFI image without a motorized Z drive e Acquiring an EFI image with a motorized Z drive 29 Task Selecting the acquisition process Setting acquisition parameters Preparing an EFI acquisition Acquiring an EFI image Acquiring images Acquiring an EFI image Acquiring an EFI image without a motorized Z drive You have a thick section in the transmitted light mode or a sample with a very rough surface in the reflected light mode e g with holes grooves bumps peaks or slanting planes In the image it s only possible to bring one layer of the section or only part of the surface sharply into focus higher lying or deeper lying areas are outside the depth of focus range Acquire a Z stack through the complete thickness or height of the sample and have the EFI image calculated for you In this case you can use the manual nstant EFI acquisition process to acquire a sharply focused image of all of the sample Note You can use the nstant EFI acquisition process with every microscope When your microscope stage is equipped with a motorized Z drive use the Z Stack acquisition process to acquire an EFI image 1 Use the View gt Tool Windows gt Process Manager command to make the Process Manager tool window appear 2 Select the Manual Processes option 3 Click the Instant EFI e The button will appear clicked You can recognize this stat
196. reference points is the reference line for the measurement of the asymmetry In the example shown the reference points define the width of a weld The reference points in the example shown lie horizontally next to one another They could just as well have any orientation in the image e The points which you define will each be marked in the image e The mouse pointer s shape on the image window shows which measurement mode you are in e The mouse pointer is now linked to an auxiliary line parallel to the perpendicular bisector When you move the mouse you will move this line at the same time 6 Left click a measurement point to measure its distance from the reference line e The result of the measurement will be shown in the image Define a measurement point 1 The distance between the point and the reference line will be measured 7 lf required you can also define other measurement points For each measurement point defined the distance to the reference line will be measured 8 As long as the measurement is not yet finished you can undo individual measurement points if you have made a mistake in the measurement To do that press backspace on your keyboard Note If the measurement results are not shown check the measurement parameters currently displayed 63 Finishing the measurement Saving the image 9 10 11 12 Measuring images Measuring welding seams Click the right mouse button to
197. rement is finished e The Materials Solutions tool window switches back to the start position e The three images acquired will be saved in the database The name of the images in the database is determined by the current default value for the mage name database field The database administrator can set up this default value You can find more information in the online help e Aworkbook with the measurement results will be created and saved in the database e The concluding report will be generated and displayed in MS Word 126 Editing the report and saving it Loading the measurement results Performing a materials science analysis Throwing Power 1 Check the report in MS Word If necessary add more text When you are satisfied with the report in MS Word use the Olympus gt Save to Database command to also insert the report into the database Before doing that make sure that the correct database folder has been selected 72 Ox we G Ge A h i The results of a throwing power measurement will be saved in the database You can for example access the data in the document view of the database 1 The project header view 2 shows the higher level database folder In the sample list view 3 the database folder will be selected which contains the data The gallery view 4 shows the three images acquired the workbook with the measurement results and the saved MS Word report You can find additional information
198. rrect placeholders for the document types that you want to drag onto the report instruction Accordingly if your report is to contain an image and a chart select a page template that contains one placeholder for an image and another for a chart You can find more information on page templates in the online help e lf you want to use workbooks in your reports MS Excel must be installed on your PC The minimum MS Excel version required is MS Excel 2003 e The placeholder for a workbook can also be used for a MS Excel file To do so select the MS Excel file in the File Explorer tool window and drag it onto the report instruction In the report instruction MS Excel files are shown with this icon X 5 Drag the documents you want onto the lower part of the report instruction 3 e Inthe Reporting layout the Database Gallery and File Explorer tool windows are arranged to the left to the document window In each of the tool windows you can select one or more documents and drag them onto the report instruction If you use the File Explorer tool window the documents do not need to be open for this If you use the Database tool window the documents don t have to be open either It is sufficient to open the database However the Gallery tool window only allows you to select documents that are currently open in your software e You can also integrate MS Word files e g background information regarding the project into your MS Word report
199. rt 153 Image source step Performing a materials science analysis Coating Thickness General procedure for a coating thickness measurement 1 Select the analysis process Click the Coating Thickness button located in the Materials Solutions tool window 2 Image source step Choose the image you want to measure 3 Settings step Select the sample surface type Flat for example Specify further measurement parameters y 4 Measurement step Define the outer and inner borders of each coating y 5 Results step Document the results report or workbook 10615 09042013 Measuring the coating thickness This step by step instruction describes how you can measure the thickness of a coating An image of the flat sample surface on which 1 coating is to be measured has been selected as an example If you selected an image with a different surface in the Settings step there will be small differences in the procedure Example image CoatingThickness2_GrindingBallDiameter_40mm tif When your software was installed several example images were automatically installed at the same time You can follow this step by step instruction using the Coating Thickness2_GrindingBallDiameter_4Omm tif example image Open this image and make sure that it has been selected in the document group You can find the information where the example images are located in the online help Note Coatings are always measured startin
200. rtain parts in the overlap area better You will find an overview on the possibilities of changing an image s zoom factor in the online help 16 Define your way through the sample with the arrow buttons and follow that with the stage In this manner you can display a sample in any form you like in the stitched image The illustration shows a stitched image that is made up of 9 individual images and the stage path 17 Click the Stop m button when you want to end the acquisition of the stitched image e You see the completed stitched image 4 in the image window Since the individual images can lie a little askew of each other the stitched image isn t as a rule rectangular but contains empty areas on its borders 5 These areas will as a rule be cut off in the stitched 36 Properties of the stitched image Acquiring images Creating stitched images The stitched image will by default be automatically saved The storage directory is shown in the Acquisition Settings gt Saving gt Process Manager dialog box The preset file format is VSI By default in the overlap area the intensity values of two adjoining individual images will be matched with each other to make the image s overall impression homogeneous Stitched images are calibrated This means that you can measure distances and objects on a stitched image 37 Task Preconditions Selecting an objective Selecting the acquisition process U
201. s MS Word file don t need a placeholder in the report instruction Select the MS Word file in the File Explorer tool window and drag it directly onto the report instruction In the report instruction MS Word files are shown with this icon w e The documents must have been saved because unsaved documents cannot be included in a report LImage Fields The illustration shows an example of a report instruction In the report two different page templates are to be used The first page template contains a single placeholder for an image the second page template contains two placeholders for an image After the page template the images that are to be inserted in the report page are displayed 161 Exchanging the document template Changing the page templates Creating reports Working with the report composer 6 Check the report instruction now You may still edit it and e g delete or shift documents or select another page template Creating a report 1 Ww Click the Create button You find this button in the Report Composer tool window e The report will be created Creating a report can take some time when large reports with many images and documents are involved Pay attention to the progress bar that is shown The MS Word application program will open automatically and display the new report In the example shown below the report has three pages The fact that the first page template only contains one ima
202. s Solutions tool window will display the next step Select the chart by which you want to analyze the image If you ve installed a demo plate select that e For the FerriteGrains tif image you can select the Single grain size entry in these step by step instructions to specify the grain size You ll only see this entry if you ve chosen the Demo single grain size demo plate Click the Next button e The Materials Solutions tool window will display the next step e Inthe document group the new Chart Comparison document will be displayed In the Style group choose how the images for the chart comparison are to be arranged in the document group Choose an arrangement in which the FerriteGrains tif image and the selected reference image are superimposed To do this click this Li button e Inthe document group the Chart Comparison document will now be displayed It contains exactly one image e Inthe Overview field you see the arrangement that has been chosen The selected reference image is framed in red oes ed fay Lys z iS es es 7 7 T Pele E x mr 5 7 i At Compare the structures of the current image with those of the reference image Move the slide control below the Style field towards the Opaque position if the image that is to be checked is to superimpose the reference image Alternatively move the slide control towards the Transparent position 78 Results step Performing a materials science analysis
203. s described below Which of them you see depends on the image type you chose in the previous mage type information step CIKI 1 Buttons for selecting the grain boundary type Prerequisite You ll only see these buttons if you chose the Flat etched grains or Ferritic grain size with pearlite image type in the previous step Here you specify which criteria are used to detect the grain boundaries Depending on the image that is to be analyzed the grain boundary type can be bright or dark Therefore this slide control can only stand at the position Dark or Bright 2 Slide controls The positioning of the slide controls influences the detection of the grain boundaries While you are positioning the slide controls observe which grain boundaries are found The preview is updated after every change in the settings Position the slide controls in such a way that the grain boundaries are detected as completely as possible It doesn t matter if the grain boundaries are interrupted somewhere in between The algorithm that calculates the G value will automatically close small interruptions in the boundaries Note Make sure that the correct grain boundary type has been set before you adjust the positions of the other slide controls 87 Performing a materials science analysis Grains Planimetric Note If you are not sure whether or not a slide control is positioned correctly click the Next button and have a look a
204. s exactly one measurement parameter The three most frequently used parameters are Area Max Feret and Equivalent Circular Diameter These parameters are always shown in the Measurement list and can be selected quickly e lf you analyze your own images later on you may want to measure the particles according to another parameter for example according to the shape To select another measurement parameter click the Select Particle Measurement LME button located at the right hand side of the Measurement list Then select the measurement parameter you want in the Select Particle Measurement dialog box A description of this dialog box can be found in the online help 2 f necessary adjust the measurement units A the GlobularGraphite tif image is calibrated in micrometers in the Measurement Unit field theum unit must be selected Note The value in the Measurement Unit field depends on the parameter selected in the Measurement field For some parameters the Measurement Unit field is not necessary and will thus not be displayed 3 Click the Automatic Classification Ks button You will find this button in the toolbar above the table e The Automatic Classification dialog box opens 4 Inthe Automatic Classification dialog box click the Get Min Max from Image button In the Minimum and Maximum fields the area of the smallest and biggest particle is entered The kind of value that is read out from the image and entered in the
205. s or workgroup template in the software A note for users creating the MS Word reports using the Report Composer tool window If you want you can assign a title to the document In this case your software shows this title in the Report Composer tool window If you don t enter a document title the file name is shown instead in the Report Composer tool window To define a document title do the following In MS Word 2003 use the File gt Properties command and switch to the Summary tab Enter the document title in the Title field Close the dialog box with OK In MS Word 2007 2010 use the File gt Save as command In the Save as dialog box enter the document title in the Title field Close the dialog box with OK 9 Close the file Adjusting the insertion order The placeholders are numbered in the order in which they were inserted Should you have initially set up placeholders for two images have then decided to put a placeholder for a chart right at the top of the page the insertion order would be that shown in the example on the left 1 In this case use the Olympus gt Templates gt Adjust Insertion Order command to have the insertion order numbered serially from top to bottom see the example on the right j a PAA K TA ES ON 166 Considerations for users who created the MS Word report using the Report Composer tool window Creating reports Working with the Olympus MS Office add in Inserting a place
206. s step in the analysis This intensity range is called a phase The intensity value range is limited by a top and a bottom intensity value These are the so called threshold values In this step in the analysis you can change the threshold values You can also create another phase This makes sense for example if the pores have very variable intensity values To the left you can see a sample which only has one phase On the right you can see a sample with a red and a green phase Please note that defined ROIs will not be considered in this step in the analysis but only in the next step 1 Component field Click on the Automatic Threshold Computation button to have the threshold values initially calculated automatically to then manually process them if necessary The Compute automatic thresholds dialog box will open Make the necessary settings here 130 Performing a materials science analysis Porosity If you measure the porosity in a color image in the Component list you can select whether the threshold value is to be determined on the intensity value or on the red green or blue part of the image The threshold value setting in color images is more complex than it is in gray value images You will find detailed step by step instructions on setting threshold values on color images in the online help 2 Defining threshold values Note If you would like to set threshold values fo
207. selected will be used for the new joint inclusion In this case take care that you click the two inclusions in the right order e The inclusions will be joined The results will be updated 4 If you want to you can merge further inclusions 5 Click your right mouse button to leave the edit mode and to accept the changes Splitting an inclusion 1 Enlarge the display of the image until you can easily recognize the inclusions that are to be separated e In this example the particle on the far left hand side that is indicated by an arrow is to be split 2 Inthe Edit inclusions group click the Split inclusion button e The mouse pointer will change its form You will then be in edit mode The only thing you can do now is to split inclusions In this mode other work with your software isn t possible 3 To do so click once with your left mouse button at an arbitrary position on the line surrounding the inclusion 116 Performing a materials science analysis Inclusions Worst Field e The surrounding line and all of the particles that belong to this inclusion will be displayed bold 4 Click with your left mouse button at the position in the image where the separation line is to begin 5 While keeping your left mouse button depressed drag the separation line through the object 6 Click the left mouse button to confirm the separation e The inclusion will be split If you want to you can split furth
208. sible use the View gt Tool Windows gt Materials Solutions command to have it displayed 3 Click the Throwing Power button e The Materials Solutions tool window displays the Settings step 123 Performing a materials science analysis Throwing Power Selecting the 4 From the Measurement method list select the Microvias entry measurement method e Inthe Materials Solutions tool window you will now see a schematic illustration which shows the cross section through a filled microvia o 5 Click the Next button L gt e The Materials Solutions tool window will display the next step e Your software will automatically switch to the live mode e The Camera Control and Microscope Control toolbars will be displayed so that you can set the exposure time and the current magnification e The Measurements table in the Materials Solutions tool window contains the required parameters to measure the throwing power of a microvia The first measurement parameter d will automatically be selected and will be shown in the schematic illustration in a tool window The Microvias measurement method contains the following parameters d diameter of the microvia T thickness of the circuit board S1 and S2 thickness of the surface coating of the track Bmin minimum thickness of the coating at the base of the microvia Measuring the first 6 Place one of the circuit board cross sections to be measured under your wena microscope Refer to
209. sing the software autofocus Putting the stage navigator on display Acquiring images Creating stitched images Acquiring a stitched image with a motorized XY stage XY Positions MIA You want to acquire an image of a large sample area Use the automatic XY Positions MIA acquisition process to scan a rectangular area of the sample and to have adjoining images combined into one stitched image MIA stands for Multiple Image Alignment You can only use the XY Positions MIA acquisition process if your microscope is equipped with a motorized XY stage e The stage has been set up and initialized i e its stage limits have been defined e The camera is aligned parallel to the XY stage The angle between camera and stage should be smaller than 1 e The shading correction has been set up Switch to the Acquisition layout To do this use e g the View gt Layout gt Acquisition command On the Microscope Control toolbar click the button with the objective that you want to use for the acquisition of the stitched image Activate the Process Manager tool window Select the Automatic Processes option Click the XY Positions MIA button e The button will appear clicked You can recognize this status by the button s colored background e The XY group will be automatically displayed in the tool window If your microscope is equipped with a motorized Z drive you can switch ona software autofocus In the Process Ma
210. ssification of the inclusions that have been detected How this classification looks like depends on the standard by which the analysis was performed For example the ASTM E 45 Method A standard uses the classification A Sulfide B Alumina C Silicate and D Globular Oxide Furthermore this standard groups the inclusions into t thin and h heavy according to their mean width inclusions type A B C or to their diameter inclusions type D Other standards use another classification of the inclusions and don t further divide them up into groups Take a look at the displayed results in the image as well e Inthe image every detected inclusion will now be outlined with a colored line The illustration shows a detected particle The entire inclusion is outlined with a colored line e Particles that have been detected but that aren t used for the analysis e g because they don t come up to the minimum size that has been set in the industry standard are shown with a yellow line If you want to correct the automatically found inclusions use the buttons in the Edit inclusions group Click the Next button Take a look at the results that are shown in the table Here you see for each inclusion type separately the worst inclusion found in any of the analyzed images Select the Generate Report check box if you would like to have a report automatically generated in MS Word once the analysis is completed Sele
211. supported document types When you start your software the document group is empty While you use your software it gets filled e g when you load or acquire images or perform various image processing operations to change the source image and create a new one User interface Overview 3 Toolbars Commands you use frequently are linked to a button providing you with quick and easy access to these functions Please note that there are many functions which are only accessible via a toolbar e g the drawing functions required for annotating an image Use the Tools gt Customization gt Start Customize Mode command to modify a toolbar s appearance to suit your requirements 4 Tool windows Tool windows combine functions into groups These may be very different functions For example in the Properties tool window you will find all the information available on the active document In contrast to dialog boxes tool windows remain visible on the user interface as long as they are switched on That gives you access to the settings in the tool windows at any time 5 Status bar The status bar shows e g a brief description of each function Simply move the mouse pointer over the command or button for this information You can also find additional information in the status bar 00108 10 User interface Layouts 2 2 Layouts What is a layout Which elements of the user interface belong to the layout Switc
212. t the results in the mage results step With the Back button you can always return to the Settings step Grain boundary width Prerequisite You ll only see this slide control if you chose the Flat etched grains image type in the previous step With this slide control you set the necessary width for the detection of a grain boundary If the grain boundaries can be clearly recognized a small grain boundary width is sufficient The slide control can in this case stand on the far left near the Small position If the grain boundaries are difficult to recognize you ll need to increase the grain border width To do so move the slide control to the right towards the Large position In the first illustration the selected grain boundary width is too small In the Image results step you can see that the grain boundaries have not been detected completely In this illustration the grain boundary width has been increased Now the grain boundaries have been completely detected In the mage results step you can see that the grain boundaries have been detected completely You can use the program options to change the color in which the detected grain boundaries are shown You can find more information on this topic in the online help Threshold Choose whether a smaller intensity range is sufficient for the detection of a grain boundary This is the case when all of the grain boundaries stand out clearly against the background for ex
213. t to retain these newly created image layers 00736 12062012 Performing a cast iron analysis etched sample Note You can follow these step by step instructions on your PC They describe how to measure the ferrite pearlite ratio 1 Load the Ferrite Pearlite tif example image e The ferrite pearlite ratio is to be measured 2 Activate the Materials Solutions tool window Should this tool window not be visible use the View gt Tool Windows gt Materials Solutions command to have it displayed 3 Click the Cast Iron button In the Image source group choose the Selected images option to analyze the example image This image must have been opened for this purpose and have been selected in the document group 5 Select the Skip Sample information check box 6 Select the All images entry in the Check settings and results list Click the Next button e The Materials Solutions tool window will display the next step 1 Click this button to set that you want to determine the ferrite pearlite ratio using an etched sample e lf the button for unetched samples has been active before the settings possibilities in this window will now change 2 Use the Threshold for ferrite slider to define the ferrite phase By doing so you set the range of intensity values the phase that is valid for the ferrite detection If the slide control is closer to the Low position the phase contains a larger part of the intensities that are
214. t to save the changed images or not You can either insert the analyzed images as new images into the database or overwrite the existing database images with them As well as that you can either save the images in the file system or reject them e The Materials Solutions tool window will display the next step e Only when you carry out an analysis on the live image or you want to leave out the analysis of all of the remaining images Click the Get Results button You will then see the Results step Otherwise when you ve finished analyzing one live image the next live image will always then automatically be offered for analysis Check the results shown You can see the overall results for all of the images that have already been analyzed for this sample Select the Generate Report check box if you would like to have a report automatically generated in MS Word once the analysis is completed e The additional step Reporting will be added to the current analysis In the lower part of the dialog box the Finish button will change into the Next button Select the Generate Workbook check box to have a document of the workbook type automatically created at the end of the analysis If you want to save the current settings to a file click the Save settings button Then assign a descriptive name in the next dialog box e You can load these settings parameters when you analyze further images To do so you must load the image to be a
215. t to use the nstant EFI acquisition process 7 Click the Stop D button when you want to end the acquisition of the stitched image e You see the completed stitched image in the image window You can only use the EF acquisition process when your stage is equipped with a motorized Z drive 1 Select the XY Positions MIA acquisition process 2 Define an MIA scan area You can find a step by step instruction for doing this further above 3 Additionally select the Z Stack acquisition process e Inthe group with the different acquisition processes two of them are now active 4 Define all of the parameters for the Z stack s acquisition 5 Inthe Z group select the Extended Focal Imaging check box 6 Click the Start button to begin the acquisition of the stitched image e Ateach of the MIA scan area s stage positions a Z stack will first be acquired then the EFI image calculated from it The EFI images will be combined into a stitched image 41 Putting the stage navigator on display Acquiring stitched images Acquiring images Creating stitched images e When the acquisition process has been completed you ll see the finished stitched image in the image window Automatically acquiring several stitched images You can define several MIA scan areas on the sample When the acquisition has started all of the MIA scan areas will be moved to one after the other anda stitched image will be acquired at
216. t you want to edit 2 Simply drag the new documents onto the position you want in the report instruction e Dragging amp dropping images onto the report instruction is possible from the Database Gallery and File Explorer tool windows e Please note the page templates must be placed before the images You can change the order in which the selected documents are arranged in the report instruction at any time 1 Load the report instruction that you want to edit 2 Select an image and with the left mouse button depressed drag it to another position Drag amp Drop 00153 02052013 163 Creating reports Working with the Olympus MS Office add in 8 3 Working with the Olympus MS Office add in When your software is installed an add in from Olympus is added to the MS Office MS Word and MS PowerPoint application programs When you start MS Word or MS PowerPoint you can recognize this because the Olympus menu is displayed Note Depending on the MS Office version used the Olympus add in looks Slightly differently In MS Word MS PowerPoint 2003 the Olympus menu and the Olympus toolbar are available In MS Word MS PowerPoint 2007 and 2010 only the Olympus menu is available When it is selected the commands are available in a ribbon Note The language in the Olympus menu corresponds to the language set in your image analysis program The add ins functions This add in assists you with very different tasks
217. ter turns into an arrow Cp atte ol ra a En P ea Pnie Sele ee TE i Ly sf 4 Si q y ETE e T AP ae ir F a a k ma i ann ia lf you want to measure more than one coating Define all further coatings to a aS Ve Eg oe a TAT D ed i Soa J Lr Po ee oe ae k te Fie Boe ed ee ee ie See Fi e a ye a ee byt er nad a ia an TJ ay a i be measured each with one additional mouse click e As soon as you ve defined the inner border of the last coating the mouse pointer turns into an arrow 5 Check the values in the Measurements table 6 If you want you can correct a borderline To do this move the mouse pointer to the small handle on the borderline so that it takes on this shape Now click the left mouse button and move the borderline to where you want it e The borderline is corrected and the values in the Measurements table are updated 156 Performing a materials science analysis Coating Thickness 7 lf you want you can change the coating s name Normally the coatings are numbered serially If for example you prefer to specify the coating material click once on the number in the Coating field in the Measurements table to select the entry Then click on the entry one more time to overwrite it Enter the text you want 8 Click the Next button e The Materials Solutions tool window will display the next step Results step The Materials Solutions tool window displays the measurement results
218. the angle to determine the throat thickness 59 Measuring the throat thickness when the root is exposed Measuring images Measuring welding seams 7 Move the auxiliary line 4 to the outer surface of the weld The part between the two lines shown in yellow above must be just inside the cross section of the weld along the entire length e The measurement of the throat thickness is thus complete The Throat Thickness measurement object an equilateral triangle is completely defined e The throat thickness the height of the triangle will be shown in the image In the Measurement and RO tool window table a new measurement value with a type of Throat Thickness will be entered Note If the measurement results are not shown check the measurement parameters currently displayed You can find step by step instructions to modify the measurement parameters further down 8 Take a look at the result in the Measurement and ROI tool window and in the image The illustration shows an enlargement of the weld with the measurement object an equilateral triangle The result of the measurement is the throat thickness 1 the height of the triangle The auxiliary line 2 the base of the triangle must be positioned so that it just lies completely within the weld lf the root of the weld is exposed another step will be required to measure the throat thickness 9 Select the measurement object To do so click the Sele
219. the cross section as shown in the schematic illustration 7 Move the stage so that the first distance to be measured can be clearly seen in the live image and adjust the focus 8 Select the best magnification To do that in the Microscope Control toolbar click the required objective s button Bo Bic P 20x 50x Note The images which you acquire with your software will only be correctly calibrated if you specify the current objective magnification before acquiring the image Correctly calibrating the image is a requirement for a correct measurement 9 Seta zoom factor for your image window that will make the through hole that is to be measured clearly visible Rotate for example the mouse wheel to change the zoom factor of the live image in the image window You will achieve the most precise measurements if you set the zoom factor at 100 10 If necessary adjust the exposure time 11 Measure the distance which is shown in the diagram To do that click with the left mouse button on the start and end points of the distance to be measured e The line you have measured will be displayed in the image e The result will be displayed in the Materials Solutions tool window in the Measurements table e Your software will now automatically activate the next parameter to be measured in the Measurements table and will also show this in the diagram 124 Performing a materials science analysis Throwing Power In the
220. the online help Measurements always apply to one image layer For this purpose show the image layer on your monitor on which you want to make measurements To do so use the Layers tool window Then carry out the measurement on this image layer The measurement will be permanently linked to this image layer i e the measurement will only be displayed on your monitor when the image layer on which you made this measurement is also on display The measurement results will be shown in the Measurement and RO tool window You can give every measurement the name of the image layer on which it was made To do this use the Layer measurement parameter Measurement precision How precise the measurement is depends on the X Y calibration and the image s current zoom factor The X Y calibration defines the width and height of the sample area that is represented by one pixel For example it could be that one pixel displays a sample area of 10 um x 10 um A pixel is the smallest image structure that can be measured For this reason the maximum measurement precision where this example is concerned is 10 um The zoom factor tells you how large the image will be displayed on your monitor With a zoom factor of 100 one pixel on the monitor equals exactly one pixel in the image With a zoom factor of 50 one pixel on the monitor equals 2 x 2 pixels in the image When you make a measurement you should use the zoom factor 100 whenever possible Then
221. this step This has an effect on the number of intercept points that will be found Therefore you should keep an eye on the display in the image Here you set the necessary width for the detection of a grain boundary When a small grain boundary width is set your software finds considerably more intercept points than with a wider grain boundary Use this slide control to apply a smoothing filter to the image The smoothing filter reduces the image noise You should therefore apply a smoothing filter to images that are very noisy before the intercept analysis is made Move the slide control from the left to the right to increase the strength of the smoothing filter in small steps This will lead to a reduction of the detected intercept points 3 Buttons for selecting the grain boundary type Here you specify which criteria are used to detect the grain boundaries Depending on the image that is to be analyzed the grain boundary type can be dark left illustration or light middle illustration Where images that don t have any intensity deviations but only show different gray values are concerned select the Step setting right illustration 4 Number of test lines These fields are only active if you selected a line pattern that contains horizontal or vertical lines In this case you specify here the number of lines to be used for the intercept analysis 10263 Performing an intercept analysis 1 Activate the Materials Solu
222. tion even small artifacts will be ignored With samples that have a lot of artifacts using the slide control you can considerably reduce the time your software needs for reconstructing the grain boundaries ros a pr r f i ti L f 2 In the first illustration no artifacts are ignored the slide control is at the Weak position In the second illustration many artifacts are ignored the slide control is at the Strong position With this setting the next step reconstructing the grain boundaries can be completed much quicker Note Although the Artifact removal slide control s main function is to make reconstructing the grain boundaries quicker with some samples it may also lead to better results This is the case if a sample has so many artifacts lying close to each other that your software makes a new grain out of it This fake grain would then distort the number of the detected grains and also the G value Smoothness Prerequisite You ll only see this slide control if you chose the Color etched grains image type in the previous step With the help of this slide control you can specify that small structures or patterns that are located within the grains are to be ignored for the analysis These structures have nothing to do with grains Therefore it is important to exclude them from the detection If this is not done these small structures are taken for grains and will thus affect the result of a planimetric me
223. tion about this in the next section 6 If you want to insert more detail zooms Click the Add button and with the left mouse button pressed draw a rectangle in the image Each image can have up to eight detail zooms 7 Click OK e The Detail Zoom dialog box is closed The detail zooms will be shown in the report Editing a detail zoom 1 Select the image with the detail zoom that you want to edit If the image is in a grouped object you have to select the group first Use the Olympus gt Detail Zoom command 3 Select the detail zoom that you want to edit To do so click once within the black border in the image 4 Make the required changes You have the following possibilities Changing the size and shape Changing the position Changing the detail zoom Changing scale bar and info stamp options 5 If your settings should apply for all future detail zooms click the Set as Default button 6 Click OK e The Detail Zoom dialog box is closed The edited detail Zoom will now be shown in the report To do so move the blue handles Select the detail zoom and drag and drop it to another position The detail zooms can be positioned to the right or left of above or below the image In certain cases the images following in the report will be moved onto a new page Don t move the detail zoom so far from the image that it no longer fits on the report page 173 Changing the Detail zoom factor Changing scale bar a
224. tion to construct the perpendicular bisector of the connection between two reference points and to determine the distance of a measurement point from the perpendicular bisector You can find the measurement function in the Measure menu or as a button on the Measurement and ROI tool window or toolbar Prerequisite The Asymmetry Lines measurement function will only be available if you purchased the Weld Measurement solution together with your software 1 If necessary use the View gt Tool Windows gt Measurement and ROI command to have the Measurement and RO tool window displayed 2 Acquire an image or load one 3 Seta zoom factor for your image window that will make the image segment that is to be measured clearly visible You will achieve the most precise measurements if you set the zoom factor at 100 Start the measurement To do so click the Asymmetry Lines me button on the toolbar at the top of the tool window 62 Undoing measurement points Measuring images Measuring welding seams 9 2 The illustration shows a cross section of two welded pieces of metal How asymmetric is this weld Click on the two reference points 1 and 2 in turn Your software will automatically calculate the perpendicular bisector as a reference line for the measurement of the asymmetry 3 5 With the left mouse button click on two reference points in turn The perpendicular bisector of the connecting line between these two
225. tions tool window Should this tool window not be visible use the View gt Tool Windows gt Materials Solutions command to have it displayed 2 Click the Grains Intercept button 3 Inthe mage source group choose the image or the images that you want to analyze When you do this pay attention to the information as to how many images have been selected This information is shown in bold font at the bottom of the group The following options are available 4 Decide whether you want to load settings that you have saved while you were analyzing another image Then you can if necessary adapt these settings and apply them to this image Click the Load from file button to load the settings that have been saved 5 Decide whether or not you want to add data about the sample or about individual images while the analysis process is in progress If you don t want to do so select the Skip Sample information check box Should you want to add data e g because you are analyzing images of several samples in the same analysis leave the check box unselected 6 Select the All images entry in the Check settings and results list 82 Sample information step Settings step Image results step T Performing a materials science analysis Grains Intercept e f you would like to analyze your own images later on you can also select another entry from this list e g if you would no longer like to check the settings for every
226. to the image analysis software add the missing measurement and then change back to MS Word or MS PowerPoint in order to continue editing the report 1 Open the report and select the image that you want to adjust If the image is in a grouped object first select the group and then select the image 2 Select the Olympus gt Adjust Document command e You switch to the image analysis software If it was closed it will be started and displayed in the foreground e The image that you want to adjust is also opened In case it is from a database that is currently closed the database will be opened in the background Note The image analysis software is now in a special adjust document mode In this mode you can only make certain adjustments to the image This is why a lot of other functions are hidden 3 Make the required change 4 Ifthe image information was changed Save the image in the image analysis software e Some changes made to an image don t have to be saved e g when you select another frame in a multi dimensional image Other changes have to be saved e g adding a measurement The fact that a change has to be saved will be indicated by an asterisk shown behind the file name in the document group 168 Editing a workbook in the report Creating reports Working with the Olympus MS Office add in 5 Click the Update Report button You find this button in the Adjust Document message box that is shown in the
227. tool window before doing so you should decide whether it will be better to make the changes in the report i e in MS Word or in the report instruction i e in your software Often it is advisable to change the report instruction first and then create a new report Changes you make in the report instruction are valid for every subsequent report that you create with this report instruction There are numerous changes that you can anyway only make in the report instruction for example the selection of other page templates Changes that you make in a report are only valid for that particular report There is also no possible way in which changes that are made in a report can be automatically adopted in the report instruction However there are some cases when it makes sense to make a change only in the report for example when you ve created a very large report with a large number of documents and only want to change the order of two images in it If you didn t create the report using a report instruction but used the Olympus MS Office add in in MS Word or MS PowerPoint you will only be able to edit the report anyway Note The following step by step instruction relates to reports in MS PowerPoint and MS Word formats 167 Adjusting an image Creating reports Working with the Olympus MS Office add in Changing the image properties When images are transferred to an report the image link is transferred as well This makes
228. ts between the plated copper within a microvia or through hole and around the perimeter of that microvia or through hole When the filled microvia or through hole is not completely filled the measurement value is positive 122 Performing additional measurements Finishing the throwing power measurement Possible warnings once the measurement is complete Performing a materials science analysis Throwing Power When the filled microvia or through hole is overfilled the measurement value is negative 2 Performing the throwing power measurement Measure the distance which is shown in the diagram To do that click with the left mouse button on the start and end points of the distance to be measured As soon as you have measured all of the parameters which are required for the selected measurement method the Next and Get Results button will become active in the lower part of the dialog box 3 Continuing the throwing power measurement As soon as you have measured all of the parameters which are required for the selected measurement method the Next and Get Results button will become active in the lower part of the dialog box Click on the Next button to measure more structures on your panel All of the measurement parameters will be reset for the new measurement The previously measured parameters will be saved and will be included in the analysis which will be issued in a report at the end of the throwing power measurem
229. tton e The Materials Solutions tool window switches back to the start position You can now use all of your software s functions again 00724 15052013 79 Performing a materials science analysis Grains Intercept 7 3 Grains Intercept Description of the above illustration Results of an intercept analysis What is an intercept analysis The intercept analysis is used to measure grain sizes and to document them It is often used in material analyses for example when the quality of steel or other metals is being tested When an intercept analysis is made measuring lines are placed in an image Along these measuring lines your software searches for abrupt deviations in the pixels intensity gray value An intensity deviation occurs for example if dark pixels are present in an image made up of mainly light pixels When an intensity deviation exceeds the parameters that have been set an intercept point will be plotted at this position on the measuring line The intercept points are counted The distance between two intercept points is also measured From this measurement the mean intercept length is calculated MFA ae d i j bA i F 200 ren ON Jii a ype o 4 The intensity profile is determined along the horizontal measuring line Whenever the measuring line crosses a grain boundary this leads to a distinctive minimum in the intensity profile When an intercept analysis is ma
230. tton on the top right in the document group 3 Use the Gallery tool window Select the desired documents and use the Close command in the context menu For the selection of documents the standard MS Windows conventions for multiple selection are valid To close all loaded documents use the Close All command You will find this command in the File menu and in both the Documents and the Gallery tool window s context menu To close a document immediately without a query close it with the Shift key depressed Data you have not saved will be lost Opening documents There are a number of ways in which you can open or load documents 1 Use the File gt Open command 2 Use the File Explorer tool window To load a single image double click on the image file in the File Explorer tool window To load several images simultaneously select the images and with the left mouse button depressed drag them into the document group For the selection of images the standard MS Windows conventions for multiple selection are valid 3 Drag the document you want directly out of the MS Windows Explorer onto your software s document group 4 To load documents from a database into the document group use the Database gt Load Documents command You can find more information in the online help If you want to get used to your software then sometimes any image suffices to try out a function Press Ctrl Shift Alt T to generate a c
231. tuated by your software You can find more information on this dialog box in the online help When all of the hardware components have been registered with your software and have been configured the functioning of the system is already ensured However it s only really easy to work with the system and to acquire top quality images when you have calibrated your software The detailed information that helps you to make optimal acquisitions will then be available Your software offers a wizard that will help you while you go through the individual calibration processes Use the Acquire gt Calibrations command to start the software wizard You can find more information on this dialog box in the online help 17 When do you have to configure the system Necessary user rights for the system configuration Switching off your operating system s hibernation mode Configuring the system Configuring the system About the system configuration You will only need to completely configure and calibrate your system anew when you have installed the software on your PC for the first time and then start it When you later change the way your microscope is equipped you will only need to change the configuration of certain hardware components and possibly also recalibrate them To be able to configure the system you have to be logged in to your software with administrator or power user rights If you have installed the software yourself
232. ump to the position in the image that you want with one mouse click and this will be immediately shown in the magnification you want Use this possibility especially when you are commenting on very large images You can find more information on working with positions and views in the online help The Properties tool window will show you all of the available information from the document group on the active image You can also supplement this information with a text annotation of your own on the image Enter your comment in the Note field You can find step by step instructions in the online help 00121 5 2 Processing images The Process menu offers numerous image processing functions with which you can change an acquired image e g increase the image contrast or the image sharpness 1 Load the image you want to process or activate the image in the document group e Please note that the Process menu will only be visible when an image window Is active in the document group 2 Use one of the commands in the Process menu e g Process gt Enhancement gt Adjust Intensity e The image processing dialog box will open The image processing operation that is active will be shown in the dialog boxes header 3 Click the small arrow next to the Preview al button to open a list of all of the preview functions Select the Original and Preview entry e This preview function displays the same image segment twice in the dialo
233. us by the button s colored background button e The nstant EFI group will be automatically displayed in the tool window 4 From the Algorithm list select the Reflected light entry when you use your light or stereo microscope in the reflected light mode 5 If you work with a stereo microscope select the Automatic frame alignment check box If you don t work with a stereo microscope clear the Automatic frame alignment check box 6 Use the View gt Tool Windows gt Camera Control command to make the Camera Control tool window appear D 7 I button 7 Inthe Camera Control tool window click the Live 8 Move the microscope focus to the Z position where either the lowest or the highest place on the sample is only just no longer sharply focused Use the live mode for a visual control 9 Check the exposure time and correct it if necessary When the Instant EFI acquisition process has been started the exposure time will be kept constant during the whole of the acquisition 10 In the Process Manager tool window click the Start button 30 Acquiring images Acquiring an EFI image e The live image in the document group will divide itself into 3 images On the bottom right you ll still see the live image 3 On the bottom left you ll see the sharpness map 2 The large image above them is the composite resulting image 1 The 3 images will be continually updated J x 0n SS 11 Use you
234. ve been selected in the document group 4 Select the Skip Sample information check box if you don t want to add any details about the sample or about an image of the sample If you want to add details make sure the check box is not selected Note If you want to analyze images from more than one sample in the same analysis process the Skip Sample information check box must be cleared Only then will the New Sample button be displayed With this button you can specify when an image to be analyzed belongs to a new sample 5 Select the All images entry in the Check settings and results list e If you would like to analyze your own images later on you can also select another entry from this list e g if you would no longer like to check the settings for every image 6 Click the Next button 7 Sample information step Settings step Comparison step Performing a materials science analysis Chart comparison e The Materials Solutions tool window will display the next step Note You will only see this step in the analysis if in the previous step the Skip Sample information check box wasn t selected 1 Enter information on your sample By default these fields are called Reference and Group If you want to enter a comment about the sample This comment is valid for all of the images of this sample If you want to enter a comment about the current image too Click the Next button e The Material
235. very small intensity differences which means that the automatic definition would not provide you with satisfactory results Also when only a small part of a layer interests you you can easily set it with the manual definition 93 Image source step i i Settings step Performing a materials science analysis Layer Thickness Please note You can change the definition method during a measurement For example you can first have a contour determined by using the magic wand then add an additional border manually 2 Layer type group In the Layer type group you choose whether open or closed layers are to be defined To do this click the corresponding icon With an open layer type you can e g measure layer structures that continue all through the image When you have a closed layer type you can measure circular layer structures In this mode the measurement line s first point is automatically connected to its last point Please note The Layer type can only be specified at the beginning of a measurement In contrast to the definition method the Layer type can t be changed during the measurement 10500 Performing an automatic layer thickness measurement Note You can follow these step by step instructions on your PC They describe a layer thickness measurement on an example image 1 Load the Coating tif example image a e On this image the thin light layer is to be measured Activate the Materials
236. will make the image segment that is to be measured clearly visible You will achieve the most precise measurements if you set the zoom factor at 100 Measuring the throat Be thickness witha 4 Start the measurement To do so click the Throat Thickness button on welded root the toolbar at the top of the tool window With four mouse clicks 1 4 define two lines along the inner surfaces of the metal pieces which are welded together 5 Click on a point on the inner surface of the first piece of metal 1 This point should be a far as possible from the weld s root You can put the measurement point before or after the weld e The point which you define will be shown in the image with a handle e The mouse pointer s shape on the image window shows which measurement mode you are in 6 With three more mouse clicks 2 4 define two lines along the inner surfaces of the metal pieces which are welded together e Your software will now automatically display some lines and handles in the image window e The mouse pointer is now linked to an auxiliary line which is perpendicular to the bisector of the angle When you move the mouse you will move this line at the same time Once the inner surfaces are defined yellow lines the position of the root 1 will automatically be drawn in and your software will calculate the bisector of the angle 2 Together with the handle 3 move the line 4 which is perpendicular to the bisector of
237. with the specifications for the camera and the microscope 7 Select your camera e g DP25 from the Camera 1 list 8 Select your microscope e g BX51 from the Frame list If your microscope isn t listed select the Manual Microscope entry e Once you have chosen a microscope the options in the Device List dialog box change For some microscopes there are default settings Examples of default settings e For the manual microscope BX51 the Manual Nosepiece entry from the Nosepiece list is preset e For the manual stereo microscope SZX10 the Manual Nosepiece and Manual Zoom Magnitication Changer entries are preset 9 For some microscopes such as IX71 you need to choose the port on which your camera is mounted e g Side eft You find the list to the right of the camera list 10 All other settings such as nosepiece observation filter wheel shutter and condensor are appropriately preset independent of your microscope Check your settings and if necessary adjust them to suit your microscope equipment 11 Close the Device List dialog box with OK e Your hardware configuration will be automatically saved e You can return to the default configuration whenever you want to To do so use the Acquire gt Devices gt Device Settings command Select the Default entry in the Configuration list e As soon as you close the Device List dialog box your software will try to set up the connection to the specified dev
238. xample 2 During a quality control you check various components to see if they are free of defects To do so you compare the components with images of various components that are either defective or free of defects You assign the appropriate reference image to the object that is to be checked General procedure fora The image that is to be checked and all or some of the reference images are chart comparison displayed simultaneously on the screen Your software makes sure that all of the images are always shown on the same scale By making a visual comparison the user finds out which of the reference images is the most similar to the image that is to be checked Saved along with every reference image is the value that it was assigned by the industry standard By the selection of a reference image the a that is to be checked is assigned this value too a B aT A ae n pi i vali Fa ivan ind ae Li F pari Paes T ARET Er CEE A eat ry ie ant et i a i att ae eae Bart ie is Hee 7 D a fete She eter ee oy aT f IET ine me soa iii ASTM ange ean os nbs ie The above image shows the document group during a chart comparison The image that is to be checked is located at the top left the reference images are arranged either next to it or beneath it The selected reference image is framed in red Results The results of a chart comparison can be output in a workbook As well as that when you
239. you will achieve a maximum of measurement precision Should the zoom factor 100 not be possible because the image area you want to measure can t then be completely seen choose the largest possible zoom factor under 100 Information about changing an image s zoom factor can be found in the online help 00150 02072012 49 Measuring images Measuring images 6 2 Measuring images Task Loading an image Setting the labeling color Your software offers a wide range of measurement functions They enable you to quickly count objects and measure segments and areas The following step by step instructions present the measurement functions to you by way of several examples Measuring image objects interactively You want to measure the filaments in a supraconductor To do this load a suitable image or acquire one Measure the diameter of several of the hexagonal filaments in each case between the opposing vertices Subsequently edit the measurement Delete some of the measurements you ve made Enter the results in a MS Excel sheet 1 If necessary use the View gt Tool Windows gt Measurement and ROI command to have the Measurement and RO tool window displayed e You ll find the tool window at the lower edge of the user interface It s possible that it may be covered by the Count and Measure Results tool window Click the Measurement and ROI tab at the bottom of the user interface to bring the tool window into the foregr

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