16720A 300 M Vectors/s Pattern Generator Service Guide
Contents
1. 42 CAUTION Chapter 6 Replacing Assemblies To return assemblies To return assemblies Before shipping the module to Agilent contact your nearest Agilent Technologies Sales Office for additional details Write the following information on a tag and attach it to the module e Name and address of owner e Model number e Serial number e Description of service required or failure indications Remove accessories from the module Only return accessories to Agilent if they are associated with the failure symptoms Package the module You can use either the original shipping containers or order materials from an Agilent sales office For protection against electrostatic discharge package the module in electrostatic material Seal the shipping container securely and mark it FRAGILE 43 Chapter 6 Replacing Assemblies To return assemblies 44 Replaceable Parts Ordering 46 16720A Replacement Parts 47 Exploded View 48 Replaceable Parts This chapter contains information for identifying and ordering replaceable parts for your module Chapter 7 Replaceable Parts Replaceable Parts Ordering Replaceable Parts Ordering Parts listed To order a part on the list of replaceable parts quote the Agilent Technologies part number indicate the quantity desired and address the order to the nearest Agilent Technologies Sales Office Parts not listed To order a part not on the list of replaceable part2. Adjustment P Performance Tests T Troubleshooting Instructions for making these test connectors are in chapter 3 Testing Performance Chapter 1 General Information Recommended Test Equipment 10 To inspect the module 13 To prepare the mainframe 14 To configure a one card module 15 To configure a multi card module 16 To install the module 19 To turn on the system 21 To test the module 21 To clean the module 22 Preparing for Use This chapter gives you instructions for preparing the module for use Chapter 2 Preparing for Use Power Requirements All power supplies required for operating the pattern generator are supplied through the backplane connector in the mainframe Operating Environment The operating environment is listed in chapter 1 Note the non condensing humidity limitation Condensation within the instrument can cause poor operation or malfunction Provide protection against internal condensation The pattern generator module will operate at all specifications within the temperature and humidity range given in chapter 1 However reliability is enhanced when operating the module within the following ranges Temperature 20 C to 35 C 68 F to 95 F Humidity 20 to 80 non condensing Storage Store or ship the pattern generator in environments within the following limits e Temperature 40 C to 75 C 40 F to 167 F e Humidity Up to 90 at 65 C e Alt
3. Select gt es 16720A _ 300Mvector s Pattern Generator l Target Control Port Port In Port Out To test the module The pattern generator module does not require an operational accuracy calibration or adjustment After installing the module you can test and use the module e Ifyou require a test to verify the specifications start at the beginning of chapter 3 Testing Performance e Ifyou require a test to initially accept the operation perform the self tests in chapter 3 e Ifthe module does not operate correctly go to the beginning of chapter 5 Troubleshooting 21 Chapter 2 Preparing for Use To clean the module To clean the module e With the mainframe turned off and unplugged use mild detergent and water to clean the rear panel e Do not attempt to clean the module circuit board 22 Perform the power up tests 25 To perform the self tests 26 Testing Performance Chapter 3 Testing Performance To ensure the logic analysis system is operating correctly you can perform software tests self tests on the system Directions for performing the software tests are given in this chapter This chapter normally tells you how to test the performance of the logic analysis system against the specifications listed in chapter 1 Because there are no specifications for the 16720A there are no performance verification tests Self Tests There are two types of self tests self
4. Service Guide Publication number 16720 97001 November 2001 For Safety information Warranties and Regulatory information see the pages at the end of the book Copyright 2001 Agilent Technologies All Rights Reserved Agilent Technologies 16720A 300 M Vectors s Pattern Generator The Agilent 16720A pattern generator module is an expandable stimulus tool designed for the 16700 Series Logic Analysis System The 16720A provides digital design teams the ability to emulate missing devices and to functionally test prototypes Key Characteristics Some of the key characteristics of the Agilent Technologies 16720A are as follows Output Channel 24 channels at 300 MHz clock 48 channels at 180MHz clock Memory Depth 16 777 216 of vectors Logic Level data pods TTL 3 state TTL 3 3v 3 state TTL CMOS ECL PECL LVPECL terminated ECL unterminated and differential ECL without pod Data Inputs 3 bit pattern level sensing clock pod Clock Output Synchronized to output data delay of 7ns in 14 steps clock pod Clock Input DC to 300 MHz clock pod Internal Clock Period Programmable from 1 MHz to 300 MHz in 1 MHz steps External Clock Period DC to 300 MHz External Clock Duty Cycle 1 3 ns minimum high time Maximum Number of Different Macros 100 Maximum Number of Lines in a Macro 4096 Maximum Number of Wait Event Patterns 4 Service Strategy The service strategy for this instrument is the replacem
5. To configure a multi card module Place the master card on top of any expander cards that are under the master card Feed the free end of the 2x10 cables of the expander cards through the cable access holes to the master card Plug the 2x10 cables into J10 bottom most expander in a five card configuration and J11 expander that is next to the master card on the master card The illustration below shows the bottom three cards of a five card configuration AN L Expande Expander J Place the remaining expander cards on top of the master board Feed the free end of the 2x10 cables of the expander cards through the access holes to the master card Plug the 2x10 cables into J12 expander that is next to the master card and J13 top most expander in a four or five card configuration on the expander cards Expander J12 cxpande Expander J12 VLZZZZZZLLLLLLZL 16720609 18 Chapter 2 Preparing for Use To install the module To install the module 1 Slide the cards above the slots for the module about halfway out of the mainframe 2 With the probe cables facing away from the instrument slide the mod
6. 4 3 0 Event D Event C Event B Event A The four bit values have the following definition 0 passed 1 failed to stop on break with no event wait 2 failed on wait with setting of no event 3 failed to stop on break or wait with wait any event Chapter 8 Theory of Operation Self Tests Description Instruction Interrupt Test The instruction interrupt test verifies the WAIT IMB and SIGNAL IMB instruction decoder The module is configured for a run then verified that it is running The module is again configured for a run then halted by a break command Passing the instruction interrupt test verifies that the module will operate properly to user commands In case of error the following diagnostic integer will be displayed Bit 15 4 3 0 not used Status The four bit values have the following definition errors are or ed 0 passed 1 stopped without a break 2 failed to stop from software 4 failed to stop with break 8 stopped by something other than break Generate Patterns The performance test will set up two predefined patterns for examining the module from an external analyzer or oscilloscope This allows the user to check the output pipelines for functionality The data is output based on the frequency mode chosen by the user 100MHz Mode 10 000 ns period 180MHz Mode 5 555 ns period 300MHz Mode 3 333 ns period Either a checkerboard pattern alternating 1 and 0 across the
7. CPU Interface The CPU interface is a single programmable logic device PLD which interprets the Agilent 16700 series mainframe backplane logic and translates the logic into signals to drive and program the pattern generator module Pod The Clock or Date Pod converts the differential output ECL signal to logic levels of interest Because the output of the pattern generator module cannot directly drive ECL circuitry the Clock and Data Pod is required to interface the pattern generator with the system under test Self Tests Description The self tests for the pattern generator identify the correct operation of major functional areas in the module Internal Loopback Test The internal loopback test verifies the operation of the module backplane interface IC A walking ones pattern is written into module memory at a specific memory location read and compared with known values Passing the internal loopback test implies the module backplane interface IC is functioning and the system is able to write to module memory 51 Chapter 8 Theory of Operation Self Tests Description In case of error the following diagnostic integer will be displayed Bit 39 16 15 8 7 0 Memory Expected Actual Address Value Value Clock Test The clock test verifies that three clock modes can be set to verify both phase locked loop PLL clock generators are functioning Additionally the clock test verifies the RUN STOP control circuit is functional
8. Disconnect the power cord ono amp amp Disconnect any input or output connections Plan your module configuration If you are installing a one card module use any available slot in the mainframe If you are installing a multi card module use adjacent slots in the mainframe Loosen the thumb screws Cards or filler panels below the slots intended for installation do not have to be removed Starting from the top loosen the thumb screws on filler panels and cards that need to be moved ie a si NEXT OWES Starting from the top pull the cards and filler panels that need to be moved halfway out All multi card modules will be cabled together Pull these cards out together Remove the cards and filler panels Remove the cards or filler panels that are in the slots intended for the module installation Push all other cards into the card cage but not completely in This is to get them out of the way for installing the module Some modules for the logic analysis system require calibration if you move them to a different slot For calibration information refer to the manuals for the individual modules 14 CAUTION Chapter 2 Preparing for Use To configure a one card module To configure a one card module e When shipped separately the module is configured as a one card module The cables should be connected as shown in the figure e To configure a multicard module into one card modules re
9. implies that the module memory retains the data at each memory location that is programmed In case of error the following diagnostic integer indicating the status of the memory IC number will be displayed Bit 15 7 6 5 4 3 2 1 0 not 7 6 5 4 3 2 1 used amp 8 The one bit value has the following definition 0 passed 1 failed Marching Bits RAM Test The marching bits RAM test is a very extensive test and may take hours to complete Therefore this test is not included in Test All If the simple RAM test and RAM persistence test are run and you still suspect a memory problem then run the marching bits RAM test The marching bits RAM test attempts to uncover any possible failure mode of module memory Several walking 0 and walking 1 patterns are written to memory read and compared with known values A total of five read write passes are done with each pattern Passing the marching bits RAM test implies there is very high confidence that every module memory IC data and address memory pipeline is operating properly Wait Test The wait test verifies the correct operation of the WAIT pattern registers in the module backplane interface IC Test events are loaded into the WAIT pattern registers then correct operation of the module is verified Passing the wait test implies the module will operate properly to user commands In case of error the following diagnostic integer will be displayed Bit 15 12 11 8 7
10. not completely in This is to get them out of the way for removing and replacing the module If the module consist of a single card replace the faulty card If the module consists of multiple cards remove the cables from J9 and J10 of all cards Remove the 2x10 cables from J4 J5 J7 and J8 from the master card Remove the faulty card from the module 37 Chapter 6 Replacing Assemblies To replace the circuit board To replace the circuit board 1 Remove power from the mainframe 2 Remove the 16720A module from the mainframe 3 Remove the three screws that secure the cable clamp to the rear panel 4 Ifyou are replacing the circuit board unplug all cables from the board Continue with To replace the circuit board To replace the circuit board 1 Remove the cables use procedure above 2 Remove four screws attaching the ground spring and rear panel to the circuit board then remove the back panel and ground spring 3 Replace the faulty circuit board with a new circuit board On the circuit board make sure the 20 pin ribbon cable is connected between J7 and J8 4 Position the ground spring and back panel on the back edge of the replacement circuit board Install four screws to connect the back panel and ground spring to the circuit board 5 Continue with To install the cables 38 Chapter 6 Replacing Assemblies To replace the module To install the cables Plug the six data cables and the c
11. the module as well as the instructions for returning assemblies Chapter 6 Replacing Assemblies CAUTION Turn off the instrument before installing removing or replacing a module in the instrument Tools Required e A T10 TORX screwdriver to remove screws connecting the probe cables and screws connecting the back panel e A 1 4 inch hollow shaft nutdriver to remove the nut holding the cable to the module panel insert 36 CAUTION Chapter 6 Replacing Assemblies To remove the module To remove the module Electrostatic discharge can damage electronic components Use grounded wriststraps and mats when performing any service to this module Remove power from the instrument a Exit all logic analysis sessions In the session manager select Shutdown b At the query select Power Down c When the OK to power down message appears turn the instrument off d Disconnect the power cord Loosen the thumb screws Starting from the top loosen the thumb screws on the filler panels and cards located above the module and the thumb screws of the module RD Co NEXT LOWES u 16530613 Starting from the top pull the cards and filler panels located above the module half way out If the module consists of a single card pull the card completely out If the module consists of multiple cards pull all cards completely out Push all other cards into the card cage but
12. 10 cable faulty or not installed correctly between J10 and J15 or J14 and J19 on circuit boards Check 2x20 cables Are 2x20 cables properly seated y Exit the Self Test and start a logic analyzer session Troubleshooting Flowchart 1 Remove power replace defective board Reapply power and re run module self tests Reset 2x20 cable 31 Chapter 5 Troubleshooting To use the flowcharts Is the user problem still present Perform procedure To verify the pattern output on suspect pod Does pattern output test pass The module is functioning properly Replace pod with known good pod and repeat procedure Does pattern output test pass Replace suspect pod Replace cable with known good cable and repeat procedure Does the pattern output test pass Yes Replace suspect cable gt Replace defective board Troubleshooting Flowchart 2 32 Chapter 5 Troubleshooting To verify pattern output To verify pattern output Equipment Required Equipment Critical Specification Recommended Model Part Oscilloscope gt 500 MHz Bandwidth 54820A Probe 500 MHz Bandwidth 1160A Output Data Pod no substitute 10460A series Connect one of the 10460 series data pods t the end of the pattern generator Pod 1 cable Select Output Pattern
13. 9 34 55 Index 56 Copyright Agilent Technologies 2001 All Rights Reserved Reproduction adaptation or translation without prior written permission is prohibited except as allowed under the copyright laws Restricted Rights Legend Use duplication or disclosure by the U S Government is subject to restrictions as set orth in subparagraph c 1 Gi of the Rights in Technical Data and Computer Software clause at DFARS 252 227 7013 or DOD agencies and subparagraphs c 1 and c 2 of the Commercial Computer Software Restricted Rights clause at FAR 52 227 19 or other agencies Agilent Technologies 3000 Hanover Street Palo Alto California 94304 U S A Document Warranty The information contained in his document is subject to change without notice Agilent Technologies makes no warranty of any kind with regard to this material including but not limited to the implied warranties of merchantability or fitness for a particular purpose Agilent Technologies shall not be liable for errors contained herein or for damages in connection with the furnishing performance or use of this material Safety This apparatus has been designed and tested in accordance with IEC Publication 1010 Safety Requirements for Measuring Apparatus and has been supplied in a safe condition This is a Safety Class I instrument provided with terminal for protective earthing Before applying powe
14. Parts of the module backplane interface IC and the intermodule bus IMB are also tested Passing the clock test implies that the module can generate clocks through the advertised frequency range In case of error the following diagnostic integer will be displayed Bit 15 12 11 8 7 4 3 0 300 MHz 200 MHz 100 MHz not clock clock clock used The four bit values have the following definition 0 passed 1 failed to run 2 failed to stop Simple RAM Test The RAM test verifies that the entire module memory is functioning Patterns of all 0 then all 1 then alternating 0 and 1 are written read and compared with known values Bit 15 7 6 5 4 3 2 1 0 not 7 6 5 4 3 2 1 used amp 8 Passing the simple RAM test verifies that all of the module RAM is functioning properly In case of error the following diagnostic integer indicating the status of the memory IC number will be displayed The one bit value has the following definition 0 passed 1 failed 52 Chapter 8 Theory of Operation Self Tests Description RAM Persistence Test The RAM persistence test verifies the module memory refresh addressing and data retention A pattern sequence is written to blocks in module memory Because of this pattern writing process a long delay is introduced before the patterns are read and verified The patterns are then read and verified then compared with known values Passing the RAM persistence test
15. accessories the characteristics and the recommended test equipment Chapter 1 General Information Accessories Accessories The following accessories are supplied with the 16720A pattern generator module Accessories Supplied Agilent Part Number DATA CABLES 16522 61691 CLOCK CABLE 16522 61602 Mainframe and Operating System The 16720A pattern generator requires a 16700 series logic analysis system with operating system version A 02 00 00 or higher Environmental Characteristics Clock Probes A N Maximum Input Voltage 40 V CAT I CAT Category secondary power line isolated circuits Operating Environment Temperature Instrument 0 C to 55 C 32 F to 131 F Probe lead sets and cables 0 C to 65 C 32 F to 149 F Humidity Instrument probe lead sets and cables up to 95 relative humidity at 40 C 122 F Altitude To 4600 m 15 000 ft Vibration Operating Random vibration 5 to 500 Hz 10 minutes per axis 0 3 g rms Non operating Random vibration 5 to 500 Hz 10 minutes per axis 2 41 g rms and swept sine resonant search 5 to 500 Hz 0 75 g 0 peak 5 minute resonant dwell at 4 resonances per axis Operating power supplied by mainframe Indoor use only Pollution Degree 2 Chapter 1 General Information Recommended Test Equipment Recommended Test Equipment Equipment Required Equipment Critical Specifications sans Use Digitizing Oscilloscope 54820A T A
16. ated conditions are fully understood or met Product Warranty This Agilent Technologies product has a warranty against defects in material and workmanship for a period of one year from date of shipment During the warranty period Agilent Technologies will at its option either repair or replace products that prove to be defective For warranty service or repair this product must be returned to a service facility designated by Agilent Technologies For products returned to Agilent Technologies for warranty service the Buyer shall prepay shipping charges to Agilent Technologies and Agilent Technologies shall pay shipping charges to return the product to the Buyer However the Buyer shall pay all shipping charges duties and taxes for products returned to Agilent Technologies from another country Agilent Technologies warrants that its software and firmware designated by Agilent Technologies for use withaninstrument will execute its programming instructions when properly installed on that instrument Agilent Technologies does not warrant that the operation of the instrument software or firmware will be uninterrupted or error free Limitation of Warranty The foregoing warranty shall not apply to defects resulting from improper or inadequate maintenance by the Buyer Buyer supplied software or interfacing unauthorized modification or misuse operation outside of the environmental specifications for the
17. eep applying pressure to the center of the card endplate while tightening the thumbscrews finger tight Repeat this for all cards and filler panels starting at the bottom and moving to the top Correct air circulation keeps the instrument from overheating For correct air circulation filler panels must be installed in all unused card slots Keep any extra filler panels for future use 41 Chapter 6 Replacing Assemblies To replace the probe cable To replace the probe cable 1 Remove power from the instrument a Exit all logic analysis sessions In the session manager select Shutdown b At the query select Power Down c When the OK to power down message appears turn the instrument off d Disconnect the power cord 2 Remove the screws that hold the probe cable to the rear panel of the module 3 Remove the faulty probe cable from the connector and install the replacement cable 4 Install the label on the new probe If you order a new probe cable you will need to order new labels Probe cables shipped with the module are labeled Probe cables shipped separately are not labeled Refer to chapter 7 Replaceable Parts for the part numbers and ordering information 5 Install the screws connecting the probe cable to the rear panel of the module CAUTION If you over tighten the screws the threaded inserts on the back panel might break off of the back panel Tighten the screws only enough to hold the cable in place
18. eive the exchange assembly return the defective assembly to Agilent Technologies A United States customer has 30 days to return the defective assembly If you do not return the defective assembly within the 30 days Agilent Technologies will charge you an additional amount This amount is the difference in price between a new assembly and that of the exchange assembly For orders not originating in the United States contact your nearest Agilent Technologies Sales Office for information 46 Chapter 7 Replaceable Parts 16720A Replacement Parts 16720A Replacement Parts 16720 Replaceable Parts Ref Des Al Al H1 H2 H3 H4 MP1 MP2 MP3 MP4 MP5 MP6 W1 W2 W3 Part Number 16720 69501 16720 66501 0510 0684 0515 0430 0515 0665 16500 22401 16500 41201 16500 29101 16510 40501 16510 40502 01650 94309 16720 94301 16522 61601 16522 61602 16522 61603 Qty N A A OO N Description Rebuilt circuit board Circuit board assembly Retaining ring Machine screw MSPH M2X14 T10 Rear panel screw Ribbon cable ID clip Ground Spring Rear panel Cable clamp Probe label ID label Data Cable J1 J5 Clock cable J6 Interconnect cable 47 Chapter 7 Replaceable Parts Exploded View Exploded View Exploded view of the 16720A pattern generator 48 Block Level Theory 50 Self Tests Description 51 Theory of Operation This chapter presents the theory of o
19. ent of defective assemblies This service guide contains information for finding a defective assembly by testing and servicing the Agilent 16720A pattern generator module The module can be returned to Agilent Technologies for all service work including troubleshooting Contact your nearest Agilent Technologies Sales Office for more details Application This service guide applies to the Agilent 16720A pattern generator module installed in the 16700 series logic analysis system mainframes The Agilent 16720A uses operating system version A 02 00 or higher The 16700 series mainframes with a serial number prefix lower than US4019 are factory installed with older operating system versions The Agilent 16720A Pattern Generator In This Book This book is the service guide for the Agilent 16720A 300 M Vectors s Pattern Generator module Place this service guide in the 3 ring binder supplied with your 16700 Series Logic Analysis System Service Manual This service guide has eight chapters Chapter 1 contains information about the module and includes accessories for the module specifications and characteristics of the module and a list of the equipment required for servicing the module Chapter 2 tells how to prepare the module for use Chapter 3 gives instructions on how to test the performance of the module Chapter 4 contains calibration instructions for the module Chapter 5 contains self tests and flowcharts for troub
20. he trouble The circled numbers on the charts indicate connections with the other flowcharts Start your troubleshooting at the top of the first flowchart Mainframe Operating System Before starting the troubleshooting on the16720A ensure that the required version of 16700 series mainframe operating system is installed on the mainframe The required operating system software versions are listed in Mainframe and Operating System on page 8 To check the operating system version number open the System Administration window select the Admin tab then select About If the proper version is not loaded obtain a copy of the updated operating system software and install it on the mainframe 30 Apply Power Does the display show the module config correctly Yes Do the procedure To run the self tests in Chapter 3 on the suspect module Does the module self test pass Yes y Chapter 5 Troubleshooting To use the flowcharts Is the current software version No Install latest operating installed system version Yes 2x10 cable faulty or not installed correctly Yes between J3 and J6 on circuit board s Check 2x10 cable s Refer to Chapter 2 Are ALL cards properly seated in the mainframe No Remove power and properly seat all cards in the mainframe Are expander boards installed Yes Remove power from the mainframe No 2x
21. is likely that the ground protection is impaired you must make the instrument inoperative and secure it against any unintended operation e Do not operate the instrument in the presence of flammable gasses or fumes Operation of any electrical instrument in such an environment constitutes a definite safety hazard e Do not install substitute parts or perform any unauthorized modification to the instrument e Capacitors inside the instrument may retain a charge even if the instrument is disconnected from its source of supply Safety Symbols A Instruction manual symbol the product is marked with this symbol when it is necessary for you to refer to the instruction manual in order to protect against damage to the product Hazardous voltage symbol Earth terminal symbol Used to indicate a circuit common connected to grounded chassis WARNING The Warning sign denotes a hazard It calls attention to a procedure practice or the like which if not correctly performed or adhered to could result in personalinjury Do not proceed beyond a Warning sign until the indicated conditions are fully understood and met CAUTION The Caution sign denotes a hazard It calls attention to an operating procedure practice or the like which if not correctly performed or adhered to could result in damage to or destruction of part or all of the product Do not proceed beyond a Caution symbol until the indic
22. itude Up to 15 300 meters 50 000 feet Protect the module from temperature extremes which cause condensation on the instrument 12 Chapter 2 Preparing for Use To inspect the module To inspect the module Inspect the shipping container for damage If the shipping container or cushioning material is damaged keep them until you have checked the contents of the shipment and checked the instrument mechanically and electrically Check the supplied accessories Accessories supplied with the module are listed in chapter 1 Accessories Supplied Inspect the product for physical damage Check the module and the supplied accessories for obvious physical or mechanical defects If you find any defects contact your nearest Agilent Technologies Sales Office Arrangements for repair or replacement are made at Agilent Technologies option without waiting for a claim settlement 13 CAUTION CAUTION CAUTION Chapter 2 Preparing for Use To prepare the mainframe To prepare the mainframe Turn off the mainframe power before removing replacing or installing the module Electrostatic discharge can damage electronic components Use grounded wrist straps and mats when performing any service to this module Remove power from the instrument Exit all logic analysis sessions In the session manager select Shutdown At the query select Power Down When the OK to power down message appears turn the instrument off
23. leshooting the module Chapter 6 tells how to replace the module and assemblies of the module and how to return them to Agilent Technologies Chapter 7 lists replaceable parts shows an exploded view and gives ordering information Chapter 8 explains how the pattern generator works and what the self tests are checking Contents In This Book 4 General Information Accessories 8 Mainframe and Operating System 8 Environmental Characteristics 8 Recommended Test Equipment 9 Preparing for Use To inspect the module 13 To prepare the mainframe 14 To configure a one card module 15 To configure a multi card module 16 To install the module 19 To turn on the system 21 To test the module 21 To clean the module 22 Testing Performance Perform the power up tests 25 To perform the self tests 26 Calibrating Troubleshooting To use the flowcharts 30 To verify pattern output 33 To exit the test system 34 Contents Replacing Assemblies To remove the module 37 To replace the circuit board 38 To replace the module 39 To replace the probe cable 42 To return assemblies 43 Replaceable Parts Replaceable Parts Ordering 46 16720A Replacement Parts 47 Exploded View 48 Theory of Operation Block Level Theory 50 Self Tests Description 51 Accessories 8 Mainframe and Operating System 8 Environmental Characteristics 8 Recommended Test Equipment 9 General Information This chapter lists the
24. lock cable in the appropriate connectors on the circuit board If a single cable is being replaced plug the cable in the appropriate connector Note that the clock cable is connected to J6 on the 16720A board Position the cables on the rear panel so the cable clamp can be properly installed on the rear panel Install three screws that secure the cable clamp onto the rear panel Install the 16720A module into the mainframe To replace the module If the module consists of one card go to step 2 If the module consists of more than one card connect the cables together in a master expander configuration Follow the procedure To configure a multicard module in chapter 2 Slide the cards above the slots for the module about halfway out of the mainframe With the probe cables facing away from the instrument slide the module approximately halfway into the mainframe 39 Chapter 6 Replacing Assemblies To replace the module 4 Slide the complete module into the mainframe but not completely in Each card in the instrument is firmly seated and tightened one at a time in step 6 40 CAUTION Chapter 6 Replacing Assemblies To replace the module 5 Position all cards and filler panels so that the endplates overlap 6 Seat the cards and tighten the thumbscrews Starting with the bottom card firmly seat the cards into the backplane connector of the mainframe K
25. move the cables connecting the cards Then connect the free end of the 2x10 cable to the connector labeled Master J6 on each card see figure below If you pull on the flexible ribbon part of the 2x10 cable you might damage the cable assembly Using your thumb and finger grasp the ends of the cable connector Apply pressure to the ends of the cable connector to disengage the metal locking tabs of the connector from the cable socket on the board Then pull the connector from the cable socket G Pa 16720206 15 Chapter 2 Preparing for Use To configure a multi card module To configure a multi card module 1 Plan the configuration Multicard modules can only be connected as shown in the illustration Select the card that will be the master card and set the remaining cards aside One Expander wo Expanders 16522E07 16 Chapter 2 Preparing for Use To configure a multi card module 2 On the expander card disconnect the end of the 2x10 cable that is plugged into the connector labeled J8 CAUTION If you pull on the flexible ribbon part of the 2x10 cable you might damage the cable assembly Using you thumb and finger grasp the ends of the cable connector Apply pressure to the ends of the cable connector to disengage the metal locking tabs of the connector from the cable socket on the board Then pull the connector from the cable socket 17 Chapter 2 Preparing for Use
26. nd multiplexers The FIFO queue stabilizes and pipelines the pattern flow between data memory and the latch logic drivers The latch logic drivers direct the pattern to multiplexers at ECL voltage levels The multiplexers one per channel direct the programmed data patterns to the output channels The single ended ECL level signals are converted to differential signals which are routed to the output cables and to the pods Note that the differential ECL output signal of the pattern generator modules not suited to directly drive ECL circuitry Clock Circuit The clock circuit paces the instruction memory data memory and the FIFO pattern queue and multiplexers in the output driver according to the desired data rate Two phase locked loops drive the clock circuit according to the user selected data rate The output of the multiplexer which represents the user selected clocking rate is distributed to the above listed subcircuits on both the master board and all expander boards that are configured with the master board The output of the clock select multiplexer is also distributed to an external clock out circuit The clock signal is routed to a bank of external clock delay select multiplexer The output of this multiplexer which represents the desired clock delay is directed to the external clock out pin on the clock pod Consequently either the internal clock or external clock is redirected to the clock out pin with a user selected clock delay
27. on This Display to re launch a logic analysis session 26 Calibrating This chapter gives you instructions for calibrating the pattern generator Chapter 4 Calibrating Calibration Strategy The 16720A pattern generator does not require an operational accuracy calibration 28 To use the flowcharts on page 30 To verify pattern output on page 33 To exit the test system on page 34 Troubleshooting This chapter helps you troubleshoot the module to find defective assemblies CAUTION Chapter 5 Troubleshooting To use the flowcharts The troubleshooting consists of flowcharts self test instructions a cable test and a test for the auxiliary power supplied by the probe cable If you suspect a problem start at the top of the first flowchart During the troubleshooting instructions the flowcharts will direct you to perform the self tests or the cable test The service strategy for this instrument is the replacement of defective assemblies This module can be returned to Agilent for all service work including troubleshooting Contact your nearest Agilent Technologies Sales Office for more details Electrostatic discharge can damage electronic components Use grounded wrist straps and mats when you perform any service to this instrument or to the cards in it To use the flowcharts Flowcharts are the primary tool used to isolate defective assemblies The flowcharts refer to other tests to help isolate t
28. oot dialogue is in Chapter 8 Theory of Operation During initialization check for any failures If an error or an interrupt occurs refer to Chapter 5 Troubleshooting 25 Chapter 3 Testing Performance To perform the self tests The self tests verify the correct operation of the logic analysis system Self tests can be performed all at once or one at a time While testing the performance of the logic analysis system run the self tests all at once Launch the Self Tests a Inthe System Window select the System Admin icon b Inthe System Administration window select Self Test c Inthe query pop up choose Yes to exit the current session The Self Test closes down the current session because the test algorithms leave the system in an unknown state Re launching a session at the end of the tests will ensure the system is properly initialized In the Self Test window choose Test All When the tests are finished the Status will change to TEST passed or TEST failed You can find detailed information about the test results in the Status Message field of the Self Test window The System CPU Board tests returns Untested because the CPU tests require user action To test the CPU Board select CPU Board then choose each test individually For more information on tests that are not executed refer to Chapter 8 Troubleshooting Select Quit to exit the Test menu In the Session Manager select Start Sessi
29. output channels or a walking 1 pattern are available 54 Index A accessories 8 assemblies exchange 46 return 43 B block level theory 50 C cable replace probe 42 calibrating see also testing performance calibration 27 28 strategy 28 characteristics 2 environmental 8 circuit board replace 38 clean module 22 configure multi card module 16 one card module 15 E environment characteristics 8 operating 12 equipment test 9 exchange assemblies 46 exit test system 34 F flowcharts 30 G general information 7 9 I install module 19 M mainframe 8 operating system 30 prepare 14 module clean 22 inspect 13 install 19 remove 37 replace 39 test 21 multi card module 16 configure 16 o one card module configure 15 operating environment 12 system 8 30 P power requirements 12 system 21 test 25 preparing for use 11 22 R replace circuit board 38 module 39 probe cable 42 replaceable parts 45 48 replacing assemblies 35 43 return assemblies 43 S self test description 51 storage 12 system operating 8 30 test 34 turn on 21 T test equipment 9 module 21 multi card module 24 one card module 24 power 25 self 24 26 system 34 test and clock synchronization circuit 51 testing performance 23 26 equipment 9 theory of operation 49 54 tools required 36 troubleshooting 2
30. peration for the pattern generator module and describes the self tests Chapter 8 Theory of Operation Block Level Theory The information in this chapter is to help you understand how the module operates and what the self tests are testing This information is not intended for component level repair Block Level Theory The 16720 Pattern Generator YVYYYYY Clock Circuil Data Out 16720b12 Instruction Memory The instruction memory holds the programmable vector flow information and is paced in parallel with the data memory User programmable instructions are stored in instruction memory and control the pattern flow output Data Memory Consisting of six 4Mx16 DRAM ICs and RAM addressing circuitry the data memory stores the desired pattern that appears at the module output The RAM addressing circuitry is merely a counter which addresses the pattern locations in data memory When the end of the vector listing is reached the addressing circuitry is loaded from the loop register with the address of the first vector of the listing to provide an uninterrupted vector loop The RAM output is sent to the output driver circuit where the patterns are presented into a logic configuration usable by the output pods 50 Chapter 8 Theory of Operation Self Tests Description Output Driver The output driver circuit is made up of a series of FIFO queues latch logic drivers a
31. product or improper site preparation or maintenance No other warranty is expressed or implied Agilent Technologies specifically disclaims the implied warranties of merchantability or fitness for a particular purpose Exclusive Remedies The remedies provided herein are the buyer s sole and exclusive remedies Agilent Technologies shall not be liable for any direct indirect special incidental or consequential damages whether based on contract tort or any other legal theory Assistance Product maintenance agreements and other customer assistance agreements are available for Agilent Technologies products For any assistance contact your nearest Agilent Technologies Sales Office Certification Agilent Technologies certifies that this product met its published specifications at the time of shipment from the factory Agilent Technologies further certifies that its calibration measurements are traceable to the United States National Institute of Standards and Technology to the extent allowed by the Institute s calibration facility and to the calibration facilities of other International Standards Organization members About this edition This is the Agilent 16720A Pattern Generator Service Guide Publication number 16720 97001 November 2001 Printed in USA Print History is as follows 16720 97000 June 2000 New editions are complete revisions of the manual Many product updates do not re
32. quire manual changes and conversely manual corrections may be done without accompanying product changes Therefore do not expect a one to one correspondence between product updates and manual updates
33. r verify that the correct safety precautions are taken see the following warnings In addition note the external markings on the instrument that are described under Safety Symbols Agilent Technologies P O Box 2197 1900 Garden of the Gods Road Colorado Springs CO 80901 Warning e Before turning on the instrument you must connect the protective earth terminal of the instrument to the protective conductor of the mains power cord The mains plug shall only be inserted in a socket outlet provided with a protective earth contact You must not negate the protective action by using an extension cord power cable without a protective conductor grounding Grounding one conductor of a two conductor outlet is not sufficient protection e Only fuses with the required rated current voltage and specified type normal blow time delay etc should be used Do not use repaired fuses or short circuited fuseholders To do so could cause a shock or fire hazard e Service instructions are for trained service personnel To avoid dangerous electric shock do not perform any service unless qualified to do so Do not attempt internal service or adjustment unless another person capable of rendering first aid and resuscitation is present e If you energize this instrument by an auto transformer for voltage reduction make sure the common terminal is connected to the earth terminal of the power source e Whenever it
34. s In the pop up menu choose Checkerboard Pattern 100M Self Test 16720A 300Mvector s Pattern Generator Using an oscilloscope verify the existence of logic level transitions by touching the oscilloscope probe to each channel of Data Pod 1 and doing an Autoscale The signal levels that appear on the oscilloscope display should correspond with the logic levels represented by the 10460 series pod being used Repeat step 3 for each of the remaining data pods Connect one of the 10460 series clock pods to the end of the pattern generator clock cable Using the oscilloscope as in step 3 verify the existence of logic level transitions by touching the oscilloscope probe to each clock output of the clock pod In the pattern generator Output Patterns menu select the Stop icon then choose Done to exit the menu Chapter 5 Troubleshooting To exit the test system To exit the test system To exit the test system 1 Select Close to close any module or system test windows 2 In the Self Test window select Quit 3 In the session manager window select Start Session to launch a new logic analyzer session 34 To remove the module 37 To replace the circuit board 38 To replace the module 39 To replace the probe cable 42 To return assemblies 43 Replacing Assemblies This chapter contains the instructions for removing and replacing the pattern generator module the circuit board of the module and the probe cables of
35. s include the model number and serial number of the module a description of the part including its function and the number of parts required Address the order to your nearest Agilent Technologies Sales Office Direct mail order system To order using the direct mail order system contact your nearest Agilent Technologies Sales Office Within the USA Agilent Technologies can supply parts through a direct mail order system The advantages to the system are direct ordering and shipment from the Agilent Part Center in Mountain View California There is no maximum or minimum on any mail order There is a minimum amount for parts ordered through a local Agilent Technologies Sales Office when the orders require billing and invoicing Transportation costs are prepaid there is a small handling charge for each order and no invoices In order for Agilent Technologies to provide these advantages a check or money order must accompany each order Mail order forms and specific ordering information are available through your local Agilent Technologies Sales Office Addresses and telephone numbers are located in a separate document shipped with the 16700 series Logic Analysis System Service Manual Exchange assemblies Some assemblies are part of an exchange program with Agilent Technologies The exchange program allows you to exchange a faulty assembly with one that has been repaired and performance verified by Agilent Technologies After you rec
36. tests that automatically run at power up and self tests that you select on the screen For descriptions of the tests refer to chapter 8 Theory of Operation Perform the self tests as an acceptable test when receiving the logic analysis system or when the logic analysis system is repaired If a test fails refer to chapter 5 Troubleshooting 24 2 3 Chapter 3 Testing Performance Perform the power up tests The logic analysis system automatically performs power up tests when you apply power to the instrument Any errors are reported in the boot dialogue Serious errors will interrupt the boot process The power up tests are designed to complement the instrument on line Self Tests Tests that are performed during power up are not repeated in the Self Tests The monitor 16700 only keyboard and mouse must be connected to the mainframe to observe the results of the power up tests The 16702B does not require a mouse keyboard or monitor Disconnect all inputs and exit all logic analysis sessions In the Session Manager select Shutdown In the window select Powerdown When the OK to power down message appears turn off the power switch After a few seconds turn the power switch back on Observe the boot dialogue for the following e ensure all of the installed memory is recognized e any error messages e interrupt of the boot process with or without error message A complete transcript of the b
37. ule approximately halfway into the mainframe gt gt lt gt 3 Slide the complete module into the mainframe but not completely in Each card in the instrument is firmly seated and tightened one at a time in step 5 4 Position all cards and filler panels so that the endplates overlap 19 Chapter 2 Preparing for Use To install the module 5 Seat the cards and tighten the thumbscrews Starting with the bottom card firmly seat the cards into the backplane connector of the mainframe Keep applying pressure to the center of the card endplate while tightening the thumbscrews finger tight Repeat this for all cards and filler panels starting at the bottom and moving to the top CAUTION Correct air circulation keeps the instrument from overheating For correct air circulation filler panels must be installed in all unused card slots Keep any extra filler panels for future use 20 Chapter 2 Preparing for Use To turn on the system To turn on the system 1 Connect the power cable to the mainframe 2 Turn on the instrument power switch When you turn on the instrument power switch the instrument performs powerup tests that check mainframe circuitry After the powerup tests are complete the screen will look similar to the sample screen below E t och 7 EF File Window Help
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