EMI Test Accessories User Manual
Contents
1. SIGLENT EMI Test Accessories User Manual SIGLENT TECHNOLOGIES CO LTD 1 Feature Description Features Magnetic near field probe can detect the F magnetic field within 10cm mainly used for the chassis leak test Frequency range 30MHz 3GHz S 40 Resolution 25mm 1500 3000 Frequency MHz DD Gain dB D Magnetic near field probe can detect the magnetic field within 3cm Frequency range 30MHz 3GHz Resolution 10mm to D Gain dB 40 1500 Frequency MHz Magnetic near field probe is mainly used for cable electromagnetic leakage test Frequency range 30MHz 2GHz Resolution 5mm 1500 Frequency MHz Gain dB Magnetic near field probe can detect the emission of electromagnetic fields generated by the PCB layout Frequency rang 30MHz 3GHz Resolution 2mm Gain dB 1500 Frequency MHz mainly used for amplifying small signals 20dB gain Can greatly improve system sensitivity of the test Bandwidth 100KHz 2GHz Typical gain 19 5dB 2 Application MH EMI radiated interference source location MH magnetic field intensity test Operation Sketch EMI Receiver Tested Equipment on Preamplifier 3 Packing List Packing List NAME Qty Near Field Probe
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