Sandisk 5000 2.5" User's Manual
Contents
1. 17 Page 3 of 17 360 Herndon Parkway Suite 1400 Herndon VA 20170 http www rheintech com 1 GENERAL INFORMATION The following test report for a Class B digital device is prepared on behalf of SanDisk Corporation in accordance with Part 2 and Part 15 Subparts A and B of the Federal Communications Commissions Rules and Regulations The Equipment Under Test EUT was the SanDisk SSD SATA 5000 2 5 The test results reported in this document relate only to the items that were tested All measurements contained in this Application were conducted in accordance with ANSI C63 4 Methods of Measurement of Radio Noise Emissions 2003 The instrumentation utilized for the measurements conforms to the ANSI C63 4 standard for EMI and Field Strength Instrumentation Some accessories are used to increase sensitivity and prevent overloading of the measuring instrument Calibration checks are performed regularly on all test equipment All radiated and conducted emission measurements were performed manually at Rhein Tech Laboratories Inc The radiated emissions measurements were performed on the three ten meter open field test range maintained by Rhein Tech Laboratories Inc 360 Herndon Parkway Suite 1400 Herndon Va 20170 Complete description and site attenuation measurement data has been placed on file with the Federal Communications Commission The power line conducted emission measurements were performed in a shield2. _ 200 000 485 970 ap 1 10 294 89 205 370 185 Pass 631 945 V 45 10 38 62 246 370 124 _ 700 000 Qo V 5 10 304 58 246 370 12 E Note The EUT was scanned from 30 MHz to 15 000 MHz All emissions other than those listed in the tables above were found to have amplitudes attenuated by more than 20dB below the FCC limit Result Pass Test Personnel Pb Jon Wilson J April 10 2007 EMC Test Engineer Signature Date Of Test SanDisk Corporation Page 14 of 17 DoC Report 2006137 04 27 07 360 Herndon Parkway Suite 1400 Herndon VA 20170 htto www rheintech com 5 4 RADIATED TEST PHOTOGRAPHS SanDisk Corporation Page 15 of 17 DoC Report 2006137 04 27 07 360 Herndon Parkway Suite 1400 Herndon VA 20170 htto www rheintech com 6 EMISSIONS EQUIPMENT LIST The following is a list of equipment Rhein Tech uses to perform testing Part Type Manufacturer Model jSerialNumber Barcode Cal Due Date Conducted S SR2 SA3 2602A00160 900968 8 14 2007 2542A11239 900970 8 14 2007 GuesiPeskAder Heit Packard 900339 8 14 2007 Filter Solar 8130 947306 900729 N A HeALISN AR International LS16 110VAC H6010020080 901083 4 4 2008 HeALISN JARS International LS16 110VAC 16010020081 901082 1 6 2008 Current Probe Telecom conducted F
3. Pk 298 27 325 600 275 500 175 Pass 28850 Pk 222 31 253 600 347 500 247 Pass Result PASS Test Personnel As iLa Jon Wilson d April 10 2007 Tester Signature Date of Test SanDisk Corporation Page 10 of 17 DoC Report 2006137 04 27 07 360 Herndon Parkway Suite 1400 4 Herndon VA 20170 http www rheintech com SanDisk Corporation Page 11 of 17 DoC Report 2006137 04 27 07 360 Herndon Parkway Suite 1400 Herndon VA 20170 http www rheintech com 5 RADIATED EMISSIONS 5 1 SITE AND TEST DESCRIPTION Before final measurements of radiated emissions were made on the open field three ten meter range the EUT was scanned indoor at one and three meter distances This was done in order to determine its emissions spectrum signature The physical arrangement of the test system and associated cabling was varied in order to determine the effect on the EUT s emissions in amplitude direction and frequency This process was repeated during final radiated emissions measurements on the open field range at each frequency in order to insure that maximum emission amplitudes were attained Final radiated emissions measurements were made on the three ten meter open field test site The EUT was placed on a nonconductive turntable 0 8 meter above the ground plane The spectrum was examined as per FCC part 15 specifications At each frequency the EUT was rotated 360 and
4. PRODUCT DESCRIPTION SanDisk SATA 5000 2 5 SSD is a drop in replacement for the hard disk drive It has no moving mechanical parts Features o 2 5 small form factor supporting unformatted capacity of 32GB o 9 5mm case height SATA 7 15 pins combo connector Interface to host o Standards SATA 1 0a 1 5Gb s High performance o Host transfer rate 150MB s o Internal transfer read rate 67MB s o Internal transfer write rate 47MB s o Random Read 4KB 5350 IOPS o Average access time 0 11msec Low power consumption o Supply voltage 5Vdc Typical read write 190mA Typical idle 125mA o Typical standby 7OmA Typical sleep 60mA Reliability o Mean time between failure MTBF 2 000 000 hours based on Part Stress Analysis o Operating shock 1 500G 0 5msec half sine o Operating vibration 2 17G 7 500 Hz Operating temperature 0 C to 70 C o Non operating temperature and storage 55 C to 95 Operating temperature 0 C to 70 C 2 2 MODIFICATIONS None 2 3 EUT EXERCISE DESCRIPTION The SanDisk SSD SATA 5000 2 5 was installed in a Class B laptop personal computer which was running Windows XP The computer was programmed to transfer files continuously to and from the device under test using a software application provided by Dell The SanDisk SSD SATA 5000 2 5 was tested as a representative of the full line of available capacities The only difference among the different sizes is the on board fla
5. bonded to the ground plane and electrically connected to the peripheral LISN powers the EUT host peripherals The spectrum analyzer was connected to the A C line through an isolation transformer The 50 ohm output of the EUT LISN was connected to the spectrum analyzer input through a Solar 7 kHz high pass filter The filter is used to prevent overload of the spectrum analyzer from noise below 7 kHz Conducted emission levels were measured on each current carrying line with the spectrum analyzer operating in the CISPR quasi peak mode or average mode if applicable The analyzer s 6 dB bandwidth was set to 9 kHz No video filter less than 10 times the resolution bandwidth was used Average measurements are performed in linear mode using a 10 kHz resolution bandwidth a 1 Hz video bandwidth and by increasing the sweep time in order to obtain a calibrated measurement The range of the frequency spectrum to be investigated is specified in FCC Part 15 The highest emission amplitudes relative to the appropriate limit were measured and have been recorded in this report SanDisk Corporation Page 9 of 17 DoC Report 2006137 04 27 07 360 Herndon Parkway Suite 1400 Herndon VA 20170 http www rheintech com 4 2 CONDUCTED EMISSIONS TEST DATA Mode 115 vac 60 Hz Neutral Conductor Temperature 75 F Humidity 31 Emission Analyzer Site Emission Pass Frequency Reading Correction Level Fail MHz SS N 220 Pass Pas
6. record shall contain ii The name of the test laboratory or individual performing the testing The Commission may request additional information regarding the test site the test equipment or the qualifications of the Test laboratory from the client or individual performing the tests e iii A description of how the device was actually tested identifying the measurement procedure and test equipment that was used contained in the test report iv A description of the equipment under test EUT and support equipment connected to or installed within the EUT e The identification of the EUT and support equipment by trade name and model number and if appropriate by FCC identifier and serial number e vi The types and lengths of connecting cables used and how they were arranged or moved during testing e vii At least two photographs showing the test set up for the highest line conducted emission and showing the test set up for the highest radiated emission These photographs must be focused originals which show enough detail to confirm other information contained in the test report viii A description of any modifications made to the EUT Client or individual to achieve compliance with the regulations e All of the data required to show compliance with the appropriate regulations e x The signature of the individual responsible for testing the product along with the name and signature of an official of the respon
7. the Amplifier Gain if any from the measured reading The basic equation with a sample calculation is as follows Fl dBuV m SAR dBuV SCF dB m Field Intensity SAR Spectrum Analyzer Reading SCF Site Correction Factor The Site Correction Factor SCF used in the above equation is determined empirically and is expressed in the following equation SCF dB m PG dB AF dB m CL dB SCF Site Correction Factor PG Pre amplifier Gain AF Antenna Factor CL Cable Loss The field intensity in microvolts per meter can then be determined according to the following equation dBuV m 20 Fl uV m 10 For example assume a signal at a frequency of 125 MHz has a received level measured as 49 3 dBuV The total Site Correction Factor antenna factor plus cable loss minus preamplifier gain for 125 MHz is 11 5 dB m The actual radiated field strength is calculated as follows 49 3 dBuV 11 5 dB m 37 8 dBuV m 37 8 20 1 89 10 10 277 6uV m SanDisk Corporation Page 13 of 17 DoC Report 2006137 04 27 07 360 Herndon Parkway Suite 1400 Herndon VA 20170 http www rheintech com Temperature 48 F Humidity 36 Emission Test Emission Pass Frequency Detector Level Limit Margin Fail MHz dBuV m dBuV m dB 50 000 Qp 222 162 300 13 8 Pass 73 800 285 181 300 11 9 Pass 144000 Qp L 185 21 6 30 0 64 Pass __
8. this equipment does cause harmful interference to radio or television reception which can be determined by turning the equipment off and on the user is encouraged to try to correct the interference by one or more of the following measures Reorient or relocate the receiving antenna Increase the separation between the equipment and receiver Connect the equipment into an outlet on a circuit different from that to which the receiver is connected Consult the dealer or an experienced radio TV technician for help 3 3 LOCATION OF LABEL ON EUT TEL LN 1 91 Label Location SanDisk Corporation Page 8 of 17 DoC Report 2006137 04 27 07 360 Herndon Parkway Suite 1400 Herndon VA 20170 http www rheintech com 4 CONDUCTED EMISSIONS 4 1 SITE AND TEST DESCRIPTION The power line conducted emission measurements were performed in a Series 81 type shielded enclosure manufactured by Rayproof The EUT was assembled on a wooden table 80 centimeters high Power was fed to the EUT through a 50 ohm 50 microhenry Line Impedance Stabilization Network EUT LISN The EUT LISN was fed power through an A C filter box on the outside of the shielded enclosure The filter box and EUT LISN housing are bonded to the ground plane of the shielded enclosure A second LISN the peripheral LISN provides isolation for the EUT test peripherals This peripheral LISN was also fed A C power A metal power outlet box which is
9. AP or any agency of the U S Government Suite 1 SanDisk Corporation DoC Report 2006137 04 27 07 360 Herndon Parkway 400 Herndon VA 20170 htto www rheintech com TABLE OF CONTENTS 1 GENERAL INFORMATION 0 2 0 0cccccssceccscsscnscesnscnscscnscnscnscsenscnscnsnscnsenscnsnsensenscnsnscnsensesenscnsensesensensensesensensens 4 1 1 DEVIATIONS 4 1 2 ACCREDITATION STATEMENTS cccececcccecececcccecececccuececececeuecscauuunececsecuausenseauaenenstatsuuuaunenstscauaenecstauuaecenetass 4 Pd Bt lt gt OD 0p ES T Nem 5 2 1 PRODUCT DESCRIPTION ccceccecceccececcecceccecaccecceccecsecaccucaecsuceccucsucsecscaecsucuecessececaucuusuecucsucsuceccuceusuuaecaesaesass 5 2 2 IJODIBICATIONS secret ce cess vps snes sce UM Mc MM M E I DE E 5 2 3 EUT EXERCISE DESCRIPTION a MES RI DM D LE M EM n IM 5 24A EOUPMENT UNDER TEST 6 2 5 CONFIGURATION OF TESTED SYSTEDM cscccceccecceccccecceccececcuccuccecuccecseccucuecaecececuuaueaecaecuuauceeaeceseesuuaeseeseeseees 7 PRODUCT LABELLING INFORMATION TO THE 8 3 1 LABEL ON b27c cc OOO OEK 8 3 2 DOC STATEMENT IN USER S MANUAL ccccececcececcececccceccceccececuccecueuecsecucacaucuceuecseuecueceseceuauseuaecetaesucecne
10. FCC Class B Test Report For A Class B Digital Device SanDisk Corporation 7 Atir Yeda Street Kfar Saba Israel Phone 972 9 7644908 Device Under Test sanDisk SSD SATA 5000 2 5 Document Number 2007160 Reference Number QRTLO7 033 This report may not be reproduced except in full without the written approval of Rhein Tech Laboratories Inc Test Overview Model No sanDisk SSD SATA 5000 2 5 Manufacturer s SanDisk Corporation Name Manufacturer s 7 Atir Yeda Street Address Kfar Saba Israel Manufacturer s Eitan Chalfon Contact Type of Equipment ITE Serial No 713050010 Year of Manufacture 2007 Location of Testing Rhein Tech Laboratories Inc Herndon VA Date of Receipt February 5 2007 Date s of Testing April 10 2007 Purpose of Testing FCC Class B Compliance Standard s to which device was tested APPLICABILITY STANDARDS SPECIFIC TESTS Tested Not Tested radi Parts 15 109 and Radiated and Conducted Emissions Test Engineer Jon Wilson Signature d Report Written Jon Wilson Signature da Report Approved Desmond Fraser Signature Report Number 2007160 Report Date April 27 2007 0 0 Accredited by the National Voluntary Accreditation Program for the specific scope of accreditation under Lab Code 20061 0 Note This report may not be used by the client to claim product endorsement by NVL
11. Herndon Parkway Suite 1400 Herndon VA 20170 http www rheintech com Laptop PC with USB Monitor Speaker E Microphone SanDiskSSD H Termination PS SATA 5000 SanDisk Corporation Page 7 of 17 DoC Report 2006137 04 27 07 360 Herndon Parkway Suite 1400 Herndon VA 20170 htto www rheintech com 3 PRODUCT LABELLING INFORMATION TO THE USER 3 1 DOC LABEL ON DEVICE The label shall be located in a conspicuous location on the device and shall contain the unique identification described in CFR 47 Section 2 1074 the unique model name and the following DoC logo SanDisk Corporation SanDisk SSD SATA 5000 2 5 3 2 DOC STATEMENT IN USER S MANUAL For a Class B digital device or peripheral per FOC CFR 47 Section 15 105 the instructions furnished the user shall include the following or similar statement placed in a prominent location in the text of the manual NOTE This equipment has been tested and found to comply with the limits for a Class B digital device pursuant to part 15 of the FCC Rules These limits are designed to provide reasonable protection against harmful interference in a residential installation This equipment generates uses and can radiate radio frequency energy and if not installed and used in accordance with the instructions may cause harmful interference to radio communications However there is no guarantee that interference will not occur in a particular installation If
12. caees 8 3 3 LOCATION OF LABEL ON 8 4 CONDUCTED 5 1 9 4 1 SITE AND TEST DESCRIPTION cccccecececcccecececcccecececceuenececscauaunececseuuenecsuauauaunecseaeeaunesecseueaeuessrstauaenersrseaunens 9 4 2 CONDUCTED EMISSIONS TEST DATA ccccceccececcccecccecccceccccecuccucueaeaucueneuscesucuunecsuaucueaesscaesucuusecsuaesecsuaesass 10 43 CONDUCTED TEST PHOTOGRAPHS cccceccececcececccceccceccceccececuecececsunucueaesscausucuenecsuaucueaessuaesecauueceuauseseuaecass 11 5 RADIATED EMISSIONS ccccsccsscscsscnscscnscnscscnscnscnsescnsenscnsnsenscnsennnsensensnsensesensensensesensensensnsensecsensensnsensensens 12 5 1 SINE EST DESCRIPTION MNT 12 5 2 FIELD STRENGTH GOCAECULEATION G ue mer so guste zh cuu poa ua al tap aga qus te Dott uitis ek vu on tata 13 5 3 RADIATED EMISSIONS TEST 14 5 4 RADIATED TEST PHOTOGRAPHS c ccccecceccececcecceccecccucceccecuccuuaecuecucaucuusuuaececausueaecsucuusucausuesuusecsuaeseecaeaeuaes 15 6 EMISSIONS EQUIPMENT LIST crecer u na Rasa IRR IRR RRSR RR RR RRSR RR RR RE RR RR RR uersa 16 7 MANUFACTURER S EQUIPMENT FILE CHECKLIST PER FCC RULES 2 1075
13. ed enclosure also located at the Herndon Virginia facility Rhein Tech Laboratories is accepted by the FCC as a facility available to do measurement work for others on a contract basis 1 1 DEVIATIONS There were no deviations from the test standard s and or methods 1 2 ACCREDITATION STATEMENTS e NVLAP USA Accreditation under NVLAP Lab Code 200061 0 US CAB Recognition as of U S Conformity Assessment Body CAB for EMC testing under US EU and US APEC MRA IC accepted CAB under Phase of APEC Telecommunication MRA Identification number US0079 e FCC USA Listing of test sites Registration 90902 IC Canada Listing of test sites IC 2956 1 and IC 2956 2 US TCB ATCB Certification of cooperation granted in 2005 e CE Notified Body Rhein Tech Laboratories Inc has been approved by TNO Certification B V to provide EMC Test Reports and Technical Construction Files to TNO Certification B V Rheintech Certification number 10118957 AUSTEL Australia Acceptance as of a Listed Test House A97 TH 0107 ANATEL Brazil telecommunication NCC certification for performing tests Ministry of Commerce New Zealand Approval of a test laboratory ECR 3 9 BAE VCCI Japan Approval and registration of RTL test sites as 1113 and C 1172 SanDisk Corporation Page 4 of 17 DoC Report 2006137 04 27 07 360 Herndon Parkway Suite 1400 Herndon VA 20170 htto www rheintech com 2 TEST DETAILS 2 1
14. ischerCustom Communications F 141 93 901084 8 31 2007 Rev 14 0 2 N A Radiated Emissions EMI Receiver RF Section 9 KHz 6 5 GHz HewlettPackard 85462A 3325400159 900913 Filter Section 100 KHz to 6 5 GHz Hewlett Packard 85460A 48330800107 900914 Amplifier PR 004 BiLog Antenna 20MHz 2GHz Schaffner Chase CBL6112B 2648 Emissions testing software Hhein Tech Laboratories Inc Automated Emission Tester gt 14 0 2 N A IN A SanDisk Corporation Page 16 of 17 DoC Report 2006137 04 27 07 360 Herndon Parkway Suite 1400 Herndon VA 20170 htto www rheintech com 7 MANUFACTURER S EQUIPMENT FILE CHECKLIST PER FCC RULES 2 1075 This checklist shall be used by the manufacturer to verify the correct filing per 2 1075 Retention of records for products produced and marketed PRODUCT MODEL s Records Verified By sanDisk SSD SATA 5000 2 5 A record of the original design drawings and specifications To A record of all changes that have been made that would affect continued compliance with the authorized unit e g any changes which would require a Class or Class II permissive change A record of the procedures used for production inspection and testing if tests were performed to ensure ongoing conformance A record of the measurements made on an appropriate NVLAP accredited test site that demonstrates compliance The
15. s E Ig E 0 372 Qp 51 7 0 3 52 0 58 5 6 5 48 5 Pass 273 485 17 3 Pass 560 154 460 5 4 Pass 560 198 460 98 Pass 560 191 460 91 Pass 600 325 500 22 5 Pass 600 293 500 193 Pass 600 279 500 179 Pass Phase Conductor Emission Test Analyzer Site Emission CISPRB CISPRB CISPRB CISPRB Pass Frequency Detector Reading Correction Level QP QP AV AV Fail MHz dBuV Factor dBuV Limit Margin Limit Margin dB dBuV dBuV dBuV dBuV 0 155 585 02 587 657 70 557 Pass 0 155 347 02 349 656 30 7 556 207 Pass 0 186 545 02 547 642 35 542 0 186 Av 20 8 0 2 21 0 64 2 43 2 54 2 33 2 Pass 0213 522 02 524 627 103 527 J Pass 0213 Av 381 02 383 631 24 8 531 14 8 Pass 0266 466 02 468 613 145 513 45 Pass 0294 410 03 413 604 191 504 91 Pass 0377 398 03 401 583 18 2 483 8 2 Pass 0423 396 02 398 574 17 6 474 76 Pass 0500 Pk 385 02 387 560 173 460 73 Pass 2 740 Pk 31 2 1 0 32 2 56 0 23 8 46 0 13 8 Pass 9910 Pk 240 19 259 600 341 500 241 Pass 18640 Pk 280 26 306 600 294 500 194 Pass 250700
16. sh memory Otherwise there are no physical clock or electronic changes Determination of the 2 5 as the worst case test sample was determined by SanDisk based on preliminary scanning of the devices under test and engineering judgement that because of the small changes between the various capacities any changes in emission amplitudes or EMC susceptibility would be inconsequential SanDisk Corporation Page 5 of 17 DoC Report 2006137 04 27 07 360 Herndon Parkway Suite 1400 Herndon VA 20170 htto www rheintech com 2 4 EQUIPMENT UNDER TEST Listed below are the identifiers and descriptions of all equipment cables and internal devices used with the EUT for this test Equipment Under Test Serial FCC Cable RTL Equipment Number ID Description Bar Arrival Date SATA Storage SanDisk SanDisk SSD Auxiliary Equipment Serial FCC Cable RTL Equipment Number ID Description Bar Arrival oot 20 Some power 4102007 CN 0DF263 Laptop AC Adapter LA65NS0 00 71615682 Unshielded 017737 4 10 2007 2ED4 Unshielded Monitor Mag Innovision LT716s 700P FOEGISOTUSS Power 901427 12 15 2005 18U Shielded I O Gateway Inc Ethernet hub Flowpoint 134 F258219 Ensnielded 901278 10 04 2002 Duis Power Unshielded Modem US Robotics Sportster Model 8390364644 Power 900427 11 13 1996 0413 992 Shielded I O SanDisk Corporation Page 6 of 17 DoC Report 2006137 04 27 07 360
17. sible party as designated in 52 909 e A copy of the compliance information i e the DoC as described in 82 1077 required to be provided with the equipment as follows a Identification of the product name and model number b The unique model name and FCC DoC logo information as specified in 15 19 b 1 and 15 105 that the product complies with Part 15 of the FCC Rules c Identification by name and address of the responsible party SanDisk Corporation Page 17 of 17 DoC Report 2006137 04 27 07
18. the antenna was raised and lowered from 1 to 4 meters in order to determine the emission s maximum level Measurements were taken using both horizontal and vertical antenna polarizations For frequencies between 30 and 1000 MHz the spectrum analyzer s 6 dB bandwidth was set to 120 kHz and the analyzer was operated in the CISPR quasi peak detection mode For emissions above 1000 MHz measurement use an average detector function with a minimum resolution bandwidth of 1 MHz No video filter less than 10 times the resolution bandwidth was used The highest emission amplitudes relative to the appropriate limit were measured and recorded in this report Rhein Tech Laboratories Inc has implemented procedures to minimize errors that occur from test instruments calibration procedures and test setups Test instrument and calibration errors are documented from the manufacturer or calibration lab Other errors have been defined and calculated within the Rhein Tech quality manual section 6 1 Rhein Tech implements the following procedures to minimize errors that may occur yearly as well as daily calibration methods technician training and emphasis to employees on avoiding error SanDisk Corporation Page 12 of 17 DoC Report 2006137 04 27 07 360 Herndon Parkway Suite 1400 Herndon VA 20170 http www rheintech com 5 2 FIELD STRENGTH CALCULATION The field strength is calculated by adding the Antenna Factor and Cable Factor and subtracting
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