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Tektronix Wander Analyst Software Manual

1. 100 lt S lt 10 0 1 1 oa 100 1000 10 10 10 PDH Output ETS DE TM 3017 3 Fig 10 10 TDEV 34 0 1 lt S lt 48 a TDEV 0 75 48 lt lt 100 oo ee TDEV 58 1 2S 0 0003S CO ONC a 100 lt S lt 10 on ES 1 0 x 100 1000 10 10 10 PRC Generation ETS DE TM 3017 6 Fig 2 TDEV 3 0 1 lt S lt 100 TDEV 0 035 100 lt S lt 1000 TDEV 30 1000 lt S lt 10f 0 1 1 10 100 1000 10000 SSU Generation ETS DE TM 3017 4 Fig 1 TDEV 3 0 1 lt t lt 25 TDEV 0 127 25 lt t lt 100 TDEV 12 100 lt t lt 1000 0 1 25 100 1000 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation A 9 Guaranteed 888 88 SOURCE www artisantg com Appendix A Wander Masks Version 6 0 Where the Masks Apply SONET MTIE OC N Transient An OC N or STSX N signal out of a SONET network element must meet this mask during synchronization rearrangement operations See GR 253 CORE 5 4 4 3 2 and T1 101 1994 7 3 1 2 MTIE OC N Generation An OC N or STSX N signal out of a SONET network element must meet this mask when timed with a wander free reference The reference shall however have white jitter of 1 us p p bandlimited from 10 Hz to 150 Hz see GR 253 CORE 5 4 4 3 1 MTIE DS1 Generation The output of a stratum 2 3 or 3E clock must meet this mask when timed with a wander free reference The reference shall however have white j
2. 0 1 1 43 10 100 1000 10 10 10 Wander Analyst User Manual B 11 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Appendix B TDEV MTIE SDH Standards Version 5 0 TDEV SEC Output The wander at the output of a Synchronous Equipment Clock output of a SDH network element anywhere in the network must meet this mask See ETS DE TM 3017 3 section 7 2 3 10 SEC Output ETS DE TM 3017 3 Fig 8 Ee eee ee TDEV 12 0 1 lt S lt 17 14 ue TDEV 07S 17 14 lt S lt 100 TDEV 58 1 25 0 00035 1 er 100 lt S lt 10 12 0 1 1 10 17 100 1000 10 10 10 TDEV PDH Output The wander at the output of a PDH equipment providing a 2 Mbit s synchronisation signal anywhere in the network must meet this mask See ETS DE TM 3017 3 section 7 2 4 107 PDH Output ETS DE TM 3017 3 Fig 10 issgh TDEV 34 0 1 lt S lt 48 Sii TDEV 0 7S 48 lt S lt 100 TDEV 58 1 25 0 00035 199 ot 100 lt S lt 10 34 10 i 7 0 1 1 10 48 100 1000 10 10 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Appendix C TDEV and MTIE SONET Standards Version 5 0 TDEV and MTIE SONET Standards This appendix details the Time Deviation TDEV and Maximum Time Interval Error MTIE standards for the SONET Equi
3. Guaranteed 888 88 SOURCE www artisantg com Technical Articles Glossary amp aaa AU N DEMUX ETSI FIFO ITU T MPEG MTIE ppTIE PRC Regenerator NE that amplifies and re transmits a line signal fof long distance links SONET SSMB STM N TDEV Ulpp Ulrms VC N ADM_ ANSI ATM__ AUN M_L DEMUX DSP _ DXC_ ES ETSI FET _ 3 Fro F GPS gsi ITU T MPEG _ MTE MUX NE PCM PDH PIE PIL ppTIE PRC PTO SDH__ SEC SES SONET _ SSMB__ SSU __ STM N _ TDEV_ TE Ti v Ulpp Ulrms UTC YCN_ VT ae Wander Analyst User Manual 2 31 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Principles amp Metrics of Jitter and Wander Jitter and wander are defined respectively as the short term and the long term variations of the significant instants of a digital signal from their ideal positions in time One way to think of this is a digital signal continually varying its position in time by moving backwards and forwards with respect to an ideal clock source Most engineers first introduction to jitter is viewed on an oscilloscope Figure 3 20 When triggered from a stable reference clock jittered data is clearly seen to be moving in relation to a reference clock Superimposed pulses with jitter modulation Jitter modulation Figure 2 22 Jitter as viewed o
4. Measurement Period E 300 Seconds Upload File Name sblipa sdhsonet wana_60 tek wab 32 upload dat Change File Name Cancel The following choices are available from Upload selection in the top menu bar Data Storage 20 msec The Wander Analyst program normally stores all of the data uploaded Interval 1 sec from the test unit Since data is generated in 20 millisecond intervals this is generate a large data file As an option the user can elect to store data at one second or 10 second intervals The MTIE and TDEV calculated during the upload will use all of the data but the TIE data stored to disk will be averaged to create one sample per second NOTE Using TIE data stored at one second intervals will not generate the same TDEV MTIE results as the 20 millisecond upload The one second data will be less accurate than the 20 millisecond data However the tradeoff is that the one second data takes up less disk storage space Measurement _ Sets the period for uploading in seconds The length of the actual upload Period seconds is determined by the number of samples that would be read in the measurement period 50 samples per second The measurement period is stored to disk as part of the program configuration and will maintain the value set when the program is restarted Upload File Double click the file listed in the Upload File Name box to change the Name name of the file Select a file f
5. Neither this Agreement nor the license granted herein is assignable or transferable by Customer without the prior written consent of Tektronix This Agreement and the license granted herein shall be governed in the United States by the laws of the State of Delaware All questions regarding this Agreement or the license granted herein should be directed in the United States to the nearest Tektronix Sales Office Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com How to Reach Customer Service Mailing Tektronix Inc Attn Customer Service Address Measurement Business Division P O Box 500 Beaverton Oregon 97077 0001 USA Customer 800 TEK WIDE Hours are 6 00 AM to 5 00 PM and Sales or Pacific Time Support 800 835 9433 Ext 2400 Center After hours Voice Mail is available Direct 503 627 2400 Fax 503 627 5695 E Mail tm_app_supp tek com Web Site http www tek com Wander Analyst User Manual vii If you have any questions regarding the operation maintenance repair or application of your Tektronix equipment contact your local sales and service office This unit should be calibrated yearly For a complete list of Worldwide Sales and Service Offices contact 800 426 2200 or see the table below for other methods of contacting Tektronix sales and service Tektronix provides high quality Technical Support on applications operation measurement spec
6. Technical Articles Consequences of Jitter and Wander in the Network PDH Network Systems In an asynchronous system timing is derived by phase locked loops that track the slow phase variations the wander so wander is not seen by the system The jitter component of the phase which is not tracked reduces the operating margins of the system Therefore in an asynchronous system jitter is the main parameter of interest SDH Network Systems In a synchronous system such as the Synchronous Digital Hierarchy SDH both jitter and wander are of interest There are still phase locked loops for clock recovery which are sensitive to jitter But there are also FIFO buffers that are sensitive to wander These FIFOs operate open loop depending on inherent synchronization between the write clock and the read clock Therefore a key parameter of interest is the variation of phase from 10 Hz all the way down to de i e wander Consequences in the Network There are four major consequences of excessive jitter on a received signal e Bit errors can be produced because decision logic circuits do not operate at the optimum time At high jitter frequencies the clock recovery circuitry can no longer keep up with the rapid phase changes of the incoming signal And when the recovered clock gets out of step with the incoming signal by more than 0 5 UI the signal bit is incorrectly sampled and may cause an error e Data can be lost because input buffers can
7. The transient out of an SEC due to an up steam switch is restricted The specification is given in words rather than by an MTIE mask see ETS DE TM 3017 5 section 9 1 and ITU T Recommendation G 813 section 10 1 Note that TIE plot referred to in the specification is not an MTIE mask it is only a summary of the transient specification Meeting the MTIE mask provided here is a necessary but not sufficient condition for meeting the transient specification SEC Transient ITU G813 Fig 12 Re ETS DE TM 3017 5 Fig 7 Be MTE 750S 0001 lt S lt 0 032 4 MTE 2384 50S 0032 lt S lt 15 100 MTIE 1000 15 lt S lt 1000 10 100 1 0 01 0 1 1 10 100 103 MTIE PRC Noise Generation The wander at the output of a Primary Reference Clock must meet this mask The reference used in making this measurement must be more stable than the requirements of the mask See ETS DE TM 3017 6 section 5 1 104 PRC Generation ETS DE TM 3017 6 Fig 1 10 MTIE 25 0 2755 0 1 lt S lt 1000 AOp aaa n MTIE 290 0 015 1000 lt S 109 E 1 10 100 10 107 105 106 Wander Analyst User Manual B 5 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Appendix B TDEV MTIE SDH Standards Version 5 0 MTIE Masks SDH Network MTIE PRC Output The wander at the output of a Primary Reference Clock must meet this mask See ETS DE TM 301
8. A rtisan Artisan Technology Group is your source for quality TecmoogyGroup new and certified used pre owned equipment FAST SHIPPING AND SERVICE CENTER REPAIRS WE BUY USED EQUIPMENT DELIVERY Experienced engineers and technicians on staff Sell your excess underutilized and idle used equipment TENS OF THOUSANDS OF at our full service in house repair center We also offer credit for buy backs and trade ins IN STOCK ITEMS www artisantg com WeBuyEquipment 7 EQUIPMENT DEMOS HUNDREDS OF InstraV ea REMOTE INSPECTION LOOKING FOR MORE INFORMATION MANUFACTURERS Remotely inspect equipment before purchasing with Visit us on the web at www artisantg com 7 for more our interactive website at www instraview com information on price quotations drivers technical LEASING MONTHLY specifications manuals and documentation RENTALS ITAR CERTIFIED D a gaa tia Contact us 888 88 SOURCE sales artisantg com www artisantg com User Manual Real Time Wander Analyst Software CTS 850 for SDH CTS 850 for El E2 E3 E4 SJ300E for SDH SONET 071 0518 00 This document applies to firmware version 6 0 and above Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Copyright 1998 Tektronix Inc All rights reserved Licensed software products are owned by Tektronix or its suppliers and are protected by United States copyright laws and international treaty provisions Us
9. We recommend that a filter with 0 2dB passband ripple and a 3dB cut off frequency accuracy of 10Hz 15 be used as a minimum requirement see Figure 2 15 This will ensure that measurement inaccuracy due to filter variation is no more than 8 ref ETS 300 462 3 Nominal Maximum 10 100 Frequency Hz Figure 2 17 Wander measurement filter characteristic ref ETS 300 462 3 Measurement Sample Rate In addition the time interval measurement sample rate has to be high enough to reduce aliasing in combination with the 10Hz filter and provide good temporal resolution of phase transients While the minimum specified by G 813 for example is 30Hz we recommend a value of 50Hz which increases the accuracy of measured TDEV for small values of T 2 24 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Technical Articles Measurement Units Wander is principally measured as TIE ns Some specifications still use the equivalent value in Unit Intervals UD whilst at very low frequencies a frequency offset PPM reading may be useful New specifications from ITU T and ETSI will use the new TIE and MTIE metrics rather than UI The derived metrics of MTIE and TDEV are normally computed externally using PC wander analysis software due to the large volume of measurement data and the processing time required It is poss
10. this is no longer sufficient New Measurement Tools Tektronix is pioneering new measurement methods that can help to establish timing quality parameters on PDH services that have been transported by SDH The measurements are made on the PDH service and could be correlated with measurements made on the SDH network Four of these measurements are briefly outlined next Pointer Hits Pointer Hits phase transients due to pointer justification can for the first time be estimated on the PDH service As a result the occurrence of pointer events in the SDH network which could physically and operationally be some distance away can be assessed at the service delivery point This brings very useful benefits to end users and their service providers Full band Jitter Measurement Full band jitter measurements can be made on the PDH service As a result the low frequency high amplitude components of pointer jitter can be measured and evaluated in a way that was not possible previously The high pass bandwidth is selectable from 0 1Hz to 10Hz Frequency Drift rate PPM sec Frequency drift rate measurements can be made on the PDH service As a result the performance of SDH desynchronisers can be evaluated in a new way that was not previously possible New types of desynchroniser are becoming available which specifically control this parameter in order to deliver a transient free PDH service These will set a new benchmark in timing quality per
11. Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Appendix B TDEV MTIE SDH Standards Version 5 0 TDEV SSU Tolerance An SSU must tolerate give to indication of improper operation wander at its input that has TDEV of this mask See ETS DE TM 3017 4 section 7 2 1000 SSU Tolerance ETS DE TM 3017 4 Fig 4 TDEV 34 0 1 lt t lt 20 TDEV 1 7t 20 lt t lt 100 TDEV 170 100 lt t lt 1000 TDEV 5 47 1000 lt q lt 104 10 0 1 1 20 100 1000 104 TDEV SSU Transfer The wander at the output of a Synchronisation Supply Unit must meet this mask when the reference to the SSU has TDEV equal to the SSU Tolerance mask See ETS DE TM 3017 4 section 8 1000 540 SSU Transfer ETS DE TM 3017 4 Fig 7 TDEV 3 0 1 lt t lt 13 3 10 TDEV 0 0177 13 3 lt t lt 100 TDEV 170 100 lt T lt 1000 i TDEV 5 4t 1000 lt t lt 10 01 1 133 100 1000 104 TDEV SSU Generation The wander at the output of a Synchronisation Supply Unit must meet this mask when the reference to the SSU is ideal at least 10 times more stable than the output requirements See ETS DE TM 3017 4 section 6 1 SSU Generation ETS DE TM 3017 4 Fig 1 TDEV 3 0 1 lt t lt 25 TDEV 0 12t 25 lt t lt 100 TDEV 12 100 lt t lt 1000 0 1 25 100 1000 Wander Analyst User Manual B 9 Artisan Technology Group Quality Instrumentation Gua
12. So results can vary widely from the steady state condition where no pointer justifications are occurring to the condition when pointer justification are present This must be taken into account when making controlled tests 2 22 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Technical Articles Jitter Generation and Modulation Jitter Modulation Sine The standard modulation signal when generating jitter is a sinewave This is a good repeatable test signal to use for input jitter tolerance tests and jitter transfer function tests Note that this test signal is not intended to be representative of the type of jitter to be found in practice in a network Digital Test Patterns Because different digital test patterns have different spectral content it is necessary to specify what type of pattern is to be used when testing PDH systems The test patterns themselves are defined in O 151 and are summarized in Table 2 Table 2 2 Digital test patterns ref ITU T G 823 ata Rate Mbit s Digital Test Pattern 23 1 2 34 2 140 Since SDH is scrambled immediately prior to transmission it is not necessary to define specific test patterns for jitter measurements although the test signal will almost certainly contain some type of structured test payload Frequency Offset For some tests it may be desirable to offset the test signal in frequency
13. 1 TDEV SSU Generation The wander at the output of a Synchronisation Supply Unit must meet this mask when the reference to the SSU is ideal at least 10 times more stable than the output requirements See ETS DE TM 3017 4 section 6 1 A 14 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Appendix B TDEV MTIE SDH Standards Version 5 0 TDEV and MTIE SDH Standards This appendix details the Time Deviation TDEV and Maximum Time Interval Error MTIE standards for the SDH Equipment and the SDH Networks The masks in this section were used in Version 5 0 of the Wander Analyst software Wander Analyst User Manual B 1 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Appendix B TDEV MTIE SDH Standards Version 5 0 MTIE Masks SDH Equipment MTIE SEC Generation When the Synchronous Equipment Clock is slaved to a wanderless timing source the wander at output of the host SDH network element must meet this mask The test is to be performed over the temperature range specified for the equeipment See ITU T Recommendation G 813 section 7 1 1000 SEC Generation ITU T Fig 1 G813 MTE 40 0 5t 0 1 lt Tt lt 1 i MTE 40P 0 5t 1 lt t lt 100 113 MTE 25 25t 50 100 lt t lt 1000 40 0 1 1 10 100 1000 MTIE SEC Gen Const Temp When the Sy
14. 2 describes the following five types of network rearrangement activities e Manual timing reference switching the first item in section 5 4 4 3 2 e Automatic timing reference switching as described in Bellcore Section 5 4 6 e Holdover or free run entry into self timing operation for the initial self timing of 2 33 seconds e Automatic clock diagnostics e Phase transients on external or OC N synchronization input with the rate of change as specified in ANSI T1 101 1994 ANSI T1 101 1994 section 7 2 1 2 limits the rate of change to 81 ns per 1 326 ms and limits the amplitude to 1000 ns Figure 2 5 illustrates the Wander Analyst system configured to test SONET OC N Phase Transient Specifications conformance No wander or noise jitter is added to the BITS signal For information on how to generate no wander refer to the SJ300E user manual While the network element synchronization is being rearranged manually or automatically the SJ300E receiver measures the OC N wander The wander data is uploaded to a PC and used to calculate the MTIE plot 2 8 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Reference PC used to calculate TDEV and MTIE PC used to e control the NE a SJ300E TIE data GPIBor g RS 232 In Recai ST 112 SONET eceiver E Network
15. Analyst software follow the instructions in Chapter 2 Uploading Data from the SJ300E The figure below illustrates a TDEV plot with its corresponding mask Wander Analyst wander TDY of x File Communication Upload Plot Mask Process Dats Help TDEV SDH amp PDH Sync Network ETS 300 462 3 PDH Output 1000 T TDEV ns oh JODO ME H ENUE I 1 JH on 0 10 1 00 10 00 100 00 1000 00 10000 00 100000 00 Observation Interval sec Failed Measurement Period 300 sec Sample Interval 20 msec Notes Sample wander data Figure 2 5 TDEV Plot and Mask Wander Analyst User Manual 2 5 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Reference Generating Phase Transients The Phase Transient feature generates a step in phase that is used to validate the transient tolerance and the transient response of the network element under test This feature requires that the SJ300E Wander Test Option be installed The early Model SJ300 Jitter Wander Analyzers with a Wander Test Option installed and firmware versions between 3 9 and 4 9 or 5 5 and above also support the Phase Transient feature Any other version will require upgrade or replacement The phase patterns for Transient generation standards are Phase Pattern Bellcore Standard ANSI Standard 1000TRAN GR 253 Sec 5 4 4 3 2 T1 101 1994 Sec 7 2 12 ee 1200TRAN TR NWT 00124
16. Element nit opTIcaL Signal _ oc Generator gt OC n OC n BITS REF CLOCK Input Output Output DS1 DS1 Out pe inde ns 1 Reference 2 BITS OUT Figure 2 7 SONET OC N Phase Transient Specification conformance testing To test the five types of rearrangement activities specified under the Bellcore GR 253 CORE Section 5 4 4 3 2 follow the setup instructions for Basic Wander Measurement previously described in this chapter Figure 2 7 shows the SONET network element under test with two timing sources The DS1 Reference 2 passes through the SJ300E with wander generation set to NONE to provide a 324 nanosecond phase difference between it and DS1 Reference 1 The SJ300E Receiver monitors wander on the OC N signal and the Wander Analyst software calculates MTIE from the uploaded wander data To test manual timing rearrangements provision the SONET network element to be timed from DS1 Reference 1 allow the system to settle for two minutes and start a 300 second measurement of the OC N wander After ten or twenty seconds reprovision the SONET network element to be timed from DS1 Reference 2 The measurement is complete when the TIE measurement becomes stable again Now compare a plot of the MTIE data with the OC N Transient mask provided by the software An OC N or STSX N signal out of a SONET network element must meet this mask during synchronization rearrangement operations See GR 253 R5 38 and T1 101 1
17. MTIE 10 0 29 S 0 05 lt S lt 1000 MTIE 290 0 01 S 1000 lt S 0 01 0 1 1 10 100 1000 104 10 10 SMC Holdover T1 105 09 Table 2 104 MTIE 7 6 8855 0 014 lt S lt 0 5 MTIE 300 3005 0 5 lt S lt 2 33 i a a ane aay MTIE 884 50S 2 33 lt S lt 64 10 450 por 100 J 20 10 0 014 0 1 0 5 1 2 33 10 64 SMC Transient GR 253 CORE Fig 5 19 e MTIE 7 6 885S 0 014 lt S lt 0 5 ae MTIE 300 30080 5 lt S lt 2 33 MTIE 1000 2 33 lt S lt 280 100 20 E 10 Som 0 1 03 1 535 10 100 280 1000 A 2 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com TDEV Masks SONET Appendix A Wander Masks Version 6 0 OC N Generation GR 253 CORE Fig 5 17 GR 1244 CORE Fig 5 1 TDEV 3 2 t 0 5 0 1 lt 1 lt 2 5 TDEV 2 2 5 lt 1 lt 40 TDEV 0 32 70 5 40 lt T lt 1000 TDEV 10 1000 lt t lt 104 0 1 1000 10000 OC N Interface T1 101 1994 Fig 9 GR 253 Fig 5 14 TDEV 10 0 05 lt T lt 1 73 TDEV 5 77 t 1 73 lt t lt 30 TDEV 31 6 70 5 30 lt t lt 1000 1000 173 10 0 05 1 7 30 1000 DS1 Interface T1 101 1994 Fig 6 600 TDEV 100 0 05 lt t lt 10 TDEV 31 6 70 5 10 lt t lt 1000 100 1000 DS1 Filtered GR 253 CORE Fig 5 15 TDEV 17 0 1 lt t
18. OF THIS WARRANTY TEKTRONIX AND ITS VENDORS WILL NOT BE LIABLE FOR ANY INDIRECT SPECIAL INCIDENTAL OR CONSEQUENTIAL DAMAGES IRRESPECTIVE OF WHETHER TEKTRONIX OR THE VENDOR HAS ADVANCE NOTICE OF THE POSSIBILITY OF SUCH DAMAGES Wander Analyst User Manual iii Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com License Agreement and Warranty Information TEKTRONIX SOFTWARE LICENSE AGREEMENT The enclosed program is furnished subject to the terms and conditions of this agreement retention of the program for more than thirty days opening the sealed wrapper if any surrounding the program or use of the program in any manner will be considered acceptance of the agreement terms If these terms are not acceptable the unused program and any accompanying documentation should be returned promptly to Tektronix inc For a full refund of the license fee paid DEFINITIONS Program means the Tektronix software product executable program and or data enclosed with this Agreement or included within the equipment with which this Agreement is packed Customer means the person or organization in whose name the Program was ordered LICENSE The Customer may a Use the Program under a nontransferable license on a single specified machine b Copy the Program for archival or backup purposes provided that no more than one 1 such copy is permitted to exist at any one time Each copy of the
19. Wander Masks Version 6 0 TDEV OC N Generation An OC N or STSX N signal out of a SONET network element must meet this mask when timed with a wander free reference The reference shall however have white jitter of 1 us p p bandlimited from 10 Hz to 150 Hz see GR 253 CORE 5 4 4 3 1 An DS1 signal out of a stratum clock must meet this mask when timed with a wander free reference The reference shall however have white jitter of 1 us p p bandlimited from 10 Hz to 150 Hz see GR 1244 CORE 5 3 TDEV OC N Interface Under normal conditions no phase transients due to rearrangement an OC N reference signal must meet this mask at the interface point at the equipment in the office where the timing is received See T1 101 1994 7 3 2 An OC N or STSX N signal out of a SONET network element must meet the OC N Interface TDEV mask when referenced to a DS1 timing signal that meets the DS1 Filtered TDEV mask An OC N or STSX N signal out of a SONET network element must meet the OC N Interface TDEV mask when referenced to a line OC N timing signal that meets the OC N Interface TDEV mask See GR 253 5 4 4 2 4 TDEV DS1 Interface Under normal conditions no phase transients due to rearrangement a DS1 reference signal must meet this mask at the interface point at the DSX 1 cross connect in the node receiving timing See T1 101 1994 7 2 2 TDEV DS1 Filtered A filtered DS1 timing reference input to a SONET n
20. and so on Video Transport in Broadband Networks New SDH technology offers an ideal mechanism for PTOs since they can use the same backbone network for all voice video and data services Hence video transport services can be provided to customers without the need for dedicated links and organizations Irrespective of whether the video is analogue composite or digital component format using SDH as a transport network technology for video encoded on 140 and 34 Mbit s data rates may introduce unwanted timing impairments into the service this is well documented The impairments can result in distortion and visible picture degradation Since video was not considered as a primary service driver when SDH was initially developed there are important gaps in equipment and interface specifications some areas of timing performance are undefined and not easily tested This leads to operational problems that are difficult to identify and resolve yet have a visible impact on delivered service The use of ATM bearers and MPEG coded video is being evaluated by many operators initial results are that similar potential timing problems will exist in networks using this technology It is essential to begin early assessment in practical network configurations to ensure future success and enable a fast roll out of services Wander Analyst User Manual 2 17 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com
21. file with another button and submenu The 1 22 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Operating Basics a ie save command allows the user to input the full path file name Sliding Window The frequency offset will be calculated from every window width across Frequency Offset the full measurement period and plots the results Sliding Window Select The frequency drift will be calculated from every window width across Frequency Drift Range the full measurement period and plots the results Sliding Window Frequency Drift is an equivalent process to MTIE calculation from TIE data See the graphic representation of this process below Sliding Window Frequency Drift 100 sec window width 0 100 200 300 Measurement period Help Selection File Communication Upload Plot Mask Process Data HELP Disk Space Available Disk Space 20me Sample Interval 8795253 Seconds 1Sec Sample Interval 439762688 Seconds The following choices are available from the Help selection in the top menu bar Disk Space Reports the amount of disk space available on the target drive in seconds of upload time The target drive was selected by the Set upload file command under the Upload pulldown menu This feature is not available in the Win 3 1 version Available disk space in seconds bytes available 1024 200 Displays the Wander Analyst vers
22. in Figure 2 9 with the SONET NE under test in the OC N signal path Have the SJ300 start the same wander pattern again allow the system to settle for two minutes and start a 12 000 second test measurement of the wander Multiply the test TDEV values by the corresponding correction factors The results must not exceed the TDEV mask in GR 253 CORE Fig 5 14 values listed in Appendix B by more than 2 Wander Analyst User Manual 2 13 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Reference Wander Tolerance and Transfer for Stratum Clocks Bellcore GR 1244 CORE section 4 3 The clock must tolerate i e must give no indication of improper operation in addition to meeting the limit of Figure 5 3 any arbitrary input signal having wander in conformance with the mask in Figure 4 2 Bellcore GR 1244 CORE section 5 4 When timed by any input signal whose TDEV is less than or equal to the wander tolerance mask in Figure 4 2 the TDEV of the output signal from a clock shall be less than the mask in Figure 5 3 1000 TDEV ns 100 0 05 10 1000 Integration Time t seconds Figure 2 12 Wander Tolerance GR 1244 CORE Fig 4 2 C1 eee TDEV ns 547 es 100 J Stratum 3 50 Stratum 2 amp 3E 0 05 0 1 1 1 10 300 10 000 Integration Time T seconds Figure 2 13 Wander Transfer GR 1244 CORE Fig 5 3 The setup for testing conformance to the cloc
23. is a critical feature at low jitter frequencies due to the high amplitude of low frequency pointer jitter Traditional jitter test sets can have non ideal responses below a jitter wander frequency of typically 10 to 20Hz due to the PLL operating characteristics In historical PDH networks this is not an issue In the new SDH PDH networks however variations in frequency response below the 3 dB point can have a significant impact on measurement results There is a one to one relationship between jitter measurement accuracy and filter cut off accuracy at 10Hz for example Unless the filter is well controlled measurement results of pointer jitter will be poorly controlled unreliable and inaccurate Measurement Units Unit Intervals are either measured as a Peak to Peak measurement in any of the above bandwidths or an RMS measurement in which case the 12kHz bandwidth applies In addition measurements of Peak and Peak are useful particularly when diagnosing pointer jitter problems since this type of jitter is asymmetrical unlike the higher frequency jitter components Measurement Period The conventional measurement period is 60 seconds This provides good repeatability for most jitter measurements and a Peak to Peak measurement will converge quite quickly to the correct reading The one exception is when measuring pointer jitter since the measurement result needed is due to discrete often infrequently occurring pointer events
24. lt 3 TDEV 5 67 T 3 lt 1 lt 30 TDEV 31 62 19 5 30 lt t lt 1000 l 1000 0 1 3 30 Derived DS1 GR 253 CORE Fig 5 21 TDEV 3 2 105 0 1 lt 1 lt 25 TDEV 2 2 5 lt t lt 1000 0 1 2 5 100 1000 Wander Analyst User Manual A 3 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Appendix A Wander Masks Version 6 0 Stratum 2 amp 3E GR 1244 CORE Fig 5 3 1 TDEV 2 0 05 lt T lt 0 347 ii TDEV 5 777 0 347 lt t lt 30 TDEV 31 61 30 lt T lt 1000 173 2 0 05 0 347 30 1000 A 4 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com MTIE Masks SDH Appendix A Wander Masks Version 6 0 SEC Generation ITU T Fig 1 G 813 MTIE 40 0 57 O1 lt t lt 1 MTIE 400 0 5 1 lt t lt 100 MTIE 25 2517 50 100 lt t lt 1000 1000 150 113 40 0 1 1 10 100 1000 SEC Gen Const Temp ITU T Fig 1 G 813 MTIE 40 O1 lt t lt 1 MTIE 407 1 lt t lt 100 MTIE 25 257 100 lt t lt 1000 1000 n 10 i 0 1 10 100 1000 SEC Tolerance ITU T Fig 5 G 813 ie MTIE 250 0 1 lt t lt 2 5 aaa MTE 100t 25 lt t lt 20 66h ecto cect accesses tennant MTIE 2000 20 lt T lt 400 MTIE 5T 400 lt t lt 1000 250 100 s i i 0
25. performance limits are for further study e Not cause any alarms e Not cause the clock to switch reference e Not cause the clock to go into holdover MTIE SSU Tolerance An SSU must tolerate give no indication of improper operation wander at its input that has MTIE of this mask See ETS DE TM 3017 4 section 7 2 MTIE PRC Output The wander at the output of a Primary Reference Clock must meet this mask See ETS DE TM 3017 3 section 7 2 1 MTIE SSU Output The wander at the output of a Synchronisation Supply Unit slave clock anywhere in the network must meet this mask See ETS DE TM 3017 3 section 7 2 2 MTIE SEC Output The wander at the output of a Synchronous Equipment Clock output of a SDH network element anywhere in the network must meet this mask See ETS DE TM 3017 3 section 7 2 3 MTIE PDH Output The wander at the output of a PDH equipment providing a 2 Mbit s synchronisation signal anywhere in the network must meet this mask See ETS DE TM 3017 3 section 7 2 4 A 12 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Appendix A Wander Masks Version 6 0 MTIE PRC Generation The wander at the output of a Primary Reference Clock must meet this mask The reference used in making this measurement must be more stable than the requirements of the mask See ETS DE TM 3017 6 section 5 1 MTIE SSU Generation The
26. the rear panel will be used to communicate with the PC An RS 232C full modem cable or a IEEE 488 GPIB cable that can interconnect the SJ300E and the PC is also required but not supplied with the option The SJ300E SONET SDH Jitter and Wander Analyzer User s Guide details the use of the unit its installation initial checkout and setup procedures local and remote functions Personal Computer Hardware Requirements The program runs on an IBM compatible personal computer under the Windows 95 operating system The following hardware is required a Pentium processor 90 MHz or faster a minimum of 16 megabytes of RAM memory a hard drive with 3 0 MB of available space to load the program and sufficient free space to store the collected data A color monitor such as a VGA and mouse are recommended but not required The SJ300E and CTS 850 sample data at 50 samples per second The Wander Analyst software can store all of those data points data storage intervals 20 msec or it can store one point for every fifty samples by averaging the data points data storage interval 1 sec The high and low values can be displayed graphically by selecting Plot Display Mode Hi Low instead of Sample The Storage Interval can also be 10 seconds When a twenty four hour test is saved on the hard disk at fifty samples per second rate it uses approximately 32 megabytes of hard drive storage space and under one megabyte when stored at the one sample p
27. the MTIE data with the OC N Transient mask To be compliant the MTIE plot must be totally beneath the mask To test for 20 margin in compliance with the Bellcore specification repeat the test using 1200TRAN wander generation rather than 1000TRAN TIE f REF CLOCK IN SONET SDH Stratum Clock PC used to calculate TDEV and MTIE SJ300E Ref Clock Input SYNC IN IN OUT SYNC OUT E1 or DS1 Figure 2 9 Test Setup for Measuring Conformance to Clock Phase Transient Wander Analyst User Manual 2 11 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Reference Wander Transfer Conformance Testing Wander Transfer Specifications Wander accumulation is aggravated by any amplification of wander by synchronization equipment Wander transfer specifications require absolutely no gain but in practice about 2 gain is allowed to account for repeatability problems in measuring wander Wander is sometimes required to be attenuated for a range of T in order to reduce wander accumulation Transfer from DS1 to OC N Bellcore GR 253 CORE section 5 4 4 2 4 R5 125 OC N OC M and STS N STS M electrical outputs when referenced to an external DS1 timing signal that meets the wander TDEV mask in Figure 5 15 shall meet the wander TDEV mask given in Figure 5 14 TDEV ns 0 05 1 7 3 30 1000 Integration Time T s Figure 2 10 OC N Output Wander Time Deviation GR 2
28. the two frequencies are not the same the result is a phase ramp that invalidates the measurement The Remove Offset function therefore allows a frequency difference There are two situations where the user of the Wander Analyst software can encounter this frequency difference 1 The signal under test is a PDH signal for example DS3 whose frequency is only held to 20 ppm In general the frequency is not available at the remote measurement site and the wander reference will have a frequency offset The signal under test is an SDH signal for example STM 4 whose frequency is held to 0 00001 ppm If the test user does not have an expensive Stratum 1 wander reference at the remote measurement site then a wander reference can be used that is not as accurate in frequency but is stable to reduce costs Calc Frequency Data Start The Frequency Offset is the average phase slope over a specified Offset and Drift point period defined by the left and right cursor positions Window The Frequency Drift Rate is the average second derivative of the width phase over the window of time The left most cursor defines the start time as seconds into the data plot The right most cursor defines the total frequency offset measurement period in seconds A submenu allows the numeric cursor position to be entered directly from the keyboard fine tuning cursor positions Once calculated the Offset data can be accepted with an OK button or saved to a
29. this mask when timed with a wander free reference The reference shall however have white jitter of 1 us p p and a band limited from 10 Hz to 150 Hz see GR 253 CORE 5 4 4 3 1 An DS1 signal out of a stratum clock must meet this mask when timed with a wander free reference The reference shall however have white jitter of 1 us p p band limited from 10 Hz to 150 Hz see GR 1244 CORE 5 3 OCN Generation GR 253 CORE Fig 5 17 10 k GR 1244 CORE Fig 5 1 TDEV 3 r 05 0 1 lt 1 lt 25 2 TDEV 2 25 lt t lt 40 1 TDEV 032 205 40 lt t lt 1000 TDEV 10 1000 lt t lt 10 0 1 25 40 1000 10000 TDEV Derived DS1 The DS1 timing reference derived by a SONET network element from an OC N signal must meet this mask See GR 253 CORE 5 4 5 1 Derived DS1 GR 253 CORE Fig 5 21 TDEV 3 2 1 05 0 1 lt 1 lt 25 TDEV 2 2 5 lt t lt 1000 0 1 25 100 1000 C 6 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Appendix C TDEV and MTIE SONET Standards Version 5 0 TDEV DS1 Filtered A filtered DS1 timing reference input to a SONET network element must meet this mask Implied by GR 253 CORE 5 4 4 2 4 1000 F DS1 Filtered GR 253 CORE Fig 5 15 TDEV 17 O 1 lt t lt 3 ion E TDEV 5 67 T 3 lt t lt 30 TDEV 31 625 30 lt t lt 1000 177 l i l l 0 1 3 30 1000 TDEV Stratum 2 amp 3E The output of a Stratum 2 or Stra
30. wander at the output of a Synchronisation Supply Unit must meet this mask when the reference to the SSU is ideal at least 10 times more stable than the output requirements See ETS DE TM 3017 4 section 6 1 MTIE SEC Transient The transient out of an SEC due to an up steam switch is restricted The specification is given in words rather than by an MTIE mask see ETS DE TM 3017 5 section 9 1 and ITU T Recommendation G 813 section 10 1 Note that TIE plot referred to in the specification is not an MTIE mask it is only a summary of the transient specification Meeting the MTIE mask provided here is a necessary but not sufficient condition for meeting the transient specification TDEV SEC Gen Const Temp When the Synchronous Equipment Clock is slaved to a wanderless timing source the wander at the output of the host SDH network element must meet this mask This test is to be performed at a constant temperature 1 K See ITU T Recommendation G 813 section 7 1 TDEV SEC Tolerance An SEC slaved to a timing source must tolerate wander on that source that in the worst case just meets this mask See ITU T Recommendation G 813 section 8 1 Tolerate means e Maintaining the clock within prescribed performance limits The exact performance limits are for further study e Not cause any alarms e Not cause the clock to switch reference e Not cause the clock to go into holdover TDEV SSU Tolerance An SSU must tolerate give no indi
31. www artisantg com Appendix C TDEV and MTIE SONET Standards Version 5 0 MTIE DS1 Generation The output of a stratum 2 3 or 3E clock must meet this mask when timed with a wander free reference The reference shall however have white jitter of 1 us p p band limited from 10 Hz to 150 Hz see GR 1244 CORE R5 5 100 DSI Generation GR 1244 CORE Fig 5 2 MTIE 40 0 1 lt S lt 1 40 MTIE 40 504 1 lt S lt 10 MTIE 100 10 lt S lt 1000 0 1 1 10 100 1000 Wander Analyst User Manual C 3 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Appendix C TDEV and MTIE SONET Standards Version 5 0 MTIE Masks SONET Network MTIE OC N Interface Under normal conditions no phase transients due to rearrangement an OC N reference signal must meet this mask at the interface point at the equipment in the office where the timing is received See T1 101 1994 7 3 1 1 rt 1000 100 70 OCN Interface T 1 101 1994 Fig 7 MTIE 70 3328 005 lt lt 280 MIIE 997 00145 280 lt S lt 10 0 01 0 1 1 10 100 280 1000 104 10 10 MTIE DS1 Interface Under normal conditions no phase transients due to rearrangement a DS1 reference signal must meet this mask at the interface point at the DSX 1 cross connect in the node receiving timing See T1 101 1994 7 2 1 1 DS1 Interface T1 101 1994 Fig 5 MTIE 3004 25 S 0 05 lt lt 280 MTIE
32. 0 Fax 34 1 372 6049 Sweden Stockholm Phone 46 8 629 6500 Fax 46 8 629 6540 Switzerland Zug Phone 41 42 219192 Fax 41 42 217784 U K Marlow Phone 44 1628 403300 Fax 44 1628 403301 Tektronix sales and service offices around the world Algeria Argentina Australia Bahrain Bangladesh Belgium Bolivia Brazil Bulgaria Canada Chile People s Republic of China Columbia Costa Rica Cypress Czechoslovakia Denmark Ecuador Egypt Finland France Germany Greece Hong Kong Iceland India Indonesia Treland Israel Italy Ivory Coast Japan Jordan Korea Kuwait Lebanon Malaysia Mexico The Netherlands New Zealand Nigeria Norway Oman Pakistan Panama Peru Phillippines Poland Portugal Saudi Arabia South Africa Singapore Spain Sri Lanka Sweden Switzerland Taiwan Thailand Tunisia Turkey United Arab Emirates United Kingdom Uruguay Venezuela Zimbabwe Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Table Of Contents License VV ARNE ctcozsselivdatesceace seu ea raense sis eaves since tiGaics Oeeee ee iv Customer Service NOW tO reach cccceeeececceeeceeseeeeeeeeeeeeeeesteeeseeseeaens vii Getting Started nsaan anadan denan aa aande Vara annaua 1 1 Wander Analyst Software i coiccscciviacasshacernectincereisnveencretwr
33. 1 2 5 20 400 1000 SSU Tolerance ETS DE TM 3017 4 Fig 5 10 MTIE 750 0 1 lt S lt 7 5 5000 MTIE 100S 7 5 lt S lt 20 2000 MTIE 2000 20 lt S lt 400 750 MTIE 55 400 lt S lt 1000 MTIE 5000 1000 lt S lt 10 eee ii l 75 20 100 4001000 104 Wander Analyst User Manual A 5 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Appendix A Wander Masks Version 6 0 PRC Output ETS DE TM 3017 3 Fig 3 MTIE 25 0 1 lt S lt 83 MTIE 0 35 83 lt S lt 1000 MTIE 300 1000 lt S lt 30000 MTIE 0 015 30000 lt S 1000 SSU Output ETS DE TM 3017 3 Fig 5 MTIE 25 0 1 lt S lt 2 5 MTIE 10S 2 5 lt S lt 200 MTIE 2000 200 lt S lt 2000 MTIE 4338 0 01S 2000 lt S 5330 2000 SEC Output ETS DE TM 3017 3 Fig 7 MTIE 250 0 1 lt S lt 2 5 MTIE 1005S 2 5 lt S lt 20 MTIE 2000 20 lt S lt 2000 MTIE 4338 0 01S 2000 lt S 5330 2000 250 2 5 20 PDH Output ETS DE TM 3017 3 Fig 9 MTIE 732 0 1 lt S lt 7 3 MTIE 1005S 7 3 lt S lt 20 MTIE 2000 20 lt S lt 2000 MTIE 4338 0 015 2000 lt S 104 5330 2000 732 7 3 20 0 1 sa 10 PRC Generation ETS DE TM 3017 6 Fig 1 104 MTIE 25 0 2755 0 1 lt S lt 1000 MTIE 290 0 015 1000 lt S 10 BOO p 100 1T 1 10 100
34. 103 104 105 106 A 6 Artisan Technology Group Quality Instrumentation Wander Analyst User Manual Guaranteed 888 88 SOURCE www artisantg com Appendix A Wander Masks Version 6 0 SSU Generation ETS DE TM 3017 4 Fig 2 MTIE 24 0 1 lt S lt 9 MTIE 8 S gt 9 lt S lt 400 MTIE 160 400 lt S lt 1000 1000 9 400 1000 0 1 SEC Transient ITU G 813 Fig 12 104 ETS DE TM 3017 5 Fig 7 MTIE 7500S 0 001 lt S lt 0 032 MTIE 238 4 50S 0 032 lt lt 15 1 MTIE 1000 15 lt S lt 1000 100 10 0 001 0 01 0 1 1 10 100 103 MTIE SEC Transient The transient out of an SEC due to an up steam switch is restricted The specification is given in words rather than by an MTIE mask see ETS DE TM 3017 5 section 9 1 and ITU T Recommendation G 813 section 10 1 Note that TIE plot referred to in the specification is not an MTIE mask it is only a summary of the transient specification Meeting the MTIE mask provided here is a necessary but not sufficient condition for meeting the transient specification Wander Analyst User Manual A 7 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Appendix A Wander Masks Version 6 0 TDEV Masks SDH SEC Gen Const Temp ITU T Fig 2 G 813 a a T
35. 2MHz reference with wander or jitter is available at the BITS SETS OUT rear panel port The jitter signal for generating an impure reference is band limited white noise between 10 and 150 Hz It generates 1000 ns peak to peak jitter with an RMS of Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Reference 110 ns The modulation is selected by setting WANDER GENERATION to NOISE JIT and turned off by setting it to NONE Measuring DS1 Wander Relative to a Reference The Wander Test Option can measure wander on a DS1 1 544Mbps 2Mbps or 2MHz reference when it is provided with a pure reference at the receiver EXT REF port Connect the signal to be measured to the BITS SETS IN port on the rear panel and set the WANDER MEASUREMENT to BITS SETS Wander TIE data is available for uploading from the GPIB or RS 232C interfaces Data can be uploaded using the Wander Analyst program or by using the Remote Commands listed in the SJ300E User Manual Measuring SONET SDH Wander Relative to a Reference The Wander Test Option can measure wander on a SONET or SDH signal when it is provided with a pure reference at the receiver EXT REF port To do so connect the signal to be measured to the OPTICAL IN CLOCK IN or DATA IN port Set the WANDER MEASUREMENT to OCN Wander TIE data will be available for uploading from the GPIB or RS 232C interfaces It can be uploaded us
36. 4 Sec 4 4 The two transients are described by TIE ft 1000 ns 1 e and TIE t 1200 ns 1 e where TIE is time interval error and f is time in seconds These are plotted below 1300 wo 1200TRAN A d 100 aap S e H Pede te ee ee E E ket ee E E TIE 800 p 1000TRAN 700 ns 600 500 400 300 200 100 0 0 01 0 02 0 03 0 04 0 05 0 06 0 07 0 08 0 09 0 1 t sec Figure 2 6 Plot of LOOOTRAN and 1200TRAN Phase Patterns Specification for Transient Generation Note that for IOOOTRAN the maximum TIE change in a 1 326 ms interval is 80 ns compare with 81 ns limit given in T1 101 1994 Sec 7 2 1 2 The accuracy of these transients is 2 ns 5 2 6 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Reference Phase Transient Generation Procedure 1 Connect a 1 544 Mbps BITS reference to the SJ300E Receiver REF CLOCK and press the EXT key light will come on In the WANDER menu enter REF SEL and select enter DS1 Enter WAND GEN select NONE and press the enter key The BITS OUT signal rear panel is now in its quiescent state before the transient Start the Wander Analyst software program as detailed in this document to monitor the trans Click on the Start button from the Upload menu choice From the SJ300E WAND GEN menu select either 1OOOTRAN for specification conformance testing or 1200TRAN to st
37. 53 CORE Figure 5 14 and Time Deviation of Filtered Network Input to SONET NEs GR 253 CORE Figure 5 15 The setup for testing conformance to requirement R5 125 is shown in Figure 3 8 The SJ300 generates a wandered DS1 reference that just meets the mask of GR 253 CORE Fig 5 15 This is used to time the SONET NE under test The OC N output from the NE is connected to the SJ300 receiver to measure its wander The wander data is uploaded to a PC to calculate TDEV First reconfigure the setup for calibration by bypassing the SONET NE under test see dashed line in Figure 2 8 After the SJ300 starts generating the wander pattern allow the system to settle for two minutes and then start a 12 000 second calibration measurement of the DS1 signal wander with the TDEV MTIE software Calculate correction factors by dividing the calibration TDEV values into the mask TDEV values in GR 253 CORE Fig 5 15 values listed in Appendix B 2 12 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Reference Now configure the setup as in Figure 2 8 with the NE under test between the SJ300 transmitter and the SJ300 receiver Have the SJ300 start the same wander pattern again allow the system to settle for two minutes and start a 12 000 second test measurement of the OC N signal wander Multiply the test TDEV values by the corresponding correction factors The results must not e
38. 7 3 section 7 2 1 1 ot PRC Output ETS DE TM 3017 3 Fig 3 MTIE 25 0 1 lt S lt 83 1000 MTIE 03S 83 lt S lt 1000 300 MTE 300 1000 lt lt 30000 MTE 0015 30000 lt S 25 0 1 1 10 83 1000 341 ot 10 MTIE SSU Output The wander at the output of a Synchronisation Supply Unit slave clock anywhere in the network must meet this mask See ETS DE TM 3017 3 section 7 2 2 10 5330 SSU Output ETS DE TM 3017 3 Fig 5 2000 MTE 25 O 1 lt S lt 25 MTIE 10S 25 lt S lt 200 MTIE 2000 200 lt 5 lt 2000 MTIE 4338 0015 2000 lt S 0 1 2 5 200 2000 10 B 6 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com MTIE SEC Output SEC Output ETS DE TM 3017 3 Fig 7 2000 MTIE 250 0 1 lt S lt 25 MTIE 1008 2 5 lt S lt 20 250 MTIE 2000 20 lt 2000 MTIE 4338 0 018 2000 lt S MTIE PDH Output PDH Output ETS DE TM 3017 3 Fig 9 2000 MTIE 732 0 1 lt SS73 732 MTE 1005 73 lt SS20 MTIE 2000 20 lt lt 2000 MTIE 4338 0015 200 lt S Appendix B TDEV MTIE SDH Standards Version 5 0 The wander at the output of a Synchronous Equipment Clock output of a SDH network element anywhere in the network must meet this mask See ETS DE TM 3017 3 section 7 2 3 104 5330 0 1 2 5 20 2000 10 The wander at the output of a PDH equipment providing a 2 Mbit s synchroni
39. 994 7 3 1 2 as follows MTIE 7 6 885 S 0 014 lt S lt 0 5 MTIE 300 300 S 0 5 lt S lt 2 33 MTIE 1000 2 33 lt S lt 280 MTIE 997 0 01 S 280s lt S Wander Analyst User Manual 2 9 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Reference 104 1000 100 10 0 01 0 1 1 10 100 1000 104 105 10 Figure 2 8 OC N Mask to use with Generating Phase Transient To be compliant the MTIE plot must be totally beneath the mask Repeat this test changing the provisioning from the DS1 Reference 1 timing to OC N line timing OC n Input To test for the last item under GR 253 CORE section 5 4 4 3 2 provision the SONET network element to be timed from the DS1 Reference 1 Set the SJ300E wander generation to NONE allow the system to settle for two minutes and start a 300 second measurement of the OC N wander After ten or twenty seconds set the SJ300E wander generation to 1OOOTRAN as listed in the procedure in this document The measurement is complete when the TIE measurement becomes stable again Compare the plot of the MTIE data with the OC N Transient mask provided by the software To be compliant the MTIE plot must be totally beneath the mask To test for a 20 margin in being compliant with the specification repeat the test using the 1200TRAN wander generation setting Synchronization Clock Transient Test There are also phase transient specifications for S
40. 997 0014S 280 lt S lt 10 300 0 01 0 1 1 10 100 280 1000 10 C 4 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Appendix C TDEV and MTIE SONET Standards Version 5 0 MTIE PRS Output The output of a Primary Reference Source or a Stratum 1 clock must meet this mask See GR 2830 CORE and T1 101 1994 Sect 6 104 1000 PRS Output T1 101 1994 Fig 4 3003 rd GR 2830 CORE 100 MTIE 10 0 29 8 0 05 lt lt 1000 p MTIE 290 0 01 S 1000 lt 5 10 1 0 01 0 1 1 10 100 1000 104 10 106 MTIE SMC Transient A SONET Minimum Clock SMC as measured at the OC N or STS N signal out of a SONET network element must meet this mask during synchronization rearrangement operations See GR 253 CORE Section 5 4 4 3 3 SMC Transient GR 253 CORE T a Fig 5 19 a MTIE 7 6 885S 0 014 lt S lt 0 5 MTIE 300 300S 0 5 lt S lt 2 33 vs MTIE 1000 2 33 lt S lt 280 20 on 0 1 05 ED 10 100 380 1000 Wander Analyst User Manual C 5 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Appendix C TDEV and MTIE SONET Standards Version 5 0 TDEV Masks SONET Equipment TDEV OC N Generation An OC N or STSX N signal out of a SONET network element must meet
41. DEV 3 2 0 1 lt 1t lt 25 TDEV 0 641 25 lt t lt 100 TDEV 6 4 100 lt t lt 1000 i 0 1 1 10 a i00 1000 SEC Tolerance ITU T Fig 6 G 813 di TDEV 12 0 1 lt t lt 7 TDEV 1 77 7 lt 7 lt 100 fo ea Cee ee TDEV 170 100 lt t lt 400 12 f 10 0 1 7 100 1000 SSU Tolerance ETS DE TM 3017 4 Fig 4 1000 TDEV 34 0 1 lt 1 lt 20 TDEV 1 71 20 lt t lt 100 TDEV 170 100 lt T lt 1000 TDEV 5 4 1 1000 lt t lt 10 SSU Transfer ETS DE TM 3017 4 Fig 7 1000 TDEV 3 0 1 lt T lt 13 3 a9 TDEV 0 0177 13 3 lt t lt 100 TDEV 170 100 lt T lt 1000 170 TDEV 5 41 1000 lt t lt 10 10 3 0 1 PRC Output ETS DE TM 3017 3 Fig 4 uae TDEV 3 0 1 lt S lt 100 TDEV 0 035 100 lt S lt 1000 TDEV 29 7 0 00035 1000 lt S lt 10 0 1 1 0 100 1000 10 10 10 A 8 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Appendix A Wander Masks Version 6 0 SSU Output ETS DE TM 3017 3 Fig 6 1 TDEV 3 0 1 lt S lt 43 TDEV 0 75S 4 3 lt S lt 100 1900 TDEV 58 1 2S 0 0003S 190 100 lt S lt 10 10 3 iit 1 4 3 10 00 000 10 10 10 4 SEC Output ETS DE TM 3017 3 Fig 8 TDEV 12 0 1 lt S lt 17 14 TDEV 0 7S 17 14 lt S lt 100 TDEV 58 1 2S 0 00038
42. E Once detection is complete the program proceeds in a normal fashion This auto detection routing is also run whenever the user performs a communications test If the attached unit is change from a CTS 850 to a SJ300E differences in the remote interface will cause an upload failure unless the auto detection procedure has run Wander Analyst User Manual 1 3 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Getting Started Changes from previous versions Specifications Conformance Tests In addition to more Mask selections the 6 0 version adds a new menu selection on TIE drift and offset graphs which permits changing of the graph cursor readout from raw seconds to a DD HH MM SS format To increase the useable range for Wander Analyst the format for TIE data storage has been changed to 8 bytes long This has two effects e Data files take twice the disk space of prior versions e TIE data files from older versions can no longer be processed directly Calculating TDEV MTIE drift and offset calculations from older versions of Wander Analyst will result in an error message See the next paragraph for a way to utilize older information To perform calculations on TIE data captured and stored with an earlier version of Wander Analyst 1 Open the DAT file from the earlier version 2 Save the file as ASCII the same file name can be used 3 Open the ASCII file Even
43. Figure 2 18 t uses a PRBS noise generator which ensures that the same wander is generated for every test so allowing calibration and normalization routines to be run and ensuring that measurements can be repeated The noise is filtered and shaped to produce the required TDEV characteristic and finally applied as clock phase modulation Clock Phase PRBS a Modulation Generator Invert every eae other bit Low pass TDEV Filter weighting filter Period gt 150 hrs Frequency spectrum Phase characteristic 0 10 Hz 1 dB TDEV t 20 Figure 2 20 Functional model of TDEV noise generator ref ETS 300 462 4 Wander Analyst User Manual 2 27 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Technical Articles Service Timing Quality Measurement When a PDH service is transported on SDH it will suffer timing impairments from pointer adjustments when it is delivered at the far end As the hybrid SDH PDH network becomes more widespread a single PDH service may cross several SDH islands picking up significant impairment Even within single networks problems have been reported when using terminals such as GSM base stations and PBX equipment and problems may be anticipated as ATM switches are rolled out Broadcast video depends on high quality timing Traditional testing has included estimation of bit and frame slips due to excessive wander on a 2 Mbit s service
44. Interval Error Related Manuals In addition to this manual you may need a copy of the e CTS 850 Test Set SDH PDH Jitter amp Wander User Manual Tektronix part number 070 9988 01 or e SJ300E SONET SDH Jitter and Wander Analyzer User s Guide Issue 1 0 July 1995 or later xii Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Getting Started Getting Started This chapter provides an overview of the Real Time Wander Analyst software It describes the hardware and software requirements the system and software installation and configuration and the menu screens Wander Analyst User Manual 1 1 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Getting Started Real Time Wander Analyst Software Program Overview Real Time Wander Analyst software works in conjunction with the Tektronix CTS 850 or SJ300E test sets The software provides full wander TIE MTIE and TDEV analysis according to the most recent ITU T ETSI ANSI and Bellcore standards The Windows compatible PC software uploads TIE wander measurement data from the test set at a sampling rate of 50 Hz in accordance with ITU T and ETSI requirements stores the data at a rate of 50 1 or 0 1 Hz selectable and simultaneously calculates MTIE and TDEV using efficient algorithms In addition to the ITU T and European ETSI specificati
45. M SS 1 16 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Operating Basics Calibration TDEV Calibration is used only for TDEV data as it relates to a Wander Transfer measurement Any transfer measurement has two masks an input and an output mask No system can generate a perfect input mask So the Wander Analyst software permits the test unit to measure its own wander transfer input and calibrate the measured result to the input mask specified in the standards Now when the user performs the actual wander transfer test the measured wander transfer is adjusted to account for the imperfections of the transfer input signal The Wander Analyst software will display the actual transfer test results in green and the adjusted transfer test results in magenta Copy to Clipboard The Clipboard is a temporary storage area for text and graphics that you are copying or moving from one location to another Invert Colors This choice permits printing the charts and graphs in black amp white Instead of a black background the background is white and the grid lines and the plots are in black Wander Analyst User Manual 1 17 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Operating Basics Mask Menu The Mask menu presents a list of masks that can be displayed for comparison with the current gra
46. ONET clocks BITS clocks for example as specified in Bellcore TR NWT 001244 section 4 4 which reads as follows For all clocks in NEs which support the external timing mode the clock shall tolerate i e must give no indication of improper operation phase transients having any MTIE up to 1 20 milliseconds and any TIE discontinuity up to 100 nanoseconds for any measurement period up to 1 326 milliseconds The setup for testing conformance to the clock phase transient criteria is shown in Figure 2 7 Follow the setup instructions earlier in this chapter for basic synchronization reference wander measurement The steps to perform the phase transient tests also appear earlier in this chapter The measures of proper operation are currently under study by Bellcore In the interim the user might use the same transient stress 1000 ns rather than 1200 ns and the same mask GR 253 Fig 5 18 as for the OC N transient test This mask is reproduced as Figure 2 6 2 10 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Reference Set the SJ300E wander generation to NONE allow the system to settle for two minutes and start a 300 second measurement of the DS1 wander After ten or twenty seconds set the SJ300E wander generation to 1OOOTRAN and press the ENTER key The measurement is complete when the TIE measurement becomes stable again Compare a plot of
47. Program made by Customer must include a reproduction of any copyright notice or restrictive rights legend appearing in or on the copy of the Program as received from Tektronix The Customer may not a Transfer the Program to any person or organization outside of Customer or the corporation of which Customer is a part without the prior written consent of Tektronix b Export or re export directly or indirectly the program any associated documentation or the direct product thereof to any country to which such export or re export is restricted by law or regulation of the United States or any foreign government having jurisdiction without the prior authorization if required of the Office of Export Administration Department of Commerce Washington D C and the corresponding agency of such foreign government c For object code Programs only reverse compile or disassemble the Program for any purpose or d Copy the documentation accompanying the Program For Programs designed to reside on a single machine and support one or more additional machines either locally or remotely without permitting the Program to be transferred to an additional machine for local execution the additional machines shall be considered within the definition of single machine For iv Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com programs permitting the Program to be
48. RCE www artisantg com Operating Basics SONET Sync Network ANSI T1 105 03 DS1 Mapping DS1 Single VT Pointer DS1 Periodic VT Pointer DS3 Mapping DS3 Single STS Pointer DS3 Burst of 3 Pointer DS3 Transient Pointer Burst DS Periodic STS Pointer SONET Sync Network ANSI T1 105 09 SMC Input amp Output SMC Holdover Entry DS3 Metallic Interface T1 404 DS3 Interface HDSL Network ETS 152 Output Wander Wander Analyst User Manual 1 21 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Operating Basics Process Data Menu File Communication Upload Plot Mask PROCESS DATA Help Calculate TDEV and MTIE Remove Offset Calc Frequency Offset and Drift Calculate Drift and Offset Sliding Window Frequency Offset Sliding Window Fregency Drift Select Range a2 4 F 4 gt Window Width OK The following choices are available from the Process Data selection in the top menu bar Calculate TDEV Calculate and write to disk TDEV and MTIE data for the currently and MTIE displayed TIE file Remove Offset Removes average frequency offset from TIE data Wander measurements can be taken with a signal under test compared with a reference That reference must be autonomous not derived from signal under test and it must be virtually the same frequency 0 00001 ppm as the signal under test When
49. Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Technical Articles Jitter Wander Test Equipment Operation Figure 2 13 shows the simplified principle of operation of a conventional test set the various blocks are described in the following section on Jitter Measurement and also in a later section on Wander Measurement Jitter Measurement Filters band pass Signal Clock Phase Input Recovery Detector Wander Anti alias Filter low pass Reference Clock PLL ve ADC Measurement External Processing i o i Ulpp Ulrms TIE ns ior wander Figure 2 15 Simplified block diagram of jitter wander test set measurement functions Jitter Measurement and Analysis Reference Clock The reference clock is normally taken from the input signal itself using a PLL timing recovery function The loop bandwidth must be lower than the lowest jitter frequency to be measured i e the reference clock must not track jitter frequencies to be observed in the test signal Conventionally a 2 to 10 Hz loop bandwidth is used but new digital technology can easily extend this to 1 or even 0 1 Hz This allows new measurements of low frequency phase transients caused by pointer justifications The recovered reference clock is used to demodulate any phase variation of the signal under test this signal is filtered digitized and made available for further processing 2 20 Wander Analyst User Manua
50. ance ETS DE TM 3017 4 Fig 5 104 MTE 750 O 1 lt S lt 75 5000 MTIE 1008 715 lt S lt 20 2000 MTIE 2000 20 lt S lt 400 750 MTIE 5S 400 lt S lt 1000 MTE 5000 1000 lt S lt 10 Ito 1001 1 75 20 100 4001000 10t Wander Analyst User Manual B 3 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Appendix B TDEV MTIE SDH Standards Version 5 0 MTIE SSU Generation The wander at the output of a Synchronisation Supply Unit must meet this mask when the reference to the SSU is ideal at least 10 times more stable than the output requirements See ETS DE TM 3017 4 section 6 1 1000 SSU Generation ETS DE TM 3017 4 Fig 2 MTE 24 0 1 lt S lt 9 MTE 8 55 9 lt lt 400 MTIE 160 400 lt S lt 1000 0 1 9 400 1000 MTIE SEC Holdover When a Synchronous Equipment Clock enters holdover the transient during the first 64 seconds shall have an MTIE relative to the wanderless input that meets this mask See ITU G 813 Sect 10 2b 104 AOBA e cel ea e a ha SEC Holdover ITU G 813 Fig 15 ne MTIE 7 6 8858 0 014 lt S lt 05 MTIE 300 3005 05 lt S lt 233 i re MTIE 884 50S 2 33 lt S lt 64 100 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Appendix B TDEV MTIE SDH Standards Version 5 0 MTIE SEC Transient
51. anual v Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com vi within a reasonable time thereafter Customer may terminate the license for the Program and return the Program and any associated materials for credit or refund This warranty is given by Tektronix with respect to the program in lieu of any other warranties express or implied Tektronix and its vendors disclaim any implied warranties of merchantability or fitness for a particular purpose Tektronix s responsibility to replace defective media or refund customer s payment is the sole and exclusive remedy provided to the customer for breach of this warranty Limitation of liability in no event shall Tektronix or others from whom Tektronix has obtained a licensing right be liable for any indirect special incidental or consequential damages arising out of or connected with customer s possession or use of the program even if Tektronix or such others has advance notice of the possibility of such damages THIRD PARTY DISCLAIMER Except as expressly agreed otherwise third parties from whom Tektronix may have obtained a licensing right do not warrant the program do not assume any liability with respect to its use and do not undertake to furnish any support or information relating thereto GENERAL This Agreement contains the entire agreement between the parties with respect to the use reproduction and transfer of the Program
52. apability To remove an earlier release of software use File Manager to delete directories and Program Manager to delete Program Item and Program Group Wander Analyst User Manual 1 7 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Operating Basics Program Configuration Port Configuration RS 232C Port Setup GPIB Port Setup Before running Wander Analyst for the first time it must be configured for your PC The configuration will be saved and used each time the Wander Analyst program is run Make choices from the menu bar at the top of the main Wander Analyst screen 1 Select screen monitor choices output device printer and set preferences 2 Exit the screen after making choices and setting preferences For the Wander Analyst program to upload data the communication ports and program must be properly configured and connected If the SJ300E indicates setup problems on the front panel or no readings are displayed the SJ300E may be unable to send data to the program and could abort the uploading process Either the RS 232C or GPIB interface can be used as follows 1 Using a straight through cable connect the CTS 850 or SJ300E RS 232C port on the back panel to either COM1 COM2 COM3 or COM4 on the Personal Computer PC Wander Analyst may be configured for any listed PC communication port 2 On the CTS850 or SJ300E and the Personal Computer PC configure th
53. available from the Plot selection in the top menu bar Scaling Scaling is used for MTIE and TDEV data If you load a file instead of uploading directly from the test unit then you will need to calculate TDEV and MTIE by selecting Process Data Calculate TDEV and MTIE AUTO scaling is the default and informs the software to adjust the graphical display scale to fit all the data FIXED scaling is based on the scale specified in the standards USER DEFINED scaling permits the user to select the scale to be used Display Mode The SJ300E or CTS850 samples data at 50 samples per second TIE The Wander Analyst software can store all of those data points Drift DET data storage intervals 20 msec or it can store one point for every fifty samples by averaging the data points data storage Offset OFF interval 1 sec The high and low values can be displayed graphically by selecting Plot Display Mode Hi Low instead of Sample The Storage Interval can also be 10 seconds The data loading process looks at how many samples are in the file then if SAMPLE display mode has been chosen the data loading process reads a sample and skips some reads another sample and skips some more If HI LOW mode has been chosen the data loading process reads all the data and plots High and Low points from the interval Cursor Position Change the graph cursor readout from raw seconds to a DD HH MM SS format Choices Raw seconds or HH M
54. axis Time displayed on the graph The cursors define the upper and lower boundaries of the TIE data to be expanded The Zoom In button changes the graph on screen to view that time interval Zoom Out backs out the Zoomed In screen The Full button returns the screen to the original graph Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Reference Reference This chapter details the theory functions and applications of Jitter Wander and Phase Transient measurement It includes the definitions and specifications Most of the material in this Reference chapter of the combined Wander Analyst for SJ300E and CTS 850 user manual is specific to the SJZ00E Reference information that applies only to the CTS 850 is still under development It will be published in the future Also included is two technical articles on Jitter and Wander The first article beginning on page 2 16 is What are the consequences of Jitter amp Wander in the Network This material comes from the Timing amp Synchronization Primer 4 97 prepared by Mark Lum and Dr Dan Wolaver of Tektronix Starting on page 2 32 is a second article a tutorial on the Principles and Metrics of Jitter amp Wander Wander Analyst User Manual 2 1 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Reference Wander Test Functions The Wand
55. by the maximum positive and negative offsets allowed in addition to generating jitter This could be considered to be a worst case test For reference the relevant offsets from G 703 and G 813 are summarized in Table 3 Table 2 3 Maximum frequency offset ata Rate Mbit s Frequency Offset PPM 2488 Wander Analyst User Manual 2 23 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Technical Articles Wander Measurement and Analysis Refer to the previous Figure 2 13 for the simplified block diagram of jitter wander test set measurement functions The reference clock is normally taken from a signal external to the test set since it is not possible at least in a practical way to recover a suitable reference clock from the incoming signal within a test set This would normally be a portable cesium based clock or a filtered GPS derived clock It is not good practice to use a locally available network clock since that may be the cause of the very problem you are trying to diagnose or the characteristic you are trying to measure Having obtained a reference clock time interval measurements are made to determine the phase error of the signal under test This information is made available for further processing Measurement Bandwidth A 10Hz low pass filter is specified and required in order to ensure accurate measurements of wander without adding aliased components from jitter
56. cation of improper operation wander at its input that has TDEV of this mask See ETS DE TM 3017 4 section 7 2 TDEV SSU Transfer The wander at the output of a Synchronisation Supply Unit must meet this mask when the reference to the SSU has TDEV equal to the SSU Tolerance mask See ETS DE TM 3017 4 section 8 TDEV PRC Output The wander at the output of a Primary Reference Clock must meet this mask See ETS DE TM 3017 3 section 7 2 1 Wander Analyst User Manual A 13 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Appendix A Wander Masks Version 6 0 TDEV SSU Output The wander at the output of a Synchronisation Supply Unit slave clock anywhere in the network must meet this mask See ETS DE TM 3017 3 section 7 2 2 TDEV SEC Output The wander at the output of a Synchronous Equipment Clock output of a SDH network element anywhere in the network must meet this mask See ETS DE TM 3017 3 section 7 2 3 TDEV PDH Output The wander at the output of a PDH equipment providing a 2 Mbit s synchronisation signal anywhere in the network must meet this mask See ETS DE TM 3017 3 section 7 2 4 TDEV PRC Generaton The wander at the output of a Primary Reference Clock providing a 2 Mbit s synchronisation signal must meet this mask The reference used in making this measurement must be more stable than the requirements of the mask See ETS DE TM 3017 6 section 5
57. click the Start Upload key on the user interface to began the data upload The Wander Analyst program will check to ensure it is not overwriting existing data and display a summary panel of the upload file configuration e After starting the data upload a communication setup error a SJ300E problem or a CTS 850 problem can terminate the program Wander Analyst should report the error or problem that may have occurred e The upload may be manually stopped at any time by clicking the Cancel Upload key with the left mouse button That key is in the same location as the Start Upload key in the program status and control area After the first ten seconds of uploading the TIE MTIE and TDEV data is displayed on the screen That data can be monitored for obvious problems and testing terminated before hours of collecting data The real time TIE MTIE TDEV data display will be updated at approximately ten second intervals throughout the upload The Elapsed Time indicator display is also updated during the upload indicating that the system is running Completion of the upload is determined by the number of samples loaded NOTE The start and end times appearing on the real time display may not always be on even multiples of ten seconds This occurs because the priority is given to the upload and calculation processes over the display process When the data upload is complete a summary will be displayed It includes the number of data points loade
58. d and time that the upload terminated Click OK to accept the summary When the summary is accepted the TIE data for the full upload is displayed and the TDEV and MTIE plot files are written to the disk Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Operating Basics Graphic Displays The Wander Analyst software program generates four files one data and three plot files The data file contains the raw data that is used to generate all of the plot files Table 1 describes all four files Table 1 Data and Plot files File Use Type Description O O Z o Z i y O O O O Plot files TDEV TDV TDV is calculated from DAT and can be MTIE MTI plotted Drift DFT MTI is calculated from DAT and can be Offset OFF plotted Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Operating Basics Plot Menu File Communication Upload PLOT Mask Process Data Help Scaling Display Mode P Hi Low Sample TDEY Calibration PEN Cursor Position Copy to Clipboard Enable Calibration Use Current File and Mask for Calibration Active Calibration Settings Calibration Data File Standard Used for Calibration Mask Used for Calibration Cancel The following choices are
59. data acquisition or post acquisition TIE display sample or hi lo envelope Frequency offset and drift rate in accordance with ANSI T1 101 over a fixed or sliding window with user definable bandwidth Remove frequency offset Graph scaling automatic or manual with zoom cursors Documentation print clipboard copy Wander Analyst User Manual 1 5 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Getting Started SDH SONET Analyzer Hardware Requirements CTS 850 Option 14 Jitter amp Wander Generator Analyzer must be installed in the CTS850 Option 38 must be installed for E1 E3 E4 Wander Testing Option 04 05 or 06 O E modules must be installed for 622 Mbit s Wander Testing Software version 2 18 or higher in the CTS 850 required Either the RS 232C or the GPIB port on the rear panel of the CTS 850 can be used to communicate with the PC An RS 232C full modem cable or a IEEE 488 GPIB cable that can interconnect the CTS 850 and the PC is also required but not supplied with the option To measure wander at line rates use the regular connections on the front panel of the CTS 850 SJ300E The Wander Test Option must be factory installed in the SJ300E Jitter and Wander Analyzer For the SJ300E the option includes two BNC connectors on the rear panel of the SJ300E One marked BITS SETS IN and the other marked BITS SETS OUT Either the RS 232C or the GPIB port already on
60. dization programs and was recently appointed ITU T Reporter for SDH and PDH jitter wander test equipment He is an active contributor on broadband network performance and SDH ATM test equipment issues Wander Analyst User Manual 2 29 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Technical Articles ITU T Recommendations Internet http www itu ch G 811 Timing characteristics of primary reference clocks Timing requirements at the outputs of slave clocks suitable for plesiochronous operation of international digital links 2048kbit s hierarchy 1544kbit s hierarchy Timing jitter and wander measuring equipment for digital systems which are based on the PDH O 17s draft Jitter and wander measuring equipment for digital systems which are based on the SDH ETSI Standards Internet http www etsi fr 4 SDH path layer functions gt S i O 6 Synchronisation distribution function Synchronisation network architecture The control of jitter and wander within synchronisation networks Timing characteristics of slave clocks suitable for synchronisation supply to SDH and PDH equipment Timing characteristics of slave clocks suitable for operation in SDH equipment 6 O Timing characteristics of primary reference clocks Definitions and terminology for synchronisation networks 2 30 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation
61. e RS 232C and COM ports On the CTS850 or SJ300E select RS 232C from the appropriate menus and set the following e Data Transfers to 9600 baud even parity 8 bit character size e End Of Line EOL to CR LF e XON XOFF flow control to OFF The Wander Analyst program must also be configured for either COM1 COM2 COM3 or COM4 through the Port Setup selection from the Communication pull down menu explained in the Communication Port Setup section of this chapter 1 Connect a standard IEEE 488 GPIB cable between the CTS850 or SJ300E GPIB port and the GPIB PCII IIA connector on the PC 2 The GPIB setup on the CTS850 or SJ300E should be set to match the Wander Analyst GPIB address The Terminator should be set to End Or Identify EOD Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Operating Basics Program Startup Wander Analyst Program Startup Version 6 0 of the Wander Analyst software supports both the CTS 850 and the SJ300E To support both systems the Wander Analyst software at the first time communications with a test set is established will try to determine the type of device it is connected to When the program is started or after the communications settings have changed beginning a data upload will display a status screen indicating that the Wander Analyst software is auto detecting the attached device CTS 850 or SJ300E Once det
62. e duplication or disclosure by the Government is subject to restrictions as set forth in subparagraph c 1 4i of the Rights in Technical Data and Computer Software clause at DFARS 252 227 7013 or subparagraphs c 1 and 2 of the Commercial Computer Software Restricted Rights clause at FAR 52 227 19 as applicable Tektronix products are covered by U S and foreign patents issued and pending Information in this publication supersedes that in all previously published material Specifications and price change privileges reserved Printed in the U S A Tektronix Inc P O Box 1000 Wilsonville OR 97070 1000 TEKTRONIX and TEK are registered trademarks of Tektronix Inc LabView is a registered trademark of National Instrument Inc Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com WARRANTY Tektronix warrants that this product will be free from defects in materials and workmanship for a period of one 1 year from the date of shipment If any such product proves defective during this warranty period Tektronix at its option either will repair the defective product without charge for parts and labor or will provide a replacement in exchange for the defective product In order to obtain service under this warranty Customer must notify Tektronix of the defect before the expiration of the warranty period and make suitable arrangements for the perfor
63. e Computer Software and Hardware The manual is divided into three sections Getting Started Reference and Appendices Getting Started discusses the hardware requirements for either the CTS 850 SDH Generator Analyzer with Option 14 Jitter Generator Analyzer or the SJ300E SONET SDH Jitter and Wander Analyzer and your Personal Computer PC It details the installation and configuration of the complete This chapter provides all of the basic information needed to begin using the Real Time Wander Analyst system Reference details the theory functions and applications of Jitter Wander and Phase Transient measurement It includes the definitions and specifications This chapter also includes two technical articles explaining Jitter amp Wander The Appendices detail the following e Appendix A Wander Masks Version 6 0 e Appendix B Time Deviation TDEV and Maximum Time Interval Error MTIE standards for the North American Continent Version 5 0 e Appendix C Time Deviation TDEV and Maximum Time Interval Error MTIE standards for the STM and the 2 048 Mb s Hierarchy Version 5 0 Wander Analyst User Manual xi Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Conventions The manual uses the following conventions e TIE is an acronym for the words Time Interval Error e TDEV is acronym for the words Time Deviation e MTIEis an acronym for the words Maximum Time
64. ection is complete the program proceeds in a normal fashion This auto detection routing is also run whenever the user performs a communications test If the attached unit is change from a CTS 850 to a SJ300E differences in the remote interface will cause an upload failure unless the auto detection procedure has run During startup the Wander Analyst program looks at all available disk drives on the system If a removable disk drive such as a CD ROM drive has no disk in it the system will indicate that a problem is present and ask the user to choose between Abort Retry Fail Selecting Fail will allow the program to continue When the program starts the Wander Analyst screen will be displayed for a few seconds then the run screen will come up Next it will plot the default TIE data stored in the file WANDER DAT if it exists otherwise the graph will be blank Wander Analyst User Manual 1 9 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Operating Basics Program First Start The first time the program is run the graph may be blank or contain erroneous data until the full path name of the upload file is set or verified The Upload Filename command under the Upload pull down menu is used to select the drive directory and file name as described in the Upload Data Setup section of this chapter Pull down Men
65. eeeeseeeeeeeeeeeeeeeeneees 2 17 Video Transport in Broadband Networks cccceeeceeeeeeteeeeeeeeeeeeeeenaaees 2 17 Consequences of Jitter amp Wander in the Network ccceeeeeeeeeeees 2 18 Testing for Jitter and Wander ccccceeeeeeeeeeeseeeeeeeeeeeteeeeeaaeeeeeeeeeeeeeas 2 19 Principles amp Metrics of Jitter and Wander eeeeeeeeeteeeeeeeeeeeeeeeetneeeeeeeees 2 32 Wander Masks Version 6 0 cccccceeeeeeeeeeeeeeeeeeeeeeeeeeeeeeeeeeeeeeeeeeeeeeeees A 1 TDEV and MTIE SONET standards Version 5 0 cssssssssseeeeeeees B 1 TDEV and MTIE SDH standards Version 5 0 csscsssesseeeeeeeeeeees C 1 PEWS E E E E E Index 1 x Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Preface This manual describes how to use the Real Time Wander Analyst software This manual is intended for telecommunications engineers and technicians with more than two years experience with SONET or SDH networks This manual supports the Real Time Wander Analyst software version 6 0 The diskette s containing this software are available as Tektronix part number 063 3196 00 How this Manual is Organized The document covers the Real Time Wander Analyst software and applications The complete analytical system includes e The Real Time Wander Analyst software program e SDH SONET Analyzer with the Wander Test Option
66. either become empty too little data being received or overflow too much data causing frame slips data loss or data repetition resulting in SES and other defects Particularly at low jitter frequencies jitter amplitude can become extremely large and is theoretically unbounded The consequences of interconnecting and meshing new synchronous networks together is still largely uncharacterized e If the SDH transport is carrying a coded analogue signal degradation will occur when the analogue signal is reconstructed after it has been demapped from the SDH payload Jitter on the output digital signal directly causes unwanted phase modulation of the analogue signal This is not normally a problem with voice and data services but can be a significant degradation for digitized TV signals which depend on maintaining good low frequency phase information within tight specifications e In new hybrid SDH PDH networks a major cause of payload jitter is upstream wander as the following graphic illustrates Line vs Ref Pointer Payload s FIFO 5 Wander gt Adj gt Jitter SES Slips This is a new type of interaction that can be difficult to characterize since the point in the network where wander is introduced can be quite separate from the point at which its effects are felt 2 18 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Technical Articles T
67. eneration Wander Tolerance Wander Transfer Stratum 2 amp 3E Wander Transfer Stratum 3 Phase Transient SEC ITU T G 813 Opt 1 ETS 300 462 5 Wander Generation Wander Gen Var Temp Wander Tolerance Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Operating Basics Transient Response SEC ITU T G 813 Opt 2 Wander Generation Wander Tolerance Noise Transfer Transient Response Holdover Response SMC GR 253 CORE Wander Generation Derived DS1 Output Filtered Sync Interface Wander Transfer Phase Transient Holdover Entry DS1 Mapping DS1 Single VT Pointer DS1 Periodic VT Pointer SDH amp PDH Sync Network ETS 300 462 3 PRC Output SSU Output SEC Output PDH Output SDH amp PDH Transport Network ETSI DEN TM 3067 2 Mbit s Output Wander async 2 Mbit s Output Wander sync 34 Mbit s Output Wander async 34 Mbit s Output Wander sync 140 Mbit s Output Wander async 140 Mbit s Output Wander sync SONET Sync Network ANSI 11 101 PRS Output OC N Interface OC N Transient DS1 Interface DS1 Transient Stratum 3 DS1 Transient Stratum 3 OC N Transient Stratum 3 Wander Transfer Stratum 2 amp 3E Wander Transfer Stratum 2 Holdover Entry 1 20 Artisan Technology Group Quality Instrumentation Wander Analyst User Manual Guaranteed 888 88 SOU
68. equipment TENS OF THOUSANDS OF at our full service in house repair center We also offer credit for buy backs and trade ins IN STOCK ITEMS www artisantg com WeBuyEquipment 7 EQUIPMENT DEMOS HUNDREDS OF InstraV ea REMOTE INSPECTION LOOKING FOR MORE INFORMATION MANUFACTURERS Remotely inspect equipment before purchasing with Visit us on the web at www artisantg com 7 for more our interactive website at www instraview com information on price quotations drivers technical LEASING MONTHLY specifications manuals and documentation RENTALS ITAR CERTIFIED D a gaa tia Contact us 888 88 SOURCE sales artisantg com www artisantg com
69. er Test functions are e Generate Wander and Jitter References e Measure DS1 Wander Relative to a Reference e Measure SONET SDH Wander Relative to a Reference e Calculate TDEV e Calculate MTIE Generate Wander and Jitter References When it is equipped with the Wander Test Option the SJ300E or CTS 850 can emulate the wander and jitter signals that occur in synchronized digital communication networks and network components Altogether four modulating signals can be generated Three for wander below 10 Hz and one for jitter above 10 Hz Figure 2 1 characterize the wander signal test requirements These wander masks are selected by setting the wander generation to DS1 for mask 1 DS1 FILT for mask 2 or OCN MASK for mask 3 They are used to see if the measured data conforms to the Bellcore and ANSI standards TDEV ns 1000 30 Integration Time t s Figure 2 3 TDEV signals and Wander Masks Pure Clock Signal 2 2 The Wander Test Function generates a DSI 1 544Mbps 2Mbps or 2MHz reference with wander or jitter when it is provided with a pure reference signal from a Stratum 1 cesium based GPS Global Position System or LORAN based clock refer to Bellcore GR 1244 CORE The pure reference is connected to the EXT REF external reference port through a balanced 100 ohm or an unbalanced 75 ohm input If the pure signal is not applied a NEED EXT REF error message is displayed The impure DS1 1 544Mbps 2Mbps or
70. er second rate A 72 hour test session at fifty samples per second will require almost 112 megabytes of disk storage space 1 6 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Operating Basics This section provides all of the basic information needed to begin using the Real Time Wander Analyst system It focuses on using a mouse to access the options provided by the pull down menus Software Installation Distribution Diskette Contents The program distribution diskette contains the following source files e SETUP EXE Self extracting Install file e WANDER 1 001 WANDER 2 002 Compressed program files e README IST Instructions for extracting and configuring the program Installation Procedure 1 Put the Wander Analyst program diskette into the diskette drive 2 From the Windows Explorer Win95 Run the file SETUP EXE This install program will prompt the user for which subdirectories to place the files The install program will also create the appropriate Program icons and Program shortcuts This install will unpack the following files FileName FileUse _ o Release Directories Program Group Program Item eee of icon 6 0 Tek WA6 32 WA6 32 Wander Analyst so ore To TD2 Wander Analyst 2 WANDER Tektronix Wander Analyst CVIRTE TD CVIRT TDEV MTIE for TDEV MTIE for Windows Windows Releases 6 0 5 0 and 4 x have uninstall c
71. ereberrsartebimeoreseeweiade 1 2 Program Overview 2 iciunasvinsesdiuiecentsvenneidesberectsesneds inate pbnecebexeraivaansnsaseuencs 1 2 Changes from Previous VersiOns cccceeeeeeeeeeseeeeeeeeeeeeeeeeeesaaaees 1 4 Specifications erede eee eee ee 1 4 SDH SONET Analyzer Hardware Requirement eceeeeeeeeeeeeeeneees 1 6 Personal Computer Hardware Requirement ccccceeeeeeeeeeeeneeeeeeees 1 6 Operating ASS sce at ceca dee ea aaee ciel ace eee eect EE 1 7 Software INS Tel ON catia dn cinatbaeateacnrs oie ticawttnie dam Gant aee tees acMenetnandeames 1 7 Distribution Diskette Content ccccceeeeeeeeeneeeeeeeeeeeeeccaaeeeeeeeeeteeenaaaes 1 7 Installation Procedure cccceeccececeeeeeeeeeeeeeeeecaaeeeeeeeeeeteccaaeeeeeeeeeeeeenaaaes 1 7 Program Configuration 0 ccccccccccccecceeeeeeeeeeeeccaneeeeeeeeeeeecccieeeeeeeeeeeeenaaaes 1 8 Port Configuratio Masdan danaa aa aaa a aaa aaa 1 8 RS 232 Port SOUP ssicsesesseecticethassiecteacticettastioatiactteattasthestiageiactiesttastlaatindes 1 8 GPIB POM SClUp eona AERE 1 8 Pro ogr m StartUp oeeie eni rn Eaa EENE EEEn EEEREN ERS 1 9 Wander Analyst Program Startup ccceccceeeeeeeeeeeeeeeccneeeeeeeeeeeeeesaeeeeeees 1 9 Program First Start cccccceeeeecceccceeee sees ee eeeecceeeeeeeeeeeecccaeeeeeeeeeeeeenaaes 1 10 File Sel SCHON siinutienesieihataeread er a r r S 1 11 Communication Selection ceeeeeeeeesesessssesse
72. esting for Jitter and Wander This section describes the various measurement techniques and test methodologies used when assessing jitter and wander performance Traditional Jitter Tests Jitter testing has been an established part of the telecoms industry for a long time and several tests are popular and well known from their previous use in PDH systems e Output Jitter e Input Jitter Tolerance e Jitter Transfer Function e Interface Jitter New Jitter Tests Several new jitter tests required for SDH systems are providing new challenges for test equipment These new sources of jitter are so significant that 50 of the allowed jitter at a demultiplexer PDH output is allocated to them e Pointer Jitter e Mapping Jitter Pointer jitter is considered to be a more significant source of timing impairment than mapping jitter New Wander Tests New wander tests are rapidly increasing in importance as SDH is more widely deployed e Output Wander e Input Wander Tolerance e Wander Noise Transfer e Phase Transient Response e Holdover Performance New Service Quality Tests A new breed of service oriented measurement is making an appearance Network specifications are service independent by definition but some services require a more stringent timing performance and may be specified using different parameters one example is digital video where the user needs to test the Video Timing Quality Wander Analyst User Manual 2 19 Artisan
73. etwork element must meet this mask Implied by GR 253 CORE 5 4 4 2 4 TDEV Derived DS1 The DS1 timing reference derived by a SONET network element from an OC N signal must meet this mask See GR 253 CORE 5 4 5 1 TDEV Stratum 2 amp 3E The output of a Stratum 2 or Stratum 3E clock must meet this mask when its input meets the DS1 Interface TDEV mask See GR 1244 CORE R5 6 Wander Analyst User Manual A 11 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Appendix A Wander Masks Version 6 0 Where Masks Apply SDH MTIE SEC Generation When the Synchronous Equipment Clock is slaved to a wanderless timing source the wander at output of the host SDH network element must meet this mask The test is to be performed over the temperature range specified for the equeipment See ITU T Recommendation G 813 section 7 1 MTIE SEC Gen Const Temp When the Synchronous Equipment Clock is slaved to a wanderless timing source the wander at output host SDH network element must meet this mask This test is to be performed at a constant temperature 1 K See ITU T Recommendation G 813 section 7 1 MTIE SEC Tolerance An SEC slaved to a timing source must tolerate wander on that source that in the worst case just meets this mask See ITU T Recommendation G 813 section 8 1 Tolerate means e Maintaining the clock within prescribed performance limits The exact
74. formance This measurement may be correlated with payload Video Timing Quality 2 28 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Technical Articles Phase Transient Characterization Using the full band measurement filters and a traditional analogue demodulated phase output the phase behavior of PDH services can be evaluated in new ways particularly useful for system diagnostics ek HOA 500 S s I 111 Acqs F 5 00MV M 100ms Chi Y 5 8mV 26 Aug 1996 17 06 22 Figure 2 21 Phase transient demodulated from test set The example output of Figure 2 19 shows a large phase transient due to pointer justification and two smaller transients due to the mapping process The vertical scaling is 1 UI div the horizontal scaling is 100ms div Author Acknowledgments Dan H Wolaver PhD Dan is a Tektronix Fellow working at Tektronix s Broadband Network Test product line in Chelmsford MA USA Author of Phase Locked Loop Circuit Design and Electrical Engineering for All Engineers he is an acknowledged expert in the timing and synchronization field and represents Tektronix on several ANSI and IEEE committees He has been involved with many aspects of SONET and SDH test and measurement technology Mark J Lum MA MSc Mark is European Telecoms Market Development Manager based in Marlow UK He manages Tektronix ITU and ETSI standar
75. ible to compute MTIE and TDEV during the wander measurement saving a considerable time of post acquisition processing Measurement Period To obtain accurate and useful measurements an extended measurement period may be needed often over several days or even weeks To obtain accurate TDEV results we recommend that a measurement period T of greater than 12T be used where Tt is the maximum observation interval needed As an example from G 813 to measure the value of TDEV for t 1000sec a measurement period of T 12 000sec about 3 3 hours is recommended Wander Generation and Modulation Wander Modulation Sine Sinewave modulation could be considered as a simple extension of the standard jitter test signal except that it is of a lower frequency down to 12 uHz or less However there are several factors which mean that sinewaves are becoming less useful for testing synchronization performance e Due to the low frequencies involved tests over a range of frequencies can take a considerable time to complete e Noise like signals are useful for testing clock holdover performance and other clock memory dependent tests e New implementations of clocks may not perform correctly when presented with large amplitude sinewave wander modulation e Finally new wander specifications from ITU T and ETSI are using noise specifications rather than sinewave Let s look at this new noise modulation Wander Modulation Noise The objec
76. if the file name is re used the file open command needs to be performed 4 Save the file as binary Again the same name can be used MTIE and or TDEV SDH specification limit masks according to Primary Reference Clock PRC ITU T G 811 and ETS 300 462 6 PRS GR 2830 CORE Wander generation Slave Clocks SSU ITU T G 812 Type I ETS 300 462 4 Clock ITU T G 812 Type II Type HI Clock ITU T G 812 Type IV Clock ITU T G 812 Type V Type VI Clock GR 1244 CORE Wander generation Wander tolerance Noise transfer Transient response Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Getting Started SDH SONET Equipment Clock SEC ITU T G 813 Opt 1 ETS 300 462 5 SEC ITU T G 813 Opt 2 SMC GR 253 CORE Wander generation Wander tolerance Noise transfer Transient response Holdover response Real Time Wander Analyst Software Test Set Requirements CTS850 Opt 14 or SJZ00E Opt 06 must be installed Recommended PC Requirements Processor Pentium 90 MHz or faster Operating system Windows 95 Memory 16 MB minimum Hard drive 3 0 MB to load program plus free space for data storage TIE Data Acquisition and Storage Using RS 232 or GPIB interfaces 50 Hz rate 1 4 Mbyte hour 1 Hz rate 28 8 Kbyte hour 0 1 Hz rate 2 88 Kbyte hour Measurement duration 1 to 9 9x10 sec Software Processing Functions MTIE and TDEV calculation done during TIE
77. ifications hardware and software by expert application engineers For Applications Support call the Customer Support Center listed below Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com viii U S A Africa Asia Australia Central amp South America Japan Tektronix Inc P O Box 500 Beaverton Oregon 97077 0001 For additional literature or the address and phone number of the Tektronix Sales Office or Representative nearest you contact 800 426 2200 Belgium Brussels Phone 32 2 725 96 10 Fax 32 2 725 99 53 Canada Calgary Phone 403 274 2691 Fax 403 274 3483 Denmark Copenhagen Phone 45 44 850 700 Fax 45 44 850 701 Eastern Europe Middle East and Austria Tektronix Ges m b H Triester Strasse 14 A 2351 Wiener Neudorf Austria Phone 43 2236 8092 0 Fax 43 2236 8092 200 Finland Helsinki Phone 358 4783 400 Fax 358 47834 200 France and North Africa Tektronix S A ZAC Courtaboeuf 4 Av du Canada B P 13 91941 Les Ulis Cedex France Phone 33 1 69 86 81 81 Fax 33 1 69 07 09 37 Germany Cologne Phone 49 221 94770 Fax 49 221 9477 200 Italy Milan Phone 39 2 25 0861 Fax 39 2 25 086 400 Japan Tokyo Phone 81 3 3448 3111 Fax 81 3 3444 3661 The Netherlands Hoofddorp Phone 31 23 069 5555 Fax 31 23 569 5500 Norway Oslo Phone 47 22 07 0700 Fax 47 22 07 0707 Spain Madrid Phone 34 1 372 600
78. ing more widely recognized as new networks continue their expansion The figure on the right illustrates a simple SDH PDH network model A PDH circuit is transported over an SDH path while being multiplexed with other PDH circuits cross connected with other SDH payloads and regenerated The model network is synchronized from a logically separate sync network although it is likely that sync signals will be physically carried on parts of the SDH network In a synchronous network such as the SDH the timing of a data signal leaving equipment is not necessarily derived from the data entering the equipment Referring to this figure the middle cross connect SDH XCONN takes several AU 4 payloads from its inputs and generates a new aggregate output signal The timing of its outgoing STM N signal is determined by a separate synchronization reference signal from the sync network 2 16 Li PDH Terminal Decoder Terminal Encoder Figure 2 14 Reference broadband network Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Technical Articles As little as one or two years ago network sync was something invisible It worked and the PDH technology was mature and stable Now the technology has become unstable and timing sync has become the first point of contention between inter connected opera
79. ing the Wander Analyst program or by using the SJ300E Remote Commands Reference wander relative toa SONET or SDH line signal can be measured using the same connections If the line signal connected to the OPTICAL IN CLOCK IN or DATA IN port is defined to have no wander then the Wander TIE data uploaded has the same time interval error TIE as the external reference signal Calculate TDEV Time Deviation TDEV is a measurement that is used characterize Wander TDEV is a function of the Integration Time parameter T in seconds The SJ300E without the Wander Analyst software will calculate and display TDEV for one selected Integration Time The Integration Time may be set to a value between 0 1 and 100 seconds in 0 1 second increments The Wander Test Option with the Wander Analyst software calculates the TDEV from the uploaded wander data over a range of integration times Calculate MTIE Maximum Time Interval Error MTIE is another measurement that is used to characterize Wander MTIE is a function of a parameter S called Observation Time The SJ300E without the Wander Analyst software will calculate and display the MTIE for one selected Observation Time The Observation Times may be set to a value between 0 01 and 100 seconds in increments of 0 1 seconds for S lt 1 0 and 0 2 seconds for S gt 1 0 The Wander Test Option with the Wander Analyst software calculates the MTIE of uploaded wander data over a range of observation times Wa
80. ion number Wander Analyst User Manual 1 23 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Operating Basics Keyboard Operation without a Mouse When the Wander Analyst software program is launched it will enter the display control mode While in that mode the TAB key is used to navigate through the five display controls Start Upload three zoom controls and the cursor controls The Page Up and Page Down keys are used to move between the left and right cursors The four arrows keys move the selected cursor left right up and down The left cursor can be moved to either side of the right cursor effectively becoming and functioning as the right cursor The same is true for both cursors Pressing the ALT key and the letter S key simultaneously will access the File pull down menu entering the menu mode Then the four arrow keys can be used to navigate through the other menus and their choices Pressing the ENTER key will activate the highlighted choice The ALT I key combination selects Selection menu ALT U selects the Upload menu ALT P the PLOT menu and ALT M the Mask menu The Process Data menu can be selected by ALT M then push right arrow key once The Help menu can be selected by ALT H The ESC escape key is used to exit the menu mode and return to the display control mode Zoom In Zoom Out Full 1 24 Three buttons on the user interface manipulation the X
81. itter of 1 us p p bandlimited from 10 Hz to 150 Hz see GR 1244 CORE R5 5 MTIE OC N Interface Under normal conditions no phase transients due to rearrangement an OC N reference signal must meet this mask at the interface point at the equipment in the office where the timing is received See T1 101 1994 7 3 1 1 MTIE DS1 Interface Under normal conditions no phase transients due to rearrangement a DS1 reference signal must meet this mask at the interface point at the DSX 1 cross connect in the node receiving timing See T1 101 1994 7 2 1 1 MTIE Derived DS1 The DS1 timing reference derived by a SONET network element from an OC N signal must meet this mask See GR 253 CORE 5 4 5 1 MTIE PRS Output The output of a Primary Reference Source or a Stratum 1 clock must meet this mask See GR 2830 CORE and T1 101 1994 Sect 6 MTIE SMC Holdover When a Synchronous Equipment Clock enters holdover the transient during the first 64 seconds shall have an MTIE relative to the wanderless input that meets this mask See T1 105 09 Section 7 2 MTIE SMC Transient A SONET Minimum Clock SMC as measured at the OC N or STS N signal out of a SONET network element must meet this mask during synchronization rearrangement operations See GR 253 CORE Section 5 4 4 3 3 A 10 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Appendix A
82. k wander tolerance and transfer specifications is shown in Figure 2 11 Provision the Stratum Clock to time from DS1 Reference 1 The SJ300 generates a wandered DS1 reference that just meets the mask of GR 253 CORE Fig 4 2 This is used to time the Stratum Clock under test The DS1 output from the clock is connected to the SJ300 receiver to measure its wander The wander data is uploaded to a PC to calculate TDEV and see if it falls below the appropriate mask in GR 253 CORE Fig 5 3 2 14 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Reference First reconfigure the setup for calibration by bypassing the Stratum Clock under test see dashed line in Figure 2 11 After the SJ300 starts generating the wander pattern allow the system to settle for two minutes and start a 12 000 second calibration measurement of the DS1 wander Calculate correction factors by dividing the calibration TDEV values into the mask TDEV values in Fig 4 2 values listed in Appendix B Now configure the setup as in Figure 2 11 with the stratum clock under test in the DS1 signal path Have the SJ300 start the same wander pattern again allow the system to settle for two minutes and start a 12 000 second test measurement of the wander Multiply the test TDEV values by the corresponding correction factors The results must not exceed the appropriate mask in Fig 5 3 values listed in Ap
83. l Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Technical Articles Measurement Bandwidth Various measurement bandwidths are used depending on the bit rate of the signal the signal specification and the type of measurement unit Table 2 1 details the various measurement filters used to construct the jitter measurement bandwidth The information in the table can be found in ITU T G 783 Jitter and Wander Table 2 1 Jitter measurement filter cut off frequencies Peak to Peak jitter RMS jitter Data Full band filter Wide band High band RMS band Low pass filter Rate HPO Hz filter oa filter HP2 filter MHz Mbit s kHz kHz p18 2 nat l 0 1 to 10 em 155 0 1 to 10 a Notes See following sub section describing full band measurements 2 nat l refers to measurements of certain national interfaces The measurement filters are pictorially shown in Figure 2 14 At Tektronix we have given names such as wide band and full band to reduce confusion about these different measurement ranges Full band Wide band RMS band High band f0 Low pass High pass 1 RMS filter High pass 2 Vitter Frequency Figure 2 16 Pictorial representation of jitter measurement bandwidths and nomenclature The low pass filters are defined as having a 3rd order 60 dB decade roll off characteristic while the high pass filters ha
84. le Figure 2 18 TIE phase characteristic of wander noise test signal G 813 input tolerance test signal 2 26 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Technical Articles The TDEV characteristic of this looped back signal is shown in the next figure It matches the corresponding input tolerance specification from G 813 within a small error Note that the statistical deviation at t gt 200sec is because the TDEV measurement did not exceed the recommended 12t measurement period Wander Analyst wander TD oix File Communication Upload Plot Mask Process Data Help TDEV OC N Generation GR 253 5 4 4 3 1 1000 T TDE ns 10 a 0 01 0 10 1 00 10 00 100 00 1000 00 10000 00 Time sec Failed Measurement Period 300 sec Sample Interval 20 msec Notes Tektronix Wander Analyst demo file Figure 2 19 TDEV characteristic of wander noise test signal from G 813 tolerance mask Measurement Issues To ensure sufficiently accurate robust and consistent measurements using wander noise the following principles should be applied e The test signal should be deterministic yet sufficiently noise like over a short observation interval e The noise generator should produce a test signal within 20 of the appropriate input noise tolerance specification A suitable noise generator is summarized in
85. lected range can be ASCII Text saved as binary data or ASCII text Saving a selected range involves a Data Start Point and Window Width Print This choice brings up a menu which permits customization of printing Po Exits the program Properties This choice brings up a menu that shows the properties of the data file currently loaded in the Wander Analyst program The type of information contained is File Name Data Type Data Points Storage Interval Stored As and Uploaded Date See Screen Capture above tC O Wander Analyst User Manual 1 11 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Operating Basics Communication Selection File COMMUNICATION Upload Plot Mask Process Data Help Port Setup Test Communication Configuration a COM 1 T PE Serial Port 9600 Baud 8 Data Bits CHILE Terminator IEEE 488 GPIB Device Primary Address 30 Y OF Cancel The following choices are available from the Communication selection in the top menu bar RS 232 Serial I O port type and address selection Permits configuration and selection IEEE 488 GPIB of RS 232 and GPIB interfaces The GPIB interface requires that a National Instruments compatible driver already be loaded The Test function tests the communication between the Wander Analyst software and the SDH Analyzer The Wander Analyst software performs a idn command asking f
86. mance of service Customer shall be responsible for packaging and shipping the defective product to the service center designated by Tektronix with shipping charges prepaid Tektronix shall pay for the return of the product to Customer if the shipment is to a location within the country in which Tektronix service center is located Customer shall be responsible for paying all shipping charges duties taxes and any other charges for products returned to any other locations This warranty shall not apply to any defect failure or damage caused by improper use or improper or inadequate maintenance and care Tektronix shall not be obligated to furnish service under warranty a to repair damage resulting from attempts by personnel other than Tektronix representatives to install repair or service the product b to repair damage resulting from improper user or connection to incompatible equipment or c to service a product that has been modified or integrated with other products when the effect of such modification or integration increases the time or difficulty of servicing the product THIS WARRANTY IS GIVEN BY TEKTRONIX WITH RESPECT TO THIS PRODUCT IN LIEU OF ANY OTHER WARRANTIES EXPRESSED OR IMPLIED TEKTRONIX AND ITS VENDORS DISCLAIM ANY IMPLIED WARRANTIES OF MERCHANTABILITY OR FITNESS FOR A PARTICULAR PURPOSE TEKTRONIX RESPONSIBILITY TO REPAIR OR REPLACE DEFECTIVE PRODUCTS IS THE SOLE AND EXCLUSIVE REMEDY PROVIDED TO THE CUSTOMER FOR BREACH
87. me upon written notice to Tektronix The license may be terminated by Tektronix or any third party from whom Tektronix may have obtained a respective licensing right if Customer fails to comply with any term or condition and such failure is not remedied within thirty 30 days after notice thereof from Tektronix or such third party Upon termination by either party Customer shall return to Tektronix the Program and all associated documentation together with all copies in any form LIMITED WARRANTY Tektronix warrants that the media on which the Program is furnished and the encoding of the Program on the media will be free from defects in materials and workmanship for a period of three 3 months from the date of shipment If any such medium or encoding proves defective during the warranty period Tektronix will provide a replacement in exchange for the defective medium Except as to the media on which the Program is furnished the Program is provided as is without warranty of any kind either express or implied Tektronix does not warrant that the functions contained in the Program will meet Customer s requirements or that the operation of the Program will be uninterrupted or error free In order to obtain service under this warranty Customer must notify Tektronix of the defect before the expiration of the warranty period If Tektronix is unable to provide a replacement that is free from defects in materials and workmanship Wander Analyst User M
88. n an oscilloscope In fact jitter and wander on a data signal are equivalent to a phase modulation of the clock signal used to generate the data Figure 2 21 Naturally in a practical situation jitter will be composed of a broad range of frequencies at different amplitudes Figure 2 23 Phase variation between two signals Jitter and wander have both an amplitude how much the signal is shifting in phase and a frequency how quickly the signal is shifting in phase Jitter is defined in the ITU T G 810 standard as phase variation with frequency components greater than or equal to 10 Hz whilst wander is defined as phase variations at a rate less than 10 Hz Figure 2 22 Wander Jitter i i il l i i ji i i Lim im 10m0 1 1 10 100 1k 10k 1M 1M 10M Frequency Hz Figure 2 24 Frequency ranges of jitter and wander ref G 810 2 32 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Technical Articles When measuring jitter or wander always be sure what the reference clock is By definition a signal has no phase variation when referenced to itself jitter or wander always refers to a difference between one timed signal and another Metrics for Jitter Jitter is normally specified and measured as a maximum phase amplitude within one or more measurement bandwidths A single interface may be specified using several different bandwidths si
89. nce the effect of jitter varies depending on its frequency as well as its amplitude UI Unit Intervals Jitter amplitude is specified in Unit Intervals UD such that one UI of jitter is equal to one data bit width irrespective of the data rate For example at a data rate of 2048 kbit s one UI is equivalent to 488 ns whereas at a data rate of 155 52 Mbit s one UI is equivalent to 6 4 ns Jitter amplitude is normally quantified as a Peak to Peak value rather than an RMS value since it is the peak jitter that would cause a bit error to be made in network equipment However RMS values are useful for characterizing or modeling jitter accumulation in long line systems using SDH regenerators for example and the appropriate specifications use this metric instead of Peak to Peak Metrics for Wander A wander measurement requires a wander free reference relative to which the wander of another signal is measured Any Primary Reference Clock PRC can serve as a reference because of its long term accuracy 107 or better and good short term stability A PRC is usually realized with a cesium based clock although it may also be realized using GPS technology Because it involves low frequencies with long periods wander data can consist of hours of phase information However because phase transients are of importance high temporal resolution is also needed So to provide a concise measure of synchronization quality three wander paramete
90. nchronous Equipment Clock is slaved to a wanderless timing source the wander at output host SDH network element must meet this mask This test is to be performed at a constant temperature 1 K See ITU T Recommendation G 813 section 7 1 1000 SEC Gen Const Temp ITU T Fig 1 G 813 MTIE 40 O1 lt t lt 1 MTIE 400 1 lt t lt 100 100 MTE 25 250 100 lt t lt 1000 3 40 10 0 1 1 10 100 1000 B 2 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Appendix B TDEV MTIE SDH Standards Version 5 0 MTIE SEC Tolerance An SEC slaved to a timing source must tolerate wander on that source that in the worst case just meets this mask See ITU T Recommendation G 813 section 8 1 Tolerate means e Maintaining the clock within prescribed performance limits The exact performance limits are for further study e Not cause any alarms e Not cause the clock to switch reference e Not cause the clock to go into holdover 10000 SEC Tolerance ITU T Fig 5 G 813 ne MTIE 250 0 1 lt tS25 i MTIE 100r 2 5 lt T lt 20 MTIE 2000 20 lt T lt 400 MTIE St 400 lt t lt 1000 550 100 i 2 E 0 1 25 20 400 1000 MTIE SSU Tolerance An SSU must tolerate give no indication of improper operation wander at its input that has MTIE of this mask See ETS DE TM 3017 4 section 7 2 SSU Toler
91. nder Analyst User Manual 2 3 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Reference Applications All of the following applications require that the network element under test an SJ300E or CTS 850 and a PC Personal Computer running the Wander Analyst program are already interconnected This section provides example applications for Basic Wander Measurement Generating Phase Transients Phase Transient Conformance Testing Wander Transfer Conformance Testing Basic Wander Measurement Synchronization Setup 1 Measurement Selection 1 2 4 This measurement requires Synchronization Setup Measurement Selection and Measurement Execution Connect a synchronization reference signal to the SJZ00E Receiver REF CLOCK input This should be a pure clock signal either 1 544Mbps BITS Building Integrated Timing Supply 2Mbps SETS Synchronous Equipment Timing Supply or 2MHz SETS Press the EXT key so the indicator light comes on Press the MENU key twice moving the cursor to WANDER and press the ENTER key Move the cursor to REF SEL and press the ENTER key Move the cursor to either DS1 1 544Mbps 2Mbps 2 048 Mbps or 2MHz 2 048 MHz and press ENTER Connect the line signal to the Receiver CLOCK DATA or OPTICAL input and press the SELECT key until the corresponding indicator light comes one Press the MENU key twice move the cursor to WANDER and p
92. ntered on a frequency of 0 42 BPF TIE HO RMS TDEV Figure 2 28 Functional definition of TDEV Figure 2 27 shows two plots of TDEV t The first plot for T 100s corresponding to the TIE data of Figure 2 23 shows TDEV rising with t This is because for the short measurement period T 100s the two transients in Figure 2 23 dominate If we were to make a longer TIE measurement out to T 250s the effect of the two transients on TDEV would become less assuming there are no more transients The TDEV characteristic labeled T 250 s would be the result It should also be noted that TDEV is insensitive to constant phase slope frequency offset To calculate TDEV for a particular qt the overall measurement period T must be at least 3t For an accurate measure of TDEV a measurement period of at least 127 is required This is because the rms part of the TDEV calculation requires sufficient time to get a good statistical average Wander Analyst User Manual 2 35 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Technical Articles 20 30 40 50 60 70 80 Observation Interval t s Figure 2 29 Example of TDEV wander measurement corresponding to Figure 2 23 2 36 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Wander Masks Appendix A Wander Masks Version 6 0 The masks listed in the secti
93. on are used in Version 6 0 of the Wander Analyst software MTIE Masks SONET OC N Transient GR 253 CORE Fig 5 18 T1 101 1994 Fig 8 MTIE 7 6 885 S 0 014 lt S lt 0 5 MTIE 300 300 S 0 5 lt S lt 2 33 MTIE 1000 2 33 lt S lt 280 MTIE 997 0 01 S 280 lt S lt 106 20 4 10L i i 014 0 1 0 5 2 33 10 100 1000 10 105 106 OC N Generation GR 253 CORE Fig 5 16 MTIE 20 0 1 lt S lt 1 MTIE 20 50 48 1 lt S lt 10 MTIE 60 10 lt S lt 1000 0 1 1 10 100 1000 DS1 Generation GR 1244 CORE Fig 5 2 MTIE 40 0 1 lt S lt 1 MTIE 40 50 4 1 lt S lt 10 MTIE 100 10 lt S lt 1000 100 40 0 1 1 10 100 1000 OC N Interface T1 101 1994 Fig 7 MTIE 70 3 32 S 0 05 lt S lt 280 MTIE 997 0 01 280 lt 5 lt 106 104 1000 100 7 j 10 001 Ol T 10 1002801000 101 105 T06 DS1 Interface T1 101 1994 Fig 5 MTIE 300 2 5 S 0 05 lt S lt 280 MTIE 997 0 01 280 lt 5S lt 106 0 01 0 1 1 10 100 280 1000 10 Wander Analyst User Manual A 1 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Appendix A Wander Masks Version 6 0 Derived DS1 GR 253 CORE R5 151 MTIE 50 0 1 lt S lt 1000 50 0 1 10 100 1000 PRS Output T1 101 1994 Fig 4 GR 2830 CORE
94. ons Real Time Wander Analyst also includes a full suite of North American SONET and ANSI specification limits The software provides a hi lo envelope TIE plot to show transients full zoom control via cursors and calculates frequency offset and drift rate in accordance with ANSI approved methodology The Real Time Wander Analyst software is capable of the following e TIE MTIE and TDEV wander analysis e Calculation and display of frequency offset and drift rate from TIE data e SDH and SONET compatible e Windows 95 compatible e Comprehensive support for new revised and draft ITU T ETSI ANSI and Bellcore wander specifications e Automatic mask testing for easy conformance test documentation e Interactive use for design verification and performance assessment e Flexible TIE data acquisition and storage control e Efficient algorithms for speedy calculation of MTIE and TDEV The Real Time Wander Analyst program is a user friendly software package that uploads stores and displays wander Time Interval Error TIE data over the specified interval of time The Time Deviation TDEV and Maximum Time Interval Error MTIE is computed while TIE is uploading and displayed when the plot is selected The program also computes frequency drift and offset Figure 1 1 illustrates the Real Time Wander Analyst program display and user interface The display is divided into the following three areas Pull Down Menu Bar X Y Plot Display and Program Sta
95. or the test unit s software version This information is displayed and the test is successful if communication is properly established Port Setup To select RS 232C or GPIB click on the respective button and the current value will be highlighted To set the serial port on the PC select RS 232C click on the Serial Port selector and pick COM1 COM2 COM3 or COM4 To set the GPIB address for the SJ300E or CTS 850 select GPIB click on the Primary Address Selector and pick the desired address If the I O type is set to GPIB and the GPIB driver is not loaded all communications including RS 232C may be disabled If this occurs exit and restart the Wander Analyst program to initialize the RS 232C communication port Or load the GPIB driver before running the Wander Analyst program Once the Communication configuration is set you may test it with the Comm Test option from the Communication pull down menu The communications setup is stored on disk when Wander Analyst was configured and will not have to be re entered unless the configuration changes or the configuration file wancfg ini is lost 1 12 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Operating Basics Uploading Data Setup Upload Configuration Menu File Communication UPLOAD Plot Mask Process Data Help Start Upload Data Storage Interval f 20 msec e C 10sec
96. or uploading data into This will change the display to show upload information in the file data area If the file exists it may be plotted but this will not happen by default The command sub window accepts a full path name as follows drive directory subdirectory filename ext 10 sec The default is c Wander upload dat which is sample TIE data file that is provided with the Wander Analyst software Wander Analyst User Manual 1 13 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Operating Basics Using the Upload Pull Down Menu e Set the upload filename to a DOS compatible format with the DAT data file extension as shown disk directory file_name DAT e Select a measurement signal data storage interval and a measurement period Valid ranges are from 10 to 999999 seconds The end of the upload is determined by the number of samples expected in the selected period Select the Data Storage Interval of twenty millisecond 0 02 sec for greater resolution one second 1 00 sec or 10 seconds to use less storage space NOTE MTIE and TDEV files generated while the data is being uploaded at twenty millisecond intervals will reflect that resolution even though the data storage is at a one second resolution MTIE and TDEV files calculated from one second stored data will reflect that resolution Uploading Data from the SJ300E or CTS 850 Using the PC left mouse button
97. pendix B by more than 2 Wander Analyst User Manual 2 15 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Technical Article What are the consequences of Jitter amp Wander in the Network By Dr Dan H Wolaver Tektronix Chelmsford MA and Mark Lum Tektronix European Telecoms Market Development Manager Marlow U K As little as one or two years ago network synchronization was something invisible It worked and the PDH technology was mature and stable Now the technology has become unstable and timing sync has become the first point of contention between inter connected operators Telecommunication networks transport two entities data and timing as part of a service As a result timing has always been very carefully specified controlled and distributed within networks across network interfaces and between customers To deliver the timing part of the service the network must be properly synchronized Good synchronization is the foundation of Convergence integrated voice video and data services Without management of Timing and Synchronization Convergence just cannot happen The new SDH equipment being installed in public networks around the world represents a quantum leap in performance management and flexibility for network operators However the behavior of a working SDH network is very different from today s existing PDH networks something that is be
98. ph PRC ITU T G 811 ETS 300 462 6 ee SS ee The single selection picks a mask for both TDEV and MTIE If the mask does not exist for one or the other that information is displayed on the selection panel See screen example below TDEY amp MTIE Mask Selection SONET Syne Network ANSI 71 101 Stratum 3 OC N Transient 1 18 Wander Analyst User Manual Operating Basics The following choices are available from the Mask section in the top menu bar See the actual masks in the appendix of this user manual Standard Selection Mask Selection MTIE or TDEV The single selection picks a mask for both TDEV and MTIE If the mask does not exist for one or the other that information is displayed on the selection panel No Mask No Mask PRC ITU T G 811 ETS 300 462 6 Wander Generation PRS GR 2830 CORE Wander Output Phase Transient SSU ITU T G 812 Type 1 ETS 300 462 4 Wander Generation Wander Gen Var Temp Wander Tolerance Noise Transfer Transient Response STM N Clock ITU T G 812 Type Il Type III Wander Generation Wander Tolerance Noise Transfer Transient Response 1 5 Mbit s Transient Response STM N Clock ITU T G 812 Type IV Wander Generation Wander Tolerance Noise Transfer Transient Response 1 5 Mbit s Transient Response STM N Clock ITU T G 812 Type V Type VI Wander Generation Transient Response Clock GR 1244 CORE Wander G
99. pment and the SONET Networks The masks in this section were used in Version 5 0 of the Wander Analyst software Wander Analyst User Manual C 1 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Appendix C TDEV and MTIE SONET Standards Version 5 0 MTIE Masks SONET Equipment MTIE OC N Transient An OC N or STSX N signal out of a SONET network element must meet this mask during synchronization rearrangement operations See GR 253 CORE 5 4 4 3 2 and T1 101 1994 7 3 1 2 107 OEN GR2BCORE Re 519 TOMAR 1000 MIE 76 85 5 00145 S lt 05 450 MIE 30 I0S 055523 i MIE 100 23s S lt MIE 97 0S 280s S lt 1 20 MTIE OC N Generation An OC N or STSX N signal out of a SONET network element must meet this mask when timed with a wander free reference The reference shall however have white jitter of 1 us p p band limited from 10 Hz to 150 Hz see GR 253 CORE 5 4 4 3 1 60 OCN Generation GR 253 CORE Fig 5 16 MTE 20 01 lt S lt 1 20 MTIE 20 50 48 1 lt S lt 10 MTE 60 10 lt 5 lt 1000 0 1 1 10 100 1000 MTIE Derived DS1 The DS1 timing reference derived by a SONET network element from an OC N signal must meet this mask See GR 253 CORE 5 4 5 1 Derived DS1 GR 253 CORE R5 151 MTIE 50 0 1 lt 5 lt 1000 5 0 1 1 10 100 1000 C 2 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE
100. point at the DSX 1 cross connect in the node receiving timing See T1 101 1994 7 2 2 1000 DS1 Interface T1 101 1994 Fig 6 TDEV 100 0 05 lt t lt 10 TDEV 31 6 05 10 lt t lt 1000 100 0 05 10 1000 C 8 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Index Applications 2 4 Basic Wander Measurement 2 4 Generating Phase Transients 2 6 Phase Transient Conformance Testing 2 8 OC N Phase Transient Test 2 8 Synch Clock Transient Test 2 10 Wander measurements displayed 2 5 Wander Transfer Conformance Testing 2 12 Wander Transfer Specifications 2 12 Transfer from DS1 to OC N 2 12 Transfer from OC N to OC N 2 13 Hardware Requirements 1 6 Personal Computer 1 6 SDH SONET Analyzer 1 6 Keyboard Operation without a Mouse 1 24 Masks Standards SONET TDEV and MTIE Version 5 0 B 1 Standards SDH TDEV and MTIE Version 5 0 C 1 Wander Version 6 0 A 1 Menus Communication Selection 1 12 Uploading Data Setup 1 13 Upload Configuration Menu 1 13 Uploading Data from the test set 1 14 Graphic Displays 1 15 Port Setup 1 12 File Selection 1 11 Help Selection 1 23 Mask Menu 1 18 MTIE mask choices 1 20 TDEV mask choices 1 21 Plot Menu 1 16 Process Data Menu 1 22 Wander Analyst User Manua Artisan Technology Group Quality Instrumentation Index Operating Basics 1 7 Distribution Diske
101. ranteed 888 88 SOURCE www artisantg com Appendix B TDEV MTIE SDH Standards Version 5 0 TDEV PRC Noise Generation The wander at the output of a Primary Reference Clock providing a 2 Mbit s synchronisation signal must meet this mask The reference used in making this measurement must be more stable than the requirements of the mask See ETS DE TM 3017 6 section 5 1 PRC Generation ETS DE TM 3017 6 Fig 2 a ee TDEV 3 0 1 lt S lt 100 TDEV 0 03S 100 lt S lt 1000 TDEV 30 1000 lt S lt 10 3 0 1 1 10 100 1000 10000 B 10 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Appendix B TDEV MTIE SDH Standards Version 5 0 TDEV Masks SDH Network TDEV PRC Output The wander at the output of a Primary Reference Clock must meet this mask See ETS DE TM 3017 3 section 7 2 1 1000 PRC Output ETS DE TM 3017 3 Fig 4 TDEV 3 0 1 lt S5 lt 100 TDEV 0 035 100 lt S lt 1000 TDEV 29 7 0 00035 1000 lt S lt 10 1 0 1 1 10 100 1000 10 10 10 TDEV SSU Output The wander at the output of a Synchronisation Supply Unit slave clock anywhere in the network must meet this mask See ETS DE TM 3017 3 section 7 2 2 SSU Output ETS DE TM 3017 3 Fig 6 TDEV 3 01 lt S lt 43 TDEV 0 7S 43 lt S lt 100 TDEV 58 1 25 0 00035 100 lt S lt 10
102. ress ENTER Move the cursor to WAND MEAS wander measurement and press the ENTER key Move the cursor to OCN or BITS SETS and press ENTER Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Reference Wander measurements displayed on the SJ300E 1 Press the MENU key twice move the cursor to WANDER and press ENTER 2 Move the cursor to DISPLAY and press ENTER Pressing the MENU key will toggle between the Wander Analyst display and the TIE display TDEV 69 6 ns TAU 0 4 AA MTIE 1765 0 ns OBS 1 0 TIE 3752 0 ns WY Figure 2 4 SJ 300E Display Panel The front panel will display TDEV for only one value of Tau t Integration Time and MTIE for only one value of Observation Time To select the value of Tau t and Observation Time 1 Press the F1 key when the cursor is under the TAU value on the screen and increment or decrement the value 0 1 to 99 9 seconds 2 Press the F1 key until the cursor is under the OBS value on the screen and increment or decrement the value 0 1 to 99 0 seconds The displayed values of TIE TDEV or MTIE are history dependent Changes in configurations or conditions may give incorrect or erroneous the RESET key must be pressed to erase past readings The full power of the SJ300E Wander features is only accessible when used with the Wander Analyst software program To upload wander data using Wander
103. ress for margin The transients occur when the ENTER key is pressed Pressing the Enter Key a second time is not recommended because it will not produce the desired transient To repeat the transient steps 3 through 5 must be repeated The transients are in a direction to shift the phase of the BITS OUT signal earlier by either 1000 or 1200 nanoseconds Wander Analyst User Manual 2 7 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Reference Phase Transient Conformance Testing Current SONET standards limit the size of phase transients that can be generated by network elements and synchronization clocks during synchronization rearrangement operations The phase transient limits are specified by the Bellcore and ANSI standards in terms of MTIE Maximum Time Interval Error OC N Phase Transient Test Section 5 4 4 3 2 of the Bellcore GR 253 CORE standard sets the phase transient response limits of SONET network elements due to five named rearrangement activities The standard reads as follows For all SONET network elements except regenerators and loop timed terminal multiplexes OC N OC M and STS N STS M electrical outputs shall meet the requirements for phase transients during synchronization rearrangement operations detailed in ANSI T1 101 1994 Those requirements specify an MTIE of no greater than the requirement in Bellcore Figure 5 18 Bellcore GR 253 CORE section 5 4 4 3
104. rs have been defined and are used to specify performance limits e TIE Time Interval Error wander in ns e MTIE Maximum Time Interval Error related to Peak to Peak wander e TDEV Time Deviation related to rms wander Formal mathematical definitions of these and other parameters can be found in ITU T G 810 standard Wander Analyst User Manual 2 33 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Technical Articles TIE Time Interval Error TIE is defined as the phase difference between the signal being measured and the reference clock typically measured in ns TIE is conventionally set to zero at the start of the total measurement period T Therefore TIE gives the phase change since the measurement began An example is given in Figure 2 23 The increasing trend shown is due to a frequency offset of about 1 ns per 10 s or 10 in this case Measurement Time T sec Figure 2 25 Example of TIE wander measurement MTIE Maximum Time Interval Error MTIE is a measure of wander that characterizes frequency offsets and phase transients It is a function of a parameter T called the Observation Interval The definition Figure 2 24 is MTIE t is the largest Peak to Peak TIE i e wander in any observation interval of length T TIE P P Detector PPTIE Peak MTIE Window T Detector Figure 2 26 Functional definition of MTIE In order to calculate MTIE at a certain ob
105. sation signal anywhere in the network must meet this mask See ETS DE TM 3017 3 section 7 2 4 10 53304 0 1 73 20 2000 10 Wander Analyst User Manual B 7 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Appendix B TDEV MTIE SDH Standards Version 5 0 TDEV Masks SDH Equipment TDEV SEC Gen Const Temp When the Synchronous Equipment Clock is slaved to a wanderless timing source the wander at the output of the host SDH network element must meet this mask This test is to be performed at a constant temperature 1 K See ITU T Recommendation G 813 section 7 1 10 6 0 nnn SEC Gen Const Temp ITU T Fig2 G813 N TDEV 32 0 1 lt t lt 25 TDEV 06 25 lt TS 100 TDEV 64 100 lt t lt 1000 i 0 1 1 10 25 100 1000 TDEV SEC Tolerance An SEC slaved to a timing source must tolerate wander on that source that in the worst case just meets this mask See ITU T Recommendation G 813 section 8 1 Tolerate means e Maintaining the clock within prescribed performance limits The exact performance limits are for further study e Not cause any alarms e Not cause the clock to switch reference e Not cause the clock to go into holdover 1000 SEC Tolerance ITU T Fig 6 G 813 TDEV 12 0 1 lt t lt 7 TDEV 1 7 7 lt t lt 100 TDEV 170 100 lt 7 lt 400 0 1 7 w 1000 B 8 Wander Analyst User Manual
106. servation interval t from the measurement of TIE a time window of length t is moved across the entire duration of TIE data storing the peak value The peak value is the MTIE T at that particular t This process is repeated for each value of t desired For example Figure 2 23 shows a window of length tT 20 sec at a particular position The Peak to Peak TIE for that window is 4 ns However as the 20 sec window is slid through the entire measurement period the largest value of ppTIE is actually 11 ns at about 30 sec into the measurement Therefore MTIE 20 s 11 ns Figure 2 25 shows the complete plot of MTIE t corresponding to the plot of TIE in Figure 2 23 The rapid 8 ns transient at t 30 s is reflected in the value MTIE t 8 ns for very small T It should be noted that the MTIE plot is monotonically increasing with observation interval and that the largest transient masks events of lesser amplitude 2 34 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Technical Articles 40 60 Observation Interval Figure 2 27 Example of MTIE wander measurement corresponding to Figure 2 23 TDEV Time Deviation TDEV is a measure of wander that characterizes its spectral content It is also a function of the parameter T called Observation Interval The definition Figure 2 26 is TDEV t is the rms of filtered TIE where the bandpass filter BPF is ce
107. siesaweastdenescsseesnneeddenwiateetawnestccnndveetien 2 3 Calculate M Tl mrnrnnnnannnnnnnann a 2 3 PIG A OUNS sinr r r E O r 2 4 Basic Wander M aSurement ccccccecceceeeceeeeeeeeeeeeeeeeeeeeeeeeeeeeeeeeeeeeeeegs 2 4 SYNCHFOMIZATION SETUP vs Ae a ee E a 2 4 Measurement SClOCUON seccsttecccccdeacctacdeaaceadcenddeaadteadensdenatiaatinetneteninaenac 2 4 Wander measurements displayed on the Test Set ssseeeeeeee 2 5 Generating Phase Trasients svixcscisieceressinsessseineerccateseserererereceteravenetenenee 2 6 Specification for Transient Generation ccccccccceeeeeeeeeeeeeectteeeeeeeeeteee 2 6 Phase Transient Generation ProCedure eccceeeeeeeeecceeeeeeeeeeeeeenaaees 2 7 Phase Transient Conformance TeSting ccccccccceceeeeeeeeeeeeeeeeeeeeeeeeeeees 2 8 OC N Phase Transient TeSt scssssssssseeeessesseeeeseeeeesseeeaeaaasaaaaaaaaaaaaee 2 8 Synchronization Clock Transient Test ccccceceseeeeeeeeeeeeeeeetteeeeeeeeetees 2 10 Wander Transfer Conformance TeSting cccceeeeeeeeeetteeeeeeeeeeeeees 2 12 Wander Transfer Specifications ceeeceeeeeeeeeeeeeeeeceeeeeeeeeeeeeeeneeeeeees 2 12 Transfer from DS1 to OC N aoaiina anakina nania 2 12 Transfer from OC N to OC N 0 00 i iiiiiiiiiiinererenereeerees 2 13 Jitter amp Wander Technical Articles ccccccececceeeeeeeeeeeeeeeeeeeeeeeeeeeeeeeeneness 2 16 New issues in Timing and Synchonization cccecc
108. sssssssesssesssesssesssesesees 1 12 Uploading Data Setup ssseessesenerrrrersserrtrrnrrrsserrtrrrnnnrsstrrrnrrnneeseet 1 13 Upload Configuration Menu sssssssssssssssssssssrnesssosssrnnnnrsssennnnnnesssennenn 1 13 Uploading Data from the test set ssessesssseneeeseesrirrrrssssrrrrrnrnssssnnns 1 14 Graphic DIS OIA YS os eesceren a a a a haectysdeesaeweeses 1 15 Plot Men caiaseenceauas vancants on rinie aE ere EE a AE EEs ERES EREE EEREN 1 16 Mask IVT scnasena enaere raTa AEE r AEE 1 18 Process Data Menu viticnacccrwiccteanadcacaeieetanseeawiatieaneda eaten 1 22 Help Selection eeeesoonennneneeeeoereetrnrrrstertttrrnrresoerrtrrnnnrrseerrennnnneeeeee 1 23 Keyboard Operation without a MOUSe sssssssssesssesenrrrnrresserrrnrrnnrsserrnne 1 24 ZOOM IN ZOOM Out Full saire aa NEE 1 24 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Reference ou ceeceecceeceecceeceeccecceeceeccneceeceuseneceasensceeceusenscasenseusseuseneeeeseneeees 2 1 Wander Test Functions icc csiccssicassarsccasadsascasdenacaasadsascatedeadaasndeadansd sasansndends 2 2 Generate Wander and Jitter References ssseeessseesseeeeeeeeeeeeeee 2 2 Measuring DS1 Wander Relative to a Reference cccccccceeceeeeees 2 3 Measuring SONET SDH Wander Relative to a Reference 2 3 Galc late TIE cise stiestcvsiccannesteeawici
109. tive is to generate a signal whose phase behavior is such that its MTIE and or TDEV matches a defined characteristic curve The test signal is used for input wander tolerance and wander noise transfer testing it can be designed to match different TDEV or MTIE characteristic curves It is also useful for exercising the memory acquisition of clocks as a precursor to holdover testing Wander Analyst User Manual 2 25 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Technical Articles Example Input Wander Tolerance Test In this example instead of using a sinewave modulation to test the input tolerance at a specific frequency we use a special noise like signal whose TDEV meets the specification requirements The signal contains all wander frequencies at the correct amplitude and the test can be completed in a short time The figure below shows the TIE or phase characteristic of the special wander noise test signal obtained by a loop back test of a wander generator analyzer Wander Analyst wander dat Oe x File Communication Upload Plot Mask Process Data Help Time Interval Error Plot Resolution 0 60 sec Time Interval Error ns 0 20 40 60 80 100 120 140 160 180 200 220 240 260 280 300 Cursor A 98 Time sec Cursor B 200 Measurement Period 300 sec Sample Interval 20 msec Notes Tektronix Wander Analyst demo fi
110. tors As a consequence Timing and Synchronization are of strategic importance to network operators as they work in the new de regulated environment of the 1990 s New Issues in Timing and Synchronization So this is a time of great change for Timing and Synchronization in the network over 75 of the relevant technical standards are new or recently revised There are many challenges for operators and suppliers and many new issues to resolve e Synchronization networks are changing with the introduction of SDH the historical PDH based sync network will be replaced by an SDH based architecture e New equipment and network timing amp sync standards have been developed e Transport networks are evolving and hybrid SDH PDH has specific impairments due to the quantisation of network phase variation as pointer justifications e New emerging services like video and ATM depend on excellent network timing amp sync to deliver the contractual Quality of Service e Jitter Wander measurement technology is changing from analogue to digital leading to dramatically new test instrument capabilities e New test equipment standards are being developed Together with user s data timing is one entity that is transported end to end across the network no matter what the technology PDH SDH ATM ADSL RF no matter what the service voice data video and no matter what the application PBX GSM contribution or distribution quality video
111. transferred to an additional machine for local execution a separate license shall be required for each such machine with which the Program may be used Title to the Program and all copies thereof but not the media on which the Program or copies may reside shall be and remain with Tektronix Customer shall pay when due all property taxes that may now or hereafter be imposed levied or assessed with respect to the possession or use of the Program or this license and shall file all reports required in connection with such taxes Any portion of the Program modified by Customer or merged with another program shall remain subject to these terms and conditions If the Program is acquired by or for an agency of the U S Government the Program shall be considered computer software developed at private expense and the license granted herein shall be interpreted as granting Customer restricted rights in the Program and related documentation as defined in the applicable acquisition regulation THE PROGRAM MAY NOT BE USED COPIED MODIFIED MERGED OR TRANSFERRED TO ANOTHER EXCEPT AS EXPRESSLY PERMITTED BY THESE TERMS AND CONDITIONS UPON TRANSFER OF ANY COPY MODIFICATION OR MERGED PORTION OF THE PROGRAM THE LICENSE GRANTED HEREIN IS AUTOMATICALLY TERMINATED TERM The license granted herein is effective upon acceptance by Customer and shall remain in effect until terminated as provided herein The License may be terminated by Customer at any ti
112. tte Contents 1 7 GPIB Port Setup 1 8 Installation Procedure 1 7 Port Configuration 1 8 Program Configuration 1 8 Program First Start 1 10 Program Startup 1 9 Program Startup 1 9 RS 232 Port Setup 1 8 Software Installation 1 7 Software 1 2 Display amp User Interface 1 3 Program Overview 1 2 Changes from Previous Versions 1 4 Specifications 1 4 SDH conformance test 1 4 Software 1 5 SONET conformance test 1 5 Technical Articles 2 16 Consequences of Jitter Wander in Network 2 18 New issues Timing and Synch 2 17 Principles amp Metrics of Jitter Wander 2 32 Testing for Jitter and Wander 2 19 Video Transport Broadband Networks 2 17 Test Functions Wander 2 2 Calculate MTIE 2 3 Calculate TDEV 2 3 Generate Wander and Jitter References 2 2 Measure DS1 Wander Relative to Reference 2 3 Measure SONET SDH Wander Relative to Reference 2 3 Pure Clock Signal 2 2 Zoom In Zoom Out Full 1 24 Index 1 Guaranteed 888 88 SOURCE www artisantg com Index Index 2 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com A rtisan Artisan Technology Group is your source for quality TecmoogyGroup new and certified used pre owned equipment FAST SHIPPING AND SERVICE CENTER REPAIRS WE BUY USED EQUIPMENT DELIVERY Experienced engineers and technicians on staff Sell your excess underutilized and idle used
113. tum 3E clock must meet this mask when its input meets the DS1 Interface TDEV mask See GR 1244 CORE R5 6 1000 Stratum 2 amp 3E GR 1244 CORE Fig 5 3 as TDEV 2 0 05 lt t lt 0347 TDEV 5 77t 0347 lt 1 lt 30 TDEV 3160 30 lt T lt 1000 2 0 05 0 347 30 1000 Wander Analyst User Manual C 7 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Appendix C TDEV and MTIE SONET Standards Version 5 0 TDEV Masks SONET Network TDEV OC N Interface Under normal conditions no phase transients due to rearrangement an OC N reference signal must meet this mask at the interface point at the equipment in the office where the timing is received See T1 101 1994 7 3 2 An OC N or STSX N signal out of a SONET network element must meet the OC N Interface TDEV mask when referenced to a DS1 timing signal that meets the DS1 Filtered TDEV mask An OC N or STSX N signal out of a SONET network element must meet the OC N Interface TDEV mask when referenced to a line OC N timing signal that meets the OC N Interface TDEV mask See GR 253 5 4 4 2 4 1000 173 OCN Interface T1 101 1994 Fig 9 GR 253 Fig 5 14 TDEV 10 005 lt 7 lt 173 TDEV 57 t 13 lt 30 TDEV 316 05 30S TS 1000 10 0 05 1 7 30 1000 TDEV DS1 Interface Under normal conditions no phase transients due to rearrangement a DS1 reference signal must meet this mask at the interface
114. tus and Control The Zoom Control Keys In Out and Full operate the display 1 2 Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Getting Started Pull down Menu Bar Wander Analyst wander dat ofl x _ File Communication Upload Plot ask ProcessData Help Time Interval Error Plot Resolution 0 60 sec 701 600 ae 500 oak a _ 400 ith i g yry X Y Plot 5 300 Display Area w ogo Ahh j gt 100 o E 0 H HHHH HHHH HH HHHH HHHH H 100 i p 200 jh mit 7 1a 300 Wai fh aia dt b d b sw wo o o wko iwo 20 20 2o o 20 a Control Keys Cursor A 98 Time sec Cursor B 200 _ Measurement Period 300 sec Sample Interval 20 msec Program Notes Sample wander data Status and Control Figure 1 1 Wander Analyst Software Display and User Interface Version 6 0 of the Real Time Wander Analyst software supports the CTS 850 in addition to the SJ300E To support both systems the Wander Analyst software at the first time communications with a test set is established will try to determine the type of device it is connected to When the program is started or after the communications settings have changed beginning a data upload will display a status screen indicating that the Wander Analyst software is auto detecting the attached device CTS 850 or SJ300
115. u Bar Wander Analyst wander_dat olx File Communication Upload Plot Mask ProcessData Help om Time Interval Error Plot Resolution 0 60 sec 600 A i 500 H ih jj _ 400 i j i y d X Y Plot 300 Display Area w ogo Ahh j 100 A o 0 H HHHH HHHH HHHH j HHHH HHHH H 100 f iy 200 jh h ii ina 300 Mb ft Zoom 358 1 i 0 2 40 60 80 100 120 140 160 180 200 220 240 260 280 300 Cursor A 98 Time sec Cursor B 200 Control Keys _ _ Measurement Period 300 sec Sample Interval 20 msec Program Notes Sample wander data Status and Control Figure 1 2 Wander Analyst Software Display and User Interface Wander Analyst User Manual Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Operating Basics File Selection FILE Communication Upload Plot Mask Process Data Help Open Save p gt Save File As gt Save Selected Range As p gt Binary Data ASCII Text File Property File Name d sdhsonet sj300e wander dat Data Type Time Interval Error Data Points 15000 Winclow Whilth Storage Interval 20 msec Stored As Binary Integer Uploaded 02 06 1996 15 22 26 The following choices are available from the File selection in the top menu bar open dT Oa a ITE oF DAT He Save Save File As gt A file can be saved as binary data or Save Selected Range As gt Binary Data ASCII text or a se
116. ve a 1st order 20 dB decade characteristic The 60 dB decade low pass slope is needed to remove the demodulated signal clock component from the measurement Wander Analyst User Manual 2 21 Artisan Technology Group Quality Instrumentation Guaranteed 888 88 SOURCE www artisantg com Technical Articles Full band Measurements This measurement bandwidth selectable high pass ranging from 0 1 to 10Hz has been pioneered by Tektronix and is particularly valuable for measuring and diagnosing jitter due to pointer justifications Significant phase energy is present at low frequencies which can affect service timing or the performance of terminal equipment The conventional wide band filters for example 100 and 200Hz do not permit measurement at these frequencies Phase Transient Tolerance Previously an unimportant characteristic of jitter wander test equipment this has become very important when measuring hybrid SDH PDH systems Pointer Hits on PDH tributaries can cause older jitter wander test sets to lose lock exceed their measurement range and cause unreliable and inaccurate measurements to be made Even newly designed test sets may have limitations if this has not been a design criteria The answer is to ensure that jitter wander test equipment is able to tolerate the pointer induced phase transients that are present on modern PDH services Filter Cut off Frequency Accuracy The accuracy of the high pass filter characteristic
117. xceed the TDEV mask in GR 253 CORE Fig 5 14 values listed in Appendix B by more than 2 Transfer from OC N to OC N Bellcore GR 253 CORE section 5 4 4 2 4 R5 112 OC N OC M and STS N STS M electrical outputs when referenced to a line OC N timing signal that meets the wander TDEV mask in Figure 5 14 shall meet the wander TDEV mask given in Figure 5 14 The setup for testing conformance to requirement R5 126 is shown in Figure 3 9 The SJ300 generates a wandered DS1 reference that just meets the mask of GR 253 CORE Fig 5 9 This reference is used to time a SONET signal generator The resulting wandered OC N signal is provided to the SONET NE under test which is provisioned to derive its timing from the incoming OC N The OC N output from the NE is connected to the SJ300 receiver to measure its wander The wander data is uploaded to a PC to calculate TDEV DS1 Ref PRS DS1 Ref wandered Figure 2 11 Setup for Testing Conformance to Wander Transfer Specification R5 126 First reconfigure the setup for calibration by bypassing the SONET NE under test see dashed line in Figure 2 9 After the SJ300 starts generating the wander pattern allow the system to settle for two minutes and then start a 12 000 second calibration measurement of the wander Calculate correction factors by dividing the calibration TDEV values into the mask TDEV values in GR 253 CORE Fig 5 14 values listed in Appendix B Now configure the setup as

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