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UM10566 User Manual for OM7941/BGA7130LTE

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1. o Device models o Gerber files o Data Sheet BGA7130 e ESD safe casing 3 BGA7130 samples Several BGA7130 qualification samples are included These samples are qualification UM10566_1 All information provided in this document is subject to legal disclaimers NXP B V 2012 All rights reserved User manual Rev 1 11 September 2012 3 of 9 NXP Semiconductors UM1 0566 UM10566_1 5 1 5 2 5 3 User Manual for OM7941 grade 4 USB flash drive Check website for latest updates new application notes 5 LTE 750 RF board The performance of the LTE 750 application is described in the BGA7130 datasheet This section describes how to evaluate the provided board Interfaces The interfaces are defined in Fig 2 RF input is located at the top side RF output at the bottom sited ground enable and supply should be provided through the molex connector on the right hand side RF input GND GND ENABLE Vsup GND GND RF output Fig 2 Connecting the evaluation board top view Powering up To power the BGA7130 evaluation board connect a GND molex pin to ground the Vsyp molex pin to 5 V and the ENABLE molex pin also to a 5 V power supply It is good practice to avoid connecting the ENABLE pin to 5 V before Vsup is connected to 5 V If the voltage on pin ENABLE is higher than the voltage on pin Vsyp it might cause a current to flow through the ESD protection circuitry of the ENAB
2. LE pin On the boards provided a current limiting resistor R2 has been placed without it the ESD circuitry might be destroyed Powering down Setting the pin ENABLE to a logic LOW GND will disable the device All information provided in this document is subject to legal disclaimers NXP B V 2012 All rights reserved User manual Rev 1 11 September 2012 4of9 NXP Semiconductors UM1 0566 User Manual for OM7941 5 4 Evaluating the RF boards 5 4 1 S parameters and output compression point Both S parameters and the output compression P 1s point are measured with a network analyzer NWA as depicted in Fig 3 Network analyzer Optional BGA7130 PORT 1 Attenuator PORT 2 C Fig 3 S parameter and output compression power set up The Pigg is measured by sweeping the input power and observe where the Sz of the device has compressed 1 dB compared to the linear gain For this measurement an input power calibration with a power head has to be performed in order to accurately measure the input power The output power of the device is calculated by P dBm Pi dBm S2 dB In order to prevent that output signal drives the receiver of the NWA into compression an attenuator can be inserted at the input of the NWA In order to maintain small signal conditions for the S parameter measurements an input power of 20 dBm is applied 5 4 2 Output third order intercept poi
3. P Semiconductors be liable for any indirect incidental punitive special or consequential damages including without limitation lost profits lost savings business interruption costs related to the removal or replacement of any products or rework charges whether or not such damages are based on tort including negligence warranty breach of contract or any other legal theory Notwithstanding any damages that customer might incur for any reason whatsoever NXP Semiconductors aggregate and cumulative liability towards customer for the products described herein shall be limited in accordance with the Terms and conditions of commercial sale of NXP Semiconductors Right to make changes NXP Semiconductors reserves the right to make changes to information published in this document including without limitation specifications and product descriptions at any time and without notice This document supersedes and replaces all information supplied prior to the publication hereof Suitability for use NXP Semiconductors products are not designed authorized or warranted to be suitable for use in life support life critical or safety critical systems or equipment nor in applications where failure or malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury death or severe property or environmental damage NXP Semiconductors accepts no liability for inclusion and or use of NXP Semiconductors prod
4. UM10566 User Manual for OM7941 BGA7130LTE Rev 1 11 September 2012 User manual Document information Info Content Keywords BGA7130 OM7941 evaluation kit LTE 750 medium power amplifier Abstract This user manual describes the OM7941 BGA7130LTE evaluation kit for the BGA7130 medium power amplifier NXP Semiconductors UM1 0566 User Manual for OM7941 Revision history Rev Date Description 1 2012 09 11 Initial document Contact information For more information please visit http www nxp com For sales office addresses please send an email to salesaddresses nxp com UM10566_1 All information provided in this document is subject to legal disclaimers NXP B V 2012 All rights reserved User manual Rev 1 11 September 2012 2 of 9 NXP Semiconductors UM1 0566 User Manual for OM7941 1 Introduction The OM7941 BGA7130LTE customer evaluation kit enables the user to evaluate the performance of the BGA7130 medium power amplifier Please refer to the Data Sheet for information about the BGA7130 performance 2 Contents of Customer Evaluation Kit RF board e C D BGA7130 samples USB flash drive Fig 1 Content of OM7941 customer evaluation kit The evaluation kit contains the following items e RF board matched for LTE 750 MHz e BGA7130 samples e USB flash drive containing o User manual OM7941 BGA7130LTE
5. application or use by customers third party customer s NXP does not accept any liability in this respect Export control This document as well as the item s described herein may be subject to export control regulations Export might require a prior authorization from national authorities UM10566_1 All information provided in this document is subject to legal disclaimers Evaluation products This product is provided on an as is and with all faults basis for evaluation purposes only NXP Semiconductors its affiliates and their suppliers expressly disclaim all warranties whether express implied or statutory including but not limited to the implied warranties of non infringement merchantability and fitness for a particular purpose The entire risk as to the quality or arising out of the use or performance of this product remains with customer In no event shall NXP Semiconductors its affiliates or their suppliers be liable to customer for any special indirect consequential punitive or incidental damages including without limitation damages for loss of business business interruption loss of use loss of data or information and the like arising out the use of or inability to use the product whether or not based on tort including negligence strict liability breach of contract breach of warranty or any other theory even if advised of the possibility of such damages Notwithstanding any damages that cust
6. issccscsscsccccesccrsssecceessssiecasssecss 5 1 IntemaceS sisi cede indies Sei el es 5 2 Powering Up ceeeesceeeeesneeeeeseeeeeeneeeeeesneeerenanees 5 3 Powering dOWN sssseeseeiessrissrrresrrrrerrirrerrrnssrensne 5 4 Evaluating the RF boards 5 4 1 S parameters and output compression point 5 5 4 2 Output third order intercept point ee 5 5 4 3 INOISG E E N 6 6 Legal information sssssssenssnnnnenunnnnnunnnnnnnennnnnnnnn 8 6 1 DEfNWONS eiaeaen E 8 6 2 Disclaimers saasa aie E ERASE 8 6 3 LICENSES ieaiaia aa eaaa 8 6 4 PEMS e e oetene east canes 8 6 5 Trademarks cccccceceeceeeeeeeeeeeeeeeeeeeeeeneeeeeeeetees 8 7 EoI nin n S E E E E 9 NXP B V 2012 All rights reserved For more information please visit http www nxp com For sales office addresses please send an email to salesaddresses nxp com Date of release 11 September 2012 Document identifier UM10566_1
7. nt The output third order intercept point IP3o is a figure of merit for linearity see Fig 4 The set up see Fig 5 is configured to achieve an accurate measurement of the IP30 After the signal generators a low pass filter LPF and isolator is applied before combining the two signals This configuration gives best isolation between the generators hence IMD3 levels of the input signal lt 80 dBc can be measured Please refer to the Data Sheet for power levels and tone spacing UM10566_1 All information provided in this document is subject to legal disclaimers NXP B V 2012 All rights reserved User manual Rev 1 11 September 2012 5 of 9 NXP Semiconductors UM10566 UM10566_1 User Manual for OM7941 P dB PL dBm a poe i L dBm IP3o dBm o IMD3 dBc 2xfi f2 fi f2 2xf2 f1 f Hz Pi dBm Fig 4 Output third order intercept point definition Signal Low pass Isolator generator filter O Power BGA7130 Spectrum combiner analyzer Signal Low pass Isolator Wi gt generator filter Fig 5 Output third order intercept point measurement set up 5 4 3 Noise The Noise Figure NF is measured with a calibrated noise source with a specified Excess Noise Ratio ENR and with a spectrum analyzer with a noise measurement option The system is calibrated with this noise source in
8. omer might incur for any reason whatsoever including without limitation all damages referenced above and all direct or general damages the entire liability of NXP Semiconductors its affiliates and their suppliers and customer s exclusive remedy for all of the foregoing shall be limited to actual damages incurred by customer based on reasonable reliance up to the greater of the amount actually paid by customer for the product or five dollars US 5 00 The foregoing limitations exclusions and disclaimers shall apply to the maximum extent permitted by applicable law even if any remedy fails of its essential purpose 6 3 Licenses N A 6 4 Patents Notice is herewith given that the subject device uses one or more of the following patents and that each of these patents may have corresponding patents in other jurisdictions N A 6 5 Trademarks Notice All referenced brands product names service names and trademarks are property of their respective owners N A NXP B V 2012 All rights reserved User manual Rev 1 11 September 2012 8 of 9 NXP Semiconductors UM1 0566 User Manual for OM7941 7 Contents 1 PALF OCU CTION sis vccedesccsadectdcseedeniscedecateveeesecseteceeseests 3 2 Contents of Customer Evaluation Kit 3 3 BGA7130 Samples sccsseceseeeseeeeeeeeseeeeeseenenees 3 4 USB flashdrive ssiscsvissisccsecscsesusctics svsssenssvsctivesssents 4 5 LTE 750 RF DOard viss
9. order to measure accurate noise figures see Fig 6 All information provided in this document is subject to legal disclaimers NXP B V 2012 All rights reserved User manual Rev 1 11 September 2012 6 of 9 NXP Semiconductors UM10566 UM10566_1 User Manual for OM7941 Noise source Fig 6 Noise figure measurement set up BGA7130 Spectrum analyzer All information provided in this document is subject to legal disclaimers NXP B V 2012 All rights reserved User manual Rev 1 11 September 2012 70f9 NXP Semiconductors UM10566 6 Legal information User Manual for OM7941 6 1 Definitions Draft The document is a draft version only The content is still under internal review and subject to formal approval which may result in modifications or additions NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information 6 2 Disclaimers Limited warranty and liability Information in this document is believed to be accurate and reliable However NXP Semiconductors does not give any representations or warranties expressed or implied as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information In no event shall NX
10. ucts in such equipment or applications and therefore such inclusion and or use is at the customer s own risk Applications Applications that are described herein for any of these products are for illustrative purposes only NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification Customers are responsible for the design and operation of their applications and products using NXP Semiconductors products and NXP Semiconductors accepts no liability for any assistance with applications or customer product design It is customer s sole responsibility to determine whether the NXP Semiconductors product is suitable and fit for the customer s applications and products planned as well as for the planned application and use of customer s third party customer s Customers should provide appropriate design and operating safeguards to minimize the risks associated with their applications and products NXP Semiconductors does not accept any liability related to any default damage costs or problem which is based on any weakness or default in the customer s applications or products or the application or use by customer s third party customer s Customer is responsible for doing all necessary testing for the customers applications and products using NXP Semiconductors products in order to avoid a default of the applications and the products or of the

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