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1. PIXE OOOO PIGEORBSO OgOOOOOOOOOOOOOOOOO OOgOOOOOOOOOOOOOOOOO OOOOOOOOOOOOOOOOOOO OOOOOOOOOOOOOOOOOOOOO 21 PIXEOOOOOO eo eo ese nn ILMVOOOOOOODOO HV4117HC OOOOOOOOOOOOOOOO2. UO Development of simultaneous ion beam analysis with an ion accelerator Masaru NAKAMURA and Hiroaki ISE Abstract Elemental composition was determined by simultaneous ion beam analysis particle induced X ray emission PIXE particle induced gamma ray emission PIGE and Rutherford backscattering RBS PIXE provided data for elements from Al to U while the other techniques supplied information on elements lighter than Al like C N O F and Na The simultaneous analysis is fast non destructive and requires no sample preparation It is very suitable for determination of elements in suspended particulate matter The size distribution of carbon and trace elements in suspended particulate matter collected by a low pressure impactor has been investigated Sampling was carried out in Setagaya a typical residential area located southwest of Tokyo Japan The low pressure impactor has a cascade design with 12 stage collection plates allowing the collection of size fractionated suspended particulate matter Also in this paper the size distribution and element concentrations in the suspended particulate matter are discussed Keywords PIXE PIGE R
3. material CaF 2 860m 0 UO 99 3 12 2 2 85 ooooooooooooooooooooooolo RBs 23ummOOOOOOOOOOOO
4. ooOOOOOOOOOOOOOAO Micro Matter OO 2 m gt 2 3 3 3 1 FH 1 34 3 DO DO we 1 EJ EE El Bm Fig l Schematic diagram of ion beam analysis chamber 123channel BGO HHO 80channel cakaQOOOOOOOOOOOOO 20channel OOO 9290 9 PIGE OOOOOOOOOOOOOO 29 od
5. dan 197channel 2 3 Adelle 0 0 lu isa ah PINT species mT 3 T 7 J res 1 32 65 RBs 8 5 is5mmOOOOOOO 2 1 gt 09 ABSO PIGEQGOOOOOO PIXEOGO 33 Fig 2 Typical spectrum for a PIXE b RBS and c PIGE for AOOOOO 2 0MeV protons on a MicroMatter thin film standard crisis 0 1 0 0 0 0 2 2 2 1 1 1 er ET hE Ew Td Ea Sf crs RA os ff EE 3 Species O
6. 31 82 113channelg 68 6 63 5 gt 0 1 0 1 oool2ol 3 860 3469 020 25 65 56 PIGE OOO 555 Model 25195P LP ORTECOO Model ag ru 012 30 100QOOOOOOOOOOOOOOOOO 10 0 0 0 0 Princeton Gamma Tech Inc QO Si L OQ Model XPSS02 3048 GO PETOO lm OOOOOOOOOOO 6 5716205 20 OOOOOOOO 200
7. OOOO 3 W M aenhaut J L Jaffrezo R Hillamo T M akela V M Kerminen Nucl lnstr and M eth 8 150 9 1999 4 00 6 J R Tesmer and M Nastasi Handbook of modern ion beam materials analysis Materials Research Society 1995 7 OoOogRADIOISOTOPES 46 787 1997 8 David D Cohen Nucl lnstr and Meth B135 138 14 22 1998 9 David D Cohen Nucl lnstr and Meth B79 335 388 1993 10 M Nakamura H lse InternJ PIXE 7 87 1997 11 M Nakamura H lse Intern J PIXE 7 253 256 1997 12 M Nakamura H 156 Intern J PIXE 9 381 386 1999 OOOO lt lt 02 14 A Z Kiss E K oltay B Nyako 5 Somorjai A Anttila J Raisanen J Radioanal Nucl Chem 89 1 123 141 1985 2000 129 130 3 0 Oooo Table2 Analytical results of size distribution of carbon and trace elements in suspended particulate matter with a low pressure impactor by ion beam analysis Concentration of elements
8. Stage No C S Cl Fer uaim 0 4 6 7 12 1 31 32 29 111 2 8 21 46 80 3 33 20 41 113 4 18 18 13 77 5 1 76 10 48 39 6 2 05 1 7 11 7 0 95 39 7 1 0 81 6 3 2 0 41 26 1 3 0 53 12 4 0 49 17 1 RBS PIXE detet OO PIXEOOOOOOO 65 OOOO Es 3 7 OT OT I EE rons 37 0 7 gt gt 1 0 0 0 1 0 U 0 1 0 1 BREEN 1 S A E
9. Jonansson J L Campbell K G M almgvist Particle lnduced X Ray Emission Spectrometry PIXE john Wiley amp Sons Inc 1995 2 W M aenhaut R Hillamo T M akela J L Jaffrezo M H Bergin C l Davidson Nucl lnstr andM eth B 109 110 482 1996
10. BS lon beam analysis Accelerator Elemental analysis 5 1970OQOOOOOOOOO Johansson gOOOOOOOOOOOOOOOOOOOO
11. OOO gt 59 OOOOOOOOOOOOOOOOOOO goo rTabe Qo 023mm OO i18mmOOOOOOOOOOOOO Table 1 Specification of low pressure impactor model LP 20 Stage no cut off numbers of nozzle diameter nozzles diameter um mm 0 12 1 800 1 18 1 8 5 A400 1 18 2 5 7 21500 0 90 3 3 9 400 0 70 4 2 5 A400 0 50 5 1 25 400 0 35 6 0 76 400 0 25 7 0 52 216 0 25 L1 0 33 110 0 25 L2 0 22 80 0 25 L3 0 13 0 0 25 L4 0 06 110 0 25 23 DuU8 33OOO
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