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UV-1700 series SERVICE MANUAL SHIMADZU CORPORATION

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Contents

1. 5 4 6 3 2 ITEM No P N DESCRIPTION REMARK 1 062 65055 05 D2 Lamp L6380 2 062 65005 Halogen lamp NA55917 3 206 67036 Leaf spring For securing WI lamp 4 206 67035 Photo Coupler Assy 5 206 67017 Mirror Assy Light Source L205 83032 09 Mirror R 30 30 54 FR 6 034 03068 04 Spring E 560 For light source mirror 7 206 69622 Motor TS3214 N5015 8 206 88242 91 Lamp Cable Assy For WI lamp 9 206 55218 91 Cable D2 Lamp For D2 lamp 10 7 10 7 Optical Unit Assy P N 206 67014 01 ITEM No P N DESCRIPTION REMARK 1 206 69623 Harmonic Drive RH 8 SP 2 206 67027 01 Grating Assy L206 67029 01 Adherent Grating Grating with fixed pin 3 206 67024 01 Slit amp Filter Assy 4 206 67060 Toroidal Mirror Assy 5 206 67092 Mirror Assy For R side 6 206 67066 Mirror Assy For S side 7 206 90153 Beam Splitter B 30 36 F 1 8 205 8266 1 02 Window Plate W 30 Q 9 036 15501 21 O Ring AS568A 121 1A 10 206 60667 Coupler Board Assy 10 8 10 8 Cell Housing ASSY P N 206 60184 04 ITEM No P N DESCRIPTION REMARK 1 206 18009 01 Cell Housing 2 202 820
2. 3 7 Recommended Value The pass criteria value can be set to a recommended value Do not use this item at this point 3 Press the RETURN key twice to return to the instrument validation screen Now press the START key to implement inspection followed by printout of results 4 Check that wavelength accuracy is within 0 3nm Note With instrument validation set inspection items will be automatically implemented in order Setting selecting Yes for all of the parameters in the three items 3 4 Wavelength Accuracy 3 8 Baseline Flatness and 3 9 Noise Level in the acceptance procedures at time of installation makes inspections more convenient 3 4 2 Method Employing Holmium Oxide Solution Filter Specification Within 0 5nm For NIST SRM2034 Jig Holmium oxide solution filter NIST SRM2034 P N 220 9291 7 01 The Holmium oxide solution filter NIST SRM 2034 P N 220 92917 01 is also used to check wavelength accuracy in addition to the Hg and D2 lamps at time of shipping of the UV 1700 This explanation is for the Holmium oxide solution filter Note There are numerous Holmium oxide solution filters other than NIST SRM 2034 that are used to correct the wavelength of the UV 1700 Validation accuracy varies depending on the type of Holmium filter used Be sure to take into consideration the validation value accuracy of the filter being used The validation value accuracy for NIST
3. Wavelength drive motor defective Replace or readjust motor CPU PCB defective Replace CPU PCB 6 5 Wavelength Repeatability Exceeds Specification Probable Cause Action Wavelength drive motor defective Replace or readjust motor Optical system loose Readjust 6 6 Chapter 7 Parts Replacement This chapter explains the parts replacement of UV 1700 7 1 Main Unit Cover Removal 7 2 Console PCB Removal 7 3 Preamplifier PCB Removal 7 4 Power PCB Removal 7 5 CPU PCB Removal 7 6 ROM Replacement 7 7 Battery Replacement 7 1 7 1 Main Unit Cover Removal Fig 7 1 Main unit 1 1 Loosen screws 1 and remove sample compartment unit 5 4 t A A trot Fig 7 2 Main unit top 2 Remove cover screws 3 to 6 3 Slightly raise the rear of the cover slide the entire cover forward and lift up to remove Note A console PCB is mounted to the cover This board is connected tothe main unit so be careful about the cable when removing the cover 7 2 Console PCB Removal Fig 7 3 Inside of cover unit 1 Remove the mai
4. lib CARD 5 FL A99Y HIF6 26 iaia 208 94818 02 CABLE A99Y 5 14 PTY 206 84928 91 CABLE PRE AWP LED amp 144 206 67220 LED WITH CABLE r_ At Fury 206 80357 COVER PRE AWP 206 86026 04 CABLE GROUND T A WALL ASSY CELL COMP arl SAID 206 67082 01 Fig 9 4 UV 1700 electric system Explanation of Each Unit s Function Name P N Function PCB ASSY CPU X148 206 55200 91 CPU PGB that controls entire UV 1700 system It also performs A D conversion of photometric signals and processes signals PCB ASSY 206 55203 91 Supplies the system with power Also supplies the POWER X148 halogen lamp and Dz lamp with power PCB ASSY AMP X148 206 55206 91 Converts light detected at the detector Photodiode into electric signals and sends them tothe CPU PCB ASSY CONSOLE 206 67615 91 LCD module keyboard IC card etc are connected to this 9 4 Instrument Assignment Explanation 9 4 1 Function Block R side light beam Raters i d a CPU converter ROM A D F gt Ba converter S side preamplifier Detector RAM aul sng VRAM ca LCD control LCD OdEe SY I O port aounos UBI dn s 467 sounos jy S8UDIMS ubuajanem sanug JOVI SQUOUMS O I EUS XI Indino JQ UIK Sheet key peo DI Fig 9 5 Function block diagram 9 6 Fig 9 5 shows the UV 1700 function block diagram The CPU controls many of the operations such as light sou
5. 5 Insert the provided power cable to the power connector on the left side of the main unit 6 Insert the power cable in the power outlet 2 5 2 4 Instrument Baseline Correction Once installation is complete be sure to carry out instrument baseline correction following the steps below 1 Turn ON the power switch of the UV 1700 After checking that initialization has ended correctly energize the instrument for at least 30 minutes to stabilize it Maintenance 1 Validation 2 Instrument Baseline Correction Corrected date 01 03 30 11 36 00 3 Lamp time used 2 Press the F3 key Mainte on the Mode WI Lamp ae selection screen to display the screen on the D2 Lamp i2vhoues left 3 Press the 2 key to execute instrument o mm baseline correction PoE EL ES Ao 4 Instrument baseline correction requires Fig 2 2 Maintenance screen approximately 15 minutes Once correction is complete correction date and time will be displayed in the column where previous correction date and time were located Note Press the START STOP key during instrument baseline correction to halt correction operation If correction operation is halted the Not corrected will be displayed in the column where previous correction date and time were located A problem may occur if measuring is performed with instrument baseline correction in the halted status Be sure to rerun instrument baseline correction after resolvi
6. 54 075 33487 39 IC TC74HC125AP U 35 55 075 35806 01 IC HD63B09 U 36 56 075 30403 02 IC M62021P U 37 57 075 31289 33 IC uPD43256BCZ 70LL U 38 10 12 ITEM No P N DESCRIPTION REMARK 58 075 31836 01 IC wPD71055C U 40 41 59 075 39110 01 IC SI 7501 U 42 60 075 39109 03 IC SLA5015 U 43 61 075 39109 01 IC SLA5011 U 44 62 075 20007 02 IC SN74LSO7N U 45 63 075 20006 02 IC SN74LSOGN U 46 64 075 31140 34 IC yPC7915AHF U 48 65 075 31134 12 IC yPC7815AHF U 49 66 075 31827 01 IC wPD71054C U 50 67 075 31836 01 IC yPD71055C U 51 52 68 075 31908 02 IC UPA1500BH U 53 54 69 074 88025 02 IC YDS 212 S2 U 56 70 075 39115 05 IC SI 8301L U 57 71 061 86480 08 Oscillator AT 51 8 000 X 1 72 061 86480 12 Oscillator AT 51 4 000 X2 10 13 10 11 PCB ASSY Power P N 206 55203 91 ITEM No P N DESCRIPTION REMARK 1 206 55219 Radiator 2 060 01887 DI 151887 D1 3 4 3 060 13956 14 DI RD6 2JS AB1 D2 4 060 15840 01 DI RBV 406B D5 5 060 18924 01 DI GBU8D D6 6 060 15025 02 DI 1D4B42 D7 7 072 02010 11 Fuse 23706 3 F1 3 8 072 02004 13 Fuse 218 500 F2 9 072 02010 08 Fuse 237004 F4 10 072 05648 02 Fuse Holder OGN0031820 FH 1 2 3 4 11 070 50697 11 Connector B2P VH J101 12 070 50697 43 Connector B4P7 VH J102 13 070 50697 14 Connector B5P VH J103 14 070 50697 17 Connector B8P VH J104 15 070
7. and uses the amount of curve to check baseline flatness Specification Checking Method 1 Press the 5 key at the auto items screen to display the baseline flatness parameter settings screen Set the parameters to match those shown in figure 3 11 Inspection Each press of the 1 key selects Yes or deselects No the inspection Set inspection to the Yes item Scanning Range Press the 2 key to enable input of the wavelength scanning range to be measured Within 2mAbs note that shock noise should be within 4mAbs Baseline flatness l Inspection Yes 2 Scanning Range 1100 0 190 0 nm 3 Tolerance 2 mABS Input item No ESSI I a Fig 3 11 Baseline flatness parameter settings screen for the spectrum measurement Set to the 1100 0nm to 190 0nm range Tolerance Press the 3 key to enable input of pass criteria value Input range is 1 to 99 Input the 2 value Recommended Value The pass criteria value can be set to a recommended value Do not use this item at this point Press the RETURN key twice to return to the instrument validation screen Now press the START key to implement inspection followed by printout of results Check that baseline flatness is within 2mAbs Also visually check spectrum to see that shock noise is within 4mAbs Shock noise easily occurs at the following stray light cut filter switching wavelengths and light source switching wavelengt
8. the beam size at the center of the cell holder is as follows Beam size H 9mm x W 0 5mm Cell Cell holder Beam 15mm Loyi 25mm T Fig 9 3 Beam position 9 3 Electric System Fig 9 4 shows the UV 1700 electric system diagram M9 FAGSY 206 55261 91 TRAWSFORWER AgaY FTSZASIY 206 67041 02 03 04 BRACKET 135 206 55255 At i LIYA dba TRAMAFORMER INLET I po I im FANO PCB Agay RE SIT POWER X148 i 206 55203 91 I I i 1102 1101 E DEE E T TE oa gayet chi S23 a l one ros bo gs 4s x AEH YA Lui i 018 1710102 Tia PIE l aH Pa e Na In No I I I tigo ADY HALOGEN LAWP x AF73 YS Dog AHP i 018 1710102 SHIELD STICKFINGER age 5 ear s Sates SOURCE H l 5 ibt 2H4t fe PHOTO 3ENWN30R 19 4vTA99Y 206 67019 02 LAMP HOUSING Aggy ICEMTROWICS IRa zazc 1170 2 BOTTON PLATE AJAY YISFAIGIY 206 55258 91 1170 1 PEB ASSY CPU X148 206 55200 91 f Th Jthtod 208 94866 01 CABLE PHOTO SEWSOR REUT 5 GRATING WOTOR HiT EFA 2449 E Tt kh it 4 PHOTO S3EWSOR FILTER WOTOR 1292223 A99Y 206 67014 01 OPTICAL UNIT AgaY i Th tr i 208 94817 01 CABLE WITH senann COVER UNIT AA 206 67050 02 03 CH304 CN303 CN302 PCH AGIY CONSOLE 206 67615 91 CH305 CH301 l resse sese ea AA IVA ti a 2124 506 30250
9. tighten the tilt adjustment bolts until they lightly touch the flange of the plate Grating Tilt adjustment bolts B fixing screw Fig 8 23 Grating holder side view 5 Loosen the fixing screw A holding the grating 6 Rotate the grating until the beam band is parallel with the marking line on the adjusting jig And retighten the fixing screwA Beam band diffracted light Center of continuous spectrum diffracted light 40mm Make these parallel Floor surface Fig 8 24 Beam on Adjusting Jig 7 Place the grating mask again 8 Slightly loosen the fixing screw B And align the diffracted light center with the centerline horizontal line of the adjusting jig using the following procedure When diffracted light center is above adjusting jig centerline horizontal line Use the topside tilt adjustment bolt to align diffracted light center with adjusting jig centerline and tighten tilt adjustment bolt Now retighten the fixing screw B and recheck alignment Repeat procedure if alignment is not satisfactory 8 22 When diffracted light center is below adjusting jig centerline horizontal line Use the bottom side tilt adjustment bolt to align diffracted light center with adjusting jig centerline and tighten tilt adjustment bolt Now retighten the fixing screw B and recheck alignment Repeat procedure if alignment is not satisfactory 9
10. validation parameters 3 Press the 2 key to switch auto print ON and OFF If auto print is set to ON inspection Input item No results and data will be automatically printed out when validation inspection items are Fig 3 2 Inspection settings screen implemented Set this to ON for performance checks 3 3 3 2 3 Printout Press the F1 key to printout the inspection results just obtained Inspection results are stored in backup memory so they will be saved even if the power is turned OFF Note however that the printout function does not printout graph data such as spectrum and time course To printout inspection results containing such graph data set auto print to ON at the inspection settings menu see item 3 2 2 and actually implement the inspections 3 2 4 Semi Auto Validations 1 Press the 1 key at the instrument validation screen see Fig 3 1 Now select 1 Semi auto 1 Photometric Accuracy Ta i 2 Photometric Repeatabilit items the password screen will appear so o ii 3 Stray Light input the password just press the ENTER key if a password is not required The Settings of Semi Auto items screen will be displayed 2 Select one of the items 1 to 3 to enter the parameter settings screen for that inspection i i Input item No to ch ters item Setting changes to Inspection Yes No PPUT ITEM NO Fe change parameters inspection parameters and pass criteria Fig 3 3 S
11. 50695 10 Connector 171825 2 J105 16 065 61979 45 Relay G6C 1114P DC24V K1 17 065 61982 61 Relay G6B 2214P FD US K 2 3 18 060 28314 02 TR 2SD1314 SMZ Q1 19 058 00001 Spark arrester S120033 SK 1 2 3 4 5 20 066 81012 74 SW OHD 5R 90B SW 1 10 14 10 12 PCB ASSY Preamp BOARD AMP X148 ss 206 552078 SSY 206 55206 91 apa AN ra a ae lg Shu ws I P N 206 55206 91 TETEL ITEM No P N DESCRIPTION REMARK 1 061 70628 27 Photodiode S1336 8BQ D1 2 2 070 51941 44 Connector DF11 10DP 2DS22 J201 3 050 50403 29 R GS 1 2B 200M J R 1 2 4 071 06102 Terminal PTFE VTA 3 T 1 2 5 075 23758 05 IC AD645KN U1 2 6 016 37551 Tube PTFE 0 60 0 25 7 016 43211 20 PE Tube 2 0 2CL 1M 8 055 85830 18 C ECCF1H470J C1 2 10 15 10 13PCB ASSY Console P N206 87615 92 ITEM No P N DESCRIPTION REMARK 1 058 82049 05 L 8RB187LY 221K L1 2 070 51790 45 Connector HIF6A26PA1 27DS P301 3 070 53621 07 Connector FH3 13S 1 27DS P302 4 070 51941 47 Connector DF11 16DP 2DS22 P303 5 070 54122 03 Connector IL G 4P S3L2 SA P304 6 070 54201 04 Connector FCN565P068G C22 P305 7 060 21015 TR 2SA1015 Q1 8 075 39074 01 IC SED1335F0A U1 9 075 30320 90 IC M5M5256DFP 70LL U2 10 228 34062 91 Kanji ROM JIS1 16DOT U3 11 075 33492 93 IC TC74HCT245AF U5 12 075 33493 20 I
12. 91 PCB Assy CPU 6 206 55203 91 PCB Assy Power 7 206 55206 91 PCB Assy Preamp 8 206 67220 LED Assy 10 4 10 4 Cover Unit P N 206 67050 i TA LI ITEM No P N DESCRIPTION REMARK 1 206 86521 92 Cover Assy 2 206 67080 Display ASSY 078 12114 11 LCD DMF 50174NF FW7 LCD unit 208 94869 01 Cable LCD 3 206 69620 Keyboard UV X 4 206 67514 01 Lid Assy Light Source 5 206 69057 Sample compartment cover 6 206 80372 Hinge Assy 7 206 87615 92 PCB Assy Console 10 5 10 5 Transformer Assy P N 206 67041 i 3 PO I i pen h li il 1 Ot ea i 2 il TE 4 Sea tN l IBOYA 50 BOH2 fpSocpaovi 2A i 5 i i RE La erica Tor ITEM No P N DESCRIPTION REMARK 1 205 55220 Transformer UV 1700 2 208 96117 Fan MMS 08C24DS ROH 3 071 21601 Terminal T 375 Black 4 064 28246 01 SW 1832 3311 5 206 82616 91 Line Filter Assy 5 206 87700 91 Line Filter Assy for CE CE version 10 6 10 6 Light Source Assy P N 206 67019 02
13. Check that all screws and bolts have been tightened 23 Check that no fingerprints and contamination are left on any mirror lens or windowpane And reattach the covers and sample compartment unit 8 3 5 Writing Constants into EEPROM 1 Setting Filter Position 1 Select 1 Drive check from maintenance mode top menu followed by 3 Filter PM to 1 Wavelength drive PM 2 Light source mirror PM keys will be displayed at the bottom of the screen 4 Cell drive Multicell 6 PM 2 The No filter part of the stray light cut 5 Sipper PM 6 CPS 240 7 RS 232C rotate the stray light unit filter Function filter is moved to the exit slit position with filter rotation Check that the exit slit is aligned with the center of the opening of the 1 2 3 If it is not centrally aligned press the F1 Fig 8 29 Filter PM screen No filter position key to change phase The filter will rotate and the No filter position will move Check that the exit slit is aligned with the center of the opening of this No filter position Repeat this operation until alignment is achieved 4 When the position is aligned press the F 3 key to save position in EEPROM The EEPROM item will be highlighted if the position is saved 8 27 Exit slit No filter position Fig 8 30 Stray light cut filter 2 Zero Order Light Search Point Set 1 Select 2 Optics check from maintenance mode top m
14. D2 Lamp The WI lamp detection screen will light up The spectrometer will initialize And the D2 lamp will light up After approximately two minutes a message will request you to set the mercury lamp align positions and press the ENTER key If the multicell 6 cells sample compartment is to be used insert a Holmium oxide solution filter in cell 2 Press the ENTER key A message requesting you to wait will be displayed After this the Hg and D2 wavelength lines will be measured The data displayed on screen is the peak data for the wavelength lines If the standard sample compartment is used follow the screen message by inserting the Holmium oxide solution filter in the cell holder after the D2 line has been measured and press the ENTER key After the Holmium oxide solution filter has been measured follow the screen message by removing the Holmium oxide solution filter Wavelengths will be corrected after measuring and measured again Each wavelength will be automatically corrected over approximately 25 minutes When this finishes a wavelength table of the Hg and D2 spectral line will be displayed An example of such a wavelength table is shown in Fig 8 37 8 33 Example of Wavelength Table with Correction Results for Hg Lamp and D2 Lamp Standard Measured Error Half width wavelength wavelength value 191 2 191 2 0 0 0 9 253 7 253 6 0 1 0 6 289 4 289 4 0 0 0 5 296 7 296 7 0 0 0 6 334 1 334 1 0 0 0 6 40
15. J211 20 070 02832 11 Connector JEY 9S 1A3G J212 10 11 ITEM No P N DESCRIPTION REMARK 21 070 02832 12 Connector JAY 15S 1A3G J213 22 206 86450 91 Connector J214 23 070 27311 42 Connector HR12 10R 8SDL J215 24 070 51929 01 Connector DF1 2P 2 5DSA J216 25 070 52392 04 CN HIF3F 26PA2 54DSA J217 26 070 50695 02 Connector 171825 4 J218 27 070 02120 97 Cap DB 25S DC1 JC11 28 070 02120 95 Cap DE 9S DC1 JC12 29 070 02120 96 Cap DA 15S DC1 JC13 30 070 01610 Cap 5714S JC14 31 075 23690 01 IC ADG201AKN U1 2 3 32 075 28415 02 IC OPO7CP U 4 5 33 075 23714 03 IC AD652AQ U 6 7 34 075 33487 07 IC TC74HCU04AP U 8 35 075 33487 02 IC TC74HC02AP U9 36 075 33487 92 IC TC74HC245AP U 10 15 23 37 075 33488 16 IC TC74HC367AP U 11 12 22 38 075 30346 10 IC M5M51008BP 55LL U 14 39 075 33487 20 IC TC74HC32AP U 16 40 075 33487 46 IC TC74HC138AP U 17 19 41 075 33488 65 IC TC74HC688AP U 18 42 075 33487 00 IC TC74HC00AP U 20 43 075 33487 05 IC TC74HCO4AP U 21 55 44 075 33999 03 IC TD62003P U 24 47 45 075 33997 02 IC TD62064P U 25 46 075 20006 IC SN7406N U 26 47 075 31836 01 IC uPD71055C U 27 48 075 33487 15 IC TC74HC14AP U 28 49 075 33487 08 IC TC74HCO5AP U 29 30 50 075 38015 01 IC MSM62X42BRS A U 31 51 075 31827 01 IC uPD71054C U 32 52 075 35803 11 IC HD63B50P U 33 53 075 38619 01 IC LT1081CN U 34
16. down the START key and turn ON the main unit power Release the START key when the buzzer beeps TE 2 0ptics check 2 The sound of stray light cut filter origin Seca dla detection can be heard after approximately five seconds And the top menu of the maintenance mode will be displayed 3 Turn OFF the main unit power after using the maintenance mode 4 To perform normal measuring turn ON the ll leer power again and wait for initialization to end Fig 8 1 Maintenance mode screen PRINTER F1 key Select the printer type connected to the UV 1700 And set the Yes NO items for date inclusion and function key inclusion settings 8 2 2 Outline of Drive System Check Select 1 Drive check at the top menu screen to display the menu shown in Fig 8 2 Each motor s operation can be checked and stray Wavelength areas Light source mirror PM Filter PM 1 2 light cut filter offset input can be done at this 3 4 Cell drive Multicell 6 PM 5 6 7 screen Sipper PM CPS 240 RS 232C Fig 8 2 Drive check screen 1 Wavelength Drive PM Select this item to rotate the grating This is used to adjust the grating unit and move the line on the exit slit It cannot be used to set 2 Light source mirror PM 3 Filter PM 4 Cell drive Multicell 6 PM 5 6 7 1 Drive check special wavelengths Press the 1 key to select wavelength drive PM Function keys will be di
17. lamp image center is aligned with the entrance slit and retighten the set screw of the holder Be sure to double check the following two items Thelight beam is irradiating over the entire grating Theorigin detection pin is parallel with the mirror face 8 19 2 Adjustment of WI Lamp Holder Height 1 Press the F4 key at the 2 Light source mirror PM screen to extinguish the D2 lamp 2 Press the F3 key to light up the WI lamp Put the light source mirror motor into drive and align the WI lamp beam over the entrance slit Press the F 1 key to quickly rotate the light source mirror in the anticlockwise direction and press the F 2 key to quickly rotate it in the clockwise direction Press either the F 1 key or F 2 key once to start light source motor rotation and press again to halt Press the cursor key for one step drive 3 Loosen the fixing screw of the WI lamp holder Adjust the height of the WI lamp holder to align the WI lamp beam center with the entrance slit And tighten holder fixing screw Take care not leave fingerprints on the lamp during this task i Slit WI lamp holder WI lamp beam WI lamp holder fixing screw p He Fig 8 20 WI lamp holder height adjustment 4 Placearuling adjusting jig jig and ruling between entrance slit and grating 5 Check that the beam center is aligned with the adjusting jib center in the height direction 8 20 8
18. light up the WI lamp Press this again to extinguish the lamp F4 key Press this to light up the D2 lamp Press this again to extinguish the lamp Press the RETURN key to return to the drive check screen 8 5 3 Filter PM Use this to operate the stray light cut filter and memorize filter positions Press the 3 key to select the Filter PM Function keys will be displayed at the 1 Wavelength drive PM 2 Light source mirror PM 4 Cell drive Multicell 6 PM 5 Sipper PM 6 CPS 240 7 RS 232C bottom of the screen 1 2 Fig 8 5 Filter PM screen e PhaseChg F1 key Use this to select the phase 1 to 7 for stepping motor Fig 8 5 shows phase 1 as being selected FILTER F2 key Use this to select filters filters are displayed in order EEPROM F3 key Use this to memorize the currently selected stepping motor phase in EEPROM Curt Phs F4 key The stepping motor phase currently memorized in EEPROM is displayed above Press the RETURN key to return to the drive check screen 4 Cell Drive Multicell 6 PM Use this to operate the special accessory multicell holder Press the 4 key to select the cell drive multicell 6 PM Function keys will be displayed at the bottom of the screen TWavye length ae eee 2 Light source mirror PM 3 Filter PM 4 Cell drive Multicell 6 PM 5 Sipper PM 6 CPS 240 7 RS 232C E SES SS Fig 8 6 Cell drive PM scr
19. of UV 1700 Once the installation site has been decided install the UV 1700 in accordance with the following procedures 2 3 1 Power Check The UV 1700 uses a 130VA power supply Be sure to use a power supply of at least 130VA if a PC system is to be used PC and printer power supplies must be taken into consideration as well Also power supply voltage fluctuation tolerance is 10 Use a low voltage instrument if voltage fluctuation exceeds 10 2 3 2 Grounding The UV 1700 power cable has three wires including a ground wire Check to see that the power outlet has a ground terminal If the power outlet does not have ground terminal be sure to ground the instrument using the ground terminal of the standard accessory ground adapter 071 60803 01 or the ground terminal on the left side of the instrument 2 3 3 Instrument Installation and Power Cable Connection 1 Install UV 1700 in location that will not hinder ventilation for cooling fan situated on left side of instrument 2 Check that the power switch on the main unit is OFF with O pressed 3 Check that the voltage setting of the input voltage changeover switch corresponds to the working supply voltage If differing power voltages are displayed open the fuse holder using a slotted screwdriver pull out the round plug and insert it at the location displaying the used power voltage 4 Check that a 4 0A fuse is used in the 100V system and that a 2 0A fuse is used in the 200V system
20. source motor Detection of light source motor origin by Normally 0 initialization photosensor Error Origin detection defective org coarse Detection of wavelength motor origin by Stepping motor step count photosensor value during detection Detection of multicell origin if connected Pass Count of 30 000 or Error Origin detection defective less W Lamp energy Detection of optimum position of light source switch mirror after it has been scanned by WI lamp side Error Insufficient energy Energy count value Pass Count of 1 000 or more Error 0 x Org fine WiZero order light search using WI lamp Energy count value Error Insufficient energy Pass Count of 1 000 or more D2 energy Detection of optimum position of light Energy count value source switch mirror after it has been Pass Count of 1 000 or scanned by Dz lamp side more Error Insufficient energy Error 0 check Detection of D2 lamp 656 1nm line for use 656 1nm energy count as wavelength origin value Error Insufficient energy Pass Count of 425 or more Chapter 10 Parts List This chapter lists the parts configured in the UV 1700 10 1 Instrument Configuration List 10 2 UV 1700 Main Unit 10 3 Main Unit 10 4 Cover Unit 10 5 Transformer Assy 10 6 Light Source Assy 10 7 Optical Unit Assy 10 8 Cell Housing Assy 10 9 Slit amp Filter Assy 10 10 PCB ASSY CPU 10 11 PCB ASSY Power 10 12 P
21. ten minutes for the lamp to sufficiently cool Check that the lamp has cooled down and then replace Warning label WARNING DANGER Electric Shock Be sure to turn OFF power and disconnect power cable before replacing a fuse to avoid electric shock Warning label Chapter 2 Installation This chapter explains how the UV 1700 is installed Be sure to adhere to the procedures in this chapter when performing installation work so that the instrument performs appropriately to ensure customer satisfaction 2 1 Inspection of Parts 2 2 Selection of Installation Site 2 3 Installation of UV 1700 2 4 Instrument Baseline Correction 2 1 2 1 Inspection of Parts UV 1700 standard contents are shown in Table 2 1 and figure 2 1 Check these together with the customer to see that all parts have been delivered Table2 1 Standard Contents Description P N Qty 1 Spectrophotometer UV 1700 Main unit 1 For 230V CE area 206 55403 34 For 100V area 206 55403 91 For 120V area 206 55403 92 For 220V area 206 55403 93 For 240V area 206 55403 94 2 Standard Accessories One of the following For 100V 120V area 206 67099 For 220V 240V area 206 67099 01 2 1 AC Power Cable One of the following 1 For 100V 120V area 071 6081 4 01 For 220V 240V area 071 6081 4 05 2 2 Fuse One of the following 2 4 0A For 100V 120V area 072 02004 22 2 0A For 220V 240V area 072 02004 19 2 3 Grounding Adaptor For100V 12
22. the 2 key is pressed the Abs T will change together with pass 5 30 Filter S N 87654321 Good THRU 01 03 30 Tolerance Ave tlmAbs Input item No Es E E Fig 3 15 Photometric repeatability parameter settings screen criteria value for the inspection filter Use the Abs mode Check A Specify the inspection wavelength for measuring the photometric value Use the 635 0nm wavelength 10 Filter and 30 Filter Set the serial number S N expiration date pass criteria standard value Recommended Value The pass criteria value can be set to a recommended value Do not use this item at this point 3 20 3 Press the RETURN key twice to return to the instrument validation screen Now press the START key to implement inspection Take out and put in inspection filters in accordance with screen instructions Results will be printed out when the inspection is completed 4 Check that the results conform to the specifications 3 21 3 12 Stray Light Stray light is defined as light intensity of a wavelength other than the set wavelength light intensity of set wavelength Here the transmittances at 220nm of sodium iodide aqueous solution 10g l and at 340nm of sodium nitrite aqueous solution 50g 1 or a UV 39 filter are determined and the amount of stray light in each wavelength checked Specification Less than 0 04 for both 220nm and 340nm Jig Shutter block P N 202 30338 Cell containing s
23. wavelength tables this is contained on a separate EEPROM in the case of the UV 1600 There is a copy of this information in the backup RAM which is written to the new ROM when instrument power is turned ON after ROM replacement Therefore instrument readjustment is not needed after ROM replacement Note however that backup battery problems etc May lead to incorrectly stored data in the backup RAM so data renewal may be incorrect Check that the backup RAM data is correct before replacing ROM 7 7 Battery Replacement 1 Backup RAM stores data using a battery CR2032 P N 074 73307 01 even when the instrument power is OFF Replace the battery using the following procedure if it is exhausted Pull out CPU PCB from right side of main unit see item 1 of 7 5 2 Removeold battery And load new one 3 Correctly replace CPU PCB 4 Hold down the START key and turn ON instrument power Release the START key when the buzzer beeps 5 The instrumento starts up in 1 Drive check 2 0ptics check 3 Condition set maintenance mode see Fig 7 7 Select 3 Condition set at this screen ee eee ee 6 Select 4 Data init after battery Fig 7 7 Maintenance mode screen change at the condition set screen 7 5 7 A message will ask you if you really want to rewrite Press the START key to select the Yes item Press any other key to select the No item Here press the START key to initial
24. 00 1 2 UV 1700 Outline UV 1700 PharmaSpec a spectrophotometer for ultraviolet and visible region that is the first in its dass to amply clear the 1nm resolution barrier to conform to wavelength resolution regulations specified in the European Pharmacopoeia is a sister instrument to the highly rated UV 1600 The UV 1700 has the following features Conforms to specifications and functions wavelength accuracy resolution and photometric accuracy etc laid down in the European USA and J apanese Pharmacopoei as Provided with hardware validation functions as standard Supports IQ and OQ Compact light spectrophotometer LCD and designated keys enhance ease of operation 1 3 Intended Use Receiving service training is a prerequisite for the correct use of this manual Note that Shimadzu will not bear responsibility for problems that may occur when a person who has not received specific service training operates the instrument according to this manual 1 2 1 4 Warning Labels on Instrument Warning labels are attached to the UV 1700 in the following two locations Be sure to thoroughly read the instruction manual in advance and adhere to instructions provided when replacing lamps or fuses to avoid injuries such as burns and electric shocks WARNING DANGER High Temperature The light source and light source compartment become extremely hot during operation To replace the lamp turn the power OFF wait at least
25. 08 94817 01 CABLE AITH 3EKAOR COVER UNIT A 206 67050 02 03 lic CARD CN305 4 FhAdSY HIF G 26 208 94818 02 CABLE Aggy 5 14 Pury 206 84928 91 CABLE PRE AWP LEDF 145 206 67220 LED WITH CABLE WALL AJAY CELL COWP ENA FAITY 206 67082 01 CONSOLE 5 91 T RIdy CN301 206 86026 04 CABLE GROUND CH304 CN303 CN302 pep aggy i 206 6761 At Fury 206 380357 COVER PRE AWP
26. 09 91 Holder Cell Assy 3 204 00570 Screw 4 206 60165 Plate 5 204 07348 Slide plate 6 206 80401 Cover sample compartment 10 9 10 9 Slit amp Filter Assy P N 206 67024 01 1 5 4 ITEM No P N DESCRIPTION REMARK 1 206 67026 Filter Gear Assy 2 206 67087 Motor holder 3 206 69621 Motor PFC25 24 1 4 034 03057 02 Spring E 562 5 026 66213 Snap ring E type SUS 5 10 10 10 10 PCB ASSY CPU s zas pe eal N P N 206 55200 91 ITEM No P N DESCRIPTION REMARK 1 074 73307 01 Battery CR2032 BT 2 2 078 20159 01 BUZZER TMB 05 BZ 1 3 060 15837 03 DI RK34 D1 4 060 15025 01 DI 1B4B42 D2 5 060 13923 02 DI RD10E B1 D3 4 6 060 15428 01 DI MA150 D5 7 072 02004 13 Fuse 218 500 F1 2 3 8 072 05648 02 Fuse Holder 0GN0031820 FH1 2 3 9 070 50697 12 Connector B3P VH J201 10 070 50697 14 Connector B5P VH J202 11 070 50695 08 Connector 1 171825 0 J203 12 070 51929 05 Connector DF1 6P 2 5DSA J204 13 070 50695 04 Connector 171825 6 J205 14 070 51941 24 Connector DF11 10DP 2DSA J206 15 070 50695 01 Connector 171825 3 J207 16 070 51929 02 Connector DF1 3P 2 5DSA J208 17 070 51941 23 Connector DF11 8DP 2DSA J209 18 070 51790 56 CN HIF6A 26PA1 27DSA J210 19 070 02832 21 Connector JBY 25S 1A3F
27. 0V only 071 60803 01 1 3 Instruction Manual 206 94783 1 Installation amp Maintenance 4 Instruction Manual Operation 206 94785 1 Certificate of Compliance 206 84934 56 Fig 2 1 Standard contents items 5 is not displayed 2 3 2 2 Selection of Installation Site Meet with the customer and decide upon a suitable installation site before commencing installation of the UV 1700 And be sure to install the instrument in a site that conforms to the following parameters to ensure that the instrument will perform appropriately and stably over a long period Room temperature 15 C to 35 C Out of direct sunlight No strong vibration or continuous weak vibration Away from devices emitting strong magnetic fields electromagnetic fields or high frequencies Humidity 45 to 80 Away from corrosive gases and organic or non organic gases with absorbency in the ultraviolet region Away from dust Installation workbench must be able to bear the UV 1700 s weight of 17kg if a PC system is to be used PC and printer weights must be taken into consideration as well Note that the dimensions of the UV 1700 are W 550 x D 470 x H 380mm 200mm high when LCD is retracted Therefore the installation site needs to be at least W 700 x D 500mm A power switch and cooling fan are mounted on the left side of the main unit Install the instrument in a location where ventilation will not be hindered 2 4 2 3 Installation
28. 206 98366A UV Vis Spectrophotometer UV 1700 series SERVICE MANUAL 206 55401 34 for 230V CE 206 55401 91 for 100V 206 55401 92 for 120V 206 55401 93 for 220V 206 55401 94 for 240V SHIMADZU CORPORATION ANALYTICAL INSTRUMENTS DIVISON KYOTO JAPAN Contents 1 Introduction 1 1 About the Service Manual 1 2 UV 1700 Outline 1 3 Intended Use 1 4 Warning Labels on Instrument 2 Installation 2 1 Inspection of Parts 2 2 Selection of Installation Site 2 3 Installation of UV 1700 2 4 Instrument Baseline Correction 3 Performance Checks 3 1 Notes on the Performance Checks 3 2 How to Use Instrument Validation 3 3 ROM Check 3 4 Wavelength Accuracy 3 5 Wavelength Repeatability 3 6 Resolution 3 7 Baseline Stability 3 8 Baseline Flatness 3 9 Noise Level 3 10 Photometric Accuracy 3 11 Photometric Repeatability 3 12 Stray Light 4 Acceptance Procedures 4 1 Acceptance Procedures 5 Periodical Check 5 1 Daily Checks 5 2 Monthly Checks 1 1 1 2 1 2 1 2 1 3 2 1 2 2 2 4 2 5 2 6 3 1 3 2 3 3 3 7 3 10 3 11 3 12 3 13 3 15 3 17 3 20 3 22 4 1 4 2 5 1 5 2 5 2 6 Troubleshooting 6 1 An Error Occurs During Initialization 6 2 Baseline Flatness Exceeds Specification 6 3 Noise Level Exceeds Specification 6 4 Wavelength Accuracy Exceeds Specification 6 5 Wavelength Repeatability Exceeds Specification 7 Parts Replacement 7 1 Main Unit Cover Removal 7 2 Console PCB Removal 7 3 Preampl
29. 3 3 Adjustment of Grating The spectral band created by the grating is used to adjust ruling and inclination of grating 1 Follow steps 1 to 3 of item 8 3 2 2 to align the WI lamp beam over the entrance slit 2 Select 1 Drive check from maintenance L Wave Lend eh aetve EM 2 Light source mirror PM 3 Filter PM 4 Cell drive Multicell 6 PM 5 6 7 mode top menu followed by 1 Wavelength drive PM 3 Press the F 3 key to light up the WI lamp Sipper PM CPS 240 RS 232C Press cursor key for 1 step drive ESSE Fig 8 21 Wavelength drive PM screen 1 Aligning with Adjusting Jig 1 Place the adjusting jig and ruling in front of exit slit height of jig centerline 40mm Temporarily remove grating mask 2 Put the grating motor into drive and direct the diffracted light band primary light on the right side of the zero order light onto the adjusting jig Halt grating motor drive at the point when red and green beam bands hit the adjusting jig Use the F 1 key and F 2 key to move the grating motor at high speed towards either the short wavelength side or long wavelength side Press either F1 or F2 key once to start drive and press again to halt Use the cursor key for one step drive 3 Loosen the B fixing screw and tilt adjustment bolts Fixing screw A Tilt adjustment bolts Fixing screw B Fig 8 22 Grating holder rear view 8 21 4 Retighten the fixing screw B Next
30. 4 7 404 7 0 0 0 6 435 8 435 8 0 0 0 6 486 0 486 0 0 0 0 6 546 1 546 0 0 1 0 6 656 1 656 0 di 0 5 761 1 761 1 0 0 0 7 809 4 809 4 0 0 0 7 871 6 871 6 0 0 0 9 1014 0 1013 8 0 2 1 9 TBL prt Fig 8 37 Wavelength correction results 7 Check that the measured wavelength s amount of error from the standard wavelength is within the specification 0 3nm 8 Press the F1 key to display the wavelength table with correction results for the Holmium oxide solution filter see Fig 8 35 for example 8 34 Example of Wavelength Table with Correction Results for Holmium Filter Standard Measured Error wavelength wavelength 241 1 241 25 0 4 345 5 345 8 0533 361 3 361 5 iz 385 7 385 6 0 1 467 8 468 0 OZ 640 5 640 5 0 0 Fig 8 37 Wavelength correction results Holmium 9 Check that the measured wavelength s amount of error from the standard wavelength is within the specification 0 5nm 10 Press the RETURN key once to return to the Hg and D2 wavelength table screen Press the F3 key to save the table in EEPROM if the data is saved the characters EEPROM are highlighted 11 Press the RETURN key again to return to 3 Hg lamp line detection screen Finishing up after Wavelength Correction i Turn OFF main unit power Remove mercury lamp holder jig after it has cooled down or use heatproof gloves ii Remove jig cable from connector I O 2 iii Finally mount light source compar
31. 8 CPS 240 PM screen e Cell 1 F1 key Use this to move the 1 cell holder over the beam of the sample side e Cellmove F2 key Use this to move the cell holders in order e Repeat F3 key Use this to repeat cell movement e 0 order F4 key Use this to detect zero order light Press the RETURN key to return to the drive check screen 7 RS 232C This function tests the RS 232C port This function was added from ROM Ver 1 20 It is not used in adjustment 8 2 3 Outline of Optical System Check Select 2 Optics check at the top menu screen to display the screen shown in Fig 8 9 Use this to check zero order light search T O ord Light search point set i 2 0 ord light search point and D2 Hg line wavelengths as well as Bg damp Mod A detection for inputting offset values and checking 4 Resolution check resolution Fig 8 9 Optics check screen 1 0 Ord light search point set With the UV 1700 zero order light position is detected automatically Note however that 0 ord light search point must be set in order for a correct use of 2 0 ord light search Use this item to set the search point using the zero order light of the WI lamp This position will be saved in EEPROM 1 Press the 1 key to select zero order light search point set 2 After the WI lamp lights up the grating n n Lena 3 Hg lamp line A detection minutes function keys will be d
32. C TC74HC374AF U6 7 13 075 33493 16 IC TC74HC367AF U8 14 075 21211 IC TL497ACN U 11 15 075 82008 04 IC CXA L10L H 12 16 075 33492 20 IC TC74HC32AF U 13 17 208 94307 IC GAL X083CON U 14 18 075 31836 01 IC uPD71055C U 15 16 19 054 26846 01 VR 161P N2B10K Q K VR1 20 061 86480 08 Oscillator AT 51 8 000 X1 10 16 11 1 11 2 11 3 11 4 11 5 Chapter 11 Electric Circuits Diagram Electrical Block Diagram CPU P C Board Preamp P C Board Power P C Board Console P C Board 11 1 Electrical Block Diagram TRAWSFORWER AgaY FIX AI 206 67041 02 03 04 AC rad INLET AFH YA 018 1710102 y AFH YA 018 1710102 SHIELD STICKFINGER ay LIVA TRANIFOR A7 FASIY 206 55261 91 l BRACKET j Jar 206 55255 i104 1103 li PCB ASSY 1 POWER X148 206 55203 91 i J102 J101 be ee Pca eli 1 n ats A con TIAN ih tw ans 2 Na quo smi TSE i Tai Eog o7 AS bai In Mo 2 ADFY Sy I ne HALOGEN LANP ama 3 4 LIEBT SOURCE LS 75 KA t Jbt L PHOTO 3EN30R 1945 FA99Y 206 67019 02 LAWP HOUSING Aggy ICEXTROWICS IRa zazc BOTTOM PLATE A33Y YISFAIIY 206 55258 91 1140 2 1170 1 PCB AISY CPU X148 206 55200 91 CABLE PHOTO 3EW30R f Th Dibto 208 94866 01 PREGQt 5 GRATING HOTOR HiT ER FAHI Jt tv PHOTO SEWSOR Vi Ag ER E FILTER WOTOR 292223 A99IY 206 67014 01 OPTICAL UWIT Aggy 11 2 t h ttt 2
33. CB ASSY Preamplifier 10 13 PCB ASSY Console 10 1 10 1 Instrument Configuration List Filter Assy 206 67223 UV 1700 UV 1700 E Main Assy SA Main unit Transformer Assy Line Filter Assy 206 55401 ae 206 55403 206 67010 206 86519 206 67041 02 206 82616 91 di UV 1700 Packing ROM OB 1700 Light Source Assy Photo Coupler Assy 34 230V CE 206 59054 92 206 55221 92 206 67019 02 206 67035 91 100V ae ROM MODE 1700 Cable Preamp Mirror Assy Light Source 92 120V 34 230V CE 206 55222 92 206 84928 91 206 67017 93 220V 91 100V Accessories Cable VHR5 Lamp Cable Assy 94 240V 92 120V 206 67099 01 206 55216 91 206 88242 91 93 220V 100 120V Cable D2 Lamp 94 240V 01 220 230 240V 206 55218 91 Conduit Sealing 206 55409 91 Bottom Plate Assy PCB Assy CPU 206 55258 91 205 55200 91 Power Board Assy PCB Assy Power 206 55261 91 206 55203 91 Main Unit Chassis Assy Pin Assy 206 86520 92 206 67012 01 206 14522 Optical Unit Assy Case Assy 206 67014 01 206 67015 01 Wall Assy Cell Comp Grating Assy __ Adherent Grating 206 67082 01 206 67027 01 206 67029 01 PCB Assy Preamp Slit amp Fiter Assy Filter Panel Assy 206 55206 91 206 67024 01 at 206 67022 01 Lid Assy Coupler Board Assy Filt
34. Correction i Turn OFF main unit power Remove mercury lamp holder jig after it has cooled down or use heatproof gloves ii Fasten the monochromator case cover using the screws Put the main unit cover on and tighten screws iii Mount the sample compartment cover and the standard sample compartment leave off the light source compartment cover If the multicell 6 cells sample compartment is to be used mount this instead of the standard sample compartment iv Next screw the stanchion of the bottom half of the mercury lamp holder to the position for the third light source in the UV 1700 light source compartment and then secure the upper mercury lamp holder securing the lamp to the top of the stanchion using the knurled screw provided Insert the cable attached to this unit into the connector I O 2 on the bottom right side of the main unit 8 32 1 Hold down the START key and turn ON the main unit power Release the START 1 Wavelength correction Hg D2 Lamp key when the buzzer beeps The sound of _ 2 Wavelength check Hg D2 Lamp stray light cut filter origin detection can be heard after approximately five seconds And the top menu of the maintenance mode will be displayed Select 2 Optics check from maintenance mode top menu followed by 3 Hg lamp line detection see Fig 8 36 Press the F 1 key to select 1 Wavelength Fig 8 36 Hg D2 lamp line wavelength correction Hg
35. SI MIS E Fig 8 11 Zero order light search screen two minutes e Repeat F1 key Press this to repeat zero order detection D20ord F2 key Press this to extinguish the WI lamp and light the D2 lamp Now zero order light detection can be performed on the D2 lamp Press the RETURN key to return to the optic check screen 8 11 3 Hg lamp line X detection The Hg and D2 lamps are used to correct wavelength in addition to the Holmium oxide solution in UV 1700 Usethis to check wavelength correction 1 Press the 3 key at the optic check screen to select 3 Hg lamp line detection see Fig 8 11 1 Wavelength correction Hg D2 Lamp 2 Wavelength check Hg D2 Lamp 2 Hg lamp line detection screen will be displayed see Fig 8 12 1 Wavelength correction Hg D2 This uses the Hg Dz lamp lines to consecutively perform first and second corrections 2 Wavelength check Hg D2 Fig 8 12 Hg D2 lamp line wavelength This measures the Hg D2 lamp lines detection screen and displays the margin of error Copy F1 key Each press of the F1 key switches the display above the Copy function key between ON and OFF Select ON to printout data of each wavelength Press the RETURN key to return to the optic check screen 8 12 4 Resolution Check Press the 4 key at the optic check screen to select 4 Resolution check The s
36. SRM 2034 is 0 1nm Wavelength accuracy specification for NIST SRM 2034 Within 0 5nm includes the error of peak pick function 0 1nm Checking Method 1 Press the 1 key at the auto items screen to display the wavelength accuracy parameter settings screen 2 Set the parameters to match those shown in figure 3 7 3 8 ee NEREGUOn Each press of the 1 key selects Yes or 1 Inspection Yes deselects No the inspection Set Method PAESE 3 Check A nm inspection to the Yes item 640 5 536 6 485 3 467 8 416 3 e Method 385 7 361 3 345 5 333 4 287 2 Press the 2 key to open an interactive 278 1 249 9 241 1 0 0 0 0 i OS screen that enables selection of either D2 7 1erance RARI t 5 Filter Lamp or Filter Select Filter S N 12345678 GOOD THRU 01 03 30 Check A Input item No The wavelength changes depending on ESSI IS E settings for inspection method When Fig 3 7 Wavelength accuracy parameter Filter is selected as the inspection settings screen 2 method enter the wavelength in order by pressing the 3 key Enter 0 and press the ENTER key to complete entry Tolerance Press the 4 key to enable input of pass criteria value Input range is 0 1 to 0 9 Input the 0 5 value 0 5nm includes the accuracy of NIST SRM2034 40 1nm and the accuracy of peak pick function 0 1nm Filter Input the serial number S N and expiration date
37. Usethe grating motor again to direct the zero order second order and third order lights onto the adjusting jig And check that beam centers are aligned with the marking line Repeat items 5 to 8 if not aligned 2 Aligning with Slit 1 Remove adjusting jig and ruling 2 Put the grating motor into drive using the F 1 key or F2 key And check the position of the diffracted light primary light against the exit slit At this time check that the top and bottom edges of the diffracted light on both the long wavelength red and short wavelength blue sides are not broken When diffracted light and slit center are misaligned in the parallel direction Adjust height as shown in item 8 above Then retighten tilt adjustment bolts and recheck alignment When diffracted light and slit center are out of parallel Adjust height as shown in items 5 to 8 above Then retighten tilt adjustment bolts and recheck alignment Exit slit Diffracted light continuous spectrum Fig 8 25 Beam over exit slit 8 23 8 3 4 Adjustment of Double Beam Optics The light beam divided into two by the half mirror is made to pass through the sample La P D L Ref BA i P D L Sam compartment by adjusting the mirrors at the sample and reference sides Fig 8 26 UV 1700 optical system diagram Follow items 1 to 3 of procedure 8 3 2 2 to align the WI lamp beam with the
38. alidation check functions to determine baseline flatness Baseline flatness Within 0 002Abs Shock noise Within 0 004Abs 7 Noise level Use the validation check functions to determine noise level 700nm 500nm 250nm P P 8 Handling explanation P P P P Explain how the instrument is used in accordance with the instruction manual training Provide operation P P Within 0 002Abs Explain the basic operations Chapter 5 Periodical Check This chapter explains the periodical checks for the UV 1700 Recommend these periodical checks to customers for safe prolonged use of the instrument 5 1 Daily Checks 5 2 Monthly Checks 5 1 Daily Checks 5 1 1 Cooling Fan Operation Check Check that the cooling fan on the left side of the main unit is operating If the cooling fan is not working the light source compartment will overheat the safety unit temperature switch will activate and the WI lamp will not light up Note also that instrument overheating may cause a breakdown 5 1 2 Sample Compartment Floor Check If liquid samples are frequently handled remove spilt samples from the floor of the sample compartment before and after analysis Gas evaporation from spilt samples corrodes the inside of the sample compartment and may cause errors in measuring results 5 2 Monthly Checks 5 2 1 Performance Checks Baseline Flatness Check Use t
39. alue The pass criteria value can be set to a recommended value Do not use this item at this point 3 Press the RETURN key twice to return to the instrument validation screen Now press the START key to implement inspection followed by printout of results 4 Set the inspection wavelength to 500nm and the RMS value of the pass criteria to within 0 3mAbs And inspect the noise level 3 15 5 Set the inspection wavelength to 250nm and the RMS value of the pass criteria value to within 0 4mAbs And inspect the noise level 6 Check that each inspection result conforms to the specification 3 16 3 10 Photometric Accuracy This measures the optic filter for transmittance correction checks the deviation against the validation value and makes the result the photometric accuracy Check photometric accuracy using the semi automatic inspection item in the instrument validation functions Specification Within 0 002Abs vicinity of 0 5Abs Within 0 004Abs vicinity of 1 0Abs Jig NIST substandard filter P N 755 03576 CPS 240A P N 204 05837 01 Pre inspection Preparation Bring the NIST substandard filter to a constant temperature 1 Turn ON the power for the CPS 240A Set temperature to 23 5 C 2 Set the NIST substandard filter in the cell holder of the CPS 240A Maintain the filter at a constant temperature Cell position 1 None Cell position 2 10 T vicinity of 1Abs filter Cell position 3 30 T vicinity of 0 5Abs f
40. ble Cause Action ROM Check ROM chip defective ROM content destroyed ROM pin broken _ an e n rr ROM socket solder defective Replace ROM Repair pin Replace CPU PCB RAM Check Insufficient backup battery voltage RAM chip defective Replace battery Replace CPU PCB Light Source Org Contact failure of origin detection photosensor connector Light source motor connector _connection defective Photosensor for origin detection _ defective Light source e motor defective Motor drive circuit defective Repair connector Replace photosensor Replace motor Replace CPU PCB Org coarse Origin detection photosensor connector connection defective Wavelength motor connector _connection defective Origin detection photosensor _ defective Wavelength motor defective Motor drive circuit defective Repair connector Replace photosensor Replace m motor o Replace CPU PCB Error Items Probable Cause Action W Lamp Energy When WI lamp does not light up WI lamp defective WI lamp lighting circuit defective Replace lamp Replace power PCB PCB ASSY POWER or CPU PCB Replace cable When WI lamp lights up Lamp energy loss Light source position defective E Preamplifier detective AID converter defective Replace lamp Adjust light source mirror and lamp P
41. e instrument validation functions installed in the UV 1700 to check basic performance This item explains how these functions are used 3 2 1 How to Enter Instrument Validation Mode 1 Press F3 key Mainte at the mode selection screen to display the Maintenance screen 1 Semi Auto items 2 Auto items Next select 1 Validation to display the PnotoAccuracy PhotoRepeatability WL Repeatability validation screen Stray Light Resolution 2 The check item selected for implementation Baseline Stability is highlighted For example wavelength Baseline Flatness Noise Level accuracy WL Accuracy is highlighted for ia implementation in figure 3 1 3 Press the START key to execute inspection Input item No To start START of the highlighted item ES 4 There are two types of check available Fig 3 1 Instrument validation screen Semi Auto items and Auto items Semi automatic inspection is divided into items that require manual tasks such as filter changing Automatic inspection is divided into items that the instrument automatically checks without any need for manual tasks 3 2 2 Inspection Settings 1 Press the F 4 key Settings at the instrument validation screen to display the settings screen 1 Changing a Password for inspections 2 Auto print OFF 2 Press the 1 key to enable input of password A password can be input in instrument validation to prevent unauthorized changing of
42. ed not be executed 1 Press the 1 key at the condition set screen to select 1 EEPROM data initialize see Which data do you init 1 Wavelength table Valid Fig 8 15 2 0 ord light point 10000 2 Press the data number for initialization A scali data message will ask you if you really want to initialize data Press the START key to initialize TBL prt F1 key Select item No Press this to printout data for the table EE SI Press the RETURN key to return to the condition set screen 8 14 The following items are contained in the adjustment data domain Wavelength table Table with values corrected using H g D2 lamp lines Zero order light detection origin Origin offset value for zero order light detection Stray light cut filter position Phase setting value for filter motor Instrument ID No serial No Absorption correction factor Coefficient determined using standard filter normally 1 000 2 Instrument ID No Setting Use this to check and input instrument ID number serial number 1 Press the 2 key to select Instrument ID No see Fig 8 16 2 Input the instrument ID number and 1 EEPROM data initialize i f 2 Instrument ID NO XX X press the ENTER key If a mistake is 3 ABS corr Factor 1 0000 made press the CE key and delete the digits one by one Input range 0 993 1 007 4 Data init aft
43. een e Cell 1 F1 key Use this to move the 1st cell holder over the beam on the sample side e Cellmove F2 key Use this to move cell holders in order o Repeat F3 key Use this to repeat the cell movement operation Press the RETURN key to return to the drive check screen 5 Sipper PM Use this to operate the special accessory sipper Press the 5 key to select sipper PM Function keys will be displayed at the bottom of the screen 1 Wavelength drive PM 2 Light source mirror PM 3 Filter PM 4 Cell drive Multicell 6 PM 6 CPS 240 7 RS 232C Fig 8 7 Sipper PM screen e lt lt F1 key Use this to rotate sipper at high speed in the forward direction e lt F2 key Use this to rotate sipper at slow speed in the forward direction e gt F3 key Use this to rotate sipper at slow speed in the reverse direction e gt gt F4 key Use this to rotate sipper at high speed in the reverse direction Press the RETURN key to return to the drive check screen 6 CPS 240 Use this to move the cell holder of the special accessory CPS 240 and check the cell position utilizing zero order light Press the 6 key to select CPS 240 Function keys will be displayed at the bottom of the screen Wavelength drive PM 1 2 Light source mirror PM 3 Filter PM 4 5 Cell drive Multicell 6 PM Sipper PM 6 CPS 240 7 RS 232C Fig 8
44. emi auto inspection parameter values can be made here see inspection items settings screen for details 3 2 5 Auto Validations 1 Press the 2 key in the instrument validation menu see Fig 3 1 Now select 2 Auto Wavelength Accuracy items the password screen will appear so Wave length Repeatabr aay 1 Resolution input the password just press the ENTER Basctine Stabi ity key if a password is not required The Baseline Flatness Settings of Auto items screen will be Noise Level Initialization Record displayed Input item No to change parameters Fig 3 4 Auto inspection parameter settings screen 3 4 2 Select one of the items 1 to 7 to enter the parameter settings screen for that inspection item Setting changes to Inspection Yes No inspection parameters and pass criteria values can be made here see inspection items for details Note A password can be eliminated when the administrator of UV 1700 forgets the password and does not put into the condition setting screen of Semi Auto items Auto items Please perform 4 Data init after battery change from 3 Condition set in the maintenance mode However since the following information stored in backup RAM will also be eliminated if 4 Data init after battery change is performed Please be sure to acquire recognition of the administrator in advance Instrument baseline correction data Measuremen
45. entrance slit Select 1 Drive check at maintenance mode top menu followed by 1 Wavelength drive PM Put the grating mode into drive and set control to make the green light pass through the exit slit Press either F 1 or F 2 key once to start the grating motor rotation and press again to halt Use the cursor key for one step drive Check that the stray light cut filter is in the No filter position Check that the beam is arriving at about the center of the toroidal mirror ASSY M2 Cover the S side mirror ASSY M4 with the S side mirror adjusting jig And tilt adjust the toroidal mirror M2 in the height direction 8 24 Fixing screws B for position ie an a Fixing screws A adjustment R side mirror M5 Toroidal mirror M2 Tilt adjustment bolts Fixing screws A Fixing screws B for position adjustment Tilt adjustment bolts S side mirror M4 Fig 8 27 Toroidal mirror surroundings 7 Retighten the fixing screws A on the toroidal mirror M2 to fix tilt adjustment unit after adjusting height 8 Loosen the B fixing screws And adjust position in the left and right directions to align with adjusting jig on the S side mirror 9 Temporarily tighten the fixing screws B 10 Remove adjusting jig from S side mirror M4 and set the optical axis adjustment plate in the sample compartment 11 Place the adjusting jig H 40m
46. enu followed by 1 0 ord light search point set 1 0 ord light search point set 2 0 ord light search 2 The WI lamp will light And th p g up d 3 Hg lamp line A detection optimum position for the light source will 4 Resolution check be automatically determined 3 Press either the F 1 key or the F2 key to move the zero order light to a position approximately 5mm away from the left side of the exit slit a 4 Press the F3 key to save the zero order Fig 8 31 Zero order light search point set light search point set The EEPROM item will be highlighted if the data is saved 5 Press the RETURN key toreturn to the 2 Optics check screen 6 Select 2 0 ord light search and check that the zero order light is automatically set at the exit slit position 8 28 Approx 5mm Exit slit Beam zero order light ai Fig 8 32 Exit slit 8 3 6 Exit Slit Focusing Adjustment Preparation for Focus Adjustment i Turn OFF main unit power Place blackout curtain on the sample compartment And close monochromator case cover screws need not be tightened ii Next screw the stanchion of the bottom half of the mercury lamp holder with a mercury lamp to the position for the third light source in the UV 1700 light source compartment and then secure the upper mercury lamp holder Securing the lamp to the top of the stanchion using the knurled screw provided Insert t
47. er Gear Assy 206 67215 206 60667 206 67026 Grounding Cable Toroidal Mirror Assy Adherent Toroidal Mirror 206 86026 04 206 67060 206 67061 LED Assy Mirror Assy Adherent Mirror 206 67220 206 67066 206 67067 Mirror Assy __ Adherent Mirror 206 67092 206 67093 Cell Housing Assy Holder Cell Assy 206 60184 04 206 82009 91 Cover Unit Cover Assy __ Lid Assy Lamp House 206 67050 206 86521 92 206 67514 01 Display Assy 206 67080 PCB Assy Console 206 87615 91 10 2 10 2 UV 1700 Main Unit P N 206 55403 o e E EQ J lr ITEM No P N DESCRIPTION REMARK 1 206 67010 02 Main Assy SA 2 206 55259 Name Plate UV 1700 3 206 55221 92 ROM OB 1700 4 206 55222 92 ROM MODE 1700 FlashROM 5 206 67099 01 Accessories 01 220V 230 240V 6 206 94783 Instruction manual installation and maintenance edition 7 206 94785 Instruction manual operation edition 8 037 72522 20 Label Warning SB100 522P 9 037 72417 01 Label Warning SB60 417P 10 3 10 3 Main Unit P N 206 86519 4 1 3 7 2 8 ITEM No P N DESCRIPTION REMARK 1 206 67041 02 Transformer Assy 2 206 67014 01 Optical Unit Assy 3 206 67019 02 Light Source Assy 4 206 55261 91 Power Board Assy With Holder plate 5 206 55200
48. er battery change Input digits ten key Max 3 Absorbance correction factor 11 digits Fig 8 16 Instrument ID No screen Use this to check and input the absorbance correction factor 1 Press the 3 key to select ABS corr factor see Fig 8 17 2 Determine and input the correction factor using the following method 1 2 3 4 EEPROM data initialize Instrument ID No X X ABS corr Factor Input range 0 993 1 007 Data init after battery change Input a value 8 15 Fig 8 17 ABS Corr factor screen a Measure the absorbance that occurs in the standard wavelength of a substandard filter in photometric mode b Determine the factor using the calculating formula Standard value Abs Measuring value Abs Correction Factor 4 Initializing After Battery Change Use this to initialize data written in RAM when changing the battery Press the 4 key to select Data init after battery change A message will ask you if you really want to initialize data Press the START key to initialize The following data items are contained in backup RAM Instrument baseline correction data Measuring data saved in files Oto5 Condition files saved files 1 to 14 Password for instrument validation 8 16 8 3 Adjustments 1 Adjustment of light source optical axis Use the D2 lamp beam to adjust light source switch mirror and WI lam
49. for the correction filter to be used A filter that has passed the expiration date cannot be used for an inspection Recommended Value The pass criteria value can be set to a recommended value Do not use this item at this point 3 Press the RETURN key twice to return to the instrument validation screen Now press the START key to implement inspection followed by printout of results 4 Check that wavelength accuracy is within 0 5nm 3 9 3 5 Wavelength Repeatability This checks wavelength repeatability by measuring the D2 lamp line 656 1nm 486 0nm three times and verifying the deviation between the average value and each individual measuring value Specification Within 0 1nm Checking Method 1 Press the 2 key at the auto items screen to l Inspection Yes display the wavelength repeatability ieee i ea parameter settings screen 2 Set the parameters to match those shown in figure 3 8 Inspection Each press of the 1 key selects Yes or deselects No the inspection Set inspection to the Yes item Input item No E e e Fig 3 8 Wavelength repeatability parameter Tolerance Press the 2 key to enable input of pass criteria value Input range is 0 1 to 0 9 Input 0 1 settings screen Recommended Value The pass criteria value can be set to a recommended value Do not use this item at this point 3 Press the RETURN key twice to return to the instrument validation screen N
50. he adjusting jig at any position over the marking line And retighten the fixing screws B Place pieces of card like a business card over the toroidal mirror M2 and S side mirror M4 and check that the beam is not escaping over the edges of the mirrors If the beam is escaping repeat procedure from item 5 16 Place the adjusting jig H 40mm over the R side beam furthest away from you marking line of the optical axis adjustment plate And tilt adjust the R side mirror M5 in the height direction 17 Retighten the fixing screws A on the R side mirror M5 to secure mirror 18 Place the adjusting jig H 40mm in front left side of sample compartment lens over the marking line of the optical axis adjustment plate And adjust the R side mirror M5 in the left and right directions so that the beam comes to the center in the horizontal direction of the adjusting jig 19 Retighten the fixing screws B on theR side mirror M5 8 26 20 Change the position of the adjusting jig H 40mm and check that the beam is in the center of the adjusting jig whatever the position of the adjusting jig over the marking line Place pieces of card like a business card over the R side mirror M5 and check that the beam is not escaping over the edges of the mirrors If there is beam escape repeat procedure from item 16 21 Check that there is a beam in the center of the detector P D on the left side surface of the sample compartment 22
51. he cable attached to this unit into the connector I O 2 on the bottom right side of the main unit 8 29 a Knurled screw IT I stanchion Secure to position for third light source Stanchion fixing lt a 77 screws Mercury lamp holder jig SS eo re ee ee ere fe al o EI ERO E Led 170 2 10 8 CENTRONICS Connect to connector I O 2 Fig 8 33 Focusing adjustment preparations 8 30 1 Turn ON UV 1700 power and wait for normal initialization to finish 2 Enter spectrum mode and set the following parameters 1 Meas mode E 2 Scanning range 548nm 544nm 3 Rec range OE 150E 4 Scan speed Medium 5 No of scans 1 6 Display mode Sequential 7 Gain 1 8 Light Source OFF 3 Press the START key to execute measuring 4 Usethe cursor to record the position of Hg lamp line 546 1nm that appears on screen 5 Usethe GOTO key to set the wavelength recorded in item 4 6 Remove the monochromator case cover Remove the fixing screws for the Slit amp Filter Assy And place the Slit amp Filter Assy outside of the monochromator case 7 Now place the adjusting jig for exit slit position adjustment in the exit slit position of the monochromator case in place of the Sl
52. he results conform to the specifications 3 23 Chapter 4 Acceptance Procedures This chapter details the acceptance procedures for the UV 1700 4 1 Acceptance Procedures 4 1 Acceptance Procedures Check these together with the customer to see that the specifications are fulfilled for the following items after installing the UV 1700 Item Inspection Method and Results Specification Check 1 Installation Main unit installation site conditions See 2 2 Selection of Ei must be fulfilled Installation Site 2 External appearance Check to see whether or not Make sure that there L check damage has occurred are no defects that might impair functions 3 Inspection of standard Inspect parts See 2 1 Inspection of L contents Parts 4 Check of adjustment Check the following functions and Make sure that these L functions and operation operations are correct 1 CheckROM 2 Check that LCD brightness can be adjusted using the Contrast knob on the right side of the main unit 3 Turn ON the power switch and check that initialization ends correctly 4 Check that each key of the keyboard operates correctly 5 Wavelength accuracy Use the validation check functions Within 0 3nm O to check wavelength accuracy in the spectral line wavelength of a Do lamp D bright Measuring Error line value nm nm 486 0nm 656 1nm 6 Baseline flatness Use the v
53. he validation functions see item 3 8 to check baseline flatness If the baseline is abnormal the curve is greater than 0 002Abs correct the baseline see item 2 4 Wavelength Accuracy Check Use the validation functions see item 3 4 1 to check wavelength accuracy If the wavelength accuracy does not conform to the specification within 0 3nm the wavelength must be re corrected 5 2 5 2 2 Light Source Check The average lifespan of the WI lamp is 2000 hours and the D2 lamp is 500 hours As a lamp nears the end of its lifespan brightness decreases and signal noise increases The remaining lamp lifespan can be checked at the maintenance screen If a lamp has exceeded its average lifespan replace it After replacing a lamp go to the maintenance screen press the 3 key to display the interaction screen and reset the lighting time Maintenance Validation Instrument Baseline Correction Corrected date 01 03 30 11 36 00 Lamp time used WI Lamp 200hours D2 Lamp 120hours Input item No Fig 5 1 Maintenance screen 5 3 Chapter 6 Troubleshooting This chapter explains the troubleshooting method for the UV 1700 6 1 An Error Occurs During Initialization 6 2 Baseline Flatness Exceeds Specification 6 3 Noise Level Exceeds Specification 6 4 Wavelength Accuracy Exceeds Specification 6 5 Wavelength Repeatability Exceeds Specification 6 1 An Error Occurs During Initialization Error ltems Proba
54. hod 1 Press the 4 key at the auto items screen to Baseline Stability l Inspection Yes 2 Check A 700 0 nm 3 Tolerance 1 0 mABS H display the baseline stability parameter settings screen 2 Set the parameters to match those shown in figure 3 10 Inspection Each press of the 1 key selects Yes or deselects No the inspection Set inspection Input item No ESS I SI to the Yes item Check A Fig 3 10 Baseline stability parameter settings Press the 2 key to enable input of screen wavelength to be measured for time variation Input 700 0 Tolerance Press the 3 key to enable input of pass criteria value Input range is 0 0 to 99 9 Input the 1 0 value Recommended Value The pass criteria value can be set to a recommended value Do not use this item at this point 3 Press the RETURN key twice to return to the instrument validation screen Now press the START key to implement inspection followed by printout of results 4 Check that baseline stability is within 1 0mAbs h Note To implement baseline stability inspection the instrument power supply must be turned ON for at least one hour prior to inspection A warning message will be displayed if one hour has not elapsed from when the power was turned ON 3 12 3 8 Baseline Flatness This corrects the baseline to a blank status at both the sample S and reference R sides of the sample compartment measures the spectrum
55. hs 760nm 536nm 416nm 365nm 305nm 340 8nm 3 13 Note To implement baseline flatness inspection the instrument power supply must be turned ON for at least one hour prior to inspection A warning message will be displayed if one hour has not elapsed from when the power was turned ON 3 14 3 9 Noise Level This measures for one minute the time variation in the vicinity of zero absorption OAbs for the specified wavelength and checks the P P noise from that amplitude It also calculates the RMS value from the one minute data Specification P P Within 2mAbs same for each wavelength RMS 0 2mAbs or less 700nm 0 3mAbs or less 500nm 0 4mAbs or less 250nm Checking Method 1 Press the 6 key at the auto items screen to display the noise level parameter settings l Inspection Yes 2 Check A 700 0 nm screen i 3 Tolerance P P 2 0 mABS or less 2 Set the parameters to match those shown in RMS 0 2 mABS or less figure 3 12 Inspection Each press of the 1 key selects Yes or deselects No the inspection Set inspection Input item No to the Yes item ee ee CheckA Fig 3 12 Noise level parameter settings Press the 2 key to enable input of screen wavelength to be measured for time variation Input 700 0 Tolerance Press the 3 key to enable input of pass criteria value Input range is 0 0 to 99 9 Input 2 as the P P value and 0 2 as the RMS value Recommended V
56. ifier PCB Removal 7 4 Power PCB Removal 7 5 CPU PCB Removal 7 6 ROM Replacement 7 7 Battery Replacement 8 Adjustment Procedures 8 1 Jigs and Tools Required 8 2 Before Starting Adjustment 8 3 Adjustments 9 Configuration 9 1 Optical System 9 2 Beam Position in Sample Compartment 9 3 Electric System 9 4 Instrument Assignment Explanation 10 Parts List 10 1 Instrument Configuration List 10 2 UV 1700 Main Unit 10 3 Main Unit 10 4 Cover Unit 10 5 Transformer Assy 10 6 Light Source Assy 10 7 Optical Unit Assy 10 8 Cell Housing Assy 10 9 Slit amp Filter Assy 10 10 PCB ASSY CPU 10 11 PCB ASSY Power 10 12 PCB ASSY Preamp 7 1 7 2 7 3 7 3 7 4 7 4 7 5 7 5 8 1 8 2 8 17 9 1 9 2 9 4 9 5 9 6 10 1 10 2 10 3 10 4 10 5 10 6 10 7 10 8 10 9 10 10 10 11 10 14 10 15 10 13 PCB ASSY Console 11 Electric Circuit Diagram 11 1 Electrical Block Diagram 11 2 CPU P C Board 11 3 Preamp P C Board 11 4 Power P C Board 11 5 Console P C Board 10 16 11 1 11 2 11 3 11 9 11 10 11 11 Chapter 1 Introduction This chapter explains instrument outline intended use of service manual and warning labels 1 1 About the Service Manual 1 2 UV 1700 Outline 1 3 Intended Use 1 4 Warning Labels on Instrument 1 1 1 1 About the Service Manual This service manual explains the procedures for installing performance checking troubleshooting and adjusting for the UV Vis Spectrophotometer U V 17
57. ilter Note The NIST substandard filter must be maintained at 23 5 C during inspection because the measuring value varies with the temperature of the filter i Checking Method si accuracy 1 Inspection Yes 1 Press the 1 key at the semi auto items 2 Meas mode Abs screen to display the photometric accuracy 3 Check A nm parameter settings screen 635 0 590 0 546 1 465 0 440 0 4 10 Filter S N 12345678 2 Set the parameters using those shown in Good THRU 01 03 30 Tolerance 4mAbs figure 3 13 as reference 5 30 Filter S N 87654321 Good THRU 01 03 30 Tolerance 2mAbs Input item No ESETI E a Fig 3 13 Photometric accuracy parameter settings screen 3 17 Inspection Each press of the 1 key selects Yes or deselects No the inspection Set inspection to the Yes item Meas Mode Each time the 2 key is pressed the Abs T will change together with validation value for the inspection filter and the pass criteria value Use the Abs mode Check A Specify the inspection wavelength for measuring the photometric value Input the inspection wavelength for the filter to be used in the inspection Here five wavelengths 635 0nm 590 0nm 546 1nm 465 0nm and 440 0nm can be used 10 Filter and 30 Filter Set the serial number S N expiration date pass criteria value and validation value for each inspection wavelength for the inspection filter to be used A detailed explanat
58. ion is given in the next item Recommended Value The pass criteria value can be set to a recommended value Do not use this item at this point Press the 4 key and 5 key to display each inspection filter parameter settings screen This explanation takes the 10 filter as the example The setting contents for the 30 filter are the same Serial No Input the serial number for the inspection 10 Filter ta 1 Serial No 12345678 filter The digits 0 to 9 can be used and a RS A 2 Good THRU 01 03 30 number of up to eight digits can be 3 Tolerance 4mAbs composed 4 Standard values Good THRU 635 0nm 1 000Abs 590 0nm 1 000Abs BENS 546 1nm 1 000Abs 465 0nm 1 000Abs Set the expiration date of the inspection 440 0nm 1 000Abs filter A filter that has passed the expiration date cannot be used for an Input item No inspection Foleranice Fig 3 14 10 filter parameter settings screen Set the pass criteria value With the Abs absorbance mode the setting range is 1 to 99mAbs With the T transmittance mode the setting range is 0 to 99 T Standard Values Input the validation value attached to each inspection filter 3 18 Return to the instrument validation screen With the filter set load the CPS 240A kept at a constant temperature into the sample compartment Check that the CPS 240A cell position is Cell 1 and press the START key to start inspection The semi automatic pho
59. isplayed 4 Resolution check will rotate and after approximately two at the bottom of the screen e lt lt F1 key Press this to move the grating at high speed in the direction of short E E EI wavelength Press this again to halt the Fig 8 10 Zero order light search point set movement e gt gt F2 key Press this to move the grating at high speed in the direction of long wavelength Press this again to halt the movement EEPROM F3 key Press this to save zero order light search point Press the RETURN key to return to the optic check screen 8 10 2 Zero Order Light Search Use this to check that the zero order light is correctly detected for both the WI and D2 lamps After setting the first item 1 0 ord light search point set check that the settings have been saved correctly After setting this item can be used to check the optical axis and the cell position when the sipper is mounted 1 Place a blackout curtain over the entire 2 0Optics check optical system or mount the sample 1 0 ord light search point set 2 0 ord light searc 3 Hg lamp line A detection light search The grating will rotate and 4 Resolution check zero order light will be detected 3 Once zeroorder light is detected function keys will be displayed at the compartment unit and cover it 2 Press the 2 key to select zero order bottom of the screen in approximately ES
60. it amp Filter Assy see Fig 8 34 8 Move the jig backwards and forwards in relation to the grating over the optical axis And set the adjusting jig at the position where the 546 1nm green image is sharpest on the surface of the jig 9 The scale reading at this time is read off with the longest scale line as the starting point 1 5mm from starting point in Fig 8 34 10 Remove adjusting jig 11 Set the Slit amp Filter Assy at a position 1mm less than the recorded scale in item 9 above For example the Slit amp Filter Assy is secured at the 0 5mm position Fig 8 34 position 1 5mm Imm 0 5mm in Fig 8 35 At this time check that the Slit amp Filter Assy is properly in contact with the contact area of the scale If the Slit amp Filter Assy is only in contact with part of the contact area it will be at an angle when secured which may cause problems with the resolution specification 12 Turn OFF main unit power 8 31 Move jig backwards Slit amp Filter Assy Jig and forwards Butt squarely onto contact area for slit image Butt squarely onto i dA contact area Fa gt a This example shows a 1 5mm scale reading This example shows the Slit amp Filter Assy secured at the from the long stari point scale line 0 5mm position when the jig reading is 1 5mm Fig 8 34 Focus position check using jig Fig 8 35 Fixing slit filler ASSY 8 3 7 Wavelength Correction Procedure Preparation for Wavelength
61. ition set followed by 4 Data init after battery change and then initialize data in RAM Maintenance 1 Drive check 2 0ptics check 3 Condition set Ros M M Fig 8 18 Maintenance mode screen 8 18 8 3 2 Adjustment of Light Source Optical Axis Adjustment of the light source optical axis is performed by adjusting the height of the light source switch mirror and WI lamp based on the height of the D2 lamp beam 1 Adjustment of Light Source Switch Mirror 1 Select 1 Drive check from the maintenance mode top menu and then select 2 Light 1 Wavelength drive PM 2 Light source mirror PM Filter PM Cell drive Multicell 6 PM source mirror PM 2 Press the 3 key to extinguish the WI lamp 3 Press the 4 key to light up the D2 lamp always wear UV protective goggles when D2 CPS 240 3 4 5 Sipper PM 6 7 RS 232C lamp is lit 4 Temporarily secure the mirror using the setscrew so that the origin detection pin Press cursor key for 1 step drive mounted at the lower part of the light source mirror is parallel with the mirror face Fig 8 19 Light source mirror PM screen 5 Put the light source motor to the D2 lamp beam over the entrance slit Press either the F 1 or F 2 key once to start light source motor rotation and press again to halt Press the cursor key for one step drive 6 Adjust the height of the light source mirror by loosening the set screw so that the D2
62. ize the RAM 1 8 Turn OFF instrument power 3 Condition set 1 EEPROM data initialize 2 Instrument ID No 3 ABS corr factor 1 0000 Input range 0 993 1 007 4 Data init After battery change Fig 7 8 Condition set screen 7 6 Chapter 8 Adjustment Procedures This chapter explains adjustment methods mainly for the optical system of the UV 1700 8 1 Jigs and Tools Required 8 2 Before Starting Adjustment 8 3 Adjustments 8 1 Jigs and Tools Required 8 1 1 Jigs 1 Target ruling H 39 8mm P N 775 05135 2 Adjusting jig mirror for S side P N 775 06865 02 3 Optical axis adjustment plate P N 775 06116 4 Adjusting jig H 40mm P N 775 0431 3 11 Optical axis adjustment plate included 5 Mercury lamp holder P N 206 55895 92 ASSY with lamp see No 6 P N 206 55895 91 6 Mercury lamp L5630 P N 062 65048 7 Adjusting jig slit P N 206 55408 8 Holmium oxide solution filter P N220 9291 7 01 NIST FILTER SRM2034 9 Multicell 6 cells sample compartment P N206 69160 Not a necessity 8 1 2 Tools 1 Phillips screwdriver 2 L type hexagonal wrench for M4 setscrews 3 L type hexagonal wrench for M3 setscrews 4 Nut driver for M3 nuts 5 Nut driver for M4 nuts 6 UV protective goggles 7 White gloves 8 White card like a business card etc 9 Blackout curtain 8 2 Before Starting Adjustment 8 2 1 Launching Maintenance Mode Launch the maintenance mode using the following operation 1 Hold
63. line 656 1nm 486 0nm b Method employing wavelength correction filter Use method a to check wavelength accuracy at time of installation Note that at time of shipping wavelength is corrected using the Holmium oxide solution filter NIST SRM2034 P N 220 92917 01 This item explains the wavelength accuracy checking method using the Holmium oxide solution filter 3 4 1 Method Employing a D2 Lamp Line Specification Within 0 3nm Checking Method 1 Press the 1 key at the auto items screen to Wavelength accuracy 1 Inspection Yes display the wavelength accuracy parameter gt Mathod D2 Lamp settings screen 3 Check A nm 486 0nm 656 1nm 2 Set the parameters to match those shown in Tolerance ee am figure 3 6 Inspection Each press of the 1 key selects Yes or Input item No deselects No the inspection Set inspection ee to the Yes item Method Press the 2 key to open an interactive Fig 3 6 Wavelength accuracy parameter settings screen 1 screen that enables selection of either D2 Lamp or Filter Select D2 Lamp e Check A The wavelength changes depending on settings for inspection method When D2 Lamp is selected as the inspection method the 486 0nm 656 1nm or Both items can be selected by pressing the 3 key Select the Both item Tolerance Press the 4 key to enable input of pass criteria value Input range is 0 1 to 0 9 Input 0 3
64. m over the S side beam nearest you marking line of the optical axis adjustment plate And tilt adjust the S side mirror M4 in the height direction Align beam with adjusting jig center 12 Retighten the fixing screws A on the S side mirror M 4 to secure mirror 13 Place the adjusting jig H 40mm in front left side of sample compartment lens over the marking line of the optical axis adjustment plate And adjust the S side mirror M 4 in the left and right directions so that the beam comes to the center in the horizontal direction of the adjusting jig 8 25 14 Place the adjusting jig H 40mm in front right side of the sample compartment quartz windowpane over the marking line of the optical axis adjustment plate And adjust the toroidal mirror M2 in the left and right directions so that the beam comes to the center in the horizontal direction of the adjusting jig R side marking line n Optical axis A r S adjustment plate Adjusting jig H 40mm iin Tae E Hh REZE Se Lens Led ST SEE eee S side marking Quartz windowpane Fig 8 28 Sample compartment surroundings 15 Repeat items 13 and 14 above to make adjustments so that the beam will be centrally aligned on t
65. n unit cover and place on the workbench with the inside of the cover showing 2 Remove the four screws 1 4 holding the console PCB 3 Disconnect the three wiring connectors connected to the console PCB And remove the board 7 3 Preamplifier PCB Removal Shield cover Shield cover screws Fig 7 4 Preamp PCB Removal 1 Remove main unit cover 2 Remove preamplifier PCB shield cover 3 Disconnect wiring connectors connected to preamplifier PCB 4 Remove the two screws holding the preamplifier PCB And remove PCB 7 3 7 4 Power PCB Removal 3 Fig 7 5 Power PCB Removal 1 Remove main unit cover 2 Remove screws in locations 1 to 4 Loosen screws 5 and 6 and remove power PCB 7 5 CPU PCB Removal Fig 7 6 CPU PCB Removal Remove screws in locations 1 to 4 Pull out unit with CPU PCB from the right side of the 1 main unit 2 Disconnect all connectors connected to the CPU PCB 3 Remove the screws holding the CPU PCB And remove the CPU PCB 7 4 7 6 ROM Replacement 1 Pull out CPU PCB from right side of main unit see item 1 of 7 5 2 Remove and replace ROM OB 1700 P N 206 55221 92 ROM MODE 1700 P N 206 55222 92 Note With the UV 1700 ROM MODE 1700 contains adjusting information such as
66. ne Status has changed since instrument baseline was corrected Or instrument baseline has not been corrected for a long time Correct instrument baseline Sample compartment floor is littered with spilt sample solution Clean interior of sample compartment Sample compartment windowpane is dirty finger prints etc Clean windowpane Stray light cut filter function defective Replace or adjust filter ASSY Optical axis defective Readjust optical axis CPU PCB defective Replace CPU PCB 6 3 Noise Level Exceeds Specification Probable Cause Action Light is not passing through slit correctly Repair light source switching unit Light source lifespan expiration Replace lamp Light source mirror deterioration Replace light source mirror Optical system is dirty Clean or replace parts Stray light cut filter deterioration Replace filter Optical axis defective Readjust optical axis Preamplifier defective Replace preamplifier PCB CPU PCB defective Replace CPU PCB Mobile phone being used near instrument Refrain from using mobile phone Charged body on left side of instrument vicinity of preamplifier Move away charged body 6 4 Wavelength Accuracy Exceeds Specification Probable Cause Action Sample etc is set in cell holder Empty sample compartment
67. ng problems whenever this operation is halted for whatever reason 2 6 Chapter 3 Performance Checks This chapter explains how to check basic performance of the UV 1700 Note that items accompanied by an asterisk require checking as part of the acceptance procedures 3 1 Notes on the Performance Checks 3 2 How to Use Instrument Validation 3 3 ROM Check 3 4 Wavelength Accuracy 3 5 Wavelength Repeatability 3 6 Resolution 3 7 Baseline Stability 3 8 Baseline Flatness 3 9 Noise Level 3 10 Photometric Accuracy 3 11 Photometric repeatability 3 12 Stray Light 3 1 3 1 Note on the Performance Checks 3 1 1 About ROM Check Activating the instrument while holding down the F 1 key sets the instrument validation measuring parameters and pass criteria values to the default settings which are different to the normal parameters 3 1 2 Checking of Baseline Stability To implement baseline stability inspection the instrument power supply must be turned ON for at least one hour prior to inspection A warning message will be displayed if one hour has not elapsed from when the power was turned ON 3 1 3 Checking of Baseline Flatness To implement baseline flatness inspection the instrument power supply must be turned ON for at least one hour prior to inspection A warning message will be displayed if one hour has not elapsed from when the power was turned ON 3 2 3 2 How to Use Instrument Validation Use th
68. odium iodide aqueous solution Nal Cell containing sodium nitrite aqueous solution NaNoz Checking Method 1 Press the 3 key at the semi auto items screen to display the stray light parameter l Inspection Yes 2 NaI 220nm S N 12345678 Good THRU 01 03 30 Tolerance 0 04 or less figure 3 16 as reference 3 NaNo2 340nm S N 87654321 settings screen 2 Set the parameters using those shown in UV 39 Good THRU 01 03 30 Tolerance 0 04 or less Inspection Each press of the 1 key selects Yes or deselects No the inspection Set inspection Input item No to the Yes item a a Nal 220nm Set the serial number S N and expiration Fig 3 16 Stray light parameter settings screen date for the sodium iodide aqueous solution and set the pass criteria value for the amount of stray light at the 220nm wavelength NaNo2 340nm UV 39 Set the serial number S N and expiration date for the sodium nitrite aqueous solution and set the pass criteria value for the amount of stray light at the 340nm wavelength Recommended Value The pass criteria value can be set to a recommended value Do not use this item at this point 3 22 3 Press the RETURN key twice to return to the instrument validation screen Now press the START key to implement inspection Take out and put in inspection samples in accordance with screen instructions Results will be printed out when the inspection is completed 4 Check that t
69. ositions Replace preamplifier PCB Replace CPU PCB Org fine WI lamp s zero order light energy counter indicates below 1 000 Lamp energy loss Light source position defective Preamplifier defective Replace lamp _ Adjust light source mirror and lamp positions Replace preamplifier PC PCB Stray light cut filter defective Replace filter ASSY check for cable breaks and connector contact D2 Lamp Energy When Dz lamp does not light up D2 lamp defective Da lamp lighting circuit defective Replace lamp Replace power PCB PCB ASSY POWER or CPU PCB Replace cable When Dz lamp lights up Lamp energy loss Light source position defective Preamplifier defective AD converter defective Replace lamp Adjust li light source a and mirror positions Adjust p preamplifier PCB Ga Replace C CPU PCB i Error Items Probable Cause Action Check The 656 1nm line cannot be detected energy value is 425 or less Lamp energy loss Replace lamp Light source position defective Adjust light source mirror and lamp positions emi I ua i cable breaks and connector contact 6 2 Baseline Flatness Exceeds Specification Probable Cause Action Instrument baseline correction has not been performed Correct instrument baseline Baseline correction has not been performed Correct baseli
70. ow press the START key to implement inspection followed by printout of results 4 Check that wavelength repeatability is within 0 1nm 3 10 3 6 Resolution This measures the 656 1nm line of the D2 lamp takes the peak half height width of the spectrum waveform defines it as a resolution and checks that value Specification 1 0nm or less Checking Method 1 Press the 3 key at the auto items screen to display the resolution parameter settings l Inspection Yes 2 Tolerance 1 0 nm or less screen 2 Set the parameters to match those shown in figure 3 9 Inspection Each press of the 1 key selects Yes or deselects No the inspection Set Input item No inspection to the Yes item E es Tolerance Fig 3 9 Resolution parameter settings screen Press the 2 key to enable input of pass criteria value Input range is 0 1 to 9 9 Input 1 0 Recommended Value The pass criteria value can be set to a recommended value Do not use this item at this point 3 Press the RETURN key twice to return to the instrument validation screen Now press the START key to implement inspection followed by printout of results 4 Check that wavelength accuracy is within 0 1nm 3 11 3 7 Baseline Stability This measures the time variation in the vicinity of zero absorption OAbs for the specified wavelength and checks the hourly rate of variation Specification Within 1 0mAbs h 700nm Checking Met
71. p height Adjustment of light source switch mirror position perpendicularly to entrance slit Adjustment of WI lamp holder position perpendicularly to entrance slit 2 Adjustment of grating Adjust the grating until spectrum light hits at the slit Adjustment of ruling rotate toward exit slit Adjustment of inclination perpendicularly to exit slit 3 Adjustment of toroidal mirror Align light that has passed through the slit with center of sample side mirror Adjustment of toroidal mirror ASSY position horizontally to sample side mirror Adjustment of inclination horizontally to sample side mirror 4 Adjustment of sample side mirror Adjust the light that has passed through half mirror so that it passes through the center of sample side cell Adjustment of sample side mirror ASSY position horizontally to the center of sample side cell Adjustment of inclination perpendicularly to the center of sample side cell 5 Adjustment of reference side mirror Adjust the light that has passed through half mirror so that it passes through the center of reference side cell Adjustment of reference side mirror ASSY position horizontally to the center of reference side cell Adjustment of inclination perpendicularly to the center of reference side cell 6 Focus adjustment of exit slit Use the 546 1nm spectral line of the mercury lamp to adjust the focusing position of
72. pectrometer is automatically initialized and gain adjusted required time approximately two minutes The D2 lamp will light up The resolution check result will be after two displayed approximately minutes as shown in Fig 8 13 In this example the resolution is 0 7nm 8 13 Use this to check the peak half height width of the D2 lamp line 2 Optics check 1 0 ord light search point set 2 0 ord light search 3 Hg lamp line A detection 4 Resolution chec Repeat Ee ee Fig 8 13 Resolution check 8 2 4 Outline of Condition Setting Select 3 Condition set at the top menu screen to display the menu shown in Fig 8 14 hi Waiau ed in FlashROM 1 EEPROM data initialize Usethis toinitialize data saved in FlashRO E E E wee we and input instrument ID number and 3 ABS corr Factor 1 0000 absorbance correction factors Input range 0 993 1 007 4 Data init after battery change Fig 8 14 Condition set screen 1 EEPROM data initialize Usethis to initialize data in EEPROM In the case of the UV 1700 adjustment data such as wavelength tables stored in a designated EEPROM chip for the UV 1600 are concentrated in a mode ROM FlashROM 29F 040 The functions explained here are related to adjustment data domains in the FlashROM Note that when power is turned ON after replacing ROM the adjustment data copied in RAM will be automatically written into the new ROM Therefore EEPROM data initialize ne
73. rce light up light source switching wavelength drive filter switching key input LCD screen displays printout and communications via the RS 232C I F The sample and reference beams enter the detector Si photodiode and converted into signal voltage by the preamplifier Next the gain amplifier adjusts the signals And these enter the A D converter to be converted into digital signals The digitized photometric signals are processed by the CPU to become photometric values such as transmittance and absorbance 9 4 2 Setting Instrument Initialization The CPU implements the initialization settings when the UV 1700 is turned ON The following explains each initialization setting Also the meanings of numeric values that appear on the right side of the initialization settings when the instrument is launched using the F 1 key are explained Initialization Setting Contents Initialization Results Items LSI initialization Initialization of each I O device Normally 0 ROM check Calculation of ROM checksum and Checksum value collation against previously calculated sum Error When checksums do not agree RAM check Data read write check against external Number of errors RAM backup available and internal RAM Protection check of baseline data in 65535 if baseline data is external RAM damaged Filter initialization Initialization of stray light cut filter set to Normally 0 No filter position after initialization Light
74. slit filter ASSY Use the adjusting jig to read off the scale position where the exit slit image is sharpest Secure the slit filter ASSY at a position 1mm less than the scale reading 7 Wavelength correction Correct wavelength create and save wavelength table 8 17 8 Performance check Turn OFF and then ON again main unit power and check the following Initialization correctly finishes Performance check of Condition set mode correctly finishes After instrument baseline correction Abs zero flatness and noise level are within specifications 8 3 1 Optical Axis Adjustment Procedure 1 Remove the sample compartment cover sample compartment assembly and light source cover from the main unit 2 Remove main unit cover Lay it on its right side as seen from the front Do not remove the console PCB connection cable at this time 3 Remove the monochromator case cover 4 Connect the AC cable Hold down the START key and turn ON main unit power Release the START key when the buzzer beeps 5 The sound of stray light cut filter origin detection can be heard after approximately five seconds And the top menu of the maintenance mode will be displayed 6 When making first adjustments to instrument after assembly of the main unit select 3 Condition set followed by 1 EEPROM data initialize and then initialize 3 All data 7 In the same way select 3 Cond
75. splayed at the bottom of the screen Sipper PM CPS 240 RS 232C Press cursor key for 1 step drive peer Fig 8 3 Wavelength drive PM screen e lt lt F1 key Press this to move the grating at high speed in the direction of short wavelength Press this again to halt the movement e gt gt F2 key Press this to move the grating at high speed in the direction of long wavelength Press this again to halt the movement WILAMP F3 key Press this to light up the WI lamp Press this again to extinguish the lamp Press the RETURN key to return to the drive check screen 8 4 2 Light Source Mirror PM Use this to operate the light source switching mirror of the light source unit Press the 2 PM Function keys will be displayed at the bottom of the screen key to select light source mirror 1 Wavelength drive PM Filter PM Cell drive Multicell 6 PM CPS 240 3 4 5 Sipper PM 6 7 RS 232C Press cursor key for 1 step drive Fig 8 3 Light source mirror PM screen e lt lt F1 key Press this to move the grating at high speed in the direction of short wavelength Press this again to halt the movement e gt gt F2 key Press this to move the grating at high speed in the direction of long wavelength Press this again to halt the movement WILAMP D2LAMP F3 key Press this to
76. t data memorized in file No 0 5 Measurement parameter file memorized in No 1 14 3 5 3 3 ROM Check Specification Latest checksum value Checking Method 1 Hold down the F1 key and turn ON the power Release the key once the buzzer Initialization LSI Initialize ROM Check RAM Check Filter Origin beeps 2 Initialization starts and the initialization Light Source Org menu will be displayed on the LCD Org Lamp Energy Org D2 Lamp Energy A Check coarse 3 The ROM checksum values will be displayed to the right of the ROM Check items Check that they are the latest checksum values fine 4 Press the F1 key when initialization is complete to display the mode selection i Fig 3 5 Initialization setting screen screen Note Activating the instrument while holding down the F1 key sets the instrument validation measuring parameters and pass criteria values to the default settings which are different to the normal parameters Checksum Value UV 1700 Japanese UV 1700 English Ver No Checksum Implementation period Ver No Checksum Implementation period 1 10 16422 F rom 2001 3 1 10 31765 F rom 2001 3 1 20 15720 F rom 2001 6 1 20 30957 F rom 2001 6 3 6 3 4 Wavelength Accuracy In the case of the UV 1700 wavelength accuracy can be checked with the following two methods a Method employing a D2 lamp
77. tment cover 8 35 Chapter 9 Configuration This chapter explains the configuration of the UV 1700 9 1 Optical System 9 2 Beam Position in Sample Compartment 9 3 Electric System 9 4 Instrument Assignment Explanation 9 1 Optical System Fig 9 1 shows the optical system diagram for the UV 1700 P D L Ref dre rh P D L Sam Fig 9 1 UV 1700 optical system diagram Codes in Part Name Codes in Part Name Diagram Diagram WI Halogen lamp M1 Light source switch mirror D2 Do lamp M2 Toroidal mirror SI Entrance slit M3 Beam splitter S2 Exit slit M4 Sample side mirror G Diffraction grating M5 Reference side mirror F Stray light cut filter W Windowpane L Lens P D Photodiode Sam Sample side cell holder Ref Reference side cell holder Explanation of Optical System Light emitted by the light source WI or D2 is reflected by the light source switch mirror M1 to pass through the entrance slit S1 and enter the spectrometer The light source switch mirror M1 rotates automatically in response to the set wavelength of the light source The D2 lamp is used for the UV region and the WI lamp for the visible and near UV region The light irradiated from the entrance slit S1 is diffracted by the diffraction grating G Rotating the diffraction grating G enables selection of wavelength And the selected wa
78. tometric accuracy inspection will start and the baseline will be corrected When the message asking for the 10 filter to be set is displayed on screen use the CPS 240A controller to set cell position to Cell 2 Press the START key and measure the 10 filter When the message asking for the 30 filter to be set is displayed on screen set cell position to Cell 3 Press the START key and measure the 30 filter Check that inspection result conforms to the specification 3 19 3 11 Photometric Repeatability This repeatedly measures three times the photometric value that occurs in the specified wavelength of the optic filter for transmittance correction and determines the deviation between the average value and each individual measuring value to check photometric repeatability Specification Within 0 001Abs vicinity of 0 5Abs Within 0 002Abs vicinity of 1 0Abs Jig NIST substandard filter P N 775 03576 Checking Method 1 Press the 2 key at the semi auto items the repeatability parameter settings screen Photometric repeatability 1 Inspection screen to display photometric Yes 2 Meas mode Abs 3 Check A 635 0nm 4 10 Filter S N 12345678 Good THRU 01 03 30 Tolerance Ave 2mAbs 2 Set the parameters using those shown in figure 3 15 as reference Inspection Each press of the 1 key selects Yes or deselects No the inspection Set inspection to the Yes item Meas Mode Each time
79. velength passes through the exit slit S2 Grating diffracted light contains wavelength light such as half or one third known as second order and third order light of the selected wavelength so light that passes through the exit slit S2 is passed through the stray light cut filter F to remove such surplus light The stray light cut filter automatically switches to the filter six options appropriate to the selected wavelength see Fig 9 2 for configuration details U 340 B 390 Exit slit B 460 Y 52 R 72 No filter Fig 9 2 Stray light cut filter Filter Wavelength Range Filter Wavelength Range No filter 190nm 305nm B 460 417nm 536nm U 340 306nm 364nm Y 52 537nm 760nm B 390 365nm 416nm R 72 761nm 1100nm Light that has passed through the stray light cut filter F is reflected off of the toroidal mirror M2 onto the beam splitter M3 where it is split into a sample side beam and reference side beam The sample side beam is reflected off of M4 and the reference side beam is reflected off of M5 Both beams pass through quartz windowpanes W and converge on the center of the cell holders The beams pass through the cell holders are converged by the lenses L and irradiated onto the Si photodiode P D detectors 9 3 9 2 Beam Position in Sample Compartment Beam position in the UV 1700 sample compartments is the same for both the sample side and the reference side see Fig 9 3 Also

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